bq28z610 Impedance Track™ Gas Gauge and Protection Solution For 1-Series To 2-Series Cell Li-Ion Battery Packs

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bq28z610
SLUSAS3B – APRIL 2014 – REVISED DECEMBER 2015
bq28z610 Impedance Track™ Gas Gauge and Protection Solution

for 1-Series to 2-Series Cell Li-Ion Battery Packs
1 Features 3 Description
1• Autonomous Battery Charging Control Using The Texas Instruments bq28z610 device is a highly
Dedicated Master Mode I2C™ Interface integrated, accurate, 1-series to 2-series cell gas
gauge and protection solution, enabling autonomous
• Cell Balancing with Internal Bypass To Optimize charger control and cell balancing.
Battery Health
The bq28z610 device enables autonomous charge
• High-Side Protection N-CH FET Drive Allows
control through Master Mode I2C broadcasts of
Serial Bus Communication During Fault charging current and voltage information, eliminating
Conditions software overhead that is typically incurred by the
• Programmable Protection Levels for Voltage, system's host controller.
Current, and Temperature
The bq28z610 device provides a fully integrated
• Analog Front End with Two Independent ADCs pack-based solution with a flash programmable
– Support for Simultaneous Current and Voltage custom reduced instruction-set CPU (RISC), safety
Sampling protection, and authentication for 1- to 2-series cell
Li-Ion and Li-Polymer battery packs.
– High-Accuracy Coulomb Counter with Input
Offset Error < 1 µV (Typical) The bq28z610 gas gauge communicates via an I2C
• Supports Down to 1-mΩ Current Sense Resistor compatible interface and combines an ultra-low-
power, high-speed TI bqBMP processor, high-
While Capable of 1-mA Current Measurement
accuracy analog measurement capabilities, integrated
• Supports Battery Trip Point (BTP) Function for flash memory, an array of peripheral and
Windows® Integration communication ports, an N-CH FET drive, and a
• SHA-1 Authentication Responder for Increased SHA-1 Authentication transform responder into a
Battery Pack Security complete, high-performance battery management
solution.
• 400-kHz I2C Bus Communications Interface for
High-Speed Programming and Data Access Device Information(1)
• Compact 12-Pin VSON Package (DRZ) PART NUMBER PACKAGE BODY SIZE (NOM)
bq28z610 VSON (12) 4 mm × 2.5 mm
2 Applications
(1) For all available packages, see the orderable addendum at
• Tablet Computing the end of the data sheet.
• Portable and Wearable Health Devices
• Portable Audio Devices
Simplified Schematic
Pack+
10 M 10 M
Fuse
13
100
1 VSS PWPD VC1 12 2s
0.1 µF
1 µF
SRN 1s
2 VC2 11
5
0.1 µF
5.1 k 5.1 k
3 SRP PBI 10
2.2 µF
Battery
4 TS1 CHG 9 cells
10k
10
100 100
5 SCL PACK 8
Comm MM3Z5V6C
Bus 100 100

6 SDA DSG 7
MM3Z5V6C
100 100
Pack–
1 to 10 mΩ
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
bq28z610
SLUSAS3B – APRIL 2014 – REVISED DECEMBER 2015 www.ti.com
Table of Contents
1 Features .................................................................. 1 7.21 Instruction Flash...................................................... 9
2 Applications ........................................................... 1 7.22 Data Flash............................................................... 9
3 Description ............................................................. 1 7.23 Current Protection Thresholds ................................ 9
7.24 Current Protection Timing ..................................... 10
4 Revision History..................................................... 2
7.25 N-CH FET Drive (CHG, DSG)............................... 11
5 Description (Continued) ........................................ 2
7.26 I2C Interface I/O .................................................... 11
6 Pin Configuration and Functions ......................... 3
7.27 I2C Interface Timing .............................................. 11
7 Specifications......................................................... 4 7.28 Typical Characteristics ......................................... 13
7.1 Absolute Maximum Ratings ...................................... 4
8 Detailed Description ............................................ 16
7.2 ESD Ratings ............................................................ 4
8.1 Overview ................................................................. 16
7.3 Recommended Operating Conditions....................... 4
8.2 Functional Block Diagram ....................................... 16
7.4 Thermal Information .................................................. 5
8.3 Feature Description................................................. 17
7.5 Supply Current .......................................................... 5
8.4 Device Functional Modes........................................ 21
7.6 Power Supply Control ............................................... 5
9 Applications and Implementation ...................... 23
7.7 Low-Voltage General Purpose I/O, TS1 ................... 5
9.1 Application Information............................................ 23
7.8 Power-On Reset (POR) ............................................ 6
9.2 Typical Applications ............................................... 23
7.9 Internal 1.8-V LDO ................................................... 6
7.10 Current Wake Comparator...................................... 6 10 Power Supply Requirements ............................. 26
7.11 Coulomb Counter .................................................... 6 11 Layout................................................................... 26
7.12 ADC Digital Filter .................................................... 7 11.1 Layout Guidelines ................................................. 26
7.13 ADC Multiplexer ...................................................... 7 11.2 Layout Example .................................................... 27
7.14 Cell Balancing Support ........................................... 7 12 Device and Documentation Support ................. 28
7.15 Internal Temperature Sensor .................................. 8 12.1 Documentation Support ........................................ 28
7.16 NTC Thermistor Measurement Support.................. 8 12.2 Community Resources.......................................... 28
7.17 High-Frequency Oscillator....................................... 8 12.3 Trademarks ........................................................... 28
7.18 Low-Frequency Oscillator ....................................... 8 12.4 Electrostatic Discharge Caution ............................ 28
7.19 Voltage Reference 1 ............................................... 8 12.5 Glossary ................................................................ 28
7.20 Voltage Reference 2 ............................................... 9 13 Mechanical, Packaging, and Orderable
Information ........................................................... 28
4 Revision History
DATE REVISION NOTES
December 2015 B Product Preview to Production Data Release
5 Description (Continued)
The bq28z610 device provides an array of battery and system safety functions, including overcurrent in
discharge, short circuit in charge, and short circuit in discharge protection for the battery, as well as FET
protection for the N-channel FETs, internal AFE watchdog, and cell balancing. Through firmware, the devices
can provide a larger array of features including protection against overvoltage, undervoltage, overtemperature,
and more.
2 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated
Product Folder Links: bq28z610

bq28z610
www.ti.com SLUSAS3B – APRIL 2014 – REVISED DECEMBER 2015
6 Pin Configuration and Functions
1 VSS VC1 12
2 SRN VC2 11
3 SRP PBI 10
4 TS 1 CHG 9
5 SCL PACK 8
PWPD 13
6 SDA DSG 7
Pin Functions
PIN
I/O (1) DESCRIPTION
NAME DRZ
VSS 1 P Device ground
Analog input pin connected to the internal coulomb counter peripheral for integrating a small
SRN 2 AI
voltage between SRP and SRN where SRP is the top of the sense resistor.
Analog input pin connected to the internal coulomb counter peripheral for integrating a small
SRP 3 AI
voltage between SRP and SRN where SRP is the top of the sense resistor.
Temperature input for ADC to the oversampled ADC channel, and optional Battery Trip Point
TS1 4 AI
(BTP) output
SCL 5 I/O Serial Clock for I2C interface; requires external pullup when used
SDA 6 I/O Serial Data for I2C interface; requires external pullup
DSG 7 O N-CH FET drive output pin
PACK 8 AI, P Pack sense input pin
CHG 9 O N-CH FET drive output pin
PBI 10 P Power supply backup input pin
Sense voltage input pin for most positive cell, balance current input for most positive cell. Primary
VC2 11 AI, P
power supply input and battery stack measurement input (BAT)
VC1 12 AI Sense voltage input pin for least positive cell, balance current input for least positive cell
PWPD — Exposed Pad, electrically connected to VSS (external trace)
(1) P = Power Connection, O = Digital Output, AI = Analog Input, I = Digital Input, I/O = Digital Input/Output
Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 3

