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Software Testing: 1 Embedded Systems

This document discusses software testing. It provides an overview of testing, including when to test in the development process and the differences between incremental and big bang testing approaches. It describes different types of testing like clear box (white box) testing which tests based on how the code is written, and black box testing which tests the external behavior without knowledge of the internal workings. The document also discusses test planning, writing bug reports, and selecting test cases.

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Elisée Ndjabu
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0% found this document useful (0 votes)
43 views

Software Testing: 1 Embedded Systems

This document discusses software testing. It provides an overview of testing, including when to test in the development process and the differences between incremental and big bang testing approaches. It describes different types of testing like clear box (white box) testing which tests based on how the code is written, and black box testing which tests the external behavior without knowledge of the internal workings. The document also discusses test planning, writing bug reports, and selecting test cases.

Uploaded by

Elisée Ndjabu
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 35

Software Testing

Embedded Systems 1
Suggested Reading
Testing Computer Software, Cem Kaner, Jack Falk,
Hung Quoc Nguyen
– Used as framework for much of this lecture
Software Engineering: A Practitioner’s Approach,
Robert Pressman
– Chapters 17 & 18
The Art of Designing Embedded Systems, Jack Ganssle
– Chapter 2: Disciplined Development
– Chapter 3: Stop Writing Big Programs
The Mythical Man-Month, Frederick P. Brooks, Jr.
The Practice of Programming, Brian Kernighan & Rob Pike
Why Does Software Cost So Much? and Other Puzzles of the
Information Age, Tom DeMarco

Embedded Systems 2
Overview
Big Picture
– What testing is and isn’t
– When to test in the project development schedule
– Incremental vs. Big Bang
How to test
– Clear box vs. black box
– Writing test harnesses
• Software only
• Software and hardware
– Selecting test cases
• What code to test
• What data to provide

Embedded Systems 3
Testing
Brooks (MMM): Preferred time distribution – mostly planning
and testing

System Planning
Test 33%
25%

Compon
ent Test Coding
25% 17%

The sooner you start coding, the longer it will take to finish
the program

Embedded Systems 4
Philosophy of Testing

Common misconceptions
– “A program can be tested completely”
– “With this complete testing, we can ensure the program
is correct”
– “Our mission as testers is to ensure the program is
correct using complete testing”

Questions to be answered
– What is the point of testing?
– What distinguishes good testing from bad testing?
– How much testing is enough?
– How can you tell when you have done enough?

Embedded Systems 5
Clearing up the Misconceptions
Complete testing is impossible
– There are too many possible inputs
• Valid inputs
• Invalid inputs
• Different timing on inputs
– There are too many possible control flow paths in the program
• Conditionals, loops, switches, interrupts…
• Combinatorial explosion
• And you would need to retest after every bug fix
– Some design errors can’t be found through testing
• Specifications may be wrong
– You can’t prove programs correct using logic
• If the program completely matches the specification, the spec may still
be wrong
– User interface (and design) issues are too complex

Embedded Systems 6
What is the Objective of Testing?
Testing IS NOT “the process of verifying the program works correctly”
– You can’t verify the program works correctly
– The program doesn’t work correctly (in all cases), and probably won’t ever
• Professional programmers have 1-3 bugs per 100 lines of code after it
is “done”
– Testers shouldn’t try to prove the program works
• If you want and expect your program to work, you’ll unconsciously
miss failures
• Human beings are inherently biased
The purpose of testing is to find problems
– Find as many problems as possible
The purpose of finding problems is to fix them
– Then fix the most important problems, as there isn’t enough time to fix all
of them
– The Pareto Principle defines “the vital few, the trivial many”
• Bugs are uneven in frequency – a vital few contribute the majority of
the program failures. Fix these first.

Embedded Systems 7
Software Development Stages and Testing
1. Planning
– System goals: what it will do and why
– Requirements: what must be done
– Functional definition: list of features and functionality
– Testing during Planning: do these make sense?
2. Design
– External design: user’s view of the system
• User interface inputs and outputs; System behavior given inputs
– Internal design: how the system will be implemented
• Structural design: how work is divided among pieces of code
• Data design: what data the code will work with (data structures)
• Logic design: how the code will work (algorithms)
– Testing during Design
• Does the design meet requirements?
• Is the design complete? Does it specify how data is passed
between modules, what to do in exceptional circumstances, and
what starting states should be?
• How well does the design support error handling? Are all
remotely plausible errors handled? Are errors handled at the
appropriate level in the design?

