Signal Integrity Measurements and

Network Analysis
Mike Resso
Keysight Technologies
Signal Integrity Applications Scientist

O.J. Danzy
Keysight Technologies
Senior Application Engineer
Company Profile 1
 Theory Practical
Typical PCB
Overview Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
2
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
3
Components

Router

Modules
Copper

Line Cards

Network Elements &

Systems Trunk Fiber

4
 Keysight Classic Ixia Anite

COMPONENTS & DEVICES BASE STATIONS HYPERSCALE AND ENTERPRISE

CHIPSETS DATA CENTERS

Management
Experience
Customer
Layers BTS Drive Mobile Network Network Test, Visibility and Security
2-7 Mobile Drive Test Test
Device Test
Test

Layer 1 Electrical, Optical and Wireless Test

Channel Emulation

Company Profile 5
 Keysight Classic Ixia Anite

Our
Focus
Today COMPONENTS & DEVICES BASE STATIONS HYPERSCALE AND ENTERPRISE
CHIPSETS DATA CENTERS

Management
Experience
Customer
Layers BTS Drive Mobile Network Network Test, Visibility and Security
2-7 Mobile Drive Test Test
Device Test
Test

Layer 1 Electrical, Optical and Wireless Test

Channel Emulation

Company Profile 6
 Keysight Classic Ixia Anite

Our
Focus
Today COMPONENTS & DEVICES BASE STATIONS HYPERSCALE AND ENTERPRISE
CHIPSETS DATA CENTERS

Management
Experience
Customer
Layers BTS Drive Mobile Network Network Test, Visibility and Security
2-7 Mobile Drive Test Test
Device Test
Test

Layer 1 Electrical, Optical and Wireless Test

Channel Emulation

Layer 0

“Linear Passive Interconnect” Company Profile 7

 Connectors

Backplanes

PC Boards IC Packages
Cables

8
Page 8
9
 Risetimes get faster

Via stub
reflections get
larger

Frequency domain data is now required

10
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
11
R L R L R L R L R L R L R
G C G C G C G C G C G C
V (w, x ) = V0 exp(- Gx )exp(iwt )

G = a + ib = (RL + iwLL )(GL + iwCL )

(RL + iwLL )
Z0 =
(GL + iwCL )
RL, GL may vary with frequency

CL, LL are the high frequency limit values

12
• Two traces carrying complementary data are used for higher data rates
• Why?
• Receiver can reject any signal that is common to both lines
• Radiation reduced (cancellation of fields)
• Impedance measurements have slightly different meaning compared to single-ended
measurements

13
 I1 I2
x x

V1 V2

V1 = Z11I1 + Z12I 2 Example of Z-parameter matrix or

Characteristic Impedance Matrix [ohms]:
V2 = Z 22I 2 + Z 21I1 1 2
1 49.6 6.4 Coupling Factor (6.4 ohms)
2 6.4 49.6 Self Impedance (49.6 ohms)
14
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
15
Incident
Transmitted

Reflected
Lightwave

DUT

RF

16
 Incident Transmitted
R
B
Reflected
A

REFLECTION TRANSMISSION

Reflected A Transmitted B
= =
Incident R Incident R

VSWR Return Loss Group Delay

Gain / Loss
S-Parameters Impedance, Insertion
S11, S22 Reflection Admittance S-Parameters Phase
Coefficient R+jX, G+jB S21, S12 Transmission
Coefficient
G, r
T,t

17
 Port 1 Port 2
Port 3 Port 4
Four-port single-ended device

Return Loss or TDR

Insertion Loss or TDT
Near End Crosstalk (NEXT)
Far End Crosstalk (FEXT)

Frequency Domain Parameters Time Domain Parameters

FFT or IFFT
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 Balanced
Single-ended
Balanced Balanced
Port 1 Port 2 port 1 port 2
Port 3 Port 4

Differential- Common-Mode
Mode Stimulus Stimulus
Stimulus
Port 1 Port 2 Port 1 Port 2

Differential-

Response
S11 S12 S13 S14 Port 1 SDD11 SDD12 SDC11 S DC12
Response

Mode
S 21 S 22 S 23 S 24 Port 2 SDD21 SDD22 SDC21 S DC22
S31 S32 S 33 S34 Port 1 SCD11 SCD12 SCC11 S CC12

