GATE-2022 Test Series: Online

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GATE-2022

Online Test Series


Electronics and Communications Engineering - Schedule
No.of Tests : 64 + 54 free practice tests of GATE-2021 Online Test Series
GATE - 2022 Practice Tests
Test Series GATE - 2021 Test Series
Topic wise Tests 23 22

Grand Tests (Subject Wise Tests + Multi-Subject Wise Tests) 29 20

Full Length Mock Tests 12 12

Total Tests - 118

All tests will be Active upto GATE -2022 Examination.


ACE Engineering Academy
Topic wise Tests
(No.of Questions: 15, Time duration: 45 Minutes and Marks: 25 M)
Date of
Test No Name of the Topic
Activation
Engineering Mathematics-1:
Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigenvalues and eigenvectors, rank,
solution of linear equations- existence and uniqueness.
Test-01 Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives,
maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series.
Vector Analysis : Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss's, Green's and Stokes’
theorems.

Engineering Mathematics-2:
Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy's and
Euler's equations, methods of solution using variation of parameters, complementary function and particular integral, partial
differential equations, variable separable method, initial and boundary value problems. 03-05-2021
Test-02
Complex Anaysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula, sequences, series, convergence tests,
Taylor and Laurent series, residue theorem.
Probability and Statistics: Mean, median, mode, standard deviation, combinatorial probability, probability distributions, binomial
distribution, Poisson distribution, exponential distribution, normal distribution, joint and conditional probability.

Control Systems-1:
Test-03 Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph;
Transient and steady-state analysis of LTI systems; Routh – Hurwitz stability criteria, root-locus plot.

Control Systems-2:
Test-04 Frequency response; Nyquist stability criteria; Bode Plot, Lag, lead and lag-lead compensation; State variable model and
solution of state equation of LTI systems.

Signals and Systems -1:


Test-05 Introduction to signals, LTI systems: definition and properties, causality, stability, impulse response, convolution. Fourier series
and Fourier transform representations. sampling theorem and applications. Frequency response, group delay and phase delay.

Signals and Systems -2:


Test-06 Laplace transform, discrete-time Fourier transform (DTFT), DFT, Z-transform, poles and zeros, discrete-time processing of
continuous-time signals.
Digital Circuits-1:
Binary, integer and floating-point numbers, Combinatorial circuits: Boolean algebra, minimization of functions using Boolean
Test-07
identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters,
10-05-2021
multiplexers, decoders.
Digital Circuits-2:
Sequential circuits: latches and flip-flops, counters, shift-registers, finite state machines, propagation delay, setup and hold time,
Test-08
critical path delay.
Data converters: sample and hold circuits, ADCs and DACs.

Digital Circuits-3:
Test-09 Semiconductor memories: ROM, SRAM, DRAM
Computer organization: Machine instructions and addressing modes, ALU, data-path and control unit, instruction pipelining.

Networks-1:
Test-10 Circuit analysis: Node and mesh analysis, superposition, Thevenin's theorem, Norton’s theorem, reciprocity, maximum power
transfer, wye-delta transformation

Networks-2:
Test-11 Sinusoidal steady state analysis: phasors, complex power, Time and frequency domain analysis of linear circuits: RL, RC and RLC
circuits, solution of network equations using Laplace transform. Linear 2-port network parameters.
17-05-2021
Electronic Devices-1:
Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity;
Test-12
Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode, BJT. Direct and Indiect
band-gap semiconductor.

Electronic Devices-2:
Test-13
MOS capacitor, MOSFET, LED, photo diode and solar cell.

