Calculating The RMS Energy of The FFT PDF
Calculating The RMS Energy of The FFT PDF
Jack D. Peters
Accelent Technology LLC
19 Olde Harbour Trail
Rochester, New York, 14612
[email protected]
Abstract: The Fast Fourier Transform (FFT) is used in vibration analysis. It is well known that
Window Filters (Hanning, Flat Top, etc.) can be applied to the time waveform during the batch
processing of the FFT, and as a result, decrease the resolution of the FFT. The resolution is
decreased by a numerical Window Factor based on the applied filter. It is not well known that the
Window Factor (WF) can also be described as the Equivalent Noise Bandwidth (ENBW) or Noise
Power Bandwidth. This paper will explain how to calculate the RMS Energy of the FFT when the
WF or ENBW used to process the FFT has a numerical value greater than one.
Key Words: Time Waveform, Fast Fourier Transform, FFT, Window Factor, Window Filter,
Equivalent Noise Bandwidth, Noise Power Bandwidth, RMS Energy, RMS Power, Lowest
Resolvable Frequency, Vibration Analysis
Introduction:
The Fast Fourier Transform or FFT was developed by James Cooley (IBM) and John
Tukey (Princeton) in 1965. The FFT included the introduction of computer processing of the
Fourier Series originally developed by a French mathematician and physicist, Joseph Fourier. This
highly improved the accuracy of vibration analysis for resolving closely spaced frequencies in the
spectrum. [1]
In the form of an algorithm or calculation, the FFT is a batch process that is applied to
individual blocks of time waveform data that typically represent the mechanical vibration of the
machine as measured by an accelerometer, velocity sensor or displacement probe. Figure 1
illustrates a typical time waveform and FFT.
The FFT shown in Figure #1, has a vertical axis in acceleration (g’s RMS) and a horizontal
axis in frequency (Hz). The individual frequencies identified in the FFT each have an amplitude
value. The highest amplitude, 0.0465 g’s RMS, is identified at 72.5 Hz. The amplitudes of the
individual frequencies in the FFT are important in assessing the condition of the machine (i.e.
Unbalance, Misalignment or Looseness) or the condition of individual components in the machine
(i.e. Rolling Element Bearings or Gears). Although the amplitudes of the individual frequencies in
the FFT could be trended for a change in amplitude indicating a change in condition, it would
require a significant amount of processing and data storage. This may not provide an efficient
method for general evaluation of the machine. The Overall RMS Value of the FFT describes the
RMS energy contained in the FFT. In Figure 1, the Overall RMS Value is 0.0602 g’s RMS and it
describes the RMS Energy contained in the FFT from 0 – 1000 Hz. This overall value of the RMS
Energy is easy to trend and alarm. If the energy increase or decreases, it indicates a change in
condition. In some applications, it may be more appropriate to measure the RMS Band Energy to
trend known changes in specific machine conditions or components. The RMS Band Energy is
calculated for a range of frequencies instead of the total frequency span of the FFT. The RMS
Band Energy from 50 – 100 Hz would specifically track the amplitude changes in a range that
includes the 72.5 Hz, in Figure #1, but ignores all other amplitudes.
Example 1: Frequency span is 0 – 500 Hz, Number of lines selected are 400
Example 2: Frequency span is 0 – 500 Hz, Number of lines selected are 1600
As indicated by Examples 1 and 2, if the number of lines is increased and the frequency
span remains constant, the Bin width is decreased. It would indicate that a smaller Bin width would
have better resolution. In fact, the Bin width describes the Lowest Resolvable Frequency (LRF)
that can be identified in the FFT display. Given the 0 – 500 Hz frequency span and 400 Lines of
Example #1, identifiable frequencies in the FFT would be; 0, 1.25, 2.50, 3.75 - - - 496.00, 497.25,
498.5 and 500 Hz. The cursor in the FFT display could be successfully moved from Line to Line
indicating the frequency and amplitude of each Line. As shown in Figures 2, 3 and 4, the Line is
always in the center of the Bin width. A frequency of 35 Hz has been used to illustrate the Bin
width, and reflects the calculations of Examples 1 and 2.
