HEF4521B: 1. General Description
HEF4521B: 1. General Description
HEF4521B: 1. General Description
1. General description
The HEF4521B consists of a chain of 24 toggle flip-flops with an overriding asynchronous
master reset input (MR), and an input circuit that allows three modes of operation. The
single inverting stage (A2 to Y2) will function as: a crystal oscillator, an input buffer for an
external oscillator or in combination with A1 as an RC oscillator. The crystal oscillator
operates in Low-power mode when pins VSS1 and VDD1 are supplied via external resistors.
Each flip-flop divides the frequency of the previous flip-flop by two, consequently the
HEF4521B will count up to 224 = 16777216. The counting advances on the HIGH-to-LOW
transition of the clock (A2). The outputs from each of the last seven stages (218 to 224) are
available for additional flexibility.
2. Features
n Low power crystal oscillator operation
n Fully static operation
n 5 V, 10 V, and 15 V parametric ratings
n Standardized symmetrical output characteristics
n Operates across the full industrial temperature range −40 °C to +85 °C
n Complies with JEDEC standard JESD 13-B
3. Applications
n Industrial
4. Ordering information
Table 1. Ordering information
All types operate from −40 °C to +85 °C.
Type number Package
Name Description Version
HEF4521BP DIP16 plastic dual in-line package; 16-leads (300 mil) SOT38-4
HEF4521BT SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
NXP Semiconductors HEF4521B
24-stage frequency divider and oscillator
5. Functional diagram
5 4 2 9
VDD1 Y2 MR A1
A2
6 CP
STAGES 1 to 8
VSS1 CD Q8
3
CP
STAGES 9 to 16
CD Q16
CP
STAGES 17 to 24
CD
1 10 11 12 13 14 15 7
001aae708
VDD1
VDD
A2 to FFs to logic
VSS
VSS1
Y2 001aae711
NXP Semiconductors
MR A1
Y2
Q Q Q Q Q Q Q Q
FF 1 FF 2 FF 3 FF 4 FF 5 FF 6 FF 7 FF 8
A2 T T T T T T T T
VSS1
CD CD CD CD CD CD CD CD
VDD1
Q Q Q Q Q Q Q Q
FF 9 FF 10 FF 11 FF 12 FF 13 FF 14 FF 15 FF 16
T T T T T T T T
CD CD CD CD CD CD CD CD
Rev. 05 — 5 November 2009
Q Q Q Q Q Q Q Q
FF 17 FF 18 FF 19 FF 20 FF 21 FF 22 FF 23 FF 24
T T T T T T T T
CD CD CD CD CD CD CD CD
HEF4521B
© NXP B.V. 2009. All rights reserved.
3 of 17
NXP Semiconductors HEF4521B
24-stage frequency divider and oscillator
6. Pinning information
6.1 Pinning
HEF4521B
Q24 1 16 VDD
MR 2 15 Q23
VSS1 3 14 Q22
Y2 4 13 Q21
VDD1 5 12 Q20
A2 6 11 Q19
Y1 7 10 Q18
VSS 8 9 A1
001aae709
7. Count capacity
Table 3. Count capacity
Output Count capacity
Q18 218 = 262144
Q19 219 = 524288
Q20 220 = 1048576
Q21 221 = 2097152
Q22 222 = 4194304
Q23 223 = 8388608
Q24 224 = 16777216
8. Functional Test
A test function has been included to reduce the test time required to test all 24 counter
stages. This test function divides the counter into three 8-stage sections by connecting
VSS1 to VDD and VDD1 to VSS. 255 counts are loaded into each of the 8-stage sections in
parallel via A2 (connected to Y2). All flip-flops are now at a HIGH level. The counter is now
returned to the normal 24-stage in series configuration by connecting VSS1 to VSS and
VDD1 to VDD. Entering one more pulse into input A2 will cause the counter to ripple from
an all HIGH state to an all LOW state.
[1] H = HIGH voltage level; L = LOW voltage level; ↓ = HIGH to LOW transition.
9. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage −0.5 +18 V
IIK input clamping current VI < −0.5 V or VI > VDD + 0.5 V - ±10 mA
VI input voltage −0.5 VDD + 0.5 V
IOK output clamping current VO < −0.5 V or VO > VDD + 0.5 V - ±10 mA
II/O input/output current - ±10 mA
IDD supply current to any supply terminal - ±100 mA
Tstg storage temperature −65 +150 °C
Tamb ambient temperature −40 +85 °C
Ptot total power dissipation DIP16 package [1] - 750 mW
SO16 package [2] - 500 mW
P power dissipation per output - 100 mW
[1] For DIP16 package: Ptot derates linearly with 12 mW/K above 70 °C.
[2] For SO16 package: Ptot derates linearly with 8 mW/K above 70 °C.
