LM5116 Wide Range Synchronous Buck Controller: 1 Features 3 Description
LM5116 Wide Range Synchronous Buck Controller: 1 Features 3 Description
LM5116
SNVS499H – FEBRUARY 2007 – REVISED JULY 2015
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
LM5116 HTSSOP (20) 6.50 mm × 4.40 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Typical Application
VIN
VIN LM5116 VCC
C VCC
CIN RUV2
UVLO HB
VIN
R UV1
CHB
EN HO L
VOUT
CSYNC SW
RT/ SYNC C OUT
LO
RT
CS
RS
COMP CSG
C COMP
DEMB
CHF
R COMP VOUT
FB VCCX R FB2
SS RAMP AGND PGND
C SS C RAMP
RFB1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LM5116
SNVS499H – FEBRUARY 2007 – REVISED JULY 2015 www.ti.com
Table of Contents
1 Features .................................................................. 1 7.4 Device Functional Modes........................................ 19
2 Applications ........................................................... 1 8 Application and Implementation ........................ 21
3 Description ............................................................. 1 8.1 Application Information............................................ 21
4 Revision History..................................................... 2 8.2 Typical Application ................................................. 21
5 Pin Configuration and Functions ......................... 3 9 Power Supply Recommendations...................... 33
6 Specifications......................................................... 4 10 Layout................................................................... 33
6.1 Absolute Maximum Ratings ...................................... 4 10.1 Layout Guidelines ................................................. 33
6.2 ESD Ratings.............................................................. 5 10.2 Layout Example .................................................... 33
6.3 Recommended Operating Conditions....................... 5 11 Device and Documentation Support ................. 34
6.4 Thermal Information .................................................. 5 11.1 Custom Design with WEBENCH Tools................. 34
6.5 Electrical Characteristics........................................... 6 11.2 Receiving Notification of Documentation Updates 34
6.6 Switching Characteristics .......................................... 8 11.3 Device Support...................................................... 34
6.7 Typical Performance Characteristics ........................ 9 11.4 Community Resources.......................................... 34
7 Detailed Description ............................................ 13 11.5 Trademarks ........................................................... 34
7.1 Overview ................................................................. 13 11.6 Electrostatic Discharge Caution ............................ 34
7.2 Functional Block Diagram ....................................... 13 11.7 Glossary ................................................................ 35
7.3 Feature Description................................................. 14 12 Mechanical, Packaging, and Orderable
Information ........................................................... 35
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
• Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1
PWP Package
20-Pin HTSSOP
Top View
VIN 1 20 SW
UVLO 2 19 HO
RT/SYNC 3 18 HB
EN 4 17 VCCX
RAMP 5 16 VCC
TSSOP- 20
AGND 6 15 LO
SS 7 14 PGND
FB 8 13 CSG
EP
COMP 9 12 CS
VOUT 10 11 DEMB
Pin Functions
PIN
I/O (1) DESCRIPTION
NAME NO.
Analog ground.Connect to PGND through the exposed pad ground connection under the
AGND 6 G
LM5116.
Output of the internal error amplifier. The loop compensation network should be connected
COMP 9 O
between this pin and the FB pin.
Current sense amplifier input. Connect to the top of the current sense resistor or the drain of
CS 12 I
the low-sided MOSFET if RDS(ON) current sensing is used.
Current sense amplifier input. Connect to the bottom of the sense resistor or the source of
CSG 13 G
the low-side MOSFET if RDS(ON) current sensing is used.
Low-side MOSFET source voltage monitor for diode emulation. For start-up into a pre-biased
load, tie this pin to ground at the CSG connection. For fully synchronous operation, use an
DEMB 11 I
external series resistor between DEMB and ground to raise the diode emulation threshold
above the low-side SW on-voltage.
If the EN pin is below 0.5 V, the regulator is in a low-power state, drawing less than 10 µA
EN 4 I from VIN. EN must be pulled above 3.3 V for normal operation. The maximum EN transition
time for proper operation is one switching period.
Feedback signal from the regulated output. This pin is connected to the inverting input of the
FB 8 I
internal error amplifier. The regulation threshold is 1.215 V.
