User’s Guide

Agilent Technologies
8753ES Option 011
Network Analyzer

Part Number: 08753-90479

Printed in USA
June 2002
Supersedes: February 2001

© Copyright 1999–2002 Agilent Technologies, Inc.

Notice
The information contained in this document is subject to change without notice.

Agilent Technologies makes no warranty of any kind with regard to this material,
including but not limited to, the implied warranties of merchantability and fitness for a
particular purpose. Agilent Technologies shall not be liable for errors contained herein or
for incidental or consequential damages in connection with the furnishing, performance, or
use of this material.

Certification
Agilent Technologies certifies that this product met its published specifications at the time
of shipment from the factory. Agilent Technologies further certifies that its calibration
measurements are traceable to the United States National Institute of Standards and
Technology, to the extent allowed by the Institute’s calibration facility, and to the
calibration facilities of other International Standards Organization members.

Regulatory Information
The regulatory information is located in Chapter 8 , “Safety and Regulatory Information.”
Warranty
THE MATERIAL CONTAINED IN THIS DOCUMENT IS PROVIDED “AS IS,” AND IS SUBJECT TO BEING
CHANGED, WITHOUT NOTICE, IN FUTURE EDITIONS. FURTHER, TO THE MAXIMUM EXTENT
PERMITTED BY APPLICABLE LAW, AGILENT DISCLAIMS ALL WARRANTIES, EITHER EXPRESS OR
IMPLIED WITH REGARD TO THIS MANUAL AND ANY INFORMATION CONTAINED HEREIN,
INCLUDING BUT NOT LIMITED TO THE IMPLIED WARRANTIES OF MERCHANTABILITY AND
FITNESS FOR A PARTICULAR PURPOSE. AGILENT SHALL NOT BE LIABLE FOR ERRORS OR FOR
INCIDENTAL OR CONSEQUENTIAL DAMAGES IN CONNECTION WITH THE FURNISHING, USE OR
PERFORMANCE OF THIS DOCUMENT OR ANY INFORMATION CONTAINED HEREIN. SHOULD
AGILENT AND THE USER HAVE A SEPARATE WRITTEN AGREEMENT WITH WARRANTY TERMS
COVERING THE MATERIAL IN THIS DOCUMENT THAT CONFLICT WITH THESE TERMS, THE
WARRANTY TERMS IN THE SEPARATE AGREEMENT WILL CONTROL.

Assistance
Product maintenance agreements and other customer assistance agreements are available
for Agilent Technologies products. For any assistance, contact your nearest Agilent
Technologies sales or service office. See Table 8-1 for the nearest office.

ii
Safety Notes
The following safety notes are used throughout this manual. Familiarize yourself with
each of the notes and its meaning before operating this instrument. All pertinent safety
notes for using this product are located in Chapter 8 , “Safety and Regulatory
Information.”

WARNING Warning denotes a hazard. It calls attention to a procedure which, if

not correctly performed or adhered to, could result in injury or loss
of life. Do not proceed beyond a warning note until the indicated
conditions are fully understood and met.

CAUTION Caution denotes a hazard. It calls attention to a procedure that, if not

correctly performed or adhered to, would result in damage to or destruction of
the instrument. Do not proceed beyond a caution sign until the indicated
conditions are fully understood and met.

How to Use This Guide

This guide uses the following conventions:
Front-Panel Key This represents a key physically located on the
instrument.
SOFTKEY This represents a “softkey,” a key whose label is
determined by the instrument’s firmware.
Screen Text This represents text displayed on the instrument’s screen.

iii
Documentation Map

The Installation and Quick Start Guide provides procedures for

installing, configuring, and verifying the operation of the analyzer. It
also will help you familiarize yourself with the basic operation of the
analyzer.

The User’s Guide shows how to make measurements, explains

commonly-used features, and tells you how to get the most
performance from your analyzer.

The Reference Guide provides reference information, such as

specifications, menu maps, and key definitions.

The Programmer’s Guide provides general GPIB programming

information, a command reference, and example programs. The
Programmer’s Guide contains a CD-ROM with example programs.

The CD-ROM provides the Installation and Quick Start Guide, the
User’s Guide, the Reference Guide, and the Programmer’s Guide in
PDF format for viewing or printing from a PC.

The Service Guide provides information on calibrating,

troubleshooting, and servicing your analyzer. The Service Guide is not
part of a standard shipment and is available only as Option 0BW, or
by ordering part number 08753-90485. A CD-ROM with the Service
Guide in PDF format is included for viewing or printing from a PC.

iv
Contents

1. Making Measurements
Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-2
More Instrument Functions Not Described in This Guide . . . . . . . . . . . . . . . . . . . . . . . . . . .1-3
Making a Basic Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-4
Step 1. Connect the device under test and any required test equipment. . . . . . . . . . . . . .1-4
Step 2. Choose the measurement parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-4
Step 3. Perform and apply the appropriate error-correction. . . . . . . . . . . . . . . . . . . . . . . .1-5
Step 4. Measure the device under test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-5
Step 5. Output the measurement results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-6
Measuring Magnitude and Insertion Phase Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-7
Measuring the Magnitude Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-7
Measuring Insertion Phase Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-8
Using Display Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-10
Titling the Active Channel Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-11
Viewing Both Primary Measurement Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-12
Viewing Four Measurement Channels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-14
Customizing the Four-Channel Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-17
Using Memory Traces and Memory Math Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-19
Blanking the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-21
Adjusting the Colors of the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-22
Using Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-24
To Use Continuous and Discrete Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-24
To Activate Display Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-25
To Move Marker Information Off the Grids . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-26
To Use Delta (∆) Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-28
To Activate a Fixed Marker . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-29
To Couple and Uncouple Display Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-31
To Use Polar Format Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-32
To Use Smith Chart Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-33
To Set Measurement Parameters Using Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-34
Setting the CW Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-38
To Search for a Specific Amplitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-39
To Calculate the Statistics of the Measurement Data . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-42
Measuring Electrical Length and Phase Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-43
Measuring Electrical Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-43
Measuring Phase Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-45
Characterizing a Duplexer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-49
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-49
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-49
Measuring Amplifiers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-53
Measuring Harmonics (Option 002). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-54
Measuring Gain Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-59
Measuring Gain and Reverse Isolation Simultaneously. . . . . . . . . . . . . . . . . . . . . . . . . . .1-63
Using the Swept List Mode to Test a Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-65
Connect the Device Under Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-65
Observe the Characteristics of the Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-66
Choose the Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-67
Calibrate and Measure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-69
Using Limit Lines to Test a Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-71

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Contents

Setting Up the Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-71

Creating Flat Limit Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-72
Creating a Sloping Limit Line . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-74
Creating Single Point Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-76
Editing Limit Segments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-77
Running a Limit Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-77
Offsetting Limit Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-79
Using Ripple Limits to Test a Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-80
Setting Up the List of Ripple Limits to Test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-80
Editing Ripple Test Limits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-83
Running the Ripple Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-85
Using Bandwidth Limits to Test a Bandpass Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-91
Setting Up Bandwidth Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-91
Running a Bandwidth Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-93
Using Test Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-97
How to Use Test Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-97
Creating a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-97
Running a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-99
Stopping a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-99
Editing a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-99
Clearing a Sequence from Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-101
Changing the Sequence Title . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-102
Naming Files Generated by a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-102
Storing a Sequence on a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-103
Loading a Sequence from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-103
Purging a Sequence from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-103
Printing a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-104
In-Depth Sequencing Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-104
Using Test Sequencing to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-113
Cascading Multiple Example Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-113
Loop Counter Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-114
Generating Files in a Loop Counter Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . 1-115
Limit Test Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-117