bq28z610
7 Specifications
7.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted) (1)
MIN MAX UNIT
Supply voltage range, VCC VC2, PBI –0.3 30 V
PACK –0.3 30 V
TS –0.3 VREG + 0.3 V
SRP, SRN –0.3 0.3 V
Input voltage range, VIN
VC1 + 8.5 or
VC2 VC1 – 0.3 V
VSS + 30
VSS + 8.5 or
VC1 VSS – 0.3 V
VSS + 30
Output voltage range, VO CHG, DSG –0.3 32 V
Maximum VSS current, ISS ±50 mA
Functional Temperature, TFUNC –40 110 °C
Lead temperature (soldering, 10 s), TSOLDER ±300 °C
Storage temperature range, TSTG –65 150 °C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings

VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins (1) ±2000
V(ESD) Charged device model (CDM), per JEDEC specification JESD22-C101, all V
±500
pins (2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions

Typical values stated where TA = 25ºC and VCC = 7.2 V, Min/Max values stated where TA = –40ºC to 85ºC and VCC = 2.2 V
to 26 V (unless otherwise noted)
PARAMETER TEST CONDITION MIN NOM MAX UNIT
VCC Supply voltage VC2, PBI 2.2 26 V
VSHUTDOWN– Shutdown voltage VPACK < VSHUTDOWN– 1.8 2.0 2.2 V
VSHUTDOWN+ Start-up voltage VPACK > VSHUTDOWN– + VHYS 2.05 2.25 2.45 V
Shutdown voltage
VHYS VSHUTDOWN+ – VSHUTDOWN– 250 mV
hysteresis
SDA, SCL 5.5
TS1 VREG
SRP, SRN –0.2 0.2
VIN Input voltage range V
VC2 VVC1 VVC1 + 5
VC1 VVSS VVSS + 5
PACK 26
VO Output voltage range CHG, DSG 26 V
CPBI External PBI capacitor 2.2 µF
TOPR Operating temperature –40 85 °C

bq28z610
7.4 Thermal Information

bq28z610
THERMAL METRIC (1) DRZ UNIT
12 PINS
RθJA, High K Junction-to-ambient thermal resistance 186.4
RθJC(top) Junction-to-case(top) thermal resistance 90.4
RθJB Junction-to-board thermal resistance 110.7
°C/W
ψJT Junction-to-top characterization parameter 96.7
ψJB Junction-to-board characterization parameter 90
RθJC(bottom) Junction-to-case(bottom) thermal resistance n/a
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
7.5 Supply Current

to 7.6 V (unless otherwise noted)
PARAMETER TEST CONDITION MIN TYP MAX UNIT
INORMAL (1) NORMAL mode CHG = ON, DSG = ON, No Flash Write 250 µA
CHG = OFF, DSG = OFF, No Communication on
ISLEEP (1) SLEEP mode 100
Bus
ISHUTDOWN SHUTDOWN mode 0.5 2 µA
(1) Dependent on the use of the correct firmware (FW) configuration
7.6 Power Supply Control

VC2 to PACK
VSWITCHOVER– VVC2 < VSWITCHOVER– 2.0 2.1 2.2 V
switchover voltage
PACK to VC2
VSWITCHOVER+ VVC2 > VSWITCHOVER– + VHYS 3.0 3.1 3.2 V
switchover voltage
Switchover voltage
VHYS VSWITCHOVER+ – VSWITCHOVER– 1000 mV
hysteresis
VC2 pin, VC2 = 0 V, PACK = 25 V 1
Input Leakage PACK pin, VC2 = 25 V, PACK = 0 V 1
ILKG µA
current
VC2 and PACK pins, VC2 = 0 V, PACK = 0 V,
1
PBI = 25 V
Internal pulldown
RPACK(PD) PACK 30 40 50 kΩ
resistance
7.7 Low-Voltage General Purpose I/O, TS1

VIH High-level input 0.65 x VREG V
VIL Low-level input 0.35 x VREG V
VOH Output voltage high IOH = – 1.0 mA 0.75 x VREG V
VOL Output voltage low IOL = 1.0 mA 0.2 x VREG V
CIN Input capacitance 5 pF
Input leakage
ILKG 1 µA
current

bq28z610
7.8 Power-On Reset (POR)

Negative-going voltage
VREGIT– VREG 1.51 1.55 1.59 V
input
Power-on reset
VHYS VREGIT+ – VREGIT– 70 100 130 mV
hysteresis
tRST Power-on reset time 200 300 400 µs
7.9 Internal 1.8-V LDO

VREG Regulator voltage 1.6 1.8 2.0 V
Regulator output over
ΔVO(TEMP) ΔVREG/ΔTA, IREG = 10 mA ±0.25%
temperature
ΔVO(LINE) Line regulation ΔVREG/ΔVBAT, VBAT = 10 mA –0 .6% 0.5%
ΔVO(LOAD) Load regulation ΔVREG/ΔIREG, IREG = 0 mA to 10 mA –1.5% 1.5%
Regulator output
IREG VREG = 0.9 x VREG(NOM), VIN > 2.2 V 20 mA
current limit
Regulator short-circuit
ISC VREG = 0 x VREG(NOM) 25 40 50 mA
current limit
Power supply rejection
PSRRREG ΔVBAT/ΔVREG, IREG = 10 mA, VIN > 2.5 V, f = 10 Hz 40 dB
ratio
Slew rate enhancement
VSLEW VREG 1.58 1.65 V
voltage threshold
7.10 Current Wake Comparator

VWAKE = VSRP – VSRN WAKE_CONTROL[WK1, WK0]
±0.3 ±0.625 ±0.9 mV
= 0,0
±0.6 ±1.25 ±1.8 mV
Wake voltage = 0,1
VWAKE
threshold VWAKE = VSRP – VSRN WAKE_CONTROL[WK1, WK0]
±1.2 ±2.5 ±3.6 mV
= 1,0
±2.4 ±5.0 ±7.2 mV
= 1,1
Temperature drift of
VWAKE(DRIFT) 0.5% °C
VWAKE accuracy
Time from application
tWAKE 0.25 0.5 ms
of current to wake
Wake up comparator [WKCHGEN] = 0 and [WKDSGEN] = 0 to
tWAKE(SU) 250 640 µs
startup time [WKCHGEN] = 1 and [WKDSGEN] = 1
7.11 Coulomb Counter

Input voltage range –100 100 mV
Full scale range –VREF1/10 +VREF1/10 mV
Differential nonlinearity 16-bit, No missing codes ±1 LSB

bq28z610
Coulomb Counter (continued)