Amplitude
Amplitude
Figure 7 Flat Top Window Filter, Periodic, Continuous Time Waveform Data
Uniform 1.00
Rectangular 1.00
Hanning 1.50
Flat Top 2.96
Flat Top 3.82
Table 1 Window Factors or Equivalent Noise Bandwidth
It should be noted in Table 1 that some Window Filters will have multiple values for the
ENBW based on the calculated design of the Window Filter by the manufacturer of the data
collector, vibration analyzer or dynamic signal analyzer. This author has two vibration analyzers.
Both of them have an ENBW of 1.5 for the Hanning Window Filter, but for the Flat Top Window
Filter, one of them has an ENBW of 2.96 and the other one has an ENBW of 3.82. The user should
always refer to the technical specifications for their analyzer or ask the manufacturer to ascertain
the ENBW of the Window Filter they are using.
In Examples 1 and 2, the Bin Width or Lowest Resolvable Frequency (LRF) was identified
by dividing the Frequency Span by the Number of Lines. When a Window Filter is used, the
Window Factor or ENBW must be combined with the LRF. This combination will identify the
Bandwidth [4] of the FFT, as shown in Examples 3 and 4.
Example 3: Frequency span is 0 – 500 Hz, Number of lines are 400, Hanning Window
Example 4: Frequency span is 0 – 500 Hz, Number of lines are 1600, Hanning Window
Example 5: Frequency span is 0 – 500 Hz, Number of lines are 400, Hanning Window
Example 6: Frequency span is 0 – 500 Hz, Number of lines are 1600, Hanning Window
Scallop Loss
Hanning -15.1 % (1.42 dB)
100
90
80
70
60
50
%
40
30
20
10
0
0 1 2 3 4 5 6 7 8 9 10
Frequency (Hz)
A B
88
86
84
82
80
0 1 2 3 4 5 6 7 8 9 10
Frequency (Hz)
A B
Figure 9 Flat Top Window Filter (ENBW = 3.8) with Scallop Loss
The narrow Bandwidth of the Hanning Window Filter in Figure 8 provides good frequency
resolution for general purpose vibration measurements but has a high amplitude uncertainty.
Frequency A in Figure 8 is centered in the filter band and will have an accurate amplitude value.
Frequency B in Figure 8 is at the intersection of two filter bands and will have an amplitude value
that is attenuated due to Scallop Loss by 15.1%.
The wider Bandwidth of the Flat Top Window Filter in Figure 9 provides poor frequency
resolution for general purpose vibration measurements, but has a low amplitude uncertainty.
Frequency A in Figure 9 is centered in the filter band and will have an accurate amplitude value.
Frequency B in Figure 9 is at the intersection of two filter bands and will have an amplitude value
that is attenuated due to Scallop Loss by only 1%.
In Figure 10, the Hanning Window Filter (ENBW = 1.5) and Flat Top Window Filter
(ENBW = 3.8) have been superimposed on each other. Two examples are shown. One is bin
centered at 3 Hz and the other is bin centered at 7 Hz. Vertical scaling is 0% to 120% so that both
filter shapes are fully visible.
The Bandwidth of the Hanning Filter is equal to (400 Hz/400 Lines) 1.5 = 1.5 Hz.
The Bandwidth of the Flat Top Filter is equal to (400 Hz/400 Lines) 3.8 = 3.8 Hz.
In Figure 11, vertical scaling has been adjusted and is set at 80% to 100%. This provides
an expanded view and comparison of the Bin Width and Scallop Loss of each filter.
Although Scallop Loss was an important aspect of window filters when they were first
applied to digital signal analysis, many of today’s vibration analyzers, data collectors and virtual
instruments are able to measure and display the correct peak value with no user interaction.
