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EC 361 DSD Syllabus

This document provides information about the Digital System Design course offered at ktuweb.com, including the course code, name, credits, year of introduction, prerequisites, objectives, syllabus, outcomes, textbooks, references, course plan, and exam pattern. The 3-credit, junior-level course aims to teach students to analyze, design, and diagnose digital circuits including clocked synchronous networks, asynchronous sequential circuits, hazards, programmable logic arrays, and field programmable gate arrays. The course is divided into 6 modules covering these topics and is assessed through internal and semester exams with questions testing both theoretical and practical concepts.

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0% found this document useful (0 votes)
177 views2 pages

EC 361 DSD Syllabus

This document provides information about the Digital System Design course offered at ktuweb.com, including the course code, name, credits, year of introduction, prerequisites, objectives, syllabus, outcomes, textbooks, references, course plan, and exam pattern. The 3-credit, junior-level course aims to teach students to analyze, design, and diagnose digital circuits including clocked synchronous networks, asynchronous sequential circuits, hazards, programmable logic arrays, and field programmable gate arrays. The course is divided into 6 modules covering these topics and is assessed through internal and semester exams with questions testing both theoretical and practical concepts.

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Bilga
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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com

COURSE YEAR OF
CODE COURSE NAME L-T-P-C INTRODUCTION
EC 361 DIGITAL SYSTEM DESIGN 3-0-0-3 2015
Prerequisite: EC207 Logic Circuit Design
Course objectives:
The purpose of this course is:
5. To study synthesis and design of CSSN
6. To study synthesis and design of ASC
7. To study hazards and design hazard free circuits
8. To study PLA folding
9. To study architecture of one CPLDs and FPGA family
Syllabus:
Clocked synchronous networks, asynchronous sequential circuits, Hazards, Faults, PLA,
CPLDs and FPGA
Expected outcome:
The student should able:
1. To analyze and design clocked synchronous sequential circuits
2. To analyze and design asynchronous sequential circuits
3. To apply their knowledge in diagnosing faults in digital circuits, PLA
4. To interpret architecture of CPLDs and FPGA
Text Books:
1. Donald G Givone, Digital Principles & Design, Tata McGraw Hill, 2003
2. John M Yarbrough, Digital Logic Applications and Design, Thomson Learning
3. John F Wakerly, Digital Design, Pearson Education, Delhi 2002
References:
1. Richard E. Haskell, Darrin M. Hanna , Introduction to Digital Design Using Digilent
FPGA Boards, LBE Books- LLC
2. N. N. Biswas, Logic Design Theory, PHI
3. Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman, Digital Systems Testing
and Testable Design, John Wiley & Sons Inc.
4. Z. Kohavi, Switching and Finite Automata Theory, 2nd ed., 2001, TMH
5. Morris Mano, M.D.Ciletti, Digital Design, 5th Edition, PHI.
6. Samuel C. Lee, Digital Circuits and Logic Design, PHI
Course Plan
Module Course content Sem. Exam
Hours
Marks
Analysis of clocked Synchronous Sequential
2
Networks(CSSN)
Modelling of CSSN – State assignment and reduction 1
Design of CSSN 2 15
I
Iterative circuits 1
ASM Chart and its realization 2
Analysis of Asynchronous Sequential Circuits (ASC) 2
Flow table reduction- Races in ASC 1
II State assignment problem and the transition table- 15
2
Design of AS
Design of Vending Machine controller. 2
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FIRST INTERNAL EXAM


Hazards – static and dynamic hazards – essential 1
Design of Hazard free circuits – Data synchronizers 1
III Mixed operating mode asynchronous circuits 1 15
Practical issues- clock skew and jitter 1
Synchronous and asynchronous inputs – switch bouncing 2
Fault table method – path sensitization method – Boolean
2
difference method
IV Kohavi algorithm 2 15
Automatic test pattern generation – Built in Self
3
Test(BIST)
SECOND INTERNAL EXAM
PLA Minimization - PLA folding 2
Foldable compatibility Matrix- Practical PLA 2
V 20
Fault model in PLA 1
Test generation and Testable PLA Design. 3
CPLDs and FPGAs - Xilinx XC 9500 CPLD family,
functional block diagram– input output block 3
architecture - switch matrix
VI 20
FPGAs – Xilinx XC 4000 FPGA family – configurable
logic block - input output block, Programmable 3
interconnect
END SEMESTER EXAM

Question Paper Pattern


The question paper consists of three parts. Part A covers modules I and II, Part B covers
modules III and IV and Part C covers modules V and VI. Each part has three questions. Each
question has a maximum of four subparts. Among the three questions one will be a
compulsory question covering both the modules and the remaining two questions will be as
one question from each module, of which one is to be answered. Mark pattern is according to
the syllabus with 50 % for theory, derivation, proof and 50% for logical/numerical problems.

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