IC STMicroelectronics STM32L010F4P6 Eec

STM32L010F4
STM32L010K4
Value line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0+,
16-Kbyte Flash memory, 2-Kbyte SRAM, 128-byte EEPROM, ADC
Datasheet - production data
Features
• Ultra-low-power platform
– 1.8 V to 3.6 V power supply
– –40 to 85 °C temperature range LQFP32
TSSOP20
7 x 7 mm
– 0.23 µA Standby mode (2 wakeup pins) 169 mils
– 0.29 µA Stop mode (16 wakeup lines)

– 0.54 µA Stop mode + RTC + 2-Kbyte RAM • Analog peripherals
retention – 12-bit ADC 1.14 Msps up to 10 channels (down
– Down to 76 µA/MHz in Run mode to 1.8 V)
– 5 µs wakeup time (from Flash memory) • 5-channel DMA controller, supporting ADC, SPI,
– 41 µA 12-bit ADC conversion at 10 ksps I2C, USART and timers
• Core: Arm® 32-bit Cortex®-M0+ • 4x peripherals communication interface
– From 32 kHz to 32 MHz • 1x USART, 1x LPUART (low power)
– 0.95 DMIPS/MHz
• 1x SPI 16 Mbit/s
• Reset and supply management
• 1x I2C (SMBus/PMBus)
– Ultra-low-power BOR (brownout reset) with
5 selectable thresholds • 7x timers: 1x 16-bit with up to 4 channels,
– Ultra-low-power POR/PDR 1x 16-bit with up to 2 channels, 1x 16-bit ultra-low-
power timer, 1x SysTick, 1x RTC and 2x watchdogs
• Clock sources (independent/window)
– 0 to 32 MHz external clock
• CRC calculation unit, 96-bit unique ID
– 32 kHz oscillator for RTC with calibration
– High-speed internal 16 MHz factory-trimmed RC • All packages are ECOPACK2 compliant.
(±1%)
– Internal low-power 37 kHz RC
– Internal multispeed low-power 65 kHz to
4.2 MHz RC
– PLL for CPU clock
• Pre-programmed bootloader
– USART, SPI supported
• Development support
– Serial wire debug supported
• Up to 26 fast I/Os (23 I/Os 5-Volt tolerant)
• Memories
– 16-Kbyte Flash memory
– 2-Kbyte RAM
– 128 bytes of data EEPROM
– 20-byte backup register
– Sector protection against R/W operation
August 2019 DS12323 Rev 3 1/91

This is information on a product in full production. www.st.com
Contents STM32L010F4/K4
Contents
1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.1 Device overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.2 Ultra-low-power device continuum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3 Functional overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.1 Low-power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.2 Interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
3.3 Arm® Cortex®-M0+ core . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.4 Reset and supply management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.4.1 Power supply schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.4.2 Power supply supervisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.4.3 Voltage regulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.4.4 Boot modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.5 Clock management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.6 Low-power real-time clock and backup registers . . . . . . . . . . . . . . . . . . . 21
3.7 General-purpose inputs/outputs (GPIOs) . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.8 Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.9 Direct memory access (DMA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.10 Analog-to-digital converter (ADC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.11 Internal voltage reference (VREFINT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.12 System configuration controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.13 Timers and watchdogs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.13.1 General-purpose timers (TIM2, TIM21) . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.13.2 Low-power timer (LPTIM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.13.3 SysTick timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.13.4 Independent watchdog (IWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.13.5 Window watchdog (WWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.14 Communication interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.14.1 I2C bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.14.2 Universal synchronous/asynchronous receiver transmitter (USART) . . 26
3.14.3 Low-power universal asynchronous receiver transmitter (LPUART) . . . 27
2/91 DS12323 Rev 3

STM32L010F4/K4 Contents
3.14.4 Serial peripheral interface (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

3.15 Cyclic redundancy check (CRC) calculation unit . . . . . . . . . . . . . . . . . . . 27
3.16 Serial wire debug port (SW-DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
4 Pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
5 Memory mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
6 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1 Parameter conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.1 Minimum and maximum values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.2 Typical values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.3 Typical curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.4 Loading capacitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.5 Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.1.6 Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
6.1.7 Current consumption measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
6.2 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
6.3 Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
6.3.1 General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
6.3.2 Embedded reset and power control block characteristics . . . . . . . . . . . 40
6.3.3 Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . 41
6.3.4 Supply current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
6.3.5 Wakeup time from low-power mode . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
6.3.6 External clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
6.3.7 Internal clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
6.3.8 PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
6.3.9 Memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
6.3.10 EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
6.3.11 Electrical sensitivity characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
6.3.12 I/O current injection characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
6.3.13 I/O port characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
6.3.14 NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
6.3.15 12-bit ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
6.3.16 Timer characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
6.3.17 Communications interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
DS12323 Rev 3 3/91

4
Contents STM32L010F4/K4
7 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
7.1 TSSOP20 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
7.2 LQFP32 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
7.3 Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
8 Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
4/91 DS12323 Rev 3

STM32L010F4/K4 List of tables
List of tables
Table 1. STM32L010F4/K4 features and peripheral counts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Table 2. CPU frequency range depending on dynamic voltage scaling . . . . . . . . . . . . . . . . . . . . . . 14
Table 3. Functionalities depending on the working mode
(from Run/active down to Standby) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Table 4. STM32L010F4/K4 peripherals interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 5. Features of general purpose timers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Table 6. I2C implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Table 7. USART implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Table 8. SPI implementation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 9. Legend/abbreviations used in the pinout table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 10. Pin definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 11. Alternate functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Table 12. Voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Table 13. Current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 14. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 15. General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Table 16. Embedded reset and power control block characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 40
Table 17. Embedded internal reference voltage calibration values . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 18. Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 19. Current consumption in Run mode, code with data processing
running from Flash memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 20. Current consumption in Run mode vs code type, code with data processing
running from Flash memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 21. Current consumption in Run mode, code with data processing running from RAM . . . . . . 45
running from RAM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Table 23. Current consumption in Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Table 24. Current consumption in Low-power run mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Table 25. Current consumption in Low-power sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Table 26. Typical and maximum current consumptions in Stop mode . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 27. Typical and maximum current consumptions in Standby mode . . . . . . . . . . . . . . . . . . . . . 50
Table 28. Average current consumption during wakeup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Table 29. Peripheral current consumption in run or Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
Table 30. Peripheral current consumption in Stop and Standby mode . . . . . . . . . . . . . . . . . . . . . . . 53
Table 31. Low-power mode wakeup timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 32. High-speed external user clock characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Table 33. Low-speed external user clock characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Table 34. HSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Table 35. LSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Table 36. 16 MHz HSI16 oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Table 37. LSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Table 38. MSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Table 39. PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Table 40. RAM and hardware registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Table 41. Flash memory and data EEPROM characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Table 42. Flash memory and data EEPROM endurance and retention . . . . . . . . . . . . . . . . . . . . . . . 63
Table 43. EMS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
Table 44. EMI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
DS12323 Rev 3 5/91

6
List of tables STM32L010F4/K4
Table 45. ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Table 46. Electrical sensitivities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Table 47. I/O current injection susceptibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Table 48. I/O static characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Table 49. Output voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
Table 50. I/O AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 51. NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Table 52. ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 53. RAIN max for fADC = 16 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
Table 54. ADC accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Table 55. TIMx characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Table 56. I2C analog filter characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Table 57. SPI characteristics in voltage Range 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Table 60. TSSOP20 – 20-lead thin shrink small outline, 6.5 x 4.4 mm, 0.65 mm pitch,
package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Table 61. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data. . . . . . . . . . . . 86
Table 62. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 63. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
6/91 DS12323 Rev 3

STM32L010F4/K4 List of figures
List of figures
Figure 1. STM32L010F4/K4 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Figure 2. Clock tree . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Figure 3. STM32L010F4/K4 TSSOP20 pinout. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Figure 4. STM32L010F4/K4 LQFP32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Figure 5. Pin loading conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 6. Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 7. Power supply scheme. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 8. Current consumption measurement scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 9. IDD vs VDD, Run mode, code running from Flash memory, Range 2, HSI, 1 ws . . . . . . . . 44
Figure 10. IDD vs VDD, Run mode, code running from Flash memory, Range 2, HSE bypass, 1 ws . 45
Figure 11. IDD vs VDD, Low-power run mode executed from RAM, Range 3, MSI at 65 KHz, 0 ws . . 48
Figure 12. IDD vs VDD, Stop mode with RTC enabled and running from LSE on low drive . . . . . . . . . 49
Figure 13. IDD vs VDD, Stop mode with RTC disabled, all clocks off . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 14. High-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Figure 15. Low-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 16. HSE oscillator circuit diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 17. Typical application with a 32.768 kHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Figure 18. HSI16 minimum and maximum value versus temperature . . . . . . . . . . . . . . . . . . . . . . . . . 59
Figure 19. VIH/VIL versus VDD (CMOS I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Figure 20. VIH/VIL versus VDD (TTL I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Figure 21. I/O AC characteristics definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Figure 22. Recommended NRST pin protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Figure 23. ADC accuracy characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Figure 24. Typical connection diagram using the ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Figure 25. SPI timing diagram - slave mode and CPHA = 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Figure 26. SPI timing diagram - slave mode and CPHA = 1(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Figure 27. SPI timing diagram - master mode(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Figure 28. TSSOP20 – 20-lead thin shrink small outline, 6.5 x 4.4 mm, 0.65 mm pitch,
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
package footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
Figure 30. TSSOP20 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Figure 31. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package outline . . . . . . . . . . . . . . . . . . . 85
Figure 32. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package
recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
Figure 33. LQFP32 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
DS12323 Rev 3 7/91

7
Introduction STM32L010F4/K4
1 Introduction
The STM32L010F4/K4 ultra-low-power microcontrollers are part of the STM32L010 value

line.
The STM32L010F4/K4 features make these ultra-low-power microcontrollers suitable for a
wide range of applications:
• gas/water meters and industrial sensors
• healthcare and fitness equipment
• remote control and user interfaces
• PC peripherals, gaming, GPS equipment
• alarm systems, wired and wireless sensors, video intercom
This datasheet must be read in conjunction with the STM32L010 value line reference
manual (RM0451).
For information on the Arm®(a) Cortex®-M0+ core, refer to the Cortex®-M0+ Technical
Reference Manual, available from the www.arm.com website.
Figure 1 shows the general block diagram of the STM32L010F4/K4.
a. Arm is a registered trademark of Arm Limited (or its subsidiaries) in the US and/or elsewhere.
8/91 DS12323 Rev 3

STM32L010F4/K4 Description
2 Description
The ultra-low-power STM32L010F4/K4 microcontrollers incorporate the high-performance

Arm® Cortex®-M0+ 32-bit RISC core operating at 32 MHz, high-speed embedded memories
(16 Kbytes of Flash program memory, 128 bytes of data EEPROM and 2 Kbytes of RAM)
plus an extensive range of enhanced I/Os and peripherals.
The STM32L010F4/K4 provide high power efficiency over a wide performance range. This
is achieved with a large choice of internal and external clock sources, internal voltage
adaptation, and several low-power modes.
The STM32L010F4/K4 offer several analog features: one 12-bit ADC with hardware
oversampling, several timers, one low-power timer (LPTIM), two general-purpose 16-bit
timers, one RTC and one SysTick that can be used as timebases. The STM32L010F4/K4
also feature two watchdogs, one watchdog with independent clock and window capability,
and one window watchdog based on the bus clock.
Moreover, the STM32L010F4/K4 embed standard and advanced communication interfaces:
one I2C, one SPI, one USART, and a low-power UART (LPUART).
The STM32L010F4/K4 also include a real-time clock and a set of backup registers that
remain powered in Standby mode.
The ultra-low-power STM32L010F4/K4 operate from a 1.8 to 3.6 V power supply and in the
–40 to + 85 °C temperature range. A comprehensive set of power-saving modes allows the
design of low-power applications.
DS12323 Rev 3 9/91

28
Description STM32L010F4/K4
2.1 Device overview

Table 1. STM32L010F4/K4 features and peripheral counts
Feature and peripheral count STM32L010F4 STM32L010K4
Flash memory (Kbytes) 16

Data EEPROM (bytes) 128
RAM (Kbytes) 2
General-purpose 2
Timers
LPTIM 1
RTC / SYSTICK / IWDG / WWDG 1/1/1/1
SPI 1
Communication I2C 1
interfaces USART 1
LPUART 1
GPIOs 16 26
Clocks: HSE(1) / LSE / HSI / MSI / LSI 1/1/1/1/1
12-bit synchronized ADC / Number of
1/7 1/10
channels
Maximum CPU frequency 32 MHz
Operating voltage range 1.8 to 3.6 V
Ambient temperature: –40 to +85 °C
Operating temperatures
Junction temperature: –40 to +105 °C
Package TSSOP20 LQFP32
1. HSE available only as external clock input (HSE bypass).
10/91 DS12323 Rev 3

STM32L010F4/K4 Description
Figure 1. STM32L010F4/K4 block diagram
SWD SWD
FLASH
EEPROM
BOOT ADC1 AINx
MISO, MOSI,
SPI1 SCK, NSS
CORTEX M0+ CPU
Fmax:32MHz RAM A
P
DBG B
DMA1 2
NVIC TIM21 2ch
EXTI
BRIDGE
CRC
BRIDGE
IN1, IN2,
PA[0:15] GPIO PORT A LPTIM1 ETR, OUT
AHB: Fmax 32MHz
PB[0:15] GPIO PORT B
SCL, SDA,
WWDG I2C1
SMBA
PC[14:15] GPIO PORT C
A
P
B RX, TX, RTS,
USART2
1 CTS, CK
RX, TX,
LPUART1 RTS, CTS
CK_IN HSE HSI 16M
LSI IWDG
TIM2 4ch
PLL
MSI RTC
BCKP REG
WKUPx RESET & CLK
OSC32_IN, LSE
OSC32_OUT
VREF_OUT
PMU
NRST
VDDA
VDD REGULATOR
MSv48124V1
DS12323 Rev 3 11/91

28
Description STM32L010F4/K4
2.2 Ultra-low-power device continuum

The ultra-low-power microcontrollers’ family offers a large choice of core and features, from
8-bit proprietary core up to Arm® Cortex®-M4, including Arm® Cortex®-M3 and
Arm® Cortex®-M0+. The STM32Lx series are the best choice to answer application needs in
terms of ultra-low-power features and the best solution for applications such as gas/water
meter, keyboard/mouse or fitness and healthcare applications.
Several built-in features, like LCD drivers, dual-bank memory, low-power Run mode,
operational amplifiers, 128-bit AES, DAC, crystal-less USB and many others, definitely help
building a highly cost optimized application by reducing BOM cost. STMicroelectronics, as a
reliable and long-term manufacturer, ensures as much as possible pin-to-pin compatibility
between all STM8Lx and STM32Lx on one hand, and between all STM32Lx and STM32Fx
on the other hand.
Thanks to this scalability, any legacy application can be upgraded to respond to the latest
market feature and efficiency requirements.
12/91 DS12323 Rev 3

STM32L010F4/K4 Functional overview
3 Functional overview
3.1 Low-power modes

The STM32L010F4/K4 support dynamic voltage scaling to optimize its power consumption
in Run mode. The voltage from the internal low-drop regulator that supplies the logic, can be
adjusted according to the maximum operating frequency of the system.
There are three power consumption ranges:
• Range 1 with the CPU running at up to 32 MHz
• Range 2 with a maximum CPU frequency of 16 MHz
• Range 3 with a maximum CPU frequency limited to 4.2 MHz
Seven low-power modes are provided to achieve the best compromise between low-power
consumption, short startup time and available wakeup sources:
• Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can
wake up the CPU when an interrupt/event occurs. The power consumption in this
mode, at 16 MHz, is about 1 mA with all peripherals off.
• Low-power run mode
This mode is achieved with the multispeed internal (MSI) RC oscillator set to the low-
speed clock (max 131 kHz), execution from SRAM or Flash memory, and internal
regulator in low-power mode to minimize its operating current. In Low-power run mode,
the clock frequency and the number of enabled peripherals are both limited.
• Low-power sleep mode
This mode is achieved by entering Sleep mode with the internal voltage regulator in
low-power mode to minimize its operating current. In Low-power sleep mode, both the
clock frequency and the number of enabled peripherals are limited; a typical example is
to have a timer running at 32 kHz.
When wakeup is triggered by an event or an interrupt, the system reverts to the Run
mode with the regulator on.
• Stop mode with RTC
The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents and real time clock. All clocks in the VCORE domain are stopped, the
PLL, HSE input, MSI and HSI RC oscillators are disabled. The LSE or LSI is still
running. The voltage regulator is in Low-power mode.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The device can be woken up from Stop mode by any of the EXTI line. In 3.5 µs, the
processor serves the interrupt or resume the code. The EXTI line source can be any
GPIO, the RTC alarm/tamper/timestamp/wakeup events, or the
USART/I2C/LPUART/LPTIM wakeup events.
DS12323 Rev 3 13/91

