Keysight - Radar Electromagnetic Spectrum Operatioms
Keysight - Radar Electromagnetic Spectrum Operatioms
Electronic warfare (EW) generally includes anything operating in the radio frequency (RF). EM
operations target many aspects of the EW environment, ranging from radars and jammers to military
communications. EW systems use the EM spectrum to support communications, sensing, and defense.
Modern EW systems continuously evolve as new and emerging technologies transform these systems.
Digital and programmable RF equipment, such as software-defined radios, adds complexity. In addition,
radars can quickly change waveforms, making it challenging to locate, identify, and confuse hostile
emitters. These trends impact every aspect of EW. You can address these evolving needs with flexible,
scalable threat simulation and analysis solutions.
This book outlines the core aspects of radar and EMSO engineering. Starting with broad fundamentals,
it covers the technology shift from analog systems to faster digital systems. From the operational
perspective, these systems deploy wideband frequencies. Signal formats and modulation schemes —
pulsed and otherwise — continue to grow more complicated, and this demands wider bandwidth.
Advanced digital signal processing (DSP) techniques are used to disguise system operation and
avoid jamming.
This volume explores all possible challenges and scenarios at the design and simulation, component,
subsystem, and system levels. The design section highlights the importance of model-based
engineering and the significance of simulation tools, which can help increase accuracy at much lower
cost. The subsequent sections take a bottoms-up approach, covering critical amplifier measurements,
material measurement, filters, mixers, and up/down converters. At the subsystem level, the transmitter
and receiver sections highlight how the latest signal generators and signal analyzers can help
engineers perform validation in their labs using software. The last section provides a complete overview
of the system level, addressing the importance of software intelligence, data analysis, and emerging
cyber needs.
Offering a combination of leading technical expertise and a heritage in measurement science and
innovation, Keysight works closely with research, design, and manufacturing companies to support the
development and evolution of new technologies. We offer solutions to address all phases of development
and support for radar and EW systems, from design to verification through long-term sustainment. At
Keysight, we take pride in our leadership as a commercial collaborator, creating and delivering the rapidly
adaptable solutions you need for success in your current programs and to achieve your objectives for
future capabilities.
Table of Contents
Appendix
Acronyms.............................................................................................................................311
Additional Resources.............................................................................................................314
Section 1
Threats do not have to conduct a visible attack but instead cause failure in communications, coordination,
and other operations. Due to the convergence of the following trends, threats have grown increasingly in
number and sophistication:
1. Availability of technology: 10 years ago, very few players dominated this battlefield. The technological
capabilities and investments required to dominate in EW prohibited others from developing competing
EW capabilities. As commercial electronics became cheaper and more available, adversaries of all sizes
entered the EW arena. Now, even smaller adversaries potentially have a competitive threat arsenal,
making the threat environment more dangerous and unpredictable. With the barrier to entry so low,
anyone with the right skill and knowledge can secure enough equipment to be a threat.
3. Artificial intelligence (AI): The pace of change for commercially available dual-use technologies and
software-defined systems drives both the diversity and complexity of future threats. With the addition of
AI, those threats also learn from each conflict and are more likely to prevail in the future.
Types of EW Threats
Threats of the past were static – consistent in appearance and behavior. Today’s threats are responsive,
changing their behavior based on the scenario. If an adversary is jamming a reactive threat, for example, it
will switch frequencies or take another action to elude that jamming. Adversaries must now assume that a
threat might change and prepare to react accordingly.
In contrast, adaptive solutions cannot rapidly grasp and respond to a new scenario. For example, an
adaptive radar senses the environment and alters its transmission characteristics accordingly, providing
a new waveform for each transmission or adjusting pulse processing. This flexibility allows an adaptive
radar to enhance its target resolution. Many adversary systems require only a simple software change to
alter waveforms, which adds to the unpredictability of waveform appearance and behavior. Military forces
struggle to isolate adaptive radar pulses from other signals, friend or foe.
Much adaptive and cognitive development is in response to anti-access / area denial (A2/AD) threats. A2
threats prevent or hinder the deployment of ally forces into the conflict zone. For example, these threats
may do something to force the adversary to engage from a less effective distance. Successful A2 threats
prevent access or even passage of ally forces.
In contrast, AD threats take actions that impede friendly operations. These threats work to limit or
eliminate an adversary’s ability to respond to its allies or other friendly forces. Examples of such
threats include attack vessels or aircraft, as well as missiles. AD threats affect the operations within
the domain. As these threats grow increasingly adaptive, their opponents must respond to them in a
much shorter time.
Impact of Machine Learning
With AI, intelligent machines work and respond much like humans to perform more complex tasks using
capabilities like signal recognition. Machine learning takes AI one step further, allowing machines to
continuously learn from data and adapt as a result. These computers learn over time at a very rapid rate.
Threats using machine learning continue to learn from every conflict and determine ways to prevail against
future countermeasures. As the computer decides how to alter behaviors, evolution occurs without the
need for human interaction. Due to the unpredictable behavior of the threat system, even the people who
implemented it cannot foretell its exact behavior.
As threat systems advance with machine learning technology, they will adapt and alter their behavior
or course of action at an increasingly rapid rate. For example, if a radar is trying to track a jet, the
adversary’s countermeasures may stop it from succeeding. Using machine learning, that radar would
repeatedly try new approaches to achieve success.
An ECM is an electrical or electronic device designed to trick or deceive radar, sonar, or other detection
systems, like infrared (IR) or lasers. It may be used both offensively and defensively to deny targeting
information to an enemy. The system may make many separate targets appear to the enemy or make the
real target appear to disappear or move about randomly.
Most air forces use ECM to protect their aircraft from attack. Military ships also deploy ECM, while some
advanced tanks recently began leveraging them to fool laser/IR guided missiles. Frequently, an ECM
is coupled with stealth advances to simplify the work of the ECM systems. Offensive ECM often takes
the form of jamming. Self-protecting (defensive) ECM includes using blip enhancement and jamming of
missile terminal homers.
As threats grow more sophisticated, countermeasures must become just as sophisticated. Radars go
through a step of evolution and emerge more sophisticated. The role of countermeasures is to counteract
these developments, so they go through their evolution to again take the lead. As the two sides compete
against each other, every step increases complexity.
With range gate and velocity gate pull offs, the returned pulse looks like the skin return, but it changes it
slightly. It makes it look like the direction that that aircraft is flying is different than what it is. For example,
it could appear that the reflected object is moving away instead of toward you. As a result, you lose the
tracking on it.
With digital radio frequency memory (DRFM) techniques, you take RF in, digitize those signals, and create
new RF energy based on the pulse you receive. You use this very fast turnaround technology to create
multiple false targets.
Stealth technology uses a different approach. It combines the geometry of the plane with materials that
do not reflect RF energy well. When radars send out the pulse, they do not get a good skin return back.
The combination makes it challenging for radar to detect stealth units.
Countermeasures continue evolving more rapidly to stay ahead of threats. Many of these developments
focus on DRFMs and the use of more sophisticated digital signal processing (DSP). As DSP grows more
scalable and powerful, more intelligence can be added to EA receivers. To learn how to respond to new
threats, these systems also use machine learning or AI-type applications.
In the increasingly crowded spectrum, uncertainty grows over the guaranteed success of any electronic
countermeasure. To evaluate electronic attacks or electronic countermeasures, you should generate the
threat and analyze your response to it. If accurate threat detection and analysis are enabled, your systems
will respond to threats with the right countermeasures. This ECM analysis tells you if you can prevail in
your electromagnetic spectrum operations.
Incomplete, disaggregated data prevents military forces from attaining or creating a clear threat
picture. They lack a methodology against which to test these threats. This issue stems from traditional
EW threat simulation systems. They use databases of known threats, which usually have associated
countermeasures. Such classified lists of known targets are no longer as effective as they quickly fall out
of date. These systems were not built to identify and isolate threats in the EM environment and determine
countermeasures on the fly.
Even when capable of processing new signals, traditional EW threat simulation systems involve a very
time-consuming process. For example, military forces collect information from the field about a type of
signal, such as frequency or pulse repetition interval (PRI). They send that information to a lab, where it is
analyzed to gather more information and develop countermeasures. Months pass before that information
is available in the system for use.
In the future, adversaries will have a more complete picture of operations. Building on the past decade’s
transformation, the next 10 to 20 years promise to deliver faster, more evolved technology developments.
Many predict that machine learning and artificial intelligence will drive powerful, continuous evolution in
EW. The EW threat environment will leverage drastic processing improvements like using multiple devices
to provide more information in less time. Sensing technologies will also play a larger role, gathering
information about the conflict zone. New coding techniques already result in increasingly complex,
interconnected, and correlated sensors.
These technology innovations will spawn knowledgeable, newly responsive threats that find novel ways to
gain power in the EM spectrum. While the technologies will continue to evolve, and new threats emerge,
one constant remains – the military force that achieves and maintains spectrum dominance will dominate
the EW domain.
Virtual Prototyping
Using Design Tools
Introduction
Gone are the days of simple design. Every year, designers push new limits: higher output power,
better efficiency, smaller components, and increased levels of integration.
With complex design comes new challenges. Designers spend hours setting up and running
simulations. Mountains of data wait to be measured and analyzed. Engineers need to create
workarounds to connect multiple design tools. Meanwhile, wireless standards are evolving quickly.
To keep up with the strong demands of modern technology, a new approach is essential.
The approach moves organizations from siloed design and test steps to agile, connected workflows. The
benefits mirror those of agile software design and DevOps:
When coupled with automation, what results is a new development culture known as TestOps. (Read
more in The TestOps Manifesto: A Blueprint for Connected, Agile Design and Test.)
The Transformation Starts with Design
There is a tremendous opportunity to reduce time-to-market across the design and simulation phases of
the electronic product development lifecycle. Most challenges slowing the lifecycle today can be distilled
down to data movement and tool integration. Information sharing across the workflow is one of the
biggest challenges for design and test engineers. 9 out of 10 companies revealed that correlating test
result data with simulation takes months.
The reason data correlation takes so long is primarily because of the numerous tools used throughout
the development lifecycle. Over 50 percent of designers use more than 5 different tools for simulation
and design. The software tools are not integrated and require hours of coding each week to enable data
sharing. The magnitude of that integration effort is amplified by the fact that nearly every company is
devoting more resources to the maintenance of in-house tools. Designers are looking for an integrated
solution that leverages shared data to accelerate their electronic design.
KEYSIGHT PATHWAVE DESIGN AND TEST SOFTWARE PLATFORM WHAT’S NEW IN PATHWAVE SYSTEM DESIGN (SYSTEMVUE)
https://www.keysight.com/see/radar-ew-system-design
Chapter 2
Radar and EW Development Using Model-Based Engineering
This chapter describes a design methodology and flow that is well suited for use in model-
based engineering. This is an approach to engineering that uses models as an integral part of
the technical baseline that includes the requirements, analysis, design, implementation, and
verification of a capability, system, and/or product throughout the acquisition lifecycle. It is targeted
at system engineers, directors of engineering and equivalent job functions who are involved in the
development of radar and EW systems.
This chapter reviews the MBE technique. It also examines in detail how a set of simulation and modeling
tools can work together to support MBE.
MBE Basics
As per the final report1 of the MBE subcommittee of National Defense Industrial Association (NDIA), MBE
is defined as:
“An approach to engineering that uses models as an integral part of the technical baseline that includes
the requirements, analysis, design, implementation, and verification of a capability, and/or a product
throughout the acquisition cycle.”
During development, therefore, all aspects of radar acquisition have to be considered. MBE was originally
derived because of several gaps in the practice and the process of developing complex systems. While
the negatives may have necessitated MBE, the advantages have accelerated the focus and attention on
it. MBE’s main advantages include the ability to:
• quickly evaluate what’s not possible by exploring the entire project scope
• derive all downstream activities
• come up with quick proposals and Rough Order of Magnitude (ROM) estimates
• rapidly evaluate the system performance for changing requirements
• use the top-level model as the beacon for every subsystem development
With a system model, it’s possible to derive all subsystems’ requirements and partition the design margins
more meaningfully; a process generally known as top-down design. In the case of MBE, the system
model not only guides the subsystem design, but also helps define the system test, manufacturability and
cost of production, among other things. This also leads to the ability to generate a quick proposal that is
totally devoid of impossibilities and has a decent probability of success.
Clearly the first, and perhaps the only, critical step in MBE is the development of the model. When
developing the ‘model’ we need to consider two aspects:
• Width and versatility. How wide should the model be? The radar model must predict the performance
under a variety of conditions, such as frequency range, complex environments, waveforms, wide
variety of threats, and various interferences. It is generally desirable to build a model as wide and
versatile as possible so that one can explore all the above conditions.
• Depth. How deep should the model be? This is an engineering and business decision. There are
tools that allow both the fidelity and accuracy of the building block models to be increased infinitely.
Doing so; however, would increase the simulation time enormously and could be prohibitive and
counterproductive from a business point of view. Hence, a good system model is one that has
enough accuracy, but that also simulates quickly. A good system model also has fidelity that can be
progressively increased on demand.
Let’s now go to the question of: What is being engineered? In the context of radar, this can be several
systems. We can view radar as a system of systems as shown in Figure 2.1.
DSP research /
engineering
Data Antenna
processing engineering
engineering
System
engineering
Mechanical RF/µW
engineering engineering
Power
engineering
For the rest of the discussion we will consider only the electronic system of radar, which includes the DSP
and RF/MW subsystems in the transmitter and receiver, and the antenna. However, the methodology
applies to all other systems each requiring a set of special tools.
Realization
Figure 2.2 shows both a top-down and bottom-up flow. The definition and decomposition flow dictates
the specification of the subsystems and their margins. It is common that the subsystems themselves are
complex and hence, they can also be described with individual V-diagrams as shown in Figure 2.3.
Realization
Realization
Realization
Realization
Realization
Realization
Realization
Each of these subsystems must be designed using an appropriate tool. Let’s call the V-diagram one
level below a child-V, and the one above child-V, a mother-V. An important requirement of MBE is that a
mother-V be able to call, command and control child-V. It should be able to simulate child-V, keep it in
standby mode, examine the output from child-V, and change the inputs to child-V to continue with the
simulation on demand.
The tools used to design each of these systems—which by itself is a subsystem for the higher-level
system—are very likely different tools. For example, a system-level simulation is done using popular
tools like Keysight’s PathWave System Design (also known as SystemVue), while the subsystem (e.g., a
TR module) is designed using a circuit simulator, for example with PathWave Advanced Design System
(ADS). Depending on the situation, some of the subsystems could be actual hardware connected to
measuring instruments. It quickly becomes clear that for maximum effectiveness, however, all these tools
should be inter-operable. In other words, a higher-level system simulating tool should be able to call a
subsystem simulating tool and put it in a command-and-control mode.
Once the above requirements are satisfied, one can build the system model to simulate the end-to-end
performance of the system. Let’s see how such a system model can be created for a radar using a
set of tools.
On close observation of the V-diagram in Figure 2.2, notice that the left side of the V pertains to top-
down design, while the right pertains to integration and verification. Verification is usually done with actual
hardware, meaning that it is not performed until the actual hardware is available. With modern tools, a
top-level model can be built that allows verification to be done in simulation. To highlight the difficulty,
imagine having to co-simulate RF and DSP circuits. However, very few tools in the industry support this
kind of co-simulation. With an improved co-simulation capability though, both sides of the V-diagram
(top-down design and bottom-up verification) can be done entirely in simulation. Final verification is then
done with actual hardware. Performing the entire V in simulation eliminates major risk factors early in the
development cycle.
Chaff
Jamming
Rain
Sea/ocean
Figure 2.4. This image depicts the typical operation of a mono-static pulse Doppler radar.
From Figure 2.4, it’s apparent that the radar is on a moving platform, a ship, and that there are three
targets, one jammer and the clutter caused by sea, rain and chaff. The communication signals from
the city environment may act as interferers. Also, the radar could be treated as bi-static with the radar
receiver on the reconnaissance aircraft. It is important to note that pictures like that shown in Figure 2.4
have to be made visible throughout the organization engaged in MBE. Everyone then will be able to check
the performance of their individual subsystems through the system model.
Figure 2.5. Shown here is the scheme for modeling the target reflection, jamming signal, clutter, and noise.
The inputs to the target return model—the target position, target RCS, transmitting antenna position,
receiving antenna position, and waveform from the source—come from the antenna layer. The output
from this model is computed using the radar equation.
The Jammer model is versatile and allows both cover and deceptive jamming to be modelled. There
are four types of cover jamming: barrage, spot, multi-spot, and swept spot. For barrage jamming, the
model generates the Additive White Gaussian Noise (AWGN) with mean and standard deviation values
determined by the parameters Mean and Stdev in the full bandwidth. For spot jamming, the model
generates the band limited AWGN noise. The normalized bandwidth is determined by the parameter
Bandwidth. Also, the FilterTapsLength is used to set up the maximum length of low-pass filter. For
multi-spot jamming, the model generates band limited AWGN noise in the sub-bands determined by the
parameter MultiSpotBand, which can be used to set up the normalized start and cut-off frequencies of
the passbands. For swept-spot jamming, the band-limited AWGN noise sweeps in the scope of the full
band, with the sweep rate decided by the parameter SweepFreqStep.
The clutter model is different from noise in two major ways. First,
the power spectrum of clutter is not white and is the result of echo.
Second, the model supports the Gaussian, all-pole and Cauchy
power spectrum model.
Figure 2.6. Measured or simulated clutter files can be used for a given terrain.
The measured clutter files, in terms of I and Q, are read from the
external files into the simulation. NOTE. While the model
is versatile, it can take
After the addition of noise, the return signal goes into the radar a long time to simulate
receiving antenna. The receiving antenna is very similar to the and this is contrary to
transmitting antenna in that it takes input from the antenna layer the MBE system model
and forms a beam in the direction of the target. The output of the philosophy. Hence, a better
receiving antenna is passed through an RF down-converter into way is to use measured or
simulated clutter files for
the baseband processor. Adaptive digital beamforming techniques
the given terrain. One such
are used to combine the outputs of various phased-array antenna
implementation is shown
elements to form a signal input for the pulse compression block. in Figure 2.6.
Figure 2.7. To see how the actual LNA circuit in the receiver performs, ADS can be used to simulate it. SystemVue
enables co-simulation with ADS.
A circuit simulator like PathWave Advanced Design System (ADS) can simulate actual circuits in the
design. SystemVue can co-simulate with ADS. It is also possible to scale the fidelity of the circuit model.
To do this, we extract the X-parameters* of the circuit and place it as a model for the amplifier in the
system simulator.
An example can also be provided for baseband models. We simply substitute HDL code for a building
block that considers the finite precision accounting for the quantization effects. Another example is to
read in the measured antenna patterns for the antenna elements rather than assuming an analytical
antenna factor. The choice of varying fidelity for the building block models is a key requirement of MBE.
* “X-parameters” is a registered trademark of Keysight Technologies. The X-parameter format and underlying equations are open and
documented. For more information click here. (https://www.keysight.com/in/en/lib/resources/miscellaneous/x-parameters-open-
documentation-trademark-usage-and-partnerships.html)
First, users model the time-dynamic position and orientation of vehicles. Given these dynamic positions
and orientations, users can model the characteristics and pointing of sensors, communications and other
payloads aboard the asset. STK then determines the spatial relationships (e.g., line-of-sight) between
the assets of interest and all the objects under consideration. These relationships can also be modeled
across multi-hop links or over regions of interest. STK assesses the quality of these relationships through
a wide array of constraining conditions (e.g., payload capability, unique user algorithms, etc.), while also
incorporating environmental effects such as terrain, lighting and weather conditions on sensor visibility or
communication link quality.
When SystemVue is co-simulating with STK, the inputs are brought from STK directly into SystemVue’s
signal layer. For more details on this process, please refer to reference 3.
Any tool utilized to build a system using the model-based engineering technique requires three key
characteristics. It must be able to create the wide and versatile models needed to build a system model.
It must support scalable fidelity for the models. And, it must have the ability for an external program to
command and control the system model.
References
1. Final report of the Model Based Engineering (MBE) subcommittee, NDIA systems engineering
division, M&S committee, February 10, 2011.
2. Ron Williams, INCOSE Model Based Systems Engineering, Integration and verification scenario,
Raytheon, INCOSE IW12 MBSE Workshop, January 21-22, 2012.
3. Virtual flight testing using SystemVue and STK, 5991-1254EN, Keysight Technologies.
pulse pulse 11
Gain=31.42e+6 [wc] A1
u=2*pi*(FM_High.FM_Low)/PW;
Sqr wc=2*pi*FM_Low;
7 10
Math Gain=31.42e+12[0.5*u]
FunctionType=Sqr
(3.1a)
(3.1b)
Figure 3.1. Custom signal generation using SystemVue DSP library blocks
Note that the M-Code component does not provide SystemVue with the sample rate information that
its built-in models do. It is recommended, therefore, that a sample rate component be added after
a M-Code component that is used as a source to implicitly define the sample rate (Figure 3.5). The
CxToEnvelope component defines the complex waveform as an RF Envelope waveform where I&Q,
plus time and carrier frequency are defined. The spectral result, centered around 500 MHz, is shown
in Figure 3.5.
Figure 3.5. LFM chirp signal generation and IF spectrum. Note that the Sample_Rate component declares the time-
step for the un-timed complex numeric data emerging from the MATLAB Script source.
Transmitter RF Design
The RF chain of the radar transmitter was designed using the Data Flow RF block library in SystemVue,
which offers users a variety of RF models to implement the RF section of the system (Figures 3.6a and
3.6b). Real-world impairments such as nonlinearities, LO phase noise, and mixer leakage products can
also be incorporated into the simulation.
Figure 3.7b. Implementing radar propagation loss and propagation delay models
Figure 3.8a. Radar front-end receiver design using RF block library in SystemVue
CIC Filter
0=Deactive (Short)
Receiver IF 1=Activated
Take Congujate
of Reference Signal
Reference In
Divider.
Reference/Test Out=conj(Ref)*Received
Inverse FFT
Integrate FFT
magnitude values 1/Test so that as
Test increases
VGA gain
decreases
Note: The two
input port
locations are
reversed from
the symbol
Figure 3.9b. FFT-based convolution algorithm (pulse compression) using SystemVue DSP library blocks
Figure 3.10a. Creating and combining interferer source with radar waveform
Figure 3.10d. Sweeping interference power to see its effect on compressed-pulse peak detection
In this case study, the LFM chirp radar waveform is used. It is designed using SystemVue software with
different specifications and downloaded onto the VSG (Figures 3.11b and 3.11c). SystemVue allows data
to be downloaded from any node in the design. In this case, the node selected is the one where there is
a combined spectrum of main radar return coming to the receiver input and where interfering signals can
be added to perform receiver signal processing fidelity test (Figure 3.11d).
CIC Filter
Interference Sources 0=Deactive (Short)
1=Activated
From
Chirp
FFT Based
Source Convolution
Solver
Figure 3.11b. SystemVue workspace with signal downloader component to download custom waveform to VSG
Figure 3.11c. Ideal LFM chirp waveform being analyzed using spectrum analyzer and its vector signal analysis using
89600 VSA software running on the N9030A PXA
This section proposes a solution to this dilemma, a system-design methodology that uses
PathWave System Design (SystemVue). Examples will be used to illustrate how advanced pulse
Doppler (PD) surveillance radar with moving target detection (MTD) and a constant false alarm
rate (CFAR) processor can be designed. To ensure the design works properly, the platform can
be connected to instrumentation for system test and verification. This allows users to reduce
their system development time and cost, while also decreasing their chances of unexpected
system failures late in the system development process.
To begin, consider the tasks undertaken by the radar DSP algorithm designer, which typically breaks
down into the following two stages:
Stage 1. Design the algorithm in software and verify it using a simulation tool.
To accomplish this task, the designer needs:
• A user-friendly algorithm modeling environment to easily create and debug the algorithm during
development. The environment should support multiple languages, such as m-code, C++, and HDL.
• Signal sources and measurements to verify the algorithm during verification, once it is created.
Unfortunately, it is not a simple task for the DSP algorithm designer to create radar signal sources
with radar cross section (RCS), clutters, noise, and jamming. The designer might also encounter
difficulty creating measurements for the algorithm. Consequently, a tool that provides radar sources
and measurements is desired.
To address these needs when creating the MTD and CFAR processor, a platform that provides the
following functionality is required:
• An interface to a vector signal generator to generate test signals. The vector signal generator
provides radar signal-generation test sources and models for RCS parameters, Clutter, Jamming,
Doppler, and Frequency offset.
• An interface to a vector signal analyzer to verify the implemented hardware as compared to the
original algorithm. The platform must support a wide range of measurements including waveforms,
spectra, detection rate, and false alarm rate (FAR). Also, it must provide an estimation of target
distance, speed, and angles for the detected target.
In SystemVue, an interface model (sink) allows for direct connections with various signal generators as
shown in Figure 4.2. This allows software data to be downloaded to instruments for hardware test data.
Figure 4.3 shows the details for using the platform to connect to instruments and test hardware based on
the created algorithm.
SystemVue can also connect to signal analyzers, logic analyzers or scopes to provide additional
measurements and expand instrument capability according to the user’s needs. As an example,
Figure 4.4, shows the link between SystemVue and a signal analyzer. Here, test signals from the
signal generator are sent to the device-under-test (DUT). The signal analyzer captures the DUT
output waveforms and sends them to SystemVue, using the Vector Signal Analyzer (VSA) link model.
In SystemVue, the waveform can be further processed using the radar signal processing function.
SystemVue also provides additional measurements such as Doppler frequency, detection probability, and
false alarm probability.
The radar transmission signal and returned signal [1] can be expressed as:
where fd is the Doppler frequency, 1 is the delay, and Nc, Nn and Nj refer to clutter, noise and jamming,
respectively. To detect target, speed, and distance, fd and 1 must be estimated.
Because the small moving targets are hidden by the heavily cluttered environments, they cannot be
detected in the time domain. Instead, the signal must be detected in the frequency domain using Doppler
frequency analysis. To do this, return data must be collected and processed using two-dimensional (2D)
signal analysis for both target, speed, and distance. 2D signal processing is required for moving target
indicator (MTI) and MTD. CFAR processing is needed for auto-detection in PD signal processing. Without
CFAR, auto-detection will likely fail.
Sampling Interval
Range bins
= 1/BW
The first step in PD signal processor development is to design a data bank to store received timed
signals, as shown in Figure 4.6. The received data is entered into the data bank point-by-point from one
column to another until the bank is full.
Taking a closer look at each column, the time interval for each data point is 1/bandwidth. Each data point
is a return signal from different distances. The sampling interval between each column is the pulse signal
repetition interval. All data points in the same row are returned from the same distance with different
timing. Doppler frequency can be extracted from data in the rows. Either a filter bank or a group of fast
Fourier transform (FFT) operations can be used for all data points in the data bank. In software design,
a group of FFTs is always used. Once the Doppler frequency is detected, the location of the row can be
mapped to the return target distance from the range bins. Then, the distance can be detected.
Signal sources
For this example, signal sources include:
where R0 is the distance between radar and the target, and tr is the path delay, so tr = 2R/c.
PDF PSD
• Rayleigh • Gaussian
• Log-Normal • Cauchy
• Weibull • All Pole
• K–Distribution
The user can also define any distribution using SystemVue’s built-in MATLAB Script capabilities.
