Busbar Protection REB670 Version 2.2 IEC: Commissioning Manual
Busbar Protection REB670 Version 2.2 IEC: Commissioning Manual
Busbar Protection REB670 Version 2.2 IEC: Commissioning Manual
The software and hardware described in this document is furnished under a license and may
be used or disclosed only in accordance with the terms of such license.
This product includes software developed by the OpenSSL Project for use in the OpenSSL
Toolkit. (http://www.openssl.org/) This product includes cryptographic software written/
developed by: Eric Young ([email protected]) and Tim Hudson ([email protected]).
Trademarks
ABB and Relion are registered trademarks of the ABB Group. All other brand or product names
mentioned in this document may be trademarks or registered trademarks of their respective
holders.
Warranty
Please inquire about the terms of warranty from your nearest ABB representative.
Disclaimer
The data, examples and diagrams in this manual are included solely for the concept or product
description and are not to be deemed as a statement of guaranteed properties. All persons
responsible for applying the equipment addressed in this manual must satisfy themselves that
each intended application is suitable and acceptable, including that any applicable safety or
other operational requirements are complied with. In particular, any risks in applications where
a system failure and/or product failure would create a risk for harm to property or persons
(including but not limited to personal injuries or death) shall be the sole responsibility of the
person or entity applying the equipment, and those so responsible are hereby requested to
ensure that all measures are taken to exclude or mitigate such risks.
This document has been carefully checked by ABB but deviations cannot be completely ruled
out. In case any errors are detected, the reader is kindly requested to notify the manufacturer.
Other than under explicit contractual commitments, in no event shall ABB be responsible or
liable for any loss or damage resulting from the use of this manual or the application of the
equipment.
Conformity
This product complies with the directive of the Council of the European Communities on the
approximation of the laws of the Member States relating to electromagnetic compatibility
(EMC Directive 2004/108/EC) and concerning electrical equipment for use within specified
voltage limits (Low-voltage directive 2006/95/EC). This conformity is the result of tests
conducted by ABB in accordance with the product standard EN 60255-26 for the EMC directive,
and with the product standards EN 60255-1 and EN 60255-27 for the low voltage directive. The
product is designed in accordance with the international standards of the IEC 60255 series.
Table of contents
Table of contents
Section 1 Introduction........................................................................................................ 9
1.1 This manual......................................................................................................................................... 9
1.2 Intended audience............................................................................................................................. 9
1.3 Product documentation................................................................................................................. 10
1.3.1 Product documentation set...................................................................................................... 10
1.3.2 Document revision history......................................................................................................... 11
1.3.3 Related documents...................................................................................................................... 11
1.4 Document symbols and conventions........................................................................................... 12
1.4.1 Symbols..........................................................................................................................................12
1.4.2 Document conventions...............................................................................................................13
1.5 IEC 61850 edition 1 / edition 2 mapping..................................................................................... 13
10.9.2.2 Switching the auto recloser to On and Off On and Off.................................................. 133
10.9.2.3 Verifying the auto recloser .................................................................................................. 134
10.9.2.4 Checking the auto reclosing conditions............................................................................134
10.9.2.5 Completing the test...............................................................................................................136
10.9.3 Apparatus control APC............................................................................................................. 136
10.9.4 Single command, 16 signals SINGLECMD............................................................................. 136
10.9.5 Interlocking................................................................................................................................. 136
10.10 Monitoring....................................................................................................................................... 137
10.10.1 Gas medium supervision SSIMG............................................................................................. 137
10.10.1.1 Testing the gas medium supervision for pressure alarm and pressure lockout
conditions................................................................................................................................ 137
10.10.1.2 Testing the gas medium supervision for temperature alarm and temperature
lock out conditions.................................................................................................................137
10.10.1.3 Completing the test...............................................................................................................138
10.10.2 Liquid medium supervision SSIML......................................................................................... 138
10.10.2.1 Testing the liquid medium supervision for level alarm and level lockout
conditions................................................................................................................................ 138
10.10.2.2 Testing the liquid medium supervision for temperature alarm and
temperature lock out conditions........................................................................................ 138
10.10.2.3 Completing the test...............................................................................................................139
10.10.3 Breaker monitoring SSCBR...................................................................................................... 139
10.10.3.1 Verifying the settings............................................................................................................ 139
10.10.3.2 Completing the test.............................................................................................................. 140
10.10.4 Event function EVENT...............................................................................................................140
10.10.5 Limit counter L4UFCNT............................................................................................................ 141
10.10.5.1 Completing the test............................................................................................................... 141
10.10.6 Current harmonic monitoring CHMMHAI..............................................................................141
10.10.6.1 Verifying the signals and settings.......................................................................................141
10.10.6.2 Completing the test...............................................................................................................142
10.10.7 Voltage harmonic monitoring VHMMHAI............................................................................. 142
10.10.7.1 Verifying the signals and settings...................................................................................... 142
10.10.7.2 Completing the test...............................................................................................................142
10.11 Metering...........................................................................................................................................143
10.11.1 Pulse-counter logic PCFCNT....................................................................................................143
10.11.2 Function for energy calculation and demand handling ETPMMTR..................................143
10.11.2.1 Verifying the settings............................................................................................................ 143
10.11.2.2 Completing the test.............................................................................................................. 144
10.12 Station communication................................................................................................................ 144
10.12.1 Multiple command and transmit MULTICMDRCV / MULTICMDSND.............................. 144
10.13 Remote communication............................................................................................................... 144
10.13.1 Binary signal transfer................................................................................................................144
10.14 Basic IED functions........................................................................................................................146
10.14.1 Parameter setting group handling SETGRPS.......................................................................146
10.14.1.1 Verifying the settings............................................................................................................146
10.14.1.2 Completing the test...............................................................................................................146
10.15 Exit test mode................................................................................................................................ 146
Section 14 Glossary............................................................................................................163
Section 1 Introduction
1.1 This manual GUID-AB423A30-13C2-46AF-B7FE-A73BB425EB5F v19
The commissioning manual contains instructions on how to commission the IED. The manual
can also be used by system engineers and maintenance personnel for assistance during the
testing phase. The manual provides procedures for the checking of external circuitry and
energizing the IED, parameter setting and configuration as well as verifying settings by
secondary injection. The manual describes the process of testing an IED in a substation which
is not in service. The chapters are organized in the chronological order in which the IED should
be commissioned. The relevant procedures may be followed also during the service and
maintenance activities.
This manual addresses the personnel responsible for commissioning, maintenance and taking
the IED in and out of normal service.
The commissioning personnel must have a basic knowledge of handling electronic equipment.
The commissioning and maintenance personnel must be well experienced in using protection
equipment, test equipment, protection functions and the configured functional logics in the
IED.
Decommissioning
Commissioning
Maintenance
Engineering
Operation
Installing
Engineering manual
Installation manual
Commissioning manual
Operation manual
Application manual
Technical manual
Communication
protocol manual
Cyber security
deployment guideline
IEC07000220-4-en.vsd
IEC07000220 V4 EN-US
The installation manual contains instructions on how to install the IED. The manual provides
procedures for mechanical and electrical installation. The chapters are organized in the
chronological order in which the IED should be installed.
The commissioning manual contains instructions on how to commission the IED. The manual
can also be used by system engineers and maintenance personnel for assistance during the
testing phase. The manual provides procedures for the checking of external circuitry and
energizing the IED, parameter setting and configuration as well as verifying settings by
secondary injection. The manual describes the process of testing an IED in a substation which
is not in service. The chapters are organized in the chronological order in which the IED should
be commissioned. The relevant procedures may be followed also during the service and
maintenance activities.
The operation manual contains instructions on how to operate the IED once it has been
commissioned. The manual provides instructions for the monitoring, controlling and setting of
the IED. The manual also describes how to identify disturbances and how to view calculated
and measured power grid data to determine the cause of a fault.
The application manual contains application descriptions and setting guidelines sorted per
function. The manual can be used to find out when and for what purpose a typical protection
function can be used. The manual can also provide assistance for calculating settings.
The technical manual contains operation principle descriptions, and lists function blocks, logic
diagrams, input and output signals, setting parameters and technical data, sorted per
function. The manual can be used as a technical reference during the engineering phase,
installation and commissioning phase, and during normal service.
The point list manual describes the outlook and properties of the data points specific to the
IED. The manual should be used in conjunction with the corresponding communication
protocol manual.
The cyber security deployment guideline describes the process for handling cyber security
when communicating with the IED. Certification, Authorization with role based access control,
and product engineering for cyber security related events are described and sorted by
function. The guideline can be used as a technical reference during the engineering phase,
installation and commissioning phase, and during normal service.
The electrical warning icon indicates the presence of a hazard which could
result in electrical shock.
The warning icon indicates the presence of a hazard which could result in
personal injury.
The caution hot surface icon indicates important information or warning about
the temperature of product surfaces.
Class 1 Laser product. Take adequate measures to protect the eyes and do not
view directly with optical instruments.
The information icon alerts the reader of important facts and conditions.
The tip icon indicates advice on, for example, how to design your project or
how to use a certain function.
Although warning hazards are related to personal injury, it is necessary to understand that
under certain operational conditions, operation of damaged equipment may result in
degraded process performance leading to personal injury or death. It is important that the
user fully complies with all warning and cautionary notices.
• Abbreviations and acronyms in this manual are spelled out in the glossary. The glossary
also contains definitions of important terms.
• Push button navigation in the LHMI menu structure is presented by using the push button
icons.
For example, to navigate between the options, use and .
• HMI menu paths are presented in bold.
For example, select Main menu/Settings.
• LHMI messages are shown in Courier font.
For example, to save the changes in non-volatile memory, select Yes and press .
• Parameter names are shown in italics.
For example, the function can be enabled and disabled with the Operation setting.
• Each function block symbol shows the available input/output signal.
• the character ^ in front of an input/output signal name indicates that the signal
name may be customized using the PCM600 software.
• the character * after an input signal name indicates that the signal must be
connected to another function block in the application configuration to achieve a
valid application configuration.
• Dimensions are provided both in inches and millimeters. If it is not specifically mentioned
then the dimension is in millimeters.
Function block names are used in ACT and PST to identify functions. Respective function block
names of Edition 1 logical nodes and Edition 2 logical nodes are shown in the table below.
Read the entire manual before doing installation or any maintenance work on
the product.
Class 1 Laser product. Take adequate measures to protect your eyes and do not
view directly with optical instruments.
Do not touch the unit in operation. The installation shall take into account the
worst case temperature.
Observe the warnings during all types of work related to the product.
GUID-C9B6638A-57E7-4E05-9A33-A60E359C54AF v1
Only electrically skilled persons with the proper authorization and knowledge of
any safety hazards are allowed to carry out the electrical installation.
M2366-2 v2
M2362-2 v1
Do not touch circuitry during operation. Potentially lethal voltages and currents
are present.
M2364-2 v1
Always use suitable isolated test pins when measuring signals in open circuitry.
Potentially lethal voltages and currents are present.
M2370-2 v1
GUID-BEDD698E-356C-4CF9-9DAE-64DB3CEADEAD v1
Dangerous voltages can occur on the connectors, even though the auxiliary
voltage has been disconnected.
M2369-2 v3
M2367-2 v1
M2372-2 v1
Never remove any screw from a powered IED or from a IED connected to
powered circuitry. Potentially lethal voltages and currents are present.
SEMOD168311-3 v1
Take adequate measures to protect the eyes. Never look into the laser beam.
GUID-11CCF92B-E9E7-409C-84D0-DFDEA1DCBE85 v2
GUID-5D1412B8-8F9D-4D39-B6D1-60FB35797FD0 v2
Whenever changes are made in the IED, measures should be taken to avoid
inadvertent tripping.
GUID-F2A7BD77-80FB-48F0-AAE5-BE73DE520CC2 v1
M2695-2 v2
M2696-2 v1
Do not connect live wires to the IED. Internal circuitry may be damaged
M2697-2 v2
M2698-2 v2
M2693-2 v1
Changing the active setting group will inevitably change the IEDs operation. Be
careful and check regulations before making the change.
M19-2 v3
Observe the maximum allowed continuous current for the different current
transformer inputs of the IED. See technical data.
The following tables list all the functions available in the IED. Those functions
that are not exposed to the user or do not need to be configured are not
described in this manual.
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Differential protection
BUTPTRC, 87B Busbar differential 1
BCZTPDIF, protection, 2 zones,
BZNTPDIF, three phase/4 bays
BZITGGIO,
BUTSM4
BUTPTRC, 87B Busbar differential 1 1
BCZTPDIF, protection, 2 zones,
BZNTPDIF, three phase/8 bays
BZITGGIO,
BUTSM8
BUSPTRC, 87B Busbar differential 1 1
BCZSPDIF, protection, 2 zones,
BZNSPDIF, single phase/12 bays
BZISGGIO,
BUSSM12
BUSPTRC, 87B Busbar differential 1 1
BCZSPDIF, protection, 2 zones,
BZNSPDIF, single phase/24 bays
BZISGGIO,
BUSSM24
BDZSGAPC, 87B Busbar differential 1
BFPTRC, protection, 6 zones,
BICPTRC, single phase/24 bays
BZNPDIF,
BCZPDIF,
BSMGAPC
BDCGAPC 87B Status of primary 128 20 40 60 60 96
switching object for
busbar protection zone
selection
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Current protection
OC4PTOC 51_671) Directional phase 0-8 4-C06 8-C07
overcurrent protection,
four steps
PH4SPTOC 51 Four step single phase 0-24 12- 12- 24-
overcurrent protection C08 C08 C09
EF4PTOC 51N Directional residual 0-8
67N2) overcurrent protection,
four steps
NS4PTOC 46I2 Four step directional 0-8
negative phase
sequence overcurrent
protection
TRPTTR 49 Thermal overload 0-2
protection, two time
constants
CCRBRF 50BF Breaker failure 0-8 4-C10 8-C11
protection
CCSRBRF 50BF Breaker failure 0-24 12- 12- 24-
protection, single C12 C12 C13
phase version
GUPPDUP 37 Directional underpower 0-4
protection
GOPPDOP 32 Directional overpower 0-4
protection
CBPGAPC Capacitor bank 0-2
protection
Voltage protection
UV2PTUV 27 Two step undervoltage 0-2
protection
OV2PTOV 59 Two step overvoltage 0-2
protection
ROV2PTOV 59N Two step residual 0-2
overvoltage protection
VDCPTOV 60 Voltage differential 0-2
protection
LOVPTUV 27 Loss of voltage check 0-2
Frequency protection
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Multipurpose protection
CVGAPC General current and 0-6
voltage protection
1) 67 requires voltage
2) 67N requires voltage
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Control
SESRSYN 25 Synchroch 0-3
eck,
energizing
check and
synchroni
zing
SMBRREC 79 Autoreclo 0-2 2-H05 2-H05 2-H05 2-H05 2-H05
ser
APC30 3 Control 0-1
functional
ity for up
to 6 bays,
max 30
objects
(6CBs),
including
interlockin
g (see
Table 4)
QCBAY Bay 1+5/APC30 1 1 1 1 1
control
LOCREM Handling 1+5/APC30 1 1 1 1 1
of LR-
switch
positions
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
LOCREMCTRL LHMI 1 1 1 1 1 1
control of
PSTO
SXCBR Circuit 24 24 24 24 24 24
breaker
SLGAPC Logic 15 15 15 15 15 15
rotating
switch for
function
selection
and LHMI
presentati
on
VSGAPC Selector 30 30 30 30 30 30
mini
switch
DPGAPC Generic 32 32 32 32 32 32
communic
ation
function
for Double
Point
indication
SPC8GAPC Single 5 5 5 5 5 5
point
generic
control
function 8
signals
AUTOBITS Automatio 3 3 3 3 3 3
n bits,
command
function
for
DNP3.0
SINGLECMD Single 8 8 8 8 8 8
command,
16 signals
I103CMD Function 1 1 1 1 1 1
command
s for IEC
60870-5-1
03
I103GENCMD Function 50 50 50 50 50 50
command
s generic
for IEC
60870-5-1
03
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
I103POSCMD IED 50 50 50 50 50 50
command
s with
position
and select
for IEC
60870-5-1
03
I103POSCMDV IED direct 50 50 50 50 50 50
command
s with
position
for IEC
60870-5-1
03
I103IEDCMD IED 1 1 1 1 1 1
command
s for IEC
60870-5-1
03
I103USRCMD Function 4 4 4 4 4 4
command
s user
defined
for IEC
60870-5-1
03
Secondary
system
supervision
FUFSPVC Fuse 0-2
failure
supervisio
n
VDSPVC 60 Fuse 0-2
failure
supervisio
n based
on voltage
difference
DELVSPVC 7V_78 Voltage 4 4 4 4 4 4
V delta
supervisio
n, 2 phase
DELISPVC 71 Current 4 4 4 4 4 4
delta
supervisio
n, 2 phase
DELSPVC 78 Real delta 4 4 4 4 4 4
supervisio
n, real
Logic
TMAGAPC Trip 12 12 12 12 12 12
matrix
logic
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
ITBGAPC Integer to 16 16 16 16 16 16
Boolean
16
conversio
n with
Logic
Node
represent
ation
TEIGAPC Elapsed 12 12 12 12 12 12
time
integrator
with limit
transgres
sion and
overflow
supervisio
n
INTCOMP Comparat 30 30 30 30 30 30
or for
integer
inputs
REALCOMP Comparat 30 30 30 30 30 30
or for real
inputs
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Monitoring
AISVBAS General 1 1 1 1 1 1
service
value
presentati
on of
analog
inputs
EVENT Event 20 20 20 20 20 20
function
DRPRDRE, Disturban 1 1 1 1 1 1
A4RADR, ce report
SPGAPC Generic 96 96 96 96 96 96
communic
ation
function
for Single
Point
indication
SP16GAPC Generic 16 16 16 16 16 16
communic
ation
function
for Single
Point
indication
16 inputs
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
MVGAPC Generic 24 24 24 24 24 24
communic
ation
function
for
measured
values
BINSTATREP Logical 3 3 3 3 3 3
signal
status
report
RANGE_XP Measured 28 28 28 28 28 28
value
expander
block
SSIMG 63 Insulation 21 21 21 21 21 21
supervisio
n for gas
medium
SSIML 71 Insulation 3 3 3 3 3 3
supervisio
n for
liquid
medium
SSCBR Circuit 0-24 12 12 12 12 24
breaker
condition
monitorin
g
I103MEAS Measuran 1 1 1 1 1 1
ds for IEC
60870-5-1
03
I103MEASUSR Measuran 3 3 3 3 3 3
ds user
defined
signals for
IEC
60870-5-1
03
I103AR Function 1 1 1 1 1 1
status
auto-
recloser
for IEC
60870-5-1
03
I103EF Function 1 1 1 1 1 1
status
earth-
fault for
IEC
60870-5-1
03
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
I103FLTPROT Function 1 1 1 1 1 1
status
fault
protection
for IEC
60870-5-1
03
I103IED IED status 1 1 1 1 1 1
for IEC
60870-5-1
03
I103SUPERV Superviso 1 1 1 1 1 1
n status
for IEC
60870-5-1
03
I103USRDEF Status for 20 20 20 20 20 20
user
defined
signals for
IEC
60870-5-1
03
L4UFCNT Event 30 30 30 30 30 30
counter
with limit
supervisio
n
CHMMHAI ITHD Current 0-3 0-3 0-3 0-3 0-3 0-3
harmonic
monitorin
g, 3 phase
VHMMHAI VTHD Voltage 0-3 0-3 0-3 0-3 0-3 0-3
harmonic
monitorin
g, 3 phase
Metering
PCFCNT Pulse- 16 16 16 16 16 16
counter
logic
ETPMMTR Function 6 6 6 6 6 6
for energy
calculatio
n and
demand
handling
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Station communication
LONSPA, SPA SPA communication 1 1 1 1 1 1
protocol
HORZCOMM Network variables via 1 1 1 1 1 1
LON
IEC 61850-8-1 IEC 61850 1 1 1 1 1 1
GOOSEINTLKRCV Horizontal 59 59 59 59 59 59
communication via
GOOSE for interlocking
GOOSEBINRCV GOOSE binary receive 16 16 16 16 16 16
GOOSEDPRCV GOOSE function block to 64 64 64 64 64 64
receive a double point
value
GOOSEINTRCV GOOSE function block to 32 32 32 32 32 32
receive an integer value
GOOSEMVRCV GOOSE function block to 60 60 60 60 60 60
receive a measurand
value
GOOSESPRCV GOOSE function block to 64 64 64 64 64 64
receive a single point
value
MULTICMDRCV, Multiple command and 60/10 60/10 60/10 60/10 60/10 60/10
MULTICMDSND transmit
AGSAL Generic security 1 1 1 1 1 1
application component
LD0LLN0 IEC 61850 LD0 LLN0 1 1 1 1 1 1
SYSLLN0 IEC 61850 SYS LLN0 1 1 1 1 1 1
LPHD Physical device 1 1 1 1 1 1
information
PCMACCS IED configuration 1 1 1 1 1 1
protocol
FSTACCS Field service tool access 1 1 1 1 1 1
IEC 61850-9-2 Process 0-1 1-P30 1-P30 1-P30 1-P30 1-P30
bus communication, 8
merging units
ACTIVLOG Activity logging 1 1 1 1 1 1
ALTRK Service tracking 1 1 1 1 1 1
PRP IEC 62439-3 Parallel 0-1 1-P23 1-P23 1-P23 1-P23 1-P23
redundancy protocol
HSR IEC 62439-3 High- 0-1 1-P24 1-P24 1-P24 1-P24 1-P24
availability seamless
redundancy
Table continues on next page
REB670 (A20)
REB670 (B20)
REB670 (A31)
REB670 (B21)
REB670 (B31)
REB670
(Customized)
Section 4 Starting up
4.1 Factory and site acceptance testing GUID-38C2B5FA-9210-4D85-BA21-39CE98A1A84A v2
Testing the proper IED operation is carried out at different occasions, for example:
• Acceptance testing
• Commissioning testing
• Maintenance testing
This manual describes the workflow and the steps to carry out the commissioning testing.