High-side driver supply for bootstrap gate drive. Connect to the cathode of the bootstrap
diode and the positive terminal of the bootstrap capacitor. The bootstrap capacitor supplies
HB 18 P
current to charge the high-side MOSFET gate and should be placed as close to the
controller as possible.
Connect to the gate of the high-side synchronous MOSFET through a short, low inductance
HO 19 O
path
Connect to the gate of the low-side synchronous MOSFET through a short, low inductance
LO 15 O
path.
Power ground. Connect to AGND through the exposed pad ground connection under the
PGND 14 G
LM5116
Ramp control signal. An external capacitor connected between this pin and the AGND pin
RAMP 5 I
sets the ramp slope used for current mode control.
The internal oscillator is set with a single resistor between this pin and the AGND pin. The
RT/SYNC 3 I recommended frequency range is 50 kHz to 1 MHz. The internal oscillator can be
synchronized to an external clock by AC coupling a positive edge onto this node.
6 Specifications
6.1 Absolute Maximum Ratings
(1)
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VIN to GND –0.3 100 V
(2)
VCC, VCCX, UVLO to GND –0.3 16 V
SW, CS to GND –3.0 100 V
HB to SW –0.3 16 V
HO to SW –0.3 HB +0.3 V
VOUT to GND –0.3 100 V
CSG to GND –1 1 V
LO to GND –0.3 VCC + 0.3 V
SS to GND –0.3 7 V
FB to GND –0.3 7 V
DEMB to GND –0.3 VCC V
RT to GND –0.3 7 V
EN to GND –0.3 100 V
Junction Temperature 150 °C
Storage Temperature –55 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) These pins must not exceed VIN.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) The human body model is a 100-pF capacitor discharged through a 1.5-kΩ resistor into each pin. 2-kV rating for all pins except VIN
which is rated for 1.5 kV.
(3) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) RAMP, COMP are output pins. As such they are not specified to have an external voltage applied.
(2) Recommended Operating Ratings do not imply performance limits. For specified performance limits and associated test conditions, see
the Electrical Characteristics tables.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
Figure 1. Typical Application Circuit Efficiency Figure 2. Driver Source Current vs VCC
Figure 11. Forced HO Off-time vs Temperature VCCX = 5 V Figure 12. HB DC Bias Current vs Temperature
Figure 15. Frequency vs Temperature Figure 16. Error Amp Phase vs Frequency
Figure 17. Frequency vs Temperature Figure 18. Current Limit Threshold vs Temperature
Figure 19. VIN Operating Current vs Temperature Figure 20. VCC vs Temperature
Figure 23. VCC vs ICC Figure 24. VCCX Switch RDS(ON) vs VCCX
7 Detailed Description
7.1 Overview
The LM5116 high voltage switching regulator features all of the functions necessary to implement an efficient
high voltage buck regulator using a minimum of external components. This easy to use regulator integrates high-
side and low-side MOSFET drivers capable of supplying peak currents of 2 Amps. The regulator control method
is based on current mode control utilizing an emulated current ramp. Emulated peak current mode control
provides inherent line feed-forward, cycle by cycle current limiting and ease of loop compensation. The use of an
emulated control ramp reduces noise sensitivity of the pulse-width modulation circuit, allowing reliable processing
of the very small duty cycles necessary in high input voltage applications. The operating frequency is user
programmable from 50 kHz to 1 MHz. An oscillator/synchronization pin allows the operating frequency to be set
by a single resistor or synchronized to an external clock. Fault protection features include current limiting, thermal
shutdown and remote shutdown capability. An undervoltage lockout input allows regulator shutdown when the
input voltage is below a user selected threshold, and an enable function will put the regulator into an extremely
low current shutdown via the enable input. The HTSSOP-20 package features an exposed pad to aid in thermal
dissipation.