As shown in Figure 4.8, the RF transmitter features local oscillators, which can include phase noise,
modulators and mixers with non-ideal behavior, and amplifiers which can include complex nonlinear
behaviors and filters. Figure 4.9 depicts the RF receiver’s oscillators, demodulator, amplifiers, and filters.
Pulse compression
Figure 4.12 depicts the PD processing pulse compression.
Digital Compressed
DFT IDFT Digital
2D I/Q Matrix
2D I/Q Matrix
z–1 z–1
Filtering Bank Or
spectra Estima-
tion for Doppler
Freq
CFAR Processor
Since modern radar requires auto-detection, PD radar must use CFAR to control the false alarm rate.
Otherwise, the radar won’t work. The CFAR can be done in time, frequency domains, or both. Instead
of the fixed detection threshold, the averaging amplitude value of reference cells is used as the threshold
to prevent false alarms from happening too frequently. This CFAR system is called a cell averaging (CA)
CFAR system.
In the PD radar example in this chapter, CFAR was done in the frequency domain. Cell averaging CFAR
was used.
Once the algorithm is understood, the code can be derived using C++ or MATLAB Script. During its
development, the code can be easily debugged for either C++ or MATLAB Script as shown in
Figure 4.15. Users can modify the code or insert their own in the code window to implement their own
CFAR algorithm.
• Basic Measurements
- Waveform
- Spectrum
- Signal noise ratio
• Advanced Measurements
- Estimation of distances and speeds
- Detection probability, Pd = number of successful detection/total number of tests
- False alarm probability, Pf = number of false errors/total number of tests
- Importance sampling will be implemented to speed up the Pf simulation [3]
If the user wants more, custom measurement models can be created using a combination of
existing models.
In Figure 4.18, the detection probability of the system is displayed. The detection rate is obtained by
running several tests and using the Pd definition to obtain it. The target distance and speed are estimated
using the detected Doppler frequency and the detected range bin location.
Algorithms are critical for high-performing advanced radar systems. A unified approach to radar system
design that relies on SystemVue now offers designers a viable means of creating effective algorithms.
It provides a user-friendly environment for algorithm development, while also integrating software and
hardware to verify the algorithms. SystemVue can even be used to develop algorithms for digital array
radar plus spacetime adaptive processing (STAP) and multiple-input multiple-output (MIMO) radar.
Moreover, it allows the system development team to quickly and easily try new and innovative ideas and
to evaluate the effects of jamming and interference sources on radar performance.
References
1. I. Skolnik, Radar Handbook, 2nd ed. McGraw-Hill Inc., 1990.
2. D. Curtis Schleher, MTI and Pulse Doppler Radar, Artech House, Inc., 1991.
3. Dingqing Lu and Kong Yao, Importance Sampling Simulation Techniques
Applied to Estimating False Alarm Probabilities, Proc. IEEE ISCAS, 1989, pp. 598-601.
Modern UWB radar systems often operate in unpredictable environments, with interference, jamming,
and other “real world” performance limitations. Therefore, during system development, it is critical for
engineers to understand how their actual hardware will perform in these environments.
Problem
Effective radar system design requires comprehensive system validation, a time-consuming and
expensive process often necessitating costly facilities and complex measurement systems. Radar
algorithms, such as target recognition and countermeasures, need to be validated early enough to
change the signal processing hardware design. Hardware receivers must also be tested with realistic
threats and jamming scenarios. Together, these often require outdoor ranges, chambers, and real-time
hardware simulators costing tens of thousands of dollars per hour.
Unlike communication system designers, UWB radar system designers face several unique challenges,
beyond sheer bandwidth. Impulse radar signals, for example, can change shape during propagation
(e.g., non-sinusoidal waveforms), while for noise-like radars, figuring out how to model the noise in the
waveform can be challenging. With Linear FM systems, generating UWB signals with Doppler frequency
offsets, target echoes, and clutter to perform receiver verification can be challenging. As a result,
designing and testing UWB radar systems requires a variety of signal sources, target environment setups,
and measurements. Carefully designed and optimized waveforms are essential to ensure excellent real-
world performance.
An additional role of the EDA software is to surround the raw radar design and test equipment with the
environmental, baseband, and RF modeling required to close a round-trip signal processing loop to
perform early simulation-based verification. As hardware becomes available, the software continues to
connect directly into the physical hardware measurement. By leveraging the design tools into verification,
a consistent approach is maintained throughout the research and development process saving time,
promoting re-use, and making optimum use of the capital equipment assets.
Keysight provides an example of just such a test system. As shown in Figure 5.1, the system starts
with the SystemVue simulation and modeling environment, which is used with a wideband AWG (upper
left), the vector signal generator (lower right) and the 32 GHz oscilloscope (lower left). Together, these
components allow engineers to carefully design and optimize the UWB signals that are so critical to the
design, verification, and test of UWB radar systems.
The test bed shown in Figure 5.1 supports investigations of UWB architectures, as well as a direct
connection to test equipment for verification. It can be used to model, encode, and download UWB test
signals and also post-process received signals. The wide-bandwidth 90000 X-Series oscilloscope allows
RF engineers to measure and analyze UWB radar transmitter outputs using up to 32 GHz of true analog
bandwidth, without the need for external down-conversion. This direct approach reduces hardware
calibration, system impairments, and measurement system complexity and uncertainty.
Keysight’s E8267D PSG microwave vector signal generator features wideband baseband IQ inputs. When
combined with a wideband AWG, such as the 81180A, M9330A, or the new M8190A, the PSG provides
the flexibility necessary to create microwave and millimeter-wave signals for UWB radar scenarios, as well
as component validation.
With this test system, SystemVue generates and downloads different UWB radar test vectors to the
wideband AWG to create the necessary baseband signals. The output differential IQ signals of the AWG
are then modulated by the PSG to create an X, Ku,or Ka band test signal, to be used directly as an input
to a device under test (DUT) for the radar component test. Next, the output of the DUT is captured using
the Infiniium 90000 X-Series oscilloscope where radar measurements can be made (Figure 5.2). Signals
can be analyzed inside the Infiniium oscilloscope using the Oscilloscope Signal Analyzer (OSA) or Vector
Signal Analysis (VSA) software. For further analysis and signal processing, measured signals up to 32 GHz
Because of the versatility of this UWB test bed, it can be used for both validation and troubleshooting of
UWB transmitters and UWB receivers.
Figure 5.1. With SystemVue integrating this UWB test platform with a working radar reference design, engineers
can precisely generate and measure UWB waveforms for any point in a UWB system architecture, and perform
closed-loop stimulus/response measurements that reduce the need for expensive ranges, chambers, and hardware
simulators in early R&D.
Figure 5.2. SystemVue, in combination with best-in-class AWG and oscilloscope test families, provides a closed-loop, stimulus/
response modeling, and verification platform up to 32 GHz wide. It enables a versatile and cost-effective UWB system-level
approach in R&D.
Before downloading to test equipment, the simulated waveforms can be verified in SystemVue for
conformance to both frequency- and time-domain specifications. SystemVue also enables engineers to
incorporate custom signal processing intellectual property (IP) and create custom signals that integrate
C++ dynamic link libraries, MATLAB models, VHDL, and test vector data files.
Figure 5.3. An LFM design in SystemVue (upper image) is used to generate a UWB signal. The final block in the
system-level schematic captures the simulation result and downloads the waveform data into the 81180A AWG using
the parameters shown (lower right). Then, the 81180 (not shown) repeats the generated signal for hardware testing
For receiver component test, the same equipment is used to create an LFM UWB receiver signal for a
target with a 100 meter range and a 20 m/s velocity. The 89600B VSA software is used to capture the
LFM UWB receiver signal. The VSA measurement is configured using a stored “setup” file which is quickly
recalled at the simulation runtime.
Note that for either or OFDM type transmitter signals, the impulse or OFDM UWB source objects must
first be activated in the SystemVue simulation to generate the respective UWB signals. Like the LFM
UWB signals, these alternate types of UWB signals can be measured using the VSA software.
Figure 5.4. Shown here is a 1-GHz LFM UWB signal. The upper left image shows the 1-GHz wide radar spectrum centered at
10 GHz, while the log magnitude envelope versus time is shown just below it. The signal phase is shown on the upper right
graph. The 1 GHz-wide LFM chirp is displayed on the lower right graph.
Figure 6.1. Two types of phased-array radar, passive-array and active-array antenna systems, are shown here.
The platform solution also offers trade-off analysis, T/R module and antenna unit failure analysis, and
adaptive algorithm creation support. It features links to test equipment (e.g., a signal generator, arbitrary
waveform generator (AWG), and signal analyzer) for hardware testing, along with support for integrated
testing. The links allow data to be downloaded to an AWG for testing RF signals and hardware signals
to be acquired and sent back to simulation for post-analysis. A prime example of this platform solution is
PathWave System Design, (SystemVue).
Figure 6.2. This platform solution for AESA radar relies on simulation at its core, in this case, the SystemVue
simulation software from Keysight Technologies, Inc.
Even though “free space analysis” may be adequate to provide a general understanding of a radar
system, it is only an approximation. To accurately predict radar performance, the free space analysis
must be modified to include the effects of the earth and its atmosphere. Note that radar clutter is not
considered as part of this analysis because it almost always is assumed to be a distributed target that
can be dealt with separately by the radar signal processor.
• Clutter model
A clutter model is used to model the unwanted echoes in a radar system (Figure 6.5). The echoes are
typically returned from ground, sea, rain, animals/insects, chaff, and atmospheric turbulence, and can
cause serious performance issues with radar systems. Clutter can be best modeled using a statistical
approach that combines the probability density function (PDF) for clutter amplitude and clutter power
spectrum density (PSD). The PDF is used for the time-domain statistical property description, while
the PSD is used for the frequency-domain description. Both are suitable for describing the effects of
the radar environment. The K-clutter model is another important statistical model and is used for sea
and round clutters.
In the design in Figure 6.7, a signal source is followed by a Tx beamformer to specify a 16-x-16
rectangular array with beam direction at Phi=0 and Theta=0. Through a T/R module, a Tx array antenna
model is used to send out the defined signals. Then, an ideal transmitter is used, followed by a sink to
collect the transmission data. Next, post processing is used in an equation block and MATLAB 3D plots
are used in 3D and 2D (Figure 6.8).
– Source
– Tx Beamformer
– T.R Module
– 2D 3D Antenna
– Pattern Measurements
– MATLAB® Co-Simulation
RF Co-Simulation Challenge
Transmitter Test
How to account for
accurate RF at the
system-level
After running the simulation, the following waveforms can be observed, as shown in Figure 6.11: figure A
is an LFM transmission signal, figure B is the received signal (return target plus clutter) hidden in strong
clutter and noise, and figure C is the return target with pulse compression hidden; MTI and MTD are
recovered and detected. In figure D, the return target through the signal processor (MTI and MTD)
is recovered.
In Figure 6.12, two 3D displays are plotted to show the detected signal in the Range-Doppler plane. The
first one shows the detected signal without any signal processing, while the second shows the signal with
signal processing.
Using the template in Figure 6.10, the user can quickly put together a phased-array radar system
for algorithm design, with a phased-array antenna and advanced signal processing. A cross-domain
architecture is also supported, and complex environments and advanced measurements are considered.
This allows the user to insert a custom algorithm and re-use their Intellectual Property (IP) for design
and validation.
The template is easy to use because the design schematic, measurement results, and estimated
parameters are all shown at the top level of the screen, eliminating the need for the engineer to have to
track down results from various places. Key specified parameters can be easily modified using sliders at
the same top level. The engineer simply makes one click and the results populate the screen, including a
3D plot, measurements, and parameter estimations.
To create a custom design, engineers need not start from scratch. Instead, the example design in Figure
6.10 can be used as a template. The user simply modifies the template by changing parameters and
replacing models with existing models in the radar library or by importing custom models into the design.
Regardless of the radar system-level test solution utilized, core software is needed to integrate all test
software and hardware and to automate the test.
SystemVue integrates all test instruments together as a test system that provides complex radar test
signals with environment scenarios to the Device-Under-Test (DUT), to capture DUT outputs and then
synchronize signals, post-processing the result to extract more information and obtain more advanced
measurements, such as detection rate, false alarm rate, and imaging analysis. Without integration
and synchronization, each instrument would function on its own, making it impossible to perform
complex tests.
SystemVue is a prime example of a platform solution. There are several key benefits to using it to design
and test phased-array systems. For example, trade-off analysis can be used to significantly reduce cost.
Adaptive algorithms can be used to fix amplitude/phase errors for calibration purposes. SystemVue
also provides emulation environments that account for clutter and Interference. Lastly, validation can be
performed based on measured antenna patterns, Tx measurements such as waveform, spectrum, time-
side-lobes; and Rx measurements such as detection rate and false alarm rate, which helps reduce the
design cycle.
Using the design templates provided in the model based SystemVue platform users can:
• Quickly put together a new system-level proposal by creating, with a higher level of confidence, an
integrated RF and DSP architecture design.
• Easily integrate IP written in different languages (e.g., C++, MATLAB, ADS, and HDL) at the system
level for a radar/Electronic Warfare (EW) system.
• Easily create complex radar/EW scenarios and verify systems with environment scenarios (e.g.,
clutter, jamming/deception, interference, and RCS) to meet complex system specifications and
perform virtual flight testing to reduce the high cost of the field test.
• Utilize an integrated test system.
Unfortunately, signal processing algorithm creation is complicated, with all resulting algorithms needing
to be verified in the complex external environment. Greater interaction between algorithms and signal
sources provides a realistic radar environment that allows early maturity and confidence in the radar
system. Creating the advanced algorithms, therefore, requires the availability of a sufficient set of models
for the various radar elements and functions, including signal generation, transmission, antenna, T/R
switching, clutter, noise, jamming, receiving, signal processing, and measurements.
Hardware simulation
Scenario-based verification is typically performed using expensive, high-end hardware simulators that
create real-time scenarios of realistic fidelity. Unfortunately, such simulators are not available early enough
in the design process (during the algorithm stage before hardware implementation), to provide meaningful
insight for the algorithm developer. They also don’t integrate well with model-based design practices or
provide the level of scripting needed in early development for low-level, block-level verification. Because
simulation takes place later in the design cycle, making design changes at this stage can be both costly
and time-consuming. Design engineers can benefit from earlier algorithmic validation of their key ideas.
Field testing
Another way to generate the required signals is to physically go into the field to make environmental
measurements of the radar hardware operating under realistic conditions. While there are many reasons
for utilizing this approach, because it comes late in the design process it rarely connects to the original
algorithmic development environment. In addition, this method is costly, sometimes inconvenient,
and cumbersome.
Signal
g ggenerators
Signal
processor
hardware
Signal analyzers
logic analyzers, scopes
Figure 7.2. The W4521 Aerospace/Defense Library and SystemVue system platform.
Figure 7.3. SystemVue combined with the optional W4521 Aerospace/Defense Library is a platform for radar
system design.
As shown in Figure 7.4, radar components can be connected to instruments and test hardware based on
the created algorithm.
To better understand how the W4521 Aerospace/Defense Library and SystemVue platform generate radar
test signals, consider the test setup in Figure 7.5. Here, an interface model (Sink) in SystemVue connects
to one of the Keysight ESG/PSG/MXG families of vector signal generators. SystemVue generates radar
waveforms in simulation that are automatically downloaded at run-time into the instruments for use as RF/
IF test signals during hardware testing. Waveforms captured by the vector signal analyzer can then be
automatically returned to SystemVue. Acquired waveforms can be further processed in SystemVue.
SystemVue DUT
Signal generator Signal analyzer
The SystemVue platform provides an interface to a range of test equipment to help verify the implemented
hardware (compared to the original pure algorithm). Supported algorithmic reference sources
include radar signal generation with RCS, clutter, jamming, and Doppler frequency offset. Supported
measurements include waveforms, spectra, detection rate, and false alarm rate (FAR).
Some of the test equipment that can be connected to SystemVue includes signal analyzers, logic
analyzers, and scopes (e.g., Keysight’s Infiniium 90000 X-Series high-performance oscilloscope).
Signal generators
Signal
processor
hardware
Signal analyzers
logic analyzers, scopes
Figure 7.6. This diagram shows how a LFM radar transmission signal can be generated in SystemVue and then
downloaded to Keysight’s ESG/MSG/PSG vector signal generator. The LFM transmission signal can be used for
radar component testing.
Signal generators
Signal
processor
hardware
Signal analyzers
logic analyzers, scopes
Figure 7.7. This diagram depicts how to generate the radar receiver test signal. Users can use the SystemVue radar
Target model to specify target range, velocity, and radar cross-section models. The receiver signal can be used to
test radar receiver detection algorithms.
Signal generators
Signal
processor
hardware
Signal analyzers
logic analyzers, scopes
Figure 7.8. The resulting radar received signal with RCS and clutter describes the radar environment details.
Signal generators
Signal
processor
hardware
Signal analyzers
logic analyzers, scopes
Figure 7.9. Here, the radar received signal has not only RCS and clutter but jamming as well for describing the
radar’s complex environment details.
The W4521 can also be used to generate wideband and ultra-wideband signals using the setup shown
in Figure 7.10. In this case, SystemVue generates radar baseband I/Q data that is downloaded to the
N6030 or N81180 arbitrary waveform generator—a 4.2 GSa/s arbitrary waveform generator with a
12-bit vertical resolution for complex real-world signals. The wideband radar signals formed in the
N6030 or N81180 are then sent to the wideband PSG I/Q modulator inputs, which in turn sends RF
wideband signals to the DUT to test the RF radar components. Next, the output DUT is captured using
the Infiniium 90000 X-Series scope and sent back to the PC for either direct analysis using the VSA
software or for further analysis using SystemVue. A generated radar received LFM signal with RCS is
shown in Figure 7.11.
Figure 7.11. This wideband signal (radar received LFM signal with RCS) was
generated using SystemVue, the N6030, and PSG. The signal was measured using
VSA software.
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While final operational verification may still be necessary for contractual or legal reasons, “virtual flight
testing” is a faster, more cost-effective alternative for earlier stages of R&D, such as algorithm and
countermeasures development. In a simulation, complex radar systems can be evaluated hundreds of
times in an hour, using the same or varied scenarios for each run (flight), and at significantly less cost than
a single hour on a flight range. By evaluating realistic flight-testing scenarios before or in place of physical
flight testing, engineers can validate electronic warfare algorithms earlier, saving both time and money.
Simulation
Open modeling – Integration capability
– Existing modeling templates – Connection to leading RF EDA flows
– Custom models: C++,.m, HDL – Performance evaluation for RF & BB
– Model import: MATLAB, ADS, – Advanced measurement
SignalStudio, VSA, STK – Detection rate, flase alarm rate
– Recorded data System Vue – Dynamic range
– Advanced dataflow engine – Parameter estimation
– Co-simulation
– RF envelope simulation
– Model libraries
– Integration of SW, HW
– HDL simulation
– FPGA implementation
HW implementation HW test
– Existing modeling templates – Link to VSG/VSA/Scope/LA
– DSP algorithm creation – Integration/Controlling/Automation
– Fixed point simulation – Custom waveform generation
– HDL code generation – Advanced RF & BB measurements
– FPGA synthesis – Parameter estimation
– Troubleshooting
Figure 8.2. With SystemVue, PHY development is enabled across RF and baseband domains and that development
can easily transition from algorithms into hardware verification.
The basic STK process is to define a system link scenario with moving transmitter (Tx), receiver (Rx),
and interferer objects. The scenario is then analyzed to obtain system metrics as a function of time (e.g.,
range, propagation loss, RCS, noise bandwidth, and Rx signal strength). Almost everything in STK can
be controlled by third-party tools. However, the software has no inherent ability to process signals from
radar/communications applications through the dynamic environment link. Linking STK with SystemVue
allows arbitrary Tx/Rx radar/communications systems to be modeled with the STK dynamic environment
link characteristics. During virtual flight testing, SystemVue models the radar system including waveform
LFM STK
Transmitter Receiver Signal processing Pd
link
SystemVue: TX/RX radar signal processing chain, with parameterized fading PROBABILITY
OF DETECTION
Figure 8.3. One application of the interface between SystemVue and STK is the ability to do virtual flight testing
of radar systems, including DSP, RF impairments, jamming, and interference as an aircraft encounters targets and
clutter along a virtual flight plan.
Measurements
Tx waveforms Targets
MATH
.m Antenna
Figure 8.4. In this multiple target signal emulation example, test entry comes from a custom user interface with
hardware text flavor. The user does not have to open a simulation schematic. This approach integrates both signal
generation and signal analysis.
The interface presented in this chapter started with the commercially available SystemVue and STK
environments and then used their application programming interfaces (APIs) to link them together.
When it comes to testing radar system performance, extensive flight testing using physical aircraft is a
prohibitively expensive and time-consuming proposition. Virtual flight testing, made possible by the flexible
interfaces between the SystemVue and STK software tools, now offers an economical alternative for R&D
validation. This allows measurement hardened algorithms to be deployed quickly, and a minimum of true
operational testing to be done with greater confidence, to save costs. By closing the loop between lab-
based virtual testing (simulation and test equipment) and operational testing, virtual testing can be made
even more effective.
RF Component Test
and Verification
Introduction
As radar and EW systems become ever more sophisticated, their demanding performance
requirements flow downstream to produce challenging specifications at the component level,
with a need to characterize at higher frequencies, wider bandwidths, lower noise levels, and with
complex signals.
This section addresses the measurement fundamentals of Distortion, Noise, Phase Noise,
and S-parameters. We also cover the “Active-Hot” characterization of nonlinear devices such
as amplifiers, introducing the concept of X-parameters and the benefits. Finally, we look at
characterizing materials that may plan to be used in radomes or for RF absorption, in and around
your radar and EW system.
Harmonic Distortion
The amplitude transfer characteristics of a circuit or device cannot precisely track the input signal. The
amplitude shifts generate higher frequency components at integer multiples of the input signal.
Using a continuous wave (CW) tone as an input signal and measuring the output signal with a signal
analyzer is the most straightforward method for measuring harmonic distortion; see Figure 9.1. A DUT
might be an RF amplifier or mixer.
Amplifier
Amplitude
∆2
Fi Fo
∆3
Mixer
Frequency
Fo 2Fo 3Fo
Figure 9.1. Harmonic distortion measurement setup
Third-Order Intermodulation
Two-tone, third-order intermodulation (TOI) distortion is a common test for RF distortion measurements.
When two or more signals are present in a nonlinear system, they can interact and create additional
components at the sum and difference frequencies of the original frequencies and at sums and
differences of multiples of those frequencies. Figure 9.3 below shows the two-tone third-order
Intermodulation measurement setup. The device under test could be an amplifier or a mixer.
F1
Fo
SG #1 Signal
DUT Analyzer
F2
SG #2
PF1 PF2
Plower_intermod Pupper_intermod
Amplifier
Amplitude
F1+F2
2F1-F2 2F2-F1
Mixer ...
3F1-2F2 3F2-2F1
Frequency
F2-F1 F1F2 2F1 2F2
For test efficiency, a vector signal generator alone can be used to generate two test tones using the
internal baseband generator to save costs. Keysight offers an advanced correction routine that can
suppress distortion products generated by the signal generator itself or an external pre-amplifier. Swept
IMD measurement of amplifiers and frequency converters can also be performed using a VNA with an
internal combiner and two internal signal generators. Wide receiver dynamic range and high-quality signal
sources minimize the measurement errors found in traditional setups.
Figure 9.4. PNA-X with S93087B IMD measurement simplifies setup and provides guided calibration.
A third RF source can be added to the 4-port PNA with the same low-phase noise performance as the
two internal RF sources. You can use it as the local source of the DUT for two-tone frequency converter
measurements or two-stage frequency converter measurements. It eliminates the need for an external
signal generator. You can also use it as an independent analog signal generator. For example, it can
be used as the reference signal for a DUT that requires the external reference clock signal, and as the
reference signal of another measurement instrument.
The 4-port PNA-X can be equipped with extremely low phase noise performance on all internal signal
generators making it ideal for IMD measurements where the two-tone stimulus signals must be close to
each other.
IMD IMD
Input Output
Figure 9.5. Two-tone IMD mixer measurement utilizing three high-performance analog signal generators built into
the 4-port PNA-X
Compression
The most common measurement of amplifier compression is the 1-dB compression point. This is defined
as the input power (or sometimes the corresponding output power) that results in a 1-dB decrease in
amplifier gain referenced to the amplifier’s small-signal or linear gain.
The example in Figure 9.3 shows an amplifier’s output versus input power measured at a single frequency.
The amplifier has a linear region of operation at which gain is constant regardless of power level. The gain
in this region is called small-signal gain and is proportional to the slope of the power response.
As the input power continues to increase, the point on the curve at which amplifier gain begins to
decrease defines where the compression region begins. The amplifier’s output is no longer sinusoidal in
this region, and some of the output appears in harmonics rather than only in the fundamental frequency
of the signal. As input power is increased, even more, the amplifier becomes saturated, and output
power remains constant. At this point, the amplifier’s gain drops to zero, and increases in input power will
typically not produce increased output power.
Saturated
output power
Output Power (dBm)
Compression
region
Linear region
(slope = small-signal gain)
S1 / Ni
F=
SO / NO
Thus, the noise figure represents the decrease (or degradation) in the signal-to-noise ratio as the signal
goes through a device or network. A perfect amplifier would amplify the noise at its input along with the
signal, maintaining the same signal-to-noise ratio at its input and output (the source of input noise is often
thermal noise associated with the earth’s surface temperature or with losses in the system). A realistic
amplifier, however, also adds some extra noise from its components and degrades the signal-to-noise
ratio. A low noise figure means that very little noise is added by the network.
Noise figure can be applied to both individual components such as a single transistor amplifier, or a
complete system such as a receiver. The overall noise figure of the system can be calculated if the
individual noise figures and gains of the system components are known.
+28V
Noise
Source
DUT
Figure 10.1. In the Y-factor method, the central element of the noise source is a diode, driven to an avalanche
condition to produce a known quantity of noise power. The diode is not a dependable 50 Ω impedance, so it is
often followed by an attenuator to improve impedance match with the presumed 50 Ω DUT.
The most accurate measurements, especially those made under unfavorable conditions, are made using
the cold source method. This method is especially valuable for millimeter-frequency measurements or
when the input and output match of the DUT is poor—that is, substantially different from the 50 ohms
assumed for instruments, cables, and accessories.
The vector calibration techniques of a VNA can account for the multiple potential mismatch errors in the
measurement configuration. This reduces what is normally the largest single source of error in noise figure
measurements. Impedance mismatches result in erroneous power measurements, which directly affect
noise figure calculations.
Common sources of mismatch include the use of wafers, probes, or fixtures (or any type of non coaxial
connection); mismatch between the DUT and noise source or analyzer; and test system signal switching.
Mismatch also generally degrades as frequency increases, so the cold-source method is often the best
approach for millimeter-frequency measurements.
In practice, though, most noise figure measurements are made at RF and microwave frequencies, with
coaxial connections and a reasonable impedance match between the noise source, analyzer, and DUT.
For these measurements, cost and convenience lead many RF engineers to choose the Y-factor method.
It takes advantage of the signal analyzer that is more likely to be on their bench. These are usually less
expensive than VNAs and can provide a good combination of accuracy and measurement cost.