2. Making Mixer Measurements

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2
Mixer Measurement Capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-3
Measurement Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-4
Minimizing Source and Load Mismatches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-4
Reducing the Effect of Spurious Responses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-5
Eliminating Unwanted Mixing and Leakage Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6
How RF and IF Are Defined . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-7
Frequency Offset Mode Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-10
LO Frequency Accuracy and Stability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-10
Power Meter Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-10
Conversion Loss Using the Frequency Offset Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-11
Setting Measurement Parameters for the Power Meter Calibration . . . . . . . . . . . . . . . . 2-12
Performing a Power Meter (Source) Calibration Over the RF Range . . . . . . . . . . . . . . . . 2-12
Setting the Analyzer to Make an R Channel Measurement . . . . . . . . . . . . . . . . . . . . . . . 2-15

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Contents

High Dynamic Range Swept RF/IF Conversion Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-18

Set Measurement Parameters for the IF Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-18
Perform a Power Meter Calibration Over the IF Range . . . . . . . . . . . . . . . . . . . . . . . . . . .2-18
Perform a Receiver Calibration Over the IF Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-20
Set the Analyzer to the RF Frequency Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-21
Perform a Power Meter Calibration Over the RF Range . . . . . . . . . . . . . . . . . . . . . . . . . .2-21
Perform the High Dynamic Range Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-22
Fixed IF Mixer Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-24
Tuned Receiver Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-24
Sequence 1 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-24
Sequence 2 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-29
Phase or Group Delay Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-32
Phase Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-32
Phase Linearity and Group Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-32
Amplitude and Phase Tracking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-36
Conversion Compression Using the Frequency Offset Mode . . . . . . . . . . . . . . . . . . . . . . . .2-37
Isolation Example Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-42
LO to RF Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-42
RF Feedthrough . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-45
SWR / Return Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-48

3. Making Time Domain Measurements

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-2
Introduction to Time Domain Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-3
Making Transmission Response Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-5
Making Reflection Response Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-9
Time Domain Bandpass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12
Adjusting the Relative Velocity Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12
Reflection Measurements Using Bandpass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12
Transmission Measurements Using Bandpass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-14
Time Domain Low Pass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-15
Setting the Frequency Range for Time Domain Low Pass . . . . . . . . . . . . . . . . . . . . . . . .3-15
Reflection Measurements in Time Domain Low Pass . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-16
Fault Location Measurements Using Low Pass . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-18
Transmission Measurements in Time Domain Low Pass . . . . . . . . . . . . . . . . . . . . . . . . .3-19
Transforming CW Time Measurements into the Frequency Domain . . . . . . . . . . . . . . . . .3-22
Forward Transform Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-22
Masking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-26
Windowing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-27
Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-30
Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-32
Response Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-32
Range Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-34
Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-35
Setting the Gate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-35
Selecting Gate Shape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-36

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4. Printing, Plotting, and Saving Measurement Results

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-2
Printing or Plotting Your Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-3
Configuring a Print Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-4
Defining a Print Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6
If You Are Using a Color Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6
To Reset the Printing Parameters to Default Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-7
Printing One Measurement Per Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-7
Printing Multiple Measurements Per Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-8
Configuring a Plot Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-9
If You Are Plotting to an HPGL/2 Compatible Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-9
If You Are Plotting to a Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-10
If You Are Plotting Measurement Results to a Disk Drive . . . . . . . . . . . . . . . . . . . . . . . . 4-11
Defining a Plot Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-13
Choosing Display Elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-13
Selecting Auto-Feed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-13
Selecting Pen Numbers and Colors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-14
Selecting Line Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-15
Choosing Scale . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-15
Choosing Plot Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-16
To Reset the Plotting Parameters to Default Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-16
Plotting One Measurement Per Page Using a Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . 4-17
Plotting Multiple Measurements Per Page Using a Pen Plotter . . . . . . . . . . . . . . . . . . . . . 4-18
If You Are Plotting to an HPGL Compatible Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-19
To View Plot Files on a PC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-20
Using Ami Pro . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-21
Using Freelance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-21
Converting HPGL Files for Use with Other PC Applications . . . . . . . . . . . . . . . . . . . . . . 4-22
Outputting Plot Files from a PC to a Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-22
Outputting Plot Files from a PC to an HPGL Compatible Printer . . . . . . . . . . . . . . . . . . . 4-23
Step 1. Store the HPGL initialization sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-23
Step 2. Store the exit HPGL mode and form feed sequence. . . . . . . . . . . . . . . . . . . . . . . . 4-24
Step 3. Send the HPGL initialization sequence to the printer. . . . . . . . . . . . . . . . . . . . . 4-24
Step 4. Send the plot file to the printer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-24
Step 5. Send the exit HPGL mode and form feed sequence to the printer. . . . . . . . . . . . 4-24
Outputting Single Page Plots Using a Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-24
Outputting Multiple Plots to a Single Page Using a Printer . . . . . . . . . . . . . . . . . . . . . . . . 4-25
Plotting Multiple Measurements Per Page from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-26
To Plot Multiple Measurements on a Full Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-27
To Plot Measurements in Page Quadrants . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-28
Titling the Displayed Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-30
Configuring the Analyzer to Produce a Time Stamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-31
Aborting a Print or Plot Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-31
Printing or Plotting the List Values or Operating Parameters . . . . . . . . . . . . . . . . . . . . . . 4-32
If You Want a Single Page of Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-32
If You Want the Entire List of Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-32
Solving Problems with Printing or Plotting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-33
Saving and Recalling Instrument States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-34
Places Where You Can Save . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-34

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What You Can Save to the Analyzer’s Internal Memory . . . . . . . . . . . . . . . . . . . . . . . . . .4-34

What You Can Save to a Floppy Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-35
What You Can Save to a Computer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-35
Saving an Instrument State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-36
Saving Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-37
ASCII Data Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-40
Saving in Textual (CSV) Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-43
Saving in Graphical (JPEG) Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-45
Instrument State Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-46
Saving Time Gated Frequency Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-48
Differences between Raw, Data, and Format Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-49
Re-Saving an Instrument State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51
Deleting a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51
To Delete an Instrument State File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51
To Delete all Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51
Renaming a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-52
Recalling a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-52
Formatting a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-53
Solving Problems with Saving or Recalling Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-53
If You Are Using an External Disk Drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-53

5. Optimizing Measurement Results

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-2
Taking Care of Microwave Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-3
Increasing Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4
Interconnecting Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4
Improper Calibration Techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4
Sweeping Too Fast for Electrically Long Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4
Connector Repeatability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4
Temperature Drift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5
Frequency Drift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5
Performance Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5
Reference Plane and Port Extensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5
Making Accurate Measurements of Electrically Long Devices . . . . . . . . . . . . . . . . . . . . . . . .5-7
The Cause of Measurement Problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-7
To Improve Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-7
Increasing Sweep Speed. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-9
To Use Swept List Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-9
To Decrease the Frequency Span . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-10
To Set the Auto Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11
To Widen the System Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11
To Reduce the Averaging Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11
To Reduce the Number of Measurement Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11
To Set the Sweep Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11
To View a Single Measurement Channel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12
To Activate Chop Sweep Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12
To Use External Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12
To Use Fast 2-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12
Increasing Dynamic Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-14

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Increase the Test Port Input Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14

Reduce the Receiver Noise Floor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14
Reduce the Receiver Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14
Reducing Noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15
To Activate Averaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15
To Change System Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15
Reducing Receiver Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-16
Reducing Recall Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-17
Understanding Spur Avoidance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-17

