Lm1973 Μpot3-Channel 76Db Audio Attenuator With Mute: Features Description
Lm1973 Μpot3-Channel 76Db Audio Attenuator With Mute: Features Description
1FEATURES DESCRIPTION
•
2 3-Wire Serial Interface The LM1973 is a digitally controlled 3-channel 76dB
audio attenuator fabricated on a CMOS process.
• Daisy-Chain Capability Each channel has attenuation steps of 0.5dB from
• 104dB Mute Attenuation 0dB–15.5dB, 1.0dB steps from 16dB–47dB, and
• Pop and Click Free Attenuation Changes 2.0dB steps from 48dB– 76dB, with a mute function
attenuating 104dB. Its logarithmic attenuation curve
APPLICATIONS can be customized through software to fit the desired
application.
• Automated Studio Mixing Consoles
The performance of a μPot is demonstrated through
• Music Reproduction Systems its excellent Signal-to-Noise Ratio, extremely low
• Sound Reinforcement Systems (THD+N), and high channel separation. Each μPot
• Electronic Music (MIDI) contains a mute function that disconnects the input
signal from the output, providing a minimum
• Personal Computer Audio Control
attenuation of 96dB. Transitions between any
attenuation settings are pop free.
KEY SPECIFICATIONS
The LM1973's 3-wire serial digital interface is TTL
• Total Harmonic Distortion + Noise: 0.003 % and CMOS compatible; receiving data that selects a
(max) channel and the desired attenuation level. The Data-
• Frequency response: 100 kHz (−3dB) (min) Out pin of the LM1973 allows multiple μPots to be
• Attenuation range (excluding mute): 76 dB daisy-chained together, reducing the number of
(typ) enable and data lines to be routed for a given
application.
• Differential attenuation: ±0.25 dB (max)
• Signal-to-noise ratio (ref. 4 Vrms): 110 dB
(min)
• Channel separation: 110 dB (typ)
TYPICAL APPLICATION
CONNECTION DIAGRAM
Top View
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Copyright © 2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
LM1973
SNAS093A – MAY 2004 – REVISED OCTOBER 2004 www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
(1) All voltages are measured with respect to GND (pins 1, 3, 5, 14, 17), unless otherwise specified.
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not guarantee specific performance limits. Electrical Characteristics state DC and AC electrical
specifications under particular test conditions which guarantee specific performance limits. This assumes that the device is within the
Operating Ratings. Specifications are not guaranteed for parameters where no limit is given, however, the typical value is a good
indication of device performance.
(3) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(4) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJMAX, θJA, and the ambient temperature
TA. The maximum allowable power dissipation is PD = (TJMAX − TA)/θJA or the number given in the Absolute Maximum Ratings,
whichever is lower. For the LM1973N, TJMAX = +150°C, and the typical junction-to-ambient thermal resistance, when board mounted, is
65°C/W.
(5) Human body model, 100 pF discharged through a 1.5 kΩ resistor.
(1) (2)
OPERATING RATINGS
TMIN TA TMAX
Temperature Range TMIN ≤TA ≤TMAX 0°C ≤TA ≤ +70°C
Supply Voltage (VDD − VSS) 4.5V to 12V
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not guarantee specific performance limits. Electrical Characteristics state DC and AC electrical
specifications under particular test conditions which guarantee specific performance limits. This assumes that the device is within the
Operating Ratings. Specifications are not guaranteed for parameters where no limit is given, however, the typical value is a good
indication of device performance.
(2) All voltages are measured with respect to GND (pins 1, 3, 5, 14, 17), unless otherwise specified.
(1) (2)
ELECTRICAL CHARACTERISTICS
The following specifications apply for all channels with VDD = +6V, VSS = −6V, VIN = 5.5 Vpk, and f = 1 kHz, unless otherwise
specified. Limits apply for TA = 25°C. Digital inputs are TTL and CMOS compatible.