With these tradeoffs in mind, it important to pay some attention to the unfavorable conditions that can
make measurements difficult or substantially increase error:
• DUTs with a combination of low gain and very good noise figure: Such devices will generate very
little incremental noise. This may result in a signal at the analyzer input that is difficult to measure
accurately because it is very close to the analyzer’s noise floor.
• Conducted or radiated interference: Analyzers have no way of separating power that is due to
either conducted or radiated interference. If possible, measurements should be made in shielded
enclosures, with mobile phones and networks excluded, and on battery power, if practical.
• Complex or lengthy connections or adapters: Cabling and adapters can spoil impedance match and
attenuate the noise power that is supplied or measured. Custom cabling, which eliminates the need
for adapters or extra length, can be an inexpensive way to improve measurement performance and
reduce error.
• Inconsistent connections between calibration and measurement steps: Cable and connector care
and connection techniques, including proper torque, are especially important.
Signal/spectrum analyzers
Adding an optional noise figure measurement application to a versatile signal or spectrum analyzer is
an economical way to add noise figure capabilities. The accuracy and frequency range of this solution
depends on which base instrument it is installed. Signal/spectrum analyzers use the Y-factor method to
measure noise figure. Preamplification, either external or internal, often improves accuracy.
When selecting an instrument to meet your needs, it is first important to select one that will cover the
frequency range of your DUT.
Absolute 1-Port
DUT Absolute phase noise measurements for DUTs with one
Measurement output port, such as oscillators or signal generators
Receiver
with internal references, require only a phase noise
measurement receiver to measure the output of the DUT
since the stimulus source is internal.
Note that all three residual two-port measurement modes also apply to devices with multiple outputs, if
the outputs can be measured one at a time.
The direct spectrum method is the most convenient and lowest cost solution since it is included with
signal and network analyzers and does not require extra equipment. But due to the presence of the DUT’s
carrier signal, the measurement sensitivity is limited by the phase noise of the analyzer, typically set by the
dynamic range of the digitizer.
Only report
phase noise
Suppress
amplitude
noise
ag
M
Phase
0 deg
Figure 11.3. Phase noise direct spectrum method by employing vector analyzer removal of amplitude noise.
To achieve quadrature for the absolute PLL reference source phase noise measurement, a reference
source is locked to the DUT by a PLL that drives the output voltage of the double-balanced mixer to 0V.
The absolute PLL phase noise measurement block diagram utilizing the carrier removal method is shown
in Figure 11.4.
Power Power
Phase Detector
Frequency
Reference signal
at same carrier
frequency as
DUT
Figure 11.4. PLL reference source is used to remove the carrier for an absolute phase noise measurement utilizing
the carrier removal method.
Stimulus
LO In
sin (ωt)
sin (ωt)
1 channels with SSB Cal
Table 11.1. Theoretical two-channel cross-correlated sensitivity limits vs. DUT output power.
For faster measurement time of improved sensitivity measurements, Keysight’s PNTS provides the
additional flexibility to use high performance external references and stimulus sources, including
duplicates of one-port DUTs. Table 11.2 shows the improvement of sensitivity with number of cross-
correlations.
Table 11.2. Phase noise measurement sensitivity improvement above the thermal noise floor vs. number of
cross-correlations.
A signal analyzer-based phase noise measurement solution typically offers the lowest cost option for
absolute measurement. Oscilloscopes can measure very wide (multi-GHz) offset on high-frequency
carriers. Modern VNAs incorporating high-quality signal sources can make absolute and residual
measurements at offsets to 10 MHz. A dedicated signal source analyzer such as the Keysight Signal
Source Analyzer (SSA) provides high performance and efficiency for measuring oscillators and phase
locked loops (PLLs) at offsets to 30 MHz. A Phase Noise Test System is more complex but offers the
greatest flexibility and performance including measurement of pulsed signals.
Attribute Infiniium N9068A Phase S930317B PNA E5052B Signal N5511A Phase
UXR, MXR Noise X-Series and PNA-X Source Analyzer Noise Test
Oscilloscopes Signal Analyzers Network System using 2
Measurement Analyzers E8257D Option
Application Phase Noise UNY PSGs
Measurement
Application
Absolute Yes Yes Yes Yes Yes
Measurements
Residual No Yes, but with Yes No Yes
Measurements external stimulus
source and
subtraction
Frequency DC to 110 GHz 3 Hz to 110 GHz; 10 MHz to 125 10 MHz to 26.5 50 kHz to 40
Range >>110 GHz with GHz GHz; GHz;
external mixer >>110 GHz with >> 110 GHz with
external mixer external mixer
Frequency 1 KHz to 55 GHz 1 Hz to 10 MHz 0.1 Hz to 10 1 Hz to 100 MHz 0.01 Hz to 160
Offsets MHz MHz
Noise Floor at 10 -121 dBc/Hz -134 dBc/Hz -140 dBc/Hz -137 dBc/Hz -170 dBc/Hz
GHz carrier and (after 1 cross (after 1 cross
10 kHz offset correlation at 1 correlation at 1
Hz offset) Hz offset)
Cross Yes No No Yes Yes
Correlation
VCO Yes (requires No No Yes Yes (FM
Measurements external DC Discriminator
source) Method)
Baseband Noise Yes No No Yes Yes
Measurements
AM Noise Combined Combined Combined Combined Separate Input
Measurement
Other Oscilloscope Signal Analyzer Network Signal Analyzer None
Measurements Analyzer (subset)
Measurement Moderate Low Low Low High (external
System (external (all internal) (all internal) (all internal) splitters and
Complexity splitters) signal sources)
Method Direct Direct Direct Carrier Carrier
Spectrum Spectrum Spectrum Removal Removal
Figure 11.7. Keysight X-Series signal analyzers phase noise measurement application.
Keysight PNA Microwave Network Analyzers are fitted with enhanced low phase noise Direct Digital
Synthesis (DDS) stimulus sources. A dedicated phase noise measurement application supports absolute
phase noise measurements and residual noise measurements, without the need for external excitation
sources. The phase noise measurement sensitivity is -97 dBc/Hz1 at 100 Hz offset from a 10 GHz carrier.
The PNA is architected with multiple internal DDS sources (RF and LO sources) and multiple receivers.
The internal sources are all correlated. When you make 2-port or 3-port device measurements, the
sources cancel the phase noise and provide better measurement sensitivity, especially at close-in
offset frequencies. The sensitivity of frequency converter embedded-LO phase noise measurement is
determined by the phase noise of the DDS source at the carrier frequency of the embedded LO. When
the PNA provides both IF and LO or RF and LO a mixer under test, the phase noise cancellation is even
larger and makes the sensitivity drastically high, -86 dBc/Hz1 at 1 Hz offset from a 10 GHz carrier.
The N522xB PNA and N524xB PNA-X with S930317B/S930321B phase noise measurement application
simplifies your active device measurement configuration by using the same cable connection as other
measurements such as S-parameters, noise figure, gain compression, IMD, group delay, and reduces
the total test time significantly. Higher frequency models of the PNA like 67 GHz N5247B PNA-X and 125
GHz N5291A allow you to perform the phase noise measurement at millimeter-wave frequencies without
using harmonic mixers.
Figure 11.11. Keysight phase noise test system with two PSGs.
The second architectural feature that PNTS has that minimizes the cross-correlation time penalty is the
ability to use any electronic frequency tunable reference. This allows the use of the best available signal
generators today (or even use copies of the DUT as references) and gets better performance in the future
as newer and higher-performance signal generators come to market. This reduces the cross-correlation
time penalty because lower phase noise (better performance) references add less uncorrelated noise to
the measurement and thus require fewer correlations (and less time) to suppress this lower uncorrelated
reference noise and allow the user to observe their device’s true phase noise.
Pulsed and residual phase noise measurements are especially helpful for pulsed radar systems. The
N5511A can perform residual measurements on pulsed RF carriers as well as absolute measurements on
pulsed carriers. The phase detector modules in the N5511A come equipped with multiple internal PRF
(pulse repetition frequency) filters; these are low pass filters (LPFs) because all analog and digital signal
processing performed after the phase detectors in PNTS is performed at baseband. However, if there is
a measurement requirement for LPFs with different cutoff frequencies than the ones provided, N5511A
offers the flexibility of adding user-supplied external filters.
Keysight offers the broadest range of network analyzer models and form factors — from
the portable FieldFox to the highly integrated PNA which can be configured with three high-
performance, low phase-noise signal generators.
The number of S-parameters for a given device is equal to the square of the number of ports. For
example, a two-port device has four S-parameters. The numbering convention for S-parameters is that
the first number following the S is the port at which energy emerges, and the second number is the port
at which energy enters. So, S21 is a measure of power emerging from Port 2 as a result of applying an
RF stimulus to Port 1. When the numbers are the same (e.g. S11), a reflection measurement is indicated.
Incident S 21 Transmitted
a
1 S 11 b2
Reflected DUT
S 22
b1 Port 1 Port 2 Reflected
a2
Transmitted S 12 Incident
b 1 = S 11 a 1 + S 12 a 2
b 2 = S 21 a 1 + S 22 a 2
S 21 b2
a1 Incident Transmitted
S 11 Z0
Forward
Reflected DUT load
b1 a2 = 0
Reflected b1 Reflected b2
S 11 = = a 2 =0 S 22 = = a1 =0
Incident a1 Incident a2
Transmitted b2 Transmitted b
S 21 = = a 2 =0 S 12 = = 1 a1 =0
Incident a1 Incident a2
a 1= 0
b2
Z0 S 22
DUT Reverse
load Reflected
a2
Transmitted S 12 Incident
b1
When the output power of the AUT exceeds the input compression level of the analyzer’s receiver,
some type of attenuation is needed to reduce the output level. This can be accomplished by using
couplers, attenuators, or a combination of both. Care must be taken to choose components that can
absorb the high power from the AUT without sustaining damage. Most loads designed for small-signal
use can only handle up to about one watt of power. Beyond that, special loads that can dissipate more
power must be used.
The frequency-response effects of the attenuators and couplers can be removed or minimized by using
the appropriate type of error-correction. One concern when calibrating with extra attenuation is that the
input levels to the receiver may be low during the calibration cycle. The power levels must be significantly
above the noise floor of the receiver for accurate measurements. For this reason, network analyzers that
have narrowband tuned receivers are typically used for high-power applications since their noise floor is
typically 90 dBm, and they exhibit excellent receiver linearity over a wide range of power levels.
Ref In
Coupler
AUT
Preamp High-power
load
Network analyzer
RF amplifier Attenuator
Attenuator
"R"
Channel in
Coupler
Switch
Attenuator
DUT
Power
divider
Attenuator
Attenuator
The topic of pulsed-RF testing is often focused on measuring the pulses themselves. This is critical,
for example, in evaluating radar system performance and effectiveness. When measuring components,
however, the pulses are merely the stimulus, and the VNA measures the effect that the device under
test (DUT) has on the pulsed stimulus. Any non-ideal behavior of the pulses themselves is removed from
the measurement since the VNA performs ratioed measurements. This means that each S-parameter
measurement compares a measured reflection or transmission response with the incident signal,
providing ratioed magnitude and phase results. Figure 12.6, shows the configuration for measuring
Incident
DUT
Reflected Transmitted
Source
Signal
separation
Receiver/detector
Processor/display
Point-in-
Pulse
Data acquired at uniformly spaced
time positions across pulse
Pulse
Profile
Another important measure of a pulsed RF signal is its duty cycle. This is the amount of time the pulse
is on, compared to the period of the pulses. A duty cycle of 1 (100%) would be a CW signal. A duty
cycle of 0.1 (10%) means that the pulse is on for one-tenth of the overall pulse period. For a fixed
pulse width, increasing the PRF will increase the duty cycle. For a fixed PRF, increasing the pulse width
increases the duty cycle. The duty cycle will become an important pulse parameter when we look at
narrowband detection.
Figure 12.9. Pulse width and receiver bandwidth with wideband detection in time and frequency domain
Keysight has developed a novel way of achieving narrowband detection using wider IF bandwidths than
normal, by using unique “spectral nulling” and “software gating” techniques. These techniques let the user
trade dynamic range for speed, with the result almost always yielding faster measurements than those
obtained by conventional filtering.
The advantage to narrowband detection is that there is no lower pulse-width limit, regardless of how
broad the pulse spectrum is, most of it is filtered away, leaving only the central spectral component.
The disadvantage to narrowband detection is that measurement dynamic range is a function of the duty
cycle. As the duty cycle of the pulses becomes smaller (longer time between pulses), the power of the
central spectral component becomes smaller, resulting in less signal-to-noise ratio as shown in Figure
12.10. Using this method, the measurement dynamic range decreases as the duty cycle decreases.
This phenomenon is often called “pulse desensitization” and can be expressed as 20*log (duty cycle) in
dB. Modern VNAs employs several unique features to minimize this effect, resulting in considerably less
degradation in dynamic range.
Figure 12.10. Duty cycle (time domain) versus signal-to-noise ratio of center spectrum (frequency domain)
By default, network analyzers consider the DUT everything beyond the test ports. This consideration
means the network analyzer’s reference plane is at the test ports. Everything beyond the reference plane
is included in the measurement.
The two most common methods of calibration are Thru, Reflect, Line (TRL), and Short, Open, Load, Thru
(SOLT). These methods are different combinations of impedance and transmission measurements used to
characterize the cables and fixtures for calibration.
These calibration techniques involve connecting standards with known properties to the measurement
setup in place of the DUT. The network analyzer can apply corrections for cables and connectors by
comparing what it measures to the values of the standards.
Traditionally, calibration is performed with mechanical standards. Operators would individually make
each connection and let the instrument take a measurement. Full two-port calibration requires seven
mechanical connections. This process is time-consuming and creates possibilities for user error.
Electronic calibration modules can replicate the different types of loads with just one connection.
Electronic calibration is fast, repeatable, and limits wear on connectors.
CalPod calibration refresh modules are in-situ devices that can remove the effects of environmental
variations in test cables, connectors, adaptors, and switch matrices to re-establish a valid calibration at
the measurement plane, assuring your device’s performance is not affected by these other environmental
variations. Easily refresh a calibration at the push of a button, without removing the DUT, and without the
physical connection of standards.
Powerful, fast, and accurate automatic fixture removal (AFR) can handle a variety of measurement needs
such as:
Keysight AFR is the fastest way to de-embed a fixture from the measurement.
Figure 12.11. The S93007B five-step wizard guides you through the process to characterize your fixture and
removes it from your measurement.
A B
2-port VNA
Port 1 Port 2
24-port simple
switch-tree test set
High-volume tuning and testing of multiport devices can be greatly simplified by using a multiport network
analyzer, or a multiport test set with a traditional two-port analyzer.
A single connection to each port of the device under test (DUT) allows for complete testing of all
transmission paths and port reflection characteristics. Multiport test systems eliminate time-consuming
reconnections to the DUT, significantly increasing efficiency. Furthermore, the risk of misconnections
is lowered, operator fatigue is reduced, and the wear on cables, fixtures, connectors, and the DUT
is minimized.
A B
2-port VNA
Port 1 Port 2
External switches significantly affect measurement performance. The switching hardware is beyond the
VNA’s directional couplers that sample the test signal. Interference from the switching hardware creates a
mismatch between the signal reaching the DUT and what the VNA measures. Calibration can help, but a
switch matrix can never achieve the dynamic range, temperature stability, and trace noise performance of
a standalone VNA.
Switch matrices provide a low-cost solution for multiport testing, but require significant operator
intervention for setup, calibration, and adjusting configurations. Modern multiport devices demand faster
and more accurate measurements than a switch-based solution.
True multiport setups maintain their measurement performance no matter how many ports you use. As
frequencies trend higher and margins for error shrink, your test setup’s measurement performance can
significantly impact your yield.
Removing switches from multiport measurements does more than speed up the measurements. Setups
without switches provide full VNA measurement performance. Attenuation from the switches degrades
the dynamic range of switch-based multiport measurements, particularly at higher frequencies. By 20
GHz, switch-based solutions retain only half the dynamic range of multiport solutions.
Multiport setups require significant calibration time. Switched test sets with solid-state switches are
easily affected by temperature and must undergo frequent calibration to ensure accurate measurements.
Calibration downtime drastically impacts throughput; a system with longer calibration intervals reduces
your test time and your cost of test.
24
Number of ports on DUT
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• Transmission measurements include RF to IF transfer function viz. conversion loss or gain, group
delay, derivation from linear phase, and port to port isolation.
• Reflection measurements including return loss and VSWR.
• Measurements that characterize the distortion added by the conversion process include
intermodulation distortion, conversion compression, and undesired mixing products.
A radio receiving system requires that the mixers within it have well-controlled amplitude, phase,
and group-delay responses. Due to the nature of the required measurements, a stimulus-response
ratioed measurement technique, such as S-parameter analysis, is ideal for most of the above
measurements. Unfortunately, since these components have different input and output frequencies
traditional S-parameter and network analysis techniques used for non-frequency translating
devices are not valid.
Reference Measurement
receiver receiver
R2 B
Splitter
Signal separation
Source LO
R1 A
Reference Measurement
receiver receiver
This technique is referred to as frequency offset and is an option on many vector network analyzers.
This requires additional hardware and firmware control. Traditional techniques used for calibration and
error correction are not valid with frequency-offset hardware changes because the error terms cannot be
maintained in a constant phase relation. A modified frequency-offset error model is needed to describe
the interactions of error signals in this environment. Frequency Offset Mode (FOM) provides the capability
to have the VNA Sources tuned to frequencies that are different (offset) from the VNA Receivers. Further,
modern mixers and frequency converters also push the limits of a network analyzer’s capabilities. Getting
consistent measurements for operating bandwidths as wide as 3.2 GHz at 29 GHz often requires
averaging multiple sweeps to reduce the noise.
The frequency converter application (FCA) is an option offered with the microwave PNA Series network
analyzers and is designed to address both the calibration and measurement difficulties for testing
frequency converter devices. FCA offers an easy-to-use graphical user interface and advanced calibration
techniques, including the scalar-mixer calibration, scalar-mixer + phase (SMC+Phase), and vector-mixer
calibration (VMC).
SMC can be used to characterize the conversion loss magnitude and reflection parameters of mixers. A
conversion loss magnitude measurement is a ratio of the output power (at the output frequency) to the
input power (at the input frequency). The calibration is based on a combination of port and device match
characterization and power meter measurements. With SMC, the input and output power levels are
accurately determined by calibrating the network analyzer with a power meter, thereby transferring the
accuracy of a power meter to the network analyzer. By using the network analyzer’s one-port calibration
ability, the port and device input and output reflection coefficients are measured. Using the known vector
reflection coefficients of the test port, the device, and the power sensor, SMC corrects for mismatch loss.
Since SMC is referenced to a traceable standard (power sensor/meter measurements), it provides the
best-specified measurement of conversion loss magnitude.
VMC offers measurements of conversion loss magnitude, phase, and absolute group delay by using a
combination of calibration standards (such as short, open, load, or ECal), and a “calibration mixer/IF-filter”
pair during calibration. Vector-mixer calibration is based on a modified two-port error model, however,
the steps and standards used to determine the error terms differ from the traditional two-port calibration.
In the case of a frequency-translating device, the procedures differ because the input and output
frequencies are different and additional calibration steps are required. In VMC, the calibration standards
are still used to determine the directivity and match error terms. A “calibration mixer/IF-filter” pair is
used as a new standard to determine the transmission tracking term. A calibration mixer that is assumed
to be reciprocal, is characterized for input match, output match, and conversion loss (both magnitude
and phase).
SMC+Phase combines the simplicity of SMC with the phase and delay measurement capability of
VMC and eliminates the need for reference and calibration mixers for phase or group delay testing.
SMC+Phase can also be used to measure converters with embedded LOs that are difficult or impossible
to access. This technique significantly simplifies and reduces the cost of the measurement test setup.
Power
sensor
Calibration
VMC mixer/filter
SMC
Reference
mixer
ECal
DUT module DUT
The VMC technique delivers the most accurate phase and absolute group delay measurements,
calibrates the test system’s transmission phase response, and provides mismatch correction at the input
and output of the DUT. However, the technique has several inherent drawbacks. It is more complicated
and requires more external components than SMC as two additional mixers are needed for reference
and calibration. VMC uses a characterized mixer as a calibration thru standard along with the usual
open, short, and load standards, and removes magnitude and phase errors for transmission and
reflection measurements. An external reference mixer is used as a phase reference but is not needed for
phase locking the source and receivers with a frequency offset, as offset sweeps are achieved with the
instrument’s internal sources. As both calibration techniques perform corrections for mismatches, external
attenuators are rarely needed. While VMC provides the ability to evaluate deviation from linear phase and
absolute group delay, mixers that match the frequency range of the DUT are harder to obtain above 26.5
GHz as are filters with acceptable performance. In addition, many mixers may be required to evaluate
DUTs with diverse frequency plans, so several calibrations must often be performed to cover all bands.
The SMC+Phase technique, as shown in Figure 13.3, uses simple setup and calibration, requires no
external signal source or reference and calibration mixers, provides the most accurate conversion-loss/
gain and phase/delay measurements, and removes mismatch errors during calibration and measurement.
It replaces VMC for most frequency converter measurement applications. In contrast to VMC that
uses ratios of test and reference signals at the same frequency (thus the required reference mixer), the
SMC+Phase technique ratios single-receiver phase measurements performed at the DUT’s input and
output. It also replaces the calibration mixer with a comb generator as a phase standard, and magnitude
Power
10 MHz sensor
Comb
Gen
SMC+Phase ECal
DUT module
The phase-measurement technique employed by SMC+Phase relies on the phase coherency of the
signal sources in the instruments’ DDS architecture to eliminate the reference mixer Figure 13.4. This is
an advantage of the PNA and PNA-X over other VNAs that do not have the new DDS sources. The PNA
and PNA-X feature extremely low phase noise and spurious emissions to help you measure complex
components faster. DDS sources maintain relative phase coherence across a frequency sweep by
digitally incrementing the phase accumulators and by employing synchronous IF detection and digital
signal processing.
The calibration performed during the first step adjusts the VNA receivers for absolute power using a
power sensor and phase using a comb generator. It is typically performed directly at the reference
plane of the instrument’s test ports or with adapters connected to them. This eliminates the effect of
test cables, making the calibration more accurate and repeatable. Calibration is typically performed over
the full frequency range of the instrument and can be performed infrequently because of the
instruments’ stability.
The S-parameter calibration performed in the second step includes the system interconnect hardware
that was not included in the first step and is performed at the end of the test cables, adapters, or wafer
probes that connect to the DUT. For coaxial calibrations in which the ECal module connectors match
those of the DUT, this calibration can be done as a single step.
10 MHz
DUT
PROBLEM
• Can’t lock internal LO of DUT to VNA
• VNA receivers won’t be tuned to
exact output frequency resulting
in unstable phase/delay measurements
Finally, as the phase noise of the LOs in the VNA and DUT cannot be “ratioed out”, averaging and
smoothing can be used to lower the noise of the group delay measurements. To establish the appropriate
pseudo-coherent phase relationship between the DUT and the test instrument, the PNA or PNA-X breaks
down the measurement of the converter’s effective LO into coarse and fine measurements. This two-step
approach quickly achieves the needed frequency accuracy. Coarse tuning is achieved by first setting
the RF stimulus to an appropriate CW frequency within the defined input frequency band, and then the
instrument calculates the output frequency corresponding to the input frequency and the nominal value of
the DUT’s LO.
The instrument’s internal receivers are swept around the expected center frequency of the DUT’s output.
The difference between the peak of the actual signal and the expected signal (based on the nominal value
of the DUT’s LO) gives a frequency-offset value for adjusting the nominal LO value of the mixing plan. The
VNA is then tuned very close to the DUT’s actual output frequency. The frequency span of the course
receiver sweep can be set by the user up to 10 MHz. The coarse-tune process gets the instrument close
to the desired output frequency but not close enough to stop phase slippage between the VNA and the
DUT. The necessary frequency accuracy can be obtained by taking a different measurement approach
for the fine sweep. Once the coarse offset is applied, the PNA performs a ratioed phase-versus time
sweep between the DUT and test receivers at a fixed input frequency and with the test receiver fix-tuned
to the output frequency of the DUT derived with the coarse sweep. Any small residual frequency offset
will show up as a linear phase change versus time. The slope of this phase change can be accurately
estimated, which gives the fine offset value. This fine-tuning process can be repeated multiple times to
get a good sub-hertz estimate of the DUT’s LO frequency. Minimizing the phase shift versus time until the
phase response has a flat slope over the measurement period provides a pseudo-locked condition and
places the two local oscillators in a fixed phase relationship. This method is much faster than performing
a narrowband sweep of the VNA’s receivers with many data points. Both coarse and fine-tuning can be
performed at every sweep of the group delay measurement, creating a coherent relationship between the
instrument and the DUT.
3rd Source
IMD IMD
Input Output
FCA applications on the VNA provide the scalar mixer/converter plus phase (SMC+Phase) measurement
class that provides fully calibrated conversion gain/loss, relative phase, and absolute group delay
measurements of mixers and converters without the need for reference or calibration mixers.
Eliminating the calibration mixer requires a U9391C/F/G comb generator. FCA provides an intuitive
and easy-to-use user interface for setting up mixer and converter measurements, with single or dual
conversion stages. It can control the analyzer’s built-in source(s) as well as external signal generators
for use as LO signals. Supported external sources include the Keysight sources as well as other SCPI-
controlled signal generators.
Further, when measuring the noise figure of frequency converters, source power calibration is performed
which levels the source power versus frequency. The leveled power is later used to calibrate the standard
receivers for absolute power measurements, which is necessary for measuring the conversion gain (or
loss) of frequency converters. This methodology is the same as is used in the SMC measurement class.
Keysight ENA, PXIe, and USB streamline VNA also offer advanced mixer calibration techniques: SMC,
SMC+Phase, and vector-mixer calibration to test frequency translating devices.
Together these techniques represent significant advances in converter characterization that are likely to
become the standard for the way these measurements are made by the radar and EW system designers.
Amplifier characteristics depend on the impedance matching and need to be tested under actual drive
power. The power delivered and the optimum load can be characterized with normal S22 S-parameter
measurements in linear regions, but once the amplifier operates at high power, it goes into nonlinear
regions, and the behavior cannot be predicted.
Active hot parameters are appropriate for amplifiers where the transistors are pre-matched and are used
to verify that the matching is good and there are not any extraneous matching issues. The technique
is significantly faster than other methods and provides a measure of the true Hot S22, the optimum
match for maximum power, the value of the maximum power as well as the power delivered to 50 Ω.
In summary, it provides the fundamental X-parameters of the amplifier. This capability can be added to
PNA-X network analyzers with the S93110B Active Hot Parameters application.
Bare transistors, which require substantial impedance matching at fundamental and harmonic frequencies
require testing with the nonlinear vector network analyzer and X-parameters - the mathematically correct
extension of S-parameters to large-signal conditions. This provides a device-independent black-box
framework whose coefficients are identifiable from a simple set of physical measurements on the device
under test.
X-parameters are a fully nonlinear framework that provides both the magnitude and phase of the
fundamental and harmonics. They can be cascaded in simulation and produce the correct behavior in
mismatched environments. Researchers and designers can now measure match, gain, group delay, and
more for driven components. The methodology can be extended to two-tone, multi-tone, frequency
converter, and three-port mixer parameters.