6. Calibrating for Increased Measurement Accuracy

How to Use This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-3
Calibration Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
Device Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
Clarifying Type-N Connector Sex . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
Omitting Isolation Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
Saving Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5
Restarting a Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5
The Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5
Frequency Response of Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6
Interpolated Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-8
Error-Correction Stimulus State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-9
Procedures for Error Correcting Your Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-10
Types of Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-10
Frequency Response Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12
Response Error Correction for Reflection Measurements . . . . . . . . . . . . . . . . . . . . . . . . . 6-12
Response Error Correction for Transmission Measurements . . . . . . . . . . . . . . . . . . . . . . 6-14
Receiver Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-15
Frequency Response and Isolation Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-17
Response and Isolation Error Correction for Transmission Measurements . . . . . . . . . . 6-17
Response and Isolation Error Correction for Reflection Measurements . . . . . . . . . . . . . 6-19
Enhanced Frequency Response Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-22
Enhanced Reflection Calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-25
One-Port Reflection Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-26
Full Two-Port Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-29
Power Meter Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-33
Loss of Power Meter Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-33
Interpolation in Power Meter Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-34
Entering the Power Sensor Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-34
Compensating for Directional Coupler Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-35
Using Sample-and-Sweep Correction Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-36
Using Continuous Correction Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-38
Calibrating for Noninsertable Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-40
Adapter Removal Calibration (ES Analyzers Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-41
Matched Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-46
Modify the Cal Kit Thru Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-47
Minimizing Error When Using Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-49

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Making Non-Coaxial Measurements. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-50

Fixtures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-50
Calibrating for Non-Coaxial Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-52
TRL Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-52
LRM Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-56
Create a User-Defined LRM Calibration Kit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-56
Perform the LRM Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-58
Calibrating Using Electronic Calibration (ECal) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-60
Set Up the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-60
Connect the ECal Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-61
Select the ECal Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-62
Perform the Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-64
Display the Module Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-66
Perform the Confidence Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-67
Investigating the Calibration Results Using the ECal Service Menu . . . . . . . . . . . . . . . .6-69
Adapter Removal Using ECal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-71
Perform the 2-Port Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-73
Determine the Electrical Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-75
Remove the Adapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-76
Verify the Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-77

7. Operating Concepts
Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-2
Where to Find More Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-2
System Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-3
The Built-In Synthesized Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4
Test Sets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4
The Receiver Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4
The Microprocessor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4
Required Peripheral Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-5
Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-6
Processing Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-7
Output Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-10
Power Coupling Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-10
Sweep Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-11
Manual Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-11
Auto Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-11
Minimum Sweep Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-11
Source Attenuator Switch Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-13
Allowing Repetitive Switching of the Attenuator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-13
Channel Stimulus Coupling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-14
Sweep Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-15
Linear Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-15
Logarithmic Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-15
Stepped List Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-15
Swept List Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-17
Power Sweep (dBm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-19
CW Time Sweep (Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-19
Selecting Sweep Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-19

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S-Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20
Understanding S-Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20
The S-Parameter Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-22
Analyzer Display Formats. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-24
Log Magnitude Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-24
Phase Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-24
Group Delay Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-25
Smith Chart Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-26
Polar Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-27
Linear Magnitude Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-27
SWR Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-28
Real Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-29
Imaginary Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-29
Group Delay Principles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-29
Electrical Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-33
Noise Reduction Techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-34
Averaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-34
Smoothing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-35
IF Bandwidth Reduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-35
Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-37
What Is Accuracy Enhancement? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-37
What Causes Measurement Errors? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-38
Characterizing Microwave Systematic Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-41
How Effective Is Accuracy Enhancement? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-51
Calibration Routines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-54
Response Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-54
Response and Isolation Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-54
Enhanced Response Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-54
S11 and S22 One-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-55
Full Two-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-55
TRL*/LRM* Two-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-55
E-CAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-55
Modifying Calibration Kits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-56
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-56
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-57
Modify Calibration Kit Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-57
Verify Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-64
Saving Modified Calibration Kits to a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-65
Modifying and Saving a Calibration Kit from the Calibration Kit Selection Menu . . . . . 7-65
TRL*/LRM* Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-66
Why Use TRL Calibration? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-66
TRL Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-67
How TRL*/LRM* Calibration Works . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-67
Improving Raw Source Match and Load Match for TRL*/LRM* Calibration . . . . . . . . . 7-70
The TRL Calibration Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-71
GPIB Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-77
Local Key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-77
GPIB STATUS Indicators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-78
System Controller Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-78

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Talker/Listener Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-78

Pass Control Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-78
Address Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-79
Using the Parallel Port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-79
Limit Line Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-81
Edit Limits Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-82
Edit Segment Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-82
Offset Limits Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-82
Knowing the Instrument Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-83
Network Analyzer Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-83
External Source Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-83
Tuned Receiver Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-85
Frequency Offset Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-87
Harmonic Operation (Option 002 Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-87
Differences between 8753 Network Analyzers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-89

8. Safety and Regulatory Information

General Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2
Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2
Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2
Shipment for Service . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2
Safety Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-4
Instrument Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-4
Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5
Safety Earth Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5
Before Applying Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5
Servicing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-6
General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-7
Compliance with German FTZ Emissions Requirements . . . . . . . . . . . . . . . . . . . . . . . . . .8-8
Compliance with German Noise Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-8
Compliance with Canadian EMC Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-8
Declaration of Conformity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-9

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xiv
1 Making Measurements

1-1
Making Measurements
Using This Chapter

Using This Chapter

This chapter contains the following example procedures for making measurements. Mixer
and time domain measurements are covered in Chapter 2 , "Making Mixer Measurements"
and Chapter 3 , “Making Time Domain Measurements.” This chapter also describes how to
use most display, marker, and sequencing functions.
• "Making a Basic Measurement" on page 1-4
• "Measuring Magnitude and Insertion Phase Response" on page 1-7
• "Measuring Electrical Length and Phase Distortion" on page 1-43
— Electrical Length
— Phase Distortion (deviation from linear phase, group delay)
• Characterizing a Duplexer
• "Measuring Amplifiers" on page 1-53
— Measuring Harmonics (Option 002 Only)
— Measuring Gain Compression
— Measuring Gain Compression and Reverse Isolation Simultaneously
— Making High Power Measurements
• "Using the Swept List Mode to Test a Device" on page 1-65
• "Using Limit Lines to Test a Device" on page 1-71
• "Using Test Sequencing to Test a Device" on page 1-113
The following chapters describe how to use more instrument functions (as indicated by
their chapter titles):
• Chapter 4 , "Printing, Plotting, and Saving Measurement Results"
• Chapter 5 , "Optimizing Measurement Results"
• Chapter 6 , "Calibrating for Increased Measurement Accuracy"

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 Making Measurements
More Instrument Functions Not Described in This Guide

More Instrument Functions Not Described in This Guide

To learn about instrument functions not covered in this user’s guide, refer to the following
chapters in the reference guide.

“Menu Maps” contains maps of the instrument menu structure.

“Hardkey/Softkey Reference” contains descriptions of all instrument functions.

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Making Measurements
Making a Basic Measurement

Making a Basic Measurement

There are five basic steps when you are making a measurement.
1. Connect the device under test and any required test equipment.

CAUTION Damage may result to the device under test (DUT) if it is sensitive to the
analyzer’s default output power level. To avoid damaging a sensitive DUT, be
sure to lower the output power before connecting the DUT to the analyzer.

2. Choose the measurement parameters.

3. Perform and apply the appropriate error-correction.
4. Measure the device under test (DUT).
5. Output the measurement results.
This example procedure shows you how to measure the transmission response of a
bandpass filter.

Step 1. Connect the device under test and any required test
equipment.
Make the connections as shown in Figure 1-1.

Figure 1-1 Basic Measurement Setup

Step 2. Choose the measurement parameters.

Press Preset .
To set preset the analyzer to the “Factory Preset” conditions, press the
PRESET: FACTORY softkey if it is not selected. Then press Preset .

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 Making Measurements
Making a Basic Measurement

Setting the Frequency Range

To set the center frequency to 134 MHz, press:
Center 134 M/µ
To set the span to 30 MHz, press:
Span 30 M/µ

NOTE You could also press the Start and Stop keys and enter the frequency
range limits as start frequency and stop frequency values.

Setting the Source Power

To change the power level to −5 dBm, press:
Power −5 x1

NOTE You could also press POWER RANGE MAN POWER RANGES and select
one of the power ranges to keep the power setting within the defined range.