Factory acceptance testing (FAT) is typically done to verify that the IED and its corresponding
configuration meet the requirements of the utility or industry. This test is the most complex
and in depth, as it is done to familiarize the user with a new product or to verify a new
configuration. The complexity of this testing depends on several factors, such as:
Site acceptance testing (SAT or commissioning testing) is typically done to verify that the
installed IED is correctly set and connected to the power system. SAT requires that the
acceptance testing has been performed and that the application configuration is verified.
Maintenance testing is a periodic verification that the IED is healthy and has correct settings,
depending on changes in the power system. There are also other types of maintenance
testing.
Before starting up commissioning at site, check that the following items are available.
Do not insert anything else to the female connector but the corresponding
male connector. Inserting anything else (such as a measurement probe) may
damage the female connector and prevent a proper electrical contact between
the printed circuit board and the external wiring connected to the screw
terminal block.
Check that the auxiliary supply voltage remains within the permissible input voltage range
under all operating conditions. Check that the polarity is correct before energizing the IED.
Check all connections to external circuitry to ensure correct installation, before energizing the
IED and carrying out the commissioning procedures.
Energize the power supply of the IED to start it up. Keep the DC power supply on until the Root
menu or the selected default screen is shown on the HMI before interrupting the DC power
supply again. The energization could be done in a number of ways, from energizing a whole
cubicle with many IEDs to energizing each single IED one by one.
If HW (i.e. I/O and/or communication boards etc.) have been changed (i.e. removed, replaced,
or added), the user should re-configure the IED by navigating in the local HMI menu to: Main
menu/Configuration/Reconfigure HW modules to activate the changed hardware modules in
order to enable the self-supervision function to detect possible hardware errors.
To ensure that the IED is according to the delivery and ordering specifications documents
delivered together with each IED, the user should also after start-up use the built in HMI to
check the IED's:
When the IED is energized, the green LED starts flashing instantly. After approximately 55
seconds the window lights up and the window displays ‘IED Startup’. The main menu is
displayed and the upper row should indicate ‘Ready’ after about 90 seconds. A steady green
light indicates a successful startup.
1 2 3
t (s)
0 t1 t2
xx04000310-1-en.vsd
IEC04000310 V2 EN-US
If the upper row in the window indicates ‘Fail’ instead of ‘Ready’ and the green LED flashes, an
internal failure in the IED has been detected.
The communication between the IED and PCM600 is independent of the communication
protocol used within the substation or to the NCC.
The communication media is always Ethernet and the used transport layer is TCP/IP.
Each IED has an RJ-45 Ethernet interface connector on the front. The front Ethernet connector
is recommended to be used for communication with PCM600.
When an Ethernet-based station protocol is used, PCM600 communication can use the same
Ethernet port and IP address.
• Direct point-to-point link between PCM600 and the IED front port. The front port can be
seen as a service port.
• A link via a station LAN or from remote via a network.
The physical connection and the IP address must be configured in both cases to enable
communication.
Setting up IP addresses
Communication between the IED and PCM600 is enabled from the LHMI. The IP address and
the corresponding communication subnetwork mask must be set via the Ethernet
configuration tool (ECT) for each available Ethernet interface in the IED. Each Ethernet
interface has a default factory IP address when the IED is delivered. The IP adress and the
subnetwork mask might have to be reset when an additional Ethernet interface is installed or
an interface is replaced.
DHCP is available for the front port, and a device connected to it can thereby obtain an
automatically assigned IP address via the local HMI path Main menu/Configuration/
Communication/Ethernet configuration/Front port/DHCP.
Alternatively the default IP address for the IED front port is 10.1.150.3 and the corresponding
subnetwork mask is 255.255.255.0, which can be set via the local HMI path Main menu/
Configuration/Communication/TCP-IP configuration/ETHFRNT:1Main menu/Configuration/
Communication/Ethernet configuration/AP_FRONT.
IEC13000057-1-en.vsd
IEC13000057 V1 EN-US
IEC13000058-1-en.vsd
IEC13000058 V1 EN-US
IEC13000059-1-en.vsd
IEC13000059 V1 EN-US
IEC13000060-1-en.vsd
IEC13000060 V1 EN-US
IEC13000062-1-en.vsd
IEC13000062 V1 EN-US
The PC and IED must belong to the same subnetwork for this set-up to work.
The PC and IED must belong to the same subnetwork for this set-up to work.
When writing a configuration to the IED with PCM600, the IED is automatically set in
configuration mode. When the IED is set in configuration mode, all functions are blocked. The
red LED on the IED flashes, and the green LED is lit while the IED is in the configuration mode.
When the configuration is written and completed, the IED is automatically set into normal
mode. For further instructions please refer to the users manuals for PCM600.
Check that the wiring is in strict accordance with the supplied connection
diagram.
The CTs must be connected in accordance with the circuit diagram provided with the IED, both
with regards to phases and polarity. The following tests shall be performed on every primary
CT connected to the IED:
• Primary injection test to verify the current ratio of the CT, the correct wiring up to the
protection IED and correct phase sequence connection (that is L1, L2, L3.)
• Polarity check to prove that the predicted direction of secondary current flow is correct
for a given direction of primary current flow. This is an essential test for the proper
operation of the differential function and directional protection functions.
• CT secondary loop resistance measurement to confirm that the current transformer
secondary loop DC resistance is within the specification for the connected protection
functions. When the measured loop resistance is near the calculated value for maximum
DC resistance, perform a complete burden test.
• CT excitation test in order to confirm that the current transformer is of the correct
accuracy rating and that there are no shorted turns in the current transformer windings.
Manufacturer's design curves must be available for the current transformer to compare
the actual results.
• Earthing check of the individual CT secondary circuits to verify that each three-phase set
of main CTs is properly connected to the station earth and only at one electrical point.
• Insulation resistance check.
While the CT primary is energized, the secondary circuit shall never be open
circuited because extremely dangerous high voltages may arise.
Both the primary and the secondary sides must be disconnected from the line
and the IED when plotting the excitation characteristics.
Check that the wiring is in strict accordance with the supplied connection diagram.
• Polarity check when applicable; this test is often omitted for CVTs
• VT circuit voltage measurement (primary injection test)
• Earthing check
• Phase relationship
• Insulation resistance check
The primary injection test verifies the VT ratio and the wiring all the way from the primary
system to the IED. Injection must be performed for each phase-to-neutral circuit.
The RTXP test switch is designed to provide the means of safe testing of the IED. This is
achieved by the electromechanical design of the test switch and test plug handle. When the
test plug handle is inserted, it first blocks the trip and alarm circuits then it short circuits the
CT secondary circuit and opens the VT secondary circuits making the IED available for
secondary injection.
When pulled out, the test handle is mechanically stopped in half withdrawn position. In this
position, the current and voltage enter the protection, but the alarm and trip circuits are still
isolated and the IED is in test mode. Before removing the test handle, check the measured
values in the IED.
Not until the test handle is completely removed, the trip and alarm circuits are restored for
operation.
Verify that the contact sockets have been crimped correctly and that they are
fully inserted by tugging on the wires. Never do this with current circuits in
service.
Current circuit
Voltage circuit
Do not insert anything else to the female connector but the corresponding
male connector. Inserting anything else (such as a measurement probe) may
damage the female connector and prevent a proper electrical contact between
the printed circuit board and the external wiring connected to the screw
terminal block.
Preferably, disconnect the binary input connector from the binary input cards. Check all
connected signals so that both input level and polarity are in accordance with the IED
specifications.
Preferably, disconnect the binary output connector from the binary output cards. Check all
connected signals so that both load and polarity are in accordance with IED specifications.
The customer specific values for each setting parameter and a configuration file have to be
available before the IED can be set and configured, if the IED is not delivered with a
configuration.
Use the configuration tools in PCM600 to verify that the IED has the expected configuration.
Each function included in the IED has several setting parameters, which have to be set in order
to make the IED behave as intended. A factory default value is provided for each
parameter.The Parameter Setting Tool in PCM600 is used when changing setting parameters.
Make sure that the DC supply is not turned off when the IED saves the written
configuration.
The IED uses a FLASH disk for storing configuration data and process data like counters,
object states, Local/Remote switch position etc. Since FLASH memory is used, measures have
been taken in software to make sure that the FLASH disk is not worn out by too intensive
storing of data.
This means, that to be absolutely sure that all data have been saved to FLASH, it is necessary
to leave the IED with auxiliary power connected after all the commissioning is done(including
setting the Local/Remote switch to the desired position) for at least one hour after the last
commissioning action performed on the IED.
After that time has elapsed, it will be safe to turn the IED off, no data will be lost.
The analog input channels must be configured to get correct measurement results as well as
correct protection functionality. Because all protection algorithms in the IED utilize the
primary system quantities, it is extremely important to make sure that connected current
transformer settings are done properly. These data are calculated by the system engineer and
normally set by the commissioner from the local HMI or from PCM600.
The analog inputs on the transformer input module are dimensioned for either 1A or 5A. Each
transformer input module has a unique combination of current and voltage inputs. Make sure
the input current rating is correct and that it matches the order documentation.
The primary CT data are entered via the HMI menu under Main menu/Configurations/Analog
modules
The following parameter shall be set for every current transformer connected to the IED:
Table 9: CT configuration
Parameter description Parameter name Range Default
Rated CT primary current in A CTPRIMn from 0 to 99999 3000
n = channel number
This parameter defines the primary rated current of the CT. For two set of CTs with ratio
1000/1 and 1000/5 this parameter is set to the same value of 1000 for both CT inputs. The
parameter CTStarPoint can be used in order to reverse the direction of the CT. This might be
necessary if two sets of CTs have different star point locations in relation to the protected
busbar.
For main CTs with 2A rated secondary current, it is recommended to connect the secondary
wiring to the 1A input.
Take the rated permissive overload values for the current inputs into
consideration.
I/O modules configured with PCM600 (BIM, BOM or IOM) are supervised.
Each logical I/O module has an error flag that indicates signal or module failure. The error flag
is also set when the physical I/O module of the correct type is not detected in the connected
slot.
If the IED is connected to a monitoring or control system via the rear SPA/IEC103 port, the
SPA/IEC103 port has to be set either for SPA or IEC103 use.
The SPA/IEC port is located on the rear side of the IED. Two types of interfaces can be used:
When using the SPA protocol, the rear SPA/IEC port must be set for SPA use.
Procedure:
1. Set the port for SPA use on the local HMI under Main menu /Configuration /
Communication /Station communication/Port configuration/SLM optical serial port/
PROTOCOL:1. When the communication protocol is selected, the IED is automatically
restarted, and the port then operates as a SPA port.
2. Set the SlaveAddress and BaudRate for the rear SPA port on the local HMI under Main
menu/Configuration/Communication/Station communication/SPA/SPA:1. Use the
same settings for these as is set in the SMS system for the IED.
The SPA/IEC port is located on the rear side of the IED. Two types of interfaces can be used:
When using the IEC protocol, the rear SPA/IEC port must be set for IEC use.
Procedure:
1. Set the port for IEC use on the local HMI under Main menu /Configuration /
Communication /Station communication/Port configuration/SLM optical serial port/
PROTOCOL:1. When the communication protocol is selected, the IED is automatically
restarted, and the port then operates as an IEC port.
2. Set the SlaveAddress and BaudRate for the rear IEC port on the local HMI under Main
menu/Configuration/Communication/Station communication/IEC60870-5-103/
OPTICAL103:1. Use the same settings for these as is set in the SMS system for the IED.
To verify that the rear communication with the SMS/SCS system is working, there are some
different methods. Choose one of the following.
Procedure
1. Use a SPA-emulator and send “RF” to the IED. The answer from the IED should be the type
and version of it, for example, “REL670 2.1...”.
2. Generate one binary event by activating a function, which is configured to an EVENT
block where the used input is set to generate events on SPA. The configuration must be
made with the PCM600 software. Verify that the event is presented in the SMS/SCS
system.
During the following tests of the different functions in the IED, verify that the events and
indications in the SMS/SCS system are as expected.
To verify that the IEC communication with the IEC master system is working, there are some
different methods. Choose one of the following.
Procedure
1. Check that the master system time-out for response from the IED, for example after a
setting change, is > 40 seconds.
2. Use a protocol analyzer and record the communication between the IED and the IEC
master. Check in the protocol analyzer’s log that the IED answers the master messages.
3. Generate one binary event by activating a function that is configured to an event block
where the used input is set to generate events on IEC. The configuration must be made
with the PCM600 software. Verify that the event is presented in the IEC master system.
During the following tests of the different functions in the IED, verify that the events and
indications in the IEC master system are as expected.
The SPA communication is mainly used for SMS. It can include different numerical IEDs with
remote communication possibilities. The fiber optic loop can contain < 20-30 IEDs depending
on requirements on response time. Connection to a personal computer (PC) can be made
directly (if the PC is located in the substation) or by telephone modem through a telephone
network with ITU (CCITT) characteristics.
LON communication is normally used in substation automation systems. Optical fiber is used
within the substation as the physical communication link.
The test can only be carried out when the whole communication system is installed. Thus, the
test is a system test and is not dealt with here.
M14804-3 v6
Gateway
Star coupler
RER 111
IEC05000663-1-en.vsd
IEC05000663 V2 EN-US
The fiber optic LON bus is implemented using either glass core or plastic core fiber optic
cables.
The LON protocol is specified in the LonTalkProtocol Specification Version 3 from Echelon
Corporation. This protocol is designed for communication in control networks and is a peer-
to-peer protocol where all the devices connected to the network can communicate with each
other directly. For more information of the bay-to-bay communication, refer to the section
Multiple command function.
The hardware needed for applying LON communication depends on the application, but one
very central unit needed is the LON Star Coupler and optical fibers connecting the star coupler
to the IEDs. To interface the IEDs from the MicroSCADA with Classic Monitor, application
library LIB520 is required.
The HV Control 670 software module is included in the LIB520 high-voltage process package,
which is a part of the Application Software Library in MicroSCADA applications.
The HV Control 670 software module is used for control functions in the IEDs. The module
contains a process picture, dialogues and a tool to generate a process database for the
control application in MicroSCADA.
When using MicroSCADA Monitor Pro instead of the Classic Monitor, SA LIB is used together
with 670 series Object Type files.
The HV Control 670 software module and 670 series Object Type files are used
with both 650 and 670 series IEDs.
Use the LON Network Tool (LNT) to set the LON communication. This is a software tool
applied as one node on the LON bus. To communicate via LON, the IEDs need to know
The node address is transferred to LNT via the local HMI by setting the parameter
ServicePinMsg = Yes. The node address is sent to LNT via the LON bus, or LNT can scan the
network for new nodes.
The communication speed of the LON bus is set to the default of 1.25 Mbit/s. This can be
changed by LNT.
M11888-3 v5
The LON communication setting parameters are set via the local HMI. Refer to the Technical
manual for more detailed specifications.
If LON communication from the IED stops because of illegal communication parameter
settings (outside the setting range) or due to other kind of disturbance, it is possible to reset
the IED's LON port.
M11643-1 v4
LON communication setting parameters (Table 13) and LON node information parameters
(Table 14) can only be set via the LON Network Tool (LNT).
Some of these parameters can be viewed on the local HMI under Main menu/Configuration/
Communication/Station communication/Port configuration/SLM optical LON port/
LONGEN:1.
ADE settings are available on the local HMI under Main menu/Configuration/Communication/
Station communicaton/LON/ADE:1
LON commands are available on the local HMI under Main menu/Configuration/
Communication/Station communication/Port configuration/SLM optical LON pot/Service
Pin Messae/Generate service pin message
To enable IEC 61850 communication, the corresponding ports must be activated. The rear
access points can be used for IEC 61850-8-1 and IEC/UCA 61850-9-2LE communication. IEC
61850-8-1 redundant communication requires the use of two Ethernet ports, when it is
activated for Ethernet port the next immediate port is selected as the second Ethernet port
and will become hidden.
There are no settings needed for the IEC/UCA 61850-9-2LE communication in the local HMI
branch Station communication. Make sure that the optical fibers are connected correctly.
Communication is enabled whenever the merging unit starts sending data.
To verify that the communication is working a test/analyzing tool, for example ITT600, can be
used.
as Ok. Remove the optical connection to one of the Ethernet ports. Verify that either signal
status (depending on which connection that was removed) is shown as Error and the that
other signal is shown as Ok. Be sure to re-connect the removed connection after completed
verification.
• Calculated settings
• Application configuration diagram
• Signal matrix (SMT) configuration
• Terminal connection diagram
• Technical manual
• Three-phase test equipment
• Process bus, IEC/UCA 61850-9-2LE, MU test simulator, if IEC/UCA 61850-9-2LE process
bus communication is used.
• PCM600
The setting and configuration of the IED must be completed before the testing can start.
The terminal diagram, available in the technical reference manual, is a general diagram of the
IED.
Note that the same diagram is not always applicable to each specific delivery
(especially for the configuration of all the binary inputs and outputs).