28
Functional overview STM32L010F4/K4
• Stop mode without RTC

The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents. All clocks are stopped. The PLL, MSI RC, HSI and LSI RC, HSE
bypass input and LSE crystal oscillator are disabled.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The voltage regulator is in Low-power mode. The device can be woken up from Stop
mode by any of the EXTI line. In 3.5 µs, the processor serves the interrupt or resume
the code. The EXTI line source can be any GPIO. It can also be wakened by the
USART/I2C/LPUART/LPTIM wakeup events.
• Standby mode with RTC
The Standby mode is used to achieve the lowest power consumption and real time
clock. The internal voltage regulator is switched off so that the entire VCORE domain is
powered off. The PLL, MSI RC, HSE bypass and HSI RC oscillators are also switched
off. The LSE or LSI is still running. After entering Standby mode, the RAM and register
contents are lost except for registers in the Standby circuitry (wakeup logic, IWDG,
RTC, LSI, LSE Crystal 32 kHz oscillator, RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin), an IWDG
reset, a rising edge on one of the three WKUP pins, RTC alarm (Alarm A or Alarm B),
RTC tamper event, RTC timestamp event or RTC wakeup event occurs.
• Standby mode without RTC
The Standby mode is used to achieve the lowest power consumption. The internal
voltage regulator is switched off so that the entire VCORE domain is powered off. The
PLL, MSI RC, HSI and LSI RC, HSE bypass and LSE crystal oscillator are also
switched off. After entering Standby mode, the RAM and register contents are lost
except for registers in the Standby circuitry (wakeup logic, IWDG, RTC, LSI, LSE
Crystal 32 kHz oscillator, RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin) or a rising
edge on one of the three WKUP pin occurs.
Note: The RTC, the IWDG, and the corresponding clock sources are not stopped automatically by
entering Stop or Standby mode.
For power supply voltage range 1.8 V-2.0 V, CPU frequency changes from initial to final
must respect the condition: fCPU initial < 4fCPU initial. It must also respect 5 µs delay between
two changes. For example, switch from 4.2 MHz to 32 MHz can be split in switch from
4.2 MHz to 16 MHz, wait 5 µs, then switch from 16 MHz to 32 MHz.
Table 2. CPU frequency range depending on dynamic voltage scaling
CPU frequency range (number of wait state) Dynamic voltage scaling range
16 MHz to 32 MHz (1ws) - 32 kHz to 16 MHz (0ws) Range 1

8 MHz to 16 MHz (1ws) - 32 kHz to 8 MHz (0ws) Range 2
32 kHz to 4.2 MHz (0ws) Range 3
14/91 DS12323 Rev 3


(from Run/active down to Standby)(1)(2)
Low- Low- Stop mode Standby mode
Run/active Sleep power power
IP
mode mode run sleep Wakeup Wakeup
mode mode capability capability
CPU Y - Y - - - - -
Flash memory O O O O - - - -
RAM Y Y Y Y Y - - -
Backup registers Y Y Y Y Y - Y -
EEPROM O O O O - - - -
Brownout reset (BOR) O O O O O O O O
DMA O O O O - - - -
Power-on/down reset
Y Y Y Y Y Y Y Y
(POR/PDR)
(3)
High speed internal (HSI) O O - - - - -
High speed external (HSE) O O O O - - - -
Low speed internal (LSI) O O O O O - O -
Low speed external (LSE) O O O O O - O -
Multispeed internal (MSI) O O Y Y - - - -
Interconnect controller Y Y Y Y Y - - -
RTC O O O O O O O -
RTC tamper O O O O O O O O
Auto wakeup (AWU) O O O O O - O O
(4)
USART O O O O O O - -
(4)
LPUART O O O O O O - -
SPI O O O O - - - -
I2C O O - - O(5) O - -
ADC O O - - - - - -
16-bit timers O O O O - - - -
LPTIM O O O O O O - -
IWDG O O O O O O O O
WWDG O O O O - - - -
SysTick timer O O O O - - - -
GPIOs O O O O O O - 2 pins
6 CPU 7 CPU
Wakeup time to Run mode 0 µs 3 µs 5 µs 65 µs
cycles cycles
DS12323 Rev 3 15/91

28

(from Run/active down to Standby)(1)(2) (continued)
Low- Low- Stop mode Standby mode
Run/active Sleep power power
IP
mode mode run sleep Wakeup Wakeup
mode mode capability capability
0.29 µA (no 0.1 µA (no RTC)

RTC) VDD=1.8 V VDD=1.8 V
Down to Down to 0.54 µA (with 0.41 µA (with RTC)

Down RTC) VDD=1.8 V VDD=1.8 V
Consumption 140 µA/MHz 37 µA/MHz Down
to
VDD=1.8 to 3.6 V (typ) (from Flash (from Flash to 8 µA 0.34 µA (no 0.23 µA (no RTC)
4.5 µA
memory) memory) RTC) VDD=3.0 V VDD=3.0 V
0.67 µA (with 0.53 µA (with RTC)
RTC) VDD=3.0 V VDD=3.0 V
1. Legend:
“Y” = Yes (enable).
“O” = Optional (can be enabled/disabled by software)
“-” = Not available
2. The consumption values given in this table are preliminary data given for indication. They are subject to slight changes.
3. Some peripherals with wakeup from Stop capability can request HSI to be enabled. In this case, HSI is woken up by the
peripheral, and only feeds the peripheral which requested it. HSI is automatically put off when the peripheral does not need
it anymore.
4. USART and LPUART reception is functional in Stop mode. It generates a wakeup interrupt on Start.To generate a wakeup
on address match or received frame event, the LPUART can run on LSE clock while the USART has to wake up or keep
running the HSI clock.
5. I2C address detection is functional in Stop mode. It generates a wakeup interrupt in case of address match. It wakes up the
HSI during reception.
3.2 Interconnect matrix

Several peripherals are directly interconnected. This allows autonomous communication
between peripherals, thus saving CPU resources and power consumption. In addition,
these hardware connections allow fast and predictable latency.
Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power

run, Low-power sleep and Stop modes.
Table 4. STM32L010F4/K4 peripherals interconnect matrix

Inter- Low- Low-
Interconnect
connect Interconnect action Run Sleep power power Stop
source
destination run sleep
TIMx TIMx Timer triggered by other timer Y Y Y Y -

TIM21 Timer triggered by auto wakeup Y Y Y Y -
RTC
LPTIM1 Timer triggered by RTC event Y Y Y Y Y
Clock source used as input channel
All clocks TIMx Y Y Y Y -
for RC measurement and trimming
16/91 DS12323 Rev 3

Table 4. STM32L010F4/K4 peripherals interconnect matrix (continued)

Inter- Low- Low-
Interconnect
connect Interconnect action Run Sleep power power Stop
source
destination run sleep
TIMx Timer input channel and trigger Y Y Y Y -

GPIO LPTIM1 Timer input channel and trigger Y Y Y Y Y
ADC Conversion trigger Y Y Y Y -
3.3 Arm® Cortex®-M0+ core

The Cortex-M0+ processor is an entry-level 32-bit Arm Cortex processor designed for a
broad range of embedded applications. It offers significant benefits to developers, including:
• a simple architecture that is easy to learn and program
• ultra-low power, energy-efficient operation
• excellent code density
• deterministic, high-performance interrupt handling
• upward compatibility with Cortex-M processor family
• platform security robustness
The Cortex-M0+ processor is built on a highly area and power optimized 32-bit processor
core, with a 2-stage pipeline von Neumann architecture. The processor delivers exceptional
energy efficiency through a small but powerful instruction set and extensively optimized
design, providing high-end processing hardware including a single-cycle multiplier.
The Cortex-M0+ processor provides the exceptional performance expected of a modern 32-
bit architecture, with a higher code density than other 8-bit and 16-bit microcontrollers.
Owing to its embedded Arm core, the STM32L010F4/K4 are compatible with all Arm tools
and software.
Nested vectored interrupt controller (NVIC)

The ultra-low-power STM32L010F4/K4 embed a nested vectored interrupt controller, able to
handle up to 32 maskable interrupt channels and 4 priority levels.
The Cortex-M0+ processor closely integrates a configurable nested vectored interrupt
controller (NVIC), to deliver industry-leading interrupt performance.
The NVIC includes a non-maskable interrupt (NMI) and provides zero jitter interrupt option
plus four interrupt priority levels.
The tight integration of the processor core and NVIC provides fast execution of interrupt
service routines (ISRs), reducing the interrupt latency. This is achieved through the
hardware stacking of registers, and the ability to abandon and restart load-multiple and
store-multiple operations. Interrupt handlers do not require any assembler wrapper code,
removing any code overhead from the ISRs. Tail-chaining optimization also significantly
reduces the overhead when switching from one ISR to another.
To optimize low-power designs, the NVIC integrates sleep modes, such as a deep-sleep
function that enables the entire device to enter rapidly Stop or Standby mode.
This hardware block provides flexible interrupt management features with minimal interrupt
latency.
DS12323 Rev 3 17/91

28
3.4 Reset and supply management
3.4.1 Power supply schemes

• VDD (1.8 to 3.6 V): external power supply for I/Os and the internal regulator. Provided
externally through VDD pins.
• VSSA, VDDA (1.8 to 3.6 V): external analog power supplies for ADC, reset blocks, RCs
and PLL. VDDA and VSSA must be connected to VDD and VSS, respectively.
3.4.2 Power supply supervisor

The STM32L010F4/K4 feature an integrated zeropower power-on reset (POR)/power-down
reset (PDR) that can be coupled with a brownout reset (BOR) circuitry.
After the VDD threshold is reached, the option byte loading process starts, either to confirm
or modify default thresholds, or to disable the BOR permanently.
The BOR is active at power-on, and ensures proper operation starting from 1.8 V, whatever
the power ramp-up phase before it reaches 1.8 V.
Five BOR thresholds are available through option bytes, starting from 1.8 V to 3 V. To
reduce the power consumption in Stop mode, it is possible to automatically switch off the
internal reference voltage (VREFINT) in Stop mode. The device remains in reset mode when
VDD is below a specified threshold, VPOR/PDR or VBOR, without the need for any external
reset circuit.
3.4.3 Voltage regulator

The regulator has three operation modes: main (MR), low power (LPR) and power down.
• MR is used in Run mode (nominal regulation)
• LPR is used in the Low-power run, Low-power sleep and Stop modes
• Power down is used in Standby mode. The regulator output is high impedance, the
kernel circuitry is powered down, inducing zero consumption but the contents of the
registers and RAM are lost except for the standby circuitry (wakeup logic, IWDG, RTC,
LSI, LSE crystal 32 kHz oscillator, RCC_CSR).
3.4.4 Boot modes

At startup, BOOT0 pin and nBOOT0, nBOOT1 and nBOOT_SEL option bits are used to
select one of the three following boot options:
• Boot from Flash memory
• Boot from system memory
• Boot from embedded RAM
The bootloader is located in system memory. It is used to reprogram the Flash memory by
using SPI1 (PA4, PA5, PA6 and PA7) or USART2 (PA2, PA3).
If the bootloader is activated (the bootloader is active on all empty devices due to the empty
check mechanism), then the above mentioned bits are configured depending on whether
SPI1 or USART2 functionality is used.
See the application note STM32 microcontroller system memory boot mode (AN2606) for
more details.
18/91 DS12323 Rev 3

3.5 Clock management

The clock controller distributes the clocks coming from different oscillators to the core and
the peripherals. It also manages clock gating for low-power modes and ensures clock
robustness. Its associated features are the listed below:
• Clock prescaler
To get the best trade-off between speed and current consumption, the clock frequency
to the CPU and peripherals can be adjusted by a programmable prescaler.
• Safe clock switching
Clock sources can be changed safely on the fly in Run mode through a configuration
register.
• Clock management
To reduce power consumption, the clock controller can stop the clock to the core,
individual peripherals or memory.
• System clock source
Three different clock sources are available to drive the master clock SYSCLK:
– 0-32 MHz high-speed external (HSE bypass), that can supply a PLL
– 16 MHz high-speed internal RC oscillator (HSI), trimmable by software, that can
supply a PLL
– multispeed internal RC oscillator (MSI), trimmable by software, able to generate
seven frequencies (65 kHz, 131 kHz, 262 kHz, 524 kHz, 1.05 MHz, 2.1 MHz
and 4.2 MHz). When a 32.768 kHz clock source is available in the system (LSE),
the MSI frequency can be trimmed by software down to a ±0.5% accuracy.
• Auxiliary clock source
Two ultra-low-power clock sources can be used to drive the real-time clock:
– 32.768 kHz low-speed external crystal (LSE)
– 37 kHz low-speed internal RC (LSI), also used to drive the independent watchdog.
The LSI clock can be measured using the high-speed internal RC oscillator for
greater precision.
• RTC clock sources
The LSI, LSE or HSE sources can be chosen to clock the RTC, whatever the system
clock.
• Startup clock
After reset, the microcontroller restarts by default with an internal 2 MHz clock (MSI).
The prescaler ratio and clock source can be changed by the application program as
soon as the code execution starts.
• Clock security system (CSS)
This feature can be enabled by software. If an LSE clock failure occurs, it provides an
interrupt or wakeup event that is generated assuming it has been previously enabled.
This feature is not available on the HSE clock.
• Clock-out capability (MCO: microcontroller clock output)
It outputs one of the internal clocks for external use by the application.
Several prescalers allow the configuration of the AHB frequency, each APB (APB1 and
APB2) domains. The maximum frequency of the AHB and the APB domains is 32 MHz.
See Figure 2 for details on the clock tree.
DS12323 Rev 3 19/91

28
Figure 2. Clock tree
@V33 Enable Watchdog

Watchdog LS Legend:
LSI RC LSI tempo HSE = High-speed external clock signal
RTCSEL HSI = High-speed internal clock signal
LSI = Low-speed internal clock signal
RTC2 enable LSE = Low-speed external clock signal
MSI = Multispeed internal clock signal
RTC
LSE OSC LSE tempo
LSU LSD LSD
@V18
@V33 MCOSEL ADC enable

LSI
MSI RC ADCCLK
MSI LSE
Level shifters
@V18 / 1,2,4,8,16 MCO
not deepsleep
/ 2,4,8,16
@V33 CK_PWR
not deepsleep
HSI16 RC
ck_rchs HSI16
Level shifters / 1,4 not (sleep or FCLK
@V18 deepsleep)
System
Clock not (sleep or HCLK
deepsleep)
/8
MSI TIMxCLK
@V33
HSI16 AHB
HSE OSC 4 MHz PRESC
HSE PCLK1 to APB1
Level shifters PLLSRC / 1,2,…, 512 peripherals
@V18 @V33
PLLCLK APB1
PRESC
ck_pllin PLL / 1,2,4,8,16
LSU X Peripheral
@V33 3,4,6,8,12,16, clock enable
24,32,48 to TIMx
1 MHz Clock / 2,3,4
If (APB1 presc=1) x1
Detector else x2)
Level shifters
Peripheral
@VDDCORE
HSE present or not Clock clock enable
LSD PCLK2 to APB2
Source 32 MHz peripherals
APB2 max.
Control PRESC
/ 1,2,4,8,16
Peripheral
clock enable
to TIMx
If (APB2 presc=1) x1
else x2)
Peripherals
LSI enable
LPTIMCLK
LSE Peripherals
enable
HSI16
SYSCLK
PCLK Peripherals LPUART/
enable UARTCLK
I2C1CLK
MSv34747V2
20/91 DS12323 Rev 3