CLK DRIVER
HO 19 Q1
10 μA S Q L1
7 SS ADAPTIVE VOUT
3V TIMER SW 20
R Q
CSS PWM
VCC
1.215 V
1V DRIVER
CURRENT LO 15 Q2 CSNUB
LIMIT COUT
8 FB R SNUB
CS 12
C COMP ERROR TRACK
AMP 1.6 V SAMPLE 10 x RS V/A
CHF and
A =10
RS
R COMP HOLD 0.5 V CSG 13
9 COMP
+ CLK
DIODE SW
EMULATION 11
DEMB
SS CONTROL
VIN VOUT 10
CLK
SYNC C SYNC
3 RT/SYNC
OSCILLATOR R FB2
RAMP GENERATOR
I R = 5 μA / V x ( VIN - VOUT )+25 μA
RT
IR
R FB1
VOUT
SW L
COUT
An output voltage derived bias supply can be applied to the VCCX pin to reduce the IC power dissipation. If the
bias supply voltage is greater than 4.5 V, the internal regulator will essentially shut off, reducing the IC power
dissipation. The VCC regulator series pass transistor includes a diode between VCC and VIN that should not be
forward biased in normal operation. For an output voltage between 5 V and 15 V, VOUT can be connected
directly to VCCX. For VOUT < 5 V, a bias winding on the output inductor can be added to VOUT. If the bias
winding can supply VCCX greater than VIN, an external blocking diode is required from the input power supply to
the VIN pin to prevent VCC from discharging into the input supply.
The output of the VCC regulator is current limited to 15 mA minimum. The VCC current is determined by the
MOSFET gate charge, switching frequency and quiescent current (see MOSFETs). If VCCX is powered by the
output voltage or an inductor winding, the VCC current should be evaluated during startup to ensure that it is less
than the 15 mA minimum current limit specification. If VCCX is powered by an external regulator derived from
VIN, there is no restriction on the VCC current.
VIN
1
VIN
0.1 PF
6
AGND
In high voltage applications extra care should be taken to ensure the VIN pin does not exceed the absolute
maximum voltage rating of 100 V. During line or load transients, voltage ringing on the VIN line that exceeds the
Absolute Maximum Ratings can damage the IC. Both careful PC board layout and the use of quality bypass
capacitors located close to the VIN and GND pins are essential.
3 μA
EN
6V
7.3.3 UVLO
An undervoltage lockout pin is provided to disable the regulator without entering shutdown. If the UVLO pin is
pulled below 1.215 V, the regulator enters a standby mode of operation with the soft-start capacitor discharged
and outputs disabled, but with the VCC regulator running. If the UVLO input is pulled above 1.215 V, the
controller will resume normal operation. A voltage divider from input to ground can be used to set a VIN threshold
to disable the supply in brown-out conditions or for low input faults. The UVLO pin has a 5-µA internal pull up
current that allows this pin to left open if the input undervoltage lockout function is not needed. For applications
which require fast on/off cycling, the UVLO pin with an open collector control signal may be used to ensure
proper start-up sequencing.
The UVLO pin is also used to implement a “hiccup” current limit. If a current limit fault exists for more than 256
consecutive clock cycles, the UVLO pin will be internally pulled down to 200 mV and then released, and a new
SS cycle initiated. A capacitor to ground connected to the UVLO pin will set the timing for hiccup mode current
limit. When this feature is used in conjunction with the voltage divider, a diode across the top resistor may be
used to discharge the capacitor in the event of an input undervoltage condition. There is a 5-µs filter at the input
to the fault comparator. At higher switching frequency (greater than approximately 250 kHz) the hiccup timer may
be disabled if the fault capacitor is not used.
where
• T = 1 / fSW and RT is in ohms (1)
450 ns represents the fixed minimum off time.
tON
(5 μA/V x (VIN-VOUT) + 25 μA) x
CRAMP
RAMP
tON
The sample-and-hold DC level is derived from a measurement of the recirculating current through either the low-
side MOSFET or current sense resistor. The voltage level across the MOSFET or sense resistor is sampled and
held just prior to the onset of the next conduction interval of the buck switch. The current sensing and sample-
and-hold provide the DC level of the reconstructed current signal. The positive slope inductor current ramp is
emulated by an external capacitor connected from the RAMP pin to the AGND and an internal voltage controlled
current source. The ramp current source that emulates the inductor current is a function of the VIN and VOUT
voltages per the following equation:
IR = 5 µA/V x (VIN - VOUT) + 25 µA (2)
where
• gm is the ramp generator transconductance (5 µA/V)
• A is the current sense amplifier gain (10 V/V) (3)
The ramp capacitor should be located very close to the device and connected directly to the pins of the IC
(RAMP and AGND).