Analog Circuits-1:
Test-14 Diode circuits: clipping, clamping and rectifiers. BJT and MOSFET amplifiers: biasing, ac coupling, small signal analysis, frequency
response, Current mirrors.
24-05-2021
Analog Circuits-2:
Test-15 Op-amp circuits: Amplifiers, summers, differentiators, integrators, active filters, Schmitt triggers and oscillators. Differential
amplifiers.
ACE Engineering Academy
Date of
Test No Name of the Topic
Activation
Communications-1:
Test-16 Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM,
superheterodyne receivers.
Communications-2:
Test-17 Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI
24-05-2021
systems. Information theory: entropy, mutual information and channel capacity theorem.
Communications-3:
Test-18 Digital communications: PCM, DPCM, digital modulation schemes (ASK, PSK, FSK, QAM), bandwidth, inter-symbol interference,
MAP, ML detection, matched filter receiver, SNR and BER. Fundamentals of error correction, Hamming codes, CRC.
Electromagnetics-1:
Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting
Test-19
vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through
various media, skin depth.
31-05-2021
Electromagnetics-2:
Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith
Test-20
chart; Rectangular and circular waveguides, light propagation in optical fibers, dipole and monopole antennas, linear antenna
arrays.
Verbal Ability:
Basic English grammar: tenses, articles, adjectives, prepositions, conjunctions, verb-noun agreement, and other parts of speech.
Test-21 Basic vocabulary: words, idioms, and phrases in context.
Reading and comprehension.
Narrative sequencing.
Quantitative Aptitude:
Data interpretation: data graphs (bar graphs, pie charts, and other graphs representing data), 2- and 3-dimensional plots, maps,
and tables.
07-06-2021
Test-22 Numerical computation and estimation: ratios, percentages, powers, exponents and logarithms, permutations and
combinations, and series
Mensuration and geometry.
Elementary statistics and probability.
Analytical Aptitude:
Logic: deduction and induction, Analogy, Numerical relations and reasoning
Test-23 Spatial Aptitude:
Transformation of shapes: translation, rotation, scaling, mirroring, assembling, and grouping
Paper folding, cutting, and patterns in 2 and 3 dimensions

Subject Wise Grand Tests - 1st Series


(No.of Questions: 30, Time duration: 90 Minutes and Marks: 50 M)
Date of
Test No Name of the Subject
Activation
Test-24 Engineering Mathematics
21-06-2021
Test-25 Control Systems

Test-26 Signals and Systems


28-06-2021
Test-27 Digital Circuits

Test-28 Networks
12-07-2021
Test-29 Electronic Devices

Test-30 Analog Circuits


19-07-2021
Test-31 Communications

Test-32 Electromagnetics
26-07-2021
Test-33 General Aptitude

Full Length Mock Test - 1st Series


(No.of Questions: 65, Time duration: 180 Minutes and Marks: 100 M)
Date of
Test No Name of the Mock
Activation
Test-34 Full Length Mock Test-1 09-08-2021

Test-35 Full Length Mock Test-2 16-08-2021

Test-36 Full Length Mock Test-3 23-08-2021


ACE Engineering Academy
Subject Wise Grand Tests - 2nd Series
(No.of Questions: 30, Time duration: 90 Minutes and Marks: 50 M)
Date of
Test No Name of the Subject
Activation
Test-37 Engineering Mathematics
30-08-2021
Test-38 Control Systems

Test-39 Signals and Systems


06-09-2021
Test-40 Digital Circuits

Test-41 Networks
13-09-2021
Test-42 Electronic Devices

Test-43 Analog Circuits


20-09-2021
Test-44 Communications

Test-45 Electromagnetics
27-09-2021
Test-46 General Aptitude

Full Length Mock Test - 2nd Series


(No.of Questions: 65, Time duration: 180 Minutes and Marks: 100 M)
Date of
Test No Name of the Mock
Activation
Test-47 Full Length Mock Test-4 18-10-2021

Test-48 Full Length Mock Test-5 25-10-2021

Test-49 Full Length Mock Test-6 01-11-2021

Multi-Subject Wise Grand Tests


(No.of Questions: 30, Time duration: 90 Minutes and Marks: 50 M)
Date of
Test No Name of the Subject
Activation
Test-50 Networks & Electromagnetics
15-11-2021
Test-51 Control Systems & Signals and Systems