Embedded Systems 8
Software Development Stages
3. Coding and Documentation
– Good practices interleave documentation and testing with coding
• Document the function as you write it, or once you finish it
• Test the function as you build it. More on this later
4. Black Box Testing and Fixing
– After coding is “finished” the testing group beats on the code,
sends bug reports to developers. Repeat.
5. Post-Release Maintenance and Enhancement
• 42% of total software development budget spent on user-
requested enhancements
• 25% adapting program to work with new hardware or other
programs
• 20% fixing errors
• 6% fixing documentation
• 4% improving performance

Embedded Systems 9
Development and Testing Approach: Incremental vs. Big Bang Testing

Incremental Testing
– Code a function and then test it (module/unit/element testing)
– Then test a few working functions together (integration testing)
• Continue enlarging the scope of tests as you write new functions
– Incremental testing requires extra code for the test harness
• A driver function calls the function to be tested
• A stub function might be needed to simulate a function called by
the function under test, and which returns or modifies data.
• The test harness can automate the testing of individual functions to
detect later bugs
Big Bang Testing
– Code up all of the functions to create the system
– Test the complete system
• Plug and pray

Embedded Systems 10
Why Test Incrementally?
Finding out what failed is much easier
– With BB, since no function has been thoroughly tested, most probably
have bugs
– Now the question is “Which bug in which module causes the failure I see?”
– Errors in one module can make it difficult to test another module
• If the round-robin scheduler ISR doesn’t always run tasks when it
should, it will be hard to debug your tasks!
Less finger pointing = happier team
– It’s clear who made the mistake, and it’s clear who needs to fix it
Better automation
– Drivers and stubs initially require time to develop, but save time for future
testing

Embedded Systems 11
Development Tasks

Development = Σ(coding + testing)


Task dependency graph shows an overview of the sequence of
– What software must be written
– When and how it is tested
Nodes represent work
– Ellipse = code, Box = test
Arrows indicate order

Embedded Systems 12
Overview
Big Picture
– What testing is and isn’t
– When to test in the project development schedule
– Incremental vs. Big Bang
How to test
– Bug reports
– Clear box vs. black box testing
– Writing test harnesses
• Software only
• Software and hardware
– Test plan and selecting test cases
• What code to test
• What data to provide

Embedded Systems 13
Bug Report
Goal: provide information to get bug fixed
– Explain how to reproduce the problem
– Analyze the error so it can be described in as few steps as possible
– Write report which is complete, easy to understand, and non-antagonistic
Sections
– Program version number
– Date of bug discovery
– Bug number
– Type: coding error, design issue, suggestion, documentation conflict,
hardware problem, query
– Severity of bug: minor, serious, fatal
– Can you reproduce the bug?
– If so, describe how to reproduce it
– Optional suggested fix
– Problem summary (one or two lines)

Embedded Systems 14
Clear Box (White Box) Testing
How?
– Exercise code based on knowledge of how program is written
– Performed during Coding stage
Subcategories
– Condition Testing
• Test a variation of each condition in a function
– True/False condition requires two tests
– Comparison condition requires three tests
» A>B? A < B, A == B, A > B
• Compound conditions
– E.g. (n>3) && (n != 343)
– Loop Testing
• Ensure code works regardless of number of loop iterations
• Design test cases so loop executes 0, 1 or maximum number of times
• Loop nesting or dependence requires more cases

Embedded Systems 15
Black Box Testing
Complement to white box testing
Goal is to find
– Incorrect or missing functions
– Interface errors
– Errors in data structures or external database access
– Behavioral or performance errors
– Initialization and termination errors
Want each test to
– Reduce the number of additional tests needed for reasonable
testing
– Tell us about presence or absence of a class of errors

Embedded Systems 16
Comparing Clear Box and Black Box Testing
Clear box
– We know what is inside the box, so we test to find internal
components misbehaving
– Large number of possible paths through program makes it
impossible to test every path
– Easiest to do during development
Black box, behavioral testing
– We know what output the box should provide based on given
inputs, so we test for these outputs
– Performed later in test process

Embedded Systems 17
Test Harness
int ADC_Stub(void) {
Components static float i=0.0;
– Driver: provide data to function i += 0.04;
return 50*sin(i);
under test }
– Stub: simulate an as-of-yet-
unwritten function void Test_ADC_Clip(int num_tests){
• May need stub functions to int n;
while (num_tests--) {
simulate hardware n = ADC_Clip();
Conditional compilation // verify result is valid
if ((n<MIN_VAL)||(n>MAX_VAL))
Automation Signal_Test_Failure();
}
#define TESTING 1
}
#define MIN_VAL (10)
#define MAX_VAL (205)
int ADC_Clip(void) {
// read value from ADC ch 2 and
#if TESTING
// clip it to be within range
#define ADC_VAL ADC_Stub()
int v = ADC_VAL;
#else
v = (v>MAX_VAL)? MAX_VAL : v;
#define ADC_VAL adc2
v = (v<MIN_VAL)? MIN_VAL : v;
#endif
return v;
}