Setting the Measurement

To change the number of measurement data points to 101, press:
Sweep Setup NUMBER OF POINTS
To select the transmission measurement, press:
Meas Trans: FWD S21 (B/R)
To view the data trace, press:
Scale Ref AUTOSCALE

Step 3. Perform and apply the appropriate error-correction.

Refer to the Chapter 5 , “Optimizing Measurement Results,” for procedures on
correcting measurement errors.
To save the instrument state and error-correction in the analyzer internal memory,
press:
Save/Recall SELECT DISK INTERNAL MEMORY RETURN SAVE STATE

Step 4. Measure the device under test.

Replace any standard used for error-correction with the device under test.
To measure the insertion loss of the bandpass filter, press:
Marker Search SEARCH: MAX

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Making Measurements
Making a Basic Measurement

Step 5. Output the measurement results.

To create a printed copy of the measurement results, press:
Copy PRINT MONOCHROME (or PLOT )
Refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results,” for
procedures on how to set up a printer and define a print, plot, or save results.

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 Making Measurements
Measuring Magnitude and Insertion Phase Response

Measuring Magnitude and Insertion Phase Response

This measurement example shows you how to measure the maximum amplitude of a
surface acoustic wave (SAW) filter and then how to view the measurement data in the
phase format, which provides information about the phase response.

Measuring the Magnitude Response

1. Connect your test device as shown in Figure 1-2.

Figure 1-2 Device Connections for Measuring a Magnitude Response

2. Press Preset and choose the measurement settings. For this example the
measurement parameters are set as follows:

Meas Trans:FWD S21 (B/R)

Center 134 M/µ

Span 50 M/µ

Power −3 x1

Scale Ref AUTO SCALE

Chan 2

Meas Trans:FWD S21 (B/R)

Scale Ref AUTO SCALE

You may also want to select settings for the number of data points, averaging, and IF
bandwidth.
3. Remove the device and connect the power cables together (thru) and perform a response
calibration using the following key presses.
Press Chan 1 Cal CALIBRATE MENU RESPONSE THRU .

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Making Measurements
Measuring Magnitude and Insertion Phase Response

If the channels are coupled (the default condition), this calibration is valid for both
channels.
4. Reconnect your test device.
5. To better view the measurement trace, press:
Scale Ref AUTO SCALE
6. To locate the maximum amplitude of the device response, as shown in Figure 1-3, press:
Marker Search SEARCH: MAX

Figure 1-3 Example Magnitude Response Measurement Results

Measuring Insertion Phase Response

7. To view both the magnitude and phase response of the device, as shown in Figure 1-4,
press:

Chan 2

Display DUAL | QUAD SETUP DUAL CHAN ON

Format PHASE
The channel 2 portion of Figure 1-4 shows the insertion phase response of the device under
test. The analyzer measures and displays phase over the range of −180° to +180°. As phase
changes beyond these values, a sharp 360° transition occurs in the displayed data.

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 Making Measurements
Measuring Magnitude and Insertion Phase Response

Figure 1-4 Example Insertion Phase Response Measurement

The phase response shown in Figure 1-5 is undersampled; that is, there is more than 180°
phase delay between frequency points. If the ∆Φ ≥ 180°, incorrect phase and delay
information may result. Figure 1-5 shows an example of phase samples being with
∆Φ less than 180° and greater than 180°.

Figure 1-5 Phase Samples

Undersampling may arise when measuring devices with long electrical length. To correct
this problem, the frequency span should be reduced, or the number of points increased
until ∆Φ is less than 180° per point. Electrical delay may also be used to compensate for
this effect (as shown in the next example procedure).

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Making Measurements
Using Display Functions

Using Display Functions

This section provides the necessary information for using the display functions. These
functions are very helpful for displaying measurement data so that it will be easy to read.
This section covers the following topics:
• Adding titles to your measurements
• Viewing both primary channels at the same time
• Viewing and customizing four-channel measurements
• Using the memory traces
• Using the memory math functions
• Blanking the analyzer’s display
• Changing the colors of the display

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 Making Measurements
Using Display Functions

Titling the Active Channel Display

1. Press Display MORE TITLE to access the title menu.

2. Press ERASE TITLE and enter the title you want for your measurement display.
• If you have a DIN keyboard attached to the analyzer, type the title you want from the
keyboard. Then press ENTER to enter the title into the analyzer. You can enter a
title that has a maximum of 50 characters. (For more information on using a
keyboard with the analyzer, refer to the “Options and Accessories” chapter in the
reference guide.)
• If you do not have a DIN keyboard attached to the analyzer, enter the title from the
analyzer front panel.
a. Turn the front panel knob to move the arrow pointer to the first character of the
title.
b. Press SELECT LETTER .
c. Repeat the previous two steps to enter the rest of the characters in your title. You
can enter a title that has a maximum of 50 characters.
d. Press DONE to complete the title entry.

Figure 1-6 Example of a Display Title

CAUTION The NEWLINE and FORMFEED keys are not intended for creating display
titles. Those keys are for creating commands to send to peripherals during a
sequence program.

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Making Measurements
Using Display Functions

Viewing Both Primary Measurement Channels

In some cases, you may want to view more than one measured parameter at a time.
Simultaneous gain and phase measurements, for example, are useful in evaluating
stability in negative feedback amplifiers. You can easily make such measurements using
the dual channel display.
1. To see channels 1 and 2 in the same grid, press:
Display DUAL | QUAD SETUP , set DUAL CHAN on OFF to ON, and SPLIT DISP
to 1X.

Figure 1-7 Example of Viewing Channel 1 and 2 Simultaneously

2. To view the measurements on separate graticules, press: Set SPLIT DISP to 2X. The
analyzer shows channel 1 on the upper half of the display and channel 2 on the lower
half of the display. The analyzer defaults to measuring S11 on channel 1 and S21 on
channel 2.

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 Making Measurements
Using Display Functions

Figure 1-8 Example Dual Channel with Split Display On

3. To return to a single-graticule display, press: SPLIT DISPLAY 1X .

NOTE You can control the stimulus functions of the two channels independent of
each other by pressing Sweep Setup COUPLED CH OFF .

Dual Channel Mode with Decoupled Stimulus

The stimulus functions of the two channels can be controlled independently using
COUPLED CH ON off in the stimulus menu. In addition, the markers can be controlled
independently for each channel using MARKERS: UNCOUPLED in the marker mode
menu, under the Marker Fctn key.

NOTE For dual channel, if channels are uncoupled and you have full 2-port
calibrations on both channels, you will not be able to select a non-ratioed
measurement. For example, you can measure S21 or B/R, but not input B.

NOTE Auxiliary channels 3 and 4 are permanently coupled by stimulus to primary

channels 1 and 2, respectively. Decoupling the primary channels’ stimulus
from each other does not affect the stimulus coupling between the auxiliary
channels and their primary channels.

Dual Channel Mode with Decoupled Channel Power

By decoupling the channel power or port power and using the dual channel mode, you can
simultaneously view two measurements (or two sets of measurements, if both auxiliary
channels are enabled) having different power levels.

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Making Measurements
Using Display Functions

However, there are situations where the analyzer will not update all measurements
continuously. For analyzers with source attenuators, such situations occur if channel 1
requires one attenuation value and channel 2 requires a different value, or if 2-port cal is
active and the port 1 attenuation value is not equal to the attenuation value of port 2.
Since one attenuator is used for both measurements, this would cause the attenuator to
continuously switch power ranges, which is not allowed.
If one of these conditions exist, the test set hold mode will engage, and the status notation
tsH will appear on the left side of the screen. The hold mode leaves the measurement
function in only one of the two measurement paths. To update both measurements, press
Sweep Setup MEASURE RESTART . Refer to "Source Attenuator Switch Protection" on
page 7-13.

