Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
Tomek Kowalewski
Department of Chemistry
Justin Legleiter
Brian Cusick
Matthew Park
Funding:
NSF: CTS-0304568, DMR-9974457
E = 109 Pa
E = 108 Pa
E = 107 Pa
Plotting tapping force vs. cantilever deflection reveals that each tapping
event resembles closely the contact mode force curve.
The slope of these “mini force curves” depends in a familiar way on teh
sample stiffness and dictates the width of the tapping pulse
Towards direct reconstruction of tip-sample force from
cantilever trajectory
Scanning Probe Acceleration Microscopy
Cantilever
acceleration
1
z=
&& [ Ftip − sample − bz& − kz + k ( Do − a0 sin(2π f op t ))]
meff
These terms vary as exp( i ωop t)
Tapping
force pulse
⎡ N
⎤
yrec (t ) = ℑ ⎢ y (ω )∑ δ (ω − kωoper ) ⎥
−1
⎣ k =1 ⎦
mω o
Q=
b
Ao
Q=
ao
y = z − D0 + a0 sin(ω t )
Appl.Phys.Lett., (2005), 87, 163120/1-163120/3
Fluid Tapping Force-Curve
Experiment Simulation
⎡ N
⎤
yrec (t ) = ℑ ⎢ y (ω )∑ δ (ω − kωoper ) ⎥
−1
⎣ k =1 ⎦
Sliding window Fourier transform