Advanced Doherty Alignment Module (ADAM) : MMDS36254HT1
Advanced Doherty Alignment Module (ADAM) : MMDS36254HT1
Advanced Doherty Alignment Module (ADAM) : MMDS36254HT1
0
RFout2
0 to –45.5 0 to 7.75 dB
RFin
0 to –45.5 0 to 7.75 dB
RFout1
–90
Table 3. Electrical Characteristics (VDD = 5 Vdc, 3600 MHz, TA = 25C, 50 ohm system, in NXP Application Circuit)
Characteristic Symbol Min Typ Max Unit
Insertion Loss (Includes 3 dB power division and 2.5 dB loss) IL — 6.5 — dB
Max Transition Time (Rising Edge of LCLK to RFout) ttransition — 350 — ns
Power Input @ 1dB Compression P1dB — 39 — dBm
Supply Current IDD 9.1 9.7 10.5 mA
Isolation (S32) |S32| — 35 — dB
Input Return Loss (S11) IRL — 15 — dB
Output Return Loss (S22, S33) ORL — 15 — dB
Phase Step — 6.5 — /bit
Phase Control Range — 45.5 —
Attenuation Step R — 0.25 — dB/bit
Attenuation Control Range R — 7.75 — dB
Max Input Voltage Logic Low VIL — — 0.4 V
Min Input Voltage Logic High VIH 1.6 — — V
SDO Output Voltage High VOH 1.8(1) — 0.6 VDD V
SDO Output Voltage Low VOL 0 — 0.4 V
Clock Frequency (50% Duty Cycle) fSCLK — — 26 MHz
1. Load = 20 pF @ maximum clock frequency.
Table 4. Thermal Characteristics
Characteristics Symbol Value (2) Unit
Thermal Resistance, Junction to Case RJC 10 C/W
Case Temperature 78.5C, Pout = 0.01 W, Maximum Phase and
Attenuation State, Pin = 25 dBm CW, 3600 MHz, VDD = 5 Vdc,
IDD = 11 mA
MMDS36254HT1
RF Device Data
2 NXP Semiconductors
SDI LCLK VDD N.C. N.C. N.C. N.C. N.C.
32 31 30 29 28 27 26 25
SCLK 1 24 RFout2
SDO 2 23 RFout2
N.C. 3 22 BYP
RFin 4 21 PUP
GND
RFin 5 20 LEN
N.C. 6 19 GND
SDO 7 18 RFout1
SCLK 8 17 RFout1
9 10 11 12 13 14 15 16
SDI LCLK VDD N.C. N.C. N.C. N.C. N.C.
(Top View)
Note: Exposed backside of the package is DC and RF ground.
Figure 2. Pin Connections
1. Redundant pins are internally connected. User can connect to either of the internally connected paired pins:
1 and 8, 2 and 7, 9 and 32, 10 and 31, and 11 and 30.
2. The ADAM SPI interface can be connected to a common SPI bus, provided the SDO pin is not connected,
and treated as a write--only device.
3. Each RF pin pair should be tied together.
4. Logic low enables normal SPI operation. Logic high disables SPI and places device at 0 dB attenuation and
0 phase shift.
5. Logic low places device at 0 dB attenuation and 0 phase shift at power up. Logic high places device at 7.75 dB
attenuation and –45.5 phase shift. Because PUP pin has internal pull up, logic high can be set by no
connection to pin. Alternatively, it can be connected to BYP or a user--controlled Vin.