Test-52 Electronic Devices & Analog Circuits


22-11-2021
Test-53 Communications & Digital Circuits

Test-58 Engineering Mathematics & General Aptitude 29-11-2021

Test-54 Networks & Signals and Systems


03-12-2021
Test-55 Analog Circuits & Digital Circuits

Test-56 Electromagnetics & Electronic Devices


06-12-2021
Test-57 Communications &Control Systems

Full Length Mock Test - 3rd Series


(No.of Questions: 65, Time duration: 180 Minutes and Marks: 100 M)
Date of
Test No Name of the Mock
Activation
Test-59 Full Length Mock Test-7 20-12-2021

Test-60 Full Length Mock Test-8 27-12-2021

Test-61 Full Length Mock Test-9 03-01-2022

Test-62 Full Length Mock Test-10 10-01-2022

Test-63 Full Length Mock Test-11 17-01-2022

Test-64 Full Length Mock Test-12 24-01-2022


Note: The Syllabus considered as per Previoues year Notification of GATE. ACE Engineering Academy does not take any responsibility for deviations in syllabus in
the final exam.
The Dates of above test may Change according to the GATE-2022 Exam schedule.
Tests will be activated at 02:00 pm on the scheduled day.
ACE Engineering Academy

Free Practice Tests of GATE-2021 Online Test Series


Topic wise Tests
(No.of Questions: 15, Time duration: 45 Minutes and Marks: 25 M)
Date of
Test No Name of the Topic
Activation
Engineering Mathematics-1:
EC_P-01
Linear Algebra, Calculus, Differential Equations and Vector Analysis.
Engineering Mathematics-2:
EC_P-02
Complex Anaysis, Probability and Statistics.
Control Systems-1:
EC_P-03 Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph;
Transient and steady-state analysis of LTI systems; Routh – Hurwitz stability criteria, root-locus plot.
Control Systems-2:
EC_P-04 Frequency response; Nyquist stability criteria; Bode Plot, Lag, lead and lag-lead compensation; State variable model and
solution of state equation of LTI systems.
Signals and Systems -1:
EC_P-05 Introduction to signals, LTI systems: definition and properties, causality, stability, impulse response, convolution. Fourier series
and Fourier transform representations. sampling theorem and applications. Frequency response, group delay and phase delay.
Signals and Systems -2:
EC_P-06 Laplace transform, discrete-time Fourier transform (DTFT), DFT, Z-transform, poles and zeros, discrete-time processing of
continuous-time signals.
Digital Circuits-1:
Binary, integer and floating-point numbers, Combinatorial circuits: Boolean algebra, minimization of functions using Boolean
EC_P-07
identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters,
multiplexers, decoders.
Digital Circuits-2:
Sequential circuits: latches and flip-flops, counters, shift-registers, finite state machines, propagation delay, setup and hold time,
EC_P-08
critical path delay.
Data converters: sample and hold circuits, ADCs and DACs.
Digital Circuits-3:
EC_P-09 Semiconductor memories: ROM, SRAM, DRAM
Computer organization: Machine instructions and addressing modes, ALU, data-path and control unit, instruction pipelining.
Networks-1:

15-04-2021
EC_P-10 Circuit analysis: Node and mesh analysis, superposition, Thevenin's theorem, Norton’s theorem, reciprocity, maximum power
transfer, wye-delta transformation
Networks-2:
EC_P-11 Sinusoidal steady state analysis: phasors, complex power, Time and frequency domain analysis of linear circuits: RL, RC and RLC
circuits, solution of network equations using Laplace transform. Linear 2-port network parameters
Electronic Devices-1:
Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity;
EC_P-12
Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode, BJT. Direct and Indiect
band-gap semiconductor.
Electronic Devices-2:
EC_P-13
MOS capacitor, MOSFET, LED, photo diode and solar cell;
Analog Circuits-1:
EC_P-14 Diode circuits: clipping, clamping and rectifiers. BJT and MOSFET amplifiers: biasing, ac coupling, small signal analysis, frequency
response, Current mirrors.
Analog Circuits-2:
EC_P-15 Op-amp circuits: Amplifiers, summers, differentiators, integrators, active filters, Schmitt triggers and oscillators. Differential
amplifiers.
Communications-1:
EC_P-16 Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM,
superheterodyne receivers.
Communications-2:
EC_P-17 Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI
systems. Information theory: entropy, mutual information and channel capacity theorem.