Response
Common-
S 41 S 42 S 43 S 44

Mode
Port 2 SCD21 SCD22 SCC21 SCC22
Naming Convention:
Smode res., mode stim., port res., port stim.
19
20
 Differential
Return Loss of
standard via

Differential
Return Loss of
microvia

Differential
Insertion Loss of
microvia

Differential
Insertion Loss of
standard via

21
Time Domain Reflectometer (TDR) Vector Network Analyzer (VNA)
22
 Frequency
Device Range
Repeatability Normalization
Length
Reciprocity
Accuracy SOLT

Voltage & Calibration Risetime

Device Temp Drift
Complexity

Time Base Instrument

Architectures Noise Floor
Number Signal-to-Noise
of Points Ratio
Source Rcvr
Error Dynamic
Time Step IF BW
Range Filter
BW
Roll-off
Source Drift Source
Averaging
Stability

23 23
 Device Under Test

TDR – Time Domain

t0 t1=delay

Device Under Test

VNA – Frequency Domain

tm tm= phase offset
deg nsec
Phase
Df=2pf*time delay Group delay = df/df = time delay
Group Delay
Frequency

24 24
 Incident wave Transmitted wave TDT
t
DUT
TDR

Incident wave Transmitted wave S21

CH1 S
11
log MAG 10 dB/ REF 0 dB

1.452 378 096 GHz

1 _:-2.145 dB
t DUT CH2 S 21 l og MAG 10 dB/ REF 0 dB 1 _: - 3. 089 dB

1. 017 462 619 GHz

C2
MARKER 1

1.452378096 GHz
S11 MARKER 1
1. 017462619 GHz

START 0. 099 751 243 GHz STOP 20. 049 999 843 GHz

START 0.099 751 243 GHz STOP 20.049 999 843 GHz

25 25
 2 Sources (Step Generators), 2 Samplers, and 2 ADCs

Trigger Trigger
ADC ADC
Channel 1 Channel 2
DUT

Clock Step Device Front Samplers

Trigger Generators Reference Panel & ADCs
Planes
TDR TDT

26 26
 RF
Source

a0 a3
IF IF
Reflected Signal Transmitted Signal
S11 = b0/a0 S21 = b3/a0
LO
Source
IF IF
b0 b3
Port - 1 Port - 2
a1 b2
Cable Cable
DUT
b1 a2

27 27
Dynamic Range = MaxSignal-
Noise Floor.
Approx.
TDR
VNA
VNA with wider Dynamic Range Dynamic
Dynamic
allows measuring signals that are Range
Range
40 - 80dB down. (Today 120 dB is
more typical for 4 ports.)
TDR Noise Floor

VNA Noise Floor

28 28
▪ Random Errors: Instrument Noise, Switch Repeatability, and connector repeatability
▪ Systematic Sources of Error
o Directivity & Crosstalk errors relating to signal leakage
o Source & Load Impedance mismatches relating to reflections
o Frequency Response errors caused by reflection & transmission tracking issues within receivers

a0 b0 b3
6 Forward & 6 Reverse Error Terms Crosstalk
12 Terms total for 2 Port Device &
48 Terms for a 4 port Device
Directivity
DUT
Reflection Tracking (b0 / a0)
Transmission Tracking (b3/ a0) Source Match Load Match

29 29
 a0 b0
a0 Error a1
DUT
b0 Adapter b1
Perfect
Reflectometer 3 Error Terms

DUT
Port - 1
a1
a0 e00 = Directivity
1
e00 e11 G e11 = Port Match

e10e01 (e10e01) = Tracking

b0
b1

30 30
 FORWARD MODEL

e30
DUT
Port - 1 a1 b2 Port - 2
a0 b3
1 S21 e10e32
e00 e11 S11 S22 e22
e10e01 S12
b0
b1 a2

e00 = Directivity
b0 S11 - e22 DS
e11 = Port-1 Match S11M = = e00 + (e10e01)
a0 1 - e11S11 - e22S22 + e11e22 DS
(e10e01) = Reflection Tracking
b3 S21
(e10e32) = Transmission Tracking S21M = = e30 + (e10e32)
a0 1 - e11S11 - e22S22 + e11e22 DS
e22 = Port-2 Match
e30 = Leakage
DS = S11S22 - S21S12

31 31
32
• Using Reciprocity to Check Measurement Credibility
• Reciprocity with a TDR & VNA
• Repeatability with a TDR & VNA
• Summary of Calibration & Measurement Accuracy

33 33
• Reciprocity is the constraint that for passive devices S12 = S21.
• In VNA measurements S12 virtually overlays S21 when a Thru path is
measured. For TDR measurements the alignment is not as good.
• Be aware when exporting data that some tools may require a certain level of
reciprocity (eg. IConnect, HSPICE).