6. Requires external capacitive decoupling to ground.
MMDS36254HT1
RF Device Data
NXP Semiconductors 3
Table 9. Serial Interface Timing Parameters
Symbol Parameter Min Typ Max Units
tSCLK Serial Clock Period 38.5 — — ns
tSCLKH Serial Clock Pulse Width High 10 — — ns
tSCLKL Serial Clock Pulse Width Low 10 — — ns
tSU Serial Data Input Setup Time to SCLK Rising Edge — — 5 ns
tH Serial Data Input Hold Time from SCLK Rising Edge — — 2 ns
tOH Serial Data Output Hold Time from SCLK Rising Edge 1.6 — — ns
tOV (10 pF) Serial Data Output Propagation Delay from SCLK Rising Edge — 5 9 ns
tOV (50 pF) Serial Data Output Propagation Delay from SCLK Rising Edge — 15 26 ns
tOV (150 pF) Serial Data Output Propagation Delay from SCLK Rising Edge — 35 65 ns
tSETTLE Serial Clock Rising Edge Setup Time to Latch Clock Rising Edge — — 27 ns
tLCLKH Latch Clock Pulse Width High 10 — — ns
tSCLK tSCLKH
SCLK
tSU tH
tSCLKL
SDI
tOH tOV
SDO
tSETTLE tLCLKH
LCLK
RFout2 RFout1
SCLK
SDI b7 b6 b5 b4 b3 b2 b1 b0 a7 a6 a5 a4 a3 a2 a1 a0
LCLK
MMDS36254HT1
RF Device Data
4 NXP Semiconductors
Table 10. Logic Truth Table — RFin to RFout1 Table 11. Logic Truth Table — RFin to RFout2
Att. Phase Shift Att. Phase Shift
a7 a6 a5 a4 a3 (dB) a2 a1 a0 () b7 b6 b5 b4 b3 (dB) b2 b1 b0 ()
L L L L L 0 L L L 0 L L L L L 0 L L L 0
L L L L H 0.25 L L H –6.5 L L L L H 0.25 L L H –6.5
L L L H L 0.5 L H L –13 L L L H L 0.5 L H L –13
L L L H H 0.75 L H H –19.5 L L L H H 0.75 L H H –19.5
L L H L L 1.0 H L L –26 L L H L L 1.0 H L L –26
L L H L H 1.25 H L H –32.5 L L H L H 1.25 H L H –32.5
L L H H L 1.5 H H L –39 L L H H L 1.5 H H L –39
L L H H H 1.75 H H H –45.5 L L H H H 1.75 H H H –45.5
L H L L L 2.0 L H L L L 2.0
L H L L H 2.25 L H L L H 2.25
L H L H L 2.5 L H L H L 2.5
L H L H H 2.75 L H L H H 2.75
L H H L L 3.0 L H H L L 3.0
L H H L H 3.25 L H H L H 3.25
L H H H L 3.5 L H H H L 3.5
L H H H H 3.75 L H H H H 3.75
H L L L L 4.0 H L L L L 4.0
H L L L H 4.25 H L L L H 4.25
H L L H L 4.5 H L L H L 4.5
H L L H H 4.75 H L L H H 4.75
H L H L L 5.0 H L H L L 5.0
H L H L H 5.25 H L H L H 5.25
H L H H L 5.5 H L H H L 5.5
H L H H H 5.75 H L H H H 5.75
H H L L L 6.0 H H L L L 6.0
H H L L H 6.25 H H L L H 6.25
H H L H L 6.5 H H L H L 6.5
H H L H H 6.75 H H L H H 6.75
H H H L L 7.0 H H H L L 7.0
H H H L H 7.25 H H H L H 7.25
H H H H L 7.5 H H H H L 7.5
H H H H H 7.75 H H H H H 7.75
Note: ADAM contains a 32--bit shift register, with the last bit connected to the SDO signal. The SDO pin is intended for daisy--chaining
multiple ADAM devices rather than being used as an SPI bus connection; the SDO output is always actively driven, so it should not
be directly connected to the SPI bus.
MMDS36254HT1
RF Device Data
NXP Semiconductors 5
Table 12. Power--up Programming (PUP) State
LCLK PUP Function
X 0 Minimum Attenuation/Minimum Phase (0 dB/0)
X 1 Maximum Attenuation/Maximum Phase (7.75 dB/–45.5)
On 1st rising edge X Normal Operation on 1st Rising Edge LCLK and Subsequent Rising Edges
DRIVER OUTPUT
0 Carrier
MMG30271B
0 to –45.5 0 to 7.75 dB
Zo
0 to –45.5 0 to 7.75 dB
Peaking
–90
TO ISOLATOR
MMDS36254HT1
RF Device Data
6 NXP Semiconductors
ALTERNATE SDI ALTERNATE LCLK
32 31 30 29 28 27 26 25
ALTERNATE SCLK 1 24
RF OUTPUT
ALTERNATE SDO 2 23
3 22
C5
4 21
RF INPUT
5 20
6 19
SDO 7 18
RF OUTPUT
SCLK 8 17
9 10 11 12 13 14 15 16
SDI LCLK C1 C2
5V
Figure 6. MMDS36254H Test Circuit Schematic
MMDS36254HT1
RF Device Data
NXP Semiconductors 7
RFout2
ADAM_36
Phase Shifter/Attenuator C4*
Rogers RO4350 20 mil +
Rogers Theta 5 mil
FSL0124 JUN 2015
C5
SCLK
LCLK
RFin
SDO
SDI1
C1 C2
C3*
+5 V
GND
RFout1
Note: Component numbers C3* and C4* are labeled on board but not placed.