LM1973 Units
Parameter Test Conditions
Typical (3)
Limit (4) (Limits)
IS Supply Current Inputs are AC Grounded 3 5 mA (max)
THD+N Total Harmonic Distortion plus Noise VIN = 0.5 Vpk at 0dB Attenuation 0.0008 0.003 % (max)
XTalk Crosstalk (Channel Separation) 0dB Attenuation for VIN 110 dB
(5)
VCH measured at −76dB
SNR Signal-to-Noise Ratio Inputs are AC Grounded
at −12dB Attenuation 120 110 dB (min)
A-Weighted
AM Mute Attenuation 104 96 dB (min)
Attenuation Step Size Error 0dB to −16dB ±0.05 dB (max)
−17dB to −48dB ±0.1 dB (max)
−49dB to −76dB ±0.25 dB (max)
Absolute Attenuation Error Attenuation at 0dB 0.01 0.5 dB (min)
Attenuation at −20dB 19.8 19.0 dB (min)
Attenuation at −40dB 39.5 38.5 dB (min)
Attenuation at −60dB 59.3 58.0 dB (min)
Attenuation at −76dB 74.5 73.0 dB (min)
Channel-to-Channel Attenuation Attenuation at 0dB, −20dB, −40dB, ±0.5 dB (max)
−60dB
Tracking Error Attenuation at −76dB ±0.75 dB (max)
ILEAK Analog Input Leakage Current Inputs are AC Grounded 10.0 100 nA (max)
RIN AC Input Impedance Pins 2, 4, 18, VIN = 1.0 Vpk, f = 1 kHz 40 20 kΩ (min)
60 kΩ (max)
IIN Input Current at Pins 9, 10, 11 at 0V < VIN < 5V 1.0 ±100 nA (max)
fCLK Clock Frequency 3 2 MHz (max)
VIH High-Level Input Voltage at Pins 9, 10, 11 2.0 V (min)
VIL Low-Level Input Voltage at Pins 9, 10, 11 0.8 V (max)
Data-Out Levels (Pin 12) VDD = 6V, VSS = 0V 0.1 V (max)
5.9 V (min)
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not guarantee specific performance limits. Electrical Characteristics state DC and AC electrical
specifications under particular test conditions which guarantee specific performance limits. This assumes that the device is within the
Operating Ratings. Specifications are not guaranteed for parameters where no limit is given, however, the typical value is a good
indication of device performance.
(2) All voltages are measured with respect to GND (pins 1, 3, 5, 14, 17), unless otherwise specified.
(3) Typicals are measured at 25°C and represent the parametric norm.
(4) Limits are guaranteed to TI's AOQL (Average Output Quality Level).
(5) At the present time the Crosstalk measurement is specified as a typical only, which is due to a hardware limitation of the automated test
equipment.
PIN DESCRIPTIONS
Signal Ground (1, 5, 17): Each input has its own independent ground, GND1, GND2, and GND3.
Signal Input (2, 4, 18): There are 3 independent signal inputs, IN1, IN2, and IN3.
Signal Output (6, 16, 20): There are 3 independent signal outputs, OUT1, OUT2, and OUT3.
Voltage Supply (13, 15):
Voltage Supply (7, 19): Negative voltage supply pins, VSS1 and VSS2. To be tied to ground in a single supply
configuration.
AC Ground (3, 14): These two pins are not physically connected to the die in any way (i.e., No bondwires).
These pins must be AC grounded to prevent signal coupling between any of the pins nearby. Pin 14
should be connected to pins 13 and 15 for ease of wiring and the best isolation.
Logic Ground (8): Digital signal ground for the interface lines; CLOCK, LOAD/SHIFT, DATA-IN and DATA-OUT.
Clock (9): The clock input accepts a TTL or CMOS level signal. The clock input is used to load data into the
internal shift register on the rising edge of the input clock waveform.
Load/Shift (10): The load/shift input accepts a TTL or CMOS level signal. This is the enable pin of the device,
allowing data to be clocked in while this input is low (0V).
Data-In (11): The data-in input accepts a TTL or CMOS level signal. This pin is used to accept serial data from a
microcontroller that will be latched and decoded to change a channel's attenuation level.
Data-Out (12): This pin is used in daisy-chain mode where more than one μPot is controlled via the same data
line. As the data is clocked into the chain from the μC, the preceding data in the shift register is shifted out
the DATA-OUT pin to the next μPot in the chain or to ground if it is the last μPot in the chain. The
LOAD/SHIFT line goes high once all of the new data has been shifted into each of its respective registers.
Figure 4. Figure 5.
Figure 6. Figure 7.
THD
vs
VOUT at
1 kHz by FFT
VDD − VSS = 12V Crosstalk Test
Figure 8. Figure 9.
THD + N
vs
Amplitude
f = 20 Hz, VDD = ±6V
FFT of 20 kHz THD VIN into CH1 at 0 dB
THD + N THD + N
vs vs
Amplitude Amplitude
f = 1 kHz, VDD = ±6V f = 20 kHz, VDD = ±6V
VIN into CH1 at 0 dB VIN into CH1 at 0 dB
APPLICATION INFORMATION
Figure 16.