The standard PNA-X is transformed into the NVNA with a minimum of external accessories and nonlinear
firmware options. Core to this transformation is the nonlinear calibration process. Trust in the measured
data is as important as the data itself. NVNA’s state-of-the-art nonlinear calibration process provides
vector calibrated amplitude and phase data traceable to the National Institute of Science and Technology
(NIST). A simple three-step calibration process is driven by a graphical calibration wizard to remove any
systematic errors and maximize accuracy.
v1 v2
1 0 1 0 1 0
I_Probe U_Probe
R
can be used to distribute more i1 i2
R11 MCA_ZFL_11AD Connector MCA_ZX60_2522
R=50 Ohm DC_Block MCA_ZFL_11AD_1 X1 MCA_ZX60_2522_1
DC_Block1 fundamental_1=fundamental fundamental_1=fundamental
X-parameter blocks
datasheets, and at the same
X-parameters enable accurate nonlinear
time protect the device IP. simulation under arbitrary matching conditions.
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• Storage: Energy may be exchanged between the field and the material, in a bi-directional
(lossless) manner.
• Loss: Energy may be permanently lost from the field, and absorbed in the material
(usually as heat).
Material Characterization
Material has a unique set of electrical and magnetic characteristics that are dependent on its
electromagnetic properties. Accurate measurements of these properties can provide scientists and
engineers with valuable information to properly incorporate the material into its intended application
for more solid designs or to monitor a manufacturing process for improved quality control.
A dielectric materials measurement can provide critical design parameter information for many
electronics applications.
Numerous techniques are adopted for material characterization. Here’s an overview of the techniques we
will be discussing in this chapter.
1. Parallel Plate (sometimes called capacitance method): It uses a parallel plate capacitor, with
the material in between. This method uses an impedance analyzer. It is typically used at the lower
frequencies, below 1 GHz.
2. Coaxial probe: This method uses an open-ended coaxial probe, usually with a network analyzer.
It is the easiest method to use for liquids, or soft semi-solids, although very flat hard solids can be
measured as well. Keysight offers probes in the RF to microwave frequencies, 200MHz to 50GHz.
3. Resonant Cavity: This method uses a resonant cavity for the sample holder, and a network analyzer
to measure the resonant frequency and Q of the cavity, both empty and with the sample present.
From this, permittivity can be calculated. This method has the best loss factor resolution.
4. Transmission Line: This method can use a variety of transmission “lines” for sample holders
with a network analyzer. Lines can be coaxial; waveguide and even free space are considered a
transmission line technique. It is useful for a broad frequency range, from the low microwave region to
mm-wave.
Each method has strengths and limitations that make it useful for a particular application. The choice
of technique depends on many things like frequency of interest, required measurement accuracy,
material properties (i.e., homogeneous, isotropic), the form of material (i.e., liquid, powder, solid, sheet);
sample size restrictions, destructive or nondestructive testing, contacting or non-contacting test,
measurement temperature.
Loss
Coaxial Probe
High
Transmission line
Electrodes (area = A) Y = G + j ω Cp
Cp G
Equivalent circuit = jωC 0 –j
C0 ω C0
t • Cp
εr' =
A • ε0
t
εr" =
Solid thickness = t Liquid ω • Rp • A • ε0
RF parallel plate provides ease of use and good accuracy for both dielectric and magnetic materials.
However, the parallel plate method does not measure materials with magnetic properties.
16454A
In
h
where,
relative permeability
measured inductance with MUT
c measured inductance without MUT
permeability of free space
b height of MUT (Material Under Test)
outer diameter of MUT
No magnetic flux leakage inner diameter of MUT
You should use the “inductance” measurement method to measure permeability. Relative permeability
of magnetic material derived from the self-inductance of a cored inductor that has a closed-loop (such
as the toroidal core) is often called effective permeability, see Figure 15.3. The conventional method
of measuring effective permeability is to wind some wire around the core and evaluate the inductance
with respect to the ends of the wire. This type of measurement is usually performed with an impedance
analyzer. Effective permeability is derived from the inductance measurement result. The Keysight 16454A
magnetic material test fixture provides an ideal structure for a single-turn inductor, with no flux leakage
when a toroidal core is inserted in it.
The coaxial probe method works with Keysight N1501A dielectric probe hardware. Measurements are
conveniently made by immersing the probe into liquids or semi-solids – no special fixtures or containers
are required. Measurements are non-destructive and can be made in real-time. These important features
allow the dielectric probe kit to be used in process analytic technologies. The open-ended coaxial probe
Reflection
(S11 )
15.4. Coaxial probe method
Additionally, an automated electronic calibration refresh feature recalibrates the system automatically,
in seconds, before each measurement is made. This virtually eliminates cable instability and system
drift errors.
The coaxial probe method is convenient and operates over a wide 200 MHz to 50 GHz frequency range.
It is not well suited to low loss materials, magnetic materials, or where high accuracy is desired. Keysight
offers three probe designs. Each has unique strengths and limitations.
“High-Temperature Probe” has the lowest frequency coverage of all the probes. It can be used with an
impedance analyzer down to 10MHz. The large flange makes it easier to measure solid materials.
“Slim Form Probe” is a low-cost consumable design. It is the lowest cost of all the probes. It is ideal for
measuring materials that would destroy the probe, such as curing epoxy or cement. Because the tip is so
narrow and the tip is not as flat as the other probes, it is not suitable for measuring hard solids.
There are few assumptions while making this measurement. The technique assumes that the sample is
semi-infinite or endless, or at least as far as the network analyzer can see. How far into the material the
field extends depends on the material properties, the frequency of the measurement, and the dimensions
of the probe. Air gaps between a solid and the probe tip, and bubbles in a liquid will cause errors. The
sample is also assumed to be non-magnetic and isotropic.
17.0
200 mm
Borosilicate
150 Glass Seal
1.6 9.5
Nickel Plated
2.4 mm Male Stainless Steel Tungsten Center
connector T304L Body Conductor
Stainless Steel
T304L Tip
Figure 15.5. Coaxial probes
The material sample is assumed to fill the cross-section of the fixture with no air gaps, have smooth
flat faces, and be uniform throughout. Coaxial airline fixtures are broadband, but the samples are more
difficult to machine. Waveguide fixtures extend to the mm-wave frequencies and the samples are simpler
to machine, but their frequency coverage is banded. Because the coaxial and waveguide transmission
line size scales with frequency, the practical sample size determines the frequency limits. Waveguides at
frequencies much lower than 5GHz start to get very large, and a large sample is needed. Below 1GHz for
many materials, sample length also becomes an issue. At frequencies above 75GHz, both coaxial and
waveguide dimensions get very small, and it becomes too difficult to machine the tiny samples.
Waveguide
Reflection Transmission
(S11 ) (S 21 )
Thermocouple
Sample
Transmission line sample holders can be made from coaxial airlines or waveguide straight sections. Both
are widely available in different frequencies from Keysight and other connector manufacturers. Samples
must fit inside. This technique works best for hard solids that can be machined. It is possible, although
more difficult to contain liquids and powders inside these. Coaxial sample holders offer broadband
frequency coverage; however, it is more difficult to machine solid materials to the shape needed to fit
inside. Waveguide straight sections offer banded frequency coverage, but it is much easier to machine
solid materials to fit inside.
Table 15.1 shows the algorithms used in the N1500A material measurement suite from Keysight
technologies. They will convert the measured S-parameters to permittivity or permeability. The first
three require a two-port fixture. The last two require a one-port fixture which may be better for liquids or
powders where a shorted waveguide section can be turned on end and filled. One-port fixtures may also
be better for measurements at high temperatures where one end of the waveguide can be heated while
cooling mechanisms keep the network analyzer cool.
A special variant of the transmission line method is “free space” and is best for high-temperature
measurements since the sample is not enclosed in any kind of fixture, see Figure 15.6. The MUT is
assumed to be large, flat, and uniform throughout. The free space antennas are connected to a vector
network analyzer that measures the reflection and transmission from the MUT which are then converted
to permittivity and permeability. There are many free space measurement methods available to choose
Optimum
Algorithm Measured Output
Length
Nicolson-Ross S11,S21,S12,S22
λg /4 εr and µr
(PN 8510-3) or S11,S21)
S21,S12
Fast nλg /4 εr
(S21)
Short-circuited
S11 λg /2 εr
back
Arbitrary dielectric
S11 λg /2 εr
back
However, it is much more sensitive and has a better resolution than the other techniques. The typical
resolution for this method is 10-4 whereas the broadband method is 10-2. A least-squares circle fitting
technique is used to calculate Q, which uses both magnitude and phase information and is more
repeatable than other Q calculation methods. The software then calculates εr’, εr”, and loss tangent and
displays them in its easy-to-use interface.
As is the case in commercial electronics and communications, the evolution from purely analog
designs to hybrid analog/digital designs continues to drive advances in radar system capability
and performance. Frequencies keep reaching higher and signals are becoming increasingly agile.
Signal formats and modulation schemes—pulsed and otherwise—continue to become more
complex, and this demands wider bandwidth. Advanced digital signal processing (DSP) techniques
are being used to disguise system operation and thereby avoid jamming. Architectures such as
active electronically steered arrays (AESA) rely on advanced materials such as gallium nitride
(GaN) to implement phased-array antennas that provide greater performance in beamforming and
beam steering.
Within the operating environment, the range of complexities may include ground clutter, sea clutter,
jamming, interference, wireless communication signals, and other forms of electromagnetic noise.
It may also include multiple targets, many of which utilize materials and technologies that present a
reduced radar cross-section.
This section moves ahead from component level to subsystem level characterization. Starting
with the basics of radar and EW transmitter and receiver, it covers new age requirements,
technologies and instruments to measure those. The section also highlights the methodology to
test Transmit-Receive (TR) modules efficiently and concludes with understanding different
techniques of antenna testing.
Chapter 16
Signal Source Essentials- Parameters, Technologies, and Methods
The essence of radar is the ability to gather information about a target — location, speed, direction,
shape, identity, or simply presence. This is done by processing reflected radio frequency (RF) or
microwave signals in the case of primary radars, or from a transmitted response in the case of
secondary radars.
Figure 16.1. The essential characteristics of real-world pulses affect the performance of the radar system.
The time between pulses—the pulse-repetition interval (PRI)—determines the maximum unambiguous
range to the target; pulse repetition frequency (PRF) is the inverse of PRI. The duration of the pulse—the
pulse width—determines the spatial resolution of the radar: pulses must be shorter than the time it takes
for the signal to travel between the target details; otherwise, the pulses overlap in the receiver.
Together, pulse width and pulse shape determine the spectrum of the radar signal. Decreasing the pulse
width increases signal bandwidth; however, wider system bandwidth results in higher receiver noise for
a given amount of power, and this reduces sensitivity. Also, the pulse spectrum may exceed regulated
frequency allotments if the pulse is too short.
Short pulses with a low repetition rate maximize resolution and unambiguous range, and high pulse
power maximizes the radar’s range in distance. There are, however, practical limitations in generating
short, high-power pulses. For example, higher peak power will shorten the life of tubes used in high-
power amplifier designs. This conundrum would be a barrier to increasing radar performance if radar
technology stopped here. However, complex waveforms and pulse-compression techniques can be used
to greatly mitigate the power limitation on pulse width.
From this, a pulse-compression radar realizes many of the benefits of a short pulse: improved resolution
and accuracy; reduced clutter; better target classification; and greater tolerance to some electronic
warfare (EW) and jamming techniques. One area that does not improve is minimum range performance:
the long transmitter pulse may obscure targets that are too close to the radar.
The ability to compress the pulse with a matched filter is achieved by modulating the RF pulse in ways
that facilitate the compression process. The matching filter function can be achieved digitally using the
cross-correlation function to compare the received and transmitted pulses. The sampled receive signal is
repeatedly time-shifted, fast Fourier transformed and multiplied by the conjugate of the Fourier transform
of the sampled transmit signal (or a replica).
The output of the cross-correlation function is proportional to the time-shifted match of the two signals.
A spike in the cross-correlation function or matching-filter output occurs when the two signals are
aligned. This spike is the radar return signal, and it may be 1000 times shorter in duration than the
transmitted pulse.
Even if two or more of the transmitted pulses overlap in the receiver, the sharp rise in output occurs only
when each pulse is aligned with the transmit pulse. This restores the separation between the received
pulses and, with it, the range resolution. To reduce the time-domain sidelobes created during the cross-
correlation process, the received waveform can be processed with a windowing function of Hamming
shape or similar.
As mentioned above, the output of the cross-correlation filter is proportional to the match between the
received and transmitted signals. If the received signal is slightly lower or slightly higher in frequency, then
the filter output is somewhat lower.
For a simple pulse, the filter response follows the familiar sin(x)/x shape as a function of Doppler
frequency. In extreme cases, the frequency of the received signal may shift far enough to correlate with a
sidelobe of the transmit signal.
Note that short pulses have a relatively wide initial lobe in the sin(x)/x response and so tend to be
“Doppler tolerant” compared to longer pulses. In pulse compression schemes such as Barker coding,
the matching-filter output drops off much faster than the sin(x)/x of the simple pulse, making them
“Doppler intolerant.”
Doppler shifts in linear FM pulses can create an error in the location information because the highest
cross-correlation occurs where the swept frequencies in the received pulse are best aligned with the
swept frequencies in the transmit pulse. This offset is directly proportional to the Doppler shift.
0 dB Doppler
frequency
16 MHz
–3 dB Doppler
frequency
8 MHz
–21dB Doppler
frequency
Pulse
Swept RF pulse width*
1.2 GHz
–20 dB Doppler
frequency
13-bit Barker Pulse
coded RP pulse width*
1.2 GHz
*Figure
The term
16.2. pulse width on
The ambiguity the ambiguity
diagrams illustratediagram refers toversus
location accuracy the pulse width
Doppler at the This
accuracy. radarfigure
detector
showsoutput.
relative
ambiguity diagrams for different types of radar pulses.
*Note: in the ambiguity diagram, “pulse width” refers to the width at the output of the radar detector.
X
DUT
Upconvert
r er / downconvert
r er
Figure 16.3. Signal generator use cases for component characteristic tests or a system component
Figure 16.4. Signal generator use case for receiver sensitivity tests
The PXIe modular form factor signal generators are compact instruments housed in a PXIe chassis and
controlled using a PC. Several PXIe signal generators can be placed in a single chassis, making them
ideal for applications that require multi-channel measurement capabilities, fast measurement speed,
and a small footprint. A PXIe signal generator often uses the same software applications as a benchtop
signal generator, providing measurement consistency and compatibility from product development to
manufacturing and support.
Vector signal generators (VSG), a more capable class of signal generators, enable complex digital
modulation schemes. VSGs have a built-in quadrature (also called IQ) modulator to generate complex
modulation formats such as quadrature phase-shift keying (QPSK) and 1024 quadrature amplitude
modulation (QAM). When combined with an IQ baseband generator, virtually any signal can be emulated
and transmitted within the information bandwidth supported by the system.
Optimized for speed, agile signal generators can quickly change frequency, amplitude, and phase of the
signal. They also have the unique capability to be phase coherent at all frequencies, at all times. This
attribute, along with extensive pulse modulation and wideband chirp capabilities, make them ideal for
electronic warfare and radar applications.
Frequency specifications
The frequency specification defines the range, resolution, accuracy, and switching speed of your
signal generator.
• Range — the maximum and minimum output frequencies your signal generator can output.
• Resolution — the smallest frequency change.
• Accuracy — how close the source’s output frequency is to the set frequency.
• Switching — how fast the output settles down to the desired frequency.
• Range — the difference between the maximum and minimum output power capability of the
signal generator. The signal generator’s output attenuator design determines its range.
The output attenuator allows the signal generator to produce extremely small signals used to test
a receiver’s sensitivity.
• Resolution — the smallest possible power increment.
• Switching speed — how fast the source can change from one power level to the next.
Pmax Accuracy
Power
Pmin
Frequency
Spectral purity
Spectral purity is the inherent stability of a signal. A perfect signal generator will generate a sinusoidal
wave at a single frequency without the presence of noise. However, signal generators consist of non-ideal
components which introduce noise and distortion. The specifications associated with spectral purity are
often the most difficult to understand. These specifications include phase noise, harmonics, and spurs as
shown in Figure 16.8.
CW
output
Harmonic spur
Phase
~30dBc from
noise Non-harmonic spur
non-linear
Sub-harmonics (dBc/Hz) from power supplies
components
from multipliers used to from LO’s and other contributors
extend the frequency
output
• Harmonics — integer multiples of the sinusoidal fundamental frequency output. These harmonics are
caused by the non-linear characteristics of components used in the signal generator.
• Spurs — non-random or deterministic signals created from mixing and dividing signals to get the
carrier frequency. These signals may be harmonically or non harmonically related to the carrier.
Interface transferring
Var. delay
Var. delay
Dynamic Control In
48.64 DAC samples or
24 IQ sample pairs AC Amp.
per Sync Clk
AMP OUT
Ref CLK In
Sample CLK In Clock
Generation DC Amp.
Channel 2
Figure 16.9. Modern Arbitrary Waveform Generators are comprised of much more than DACs. Such new
capabilities involve memory sequencing, clock sharing for synchronization, and different output paths to optimize
signals depending on the application. Shown here is the block diagram for the high-resolution M8190A Arbitrary
Waveform Generator.
a) Baseband Generation
I Q
IF/RF Out
Lowpass Filter
IF/RF Out
1-Channel AWG
Figure 16.10. AWGs can generate radar (and any RF) signals following to different basic schemes
Simulation for these multi-emitter environments traditionally encompasses large, complex, and custom
systems during the system qualification and verification stage. These systems are usually not widely
available to EW design engineers as R&D test equipment. EW designers working on optimization and
pre-qualification are at a disadvantage in comparison to wireless engineers performing similar tasks. EW
engineers often discover the nature and magnitude of performance problems later in the design phase —
leading to delays, design rework, and solutions that are not optimal.
The cost of the test is as important as test realism, as the relationship between cost and test fidelity
is exponential. As test equipment becomes more cost-effective and capable, more EW testing can be
performed on the ground — in a lab or chamber — rather than in flight. Even though flight testing can
add test capability, it does so at a high cost. It is typically done later in the program lifecycle, adding risk
and further expense to the program through missed deadlines if the system under test (SUT) fails. It is far
better to test early in a lab environment with as much realism as possible, where tests are easily repeated
to identify iteratively and to resolve issues.
Acquisition, GCI
Fire control
Early warning
VHF UHF L S C X Ku K Ka
A B C D E F G H I J K
Figure 16.11. A general representation of the threat density vs. frequency band in a typical operational environment.
The full RF/microwave environment would be a combination of the threat and commercial wireless environments.
In EW design, the multiplicity and density of the environment — and often the bandwidth — make it
impractical to use a single source or a small number of sources to simulate a single emitter or a small
number of emitters. Cost, space, and complexity considerations rule out these approaches.
The only practical solution is to simulate many emitters with a single source, and to employ multiple
sources — each typically simulating many emitters — when required to produce the needed signal
density or to simulate specific phenomena such as angle-of-arrival (AoA).
The ability to simulate multiple emitters at multiple frequencies depends on the following: pulse repetition
frequency; duty cycle; number of emitters; and the capability of the source to switch between frequency,
amplitude, and modulation quickly.
A source’s agility is a factor in its ability to simulate multiple emitters. Source frequency, phase, and
amplitude settling time (whichever is greater) is the transition time between playing one pulse descriptor
word (PDW) and the next.
Value
Legacy simulation
technology Modern
simulation technology
Fidelity
Figure 16.12. Simulation fidelity and cost increase exponentially. System integrators and evaluators must determine
the level of cost versus fidelity to ensure system performance. New simulation technologies enable more simulation
realism and fidelity at a lower cost.
Synchronization
Figure 16.13. In the traditional approach, PDW control parameters are sent in parallel to multiple functional
elements, on a pulse-to-pulse basis, to generate and modify the desired signal. This approach results in a complex
system, demanding precise synchronization.
Because multiple functional components are required to produce each output channel, time
synchronization is a significant configuration and operational challenge. A wide variety of settling times
and latencies must be fully characterized to optimize pulse density by minimizing lockout periods.
This approach can be scaled directly to create multiple coordinated channels, as shown in Figure 16.14
However, systems configured in this way require a large footprint — occupying more rack space — and
cost escalates quickly.
Modulation RF Signal
Generator Generator Attenuator
Modulation RF Signal
Generator Generator Attenuator
Distribution
Network
Emulated
RF Output
Control Modulation RF Signal to EW
Generator Generator Attenuator Receiver
Modulation RF Signal
Generator Generator Attenuator
Figure 16.14. A signal generation approach using separate functional elements can be scaled up to increase pulse
density and generate a more realistic environment. The cost and space requirements scale up rapidly as well2.
EW receivers must be able to handle millions of pulses per second, where most of the pulse density
occurs at the X-band. EW receivers must be able to handle pulses arriving at the same time at different
frequencies from different angles. Creating pulses that are coincident with one another in the time domain
should be a goal of simulation to increase simulation realism.
Though Figure 16.14 describes a very capable system, the system elements are not highly integrated.
Recent developments in analog and digital signal generation technologies are enabling a higher degree of
integration and solutions which are more cost- and space- efficient.
There are several methods of controlling simulations, depending on test objectives. Figure 16.14 shows
systems with a traditional, distributed architecture. The synchronization of an agile local oscillator
(LO) with functions such as pulse modulation, frequency/phase modulation, and amplitude control is
a considerable challenge. In an integrated EW test solution such as the UXG, this synchronization is
automatic, provided by the test equipment itself. By simplifying hardware and system complexity, this
integrated approach promises to improve both performance and reliability.
For example, there is often a need to switch between one simulated threat mode to another in response
to identification and jamming by the SUT. For long scenario lengths with fast control over scenario
changes, PDWs can be streamed over the LAN to the signal generation system operating in an agile
controller mode. In this case, simulation software generates batches of PDWs according to simulation
kinematic granularity and streams them ahead of their desired playtime.
The goals are to stress the SUT with increasing pulse density, depending on the number of simulation
channels available and the parameters of the threats to be simulated. As pulse density increases, PDWs
can be dropped according to a priority scheme as they increasingly collide in the time domain, and there
are insufficient signal generation channels to play them.
Creating AoA
In addition to creating emitters with the desired fidelity and density, it is also important to match the
geometry and kinematics of EW scenarios. This is because the AoA of a radar threat to the EW system
changes slowly compared to other parameters, such as center frequency and pulse repetition frequency.
As an alternative, and depending on their architecture, sources can be linked together to create
phase-coherent output, allowing for exceptional control over creating phase fronts to the SUT.
Similarly, amplitude control at the source can be used to create appropriate amplitude differences at
SUT receive channels.
The ability to control AoA to meet modern test requirements depends on the architecture of the source.
At a minimum, it should be possible to lock the LOs of multiple sources together so that they all share the
same phase. Often, calibration is required to align the phase and timing between sources.
Creating small, accurate, and repeatable differences in phase or frequency between channels is the next
challenge. Sources based on a direct digital synthesis (DDS) architecture allow AoA to be controlled
digitally in a numerically controlled oscillator. Phase alignment in a DDS source is then a matter of sharing
reference clocks. Calibrations to provide accuracy and repeatability can be uploaded to a table to be
applied in real-time.
The required control loop filtering in PLLs results in a significant settling or loop response time. This
looping limits the ability of the synthesizer to switch frequency quickly. Due to their comparatively high
transition time, these sources are limited in their ability to simulate multiple radar threats out of a single
channel, even if they have the necessary broadband frequency coverage and frequency resolution. They
also lack phase-repeatable switching capability.
Since the switches and arithmetic operators used in the DAS approach operate very quickly and do not
need loop filtering, these synthesizers have very high-frequency agility. They are a typical architecture for
traditional EW test solutions.
However, DAS technology has several drawbacks. First, numerous stages are required to achieve the
desired frequency resolution. Switching parallel and series multiplication, division, and mixing stages
require more hardware than PLLs and reduces reliability. Second, circuit noise from each stage is
cascaded, and phase noise is multiplied through the stages. Finally, each stage adds components that
increase size, weight, and cost.
On the positive side for EW applications, DAS has the potential for limited phase-repeatable frequency
switching. All frequencies are usually derived from the same reference, but divider ambiguities generally
preclude full phase-coherent switching.
Fast sample rates are needed to produce outputs with very wide bandwidth so that a minimum of
multiplying stages can be used to create the desired output frequencies. The use of either many
multiplying stages or a DAC of insufficient purity would limit the effective spurious-free dynamic range
(SFDR) of the EW synthesizer.
In concept, a DDS is one of the simplest types of signal generators. In a frequency-tunable DDS, data
from a numerically controlled oscillator is converted to analog form by a DAC and low-pass filtered to
remove image frequencies and harmonics. A block diagram of the key elements of a DDS is shown in
Figure 16.15.
Advantages of DDS
The Keysight UXG agile signal generator uses DDS technology made possible by a proprietary DAC to
generate multi-emitter simulations. DDS has several advantages over other synthesis technologies
for EW applications: Digital control of extremely fine frequency and phase tuning increments within a
single clock cycle.
In the UXG agile signal generator, the frequency resolution is one millihertz and phase resolution is
sub-degree. Fractional-N techniques can provide microhertz resolution, but frequency changes are
much slower due to PLL filtering. DAS techniques provide rapid frequency switching, but at a cost in
frequency resolution.
DAS techniques offer hop speed and frequency/phase repeatability only under limited conditions.
Modulation is created in the digital domain, providing numerical precision and repeatability.
There are other advantages to using DDS that are of interest to the EW engineer. Many DDSs employ a
digital modulator for amplitude, frequency, and phase modulation for the creation of digitally modulated
signals in the numerically controlled oscillator. Linear frequency modulated (LFM) chirps and Barker
codes can also be directly synthesized using the numerically controlled oscillator. Chirp bandwidth
depends on the bandwidth of the bandpass filters after each multiplication stage and whether the signal
is crossing a band.
You cannot create some threat scenarios, such as AoA, with a single-channel source. Those scenarios
depend on properly synchronizing the outputs of two or more sources. By precisely controlling the
amplitude, phase, and time delay of each source output, you can simulate the direction of a radar wave-
front as it reaches the multiple antennas of an EW SUT. Accomplishing this feat with multiple signal
generators scales up the cost, often resulting in redundant hardware — adding size, weight, power
consumption, and complexity.
The Keysight UXG agile vector adapter works in conjunction with the UXG agile signal generator. Figure
16.16 shows the block diagram.
6 GHz reference
8 - 18 GHz LO
1.8 GHz
1.6 GHz BW
.05 - 40 GHz
PDWs
Proprietary DAC
Figure 16.16. High-level block diagram of the UXG agile vector adapter
Minimizing Distortion
Traditional analog I/Q baseband systems must be carefully tuned to minimize signal distortion caused by
phenomena such as IQ gain imbalance (where the gain in the I and Q channels is slightly different) and IQ
skew (where the I and Q paths are not precisely in quadrature). Figure 16.17 (left image) shows how these
imperfections create in-band distortion. these distortion products occur within the signal bandwidth,
hence cannot be filtered out.
