Intel Core™ X-Series Processor Families: Datasheet - Volume 1
Intel Core™ X-Series Processor Families: Datasheet - Volume 1
Families
Datasheet – Volume 1
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2 Datasheet, Volume 1
Contents
1 Introduction .............................................................................................................. 7
1.1 Processor Feature Details ..................................................................................... 8
1.2 Supported Technologies ....................................................................................... 9
1.3 Interfaces .......................................................................................................... 9
1.3.1 System Memory Support ........................................................................... 9
1.3.2 PCI Express* ......................................................................................... 10
1.3.3 Direct Media Interface............................................................................. 12
1.3.4 Platform Environment Control Interface (PECI) ........................................... 13
1.4 Power Management Support ............................................................................... 13
1.4.1 Processor Package and Core States........................................................... 13
1.4.2 System States Support ........................................................................... 13
1.4.3 Memory Controller.................................................................................. 13
1.4.4 PCI Express* ......................................................................................... 13
1.5 Thermal Management Support ............................................................................ 13
1.6 Package Summary............................................................................................. 14
1.7 Operating System Support ................................................................................. 14
1.8 Terminology ..................................................................................................... 14
1.9 Related Documents ........................................................................................... 17
2 Interfaces................................................................................................................ 18
2.1 System Memory Interface .................................................................................. 18
2.1.1 System Memory Technology Support ........................................................ 18
2.1.2 System Memory Timing Support............................................................... 18
2.2 PCI Express* Interface....................................................................................... 18
2.2.1 PCI Express* Architecture ....................................................................... 18
2.2.1.1 Transaction Layer ..................................................................... 19
2.2.1.2 Data Link Layer ........................................................................ 19
2.2.1.3 Physical Layer .......................................................................... 20
2.2.2 PCI Express* Configuration Mechanism ..................................................... 20
2.3 Direct Media Interface 3 (DMI3) / PCI Express* Interface ....................................... 20
2.3.1 DMI3 Error Flow ..................................................................................... 21
2.3.2 Processor / PCH Compatibility Assumptions................................................ 21
2.3.3 DMI3 Link Down..................................................................................... 21
2.4 Platform Environment Control Interface (PECI) ...................................................... 21
3 Technologies ........................................................................................................... 22
3.1 Intel® Virtualization Technology (Intel® VT).......................................................... 22
3.1.1 Intel® VT-x Objectives ............................................................................ 22
3.1.2 Intel® VT-x Features .............................................................................. 23
3.1.3 Intel® VT-d Objectives ............................................................................ 23
3.1.3.1 Intel® VT-d Features Supported.................................................. 24
3.1.4 Intel® Virtualization Technology Processor Extensions ................................. 24
3.2 Security Technologies ........................................................................................ 25
3.2.1 Intel® Advanced Encryption Standard New Instructions
(Intel® AES-NI) Instructions .................................................................... 25
3.2.2 Execute Disable Bit................................................................................. 25
3.3 Intel® Hyper-Threading Technology (Intel® HT Technology).................................... 25
3.4 Intel® Turbo Boost Max Technology 3.0 ............................................................... 26
3.4.1 Intel® Turbo Boost Operating Frequency ................................................... 26
3.5 Enhanced Intel SpeedStep® Technology ............................................................... 26
3.6 Intel® Advanced Vector Extensions (Intel® AVX) ................................................... 27
4 Signal Descriptions.................................................................................................. 29
4.1 System Memory Interface .................................................................................. 29
Datasheet, Volume 1 3
4.2 PCI Express* Based Interface Signals ...................................................................30
4.3 Direct Media Interface 3 (DMI3) Signals................................................................30
4.4 PECI Signal .......................................................................................................31
4.5 System Reference Clock Signals ..........................................................................31
4.6 JTAG and TAP Signals.........................................................................................31
4.7 Serial VID Interface (SVID) Signals ......................................................................32
4.8 Processor Asynchronous Sideband and Miscellaneous Signals...................................32
4.9 Processor Power and Ground Supplies ..................................................................35
5 Electrical Specifications ...........................................................................................36
5.1 Integrated Voltage Regulation .............................................................................36
5.2 Processor Signaling ............................................................................................36
5.2.1 System Memory Interface Signal Groups....................................................36
5.2.2 PCI Express* Signals...............................................................................36
5.2.3 DMI3/PCI Express* Signals ......................................................................36
5.2.4 Platform Environmental Control Interface (PECI) .........................................37
5.2.4.1 Input Device Hysteresis .............................................................37
5.2.5 System Reference Clocks (BCLK{0/1/2}_DP, BCLK{0/1/2}_DN) ...................37
5.2.6 JTAG and Test Access Port (TAP) Signals....................................................38
5.2.7 Processor Sideband Signals ......................................................................38
5.2.8 Power, Ground and Sense Signals .............................................................38
5.2.8.1 Power and Ground Lands............................................................38
5.2.8.2 Decoupling Guidelines ................................................................39
5.2.8.3 Voltage Identification (VID) ........................................................39