Viewing Four Measurement Channels

Four measurement channels can be viewed simultaneously by enabling auxiliary channels
3 and 4. Although independent of other channels in most variables, channels 3 and 4 are
permanently coupled to channels 1 and 2 respectively by stimulus. That is, if channel 1 is
set for a center frequency of 200 MHz and a span of 50 MHz, channel 3 will have the same
stimulus values.

NOTE Channels 1 and 2 are referred to as primary channels and channels 3 and 4
are referred to as auxiliary channels.

Channel 3 or 4 are activated when the Chan 3 or Chan 4 keys are pressed. Alternatively,
you can enable the auxiliary setting AUX CHAN to ON. For example, if channel 1 is
active, pressing AUX CHAN to ON enables channel 3 and its trace appears on the display.
Channel 4 is similarly enabled and viewed when channel 2 is active.

1. Press Format to select the type of display of the data. This example uses the log mag
format.
2. If channel 1 is not active, make it active by pressing Chan 1 .
3. Press Display DUAL | QUAD SETUP , set DUAL CHAN to ON, set AUX CHAN to
ON, and set SPLIT DISP to 4X .
The display will appear as shown in Figure 1-9. Channel 1 is in the upper-left quadrant
of the display, channel 2 is in the upper-right quadrant, and channel 3 is in the lower
half of the display.

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 Making Measurements
Using Display Functions

Figure 1-9 Three-Channel Display

4. Press Chan 4 (or press Chan 2 , set AUX CHAN to ON).

This enables channel 4 and the screen now displays four separate grids as shown in
Figure 1-10. Channel 4 is in the lower-right quadrant of the screen.

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Making Measurements
Using Display Functions

Figure 1-10 Four-Channel Display

5. Press Chan 4 .
Observe that the amber LED adjacent to the Chan 4 key is lit and the CH4 indicator
on the display has a box around it. This indicates that channel 4 is now active and can
be configured.
6. Press Marker MARKER 1 MARKER 2 .
Markers 1 and 2 appear on all four channel traces. Rotating the front panel control
knob moves marker 2 on all four channel traces. Note that the active function, in this
case the marker frequency, is the same color and in the same grid as the active channel
(channel 4).
7. Press Chan 3 .
Observe that the amber LED adjacent to the Chan 3 key is lit. This indicates that
channel 3 is now active and can be configured.
8. Rotate the front panel control knob and notice that marker 2 still moves on all four
channel traces.

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 Making Measurements
Using Display Functions

9. To independently control the channel markers:

Press Marker Fctn MARKER MODE MENU , set MARKERS: to UNCOUPLED.
Rotate the front panel control knob. Marker 2 moves only on the channel 3 trace.
Once made active, a channel can be configured independently of the other channels in most
variables except stimulus. For example, once channel 3 is active, you can change its format
to a Smith chart by pressing Format SMITH CHART .

Customizing the Four-Channel Display

When one or both auxiliary channels are enabled, DUAL CHAN on OFF and
SPLIT DISP 1X 2X 4X interact to produce different display configurations according to
Table 1-1.
Table 1-1 Customizing the Display

Split Display Dual Channel Aux Channels On Number of Graticules

1X Don’t Care Don’t Care 1

1X/2X/4X Off None

2X/4X Off 3 or 4 2

2X On Don’t Care

4X On 3 or 4 3

4X On Both on 4

Channel Position Softkey

CHANNEL POSITION gives you options for arranging the display of the channels. Press
Display , DUAL|QUAD SETUP to use CHANNEL POSITION .

CHANNEL POSITION works with SPLIT DISP 1X 2X 4X . When SPLIT DISP 2X is

selected, CHANNEL POSITION gives you two choices for a two-graticule display:
• Channels 1 and 2 overlaid in the top graticule, and channels 3 and 4 are overlaid in the
bottom graticule.
• Channels 1 and 3 are overlaid in the top graticule, and channels 2 and 4 are overlaid in
the bottom graticule.
When SPLIT DISP 4X is selected, CHANNEL POSITION gives you two choices for a
four-graticule display:
• Channels 1 and 2 are in separate graticules in the upper half of the display, channels 3
and 4 are in separate graticules in the lower half of the display.
• Channels 1 and 3 are in the upper half of the display, channels 2 and 4 are in the lower
half of the display.

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Making Measurements
Using Display Functions

4 Param Displays Softkey

The 4 PARAM DISPLAYS menu does two things:
• provides a quick way to set up a four-parameter display
• gives information for using softkeys in the Display menu
Figure 1-11 shows the first 4 PARAM DISPLAYS screen. Six setup options are described
with softkeys SETUP A through SETUP F . SETUP A is a four-parameter display
where each channel is displayed on its own grid. Pressing SETUP A immediately
produces a four-grid, four-parameter display. SETUP B is also a four-parameter display,
except that channel 1 and channel 2 are overlaid on the upper grid and channel 3 and
channel 4 are overlaid on the lower grid. The other setup softkeys operate similarly. Notice
that setups D and F produce displays which include Smith charts.
Pressing TUTORIAL opens a screen which lists the order of keystrokes you would have to
enter in order to create some of the setups without using one of the setup softkeys. The
keystroke entries are listed (from top to bottom) beneath each setup and are color-coded to
show the relationship between the keys and the channels. For example, beneath the
four-grid display, [CHAN 1] and [MEAS] S11 are shown in yellow. Notice that in the
four-grid graphic, Ch1 is also yellow, indicating that the keys in yellow apply to channel 1.
Pressing MORE HELP opens a screen which lists the hardkeys and softkeys associated
with the auxiliary channels and setting up multiple-channel, multiple-grid displays. Next
to each key is a description of its function.

Figure 1-11 4 Param Displays Menu

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 Making Measurements
Using Display Functions

Using Memory Traces and Memory Math Functions

The analyzer has four available memory traces, one per channel. Memory traces are totally
channel dependent: channel 1 cannot access the channel 2 memory trace or vice versa.
Memory traces can be saved with instrument states: one memory trace can be saved per
channel for each saved instrument state. There are up to 31 save/recall registers available,
so the total number of memory traces that can be present is 128 including the four active
for the current instrument state. The memory data is stored as full precision, complex
data. Memory traces must be displayed in order to be saved with instrument states.
Additional data can be stored onto 3.5-inch floppy disks using the front panel disk drive.

NOTE You may not be able to store 31 instrument states if they include a large
amount of calibration data. The calibration data contributes considerably to
the size of the instrument state file and therefore the available memory may
be full prior to filling all 31 registers.

Two trace math operations are implemented:

• DATA/MEM (data/memory)

• DATA-MEM (data−memory)

(Note that normalization is DATA/MEM not DATA-MEM .) Memory traces are saved and
recalled and trace math is done immediately after error-correction. This means that any
data processing done after error-correction, including parameter conversion, time domain
transformation (Option 010), scaling, etc., can be performed on the memory trace. You can
also use trace math as a simple means of error-correction, although that is not its main
purpose.
All data processing operations that occur after trace math, except smoothing and gating,
are identical for the data trace and the memory trace. If smoothing or gating is on when a
memory trace is saved, this state is maintained regardless of the data trace smoothing or
gating status. If a memory trace is saved with gating or smoothing on, these features can
be turned on or off in the memory-only display mode.
The actual memory for storing a memory trace is allocated only as needed. The memory
trace is cleared on instrument preset, power on, or instrument state recall.
If sweep mode or sweep range is different between the data and memory traces, trace math
is allowed, and no warning message is displayed. If the number of points in the two traces
is different, the memory trace is not displayed nor rescaled. However, if the number of
points for the data trace is changed back to the number of points in the memory, the
memory trace can then be displayed.
If trace math or display memory is requested and no memory trace exists, the message
CAUTION: NO VALID MEMORY TRACE is displayed.