The difference between the average inductor current and the DC value of the sampled inductor current can
cause instability for certain operating conditions. This instability is known as sub-harmonic oscillation, which
occurs when the inductor ripple current does not return to its initial value by the start of next switching cycle.
Sub-harmonic oscillation is normally characterized by observing alternating wide and narrow pulses at the switch
node. Adding a fixed slope voltage ramp (slope compensation) to the current sense signal prevents this
oscillation. The 25 µA of offset current provided from the emulated current source adds the optimal slope
compensation to the ramp signal for a 5-V output. For higher output voltages, additional slope compensation may
be required. In these applications, a resistor is added between RAMP and VCC to increase the ramp slope
compensation.
SW
LO
RG
CS
RG
CSG
DEMB
RDEMB
The DC current sample is obtained using the CS and CSG pins connected to either a source sense resistor (RS)
or the RDS(ON) of the low-side MOSFET. For RDS(ON) sensing, RS = RDS(ON) of the low-side MOSFET. In this case
it is sometimes helpful to adjust the current sense amplifier gain (A) to a lower value in order to obtain the
desired current limit. Adding external resistors RG in series with CS and CSG, the current sense amplifier gain A
becomes:
10k
A,
1k + RG (4)
10 k
HO RAMP A=
1 k + RG
CRAMP
Using a current sense resistor in the source of the low-side MOSFET provides superior current limit accuracy
compared to RDS(ON) sensing. RDS(ON) sensing is far less accurate due to the large variation of MOSFET RDS(ON)
with temperature and part-to-part variation. The CS and CSG pins should be Kelvin connected to the current
sense resistor or MOSFET drain and source.
The peak current which triggers the current limit comparator is:
25 PA x tON
1.1V -
CRAMP 1.1V
IPEAK = ,
A x RS A x RS
where
• tON is the on-time of the high-side MOSFET (5)
The 1.1-V threshold is the difference between the 1.6-V reference at the current limit comparator and the 0.5-V
offset at the current sense amplifier. This offset at the current sense amplifier allows the inductor ripple current to
go negative by 0.5 V / (A x RS) when running full synchronous operation.
Current limit hysteresis prevents chatter around the threshold when VCCX is powered from VOUT. When 4.5 V <
VCC < 5.8 V, the 1.6-V reference is increased to 1.72 V. The peak current which triggers the current limit
comparator becomes:
25 PA x tON
1.22V -
CRAMP 1.22V
IPEAK = ,
A x RS A x RS (6)
This has the effect of a 10% fold-back of the peak current during a short circuit when VCCX is powered from a 5-
V output.
7.3.8 HO Ouput
The LM5116 contains a high current, high-side driver and associated high voltage level shift. This gate driver
circuit works in conjunction with an external diode and bootstrap capacitor. A 1-µF ceramic capacitor, connected
with short traces between the HB pin and SW pin, is recommended. During the off-time of the high-side
MOSFET, the SW pin voltage is approximately –0.5 V and the bootstrap capacitor charges from VCC through the
external bootstrap diode. When operating with a high PWM duty cycle, the buck switch will be forced off each
cycle for 450 ns to ensure that the bootstrap capacitor is recharged.
SS
+
-
During this initial charging of CSS to the internal reference voltage, the LM5116 will force diode emulation. That
is, the low-side MOSFET will turn off for the remainder of a cycle if the sensed inductor current becomes
negative. The inductor current is sensed by monitoring the voltage between SW and DEMB. As the SS capacitor
continues to charge beyond 1.215 V to 3 V, the DEMB bias current will increase from 0 µA up to 40 µA. With the
use of an external DEMB resistor (RDEMB), the current sense threshold for diode emulation will increase resulting
in the gradual transition to synchronous operation. Forcing diode emulation during soft-start allows the LM5116
to start up into a pre-biased output without unnecessarily discharging the output capacitor. Full synchronous
operation is obtained if the DEMB pin is always biased to a higher potential than the SW pin when LO is high.
RDEMB = 10 kΩ will bias the DEMB pin to 0.45V minimum, which is adequate for most applications. The DEMB
bias potential should always be kept below 2V. At very light loads with larger values of output inductance and
MOSFET capacitance, the switch voltage may fall slowly. If the SW voltage does not fall below the DEMB
threshold before the end of the HO fall to LO rise dead-time, switching will default to diode emulation mode.
