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XRD Test1
Q 1: Which of the procedures below does not improve the intensity during data collection?
Increasing the tube current.
Increasing the tube voltage.
Increasing the opening angle of the divergence slit.
Choosing a larger step width.
Reducing data collection time.
Increasing data collection time.
Q 2: Which of the statement below is correct?
A high surface smoothness improves the quality of a powder pattern and has no undesirable side effect. I will polish my sintered pellet
sample made from polycrystalline powder thoroughly with a glass slide.
Polishing a sintered pellet sample made from polycrystalline powder will always result in preferred orientation. Therefore I will never polish
such a sample.
There is no good in polishing a sintered pellet sample made from polycrystalline powder. It's just a waste of time.
Polishing a sintered pellet sample made from polycrystalline powder does improve the quality of a powder pattern but can result in preferred
orientation if the powder consists in platelets or needles. It is important to consider each particular sample.
Q 3: How do you prepare a homogeneous powder (tiny amount) of small, nearly spherical particles for XRD analysis?
Directly fill it into a powder sample holder mould, polish the surface with a glass slide and proceed to measure.
Ball mill the sample before filling it into the sample holder.
Ball mill the sample, then use the bottom-up technique with the bulk sample holder.
Press the sample into a pellet, polish the surface and prepare it in the bulk sample holder.
Use the back of a glass powder sample holder, form a slurry with nail paint and let it dry.
Q 4: What type of information cannot be gathered from a sample using a powder diffractometer?
elemental information
microstructural information i.e. crystallite size and strain
crystallographic information
none of the above
Q 5: How do you prepare a heterogenous powder (large amount) of large (1mm) particles for XRD analysis?
Directly fill it into a powder sample holder mould, polish the surface with a glass slide and proceed to measure.
Ball mill the sample before filling it into the sample holder.
Ball mill the sample, then use the bottom-up technique with the bulk sample holder.
Use the back of a glass powder sample holder, for a slurry with nail paint and let it dry.
Q 6: Which X-ray diffraction based technique can be used to map the orientation of selected hkl planes with respect to the sample frame?
X-ray reflectivity
Small-Angle X-ray Scattering
Pole Figure Measurements
Residual Stress Analysis
Q 7: Which parameter does not improve the instrument resolution and profile quality?
Narrower Receiving Slit width
Narrower Divergence slit width
Larger Tube current
Narrower Soller Slit set
A narrower anti scatter slit
Q 8: Which anode material is not used in powder X-ray diffraction?
Copper
Cobalt
Molybdenum
Rhodium
Q 9: Associate the sequence of wavelengths with the correct sequence of anode materials: 2.2897263 1.9360413 1.5405929 0.7093000
0.5594075
Chromium – Iron – Copper – Molybdenum - Silver
Silver – Iron - Copper - Molybdenum - Chromium
Silver - Molybdenum - Copper - Iron - Chromium
Silver - Molybdenum - Copper - Chromium- Iron
Q 10: What does 32 in a Space group symbol stand for?
3 Mirror planes that meet a two fold axis
3fold axis with a mirror plane normal to the axis
A 3fold screw axis with a translation vector of ½
A 3fold screw axis with a translation vector of 2/3
Q 11: A plate of pure polycrystalline Si was scanned using a powder diffractometer with Cu X-ray source. When compared to the reference Si
XRD pattern the peak positions matched very well but the peak intensity ratio between hkl planes is not comparable. This indicates that the
sample has:
Micro-strain
Consist of impurities
Preferred orientation
Nano grain size
Q 12: Which of the wavelength below is not associated with a copper anode?
1.541867 Ǻ
1.540593 Ǻ
1.544427 Ǻ
1.620826 Ǻ
Q 13: What causes the high background level of XRD powder diffractograms at low 2θ values?
Residual divergence of the x-ray beam.
Poor instrument calibration.
Air scattering.
Amorphous scattering from the sample.
Q 14: How do you prepare an air sensitive sample for XRD analysis?
Directly fill it into a powder sample holder mould, polish the surface with a glass slide and proceed to measure – no extra precaution.
Use the back of a glass powder sample holder, for a slurry with nail paint and let it dry.
Prepare it like a normal powder but then seal it off with cellotape.
Q 15: What is the information content of a powder diffractogramm?
The lattice parameters of the crystalline phases present.
The relative amounts of all crystalline phases present.
The atomic positions, thermal displacement parameters of each crystalline phase.
The average crystallite size of each crystalline phase.
All of the above.
Q 16: Which is the correct assignment of the emission profile of an X-Ray tube? (1)Kα1-radiation(2)Kα2-radiation(3)White radiation(4)Kβ-radiation
A=1, B=2, C=3, D=4
A=2, B=3, C=1, D=4
A=3, B=2, C=4, D=1
A=3, B=2, C=1, D=4
Q 17: Which of the statements below is true?
The reflection positions and their presence in a diffractogram are determined by the dimensions of the unit cell and all translation containing
symmetry elements.
The reflection positions and their presence in a diffractogram are solely determined by the dimensions of the unit cell.
The reflection positions and their presence in a diffractogram are solely determined by the atomic positions in the unit cell.
The reflection positions and their presence in a diffractogram are determined by the atomic positions in the unit cell and the dimensions of the
unit cell.
Q 18: Which of the procedures below reduces the resolution while improving the intensity?
Increasing the tube current.
Increasing the tube voltage.
Increasing the opening angle of the divergence slit.
Increasing data collection time.
Q 19: A space group symbol (Hermann Maugin) always starts with a letter. What does this letter stand for?
It denotes the main axis
It indicates the centering of the unit cell
It indicates the crystal class
It indicates the Bravais lattice
Q 20: What is the standard XRD scan mode to measure thin film sample?
detector or 2theta scan
omega scan
rocking curve
theta-2theta or locked-coupled scan
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XRD Test1

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