Integral nonlinearity 16-bit, Best fit over input voltage range ±5.2 ±22.3 LSB
Offset error 16-bit, Post-calibration ±1.3 ±2.6 LSB
Offset error drift 15-bit + sign, Post-calibration 0.04 0.07 LSB/°C
Gain error 15-bit + sign, Over input voltage range ±131 ±492 LSB
Gain error drift 15-bit + sign, Over input voltage range 4.3 9.8 LSB/°C
Effective input resistance 2.5 MΩ
7.12 ADC Digital Filter

ADCTL[SPEED1, SPEED0] = 0, 0 31.25
tCONV ms
No missing codes, ADCTL[SPEED1, SPEED0] =
Resolution 16 Bits
0, 0
With sign, ADCTL[SPEED1, SPEED0] = 0, 0 14 15
Effective resolution Bits
7.13 ADC Multiplexer

VC1–VSS, VC2–VC1 0.1980 0.2000 0.2020
K Scaling factor VC2–VSS, PACK–VSS 0.0485 0.050 0.051 —
VREF1/2 0.490 0.500 0.510
VC2–VSS, PACK–VSS –0.2 20
VIN Input voltage range TS1 –0.2 0.8 × VREF1 V
TS1 –0.2 0.8 × VREG
VC1, VC2 cell balancing off, cell detach detection
ILKG Input leakage current 1 µA
off, ADC multiplexer off
7.14 Cell Balancing Support

Internal cell balance
RCB RDS(ON) for internal FET switch at 2 V < VDS < 4 V 200 Ω
resistance

bq28z610
7.15 Internal Temperature Sensor

Internal temperature VTEMPP –1.9 –2.0 –2.1
VTEMP mV/°C
sensor voltage drift VTEMPP – VTEMPN (1)
0.177 0.178 0.179
(1) Assured by design
7.16 NTC Thermistor Measurement Support

Internal pull-up
RNTC(PU) TS1 14.4 18 21.6 kΩ
resistance
Resistance drift over
RNTC(DRIFT) TS1 –360 –280 –200 PPM/°C
temperature
7.17 High-Frequency Oscillator

fHFO Operating frequency 16.78 MHz
TA = –20°C to 70°C, includes frequency drift –2.5% ±0.25% 2.5%
fHFO(ERR) Frequency error
TA = –20°C to 85°C, Oscillator frequency within
4 ms
+/–3% of nominal, CLKCTL[HFRAMP] = 1
tHFO(SU) Start-up time
Oscillator frequency within +/–3% of nominal,
100 µs
CLKCTL[HFRAMP] = 0
7.18 Low-Frequency Oscillator

fLFO Operating frequency 262.144 kHz
Operating frequency in
fLFO(LP) 247 kHz
low power mode
fLFO(ERR) Frequency error
Frequency error in low
fLFO(LPERR) –5% 5%
power mode
Failure detection
fLFO(FAIL) 30 80 100 kHz
frequency
7.19 Voltage Reference 1

Internal reference
VREF1 TA = 25°C, after trim 1.215 1.220 1.225 V
voltage
Internal reference TA = 0°C to 60°C, after trim ±50
VREF1(DRIFT) PPM/°C
voltage drift TA = –40°C to 85°C, after trim ±80

bq28z610
7.20 Voltage Reference 2

Internal reference
VREF2 TA = 25°C, after trim 1.215 1.220 1.225 V
voltage
Internal reference TA = 0°C to 60°C, after trim ±50
VREF2(DRIFT) PPM/°C
voltage drift TA = –40°C to 85°C, after trim ±80
7.21 Instruction Flash

Data retention 10 Years
Flash programming
1000 Cycles
write cycles
Word programming
tPROGWORD TA = –40°C to 85°C 40 µs
time
tMASSERASE Mass-erase time TA = –40°C to 85°C 40 ms
tPAGEERASE Page-erase time TA = –40°C to 85°C 40 ms
IFLASHREAD Flash-read current TA = –40°C to 85°C 2 mA
IFLASHWRITE Flash-write current TA = –40°C to 85°C 5 mA
IFLASHERASE Flash-erase current TA = –40°C to 85°C 15 mA
7.22 Data Flash

Data retention 10 Years
Flash programming
20000 Cycles
write cycles
Word programming
tPROGWORD TA = –40°C to 85°C 40 µs
time
tMASSERASE Mass-erase time TA = –40°C to 85°C 40 ms
tPAGEERASE Page-erase time TA = –40°C to 85°C 40 ms
IFLASHREAD Flash-read current TA = –40°C to 85°C 1 mA
IFLASHWRITE Flash-write current TA = –40°C to 85°C 5 mA
IFLASHERASE Flash-erase current TA = –40°C to 85°C 15 mA
7.23 Current Protection Thresholds

VOCD = VSRP – VSRN,
–16.6 –100
OCD detection threshold PROTECTION_CONTROL[RSNS] = 1
VOCD mV
voltage range VOCD = VSRP – VSRN,
–8.3 –50
PROTECTION_CONTROL[RSNS] = 0
VOCD = VSRP – VSRN,
–5.56
OCD detection threshold PROTECTION_CONTROL[RSNS] = 1
ΔVOCD mV
voltage program step VOCD = VSRP – VSRN,
–2.78

bq28z610
Current Protection Thresholds (continued)

VSCC = VSRP – VSRN,
44.4 200
SCC detection threshold PROTECTION_CONTROL[RSNS] = 1
ΔVSCC mV
voltage range VSCC = VSRP – VSRN,
22.2 100
VSCC = VSRP – VSRN,
22.2
SCC detection threshold PROTECTION_CONTROL[RSNS] = 1
ΔVSCC mV
voltage program step VSCC = VSRP – VSRN,
11.1
VSCD1 = VSRP – VSRN,
–44.4 –200
SCD1 detection threshold PROTECTION_CONTROL[RSNS] = 1
VSCD1 mV
voltage range VSCD1 = VSRP – VSRN,
–22.2 –100
–22.2
ΔVSCD1 mV
voltage program step VSCD1 = VSRP – VSRN,
–11.1
–44.4 –200
VSCD2 mV
voltage range VSCD2 = VSRP – VSRN,
–22.2 –100
–22.2
ΔVSCD2 mV
voltage program step VSCD2 = VSRP – VSRN,
–11.1
7.24 Current Protection Timing

OCD detection delay
tOCD 1 31 ms
time
OCD detection delay
ΔtOCD 2 ms
time program step
SCC detection delay
tSCC 0 915 µs
time
SCC detection delay
ΔtSCC 61 µs
time program step
SCD1 detection delay PROTECTION_CONTROL[SCDDx2] = 0 0 915
tSCD1 µs
time PROTECTION_CONTROL[SCDDx2] = 1 0 1850
SCD1 detection delay PROTECTION_CONTROL[SCDDx2] = 0 61
ΔtSCD1 µs
time program step PROTECTION_CONTROL[SCDDx2] = 1 121
SCD2 detection delay PROTECTION_CONTROL[SCDDx2] = 0 0 458
tSCD2 µs
time PROTECTION_CONTROL[SCDDx2] = 1 0 915
SCD2 detection delay PROTECTION_CONTROL[SCDDx2] = 0 30.5
ΔtSCD2 µs
time program step PROTECTION_CONTROL[SCDDx2] = 1 61
Current fault detect VSRP – VSRN = VT – 3 mV for OCD, SCD1, and SC2,
tDETECT 160 µs
time VSRP – VSRN = VT + 3 mV for SCC
Current fault delay time
tACC Max delay setting –10% 10%
accuracy

bq28z610
7.25 N-CH FET Drive (CHG, DSG)