A digital baseband architecture mathematically shifts the I and Q channels by 90 degrees and digitally
sums them before conversion to an analog IF signal. This technique greatly reduces the amount of in-
band distortion. Figure 16.17 (right image) shows how this technique provides a higher fidelity signal.
Memory D/A
Q X Memory X IF
Digital signal Digital signal
Analog signal Analog signal
This level of performance may impose severe limits on the threat scenario, which could require a higher,
agile dynamic range. Moreover, the DAC technique for amplitude control cannot attenuate any spurious
signals created further down the signal chain. The EW receiver under test must perform additional
signal processing to determine if the detected signal is a genuine threat signal or a spurious one that
can be ignored.
If the scenario requires large numbers of pulses at multiple frequencies with minimal dropped pulses, you
might select the 4-channel, 1-port configurations in Figure 16.18. The outputs of each analog or vector
source are combined to a single RF port.
Analog Vector
If the threat scenario calls for AoA measurements, you need a different configuration. Figure 16.19 shows
two different 1-channel, 4-port test configurations. All four sources are tuned to the same frequency.
But the amplitude, phase, and time delay of each RF output are individually controlled to simulate the
direction of the threat.
More complex scenarios may demand more extensive configurations, such as the 3-channel, 4-port
setup in Figure 16.20. The three channels of this configuration provide high pulse density with pulse-on-
pulse capability, as well as multiple ports for AoA testing.
SUT
Recent innovations in core hardware such as DACs and FPGAs have enabled new solutions with the
hardware simplicity and reliability of traditional test equipment. These solutions will provide dramatic
improvements in solution cost and size, bringing high-fidelity EW environment simulation to a much
earlier phase in the design process. Using realistic EW environment simulation at the optimization and
pre-verification stages of design will improve performance, speed the design process, and reduce
overall costs.
References
1. Philip Kazserman, “Frequency of pulse coincidence given in n radars of different pulse widths and
PRFs,” IEEE Trans. Aerospace and Electronic Systems, Vol. AES-6, p. 657-662, September 1970.
2. Reproduced by permission from David Adamy, EW 101: A First Course in Electronic Warfare,
Norwood, MA: Artech House, Inc., 2001. © 2001 by Artech House, Inc.
https://www.keysight.com/see/radar-ew-subsystem-test
Average power
Pulse
width
Pulse
Duty cycle delay
PRI PRF/PRR
Other parameters, including duty cycle, pulse width, PRF, and rise and fall times as shown in Figure 17.1,
are useful for characterizing the power of the radar signal.
From a radar equation standpoint, the power term corresponds to the power of the transmit pulse.
If the integration term is excluded, the equation applies to a single pulse. Therefore, it can be useful
to examine the peak and pulse power on an individual pulse basis. This technique is becoming more
important for modern radar systems in which pulse width and PRF are dynamically adjusted and the
pulse profile may be contoured to improve system performance. It is also becoming easier to perform
with modern test equipment.
It should be noted that average power measurements are a common method for characterizing the
power of a radar signal. These are simple to perform and require only low-cost instruments. If pulse
characteristics, such as the duty cycle of the radar signal, are known, the pulse power can be derived or
estimated based on average power. Note, however, that this derived result does not provide information
about droop, or any peak excursions that may occur due to ringing or overshoot. The result would be
nearly equivalent to the pulse-top amplitude, and in the case of a perfectly square pulse, it would be
equivalent to the true peak power or pulse power.
Along with measuring power, the spectrum shape is critical to verifying that a radar system is operating
efficiently. For example, an unsymmetrical or incorrect spectral shape indicates a radar that is operating
less than optimally. In such cases, the radar may be wasting power by transmitting or splattering power at
unwanted frequencies, causing out-of-band interference. For some radar systems, pulse shaping is used
to reduce the level of the spectral sidelobes, to improve the efficiency and life of radar components, and
to reduce bandwidth.
Measuring Radar and EW Signals 183
There are several options for measuring radar power, pulse characteristics, and spectrum including the
use of a power meter, signal/spectrum analyzer, or vector signal analyzer. Because each instrument
has advantages and limitations, the best choice is determined by the measurement objectives and the
constraints on the radar and the test instrument. This section will describe how to make measurements
with each of these instruments.
RF and microwave instruments are limited in both the amount of average power and the amount of peak
power that can be input without damaging the instrument. For typical radar systems, with pulse powers
of approximately 1 MW, a directional coupler is required to sample the transmitter power and provide a
safe drive level to the test instrument.
Figure 17.3 shows an example of measuring peak and pulse power using the Keysight P-Series peak
power meter. A convenient feature of the meter is its trace display, which allows you to view the envelope
of the pulse signal that is being measured. The meter operates by continuously sampling the signal
with a 100 MS/s digitizer, buffering the data, and calculating the result. This gives the meter greater
measurement versatility, including flexible triggering, time gating with multiple gates, and the ability to take
single-shot measurements.
Figure 17.3. Using the P-Series peak power meter to measure peak power, gated pulse power, and peak-to-average
ratio. Due to the shape of this pulse the peak power is 1.39 dB higher than the pulse power.
Keysight power meters operate with various sensors (CW, average, and peak and average) and cover
numerous frequency and power ranges to accurately measure the power of RF and microwave signals.
Keysight P-Series wideband power meters (30 MHz video bandwidth) such as the N1911A (single-
channel) and N1912A (dual-channel) provide measurements including peak, peak-to-average ratio,
average power, rise time, fall time, and pulse width.
When used with an N1921A or N1922A wideband power sensor, an N1911/12A P-Series power meter
provides a measurement frequency range of 50 MHz to 40 GHz.
Using a method known as interpolation, accurate timing measurements with sub-nano-second resolution
can easily be obtained.
Figure 17.6. A signal analyzer is useful for examining the shape and symmetry of the radar spectrum. This example
shows the spectrum trace before and after a timing adjustment in the magnetron.
Measuring pulsed radar with a signal analyzer is complicated by the different modes of operation
that occur, which depend on the resolution bandwidth (RBW) setting of the spectrum analyzer. These
variations exist when measuring any type of pulsed signal but tend to be more noteworthy when
measuring the low-duty-cycle pulses commonly used with radar signals. Further, different modes in signal
analyzers, namely swept versus fast Fourier transform (FFT), can behave differently when measuring
pulsed signals.
This section starts with a quick review of the basic spectral shape of a simple pulsed RF signal. Next, it
will examine the measurement of radar with both swept-based and FFT-based signal analyzers (including
different measurement modes) and then conclude with a survey of the different built-in measurement
functions included in many of today’s analyzers.
As can be seen in Figure 17.8, the pulse width and PRF of the signal determine the characteristics of the
basic pulsed spectrum. As the pulse width narrows, the width of the spectrum and sidelobes broadens.
The PRF of the pulsed-RF waveform determines the spacing between each spectral component. Viewing
the spectrum of the pulse can therefore provide meaningful information about the signal’s pulse width,
period, and duty cycle. For a basic pulsed-RF signal, the duty cycle can then be used to calculate the
peak pulse power from the average power and vice versa.
Period = T
PRF = 1/ T
V
~ Pulse width =
Duty cycle = / T
PRF = 1 1
T
fc
FFT-based spectrum analyzers typically have a user interface designed to have a look and feel similar
to that of a traditional swept analyzer. A casual user may not even recognize that they are using FFT
techniques rather than traditional spectrum sweeps. However, the differences become apparent when
measuring pulsed RF signals.
Like a vector signal analyzer, the FFT-based spectrum analyzer can be fast at measuring signals whose
entire bandwidth is contained within a single FFT (i.e., contained within its analysis bandwidth). With this
condition met, the FFT signal analyzer is essentially equivalent to a VSA though typically without as many
measurement functions and displays.
When the span of interest is wider than the analysis or FFT bandwidth of the analyzer, the FFT-based
spectrum analyzer calculates the spectrum by taking multiple FFTs at different frequencies and
concatenating the results. This technique is sometimes called stitching because the analyzer computes
the spectrum one section at a time, step tuning to a different frequency for each section, and patching
them together. Depending on the speed of the analyzer, one may be able to see each section of the
spectrum appear as it is computed.
Built-in measurements
Today’s modern spectrum analyzers include many built-in functions and capabilities that can simplify and
enhance radar measurements. Several of these features are highlighted here.
Channel-power
The channel-power function is designed to measure the average power across a given frequency band. It
is a common measurement that is frequently used to measure many different types of signals. Spectrum
analyzers use different techniques for making channel-power measurements. The most common way,
which is usually the most accurate, is the integration bandwidth method. The analyzer essentially
integrates the power as it sweeps across the given integration bandwidth. Typically, the measurement
uses the analyzer’s averaging detector. Examples of channel-power measurements of a radar signal are
shown in Figure 17.9.
Figure 17.9. Channel power measurement of radar signals performed on a spectrum analyzer. Results are equivalent
to average power.
Figure 17.10. This is an example of an occupied bandwidth measurement on the PXA spectrum analyzer.
Bandwidth for which 99.00% of the signal power is contained is automatically measured and reported.
Figure 17.11. This is an example of burst-power measurement from the PXA signal analyzer. Burst power and pulse
width are automatically measured in zero-span mode.
A vector signal analyzer does not sweep across a wide frequency range like a spectrum analyzer.
Most vector signal analyzers operate by tuning to a specific frequency, conditioning the signal,
down-converting, digitizing, and processing the signal. Some vector signal analyzers skip the analog
down-conversion stage and directly digitize the baseband, IF, or even RF signal after conditioning.
There are a variety of vector signal analysis solutions available with varying performance constraints and
tradeoffs in bandwidth, sensitivity, memory, and frequency range. Many of today’s modern instruments
include dual functionality and operate as both a spectrum analyzer and a vector signal analyzer, as is
the case with the Keysight X-series and PSA analyzers, or as an oscilloscope and vector signal analyzer.
Keysight VSA software can also be extended to work with logic analyzers to analyze signals in digital form
or to work in software simulation environments such as Keysight ADS or MATLAB.
Figure 17.12 Time and frequency domain representation of chirp signal(left). Spectrogram view (right)
All three elements (trace types, statistics, and measurements) are shown above with highly configurable
windows. Four pulses (4 through 7) are highlighted and aligned with their corresponding time-domain
traces. A histogram of the rise time, the trend line of the pulse fall time, and an overall pulse summary are
also included. Along the bottom, detailed pulse metrics are tabulated across the 40 pulses detected.
The power, frequency, amplitude, and phase vs. time are carefully analyzed for each pulse to calculate
figures of merit that can be tabulated in a pulse table (Figure 17.15). Example metrics are pulse width
(PW), pulse repetition interval (PRI), rise time, fall time, and amplitude overshoot illustrated below.
• Modulation Metrics – modulation type, modulation code number, chip count, measured bits, chip
width, chip offset
• RF Output Level Metrics – top level, base level, top to base ratio, amplitude when the pulse is on,
peak level, mean level, peak to average ratio
• Amplitude Settling Metrics – pulse droop, droop rate, droop starting amplitude, droop ending
amplitude, overshoot, ripple
• Time Metrics – rise time, fall time, rising edge, falling edge, width, duty cycle, pulse repetition
frequency, pulse repetition interval, off time
• Frequency Metrics - mean frequency, pulse to first pulse frequency difference, peak-to-peak
frequency deviation, and relative to an estimated reference signal, RMS frequency error, peak
frequency error, and time location of peak frequency error
• Phase Metrics – mean phase, pulse to first pulse phase difference, peak to peak phase deviation,
and relative to an estimated reference signal, RMS phase error, peak phase error, and time location of
peak phase error
• Linear Frequency Modulation Metrics – best-fit mean modulation frequency, best-fit start modulation
frequency, best-fit ending modulation frequency, best-fit peak-to-peak modulation frequency
deviation, best-fit FM slope, integrated nonlinearity from best-fit
• Triangular Frequency Modulation Metrics – best-fit apex frequency, best-fit apex time
• Channel to Channel Difference Metrics – time, amplitude, and frequency difference of a
corresponding pulse on channel 2 as compared to Channel 1
• Pulse Compression Metrics – correlation between reference pulse and measured pulse; peak
sidelobe level, peak sidelobe location, compression ratio, main lobe width
• Deinterleaving Metrics – emitter ID
• Frequency Hopping Metrics – hop state index, hop begin time, hop ending time, hop settling time,
hop dwell time, hop switching time, hop mean frequency, hop mean frequency deviation
Any of these metrics may be copied to Microsoft Excel or exported to CSV format for further analysis.
Furthermore, statistics and trends on any of these metrics may be visualized. Hypothetically, a radar
engineer may have a large population of pulses that are supposed to have the same pulse width or pulse
repetition interval. The repeatability of the RF system may be plotted using a histogram.
In larger test systems, trigger events may arrive intermittently, with significant pauses in between
trigger events. In such cases, it is helpful to tabulate pulse metrics across trigger events and individual
acquisitions. For these scenarios, the pulse table may be configured as a cumulative pulse table in that
rows describing groups of pulses may come from different acquisitions.
-20
RF Envelope (dBm)
-30
-40
-50
-60
-70
Time (μs)
5 μsec 5 μsec 5 μsec
By leveraging segmented capture measured across four oscilloscope channels, scan patterns across four
antennas may be characterized over tens of seconds as shown in Figure 17.21
Binary Phase
Coded Waveform
Radar works by sending out a loud pulse and then listening for the echoes of that outbound pulse. In
other words, we judge the distance of an object by reflecting a signal off it. By noting the arrival time of
the echoes and accounting for the speed of propagation, we can estimate the distance or “range” of
the object. Furthermore, by noting the frequency shift of the echoes, we can also gauge the velocity.
By changing the shape of the outbound pulse in a specially designed way, the distance resolution and
immunity to ambient noise can be improved with the help of a matched filter. Thus the received signal
is submitted to a filter that is simply a time-reversed version of the original signal. This is the same as
taking the correlation of the original signal. Any echoes off real objects will have the same shape as the
outbound signal, and so the convolution of the received signal against the time-reversed outbound signal
leads to taller and narrower peaks, which is great for range resolution. System noise or radar clutter will
not have the same signature as the outbound signal, so after taking the correlation against the outbound
pulse, it continues to look like noise.
By the 1950s, the industry had wholeheartedly embraced this concept of pulse compression, and people
were looking at improved ways of having sharper main lobes with lower sidelobes. Both experimentally
and theoretically, they learned that a wider bandwidth signal leads to lower sidelobes and taller main
lobes. The most common approach is to apply linear frequency modulation to the pulse. To achieve even
higher levels of pulse compression, radar engineers have explored “non-linear frequency modulation” or
NLFM, typically characterized as a polynomial fit to the frequency versus time data.
While some would argue one is a superset of the other, the VSA can analyze both types, returning the
polynomial fits to the instantaneous frequency versus time in the case of NLFM. Linear FM metrics
are tabulated in the pulse results summary table. For every pulse that has a linear FM chirp, the VSA
implements a best-fit to the measured frequency versus time data to estimate what would be the
instantaneous frequency versus time if we were looking at a perfectly linear modulator. Deviations from
this best-fit are then tabulated.
Many radar system engineers require tremendous instantaneous bandwidth because no one knows
precisely what frequency the pulses will be arriving. In such situations, we would recommend a
broadband oscilloscope with up to 110 GHz of instantaneous bandwidth. Whereas typically super-wide
bandwidth oscilloscopes have presented poor dynamic range with the full bandwidth of noise degrading
the measured signal-to-noise ratio, this trade-off is not necessary today. The Infiniium UXR scope features
hardware-accelerated decimation and filtering.
Some radar engineers are trying to find a relatively small signal hidden in the noise of a dynamic
spectrum. In that case, we would recommend a state-of-the-art spectrum analyzer like the UXA with
dedicated hardware to provide the best possible dynamic range.
Lastly, for a radar engineer on a test range interested in looking for intermittent aberrations in the
electromagnetic airspace, they will be interested in collecting huge amounts of data and saving it
to robust hard drives without any gaps between acquisitions. In that case, we would recommend a
streaming digitizer such as the M8131A with an optical interface to provide adequate data throughput.
The VSA connects to all three classes of instruments and provides a hardware extension to over 300
Keysight model numbers allowing an engineer to test anywhere in the transmitter chain, from the DSP
with a logic analyzer, to the baseband inputs with an oscilloscope, and the RF output with a signal
analyzer. Once a connection has been established, the software feels like an extension of the instrument,
A second option is through simulation results. The VSA software connects to both PathWave Circuit
Design (formerly known as Keysight Advanced Design Systems) and PathWave System Level Design
(formerly known as SystemVue). The third option is through recording files. Assuming the sample rate and
center frequency are well-known, waveforms may be brought into the VSA that may have been saved to
disk in Matlab format or various other binary formats.
A radar engineer can save measured RF data to an IQ data recording and then use that same data
recording to play it back through a vector signal generator. The I and Q outputs from the data recording
get played out as pulsed waveforms at RF frequencies.
With long-time recordings leading to many gigabytes of data, the radar industry invented this concept of
Pulse Descriptor Words (PDW’s), which allow an entire pulse to be submitted as a series of parameters
describing that pulse. The most relevant characteristics like pulse width, PRI, and mean frequency are
submitted as columns to a PDW file, where every row represents a different pulse. This PDW file may be
then uploaded to an agile vector signal generator like the UXG.
Whether through an IQ data recording or using a PDW file, the recorded signal may be played into a radar
receiver under test or radar jammer as a way of verifying its response or in EW parlance, verifying its
In both cases, we begin with the definition of some reference pulses. This is entered as a table with
characteristics of amplitude, pulse width, pulse repetition interval, and average frequency. Whereas pulse
scoring compares each corresponding pulse against the reference list of pulses, pulse train scoring
evaluates the agreement of the entire measured pulse train. With pulse scoring, one may answer the
question, “Is a pulse or series of pulses similar to a single reference pulse or series of reference pulses?”
On the other hand, with pulse train scoring one may answer the question, “How do we know that pulses
measured in a reference train happened in our latest measurement, and how closely do they match?”
Certain figures of merit (like pulse width) may be emphasized more strongly than the others by way of
base error tolerances. If the base error tolerances are set small, then that metric will play a stronger role
in the overall score. Once the reference pulses and base error tolerances have been defined, measured
pulses are color-coded both on the time trace as well as in the pulse summary table, as shown below.
C B A
SUT C B A
SUT C B A
A System Under Test (SUT) will receive a train of pulses and then in response, output a train of pulses.
To characterize the efficacy of this response, it becomes necessary to chart the pulses at the input and
the output of the SUT. A multichannel scope, like the UXR, may be used to collect phase-coherent time-
domain data to look at channel-to-channel differences or more specifically, input to output differences.
Based on the number of channels in the receiver, multiple SUT’s may be tested in parallel.
Radar engineers often want to track the evolution of the SUTs response to an incoming pulse, so the
pulse repetition interval demarcates a “fast-time” slice. In plotting the evolution of the SUT response
across fast-time intervals, a new notion of time lends itself to the name “slow-time.” Below, we show the
incoming signal on channel 1 and SUT response on channel 2 in Time vs. Time Heatmap traces. This
illustrates a classic “Range Gate Pull-off” technique.
The span needs to be narrowed significantly to support the most likely frequency shifts. After changing
the span, VSA resamples the same data to show the changing frequency impulses versus time, with the
most recent time slice displayed at the bottom.
This however results in a significant blurring of the details in the Time vs. Time Heatmap. So how can we
achieve good resolution in the time-domain as well as in the frequency-domain? The multi-measurement
capability in the VSA enables this, where the span for Meas01 may be set to 16 MHz for better Time vs.
Time resolution and independently, the span for Meas02 may be set to 100 kHz for better Frequency vs.
Time resolution. Both the Time vs. Time Heatmap and Frequency vs. Time Heatmap traces are offered in
basic vector mode and pulse analysis mode.
Since the days of Nikola Tesla and other pioneers, radar has become ubiquitous and the breadth of its
application is still growing. At the same time, radar technology has become more sophisticated as signal
processing is commonly used to enhance the returned signal and to extract information, such as target
images during post processing. However, no matter how sophisticated the signal processing becomes,
the performance of every radar and EW system is directly determined by the quality of the underlying
transmitters and receivers.
A phased array antenna with an array of antenna elements controls the relative amplitude and
phase of signals from these elements to concentrate the energy in the desired direction. The
attenuator and phase shifter in each TR module quickly change their states, which enables a
phased array antenna to scan the narrow beam very rapidly.
Today’s phased-array antennas utilize 100s or even 1000s of antenna elements with TR modules. Their
energy can be directed and scanned to multiple positions, which makes them extremely flexible for use in
radar, electric warfare, and communication applications.
Active electronically scanned arrays, or AESA antennas, are the latest version of the phase-array antenna.
AESA can form a lot of antenna patterns. This provides versatility with a wider scan angle and multiple
concentrated beams for detecting and tracking multiple targets simultaneously.
Precise relative phase and amplitude control are crucial to the AESA capabilities. Shown here is a
typical AESA antenna with 24 test ports and 6-bit phase and 6-bit attenuator control. It has 4096
settings per test port and is tested at 21 frequency points. That is over 2 million antenna patterns to be
tested, Figure 18.2.
24 x 21 x 4096 =
1
4096 2 million antenna patterns!
Beamforming network
$ $$ $$$$$
Source: TRM tutorial session at IEEE International Symposium on Phased Array Systems & Technology; October
17-21, 2016.
Type-1 RADARs are low power and low-cost arrays for communications, weather radars, perimeter
detection, and automotive radars. The range of applications is rapidly growing. The phased-arrays
needed for future 5G systems will be in this category. Type-2 RADARs are medium power phased-arrays
used for military intelligence and surveillance which have a higher cost per element. This type of radar
system is also growing rapidly as communication and situation awareness become more and more
important. Type-3 RADARs are very high power per element and very expensive. These are used in
applications for fire control radars, electronic warfare, and electronic countermeasures. GaN is the current
semiconductor of choice for these high-power applications.
Applications for phased-array antennas are expanding and growing rapidly in aerospace and defense to
commercial industries, with medium to low power but highly integrated form factor. TR modules typically
need extensive testing to ensure that they are matched across the phased-array in which they are used.
6
ADC
Digital beamforming in phased-array antennas is becoming popular in both military and commercial
applications. It has a radar exciter, or signal generator and a receiver right behind each TR module,
and provides the most flexible beam control. This configuration minimizes power loss in the transmitter
and increases receiver sensitivity. The tradeoff is that it increases the complexity and requires more
components and space than analog beamforming. An alternative approach is a combination of analog
and digital beamforming to optimize special and power requirements, as well as performance and
versatility requirements.
The active phased array allowed lower RF power per element in the front-end. Lighter and smaller
structures became replacements for bulky waveguide manifolds. This enabled more elements in a system
and allowed more sophisticated digital beamforming.
Then with the planar structure, the whole system became smaller, lighter, and cheaper, but required more
components to be integrated into a smaller form factor.
Now, as function blocks like front-end TR modules, signal generators, and receivers baseband digital
processors become available in IC chips and frequency range is extended; the phase array antenna
systems will find applications in many industries. Then we begin to see needs of different scales and
sizes, lower-cost structures, high-volume production, and maybe new performance requirements.
Here we see a typical TR module. In one direction it’s a pulsed power amplifier, in the other, it’s a low
noise amplifier. All the RF characteristics of these paths are dominated by these devices and circuit
designs around them.
TR Module Air-Interface
Amp PA
Phase
Adjust
TRM UUT
Ant
RF RF
TRM Fixture
Atten
Adjust
3.5mm 3.5mm
Power & Control
Air interface
LNA TRM UUT RF
Tx/Rx RF
Control TRM Fixture Waveguide
Coupler
3.5mm 3.5mm
Power & Control
The unique part of a TR module is the phase shifter and attenuation adjusters which allow each TR
module to have its own settings. The attenuator and phase states can be re-programmed for each
radar pulse.
When TR modules are tested, they are attached to a fixture with a coaxial interface or waveguide adapter
for modules with built-in antennas. Then, the fixtures are de-embedded from the measurement results.
Let’s now focus on TR modules most commonly used today and discuss their test requirements
and challenges.
Let’s start with the transmit path (Figure 18.4). The signal in the transmit path is typically pulse-modulated.
It goes through an attenuator and a phase shifter, and then a power amplifier. To deliver amplitude-
and phase-controlled signals to the antenna element, the input and output matches of the path, gain,
and attenuation and phase offset deviations are measured at every possible setting over the operating
frequency range. The attenuation step can be 0.5 or 1 dB in the 20 to 30 dB range, and the phase offset
is controlled in about 3-degree steps or less from -180 to +180 degrees. The number of combinations, in
this case, varies from a few to several thousand. Each set of measurements are simple S-parameters, but
there are a lot of amplitude and phase states to be tested.
Furthermore, the power amplifier characteristics are tested. This includes a 1 dB compression point or
P1dB, maximum output power at P1dB or at saturation, 2nd and 3rd harmonic distortions, and output-
referred IP3. It is quite simple to measure the gain, then find P1dB and the output power with a vector
network analyzer. Notice they are all tested versus frequency. If it is tested at every 10 MHz in the whole
X-band, the measurements have to be repeated 401 times.
Distortions are traditionally tested with signal generators with a combiner and a spectrum analyzer.
This approach is simple to implement and very straight-forward for fixed-input frequency, but it is time-
consuming for testing versus frequency.
Now, let’s look at the receive path. The receive path has a power limiter at the front-end to protect the
following low-noise amplifier from unexpected high-power signals. The phase shifter and attenuator are
controlled in the same manner as the transmit path. The matches and gain are tested over the operating
frequency and the various attenuator settings. They are simple measurements but require a lot of steps.
The input path is the front-end of the whole receiver chain where distortions are tested. They include 2nd
and 3rd harmonics, input-IP2 and IP3 or IIP2 and IIP3. They are calculated with the main output power,
2nd- and 3rd-order IMD, and the gain. A spectrum analyzer is used for distortion measurements, and a
VNA measures the gain. Testing IIP2 and IIP3 requires data from both instruments and some math. They
are also tested versus frequency, so it becomes even more complex.
This is probably not common in production, but TR modules may be tested with transmitter and receiver
subsystems in design characterization. The matches stay simple as S11 and S22, but transmissions
become conversion gains between the input and the output at different frequencies. Amplitude
As there are frequency converters in the paths, there are more opportunities for signals leaking through
undesired paths. High-order mixing products are generated so there are more spurs. The mismatches
in the paths also make the signal flow more complex. These spurs and leakages must be tested in
transceiver subsystems. Additionally, wideband performance with modulated signals may be tested,
such as noise-power ratio, transmitter noise density, and receiver error vector magnitude. Vector signal
generators and signal analyzers may be used for testing these performances. They may not be needed
in a TR module test system, but it is better to be able to incorporate these additional capabilities
when needed.
Data saving/analysis/reporting
Operator interface
Measurement parameters
DUT setup ranges/steps
Test sequencer
Figure 18.5 shows a conceptual building block for test system integration. Building a test system
involves three key areas of challenges viz. measurements, switch matrices and signal conditioning,
and automation.
The measurement challenges are mostly addressed with tools and techniques that are available from
instrument suppliers. Users need skills and knowledge to utilize them, but suppliers are typically able
to assist.