Therefore, before testing, check that the available terminal diagram corresponds to the IED.
The technical manual contains application and functionality summaries, function blocks, logic
diagrams, input and output signals, setting parameters and technical data sorted per
function.
The test equipment should be able to provide a three-phase supply of voltages and currents.
The magnitude of voltage and current as well as the phase angle between voltage and current
must be variable. The voltages and currents from the test equipment must be obtained from
the same source and they must have minimal harmonic content. If the test equipment cannot
indicate the phase angle, a separate phase-angle measuring instrument is necessary.
Prepare the IED for test before testing a particular function. Consider the logic diagram of the
tested protection function when performing the test. All included functions in the IED are
tested according to the corresponding test instructions in this chapter. The functions can be
tested in any order according to user preferences. Only the functions that are used (Operation
is set to On) should be tested.
This IED is designed for a maximum continuous current of four times the rated
current.
When using a MU test simulator, make sure it is set to the correct SVID and that
the system frequency is set to the same as in the IED.
Please observe the measuring accuracy of the IED, the test equipment and the
angular accuracy for both of them.
Consider the configured logic from the function block to the output contacts
when measuring the operate time.
After intense testing, it is important that the IED is not immediately restarted,
which might cause a faulty trip due to flash memory restrictions. Some time
must pass before the IED is restarted. For more information about the flash
memory, refer to section “Configuring the IED and changing settings”.
If the IED is used together with a merging unit and no time synchronization is
available, for example, in the laboratory test, the IED will synchronize to the SV
data stream. During the re-synchronization, the protection functions will be
blocked once a second for about 45 ms, and this will continue for up to 10
minutes. To avoid this, configure PTP (IEEE 1588) to On for the access point
where the merging unit is configured.
If a test switch is included, start preparation by making the necessary connections to the test
switch. This means connecting the test equipment according to a specific and designated IED
terminal diagram.
Put the IED into the test mode to facilitate the test of individual functions and prevent
unwanted operation caused by other functions. The busbar differential protection is not
included in the test mode and is not prevented to operate during the test operations. The test
switch should then be connected to the IED.
Verify that analog input signals from the analog input module are measured and recorded
correctly by injecting currents and voltages required by the specific IED.
To make testing even more effective, use PCM600. PCM600 includes the Signal monitoring
tool, which is useful in reading the individual currents and voltages, their amplitudes and
phase angles. In addition, PCM600 contains the Disturbance handling tool. The content of
reports generated by the Disturbance handling tool can be configured which makes the work
more efficient. For example, the tool may be configured to only show time tagged events and
to exclude analog information and so on.
Check the disturbance report settings to ensure that the indications are correct.
For information about the functions to test, for example signal or parameter names, see the
technical manual. The correct initiation of the disturbance recorder is made on start and/or
release or trip from a function. Also check that the wanted recordings of analog (real and
calculated) and binary signals are achieved.
Parameters can be entered into different setting groups. Make sure to test
functions for the same parameter setting group. If needed, repeat the tests for
all different setting groups used. The difference between testing the first
parameter setting group and the remaining is that there is no need for testing
the connections.
During testing, observe that the right testing method, that corresponds to the actual
parameters set in the activated parameter setting group, is used.
Set and configure the function(s) before testing. Most functions are highly flexible and permit
a choice of functional and tripping modes. The various modes are checked at the factory as
part of the design verification. In certain cases, only modes with a high probability of coming
into operation need to be checked when commissioned to verify the configuration and
settings.
Put the IED into the test mode before testing. The test mode blocks all protection functions
and some of the control functions in the IED, and the individual functions to be tested can be
unblocked to prevent unwanted operation caused by other functions. In this way, it is possible
to test slower back-up measuring functions without the interference from faster measuring
functions. The busbar differential protection is not included in the test mode and is not
prevented to operate during the test operations. The test switch should then be connected to
the IED.Test mode is indicated when the yellow StartLED flashes.
It is important that the IED function to be tested is put into test mode, even if the MU is
sending data marked as "test". The IED will interpret these data as valid if it is not in test
mode.
The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24. The test switch
and its associated test plug handle (RTXH8, RTXH18 or RTXH24) are a part of the COMBITEST
system, which provides secure and convenient testing of the IED.
When using the COMBITEST, preparations for testing are automatically carried out in the
proper sequence, that is, for example, blocking of tripping circuits, short circuiting of CTs,
opening of voltage circuits, making IED terminals available for secondary injection. Terminals 1
and 8, 1 and 18 as well as 1 and 12 of the test switches RTXP8, RTXP18 and RTXP24 respectively
are not disconnected as they supply DC power to the protection IED.
The RTXH test-plug handle leads may be connected to any type of test equipment or
instrument. When a number of protection IEDs of the same type are tested, the test-plug
handle only needs to be moved from the test switch of one protection IED to the test switch of
the other, without altering the previous connections.
Use COMBITEST test system to prevent unwanted tripping when the handle is withdrawn,
since latches on the handle secure it in the half withdrawn position. In this position, all
voltages and currents are restored and any re-energizing transients are given a chance to
decay before the trip circuits are restored. When the latches are released, the handle can be
completely withdrawn from the test switch, restoring the trip circuits to the protection IED.
If a test switch is not used, perform measurement according to the provided circuit diagrams.
Connect the test equipment according to the IED specific connection diagram and the needed
input and output signals for the function under test. An example of a connection is shown in
figure 9.
Connect the current and voltage terminals. Pay attention to the current polarity. Make sure
that the connection of input and output current terminals and the connection of the residual
current conductor is correct. Check that the input and output logical signals in the logic
diagram for the function under test are connected to the corresponding binary inputs and
outputs of the IED under test.
To ensure correct results, make sure that the IED as well as the test equipment
are properly earthed before testing.
IL1 IL1
IL2 IL2
IL3 IL3
IN IN (I4,I5)
Test equipment
UL1 UL1
UL2
IED
UL2
UL3 UL3
UN UN
UN (U4,U5)
TRIP L1
TRIP L2
TRIP L3
IEC 61850
IEC09000652-1-en.vsd
IEC09000652 V1 EN-US
Figure 9: Connection example of the test equipment to the IED when test equipment is
connected to the transformer input module
Release or unblock the function to be tested. This is done to ensure that only the function or
the chain of functions to be tested are in operation and that other functions are prevented
from operating. Release the tested function(s) by setting the corresponding Blocked
parameter under Function test modes to No in the local HMI .
When testing a function in this blocking feature, remember that not only the actual function
must be activated, but the whole sequence of interconnected functions (from measuring
inputs to binary output contacts), including logic must be activated. Before starting a new test
mode session, scroll through every function to ensure that only the function to be tested (and
the interconnected ones) have the parameters Blocked and eventually EvDisable set to No and
Yes respectively. Remember that a function is also blocked if the BLOCK input signal on the
corresponding function block is active, which depends on the configuration. Ensure that the
logical status of the BLOCK input signal is equal to 0 for the function to be tested. Event
function blocks can also be individually blocked to ensure that no events are reported to a
remote station during the test. This is done by setting the parameter EvDisable to Yes.
Any function is blocked if the corresponding setting in the local HMI under Main
menu/Test/Function test modes menu remains On, that is, the parameter
Blocked is set to Yes and the parameter TESTMODE under Main menu/
Test/IED test mode remains active. All functions that were blocked or released
in a previous test mode session, that is, the parameter Test mode is set to On,
are reset when a new test mode session is started.
Procedure
Verify that the connections are correct and that measuring and scaling is done correctly. This
is done by injecting current and voltage to the IED.
Besides verifying analog input values from the merging unit via the IEC/UCA 61850-9-2LE
process bus, analog values from the transformer input module can be verified as follows.
Apply input signals as needed according to the actual hardware and the
application configuration.
Forcing of binary inputs and outputs is a convenient way to test wiring in substations as well
as testing configuration logic in the IEDs. Basically it means that all binary inputs and outputs
on the IED I/O modules (BOM, BIM, IOM & SOM) can be set to a value (i.e active or not-active),
selected by the user, while the IED is in test mode. For inputs, this is true regardless of the
actual signal voltage present on the input. For outputs, any output relay can be forced to be
active or not, regardless of the current requested state of the output in the IED logic
configuration.
To enable forcing, the IED must first be put into IED test mode. While the IED is not in test
mode, the LHMI/PCM600 menus that relate to forcing will not have any effect on the input/
output status due to safety reasons.
IEC15000029 V1 EN-US
It may be convenient to control the input on mentioned component from, for example, an LHMI
function key or similar during commissioning to quickly and easily enter IED test mode.
Once the IED is in IED test mode, the LHMI/PCM600 menus can be used to control input/
output signals freely.
• Edit the input/output value directly to select the desired logical level, by doing following:
1. Select the value line of the desired signal, see figure 10.
2. Press the Enter key to edit the value.
IEC15000021 V1 EN-US
On the LHMI, these edit changes have immediate effect. This means that the
value changes directly when the up/down arrow is pressed (i.e. there is no need
to press the Enter key to effectuate the change).
When navigating away from a LHMI forcing menu for an I/O board, the user is prompted to
either leave the signals forced, or to revert all of them back to the unforced state.
IEC15000022 V1 EN-US
It is possible to power-cycle the IED in this state without losing the forcing
states and values. This means that once a signal is forced, and the IED remains
in IED test mode, the input or output will appear “frozen” at the value selected
by the user, even if the IED is switched off and back on again.
• Set the status of a signal to Forced, in the forcing menu that corresponds to the I/O card
in question. See example of LHMI menu in figure 11
IEC15000020 V1 EN-US
The signal “freezes” and will not change value even if, for example, a binary input signal voltage
changes level, or if a binary output is activated as the result of a protection function block
activating.
1. Right click on the IED in the plant structure and select Signal Monitoring.
2. Click on the List View tab.
3. Click Forcing Session in the menu IED/Start Forcing.
IEC15000023 V1 EN-US
4. Click Start editing signal value for forcing on the tool bar.
IEC15000024 V1 EN-US
The Signal Monitoring menu changes and indicates the forcing values that can be edited.
IEC15000025 V1 EN-US
IEC15000026 V1 EN-US
This commits the values to the IED and exits the editing session.
7. Click Cancel to abort the changes and revert back to actual IED values.
IEC15000032 V1 EN-US
Regardless if the forcing changes are commited or canceled, the forcing is still
active.
To force more signals, click the button Start editing signal value for forcing again.
9.8.4 How to undo forcing changes and return the IED to normal
operation GUID-00E2BAD8-A29E-4B9D-80E6-E12F59E019BD v1
Regardless of which input/output signals have been forced, all forced signals will return to
their normal states immediately when the IED is taken out of test mode.
When the forcing is removed by exiting from IED test mode, both input and
output signals may change values. This means that logic input signals may
activate functions in the IED and that output relays may change state, which
can be potentially dangerous.
• If the IED test mode was entered through the test mode function block:
1. Deactivate the control input on that block.
This immediately undoes all forcing, regardless of how it was accomplished and disabled
all the way to force signals.
This immediately undoes all forcing, regardless of how it was accomplished and disabled.
IEC15000031 V1 EN-US
This may change both binary input values and output relay states and will undo
any forcing done by using the LHMI.
If the IED is left in test mode, then it is still possible to perform new forcing
operations, both from LHMI and from PCM600
• Disturbance recorder
• Event list
• Event recorder
• Trip value recorder
• Indications
If the disturbance report is set on, then its sub-functions are also set up and so it is not
possible to only switch these sub-functions off. The disturbance report function is switched
off (parameter Operation = Off) in PCM600 or the local HMI under Main menu/Settings/IED
Settings/Monitoring/Disturbance report/DRPRDRE:1.
When the IED is in test mode, the disturbance report can be made active or inactive. If the
disturbance recorder is turned on during test mode, recordings will be made. When test mode
is switched off all recordings made during the test session are cleared.
Setting OpModeTest for the control of the disturbance recorder during test mode are located
on the local HMI under Main menu/Settings/IED Settings/Monitoring/Disturbance report/
DRPRDRE:1.
A Manual Trig can be started at any time. This results in a recording of the actual values from
all recorded channels.
Evaluation of the results from the disturbance recording function requires access to a PC
either permanently connected to the IED or temporarily connected to the Ethernet port (RJ-45)
on the front. The PCM600 software package must be installed in the PC.
Disturbance upload can be performed by the use of PCM600 or by any third party tool with IEC
61850 protocol. Reports can automatically be generated from PCM600. Disturbance files can
be analyzed by any tool reading Comtrade formatted disturbance files.
It could be useful to have a printer for hard copies. The correct start criteria and behavior of
the disturbance recording function can be checked when IED protective functions are tested.
When the IED is brought into normal service it is recommended to delete all recordings, made
during commissioning to avoid confusion in future fault analysis.
The result from the event recorder and event list can be viewed on the local HMI or, after
upload, in PCM600 as follows:
When the IED is brought into normal service it is recommended to delete all events resulting
from commissioning tests to avoid confusion in future fault analysis. All events in the IED can
be cleared in the local HMI under Main Menu//Clear/Clear internal event list or Main menu/
Clear/Clear process event list. It is not possible to clear the event lists from PCM600.
When testing binary inputs, the event list (EL) might be used instead. No uploading or
analyzing of registrations is then needed since the event list keeps running, independent of
start of disturbance registration.
Use the technical manual to identify function blocks, logic diagrams, input and output signals,
setting parameters and technical data.
GUID-2B18C54A-3D20-49B3-A0AF-BBD2B99D8A80 v1
The two-zone busbar differential protections and the six-zone busbar differential protection
do share the same core features and fundamental principles of operation, although some
features may differ. For the installation and commissioning, they share also the same
principles and similar procedures. For presentation simplicity purpose, only the installation
and commissioning of the two-zone busbar differential protection applications are described
here to illustrate the principle.
Secondary injection testing is a normal part of the commissioning. The operating value of all
protection functions, the output to the proper trip and alarm contacts and the operation of
binary input signals is checked and documented for future reference.
The connection of the test set to REB670 is greatly simplified if the RTXP 24 test switch is
included.When the test handle RTXH 24 is inserted in the test switch, the preparations for
testing are automatically carried out in the proper sequence, that is:
If the REB670 is not provided with a test switch, the IED has to be tested in the proper way
from external circuit terminals. Make sure that the instrument transformers are isolated from
the circuits connected to the test set. The secondary phase terminals of the current
transformers must be short-circuited to neutral before the circuit is opened if any current can
flow on the primary side.
The testing requires a good understanding of the protection functionality of the REB670. A
testing instruction is given for each type of protection function.
Note that CT inputs for the REB670 are designed for a maximum continuous
current of four times rated value.
Note that the busbar differential protection functions are not included in the
IED Test Mode.
Before the testing, prepare the IED for verification of settings as outlined in
Section "Requirements" and Section "Preparing for test" in this chapter.
The typical connection between the three-phase current test set and REB670 IEDs is shown in
Figure 12.
3-Ph current
Test Set
L1 L2 L3 N
IEC01000112-2-en.vsd
IEC01000112 V2 EN-US
Figure 12: Typical test connection for CTx current input when COMBITEST RTXP 24 test
switch is delivered together with one-phase REB670 IED
The testing will be explained from one general current input CTx (that is 1 ≤ x ≤ Nmax; where
Nmax is the maximum number of used CT inputs).
Follow the following test instructions to test the operation of the differential protection
function for the current input CTx:
1. Connect the test set for injection of three-phase current (or if not available one-phase
current) to the current terminals of CTx input of REB670 terminal.
2. Check and write down the value for the configuration parameter CTprimx, which
corresponds to the rated primary current of the CTx input.
Test the operation of the differential protection function ZA
3. Make sure that the check zone is properly set and enabled, when used.
4. Make sure the current from this current input is included into ZA measurement.
Check the value for the configuration parameter ZoneSel of the CTx, and
• energize the binary input CTRLZA, if the value of ZoneSel is CtrlIncludes, or
• de-energize the binary input CTRLZA, if the value of ZoneSel is CtrlExcludes, or
• go to the next step, if the value of ZoneSel is Fixed to ZA, Fixed to ZB or Fixed to ZA
& - ZB.
5. Check the association status of each CT to the differential zones, from the local HMI
(under Main menu/Control/Station matrix).
6. Increase the current in the phase L1 until the correct differential zone function (that is,
either ZA or ZB) operates and observe the incoming and differential currents at the
moment of operation.
7. Check that the trip and alarm contacts operate according to the scheme wiring.
8. Check that the trip information is stored in the event list (if connected).
9. Switch off the current.
10. Check that the trip reset information is stored in the event list (if connected).
11. Check the function by injecting current in the phases L2 and L3 in the similar way.
12. Inject a symmetrical three-phase current and observe the operate value (possible with
three-phase test set only).
13. Connect the timer and set the current to be five times of the value for the parameter
DiffOperLevel.
14. Switch on the current and observe the operate time.
Test the operation of the differential protection function ZB
15. Test the operation of both differential protection function ZA and ZB simultaneously
Check the value for the configuration parameter ZoneSel of the CTx, and
• de-energize the binary input CTRLZA and energize the binary input CTRLZB, if the
value of ZoneSel is CtrlIncludes,
• energize the binary input CTRLZA and de-energize binary input CTRLZB, if the value
of ZoneSel is CtrlExcludes
• go directly to the next step, otherwise,
16. Repeat the steps from 5 to 14 for ZB
Test the operation of both differential protection function ZA and ZB simultaneously
17. Make sure the current from this current input is included into both measuring zones ZA
and ZB simultaneously.
Check the value for the configuration parameter ZoneSel of the CTx, and
• energize both the binary inputs CTRLZA and CTRLZB, if the value of ZoneSel is
CtrlIncludes,
• de-energize both the binary inputs CTRLZA and CTRLZB, If the value of ZoneSel is
CtrlExcludes,
• go directly to the next step, otherwise
18. Make sure that the dedicated binary output ACTIVE from the Zone Interconnection block
has the logical value one.
19. Repeat the steps from 5 to 14 for both ZA and ZB.
For stability test one current input shall always be used as a reference input. The reference
current input then shall be tested for stability against all other current inputs in the IED. It is
recommended to use current input CT1 as the reference current input. The typical connection
between the three-phase current test set and the IED for this type of tests is shown in
Figure 13.
3-Ph current
Test Set
L1 L2 L3 N
I1 I2
2A
2B
3A
3B
2A
2B
3A
CTx 3B
2A
2B
3A
3B
IEC01000113-2-en.vsd
IEC01000113 V2 EN-US
Figure 13: Typical test connection for CT1 and CTx current inputs of the phase L1 when
COMBITEST RTXP 24 test switch is delivered together with the one-phase IED
The connections are shown for phase L1 only. Similar connection shall be used for testing
phase L2 and L3 also.
The test will be explained for CT1 and one general current input CTx (2 ≤ x ≤ Nmax, where Nmax
is the maximum number of used CT inputs).
1. Connect the currents I1 and I2 from the three-phase test set to the current terminals of
CT1 and CTx inputs of the IED as shown in Figure 13.
2. Make sure that current measurement from CT1 and CTx inputs are included into the same
differential zone (see the previous test instruction for more details).
3. Set the current I1 (that is, the current connected to the reference current input CT1) to
the nominal secondary value (normally 1A or 5A) at 0°,
I 1 CTsec1
IECEQUATION16064 V1 EN-US (Equation 1)
where the configuration parameter CTsec1 represents the rated secondary current of the
current input CT1.