RatioDSG = (VDSG – VVC2)/VVC2, 2.2 V < VVC2 < 4.07 V, 10
2.133 2.333 2.467
MΩ between PACK and DSG
Output voltage ratio —
RatioCHG = (VCHG – VVC2)/VVC2, 2.2 V < VVC2 < 4.07 V, 10
2.133 2.333 2.467
MΩ between BAT and CHG
VDSG(ON) = VDSG – VVC2, 4.07 V ≤ VVC2 ≤ 18 V, 10 MΩ
8.75 9.5 10.25
Output voltage, between PACK and DSG
V(FETON) V
CHG and DSG on VCHG(ON) = VCHG – VVC2, 4.07 V ≤ VVC2 ≤ 18 V, 10 MΩ
8.75 9.5 10.25
between VC2 and CHG
VDSG(OFF) = VDSG – VPACK, 10 MΩ between PACK and
Output voltage, –0.4 0.4
V(FETOFF) DSG V
CHG and DSG off
VCHG(OFF) = VCHG – VBAT, 10 MΩ between VC2 and CHG –0.4 0.4
VDSG from 0% to 35% VDSG(ON)(TYP), VBAT ≥ 2.2 V, CL =
4.7 nF between DSG and PACK, 5.1 kΩ between DSG 200 500
and CL, 10 MΩ between PACK and DSG
tR Rise time µs
VCHG from 0% to 35% VCHG(ON)(TYP), VVC2 ≥ 2.2 V, CL =
4.7 nF between CHG and VC2, 5.1 kΩ between CHG and 200 500
CL, 10 MΩ between VC2 and CHG
VDSG from VDSG(ON)(TYP) to 1 V, VVC2 ≥ 2.2 V, CL = 4.7 nF
between DSG and PACK, 5.1 kΩ between DSG and CL, 40 300
10 MΩ between PACK and DSG
tF Fall time µs
VCHG from VCHG(ON)(TYP) to 1 V, VVC2 ≥ 2.2 V, CL = 4.7 nF
between CHG and VC2, 5.1 kΩ between CHG and CL, 10 40 200
MΩ between VC2 and CHG
7.26 I2C Interface I/O

VIH Input voltage high SCL, SDA, VREG = 1.8 V (STANDARD and FAST modes) 0.7 × VREG V
VIL Input voltage low SCL, SDA, VREG = 1.8 V (STANDARD and FAST modes) –0.5 0.3 × VREG V
SCL, SDA, VREG = 1.8 V, IOL = 3 mA (FAST mode) 0.2 × VREG V
VOL Output low voltage SCL, SDA, VREG > 2.0 V, IOL = 3 mA (STANDARD and
0.4 V
FAST modes)
CIN Input capacitance 10 pF
Input leakage
ILKG 1 µA
current
RPD Pull-down resistance 3.3 kΩ
7.27 I2C Interface Timing

tR Clock rise time 10% to 90% 300 ns
tF Clock fall time 90% to 10% 300 ns
tHIGH Clock high period 600 ns
tLOW Clock low period 1.3 µs
Repeated start setup
tSU(START) 600 ns
time
Start for first falling
td(START) 600 ns
edge to SCL
tSU(DATA) Data setup time 100 ns

bq28z610
I2C Interface Timing (continued)

tHD(DATA) Data hold time 0 µs
tSU(STOP) Stop setup time 600 ns
Bus free time
tBUF between stop and 1.3 µs
start
Clock operating
fSW SLAVE mode, SCL 50% duty cycle 400 kHz
frequency
tSU(STA) tw(H) tw(L) tf tr t(BUF)
SCL
SDA
td(STA) tf tsu(STOP)
tr
th(DAT) tsu(DAT)
REPEATED STOP START

START
Figure 1. I2C Timing

bq28z610
7.28 Typical Characteristics
0.15 8.0
Max CC Offset Error
Min CC Offset Error 6.0
0.10
4.0
CC Offset Error ( V)
ADC Offset Error (µV)

0.05
2.0
0.00 0.0
±2.0
±0.05
±4.0
±0.10
±6.0 Max ADC Offset Error
Min ADC Offset Error
±0.15 ±8.0
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Temperature (ƒC) C001 Temperature (°C) C003
Figure 2. CC Offset Error Vs. Temperature Figure 3. ADC Offset Error Vs. Temperature
1.24 264
Low-Frequency Oscillator (kHz) 262

Reference Voltage (V)
1.23
260
258
1.22
256
254
1.21
252
1.20 250
±40 ±20 0 20 40 60 80 100 ±40 ±20 0 20 40 60 80 100
Temperature (ƒC) C006 Temperature (ƒC) C007
Figure 4. Reference Voltage Vs. Temperature Figure 5. Low-Frequency Oscillator Vs. Temperature
16.9 ±24.6
High-Frequency Oscillator (MHz)
OCD Protection Threshold (mV)
±24.8
16.8 ±25.0
±25.2
16.7 ±25.4
±25.6
16.6 ±25.8
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Threshold setting is 25 mV.
Figure 6. High-Frequency Oscillator Vs. Temperature Figure 7. Overcurrent Discharge Protection Threshold Vs.
Temperature

bq28z610
Typical Characteristics (continued)

87.4 ±86.0
SCD 1 Protection Threshold (mV)

SCC Protection Threshold (mV)
87.2 ±86.2
87.0 ±86.4
86.8 ±86.6
86.6 ±86.8
86.4 ±87.0
86.2 ±87.2
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Threshold setting is 88.8 mV. Threshold setting is –88.8 mV.
Figure 8. Short Circuit Charge Protection Threshold Vs. Figure 9. Short Circuit Discharge 1 Protection Threshold Vs.
Temperature Temperature
11.00
SCD 2 Protection Threshold (mV)
±172.9
Over-Current Delay Time (mS)

10.95
±173.0
10.90
±173.1
±173.2 10.85
±173.3
10.80
±173.4
10.75
±173.5
±173.6 10.70
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Threshold setting is –177.7 mV. Threshold setting is 11 ms.
Figure 10. Short Circuit Discharge 2 Protection Threshold Figure 11. Overcurrent Delay Time Vs. Temperature
Vs. Temperature
452 480
SC Charge Current Delay Time ( S)
450
SC Discharge 1 Delay Time ( S)
448
460
446
444
442 440
440
438
420
436
434
432 400
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Threshold setting is 465 µs. Threshold setting is 465 µs (including internal delay).
Figure 12. Short Circuit Charge Current Delay Time Vs. Figure 13. Short Circuit Discharge 1 Delay Time Vs.
Temperature Temperature

bq28z610
Typical Characteristics (continued)

2.4984 3.49825
2.49835
3.4982
2.4983
Cell Voltage (V)

Cell Voltage (V)
2.49825 3.49815
2.4982
2.49815 3.4981
2.4981
3.49805
2.49805
2.498 3.498
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
This is the VCELL average for single cell.
Figure 14. VCELL Measurement at 2.5-V Vs. Temperature Figure 15. VCELL Measurement at 3.5-V Vs. Temperature
4.24805 99.25
Measurement Current (mA)