Automation is a huge task. Controlling TR modules and sequencing the tests require a deep
understanding of the module design, test plans, specifications, and expertise on hardware control and
software integration. It also requires measurement knowledge to maintain the test quality so that the test
systems perform as expected.
Before understanding the latest measurement techniques, let’s review the traditional test approach.
Traditional test systems are configured with many instruments, each of which was designed for a specific
set of measurements. For example, a power meter is used for output power measurements and a VNA
is used solely for S-parameter measurements. Separate signal generators and spectrum analyzers are
used for distortions and spurious tests. A noise figure analyzer is added for the NF measurements on the
receive path.
Here is an example of a VNA with the latest hardware architecture (Figure18.6). This is PNA-X with a
2-port configuration. It can have two internal sources with built-in harmonic filters with a signal combiner
for two-tone IMD measurements.
+28V J11 J10 J9 J8 J7 rear panel J2 J1
+
- LO
Source 2
OUT 1 OUT 2 Noise receivers
Source 1 To receivers
Pulse
OUT 1 OUT 2 modulator 10 MHz - 3-
3 GHz 26.5
GHz
R1
Pulse
modulator Pulse generators
R2
A 1
2
B
3
4
Source 2 Source 2
Test port 1 Output 1 Output 2 Test port 2
DUT
Impedance tuner for noise
figure measurements
The test fixture is connected to different instruments through a large multiplexing switch matrix, which
adds large path loss and mismatches, causing drift and reducing system dynamic range. Software must
control each instrument with a slow interface and longer instrument response time. This becomes a major
problem for sequencing a lot of tests like TR modules.
These measurements are traditionally made with standard S-parameter measurements in a VNA. The
compression, or P1dB, is found in swept power S21 measurements then the output power can be found
at the same output power as the P1dB. It needs many setups to cover the required frequency range
which causes throughput and calibration challenges.
The latest VNA, like the PNA-X, offers a software option called Gain Compression Application or GCA.
In a single setup, the GCA controls the stimulus frequency, power, linear gain, P1dB, and output power
at P1dB versus frequency with fewer measurement points. Using the GCA, the setup and calibration are
simpler and the measurement speed is significantly faster than the traditional swept-power S21 method.
Spurious tests are typically done using a spectrum analyzer with fixed-frequency input to the DUT. The
input frequency is stepped to cover the frequency range. The search range becomes wider frequency and
lower level making it time-consuming. Repeating these measurements at different input frequencies can
lead to hours of testing.
The slow sweep speed is mostly due to the microwave preselector at the spectrum analyzer input in
swept mode. Spectrum analyzers use it for measurements with the highest level of accuracy. The latest
spectrum analyzers also have FFT mode for faster measurements, but it bypasses the pre-selector and
loses accuracy.
Let’s move on to IP2 and IP3 measurements. Today we have a simpler way with swept-IMD applications.
The swept-IMD controls the two internal sources and switches to make two-tone IMD measurements.
By simply setting the center frequency, tone-spacing, and the sweep range we can choose the test
parameter from the pre-defined list. This is easier than setting up individual source frequencies,
programming to sweep, finding peaks, and calculating parameters using the traditional method.
One of the most important parameters of the receive path is the noise figure, which is defined as signal-
to-noise ratio degradation. The noise figure is traditionally measured with either a noise figure analyzer
or a spectrum analyzer with a noise figure option using a technique called the Y-factor method. The
Y-factor method calculates noise figures from noise power measurements at the DUT output with hot
and cold noise source states at the DUT input. This is very popular and works well when the noise
source is connected at the DUT input. However, it assumes the DUT input is terminated with 50-ohm and
The noise figure application on PNA-X uses an optional low-noise receiver or standard VNA receivers
that minimize the need for switching between the noise figure and other measurements. With industry-
unique source-mismatch error correction, it delivers superior accuracy, especially in an ATE environment.
It calculates noise figure from the device gain and noise power at the DUT output with no signal at the
DUT input, so it is called the “cold-source” method. This method enables typically 10 to 40 times faster
measurement speed than the traditional Y-factor method, enabling a finer frequency resolution with a
small impact on the test throughput.
While this chapter focuses on the PNA series VNA for the TRM test, a similar but slightly modified approach
can also be used with Keysight modular PXIe VNAs and latest the E5080B ENA for TR module testing.
Classic ATE systems are configured with front-end switch matrices to connect multiple instruments to a
DUT. The design is simple, and it is easy to understand, but it is large, difficult to configure, less accurate,
and very slow.
The ATE systems with the latest approach introduce more software capabilities and utilize front-end
receivers for multiple measurements. However, not all required measurements can be done with a single
type of receiver using software. You may need a signal generator for higher output power or complex
modulation or a signal analyzer for wideband demodulation. Then you need to switch the paths to these
instruments. And you would most likely need signal conditioning for some measurements and switch
them in and out when changing measurement types. The best solution is to keep the front-end receivers
as close as possible to the DUT interface so you can minimize the path loss and system drift. This is not
always possible, but it is a good practice to optimize the path switches and maintain higher accuracy.
The first type of switch is a multiport switch. It has one input and typically from 2 to 6 output ports and is
used to expand the number of test ports for multiple DUTs, to route a signal generator to multiple outputs,
or sharing a signal analyzer with multiple input ports.
The second type of switch is a bypass switch. It is configured with a pair of one-by-two switches and
used for switching a signal path from one to another. For example, it is used to switch in and out a
booster amplifier and an isolator pair at the DUT input or used in front of a receiver and switches between
a high-sensitivity path with an LNA and a high-power path with an attenuator.
The third type of switch is a transfer switch. It is also configured with a pair of one-by-two switches, but
they switch to opposite states to switch between two inputs and two outputs and reverse the signal
direction. It can be configured as a single-pole, double-throw, or bypass switch. It is often used as a
bypass switch and for reversing the DUT connections between transmit and receive paths to simplify the
test system configuration.
TR Modules need to be tested under environmental conditions. Under long temperature cycle for radar
and EW applications and TVAC conditions for satellite applications.
Shown in Figure 18.7 is a configuration example with CalPods for measuring TR modules in a thermal
vacuum chamber.
CalPod
Switch Matrix Switch Matrix
T/R module
T/R module
T/R module
T/R module
T/R module
T/R module
T/R module
T/R module
CalPod Controller
PNA-X
Figure 18.7. Calpod for maintaining measurement accuracy
It is one of the most critical aspects of the TRM Test system to synchronize TR module attenuator and
phase shift and getting the TR module state to change at every pulse of the radar’s PRF. You can see the
trigger handshake interactions between the PNA-X and the DUT control FPGA.
The PNA-X provides very flexible and low-latency triggering interfaces with DUT control FPGA, as well as
other instruments in the system.
The DUT control FPGA manages the timing of measurements, detects the measurement completions,
and attenuator and phase shifter states of the TR module over the proprietary interface.
Keysight’s Pathwave Test Automation Platform is a Microsoft .NET-based framework, designed for speed
and optimized execution. It provides a graphical user interface, which allows the user to quickly construct
test plans with highly repetitive tasks. Customizable modular plug-ins are available for test steps,
instrument/DUT interfaces, and result storage.
Pathwave Test Automation connection manager helps easily control the DUT, PNA-X, and non-Keysight
instruments, and a variety of measurements, including switch matrices. Pathwave Test Automation
command-line interface enables integration with other manufacturing applications and allows for various
levels of customization. There are many plug-in tools for visualization and analysis as well.
For TR module testing, Keysight provides a custom PNA-X driver which can be scaled to execute
a unique set of measurements and be synchronized to the DUT control required for phase shift and
amplitude validation. The results can be shown in test development mode or automatic test mode
in graphical format. The timing analyzer shows each test duration and provides insight into where to
optimize the test sequence for the maximum throughput.
Pathwave test automation plug-ins can be used to export the data into a graphical or numerical format for
easy analysis, test reports, and data archiving. The example here shows a graphical display on the test
automation platform as PNA-X will display. All data can be saved with a variety of standard data formats.
Keysight Pathwave test automation is not just another programming language, it is a highly customizable
and adaptable platform to speed up system integration for any skill level. It builds environments to archive
plug-ins and re-uses them to make future system integration simpler and quicker.
Before the mid-1980s, antenna and radar cross-section (RCS) test engineers used dedicated
microwave receivers. In the mid-1980s, utilizing a network analyzer in an antenna or RCS
application was a new and novel idea. Companies and individuals who adopted the new network
analyzer technology to make antenna or RCS measurements were leading innovators, and many
others came to follow this technology lead in later years.
With the next generation of network analyzers now available to the industry, the antenna test
community needs to evaluate this new technology to see if it can provide similar gains in improved
performance, accuracy, and speed to provide a better value for the antenna test community.
Antenna Test Parameters
Normally the antenna is tested under receive mode. However, certain applications require the antenna
to be tested in transmit mode also. Numerous parameters exist for characterizing the performance of
antennas and the most significant of these are discussed here.
• Antenna Impedance
• Radiation Pattern
• 3dB Beamwidth
• Directivity
• Antenna Gain
• Bandwidth
The antenna pattern is the response of the antenna to a plane wave incident from a given direction or the
relative power density of the wave transmitted by the antenna in each direction. The antenna pattern can
be realized by one of the three antenna pattern measurement techniques. The first technique developed
was the far-field range, then near-field techniques, and compact range.
Radiating Near-Field
(Fresnel Zone) Radiating
Radiating Reactive Far-Field
Antenna Field (Fraunhofer
Zone)
2 D²
4 2D²
rZ 2D² or_rZ10
1. Reactive: This region is the space immediately in front of the radiating portion of the antenna. The
reactive region is from the surface of the antenna up to one wavelength away from the surface of the
antenna. Successful measurements cannot be made in this region.
The far-field range was the original antenna measurement technique and consists of placing the AUT a
long distance away from the transmit antenna. The AUT is illuminated by a source antenna at a distance
far enough to create a planar phase front over the electrical aperture of the AUT. The AUT moves Azimuth
and Elevation directions when measuring the antenna pattern. The far-field technique can be implemented
outdoors or indoors with a reflector (compact range).
Far-field antenna ranges were the original technique for characterizing antenna radiation patterns and
have been in use for over 60 years. However, as the antennas have become larger and have increased
performance, the far-field range distance has increased. Many factors have affected the viability of using
longer far-field antenna ranges. Longer antenna ranges are subject to increased undesired reflections
from the ground, buildings, and other man-made structures. Electromagnetic congestion has increased
the interference from other sources, as well as the need to reduce electromagnetic interference from the
antenna test range. All these factors have resulted in the need to find an alternative to far-field testing.
The first alternative to far-field testing is near-field testing, which is a technique that has been known for
many years but did not come into popular acceptance until the availability of adequate computational
power of computers. The near-field technique measures amplitude and phase data at half-wavelength
intervals across the radiating aperture of an antenna and utilizes a two-dimensional Fourier transform to
transform this measured near-field data to an equivalent far-field radiation pattern. Near-field techniques
began to gain popularity about 20 years ago, as the computational power of PCs was able to handle the
two-dimensional Fourier transforms. Today, near-field measurements are widely used by antenna test
engineers because of their many benefits. They utilize smaller carbon footprints, are not as affected by
electromagnetic interference, nor do they contribute to electromagnetic interference, provide all-weather
testing capabilities, provide security for testing proprietary antennas, and the errors associated with near-
field antenna ranges are much smaller and better characterized than for far-field antenna ranges.
• Planar Near-field scanning: The measurements are conducted by scanning a small probe antenna
over a planar surface. These measurements are then transformed to the far-field by use of a Fourier
transform.
• Cylindrical Near field scanning: It measures the electric field on a cylindrical surface close to the
AUT. A Fourier transform using cylindrical coordinates is used to transform the measurements to the
far-field.
• Spherical Near-Field scanning: It measures the electric field on a spherical surface close to the
AUT. A Fourier transform using spherical coordinates is used to transform these measurements to
the far-field.
The 2nd alternative to far-field testing is a compact range which is another type of far-field facility. These
are typically located indoors, using anechoic material and large reflectors. Once the radiated energy
passes the focal point of the reflector, the signal is in the far-field. Compact antenna chambers have a
“quiet zone” that defines an area in which planar waves meet the far-field criteria.
Source Antenna
antenna under test
Antenna
under test
Source
antenna
(a)
Figure 19.3. Far-field test facilities are outdoor and compact indoor (b)
Sum Delta Az
B/R2 LAN
A/R2
Source 2 out
R1/R2 PNA-X receiver
When designing an antenna test facility, many parameters must be considered to select the optimum
equipment. Typically, one begins by considering the components for the transmit site, then moves to the
receive site. Designing a complete antenna system often requires you to configure the transmit site, then
the receive site, adjust the transmit site, and recalculate the values for optimum performance.
Transmit Site
The transmit site consists of the microwave transmit source, amplifiers (optional), the transmit antenna,
and the communications link to the receive site.
In selecting the transmit source, consider the frequency range of the antenna under test (AUT), the
distance to the transmit antenna, the available power of the source, and the speed requirements for the
measurements. For compact and near-field ranges, the internal VNA source will typically be the best
source to meet your measurement requirements. The internal source is faster than an external source and
may lower the cost of the complete system by eliminating a source. Large outdoor ranges may require
an external source that can be placed at a remote transmit site. Start by estimating the effective radiated
power (EIRP) of the transmitter site. The effective radiated power is the power level at the output of the
transmit antenna. To understand the required power level at the transmitter site, begin by making your
power calculations. If after doing the power calculations the transmit power is not high enough, you may
like to add an amplifier and run the calculations again.
The free-space loss of an antenna range determines the difference in power levels between the output
of the transmit antenna and the output of an isotropic (0dBi) antenna located at the receive site. The
test channel received power level must be calculated to determine the approximate maximum power
level present at the output of the antenna-under-test (AUT). The required measurement sensitivity is
determined from the test channel received power level, the required dynamic range, and the required
measurement accuracy.
Where:
This equation does not account for atmospheric attenuation, which can be a significant factor in certain
millimeter-wave frequency ranges.
Where:
Measurement accuracy is affected by the measurement sensitivity of the system. The signal-to-noise
ratio will directly impact the measurement accuracy of the system for both amplitude and phase
measurements. The frequency and sensitivity requirements of your antenna system will determine the
network analyzer specifications.
Where:
Keysight has developed options for the PNA Series specifically for antenna measurements. Because
of these options, the PNA Series is often the preferred analyzer for antenna solutions. However, some
applications do not require these options and the lower-cost PNA-L Series or ENA Series analyzers may
The VNA should be located as closely as possible to AUT to minimize the RF cable lengths. The
measurement sensitivity of the PNA must be degraded by the insertion loss of the RF cable(s) to
determine system measurement sensitivity.
If the AUT is located far from the analyzer, requiring long cables, then the loss caused by the cables could
be significant, reducing accuracy and dynamic range. You may also be unable to find an analyzer that
meets your sensitivity requirements. In this situation, down-converting the signal to an IF signal by using
the LO/IF distribution unit with remote mixers brings the measurement closer to the AUT. This reduces RF
cable loss and maximizes accuracy and dynamic range.
85320A
Test mixer
85320B
Reference
mixer
LO in 85309B
IF Freq.
Amplifier
O ou
LO out
Measuring system speed for antennas is one of the important aspects of an antenna measuring system.
Some applications require the fastest speed a system can provide, others are concerned with the best
dynamic range available. With the PNA Series network analyzer, users can adjust their setup according to
their specific needs. The selectable bandwidth feature can be used to optimize the measurement speed
vs. sensitivity tradeoff.
RCS Testing
From the radar range equation, RCS (σ) has a direct effect on the ability of a radar system to detect a
specified target at a defined range. Although the cross-section of the target cannot be controlled, the
objective in modeling RCS is to develop simulation tools capable of predicting the behavior of radar
receivers in a realistic environment.
A target’s RCS is a measure of its reflectivity in each direction, and there are three main contributors:
• Specular scattering: Localized scattering dependent on the surface material/texture and geometry
• Diffraction scattering: Incident signal scattering at target edges and discontinuities
• Multiple bounces: Reflections among target elements at offset angles
Computing the IFFT on a finite-length sample produces a noteworthy artifact: It creates repetitions or
“aliases” of the fundamental signal in time. These aliases can be minimized or eliminated through a
process of testing to find an alias-free measurement span. The width of this span will depend partly on
the number of data points the analyzer can measure and process. RCS measurements tend to be very
wide frequency sweeps, ensuring the presence of band crossings. High-power pulses are often used in
RCS measurements to overcome the high losses due to low device reflection and two-way transmission
path loss. For this reason, receiver gating is often required in RCS measurements to avoid overloading the
receiver during the transmission of the pulsed-RF signal.
Source
antenna Target
Receive Target
antenna
Source/receive
antenna
(a)
Figure 19.6. RCS test facilities: outdoor far-field and compact anechoic chambers (b)
The original way to implement a phased-array antenna is to use separate attenuators, phase shifters, and
other components. With the new modular approach, each antenna element and its related transmit power
amplifier (PA), receive low-noise amplifier (LNA), shifters, attenuators, and switches are packaged together
in a transmit/receive (T/R) module.
In transmit mode, the signal from the transceiver passes through the attenuator, phase shifter, and T/R
switch to the PA and then to the antenna. In receive mode, the signal from the antenna passes through
the T/R switch to the LNA and the phase shifter and attenuator to the receiver section of the transceiver.
Requirements for test and measurement must align with the application challenges we just discussed.
The testing of multiport DUTs presents four significant challenges:
Various multiport measurement solutions are available today and we can divide them into two categories:
switching solutions and true multiport VNAs.
Switching solutions include a two or four-port benchtop VNA and different types of switch matrices.
Simple switching test sets are based on RF switches that route VNA ports to the various ports of the
DUT. This type of multiport solution often uses a two-port VNA to reduce cost. These test sets are
typically constructed from a combination of 1x2, 1x4, and 1x6 RF switches. Switching test sets do not
offer measurements between any two ports, so care must be taken when designing the switch tree in the
test set to ensure it meets the measurement requirements of the intended DUT.
The switching-based approach has several drawbacks: complex setup, long test times, inadequate
measurement performance, and trade-offs between time and cost.
• Switch matrices might need additional software to assist with the measurements
• Implementation becomes more difficult as the number of ports increases
• Calibration of a full N-by-N system is difficult due to the need for port terminations
• Because many configurations share the source and receivers, test time becomes prohibitive
• Example: 24-port switching test set supports only 144 paths, but a 24-port device has 276 paths
Given these shortcomings, it becomes vital to understand a better way to address the test challenges.
The solution is a new-generation modular VNA. It delivers three main benefits:
• Increased throughput and improved accuracy driven by enhanced speed and performance
• Enhanced configurability is well-suited to the requirements of integrated A/D subsystems
• Application versatility can satisfy the majority of the needs for the testing of A/D components
Antenna
Under
Test Locate the PXI chasis close
to the AUT to minimize
Optional RF cable losses
Trigger OUT
10 MHz
Reference
Microwave Source Antenna
PSG/MXG/UXG
Trigger IN
10 MHz
Trigger OUT
LAN
Further, to reduce the complexity of scanning a single probe antenna over a mechanical arch, multiple
probe antennas can be mounted at fixed positions on an arch, and PIN switches were used to multiplex
the different probe antennas into a four-port receiver. The AUT is then rotated slightly in azimuth and when
the AUT has been rotated 180 degrees and the entire hemispherical radiated energy from the AUT has
been measured, it’s possible to do the computation of the antenna pattern.
Keysight Technologies provides many of the components required to make accurate antenna and radar
cross-section (RCS) measurements. Keysight instruments provide the greatest accuracy, reliability, and
productivity available.
You can integrate our instruments into your antenna test systems to measure a wide range of data
acquisition speeds and measurement sensitivities. Applications include near field, far field, and radar
cross section measurements.
In this section, learn how to simulate an effective and accurate radar environment, and understand
how these processes are innovative in the radar and EW industry. Various system level test and
measurement procedures are covered including validation of jammers effectiveness, Electronic
Intelligence, signal recording and analysis. The section highlights the critical need of system
calibration, field testing, sustainment and services. It also touches upon the importance of software
testing and new age cyber security.
Chapter 20
Avoiding 5G Coexistence and Effectively Simulating
Background Signals
With new bands specified for 5G communications systems, there is now an issue of coexistence,
which is radar and satellite using the same or similar frequency bands with 5G. Such coexistence
can cause loss of capacity in 5G systems and can even damage sensitive front ends in satellite
ground stations.
There are three primary use cases envisioned for 5G communication systems.
ENHANCED MOBILE
3D Videos, UHD
BROADBAND
20 Gbps
Augmented reality
Smart bldg.
MASSIVE MACHINE
5G ULTRA-RELIABLE
Industry automation
Self-driving car
Smart city
Mission-critical
The topmost hexagon is the familiar use case of watching high-definition videos on your phone. This
could entail 3D videos or augmented reality. The lower right hexagon use case is ultra-reliable low latency
communications. This would entail 1ms latency, roughly a 10x improvement, and 99.9999% reliability.
Some of the applications include industrial automation, telesurgery, self-driving vehicles, and mission-
critical communications. The lower left hexagon is massive machine-type communication. This is akin
to IoT sensors, where you have 10 million sensors per square kilometer. The data that they pass back is
meant to be low rate, therefore low bandwidth, and less power consuming. The battery in these devices
is meant to last for 10 years, and after this time, the sensors are thrown away.
These 3 use cases signify different frequency bands. The enhanced mobile broadband service needs
higher bandwidth, and higher bandwidth means higher frequency which tends to be 20+ GHz or higher.
The ultra-reliable low latency communications require mid-band frequencies, roughly 3 to 6 GHz. The
massive machine-type communications need low bandwidth to conserve power, so the frequency band
tends to be < 3 GHz.
Low Bands < 1 GHz Mid Bands 1 GHz - 6 GHz High Bands > w24 GHz
(Freq Uplink, Freq Downlink (Freq Uplink, Freq Downlink (Freq Uplink, Freq Downlink
unless otherwise noted) unless otherwise noted) unless otherwise noted)
5G NR n5: 824 - 849 MHz, 869 - 894 MHz n1: 1920 - 1980 MHz, 2110 - 2170 MHz n66: 1710 - 1780 MHz, 2110 - 2200 MHz n257: 26500 - 29500 MHz,
n8: 880 - 915 MHz, 925 - 960 MHz n2: 1850 - 1910 MHz, 1930 - 1990 MHz n70: 1695 - 1710 MHz, 1995 - 2020 MHz 26500 - 29500 MHz
n12: 699 - 716 MHz, 729 - 746 MHz n3: 1710 - 1785 MHz, 1805 - 1880 MHz n74: 1427 - 1470 MHz, 1475 - 1518 MHz n258: 24250 - 27500 MHz,
n20: 832 - 862 MHz, 791 - 821 MHz n7: 2500 - 2570 MHz, 2620 - 2690 MHz n75: 1432 - 1517 MHz (DL) 24250 - 27500 MHz
n28: 703 - 748 MHz, 758 - 803 MHz n25: 1850 - 1915 MHz, 1930 - 1995 MHz n76: 1427 - 1432 MHz (DL) n260: 37000 - 40000 MHz,
n71: 663 - 698 MHz, 617 - 652 MHz n34: 2010 - 2025 MHz, 2010 - 2025 MHz n77: 3300 - 4200 MHz, 3300 - 4200 MHz 37000 - 40000 MHz
n81: 880 - 915 MHz (SUL)
n38: 2570 - 2620 MHz, 2570 - 2620 MHz n78: 3300 - 3800 MHz, 3300 - 3800 MHz n261: 27500 - 28350 MHz,
n82: 832 - 862 MHZ (SUL)
n39: 1880 - 1920 MHz, 1880 - 1920 MHz n79: 4400 - 5000 MHz, 4400 - 5000 MHz 27500 - 28350 MHz
n83: 703 - 748 MHz (SUL)
n40: 2300 - 2400 MHz, 2300 - 2400 MHz n80: 1710 - 1785 MHz (SUL)
n41: 2496 - 2690 MHz, 2496 - 2690 MHz n84: 1920 - 1980 MHz (SUL)
n50: 1432 - 1517 MHz, 1432 - 1517 MHz n86: 1710 - 1780 MHz (SUL)
n51: 1427 - 1432 MHz, 1427 - 1437 MHz
There are many new operating bands in 5G. In particular, the n77 band spans 3.3 to 4.2 GHz and n78
band spans 3.3 to 3.8 GHz. Many new 5G commercial deployments are focused on these bands. This
overlaps with a possible downlink frequency range of satellite ground stations, from 3.4 to 4.2 GHz.
I
ISM ISM 64-71GHz
0.6 GHz S 2.5 GHz 3.3-4.2 GHz 4.4-5 GHz 5.7-5.8 24 GHz
24 GHz 28 GHz 39 GHz
M 71-76GHz
Frequency Range 1: 400 MHz to 6 GHz Frequency Range 2: 24.25 to 52.6 GHz
Adds 1.5 GHz of new spectrum in Adds 8.5 GHz of new spectrum in Frequency up to 90 GHz
frequency bands frequency bands are currently being
investigated
for future releases.
n77: 3.3-4.2 GHz n257: 26.5-29.5 GHz
n78: 3.3-3.8 GHz n258: 24.25-27.5 GHz
n79: 4.4-5 GHz n260: 37-40 GHz
3.5GHz IMT
5G
3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 4.0 4.1 4.2 GHz
3.6-3.8 GHz EU
Region 3
Currently, in the US, the entire 3.1-3.55 GHz band is allocated for both federal and non-federal
radiolocation services. Federal radiolocation services have a primary allocation and non-federal users
operate on a secondary basis. In addition, the C-band and extended C-band are used for fixed satellite
services. This introduces a conflict condition between 5G and radar/satellite allocations which is known
as coexistence.
IQ Error
Q Magnitude Vector
Error
IQ measured
Q err EVM [n]
Ø Error Vector
Phase
IQ reference
I
IQ Phase I err
Error
The 3GPP standard for 5G has laid out EVM requirements for different modulation schemes because the
modulation can be changed depending on what the channel can support. If the channel is cleaner and
can support a higher-order modulation, which is more signals being transmitted, then it will. In Table 20.1,
you can see that the QPSK, the least order modulation, has the highest required EVM, followed by 16
QAM, 64 QAM, and then 256 QAM, which requires a clean channel.
Table 20.1. Table shows how 3GPP EVM requirements for user equipment (UE) decrease as the modulation density
increases
A radio channel is the propagation path between a transmitter and a receiver. It includes such effects as
path loss, shadowing, multipath and fading, and Doppler.
PROPAGATION
Mobile station
Base station
Total Signal
Path Loss
Mobile route
Shadowing
MS
Fast Fading BS
f
Doppler spread
The superposition of multi-path components causes fast fading. This is when phases of multi-paths are
independently varying and summing together. Distance-dependent attenuation of propagating signals is
called path loss. The longer the propagation path, the greater the path loss. Large obstacles between the
transmitter (Tx) and the receiver (Rx) create shadowing and cause slow fading. A fading channel affects
RF signals between UE and BTS (over-the-air).