4. Set the current I2 (that is, the current connected to the current input CTx) to the value
calculated as follows:
CTxratio CTprimx
I 2 CTsecx CTsec1 ,
CT 1ratio CTprim1
IECEQUATION16065 V1 EN-US (Equation 2)
CTprimk
Where CTkratio CTseck , k 1 or x . The configuration parameter CTseck represents the
rated secondary current of the current input CTk, while the configuration parameter
CTprimk represents the rated primary current.
5. Set the phase angle of the current I2 to 180°, if both current inputs (that is, CT1 and CTx)
have the same set value for TRM parameter CTStarPointx (i.e. both set to value ToObject
or both set to value FromObject). Set the phase angle of the current I2 to 0°, otherwise.
6. Inject these two currents into the IED. Observe that differential function shall be stable.
Write down the service values for incoming and differential currents for the phase L1.
Observe that differential current should be very small.
7. Switch off the currents.
8. Repeat the same test procedure for the phases L2 and L3.
9. Repeat above test steps for all used CT inputs (i.e. 2 ≤ x ≤ Nmax,where Nmax is the
maximum number of used CT inputs).
For fast open CT test two current inputs shall always be used. Similar to the previous section,
the test will be explained for CT1 and CTx (2 ≤ x ≤ Nmax).
The connections are shown for phase L1 only. Similar connection shall be used for testing
phase L2 and L3 also. The typical connection between the three-phase current test set and the
IED for this type of tests is shown in Figure 13.
Follow the following test instructions to perform the test on the operation of fast open CT
detection.
1. Connect the currents I1 and I2 from the three-phase test set test set to the current
terminals of CT1 and CTx inputs of the IED as shown in Figure 13.
2. Make sure that the current measurement from CT1 and CTx inputs are included into the
same differential zone (see the previous test instructions for more details).
3. Set the current I1 (that is, current connected to input CT1) to the nominal secondary value
(normally 1A or 5A) at 0° see the formula (Equation 1) from the previous section.
4. Set the current I2 (that is, connected to current input CTx) to the value calculated by the
formula (Equation 2) from the previous section.
5. Make sure there is enough current for fast open CT algorithm to operate, when the
current is disconnected later during testing, by checking that the value of the product I2
× CTprimx is bigger than the value of the product 1.1 × OCTOperLev
6. Set the phase angle of the current I2 as explained in the previous section.
7. Inject these two currents into the IED for approximately 5s. Observe that the differential
function shall be stable. Write down the service values for incoming and differential
currents for phase L1. Observe that the differential current should be very small.
8. Switch off the current I1 only (that is, set its magnitude back to 0A).
9. Check that open CT condition shall be detected by the IED, and the differential function
behavior shall be in accordance with the value of the parameter FastOCTOper.
10. Check that open CT alarm contacts operate accordingly to the scheme wiring.
11. Check that open CT information is stored in the event list (if connected).
12. Switch off the currents.
13. Reset the open CT blocking in the reset menu of the local HMI.
14. Check that open CT reset information is stored in the event list (if connected).
15. Repeat the same test procedure for the phases L2 and L3.
For open CT test two current inputs shall be always used. Similar to the previous section, the
test will be explained for CT1 and CTx (2 ≤ x ≤ Nmax).
The connections are shown for phase L1 only. Similar connection shall be used for testing
phase L2 and L3 also. The typical connection between the three-phase current test set and the
IED for this type of tests is shown in Figure 13.
Follow the following test instructions to perform the test on the operation of slow open CT
detection:
1. Connect the currents I1 and I2 from the three-phase test set test set to the current
terminals of CT1 and CTx inputs of the IED as shown in Figure 13.
2. Make sure that the current measurement from CT1 and CTx inputs are included into the
same differential zone (see the previous test instructions for more details).
3. Set the current I1 (that is, current connected to input CT1) to the nominal secondary value
(normally 1A or 5A) at 0°, see the formula (Equation 1).
4. Set the current I2(that is, connected to current input CTx) to the value calculate as
follows:
CTxratio CTprimx
I 2 0.85 CTsecx 0.85 CTsec1 ,
CT 1ratio CTprim1
IECEQUATION16067 V1 EN-US (Equation 3)
CTprimk
Where CTkratio CTseck , k 1 or x . The configuration parameter CTseck represents the
rated secondary current of the current input CTk, while the configuration parameter
CTprimk represents the rated primary current.
5. Make sure there is enough current for slow open CT algorithm to operate, when the
current is disconnected later during testing, by checking that the value of the product
0.15 × I2 × CTprim1 is bigger than the value of OCTOperLev. If not, increase the current
into CT1 input until this condition is satisfied and change the current into input CTx
accordingly.
6. Set the phase angle of the current I2, as explained in the previous sections.
7. Inject these two currents into the IED. Observe that the differential function shall be
stable. Write down the service values for incoming and differential currents for the phase
L1. Observe that the differential current should be approximately 15% of the incoming
current.
8. After pre-set time determined by parameter tSlow OCT, open CT condition shall be
detected by the IED. The differential function behavior shall be in accordance with the set
value of the parameter SlowOCTOper.
9. Check that open CT alarm contacts operate accordingly to the scheme wiring.
10. Check that open CT information is stored in the event list (if connected).
11. Switch off the currents.
12. Reset the open CT blocking in the reset menu of the local HMI.
13. Check that open CT reset information is stored in the event list (if connected).
14. Repeat the same test procedure for the phases L2 and L3.
Continue to test another function or end the test. Restore connections and settings to their
original values, if they were changed for testing purposes.
The trip circuits are tested as part of the secondary/primary injection test.
Check that the circuit breakers associated with the IED protection scheme operate when the
tripping outputs from the IEDs are activated. The trip outputs from the IEDs are conveniently
activated by secondary injection to activate a suitable protection function. Alternatively
Forcing of Binary Output Contacts from the IED under the Test Mode can be used.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Values of the logical signals for OC4PTOC are available on the local HMI under Main menu/
Tests/Function status/Current protection/PhaseOverCurrent4Step(51_67,4(3I>))/
OC4PTOC(51_67;4(3I>)):x, where x = instance number.
The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI.
1. Connect the test set for current injection to the appropriate IED phases.
If there is any configuration logic that is used to enable or block any of the four available
overcurrent steps, make sure that the step under test is enabled (for example, end fault
protection).
If 1 out of 3 currents are chosen for operation: Connect the injection current to phases L1
and neutral.
If 2 out of 3 currents are chosen for operation: Connect the injection current into phase L1
and out from phase L2.
If 3 out of 3 currents are chosen for operation: Connect the symmetrical three-phase
injection current into phases L1, L2 and L3.
2. Connect the test set for the appropriate three-phase voltage injection to the IED phases
L1, L2 and L3. The protection shall be fed with a symmetrical three-phase voltage.
3. Block higher set stages when testing lower set stages by following the procedure
described below:
3.1. Set the injected polarizing voltage larger than the set minimum polarizing voltage
(default is 5% of UBase) and set the injection current to lag the appropriate voltage
by an angle of about 80° if forward directional function is selected.
If 1 out of 3 currents are chosen for operation: The voltage angle of phase L1 is the
reference.
If 2 out of 3 currents are chosen for operation: The phase angle of the phase-to-
phase voltage L1L2 is the reference for L1Phase.
If 3 out of 3 currents are chosen for operation: The voltage angle of phase L1 is the
reference.
If reverse directional function is selected, set the injection current to lag the
polarizing voltage by an angle equal to 260° (equal to 80° + 180°).
3.2. Increase the injected current, note the operate value of the tested step of the
function and compare it to the set value.
3.3. Decrease the current slowly, note the reset value and compare it to the reset ratio
95%.
4. If the test has been performed by injection of current in phase L1, repeat the test,
injecting current into phases L2 and L3 with polarizing voltage connected to phases L2,
respectively L3 (1 out of 3 currents for operation).
5. If the test has been performed by injection of current in phases L1 – L2, repeat the test,
injecting current into phases L2 – L3 and L3 – L1 with the appropriate phase angle of
injected currents.
6. Connect a trip output contact to a timer.
7. Set the injected current to 200% of the operate level of the tested stage, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current for txMin.
8. Check that all operate and start contacts operate according to the configuration (signal
matrixes).
9. Reverse the direction of the injected current and check that the protection does not
operate.
10. If 2 out of 3 or 3 out of 3 currents are chosen for operation: Check that the function will
not operate with current in one phase only.
11. Repeat the above described tests for the higher set stages.
12. Check that start and trip information is stored in the event menu .
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in section "Requirements" and section
"Preparing for test" in this chapter.
Procedure
1. Connect the test set for appropriate current injection to the appropriate IED terminals.
If there is any configuration logic, which is used to enable or block any of 4 available
overcurrent steps, make sure that step under test is enabled (that is, end fault
protection).
2. Increase the injected current and note the operated value of the studied step of the
function.
3. Decrease the current slowly and note the reset value.
4. Block higher set stages when testing lower set stages according to below.
5. Connect a trip output contact to a timer.
6. Set the injected current to 200% of the operate level of the tested stage, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current for tmin.
7. Check that all trip and start contacts operate according to the configuration (signal
matrixes)
8. Repeat the above described tests for the higher set stages.
9. Finally check that start and trip information is stored in the event menu.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Values of the logical signals for D2PTOC are available on the local HMI under Main menu/
Tests/Function status/Current protection/ResidualOverCurr4Step(51N_67N,4(IN>))/
EF4PTOC(51N_67N;4(IN>)):x, where x = instance number.
The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI.
1. Connect the test set for single current injection to the appropriate IED terminals.
Connect the injection current to terminals L1 and neutral.
2. Set the injected polarizing voltage slightly larger than the set minimum polarizing voltage
(5% of Ur) and set the injection current to lag the voltage by an angle equal to the set
reference characteristic angle (AngleRCA), if the forward directional function is selected.
If reverse directional function is selected, set the injection current to lag the polarizing
voltage by an angle equal to RCA+ 180°.
3. Increase the injected current and note the value at which the studied step of the function
operates.
4. Decrease the current slowly and note the reset value.
5. If the test has been performed by injection of current in phase L1, repeat the test,
injecting current into terminals L2 and L3 with a polarizing voltage connected to
terminals L2, respectively L3.
6. Block lower set steps when testing higher set steps according to the instructions that
follow.
7. Connect a trip output contact to a timer.
8. Set the injected current to 200% of the operate level of the tested step, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current for txMin.
9. Check that all operate and start contacts operate according to the configuration (signal
matrixes)
10. Reverse the direction of the injected current and check that the step does not operate.
11. Check that the protection does not operate when the polarizing voltage is zero.
12. Repeat the above described tests for the higher set steps.
13. Finally, check that start and trip information is stored in the event menu.
1. Do as described in "Four step directional earth fault protection", but without applying
any polarizing voltage.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.
GUID-F7AA2194-4D1C-4475-8853-C7D064912614 v4
GUID-F973601F-BC67-4E4F-A4CA-BE6253E2FB92 v3
Procedure
1. Connect the test set for injection of three-phase currents and voltages to the
appropriate CT and VT inputs of the IED.
2. Inject pure negative sequence current, that is, phase currents with exactly same
magnitude, reversed sequence and exactly 120° phase displaced into the IED with an
initial value below negative sequence current pickup level. No output signals should be
activated. Check under NS4PTOC function Service Values that correct I2 magnitude is
measured by the function.
3. Set the injected negative sequence polarizing voltage slightly larger than the set
minimum polarizing voltage (default 5 % of Ub) and set the injection current to lag the
voltage by an angle equal to the set reference characteristic angle (180° - AngleRCA) if the
forward directional function is selected.
If reverse directional function is selected, set the injection current to lag the polarizing
voltage by an angle equal to RCA.
4. Increase the injected current and note the value at which the studied step of the function
operates.
5. Decrease the current slowly and note the reset value.
6. Block lower set steps when testing higher set steps according to the instructions that
follow.
7. Connect a trip output contact to a timer.
8. Set the injected current to 200% of the operate level of the tested step, switch on the
current and check the time delay.
For inverse time curves, check the operate time at a current equal to 110% of the operate
current in order to test parameter txmin.
9. Check that all operate and start contacts operate according to the configuration (signal
matrixes)
10. Reverse the direction of the injected current and check that the step does not operate.
11. Check that the protection does not operate when the polarizing voltage is zero.
12. Repeat the above-described tests for the higher set steps.
13. Finally, check that start and trip information is stored in the event menu.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
Wait 5 minutes to empty the thermal memory and set Time Constant 2 (Tau2) in
accordance with the setting plan.
15. Test with injection current 1.50 · IBase2 the thermal alarm level, the operate time for
tripping and the lockout reset in the same way as described for stage IBase1.
16. Finally check that start and trip information is stored in the event menu.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
The Breaker failure protection, 3-phase activation and output function CCRBRF should
normally be tested in conjunction with some other function that provides a start signal. An
external START signal can also be used.
To verify the settings in the most common back-up trip mode 1 out of 3, it is sufficient to test
phase-to-earth faults.
At mode 2 out of 4 the phase current setting, IP> can be checked by single-phase injection
where the return current is connected to the summated current input. The value of residual
(earth fault) current IN set lower than IN> is easiest checked in back-up trip mode 1 out of 4.
10.4.6.1 Checking the phase current operate value, IP> M12104-23 v14
1. Apply the fault condition, including START of CCRBRF, with a current below the set IP>.
2. Repeat the fault condition and increase the current in steps until a trip occurs. Note that
the START signal shall be re-applied for each new current value.
3. Compare the result with the set IP>.
If RetripMode = Off and FunctionMode = Current is set, only backup trip can be
used to check set IP>.
10.4.6.2 Checking the residual (earth fault) current operate value IN> set below
IP> M12104-80 v10
Check the low set IN> current where setting FunctionMode = Current and setting BuTripMode
= 1 out of 4
1. Apply the fault condition, including START of CCRBRF, with a current just below set IN>.
2. Repeat the fault condition and increase the current in steps until trip appears. Note that
the START signal shall be re-applied for each new current value.
3. Compare the result with the set IN>.
4. Disconnect AC and START input signals.
The check of the set times can be made in connection with the check of operate values above.
Choose the applicable function and trip mode, such as FunctionMode = Current and
RetripMode = UseFunctionMode.
1. Apply the fault condition, including start of CCRBRF, well above the set current value.
Measure the time from START of CCRBRF.
2. Check the re-trip t1 and back-up trip times t2 and t3.
In applicable cases, the back-up trip for multi-phase start t2MPh and back-up trip 2, t2
and t3 can also be checked. To check t2MPh, a two-phase or three-phase start shall be
applied.
1. Apply the fault condition, including start of CCRBRF, with phase current well above set
value IP>.
2. Interrupt the current, with a margin before back-up trip time, t2. It may be made at issue
of re-trip command.
3. Check that re-trip is achieved, if selected, but no back-up trip is obtained.
The normal mode BuTripMode = 1 out of 3 should have been verified in the tests above. In
applicable cases the modes 1 out of 4 and 2 out of 4 can be checked. Choose the mode below,
which corresponds to the actual case.
Applies in a case where a signal from CB supervision function regarding CB being faulty and
unable to trip is connected to input CBFLT.
1. Repeat the check of back-up trip time. Disconnect current and START input signals.
2. Activate the input CBFLT. The output CBALARM (CB faulty alarm) should appear after set
time tCBAlarm. Keep the input activated.
3. Apply the fault condition, including start of CCRBRF, with current above set current value.
4. Verify that back-up trip is obtained without intentional delay, for example within 20ms
from application of start.
Checking the case with fault current above set value IP> M12104-241 v8
The operation shall be as in RetripMode = UseFunctionMode.
Checking the case with fault current below set value I>BlkCBPos M12104-281 v11
The case shall simulate a case where the fault current is very low and operation will depend on
CB position signal from CB auxiliary contact. It is suggested that retrip without current check
is used, setting RetripMode = UseFunctionMode Check.
10.4.6.10 Verifying the external start signal has timed out GUID-754108D4-E440-4F8F-917B-04579EC1C2C7 v1
10.4.6.11 Verifying that backup signal is released when STALARM is reset GUID-49CA34B6-5AE9-4E45-9F4E-33DA5F626209 v1
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
The parameters for the Breaker failure protection, single phase version CCSRBRF are set via
the local HMI or PCM600.
The breaker failure protection, single phase version function CCSRBRF must be tested in
combination with some other function that provides a START signal. An external START signal
can also be used.
CCSRBRF has to be set and configured before the testing can start. CCSRBRF is highly flexible
in that it permits a choice of functional and tripping modes. The various modes are checked at
the factory as part of the design verification. In certain cases only modes with a high
probability of coming into operation need to be checked, in order to verify the configuration
and settings.
Testing requirements
• Calculated settings
• Valid configuration diagram for the IED
• Valid terminal diagram for the IED
• Technical reference manual
• Single phase test equipment
The technical reference manual contains application and functionality summaries, function
blocks, logic diagrams, input and output signals, a list of setting parameters and technical
data for the function.
The test equipment should be able to provide a single phase supply of currents. The
magnitude of currents should be possible to vary.
Make sure the IED is prepared for test before starting the test session. Consider the logic
diagram of the function when performing the test. The response from a test can be viewed in
different ways:
Procedure
1. Apply the fault condition, including START of CCSRBRF, with a current value below set
IP>.
2. Repeat the fault condition and increase the current in steps until a trip occurs.
3. Compare the result with the set IP>.
4. Disconnect the AC and start input signals.
The check of the set times can be made in connection with the check of operate values above.
Choose the applicable function and trip mode, such as FunctMode = Current and RetripMode =
UseFunctionMode.
Procedure
1. Apply the fault condition, including START of CCSRBRF, well above the set current value.
2. Measure time from Start of CCSRBRF.
3. Check the re-trip t1 and back-up trip times t2 and t3.
4. Disconnect AC and start input signals.
Choose the mode below, which corresponds to the actual case. In the cases below it is
assumed that FunctionMode = Current is selected.
Procedure
1. Apply the fault condition, including START of CCSRBRF, with phase current well above set
value IP>.
2. Arrange switching the current off, with a margin before back-up trip time, t2. It may be
made at issue of re-trip command.
3. Check that re-trip is achieved, if selected, but no back-up trip.
4. Disconnect AC and start input signals.
Applies in a case where a signal from CB supervision function regarding CB being faulty and
unable to trip is connected to input CBFLT.
Procedure
1. Repeat the check of back-up trip time. Disconnect current and START input signals.
2. Activate the input CBFLT. The output CBALARM (CB faulty alarm) should appear after set
time tCBAlarm. Keep the input activated.
3. Apply the fault condition, including START of CCSRBRF, with current above set current
value.
4. Verify that back-up trip is obtained without intentional delay, for example, within 20ms
from application of START.
5. Disconnect injected AC and input signals.
Checking the case with fault current above set value IP> GUID-91453035-A2A6-42EF-B580-D2AA1C4A8810 v1
The operation shall be as in RetripMode = UseFunctionMode.
Procedure
Checking the case with fault current below set value I>BlkCBPos GUID-2CB55012-14AE-4243-B5ED-0959FA3CB39E v1
The case shall simulate a case where the fault current is very low and operation will depend on
CB position signal from CB auxiliary contact. It is suggested that retrip without current check
is used, setting RetripMode = UseFunctionMode Check.
Procedure
10.4.7.8 Verifying the external start signal has timed out GUID-754108D4-E440-4F8F-917B-04579EC1C2C7 v1
10.4.7.9 Verifying that backup signal is released when STALARM is reset GUID-49CA34B6-5AE9-4E45-9F4E-33DA5F626209 v1
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
The underpower protection shall be set to values according to the real set values to be used.