To Save a Data Trace to the Display Memory

Press Display DATA→MEMORY to store the current active measurement data in the
memory of the active channel. The data trace is now also the memory trace. You can use a
memory trace for subsequent math manipulations.

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Making Measurements
Using Display Functions

To View the Measurement Data and Memory Trace

The analyzer default setting shows you the current measurement data for the active
channel.
1. To view a data trace that you have already stored to the active channel memory, press:
Display MEMORY
This is the only memory display mode where you can change the smoothing and gating
of the memory trace.
2. To view both the memory trace and the current measurement data trace, press:
Display DATA and MEMORY

To Divide Measurement Data by the Memory Trace

You can use this feature for ratio comparison of two traces, for example, measurements of
gain or attenuation.
1. You must have already stored a data trace to the active channel memory, as described in
"To Save a Data Trace to the Display Memory" on page 1-19.
2. Press Display DATA/MEM to divide the data by the memory.
The analyzer normalizes the data to the memory, and shows the results.

To Subtract the Memory Trace from the Measurement Data Trace

You can use this feature for storing a measured vector error, for example, directivity. Then,
you can later subtract it from the device measurement.
1. You must have already stored a data trace to the active channel memory, as described in
"To Save a Data Trace to the Display Memory" on page 1-19.
2. Press Display DATA-MEM to subtract the memory from the measurement data.
The analyzer performs a vector subtraction on the complex data.

To Ratio Measurements in Channel 1 and 2

You may want to use this feature when making amplifier measurements to produce a trace
that represents gain compression. For example, with the channels uncoupled, you can
increase the power for channel 2 while channel 1 remains unchanged. This will allow you
to observe the gain compression on channel 2.

1. Press Sweep Setup COUPLED CH OFF to uncouple the channels.

2. Make sure that both channels must have the same number of points.
3. Press Display MORE D2/D1 TO D2 ON to ratio channels 1 and 2, and put the
results in the channel 2 data array. This ratio is applied to the complex data.
4. Refer to "Measuring Gain Compression" on page 1-59 for the procedure to identify the
1 dB compression point.

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 Making Measurements
Using Display Functions

Blanking the Display

Pressing Display ADJUST DISPLAY BLANK DISPLAY switches off the analyzer
display while leaving the instrument in its current measurement state. This feature may
be helpful in prolonging the life of the LCD in applications where the analyzer is left
unattended (such as in an automated test system). Turning the front panel knob or
pressing any front panel key will restore normal display operation.
Pressing Display FREQUENCY BLANK will blank the displayed frequency notation for
security purposes. The frequency labels cannot be restored except by instrument preset or
turning the power off and then on.

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Making Measurements
Using Display Functions

Adjusting the Colors of the Display

Setting Display Intensity

To adjust the intensity of the display, press Display ADJUST DISPLAY INTENSITY
and rotate the front panel knob, use the ( )( ) keys, or use the numerical keypad
to set the intensity value between 50 and 100 percent. Lowering the intensity may prolong
the life of the LCD.

Setting Default Colors

To set all the display elements to the factory-defined default colors, press
DEFAULT COLORS .

NOTE Preset does not reset or change colors to the default color values. However,
cycling power to the instrument will reset the colors to the default color
values.

The Modify Colors Menu

The MODIFY COLORS softkey within the adjust display menu provides access to the
modify colors menu.
The modify colors menu allows you to adjust the colors on your analyzer’s display. The
default colors in this instrument were chosen to maximize your ability to discern the
difference between the channel colors, and to comfortably and effectively view the colors.
Each channel’s memory trace color was chosen because the color is similar to the channels
data trace color. This allows easy association between the data trace and the memory trace
for each channel.
You may choose to change the default colors to suit environmental needs, individual
preferences, or to accommodate color deficient vision. You can use any of the available
colors for any of the display elements listed:

CH1 DATA/LIMIT LN CH3 DATA/LIMIT LN

CH1 MEM CH3 MEM

CH2 DATA/LIMIT LN CH4 DATA/LIMIT LN

CH2 MEM CH4 MEM

GRATICULE REF LINE

TEXT WARNING

To change the color of a display elements, press the softkey for that element (such as
CH1 DATA ). Then press TINT and turn the analyzer front panel knob; use the step keys
or the numeric keypad, until the desired color appears.

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 Making Measurements
Using Display Functions

NOTE Maximum viewing with the LCD display is achieved when primary colors or a
combination of them are selected at full brightness (100%). Table 1-2 lists the
recommended colors and their corresponding tint numbers.

Table 1-2 Display Colors with Maximum Viewing Angle

Display Color Tint Brightness Color

Red 0 100 100

Yellow 17 100 100

Green 33 100 100

Cyan 50 100 100

Blue 67 100 100

Magenta 83 100 100

White N/A 100 0

Color is comprised of three parameters:

• Tint: The continuum of hues on the color wheel, ranging from red, through green and
blue, and back to red.
• Brightness: A measure of the brightness of the color.
• Color: The degree of whiteness of the color. A scale from white to pure color.
The most frequently occurring color deficiency is the inability to distinguish red, yellow,
and green from one another. Confusion between these colors can usually be eliminated by
increasing the brightness between the colors. To accomplish this, press the
BRIGHTNESS softkey and turn the analyzer front panel knob. If additional adjustment
is needed, vary the degree of whiteness of the color. To accomplish this, press the COLOR
softkey and turn the analyzer front panel knob.

NOTE Color changes and adjustments remain in effect until changed again in these
menus or the analyzer is powered off and then on again. Cycling the power
changes all color adjustments to default values. Once the colors are saved,
pressing the Preset key does not affect the color selections.

Saving Modified Colors

To save a modified color set, press SAVE COLORS . Modified colors are not part of a saved
instrument state and are lost unless saved using these softkeys. Once modified colors are
saved, they will be the colors applied until Preset is pushed.

Recalling Modified Colors

To recall the previously saved color set, press RECALL COLORS .

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Making Measurements
Using Markers

Using Markers
The Marker key displays a movable active marker on the screen and provides access to a
series of menus to control up to five display markers for each channel. Markers are used to
obtain numerical readings of measured values. They also provide capabilities for reducing
measurement time by changing stimulus parameters, searching the trace for specific
values, or statistically analyzing part or all of the trace.
Markers have a stimulus value (the x-axis value in a Cartesian format) and a response
value (the y-axis value in a Cartesian format). In polar format, the second part of a
complex data pair is also provided as an auxiliary response value. In Smith chart format,
the real and imaginary rectangle are both displayed, and the effective capacitance or
inductance of the imaginary part is also displayed. When a marker is activated and no
other function is active, its stimulus value is displayed in the active entry area and can be
controlled with the knob, the step keys, or the numeric keypad. The active marker can be
moved to any point on the trace, and its response and stimulus values are displayed at the
top right corner of the graticule for each displayed channel, in units appropriate to the
display format. The displayed marker response values are valid even when the measured
data is above or below the range displayed on the graticule.
• If you activate both data and memory traces, the marker values apply to the data trace.
• If you activate only the memory trace, the marker values apply to the memory trace.
• If you activate a memory math function (data/memory or data-memory), the marker
values apply to the trace resulting from the memory math function.
Marker values are normally continuous: that is, they are interpolated between measured
points. They can also be set to read only discrete measured points. Markers normally have
the same stimulus values for all channels, or they can be uncoupled so that each channel
has independent markers, regardless of whether stimulus values are coupled or dual
channel display is on.

To Use Continuous and Discrete Markers

The analyzer can either place markers on discrete measured points, or move the markers
continuously along a trace by interpolating the data value between measured points.