Reciprocity on a Thru Adapter SE Measurement

to Port 1 to Port 3
S13(Mag) = S31(Mag); S13(Phase) = S31(Phase)

to Port 2 to Port 4
S24(Mag) = S42(Mag); S24(Phase) =
S42(Phase)
34 34
S12/S21

VNA Reciprocity:
+/- 2 deg Phase
+/- 0.25 dB Magnitude

35 35
 2 VNA measurements also 5 days apart

Magnitude Repeatability
Phase Repeatability
Difference

Excellent across entire range

Excellent across entire range

VNA Repeatability:
+/- 2 deg Phase
+/- 0.5 dB Magnitude 36 36
• Millimeter Wave Vector Network Analyzer (VNA)
• 900Hz 120GHz frequency sweep
• 6-picosecond effective TDR risetime
• less than 400 microns to be resolved in high-
performance BGA (ball grid array) ceramic IC
packages

37
 New MATLAB / Python compatibility
Software
You don’t need to know
how to operate a VNA - Data
the PLTS software controls The power of PLTS is in the completeness and
all instrument hardware accuracy of the data. Both time and frequency
via GPIB or LAN. The domain information allows unique insight into
measurement algorithms, device performance. With just one measurement,
user interface and data the design engineer can view any combination of
manipulation code is single-ended, differential, Time Domain Reflection
resident on the external (TDR), Time Domain Transmission (TDT), return
computer. loss, and insertion loss data in a variety of
graphical formats. Perhaps the most ground
breaking capability is mixed mode analysis where
Electronic mode conversion can highlight hardware that is
susceptible to EMI or radiating radio frequency.
Calibration Module
Calibrating a multiport VNA can
be a daunting experience with
traditional mechanical
calibration kits. This is why
Keysight developed the Ecal to Vector Network Analyzer
make calibration and accurate The VNA is known to have the most
s-parameter measurements a accurate calibration standards of any
quick and easy process. test and measurement
instrumentation. Keysight VNA’s
enable PLTS to acquire data with
unparalleled precision.

38
NRZ @ 3.125 Gbps PAM4 @ 3.125 Gbps

NRZ @ 6.25 Gbps

PAM4 @ 6.25 Gbps

39
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
40
 3 4
1. Excess capacitance in 2
through hole
5
2. Localized crosstalk
3. Localized changes in
conductor width
4. Localized changes in
conductor spacing
5. Reflections due to via stub
6. Nonuniform dielectric
7. Surface treatment thickness
nonuniformity 1
8. Localized changes in foil 6
thickness
9. Anodic conductive filament
(ACF) shorting
7

8
9

41
41
42
 High Precision
Molded
Components

Differential
Signal Traces

Surface Mount Terminals

Double sided shield

43
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
44
XAUI – eXtended Attachment Unit Interface

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Company Profile 52
 How many tools do we need?

When do we hit saturation?

How can we simplify?

One possible solution…

tool integration

53
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•Free 400G Poster www.keysight.com search “400G poster”

•PLTS Website: www.keysight.com/find/plts

•Configuration Guide
•Application Notes Library
•Video Tutorials
•Quick Quote
•DesignCon Papers and Technical Forum Video

•Free Signal Integrity Book: www.keysight.com/find/RessoBook

•Check out the Keysight YouTube channel

54
 Theory Practical
Typical PCB
Overview • Brief history Issues • Vias, reflections, loss
• Internet infrastructure • De-embedding

Transmission Real World

Lines • Differential impedance Measurements
• Multi-port S-parameters • Backplane Design Case Study

Measurement Demonstration
Metrics • Single-ended vs. differential • Physical Layer Test System (PLTS)
• Eye diagrams (NRZ, PAM4), • USB 3.0 compliance example
55