INPUT IMPEDANCE
The input impedance of a μPot is constant at a nominal 40 kΩ. To eliminate any unwanted DC components from
propagating through the device it is common to use 1 μF input coupling caps. This is not necessary, however, if
the dc offset from the previous stage is negligible. For higher performance systems, input coupling caps are
preferred.
OUTPUT IMPEDANCE
The output of a μPot varies typically between 25 kΩ and 35 kΩ and changes nonlinearly with step changes.
Since a μPot is made up of a resistor ladder network with a logarithmic attenuation, the output impedance is
nonlinear. Due to this configuration, a μPot cannot be considered as a linear potentiometer, but can be
considered only as a logarithmic attenuator.
It should be noted that the linearity of a μPot cannot be measured directly without a buffer because the input
impedance of most measurement systems is not high enough to provide the required accuracy. Due to the low
impedance of the measurement system, the output of the μPot would be loaded down and an incorrect reading
will result. To prevent loading from occurring, a JFET input op amp should be used as the buffer/amplifier. The
performance of a μPot is limited only by the performance of the external buffer/amplifier.
MUTE FUNCTION
One major feature of a μPot is its ability to mute the input signal to an attenuation level of 104dB as shown in
Figure 16. This is accomplished internally by physically isolating the output from the input while also grounding
the output pin through approximately 2 kΩ.
The mute function is obtained during power-up of the device or by sending any binary data of 01001111 and
above (to 11111111) serially to the device. The device may be placed into mute from a previous attenuation
setting by sending any of the above data. This allows the designer to place a mute button onto his system which
could cause a microcontroller to send the appropriate data to a μPot and thus mute any or all channels. Since
this function is achieved through software, the designer has a great amount of flexibility in configuring the
system.
DC INPUTS
Although the μPot was designed to be used as an attenuator for signals within the audio spectrum, the device is
capable of tracking an input DC voltage. The device will track DC voltages to a diode drop above each supply
rail.
One point to remember about DC tracking is that with a buffer at the output of the μPot, the resolution of DC
tracking will depend upon the gain configuration of that output buffer and its supply voltage. It should also be
remembered that the output buffer's supply voltage does not have to be the same as the μPot's supply voltage.
This could allow for more resolution when DC tracking.
DAISY-CHAIN CAPABILITY
Since the μPot's digital interface is essentially a shift register, multiple μPots can be programmed utilizing the
same data and load/shift lines. As shown in Figure 24, for an n-μPot daisy-chain, there are 16n bits to be shifted
and loaded for the chain. The data loading sequence is the same for n-μPots as it is for one μPot. First the
LOAD/SHIFT line goes low, then the data is clocked in sequentially while the preceding data in each μPot is
shifted out the DATA-OUT pin to the next μPot in the chain or to ground if it is the last μPot in the chain. Then
the LOAD/SHIFT line goes high; latching the data into each of their corresponding μPots. The data is then
decoded according to the address (channel selection) and the appropriate tap switch controlling the attenuation
level is selected.
CROSSTALK MEASUREMENTS
The crosstalk of a μPot as shown in Figure 9 in the TYPICAL PERFORMANCE CHARACTERISTICS was
obtained by placing a signal on one channel and measuring the level at the output of another channel of the
same frequency. It is important to be sure that the signal level being measured is of the same frequency such
that a true indication of crosstalk may be obtained. Also, to ensure an accurate measurement, the measured
channel's input should be AC grounded through a 1 μF capacitor.
of DC bias current for its operation. As the impedance changes, so does the DC bias current and thus there
is a DC voltage “pop”.
2. Secondly, the μPot has no drive capability, so any desired gain needs to be accomplished through a
buffer/non-inverting amplifer.
3. Third, the output of a μPot needs to see a high impedance to prevent loading and subsequent linearity errors
from ocurring. A JFET input buffer provides a high input impedance to the output of the μPot so that this
does not occur.
Clicks and pops can be avoided by using a JFET input buffer/amplifier such as an LF412ACN. The LF412 has a
high input impedance and exhibits both a low noise floor and low THD+N throughout the audio spectrum which
maintains signal integrity and linearity for the system. The performance of the system solution is entirely
dependent upon the quality and performance of the JFET input buffer/amplifier.
www.ti.com 24-Jan-2013
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Qty Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Top-Side Markings Samples
(1) Drawing (2) (3) (4)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Only one of markings shown within the brackets will appear on the physical device.
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