3.6 Low-power real-time clock and backup registers

The real time clock (RTC) and the 5 backup registers are supplied in all modes including
Standby mode. The backup registers are five 32-bit registers used to store 20 bytes of user
application data. They are not reset by a system reset, or when the device wakes up from
Standby mode.
The RTC is an independent BCD (binary-coded decimal) timer/counter. Its main features
are the following:
• Calendar with subsecond, second, minute, hour (12 or 24 format), week, day, date,
month and year, in BCD format
• Automatically correction for 28, 29 (leap year), 30, and 31 day of the month
• Two programmable alarms with wakeup capability from Stop and Standby modes
• Periodic wakeup from Stop and Standby modes, with programmable resolution and
period
• On-the-fly correction from 1 to 32767 RTC clock pulses. This can be used to
synchronize with a master clock.
• Reference clock detection: a more precise second-source clock (50 or 60 Hz) can be
used to enhance the calendar precision.
• Digital calibration circuit with 1 ppm resolution, to compensate for quartz crystal
inaccuracy
• Two anti-tamper detection pins with programmable filter. The MCU can be woken up
from Stop and Standby modes, on tamper event detection.
• Timestamp feature that can be used to save the calendar content. This function can be
triggered by an event on the timestamp pin, or by a tamper event. The MCU can be
woken up from Stop and Standby modes on timestamp event detection.
The possible RTC clock sources are listed below:
• a 32.768 kHz external crystal
• a resonator or oscillator
• the internal low-power RC oscillator (typical frequency of 37 kHz)
• the high-speed external clock
3.7 General-purpose inputs/outputs (GPIOs)

Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIOs are shared with digital or analog alternate functions, and can be individually
remapped using dedicated alternate function registers. All GPIOs are high current capable.
Each GPIO output speed can be slowed (40 MHz, 10 MHz, 2 MHz, 400 kHz). The alternate
function configuration of I/Os can be locked if needed following a specific sequence in order
to avoid spurious writing to the I/O registers. The I/O controller is connected to a dedicated
I/O bus with a toggling speed of up to 32 MHz.
Extended interrupt/event controller (EXTI)

The extended interrupt/event controller consists of 23 edge detector lines used to generate
interrupt/event requests. Each line can be individually configured to select the trigger event
(rising edge, falling edge, both) and can be masked independently. A pending register
maintains the status of the interrupt requests. The EXTI detects an external line with a pulse
width shorter than the Internal APB2 clock period. Up to 26 GPIOs can be connected to the
DS12323 Rev 3 21/91

28
16 configurable interrupt/event lines. The 7 other lines are connected to RTC, USART, I2C,
LPUART or LPTIM events.
3.8 Memories
The STM32L010F4/K4 integrate the following memories:
• 2 Kbytes of embedded SRAM accessed (read/write) at CPU clock speed with 0 wait
state. With the enhanced bus matrix, operating the RAM does not lead to any
performance penalty during accesses to the system bus (AHB and APB buses).
• the non-volatile memory divided into three arrays:
– 16 Kbytes of embedded Flash program memory
– 128 bytes of data EEPROM
– information block containing 32 user and factory options bytes, plus 4 Kbytes of
system memory
The user options bytes are used to write-protect or read-out protect the memory (4-Kbyte
granularity) and/or readout-protect the whole memory with the following options:
• Level 0: no protection
• Level 1: memory readout protected
The Flash memory cannot be read or written if either debug features are connected or
boot in RAM is selected.
• Level 2: chip readout protected, debug features (Cortex-M0+ serial wire) and boot in
RAM selection disabled (debugline fuse)
3.9 Direct memory access (DMA)

The flexible 7-channel, general-purpose DMA is able to manage memory-to-memory,
peripheral-to-memory and memory-to-peripheral transfers. The DMA controller supports
circular buffer management, avoiding the generation of interrupts when the controller
reaches the end of the buffer.
Each channel is connected to dedicated hardware DMA requests, with software trigger
support for each channel. Configuration is done by software and transfer sizes between
source and destination are independent.
The DMA can be used with the main peripherals: SPI, I2C, USART, LPUART,
general-purpose timers, and ADC.
3.10 Analog-to-digital converter (ADC)

A native 12-bit, extended to 16-bit through hardware oversampling, analog-to-digital
converter is embedded into the STM32L010F4/K4. The ADC has up to 10 external channels
and one internal channel (voltage reference). Three channels (PA0, PA4 and PA5) are fast
channels, while the others are standard channels.
The ADC performs conversions in single-shot or scan mode. In scan mode, automatic
conversion is performed on a selected group of analog inputs.
The ADC frequency is independent from the CPU frequency, allowing maximum sampling
rate of 1.14 Msps even with a low CPU speed. The ADC consumption is low at all
22/91 DS12323 Rev 3

frequencies (~25 µA at 10 ksps, ~200 µA at 1 Msps). An auto-shutdown function

guarantees that the ADC is powered off except during the active conversion phase.
The ADC can be served by the DMA controller.
The ADC features a hardware oversampler up to 256 samples, this improves the resolution
to 16 bits. See the application note Improving STM32F1x and STM32L1x ADC resolution by
oversampling (AN2668).
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions and timers.
3.11 Internal voltage reference (VREFINT)

The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the
ADC. VREFINT is internally connected to the ADC_IN17 input channel. It enables accurate
monitoring of the VDD value (since no external voltage, VREF+, is available for ADC). The
precise voltage of VREFINT is individually measured for each part by ST during production
test and stored in the system memory area (see Table 17: Embedded internal reference
voltage calibration values). It is accessible in read-only mode.
Reference voltage
The internal reference voltage is available externally via a low-power / low-current output
buffer (driving current capability of 1 µA typical).
3.12 System configuration controller

The system configuration controller provides the capability to remap some alternate
functions on different I/O ports.
The highly flexible routing interface allows the application firmware to control the routing of
different I/Os to the TIM2, TIM21 and LPTIM1 timer input captures. The system
configuration controller also controls the routing of internal analog signals to the ADC and
the internal reference voltage VREFINT.
DS12323 Rev 3 23/91

28
3.13 Timers and watchdogs

The ultra-low-power STM32L010F4/K4 include two general-purpose timers, one low- power
timer (LPTIM1), two watchdog timers and the SysTick timer.
3.13.1 General-purpose timers (TIM2, TIM21)

Table 5 compares the features of the general-purpose timers.
Table 5. Features of general purpose timers

DMA
Counter Counter Capture/compare Complementary
Timer Prescaler factor request
resolution type channels outputs
generation
Up,
Any integer
TIM2 16-bit down, Yes 4 No
between 1 and 65536
up/down
Up,
Any integer
TIM21 16-bit down, No 2 No
between 1 and 65536
up/down
TIM2
This timer is based on 16-bit auto-reload up/down counter. It includes a 16-bit prescaler and
four independent channels for input capture/output compare, PWM or one-pulse mode
output.
TIM2 can work together and be synchronized with the TIM21 timer via the Timer Link
feature for synchronization or event chaining. The TIM2 counter can be frozen in debug
mode. Any of the general-purpose timers can be used to generate PWM outputs.
TIM2 has independent DMA request generation.
This timer is capable of handling quadrature (incremental) encoder signals and the digital
outputs from 1 to 3 hall-effect sensors.
TIM21
This timer is based on a 16-bit auto-reload up/down counter. It includes a 16-bit prescaler
and two independent channels for input capture/output compare, PWM or one-pulse mode
output. TIM21 can work together and be synchronized with TIM2.
TIM21 can also be used as a simple timebase and be clocked by the LSE (32.768 kHz) to
provide independent timebase from the main CPU clock.
24/91 DS12323 Rev 3

3.13.2 Low-power timer (LPTIM)

LPTIM1 has an independent clock and is running also in Stop mode if it is clocked by LSE,
LSI or an external clock. This timer is able to wakeup the STM32L010F4/K4 from Stop
mode.
LPTIM1 supports the following features:
• 16-bit up counter with 16-bit autoreload register
• 16-bit compare register
• Configurable output: pulse, PWM
• Continuous / one shot mode
• Selectable software / hardware input trigger
• Selectable clock source
– Internal clock source: LSE, LSI, HSI or APB clock
– External clock source over LPTIM1 input (working even with no internal clock
source running, used by the pulse counter application)
• Programmable digital glitch filter
• Encoder mode
3.13.3 SysTick timer

This timer is dedicated to the OS, but can also be used as a standard downcounter. It is
based on a 24-bit downcounter with autoreload capability and a programmable clock
source. It features a maskable system interrupt generation when the counter reaches ‘0’.
3.13.4 Independent watchdog (IWDG)

The independent watchdog is based on a 12-bit downcounter and 8-bit prescaler. It is
clocked from an independent 37 kHz internal RC and, as it operates independently of the
main clock, it can operate in Stop and Standby modes. IWDG can be used either as a
watchdog to reset the device when a problem occurs, or as a free-running timer for
application timeout management. It is hardware- or software-configurable through the option
bytes. The counter can be frozen in debug mode.
3.13.5 Window watchdog (WWDG)

The window watchdog is based on a 7-bit downcounter that can be set as free-running. It
can be used as a watchdog to reset the device when a problem occurs. It is clocked from
the main clock. It has an early warning interrupt capability and the counter can be frozen in
debug mode.
3.14 Communication interfaces
3.14.1 I2C bus

One I2C interface (I2C1) can operate in multimaster or slave mode. The I2C interface can
support Standard mode up to 100 kbit/s and Fast mode (Fm) up to 400 kbit/s.
The I2C interface supports 7-bit and 10-bit addressing modes, multiple 7-bit slave
addresses (2 addresses, 1 with configurable mask).
DS12323 Rev 3 25/91

28
In addition, I2C1 provides hardware support for SMBus 2.0 and PMBus 1.1: ARP capability,
Host notify protocol, hardware CRC (PEC) generation/verification, timeouts verifications and
ALERT protocol management. I2C1 also has a clock domain independent from the CPU
clock, allowing the I2C1 to wake up the MCU from Stop mode on address match.
The I2C interface can be served by the DMA controller.
Refer to Table 6 for the supported modes and features of I2C interface.
Table 6. I2C implementation

I2C features(1) I2C1
7-bit addressing mode X

10-bit addressing mode X
Standard mode (up to 100 kbit/s) X
Fast mode (up to 400 kbit/s) X
Fast mode plus with 20 mA output drive I/Os (up to 1 Mbit/s) -
Independent clock X
SMBus X
Wakeup from Stop X
1. X = supported.
3.14.2 Universal synchronous/asynchronous receiver transmitter (USART)

The USART interface (USART2) is able to communicate at speeds of up to 4 Mbit/s.
It provides hardware management of the CTS, RTS and RS485 driver enable (DE) signals,
multiprocessor communication mode and single-wire half-duplex communication mode.
The UART2 interface can be served by the DMA controller.
Table 7 for the supported modes and features of the USART interface.
Table 7. USART implementation

USART modes/features(1) USART2
Hardware flow control for modem X

Continuous communication using DMA X
Multiprocessor communication X
Synchronous mode -
Smartcard mode -
Single-wire half-duplex communication X
IrDA SIR ENDEC block -
LIN mode -
Dual clock domain and wakeup from Stop mode -
Receiver timeout interrupt -
Modbus communication -
26/91 DS12323 Rev 3

Table 7. USART implementation (continued)

USART modes/features(1) USART2
Auto baud rate detection (4 modes) -

Driver enable X
1. X = supported.
3.14.3 Low-power universal asynchronous receiver transmitter (LPUART)

The STM32L010F4/K4 embed one low-power UART. The LPUART supports asynchronous
serial communication with minimum power consumption. It supports half-duplex single-wire
communication and modem operations (CTS/RTS). It allows multiprocessor
communication.
The LPUART has a clock domain independent from the CPU clock, and can wake up the
system from Stop mode, using baudrates up to 46 kbauds. The wakeup events from Stop
mode are programmable and can be one of the following:
• start bit detection
• any received data frame
• a specific programmed data frame
Only a 32.768 kHz clock (LSE) is needed to allow LPUART communication up to
9600 bauds. Therefore, even in Stop mode, the LPUART can wait for an incoming frame
while having an extremely low energy consumption. Higher speed clock can be used to
reach higher baudrates.
LPUART interface can be served by the DMA controller.
3.14.4 Serial peripheral interface (SPI)

The SPI is able to communicate at up to 16 Mbit/s in slave and master modes in full-duplex
and half-duplex communication modes. The 3-bit prescaler gives 8 master mode
frequencies and the frame is configurable to 8 bits or 16 bits. The hardware CRC
generation/verification supports basic SD Card / MMC modes.
The SPI can be served by the DMA controller.
Refer to Table 8 for the supported modes and features of SPI interface.
Table 8. SPI implementation

SPI features(1) SPI1
Hardware CRC calculation X

I2S mode -
TI mode X
1. X = supported.
3.15 Cyclic redundancy check (CRC) calculation unit

The CRC (cyclic redundancy check) calculation unit is used to get a CRC code using a
configurable generator polynomial value and size.
DS12323 Rev 3 27/91

28
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the EN/IEC 60335-1 standard, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps to compute a signature
of the software during runtime, to be compared with a reference signature generated at
linktime and stored at a given memory location.
3.16 Serial wire debug port (SW-DP)

An Arm SW-DP interface is provided to allow a serial wire debugging tool to be connected to
the MCU.
28/91 DS12323 Rev 3

STM32L010F4/K4 Pin descriptions
4 Pin descriptions
Figure 3. STM32L010F4/K4 TSSOP20 pinout
PB9-BOOT0 1 20 PA14
PC14-OSC32_IN 2 19 PA13
PC15-OSC32_OUT 3 18 PA10
NRST 4 17 PA9
VDDA 5 16 VDD
PA0-CK_IN 6 15 VSS
PA1 7 14 PB1
PA2 8 13 PA7
PA3 9 12 PA6
PA4 10 11 PA5
MSv37875V1
1. The above figure shows the package top view.
Figure 4. STM32L010F4/K4 LQFP32 pinout

PB9-BOOT0
PA15
VSS
PB7
PB6
PB5
PB4
PB3
32 31 30 29 28 27 26 25
VDD 1 24 PA14
PC14-OSC32_IN 2 23 PA13
PC15-OSC32_OUT 3 22 PA12
NRST 4 LQFP32 21 PA11
VDDA 5 20 PA10
PA0-CK_IN 6 19 PA9
PA1 7 18 PA8
PA2 8 17 VDD
9 10 11 12 1 3 14 15 16
PB0
PB1
VSS
PA3
PA4
PA5
PA6
PA7
MSv37870V1
1. The above figure shows the package top view.
DS12323 Rev 3 29/91

34
Pin descriptions STM32L010F4/K4
Table 9. Legend/abbreviations used in the pinout table

Name Abbreviation Definition
Unless otherwise specified in brackets below the pin name, the pin function during and after
Pin name
reset is the same as the actual pin name
S Supply pin
Pin type I Input only pin
I/O Input/output pin
FT 5 V tolerant I/O
I/O structure TTa 3.3 V tolerant I/O directly connected to the ADC
TC Standard 3.3 V I/O
Notes Unless otherwise specified by a note, all I/Os are set as analog inputs during and after reset.
Alternate
Functions selected through GPIOx_AFR registers
Pin functions
functions Additional
Functions directly selected/enabled through peripheral registers
functions
Table 10. Pin definitions

Pin
Pin functions
number
I/O
Pin name (function Pin Not
struct
TSSOP20
LQFP32
after reset) type es

ure
Alternate functions Additional functions
(1)
- 1 VDD S - - -
2 2 PC14-OSC32_IN I/O FT - - OSC32_IN
3 3 PC15-OSC32_OUT I/O TC - - OSC32_OUT
(2)
4 4 NRST I/O RST - -
(3)
5 5 VDDA S - - -
USART2_RX, LPTIM1_IN1, ADC_IN0,
6 6 PA0-CK_IN I/O TTa - TIM2_CH1, USART2_CTS, RTC_TAMP2/WKUP1/
TIM2_ETR, LPUART1_RX CK_IN
EVENTOUT, LPTIM1_IN2,
TIM2_CH2, I2C1_SMBA,
7 7 PA1 I/O FT - ADC_IN1
USART2_RTS, TIM21_ETR,
LPUART1_TX
ADC_IN2,
TIM21_CH1, TIM2_CH3,
8 8 PA2 I/O TTa - RTC_TAMP3/RTC_TS/
USART2_TX, LPUART1_TX
RTC_OUT/WKUP3
TIM21_CH2, TIM2_CH4,
USART2_RX, LPUART1_RX
30/91 DS12323 Rev 3

STM32L010F4/K4 Pin descriptions
Table 10. Pin definitions (continued)

