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XRD Test1
Q 1: How do you prepare a homogeneous powder (large amount) of small, plate shaped particles for XRD analysis?
Directly fill it into a powder sample holder mould, polish the surface with a glass slide and proceed to measure.
Ball mill the sample before filling it into the sample holder.
Ball mill the sample, then use the bottom-up technique with the bulk sample holder.
Press the sample into a pellet, polish the surface and prepare it in the bulk sample holder.
Use the back of a glass powder sample holder, form a slurry with nail paint and let it dry.
Q 2: Which of the statements below is true?
The reflection positions and their presence in a diffractogram are determined by the dimensions of the unit cell and all translation containing symmetry elements.
The reflection positions and their presence in a diffractogram are solely determined by the dimensions of the unit cell.
The reflection positions and their presence in a diffractogram are solely determined by the atomic positions in the unit cell.
The reflection positions and their presence in a diffractogram are determined by the atomic positions in the unit cell and the dimensions of the unit cell.
Q 3: What causes the high background level of XRD powder diffractograms at low 2θ values?
Residual divergence of the x-ray beam.
Poor instrument calibration.
Air scattering.
Amorphous scattering from the sample.
Q 4: What is the correct labelling of the main components of an x-ray diffractometer?
A – sample holder, B – secondary optics , B – source & primary optics D – detector
A – detector, B – source & primary optics, C – secondary optics, D – sample holder
A – source & primary optics, B – sample holder, C – secondary optics, D – detector
A – detector, B – sample holder, C – secondary optics, D – source & primary optics
Q 5: Which symmetry element is not a point symmetry element?
Screw Axis
Rotation Axis
Mirror Plane
Inversion Center
Q 6: How does the Anti Scatter slit influence the X-ray beam?
Reduces the axial divergence & reduce the intensity
Reduces the axial divergence and background by reducing air scattering
Increases resolution & reduces the intensity by limiting height divergence and reduces background by reducing air scattering
Reduces the height divergence and background by reducing air scattering
Q 7: How do you prepare a homogeneous powder (tiny amount) of small plate shaped particles for XRD analysis?
Q 8: Which of the statements below is correct?
The sample height is of negligible importance for the powder pattern. It has only a small effect on the peak position.
It is important to exactly fill the sample mould. Filling the sample holder too low or too high results in strongly shifted peak positions that severely hamper data evaluation.
The sample height does effect the peak position but this effect is easily corrected by any refinement software so I don't need to be too picky about that.
Q 9: Which of the procedures below does not improve the intensity during data collection?
Increasing the tube current.
Increasing the tube voltage.
Increasing the opening angle of the divergence slit.
Decreasing the receiving slit width.
Choosing a larger step width.
Increasing data collection time.
Q 10: What is the correct labeling of the main components of an x-ray diffractometer?
A – sample holder, B – secondary optics , B – source & primary optics D – detector
A – detector, B – source & primary optics, C – secondary optics, D – sample holder
A – source & primary optics, B – sample holder, C – secondary optics, D – detector
A – detector, B – sample holder, C – secondary optics, D – source & primary optics
Q 11: Can you limit the PC-PDF-Database?
No, I always have to search the entire database.
The base can be limited according to chemical composition only.
The database can be limited according to the dataset quality.
The database can be limited according to crystal system.
The database can be limited according to chemical composition, data set quality and crystal system.
The database can be limited according to chemical composition, data set quality, crystal system and subfiles.
Q 12: X-ray diffraction (XRD) was done on an iron powder sample using copper radiation and the XRD pattern obtained is presented below. What is the possible reason for the
increasing background intensity with increasing 2θ?
X-ray fluorescence from the sample
Poor instrument calibration
Air scattering
This is normal for all XRD samples
Q 13: How do the soller slits influence the X-ray beam?
Reduce the axial divergence & reduce the intensity
Reduce the axial divergence
Reduce the height divergence & reduce the intensity
Reduce the height divergence
Q 14: Why should you never measure below 2θ = 5°?
The detector head may collide with the instrument housing.
The sample would slip off the holder.
It simply is not a nice thing to do.
The primary beam would damage the detector.
Q 15: What kind of diffractometer does not exist?
Bragg-Brentano-Diffractometer
Debye-Scherrer-Diffractometer
Guinier-Diffractometer
Ewald-Gandolfi-Diffractometer
Q 16: When is the monochromator polarisation (single crystal monochromator) stronger?
At low monochromator glancing angles
At high monochromator glancing angles
It does not depend on the monochromator glancing
Q 17: What is the standard XRD scan mode to measure a powder sample?
Detector or 2theta scan
Omega scan
Rocking curve
theta-2theta or locked-coupled scan
Q 18: How do you prepare a homogeneous powder (large amount) of small, needle shaped particles for XRD analysis?
Q 19: Which is the correct wavelength for Cu Kβ-radiation?
1.541867 Ǻ
1.392230 Ǻ
1.540593 Ǻ
1.544427 Ǻ
Q 20: What is the reciprocal lattice?
The lattice that is obtained by inverting the real lattice
The mirror image of the real lattice
Nothing special
The lattice that is constructed by the inverse lattice vectors d*hkl=1/dhkl
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XRD Test1

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