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Lecture 6.4 Channel Length Modulation & PunchThrough

This document discusses channel length modulation in n-channel MOSFETs operating in saturation mode and how it affects the transistor's I-V characteristics. It also covers punch through, which occurs when the depletion regions of the source and drain extend and merge under certain biases, and hot-carrier degradation, where high electric fields cause carriers to gain enough energy to damage the transistor.

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Debdatta Praharaj
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53 views9 pages

Lecture 6.4 Channel Length Modulation & PunchThrough

This document discusses channel length modulation in n-channel MOSFETs operating in saturation mode and how it affects the transistor's I-V characteristics. It also covers punch through, which occurs when the depletion regions of the source and drain extend and merge under certain biases, and hot-carrier degradation, where high electric fields cause carriers to gain enough energy to damage the transistor.

Uploaded by

Debdatta Praharaj
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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Channel Length

Modulation &
PunchThrough
Lecture 6.4

Dr. Gargi Raina VIT Chennai


Channel Length Modulation

Dr. Gargi Raina VIT Chennai


Channel Length Modulation

Channel length
modulation in an
n-channel MOSFET
operation in
saturation mode.

It can be shown that

Dr. Gargi Raina VIT Chennai


I-V characteristics of an
n-channel MOS
transistor, including the
channel length
modulation effect.

Dr. Gargi Raina VIT Chennai


Punch Through &
Hot-carrier degradation

Dr. Gargi Raina VIT Chennai


Dr. Gargi Raina VIT Chennai
Dr. Gargi Raina VIT Chennai
Dr. Gargi Raina VIT Chennai
Dr. Gargi Raina VIT Chennai

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