CSD30N40 Data Sheet V1.2

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CSD30N40

N-Channel Trench Power MOSFET

General Description
The CSD30N40 uses advanced trench technology to provide
excellent RDS(ON), low gate charge and operation with gate
voltages as low as 4.5V. This device is suitable for use as a
wide variety of applications.
Schematic Diagram

Features
● VDS = 30V,ID =86A
RDS(ON) < 5 mΩ @ VGS =10V
RDS(ON) < 9.5mΩ @ VGS =4.5V

● High Power and current handing capability


● Lead free product is acquired
● Surface Mount Package
Marking and pin Assignment
Application
● PWM applications
● Load switch
● Power management

100% UIS TESTED!


100% ΔVds TESTED! TO-252(DPAK) top view

Package Marking and Ordering Information


Device Marking Device Device Package Reel Size Tape width Quantity

CSD30N40 CSD30N40 TO-252 325mm 16mm 2500

Table 1. Absolute Maximum Ratings (TA=25℃)


Symbol Parameter Value Unit
VDS Drain-Source Voltage (VGS=0V) 30 V

VGS Gate-Source Voltage (VDS=0V) ±20 V


(Note 1)
Drain Current-Continuous(Tc=25℃) 86 A
ID
Drain Current-Continuous(Tc=100℃) 60 A
(Note 2)
IDM (pluse) Drain Current-Continuous@ Current-Pulsed 344 A

Maximum Power Dissipation(Tc=25℃) 83 W


PD
Maximum Power Dissipation(Tc=100℃) 42 W
(Note 3)
EAS Avalanche energy 270 mJ

TJ,TSTG Operating Junction and Storage Temperature Range -55 To 175 ℃

Table 2. Thermal Characteristic


Symbol Parameter Typ Max Unit
RJC Thermal Resistance,Junction-to-Case - 1.8 ℃/W

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CSD30N40
Table 3. Electrical Characteristics (TA=25℃unless otherwise noted)
Symbol Parameter Conditions Min Typ Max Unit
On/Off States

BVDSS Drain-Source Breakdown Voltage VGS=0V ID=250μA 30 V

IDSS Zero Gate Voltage Drain Current VDS=30V,VGS=0V 1 μA

IGSS Gate-Body Leakage Current VGS=±20V,VDS=0V ±100 nA

VGS(th) Gate Threshold Voltage VDS=VGS,ID=250μA 1.0 1.5 2.5 V

gFS Forward Transconductance VDS=5V,ID=15A 24 S

VGS=10V, ID=20A 3.6 5 mΩ


RDS(ON) Drain-Source On-State Resistance
VGS=4.5V, ID=20A 6 9.5 mΩ

Dynamic Characteristics

Ciss Input Capacitance 1980 pF


VDS=15V,VGS=0V,
Coss Output Capacitance 320 pF
f=1.0MHz
Crss Reverse Transfer Capacitance 240 pF

Rg Gate resistance VGS=0V, VDS=0V,f=1.0MHz 3.2 Ω

Switching Times

td(on) Turn-on Delay Time 12 nS

tr Turn-on Rise Time VGS=10V, VDS=15V, 36 nS


RL=0.75,RGEN=3
td(off) Turn-Off Delay Time 49 nS

tf Turn-Off Fall Time 12 nS

Qg Total Gate Charge 45 nC

Qgs Gate-Source Charge VGS=10V, VDS=25V, ID=14A 3 nC

Qgd Gate-Drain Charge 15 nC

Source-Drain Diode Characteristics

ISD Source-Drain Current(Body Diode) 86 A

VSD Forward on Voltage VGS=0V,IS=20A 1.2 V

trr Body Diode Reverse Recovery Time IF=20A, dI/dt=100A/s 15 ns

Qrr Body Diode Reverse Recovery Charge IF=20A, dI/dt=100A/s 4 nC

Notes 1.The maximum current rating is package limited.


Notes 2.Repetitive Rating: Pulse width limited by maximum junction temperature
Notes 3.EAS condition: TJ=25℃,VDD=30V,VG=10V, RG=25Ω

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CSD30N40
Test Circuit
1) EAS Test Circuits

2) Gate Charge Test Circuit:

3) Switch Time Test Circuit:

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CSD30N40

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS (Curves)

Figure 1. Output Characteristics Figure 2. Transfer Characteristics


Id (A)

VDS Drain-to-Source Voltage(V) Id (A) VGS Gate-to-Source Voltage(V)

Figure 3. Max BVDSS vs Junction Temperature Figure 4. Drain Current


Normalized BVDSS

Id (A)

TJ-Junction Temperature(℃) TJ-Junction Temperature(℃)

Figure 5. VGS(th) vs Junction Temperature Figure 6. RDS(ON) vs Junction Temperature


Normalized Rdson
Normalized Vth

TJ-Junction Temperature(℃) TJ-Junction Temperature(℃)

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CSD30N40

Figure 7. Gate Charge Waveforms Figure 8. Capacitance

C Capacitance(pF)
Vgs (V)

Qg(nC) VDS Drain-to-Source Voltage(V)

Figure 9. Body-Diode Characteristics Id (A) Figure 10. Maximum Safe Operating Area
Is (A)

Vsd (V) VDS Drain-to-Source Voltage(V)

Figure 11. Normalized Maximum Transient Thermal Impedance

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CSD30N40

TO-252 Package Information

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