Anderson Darling
Anderson Darling
Anderson Darling
In statistics, the Anderson–Darling test, named after Theodore Wilbur Anderson (born
1918) and Donald A. Darling (born 1915), who invented it in 1952[1], is a statistical test of
whether there is evidence that a given sample of data did not arise from a given probability
distribution. In its basic form, the test assumes that there are no parameters to be estimated in
the distribution being tested, in which case the test and its set of critical values is distribution-
free. However, the test is most often used in contexts where a family of distributions is being
tested, in which case the parameters of that family need to be estimated and account must be
taken of this in adjusting either the test-statistic or its critical values.
When applied to testing if a normal distribution adequately describes a set of data, it is one of
the most powerful statistical tools for detecting most departures from normality.[2][3]
In addition to its use as a test of fit for distributions, it can be used in parameter estimation as
the basis for a form of minimum distance estimation procedure.
K-sample Anderson–Darling tests are available for testing whether several collections of
observations can be modelled as coming from a single population, where the distribution
function does not have to be specified.
Contents
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The Anderson–Darling test assesses whether a sample comes from a specified distribution. It
makes use of the fact that, when given a hypothesized underlying distribution and assuming
the data does arise from this distribution, the data can be transformed to a uniform
distribution. The transformed sample data can be then tested for uniformity with a distance
test (Shapiro 1980). The formula for the test statistic A to assess if data
(note that the data must be put in order) comes from a distribution with cumulative
distribution function (CDF) F is
where
The test statistic can then be compared against the critical values of the theoretical
distribution. Note that in this case no parameters are estimated in relation to the distribution
function F.
2
Case 1: The mean μ and the variance σ are both known.
2
Case 2: The variance σ is known, but the mean μ is unknown.
2
Case 3: The mean μ is known, but the variance σ is unknown.
2
Case 4: Both the mean μ and the variance σ are unknown.
The n observations Xi, for , of the variable X that should be tested are sorted
from low to high and the notation in the following assumes that Xi represent the ordered
observations. Let
2
With the standard normal CDF Φ, A is calculated using
An alternative expression in which only a single observation is dealt with at each step of the
summation is:
*2
If A exceeds a given critical value, then the hypothesis of normality is rejected with some
significance level. The critical values are given in the table below (valid for ).[2]
2
Note 1: If = 0 or any Φ(Yi) = (0 or 1) then A cannot be calculated and is undefined.
Note 2: The above adjustment formula is taken from Shorak & Wellner (1986, p239). Care is
required in comparisons across different sources as often the specific adjustment formula is
not stated.
Note 3: Stephens[2] notes that the test becomes better when the parameters are computed from
the data, even if they are known.
(*) For the case 2, the values are for the asymptotic distribution.
Alternatively, for case 3, D'Agostino (1986, pp. 372-373)[5] gives the adjusted statistic
*2
and normality is rejected if A exceeds 0.631, 0.752, 0.873, 1.035, or 1.159 at 10%, 5%,
2.5%, 1%, and 0.5% significance levels, respectively; the procedure is valid for sample size
at least n=8.
Above, it was assumed that the variable Xi was being tested for normal distribution. Any
other family of distributions can be tested but the test for each family is implemented by
using a different modification of the basic test statistic and this is referred to critical values
specific to that family of distributions. The modifications of the statistic and tables of critical
values are given by Stephens (1986)[3] for the exponential, extreme-value, Weibull, gamma,
logistic, Cauchy, and von Mises distributions. Tests for the (two-parameter) log-normal
distribution can be implemented by transforming the data using a logarithm and using the
above test for normality. Details for the required modifications to the test statistic and for the
critical values for the normal distribution and the exponential distribution have been
published by Pearson & Hartley (1972, Table 54). Details for these distributions, with the
addition of the Gumbel distribution, are also given by Shorak & Wellner (1986, p239).
Details for the logistic distribution are given by Stephens (1979). A test for the (two
parameter) Weibull distribution can be obtained by making use of the fact that the logarithm
of a Weibull variate has a Gumbel distribution.
See also
Kolmogorov–Smirnov test
Kuiper's test
Shapiro–Wilk test
Smirnov–Cramér–von-Mises test
Jarque–Bera test
Goodness of fit
External links
US NIST Handbook of Statistics
References
1. ^ Anderson, T. W.; Darling, D. A. (1952). "Asymptotic theory of certain "goodness-of-fit"
criteria based on stochastic processes". Annals of Mathematical Statistics 23: 193–212.
doi:10.1214/aoms/1177729437.
2. ^ a b c d Stephens, M. A. (1974). "EDF Statistics for Goodness of Fit and Some Comparisons".
Journal of the American Statistical Association 69: 730–737. doi:10.2307/2286009.
3. ^ a b c M. A. Stephens (1986). "Tests Based on EDF Statistics". In D'Agostino, R.B. and
Stephens, M.A.. Goodness-of-Fit Techniques. New York: Marcel Dekker. ISBN 0-8247-
7487-6.
4. ^ Anderson, T.W. and Darling, D.A. (1954). "A Test of Goodness-of-Fit". Journal of the
American Statistical Association 49: 765–769.
5. ^ a b Ralph B. D'Agostino (1986). "Tests for the Normal Distribution". In D'Agostino, R.B.
and Stephens, M.A.. Goodness-of-Fit Techniques. New York: Marcel Dekker. ISBN 0-8247-
7487-6.