100
80
60
%
40
20
1.5 Hz 3.8 Hz
0
0 1 2 3 4 5 6 7 8 9 10
Frequency (Hz)
Figure 10 Hanning & Flat Top Window Filters Bin Centered at 3 Hz and 7 Hz
90
Flat Top
85
80
0 1 2 3 4 5 6 7 8 9 10
Frequency (Hz)
Figure 11 Hanning & Flat Top Window Filters with Bin Width & Scallop Loss
0.047
0.020
0.011 0.013
0.007 0.008 0.009
0.004 0.006 0.005
0.003
An approximation of the overall RMS Energy could be made by using the individual
amplitude of the fundamental frequency and amplitude of each order. This calculation could be
made by; square root sum of squares, as shown in Example 7:
𝑅𝑀𝑆 𝐸𝑛𝑒𝑟𝑔𝑦 = . 047 +. 007 +. 008 +. 020 +. 004 +. 011 +. 006 +. 013 +. 003 +. 005 +. 009
The approximation in Example 7 has not used all of the energy that is contained in the FFT
from 0 – 1000 Hz. It has only calculated an approximation of eleven amplitudes. To correctly
calculate the overall RMS Energy of the FFT the equation in Example 8 should be used.
Example 8:
𝐴 +𝐴 +𝐴 +⋯𝐴 𝐴 +𝐴 +𝐴 +⋯𝐴
𝑅𝑀𝑆 𝐸𝑛𝑒𝑟𝑔𝑦 = 𝑜𝑟 𝑅𝑀𝑆 𝐸𝑛𝑒𝑟𝑔𝑦 =
𝐸𝑁𝐵𝑊 𝑊𝐹
Where:
𝑊𝐹 = 𝑊𝑖𝑛𝑑𝑜𝑤 𝐹𝑎𝑐𝑡𝑜𝑟
The FFT shown in Figure 12 utilized a Hanning Window Filter and 400 Lines. The ENBW
or WF will be 1.5. To calculate the equation in Example 8, it would be necessary to export the
frequency and amplitude data from the FFT in Figure 10 and import it to Excel or some other type
of software that can process a large volume of data. Calculations for 400 Lines with amplitudes
from 0 – 1000 Hz will be required. Table 2 is an example on how this could be done in Excel and
contains 400 amplitudes from 0 – 1000 Hz. Each amplitude (g’s RMS) is in column 2 and has been
squared in column 3 (g’s2 RMS). The sum of squares has been calculated as 0.00543711 g’s 2 RMS.
This sum will be divided by the ENBW or WF, and since we are using a Hanning Window Filter,
the divisor will be 1.5 providing a result of
0.00362474 g’s2 RMS. The square root of this Hz g’s RMS g's2 RMS
value is 0.06020583 g’s RMS and represents the 0.0 0.00724940 0.00005255
overall energy of the FFT as calculated by the 2.5 0.00362080 0.00001311
vibration analyzer. 5.0 0.00012540 0.00000002
(To reduce the size of Table 2, values between 10 7.5 0.00024780 0.00000006
Hz and 990 Hz are not shown, but they have been 10.0 0.00021800 0.00000005
included in the calculations.) - - -
- - -
- - -
990.0 0.00007931 0.00000001
If the square root sum of squares had been
992.5 0.00011210 0.00000001
used to calculate the overall RMS Energy from 0 –
995.0 0.00016160 0.00000003
1000 Hz in Figure 12, the value of the RMS Energy
997.5 0.00019500 0.00000004
would have been too high as shown in Example 9.
1000.0 0.00030960 0.00000010
The value calculated by using the square Sum of Squares 0 – 1000 Hz 0.00543711
root sum of squares is approximately 22% too high Divide by 1.5 0.00362474
when compared to the actual value that includes the Calculate Square Root 0.06020583
influence of the ENBW or WF on the RMS Energy. Table 2 RMS Energy Calculation
In order to gain a better understanding of how the
ENBW or WF effects the RMS energy of the FFT, the analysis will be limited to two single
harmonic frequencies, 35 Hz and 122 Hz, with no additional noise or influence from other sources.