• Press Marker Fctn MARKER MODE MENU and select one of the following choices:

— Choose MARKERS: CONTINUOUS if you want the analyzer to place markers at

any point on the trace, by interpolating between measured points. This default mode
allows you to conveniently obtain round numbers for the stimulus value.
— Choose MARKERS: DISCRETE if you want the analyzer to place markers only on
measured trace points determined by the stimulus settings. This may be the best
mode to use with automated testing, using a computer or test sequencing because
the analyzer does not interpolate between measured points.

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 Making Measurements
Using Markers

NOTE Using MARKERS: DISCRETE will also affect marker search and positioning
functions when the value entered in a search or positioning function does not
exist as a measurement point. The marker will be positioned to the closest
adjacent point that satisfies the search or positioning value.

To Activate Display Markers

• To switch on marker 1 and make it the active marker, press:

Marker MARKER 1
The active marker is identified on the analyzer display with the following symbol: ∇
The active marker stimulus value is displayed in the active entry area. You can modify
the stimulus value of the active marker, using the front panel knob or numerical
keypad. All of the marker response and stimulus values are displayed in the upper right
corner of the display.

Figure 1-12 Active Marker Control Example

To switch on the corresponding marker and make it the active marker, press:
MARKER 2 MARKER 3 , MARKER 4 , or MARKER 5
All of the markers, other than the active marker, become inactive and are represented on
the analyzer display as ∆. The active and inactive markers are shown in Figure 1-13.

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Making Measurements
Using Markers

Figure 1-13 Active and Inactive Markers Example

• To switch off all of the markers, press ALL OFF .

To Move Marker Information Off the Grids

If marker information obscures the display traces, you can turn off the softkey menu and
move the marker information off the display traces and into the softkey menu area.
Pressing the backspace key performs this function. This is a toggle function.
Pressing alternately hides and restores the current softkey menu. The softkey menu
is also restored when you press any softkey or a hardkey which leads to a menu.
1. Set up a four-graticule display as described in "Viewing Four Measurement Channels"
on page 1-14.
2. Activate four markers by pressing Marker 1 2 3 4 .

NOTE Observe that the markers appear on all of the grids. To activate markers on
individual grids, press Marker Fctn MARKER MODE MENU , and set
MARKERS: to UNCOUPLED. Then, activate the channel in which you wish
to have markers, press Marker , then select the markers for that channel.

3. Turn off the softkey menu and move the marker information off the grids by pressing
.
The display will be similar to Figure 1-14.

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 Making Measurements
Using Markers

Figure 1-14 Marker Information Moved into the Softkey Menu Area

pg654e

4. Restore the softkey menu and move the marker information back onto the graticules:
Press .
The display will be similar to Figure 1-15.

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Making Measurements
Using Markers

Figure 1-15 Marker Information on the Graticules

pg655e

You can also restore the softkey menu by pressing a hardkey which opens a menu (such as
Meas ) or pressing a softkey.

To Use Delta (∆) Markers

This is a relative mode, where the marker values show the position of the active marker
relative to the delta reference marker. You can switch on the delta mode by defining one of
the five markers as the delta reference.

1. Press Marker ∆ MODE MENU ∆ REF=1 to make marker 1 a reference marker.

2. To move marker 1 to any point that you want to reference:
• Turn the front panel knob.
OR
• Enter the frequency value (relative to the reference marker) on the numeric keypad.
3. Press MARKER 2 and move marker 2 to any position that you want to measure in
reference to marker 1.

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 Making Measurements
Using Markers

Figure 1-16 Marker 1 as the Reference Marker Example

4. To change the reference marker to marker 2, press:

∆ MODE MENU ∆ REF=2

To Activate a Fixed Marker

When a reference marker is fixed, it does not rely on a current trace to maintain its fixed
position. This is convenient when comparing two different measurement conditions. To
activate a fixed marker on the analyzer, press Marker MKR ZERO .
Marker zero puts a fixed reference at the current position of the active marker.
To change to a Delta Marker to a fixed reference marker, press Marker ∆ MODE MENU
∆REF=∆FIXED MKR .

Using the MKR ZERO Key to Activate a Fixed Reference Marker

Marker zero enters the position of the active marker as the ∆ reference position.
Alternatively, you can specify the fixed point with FIXED MKR POSITION . Marker zero
is canceled by switching delta mode off.
1. To place marker 1 at a point that you would like to reference, press:
Marker and turn the front panel knob, or enter a value from the front panel keypad.
2. To measure values along the measurement data trace, relative to the reference point
that you set in the previous step, press:
MKR ZERO and turn the front panel knob, or enter a value from the front panel
keypad.
3. To move the reference position, press:
∆MODE MENU FIXED MKR POSITION FIXED MKR STIMULUS and turn the
front panel knob, or enter a value from the front panel keypad.

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Making Measurements
Using Markers

Figure 1-17 Example of a Fixed Reference Marker Using MKR ZERO

Using the ∆REF=∆FIXED MKR Key to Activate a Fixed Reference Marker

1. To set the frequency value of a fixed marker that appears on the analyzer display, press:
Marker ∆MODE MENU ∆REF=∆FIXED MKR ∆MODE MENU
FIXED MKR POSITION FIXED MKR STIMULUS and turn the front panel knob, or
enter a value from the front panel keypad.
The marker is shown on the display as a small delta (∆), smaller than∆ the inactive
marker triangles.
2. To set the response value (dB) of a fixed marker, press:
FIXED MKR VALUE and turn the front panel knob, or enter a value from the front
panel keypad.
In a Cartesian format, the setting is the y-axis value. In polar or Smith chart format,
with a magnitude/phase marker, a real/imaginary marker, an R+jX marker, or a G+jB
marker, the setting applies to the first part of the complex data pair. (Fixed marker
response values are always uncoupled in the two channels.)
3. To set the auxiliary response value of a fixed marker when you are viewing a polar or
Smith format, press:
FIXED MKR AUX VALUE and turn the front panel knob, or enter a value from the
front panel keypad.
This value is the second part of complex data pair, and applies to a magnitude/phase
marker, a real/imaginary marker, an R+jX marker, or a G+jB marker. (Fixed marker
auxiliary response values are always uncoupled in the two channels.)

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 Making Measurements
Using Markers

Figure 1-18 Example of a Fixed Reference Marker Using (∆)REF=(∆)FIXED MKR

To Couple and Uncouple Display Markers

At a preset state, the markers have the same stimulus values on each channel, but they
can be uncoupled so that each channel has independent markers.
Press Marker Fctn MARKER MODE MENU and select from the following keys:

• Choose MARKERS: COUPLED if you want the analyzer to couple the marker stimulus
values for the display channels.
• Choose MARKERS: UNCOUPLED if you want the analyzer to uncouple the marker
stimulus values for the display channels. This allows you to control the marker
stimulus values independently for each channel.

Figure 1-19 Example of Coupled and Uncoupled Markers

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Making Measurements
Using Markers

To Use Polar Format Markers

The analyzer can display the marker value as magnitude and phase, or as a real/imaginary
pair: LIN MKR gives linear magnitude and phase, LOG MKR gives log magnitude and
phase, Re/Im gives the real value first, then the imaginary value.
You can use these markers only when you are viewing a polar display format. (The format
is available from the Format key.)

NOTE For greater accuracy when using markers in the polar format, it is
recommended to activate the discrete marker mode. Press Marker Fctn
MKR MODE MENU MARKERS:DISCRETE .

1. To access the polar markers, press:

Format POLAR Marker Fctn MARKER MODE MENU POLAR MKR MENU
2. Select the type of polar marker you want from the following choices:

• Choose LIN MKR if you want to view the magnitude and the phase of the active
marker. The magnitude values appear in units and the phase values appear in
degrees.
• Choose LOG MKR if you want to view the logarithmic magnitude and the phase of
the active marker. The magnitude values appear in dB and the phase values appear
in degrees.
• Choose Re/Im MKR if you want to view the real and imaginary pair, where the
complex data is separated into its real part and imaginary part. The analyzer shows
the real part as the first marker value (M cos Θ), and the second value is the
imaginary part (M sin Θ, where M = magnitude).