5.2.8.4 SVID Commands .......................................................................39
5.2.8.5 SetWP Working Point Command ..................................................40
5.2.8.6 SetVID Fast Command ...............................................................40
5.2.8.7 SetVID Slow .............................................................................41
5.2.8.8 SetVID Decay ...........................................................................41
5.2.8.9 SVID Voltage Rail Addressing ......................................................41
5.2.9 Reserved or Unused Signals .....................................................................43
5.3 Signal Group Summary.......................................................................................43
5.3.1 Power-On Configuration (POC) Options ......................................................46
5.4 Absolute Maximum and Minimum Ratings..............................................................47
5.4.1 Storage Conditions Specifications..............................................................47
5.5 DC Specifications ...............................................................................................48
5.5.1 Voltage and Current Specifications ............................................................48
5.5.2 Signal DC Specifications ..........................................................................51
5.5.2.1 DDR4 Signal DC Specifications ....................................................51
5.5.2.2 PECI DC Specifications ...............................................................52
5.5.2.3 System Reference Clock (BCLK{0/1/2}) DC Specifications ..............53
5.5.2.4 SMBus DC Specifications ............................................................55
5.5.2.5 JTAG and TAP Signals DC Specifications .......................................55
5.5.2.6 Serial VID Interface (SVID) DC Specifications................................56
5.5.2.7 Processor Asynchronous Sideband DC Specifications ......................56
5.5.2.8 Miscellaneous Signals DC Specifications .......................................57
4 Datasheet, Volume 1
Figures
1-1 Platform Block Diagram Example ........................................................................... 8
1-2 PCI Express* Lane Partitioning and Direct Media Interface Generation 3 (DMI3) with 44
PCIE lane ......................................................................................................... 11
1-3 PCI Express* Lane Partitioning and Direct Media Interface Generation 3 (DMI3) with 48
PCIE lane ......................................................................................................... 12
2-1 PCI Express* Layering Diagram........................................................................... 19
2-2 Packet Flow through the Layers........................................................................... 19
5-1 Input Device Hysteresis ..................................................................................... 37
5-2 VCCIN Static and Transient Tolerance Load Lines 1.0 mOHM ................................... 51
5-3 BCLK{0/1/2} Differential Clock Measurement Point for Ringback.............................. 54
5-4 BCLK{0/1/2} Differential Clock Crosspoint Specification ......................................... 54
5-5 BCLK{0/1/2} Single Ended Clock Measurement Points for Absolute
Cross Point and Swing ....................................................................................... 55
5-6 BCLK{0/1/2} Single Ended Clock Measure Points for Delta Cross Point ..................... 55
Tables
1-1 Terminology ..................................................................................................... 14
1-2 Related Documents ........................................................................................... 17
4-1 Memory Channel DDR0, DDR1, DDR2, DDR3, DDR4, DDR5 ..................................... 29
4-2 Memory Channel Miscellaneous ........................................................................... 30
4-3 PCI Express* Signals ......................................................................................... 30
4-4 PCI Express* Miscellaneous Signals ..................................................................... 30
4-5 DMI3 Signals .................................................................................................... 30
4-6 PECI Signal ...................................................................................................... 31
4-7 System Reference Clock (BCLK{0/1/2}) Signals .................................................... 31
4-8 JTAG and TAP Signals ........................................................................................ 31
4-9 SVID Signals .................................................................................................... 32
4-10 Processor Asynchronous Sideband Signals .......................................................... 32
4-11 Miscellaneous Signals......................................................................................... 33
4-12 Power and Ground Signals .................................................................................. 35
5-1 Power and Ground Lands.................................................................................... 38
5-2 SVID Address Usage Bus 1 ................................................................................. 41
5-3 SVID Address Usage Bus 2 ................................................................................. 42
5-4 VR13.0 Reference Code Voltage Identification (VID) Table ...................................... 42
5-5 Signal Description Buffer Types ........................................................................... 43
5-6 Signal Groups ................................................................................................... 44
5-7 Signals with On-Die Weak PU/PD......................................................................... 46
5-8 Power-On Configuration Option Lands .................................................................. 46
5-9 Processor Absolute Minimum and Maximum Ratings ............................................... 47
5-10 Storage Condition Ratings .................................................................................. 48
5-11 Voltage Specification.......................................................................................... 48
5-12 Current (ICCIN_MAX and ICCIN_TDC) Specification ............................................... 49
5-13 VCCIN Static and Transient Tolerance for 1.0LL ..................................................... 50
Datasheet, Volume 1 5
Revision History
Revision
Description Revision Date
Number
004 • Updated to include i9-99xxX and i9-99xxXE Intel® CoreTM X-series processors November 2018
005 • Updated to include i9-109xxX and i9-109xxXE Intel® CoreTM X-series processors July 2020
§§
6 Datasheet, Volume 1
Introduction
1 Introduction
The Intel® Core™ X-Series processor families are the next generation of 64-bit, multi-
core processors built on 14-nm process technology. Based on the low power / high
performance processor microarchitecture, the processor is designed for a platform
consisting of a processor and Platform Controller Hub (PCH). The X-Series processor is
used with the Intel® X299 Chipset PCH.
The processor supports up to 46 bits of physical address space and 48 bits of virtual
address space. The 78xx, 79xx, 98xx, and 99xx processor families feature up to 44
lanes of PCI Express* 3.0 links capable of 8.0 GT/s, and 4 lanes of DMI/PCI Express*
3.0. The 10xxx processor family features 48 lanes of PCI Express* 3.0 links. Both
families feature an Integrated Memory Controller (IMC) that supports four channels of
DDR4 memory.
The integrated memory controller (IMC) and integrated I/O (IIO) are on a single silicon
die. This single-die solution is known as a monolithic processor.
This document covers the following Intel® Core™ X-series processor families:
• i7-7800X, i7-7820X, i9-7900X, i9-7920X, i9-7940X, i9-7960X, i9-7980XE.