MMDS36254HT1
RF Device Data
8 NXP Semiconductors
--6 --6
--7 --7
--8 --8
--9 --9
S21, CARRIER (dB)
--11 --11
--12 --12
--13 --13
--14 --14
--15 --15
3.3 3.4 3.5 3.6 3.7 3.8 3.9 3.3 3.4 3.5 3.6 3.7 3.8 3.9
f, FREQUENCY (GHz) f, FREQUENCY (GHz)
Note: S21 is a combination of static insertion loss and selected Note: S31 is a combination of static insertion loss and selected
path attenuation. path attenuation.
Figure 8. S21 versus Attenuation State Figure 9. S31 versus Attenuation State
versus Frequency versus Frequency
150
PHASE ANGLE DIFFERENCE OF S21 AND S31 ()
140 7
(all b states at 0)
130 6
a state
5
120 4
110 3
2
PHASE INDEX
100 1
90 0
80 1
2
70
(all a states at 0)
3
60 4
b state
5
50 6
40 7
30
3.3 3.4 3.5 3.6 3.7 3.8 3.9
f, FREQUENCY (GHz)
Note: The phase angle difference is a combination of insertion phase
and selected phase adjustment.
Figure 10. Phase Angle Difference of S21 and
S31 versus Phase State versus Frequency
MMDS36254HT1
RF Device Data
NXP Semiconductors 9
0 0
--5 --5
--10 --10
S22 (dB)
S11 (dB)
--15 --15
--20 --20
--25 --25
3.3 3.4 3.5 3.6 3.7 3.8 3.9 3.3 3.4 3.5 3.6 3.7 3.8 3.9
f, FREQUENCY (GHz) f, FREQUENCY (GHz)
Figure 11. S11 versus Frequency Figure 12. S22 versus Frequency
0 0
--5
--5
--10
--10
--15
S33 (dB)
S23 (dB)
--20 --15
--25
--20
--30
--35 --25
3.3 3.4 3.5 3.6 3.7 3.8 3.9 3.3 3.4 3.5 3.6 3.7 3.8 3.9
f, FREQUENCY (GHz) f, FREQUENCY (GHz)
Figure 13. S23 versus Frequency Figure 14. S33 versus Frequency
Note: A total of 512 states are plotted in Figures 11 to 14. Graph measurements include 256 states for the carrier side
(combinations of all phase and amplitude states), with the peaking side set to 0 dB attenuation and 0 phase.
Measurements also include 256 states for the peaking side (combinations of all phase and amplitude states) with the
carrier side set to 0 dB attenuation and 0 phase.
MMDS36254HT1
RF Device Data
10 NXP Semiconductors
--6
--7
--40C
--8 25C
125C
--9
S21 (dB)
--10
--11
--12
--13
--14
--15
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
ATTENUATION INDEX
Figure 15. S21 versus Attenuation State
versus Temperature
--6
--7
--40C
--8 25C
125C
--9
S21 (dB)
--10
--11
--12
--13
--14
--15
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
ATTENUATION INDEX
Figure 16. S31 versus Attenuation State
versus Temperature
140
PHASE ANGLE DIFFERENCE OF S21 AND S31 ()
130
--40C
120 25C
110 125C
100
90
80
70
60
Minimal Temperature Variation
50
40
7 6 5 4 3 2 1 0 1 2 3 4 5 6 7
a state b state
PHASE INDEX
(all b states at 0) (all a states at 0)
Figure 17. Phase Angle Difference of S21 and S31
versus Phase State versus Temperature
MMDS36254HT1
RF Device Data
NXP Semiconductors 11
6.00
0.30
5.00 6.60
0.50
MDS36254H
AWLYWWZ
MMDS36254HT1
RF Device Data
12 NXP Semiconductors
PACKAGE DIMENSIONS
MMDS36254HT1
RF Device Data
NXP Semiconductors 13
MMDS36254HT1
RF Device Data
14 NXP Semiconductors
MMDS36254HT1
RF Device Data
NXP Semiconductors 15
PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS
FAILURE ANALYSIS
At this time, because of the physical characteristics of the part, failure analysis is limited to electrical signature analysis. In
cases where NXP is contractually obligated to perform failure analysis (FA) services, full FA may be performed by third party
vendors with moderate success. For updates contact your local NXP Sales Office.
REVISION HISTORY
MMDS36254HT1
RF Device Data
16 NXP Semiconductors
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E 2018 NXP B.V.
MMDS36254HT1
RF Device
Document Data MMDS36254H
Number:
Rev. 0,Semiconductors
NXP 01/2018 17