Pin
Pin functions
number
I/O
struct
TSSOP20
LQFP32

ure
SPI1_NSS, LPTIM1_IN1,
LPTIM1_ETR, I2C1_SCL,
10 10 PA4 I/O TTa - ADC_IN4
USART2_CK, TIM2_ETR,
LPUART1_TX
SPI1_SCK, LPTIM1_IN2,
11 11 PA5 I/O TTa - ADC_IN5
TIM2_ETR, TIM2_CH1
SPI1_MISO, LPTIM1_ETR,
LPUART1_CTS, EVENTOUT
SPI1_MOSI, LPTIM1_OUT,
13 13 PA7 I/O FT - USART2_CTS, TIM21_ETR, ADC_IN7
EVENTOUT
EVENTOUT, SPI1_MISO,
- 14 PB0 I/O FT - TIM2_CH2, USART2_RTS, ADC_IN8, VREF_OUT
TIM2_CH3
USART2_CK, SPI1_MOSI,
14 15 PB1 I/O FT - LPTIM1_IN1, LPUART1_RTS, ADC_IN9, VREF_OUT
TIM2_CH4
(4)
15 16 VSS S - - -
(1)
16 17 VDD S - - -
MCO, LPTIM1_IN1, EVENTOUT,
- 18 PA8 I/O FT - -
USART2_CK, TIM2_CH1
MCO, I2C1_SCL, LPTIM1_OUT,
17 19 PA9 I/O FT - -
USART2_TX, TIM21_CH2
TIM21_CH1, I2C1_SDA,
18 20 PA10 I/O FT - RTC_REFIN, USART2_RX, -
TIM2_CH3
SPI1_MISO, LPTIM1_OUT,
- 21 PA11 I/O FT - EVENTOUT, USART2_CTS, -
TIM21_CH2
SPI1_MOSI, EVENTOUT,
- 22 PA12 I/O FT - -
USART2_RTS
SWDIO, LPTIM1_ETR,
19 23 PA13 I/O FT - I2C1_SDA, SPI1_SCK, -
LPUART1_RX
SWCLK, LPTIM1_OUT,
20 24 PA14 I/O FT - I2C1_SMBA, USART2_TX, -
SPI1_MISO, LPUART1_TX
SPI1_NSS, TIM2_ETR,
- 25 PA15 I/O FT - EVENTOUT, USART2_RX, -
TIM2_CH1
DS12323 Rev 3 31/91

34
Pin descriptions STM32L010F4/K4
Table 10. Pin definitions (continued)

Pin
Pin functions
number
I/O
struct
TSSOP20
LQFP32

ure
SPI1_SCK, TIM2_CH2,
- 26 PB3 I/O FT - -
EVENTOUT
- 27 PB4 I/O FT - SPI1_MISO, EVENTOUT -
SPI1_MOSI, LPTIM1_IN1,
- 28 PB5 I/O FT - -
I2C1_SMBA, TIM21_CH1
USART2_TX, I2C1_SCL,
- 29 PB6 I/O FT - LPTIM1_ETR, TIM2_CH3, -
LPUART1_TX
USART2_RX, I2C1_SDA,
- 30 PB7 I/O FT - LPTIM1_IN2, TIM2_CH4, VREF_PVD_IN
LPUART1_RX
1 31 PB9-BOOT0 I B - - -
(4)
- 32 VSS S - - -
1. Digital power supply.
2. Device reset input/internal reset output (active low).
3. Analog power supply.
4. Digital and analog ground.
32/91 DS12323 Rev 3

STM32L010F4/K4
Table 11. Alternate functions
AF0 AF1 AF2 AF3 AF4 AF5 AF6
SPI1/USART2/ LPUART1/ I2C1/

Port
TIM21/ SPI1/I2C1/ LPTIM/TIM2/E USART2/ SPI1/TIM2/ LPUART1/
I2C1/EVENOUT
EVENOUT/ LPTIM VENOUT/ LPUART1/ TIM21 EVENOUT
SYS_AF SYS_AF EVENOUT
PA0 USART2_RX LPTIM1_IN1 TIM2_CH1 - USART2_CTS TIM2_ETR LPUART1_RX

PA1 EVENTOUT LPTIM1_IN2 TIM2_CH2 I2C1_SMBA USART2_RTS TIM21_ETR LPUART1_TX
PA2 TIM21_CH1 - TIM2_CH3 - USART2_TX - LPUART1_TX
PA3 TIM21_CH2 - TIM2_CH4 - USART2_RX - LPUART1_RX
PA4 SPI1_NSS LPTIM1_IN1 LPTIM1_ETR I2C1_SCL USART2_CK TIM2_ETR LPUART1_TX
PA5 SPI1_SCK LPTIM1_IN2 TIM2_ETR - - TIM2_CH1 -
PA6 SPI1_MISO LPTIM1_ETR - LPUART1_CTS - EVENTOUT
DS12323 Rev 3
PA7 SPI1_MOSI LPTIM1_OUT - USART2_CTS TIM21_ETR EVENTOUT

Port A
PA8 MCO - LPTIM1_IN1 EVENTOUT USART2_CK TIM2_CH1 -
PA9 MCO I2C1_SCL LPTIM1_OUT - USART2_TX TIM21_CH2 -
PA10 TIM21_CH1 I2C1_SDA RTC_REFIN - USART2_RX TIM2_CH3 -
PA11 SPI1_MISO LPTIM1_OUT EVENTOUT - USART2_CTS TIM21_CH2 -
PA12 SPI1_MOSI - EVENTOUT - USART2_RTS - -
PA13 SWDIO LPTIM1_ETR - I2C1_SDA - SPI1_SCK LPUART1_RX
PA14 SWCLK LPTIM1_OUT - I2C1_SMBA USART2_TX SPI1_MISO LPUART1_TX
PA15 SPI1_NSS - TIM2_ETR EVENTOUT USART2_RX TIM2_CH1 -
Pin descriptions
33/91
Table 11. Alternate functions (continued)
34/91
Pin descriptions
AF0 AF1 AF2 AF3 AF4 AF5 AF6
SPI1/USART2/ LPUART1/ I2C1/

Port
TIM21/ SPI1/I2C1/ LPTIM/TIM2/E USART2/ SPI1/TIM2/ LPUART1/
I2C1/EVENOUT
EVENOUT/ LPTIM VENOUT/ LPUART1/ TIM21 EVENOUT
SYS_AF SYS_AF EVENOUT
PB0 EVENTOUT SPI1_MISO TIM2_CH2 - USART2_RTS TIM2_CH3 -

PB1 USART2_CK SPI1_MOSI LPTIM1_IN1 - LPUART1_RTS TIM2_CH4 -
PB3 SPI1_SCK - TIM2_CH2 - EVENTOUT - -
Port B PB4 SPI1_MISO - EVENTOUT - - - -
PB5 SPI1_MOSI - LPTIM1_IN1 I2C1_SMBA - TIM21_CH1 -
PB6 USART2_TX I2C1_SCL LPTIM1_ETR - - TIM2_CH3 LPUART1_TX
PB7 USART2_RX I2C1_SDA LPTIM1_IN2 - - TIM2_CH4 LPUART1_RX
DS12323 Rev 3
STM32L010F4/K4
STM32L010F4/K4 Memory mapping
5 Memory mapping
Refer to the product line reference manual for details on the memory mapping as well as the
boundary addresses for all peripherals.
DS12323 Rev 3 35/91

35
Electrical characteristics STM32L010F4/K4
6 Electrical characteristics
6.1 Parameter conditions

Unless otherwise specified, all voltages are referenced to VSS.
6.1.1 Minimum and maximum values

Unless otherwise specified the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies by tests in production on
100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by
the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes and are not tested in production. Based on
characterization, the minimum and maximum values refer to sample tests and represent the
mean value plus or minus three times the standard deviation (mean±3σ).
6.1.2 Typical values

Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 3.6 V (for the
1.8 V ≤ VDD ≤ 3.6 V voltage range). They are given only as design guidelines and are not
tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95% of the devices have an
error less than or equal to the value indicated (mean ±2σ).
6.1.3 Typical curves

Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
6.1.4 Loading capacitor

The loading conditions used for pin parameter measurement are shown in Figure 5.
6.1.5 Pin input voltage

The input voltage measurement on a pin of the device is described in Figure 6.
Figure 5. Pin loading conditions Figure 6. Pin input voltage
MCU pin MCU pin

C = 50 pF
VIN
ai17851c ai17852c
36/91 DS12323 Rev 3

STM32L010F4/K4 Electrical characteristics
6.1.6 Power supply scheme
Figure 7. Power supply scheme

Standby-power circuitry
(OSC32,RTC,Wake-up
logic, RTC backup
registers)
Level shifter
OUT
IO
GP I/Os Logic Kernel logic
IN
(CPU,
Digital &
VDD Memories)
VDD
Regulator
N × 100 nF
+ 1 × 10 μF
VSS
VDDA
VDDA
100 nF
Analog:
+ 1 μF
ADC RC,PLL,….
VSSA
MSv48106V1
1. VSSA is internally connected to VSS on all packages.
6.1.7 Current consumption measurement
Figure 8. Current consumption measurement scheme
VDDA
IDD
NxVDD
N × 100 nF
+ 1 × 10 μF
NxVSS
MSv34711V1
DS12323 Rev 3 37/91

81
6.2 Absolute maximum ratings

Stresses above the absolute maximum ratings listed in Table 12: Voltage characteristics,
Table 13: Current characteristics, and Table 14: Thermal characteristics may cause
permanent damage to the device. These are stress ratings only and functional operation of
the device at these conditions is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability. Device mission profile (application conditions)
is compliant with JEDEC JESD47 Qualification Standard. Extended mission profiles are
available on demand.
Table 12. Voltage characteristics

Symbol Ratings Min Max Unit
External main supply voltage

VDD -VSS –0.3 4.0
(including VDDA, VDD)(1)
Input voltage on FT pin VSS - 0.3 VDD + 4.0
V
Input voltage on TC pins VSS - 0.3 4.0
VIN(2)
Input voltage on BOOT0 VSS VDD + 4.0
Input voltage on any other pin VSS - 0.3 4.0
|∆VDD| Variations between different VDDx power pins - 50
|VDDA-VDDx| Variations between any VDDx and VDDA power pins(3) - 300 mV
|∆VSS| Variations between all different ground pins - 50
VESD(HBM) Electrostatic discharge voltage (human body model) see Section 6.3.11 V
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power supply, in the
permitted range.
2. VIN maximum must always be respected. Refer to Table 13 for maximum allowed injected current values.
3. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV between VDD and
VDDA can be tolerated during power-up and device operation. its value does not need to respect this rule.
38/91 DS12323 Rev 3

Table 13. Current characteristics

Symbol Ratings Max. Unit
ΣIVDD(2) Total current into sum of all VDD power lines (source)(1) 105
ΣIVSS(2) Total current out of sum of all VSS ground lines (sink) (1)
105
ΣIVDDIO2 Total current into sum of all VDDIO2 power lines (source) 25
IVDD(PIN) Maximum current into each VDD power pin (source)(1) 100
(1)
IVSS(PIN) Maximum current out of each VSS ground pin (sink) 100
Output current sunk by any I/O and control pin 16
IIO mA
Output current sourced by any I/O and control pin -16
Total output current sunk by sum of all I/Os and control pins(2) 90
ΣIIO(PIN)
(2)
Total output current sourced by sum of all I/Os and control pins -90
Injected current on FT, RST and B pins −5/+0(3)
IINJ(PIN)
Injected current on TC pin ±5(4)
ΣIINJ(PIN) Total injected current (sum of all I/O and control pins)(5) ±25
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power supply, in the
permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins. The total output current must not be
sunk/sourced between two consecutive power supply pins referring to high pin count LQFP packages.
3. Positive current injection is not possible on these I/Os. A negative injection is induced by VIN < VSS. IINJ(PIN) must never be
exceeded. Refer to Table 12 for maximum allowed input voltage values.
4. A positive injection is induced by VIN > VDD while a negative injection is induced by VIN < VSS. IINJ(PIN) must never be
exceeded. Refer to Table 12 for the maximum allowed input voltage values.
5. When several inputs are submitted to a current injection, the maximum ΣIINJ(PIN) is the absolute sum of the positive and
negative injected currents (instantaneous values).
Table 14. Thermal characteristics

Symbol Ratings Value Unit
TSTG Storage temperature range –65 to +150 °C

TJ Maximum junction temperature 150 °C
DS12323 Rev 3 39/91

81
6.3 Operating conditions
6.3.1 General operating conditions
Table 15. General operating conditions

Symbol Parameter Conditions Min Max Unit
fHCLK Internal AHB clock frequency - 0 32

fPCLK1 Internal APB1 clock frequency - 0 32 MHz
fPCLK2 Internal APB2 clock frequency - 0 32
VDD Standard operating voltage - 1.8 3.6 V
Analog operating voltage
VDDA Must be the same voltage as VDD(1) 1.8 3.6 V
(all features)
2.0 V ≤ VDD ≤ 3.6 V –0.3 5.5
Input voltage on FT and RST pins(2)
1.8 V ≤ VDD ≤ 2.0 V –0.3 5.2
VIN V
Input voltage on BOOT0 pin - 0 5.5
Input voltage on TC pin - –0.3 VDD+ 0.3
TSSOP20/ 270/
PD Power dissipation at TA = 85 °C(3) - mW
LQFP32 333
TA Temperature range - –40 85
°C
TJ Junction temperature range (range 6) –40 °C ≤ TA ≤ 85 ° –40 105
1. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV between VDD and
VDDA can be tolerated during power-up and normal operation.
2. To sustain a voltage higher than VDD+0.3V, the internal pull-up/pull-down resistors must be disabled.
3. If TA is lower, higher PD values are allowed as long as TJ does not exceed TJ max (see Table 14: Thermal characteristics
on page 39).
6.3.2 Embedded reset and power control block characteristics

The parameters given in the following table are derived from the tests performed under the
ambient temperature condition summarized in Table 15.
Table 16. Embedded reset and power control block characteristics

Symbol Parameter Conditions Min Typ Max Unit
BOR detector enabled 0 - ∞

VDD rise time rate
BOR detector disabled 0 - 1000
tVDD(1) µs/V
BOR detector enabled 20 - ∞
VDD fall time rate
BOR detector disabled 0 - 1000
TRSTTEMPO(1) Reset temporization VDD rising, BOR enabled - 2 3.3 ms
40/91 DS12323 Rev 3

Table 16. Embedded reset and power control block characteristics (continued)
Power on/power down reset Falling edge 1 1.5 1.8

VPOR/PDR
threshold Rising edge 1.3 1.5 1.8
Falling edge 1.67 1.7 1.74
VBOR0 Brownout reset threshold 0
Rising edge 1.69 1.76 1.8
Rising edge 1.96 2.03 2.07
V
Rising edge 2.31 2.41 2.44
BOR0 threshold - 40 -
Vhyst Hysteresis voltage mV
All BOR thresholds excepting BOR0 - 100 -
1. Guaranteed by characterization results, not tested in production.
6.3.3 Embedded internal reference voltage

The parameters given in Table 18 are based on characterization results, unless otherwise
specified.
Table 17. Embedded internal reference voltage calibration values

Calibration value name Description Memory address
VREFINT_CAL Raw data acquired at temperature of 25°C, VDDA= 3 V 0x1FF8 0078 - 0x1FF8 0079
Table 18. Embedded internal reference voltage(1)

VREFINT out(2) Internal reference voltage –40 °C < TJ < +85 °C 1.202 1.224 1.242 V
TVREFINT Internal reference startup time - - 2 3 ms
VDDA voltage during VREFINT
VVREF_MEAS - 2.99 3 3.01 V
factory measure
Including uncertainties
Accuracy of factory-measured
AVREF_MEAS due to ADC and VDDA - - ±5 mV
VREFINT value(3)
values
–40 °C < TJ < +85 °C - 25 100
TCoeff(4) Temperature coefficient ppm/°C
0 °C < TJ < +50 °C - - 20
ACoeff(4) Long-term stability 1000 hours, T= 25 °C - - 1000 ppm
DS12323 Rev 3 41/91

81
Table 18. Embedded internal reference voltage(1) (continued)

VDDCoeff(4) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V
ADC sampling time when
TS_vrefint(4)(5) reading the internal reference - 5 10 - µs
voltage
Startup time of reference
TADC_BUF(4) - - - 10 µs
voltage buffer for ADC
Consumption of reference
IBUF_ADC(4) - - 13.5 25 µA
voltage buffer for ADC
IVREF_OUT(4) VREF_OUT output current(6) - - - 1 µA
CVREF_OUT(4) VREF_OUT output load - - - 50 pF
Consumption of reference
ILPBUF(4) - - 730 1200 nA
voltage buffer for VREF_OUT
VREFINT_DIV1(4) 1/4 reference voltage - 24 25 26
%
VREFINT
1. Refer to Table 30: Peripheral current consumption in Stop and Standby mode for the value of the internal reference current
consumption (IREFINT).
2. Guaranteed by test in production.
3. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.
4. Guaranteed by design, not tested in production.
5. Shortest sampling time can be determined in the application by multiple iterations.
6. To guarantee less than 1% VREF_OUT deviation.
6.3.4 Supply current characteristics