• i7-9800X, i9-9820X, i9-9900X, i9-9920X, i9-9940X, i9-9960X, i9-9980XE.
• i9-10980XE, i9-10940X, i9-10920X, i9-10900X.
Note: Throughout this document, the Intel® Core™ X-Series processor families may be
referred to as “processor”. The Intel® X299 Chipset PCH may be referred to as the
“PCH”.
Note: Some processor features are not available on all processor SKUs.
Datasheet, Volume 1 7
Introduction
CH A
CH B
PCI Express* 3.0 Processor
CH C System Memory
CH D
USB 3.0
LPC
SMBus 2.0
Super IO / EC
GPIOs
8 Datasheet, Volume 1
Introduction
1.3 Interfaces
1.3.1 System Memory Support
• Supports four DDR4 channels
• Unbuffered DDR4 DIMMs supported
• Independent channel mode or lockstep mode
• Data burst length of eight cycles for all memory organization modes
• Memory DDR4 data transfer rates of 1600 MT/s, 1866 MT/s, 2133 MT/s, 2400 MT/
s, and 2666 MT/s (1 DPC)
• 64-bit wide channels
• DDR4 standard I/O Voltage of 1.2 V
• 4Gb and 8Gb DDR4 DRAM technologies supported for these devices:
— UDIMM x8
• Up to two ranks supported per memory channel
• Open with adaptive idle page close timer or closed page policy
• Per channel memory test and initialization engine can initialize DRAM to all logical
zeros or a predefined test pattern
• Minimum memory configuration: independent channel support with one DIMM
populated
• Command launch modes of 1n/2n
• Improved Thermal Throttling
• Memory thermal monitoring support for DIMM temperature using two memory
signals, MEM_HOT_C{01/23}_N
Datasheet, Volume 1 9
Introduction
10 Datasheet, Volume 1
Introduction
Figure 1-2. PCI Express* Lane Partitioning and Direct Media Interface Generation 3
(DMI3) with 44 PCIE lane
Physical
Physical Physical Physical
0..3 0..3 4..7 8..11 12..15 0..3 4..7 8..11 12..15 0..3 4..7 12..15
x4 x4 x4 x4 x4 x4 x4 x4 x4 x4 x4 x4
DMI Port 1a Port 1b Port 1c Port 1d Port 2a Port 2b Port 2c Port 2d Port 3a Port 3b Port 3d
x8 x8 x8 x8 x8 x4
Datasheet, Volume 1 11
Introduction
Figure 1-3. PCI Express* Lane Partitioning and Direct Media Interface Generation 3
(DMI3) with 48 PCIE lane
12 Datasheet, Volume 1
Introduction
Datasheet, Volume 1 13
Introduction
1.8 Terminology
Caching Agent (also referred to as CA). It is a term used for the internal logic
Cbo providing ring interface to LLC and Core. The Cbo is a functional unit in the
processor.
DMI3 Direct Media Interface Gen2 operating at PCI Express* 3.0 speed.
DTLB Data Translation Look-aside Buffer. Part of the processor core architecture.
Enhanced Intel Allows the operating system to reduce power consumption when performance is
SpeedStep® Technology not needed.
14 Datasheet, Volume 1
Introduction
Intel® Core™ i7 processor Intel's 22-nm process based product. The processor supports Efficient
family for LGA2011-v3 Performance High-End Desktop platforms.
Socket processor
Any timing variation of a transition edge or edges from the defined Unit Interval
Jitter
(UI).
The 2011-v3 land FC-LGA package mates with the system board through this
LGA2011-v3 Socket
surface mount, 2011-v3 contact socket.
LRU Least Recently Used. A term used in conjunction with cache allocation policy.
Modified/Exclusive/Shared/Invalid/Forwarded. States used in conjunction with
MESIF
cache coherency
Platform Controller Hub. The next generation chipset with centralized platform
capabilities including the main I/O interfaces along with display connectivity,
PCH
audio features, power management, manageability, security and storage
features.
The third generation PCI Express* specification that operates at twice the speed
PCI Express* 3.0 of PCI Express* 2.0 (8 Gb/s); PCI Express* 3.0 is completely backward
compatible with PCI Express* 1.0 and 2.0.
The term "processor core" refers to Si die itself which can contain multiple
Processor Core execution cores. Each execution core has an instruction cache, data cache, and
256-KB L2 cache. All execution cores share the L3 cache.
A unit of DRAM corresponding four to eight devices in parallel. These devices are
Rank
usually, but not always, mounted on a single side of a DDR4 DIMM.
Datasheet, Volume 1 15
Introduction
Request Transaction IDs are credits issued by the Cbo to track outstanding
RTID
transaction, and the RTIDs allocated to a Cbo are topology dependent.
Stock Keeping Unit (SKU) is a subset of a processor type with specific features,
SKU electrical, power and thermal specifications. Not all features are supported on all
SKUs. A SKU is based on specific use condition assumption.
STR Suspend-to-RAM
The portion of the processor comprising the shared LLC cache, IMC, HA, PCU,
Uncore
Ubox, and IIO link interface.
VCCIN Primary voltage input to the voltage regulators integrated into the processor.