As the threat emulation environment is built up, one of the first considerations needs to be the time-base
of the system; specifically all emitters need to be phase-locked to the same time base. A fully coherent
system is critical for a successful model of threat emulation. In summary, coexistence is between 5G
and radar/satellite and is a very real problem in a crowded spectrum. The impact of 5G on radar/satellite
Avoiding 5G Coexistence and Effectively Simulating Background Signals 241
and vice versa can be measured by EVM or by 5G quality metrics. An adequate guard band should be
chosen to minimize the issue to the extent possible. Power levels, distance, and antenna orientation are
other mitigation parameters. With the ability to measure coexistence, the effects of it may be lessened to
provide seamless communication services.
Figure 20.8. Shown here is an example of an ew receiver test environment with several geographically dispersed
emitters contributing to signal conditions at a centrally-located receiver.
Step 1: Generate the Tx signal for each Tx with location described by longitude, latitude, and height, as
well as speed, the proper time waveform, and frequency content (carrier and Doppler frequency). The
required complex Tx comprises:
One of the challenges that is often encountered when testing radar/EW systems is how to generate and
analyze the MD signals, which include information about monitored Tx stations, such as location, velocity,
time, and frequency. Radar and EW environments also include interference, jamming/ deception and this
must be taken into consideration when performing measurements under real-world scenarios. A solution
to address these issues using SystemVue has been proposed, and simulation and test platforms have
been built. Using these platforms, engineers gain access to a myriad of benefits. They provide a true
design-oriented value proposition to shorten the development cycle and allow users to save time and
money by minimizing field tests. Moreover, SystemVue’s multiple environment scenarios enable engineers
to create real-world test environments that enable them to design high-quality products. Such capabilities
and benefits are critical to ensuring the successful development of modern radar and EW systems.
Simulation and test results show custom problems can be solved using the proposed method.
Radar Emulation
Scenario Controller
Channel Emulation - PDW Domain Radar Echo Generator
Tx Emulation
Rx Emulation
Channel Emulation - PDW Domain Signal Generator
Scenario Controller
A scenario controller is a software application (often supplemented by a GPU) that keeps track of the
actions of all the objects in the emulated scenario – their positions, velocities, aspects, and relationships
with one another. Such applications are broadly available although many of them are not architected for
closed-loop operation and can only create a set of signals that would be applied to the SUT, without the
ability to emulate a radar in real-time.
It is here that we first encounter challenges in the implementation of this test system:
• The SUT may function and maneuver autonomously, without the knowledge of the scenario controller.
This presents the need for a two-way communication path between the SUT and the scenario
controller. The scenario controller needs to know where the SUT is at any given time, and the
SUT needs to know about the surrounding terrain and other emulated objects so that it can
properly maneuver.
• Timing is key – precise timing between all system elements is critical, including the SUT.
Radar Transmitter
Radar emulation is central to the operation of this test system. Depending on the purpose for which the
system is to be used, radar emulation may be high-fidelity (emulating a specific radar model) or more
general-purpose in nature. In any event, the radar emulator needs to be reconfigurable so that it may be
used to emulate more than one kind of radar.
In the system architecture used here, the radar transmitter emulator’s output is a series of pulse
description words (PDWs), which describe the pulses that the radar wishes to transmit. The PDWs will
change according to the mode of the radar, and the radar emulator must transmit certain information
(such as antenna beam direction) to other test system elements.
Radar emulation will likely be implemented with a combination of software and FPGA-based firmware,
requiring the ability to reconfigure FPGA contents at will. This will require a new technology development.
• The test system knows the beam direction of the radar but not the beam direction of the SUT. This
requires a communication path between the SUT and the transmit channel emulator to properly scale
the SUT’s input signal.
• The SUT antenna might be an array. Full, element-by-element testing of phased array antennas is
possible but expensive. Alternatively, the signal may be applied to the SUT at a point behind the
antenna if a physical connection is available.
• The SUT might be trying to execute a direction-finding algorithm, requiring a test setup specifically
designed to enable direction-finding (with a calibration routine), or the ability for the test system to
‘push’ direction information into the SUT’s controller via a special test mode.
Signal Generator
Fortunately, several suitable signal sources have become available in recent years. Such sources accept
the PDW output of the channel emulator and create RF signals to match, which can be applied to the
input of the SUT.
Signal Conditioning
The SUT’s output must be assumed to be unpredictable and of varying power levels over time. It
is important to prevent the SUT’s power, which may be quite high, from damaging the input of the
downstream receiver circuits. At the same time, the receiver’s input power should be in a range that
allows the digitizer to operate near full scale so that optimum signal fidelity is maintained.
Signal conditioning can be achieved using a fast gain control circuit (with power protection at the receiver
input to handle any transient signals). Preferably, a software interface with the SUT would allow the test
system to determine appropriate attenuation levels – obviously requiring cooperation from the SUT.
There is an additional, and unusual, requirement on the signal condition solution needed for this test
system. To enable proper signal scaling downstream, the signal conditioning system must communicate
its attenuation setting to the rest of the test system. The signal conditioning system must therefore include
the appropriate communications mechanism while also participating in system timing functions.
Digitizer (Receiver)
Assuming successful implementation of signal conditioning at the SUT’s output, the receiver design
may be straightforward. The block diagram in Figure 21.1 assumes the use of a wide-band digitizer of
a type that has become recently available off-the-shelf. This type of design does not require a tunable
downconverter and may make it easier for the system to handle frequency hopping SUTs. A more
traditional downconverter-based design (with a narrowband digitizer) could also be used, in which case
the test system must be able to follow frequency changes by the SUT. In either case, an interface with the
SUT that allows the test system to follow frequency hops more easily is desirable.
Commercial channel emulators are available which can perform this function, but their inputs and outputs
are usually RF signals, and they are designed for mobile phone applications, so they are not useful in the
context of the test system examined in this paper. The underlying technology is available but must be re-
implemented in the proper form.
Signal Accumulator
The captured signal from the SUT must be combined with the emulated radar echoes, using precise
timing. The signal accumulator block represents a new (but straightforward) technology that must be
developed. Note that the echo signals are in the PDW domain while the SUT’s output is captured in the
time domain, so the signal accumulator must translate PDWs into the time domain. In addition, the SUTs
signal will not arrive at the same time as the emulated radar echo signals, so buffering and careful timing
is necessary. Once accomplished, the output of the signal accumulator is a time-domain signal that
represents the RF signal that would be captured at the radar’s antenna.
More generally, jammer effectiveness should be evaluated on a statistical basis – especially since the
jammer may ‘learn’ from one simulated run to the next, and its behavior will be modified by noise,
different navigation paths, and its cognitive algorithms.
A standard measurement technique would be helpful. Such a standard would help to avoid confusion and
duplication of effort across the field. For now, no such standard exists. This should be the topic of future
papers and industry discussions.
System Scalability
It is important to consider the issues that will arise when a test system is scaled up to include multiple
radars, jammers, and protected entities. Noting that all radar signals must be applied to all jammers, all
jammer signals must be applied to all radars, and all radar echoes must be received by all radars, it can
be seen that the complexity of signal and data connections in the system will expand factorially as the
system is scaled up. This presents architectural problems that must be resolved to prevent the system
from becoming unmanageable
As a subject for future investigation, it is proposed that ring and star architectures be implemented.
In these types of architectures, all of the necessary data is broadcast to every part of the test system.
System blocks can then listen for the data they need, ignoring the rest. Such architectures are often
used to create scalable systems – but these architectures are not common in test and measurement
applications, and further investigation will be needed.
Testing cognitive jammers – or any other cognitive system – will require the same level of innovative
thought that’s required to design the cognitive systems in the first place.
Cognitive systems will have to be full participants in their testing, with software and hardware interfaces
included that allow the test system to communicate with the SUT in a peer-to-peer fashion. Designers of
cognitive systems will be well-served to consider these requirements early in the design and development
process. Otherwise, expensive modifications will be needed to test them later.
X-COM Systems
IQC5255B
LAN PCIe®
LVDS
Figure 22.1. Combining the UXA signal analyzer and IQC5255B recorder with powerful software components
creates a comprehensive solution for RF streaming.
Table 22.1. Maximum recording time is a function of available memory and analyzer bandwidth setting.
Seamless integration between the analyzer and recorder enables you to configure and initiate recordings
directly from the UXA or PXA, streamlining recording control and eliminating the need for an external PC
or laptop. An added benefit is the ability to simultaneously view the live spectrum measurements on the
analyzer screen while a recording is in progress (Figure 22.2).
Figure 22.2. Real-time spectrum analysis (RTSA) mode provides live measurements of elusive signals even while
recording is underway.
With a modern interface such as PCIe, large files can be offloaded from the IQC5255B’s redundant array
of independent drives (RAID) array to the analysis computer (in the UXA) with nearly gigabyte-per-second
speeds. Once the data has been captured and stored as I/Q samples on the IQC recorder, it must be
analyzed, interpreted, and distilled into more compact forms such as mission data file (MDF) entries or
pulse descriptor words (PDWs).
Advanced signal processing tools are needed to turn this raw data into useful information and actionable
results. For example, the ability to search through large sets of data and isolate specific signal behavior
is essential to helping a system engineer or signal analyst determine whether the system performed as
expected or if there were any timing anomalies or unexpected RF emitters.
X-COM’s Spectro-X software allows you to quickly zoom in on desired recording segments using
automated signal- and pulse-search algorithms. It includes functions that range from basic frequency,
time, or amplitude filtering to highly advanced pulse pruning based on pulse width, pulse repetition
interval (PRI), and more. This level of functionality makes it easy to search through vast sets of data and
uncover rare events or signals (Figure 22.3).
Figure 22.3. Whether viewed in the time (top) or frequency domain (bottom), Spectro-X software helps detect
short-lived signal behaviors as in this interaction between an interceptor radar and a jamming response. Note the
relatively short duration of the interaction compared to the other scanning radars in the background.
Electromagnetic Environment
Raw
IQ Data
Identify Signals
DSP Tools of Interest Operate on very large data sets
Replay
Re-generation Hardware Portions
Recreate with high signal purity
RF streaming is big data. With 16 bit resolution on I and Q, streaming 100 MHz of IQ bandwidth for just
10 minutes would create 300 GB of data. Modern RF streaming applications routinely require bandwidths
over 200 MHz.
Thanks to modern digital interfaces and fast solid-state disk drive technology, recordings can be
streamed directly to the disk from the digitizing hardware. Wider streaming bandwidths require the data
stream to be split and fanned out to slow down the individual write rates to each disk. The parallelization
of data writing (and reading) is a storage management technique for a RAID.
and Routing
ADC
Data Sync
Real/IQ Controllers
In FPGA
(Processing /
Filtering)
RF DAC
RAID
Real/IQ Controllers
Out
High-Speed Offload
Analytics Workstation
Figure 22.5. Each link in the streaming solution is designed to meet or exceed data throughput requirements
UAV Jammer
mer
Surveillance
AIRCRAFT
ing
eam Base
Str SURVEILLANCE
S
RF
R
h RADA
rray Searc Interceptor
nte
Base Pha sed A DA
R AIRCRAFT
RA
SURVEILLANCE ch-
ear
or S
ect
Bis
Figure 22.6. An RF streaming solution is placed on-board an E2-C to record the interaction between interceptor
radar and jamming response from the UAV.
The first is the amount of bandwidth needed to capture the signals of interest. Even for multi-channel
recording systems, the engineer must determine how much IQ bandwidth is needed to capture the
signal in its entirety. Extracting pulse descriptor words from a signal that straddles more than channels is
very difficult. Furthermore, the streaming bandwidth should exhibit flat amplitude response and excellent
phase linearity to minimize distortion to the data. Poor IF flatness will manifest as poor ACPR or EVM on a
communications signal or phase errors on chirped radar pulses.
The second determinant in recorder selection is SFDR, which represents the lowest amplitude signal
that may be discerned from a large interfering signal. As defined by the ratio between the power of the
carrier signal and the RMS power of the next most significant spurious signal, it represents the sensitivity
of the measurement system to small signals. In pulse-Doppler radar signal processing, targets are often
represented in terms of their range and velocity.
• The response time between the first Blueforce transmit pulse and the first reply by the
Redforce jammer.
• The reaction time of the Redforce EW system, between when the Redforce radar warning receiver
(RWR) recognizes a potential threat and its first reply.
A live measurement cannot be performed on mission day, since this would require access to the Redforce
EW system test points. However, this measurement can be performed in a chamber if both Redforce and
Blueforce systems are available.
Figure 22.7. Radar-Jammer response timing. Blueforce initiates pulses which are detected by the Redforce RWR.
The Redforce then initiates a credible jamming signal as quickly as possible. Both Redforce reaction times are
critical measurements.
Figure 22.8. Example setup to simulate the Blueforce (radar) and Redforce (Jammer) timing and event recording.
The IQC5255B recorder accepts both marker and trigger inputs from the signal generators, along with high-speed
LVDS IQ data from the UXA signal analyzer.
1010
-10-10
-20-20
(d B m )
-30-30
Ma g n itu d e
-40-40
-50-50
-60-60
-70-70
-80-80
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
0.0 0.3 0.6 0.9 1.2 1.5(sec )
T ime 1.8 2.1 2.4 2.7 3.0
Time (sec)
Figure 22.9. Magnitude profile of RF environment during radar-jammer interaction. The top yellow trace is the
maximum value of the magnitude response while the lower green trace is the RMS value.
Figure 22.10. Successive zooming on the time-domain plots can reveal signal details down to the sample level.
Once a time segment has been identified for study as in Figure 22.10 above, the interaction can be
replayed in both frequency and spectrogram (joint time-frequency) domains for visual inspection.
Figure 22.12. Automatic pulse parameter calculation speeds validation of PDW performance against design
objectives.
Using the spectrogram function in the signal processing toolbox, we can reproduce the time-frequency
plot shown above, but in 3-D. Below, we indicated the signal anomaly with a marker. This is likely a
numerical artifact, as we find it shows up at the frequency limit of –100 MHz.
Measurement Challenges
Generally speaking, there are two primary goals of RF interference testing: to ensure interoperability and
compatibility. Interoperability testing focuses on design compliance to a published standard, as well
as margin testing, which helps engineers understand how well a system meets design criteria in the
presence of real-world signal levels and interference. Compatibility testing, on the other hand, focuses on
the “unintended interactions” between a system-under-test and other RF systems.
It’s important for engineers to understand whether radios from different vendors can interoperate with
one another, as well as if all the systems in an RF environment can play together nicely. Ascertaining a
system’s susceptibility to impact from and on other RF assets may also be critical.
To better understand why this approach falls short consider the high-level block diagram of a typical
signal analyzer shown in Figure 22.14. The main limitation to long-duration recording is that test
equipment typically has limited on-board memory.
Display
Preselect Down - Digitize Store Process
Convert
ADC DSP RAM µP
RF Acquire Read &
Input Data Store
For comparison purposes, consider the data acquisition from a typical signal analyzer with limited on-
board memory, as shown in Figure 22.15. Note the gaps in data that occur once its memory is filled up.
FAILURE
MISSED
Figure 22.15. With a typical analyzer, once its memory is filled up, data is “read” from the digitizer to the
microprocessor for processing and display. During this “read,” any new samples available at the digitizer cannot
be processed and are missing, creating a gap in the continuous acquisition of data and resulting in failures being
missed.
RAM
ADC DSP RAM Storage
buffer
RF Acquire
Input Digitizer PC RAID
data
Keysight’s gapless recording system is available in predefined packages that have been tested to
guarantee sustained data rates. The configured systems include data interface cards and modules and
can be used with Keysight’s 89600 VSA signal analysis software.
There are four main types of RF Recording use Cases: Known/Known = System validation/stress testing,
Known/Unknown = Threat Assessment, Unknown/Unknown = Spectrum monitoring, Unknown/Known =
Difficult test parameters. Today’s focus area is in system validation and stress testing in labs and its main
benefits are that it validates the test source with every pulse and acts as a witness recorder for hardware
in the loop (HITL) testing.
Jammer validation today is focused on the mission of confirming the expected output of the EW system
under test (SUT) or jammer system. It does this by measuring PRI, pulse widths, amplitude, frequency,
and more and its main purpose is to provide insight into techniques such as pull-off rates, J/S, multiple
false targets, and more.
Validation is important as it provides confidence that a platform will perform correctly during engagement.
Reprogramming is time-limited as test labs have around-the-clock usage and testing is expensive,
especially in outdoor ranges. Thus, the more that can be done in the lab to ensure that the SUT will
perform properly helps ensure proper performance later.
Modern EW threat analysis faces challenges in long simulation time, wideband analysis, and agile
emitters. Thus, Keysight’s radar recorder resolves these challenges by being multichannel and agile.
Threat simulators are inherently multichannel or multiport, measuring AoA is important for scenario
validation, and direction-finding is of interest. These 3 facts support the need for a multichannel radar
recorder. In addition, emitters and threats occur across frequency bands, with communication and radar
signals often occurring at the same time. Keysight’s radar recorder also utilizes absolute timing as there
is a need to analyze time-synchronized events and it is easier to do so when there is an understanding
of when recorded events occurred. In addition, a streaming recording architecture is needed as test
scenarios can range from seconds to hours. Thus, a high rate, gapless data capture system is needed
which is often beyond the capabilities of ethernet.
Real-time radar recorders split up these capabilities between various steps that occur while the data
is being acquired and after the data has been acquired. Recording can overlap with data offload
analysis. There is an unspoken time order because data must first be acquired to be analyzed, a series
of recordings can overlap with a series of analyses, thus boosting throughput. In addition, off-system
analysis can be possibly integrated into this process to archive the recorded data. Not every use model
will require off-system analysis, but this is a great feature that real-time radar recorders can provide.
Real-time radar recorders can be used both as a threat simulation validation tool and as a tool to witness
recording EA system output. These systems allow for input vs output jammer analysis, enable faster time
to confidence in testing, provide the ability to view large amounts of data in a more meaningful way, and
are scalable in size. Thus, these recorders appeal to the two personas in the radar industry mentioned
earlier as the recorder can collect and analyze large amounts of data both during data collection and after.
These 4 main features together allow for input vs output jammer analysis, enables faster time to answer
and increased confidence in testing, allows the user to view large amounts of data in a more meaningful
way, and has large or mid system applicability.
> 4.0
S-Series (8 GHz)
VDI+S VDI+S
Analysis bandwidth (GHz)
1.5
Z9071B:
Z9070B: PXA + S-Series (3 to 50 GHz) M1971E + S-Series
1.0 (57 to 90 GHz)
UXA (50 GHz)
0.5
0 10 20 30 40 50 60 70 80 90 100
Carrier frequency (GHz)
Figure 22.18. Determining the best-fit tool depends on the carrier frequency and the required analysis bandwidth
Up 1 1 1
to 4 S-Series V-Series Z-Series
#Channels
PXA
2 2
1 PXA UXA + 3
510 MHz 1 GHz Scope
1.2 GHz
Figure 22.19. Channel count versus bandwidth is another important consideration when selecting a wideband
measurement tool.
The one-channel PXA signal analyzer can measure signals with carrier frequencies up to 50 GHz
and offers up to 510 MHz of analysis bandwidth. Similarly, the single-channel UXA can handle carrier
frequencies up to 50 GHz and offers a maximum analysis bandwidth of 1 GHz. Note that it is possible to
link multiple PXAs or UXAs to create a multi-channel solution.
An S-Series oscilloscope provides two channels with 8 GHz bandwidth or four channels with 4 GHz
bandwidth. The V-Series oscilloscope offers two channels with 33 GHz bandwidth or four channels with
16.6 GHz bandwidth. The Z-Series oscilloscope offers two channels with 63 GHz bandwidth or four
channels with 32 GHz bandwidth.
An oscilloscope can handle signals with spectral widths nearly up to its bandwidth. One requirement: the
carrier plus modulation must be sampled with enough bandwidth to capture both. For example, a signal
with a 6 GHz carrier and a 2 GHz wide modulation would fit within the 8 GHz bandwidth of an S-Series
oscilloscope and could therefore be evaluated.
Figure 22.20. The UXA’s wide integrated bandwidth simplifies the measurement of linear FM-modulated pulses.
A wideband analyzer also offers benefits in measuring narrower pulsed signals. For example, when
measuring pulse rise-times or viewing parameters such as overshoot or droop, the wider analyzer
bandwidth offers a faster sample rate, providing more resolution for these measurements.
It’s also important to see multiple emitters in any radar or EW signal environment. These emitters likely
will also have some intra-pulse modulation and can occur over a wide bandwidth. The UXA can capture
multiple emitters across 1 GHz of bandwidth and calculate statistics over a long period. In addition, the
optional N9067C pulse application automatically detects and analyzes pulses, providing comprehensive
results that enable the full characterization of captured pulses.
The high sample rate and deep memory available in Keysight oscilloscopes make it possible to capture
a radar pulse and extract its envelope information and the embedded coding. Many of the capabilities
built into today’s scopes also support detailed troubleshooting and analysis. For example, the scope
can directly digitize a signal at RF or IF and then process the signal with internal math functions to plot a
histogram or calculate parameters such as absolute value (Figure 22.21).
Figure 22.21. Built-in oscilloscope capabilities make it possible to acquire a chirped radar signal with a bimodal PRI
and then display a histogram of thousands of pulses
In the design of radar and EW systems, increasingly complex pulse compression techniques are being
deployed to maximize resolution and range or to reduce the likelihood of detection. To help you identify
and measure performance, test solutions must deliver high resolution, excellent dynamic range, and wide
analysis bandwidth. Keysight’s range of COTS solutions include vector signal analysis software, wideband
signal analyzers, and multi-channel wideband oscilloscopes. Compared to traditional approaches,
these tools provide enhanced ease of use that simplifies the process of producing accurate, repeatable
measurement results.
Figure 22.22. The wide integrated bandwidth simplifies measurements of linear FM-modulated pulses.
Figure 22.23. The image on the left uses half the sample rate of that on the right. The larger sample rate (or wider
bandwidth) shows a clearer envelope of the signal and hence a better representation of the signature of the pulse.
Finally, it’s important to see multiple emitters in any radar or EW signal environment. These emitters likely
will also have some intra-pulse modulation and can occur over a wide bandwidth. The UXA can capture
multiple emitters across 1 GHz of bandwidth and calculate statistics over a long time. The N9067C
embedded pulse application automatically detects and analyzes pulses, providing comprehensive results
that enable the full characterization of captured pulses (Figures 22.24).
Figure 22.24. The N9067C embedded pulse application can display numerous pulse statistics, simplifying the
characterization of dense pulse environments.
Figure 22.25. The large multi-touch display provides side-by-side views of real-time measurements and tabular
pulse metrics, which can be easily exported for post-analysis.
In the UXA, an enhanced 255 MHz bandwidth path co-exists with the 1 GHz wideband path, offering
approximately 80 dBc of dynamic range and gap-free RSTA capability. In addition to ensuring that no
signal is missed, real-time also provides frequency-mask and time-qualified triggers (Figure 22.26). Users
can prune and select specific signals in a dense environment using time, frequency, and amplitude
triggering, or any combination of the three.
Figure 22.26. Frequency-mask trigger enables frequency-selective analysis with RTSA up to 255 MHz of bandwidth.
With wide analysis bandwidth, the flagship UXA delivers wide-open performance and deeper views of
elusive and wideband signals. In-depth analysis is made easy with the pulse application software and the
14.1-inch screen with multi-touch UI. With its familiar spectrum-analyzer user experience and capabilities
never offered in an integrated instrument, the UXA enables you to see more and take your designs farther.
It is important to note that the scope of EA is wider than jammers alone as many new systems are
able to use machine intelligence to generate a sophisticated multi-faceted attack with the objective
of fooling the radar and not merely jamming it. This new approach to EA is in response to new low-
probability of intercept radars, radars that utilise spread spectrum techniques, smart radars using
beam management to mitigate EA and multi-static radars.
Spectrum scanning and analysis for both radar signals and EA signals requires similar technical collection
techniques and will include:
Technical parameters collected are aligned with signatures and are stored in a Parametric Database.
Radar and EA parameters are collected under a Pulse Descriptor Word (PDW) and are assigned to a
signature. An integrated collection of Signatures is the basis for an Electronic Order of Battle (EoB).
Electronic Support (ES) military units (aircraft, UAVs, satellites, maritime units, and terrestrial army units)
revisit signatures periodically to confirm or update. Occasionally new objects are found and after analysis
new signatures is added. Some parameters are gathered through other intelligence channels not involving
the electromagnetic spectrum.
Cyberspace Operations
Employ cyberspace capabilities
to achieve objectives.
Cyber
Electromagnetic
Electronic Warfare Activities Spectrum
Use electromagnetic and
Management
directed energy to control Operations
the electromagnetic spectrum
or to attack the enemy. Plan, coordinate, and manage the
use of the electromagnetic spectrum
• Electronic attack through operational, engineering,
• Electronic protection and administrative procedures
• Electronic warfare support to deconflict all systems.
RF Rx Spectrum Analyser
Transmission Electronic Attack Pulse Descriptor Words
Emulator Scenario Generation (PDW) from ELINT
Radar Signal Generator
Noise Generator
Range deception
Radar Mode
Operation
Velocity deception
Radar
Operations
Analysis
For the effectiveness of a friendly EA asset, a radar test environment is set up using PDWs representing
an enemy radar as shown in Figure 23.3.
Radar Emulation
Scenario Controller
Channel Emulation - PDW Domain Radar Echo Generator
Tx Emulation
Rx Emulation
Channel Emulation - PDW Domain Signal Generator
Initially, we need to look at the system calibration process. First, there is the need for system
coherence. Next, we need amplitude alignment, phase alignment, and time alignment to emulate
angle of attack, also called angle of arrival (AoA). Once we have a coherent system that is
amplitude, phase, and time-aligned, we can use the calibrated system to create a realistic
emulation of an electronic warfare electromagnetic environment.
Accurately modeling the environment of an electronic warfare scenario requires generating the
signals that represent the angle of arrival characteristics of all platforms of interest. To make the
emulation of such signals meaningful there must be a very careful creation of amplitude, phase, and
timing differences between signals as would be received on multiple antennas of the SUT. The first
step in this process is to remove as much error in the signal generation system as possible. This is
the primary purpose of calibrating an EW emulator.
Realistic Model
Amplitude of Electronic
Time Alignment
Alignment Warfare
Environment
Phase coherence is a critical consideration to ensuring success. Two systems are coherent if they have
a constant, relative phase at all instances in time. Signals can have phase noise and phase drift and still
be coherent. When the phase impediments are common to both signals, they will cancel out and not be
present in the relative phase. It can be seen by how coherence is described in the given equation.
coherence
expected value operator
average value
std deviation
covariance of signal X and signal Y
signal X
signal Y
Equation 24.1. Coherence equation
Signals with the coherence of value 1 are fully coherent and those with value 0 are completely non-
coherent. When the coherence is somewhere in-between with partial coherence, they are called phase-
stable signals.
A second factor, besides needing phase coherence, is having signal alignment. This is when the
relative amplitude, phase, and time can be set to near 0, and then adjusted to desired values. Through
calibrations, one can know what the relative amplitude, phase, and time are as a starting point. Then,
differences in amplitude, phase, and time between the signals can be introduced to emulate accurate
AOA characteristics.
2. Phase
3. Time
The main dimensions to calibrate on are amplitude, phase and time. This can be done at a single
frequency point or across multiple frequencies depending on the SUT design requirements. This removes
as much uncertainty from the system as possible.
