LM160/LM360 High Speed Differential Comparator

December 1994

LM160/LM360 High Speed Differential Comparator

General Description Features
The LM160/LM360 is a very high speed differential input, Y Guaranteed high speed 20 ns max
complementary TTL output voltage comparator with im- Y Tight delay matching on both outputs
proved characteristics over the mA760/mA760C, for which it Y Complementary TTL outputs
is a pin-for-pin replacement. The device has been optimized Y High input impedance
for greater speed, input impedance and fan-out, and lower Y Low speed variation with overdrive variation
input offset voltage. Typically delay varies only 3 ns for over- Y Fan-out of 4
drive variations of 5 mV to 400 mV.
Y Low input offset voltage
Complementary outputs having minimum skew are provid- Y Series 74 TTL compatible
ed. Applications involve high speed analog to digital conver-
tors and zero-crossing detectors in disk file systems.

Connection Diagrams
Metal Can Package Dual-In-Line Package

TL/H/5707 – 4
Order Number LM160H/883* or LM360H
See NS Package Number H08C TL/H/5707 – 5
Order Number LM160J/883*,
LM360M or LM360N
See NS Package Number J08A, M08A or N08E

Dual-In-Package

TL/H/5707 – 6
Order Number LM160J-14/883*
See NS Package Number J14A

*Also available in SMDÝ 5962-8767401

C1995 National Semiconductor Corporation TL/H/5707 RRD-B30M115/Printed in U. S. A.

Absolute Maximum Ratings (Note 5)
If Military/Aerospace specified devices are required, Operating Temperature Range
please contact the National Semiconductor Sales LM160 b 55§ C to a 125§ C
Office/Distributors for availability and specifications. LM360 0§ C to a 70§ C
(Note 7) Storage Temperature Range b 65§ C to a 150§ C
Positive Supply Voltage a 8V Lead Temperature (Soldering, 10 sec.) 260§ C
Negative Supply Voltage b 8V Soldering Information
Peak Output Current 20 mA Dual-In-Line Package
Soldering (10 seconds) 260§ C
Differential Input Voltage g 5V
a Small Outline Package
Input Voltage V t VIN t V b
Vapor Phase (60 seconds) 215§ C
ESD Tolerance (Note 8) 1600V Infrared (15 seconds) 220§ C
See AN-450 ‘‘Surface Mounting Methods and Their Effect
on Product Reliability’’ for other methods of soldering sur-
face mount devices.

Electrical Characteristics (TMIN s TA s TMAX)

Parameter Conditions Min Typ Max Units
Operating Conditions
a
Supply Voltage VCC 4.5 5 6.5 V
b
Supply Voltage VCC b 4.5 b5 b 6.5 V
Input Offset Voltage RS s 200X 2 5 mV
Input Offset Current 0.5 3 mA
Input Bias Current 5 20 mA
Output Resistance (Either Output) VOUT e VOH 100 X
Response Time TA e 25§ C, VS e g 5V (Notes 1, 6) 13 25 ns
TA e 25§ C, VS e g 5V (Notes 2, 6) 12 20 ns
TA e 25§ C, VS e g 5V (Notes 3, 6) 14 ns
Response Time Difference between Outputs
(tpd of a VIN1) b (tpd of bVIN2) TA e 25§ C (Notes 1, 6) 2 ns
(tpd of a VIN2) b (tpd of bVIN 1) TA e 25§ C (Notes 1, 6) 2 ns
(tpd of a VIN1) b (tpd of a VIN2) TA e 25§ C (Notes 1, 6) 2 ns
(tpd of bVIN1) b (tpd of bVIN2) TA e 25§ C (Notes 1, 6) 2 ns
Input Resistance f e 1 MHz 17 kX
Input Capacitance f e 1 MHz 3 pF
Average Temperature Coefficient of RS e 50X
8 mV/§ C
Input Offset Voltage
Average Temperature Coefficient of
7 nA/§ C
Input Offset Current
Common Mode Input Voltage Range VS e g 6.5V g4 g 4.5 V
Differential Input Voltage Range g5 V
Output High Voltage (Either Output) IOUT e b320 mA, VS e g 4.5V 2.4 3 V
Output Low Voltage (Either Output) ISINK e 6.4 mA 0.25 0.4 V
Positive Supply Current VS e g 6.5V 18 32 mA
Negative Supply Current VS e g 6.5V b9 b 16 mA
Note 1: Response time measured from the 50% point of a 30 mVp-p 10 MHz sinusoidal input to the 50% point of the output.
Note 2: Response time measured from the 50% point of a 2 Vp-p 10 MHz sinusoidal input to the 50% point of the output.
Note 3: Response time measured from the start of a 100 mV input step with 5 mV overdrive to the time when the output crosses the logic threshold.
Note 4: Typical thermal impedances are as follows:
Cavity DIP (J): ijA 135§ C/W Header (H) ijA 165§ C/W (Still Air)
Molded DIP (N): ijA 130§ C/W 67§ C/W (400 LF/min Air Flow)
ijC 25§ C/W
Note 5: The device may be damaged if used beyond the maximum ratings.
Note 6: Measurements are made in AC Test Circuit, Fanout e 1
Note 7: Refer to RETS 160X for LM160H, LM160J-14 and LM160J military specifications.
Note 8: Human body model, 1.5 kX in series with 100 pF.

2
Typical Performance Characteristics

Input Currents vs Ambient

Offset Voltage Temperature Input Characteristics

Delay of Output 1 With

Supply Current vs Ambient Propagation Delay vs Respect to Output 2 vs
Temperature Ambient Temperature Ambient Temperature

Common-Mode
Pulse Response
AC Test Circuit

VIN e g 50 mV FANOUT e 1 FANOUT e 4

V a e a 5V R e 2.4k R e 630X TL/H/5707 – 3
TL/H/5707 – 2 Vb eb 5V C e 15 pF C e 30 pF

3
Schematic Diagram

TL/H/5707 – 1

4
5
Physical Dimensions inches (millimeters)

Metal Can Package (H)

Order Number LM160H/883 or LM360H
NS Package Number H08C

Dual In-Line Package (J)

Order Number LM160J/883
NS Package Number J08A

6
Physical Dimensions inches (millimeters) (Continued)

Ceramic Dual-In-Line Package (J)

Order Number LM160J-14/883
NS Package Number J14A

Molded Dual-In-Line Package (M)

Order Number LM360M
NS Package Number M08A

7
LM160/LM360 High Speed Differential Comparator
Physical Dimensions inches (millimeters) (Continued)

Molded Dual-In-Line Package (N)

Order Number LM360N
NS Package Number N08E

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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant support device or system whose failure to perform can
into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life
failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.

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