Application Note

Testing Overexcitation Protection (ANSI 24) for

Generators using the CMC and Test Universe

Author
Sameh Eldmrdash | [email protected]

Date
August 23, 2021

Related OMICRON Product

CMC, Test Universe

Application Area
Protection Systems

Keywords
CMC, Test Universe, Generator Protection Testing, Overflux, Overexcitation

Version
v1.0

Document ID
ANS_21007_ENU

Abstract
Testing the overexcitation for generator protection relays is often a challenge due to the overlapping with
other protection functions like voltage and frequency protection. This application note is describing how you
can test this function with an application setting in a proper and easy way.
 General information

OMICRON electronics GmbH, including all international branch offices, is henceforth referred to as
OMICRON.
The product information, specifications, and technical data embodied in this Application Note represent the
technical status at the time of writing and are subject to change without prior notice.
We have done our best to ensure that the information given in this Application Note is useful, accurate and
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OMICRON translates this Application Note from the source language English into a number of other
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© OMICRON 2021. All rights reserved. This Application Note is a publication of OMICRON.

© OMICRON 2021 Page 2 of 13

 Table of content

1 Safety instructions ................................................................................................................................4

2 Introduction ............................................................................................................................................5
3 Overexcitation protection function ......................................................................................................6
3.1 Overexcitation protection parameter settings .................................................................................6
3.2 Overlapping with other protection functions ...................................................................................7
3.3 Testing the overexcitation protection function ................................................................................7
3.3.1 Testing the warning stage (V/f>) ....................................................................................................... 7
3.3.2 Testing the tripping characteristic of the overexcitation protection .................................................... 9
3.3.3 Testing the V/f>> instantaneous tripping stage of the overexcitation protection ............................. 11

© OMICRON 2021 Page 3 of 13

1 Safety instructions
This Application Note may only be used in conjunction with the relevant product manuals which contain all
safety instructions. The user is fully responsible for any application that makes use of OMICRON products.
Instructions are always characterized by a  symbol, even if they are included in a safety instruction.

NOTICE

Equipment damage or loss of data possible

 Carefully read and understand the content of this Application Note as well as the manuals of the
systems involved before taking them into operation.
 Please contact OMICRON support if you have any questions or doubts regarding the safety or
operating instructions.
 Follow each instruction listed in the manuals, especially the safety instructions, since this is the
only way to avoid the danger that can occur when working on high voltage or high current
systems.
 Only use the equipment involved according to its intended purpose to guarantee safe operation.
 Existing national safety standards for accident prevention and environmental protection may
supplement the equipment’s manual.
 Before starting a test always check that the test signals are suitable for your system under test.

DANGER
Death or severe injury caused by high voltage or current.

 Do not enter the high-voltage area while working with the MPO1.
 Do not enter the high-voltage area if the red warning light of the CPC 100 is
on since all outputs carry dangerous voltage current.
 Always obey the five safety rules and follow the detailed safety instructions
in the respective user manuals.

Only experienced and competent professionals that are trained for working in high voltage or high current
environments may implement this Application Note. Additionally, the following qualifications are required:
• Authorized to work in environments of energy generation, transmission or distribution, and familiar
with the approved operating practices in such environments.
• Familiar with the five safety rules.
• Good knowledge/proficient in working with the CMC and Test Universe.

© OMICRON 2021 Page 4 of 13

2 Introduction
Over fluxing or Overexcitation (Volts/Hertz) protection function (ANSI 24) is used to protect generators and
transformers against overheating and winding insulation failure caused by the high induction which will
quickly saturate the iron core and cause current losses. This function is often used to protect power station
unit transformers against either the rise of the voltage - where voltage regulators are not operating to
readjust the associated voltage - or the decrease of the frequency (generator rotation speed) or both.

© OMICRON 2021 Page 5 of 13

 3 Overexcitation protection function
The overexcitation protection function calculates the quotient V/f (V/Hz) and compares it to the nominal
induction (Bn) of the asset to be protected. If the calculated value is higher than the configured value (B/Bn),
the protection function performs delayed tripping in order to protect the stator core from thermal damages.