35 Hz 122.5 Hz
1.004 g’s RMS 1.006 g’s RMS
35 Hz
1.004 g’s RMS
33.75 Hz 36.25 Hz
0.5016 g’s RMS 0.5026 g’s RMS
In Figure 14, the FFT has been expanded to focus on the Bin centered 35 Hz frequency.
The modulation like effect of the Window Filter has created what appear to be sideband amplitudes
+/- one Bin of center. The ENBW or WF has created amplitudes above and below the 35 Hz
frequency that must be accounted for. The RMS Energy for the 35 Hz frequency, using a Hanning
Window Filter with an ENBW of 1.5 will be:
In Figure 15, the FFT has been expanded to focus on the 122 Hz frequency that is not Bin
centered. The ENBW or WF has created amplitudes above and below the 122 Hz frequency that
must be accounted for. The RMS Energy for the 122 Hz frequency, using a Hanning Window
Filter with an ENBW of 1.5 will be:
The calculations for Figures 14 and 15 provide three very important pieces of information
about calculating the RMS Energy in the FFT using a Hanning Window Filter.
1. If a single harmonic frequency is Bin centered (Figure 14) using a Hanning Window
Filter, the RMS Energy will be equal to the RMS amplitude of that Bin centered
frequency.
2. If a single harmonic frequency is not Bin centered (Figure 15) using a Hanning Window
Filter, the RMS Energy must be calculated as shown because the frequency is
distributed in more than one Bin.
3. The 35 Hz and 122 Hz used in Figures 14 and 15 are single harmonic frequencies.
There is no additional noise added from other frequencies that may appear in an FFT
of actual vibration data.
35 Hz 122.5 Hz
1.002 g’s RMS 1.115 g’s RMS
35 Hz
1.002 g’s RMS
33.75 Hz 36.25 Hz
0.9285 g’s RMS 0.9289 g’s RMS
32.5 Hz 37.5 Hz
0.3523 g’s RMS 0.3532 g’s RMS
In Figure 18, the FFT has been expanded to focus on the 122 Hz frequency that is not Bin
centered. The ENBW or WF has created amplitudes above and below the 122 Hz frequency that
must be accounted for. The RMS Energy for the 122 Hz frequency, using a Flat Top Window
Filter with an ENBW of 2.96 will be:
The calculations for Figures 17 and 18 provide three very important pieces of information
about calculating the RMS Energy in the FFT using a Flat Top Window Filter.
1. If a single harmonic frequency is Bin centered (Figure 17) using a Flat Top Window Filter,
the RMS Energy will be equal to the RMS amplitude of that Bin centered frequency.
2. If a single harmonic frequency is not Bin centered (Figure 18) using a Flat Top Window
Filter, the RMS Energy must be calculated as shown because the frequency is distributed
in more than one Bin, but since the Flat Top Window only has a 1% maximum amplitude
error as previously discussed, the RMS Energy and amplitudes at 121.25 Hz and 122.5 Hz
will be almost the same..
3. The 35 Hz and 122 Hz used in Figures 17 and 18 are single harmonic frequencies. There
is no additional noise added from other frequencies that may appear in an FFT of actual
vibration data.
Summary:
Window Filters are necessary for vibration analysis because they modify the time
waveform data in each time block to simulate continuous data during the batch processing of the
FFT. Modifying the original time waveform data creates many cause and effects in the FFT that
must be understood for measurement and analysis of the machine vibration.
The Window Factor is also known to affect the amplitude uncertainty of the individual
frequencies being measured. If the frequency is not centered in the Window Filter there will be
some amount of amplitude error. In a Hanning Window Filter the amplitude uncertainty can be
-15.1%, but in a Flat Top Window Filter the amplitude uncertainty is only -1%. In general purpose
vibration measurements, the Hanning Window Filter is preferred for better frequency resolution,
but if the amplitude is critical to the measurement, then the Flat Top Window Filter can be used.