4.248 99.20
Cell Voltage (V)
4.24795 99.15
4.2479 99.10
4.24785 99.05
4.2478 99.00
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
This is the VCELL average for single cell. ISET = 100 mA, RSNS= 1 Ω
Figure 16. VCELL Measurement at 4.25-V Vs. Temperature Figure 17. I measured Vs. Temperature

bq28z610
8 Detailed Description
8.1 Overview
The bq28z610 gas gauge is a fully integrated battery manager that employs flash-based firmware and integrated
hardware protection to provide a complete solution for battery-stack architectures composed of 1- to 2-series
cells. The bq28z610 device interfaces with a host system via an I2C protocol. High-performance, integrated
analog peripherals enable support for a sense resistor down to 1 mΩ and simultaneous current/voltage data
conversion for instant power calculations. The following sections detail all of the major component blocks
included as part of the bq28z610 device.
8.2 Functional Block Diagram

The Functional Block Diagram depicts the analog (AFE) and digital (AGG) peripheral content in the bq28z610
device.
PACK
CHG
DSG
VSS
VC2
VC1
PBI
Cell, Stack, High Side
Cell Cell Detach Power Mode
Pack N-CH FET
Balancing Detection Control
Voltage Drive
Zero Volt
Wake Power On
Charge
Comparator Reset
Control
Short Circuit
Comparator
Over
Voltage
Current
Reference 2
Comparator
Watchdog
Timer Interrupt
NTC Bias
Internal
Temp
AD0/RC0 (TS1) Sensor
Internal
Voltage Reset
ADC MUX AFE Control
Reference1
Low
ADC/CC AFE COM 1.8V LDO
Frequency
FRONTEND Engine Regulator
Oscillator
SRP
SRN SDA
High
Low Voltage Frequency SCL
I/O Oscillator
I/O
I/O &
In-Circuit ADC/CC Timers & AFE COM COM
Interrupt
Emulator Digital Filter PWM Engine Engine
Controller
bqBMP Data (8bit)
PMInstr CPU DMAddr (16bit)

(8bit)
PMAddr
(16bit)
Program
Data Flash Data
Flash
EEPROM SRAM
EEPROM

bq28z610
8.3 Feature Description

8.3.1 Battery Parameter Measurements
The bq28z610 device measures cell voltage and current simultaneously, and also measures temperature to
calculate the information related to remaining capacity, full charge capacity, state-of-health, and other gauging
parameters.
8.3.1.1 bq28z610 Processor

The bq28z610 device uses a custom TI-proprietary processor design that features a Harvard architecture and
operates at frequencies up to 4.2 MHz. Using an adaptive, three-stage instruction pipeline, the bq28z610
processor supports variable instruction length of 8, 16, or 24 bits.
8.3.2 Coulomb Counter (CC)

The first ADC is an integrating converter designed specifically for coulomb counting. The converter resolution is a
function of its full-scale range and number of bits, yielding a 3.74-µV resolution.
8.3.3 CC Digital Filter

The CC digital filter generates a 16-bit conversion value from the delta-sigma CC front-end. Its FIR filter uses the
LFO clock output, which allows it to stop the HFO clock during conversions. New conversions are available every
250 ms while CCTL[CC_ON] = 1. Proper use of this peripheral requires turning on the CC modulator in the AFE.
8.3.4 ADC Multiplexer

The ADC multiplexer provides selectable connections to the VCx inputs, TS1 inputs, internal temperature sensor,
internal reference voltages, internal 1.8-V regulator, PACK input, and VSS ground reference input. In addition,
the multiplexer can independently enable the TS1 input connection to the internal thermistor biasing circuitry, and
also enables the user to short the multiplexer inputs for test and calibration purposes.
8.3.5 Analog-to-Digital Converter (ADC)

The second ADC is a 16-bit delta-sigma converter designed for general-purpose measurements. The ADC
automatically scales the input voltage range during sampling based on channel selection. The converter
resolution is a function of its full-scale range and number of bits, yielding a 38-µV resolution. The default
conversion time of the ADC is 31.25 ms, but is user-configurable down to 1.95 ms. Decreasing the conversion
time presents a tradeoff between conversion speed and accuracy, as the resolution decreases for faster
conversion times.
8.3.6 ADC Digital Filter

The ADC digital filter generates a 24-bit conversion result from the delta-sigma ADC front end. Its FIR filter uses
the LFO clock, which allows it to stop the HFO clock during conversions. The ADC digital filter is capable of
providing two 24-bit results: one result from the delta-sigma ADC front-end and a second synchronous result
from the delta-sigma CC front-end.
8.3.7 Internal Temperature Sensor

An internal temperature sensor is available on the bq28z610 device to reduce the cost, power, and size of the
external components necessary to measure temperature. It is available for connection to the ADC using the
multiplexer, and is ideal for quickly determining pack temperature under a variety of operating conditions.
8.3.8 External Temperature Sensor Support

The TS1 input is enabled with an internal 18-kΩ (Typ.) linearization pull-up resistor to support the use of a 10-kΩ
(25°C) NTC external thermistor, such as the Semitec 103AT-2. The NTC thermistor should be connected
between VSS and the individual TS1 pin. The analog measurement is then taken via the ADC through its input
multiplexer. If a different thermistor type is required, then changes to configurations may be required.

bq28z610
Feature Description (continued)
VREG
RNTC
ADx
NTC
Figure 18. External Thermistor Biasing
8.3.9 Power Supply Control

The bq28z610 device manages its supply voltage dynamically according to operating conditions. When VVC2 >
VSWITCHOVER– + VHYS, the AFE connects an internal switch to BAT and uses this pin to supply power to its internal
1.8-V LDO, which subsequently powers all device logic and flash operations. Once VC2 decreases to VVC2 <
VSWITCHOVER–, the AFE disconnects its internal switch from VC2 and connects another switch to PACK, allowing
sourcing of power from a charger (if present). An external capacitor connected to PBI provides a momentary
supply voltage to help guard against system brownouts due to transient short-circuit or overload events that pull
VC2 below VSWITCHOVER–.
8.3.10 Power-On Reset

In the event of a power-cycle, the bq28z610 AFE holds its internal RESET output pin high for tRST duration to
allow its internal 1.8-V LDO and LFO to stabilize before running the AGG. The AFE enters power-on reset when
the voltage at VREG falls below VREGIT– and exits reset when VREG rises above VREGIT– + VHYS for tRST time. After
tRST, the bq28z610 AGG will write its trim values to the AFE.
tRST
normal operation normal operation
t OSU
(untrimmed) (trimmed)
VIT+
1.8-V Regulator VIT–
LFO
AFE RESET
AGG writes trim values to

AFE
Figure 19. POR Timing Diagram
8.3.11 Bus Communication Interface

The bq28z610 device has an I2C bus communication interface. This device has the option to broadcast
information to a smart charger to provide key information to adjust the charging current and charging voltage
based on the temperature or individual cell voltages.

bq28z610
CAUTION
If the device is configured as a single-master architecture (an application processor)
and an occasional NACK is detected in the operation, the master can resend the
transaction. However, in a multi-master architecture, an incorrect ACK leading to
accidental loss of bus arbitration can cause a master to wait incorrectly for another
master to clear the bus. If this master does not get a bus-free signal, then it must have
in place a method to look for the bus and assume it is free after some period of time.
Also, if possible, set the clock speed to be 100 kHz or less to significantly reduce the
issue described above for multi-mode operation.
8.3.12 Cell Balancing Support