3.1 Overexcitation protection parameter settings

V/f t (s)

V/f> 1.03 1000

1.05 1000

1.1 600

1.15 240

Thermal tripping
1.2 60

1.25 30

1.3 19
3
1.35 13

1.4 10

V/f>> 1.4 1

Figure 1: Trip time characteristics of the overexcitation protection

V
Vn Generator
Tripping criterion: B ≥
f
fn

Additionally, the warning stage (V/f>) has a warning time delay of 10 seconds.

© OMICRON 2021 Page 6 of 13

3.2 Overlapping with other protection functions

It is difficult to clearly distinguish this protection function from the voltage protection and/or the frequency
protection function. For this reason, it is important to determine the maximum permissible values for the test
voltage and the test frequency.

Parameter settings of the protection relay:

Nominal values of the generator Overexcitation

Vn generator 105.00 V 60.622 V (line-neutral) V/f> 1.03 V/Hz

Vn transducer 100.00 V 57.735 V (line-neutral) V/f>> 1.40 V/Hz

fn 50.00 Hz --- T V/f>> 1.00 s

3.3 Testing the overexcitation protection function

This Application Note includes an OCC test file which will be explained in the following section.

3.3.1 Testing the warning stage (V/f>)

Local Hardware Configuration

> 3 voltage outputs must be mapped as phase-neutral voltages.
> The start signal must be mapped to a binary input.

Testing the V/f> pick-up value

Test module settings:

Since the V/f quotient is the only relevant value for assessment, we can use signal 1 (test voltage) and
signal 2 (test frequency) of the test module. Varying both test quantities at the same time avoids tripping of
the frequency protection or the voltage protection function.

In case there is no overlapping with other functions, signal 2 can be set to (none) and frequency of the
voltage signal ramped (as signal 1) can be set to nominal value (50 Hz).

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 Figure 2: Ramping module setting for the warning stage pickup test

The expected pickup value of the voltage is: 𝑉𝑉 𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝 = 1.03 ∗ 60.62 = 62.44 V

The ramp 2 starts from a value a bit below 62.44 V till a value a bit above 62.44 V using a proper delta V to
ensure accurate pickup result (normally 25% of the voltage tolerance mentioned in the relay user manual), in
our case 20 mV is used as a delta V with 250 ms as delta t.

In the Detail View, you can use the "Reset therm. replica" signal
to automatically clear the thermal storage of the overexcitation
protection function for Ramp 1.
Precondition: Binary output 1 of the CMC is wired to the
corresponding binary input of the protection relay.
Figure 3: Detail view for the Ramp 1

Figure 4: Ramp assessment for the warning stage pickup test including test results

Testing the time delay of the warning stage (V/f)

Local Hardware Configuration

> 3 voltage outputs must be mapped as phase-neutral voltages.
> The trip signal of the V/f> stage must be mapped to a binary input.

© OMICRON 2021 Page 8 of 13

 Test module settings:

The State Sequencer test module tests the delay time of the V/f> warning stage of the overexcitation
protection function. The test steps "Pre- and Post-Fault" ensure safe resetting of all commands after each
test step.

State Test quantities Time limit Binary trigger

Pre- and Post-

Vn = 60.62 V; fn = 50 Hz 2s None
Fault

Fault V = 62.62 V; f = 50 Hz 1.5 tV/f> = 15 s V/f Warn 0 => 1

The settings for State 2 (Fault) correspond to a V/f ratio of 1.04 (a bit higher than 1.03) which is 65 V.

Figure 5: U/f> Trip time test; State Sequencer, Table View settings

In the Detail View, you can use the "Reset thermal replica"
signal to automatically clear the thermal storage of the
overexcitation protection function for State 1.

Precondition: Binary output 1 of the CMC is wired to the

corresponding binary input of the protection relay.
Figure 6: Detail view for the State 1

In order to assess the trip times, a corresponding test report has to be defined in the Measurement View.

Figure 7: Time assessment of the U/f> trip time test

3.3.2 Testing the tripping characteristic of the overexcitation protection

Local Hardware Configuration

> 3 voltage outputs must be mapped as phase-neutral voltages.
> 1 trip command must be mapped to a binary input.