The test is made by means of injection of voltage and current where the amplitude of both
current and voltage and the phase angle between the voltage and current can be controlled.
During the test, the analog outputs of active and reactive power shall be monitored.
1. Connect the test set for injection of voltage and current corresponding to the mode to
be used in the application. If a three-phase test set is available this could be used for all
the modes. If a single-phase current/voltage test set is available the test set should be
connected to a selected input for one-phase current and voltage.
Arone
S = U L1L 2 × I L1* - U L 2 L 3 × I L 3*
EQUATION1698 V1 EN-US (Equation 5)
PosSeq
S = 3 × U PosSeq × I PosSeq*
EQUATION1699 V1 EN-US (Equation 6)
L2L3
S = U L 2 L 3 × ( I L 2* - I L 3* )
EQUATION1701 V1 EN-US (Equation 8)
L3L1
S = U L 3 L1 × ( I L 3* - I L1* )
EQUATION1702 V1 EN-US (Equation 9)
L1
S = 3 × U L1 × I L1*
EQUATION1703 V1 EN-US (Equation 10)
L2
S = 3 × U L 2 × I L 2*
EQUATION1704 V1 EN-US (Equation 11)
L3
S = 3 × U L 3 × I L 3*
EQUATION1705 V1 EN-US (Equation 12)
2. Adjust the injected current and voltage to the set values in % of IBase and UBase
(converted to secondary current and voltage). The angle between the injected current
and voltage shall be set equal to the set direction Angle1, angle for stage 1 (equal to 0° for
low forward power protection and equal to 180° for reverse power protection). Check
that the monitored active power is equal to 100% of rated power and that the reactive
power is equal to 0% of rated power.
3. Change the angle between the injected current and voltage to Angle1 + 90°. Check that
the monitored active power is equal to 0% of rated power and that the reactive power is
equal to 100% of rated power.
4. Change the angle between the injected current and voltage back to 0°. Decrease the
current slowly until the START1 signal, start of stage 1, is activated.
5. Increase the current to 100% of IBase.
6. Switch the current off and measure the time for activation of TRIP1, trip of stage 1.
7. If a second stage is used, repeat steps 2 to 6 for the second stage.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
The overpower protection shall be set to values according to the real set values to be used. The
test is made by means of injection of voltage and current where the amplitude of both current
and voltage and the phase angle between the voltage and current can be controlled. During the
test the analog outputs of active and reactive power shall be monitored.
1. Connect the test set for injection of voltage and current corresponding to the mode to
be used in the application. If a three phase test set is available this could be used for all
the modes. If a single phase current/voltage test set is available the test set should be
connected to a selected input for one phase current and voltage.
2. Adjust the injected current and voltage to the set rated values in % of IBase and UBase
(converted to secondary current and voltage). The angle between the injected current
and voltage shall be set equal to the set direction Angle1, angle for stage 1 (equal to 0° for
low forward power protection and equal to 180° for reverse power protection). Check
that the monitored active power is equal to 100% of rated power and that the reactive
power is equal to 0% of rated power.
3. Change the angle between the injected current and voltage to Angle1 + 90°. Check that
the monitored active power is equal to 0% of rated power and that the reactive power is
equal to 100% of rated power.
4. Change the angle between the injected current and voltage back to Angle1 value. Increase
the current slowly from 0 until the START1 signal, start of stage 1, is activated. Check the
injected power and compare it to the set value Power1, power setting for stage 1 in % of
Sbase.
5. Increase the current to 100% of IBase and switch the current off.
6. Switch the current on and measure the time for activation of TRIP1, trip of stage 1.
7. If a second stage is used, repeat steps 2 to 6 for the second stage.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.
In this section it is shown how to test the capacitor bank protection function CBPGAPC for
application on a 50Hz, 200MVAr, 400kV SCB with 500/1A ratio CT.
Note that such SCB is shown in the application manual for this function. The
same procedure can be used to test SCB with some other rating and different
CT ratio.
As calculated in the application manual the base current for this particular SCB will be 289A on
the primary side and 0.578A on the CT secondary side. Before any testing is commenced make
sure that setting IBase for this function is set to 289A (that is, setting for the base current
corresponds to the rated current of the protected SCB). It will be also assumed that all other
settings have values as shown in the setting example in the application manual for this SCB.
Test equipment
Connect the secondary test set to the CT inputs on the IED dedicated for the SCB currents.
Single- or three-phase test equipment can be used but it may be required to have facility to
vary the frequency of the injected current signal(s).
1. Inject SCB rated current (that is, 0.587A at 50Hz for this SCB) in at least one phase
(preferably perform this test with three phase injection).
2. After couple of seconds stop injection of all currents (that is, set all currents back to 0A).
3. Check that function binary output signal RECNINH is set to logical 1 and that only resets
after the set time under parameter tReconnInhibit (for example 300s for this SCB) has
expired.
4. If this binary signal is used to prevent CB closing make sure that it is properly connected/
wired into the CB closing circuit.
Note that during testing the overcurrent feature the harmonic voltage overload
feature or reactive power overload feature may also give start and operate
signals depending on their actual settings. Therefore it is best to switch them
off during this test.
1. Inject current 20% bigger than the set overcurrent pickup level under setting parameter
IOC> (for example, 1.2 · 1.35 · 0.587A = 0951A at 50Hz for this SCB) in phase L1 only.
2. Check that function binary output signals STOCL1 and STOC are set to one.
3. Check that function binary output signals TROC and TRIP are set to one after the set time
under parameter tOC (that is, 30s for this SCB) has expired.
4. If any of these signals are used for tripping, signaling and/or local/remote indication
check that all relevant contacts and LEDs have operated and that all relevant GOOSE
messages have been sent.
5. Check that service value from the function for current in phase L1, on the local HMI under
Main menu/Test is approximately 476A (that is, 0.951A · (500/1) = 476A).
6. Stop injection of all currents (that is, set all currents back to 0A).
7. Check that all above mentioned function binary output signals now have logical value
zero.
8. Repeat above steps 1-7 for phase L2 and phase L3.
Note that the operation of this feature is based on current peak value. That
means that this overcurrent function is also able to operate for the same
current magnitude but for different injected frequencies. If required repeat this
injection procedure for example for the 3rd harmonic by just simply injecting 3 ·
50 = 150Hz currents with the same magnitude. Obtain results shall be the
same.
1. Inject SCB rated current (that is, 0.587A at 50Hz for this SCB) in all three phases.
2. Lower phase L1 current 10% under the set value for setting parameter IUC< (that is, 0.9 ·
0.7 · 0.587A = 0.370A at 50Hz for this SCB).
3. Check that function binary output signals STUCL1 and STUC are set to one.
4. Check that function binary output signals TRUC and TRIP are set to one after the set time
under parameter tUC (for example, 5s for this SCB) has expired.
5. If any of these signals are used for tripping, signaling and/or local/remote indication
check that all relevant contacts and LEDs have operated and that all relevant GOOSE
messages have been sent.
6. Check that service value from the function for current in phase L1, on the local HMI under
Main menu/Test is approximately 185A (that is, 0.370A · (500/1) = 185A).
7. Stop injection of all currents (that is, set all currents back to 0A).
8. Check that all above mentioned function binary output signals now have logical value
zero because they will be automatically blocked by operation of built-in reconnection
inhibit feature.
9. Repeat above steps 1-8 for phase L2 and phase L3.
Note that during testing the reactive power overload feature the harmonic
voltage overload feature or overcurrent feature may also give start and operate
signals depending on their actual settings. Therefore it is recommended to
switch them off during this test.
1. Inject current equal to the set reactive power overload pickup level under setting
parameter QOL> (that is, 1.3 · 0.587A = 0.763A at 50Hz for this SCB) in phase L1 only.
2. Check that function binary output signals STQOLL1 and STQOL are set to one.
3. Check that function binary output signals TRQOL and TRIP are set to one after the set
time under parameter tQOL (for example, 60s for this SCB) has expired.
4. If any of these signals are used for tripping, signaling and/or local/remote indication
check that all relevant contacts and LEDs have operated and that all relevant GOOSE
messages have been sent.
5. Check that service value from the function for current in phase L1, on the local HMI under
Main menu/Test is approximately 382A (that is, 0.763A · (500/1) = 382A).
6. Check that service value from the function for reactive power in phase L1, on the local
HMI under Main menu/Test is approximately 169% (that is, 1.3 · 1.3 = 1,69pu = 169%).
7. Stop injection of all currents (that is, set all currents back to 0A).
8. Check that all above mentioned function binary output signals now have logical value
zero.
9. Repeat above steps 1 - 8 for phase L2 and phase L3.
Note that operation of this feature is based on injected current and internally
calculated true RMS values. That means that this feature is also able to operate
for current signals with varying frequency. However due to relatively complex
calculation procedure it is recommended to do secondary tests only with
fundamental frequency current signals.
The following formula can be used to calculate SCB reactive power in per-unit system when
current with different frequency from the rated frequency is injected.
f rated
Q [ pu ] = ×I [ pu ]
2
f injected
EQUATION2273 V1 EN-US (Equation 13)
Note that during testing the harmonic voltage overload feature the reactive
power overload feature or overcurrent feature may also give start and operate
signals depending on their actual settings. Therefore it is recommended to
switch them off during this test.
The following points on the inverse curve are defined per relevant IEC/ANSI standards for time
multiplier value set to kHOLIDMT=1.0
GUID-FECBCAD4-16CE-4EFC-9869-9F6D98E2F721 v2
Here will be shown how to test the fourth point from the above table. Other points can be
tested in the similar way:
1. Inject 140% of the base current (that is, 1.4 · 0.587A = 0.822A at 50Hz for this SCB) in
phase L1only.
2. Check that function binary output signals STHIDML1 and STHOL are set to one.
3. Check that function binary output signals TRHOL and TRIP are set to one after the
expected time (for example, 15s for this voltage level in accordance with the above table)
has expired.
4. If any of these signals are used for tripping, signaling and/or local/remote indication,
check that all relevant contacts and LEDs have operated and that all relevant GOOSE
messages have been sent.
5. Check that service value for current in phase L1, on the local HMI under Main menu/Test
is approximately 411A (that is, 0.822A · (500/1) = 411A).
6. Check that service value for voltage across SCB in phase L1, on the local HMI under Main
menu/Test is approximately 140%.
7. Stop injection of all currents (that is, set all currents back to 0A).
8. Check that all above mentioned function binary output signals now have logical value
zero.
9. Repeat above steps 1 - 8 for phase L2 and phase L3.
10. Repeat above steps 1 - 8 to test different points from the above table.
Operation of this feature is based on internally calculated peak RMS voltage value. That means
that this feature is also able to operate for current signals with varying frequency. Note that
for the fundamental frequency injection, internally calculated voltage in percent corresponds
directly to the injected current value given in percent. However if it is required to test IDMT
characteristic with a varying frequency, the magnitude of the injected current must be
adjusted accordingly. The following formula can be used to calculate required current RMS
value in percent at the desired injection frequency in order to archive voltage percentage value
given in the above table:
finjected
I inj [ % ] = ×U [%]
f rated
EQUATION2274 V1 EN-US (Equation 14)
Above procedure can also be used to test definite time step. Pay attention that IDMT step can
also operate during such injection. Therefore make sure that appropriate settings are entered
in order to insure correct test results for definite time step.
Continue to test another functions or end the test by changing the Test mode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes. Make sure that all built-in features for this function, which shall be in operation, are
enabled and with correct settings.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
Verification of start value and time delay to operate for Step 1 M13796-29 v10
1. Check that the IED settings are appropriate, especially the START value, the definite time
delay and the 1 out of 3 operation mode.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the voltage in one of the phases, until the START signal appears.
4. Note the operate value and compare it with the set value.
U1 < VT sec
× UBase ×
100 VTprim
IECEQUATION2431 V1 EN-US (Equation 16)
5. Increase the measured voltage to rated load conditions.
6. Check that the START signal resets.
7. Instantaneously decrease the voltage in one phase to a value about 20% lower than the
measured operate value.
8. Measure the time delay for the TRIP signal, and compare it with the set value.
9. Check the inverse time delay by injecting a voltage corresponding to 0.8 × U1<.
For example, if the inverse time curve A is selected, the trip signals TR1
and TRIP operate after a time corresponding to the equation:
k1
t (s ) =
U
1 − U1 <
IECEQUATION2428 V1 EN-US (Equation 17)
where:
t(s) Operate time in seconds
k1 Settable time multiplier of the function for step 1
U Measured voltage
U1< Set start voltage for step 1
For example, if the measured voltage jumps from the rated value to 0.8 times the set
start voltage level and time multiplier k1 is set to 0.05 s (default value), then the TR1 and
TRIP signals operate at a time equal to 0.250 s ± tolerance.
10. The test above can be repeated to check the inverse time characteristic at different
voltage levels.
11. Repeat the above described steps for Step 2 of the function.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
Verification of single-phase voltage and time delay to operate for Step 1 M13806-50 v9
U1 > VT sec
× UBase ×
100 VTprim
IECEQUATION2427 V1 EN-US (Equation 19)
4. Decrease the voltage slowly and note the reset value.
5. Set and apply about 20% higher voltage than the measured operate value for one phase.
6. Measure the time delay for the TR1 signal and compare it with the set value.
7. Check the inverse time delay by injecting a voltage corresponding to 1.2 × U1>.
8. Repeat the test to check the inverse time characteristic at different over-voltage levels.
9. Repeat the above described steps for Step 2 of the function.
1. The tests above can be repeated for 2 out of 3 and for 3 out of 3 operation mode.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
For example, if the inverse time curve A is selected, the trip signals TR1
and TRIP operate after a time corresponding to the equation:
k1
t (s ) =
U
U1 > − 1
IECEQUATION2429 V1 EN-US (Equation 20)
where:
t(s) Operate time in seconds
k1 Settable time multiplier of the function for step 1
U Measured voltage
U1> Set start voltage for step 1
8. Repeat the test for Step 2 of the function.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and section
"Preparing for test" in this chapter.
1. Connect voltages to the IED according to valid connection diagram and figure 14.
2. Apply voltage higher than the highest set value of UDTrip, U1Low and U2Low to the U1
three-phase inputs and to one phase of the U2 inputs according to figure 14.
The voltage differential START signal is set.
UL1 UL1
UL3 UL3
IED
UN UN
UL1
UL2 2
UL3
IEC07000106-1-en.vsd
IEC07000106 V2 EN-US
Figure 14: Connection of the test set to the IED for test of U1 block level
where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)
3. Decrease slowly the voltage in phase UL1 of the test set until the START signal resets.
4. Check U1 blocking level by comparing the voltage level at reset with the set undervoltage
blocking U1Low.
5. Repeat steps 2 to 4 to check U1Low for the other phases.
1. Connect voltages to the IED according to valid connection diagram and figure 15.
UL1 UL1
UL3 UL3
IED
UN UN
UL1
UL2 2
UL3
IEC07000107-1-en.vsd
IEC07000107 V2 EN-US
Figure 15: Connection of the test set to the IED for test of U2 block level
where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)
2. Apply voltage higher than the highest set value of UDTrip, U1Low and U2Low to the U1
three-phase inputs and to one phase of the U2 inputs according to figure 15.
The voltage differential START signal is set.
3. Decrease slowly the voltage in phase UL3 of the test set until the START signal resets.
4. Check U2 blocking level by comparing the voltage level at reset with the set undervoltage
blocking U2Low.
Procedure
1. Connect voltages to the IED according to valid connection diagram and figure 16.
UL1 UL1
UL3 UL3
IED
UN UN
UL1
UL2 2
UL3
IEC07000108-1-en.vsd
IEC07000108 V2 EN-US
Figure 16: Connection of the test set to the IED for test of alarm levels, trip levels
and trip timer
where:
1 is three-phase voltage group1 (U1)
2 is three-phase voltage group2 (U2)
4. Check the alarm operation level by comparing the differential voltage level at ALARM with
the set alarm level UDAlarm.
5. Continue to slowly decrease the voltage until START signal is activated.
6. Check the differential voltage operation level by comparing the differential voltage level
at START with the set trip level UDTrip.
7. Repeat steps 1 to 6 to check the other phases.
Observe that the connections to U1 must be shifted to test another phase. (UL1 to UL2,
UL2 to UL3, UL3 to UL1)
Procdure
1. Connect voltages to the IED according to valid connection diagram and figure 16.
2. Set Ur (rated voltage) to the U1 inputs and increase U2 voltage until differential voltage is
1.5 · operating level (UDTrip).
3. Switch on the test set. Measure the time from activation of the START signal until TRIP
signal is activated.
4. Check the measured time by comparing it to the set trip time tTrip.
5. Increase the voltage until START signal resets. Measure the time from reset of START
signal to reset of TRIP signal.
6. Check the measured time by comparing it to the set trip reset time tReset.
Procedure
1. With the protection in test mode, view the differential voltage service values in each
phase on the local HMI under Main menu/Test/Function status/Voltage protection/
VoltageDiff(PTOV,60)/VDCPTOV:x.
The IED voltage inputs should be connected to the VTs according to valid
connection diagram.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
1. Check that the input logical signals BLOCK, CBOPEN and VTSU are logical zero.
2. Supply a three-phase rated voltage in all three phases and note on the local HMI that the
TRIP logical signal is equal to the logical 0.
3. Switch off the voltage in all three phases.
After set tTrip time a TRIP signal appears on the corresponding binary output or on the
local HMI.
Note that TRIP at this time is a pulse signal, duration should be according
to set tPulse.
4. Inject the measured voltages at rated values for at least set tRestore time.
5. Activate the CBOPEN binary input.
6. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
7. Inject the measured voltages at rated values for at least set tRestore time.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
1. Check that the IED settings are appropriate, for example the start value and the time
delay.
2. Supply the IED with three-phase voltages at their rated values and initial frequency.
The initial frequency is calculated using Equation 21.
1. Check that the IED settings are appropriate, for example the StartFrequency, UMin , and
the tDelay.
2. Supply the IED with three-phase voltages at rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the set value UMin.
5. Slowly decrease the frequency of the applied voltage, to a value below StartFrequency.
6. Check that the START signal does not appear.
7. Wait for a time corresponding to tDelay, make sure that the TRIP signal does not appear.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
1. Check that the IED settings are appropriate, for example the start value and the time
delay.
2. Supply the IED with three-phase voltages at their rated values and initial frequency.
3. Slowly increase the frequency of the applied voltage with a 40 mHz step, applying it for a
period that is 10% longer than tDelay.
4. Note the operate value and compare it with the set value.
5. Decrease the frequency to rated operating conditions.
6. Check that the START signal resets.
7. Set the frequency to 20 mHz under the operate value.
8. Increase the frequency with a 40 mHz step, applying it for a period that is 10% longer
than tDelay.
9. Measure the time delay for the TRIP signal, and compare it with the set value. Note that
the measured time consists of the set value for time delay plus minimum operate time of
the start function (80 - 90 ms).
1. Check that the settings in the IED are appropriate, for example the StartFrequency and
the tDelay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the set value.
5. Slowly increase the frequency of the applied voltage, to a value above StartFrequency.
6. Check that the START signal does not appear.
7. Wait for a time corresponding to tDelay, make sure that the TRIP signal does not appear.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
1. Check that the settings in the IED are appropriate, especially the START value and the
definite time delay. Set StartFreqGrad, to a rather small negative value.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the frequency of the applied voltage, with an increasing rate-of-change
that finally exceeds the setting of StartFreqGrad, and check that the START signal
appears.