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
13. Waveforms
VI
MR input VM
0V
tW
1/fmax
VI
A2 input VM
0V
trec tW
tPHL tPLH
VOH
90 %
Qn output
10 %
VOL
tt tt
001aae712
a. Pulse widths, maximum frequency, recovery and transition times and A2 to Qn propagation delays
VI VOH
A1 input VM Qn output VM
0V VOL
tPLH tPHL tPLH tPHL
VOH VOH
Y1 output VM Qn + 1 output VM
VOL VOL
Y1 propagation delays Qn to Qn + 1 propagation delays
001aak015
tW
VI
90 %
negative
pulse VM VM
10 %
0V
tf tr
tr tf
VI
90 %
positive
pulse VM VM
10 %
0V
tW
001aaj781
a. Input waveforms
VDD
VI VO
G DUT
RT CL
001aag182
b. Test circuit
Test data is given in Table 10.
Definitions for test circuit:
Device Under Test (DUT);
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Fig 6. Test circuit for switching times
VDD
Ro 1.8 MΩ R(1)
VDD VDD1
A1 Y1
Y2
Q18
A2
HEF4521B
CS CT
MR Q24
VSS VSS1
R(1)
001aae713
001aae715
RTC VDD 102
C
fosc (1)
(kHz)
RS VDD VDD1
A1 Y1 10
Y2 (2)
Q18
A2
HEF4521B
MR Q24
VSS VSS1
10−1
1 10 102 RTC (kΩ) 103
001aae714 10−1 1 10 C (nF) 102
V IL ( max )
R S + R TC < --------------------- , where:
I LI
001aae658
12.5
gfs
(mA/V)
10
(1)
7.5
(2)
Rbias
560 kΩ 5 (3)
VDD
Vi input output io
A
(f = 1 kHz)
0
VSS 0 5 10 15
001aae820 VDD (V)
001aae716 001aae717
75 20
IDD
gain (mA)
(VO/VI)
15
50
typ
typ
10
25
5
0 0
0 5 10 15 0 5 10 15
VDD (V) VDD (V)
Fig 12. Voltage gain VO/VI as a function of supply Fig 13. Supply current as a function of supply voltage
voltage
330 kΩ
A2 Y2
001aae718
Fig 14. Test setup for measuring the Figure 12 and Figure 13 graphs
D ME
seating plane
A2 A
L A1
c
Z e w M
b1
(e 1)
b b2
16 9 MH
pin 1 index
E
1 8
0 5 10 mm
scale
UNIT
A A1 A2
b b1 b2 c D (1) E (1) e e1 L ME MH w Z (1)
max. min. max. max.
1.73 0.53 1.25 0.36 19.50 6.48 3.60 8.25 10.0
mm 4.2 0.51 3.2 2.54 7.62 0.254 0.76
1.30 0.38 0.85 0.23 18.55 6.20 3.05 7.80 8.3
inches 0.068 0.021 0.049 0.014 0.77 0.26 0.14 0.32 0.39
0.17 0.02 0.13 0.1 0.3 0.01 0.03
0.051 0.015 0.033 0.009 0.73 0.24 0.12 0.31 0.33
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
95-01-14
SOT38-4
03-02-13
SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
D E A
X
y HE v M A
16 9
Q
A2
(A 3) A
A1
pin 1 index
θ
Lp
1 8 L
e w M detail X
bp
0 2.5 5 mm
scale
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
99-12-27
SOT109-1 076E07 MS-012
03-02-19
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
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information is available on the Internet at URL http://www.nxp.com.
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NXP Semiconductors products in such equipment or applications and
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Draft — The document is a draft version only. The content is still under
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representations or warranties as to the accuracy or completeness of representation or warranty that such applications will be suitable for the
information included herein and shall have no liability for the consequences of specified use without further testing or modification.
use of such information. Limiting values — Stress above one or more limiting values (as defined in
Short data sheet — A short data sheet is an extract from a full data sheet the Absolute Maximum Ratings System of IEC 60134) may cause permanent
with the same product type number(s) and title. A short data sheet is intended damage to the device. Limiting values are stress ratings only and operation of
for quick reference only and should not be relied upon to contain detailed and the device at these or any other conditions above those given in the
full information. For detailed and full information see the relevant full data Characteristics sections of this document is not implied. Exposure to limiting
sheet, which is available on request via the local NXP Semiconductors sales values for extended periods may affect device reliability.
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full data sheet shall prevail. subject to the general terms and conditions of commercial sale, as published
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19. Contents
1 General description . . . . . . . . . . . . . . . . . . . . . . 1
2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
4 Ordering information . . . . . . . . . . . . . . . . . . . . . 1
5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4
7 Count capacity . . . . . . . . . . . . . . . . . . . . . . . . . . 4
8 Functional Test. . . . . . . . . . . . . . . . . . . . . . . . . . 5
9 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5
10 Recommended operating conditions. . . . . . . . 6
11 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6
12 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7
13 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
14 Application information. . . . . . . . . . . . . . . . . . 10
15 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 13
16 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 15
17 Legal information. . . . . . . . . . . . . . . . . . . . . . . 16
17.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 16
17.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
17.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
17.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
18 Contact information. . . . . . . . . . . . . . . . . . . . . 16
19 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.