The Equivalent Noise Bandwidth is terminology better used to describe the calculation of
the RMS Energy in the FFT. The amplitudes that are present in adjacent Bins of the FFT contribute
to the noise bandwidth and must be accounted for when calculating the RMS Energy in the FFT
as shown:
If FFT amplitudes (A) are in RMS units (i.e. g’s RMS, in/s RMS or mm/s RMS) then:
𝐴 + 𝐴 + 𝐴 + ⋯𝐴
𝑅𝑀𝑆 𝐸𝑛𝑒𝑟𝑔𝑦 =
𝐸𝑞𝑢𝑖𝑣𝑎𝑙𝑒𝑛𝑡 𝑁𝑜𝑖𝑠𝑒 𝐵𝑎𝑛𝑑𝑤𝑖𝑑𝑡ℎ
If FFT amplitudes (A) are in Peak units (i.e. g’s Peak, in/s Peak or mm/s Peak) then:
𝐴 + 𝐴 + 𝐴 + ⋯𝐴
𝑅𝑀𝑆 𝐸𝑛𝑒𝑟𝑔𝑦 = 0.707
𝐸𝑞𝑢𝑖𝑣𝑎𝑙𝑒𝑛𝑡 𝑁𝑜𝑖𝑠𝑒 𝐵𝑎𝑛𝑑𝑤𝑖𝑑𝑡ℎ
Equivalent Noise
ENBW A numerical value that describes the Window Factor.
Bandwidth
𝐹𝑟𝑒𝑞𝑢𝑒𝑛𝑐𝑦 𝑆𝑝𝑎𝑛
Bin Width Bin
𝑁𝑢𝑚𝑏𝑒𝑟 𝑜𝑓 𝐿𝑖𝑛𝑒𝑠
𝐹𝑟𝑒𝑞𝑢𝑒𝑛𝑐𝑦 𝑆𝑝𝑎𝑛
Bandwidth BW 𝑊𝑖𝑛𝑑𝑜𝑤 𝐹𝑎𝑐𝑡𝑜𝑟
𝑁𝑢𝑚𝑏𝑒𝑟 𝑜𝑓 𝐿𝑖𝑛𝑒𝑠
𝐹𝑟𝑒𝑞𝑢𝑒𝑛𝑐𝑦 𝑆𝑝𝑎𝑛
Resolution Res 2 𝑊𝑖𝑛𝑑𝑜𝑤 𝐹𝑎𝑐𝑡𝑜𝑟
𝑁𝑢𝑚𝑏𝑒𝑟 𝑜𝑓 𝐿𝑖𝑛𝑒𝑠
RMS Energy 𝐴 + 𝐴 + 𝐴 + ⋯𝐴
RMS
(with RMS units) 𝐸𝑞𝑢𝑖𝑣𝑎𝑙𝑒𝑛𝑡 𝑁𝑜𝑖𝑠𝑒 𝐵𝑎𝑛𝑑𝑤𝑖𝑑𝑡ℎ
RMS Energy 𝐴 + 𝐴 + 𝐴 + ⋯𝐴
RMS 0.707
(with Peak units) 𝐸𝑞𝑢𝑖𝑣𝑎𝑙𝑒𝑛𝑡 𝑁𝑜𝑖𝑠𝑒 𝐵𝑎𝑛𝑑𝑤𝑖𝑑𝑡ℎ
References:
1. Eshleman, Ronald L. and Peters, Jack D., Category III Machinery Vibration Analysis,
Vibration Institute 2019.
2. Harris, Frederic J., On the Use of Windows for Harmonic Analysis with the Discrete
Fourier Transform, Proceedings of the IEEE, Volume 66, Number 1, January 1978.
3. Cerna, Michael and Harvey, Audrey F., The Fundamentals of FFT-Based Signal Analysis
and Measurement, Application Note 041, National Instruments Corporation, July 2000.
4. Dynamic Signal Analyzer Applications, Application Note 243-1, Hewlett-Packard
Company, October 1983.
5. Frarey, Jack, An Examination of Signal Resolution in an FFT Analyzer, 21st Annual
Meeting, Vibration Institute, July 17, 1997.
6. The Fundamentals of Signal Analysis, Application Note 243, Hewlett-Packard Company,
1985.