The integrated cell balancing FETs included in the bq28z610 device enable the AFE to bypass cell current
around a given cell or numerous cells to effectively balance the entire battery stack. External series resistors
placed between the cell connections and the VCx input pins set the balancing current magnitude. The cell
balancing circuitry can be enabled or disabled via the CELL_BAL_DET[CB2, CB1] control register. Series input
resistors between 100 Ω and 1 kΩ are recommended for effective cell balancing.
VC2
VC1
VSS
Figure 20. Internal Cell Balancing
8.3.13 N-Channel Protection FET Drive

The bq28z610 device controls two external N-Channel MOSFETs in a back-to-back configuration for battery
protection. The charge (CHG) and discharge (DSG) FETs are automatically disabled if a safety fault (AOLD,
ASSC, ASCD, SOV) is detected, and can also be manually turned off using AFE_CONTROL[CHGEN, DSGEN]
= 0, 0. When the gate drive is disabled, an internal circuit discharges CHG to VC2 and DSG to PACK.
8.3.14 Low Frequency Oscillator

The bq28z610 AFE includes a low frequency oscillator (LFO) running at 262.144 kHz. The AFE monitors the
LFO frequency and indicates a failure via LATCH_STATUS[LFO] if the output frequency is much lower than
normal.
8.3.15 High Frequency Oscillator

The bq28z610 AGG includes a high frequency oscillator (HFO) running at 16.78 MHz. It is synthesized from the
LFO output and scaled down to 8.388 MHz with 50% duty cycle.
8.3.16 1.8-V Low Dropout Regulator

The bq28z610 AFE contains an integrated 1.8-V LDO that provides regulated supply voltage for the device CPU
and internal digital logic.

bq28z610

8.3.17 Internal Voltage References
The bq28z610 AFE provides two internal voltage references with VREF1, used by the ADC and CC, while VREF2 is
used by the LDO, LFO, current wake comparator, and OCD/SCC/SCD1/SCD2 current protection circuitry.
8.3.18 Overcurrent in Discharge Protection

The overcurrent in discharge (OCD) function detects abnormally high current in the discharge direction. The
overload in discharge threshold and delay time are configurable via the OCD_CONTROL register. The thresholds
and timing can be fine-tuned even further based on a sense resistor with lower resistance or wider tolerance via
the PROTECTION_CONTROL register. The detection circuit also incorporates a filtered delay before disabling
the CHG and DSG FETs. When an OCD event occurs, the LATCH_STATUS[OCD] bit is set to 1 and is latched
until it is cleared and the fault condition has been removed.
8.3.19 Short-Circuit Current in Charge Protection

The short-circuit current in charge (SCC) function detects catastrophic current conditions in the charge direction.
The short-circuit in charge threshold and delay time are configurable via the SCC_CONTROL register. The
thresholds and timing can be fine-tuned even further based on a sense resistor with lower resistance or wider
tolerance via the PROTECTION_CONTROL register. The detection circuit also incorporates a blanking delay
before disabling the CHG and DSG FETs. When an SCC event occurs, the LATCH_STATUS[SCC] bit is set to
1 and is latched until it is cleared and the fault condition has been removed.
8.3.20 Short-Circuit Current in Discharge 1 and 2 Protection

The short-circuit current in discharge (SCD) function detects catastrophic current conditions in the discharge
direction. The short-circuit in discharge thresholds and delay times are configurable via the SCD1_CONTROL
and SCD2_CONTROL registers. The thresholds and timing can be fine-tuned even further based on a sense
resistor with lower resistance or wider tolerance via the PROTECTION_CONTROL register. The detection circuit
also incorporates a blanking delay before disabling the CHG and DSG FETs. When an SCD event occurs, the
LATCH_STATUS[SCD1] or LATCH_STATUS[SCD2] bit is set to 1 and is latched until it is cleared and the fault
condition has been removed.
8.3.21 Primary Protection Features

The bq28z610 gas gauge supports the following battery and system level protection features, which can be
configured using firmware:
• Cell Undervoltage Protection
• Cell Overvoltage Protection
• Overcurrent in CHARGE Mode Protection
• Overcurrent in DISCHARGE Mode Protection
• Overload in DISCHARGE Mode Protection
• Short Circuit in CHARGE Mode Protection
• Overtemperature in CHARGE Mode Protection
• Overtemperature in DISCHARGE Mode Protection
• Precharge Timeout Protection
• Fast Charge Timeout Protection
8.3.22 Gas Gauging

This device uses the Impedance Track™ technology to measure and determine the available charge in battery
cells. The accuracy achieved using this method is better than 1% error over the lifetime of the battery. There is
no full charge/discharge learning cycle required. See the Theory and Implementation of Impedance Track Battery
Fuel-Gauging Algorithm Application Report (SLUA364B) for further details.

bq28z610

8.3.23 Charge Control Features
This device supports charge control features, such as:
• Reports charging voltage and charging current based on the active temperature range—JEITA temperature
ranges T1, T2, T3, T4, T5, and T6
• Provides more complex charging profiles, including sub-ranges within a standard temperature range
• Reports the appropriate charging current required for constant current charging and the appropriate charging
voltage needed for constant voltage charging to a smart charger, using the bus communication interface
• Selects the chemical state-of-charge of each battery cell using the Impedance Track method, and reduces the
voltage difference between cells when cell balancing multiple cells in a series
• Provides pre-charging/zero-volt charging
• Employs charge inhibit and charge suspend if battery pack temperature is out of programmed range
• Reports charging faults and indicates charge status via charge and discharge alarms
8.3.24 Authentication
This device supports security by:
• Authentication by the host using the SHA-1 method
• The gas gauge requires SHA-1 authentication before the device can be unsealed or allow full access.
8.4 Device Functional Modes

This device supports three modes, but the current consumption varies, based on firmware control of certain
functions and modes of operation:
• NORMAL mode: In this mode, the device performs measurements, calculations, protections, and data
updates every 250-ms intervals. Between these intervals, the device is operating in a reduced power stage to
minimize total average current consumption.
• SLEEP mode: In this mode, the device performs measurements, calculations, protections, and data updates
in adjustable time intervals. Between these intervals, the device is operating in a reduced power stage to
minimize total average current consumption.
• SHUTDOWN mode: The device is completely disabled.
8.4.1 Lifetime Logging Features

The device supports data logging of several key parameters for warranty and analysis:
• Maximum and Minimum Cell Temperature
• Maximum Current in CHARGE or DISCHARGE Mode
• Maximum and Minimum Cell Voltages
8.4.2 Configuration
The device supports accurate data measurements and data logging of several key parameters.
8.4.2.1 Coulomb Counting

The device uses an integrating delta-sigma analog-to-digital converter (ADC) for current measurement. The ADC
measures charge/discharge flow of the battery by measuring the voltage across a very small external sense
resistor. The integrating ADC measures a bipolar signal from a range of –100 mV to 100 mV, with a positive
value when V(SRP) – V(SRN), indicating charge current and a negative value indicating discharge current. The
integration method uses a continuous timer and internal counter, which has a rate of 0.65 nVh.
8.4.2.2 Cell Voltage Measurements

The bq28z610 measures the individual cell voltages at 250-ms intervals using an ADC. This measured value is
internally scaled for the ADC and is calibrated to reduce any errors due to offsets. This data is also used for
calculating the impedance of the individual cell for Impedance Track gas gauging.

bq28z610
Device Functional Modes (continued)

8.4.2.3 Current Measurements
The current measurement is performed by measuring the voltage drop across the external sense resistor (1 mΩ
to 3 mΩ) and the polarity of the differential voltage determines if the cell is in the CHARGE or DISCHARGE
mode.
8.4.2.4 Auto Calibration