When RDEMB = 0 Ω, the LM5116 will always run in diode emulation.
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
3. WEBENCH Power Designer provides you with a customized schematic along with a list of materials with real
time pricing and component availability.
4. In most cases, you will also be able to:
– Run electrical simulations to see important waveforms and circuit performance,
– Run thermal simulations to understand the thermal performance of your board,
– Export your customized schematic and layout into popular CAD formats,
– Print PDF reports for the design, and share your design with colleagues.
5. Get more information about WEBENCH tools at www.ti.com/webench.
IO IPP
0
1
T=
fSW
Knowing the switching frequency (fSW), maximum ripple current (IPP), maximum input voltage (VIN(MAX)) and the
nominal output voltage (VOUT), the inductor value can be calculated:
VOUT VOUT
L= x 1-
IPP x fSW VIN(MAX) (8)
The maximum ripple current occurs at the maximum input voltage. Typically, IPP is 20% to 40% of the full load
current. When running diode emulation mode, the maximum ripple current should be less than twice the
minimum load current. For full synchronous operation, higher ripple current is acceptable. Higher ripple current
allows for a smaller inductor size, but places more of a burden on the output capacitor to smooth the ripple
current for low output ripple voltage. For this example, 40% ripple current was chosen for a smaller sized
inductor.
5V 5V
L= x 1- = 6.5 PH
0.4 x 7A x 250kHz 60V (9)
The nearest standard value of 6 µH will be used. The inductor must be rated for the peak current to prevent
saturation. During normal operation, the peak current occurs at maximum load current plus maximum ripple.
During overload conditions with properly scaled component values, the peak current is limited to VCS(TH) / RS
(See Current Sense Resistor). At the maximum input voltage with a shorted output, the valley current must fall
below VCS(TH) / RS before the high-side MOSFET is allowed to turn on. The peak current in steady state will
increase to VIN(MAX) x tON(min) / L above this level. The chosen inductor must be evaluated for this condition,
especially at elevated temperature where the saturation current rating may drop significantly.
'VOUT = IPP x
€ ESR2 +
1
8 x fSW x COUT
2
(15)
With typical values for the 5-V design example:
24 Submit Documentation Feedback Copyright © 2007–2015, Texas Instruments Incorporated
2
1
'VOUT = 3A x 0.4 m:2 +
8 x 250 kHz x 320 PF
where
• RIN is the input wiring resistance
• ESR is the series resistance of the input capacitors (20)
The term ZS / ZIN will always be negative due to ZIN.
When δ = 1, the input filter is critically damped. This may be difficult to achieve with practical component values.
With δ < 0.2, the input filter will exhibit significant ringing. If δ is zero or negative, there is not enough resistance
in the circuit and the input filter will sustain an oscillation. When operating near the minimum input voltage, an
aluminum electrolytic capacitor across CIN may be needed to damp the input for a typical bench test setup. Any
parallel capacitor should be evaluated for its RMS current rating. The current will split between the ceramic and
aluminum capacitors based on the relative impedance at the switching frequency.
where
• Qg is the high-side MOSFET gate charge
• ΔVHB is the tolerable voltage droop on CHB (21)
CHB is typically less than 5% of VCC. A value of 1 µF was selected for this design.
If undervoltage shutdown is not required, RUV1 and RUV2 can be eliminated and the off-time becomes:
1.215V
tOFF = CFT x
5 PA (25)
The voltage at the UVLO pin should never exceed 16 V when using an external set-point divider. It may be
necessary to clamp the UVLO pin at high input voltages. For the design example, RUV2 = 102 kΩ and RUV1 = 21
kΩ for a shut-down voltage of 6.6 V. If sustained short circuit protection is required, CFT ≥ 1 µF will limit the short
circuit power dissipation. D2 may be installed when using CFT with RUV1 and RUV2.
8.2.2.13 MOSFETs
Selection of the power MOSFETs is governed by the same tradeoffs as switching frequency. Breaking down the
losses in the high-side and low-side MOSFETs is one way to determine relative efficiencies between different
devices. When using discrete SO-8 MOSFETs the LM5116 is most efficient for output currents of 2A to 10A.
Losses in the power MOSFETs can be broken down into conduction loss, gate charging loss, and switching loss.