© OMICRON 2021 Page 9 of 13

 Test module settings:

The testable part of the tripping characteristic is restricted by the existing overlapping with the frequency
protection and the overvoltage protection function! Due to this, only two test points are defined for this
example.
The State Sequencer test module tests the trip time for one test point (V/f = 1.2 V/Hz). The "Pre-Fault" test
step ensures that the test starts at a defined state (nominal operation).

Note: The thermal image of the protection relay has to be reset prior to the test.

Testing the trip time for V/f = 1.2:

State Test quantities Time limit Binary trigger

Pre-Fault Vn = 60.62 V; fn = 50 Hz 3s None

Fault @ 1.2x V/f V = 72.80 V; fn = 50 Hz 1.5 t1,2 = 90 s Trip 0 => 1

Post-Fault V=0 0.5 s None

Figure 8: U/f characteristic test @ 1.2x Un/fn; State Sequencer, Table View settings

The calculated value of the fault voltage is: 𝑉𝑉 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 = 1.2 ∗ 60.62 = 72.8 V

In the Detail View, you can use the "Reset thermal replica"
signal to automatically clear the thermal storage of the
overexcitation protection function for State 1.
Precondition: Binary output 1 of the CMC is wired to the
corresponding binary input of the protection relay.

Figure 9: Detail view for the State 1

In order to assess the trip times, a corresponding test report has to be defined in the Measurement View.

Figure 10: Time assessment of the U/f characteristic test @ 1.2x Un/fn

© OMICRON 2021 Page 10 of 13

 Testing the trip time for V/f = 1.3:

State Test quantities Time limit Binary trigger

Pre-Fault Vn = 60.62 V; fn = 50 Hz 3s None

Fault @ 1.3x V/f V = 78.80 V; fn = 50 Hz 1.5 t1,3 = 28.5 s Trip 0 => 1

Post-Fault V=0 0.5 s None

Figure 11: U/f characteristic test @ 1.3x Un/fn; State Sequencer, Table View settings

The calculated value of the fault voltage is: 𝑉𝑉 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 = 1.3 ∗ 60.62 = 78.8 V

In the Detail View, you can use the "Reset therm. replica"
signal to automatically clear the thermal storage of the
overexcitation protection function for State 1.

Precondition: Binary output 1 of the CMC is wired to the

corresponding binary input of the protection relay.
Figure 12: Detail view for the State 1

In order to assess the trip times, a corresponding test report has to be defined in the Measurement View.

Figure 13: Time assessment of the U/f characteristic test @ 1.3x Un/fn

3.3.3 Testing the V/f>> instantaneous tripping stage of the overexcitation protection

Local Hardware Configuration

> 3 voltage outputs must be mapped as phase-neutral voltages.
> The trip command must be mapped to a binary input.

© OMICRON 2021 Page 11 of 13

 State Test quantities Time limit Binary trigger

Pre-Fault Vn = 60.62 V; fn = 50 Hz 3s None

Fault @ 1.4x V/f V = 84.87 V; fn = 50 Hz 1.5 t1,4 = 1.5 s Trip 0 => 1

Post-Fault V=0 0.5 s None

Figure 14: U/f>> Trip time test; State Sequencer, Table View settings

The calculated value of the fault voltage is: 𝑉𝑉 𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓𝑓 = 1.4 ∗ 60.62 = 84.87 V

To avoid possible tripping caused by the thermal tripping

characteristic, it is possible to permanently reset the
thermal storage for all ramps in the Detail View.

Precondition: Binary output 1 of the CMC is wired to the

corresponding binary input of the protection relay.
In order to assess the trip times, a corresponding test
report has to be defined in the Measurement View.
Figure 15: Detail view for the State 1

Figure 16: Time assessment of the U/f characteristic test @ 1.4x Un/fn

Note: If external blocking is neither possible for the underfrequency protection function nor for the
overvoltage protection function, this test is only possible if the tripping of the V/f>> stage is configured as a
separate signal.

© OMICRON 2021 Page 12 of 13

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