The auto-calibration feature helps to cancel any voltage offset across the SRP and SRN pins for accurate
measurement of the cell voltage, charge/discharge current, and thermistor temperature. The auto-calibration is
performed when there is no communication activity for a minimum of 5 s on the bus lines.
8.4.2.5 Temperature Measurements

This device has an internal sensor for on-die temperature measurements, and the ability to support external
temperature measurements via the external NTC on the TS1 pin. These two measurements are individually
enabled and configured.

bq28z610
9 Applications and Implementation

9.1 Application Information
The bq28z610 gas gauge is a primary protection device that can be used with a 1- to 2-series Li-Ion/Li Polymer
battery pack. To implement and design a comprehensive set of parameters for a specific battery pack, the user
needs Battery Management Studio (bqSTUDIO), which is a graphical user-interface tool installed on a PC during
development. The firmware installed in the product has default values, which are summarized in the bq28z610
Technical Reference Manual (SLUUA65) for this product. Using the bqSTUDIO tool, these default values can be
changed to cater to specific application requirements during development once the system parameters, such as
fault trigger thresholds for protection, enable/disable of certain features for operation, configuration of cells,
chemistry that best matches the cell used, and more are known. This data can be referred to as the "golden
image."
9.2 Typical Applications

The following is the bq28z610 application schematic for the 2-series configuration.
0.1 µF 0.1 µF
2N7002K
10 M 10 M
10 k Fuse
13
100
0.1 µF 1 VSS PWPD VC1 12 2s
0.1 µF 1 µF
0.1 µF
SRN 1s
2 VC2 11
0.1 µF 5
0.1 µF
5.1 k 5.1 k
3 SRP PBI 10
0.1 µF 2.2 µF
PACK+
4 TS1 CHG 9
10 k
10
100 100
SCL 5 SCL PACK 8
MM3Z5V6C
100 100
SDA 6 SDA DSG 7
MM3Z5V6C
PACK–
100 100
1 to 3 mΩ
Note: The input filter capacitors of 0.1 µF for the SRN and SRP pins must be located near the pins of
the device.
Figure 21. bq28z610 2-Series Cell Typical Implementation
9.2.1 Design Requirements (Default)
Design Parameter Example

Cell Configuration 2s1p (2-series with 1 Parallel)
Design Capacity 4400 mAH
Device Chemistry 100 (LiCoO2/graphitized carbon)
Cell Overvoltage at Standard Temperature 4300 mV
Cell Undervoltage 2500 mV
Shutdown Voltage 2300 mV
Overcurrent in CHARGE Mode 6000 mA
Overcurrent in DISCHARGE Mode –6000 mA
Short Circuit in CHARGE Mode 0.1 V/Rsense across SRP, SRN

bq28z610
Typical Applications (continued)

Design Parameter Example
Short Circuit in DISCHARGE 1 Mode –0.1 V/Rsense across SRP, SRN
Safety Over Voltage 4500 mV
Cell Balancing Disabled
Internal and External Temperature Sensor Enabled
Under Temperature Charging 0°C
Under Temperature Discharging 0°C
BROADCAST Mode Enabled
9.2.2 Detailed Design Procedure
9.2.2.1 Setting Design Parameters

For the firmware settings needed for the design requirements, refer to the bq28z610 Technical Reference
Manual (SLUUA65).
• To set the 2s1p battery pack, go to data flash Configuration: DA Configuration register's bit 0 (CC0) = 1.
• To set design capacity, set the data flash value to 4400 in the Gas Gauging: Design: Design Capacity
register.
• To set device chemistry, go to data flash SBS Configuration: Data: Device Chemistry. The bqStudio
software automatically populates the correct chemistry identification. This selection is derived from using the
bqCHEM feature in the tools and choosing the option that matches the device chemistry from the list.
• To protect against cell overvoltage, set the data flash value to 4300 in Protections: COV: Standard Temp.
• To protect against cell undervoltage, set the data flash value to 2500 in the Protections: CUV register.
• To set the shutdown voltage to prevent further pack depletion due to low pack voltage, program Power:
Shutdown: Shutdown voltage = 2300.
• To protect against large charging currents when the AC adapter is attached, set the data flash value to 6000
in the Protections: OCC: Threshold register.
• To protect against large discharging currents when heavy loads are attached, set the data flash value to
–6000 in the Protections: OCD: Threshold register.
• Program a short circuit delay timer and threshold setting to enable the operating the system for large short
transient current pulses. These two parameters are under Protections: ASCC: Threshold = 100 for charging
current. The discharge current setting is Protections: ASCD:Threshold = –100 mV.
• To prevent the cells from overcharging and adding a second level of safety, there is a register setting that will
shut down the device if any of the cells voltage measurement is greater than the Safety Over Voltage setting
for greater than the delay time. Set this data flash value to 4500 in Permanent Fail: SOV: Threshold.
• To disable the cell balancing feature, set the data flash value to 0 in Settings: Configuration: Balancing
Configuration: bit 0 (CB).
• To enable the internal temperature and the external temperature sensors: Set Settings:Configuration:
Temperature Enable: Bit 0 (TSInt) = 1 for the internal sensor; set Bit 1 (TS1) = 1 for the external sensor.
• To prevent charging of the battery pack if the temperature falls below 0°C, set Protections: UTC:Threshold
= 0.
• To prevent discharging of the battery pack if the temperature falls below 0°C, set Protections:
UTD:Threshold = 0.
• To provide required information to the smart chargers, the gas gauge must operate in BROADCAST mode.
To enable this, set the [BCAST] bit in Configuration: SBS Configuration 2: Bit 0 [BCAST] = 1.
Each parameter listed for fault trigger thresholds has a delay timer setting associated for any noise filtering.
These values, along with the trigger thresholds for fault detection, may be changed based upon the application
requirements using the data flash settings in the appropriate register stated in the bq28z610 Technical Reference
Manual (SLUUA65).

bq28z610
9.2.3 Calibration Process

The calibration of Current, Voltage, and Temperature readings is accessible by writing 0xF081 or 0xF082 to
ManufacturerAccess(). A detailed procedure is included in the bq28z610 Technical Reference Manual
(SLUUA65) in the Calibration section. The description allows for calibration of Cell Voltage Measurement Offset,
Battery Voltage, Pack Voltage, Current Calibration, Coulomb Counter Offset, PCB Offset, CC Gain/Capacity
Gain, and Temperature Measurement for both internal and external sensors.
9.2.4 Gauging Data Updates

When a battery pack enabled with the bq28z610 is first cycled, the value of FullChargeCapacity() updates
several times. Figure 22 shows RemainingCapacity() and FullChargeCapacity(), and where those updates occur.
As part of the Impedance Track algorithm, it is expected that FullChargeCapacity() may update at the end of
charge, at the end of discharge, and at rest.
9.2.4.1 Application Curve
(mAh)
(mAh)
Figure 22. Elapsed Time(s)

bq28z610
10 Power Supply Requirements

There are two inputs for this device, the PACK input and VC2. The PACK input can be an unregulated input from
a typical AC adapter. This input should always be greater than the maximum voltage associated with the number
of series cells configured. The input voltage for the VC2 pin will have a minimum of 2.2 V to a maximum of 26 V
with the recommended external RC filter.
11 Layout
11.1 Layout Guidelines