The current consumption is a function of several parameters and factors such as the
operating voltage, temperature, I/O pin loading, device software configuration, operating
frequencies, I/O pin switching rate, program location in memory and executed binary code.
The current consumption is measured as described in Figure 8: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified
otherwise.
The current consumption values are derived from the tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 15: General operating
conditions unless otherwise specified.
42/91 DS12323 Rev 3

The MCU is placed under the following conditions:

• All I/O pins are configured in analog input mode
• All peripherals are disabled except when explicitly mentioned
• The Flash memory access time and prefetch is adjusted depending on fHCLK frequency
and voltage range to provide the best CPU performance unless otherwise specified.
• When the peripherals are enabled fAPB1 = fAPB2 = fAPB
• When PLL is ON, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used) or
HSE = 16 MHz (if HSE bypass is used)
• The HSE user clock is applied to CK_IN. It follows the characteristic specified in
Table 32: High-speed external user clock characteristics
• For maximum current consumption VDD = VDDA = 3.6 V is applied to all supply pins
• For typical current consumption VDD = VDDA = 3.0 V is applied to all supply pins if not
specified otherwise
Table 19. Current consumption in Run mode, code with data processing
running from Flash memory
fHCLK
Symbol Parameter Conditions Typ Max Unit
(MHz)
1 140 180
Range 3,
VCORE = 1.2 V 2 245 290 µA
VOS[1:0] = 11
4 460 540
fHSE = fHCLK up to 16 MHz 4 0.56 0.65
included, Range 2,
VCORE = 1.5 V 8 1.1 1.3
fHSE = fHCLK/2 above VOS[1:0] = 10,
16 MHz (PLL ON)(1) 16 2.1 2.4
mA
8 1.3 1.6
Supply current Range 1,
IDD (Run in Run mode, VCORE = 1.8 V 16 2.6 3
from Flash code executed VOS[1:0] = 01
32 5.3 6.5
memory) from Flash
memory 0.065 34.5 54
Range 3,
MSI clock VCORE = 1.2 V 0.524 86 120 µA
VOS[1:0] = 11
4.2 505 560
Range 2,
VCORE = 1.5 V 16 2.2 2.6
VOS[1:0] = 10,
HSI clock mA
Range 1,
VCORE = 1.8 V 32 5.4 5.9
VOS[1:0] = 01
1. Oscillator bypassed (HSEBYP = 1 in RCC_CR register).
DS12323 Rev 3 43/91

81
running from Flash memory
Symbol Parameter Conditions fHCLK Typ Unit
Dhrystone 460
CoreMark 440
Range 3,
VCORE = 1.2 V, Fibonacci 4 MHz 330 µA
Supply VOS[1:0] = 11
IDD current in while(1) 305
fHSE = fHCLK up to
(Run Run mode, while(1), prefetch OFF 320
16 MHz included,
from code
Flash executed fHSE = fHCLK/2 above Dhrystone 5.4
16 MHz (PLL ON)(1)
memory) from Flash CoreMark 4.9
memory Range 1,
VCORE = 1.8 V Fibonacci 32 MHz 5 mA
VOS[1:0] = 01
while(1) 4.35
while(1), prefetch OFF 3.7
Figure 9. IDD vs VDD, Run mode, code running from Flash memory, Range 2, HSI, 1 ws
MSv48132V1
44/91 DS12323 Rev 3

Figure 10. IDD vs VDD, Run mode, code running from Flash memory, Range 2, HSE bypass, 1 ws
MSv48133V1
Table 21. Current consumption in Run mode, code with data processing running from RAM
fHCLK
Symbol Parameter Conditions Typ Max(1) Unit
(MHz)
1 115 140
Range 3,
VCORE = 1.2 V, 2 205 240 µA
VOS[1:0] = 11
4 385 420
fHSE = fHCLK up to 16 MHz, 4 0.48 0.55
Range 2,
included
Supply current in VCORE = 1.5 ,V, 8 0.935 1.1
Run mode, code fHSE = fHCLK/2 above 16 MHz VOS[1:0] = 10
IDD (Run (2) 16 1.8 2
executed from (PLL ON)
from mA
RAM, Flash 8 1.1 1.4
RAM) Range 1,
memory
switched OFF VCORE = 1.8 V, 16 2.1 2.5
VOS[1:0] = 01
32 4.5 4.9
0.065 22 38
Range 3,
MSI clock VCORE = 1.2 V, 0.524 67 91 µA
VOS[1:0] = 11
4.2 415 450
Supply current in Range 2,

Run mode, code VCORE = 1.5 V, 16 1.95 2.2
IDD (Run VOS[1:0] = 10
executed from
from HSI16 clock source (16 MHz) mA
RAM, Flash Range 1,
RAM)
memory VCORE = 1.8 V, 32 4.7 5.2
switched OFF VOS[1:0] = 01
1. Guaranteed by characterization results at 85 °C, not tested in production, unless otherwise specified.
DS12323 Rev 3 45/91

81
running from RAM(1)
Symbol Parameter Conditions fHCLK Typ Unit
Dhrystone 385
Range 3 CoreMark -(3)
VCORE = 1.2 V 4 MHz µA
Supply current in VOS[1:0] = 11 Fibonacci 350
Run mode, code fHSE = fHCLK up to 16 MHz,
IDD (Run included, while(1) 340
executed from
from
RAM, Flash fHSE = fHCLK/2 above 16 MHz Dhrystone 4.5
RAM)
memory switched (PLL ON)(2)
Range 1 CoreMark -(3)
OFF
VCORE = 1.8 V 32 MHz mA
VOS[1:0] = 01 Fibonacci 4.2
while(1) 3
1. Guaranteed by characterization results, not tested in production, unless otherwise specified.
3. CoreMark code is unable to run from RAM since the RAM size is only 2 Kbytes.
Table 23. Current consumption in Sleep mode

fHCLK
(MHz)
1 36.5 70
Range 3,
VCORE = 1.2 V, 2 58 95
VOS[1:0] = 11
4 100 150
fHSE = fHCLK up to 16 MHz 4 125 170
included, Range 2,
VCORE = 1.5 V, 8 230 300
fHSE = fHCLK/2 above 16
VOS[1:0] = 10
MHz (PLL ON)(2) 16 450 540
8 275 350
Range 1,
Supply current VCORE = 1.8 V, 16 555 650
IDD in Sleep VOS[1:0] = 01
32 1350 1600 µA
(Sleep) mode, Flash
memory OFF 0.065 15.5 32
Range 3,
MSI clock VCORE = 1.2 V, 0.524 26.5 55
VOS[1:0] = 11
4.2 115 160
Range 2,
VCORE = 1.5 V, 16 585 670
HSI16 clock source (16 VOS[1:0] = 10
MHz) Range 1,
VCORE = 1.8 V, 32 1500 1700
VOS[1:0] = 01
46/91 DS12323 Rev 3

Table 23. Current consumption in Sleep mode (continued)

fHCLK
(MHz)
1 49 88
Range 3,
VCORE = 1.2 V, 2 69 120
VOS[1:0] = 11
4 115 190
fHSE = fHCLK up to 16 MHz 4 135 200
included, Range 2,
CORE = 1.5 V, 8 240 340
fHSE = fHCLK/2 above VOS[1:0] = 10
16 MHz (PLL ON)(2) 16 460 650
8 290 400
Range 1,
Supply current VCORE = 1.8 V, 16 565 750
IDD in Sleep VOS[1:0] = 01
32 1350 1900 µA
(Sleep) mode, Flash
memory ON 0.065 26.5 46
Range 3,
MSI clock VCORE = 1.2 V, 0.524 38.5 70
VOS[1:0] = 11
4.2 125 190
Range 2,
VCORE = 1.5 V, 16 600 760
HSI16 clock source (16 VOS[1:0] = 10
MHz) Range 1,
VCORE = 1.8 V, 32 1500 1850
VOS[1:0] = 01
DS12323 Rev 3 47/91

81
Table 24. Current consumption in Low-power run mode

MSI clock = 65 KHz TA = -40 °C to 25 °C 5.7 8.1

fHCLK = 32 KHz TA = 85 °C 6.5 9
All peripherals OFF,
TA =-40 °C to 25 °C 8.7 11
code executed from MSI clock = 65 KHz
RAM, Flash memory fHCLK = 65 KHz TA = 85 °C 9.5 12
switched OFF, VDD
TA = -40 °C to 25 °C 17 19
from 1.8 V to 3.6 V MSI
clock = 131 KHz TA = 55 °C 17 19.5
Supply fHCLK = 131 KHz
IDD current in TA = 85 °C 17.5 20
µA
(LP run) Low-power TA = -40 °C to 25 °C 18 22
MSI clock = 65 KHz
run mode
fHCLK = 32 KHz TA = 85 °C 20 24
All peripherals OFF, MSI clock = 65 KHz TA = -40 °C to 25 °C 22 25
code executed from fHCLK = 65 KHz TA = 85 °C 24 27
Flash memory, VDD
from 1.8 V to 3.6 V TA = -40 °C to 25 °C 32 35
MSI
clock = 131 KHz TA = 55 °C 32.5 35
fHCLK = 131 KHz
TA = 85 °C 34 37
Figure 11. IDD vs VDD, Low-power run mode executed from RAM, Range 3, MSI at 65 KHz, 0 ws
MSv48134V1
48/91 DS12323 Rev 3

Table 25. Current consumption in Low-power sleep mode

MSI clock = 65 KHz

fHCLK = 32 KHz TA = -40 °C to 25 °C 2.5(2) -
Flash OFF
MSI clock = 65 KHz TA = -40 °C to 25 °C 13 19
fHCLK = 32 KHz
Supply Flash ON TA = 85 °C 15.5 20
All peripherals
IDD current in
OFF, VDD from MSI clock = 65 KHz TA = -40 °C to 25 °C 13.5 19 µA
(LP Sleep) Low-power
1.8 V to 3.6 V fHCLK = 65 KHz
sleep mode
Flash ON TA = 85 °C 16 20
MSI TA = -40 °C to 25 °C 15.5 21

clock = 131 KHz
TA = 55 °C 17 22
fHCLK = 131 KHz
Flash ON TA = 85 °C 18 23
2. In low-power modes, only the static Flash memory power consumption applies (~13 µA) when Flash is ON (independent of
clock speed).
Figure 12. IDD vs VDD, Stop mode with RTC enabled and running from LSE on low drive
MSv48135V1
DS12323 Rev 3 49/91

81
Figure 13. IDD vs VDD, Stop mode with RTC disabled, all clocks off
MSv48136V1
Table 26. Typical and maximum current consumptions in Stop mode

TA = –40°C to 25°C 0.34 0.99

IDD (Stop) Supply current in Stop mode TA = 55°C 0.43 1.9 µA
TA= 85°C 0.94 4.2
Table 27. Typical and maximum current consumptions in Standby mode

TA = –40 °C to 25 °C 0.8 1.6

Independent watchdog
TA = 55 °C 0.9 1.8
and LSI enabled
IDD Supply current in Standby TA= 85 °C 1 2
µA
(Standby) mode TA = -40 °C to 25 °C 0.23 0.6
Independent watchdog
TA = 55 °C 0.25 0.7
and LSI OFF
TA = 85 °C 0.36 1.7
1. Guaranteed by characterization results, not tested in production, unless otherwise specified
50/91 DS12323 Rev 3

Table 28. Average current consumption during wakeup

Current
System
Symbol Parameter consumption Unit
frequency
during wakeup
HSI 1
HSI/4 0,7
Supply current during wakeup from
IDD (wakeup from Stop) MSI 4,2 MHz 0,7
Stop mode
MSI 1,05 MHz 0,4
MSI 65 KHz 0,1
mA
IDD (Reset) Reset pin pulled down - 0,21
IDD (Power up) BOR ON - 0,23
With fast wakeup set MSI 2,1 MHz 0,5

IDD (wakeup from Standby)
With fast wakeup disabled MSI 2,1 MHz 0,12
On-chip peripheral current consumption

The current consumption of the on-chip peripherals is given in the following tables. The
MCU is placed under the following conditions:
• all I/O pins are in input mode with a static value at VDD or VSS (no load)
• all peripherals are disabled unless otherwise mentioned
• the given value is calculated by measuring the current consumption
– with all peripherals clocked OFF
– with only one peripheral clocked ON
DS12323 Rev 3 51/91

81
Table 29. Peripheral current consumption in run or Sleep mode(1)

Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral Range 1, Range 2, Range 3, Unit

Low-power
VCORE = 1.8 V VCORE = 1.5 V VCORE = 1.2 V
sleep and run
VOS[1:0] = 01 VOS[1:0] = 10 VOS[1:0] = 11
WWDG 2.5 2 1.6 2

LPUART1 8.3 7.2 5.4 7.2
I2C1 11 8.2 6.8 8.9
APB1
LPTIM1 14 11 8.7 11
TIM2 10.5 8.5 6.4 8.5
USART2 8.5 6.8 5.4 7.1
(2)
ADC1 5 3.9 3.3 4
SPI1 4.5 3.5 2.9 3.6
APB2 TIM21 6.8 6.1 4.5 5.6
DBGMCU 1.7 1.7 1.1 1.4
SYSCFG 2.5 2.4 1.6 2.3
GPIOA 7.6 6.3 4.9 6.5 µA/MHz
GPIOB 5.1 4.1 3.2 4 (fHCLK)
Cortex-M0+
GPIOC 1.1 0.7 0.6 0.8
I/O port
CRC 1.5 1
(3)
AHB FLASH 0 0 0 0
DMA1 5.3 4.2 3.5 4.8
All enabled 96 80 62 88
PWR 2.5 2 2 1
1. Data based on differential IDD measurement between all peripherals OFF an one peripheral with clock enabled, in the
following conditions: fHCLK = 32 MHz (range 1), fHCLK = 16 MHz (range 2), fHCLK = 4 MHz (range 3), fHCLK = 64 KHz (Low-
power run/sleep), fAPB1 = fHCLK, fAPB2 = fHCLK, default prescaler value for each peripheral. The CPU is in Sleep mode in
both cases. No I/O pins toggling. Not tested in production.
2. HSI oscillator is OFF for this measure.
3. These values correspond to the Flash memory configuration interface consumption, which is negligible. To assess true
Flash memory consumption, compare relevant figures, like for example Table 19 and Table 21.
52/91 DS12323 Rev 3

Table 30. Peripheral current consumption in Stop and Standby mode

Typical consumption, TA = 25 °C
Symbol Peripheral Unit
VDD = 1.8 V VDD = 3.0 V
IDD(BOR) - 0.6 1
IREFINT - 3
- LSE low drive(1)
- LPTIM1(2), input 100 Hz 0.01
µA
- LPTIM1, input 1 MHz 8 9
- LPUART1 0.025 0.03
- RTC 0.1 0.19

1. LSE low drive consumption is the difference between an external clock on OSC32_IN and a quartz between
OSC32_IN and OSC32_OUT.
2. LPTIM peripheral cannot operate in Standby mode.
6.3.5 Wakeup time from low-power mode

The wakeup times given in the following table are measured with the MSI or HSI16 RC
oscillator. The clock source used to wake up the device depends on the current operating
mode:
• Sleep mode: the clock source is the clock that was set before entering Sleep mode
• Stop mode: the clock source is either the MSI oscillator in the range configured before
entering Stop mode, the HSI16 or HSI16/4.
• Standby mode: the clock source is the MSI oscillator running at 2.1 MHz
All timings are derived from tests performed under ambient temperature and VDD supply
voltage conditions summarized in Table 15.
Table 31. Low-power mode wakeup timings

tWUSLEEP Wakeup from Sleep mode fHCLK = 32 MHz 7 8

fHCLK = 262 KHz
7 8 CPU
Wakeup from Low-power sleep mode, Flash enabled
tWUSLEEP_LP cycles
fHCLK = 262 KHz fHCLK = 262 KHz
9 10
Flash switched OFF
DS12323 Rev 3 53/91