16 Datasheet, Volume 1
Introduction
§§
Datasheet, Volume 1 17
Interfaces
2 Interfaces
This chapter describes the functional behaviors supported by the processor. Topics
covered include:
• System Memory Interface
• PCI Express* Interface
• Direct Media Interface 3 (DMI3) / PCI Express* Interface
• Platform Environment Control Interface (PECI)
The PCI Express* architecture is specified in three layers – Transaction Layer, Data Link
Layer, and Physical Layer. The partitioning in the component is not necessarily along
these same boundaries. Refer to the following figure for the PCI Express* Layering
Diagram.
18 Datasheet, Volume 1 of 2
Interfaces
Transaction Transaction
Physical Physical
Logical Sub-Block Logical Sub-Block
RX TX RX TX
Sequence
Framing Header Date ECRC LCRC Framing
Number
Transaction Layer
Data Link Layer
Physical Layer
Datasheet, Volume 1 of 2 19
Interfaces
The transmission side of the Data Link Layer accepts TLPs assembled by the
Transaction Layer, calculates and applies data protection code and TLP sequence
number, and submits them to Physical Layer for transmission across the Link. The
receiving Data Link Layer is responsible for checking the integrity of received TLPs and
for submitting them to the Transaction Layer for further processing. On detection of
TLP error(s), this layer is responsible for requesting retransmission of TLPs until
information is correctly received, or the Link is determined to have failed. The Data Link
Layer also generates and consumes packets that are used for Link management
functions.
The PCI Express* Host Bridge is required to translate the memory-mapped PCI
Express* configuration space accesses from the host processor to PCI Express*
configuration cycles. To maintain compatibility with PCI configuration addressing
mechanisms, it is recommended that system software access the enhanced
configuration space using 32-bit operations (32-bit aligned) only.
Refer to the PCI Express* Base Specification for details of both the PCI-compatible and
PCI Express* Enhanced configuration mechanisms and transaction rules.
20 Datasheet, Volume 1 of 2
Interfaces
Downstream transactions that had been successfully transmitted across the link prior
to the link going down may be processed as normal. No completions from downstream,
non-posted transactions are returned upstream over the DMI3 link after a link down
event.
The interface design was optimized for interfacing to Intel processor and chipset
components in both single processor and multiple processor environments. The single
wire interface provides low board routing overhead for the multiple load connections in
the congested routing area near the processor and chipset components. Bus speed,
error checking, and low protocol overhead provides adequate link bandwidth and
reliability to transfer critical device operating conditions and configuration information.
§§
Datasheet, Volume 1 of 2 21
Technologies
3 Technologies
22 Datasheet, Volume 1 of 2
Technologies
Datasheet, Volume 1 of 2 23
Technologies
24 Datasheet, Volume 1 of 2
Technologies
The architecture consists of six instructions that offer full hardware support for Intel®
AES-NI. Four instructions support the Intel® AES-NI encryption and decryption, and
the other two instructions support the Intel® AES-NI key expansion. Together, they
offer a significant increase in performance compared to pure software implementations.
The Intel® AES-NI instructions have the flexibility to support all three standard Intel®
AES-NI key lengths, all standard modes of operation, and even some nonstandard or
future variants.
Datasheet, Volume 1 of 2 25
Technologies
Processors with Intel® Turbo Boost Max Technology 3.0 feature contain at least one
processor core whose maximum turbo frequency is higher than the others. To realize
the higher performance benefit of such a core, targeted applications must run on that
core. The processor core with the higher frequency may vary from one processor to
another. BIOS calls to the mailbox interface is used to identify the core with the higher
performance.
To determine the highest performance frequency amongst active cores, the processor
takes the following into consideration:
• Number of cores operating in the C0 state
• Estimated current consumption
• Estimated power consumption
• Die temperature
Any of these factors can affect the maximum frequency for a given workload. If the
power, current, or thermal limit is reached, the processor will automatically reduce the
frequency to stay with its TDP limit.
Note: Intel® Turbo Boost Technology is only active if the operating system is requesting the
P0 state.
Enhanced Intel SpeedStep® Technology builds upon that architecture using design
strategies that include the following:
• Separation between Voltage and Frequency Changes. By stepping voltage up
and down in small increments separately from frequency changes, the processor is
able to reduce periods of system unavailability that occur during frequency change.
Thus, the system is able to transition between voltage and frequency states more
often, providing improved power/performance balance.
• Clock Partitioning and Recovery. The bus clock continues running during state
transition, even when the core clock and Phase-Locked Loop are stopped, which
26 Datasheet, Volume 1 of 2
Technologies
allows logic to remain active. The core clock can also restart more quickly under
Enhanced Intel SpeedStep Technology.
Intel® AVX is a comprehensive ISA extension of the Intel® 64 Architecture. The main
elements of Intel® AVX are:
• Support for wider vector data (up to 256-bit) for floating-point computation.
• Efficient instruction encoding scheme that supports three operand syntax and
headroom for future extensions.
• Flexibility in programming environment, ranging from branch handling to relaxed
memory alignment requirements .
• New data manipulation and arithmetic compute primitives, including broadcast,
permute, fused-multiply-add, and so on.
• Floating point bit depth conversion (Float 16)
• A group of four instructions that accelerate data conversion between 16-
bit floating point format to 32-bit and vice versa.
• This benefits image processing and graphical applications allowing
compression of data so less memory and bandwidth is required.
Datasheet, Volume 1 of 2 27
Technologies
§§
28 Datasheet, Volume 1 of 2
Signal Descriptions
4 Signal Descriptions
This chapter describes the signals. They are arranged in functional groups according to
their associated interface or category.