Conduction, or I2R loss PDC, is approximately:
PDC(HO-MOSFET) = D x (IO2 x RDS(ON) x 1.3) (26)
PDC(LO-MOSFET) = (1 - D) x (IO2 x RDS(ON) x 1.3) (27)
Where D is the duty cycle. The factor 1.3 accounts for the increase in MOSFET on-resistance due to heating.
Alternatively, the factor of 1.3 can be ignored and the on-resistance of the MOSFET can be estimated using the
RDS(ON) vs Temperature curves in the MOSFET datasheet. Gate charging loss, PGC, results from the current
driving the gate capacitance of the power MOSFETs and is approximated as:
PGC = n x VCC x Qg x fSW (28)
Qg refer to the total gate charge of an individual MOSFET, and ‘n’ is the number of MOSFETs. If different types
of MOSFETs are used, the ‘n’ term can be ignored and their gate charges summed to form a cumulative Qg.
Gate charge loss differs from conduction and switching losses in that the actual dissipation occurs in the LM5116
and not in the MOSFET itself. Further loss in the LM5116 is incurred as the gate driving current is supplied by
the internal linear regulator. The gate drive current supplied by the VCC regulator is calculated as:
IGC =(Qgh + Qgl) x fSW
where
• Qgh + Qgl represent the gate charge of the HO and LO MOSFETs at VGS = VCC (29)
To ensure start-up, IGC should be less than the VCC current limit rating of 15 mA minimum when powered by the
internal 7.4-V regulator. Failure to observe this rating may result in excessive MOSFET heating and potential
damage. The IGC run current may exceed 15 mA when VCC is powered by VCCX.
PSW = 0.5 x VIN x IO x (tR + tF) x fSW
where
• tR and tF are the rise and fall times of the MOSFET (30)
Switching loss is calculated for the high-side MOSFET only. Switching loss in the low-side MOSFET is negligible
because the body diode of the low-side MOSFET turns on before the MOSFET itself, minimizing the voltage from
drain to source before turnon. For this example, the maximum drain-to-source voltage applied to either MOSFET
is 60 V. VCC provides the drive voltage at the gate of the MOSFETs. The selected MOSFETs must be able to
withstand 60 V plus any ringing from drain to source, and be able to handle at least VCC plus ringing from gate
to source. A good choice of MOSFET for the 60-V input design example is the Si7850DP. It has an RDS(ON) of 20
mΩ, total gate charge of 14 nC, and rise and fall times of 10 ns and 12 ns, respectively. In applications where a
high step-down ratio is maintained for normal operation, efficiency may be optimized by choosing a high-side
MOSFET with lower Qg, and low-side MOSFET with lower RDS(ON).
For higher voltage MOSFETs which are not true logic level, it is important to use the UVLO feature. Choose a
minimum operating voltage which is high enough for VCC and the bootstrap (HB) supply to fully enhance the
MOSFET gates. This will prevent operation in the linear region during power-on or power-off which can result in
MOSFET failure. Similar consideration must be made when powering VCCX from the output voltage. For the
high-side MOSFET, the gate threshold should be considered and careful evaluation made if the gate threshold
voltage exceeds the HO driver UVLO.
Components RCOMP and CCOMP configure the error amplifier as a type II configuration. The DC gain of the
amplifier is 80 dB which has a pole at low frequency and a zero at fZEA = 1 / (2π x RCOMP x CCOMP). The error
amplifier zero cancels the modulator pole leaving a single pole response at the crossover frequency of the
voltage loop. A single pole response at the crossover frequency yields a very stable loop with 90° of phase
margin. For the design example, a target loop bandwidth (crossover frequency) of one-tenth the switching
frequency or 25 kHz was selected. The compensation network zero (fZEA) should be selected at least an order of
magnitude less than the target crossover frequency. This constrains the product of RCOMP and CCOMP for a
desired compensation network zero 1 / (2π x RCOMP x CCOMP) to be 2.5 kHz. Increasing RCOMP, while
proportionally decreasing CCOMP, increases the error amp gain. Conversely, decreasing RCOMP while
proportionally increasing CCOMP, decreases the error amp gain. For the design example CCOMP was selected as
3300 pF and RCOMP was selected as 18 kΩ. These values configure the compensation network zero at 2.7 kHz.