Embedded Systems 18
Passing Input Data to Functions
SONAR
U0RxQ Process
UART0
NMEA CurDepth
Rx ISR
Sentence
void Test_NMEA_Decoding(void) {
unsigned int i;
Insert i = 0;
Data while (nmea_sonar[i][0]) {
Q_Enqueue_String(&SONAR_RX_Q,
Code gets data from… nmea_sonar[i]); /* add string
– Arguments – easy to handle to queue */
– Global variables (including global data sonar_sentence_avail = 1;
structures) – require some “glue” code to TASK_Process_NMEA_Sentence();
configure/preload i++;
Example: Testing decoding of recorded NMEA }
sentences from sonar }
– Don’t have sonar connected to board
– Instead load U0RxQ with NMEA sentences

_far const char nmea_sonar[9][] = {


"$YXXDR,R,0.0,l,PORT FUEL,R,0.0,l,STARBOARD FUEL,U,12.4,V,BATTERY
*4F\r\n",
"$SDDBT,0.0,f,0.0,M,0.0,F*06\r\n", "$SDDPT,0.0,0.0,2.0*57\r\n",
"$PTTKV,0.0,,,49.6,49.6,72.3,F*11\r\n", "$PTTKD,0.0,,B*1F\r\n",
"$VWVHW,,,,,0.0,N,0.0,K*4D\r\n", "$VWMTW,22.4,C*16\r\n",
"$VWVLW,49.6,N,49.6,N*4C\r\n", ""};}

Embedded Systems 19
Class Exercise: black box, driver testing
Test the function:

Function: ctof
Prototype: int ctof(int);
Works: Input a valid integer Celsius temperature, output will
be a valid Fahrenheit temperature.

Assignment: Write a driver to test the function using black


box testing

Embedded Systems 20
Your solution for black box testing
void main(void) {
printf(“input %d, output %d\n”, -30000,
ctof(-30000));
printf(“input %d, output %d\n”, -274,
ctof(-274));
printf(“input %d, output %d\n”, -273,
ctof(-273));
printf(“input %d, output %d\n”, -40,
ctof(-40));
printf(“input %d, output %d\n”, 10000,
ctof(10000));
printf(“input %d, output %d\n”, 23,
ctof(23));
}
Embedded Systems 21
Now imagine this code for ctof
int ctof (int tempin){
if (tempin < -273) return (-32768);
if (tempin > 18185) return (-32768);
return ((tempin*9/5) +32);
}

Embedded Systems 22
Class Exercise: white box, driver testing
Test the function:

Function: ctof
Prototype: int ctof(int);
Works: Input a valid integer Celsius temperature, output will
be a valid Fahrenheit temperature.

Assignment: Write a driver to test the function using white


box testing

Embedded Systems 23
Sample solution for white box testing
void main(void) {
printf(“input %d, output %d\n”, -32768,
ctof(-32768)); //result -32768
printf(“input %d, output %d\n”, -274,
ctof(-274)); //result -32768
printf(“input %d, output %d\n”, -273,
ctof(-273)); //result -460
printf(“input %d, output %d\n”, -40,
ctof(-40)); //result -40
printf(“input %d, output %d\n”, 18185,
ctof(18185)); //result 32767
printf(“input %d, output %d\n”, 18186,
ctof(18185)); //result -32768
printf(“input %d, output %d\n”, 32767,
ctof(32767)); //result -32768
}

Embedded Systems 24
Code for ctof – it has a code error!!!!
return ((tempin*9/5) +32);

tempin*9 could result in an integer (16-bit) overflow!


Can you instead divide by 5 first?
Test with the number 15003:
15003/5 = 3000, * 9 = 27000, +32 = 27032
But if you enter in 15003 it should yield a correct answer
27037.

Solution:
return (int(((long)tempin*9/5) +32));

Would your test have found the error?

Embedded Systems 25
Test Plans
A test plan is a general document describing the general test
philosophy and procedure of testing. It will include:
Hardware/software dependencies
Test environments
Description of test phases and functionality tested each
phase
List of test cases to be executed
Test success/failure criteria of the test phase
Personnel
Regression activities

Embedded Systems 26
Test Cases
A test case is a specific procedure of testing a particular
requirement. It will include:
Identification of specific requirement tested
Test case success/failure criteria
Specific steps to execute test