Table 4-1. Memory Channel DDR0, DDR1, DDR2, DDR3, DDR4, DDR5
Signal Name Description
Bank Address. Defines which bank is the destination for the current
DDR{5:0}_BA[1:0]
Activate, Read, Write, or Precharge command.
Bank Group: Defines which bank group is the destination for the current
DDR{5:0}_BG[1:0] Active, Read, Write or Precharge command. BG0 also determines which
mode register is to be accessed during a MRS cycle.
DDR{5:0}_CLK_DN[3:0] Differential clocks to the DIMM. All command and control signals are valid on
DDR{5:0}_CLK_DP[3:0] the rising edge of clock.
Chip Select. Each signal selects one rank as the target of the command and
address.
DDR{5:0}_CS_N[7:0]
CS_N[7:6] are multiplexed with CID[4:3], respectively. CS_N[3:2] are
multiplexed with CID[1:0], respectively.
Data strobes. Differential pair, Data Strobe. Differential strobes latch data
DDR{5:0}_DQS_DP[17:0] for each DRAM. Different numbers of strobes are used depending on
DDR{5:0}_DQS_DN[17:0] whether the connected DRAMs are x4,x8. Driven with edges in center of
data, receive edges are aligned with data edges.
Memory Address. Selects the Row address for Reads and writes, and the
column address for activates. Also used to set values for DRAM configuration
registers.
MA[16], MA[15], and MA[14] are multi-function and multiplexed with
DDR{5:0}_MA[17:0]
RAS_N, CAS_N, and WE_N, respectively.
Note: MA[17] is not used on X-Series Processor It is reserved for future
processor implementations. The pin still requires to be routed appropriately
on the board to support future drop-in compatibility.
Datasheet, Volume 1 of 2 29
Signal Descriptions
SMBus clock for the dedicated interface to the serial presence detect
(SPD) and thermal sensors (TSoD) on the DIMMs. DDR_SCL_C012 is used
DDR{012,345}_SPDSCL
for memory channels 0, 1 and 2 while DDR_SCL_C345 is used for memory
channels 3, 4 and 5.
SMBus data for the dedicated interface to the serial presence detect (SPD)
and thermal sensors (TSoD) on the DIMMs. DDR_SDA_C012 is used for
DDR{012,345}_SPDSDA
memory channels 0, 1 and 2 while DDR_SDA_C345 is used for memory
channels 3, 4 and 5.
Power good for VCCD rail used by the DRAM. This is an input signal used
DDR{012,345}_DRAM_PWR_OK to indicate the VCCD power supply is stable for memory channels 0, 1, 2
and channels 3, 4, 5.
PCI Express* Hot-Plug SMBus Data: Provides PCI Express* hot-plug support
PE_HP_SDA via a dedicated SMBus interface. Requires an external general purpose
input/output (GPIO) expansion device on the platform.
30 Datasheet, Volume 1 of 2
Signal Descriptions
Breakpoint and Performance Monitor Signals: I/O signals from the processor
BPM_N[7:0] that indicate the status of breakpoints and programmable counters used for
monitoring processor performance. These are 100 MHz signals.
TCK (Test Clock) provides the clock input for the processor Test Bus (also
TCK
known as the Test Access Port).
TDI (Test Data In) transfers serial test data into the processor. TDI provides
TDI
the serial input needed for JTAG specification support.
TDO (Test Data Out) transfers serial test data out of the processor. TDO
TDO
provides the serial output needed for JTAG specification support.
TMS (Test Mode Select) is a JTAG specification support signal used by debug
TMS
tools.
TRST_N (Test Reset) resets the Test Access Port (TAP) logic. TRST_N must
TRST_N
be driven low during power on Reset.
Datasheet, Volume 1 of 2 31
Signal Descriptions
Indicates that the system has experienced a fatal or catastrophic error and
cannot continue to operate. The processor will assert CATERR_N for
unrecoverable machine check errors and other internal unrecoverable
errors. It is expected that every processor in the system will wire-OR
CATERR_N for all processors. Since this is an I/O land, external agents are
CATERR_N allowed to assert this land which will cause the processor to take a machine
check exception. The CATERR_N signal can be sampled any time after 1.5
ms after the assertion of PWRGOOD. CATERR_N is used for signaling the
following types of errors:
• Legacy MCERR's, CATERR_N is asserted for 16 BCLKs.
Machine Check Exception (MCE) is signaled using this pin when eMCA2 is
MSMI_N enabled. The MSMI_N signal can be sampled any time after 1.5 ms after the
assertion of PWRGOOD
32 Datasheet, Volume 1 of 2
Signal Descriptions
Global reset signal. Asserting the RESET_N signal resets the processor to a
known state and invalidates its internal caches without writing back any of
RESET_N
their contents. Note that some PLL, error states are not affected by reset
and only PWRGOOD forces them to a known state.
This pin is used to force debug to be enabled when the ITP is connected to
DEBUG_EN_N
the main board. This allows debug to occur beginning from cold boot.
Datasheet, Volume 1 of 2 33
Signal Descriptions
RESERVED. All signals that are RSVD must be left unconnected on the
RSVD
board.
34 Datasheet, Volume 1 of 2
Signal Descriptions
PWR_DEBUG_N This is a debug signal for power debug using Intel® ITP on the processor.
SOCKET_ID2 Asynchronous to other clocks in the processor.
1.8 V - 1.55 V input to the Integrated Voltage Regulator (IVR) for the
processor cores, lowest level caches (LLC), ring interface, PLL, IO, and home
VCCIN agent. It is provided by a VR 13.0 compliant motherboard voltage regulator
(MBVR) for each CPU socket. The output voltage of this MBVR is controlled
by the processor, using the serial voltage ID (SVID) bus.