The error amp gain at frequencies greater than fZEA is: RCOMP / RFB2, which is approximately 4.8 (13.6 dB).
The overall voltage loop gain can be predicted as the sum (in dB) of the modulator gain and the error amp gain.
If a network analyzer is available, the modulator gain can be measured and the error amplifier gain can be
configured for the desired loop transfer function. If a network analyzer is not available, the error amplifier
compensation components can be designed with the guidelines given. Step load transient tests can be
performed to verify acceptable performance. The step load goal is minimum overshoot with a damped response.
CHF can be added to the compensation network to decrease noise susceptibility of the error amplifier. The value
of CHF must be sufficiently small since the addition of this capacitor adds a pole in the error amplifier transfer
function. This pole must be well beyond the loop crossover frequency. A good approximation of the location of
the pole added by CHF is: fP2 = fZEA x CCOMP / CHF. The value of CHF was selected as 100 pF for the design
example.
gm x L 5 - VOUT
CRAMP = x 1+
A x RS VIN(MAX)
(34)
General Method for 5 V < VOUT < 7.5 V:
VCS(TH)
RS =
VOUT x T VOUT VOUT x T
IOUT - x 1- +
2xL VIN(MIN) L (35)
gm x L 5 - VOUT
CRAMP = x 1+
A x RS VIN(MIN)
(36)
Best Performance Method:
This minimizes the current limit deviation due to changes in line voltage, while maintaining near optimal slope
compensation.
Calculate optimal slope current, IOS = (VOUT / 3) x 10 µA/V. For example, at VOUT = 7.5 V, IOS = 25 µA.
VCS(TH) IOS x L
RS = CRAMP =
VOUT x T VOUT x A x RS
IOUT +
L
(37)
Calculate VRAMP at the nominal input voltage.
VOUT ((VIN ± VOUT) x gm + IOS) x T
VRAMP = x
VIN CRAMP
(38)
For VOUT > 7.5 V, install a resistor from the RAMP pin to VCC.
VCC - VRAMP
RRAMP =
IOS - 25 PA
(39)
VCC
RRAMP
RAMP
CRAMP
For VOUT < 7.5 V, a negative VCC is required. This can be made with a simple charge pump from the LO gate
output. Install a resistor from the RAMP pin to the negative VCC.
VCC ± 0.5V + VRAMP
RRAMP =
25 PA - IOS
(40)
LO
10 nF 1N914
RRAMP 10 nF
RAMP
-VCC
CRAMP
If a large variation is expected in VCC, say for VIN < 11 V, a Zener regulator may be added to supply a constant
voltage for RRAMP.
(CHF + CCOMP)
ZHF =
CHF x CCOMP x RCOMP
(48)
Where AOL = 10,000 (80 dB) and ωBW = 2π x fBW. GEA(S) is the ideal error amplifier gain, which is modified at DC
and high frequency by the open loop gain of the amplifier and the feedback divider ratio.
Figure 40. Efficiency With 6-µH Copper Inductor Figure 41. Short Circuit Recovery Into Resistive Load With
C7 = 1 µF and D2 Installed
10 Layout
Controller
Place controller as QL
close to the switches
Inductor
QH
RSENSE
CIN COUT
CIN COUT
11.5 Trademarks
E2E is a trademark of Texas Instruments.
WEBENCH is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.6 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 6-Feb-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
LM5116MH NRND HTSSOP PWP 20 73 TBD Call TI Call TI -40 to 150 LM5116
MH
LM5116MH/NOPB ACTIVE HTSSOP PWP 20 73 Green (RoHS Call TI | SN Level-1-260C-UNLIM -40 to 150 LM5116
& no Sb/Br) MH
LM5116MHX NRND HTSSOP PWP 20 2500 TBD Call TI Call TI -40 to 150 LM5116
MH
LM5116MHX/NOPB ACTIVE HTSSOP PWP 20 2500 Green (RoHS Call TI | SN Level-1-260C-UNLIM -40 to 150 LM5116
& no Sb/Br) MH
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 6-Feb-2020
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 29-Sep-2019
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 29-Sep-2019
Pack Materials-Page 2
MECHANICAL DATA
PWP0020A
MXA20A (Rev C)
www.ti.com
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