4. Note the operate value and compare it with the set value.
5. Increase the frequency to rated operating conditions, and zero rate-of-change.
6. Check that the START signal resets.
7. Instantaneously decrease the frequency of the applied voltage to a value about 20%
lower than the nominal value.
8. Measure the time delay for the TRIP signal, and compare it with the set value.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
One of the facilities within the general current and voltage protection function CVGAPC is that
the value, which is processed and used for evaluation in the function, can be chosen in many
different ways by the setting parameters CurrentInput and VoltageInput.
These setting parameters decide what kind of preprocessing the connected three-phase CT
and VT inputs shall be subjected to. That is, for example, single-phase quantities, phase-to-
phase quantities, positive sequence quantities, negative sequence quantities, maximum
quantity from the three-phase group, minimum quantity from the three-phase group,
difference between maximum and minimum quantities (unbalance) can be derived and then
used in the function.
Due to the versatile possibilities of CVGAPC itself, but also the possibilities of logic
combinations in the application configuration of outputs from more than one CVGAPC
function block, it is hardly possible to define a fully covering general commissioning test.
Procedure
The current restraining value has also to be measured or calculated and the influence on the
operation has to be calculated when the testing of the operate value is done.
Procedure
Procedure
1. Connect the test set for injection of three-phase currents and three-phase voltages to
the appropriate current and voltage terminals of the IED.
2. Inject current(s) and voltage(s) in a way that relevant measured (according to setting
parameter CurrentInput and VoltageInput) currents and voltages are created from the
test set.
Overall check in principal as above (non-directional overcurrent feature)
3. Operate value measurement
The relevant voltage restraining value (according to setting parameter VoltageInput) has
also to be injected from the test set and the influence on the operate value has to be
calculated when testing of the operate value is done.
4. Operate time measurement
Definite times may be tested as above (non-directional overcurrent feature). For inverse
time characteristics the START value (to which the overcurrent ratio has to be calculated)
is the actual pickup value as got with actual restraining from the voltage restraining
quantity.
Please note that the directional characteristic can be set in two different ways either just
dependent on the angle between current and polarizing voltage (setting parameter
DirPrinc_OC1 or DirPrinc_OC2 set to or in a way that the operate value also is dependent on the
angle between current and polarizing voltage according to the I · cos(F) law (setting
parameter DirPrinc_OC1 or DirPrinc_OC2 set to I · cos(F). This has to be known if a more
detailed measurement of the directional characteristic is made, than the one described below.
Procedure
1. Connect the test set for injection of three-phase currents and three-phase voltages to
the appropriate current and voltage terminals of the IED.
2. Inject current(s) and voltage(s) in a way that relevant measured (according to setting
parameter CurrentInput and VoltageInput) currents and voltages are created from the
test set.
3. Set the relevant measuring quantity current to lag or lead (lag for negative RCA angle and
lead for positive RCA angle) the relevant polarizing quantity voltage by an angle equal to
the set IED characteristic angle (rca-dir) when forward directional feature is selected and
the CTstarpoint configuration parameter is set to ToObject.
If reverse directional feature is selected or CTstarpoint configuration parameter is set to
FromObject, the angle between current and polarizing voltage shall be set equal to rca-
dir+180°.
4. Overall check in principal as above (non-directional overcurrent feature)
5. Reverse the direction of the injection current and check that the protection does not
operate.
6. Check with low polarization voltage that the feature becomes non-directional, blocked or
with memory according to the setting.
Procedure
1. Connect the test set for injection three-phase voltages to the appropriate voltage
terminals of the IED.
2. Inject voltage(s) in a way that relevant measured (according to setting parameter
VoltageInput) voltages are created from the test set.
3. Overall check in principal as above (non-directional overcurrent feature) and
correspondingly for the undervoltage feature.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
The verification is divided in two main parts. The first part is common to all fuse failure
supervision options, and checks that binary inputs and outputs operate as expected according
to actual configuration. In the second part the relevant set operate values are measured.
10.8.1.1 Checking that the binary inputs and outputs operate as expected M1405-9 v8
1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Connect the nominal dc voltage to the DISCPOS binary input.
• The signal BLKU should appear with almost no time delay.
• The signals BLKZ and 3PH should not appear on the IED.
• Only the distance protection function can operate.
• Undervoltage-dependent functions must not operate.
3. Disconnect the dc voltage from the DISCPOS binary input terminal.
4. Connect the nominal dc voltage to the MCBOP binary input.
• The BLKUand BLKZ signals should appear without any time delay.
• All undervoltage-dependent functions must be blocked.
5. Disconnect the dc voltage from the MCBOP binary input terminal.
6. Disconnect one of the phase voltages and observe the logical output signals on the
binary outputs of the IED.
BLKU and BLKZ signals should appear simultaneously wether the BLKU and BLKZ reset
depends on the setting SealIn “on” or “off”. If “on” no reset, if “off” reset.
7. After more than 5 seconds disconnect the remaining two-phase voltages and all three
currents.
• There should be no change in the high status of the output signals BLKU and BLKZ.
• The signal 3PH will appear.
8. Establish normal voltage and current operating conditions simultaneously and observe
the corresponding output signals.
They should change to logical 0 as follows:
10.8.1.2 Measuring the operate value for the negative sequence function M1405-46 v12
Measure the operate value for the negative sequence function, if included in the IED.
1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Slowly decrease the measured voltage in one phase until the BLKU signal appears.
3. Record the measured voltage and calculate the corresponding negative-sequence voltage
according to the equation (observe that the voltages in the equation are phasors):
3 ⋅ U 2 = U L1 + a 2 ⋅ U L2 + a ⋅ U L3
EQUATION707 V2 EN-US (Equation 22)
Where:
are the measured phase voltages
UL1 , U L 2 and U L3
IEC00000275 V1 EN-US
2 ×p
j 3
a = 1× e 3
= -0,. 5 + j
2
IECEQUATION00022 V2 EN-US
4. Compare the result with the set value of the negative-sequence operating voltage
(consider that the set value 3U2> is in percentage of the base voltage UBase).
5. Repeat steps 1 and 2. Then slowly increase the measured current in one phase until the
BLKU signal disappears.
6. Record the measured current and calculate the corresponding negative-sequence current
according to the equation (observe that the currents in the equation are phasors):
3 × I 2 = I L1 + a × I L 2 + a × I L 3
2
Where:
are the measured phase currents
I L1 , I L 2 and I L 3
IECEQUATION00020 V1 EN-US
2 ×p
j 3
a = 1× e 3
= -0,. 5 + j
2
IECEQUATION00022 V2 EN-US
7. Compare the result with the set value of the negative-sequence operating current.
Consider that the set value 3I2< is in percentage of the base current IBase.
10.8.1.3 Measuring the operate value for the zero-sequence function M1405-72 v11
Measure the operate value for the zero-sequence function, if included in the IED.
1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Slowly decrease the measured voltage in one phase until the BLKU signal appears.
3. Record the measured voltage and calculate the corresponding zero-sequence voltage
according to the equation (observe that the voltages in the equation are phasors):
3 × U0 = U L1 + UL2 + U L3
IEC00000276 V1 EN-US (Equation 24)
Where:
UL1 , U L2 and U L3
are the measured phase voltages
IEC00000275 V1 EN-US
4. Compare the result with the set value of the zero-sequence operating voltage (consider
that the set value 3U0> is in percentage of the base voltage.)
5. Repeat steps 1 and 2. Then slowly increase the measured current in one phase until the
BLKU signal disappears.
6. Record the measured current and calculate the corresponding zero-sequence current
according to the equation (observe that the currents in the equation are phasors):
3 × I 0 = I L1 + I L2 + I L3
IECEQUATION00019 V1 EN-US (Equation 25)
Where:
are the measured phase currents
I L1 , I L 2 and I L 3
IECEQUATION00020 V1 EN-US
7. Compare the result with the set value of the zero-sequence operate current. Consider
that the set value 3I0< is in percentage of the base current IBase.
10.8.1.4 Measuring the operate value for the dead line detection function GUID-4ABF1FD4-F6D3-4109-AFE5-552875E558A0 v4
1. Apply three-phase voltages with their rated value and zero currents.
2. Decrease the measured voltage in one phase until the DLD1PH signal appears.
3. This is the point at which the dead line condition is detected. Check the value of the
decreased voltage with the set value UDLD< (UDLD< is in percentage of the base voltage
UBase).
4. Apply three-phase currents with their rated value and zero voltages.
5. Decrease the measured current in one phase until the DLD1PH signal appears.
6. This is the point at which the dead line condition is detected. Check the value of the
decreased current with the set value IDLD< (IDLD< is in percentage of the base current
IBase).
10.8.1.5 Checking the operation of the du/dt and di/dt based function M1405-96 v12
Check the operation of the du/dt and di/dt based function if included in the IED.
1. Simulate normal operating conditions with the three-phase currents in phase with their
corresponding phase voltages and with all of them equal to their rated values.
2. Change the voltages and currents in all three phases simultaneously.
The voltage change must be higher than the set value DU> and the current change must
be lower than the set value DI<.
• The BLKU and BLKZ signals appear without any time delay. The BLKZ signal will be
activated only if the internal deadline detection is not activated at the same time.
• 3PH should appear after 5 seconds, if the remaining voltage levels are lower than
the set UDLD< of the dead line detection function.
3. Apply normal conditions as in step 1.
The BLKU, BLKZ and 3PH signals should reset, if activated, see step 1 and 2.
4. Change the voltages and currents in all three phases simultaneously.
The voltage change must be higher than the set value DU> and the current change must
be higher than the set value DI<.
The BLKU, BLKZ and 3PH signals should not appear.
5. Repeat step 2.
6. Connect the nominal voltages in all three phases and feed a current below the operate
level in all three phases.
7. Keep the current constant. Disconnect the voltage in all three phases simultaneously.
The BLKU, BLKZ and 3PH signals should not appear.
8. Change the magnitude of the voltage and current for phase 1 to a value higher than the
set value DU> and DI<.
9. Check that the start output signals STDUL1 and STDIL1 and the general start signals
STDU or STDI are activated.
10. Check that the start output signals for the current and voltage phases 2 and 3 are
activated by changing the magnitude of the voltage and current for phases 2 and 3.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
GUID-004BFFE4-B1C1-4C0E-8D7A-ABE7B566AB28 v2
4. Set SealIn to On, UD>MainBlock to 20% of UBase and USealIn to 70% of UBase.
5. Apply three-phase voltages with the value slightly below USealIn level.
6. Decrease one of the three-phase voltages on main fuse group. The voltage change must
be greater than the set value for Ud>MainBlock. MAINFUF signal is activated.
7. After more than 5 seconds increase the measured voltage back to the value slightly below
USealIn level. MAINFUF signal should not reset.
8. Slowly increase measured voltage to the value slightly above USealIn until MAINFUF signal
resets.
9. Record the measured voltage and compare with the set value USealIn.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Make sure that the function is connected to SMAI function with U3P signal.
Delta supervision function has 6 different modes of operation. Proceed as follows to test the
function in a particular mode.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Make sure that the function is connected to SMAI function with I3P signal.
Delta supervision function has four different modes of operation. Proceed as follows to test
the function in a particular mode.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Make sure that the function is connected to any of the available real derived outputs, for
example the P output signal of the CMMXU function.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
This section contains instructions on how to test the synchrocheck, energizing check, and
synchronizing function SESRSYN for single, double and 1½ breaker arrangements.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
At commissioning and periodical checks, the functions shall be tested with the used settings.
To test a specific function, it might be necessary to change some setting parameters, for
example:
• AutoEnerg = Off/DLLB/DBLL/Both
• ManEnerg = Off
• Operation = Off/On
• Activation of the voltage selection function if applicable
The tests explained in the test procedures below describe the settings, which can be used as
references during testing before the final settings are specified. After testing, restore the
equipment to the normal or desired settings.
A secondary injection test set with the possibility to alter the phase angle and amplitude of
the voltage is needed. The test set must also be able to generate different frequencies on
different outputs.
Figure 17 shows the general test connection principle, which can be used during testing. This
description describes the test of the version intended for one bay.
Figure 18 shows the general test connection for a 1½ breaker diameter with one-phase voltage
connected to the line side.
IED
Test UMeasure
U-Bus
equipment U3PBB1 Ph/N
N Ph/Ph
Input Phase
L1,L2,L3
L12,L23,L31
UMeasure
U-Line
U3PLN1 Ph/N
Ph/Ph
UL1
UL2
Input Phase
UL3
L1,L2,L3
N
N L12,L23,L31
IEC05000480-4-en.vsd
IEC05000480 V4 EN-US
Figure 17: General test connection with three-phase voltage connected to the line side
IED
Test U-Bus1
equipment U3PBB1 UMeasure
Ph/N
N Ph/Ph
U-Bus2
U3PBB2
Input Phase
N L1,L2,L3
U-Line2
U3PLN2 L12,L23,L31
N
UMeasure
Ph/N
U-Line1 Ph/Ph
U3PLN1
Input Phase
L1,L2,L3
L12,L23,L31
N N
IEC05000481-5-en.vsd
IEC05000481 V5 EN-US
Figure 18: General test connection for a 1½ breaker diameter with one-phase voltage
connected to the line side
FreqDiffMax = 50.2 Hz
FreqDiffMin = 50.01 Hz
tBreaker = 0.080 s
1. Apply voltages
1.1. U-Line = 100% UBaseLine and f-Line = 50.0 Hz
1.2. U-Bus = 100% UBaseBus and f-Bus = 50.15Hz
2. Check that a closing pulse is submitted at a closing angle equal to calculated phase angle
value from the formula below. Modern test sets will evaluate this automatically.
Closing Angle = |( (fBus– fLine) * tBreaker * 360 degrees) |
fBus= Bus frequency
fLine= Line frequency
tBreaker = Set closing time of the breaker
3. Repeat with
3.1. U-Bus = 100% UBaseBus and f-bus = 50.25 Hz, to verify that the function does not
operate when frequency difference is above limit.
4. Verify that the closing command is not issued when the frequency difference is less than
the set value FreqDiffMin.
During the test of SESRSYN for a single bay arrangement, these voltage inputs are used:
U-Line UL1, UL2 or UL3 line 1 voltage input on the IED according to the connection in
SMT
U-Bus Bus voltage input on the IED according to the connection in SMT
The settings used in the test shall be final settings. The test shall be adapted to site setting
values instead of values in the example below.
1. Apply voltages U-Line (for example) = 80% GblBaseSelLine and U-Bus = 80%
GblBaseSelBusGblBaseSelBus with the same phase-angle and frequency.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
3. The test can be repeated with different voltage values to verify that the function
operates within the set UDiffSC. Check with both U-Line and U-Bus respectively lower
than the other.
4. Increase the U-Bus to 110% GblBaseSelBus, and the U-Line = 90% GblBaseSelLine and
also the opposite condition.
5. Check that the two outputs for manual and auto synchronism are not activated.
1. Apply voltages U-Line (for example) = 100% GblBaseSelLine and U-Bus = 100%
GblBaseSelBus, with a phase difference equal to 0 degrees and a frequency difference
lower than FreqDiffA and FreqDiffM.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
The test can be repeated with other phase difference values to verify that the function
operates for values lower than the set ones, PhaseDiffM and PhaseDiffA. By changing the
phase angle on the voltage connected to U-Bus, between ± dφ degrees, the user can
check that the two outputs are activated for a phase difference lower than the set value.
It should not operate for other values. See figure 19.
U-Bus
No operation
+dj
U-Line operation
-dj
U-Bus
en05000551.vsd
IEC05000551 V1 EN-US
Test with a frequency difference outside the set limits for manual and auto synchronizing
check respectively.
1. Apply voltages U-Line equal to 100% GblBaseSelLine and U-Bus equal to 100%
GblBaseSelBus, with a frequency difference equal to 0 mHz and a phase difference lower
than the set value.
2. Check that the AUTOSYOK and MANSYOK outputs are activated.
3. Apply voltage to the U-Line equal to 100% GblBaseSelLine with a frequency equal to 50
Hz and voltage U-Bus equal to 100% GblBaseSelBus, with a frequency outside the set
limit.
4. Check that the two outputs are not activated. The test can be repeated with different
frequency values to verify that the function operates for values lower than the set ones. If
a modern test set is used, the frequency can be changed continuously.
During the test of the energizing check function for a single bay arrangement, these voltage
inputs are used:
General M2377-271 v6
When testing the energizing check function for the applicable bus, arrangement shall be done
for the energizing check functions. The voltage is selected by activation of different inputs in
the voltage selection logic.
Live voltage level is fixed to 80% UBase and dead voltage level to fixed 40% UBase.
The test shall be performed according to the settings for the station. Test the alternatives
below that are applicable.
1. Verify the local HMI setting AutoEnerg to be Off and ManEnerg to be DBLL.
2. Set the parameter ManEnergDBDL to On.
3. Apply a single-phase voltage of 30% GblBaseSelBus to the U-Bus and a single-phase
voltage of 30% GblBaseSelLine to the U-Line.
4. Check that the MANENOK output is activated after set tManEnerg.
5. Increase the U-Bus to 80% GblBaseSelBus and keep the U-Line equal to 30%
GblBaseSelLine. The outputs should not be activated.
6. Repeat the test with ManEnerg set to DLLB with different values on the U-Bus and the U-
Line voltage.
If the UB1/2OK inputs for the fuse failure are used, they must be activated, during tests below.
Also verify that deactivation prevents operation and gives an alarm.
1. Connect the analog signals to the voltage inputs, in pair of two for U1 and U2. (Inputs
U3PBB1, U3PBB2, U3PLN1, U3PLN2)
2. Activate the binary signals according to the used alternative. Verify the measuring
voltage on the synchronizing check function SESRSYN. Normally it can be good to verify
synchronizing check with the same voltages and phase angles on both voltages. The
voltages should be verified to be available when selected and not available when another
input is activated so connect only one voltage transformer reference at each time.
3. Record the voltage selection tests in a matrix table showing read values and AUTOSYOK/
MANSYOK signals to document the test performed.
WA1
WA2
WA1_QA1 WA2_QA1
(SESRSYN 1) (SESRSYN 3)
TIE_QA1
(SESRSYN 2)
LINE1_QB9 LINE2_QB9
LINE1 LINE2
IEC11000274-3-en.vsd
IEC11000274 V3 EN-US
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Verification of the auto recloser for single-phase, two-phase or three-phase auto reclosing
attempts can be considered to consist of two parts.
• One part to verify the internal logic and timing of the auto recloser
• One part to verify its interaction with the protection system
This section deals with verification of the auto recloser itself. However, it is practical to start
the auto recloser by activating a protection function, for example, by secondary injection
tests.
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
The purpose of verification before commissioning is to check that entered selections, setting
and configuration render the intended result. The auto recloser is flexible with many options
and facilities. At commissioning only the selections and settings intended for use are verified.
If one chooses to reduce some time settings in order to speed up verification, be careful to set
the auto recloser at intended operational values at the end of the verification procedure. One
such parameter is the tReclaim time that must be timed out before a new test sequence can
be performed.
The verification test is performed together with protection and trip functions.
If no bi-stable relay or breaker simulator is available, replace it with two self-reset auxiliary
relays and use a self-holding connection.
Use a secondary injection IED test set to operate the protection function. The test set shall be
switched off when a trip signal is given or when the BR comes to open position to simulate real
conditions.
