Silicon Diffused Power Transistor BU4530AL: General Description
Silicon Diffused Power Transistor BU4530AL: General Description
GENERAL DESCRIPTION
Enhanced performance, new generation, high-voltage, high-speed switching npn transistor in a plastic envelope
intended for use in horizontal deflection circuits of colour television receivers and p.c monitors. Features exceptional
tolerance to base drive and collector current load variations resulting in a very low worst case dissipation.
heat collector
sink 1 2 3 e
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCESM Collector-emitter voltage peak value VBE = 0 V - 1500 V
VCEO Collector-emitter voltage (open base) - 800 V
IC Collector current (DC) - 16 A
ICM Collector current peak value - 40 A
IB Base current (DC) - 10 A
IBM Base current peak value - 15 A
Ptot Total power dissipation Tmb ≤ 25 ˚C - 125 W
Tstg Storage temperature -55 150 ˚C
Tj Junction temperature - 150 ˚C
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
Rth j-mb Junction to mounting base - - 1.0 K/W
Rth j-a Junction to ambient in free air 35 - K/W
STATIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
1
ICES Collector cut-off current VBE = 0 V; VCE = VCESMmax - - 1.0 mA
ICES VBE = 0 V; VCE = VCESMmax; - - 2.0 mA
Tj = 125 ˚C
BVEBO Base-emitter breakdown voltage IB = 1 mA 7.5 12.8 - V
VCEOsust Collector-emitter breakdown voltage IB = 0 A;IC = 100 mA; 800 V
L = 25 mH
VCEsat Collector-emitter saturation voltage IC = 10 A; IB = 2.22 A - - 3.0 V
VBEsat Base-emitter saturation voltage IC = 10 A; IB = 2.22 A 0.83 0.92 1.01 V
hFE DC current gain IC = 1 A; VCE = 5 V - 12 -
hFE IC = 10 A; VCE = 5 V 4.8 6.6 8.5
DYNAMIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
Switching times (32 kHz line ICsat = 9.0 A; IB1 = 1.8 A; (IB2 = -4.5 A)
deflection dynamic test circuit).
ts Turn-off storage time 3.0 4.0 µs
tf Turn-off fall time 0.20 0.26 µs
Switching times (90 kHz line ICsat = 8 A;IB1 = 1.6 A; (IB2 = -4.0 A)
deflection dynamic test circuit).
ts Turn-off storage time 2 - µs
tf Turn-off fall time 0.12 - µs
IC / mA
+ 50v
100-200R
250
Horizontal 200
Oscilloscope
Vertical 100
100R 1R
0
6V VCE / V min
30-60 Hz
VCEOsust
Fig.1. Test circuit for VCEOsust. Fig.2. Oscilloscope display for VCEOsust.
IB IBend
10
t
10us 13us
32us
VCE
1
t 0.01 0.1 1 10 IC / A 100
Fig.3. Switching times waveforms. Fig.6. High and low DC current gain.
ICsat hFE
100
90 %
VCE = 5V
- - -Tj = 85 C
Tj = 25 C
IC
10 %
10
tf t
ts
IB
IB1
1
- IB2 0.01 0.1 1 10 IC / A 100
Fig.4. Switching times definitions. Fig.7. High and low DC current gain.
0.9
Lc
IC = 8 A
0.8
IBend LB T.U.T.
Cfb 0.7
-VBB
0.6
0 1 2 3 IB / A 4
Fig.5. Switching times test circuit. Fig.8. Typical base-emitter saturation voltage.
VCEsat / V
10 Zth / (K/W) BU4530AL
10
- - -Tj = 85 C
Tj = 25 C
1
1 0.5
0.2
0.1 0.1
0.05
IC / IB = 5
0.1 0.02
tp t
0.01 P
D D= p
T
t
T
0.001
0.01 1E-07 1E-05 1E-03 1E-01 1E+01
0.1 1 10 IC / A 100 t/s
Fig.9. Typical collector-emitter saturation voltage. Fig.12. Transient thermal impedance.
VCEsat = f (IC); parameter IC/IB
8 8
6 6
4 4
2
2
0
0 0 20 40 60 80 100
0 0.5 1 1.5 2 2.5 3
IB / A frequency (kHz)
Fig.10. Typical collector storage and fall time. Fig.13. ICsat during normal running vs. frequency of
IC =9 A; Tj = 85˚C; f = 32kHz operation for optimum performance
MECHANICAL DATA
Dimensions in mm
20.5 max 5.3 max
Net Mass: 9 g
3.1 3.0
3.53
4.06
6.17 3.0
4.06
25.5
2.99
26.5 2.09 8.53
1.92
22.53 3.13
3.23
22.63 seating
plane
2.39
2.45
19.5 18.16
min 3.5 max
0.8
1.35
0.4 M 1.0 max
3.0 max
5.45 5.45
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1999
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