VCCIN_SENSE and VSS_VCCIN_SENSE are remote sense signals for VCCIN
VCCIN_SENSE MBVR13.0 and are used by the voltage regulator to ensure accurate voltage
regulation. These signals must be connected to the voltage regulator
VSS_VCCIN_SENSE feedback circuit, which insures the output voltage remains within
specification.
Pmax detect VCCIN supply through board R2 thermistor for VCCIN loadline
VCCINPMAX
temperature compensation
§§
Datasheet, Volume 1 of 2 35
Electrical Specifications
5 Electrical Specifications
Throughout this chapter the system memory interface may be referred to as DDR4.
Datasheet, Volume 1 36
Electrical Specifications
The PECI interface operates at a nominal voltage. The set of DC electrical specifications
shown in Section 5.5.2.2 is used with devices normally operating from a PECI
interface supply.
The processor core frequency is configured during reset by using values stored within
the device during manufacturing. The stored value sets the lowest core multiplier at
which the particular processor can operate. If higher speeds are desired, the
appropriate ratio can be configured using the IA32_PERF_CTL MSR (MSR 199h); Bits
[14:0].
37 Datasheet, Volume 1
Electrical Specifications
Clock multiplying within the processor is provided by the internal phase locked loop
(PLL), which requires a constant frequency BCLK{0/1/2}_DP, BCLK{0/1/2}_DN input,
with exceptions for spread spectrum clocking. DC specifications for the BCLK{0/1/
2}_DP, BCLK{0/1/2}_DN inputs are provided in Section 5.5.2.7.
All Processor Asynchronous Sideband input signals are required to be asserted/ de-
asserted for a defined number of BCLKs in order for the processor to recognize the
proper signal state, these are outlined in Section 5.5.2.7, “Processor Asynchronous
Sideband DC Specifications”.
For clean on-chip power distribution, processors include lands for all required voltage
supplies. These are listed in the following table.
VCCIN Each VCCIN land must be supplied with the voltage determined by the SVID Bus
signals. VR 13.0 defines the voltage level associated with each core SVID pattern.
VCCD012 VCCD345 Each VCCD land is connected to a switchable 1.20 V supply, provide power to the
processor DDR4 interface.
VCCD is also controlled by the SVID Bus. VCCD is the generic term for VCCD012 and
VCCD345..
VCCSA IO voltage supply input
VCC33 Power supply for PIROM.
VSS Ground
VCCIO IO voltage supply input
Datasheet, Volume 1 38
Electrical Specifications
Individual processor VID values may be calibrated during manufacturing such that two
processor units with the same core frequency may have different default VID settings.
The VRM or EVRD utilized must be capable of regulating its output to the value defined
by the new VID.
39 Datasheet, Volume 1
Electrical Specifications
The Work Point command is encoded to support up to 8 VID targets, slew rate for the
command, and alert function. The PWM should use its auto power state or auto-phase
shedding functions to select appropriate # phases, CCM/DCM operation, and so forth.
based on output load current after the SetWP command target has been reached.
WP7 = State 7
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Electrical Specifications
The SetVID_Fast command is preemptive. The VR interrupts its current processes and
moves to the new VID. The SetVID_Fast command operates on 1 VR address at a time.
This command is used in the processor for package C6 fast exit.
The SetVID_Slow command is preemptive, the VR interrupts its current processes and
moves to the new VID. This is the instruction used for normal P-state voltage change.
This command is used in the processor for the Intel Enhanced SpeedStep® Technology
transitions.
The SetVID_Decay command is preemptive, the VR interrupts its current processes and
moves to the new VID. This command is used in the processor for package C6 entry,
allowing capacitor discharge by the leakage, thus saving energy.This command is only
used in VID down direction in the processor package C6 entry.
Notes:
1. Check with VR vendors for determining the physical address assignment method for their controllers.
2. VR addressing is assigned on a per voltage rail basis.
3. Dual VR controllers will have two addresses with the lowest order address, always being the higher
phase count.
4. For future platform flexibility, the VR controller should include an address offset, as shown with +1
not used.
41 Datasheet, Volume 1
Electrical Specifications
01 NA
03 NA
Notes:
1. Check with VR vendors for determining the physical address assignment method for their controllers.
2. VR addressing is assigned on a per voltage rail basis.
3. Dual VR controllers will have two addresses with the lowest order address, always being the higher
phase count.
Table 5-4. VR13.0 Reference Code Voltage Identification (VID) Table (Sheet 1 of 2)
HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN
Datasheet, Volume 1 42
Electrical Specifications
Table 5-4. VR13.0 Reference Code Voltage Identification (VID) Table (Sheet 2 of 2)
HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN
Analog Analog reference or output. May be used as a threshold voltage or for buffer
compensation
Asynchronous Signal has no timing relationship with any system reference clock.
CMOS CMOS Output buffers: 1.05 V tolerant / CMOS Input buffers
DMI3 Direct Media Interface Gen 3 signals. These signals are compatible with PCI Express* 3.0
Signaling Environment AC Specifications.
PCI Express* PCI Express* interface signals. These signals are compatible with PCI Express* 3.0
Signaling Environment AC Specifications and are AC coupled. The buffers are not 3.3-V
tolerant. Refer to the PCIe* specification.