Communications-3:
EC_P-18 Digital communications: PCM, DPCM, digital modulation schemes (ASK, PSK, FSK, QAM), bandwidth, inter-symbol interference,
MAP, ML detection, matched filter receiver, SNR and BER. Fundamentals of error correction, Hamming codes, CRC.

Electromagnetics-1:
Maxwell’s equations: differential and integral forms and their interpretation, boundary
EC_P-19
conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group
velocity, propagation through various media, skin depth.
Electromagnetics-2:
Transmission lines: equations, characteristic impedance, impedance matching, impedance
EC_P-20
transformation, S-parameters, Smith chart; Rectangular and circular waveguides, light propagation in optical fibers, dipole and
monopole antennas, linear antenna arrays.
ACE Engineering Academy
Date of
Test No Name of the Topic
Activation

Verbal Ability:
EC_P-21 Basic English grammar: tenses, articles, adjectives, prepositions, conjunctions, verb-noun agreement, and other parts of speech

15-04-2021
Basic vocabulary: words, idioms, and phrases in context Reading and comprehension Narrative sequencing

Numarical Ability:
Quantitative Aptitude: Data interpretation: data graphs (bar graphs, pie charts, and other graphs representing data), 2- and 3-
dimensional plots, maps, and tables Numerical computation and estimation: ratios, percentages, powers, exponents and
EC_P-22 logarithms, permutations and combinations, and series Mensuration and geometry Elementary statistics and probability.
Analytical Aptitude: Logic: deduction and induction Analogy Numerical relations and reasoning
Spatial Aptitude: Transformation of shapes: translation, rotation, scaling, mirroring, assembling, and grouping Paper folding,
cutting, and patterns in 2 and 3 dimensions.

Subject Wise Grand Tests


(No.of Questions: 30, Time duration: 90 Minutes and Marks: 50 M)
Date of
Test No Name of the Subject
Activation
EC_P-23 Engineering Mathematics
EC_P-24 Control Systems

20-04-2021
EC_P-25 Signals and Systems
EC_P-26 Digital Circuits
EC_P-27 Networks
EC_P-28 Electronic Devices
EC_P-29 Analog Circuits
EC_P-30 Communications
EC_P-31 Electromagnetics
EC_P-32 General Aptitude

Multi-Subject Wise Grand Tests


(No.of Questions: 30, Time duration: 90 Minutes and Marks: 50 M)
Date of
Test No Name of the Subject
Activation
EC_P-33 Networks & Electromagnetics
EC_P-34 Control Systems & Signals and Systems

20-04-2021
EC_P-35 Electronic Devices & Analog Circuits
EC_P-36 Communications & Digital Circuits
EC_P-37 Engineering Mathematics & General Aptitude
EC_P-38 Control Systems, Signals and Systems, Digital Circuits & Analog Circuits
EC_P-39 Electronic Devices, Networks, Communications & Electromagnetics
EC_P-40 Signals and Systems, Analog Circuits, Electronic Devices & Communications
EC_P-41 Control Systems, Neworks, Digital Circuits & Electromagnetics
EC_P-42 Engineering Mathematics & General Aptitude

Full Length Mock Test


(No.of Questions: 65, Time duration: 180 Minutes and Marks: 100 M)
Date of
Test No Name of the Mock
Activation
EC_P-43 Full Length Mock Test-1
EC_P-44 Full Length Mock Test-2
EC_P-45 Full Length Mock Test-3
30-04-2021

EC_P-46 Full Length Mock Test-4


EC_P-47 Full Length Mock Test-5
EC_P-48 Full Length Mock Test-6
EC_P-49 Full Length Mock Test-7
EC_P-50 Full Length Mock Test-8
EC_P-51 Full Length Mock Test-9
EC_P-52 Full Length Mock Test-10
EC_P-53 Full Length Mock Test-11
EC_P-54 Full Length Mock Test-12

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