81
Table 31. Low-power mode wakeup timings (continued)

fHCLK = fMSI = 4.2 MHz 5.1 8

Wakeup from Stop mode, regulator in
fHCLK = fHSI = 16 MHz 5.1 7
Run mode
fHCLK = fHSI/4 = 4 MHz 8.1 11
fHCLK = fMSI = 4.2 MHz
5 8
Voltage Range 1
5 8
Voltage Range 2
5 8
Voltage Range 3
fHCLK = fMSI = 1.05 MHz 14 23
Low-power mode
tWUSTOP fHCLK = fMSI = 524 KHz 28 38
µs
fHCLK = fMSI = 262 KHz 51 65
fHCLK = fHSI/4 = 4 MHz 8.2 11
Low-power mode, HSI kept running in fHCLK = fHSI = 16 MHz 3.25 -
Stop mode
Low-power mode, code running from fHCLK = fHSI/4 = 4 MHz 7.9 10
RAM
Wakeup from Standby mode, FWU bit = 1 fHCLK = fMSI = 2.1 MHz 65 130
tWUSTDBY
Wakeup from Standby mode, FWU bit = 0 fHCLK = fMSI = 2.1 MHz 2.2 3 ms
54/91 DS12323 Rev 3

6.3.6 External clock source characteristics

High-speed external user clock generated from an external source
In bypass mode the input pin is a standard GPIO.The external clock signal has to respect
the I/O characteristics in Section 6.3.12. However, the recommended clock input waveform
is shown in Figure 14.
Table 32. High-speed external user clock characteristics(1)

CSS is ON or
1 8 32 MHz
User external clock source PLL used
fHSE_ext
frequency CSS is OFF,
0 8 32 MHz
PLL not used
VHSEH CK_IN input pin high level voltage 0.7VDD - VDD
V
VHSEL CK_IN input pin low level voltage VSS - 0.3VDD
tw(HSE)
CK_IN high or low time 12 - -
tw(HSE)
- ns
tr(HSE)
CK_IN rise or fall time - - 20
tf(HSE)
Cin(HSE) CK_IN input capacitance - 2.6 - pF
DuCy(HSE) Duty cycle 45 - 55 %
IL CK_IN input leakage current VSS ≤ VIN ≤ VDD - - ±1 µA
Figure 14. High-speed external clock source AC timing diagram
VHSEH
90%
10%
VHSEL
tr(HSE) tW(HSE) t
tf(HSE) tW(HSE)
THSE
EXTERNAL fHSE_ext CK_IN IL

CLOCK SOURCE
STM32L010
MSv48107V1
DS12323 Rev 3 55/91

81
Low-speed external user clock generated from an external source

The characteristics given in the following table result from tests performed using a low-
speed external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 15.
Table 33. Low-speed external user clock characteristics(1)

User external clock source

fLSE_ext - 32.768 1000 KHz
frequency
OSC32_IN input pin high level
VLSEH 0.7VDD - VDD
voltage
V
OSC32_IN input pin low level
VLSEL - VSS - 0.3VDD
voltage
tw(LSE)
OSC32_IN high or low time 465 - -
tw(LSE)
ns
tr(LSE)
OSC32_IN rise or fall time - - 10
tf(LSE)
CIN(LSE) OSC32_IN input capacitance - - 0.6 - pF
DuCy(LSE) Duty cycle - 45 - 55 %
IL OSC32_IN input leakage current VSS ≤ VIN ≤ VDD - - ±1 µA
Figure 15. Low-speed external clock source AC timing diagram
VLSEH
90%
10%
VLSEL
tr(LSE) tW(LSE) t
tf(LSE) tW(LSE)
TLSE
EXTER NAL fLSE_ext

OSC32_IN IL
CLOCK SOURC E
STM32Lxx
ai18233c
High-speed external clock generated from a crystal/ceramic resonator

The high-speed external (HSE) clock can be supplied with a 1 to 25 MHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in Table 34. In
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
56/91 DS12323 Rev 3

time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
Table 34. HSE oscillator characteristics(1)

fOSC_IN Oscillator frequency - 1 - 25 MHz

RF Feedback resistor - - 200 - kΩ
Maximum critical crystal
Gm Startup - - 700 µA/V
transconductance
tSU(HSE)(2) Startup time VDD is stabilized - 2 - s
2. Guaranteed by characterization results. tSU(HSE) is the startup time measured from the moment it is
enabled (by software) to a stabilized 8 MHz oscillation is reached. This value is measured for a standard
crystal resonator and it can vary significantly with the crystal manufacturer.
For CL1 and CL2, it is recommended to use high-quality external ceramic capacitors in the
5 pF to 25 pF range (typ.), designed for high-frequency applications, and selected to match
the requirements of the crystal or resonator (seeFigure 16). CL1 and CL2 are usually the
same size. The crystal manufacturer typically specifies a load capacitance which is the
series combination of CL1 and CL2. PCB and MCU pin capacitance must be included (10 pF
can be used as a rough estimate of the combined pin and board capacitance) when sizing
CL1 and CL2. Refer to the application note Oscillator design guide for STM8AF/AL/S and
STM32 microcontrollers (AN2867) available from the ST website www.st.com.
Figure 16. HSE oscillator circuit diagram
fHSE to core
Rm
CO RF
Lm
CL1
Cm OSC_IN
gm
Resonator
Consumption
control
Resonator
STM32
OSC_OUT
CL2
ai18235b
Low-speed external clock generated from a crystal/ceramic resonator

The low-speed external (LSE) clock can be supplied with a 32.768 KHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in Table 35. In
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
DS12323 Rev 3 57/91

81
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
Table 35. LSE oscillator characteristics(1)

Symbol Parameter Conditions(2) Min(2) Typ Max Unit
LSE oscillator
fLSE - - 32.768 - KHz
frequency
LSEDRV[1:0]=00
- - 0.5
lower driving capability
LSEDRV[1:0]= 01
- - 0.75
Maximum critical crystal medium low driving capability
Gm µA/V
transconductance LSEDRV[1:0] = 10
- - 1.7
medium high driving capability
LSEDRV[1:0]=11
- - 2.7
higher driving capability
tSU(LSE)
(3) Startup time VDD is stabilized - 2 - s

2. Refer to the note and caution paragraphs below the table.
3. Guaranteed by characterization results, not tested in production. tSU(LSE) is the startup time measured from
the moment it is enabled (by software) to a stabilized 32.768 KHz oscillation is reached. This value is
measured for a standard crystal resonator and it can vary significantly with the crystal manufacturer. To
increase speed, address a lower-drive quartz with a high- driver mode.
Note: For information on selecting the crystal, refer to the application note Oscillator design guide
for STM8AF/AL/S and STM32 microcontrollers (AN2867) available from the ST website
www.st.com.
Figure 17. Typical application with a 32.768 kHz crystal
Resonator with integrated

capacitors
CL1
OSC32_IN fLSE
32.768 kHz Drive

resonator programmable
amplifier
OSC32_OUT
CL2
MS30253V2
Note: An external resistor is not required between OSC32_IN and OSC32_OUT and it is forbidden
to add one.
58/91 DS12323 Rev 3

6.3.7 Internal clock source characteristics

The parameters given in Table 36 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 15.
High-speed internal 16 MHz (HSI16) RC oscillator
Table 36. 16 MHz HSI16 oscillator characteristics

fHSI16 Frequency VDD = 3.0 V - 16 - MHz

Trimming code is not a multiple
HSI16 user- - ±0.4 0.7
(1)(2) of 16
TRIM trimmed resolution
Trimming code is a multiple of 16 - - ±1.5
VDDA = 3.0 V, TA = 25 °C –1(3) - 1(3)
VDDA = 3.0 V, TA = 0 to 55 °C –1.5 - 1.5 %
Accuracy of the
ACCHSI16 VDDA = 3.0 V, TA = –10 to 70 °C –2 - 2
(2) factory-calibrated
HSI16 oscillator VDDA = 3.0 V, TA = –10 to 85 °C –2.5 - 2
VDDA = 1.8 V to 3.6 V
–5.45 - 3.25
TA = -40 to 85 °C
HSI16 oscillator
tSU(HSI16)(2) - - 3.7 6 µs
startup time
HSI16 oscillator
IDD(HSI16)(2) power - - 100 140 µA
consumption
1. The trimming step differs depending on the trimming code. It is usually negative on the codes which are
multiples of 16 (0x00, 0x10, 0x20, 0x30...0xE0).
Figure 18. HSI16 minimum and maximum value versus temperature
DS12323 Rev 3 59/91

81
Low-speed internal (LSI) RC oscillator
Table 37. LSI oscillator characteristics

Symbol Parameter Min Typ Max Unit
fLSI(1) LSI frequency 26 38 56 KHz

LSI oscillator frequency drift
DLSI(2) –10 - 4 %
0°C ≤ TA ≤ 85°C
tsu(LSI)(3) LSI oscillator startup time - - 200 µs
(3)
IDD(LSI) LSI oscillator power consumption - 400 510 nA
2. This is a deviation for an individual part, once the initial frequency has been measured.
Multi-speed internal (MSI) RC oscillator
Table 38. MSI oscillator characteristics

Symbol Parameter Condition Typ Max Unit
MSI range 0 65.5 -

MSI range 1 131 -
KHz
MSI range 2 262 -
Frequency after factory calibration, done
fMSI MSI range 3 524 -
at VDD = 3.3 V and TA = 25 °C
MSI range 4 1.05 -
MSI range 5 2.1 - MHz
MSI range 6 4.2 -
ACCMSI Frequency error after factory calibration - ±0.5 - %
MSI oscillator frequency drift
DTEMP(MSI)(1) - ±3 - %
0°C ≤ TA ≤ 85°C
MSI oscillator frequency drift
DVOLT(MSI)(1) - - 2.5 %/V
1.8 V ≤ VDD ≤ 3.6 V, TA = 25 °C
MSI range 0 0.75 -
MSI range 1 1 -
MSI range 2 1.5 -
(2)
IDD(MSI) MSI oscillator power consumption MSI range 3 2.5 - µA
MSI range 4 4.5 -
MSI range 5 8 -
MSI range 6 15 -
60/91 DS12323 Rev 3

Table 38. MSI oscillator characteristics (continued)

Symbol Parameter Condition Typ Max Unit
MSI range 0 30 -
MSI range 1 20 -
MSI range 2 15 -
MSI range 3 10 -
MSI range 4 6 -
tSU(MSI) MSI oscillator startup time µs
MSI range 5 5 -
MSI range 6,
Voltage range 1 3.5 -
and 2
MSI range 6,
5 -
Voltage range 3
MSI range 0 - 40
MSI range 1 - 20
MSI range 2 - 10
MSI range 3 - 4
MSI range 4 - 2.5
tSTAB(MSI)(2) MSI oscillator stabilization time µs
MSI range 5 - 2
MSI range 6,
Voltage range 1 - 2
and 2
MSI range 3,
- 3
Voltage range 3
Any range to
- 4
range 5
fOVER(MSI) MSI oscillator frequency overshoot MHz
Any range to
- 6
range 6
1. This is a deviation for an individual part, once the initial frequency has been measured.
6.3.8 PLL characteristics

The parameters given in Table 39 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 15.
Table 39. PLL characteristics

Value
Symbol Parameter Unit
Min Typ Max(1)
PLL input clock(2) 2 - 24 MHz

fPLL_IN
PLL input clock duty cycle 45 - 55 %
DS12323 Rev 3 61/91

81
Table 39. PLL characteristics (continued)

Value
Symbol Parameter Unit
Min Typ Max(1)
fPLL_OUT PLL output clock 2 - 32 MHz

PLL input = 16 MHz
tLOCK - 115 160 µs
PLL VCO = 96 MHz
Jitter Cycle-to-cycle jitter - - ± 600 ps
IDDA(PLL) Current consumption on VDDA - 220 450
µA
IDD(PLL) Current consumption on VDD - 120 150
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with
the range defined by fPLL_OUT.
6.3.9 Memory characteristics

RAM memory
Table 40. RAM and hardware registers

VRM Data retention mode(1) Stop mode (or reset) 1.8 - - V

1. Minimum supply voltage without losing data stored in RAM (in Stop mode or under Reset) or in hardware
registers (only in Stop mode).
Flash memory and data EEPROM
Table 41. Flash memory and data EEPROM characteristics

Symbol Parameter Conditions Min Typ Max(1) Unit
Operating voltage
VDD - 1.8 - 3.6 V
Read / Write / Erase
Programming time for Erasing - 3.28 3.94

tprog ms
word or half-page Programming - 3.28 3.94
Average current during
the whole programming / - 500 700 µA
erase operation
IDD Maximum current (peak) TA = 25 °C, VDD = 3.6 V
during the whole
- 1.5 2.5 mA
programming / erase
operation
62/91 DS12323 Rev 3

Table 42. Flash memory and data EEPROM endurance and retention
Value
Symbol Parameter Conditions Unit
Min(1)
Cycling (erase / write)

10
Program memory
NCYC(2) TA = –40°C to 85 °C kcycles
Cycling (erase / write)
100
EEPROM data memory
Data retention (program memory) after
30
10 kcycles at TA = 85 °C
tRET(2) TRET = +85 °C years
Data retention (EEPROM data memory)
30
after 100 kcycles at TA = 85 °C
2. Characterization is done according to JEDEC JESD22-A117.
6.3.10 EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
• Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
• FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 43. They are based on the EMS levels and classes
defined in application note AN1709.
Table 43. EMS characteristics

Level/
Symbol Parameter Conditions
Class
VDD = 3.3 V, TA = +25 °C,

Voltage limits to be applied on any I/O pin to induce
VFESD fHCLK = 32 MHz 3B
a functional disturbance
conforms to IEC 61000-4-2
Fast transient voltage burst limits to be applied VDD = 3.3 V, TA = +25 °C,
VEFTB through 100 pF on VDD and VSS pins to induce a fHCLK = 32 MHz 4A
functional disturbance conforms to IEC 61000-4-4
DS12323 Rev 3 63/91

81
Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
• Corrupted program counter
• Unexpected reset
• Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring. See application note Software techniques for
improving microcontrollers EMC performance (AN1015).
Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 44. EMI characteristics

Monitored Max vs. frequency range
Symbol Parameter Conditions Unit
frequency band (32 MHz voltage range 1)
0.1 to 30 MHz –22

VDD = 3.3 V,
TA = 25 °C, 30 to 130 MHz –7 dBµV
SEMI Peak level
compliant with 130 MHz to 1GHz –12
IEC 61967-2
SAE EMI Level 1 -
6.3.11 Electrical sensitivity characteristics

Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
64/91 DS12323 Rev 3

Table 45. ESD absolute maximum ratings

Maximum
Symbol Ratings Conditions Class Unit
value(1)
Electrostatic discharge voltage TA = +25 °C, conforming

VESD(HBM) 2 2000
(human body model) to ANSI/JEDEC JS-001
V
Electrostatic discharge voltage TA = +25 °C, conforming
VESD(CDM) C4 500
(charge device model) to ANSI/ESD STM5.3.1
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
• A supply overvoltage is applied to each power supply pin.
• A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 46. Electrical sensitivities

Symbol Parameter Conditions Class
LU Static latch-up class TA = +85 °C conforming to JESD78A II level A
6.3.12 I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation).
The test results are given in the Table 47.
DS12323 Rev 3 65/91

81
Table 47. I/O current injection susceptibility

Functional susceptibility
Symbol Description Unit
Negative Positive
injection injection
Injected current on BOOT0 –0 NA(1)

Injected current on PA0, PA4, PA5,
–5 0
IINJ PA11, PA12, PC15, PH0 and PH1 mA
Injected current on all FT pins –5(2) NA(1)
Injected current on any other pin –5(2) +5
1. Current injection is not possible.
2. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
6.3.13 I/O port characteristics

General input/output characteristics
Unless otherwise specified, the parameters given in Table 48 are derived from tests
performed under the conditions summarized in Table 15. All I/Os are CMOS and TTL
compliant.
Table 48. I/O static characteristics

TC, FT, RST I/Os - - 0.3VDD

VIL Input low level voltage
BOOT0 pin - - 0.14VDD(1)
All I/Os except
VIH Input high level voltage 0.7 VDD - -
BOOT0 pin V
10% VDD
I/O Schmitt trigger Standard I/Os - (3) -
Vhys
voltage hysteresis (2)
BOOT0 pin - 0.01 -
VSS ≤ VIN ≤ VDD
All I/Os except
- - ±50
PA11, PA12 and
BOOT0 pins
VSS ≤ VIN ≤ VDD
- - –50/+250 nA
PA11, PA12 pins
Input leakage current
Ilkg (4) VDD ≤ VIN ≤ 5 V All
I/Os except PA11,
- - 200
PA12 and BOOT0
pins
VDD ≤ VIN ≤ 5 V
PA11, PA12 and - - 10 µA
BOOT0 pins
Weak pull-up
RPU VIN = VSS 25 45 65 kΩ
equivalent resistor(5)
66/91 DS12323 Rev 3