The CB simulation can be made more elaborate, including simulation of the operating gear
condition, CBREADY of either the type ready for a Close-Open (CO) cycle, or the type ready for
an Open-Close -Open (OCO) cycle.
The CB condition CBREADY of a type, CO, shall be high (true) until a closing operation is
performed. It then goes low (false) for a recharging time of about 5 - 10s. After that it is high
again.
A CB condition CBREADY of a type, OCO shall be high (true) before and during tripping (start
auto reclosing). During tripping it goes low for a recharging time, for example, 10s. It may thus
be low at the instant of reclosing. After each Open or Close operation it may need a recharging
period before it goes high again.
IED
CLOSECB
BR
SC
Trip
ST
CBCLOSED
SRY
CBREADY
To test
set
+ -
IEC04000202-3-en.vsd
IEC04000202 V3 EN-US
1. Check the function settings on the local HMI under Main menu/Settings/IED Settings/
Control/Autorecloser79,5(0–>1)/SMBRREC:x(79,5(0–>)):x
If any timer settings are reduced to speed up or facilitate the testing, they shall be set to
normal after testing. A temporary label on the IED can be a reminder to restore normal
settings after which a verification test should be performed.
2. Decide if a synchrocheck function SESRSYN shall be included in the test.
If SESRSYN as an internal function or external device is not operated by the injection,
input signal SYNC must be connected as a permanent high signal or controlled by a
switch.
3. Read and make notes of the reclosing operation counters on the local HMI under Main
menu/Test/Function status/Control/AutoRecloser79,5(0–>1)/SMBRREC(79,5(0–>1)):x
Possibly reset the counters to Zero. Counters are reset in the reset menu.
4. Make arrangements for the simulation of the CB, for example as in Figure 21.
5. Make arrangements for indication, recording and time measurements.
The signals for CBCLOSED, START, CLOSECB, READY and other relevant signals should
preferably be arranged for event recording with time tagging. If that is not possible,
other means of time measurement and recording should be arranged.
10.9.2.2 Switching the auto recloser to On and Off On and Off M12400-79 v9
Select the test cases to be run according to what is applicable to the particular application. It
can be, for example,
Below, a case with single-phase and three-phase single-shot auto reclosing is described.
When checking the influence of a releasing condition it is suggested to first run an auto
reclosing sequence with the condition fulfilled. When the condition signal is removed, and a
new sequence is run, it indicates that the result was due to the changed condition. In case of a
blocking signal the procedure should be similar. Start without the blocking or inhibit signal,
and then run a sequence with the blocking or inhibit signal added.
1. Check that the auto recloser is operative, for example, by making a reclosing shot
without the INHIBIT signal.
2. Apply a fault and thereby a START signal. At the same time, or during the dead time,
apply a signal to the input INHIBIT.
3. Check that the auto reclosing sequence is interrupted and no auto reclosing takes place.
1. Check that the auto recloser is operative, for example by making a reclosing shot.
Keep the CBREADY signal high.
2. Set the breaker simulating relay BR in Open position.
3. Close the BR relay and immediately apply a fault and thereby a START signal.
4. Check that no auto reclosing takes place.
Checking the influence of circuit breaker not ready for reclosing M12400-149 v5
1. Check that the auto recloser function is operative, for example by making an auto
reclosing shot.
Keep the CB simulator BR closed. Remove the CBREADY signal by opening SRY.
2. Apply a fault and thereby a START signal.
3. Check that no auto reclosing takes place.
1. Check that the auto recloser is operative, for example, by making a three-phase reclosing
shot with the synchrocheck SESRSYN conditions fullfilled.
Set the SESRSYN function to Off to eliminate the signal connected to input signal SYNC.
2. Apply a fault causing three-phase trip and thereby a START and a TR3P signal to the auto
recloser.
3. Wait for the tSync time-out limit.
Check that no reclosing is made.
1. Check that the auto recloser is operative, for example by making a reclosing shot.
Set the autoreclosing operation to Off, for example by external control.
The output READY shall be low, and PREP3P shall be high.
2. Apply a single phase fault and thereby a START signal.
3. Check that a definitive three phase trip and no auto reclosing takes place.
The two auto reclosers can be checked individually by carefully applying START, WAIT, and
INHIBIT signals.
It is also possible to verify the two functions together by using circuit breaker simulating
equipment for two circuit breaker circuits. There should be interconnections from the master
to the slave function, WFMASTER- WAIT, and UNSUCCL - INHIBIT, as shown in the illustration
referred to above.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
The apparatus control function consists of four types of function blocks, which are connected
in a delivery-specific way between bays and to the station level. For that reason, test the total
function in a system, that is, either in a complete delivery system as an acceptance test (FAT/
SAT) or as parts of that system.
For the single command function block, it is necessary to configure the output signal to
corresponding binary output of the IED. The operation of the single command function
(SINGLECMD) is then checked from the local HMI by applying the commands with Mode = Off,
Steady or Pulse, and by observing the logic statuses of the corresponding binary output.
Command control functions included in the operation of different built-in functions must be
tested at the same time as their corresponding functions.
Prepare the IED for verification of settings as outlined in section "Requirements" and
section "Preparing for test" in this chapter.
Values of the logical signals are available on the local HMI under Main menu/Tests/Function
status/Control/Apparatus control/Interlocking. The Signal Monitoring in PCM600 shows the
same signals that are available on the local HMI.
The interlocking function consists of a bay-level part and a station-level part. The interlocking
is delivery specific and is realized by bay-to-bay communication over the station bus. For that
reason, test the function in a system, that is, either in a complete delivery system as an
acceptance test (FAT/SAT) or as parts of that system.
Prepare the IED for verification of settings as outlined in Section "Preparing the IED to verify
settings" in this chapter.
Values of logical signals for SSIMG protection are available on the local HMI under Main menu/
Tests/Function status/Monitoring/InsulationGas(63)/SSIMG(63):x, where x = 1, 2,....21.
The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI.
Check that the input logical signal BLOCK is logical zero and that on the local HMI, the logical
signals PRESALM, PRESLO, TEMPALM, TEMPLO, ALARM and LOCKOUT are logical zero.
Using service kit. prepare the IED for verification of settings as outlined in Section "Preparing
the IED to verify settings" in this chapter.
10.10.1.1 Testing the gas medium supervision for pressure alarm and pressure
lockout conditions GUID-768DAAC8-F89D-4401-B86D-9B26FD7224F6 v3
1. Connect binary inputs to consider gas pressure and gas density to initiate the alarms.
2. Consider the analogue pressure input SENPRES and set SENPRES to a value lower than
PresAlmLimit or activate binary input signal SENPRESALM, check that outputs PRESALM
and ALARM are activated after a set time delay of tPressureAlarm.
3. Gas pressure lockout input SETPLO can be used to set PRESLO.
4. Also, reduce further the pressure level input below PresLOLimit or activate the binary
input signal SENPRESLO, check that PRESLO signal appears after a set time delay of
tPressureLO.
5. Activate BLOCK binary input and check that the outputs PRESALM, PRESLO, ALARM and
LOCKOUT disappear.
6. Reset the BLOCK binary input.
7. Make sure that pressure lockout condition exists and then activate the reset lock out
input RESETLO and check that the outputs PRESLO and LOCKOUT reset.
10.10.1.2 Testing the gas medium supervision for temperature alarm and
temperature lock out conditions GUID-EC145626-90B0-45A2-AD58-CB8BF203FE16 v1
1. Consider the analogue temperature input SENTEMP and set SENTEMP to a value higher
than TempAlarmLimit, check that outputs TEMPALM and ALARM are activated after a set
time delay of tTempAlarm.
2. Temperature lockout input SETTLO can be used to set TEMPLO signal.
3. Also, increase further the temperature input above TempLOLimit, check that the outputs
TEMPLO and LOCKOUT appears after a set time delay of tTempLockOut.
4. Activate BLOCK binary input and check that the outputs TEMPALM, TEMPLO, ALARM and
LOCKOUT disappear.
5. Reset the BLOCK binary input.
6. Make sure that temperature lockout condition exists and then activate the reset lock out
input RESETLO and check that the outputs TEMPLO and LOCKOUT reset.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Preparing the IED to verify
settings" in this chapter.
Values of logical signals for SSIMG protection are available on the local HMI under Main menu/
Tests/Function status/Monitoring/InsulationLiquid(71)/SSIML(71):x, where x = 1, 2,....4.
Check that the input logical signal BLOCK is logical zero and that on the local HMI, the logical
signals LVLALM, LVLLO, TEMPALM, TEMPLO, ALARM and LOCKOUT are logical zero.
10.10.2.1 Testing the liquid medium supervision for level alarm and level lockout
conditions GUID-C1F1E6CA-9512-4358-A4E7-84CC3698D156 v3
1. Connect the binary inputs to consider liquid level to initiate the alarms.
2. Consider the analogue level input SENLEVEL and set SENLEVEL to a value lower than
LevelAlmLimit or activate binary input signal SENLVLALM, check that outputs LVLALM and
ALARM are activated after a set time delay of tLevelAlarm.
3. Liquid level lockout input SENLVLLO can be used to set LVLLO.
4. Also, reduce the liquid level input below LevelLOLimit or activate the binary input signal
SENLVLLO, check that LVLLO signal after a set time delay of tLevelLockOut.
5. Activate BLOCK binary input and check that the outputs LVLALM, LVLLO, ALARM and
LOCKOUT disappears.
6. Reset the BLOCK binary input.
7. Make sure that level lockout condition exists and then activate the reset lock out input
RESETLO and check that the outputs PRESLO and LOCKOUT reset.
10.10.2.2 Testing the liquid medium supervision for temperature alarm and
temperature lock out conditions GUID-189AF20B-D0E3-453D-A787-68F25D0903D3 v1
1. Consider the analogue temperature input SENTEMP and set SENTEMP to a value higher
than TempAlarmLimit, check that outputs TEMPALM and ALARM are activated after a set
time delay of tTempAlarm.
2. Temperature lockout input SETTLO can be used to set TEMPLO signal.
3. Also, increase further the temperature input above TempLOLimit, check that the outputs
TEMPLO and LOCKOUT appears after a set time delay of tTempLockOut.
4. Activate BLOCK binary input and check that the outputs TEMPALM, TEMPLO, ALARM and
LOCKOUT disappear.
5. Reset the BLOCK binary input.
6. Make sure that temperature lockout condition exists and then activate the reset lock out
input RESETLO and check that the outputs TEMPLO and LOCKOUT reset.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Prepare the IED for verification of settings outlined in section “Testing the IED operation”.
The Signal Monitoring tool in PCM600 shows the service values that are available on the Local
HMI as well.
Values of the logical signals belong to the breaker monitoring are available on the local HMI
under: Main menu/Test/Function status/Monitoring/BreakerMonitoring/SSCBR:x
1. Connect the test set for the injection of a three-phase current to the appropriate current
terminals of the IED.
2. If current need to be injected for a particular test, it should be done in the phase selected
by the PhSel parameter.
3. Follow the sequence for positioning the auxiliary contacts before testing:
POSCLOSE 0 1 0
POSOPEN 0 0 1
4. Test of CB contact travel time
4.1. Test the set timing defined by OpenTimeCorr, CloseTimeCorr, tTrOpenAlm and
tTrCloseAlm.
4.2. Change the status of the auxiliary contacts such that travel time to open TTRVOP
and travel time to close TTRVCL exceed the respective set values (tTrOpenAlm and
tTrCloseAlm). The measured travel time for opening and closing is shown on TTRVOP
and TTRVCL respectively.
4.3. Check that TRVTOPAL and TRVTCLAL are activated.
5. Test of CB status
5.1. Test the set current level defined by AccStopCurr.
5.2. Check the CLOSEPOS output by changing the POSOPEN to 0 and POSCLOSE to 1.
5.3. Check the OPENPOS output by changing the POSOPEN to 1 and POSCLOSE to 0 and
also inject the current in the selected phase slightly lower and higher than
AccStopCurr set value. Only for a current lower than set AccStopCurr should activate
the output POSOPEN.
5.4. Check the circuit breaker is in INVDPOS if auxiliary contacts read same value or CB is
open and inject the current in selected phase more than AccStopCurr set value.
6. Test of remaining life of CB
6.1. Test the set timing defined byRatedOperCurr, RatedFltCurr, OperNoRated,
OperNoFault, DirCoef, CBLifeAlmLevel.
6.2. Vary the phase current in the selected phase from below rated operated current,
RatedOperCurr to above rated fault current, RatedFltCurr of a breaker.
6.3. The remaining life of CB output CBLIFEPH is estimated when the CB is changed from
closed to open position. Check that the output CBLIFEPH is decreased with a value
that corresponds to the injected current.
6.4. CBLIFEAL is activated as soon as CBLIFEPH is below the set CBLifeAlmLevel value.
7. Test of accumulated energy
7.1. Test the actual set values defined by AccSelCal to Aux Contact, ContTrCorr and
AlmAccCurrPwr.
7.2. Inject phase current in the selected phase such that its value is greater than set
AccStopCurr value.
7.3. When the breaker goes to open position, accumulated energy IPOWPH is calculated.
The calculated value can be seen on the output IPOWPH.
7.4. Alarm signal IPOWALPH appears when IPOWPH is greater than set AlmAccCurrPwr
value.
7.5. Lockout signal IPOWLOPH appears if IPOWPH exceeds further to the threshold value
LOAccCurrPwr.
7.6. Calculation of accumulated energy IPOWPH is stopped when injected current is lower
than set AccStopCurr value.
8. Test of CB operation cycles
8.1. Test the actual set values defined by OperAlmLevel and OperLOLevel.
8.2. The operation counter, NOOPER is updated for every close-open sequence of the
breaker by changing the position of auxiliary contacts POSCLOSE and POSOPEN.
8.3. OPERALM is activated when NOOPER value exceeds the set OperAlmLevel value. The
actual value can be read on the output NOOPER.
8.4. OPERLO is activated when NOOPER value exceeds the set OperLOLevel value.
9. Test of CB spring charge monitoring
9.1. Test the actual set value defined by SpChAlmTime.
9.2. Enable SPRCHRST input. Also activate SPRCHRD after a time greater than set time
SpChAlmTime.
9.3. At this condition, SPCHALM is activated.
10. Test of CB gas pressure indication
10.1. Test the actual set value defined bytDGasPresAlm and tDGasPresLO.
10.2. The output GPRESALM is activated after a time greater than set time of
tDGasPresAlm value if the input PRESALM is enabled.
10.3. The output GPRESLO is activated after a set time of tDGasPresLO value if the input
PRESLO is enabled.
1. Continue to test another function or end the test by changing the Test mode setting to
Off.
2. Restore connections and settings to their original values if they were changed for testing
purposes.
Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.
During testing, the IED can be set when in test mode from PST. The functionality of the event
reporting during test mode is set in the Parameter Setting tool in PCM600.
The Limit counter function L4UFCNT can be tested by connecting a binary input to the counter
and applying pulses to the counter. The speed of the pulses must not exceed the cycle time of
the function. Normally the counter will be tested when testing the function that the counter is
connected to, such as the trip function. When the function is configured, test it together with
the function that operates it. Trigger the function and check that the counter result
corresponds to the number of operations.
Continue to test another function or end the test by changing the Test mode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
GUID-804F309E-B02F-4F6B-B0FC-2C7AE3F12DBA v2
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Verifying the warning and alarm time limit of THD, WrnLimitTHD and tDelayAlmTHD GUID-92992D84-BDAA-436F-9D2E-3770A29EF956 v1
Verifying the warning and alarm time limit of TDD, WrnLimitTDD and tDelayAlmTDD GUID-3C346AFB-C073-4CA8-A471-57B04D9170DE v1
Verifying the warning and alarm time limit of individual harmonic distortions IHD,
WrnLimit#HD and tDelayAlm#HD (where # = 2nd, 3rd…5th) GUID-C10AB22D-5FC7-47B4-B619-EAC46D1C2ECF v2
5. Continue to inject the same level of harmonics level until the 2NDHDALM signal appears
and note down the time from 2NDHDWRN signal set to 2NDHDALM signal set.
6. Compare the noted time value with the set time limit value of alarm.
7. Repeat Steps 2 to 6 for the harmonics until 5th order.
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
GUID-804F309E-B02F-4F6B-B0FC-2C7AE3F12DBA v2
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify
settings".
Verifying the warning and alarm time limit of THD, WrnLimitTHD and tDelayAlmTHD
GUID-3E56D8AC-9461-4EEA-83A8-522CA177563E v1
Verifying the warning and alarm time limit of individual harmonic distortions IHD,
WrnLimit#HD and tDelayAlm#HD (where # = 2nd, 3rd…5th) GUID-17EC5D60-A748-46F4-8F13-A77E9CA3D17D v2
Continue to test another function or end the test by changing the TestMode setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
The test of the Pulse-counter logic function PCFCNT requires the Parameter Setting tool in
PCM600 or an appropriate connection to the local HMI with the necessary functionality. A
known number of pulses with different frequencies are connected to the pulse counter input.
The test should be performed with settings Operation = On or Operation = Off and the
function blocked or unblocked. The pulse counter value is then checked in PCM600 or on the
local HMI.
Prepare the IED for verification of settings as outlined in section ”Overview “ and
section ”Preparing for test“ in this chapter.
Common test equipment can be used to determine the injection of current and voltage and
time measurement.
1. Connect the test set for injection of three-phase currents and three-phase voltage to the
appropriate current and voltage terminals of the IED.
2. Ensure the instantaneous values of active and reactive power from CVMMXN function
block are connected to ETPMMTR function block active and reactive power inputs.
3. Enable the EnaAcc setting and set tEnergy as 1 minute.
4. Activate the STARTACC input and supply the IED with three-phase currents and voltages at
their rated value.
5. Check that the ACCINPRG signal appears continuously.
6. Note the EAFACC and ERFACCvalue after 1 minute and compare it with calculated energy
value.
7. Similarly check after each 1 minute whether the calculated integrated energy value and
EAFACC and ERFACC outputs are matching.
8. After some time (multiple of minute) remove the current and voltage input from CVMMXN
function block.
9. Check the EAFACC and ERFACC output in the next 1 minute cycle for the retaining the same
value.
10. Activate STOPACC input after some time and supply the IED with same current and
voltage.
11. Check that the ACCINPRG signal disappears immediately and EAFACC and ERFACC outputs
also stop updating.
12. Similarly the testing can be done for EAFACC and ERFACC outputs by changing the power
inputs directions through direction settings.
5. After 1 minute check the MAXPAFD and MAXPRFD whether it is showing the last 1 minute
average power value as maximum.
6. Next 1 minute cycle reduce the current or voltage below previous value.
7. Check after 1 minute whether the MAXPAFD and MAXPRFD outputs are retaining the old
maximum value.
8. Similarly the testing can be done for MAXPAFD and MAXPRFD outputs by changing the
power inputs directions through direction settings.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
Test of the multiple command function block and multiple transmit is recommended to be
performed in a system, that is, either in a complete delivery system as an acceptance test
(FAT/SAT) or as parts of that system, because the command function blocks are connected in
a delivery-specific way between bays and the station level and transmit.
Command and transmit function blocks included in the operation of different built-in
functions must be tested at the same time as their corresponding functions.
Prepare the IED for verification of settings as outlined in section "Preparing the IED to verify
settings".
To perform a test of the binary signal transfer functions, the hardware (LDCM) and binary
input and output signals to transfer must be configured as required by the application.
There are two types of internal self-supervision of the binary signal transfer:
• The I/O-circuit board is supervised as an I/O module. For example it generates FAIL if the
board is not inserted. I/O-modules not configured are not supervised.