Embedded Systems 27
Test Case Example
Test Case L04-007:
Objective: Tested Lab 4 requirement 007.
Passing Criteria: All characters typed are displayed on LCD and
HyperTerminal window.
Materials needed: Standard Lab 4 setup (see test plan).
1. Attach RS-232c cable between the SKP board and a PC.
2. Start HyperTerminal on PC at 300 baud, 8 data bits, 2 stop bits, even
parity.
3. Type “a” key on PC. Ensure it is displayed on SKP board LCD, and
in the PC HyperTerminal window.
4. Test the following characters: CR, A, a, Z, z, !, \, 0, 9

Embedded Systems 28
A Good Test…
Has a high probability of finding an error
– Tester must have mental model of how software might fail
– Should test classes of failure
Is not redundant
– Testing time and resources are limited
– Each test should have a different purpose
Should be “best of breed”
– Within a set of possible tests, the test with the highest likelihood of finding
a class of errors should be used
Should be neither too simple nor too complex
– Reduces possibility of one error masking another
Should test rarely used as well as common code
– Code which is not executed often is more likely to have bugs
– Tests for the common cases (e.g. everything normal) do not exercise
error-handling code
– We want to ensure we test rare cases as well

Embedded Systems 29
Equivalence Partitioning
Divide input domain into data classes
Derive test cases from each class
Guidelines for class formation based on input condition
– Range: define one valid and two invalid equivalence classes
• if ((a>7) && (a<30))…
• Valid Equivalence Class: 7<x<30
• Invalid Equivalence Class 1: x <= 7
• Invalid Equivalence Class 2: x >= 30
– Specific value: one valid and two invalid equivalence classes
• if (a==20))…
• Valid Equivalence Class: x == 20
• Invalid Equivalence Class 1: x < 20
• Invalid Equivalence Class 2: x > 20
– Member of a set: one valid and one invalid equivalence classes
– Boolean: one valid and one invalid equivalence classes

Embedded Systems 30
Examples of Building Input Domains
Character strings representing integers
– Valid: optional ‘–’ followed by one or more decimal digits
• 5, 39, -13451235
– Invalid: strings not matching description above
• 61-, 3-1, Five, 6 3, 65.1
Character strings representing floating point numbers
– Valid: optional ‘–’ followed by one or more decimal digits, optional ‘.’
followed by one or more decimal digits
• 9.9, -3.14159265, 41
– Invalid: strings not matching above description
• 3.8E14, frew, 11/41
Character strings representing latitude
– Valid:
• Degrees: integer string >= -180 and <= 180 followed by °
• Minutes: floating point string >= 0.0 and < 60.0 followed by ’
• 31° 15.90’, 31° 15.90’
– Invalid: strings not matching description
• 310° 15.90’, 1° -15’, 30° 65.90’

Embedded Systems 31
Regression Tests
A set of tests which the program has failed in the past
When we fix a bug, sometimes we’ll fix it wrong or break
something else
– Regression testing makes sure the rest of the program still works
Test sources
– Preplanned (e.g. equivalence class) tests
– Tests which revealed bugs
– Customer-reported bugs
– Lots of randomly generated data

Embedded Systems 32
Testability- How Easily Can A Program Be Tested?
How we design the software affects testability
• Operability – The better it works, the more efficiently it can be tested.
– Bugs add overhead of analysis and reporting to testing.
– No bugs block the execution of the tests.
– The product evolves in functional stages (allowing concurrent testing)
• Observability – What you see is what you test.
– A distinct output is generated for each input
– System state and variables should be visible or queriable during
execution (past states and variables too)
– Incorrect output is easily identified
– Internal errors are detected through self-testing, and are automatically
reported
– Source code is accessible

Embedded Systems 33
More Characteristics of Testability
• Controllability – The better we can control the software, the more
testing can be automated and optimized.
– All possible outputs can be generated through some combination of inputs
– All code is executable through some combination of input
– Software and hardware states can be controlled directly by the test
engineer
– Input and output formats are consistent and structured
– Tests can be conveniently specified, automated and reproduced
• Decomposability – By controlling the scope of testing, we can more
quickly isolate problems and perform smarter retesting
– Software is built from independent modules
– Modules can be tested independently
• Simplicity – The less there is to test, the more quickly we can test it.
– Functional simplicity – no extra features beyond requirements
– Structural simplicity – partition architecture to minimize the propagation of
faults
– Code simplicity – a coding standard is followed for ease of inspection and
maintenance

Embedded Systems 34
More Characteristics of Testability
• Stability – The fewer the changes, the fewer the
disruptions to testing.
– Changes to software are infrequent and controlled
– Changes to software do not invalidate existing tests
– Software recovers well from failures
• Understandability – The more information we have, the
smarter we will test
– The design is well understood
– Dependencies among components are well understood
– Technical documentation is
• Instantly accessible
• Well organized
• Specific, detailed and accurate

Embedded Systems 35

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