Table 48. I/O static characteristics (continued)

Weak pull-down
RPD VIN = VDD 25 45 65 kΩ
equivalent resistor(5)
CIO I/O pin capacitance - - 5 - pF
1. Guaranteed by characterization, not tested in production
2. Hysteresis voltage between Schmitt trigger switching levels. Guaranteed by characterization results, not
tested in production.
3. With a minimum of 200 mV. Guaranteed by characterization results, not tested in production.
4. The max. value may be exceeded if negative current is injected on adjacent pins.
5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable
PMOS/NMOS. This MOS/NMOS contribution to the series resistance is minimum (~10% order).
Figure 19. VIH/VIL versus VDD (CMOS I/Os)
VIL/VIH (V) pins

0.7V D 9 (all
D
in = +0.5 , PH0/1
V IHm 9 V DD
ents = 0.3 , PC
1 5
quirem V IHmin t BOOT0 0.38 for
d re
sta ndar p
exce = 0.45V DD H0/1
+
C MOS V IHmin 0, PC15
,P
VIHmin 2.0 T
BOO
V DD
= 0.3
1.3 V ILmax
Input range not
guaranteed
CMOS standard requirements VILmax = 0.3VDD
VILmax 0.7
0.6
VDD (V)
2.0 2.7 3.0 3.3 3.6
MSv34789V1
Figure 20. VIH/VIL versus VDD (TTL I/Os)
VIL/VIH (V) pins

9 (all 0/1
+0.5
0 .3 9V DD C15, PH
= ,P
V IHmin t BOOT0 0.38 for
p +
TTL standard requirements VIHmin = 2 V exce = 0.45V DD PH0/1
,
VIHmin 2.0 V IHmin 0, PC15
O T
BO
V DD
= 0.3
1.3 V ILmax
Input range not
guaranteed
VILmax 0.8
0.7 TTL standard requirements VILmax = 0.8 V
VDD (V)
2.0 2.7 3.0 3.3 3.6
MSv34790V1
DS12323 Rev 3 67/91

81
Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or
source up to ±15 mA with the non-standard VOL/VOH specifications given in Table 49.
In the user application, the number of I/O pins which can drive current must be limited to
respect the absolute maximum rating specified in Section 6.2:
• The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run
consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating
IVDD(Σ) (see Table 13).
• The sum of the currents sunk by all the I/Os on VSS plus the maximum Run
consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating
IVSS(Σ) (see Table 13).
Output voltage levels

performed under ambient temperature and VDD supply voltage conditions summarized in
Table 15. All I/Os are CMOS and TTL compliant.
Table 49. Output voltage characteristics

VOL(1) Output low level voltage for an I/O pin CMOS port(2), - 0.4
IIO = +8 mA
VOH(3) Output high level voltage for an I/O pin 2.7 V ≤ VDD ≤ 3.6 V VDD - 0.4 -
TTL port(2),
VOL (1) Output low level voltage for an I/O pin IIO = +8 mA - 0.4
2.7 V ≤ VDD ≤ 3.6 V
TTL port(2),
VOH (3)(4)
Output high level voltage for an I/O pin IIO = –6mA 2.4 -
2.7 V ≤ VDD ≤ 3.6 V
V
IIO = +15 mA
VOL(1)(4) Output low level voltage for an I/O pin - 1.3
2.7 V ≤ VDD ≤ 3.6 V
IIO = –15 mA
VOH(3)(4) Output high level voltage for an I/O pin VDD - 1.3 -
2.7 V ≤ VDD ≤ 3.6 V
IIO = +4 mA
VOL(1)(4) Output low level voltage for an I/O pin - 0.45
1.8 V ≤ VDD ≤ 3.6 V
IIO = –4 mA
VOH(3)(4) Output high level voltage for an I/O pin V - 0.45 -
1.8 V ≤ VDD ≤ 3.6 V DD
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 13.
The sum of the currents sunk by all the I/Os (I/O ports and control pins) must always be respected and
must not exceed ΣIIO(PIN).
2. TTL and CMOS outputs are compatible with JEDEC standards JESD36 and JESD52.
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in
Table 13. The sum of the currents sourced by all the I/Os (I/O ports and control pins) must always be
respected and must not exceed ΣIIO(PIN).
68/91 DS12323 Rev 3

Input/output AC characteristics
The definition and values of input/output AC characteristics are given in Figure 21 and
Table 50, respectively.
Table 15.
Table 50. I/O AC characteristics(1)(2)

OSPEEDRx
[1:0] bit Symbol Parameter Conditions Min Max(3) Unit
value(1)
CL = 50 pF,
- 400
VDD = 2.7 V to 3.6 V
fmax(IO)out Maximum frequency(4) KHz
CL = 50 pF,
- 100
VDD = 1.8 V to 2.7 V
00
CL = 50 pF,
- 125
tf(IO)out VDD = 2.7 V to 3.6 V
Output rise and fall time ns
tr(IO)out CL = 50 pF,
- 320
VDD = 1.8 V to 2.7 V
CL = 50 pF,
- 2
VDD = 2.7 V to 3.6 V
fmax(IO)out Maximum frequency(4) MHz
CL = 50 pF,
- 0.6
VDD = 1.8 V to 2.7 V
01
CL = 50 pF,
- 30
- 65
VDD = 1.8 V to 2.7 V
CL = 50 pF,
- 10
VDD = 2.7 V to 3.6 V
Fmax(IO)out Maximum frequency(4) MHz
CL = 50 pF,
- 2
VDD = 1.8 V to 2.7 V
10
CL = 50 pF,
- 13
- 28
VDD = 1.8 V to 2.7 V
DS12323 Rev 3 69/91

81
Table 50. I/O AC characteristics(1)(2) (continued)

OSPEEDRx
[1:0] bit Symbol Parameter Conditions Min Max(3) Unit
value(1)
CL = 30 pF,
- 35
VDD = 2.7 V to 3.6 V
(4)
Fmax(IO)out Maximum frequency MHz
CL = 50 pF,
- 10
VDD = 1.8 V to 2.7 V
11
CL = 30 pF,
- 6
- 17
VDD = 1.8 V to 2.7 V
Pulse width of external
- tEXTIpw signals detected by the - 8 - ns
EXTI controller
1. The I/O speed is configured using the OSPEEDRx[1:0] bits. Refer to the line reference manual for a
description of GPIO Port configuration register.
2. BOOT0/PB9 maximum input frequency is 10 KHz (1.8 V < VDD < 2.7 V) and 5 MHz (2.7 V < VDD < 3.6 V).
3. Guaranteed by design. Not tested in production.
4. The maximum frequency is defined in Figure 21.
Figure 21. I/O AC characteristics definition

90% 10%
50% 50%
10% 90%
EXTERNAL tr(IO)out tf(IO)out

OUTPUT
ON CL T
Maximum frequency is achieved if (tr + tf) ≤ (2/3)T and if the duty cycle is (45-55%)
when loaded by CL specified in the table “ I/O AC characteristics”.
ai14131d
6.3.14 NRST pin characteristics

The NRST pin input driver uses CMOS technology. It is connected to a permanent pull-up
resistor, RPU , except when it is internally driven low (see Table 51).
Table 15.
70/91 DS12323 Rev 3

Table 51. NRST pin characteristics

NRST input low

VIL(NRST)(1) - - - 0.3VDD
level voltage
NRST input high
VIH(NRST)(1) - 0.39VDD+ 0.59 - -
level voltage
V
IOL = 2 mA
- -
NRST output low 2.7 V < VDD < 3.6 V
VOL(NRST)(1) 0.4
level voltage IOL = 1.5 mA
- -
1.8 V < VDD < 2.7 V
NRST Schmitt
Vhys(NRST)(1) trigger voltage - - 10%VDD(2) - mV
hysteresis
Weak pull-up
RPU equivalent VIN = VSS 25 45 65 kΩ
resistor(3)
NRST input
VF(NRST)(1) - - - 50 ns
filtered pulse
NRST input not
VNF(NRST)(1) - 350 - - ns
filtered pulse
2. 200 mV minimum value
3. The pull-up is designed with a true resistance in series with a switchable PMOS. This PMOS contribution to
the series resistance is around 10%.
Figure 22. Recommended NRST pin protection
VDD
External reset circuit(1)
RPU Internal reset

NRST(2)
Filter
0.1 μF
STM32Lxx
ai17854c
1. The reset network protects the device against parasitic resets.

2. The external capacitor must be placed as close as possible to the device.
3. The user must ensure that the level on the NRST pin can go below the VIL(NRST) max level specified in
Table 51. Otherwise the reset will not be taken into account by the device.
6.3.15 12-bit ADC characteristics

Unless otherwise specified, the parameters given in Table 52 are values derived from tests
performed under ambient temperature, fPCLK frequency and VDDA supply voltage conditions
summarized in Table 15: General operating conditions.
Note: It is recommended to perform a calibration after each power-up.
DS12323 Rev 3 71/91

81
Table 52. ADC characteristics

Analog supply voltage for - - - 3.6

VDDA V
ADC ON - 1.8 (1)
- 3.6
Current consumption of the 1.14 Msps - 200 -

ADC on VDDA 10 ksps - 40 -
IDDA (ADC) µA
Current consumption of the 1.14 Msps - 70 -
ADC on VDD(2) 10 ksps - 1 -
Voltage scaling Range 1 0.14 - 16
fADC ADC clock frequency Voltage scaling Range 2 0.14 - 8 MHz
Voltage scaling Range 3 0.14 - 4
fS(3) Sampling rate - 0.01 - 1.14 MHz
fADC = 16 MHz,
- - 941 KHz
fTRIG(3) External trigger frequency 16-bit resolution
- - - 17 1/fADC
VAIN Conversion voltage range - 0 - VDDA V
See Equation 1 and
RAIN(3) External input impedance - - 50 kΩ
Table 53 for details
RADC(3)(4) Sampling switch resistance - - - 1 kΩ
Internal sample and hold

CADC(3) - - - 8 pF
capacitor
fADC = 16 MHz 5.2 µs
tCAL(3) Calibration time
- 83 1/fADC
1.5 ADC 1.5 ADC
ADC clock = HSI16 cycles + 2 - cycles + 3 -
fPCLK cycles fPCLK cycles
ADC_DR register write fPCLK
WLATENCY
latency ADC clock = PCLK/2 - 4.5 -
cycle
fPCLK
ADC clock = PCLK/4 - 8.5 -
cycle
fADC = fPCLK/2 = 16 MHz 0.266 µs
fADC = fPCLK/2 8.5 1/fPCLK
tlatr(3) Trigger conversion latency fADC = fPCLK/4 = 8 MHz 0.516 µs
fADC = fPCLK/4 16.5 1/fPCLK
fADC = fHSI16 = 16 MHz 0.252 - 0.260 µs
ADC jitter on trigger
JitterADC fADC = fHSI16 - 1 - 1/fHSI16
conversion
fADC = 16 MHz 0.093 - 10.03 µs
tS(3) Sampling time
- 1.5 - 239.5 1/fADC
72/91 DS12323 Rev 3

Table 52. ADC characteristics (continued)

tSTAB(3) Power-up time - 0 0 1 µs

fADC = 16 MHz 0.875 - 10.81 µs
Total conversion time
tConV(3) 14 to 173 (tS for sampling +12.5 for
(including sampling time) - 1/fADC
successive approximation)
1. VDDA minimum value can be decreased in specific temperature conditions.
Refer to Table 53: RAIN max for fADC = 16 MHz.
2. A current consumption proportional to the APB clock frequency has to be added
Refer to Table 29: Peripheral current consumption in run or Sleep mode.
4. Standard channels have an extra protection resistance which depends on supply voltage.
Refer to Table 53: RAIN max for fADC = 16 MHz.
Equation 1: RAIN max formula
TS
R AIN < ---------------------------------------------------------------
N+2
- – R ADC
f ADC × C ADC × ln ( 2 )
The presented formula above (Equation 1) is a representation of an hypothetical ideal ADC

and illustrates how the parameters influence each other. It is not to be used for computation
of actual values.
Table 53. RAIN max for fADC = 16 MHz(1)

RAIN max for standard channels (kΩ)
RAIN max for fast
Ts (cycles) tS (µs)
channels (kΩ)
VDD > 2.7 V VDD > 2.4 V VDD > 2.0 V VDD > 1.8 V
1.5 0.09 0.5 < 0.1 NA NA NA

3.5 0.22 1 0.2 < 0.1 NA NA
7.5 0.47 2.5 1.7 1.5 < 0.1 NA
12.5 0.78 4 3.2 3 1 NA
19.5 1.22 6.5 5.7 5.5 3.5 NA
39.5 2.47 13 12.2 12 10 NA
79.5 4.97 27 26.2 26 24 < 0.1
160.5 10.03 50 49.2 49 47 32
1. Guaranteed by design.
DS12323 Rev 3 73/91

81
Table 54. ADC accuracy(1)(2)(3)

ET Total unadjusted error - 2 4

EO Offset error - 1 2.5
EG Gain error - 1 2 LSB
EL Integral linearity error - 1.5 2.5
ED Differential linearity error - 1 1.5
Effective number of bits 10.2 11 -
1.8 V < VDDA < 3.6 V,
ENOB Effective number of bits (16-bit mode Range 1, 2 and 3 bits
11.3 12.1 -
oversampling with ratio =256)(4)
SINAD Signal-to-noise distortion 62 67.8 -
Signal-to-noise ratio 63 68 -
SNR Signal-to-noise ratio (16-bit mode dB
70 76 -
oversampling with ratio =256)(4)
THD Total harmonic distortion - -81 -68.5
1. ADC DC accuracy values are measured after internal calibration.
2. ADC accuracy vs. negative current injection: Injecting negative current on any of the standard (non-robust) analog input
pins must be avoided as it significantly reduces the accuracy of the conversion being performed on another analog input. It
is recommended to add a Schottky diode (pin to ground) to standard analog pins that may potentially inject negative
current.
Any positive current injection within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.12 does not affect the ADC
accuracy.
3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.
4. This number is obtained by the test board without additional noise, resulting in non-optimized value for oversampling mode.
Figure 23. ADC accuracy characteristics
VSSA EG (1) Example of an actual transfer curve

4095
(2) The ideal transfer curve
4094 (3) End point correlation line
4093
(2)
ET = total unajusted error: maximum deviation
between the actual and ideal transfer curves.
ET EO = offset error: maximum deviation
(3)
7 between the first actual transition and
(1)
6 the first ideal one.
EG = gain error: deviation between the last
5
EO EL
ideal transition and the last actual one.
4 ED = differential linearity error: maximum
3 deviation between actual steps and the ideal ones.
ED
EL = integral linearity error: maximum deviation
2
between any actual transition and the end point
1 LSB IDEAL
1 correlation line.
0
1 2 3 4 5 6 7 4093 4094 4095 4096 VDDA
MS19880V2
74/91 DS12323 Rev 3

Figure 24. Typical connection diagram using the ADC
VDDA
VT Sample and hold ADC

converter
RAIN(1) RADC
AINx 12-bit
IL±50nA converter
Cparasitic VT
VAIN
CADC
MSv34712V1
1. Refer to Table 52: ADC characteristics for the values of RAIN, RADC and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the pad capacitance
(roughly 7 pF). A high Cparasitic value downgrades conversion accuracy. To remedy this, fADC must be reduced.
6.3.16 Timer characteristics

TIM timer characteristics
The parameters given in the Table 55 are guaranteed by design.
Refer to Section 6.3.13: I/O port characteristics for details on the input/output alternate
function characteristics (output compare, input capture, external clock, PWM output).
Table 55. TIMx(1) characteristics

- 1 - tTIMxCLK
tres(TIM) Timer resolution time
fTIMxCLK = 32 MHz 31.25 - ns
Timer external clock frequency on - 0 fTIMxCLK/2 MHz

fEXT
CH1 to CH4 fTIMxCLK = 32 MHz 0 16 MHz
ResTIM Timer resolution - - 16 bit
16-bit counter clock period when - 1 65536 tTIMxCLK
tCOUNTER internal clock is selected (timer’s
prescaler disabled) fTIMxCLK = 32 MHz 0.0312 2048 µs
- - 65536 × 65536 tTIMxCLK

tMAX_COUNT Maximum possible count
fTIMxCLK = 32 MHz - 134.2 s
1. TIMx is used as a general term to refer to the TIM2, TIM21 and TIM22 timers.
DS12323 Rev 3 75/91