Az
+ Az
Phase
The difference in the phase of two signals in a system defines the phase alignment. Once signals are
phase aligned, they can be programmed for desired phase shift.
Incident
wavefront
Phase
difference
d
Antenna Antenna
1 2
Origin at Receiver P0
z
V
P0 Y
Pm
X
R0
PN Rm
RN
R1 E
P1
Emitter
Receivers
Wave front
Approaching the receivers
Once the threat emulator is coherent and the output signals are aligned, RF threat emitters can be
accurately emulated. Amplitude, phase, and time alignment in a system allow for accurate calibration
between the emulator and the threat, thus ensuring that your threat emulator is accurate. Keysight’s
89600 VSA software can be used with Analog and Vector UXGs to create an accurate threat emulator.
These milestone decisions made during the early stages incur upfront costs that are relatively
high compared to the rest of the program’s per-incident costs. However, these key decisions
also define the rest of the program, including the long-term costs during the sustainment phase.
For example, downtime due to improper planning of test equipment maintenance, especially
during production runs, can put a program budget and schedule at high risk. It is therefore vital to
consider sustainment challenges and costs in the early stages of the program, and the associated
requirements and consequences for program suppliers.
Let’s consider the concept of sustainment according to the government. Reference 3, for example,
lists several key goals for sustainment activities. The first is to maximize the chance of mission success
through guaranteed availability to meet mission requirements. This is measured through parameters
that quantify operational availability and the probability of success of the given mission. Second, unit
self-sufficiency during the mission is a goal that is measured by the length of time a unit can maintain
self-sufficiency. In this context, self-sufficiency means that a combat unit can operate without external
resupply or support for a given period or combat pulse. Self-sufficiency must be balanced by the total
number of personnel required for a given combat unit to be successful. The goal is to minimize the
number of additional forces dedicated to sustainment while maximizing the length of time a unit can be
self-sufficient.
Thus, you can see how sustainment is an essential component of mission success. In addition, expenses
due to ongoing operational and maintenance activities are becoming an increasingly larger part of
total expenditures. This is shown in Figure 25.1, which depicts total expenditures by category for A/D
programs2. In the chart, the operations and maintenance category has increased by 10% from the
1980s to the 2000s. It is projected to increase further to 44% of total expenditures by 2029. Personnel
expenditures have also increased, likely due in part to increased demand to meet sustainment goals.
Unfortunately, although sustainment costs are becoming more significant, it continues to be undervalued
and underappreciated during the key decision phases.
Expenditures by category
2%
7% 4% Other
9%
Research, development, testing, and evaluation
11% 13%
Procurement
18%
Personnel
20%
Operations and maintenance
30%
27%
24%
23%
39% 44%
29%
A B C
LRIP
Operational Test and
Evaluation (OT&E) Sustainment Disposal
Material Technology Engineering & Production & Operations & Support
Solution Maturation & Manufacturing Deployment
Analysis Risk Development
Reduction
Now that we have established what the goals are for sustainment and that it is becoming increasingly
important to manage sustainment-related expenses, let’s consider the program support strategy and
the associated consequences for the suppliers of those programs. Figure 25.2 depicts the program
• Sustainment metrics that are continually monitored and managed to minimize program costs and
risks to schedule and quality
• An initiative to improve reliability based upon failure modes and critical analysis. Data is captured
during the engineering development phase and through systems health info that is available through
on-board and off-board technologies
• The ability for competition at the prime and subcontract levels for both system and subsystem levels
The sustainment plan is not fixed. Throughout the lifecycle, the plan performance will be assessed and
modified as necessary to reduce cost and risk.
What, then, is the impact on suppliers? Ongoing assessment of a supplier’s ability to provide support is
part of the overall management of sustainment for the program. It is therefore imperative for the supplier
to provide products and product support for the length of the program. It also means that consistent
yields are required. In addition, for the supplier to continue to provide the lowest possible cost and remain
competitive, predictable costs are required. For example, if the supplier’s costs are at risk of increasing
over time, this increases prices for long-term programs and reduces the supplier’s competitiveness. And
finally, to improve sustainment metrics and manage long-term costs, contracts are often re-bid at later
program stages. When a supplier can maintain consistent costs and continue to improve efficiency, the
chances of winning the re-bid are significantly higher.
• Implementing a zero-defect policy for suppliers to ensure uncompromising quality; this means that
suppliers’ parts must always meet their specifications
• Minimizing downtime to mitigate schedule delays
As a result, understanding the limits of test system performance and maintenance is essential for
sustainment purposes.
Finally, support costs become significant when a commercial product is reaching its end of life.
Unfortunately, not only are costs higher at the product’s end of life due to shortages in parts supplies, but
failures tend to occur more often. These risks are more apparent for long-term programs because the
lifecycle of most commercial products is shorter than that of most A/D programs.
An underlying issue becomes clear when analyzing the various challenges of sustaining long-term
programs: all these risks require time and effort to manage and mitigate. The real goal, then, is not just
to mitigate these risks. Instead, it is to eliminate the need to think about them at all. If all these risks are
addressed by a third party with the appropriate expertise, then a defense contractor can truly focus on its
core proficiencies, and this in turn increases its competitiveness, profitability, and longevity in the market.
$450,000
$400,000
$350,000
$300,000
$250,000
$200,000 Per Incident Method Agreement Method
$150,000
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
Yr1 Yr2 Yr3 Yr4 Yr5 Yr6 Yr7 Yr8 Yr9 Yr10 Yr11 Yr12 Yr13 Yr14 Yr15 Yr16 Yr17 Yr18 Yr19 Yr20 Yr21 Yr22 Yr23 Yr24 Yr25
The upper plot in Figure 25.3 shows the total cost of sustainment as a cumulative total from years 1
to 25. For simplicity, the figure shows the repair and calibration costs for a Keysight vector network
analyzer. The lower plot in Figure 25.3 shows the annual support costs for the per-incident method. The
agreement price grows at a 3% inflation rate, so it was not included in the lower plot. Until about year 5,
the two methods have similar prices (red and gray lines). But, the cost of each major repair is significantly
higher than the agreed price. In general, the agreed price for the entire year can be as much as 70%
lower than the per-incident price of one major repair. Therefore, by year 10, the agreement method
becomes the lower-cost option. As the program reaches its long-term sustainment phase, the associated
equipment has aged and tends to fail more often, decreasing the meantime between major repairs. This
creates a major difference in total cost by year 25, the end of the program. In this case, the total cost of
sustainment of the agreement method is only 66% of the total cost of paying per incident.
Furthermore, it is important to note that it does not take many failures to justify using the agreement
method. To maintain an approximately equal total cost between the methods, no more than two major
repairs can occur within 25 years.
An alternative approach is possible and would dramatically reduce upfront costs while managing
ongoing expenses appropriately. Using this approach, the program contractor partners with the OEM to
plan for long-term support. An end-user who chooses to adopt this approach can achieve predictable
sustainment costs because the OEM using this planning approach can ensure consistent prices. This
partnering approach utilizes a key role that must be created by the OEM called the “project success
manager.” The project success manager is responsible for ensuring that support is available, provided
only as needed, and delivered at the lowest possible cost, which translates to a low, predictable cost for
the program contractor.
There are four key aspects of this approach that are implemented by the project success manager.
First, for system elements that are manufactured by the OEM service provider and have not been
discontinued yet, the project success manager works with product planners to ensure that parts are
available throughout the life of the program. Product planners then make lifetime buys when necessary
to ensure that parts are available for standard support purposes and any existing sustainment contracts.
Second, the project success manager continually audits the system bill of materials to determine when
obsolescence is imminent and secures the appropriate parts or spares. For example, a CPU often has
a much shorter lifecycle than a typical A/D program. The project success manager must ensure that
enough spare CPUs are available, which are compatible with the system and meet program requirements.
The final aspect of this novel approach for sustaining test systems is to continually plan, especially
earlier in the program’s lifecycle. The project success manager, therefore, ensures that predictable,
consistent costs for support are achieved. This translates to an overall predictable cost of sustainment
for program contractors.
Consider Figure 25.4, which depicts the tradeoff between the value and cost of a sustainment solution
based upon which program phase is currently employed. At a high level, this graphic depicts the inverse
relationship. The earlier that you plan for sustainment, the more options there are available to achieve the
lowest cost. One reason for this, as discussed, is the number of options available to acquire or supply
stockpiles of parts. In addition, besides parts supply, sustainment and test costs can be significantly
reduced through a combination of services that are tailored according to the program phase and goals.
Greates ly
t flexibil est supp
ity, lowe cost, low
Cost provide
highest
Flexibility, value
sustainment
st cost,
most va
lue Least flexibility,
Figure 25.4. Tradeoff between value and cost based upon program phase
To better understand the cost versus benefit tradeoff, consider the cost of downtime according to the
current program stage. For example, in the earlier development and prototyping stage, downtime is
more manageable and may be mitigated through a spare program or even a return-to-OEM strategy with
dedicated turn-around-times. On the other hand, when a system is getting used regularly to identify and
verify new threats, the cost of downtime is likely much higher. This is especially the case when lives are
at stake. The difference between sending individual instruments away to be calibrated and an on-site
approach can reduce downtime from months to days, or even hours. Check with the original equipment
manufacturer (OEM) on available solution-level services that reduce downtime. Examples could include a
customized solution of on-site repair and calibration services, dedicated loaners for any instruments that
cannot be serviced on-site, and guaranteed response times for on-site service calls.
Consider the following case study that highlights how partnering with the hardware solution provider can
mitigate program and schedule risks while providing consistent access to the system. In this case study,
the defense contractor needed to increase its system output but did not have the people, equipment, or
floor space to meet the requirements. Current system uptime was less than 70% and was considered
acceptable based upon uptime measured on other systems and programs. However, by partnering with
the OEM system provider on a comprehensive uptime program, the contractor achieved consistently
greater than 90% uptime. This additional uptime translated to greater capacity, which allowed the
contractor to achieve the increased production targets without acquiring more facilities or floor space. The
comprehensive program consisted of OEM expert personnel embedded in the contractor’s environment
with a working set of spares and parts to provide all required services inside the secure environment. All
moving of parts and equipment in and out of the secure environment was performed independently, and
therefore this did not impact the contractor’s system uptime.
Technical Support
Technical support is a key component of the support plan for any test system. Understanding the use of the
system, or perhaps even more importantly, identifying whatever is causing unexpected issues with the test
system is an absolute necessity to most efficiently utilize the time spent on the system and increase overall
capacity. This ensures schedules are met and system use is maximized. Technical support at the system
level can take on many forms, whether remote or on-site. Based upon the program stage and requirements,
it is important to consider the best method for receiving regular technical support, as well as the process
that is used in the event of a support issue. For example, while on-site technical support may be especially
useful in the beginning after the system has first been delivered, remote support may be sufficient once
the initial learning phase is completed. While a remote expert would not be able to see the system, he or
she should know about the system architecture and would still be able to troubleshoot issues remotely. In
addition, any required service such as a repair could be quickly identified and ordered remotely.
Sustainment is a major contributor to the overall program cost, and in many cases is the leading
contributor. This has consequences. For example, long-term supportability is required. Also, it is
important to maintain predictable costs and utilize cost-management techniques (e.g., improve efficiency).
Not only is sustainment a leading contributor to the program cost, but most of these costs are also
locked in by decisions made during the development phase. As shown, managing risk through a planned
approach to sustainment can ensure predictability and lower overall costs versus addressing and
managing the issues when they arise. Predictable costs ensure maximum probability of success when
re-bidding contracts and maximum probability of total program profitability. They also remove the risk of
high-cost per-incident support events.
Unfortunately, it has been common to accept the risk of managing issues when they arise. This may seem
to be the lowest-cost option, especially at the beginning of the program when support costs are usually
low. However, this is not the best long-term option. The costs can be very high, and there is no way to
predict the magnitude or timing of those costs as the program ages if no planning has been done earlier.
Predictable and consistent costs are achieved by partnering with an OEM that is committed to delivering
the right level of support throughout the lifecycle. The innovative approach to sustainment solutions
discussed ensures test systems are operational and maintained long-term, provides the right level of
uptime support, and minimizes total sustainment costs. Additionally, while incorporating sustainment
solutions earlier in the program enables greater value and cost savings long-term, a customized
sustainment solution can be created for any phase of the program and set of requirements. One example
of this is an evolving uptime solution tailored to the given program stage and requirements.
References
1. D. Gouré, “Pentagon Plan To Manage F-35 Sustainment Is A Good Move,” lexingtoninstitute.org,
Jun. 1, 2015. [Online]. Available: https://www.lexingtoninstitute.org/pentagon-plan-to-manage-f-35-
sustainment-is-a-good-move/. [Accessed: Feb. 12, 2019].
2. S. Hurt, “Three Ways the U.S. Department of Defense Can Achieve Its Sustainment Objectives in
Challenging Times,” atkearney.com, Feb., 2013. [Online]. Available: https://www.atkearney.com/
aerospacedefense/article?/a/three-ways-the-u-s-department-of-defense-canachieve-its-sustainment-
objectives-in-challenging-times. [Accessed: Feb.15, 2019].
3. E. Peltz, “Equipment Sustainment Requirements for the Transforming Army,” rand.org, 2003. [Online].
Available: https://www.rand.org/pubs/monograph_reports/MR1577.html.[Accessed: Jan. 18, 2019].
4. Executive Services Directorate, “Department of Defense Instruction 5000.02,” Executive Services
Directorate, Aug. 10, 2017. [Online]. Available: https://www.esd.whs.mil/Portals/54/Documents/DD/
issuances/dodi/500002_dodi_2015.pdf. [Accessed: Feb. 2, 2019].
Emphasizing the importance of security, the concept of DevOps is extended to DevSecOps. The US Air
Force’s Office of the Chief Software Officer defines this as “the software automated tools, services, and
standards that enable programs to develop, secure, deploy, and operate applications in a secure, flexible,
and interoperable fashion.” Among the benefits of the adoption of DevSecOps are shortened release
cycles, higher-quality releases that can incorporate continuous feedback from real end-users, and the
automation of testing and security.
The iterative development approach encapsulated by the phrase “Software is never done” suggests
a constant cycle of planning, coding, building, and testing. More specifically, continuous testing is
a requirement of the execution phase of software development, with DoDI 5000.87 indicating that
whichever software development methodology is being used, it must “incorporate continuous testing and
evaluation, resiliency, and cybersecurity, with maximum possible automation, as persistent requirements
… throughout the entire lifecycle.”
• Testing should cover the user journeys and interactions between the users and various devices in
radar systems, not just individual software components in isolation.
• There is often a diverse set of interfaces to be tested, from the command line to graphical user
interfaces (GUIs) like touch screens.
• As such, it is important to have the ability to test multiple endpoints built on entirely different
technologies and programming languages.
• Tests should be able to be conducted in a non-invasive manner, i.e., without access to source code.
• Testing solutions should exist on-premises and be operable without phoning home.
Testing requirements are not limited to individual systems, components, or pieces of software themselves,
but rather the supersystems of connected devices and software covering multiple endpoints. As such,
principles and practices from software test automation can be applied in the context of radar systems
and electronic warfare. The sheer diversity of devices and software means that any software test
automation solution must be sufficiently adaptable. This goes way beyond simple bug testing. Interactions
that real users can do must also be tested, such as using a touch screen, transferring data across a
network, or reaching into a database.
• Regression testing — When certain components of the system are upgraded, will the previously
developed and tested software still work in the desired manner?
• Usability testing — Can operators of radar systems access and use the features needed to fully
take advantage of the systems’ capabilities?
• Performance testing — It’s important to replicate real-world conditions to ensure that the systems
can perform in the desired manner. Tests should look at peak conditions, operating capacity,
application and device integration, response time, and loading speed.
• Functionality testing — This covers testing system functionality, user workflows, and accessibility
considerations.
• Integration testing — Does the software interact with or draw information from other systems? If so,
these integrations need to be tested.
• Security testing — The software needs to stand up to the strict security standards and protocols
demanded by defense agencies.
• Exploratory testing — The testing solution should be able to proactively track down and identify
bugs. Software test automation can be augmented by artificially intelligent bug detection that will flag
up errors that human testers will miss.
In short, AI allows software interfaces to be interpreted and intelligently interacted within the absence of
direct human supervision or input. AI can then explore the various permutations of actions possible in the
interface, autonomously generating novel user journeys that may unearth otherwise unknown bugs and
defects. This exploration of an application or software system is called exploratory testing, a discipline
that has traditionally been heavily reliant on manual human testers. AI-augmented exploratory testing can
be a uniquely effective method to “identify system capabilities, limitations, and deficiencies,” a requirement
of DoDI 5000.89, ‘Test and Evaluation.’
Software test automation benefits from AI by first interpreting the text and visual elements on the
screen via optical character recognition (OCR) and computer vision, respectively. This requires the AI to
apprehend and interpret various screen elements, whether they are input controls (e.g. buttons or text
fields), navigational components (e.g. breadcrumbs or icons), informational components (e.g. notifications
or message boxes), containers, or other objects. Once a model of the application or system under test
has been constructed, intelligent agents (sometimes referred to as ‘bots’) will navigate the application and
perform actions.
• Exploratory testing models learned from millions of user journeys across all types of software
and devices.
• User behavior observed from interaction with the specific application to be tested. The application
can be instrumented and event-level data from real usage is collected and used to train the AI.
AI is also helpful for the visual validation of software. Code or object-level testing tools can provide a
certain level of confidence that data and objects have loaded properly. However, certainty can only be
achieved if visual validation tools are used to ensure that the elements onscreen reflect the intended
outcomes. In other words, computer vision can be used to verify that the user interface is behaving
expectedly. When visual validation fails, this indicates to development teams that there is some behavioral
quirk in the software that needs to be addressed.
Intelligent agents can also be used to stress test systems for performance and load testing. Virtual users
can flood an application, with visual validation tools used to ascertain the impact on the user experience
of peak loads.
AI has a great deal to offer software teams in the radar and electronic warfare space. By augmenting
existing testing methods through AI and automation, developers can achieve a much greater
understanding of the true performance, behavior, and utility of their software in real-world scenarios.
Ultimately, this reduces the amount of ‘unknown unknowns’ for the modern warfighter.
SecOps Impact
Breach and attack simulation expose the gaps in your security environment, but it also helps you fix
the problems and then re-audit to confidently know your work has made your security stronger. For too
long, security professionals have often had to simply guess that what they did on a Monday helped the
company’s security on Friday. With breach and attack simulation, that is no longer a question. Now you
know the impact of your time and resources, allowing you to accurately measure security operations
effectiveness and costs.
A defense organization will be genuinely assured in its security posture only after having it tested. Being
“tested” is not a euphemism for suffering a breach. Being tested means deploying a breach and attack
simulation solution to continuously create security audits. Continuous breach simulation identifies weak
spots and misconfigurations to be more closely monitored. With breach and attack simulation, an
organization gains first-hand insight into how the attack will succeed — without opening the door to
their adversaries.
Additional Reading
Breach & Attack Simulation For Dummies, Keysight Technologies Special Edition
The electromagnetic (EM) spectrum environment is evolving with increasing speed and complexity.
New threats emerge constantly, driving the need for electronic warfare (EW) systems that can
accurately identify and neutralize radar threats. Often, these responses include adaptive and cognitive
countermeasures. To provide the accuracy required for system performance, EW tests and evaluations
must adapt through significant advances.
This challenge faces increased pressure with high-fidelity complex emitters, as there is a need to simulate
and analyze high-density environments. As the EW threat environment continues to evolve, confidence
and reliability in EW system validation and verification requires modernization and improvements in the
test and evaluation process. To ensure consistency throughout the development, testing, and deployment
of EW systems, you must identify when or where an error occurred. With Keysight’s full range of COTS
building blocks, you can test and evaluate from digital modeling in research and development through
system integration, flight tests, and fully operational systems.
Using a COTS range of test and measurement equipment provides testing flexibility and adaptability
as the system moves from a digital model into hardware prototypes during hardware-in-the-loop (HIL)
testing. Choose from a range of arbitrary waveform generators and agile vector signal generators for
signal generation. You have a choice of oscilloscopes or digitizers for signal analysis. Using SystemVue as
a platform, you can control the hardware test setup.
• Analyze entire system including dynamic flight path, multi-emitters, jamming, and interferers
• Model environment, RF hardware, antenna, and phased array effects
• Reduce cost and time of field flight tests through simulation
SystemVue
TEST SCHEDULE CONTROL
INSTRUMENT CONFIGURATION
SUT CONFIGURATION
REFERENCE RECEIVER
ADVANCED MEASUREMENTS
With an agile signal generator that can switch frequency and settle amplitude in the hundreds of
nanoseconds at different frequencies, you can accurately simulate radar threats and targets. When
looking for a solution to simulate your RF environment, make sure the product’s internal modulation
bandwidth is sufficient to cover your threat frequencies of interest. Our solution combines UXGs,
calibration hardware and software, and application software for pre-scripted or dynamic threat generation
scenarios. The application software has been configured to simulate an electronic battlefield with
thousands of emitters.
Rx
The UXG agile signal generator’s ability to fast frequency hop with phase continuity and repeatability
makes it an ideal source to efficiently simulate complex threat environments across the signal generator’s
full 40 GHz range:
• Multiple pulse-Doppler radars at different frequencies while maintaining the original phase as the
signal generator hops from one emitter frequency to another
• EW scenarios with thousands of radar threat-emitters and millions of pulses per second with unique
antenna scans
• IQ custom complex modulation on pulse with the UXG Vector Adapter including linear and nonlinear
frequency modulated chirps over a 20 GHz range
• Scaling up the number of UXGs to increase pulse density while enabling pulse-on-pulse simulations
or multi-port angle of arrival (AoA) simulations
• AoA simulations with multiple UXGs and staggering identical pulses played out of different ports
(different UXGs) in time, phase, amplitude, or all three
The key is pulse analysis software. Using the Keysight N9067C and 89601B software, you can
differentiate threats with pulse-scoring filters based on characteristics such as pulse width, PRI, and
modulation type (including linear and non-linear modulation). You also can capture long scenarios with
efficient memory usage and make correlations and sidelobe measurements.
Dual-domain analysis with narrow bandwidth enables frequency domain analysis while wider bandwidth
targets time-domain analysis. Using the 89601B software, you can compare sequential pulses to assist
with radar output waveform validation with Pulse Similarity Scores. Pulse Train Searches ensure that radar
mode changes happen as expected.
For example, the Z2099B family’s wideband, multi-channel design allows simultaneous two-channel
recording for analysis on both inputs and outputs. Real-time measurement and PDW scoring increase
confidence in testing while introducing the rapid verification of measured pulses. You can easily view
and analyze large amounts of PDW data via the analysis software. Staggered channel capture allows
for simultaneous recording and data offloading and analysis. This system family ranges from small and
transportable to fill systems, allowing the radar recorder to scale easily.
1 N7660C and Z9500A software are subject to US ITAR export regulations. For more information, contact your Keysight sales
representative.
• N5193A/94A Agile signal generators for multi-channel and multi-port threat simulations
• Arbitrary waveform generators for threat simulation for baseband or wideband verification
• Oscilloscopes, signal analyzers, and digitizers for wideband signal analysis
• Flexible FPGA tools and storage and streaming options for closed-loop simulations
• Control several UXG stacks located over a significant distance from one central location
• Use the same PDW library and threat simulation files from early prototype and system integration
testing to verify in-flight/operation receiver & processor effectiveness and stability and
• Play the same files and simulations at the corresponding UTC across different labs or locations
• Receiver Test
- noise figure
- functional test with CW source
• Emitter Verification
- verify signal output and characteristics with a power meter, spectrum analyzer, and real-time
spectrum analyzer to 50 GHz
- pulse profiling to 40 GHz with USB peak power sensor
• Op check entire RF chain or individual components, radiated or closed-loop
- antennas, cables, converters, amplifiers
- distance-to-fault and Time domain reflectometry (TDR)
• Op Check GPS
- evaluate carrier-to-noise density (C/N) and distribution amplifiers
• Implement an optimal migration strategy with Technology Refresh Services to modernize test
equipment to the latest technology as soon as it is available with upgrade and Trade-In Services
• Have confidence that your instruments are performing to specification by utilizing Keysight’s global
network of service centers across multiple countries
• Avoid the need to disassemble and reassemble test systems and improve true yields with System
Calibration Services
One of the long-standing trends in the industry is the need for long-term support for sometimes multi-
decade programs with little to no budget for upgrades:
• Use Extended Support plans to ensure the availability of parts for repair and calibration procedures
for legacy instruments
• Take advantage of Keysight’s expertise in test and sustainment planning through Consulting Services
• Leverage One-Stop Calibration Services to reduce logistical complexity and lower costs with one
point of contact for the calibration of all your test assets
As the demand for better performance and newer technologies continually drives more complex designs,
with narrow test margins and longer test times. The complex test systems composed of instruments from
multiple vendors must be managed. To help mitigate these challenges, you can:
• Dramatically reduce test times and improve test system efficiency through Keysight Process Analysis
Services
• Improve operational performance and ensure ongoing accuracy through accredited and standards
lab calibration on Keysight and non-Keysight electronic instruments
• Manage downtime with loaner services, onsite calibration, and onsite resident professionals
• Minimize risk and reduce costs by leveraging System Calibration Services to ensure that your test
systems are performing to the test system uncertainty we calculate
Engage with Keysight — solutions and services — and take your lab to the next level.
Note: The EW software is subject to ITAR export regulations. For more information, a live demonstration, or a trial
license, please contact your Keysight sales representative.
Appendix
Acronyms
ACPR Adjacent Channel Power Ratio DANL Displayed Average Noise Level
AESA Active Electronically Scanned Array DRFM Digital Radio Frequency Memory
AEW Airborne Early Warning DTM Digital Terrain Model
APAR Active Phase Array Radar EIRP Effective Isotropic Radiated power
Acronyms 311
FCC Fault Collection Unit MMIC Microwave Monolithic Integrated Circuit
FCW Forward Collision Warning MSSR Monopulse Secondary Surveillance Radar
FDOA Frequency Difference of Arrival MTD Moving Target Detection
FOM Frequency Offset Mode NIST National Institute of Standards and Technology
FPGA Field Programmable Gate Array NVNA Non-Linear Vector Network Analyzer
Acronyms 312
RDF Range and Direction Finding STC Sensitivity Time Control
SOLT Short, Open, Load, Thru (calibration) UUT Unit Under Test
Text is available under the GNU Free Documentation License (https://www.gnu.org/licenses/fdl-1.3.html), and the
Creative Commons Attribution-Share Alike 3.0 Unported (CC BY-SA 3.0) (https://creativecommons.org/licenses/
by-sa/3.0/)license, additional terms may apply.
Acronyms 313
Additional Resources
Keysight Technologies Electronic Warfare Test and Evaluation Solutions, 5992-3476EN
Creating Multi-Emitter Scenarios for Radar and Electronic Warfare (EW) Testing, 5992-2902EN
Pulse Analysis – PathWave Vector Analysis (89600 VSA) Technical Overview, 5992-4197EN
Measuring Radar Signals with Vector Signal Analyzers and Wideband Instruments, 5992-1580EN
Techniques for Precision Validation of Radar System Performance in the Field, 5991-4107EN
314
This information is subject to change without notice. © Keysight Technologies, 2021, Published in USA, December 1, 2021, 7121-1111.EN