• The communication is supervised and the signal COMFAIL is generated if a
communication error is detected.
Status for inputs and outputs as well as self-supervision status are available from the local
HMI under
Test the correct functionality by simulating different kind of faults. Also check that sent and
received data is correctly transmitted and read.
A test connection is shown in figure 22. A binary input signal (BI) at End1 is configured to be
transferred through the communication link to End2. At End2 the received signal is configured
to control a binary output (BO). Check at End2 that the BI signal is received and the BO
operates.
Repeat the test for all the signals configured to be transmitted over the communication link.
IEC07000188 V1 EN-US
Prepare the IED for verification of settings as outlined in section "Preparing for test" in this
chapter.
1. Check the configuration of binary inputs that control the selection of the active setting
group.
2. Browse to the ActiveGroup menu to achieve information about the active setting group.
The ActiveGroup menu is located on the local HMI underMain menu/Test/Function
status/Setting groups/ActiveGroup
The ActiveGroup menu is located on the PCM600 underMain menu/Test/Function
status/Setting groups/ActiveGroup
3. Connect the appropriate dc voltage to the corresponding binary input of the IED and
observe the information presented on the local HMI.
The displayed information must always correspond to the activated input.
4. Check that the corresponding output indicates the active group.
Operating procedures for the PC aided methods of changing the active setting groups
are described in the corresponding PCM600 documents and instructions for the
operators within the SCS are included in the SCS documentation.
continue to test another function or end the test by changing the TESTMODE setting to Off.
Restore connections and settings to their original values, if they were changed for testing
purposes.
After exiting the IED test mode, make sure that the MU is returned to normal
mode.
SEMOD65857-3 v3
SEMOD65857-8 v2
A test with primary current through the protected zone is usually a final check that the current
circuits are correctly connected to the IED protection scheme. It is important to have an
appropriate source, which is able to inject sufficient current in the primary circuit in order to
distinguish between noise and real injected current. Therefore it is recommended that the
injection current should be at least 10% of rated CT primary current.
The primary injection tests of a differential IED consist of applying a suitable current source
across the primary winding of the CT connected to the current input of the IED. The testing is
normally carried out on one phase at a time. If the primary current is bigger than the set value
of the DiffOperLevel parameter, the IED shall issue the trip command as well. The primary
current injection test should be repeated for every CT until all current circuits in all phases are
checked. The typical connection for the primary injection test is shown in figure 23.
IED
Primary Injection
Test Set CT Input
1200/1
Optional equipment
(i.e,Test Switch,CB
Fail relay,other relays)
IEC05000470-2-en.vsd
IEC05000470 V2 EN-US
Follow the following test instructions for all used current inputs in an IED.
Procedure
1. Connect the test set for injection primary current to the main CT connected to the
current terminals of CTx input of the IED as shown in figure 23.
2. Make sure that current measurement from the CTx input are included in one of the
differential zones.
3. Inject the primary current in phase L1 and note the incoming and differential currents on
the local HMI of the IED. The values of the incoming and the differential currents shall
correspond to the injected primary current.
4. Check that the current is present only in the phase being tested.
5. If the injected current is high enough, check that trip contacts operate accordingly to the
scheme wiring.
6. Check that trip information is stored in the disturbance recorder and event list (if
connected).
7. Switch off the current.
8. Check the function in the same way by injecting current in phases L2 and L3.
It is recommended that each primary CB is tripped directly from the protection scheme at
least once during these tests. This will confirm the trip-circuit connection between the
protection scheme and the CB.
For stability testing, one current circuit shall always be used as a reference input. The
reference current circuit shall then be tested for stability against all other current circuits
connected to a busbar protection scheme on a one-by-one basis. Use the current circuit
connected to the CT1 current input as the reference current circuit. A typical connection for the
primary current test set for this type of tests is shown in figure 24.
REB 670
Primary Injection
Test Set
IEC13000228-1-en.vsd
IEC05000307 V2 EN-US
Figure 24: Typical test connection for primary injection, which should confirm the
stability of the main CT connected to current inputs of the IED
For this type of primary injection tests a suitable current source should be applied across the
primary windings of two CTs connected in series as shown in figure 24. The testing is normally
done on one phase at the time. The currents in the secondary winding of these CTs are then
opposite in phase. The differential current displayed by the IED should be negligible while the
incoming current displayed should be equal to the value of the injected primary current. The
IED must not issue the trip command during these tests. If it trips or the differential current
has a high value it usually means that there is a wiring problem in the CT circuits connected to
the current input CTx (that is, a differential current equal to twice the injection current
probably indicates wrong polarity of the main CT connected to the CTx current input). This
problem must be solved before the protection scheme is put in service.
Procedure
1. Connect the test set for primary current injection to the main CTs as shown in figure 24.
2. Make sure that current measurement from two used CT inputs are included in the same
differential zone.
3. Inject the primary current in phase L1 and note the incoming and differential currents on
the local HMI of the IED.
The value of the incoming current for phase L1 shall correspond to the injected primary
current. The value of the differential current for phase L1 shall be negligible.
4. Check that the current is present only in the phase being tested.
5. Switch the current off.
6. Check the function in phases L2 and L3 by injecting current in the same way.
SEMOD65855-5 v3
In busbar arrangements where a disconnector replica is used, it provides the information to
the busbar protection about which of the measured CT currents shall be included within
different differential zones. It is necessary to verify the auxiliary contacts from each busbar
disconnector.
The protection scheme can be put in service after all these tests have been conducted.
During commissioning all protection functions shall be verified with the setting values used at
each plant. The commissioning tests must include verification of all circuits by green-lining the
circuit diagrams and the configuration diagrams for the used functions.
Further, the settings for protection functions are tested and recorded carefully as outlined for
the future periodic maintenance tests.
The final testing includes primary verification of all directional functions where load currents is
checked on the local HMI and in PCM600. The amplitudes and angles of all currents and
voltages should be checked and the symmetry verified.
Directional functions have information about the measured direction and, for example,
measured impedance. These values must be checked and verified as correct with the export or
import of power available.
Finally, final trip tests must be performed. This involves activation of protection functions or
tripping outputs with the circuit breaker closed and the tripping of the breaker verified. When
several breakers are involved, each breaker must be checked individually and it must be
verified that the other involved breakers are not tripped at the same time.
SEMOD56520-5 v4
The periodicity of all tests depends on several factors, for example the importance of the
installation, environmental conditions, simple or complex equipment, static or
electromechanical IEDs, and so on.
The normal maintenance praxis of the user should be followed. However, ABB's
recommendation is as follows:
• Periodic maintenance test for protection IEDs of objects with redundant protection
system.
First maintenance test should always be carried out after the first half year of
service.
When protection IEDs are combined with built-in control, the test interval can
be increased drastically, up to for instance 15 years, because the IED
continuously reads service values, operates the breakers, and so on.
Prior to testing, the protection IEDs should be inspected to detect any visible damage that
may have occurred (for example, dirt or moisture deposits, overheating).
SEMOD56528-5 v5
To be made after the first half year of service, then with the cycle as proposed above and after
any suspected maloperation or change of the IED setting.
Testing of protection IEDs shall preferably be made with the primary circuit de-energized. The
IED cannot protect the circuit during testing. Trained personnel may test one IED at a time on
live circuits where redundant protection is installed and de-energization of the primary circuit
is not allowed.
ABB protection IEDs are preferably tested by aid of components from the COMBITEST testing
system described in information B03-9510 E. Main components are RTXP 8/18/24 test switch
usually located to the left in each protection IED and RTXH 8/18/24 test handle, which is
inserted in test switch at secondary testing. All necessary operations such as opening of trip
circuits, short-circuiting of current circuits and opening of voltage circuits are automatically
performed in the right order to allow for simple and safe secondary testing even with the
object in service.
Before starting maintenance testing, the test engineers should scrutinize applicable circuit
diagrams and have the following documentation available:
It is of utmost importance to carefully record the test results. Special test sheets covering the
frequency of test, date of test and achieved test values should be used. IED setting list and
protocols from previous tests should be available and all results should be compared for
differences. At component failures, spare equipment is used and set to the requested value. A
note of the exchange is made and the new measured values are recorded. Test records for
several years of testing should be stored in a common file for a station, or a part of a station,
to give a simple overview of the period of testing and achieved test values. These test records
are valuable when analysis of service disturbances shall be done.
The periodic maintenance test is done by secondary injection from a portable test set. Each
protection shall be tested according to the secondary injection test information for the
specific protection IED. Only the setting values adopted shall be checked for each protection
function. If the discrepancy between obtained value and requested set value is too big the
setting should be adjusted, the new value recorded and a note should be made in the test
record.
When inserting the test handle the alarm and event signalling is normally blocked. This is done
in the IED by setting the event reporting to Off during the test. This can be done when the test
handle is inserted or the IED is set to test mode from the local HMI. At the end of the
secondary injection test it should be checked that the event and alarm signalling is correct by
activating the events and performing some selected tests.
Once secondary testing has been completed, it should be checked that no self-supervision
signals are activated continuously or sporadically. Especially check the time synchronization
system, GPS or other, and communication signals, both station communication and remote
communication.
When the protection IED undergoes an operational check, a tripping pulse is normally obtained
on one or more of the output contacts and preferably on the test switch. The healthy circuit is
of utmost importance for the protection operation. If the circuit is not provided with a
continuous trip-circuit supervision, it is possible to check that circuit is really closed when the
test-plug handle has been removed by using a high-ohmic voltmeter and measuring between
the plus and the trip output on the panel. The measurement is then done through the trip coil
of the circuit breaker and therefore the complete trip circuit is checked.
Please observe that the test system does not provide built-in security during
this test. If the instrument should be set on Amp instead of Volts, the circuit
breaker naturally is tripped, therefore, great care is necessary.
Trip circuit from trip IEDs to circuit breaker is often supervised by trip-circuit supervision. It
can then be checked that a circuit is healthy by opening tripping output terminals in the
cubicle. When the terminal is opened, an alarm shall be achieved on the signal system after a
delay of some seconds.
Remember to close the circuit directly after the test and tighten the terminal
carefully.
After a maintenance test it is recommended to measure the service currents and service
voltages recorded by the protection IED. The service values are checked on the local HMI or in
PCM600. Ensure that the correct values and angles between voltages and currents are
recorded. Also check the direction of directional functions such as Distance and directional
overcurrent functions.
For transformer differential protection, the achieved differential current value is dependent on
the tap changer position and can vary between less than 1% up to perhaps 10% of rated
current. For line differential functions, the capacitive charging currents can normally be
recorded as a differential current.
The zero-sequence current to earth-fault protection IEDs should be measured. The current
amounts normally very small but normally it is possible to see if the current circuit is "alive".
The neutral-point voltage to an earth-fault protection IED is checked. The voltage is normally
0.1 to 1V secondary. However, voltage can be considerably higher due to harmonics. Normally a
CVT secondary can have around 2.5 - 3% third-harmonic voltage.
Thus a list should be prepared of all items disturbed during test so that all can be put back into
service quickly and without overlooking something. It should be put back into service item by
item and signed by the responsible engineer.
Section 13 Troubleshooting
13.1 Checking the self supervision signals IP1474-1 v2
This procedure describes how to navigate the menus in order to find the cause of an internal
failure when indicated by the flashing green LED on the HMI module.
Procedure
Table 20: Signals from the General menu in the diagnostics tree.
Indicated result Possible reason Proposed action
Internal fail Off No problem detected. None.
Internal fail On A failure has occurred. Check the rest of the indicated results to find the fault.
Internal warning Off No problem detected. None.
Internal warning On A warning has been Check the rest of the indicated results to find the fault.
issued.
Time synch Ready No problem detected. None.
Time synch Fail No time Check the synchronization source for problems.
synchronization. If the problem persists, contact your ABB representative
for service.
Real time clock Ready No problem detected. None.
Real time clock Fail The real time clock has Set the clock.
been reset.
ADC-module OK No problem detected. None.
ADC-module Fail The AD conversion Contact your ABB representative for service.
module has failed.
(Protocol name) Ready No problem detected. None.
Table continues on next page
If an internal fault has occurred, the local HMI displays information under Main menu/
Diagnostics/IED status/General
Under the Diagnostics menus, indications of a possible internal failure (serious fault) or
internal warning (minor problem) are listed.
Also the internal signals, such as INT--FAIL and INT--WARNING can be connected to binary
output contacts for signalling to a control room.
In the IED Status - Information, the present information from the self-supervision function can
be viewed. Indications of failure or warnings for each hardware module are provided, as well as
information about the external time synchronization and the internal clock. All according to
table 21. Loss of time synchronization can be considered as a warning only. The IED has full
functionality without time synchronization.
When settings are changed in the IED, the protection and control applications restart in order
to take effect of the changes. During restart, internal events get generated and Runtime App
error will be displayed. These events are only indications and will be for short duration during
the restart.
When an internal fault has occurred, extensive information about the fault can be retrieved
from the list of internal events available in the SMS part:
The list of internal events provides valuable information, which can be used during
commissioning and fault tracing.
The internal events are time tagged with a resolution of 1ms and stored in a list. The list can
store up to 40 events. The list is based on the FIFO principle, when it is full, the oldest event is
overwritten. The list cannot be cleared and its content cannot be erased.
The internal events in this list not only refer to faults in the IED, but also to other activities,
such as change of settings, clearing of disturbance reports, and loss of external time
synchronization.
The information can only be retrieved from the Parameter Setting software package. The PC
can be connected either to the port at the front or at the rear of the IED.
Table 22: Events available for the internal event list in the IED
Event message: Description Generating signal:
INT--FAIL Off Internal fail status INT--FAIL (reset event)
INT--FAIL INT--FAIL (set event)
INT--WARNING Off Internal warning status lNT--WARNING (reset event)
INT--WARNING lNT--WARNING (set event)
IOn--Error Off In/Out module No. n status IOn--Error (reset event)
IOn--Error IOn--Error (set event)
ADMn-Error Off Analog/Digital module No. n ADMn-Error (reset event)
status
ADMn-Error ADMn-Error (set event)
MIM1-Error Off mA-input module status MIM1-Error (reset event)
MIM1-Error MIM1-Error (set event)
INT--RTC Off Real Time Clock (RTC) status INT--RTC (reset event)
INT--RTC INT--RTC (set event)
INT--TSYNC Off External time synchronization INT--TSYNC (reset event)
status
INT--TSYNC INT--TSYNC (set event)
INT--SETCHGD Any settings in IED changed
DRPC-CLEARED All disturbances in
Disturbance report cleared
The events in the internal event list are time tagged with a resolution of 1ms.
This means that, when using the PC for fault tracing, it provides information on the:
13.2.3 Diagnosing the IED status via the LHMI hint menu GUID-7E8503E9-441B-487A-9CD7-B43463D1CAE5 v3
In order to help the user, there is an LHMI page labeled ‘Hints’. This page is located under Main
menu/Diagnostics/IED status/Hints. For each activated hint there is a headline. From the
headline view, an explanation page can be entered, giving the user more information and hints
about the particular topic.
For example, if there is a configuration to use IEC 61850 9–2 analog data, but no data arrives
on the access point, then the IED will use substituted data and most protection functions will
be blocked. This condition will be indicated with a sub-menu under Hints, where details about
this condition are shown. The Hint menu is a way to assist the user in troubleshooting.
The Hint menu is currently only available in English. All the entries are in English,
regardless of which language is selected.
Headline Explanation
LDCM not running the application image <slot number> is running the factory image instead
of the application image. The factory image is older
and does not contain the latest updates and fixes.
Please reboot the IED. If the problem persists update
the LDCM firmware or replace the board.
LDCM version is not accepted <device name> firmware version <version string> is
not accepted. The minimum accepted version is
<version string>.
Please update the LDCM firmware or replace the
board.
OEM not running the application image OEM in slot <slot number> is running the factory
image instead of the application image. The factory
image is older and does not contain the latest
updates and fixes.
Please reboot the IED. If the problem persists, update
the OEM firmware or replace the board.
SFP unplugged from the slot SFP has been unplugged from the slot
Please check the connection.
Corresponding hardware(s) is set to fail.
SFP replaced with other type Configured and the detected SFP(s) are different.
Corresponding hardware(s) is set to fail.
Please restart IED and consider Reconfigure HW
modules to get updated hardware list.
Non ABB vendor SFP detected Non ABB vendor SFP detected.
Corresponding hardware(s) is set to fail. Please use
ABB approved SFP’s.
When adding, removing or moving a hardware modules in an IED ( for example, I/O modules,
communication modules or time synchronization modules) a set of procedures must be
followed.
Procedure:
Procedure:
1. Remove all existing configuration for the module in PCM, and write that configuration to
the IED.
2. Switch the IED off and remove the HW module.
3. Switch the IED on, wait for it to start, and then perform a HW reconfig.
4. Perform a license update in PCM 600.
If any configuration that makes the module needed remains, then the HW
reconfig will not remove the module.
The module will still be needed. An error indication for the module will appear, if
the module is physically removed from the IED and the IED is restarted with
some part of the configuration still requiring the module.
Procedure:
1. Remove all existing configuration for the module in PCM, and write that configuration to
the IED.
2. Switch the IED off and move the HW module.
3. Switch the IED on, wait for it to start, and then perform a HW reconfig.
4. Perform a license update in PCM600.
The new module is now available in PCM600 at the new position and is ready to be configured.
M11764-2 v3
M11764-10 v1
An alternative is to open the IED and send only the faulty circuit board to ABB for repair. When
a printed circuit board is sent to ABB, it must always be placed in a metallic, ESD-proof,
protection bag. The user can also purchase separate replacement modules.
M11766-4 v3
Most electronic components are sensitive to electrostatic discharge and latent damage may
occur. Please observe usual procedures for handling electronics and also use an ESD wrist
strap. A semi-conducting layer must be placed on the workbench and connected to earth.
If the IED has been calibrated with the system inputs, the calibration procedure must be
performed again to maintain the total system accuracy.
If an IED needs to be repaired, the whole IED must be removed and sent to an ABB Logistic
Center. Before returning the material, an inquiry must be sent to the ABB Logistic Center.
e-mail: [email protected]
Instructions from the power network company and other maintenance directives valid for
maintenance of the power system must be followed.
AC Alternating current
ACC Actual channel
ACT Application configuration tool within PCM600
A/D converter Analog-to-digital converter
ADBS Amplitude deadband supervision
ADM Analog digital conversion module, with time synchronization
AI Analog input
ANSI American National Standards Institute
AR Autoreclosing
ASCT Auxiliary summation current transformer
ASD Adaptive signal detection
ASDU Application service data unit
AWG American Wire Gauge standard
BBP Busbar protection
BFOC/2,5 Bayonet fiber optic connector
BFP Breaker failure protection
BI Binary input
BIM Binary input module
BOM Binary output module
BOS Binary outputs status
BR External bistable relay
BS British Standards
BSR Binary signal transfer function, receiver blocks
BST Binary signal transfer function, transmit blocks
C37.94 IEEE/ANSI protocol used when sending binary signals between IEDs
CAN Controller Area Network. ISO standard (ISO 11898) for serial
communication
CB Circuit breaker
CBM Combined backplane module
CCITT Consultative Committee for International Telegraph and Telephony. A
United Nations-sponsored standards body within the International
Telecommunications Union.
CCM CAN carrier module
CCVT Capacitive Coupled Voltage Transformer
Class C Protection Current Transformer class as per IEEE/ ANSI
CMPPS Combined megapulses per second
CMT Communication Management tool in PCM600