43 Datasheet, Volume 1
Electrical Specifications
DC Output DDR{5:0}_CAVREF
Datasheet, Volume 1 44
Electrical Specifications
Miscellaneous Signals
Power/Other Signals
45 Datasheet, Volume 1
Electrical Specifications
The sampled information configures the processor for subsequent operation. These
configuration options cannot be changed except by another reset transition of the
latching signal (RESET_N or PWRGOOD).
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Electrical Specifications
Notes:
1. Output tri-state option enables Fault Resilient Booting (FRB), for FRB details, refer to the Fault Resilient
Booting (FRB) Section. The signal used to latch PROCDIS_N for enabling FRB mode is RESET_N.
2. BIST_ENABLE is sampled at RESET_N de-assertion
3. This signal is sampled after PWRGOOD assertion.
Although the processor contains protective circuitry to resist damage from Electro-
Static Discharge (ESD), precautions should always be taken to avoid high static
voltages or electric fields.
Notes:
1. For functional operation, all processor electrical, signal quality, mechanical, and thermal specifications
must be satisfied.
2. Excessive Overshoot or undershoot on any signal will likely result in permanent damage to the processor.
The following table specifies absolute maximum and minimum storage temperature
limits which represent the maximum or minimum device condition beyond which
damage, latent or otherwise, may occur. The table also specifies sustained storage
temperature, relative humidity, and time-duration limits. These limits specify the
maximum or minimum device storage conditions for a sustained period of time. At
conditions outside sustained limits, but within absolute maximum and minimum
ratings, quality and reliability may be affected.
47 Datasheet, Volume 1
Electrical Specifications
Timeshort term storage A short period of time (in shipping media). 0 72 hours
Notes:
1. Storage conditions are applicable to storage environments only. In this scenario, the processor must not
receive a clock, and no lands can be connected to a voltage bias. Storage within these limits will not
affect the long-term reliability of the device. For functional operation, refer to the processor case
temperature specifications.
2. These ratings apply to the Intel component and do not include the tray or packaging.
3. Failure to adhere to this specification can affect the long-term reliability of the processor.
4. Non-operating storage limits post board attach: Storage condition limits for the component once
attached to the application board are not specified. Intel does not conduct component level certification
assessments post board attach given the multitude of attach methods, socket types and board types
used by customers. Provided as general guidance only, Intel board products are specified and certified to
meet the following temperature and humidity limits (Non-Operating Temperature Limit: -40 °C to 70 °C
and Humidity: 50% to 90%, non condensing with a maximum wet bulb of 28 °C).
5. Device storage temperature qualification methods follow JEDEC High and Low Temperature Storage Life
Standards: JESD22-A119 (low temperature) and JESD22-A103 (high temperature).
5.5 DC Specifications
DC specifications are defined at the processor pads, unless otherwise noted.
DC specifications are only valid while meeting specifications for case temperature, clock
frequency, and input voltages. Care should be taken to read all notes associated with
each specification.
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Electrical Specifications
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processors.
2. These voltages are targets only. A variable voltage source should exist on systems in the event that a different voltage is
required.
3. The VCCIN voltage specification requirements are measured across the remote sense pin pairs (VCCIN_SENSE and
VSS_VCCIN_SENSE) on the processor package. Voltage measurement should be taken with a DC to 100 MHz bandwidth
oscilloscope limit (or DC to 20 MHz for older model oscilloscopes), using a 1.5 pF maximum probe capacitance, and 1 Mohm
minimum impedance. The maximum length of the ground wire on the probe should be less than 5 mm to ensure external
noise from the system is not coupled in the scope probe.
4. Refer to VCCIN Static and Transient Tolerance Processor and corresponding Figure 5-2, “VCCIN Static and Transient
Tolerance Load Lines 1.0 mOHM” on page 51. The processor should not be subjected to any static VCCIN level that exceeds
the VCCIN_MAX associated with any particular current. Failure to adhere to this specification can shorten processor lifetime.
5. ICCIN_MAX is specified at the relative VCC_MAX point on the VCCIN load line. The processor is capable of drawing
ICCIN_MAX for up to 2 ms.
6. This specification represents the VCCIN reduction or VCCIN increase due to each VID transition. For Voltage Identification
(VID), refer Table 5-4, “VR13.0 Reference Code Voltage Identification (VID) Table”.
7. Baseboard bandwidth is limited to 20 MHz.
8. N/A
9. DC + AC + Ripple = Tolerance
10. VCCD tolerance at processor pins. Required in order to meet +/-5% tolerance at processor die.
11. The VCCD012, VCCD345 voltage specification requirements are measured across vias on the platform. Choose VCCD012 or
VCCD345 vias close to the socket and measure with a DC to 100 MHz bandwidth oscilloscope limit (or DC to 20 MHz for
older model oscilloscopes), using 1.5 pF maximum probe capacitance, and 1M ohm minimum impedance. The maximum
length of the ground wire on the probe should be less than 5 mm to ensure external noise from the system is not coupled in
the scope probe.
12. VCCIN has a Vboot setting of 1.7 V and is not included in the PWRGOOD indication.
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processors.
2. N/A
3. ICCIN_TDC (Thermal Design Current) is the sustained (DC equivalent) current that the
processor is capable of drawing indefinitely and should be used for the voltage regulator
thermal assessment. The voltage regulator is responsible for monitoring its temperature
and asserting the necessary signal to inform the processor of a thermal excursion.