• The layout for the high-current path begins at the PACK+ pin of the battery pack. As charge current travels
through the pack, it finds its way through protection FETs, a chemical fuse, the Li-Ion cells and cell
connections, and the sense resistor, and then returns to the PACK– pin. In addition, some components are
placed across the PACK+ and PACK– pins to reduce effects from electrostatic discharge.
• The N-channel charge and discharge FETs must be selected for a given application. Most portable battery
applications are a good option for the CSD16412Q5A. These FETs are rated at 14-A, 25-V device with
Rds(on) of 11 mΩ when the gate drive voltage is 10 V. The gates of all protection FETs are pulled to the
source with a high-value resistor between the gate and source to ensure they are turned off if the gate drive
is open. The capacitors (both 0.1 µF values) placed across the FETs are to help protect the FETs during an
ESD event. The use of two devices ensures normal operation if one of them becomes shorted. For effective
ESD protection, the copper trace inductance of the capacitor leads must be designed to be as short and wide
as possible. Ensure that the voltage rating of both these capacitors are adequate to hold off the applied
voltage if one of the capacitors becomes shorted.
• The quality of the Kelvin connections at the sense resistor is critical. The sense resistor must have a
temperature coefficient no greater than 50 ppm in order to minimize current measurement drift with
temperature. Choose the value of the sense resistor to correspond to the available overcurrent and short-
circuit ranges of the bq28z610. Select the smallest value possible in order to minimize the negative voltage
generated on the bq28z610 VSS node(s) during a short circuit. This pin has an absolute minimum of –0.3 V.
Parallel resistors can be used as long as good Kelvin sensing is ensured. The device is designed to support a
1-mΩ to 3-mΩ sense resistor.
• A pair of series 0.1-μF ceramic capacitors is placed across the PACK+ and PACK– pins to help in the
mitigation of external electrostatic discharges. The two devices in series ensure continued operation of the
pack if one of the capacitors becomes shorted. Optionally, a transorb such as the SMBJ2A can be placed
across the pins to further improve ESD immunity.
• In reference to the gas gauge circuit the following features require attention for component placement and
layout: Differential Low-Pass Filter, I2C communication, and PBI (Power Backup Input).
• The bq28z610 uses an integrating delta-sigma ADC for current measurements. Add a 100-Ω resistor from the
sense resistor to the SRP and SRN inputs of the device. Place a 0.1-μF filter capacitor across the SRP and
SRN inputs. Optional 0.1-μF filter capacitors can be added for additional noise filtering for each sense input
pin to ground, if required for your circuit. Place all filter components as close as possible to the device. Route
the traces from the sense resistor in parallel to the filter circuit. Adding a ground plane around the filter
network can add additional noise immunity.

bq28z610
Layout Guidelines (continued)
0.1 µF
0.1 µF 0.1 µF
100 100
0.001, 50 ppm
Filter Circuit
Sense Ground
resistor Shield
Figure 23. bq28z610 Differential Filter
• The bq28z610 has an internal LDO that is internally compensated and does not require an external
decoupling capacitor. The PBI pin is used as a power supply backup input pin, providing power during brief
transient power outages. A standard 2.2-μF ceramic capacitor is connected from the PBI pin to ground, as
shown in application example.
• The I2C clock and data pins have integrated high-voltage ESD protection circuits; however, adding a Zener
diode and series resistor provides more robust ESD performance. The I2C clock and data lines have an
internal pull-down. When the gas gauge senses that both lines are low (such as during removal of the pack),
the device performs auto-offset calibration and then goes into SLEEP mode to conserve power.
11.2 Layout Example

CSD16412Q5A CSD16412Q5A
D D D D D D D D
S S S G S S S G
Power Trace Line
PACK +
Reverse Polarity
Portection
PACK–
Fuse
13 Input filters
1 VSS VC1 12
PWPD
2s
2 SRN VC2 11
Differential Input well
matched for accuracy 1s
3 SRP PBI 10
Thermistor
4 TS1 CHG 9
5 SCL PACK 8
SCL Bus
Communication
Power Ground Trace
SDA 6 SDA DSG 7
Exposed Thermal Pad

Via connects to Power Ground
Via connects between two layers
Figure 24. bq28z610 Board Layout

bq28z610
12 Device and Documentation Support
12.1 Documentation Support

• bq28z610 Technical Reference Manual (SLUUA65)
• Theory and Implementation of Impedance Track Battery Fuel-Gauging Algorithm Application Report
(SLUA364B)
12.2 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
Impedance Track, E2E are trademarks of Texas Instruments.
Windows is a registered trademark of Microsoft.
I2C is a trademark of NXP Semiconductors N.V.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

PACKAGE OPTION ADDENDUM
www.ti.com 18-Dec-2015
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
BQ28Z610DRZR ACTIVE SON DRZ 12 3000 Green (RoHS CU NIPDAU Level-2-260C-1 YEAR -40 to 85 BQ28
& no Sb/Br) Z610
BQ28Z610DRZT ACTIVE SON DRZ 12 250 Green (RoHS CU NIPDAU Level-2-260C-1 YEAR -40 to 85 BQ28
& no Sb/Br) Z610
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
TAPE AND REEL INFORMATION
*All dimensions are nominal

Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
BQ28Z610DRZR SON DRZ 12 3000 330.0 12.4 2.8 4.3 1.2 4.0 12.0 Q2
BQ28Z610DRZT SON DRZ 12 250 330.0 12.4 2.8 4.3 1.2 4.0 12.0 Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
*All dimensions are nominal

Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
BQ28Z610DRZR SON DRZ 12 3000 338.1 338.1 20.6
BQ28Z610DRZT SON DRZ 12 250 338.1 338.1 20.6
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
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supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
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bq28z610 Impedance Track™ Gas Gauge and Protection Solution

Bus 100 100

2 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated

Product Folder Links: bq28z610

6 Pin Configuration and Functions

Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 3

7.2 ESD Ratings

7.3 Recommended Operating Conditions

4 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated

Product Folder Links: bq28z610

7.4 Thermal Information

7.5 Supply Current

(1) Dependent on the use of the correct firmware (FW) configuration

7.6 Power Supply Control

7.7 Low-Voltage General Purpose I/O, TS1

Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 5

7.8 Power-On Reset (POR)

7.9 Internal 1.8-V LDO

7.10 Current Wake Comparator

7.11 Coulomb Counter

6 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated

Product Folder Links: bq28z610

Coulomb Counter (continued)

7.12 ADC Digital Filter

7.13 ADC Multiplexer

7.14 Cell Balancing Support

Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 7

7.15 Internal Temperature Sensor

(1) Assured by design

7.16 NTC Thermistor Measurement Support

7.17 High-Frequency Oscillator

7.18 Low-Frequency Oscillator

7.19 Voltage Reference 1

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7.20 Voltage Reference 2

7.21 Instruction Flash

7.22 Data Flash

7.23 Current Protection Thresholds

Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 9

Current Protection Thresholds (continued)

7.24 Current Protection Timing

10 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated

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7.25 N-CH FET Drive (CHG, DSG)

7.26 I2C Interface I/O

7.27 I2C Interface Timing

Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 11

I2C Interface Timing (continued)

tSU(STA) tw(H) tw(L) tf tr t(BUF)

REPEATED STOP START

Figure 1. I2C Timing

12 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated

Product Folder Links: bq28z610

7.28 Typical Characteristics

ADC Offset Error (µV)

Low-Frequency Oscillator (kHz) 262