81
6.3.17 Communications interfaces

I2C interface characteristics
The I2C interface meets the timings requirements of the I2C-bus specification and user
manual rev. 03 for standard-mode (Sm) with a bit rate up to 100 kbit/s.
The I2C timing requirements are guaranteed by design when the I2C peripheral is properly
configured (refer to the reference manual for details) and when the I2CCLK frequency is
greater than 2 MHz. The SDA and SCL I/O requirements are met with the following
restrictions: the SDA and SCL I/O pins are not "true" open-drain. When configured as open-
drain, the PMOS connected between the I/O pin and VDDIOx is disabled, but is still present.
All I2C SDA and SCL I/Os embed an analog filter (see Table 56 for the analog filter
characteristics).
Table 56. I2C analog filter characteristics(1)
Range 1 100(3)
Maximum pulse width of spikes that are
tAF Range 2 50(2) - ns
suppressed by the analog filter
Range 3 -
1. Guaranteed by characterization results.
2. Spikes with widths below tAF(min) are filtered.
3. Spikes with widths above tAF(max) are not filtered
76/91 DS12323 Rev 3

SPI characteristics
Unless otherwise specified, the parameters given in the following tables are derived from
tests performed under ambient temperature, fPCLKx frequency and VDD supply voltage
conditions summarized in Table 15.
Refer to Section 6.3.12: I/O current injection characteristics for more details on the
input/output alternate function characteristics (NSS, SCK, MOSI, MISO).
Table 57. SPI characteristics in voltage Range 1 (1)

Master mode 16
- -
Slave mode receiver 16
fSCK Slave mode transmitter
SPI clock frequency - - 12(2) MHz
1/tc(SCK) 1.71 < VDD < 3.6V
Slave mode transmitter
- - 16(2)
2.7 < VDD < 3.6V
Duty cycle of SPI clock
Duty(SCK) Slave mode 30 50 70 %
frequency
tsu(NSS) NSS setup time Slave mode, SPI presc = 2 4Tpclk - -
th(NSS) NSS hold time Slave mode, SPI presc = 2 2Tpclk - -
tw(SCKH)
SCK high and low time Master mode Tpclk - 2 Tpclk Tpclk + 2
tw(SCKL)
tsu(MI) Master mode 3 - -
Data input setup time
tsu(SI) Slave mode 3 - -
th(MI) Master mode 3.5 - -
Data input hold time
th(SI) Slave mode 0 - - ns
ta(SO Data output access time Slave mode 15 - 36
tdis(SO) Data output disable time Slave mode 10 - 30
Slave mode, 1.71 < VDD < 3.6V - 14 35
tv(SO)
Data output valid time Slave mode, 2.7 < VDD < 3.6V - 14 20
tv(MO) Master mode - 4 6
th(SO) Slave mode 10 - -
Data output hold time
th(MO) Master mode 3 - -
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI) which has to fit
into SCK low or high phase preceding the SCK sampling edge. This value can be achieved when the SPI communicates
with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
DS12323 Rev 3 77/91

81

Master mode 8
fSCK 8
SPI clock frequency 1.8 V < VDD < 3.6 V - - MHz
1/tc(SCK)
8(2)
2.7 V < VDD < 3.6 V
frequency
tw(SCKH)
tw(SCKL)
th(MI) Master mode 6 - -
Data input hold time
th(SI) Slave mode 2 - - ns

Slave mode - 16 33
tv(SO) Data output valid time
Master mode - 4 6
tv(MO) Slave mode 11 - -
th(SO) Master mode 3 - -
78/91 DS12323 Rev 3


fSCK Master mode 2

SPI clock frequency - - MHz
1/tc(SCK) Slave mode 2(2)
frequency
tw(SCKH)
tw(SCKL)
th(MI) Master mode 16 - -
Data input hold time ns
th(SI) Slave mode 14 - -
Slave mode - 26.5 47

tv(SO) Data output valid time
Master mode - 4 6
tv(MO) Slave mode 20 - -
th(SO) Master mode 3 - -
DS12323 Rev 3 79/91

81
Figure 25. SPI timing diagram - slave mode and CPHA = 0
NSS input
tc(SCK) th(NSS)
tsu(NSS) tw(SCKH) tr(SCK)

CPHA=0
SCK input
CPOL=0
CPHA=0
CPOL=1
ta(SO) tw(SCKL) tv(SO) th(SO) tf(SCK) tdis(SO)
MISO output First bit OUT Next bits OUT Last bit OUT
th(SI)
tsu(SI)
MOSI input First bit IN Next bits IN Last bit IN
MSv41658V1
Figure 26. SPI timing diagram - slave mode and CPHA = 1(1)
NSS input
tc(SCK)
tsu(NSS) tw(SCKH) tf(SCK) th(NSS)

CPHA=1
SCK input
CPOL=0
CPHA=1
CPOL=1
ta(SO) tw(SCKL) tv(SO) th(SO) tr(SCK) tdis(SO)
MISO output First bit OUT Next bits OUT Last bit OUT
tsu(SI) th(SI)
MOSI input First bit IN Next bits IN Last bit IN
MSv41659V1
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
80/91 DS12323 Rev 3

Figure 27. SPI timing diagram - master mode(1)
High
NSS input
tc(SCK)
SCK Output
CPHA= 0
CPOL=0
CPHA= 0
CPOL=1
SCK Output
CPHA=1
CPOL=0
CPHA=1
CPOL=1
tw(SCKH) tr(SCK)
tsu(MI) tw(SCKL) tf(SCK)
MISO
INP UT MSB IN BIT6 IN LSB IN
th(MI)
MOSI
MSB OUT B I T1 OUT LSB OUT
OUTPUT
tv(MO) th(MO)
ai14136d
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
DS12323 Rev 3 81/91

81
Package information STM32L010F4/K4
7 Package information
In order to meet environmental requirements, ST offers the STM32L010F4/K4 in different

grades of ECOPACK packages, depending on their level of environmental compliance.
ECOPACK specifications, grade definitions and product status are available at www.st.com.
ECOPACK is an ST trademark.
7.1 TSSOP20 package information

package outline
20 11
c
E1 E
SEATING 0.25 mm
PLANE GAUGE PLANE
C
1 10
PIN 1
IDENTIFICATION
k
aaa C A1 L
A A2
L1
b e
YA_ME_V3
1. Drawing is not to scale.
package mechanical data
millimeters inches(1)
Symbol
Min. Typ. Max. Min. Typ. Max.
A - - 1.200 - - 0.0472
A1 0.050 - 0.150 0.0020 - 0.0059
A2 0.800 1.000 1.050 0.0315 0.0394 0.0413
b 0.190 - 0.300 0.0075 - 0.0118
c 0.090 - 0.200 0.0035 - 0.0079
D(2) 6.400 6.500 6.600 0.2520 0.2559 0.2598
E 6.200 6.400 6.600 0.2441 0.2520 0.2598
E1(3) 4.300 4.400 4.500 0.1693 0.1732 0.1772
e - 0.650 - - 0.0256 -
82/91 DS12323 Rev 3

STM32L010F4/K4 Package information
package mechanical data (continued)
Symbol
Min. Typ. Max. Min. Typ. Max.
L 0.450 0.600 0.750 0.0177 0.0236 0.0295

L1 - 1.000 - - 0.0394 -
k 0° - 8° 0° - 8°
aaa - - 0.100 - - 0.0039
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or gate burrs
shall not exceed 0.15mm per side.
3. Dimension “E1” does not include interlead flash or protrusions. Interlead flash or protrusions shall not
exceed 0.25mm per side.
package footprint
0.25
6.25
20 11
1.35
0.25
7.10 4.40
1.35
1 10
0.40 0.65 YA_FP_V1
1. Dimensions are expressed in millimeters.
DS12323 Rev 3 83/91

89
Device marking for TSSOP20

Figure 30 gives an example of topside marking versus pin 1 position identifier location.
The printed markings may differ depending on the supply chain.
Other optional marking or inset/upset marks depending on supply-chain operations, are not
indicated below.
Figure 30. TSSOP20 marking example (package top view)
Product identification(1)
32L010F4P6
Pin 1 Date code Revision code

indentifier
Y WW R
MSv48142V1
1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet
qualified and therefore not approved for use in production. ST is not responsible for any consequences
resulting from such use. In no event will ST be liable for the customer using any of these engineering
samples in production. ST’s Quality department must be contacted prior to any decision to use these
engineering samples to run a qualification activity.
84/91 DS12323 Rev 3

7.2 LQFP32 package information

Figure 31. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package outline
SEATING
PLANE
C
A2
A
c
A1
0.25 mm
GAUGE PLANE
ccc C
K
D
L
A1
D1
L1
D3
24 17
25 16
b
E1
E3
32 9
PIN 1
IDENTIFICATION 1 8
e 5V_ME_V2
1. Drawing is not to scale.
DS12323 Rev 3 85/91

89
Table 61. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data
Symbol
Min Typ Max Min Typ Max
A - - 1.600 - - 0.0630
A1 0.050 - 0.150 0.0020 - 0.0059
A2 1.350 1.400 1.450 0.0531 0.0551 0.0571
b 0.300 0.370 0.450 0.0118 0.0146 0.0177
c 0.090 - 0.200 0.0035 - 0.0079
D 8.800 9.000 9.200 0.3465 0.3543 0.3622
D1 6.800 7.000 7.200 0.2677 0.2756 0.2835
D3 - 5.600 - - 0.2205 -
E 8.800 9.000 9.200 0.3465 0.3543 0.3622
E1 6.800 7.000 7.200 0.2677 0.2756 0.2835
E3 - 5.600 - - 0.2205 -
e - 0.800 - - 0.0315 -
L 0.450 0.600 0.750 0.0177 0.0236 0.0295
L1 - 1.000 - - 0.0394 -
k 0° 3.5° 7° 0° 3.5° 7°
ccc - - 0.100 - - 0.0039
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Figure 32. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package

recommended footprint
0.80
1.20
24 17
25 16 0.50
0.30
7.30
6.10
9.70
7.30
32 9
1 8
1.20
6.10
9.70
5V_FP_V2
1. Dimensions are expressed in millimeters.
86/91 DS12323 Rev 3

Device marking for LQFP32

Figure 33 gives an example of topside marking versus pin 1 position identifier location.
The printed markings may differ depending on the supply chain.
Other optional marking or inset/upset marks depending on supply-chain operations, are not
indicated below.
Figure 33. LQFP32 marking example (package top view)
Product identification(1)
STM32L
010K4T6
Date code
Y WW
Revision code
Pin 1
indentifier
R
MSv48143V1
1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet
qualified and therefore not approved for use in production. ST is not responsible for any consequences
resulting from such use. In no event will ST be liable for the customer using any of these engineering
samples in production. ST’s Quality department must be contacted prior to any decision to use these
engineering samples to run a qualification activity.
7.3 Thermal characteristics

The maximum chip-junction temperature, TJ max, in °C, may be calculated using the
following equation:
TJ max = TA max + (PD max × ϴJA)
Where:
• TA max is the maximum ambient temperature in °C
• ϴJA is the package junction-to-ambient thermal resistance in °C/W
• PD max is the sum of PINT max and PI/O max (PD max = PINT max + PI/Omax),
• PINT max is the product of IDD and VDD, expressed in Watts. This is the maximum chip
internal power.
PI/O max represents the maximum power dissipation on output pins where:
PI/O max= Σ(VOL × IOL) + Σ((VDD – VOH) × IOH),
taking into account the actual VOL / IOL and VOH / IOH of the I/Os at low and high level in the
application.
DS12323 Rev 3 87/91

89
Table 62. Thermal characteristics

symbol Thermal resistance junction-ambient Value Unit
TSSOP20 - 169 mils 74

ϴJA °C/W
LQFP32 - 7 x 7 mm / 0.8 mm pitch 60
Reference document
JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural
Convection (Still Air). Available from www.jedec.org.
88/91 DS12323 Rev 3

STM32L010F4/K4 Ordering information
8 Ordering information
Example: STM32 L 010 F 4 P 6 xxx
Device family
STM32 = Arm-based 32-bit microcontroller
Product type
L = Low power
Device subfamily
010 = Value line
Pin count
F = 20 pins
K = 32 pins
Flash memory size

4 = 16 Kbytes
Package
P = TSSOP
T = LQFP
Temperature range
6 = Industrial temperature range, –40 to 85 °C
Packing
TR = tape and reel
No character = tray or tube
For a list of available options (such as speed, package) or for further information on any
aspect of this device, contact the nearest ST sales office.
DS12323 Rev 3 89/91

89
Revision history STM32L010F4/K4
9 Revision history
Table 63. Document revision history

Date Revision Changes
8-Dec-2017 1 Initial release.

Updated Introduction.
3-Sep-2018 2
TSSOP14 removed in the whole document.
Updated:
– Table 3: Functionalities depending on the working
mode (from Run/active down to Standby)
7-Aug-2019 3
– Table 29: Peripheral current consumption in run or
Sleep mode
– Device marking sections
90/91 DS12323 Rev 3

STM32L010F4/K4
IMPORTANT NOTICE – PLEASE READ CAREFULLY
STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, enhancements, modifications, and
improvements to ST products and/or to this document at any time without notice. Purchasers should obtain the latest relevant information on
ST products before placing orders. ST products are sold pursuant to ST’s terms and conditions of sale in place at the time of order
acknowledgement.
Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or
the design of Purchasers’ products.
No license, express or implied, to any intellectual property right is granted by ST herein.
Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product.
ST and the ST logo are trademarks of ST. For additional information about ST trademarks, please refer to www.st.com/trademarks. All other
product or service names are the property of their respective owners.
Information in this document supersedes and replaces information previously supplied in any prior versions of this document.
© 2019 STMicroelectronics – All rights reserved
DS12323 Rev 3 91/91

91

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STM32L010F4

– 0.29 µA Stop mode (16 wakeup lines)

August 2019 DS12323 Rev 3 1/91

2/91 DS12323 Rev 3

3.14.4 Serial peripheral interface (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

DS12323 Rev 3 3/91

4/91 DS12323 Rev 3

Table 1. STM32L010F4/K4 features and peripheral counts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

DS12323 Rev 3 5/91

Table 45. ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

6/91 DS12323 Rev 3

Figure 1. STM32L010F4/K4 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

DS12323 Rev 3 7/91

The STM32L010F4/K4 ultra-low-power microcontrollers are part of the STM32L010 value

8/91 DS12323 Rev 3

The ultra-low-power STM32L010F4/K4 microcontrollers incorporate the high-performance

DS12323 Rev 3 9/91

2.1 Device overview

Flash memory (Kbytes) 16

10/91 DS12323 Rev 3

Figure 1. STM32L010F4/K4 block diagram

PB[0:15] GPIO PORT B

CK_IN HSE HSI 16M

DS12323 Rev 3 11/91

2.2 Ultra-low-power device continuum

12/91 DS12323 Rev 3

3.1 Low-power modes

DS12323 Rev 3 13/91

• Stop mode without RTC

Table 2. CPU frequency range depending on dynamic voltage scaling

16 MHz to 32 MHz (1ws) - 32 kHz to 16 MHz (0ws) Range 1

14/91 DS12323 Rev 3

Table 3. Functionalities depending on the working mode

DS12323 Rev 3 15/91

Table 3. Functionalities depending on the working mode

0.29 µA (no 0.1 µA (no RTC)

Down to Down to 0.54 µA (with 0.41 µA (with RTC)

3.2 Interconnect matrix

Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power

Table 4. STM32L010F4/K4 peripherals interconnect matrix

TIMx TIMx Timer triggered by other timer Y Y Y Y -

16/91 DS12323 Rev 3

Table 4. STM32L010F4/K4 peripherals interconnect matrix (continued)

TIMx Timer input channel and trigger Y Y Y Y -

3.3 Arm® Cortex®-M0+ core

Nested vectored interrupt controller (NVIC)

DS12323 Rev 3 17/91

3.4 Reset and supply management

3.4.1 Power supply schemes

3.4.2 Power supply supervisor

3.4.3 Voltage regulator

3.4.4 Boot modes

18/91 DS12323 Rev 3

3.5 Clock management

DS12323 Rev 3 19/91

Figure 2. Clock tree

@V33 Enable Watchdog

LSU LSD LSD

@V33 MCOSEL ADC enable