4. Minimum VCCIN and maximum ICCIN are specified at the maximum processor case
temperature (TCASE). ICCIN_MAX is specified at the relative VCCIN_MAX point on the
VCCIN load line. The processor is capable of drawing ICCIN_MAX for up to 2 ms.
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Electrical Specifications
Notes:
1. The VCCIN_MIN and VCCIN_MAX loadlines represent static and transient limits.
2. This table is intended to aid in reading discrete points on graph in Figure 5-2, “VCCIN Static and
Transient Tolerance Load Lines 1.0 mOHM” on page 51.
3. The loadlines specify voltage limits at the die measured at the VCCIN_SENSE and VSS_VCCIN_SENSE lands.
Voltage regulation feedback for voltage regulator circuits must also be taken from processor VCCIN_SENSE
and VSS_VCCIN_SENSE lands.
4. The Adaptive Loadline Positioning slope is 1.00 m (mohm) with ±22mV TOB (Tolerance of Band).
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Electrical Specifications
Figure 5-2. VCCIN Static and Transient Tolerance Load Lines 1.0 mOHM
Data Signals
Data Signals
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Electrical Specifications
Command Signals
Control Signals
DRAM_PWR_OK_C{01/23}
VIL Input Low Voltage — 0.3*VCCD — mV 2, 3
VIH Input High Voltage — 0.7*VCCD — mV 2, 4, 5
ALERT_N
VIL Input Low Voltage Vref-90 — Vref - 70 mV 3
VIH Input High Voltage Vref+70 — Vref+90 mV 4
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. The voltage rail VCCD which will be set to 1.2 V nominal depending on the voltage of all DIMMs connected to the processor.
3. VIL is the maximum voltage level at a receiving agent that will be interpreted as a logical low value.
4. VIH is the minimum voltage level at a receiving agent that will be interpreted as a logical high value.
5. VIH and VOH may experience excursions above VCCD. However, input signal drivers must comply with the signal quality
specifications.
6. This is the pull down driver resistance. Reset drive does not have a termination.
7. RVTT_TERM is the termination on the DIMM and not controlled by the processor. Refer to the applicable DIMM datasheet.
8. The minimum and maximum values for these signals are programmable by BIOS to one of the pairs.
9. Input leakage current is specified for all DDR4 signals.
10. Vol = Ron * [VCCD/(Ron + Rtt_Eff)], where Rtt_Eff is the effective pull-up resistance of all DIMMs in the system, including
ODTs and series resistors on the DIMMs.
11. This Ron value is only for UDIMM, otherwise the Ron Value is 30 ohm.
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Electrical Specifications
Vcross (abs) Absolute Crossing Point Single Ended Figure 5-4 and 2, 4, 7,
0.250 0.550 V
Figure 5-5 9
Vcross (rel) Relative Crossing Point Single Ended 0.250 + 0.550 + Figure 5-4 3, 4, 5,
0.5*(VHavg - 0.5*(VHavg - V 9
0.700) 0.700)
ΔVcross Range of Crossing Points Single Ended N/A 0.140 V Figure 5-6 6, 9
VTH Threshold Voltage Single Ended Vcross - 0.1 Vcross + 0.1 V 9
IIL Input Leakage Current N/A — 1.50 mA 8, 9
Cpad Pad Capacitance N/A 1.90 1.72 pF 9
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Crossing Voltage is defined as the instantaneous voltage value when the rising edge of BCLK{0/1}_DN is equal to the falling
edge of BCLK{0/1}_DP.
3. VHavg is the statistical average of the VH measured by the oscilloscope.
4. The crossing point must meet the absolute and relative crossing point specifications simultaneously.
5. VHavg can be measured directly using “Vtop” on Agilent* and “High” on Tektronix oscilloscopes.
6. VCROSS is defined as the total variation of all crossing voltages as defined in Note 3.
7. The rising edge of BCLK{0/1}_DN is equal to the falling edge of BCLK{0/1}_DP.
8. For Vin between 0 and Vih.
9. Specifications can be validated at the pin.
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Electrical Specifications
Figure 5-5. BCLK{0/1/2} Single Ended Clock Measurement Points for Absolute
Cross Point and Swing
Figure 5-6. BCLK{0/1/2} Single Ended Clock Measure Points for Delta Cross Point
Output Edge Rate (50 ohm to VCCIO, between VIL and VIH) 1.13 5 V/ns 1
Note:
1. Value obtained through test bench with 50 ohm pull up to VCCIO.
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Electrical Specifications
Notes:
1. These are measured between VIL and VIH.
2. The signal edge rate must be met or the signal must transition monotonically to the asserted state.
Notes:
1. VCCIO refers to instantaneous VCCIO.
2. Measured at 0.31*VCCIO.
3. Vin between 0V and VCCIO (applies to SVIDDATA and SVIDALERT_N only).
4. N/A
5. These are measured between VIL and VIH.
6. Value obtained through test bench with 50 ohms pull-up to VCCIO.
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Electrical Specifications
Notes:
1. This table applies to the processor sideband and miscellaneous signals specified in Table 5-6, “Signal
Groups”.
2. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
3. These are measured between VIL and VIH.
4. In the case of bidirectional signals they use either a CMOS output /CMOS input buffer or they use Open
Drain / CMOS input buffer.
5. VOL level for open drain buffers may be obtained with the Buffer ON Resistance and the external
50 ohm pull-up to VCCIO.
SKTOCC_N Signal
VO_ABS_MAX Output Absolute Max Voltage — 3.30 3.50 V
§§
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