Figure 1-20 Example of a Log Marker in Polar Format

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 Making Measurements
Using Markers

To Use Smith Chart Markers

For greater accuracy when using markers in the Smith chart format, activate the discrete
marker mode. Press Marker Fctn MKR MODE MENU MARKERS:DISCRETE .
To use Smith chart format:

1. Press Format SMITH CHART .

2. Press Marker Fctn MARKER MODE MENU SMITH MKR MENU and turn the front
panel knob, or enter a value from the front panel keypad to read the resistive and
reactive components of the complex impedance at any point along the trace. This is the
default Smith chart marker.
The marker annotation tells that the complex impedance is capacitive in the bottom
half of the Smith chart display and is inductive in the top half of the display.

• Choose LIN MKR if you want the analyzer to show the linear magnitude and the
phase of the reflection coefficient at the marker.
• Choose LOG MKR if you want the analyzer to show the logarithmic magnitude and
the phase of the reflection coefficient at the active marker. This is useful as a fast
method of obtaining a reading of the log magnitude value without changing to log
magnitude format.
• Choose Re/Im MKR if you want the analyzer to show the values of the reflection
coefficient at the marker as a real and imaginary pair.
• Choose R+jX MKR to show the real and imaginary parts of the device impedance
(the series resistance and reactance, in ohms) at the marker. Also shown is the
equivalent series inductance or capacitance.
• Choose G+jB MKR to show the complex admittance values of the active marker in
rectangular form. The active marker values are displayed in terms of conductance
(in Siemens), susceptance, and equivalent parallel circuit capacitance or inductance.
Siemens are the international unit of admittance and are equivalent to mhos (the
inverse of ohms).

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Making Measurements
Using Markers

Figure 1-21 Example of Impedance Smith Chart Markers

To Set Measurement Parameters Using Markers

The analyzer allows you to set measurement parameters with the markers, without going
through the usual key sequence. You can change certain stimulus and response
parameters to make them equal to the current active marker value.

Setting the Start Frequency

1. Press Marker Fctn and turn the front panel knob, or enter a value from the front panel
keypad to position the marker at the value that you want for the start frequency.
2. Press MARKER→START to change the start frequency value to the value of the active
marker.

Figure 1-22 Example of Setting the Start Frequency Using a Marker

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 Making Measurements
Using Markers

Setting the Stop Frequency

1. Press Marker Fctn and turn the front panel knob, or enter a value from the front panel
keypad to position the marker at the value that you want for the stop frequency.
2. Press MARKER→STOP to change the stop frequency value to the value of the active
marker.

Figure 1-23 Example of Setting the Stop Frequency Using a Marker

Setting the Center Frequency

1. Press Marker Fctn and turn the front panel knob, or enter a value from the front panel
keypad to position the marker at the value that you want for the center frequency.
2. Press MARKER→CENTER to change the center frequency value to the value of the
active marker.

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Making Measurements
Using Markers

Figure 1-24 Example of Setting the Center Frequency Using a Marker

Setting the Frequency Span

You can set the span equal to the spacing between two markers. If you set the center
frequency before you set the frequency span, you will have a better view of the area of
interest.

1. Press Marker ∆MODE MENU ∆REF=1 MARKER 2 .

2. Turn the front panel knob, or enter a value from the front panel keypad to position the
markers where you want the frequency span.
Iterate between marker 1 and marker 2 by pressing MARKER 1 and MARKER 2 ,
respectively, and turning the front panel knob or entering values from the front panel
keypad to position the markers around the center frequency. When finished positioning
the markers, make sure that marker 2 is selected as the active marker.

NOTE Step 2 can also be performed using MKR ZERO and MARKER 1 . However,
when using this method, it will not be possible to iterate between marker zero
and marker 1.

3. Press Marker Fctn MARKER→SPAN to change the frequency span to the range
between marker 1 and marker 2.

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 Making Measurements
Using Markers

Figure 1-25 Example of Setting the Frequency Span Using Marker

Setting the Display Reference Value

1. Press Marker Fctn and turn the front panel knob, or enter a value from the front panel
keypad to position the marker at the value that you want for the analyzer display
reference value.
2. Press MARKER→REFERENCE to change the reference value to the value of the
active marker.

Figure 1-26 Example of Setting the Reference Value Using a Marker

Setting the Electrical Delay

This feature adds phase delay to a variation in phase versus frequency, therefore it is only
applicable for ratioed inputs.

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Making Measurements
Using Markers

1. Press Format PHASE .

2. Press Marker Fctn and turn the front panel knob, or enter a value from the front panel
keypad to position the marker at a point of interest.
3. Press MARKER→DELAY to automatically add or subtract enough line length to the
receiver input to compensate for the phase slope at the active marker position. This
effectively flattens the phase trace around the active marker. You can use this to
measure the electrical length or deviation from linear phase.
Additional electrical delay adjustments are required on devices without constant group
delay over the measured frequency span.

Figure 1-27 Example of Setting the Electrical Delay Using a Marker

Setting the CW Frequency

1. To place a marker at the desired CW frequency, press:
Marker and either turn the front panel knob or enter the value, followed by a unit
terminator.
2. Press Seq SPECIAL FUNCTIONS MKR→CW .
You can use this function to set the marker to a gain peak in an amplifier. After pressing
MKR→CW FREQ , activate a CW frequency power sweep to look at the gain
compression with increasing input power.

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 Making Measurements
Using Markers

To Search for a Specific Amplitude

These functions place the marker at an amplitude-related point on the trace. If you switch
on tracking, the analyzer searches every new trace for the target point.

Searching for the Maximum Amplitude

1. Press Marker Search to access the marker search menu.

2. Press SEARCH: MAX to move the active marker to the maximum point on the
measurement trace.

Figure 1-28 Example of Searching for the Maximum Amplitude Using a Marker

Searching for the Minimum Amplitude

1. Press Marker Search to access the marker search menu.

2. Press SEARCH: MIN to move the active marker to the minimum point on the
measurement trace.

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Making Measurements
Using Markers

Figure 1-29 Example of Searching for the Minimum Amplitude Using a Marker

Searching for a Target Amplitude

1. Press Marker Search to access the marker search menu.

2. Press SEARCH: TARGET to move the active marker to the target point on the
measurement trace.
3. If you want to change the target amplitude value (default is −3 dB), press TARGET
and enter the new value from the front panel keypad. You may also press
Marker Search TARGET VALUE to enter the new value.
4. If you want to search for multiple responses at the target amplitude value, press
SEARCH LEFT and SEARCH RIGHT .

Figure 1-30 Example of Searching for a Target Amplitude Using a Marker

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 Making Measurements
Using Markers

Searching for a Bandwidth

The analyzer can automatically calculate and display the bandwidth (BW:), center
frequency (CENT:), Q, and loss of the device under test at the center frequency. (Q stands
for “quality factor,” defined as the ratio of a circuit's resonant frequency to its bandwidth.)
These values are shown in the marker data readout.

1. Press Marker Search and SEARCH: MAX to place the marker near the center of the
filter passband.
2. Press MKR ZERO if you want the bandwidth relative to the maximum.
3. Press Marker Search to access the marker search menu.
4. Press WIDTHS ON to calculate the center stimulus value, bandwidth, and the Q of a
bandpass or band reject shape on the measurement trace.
5. If you want to change the amplitude value (default is −3 dB) that defines the passband
or reject band, press WIDTH VALUE and enter the new value from the front panel
keypad.

Figure 1-31 Example of Searching for a Bandwidth Using Markers

Tracking the Amplitude that You Are Searching

1. Set up an amplitude search by following one of the previous procedures in "To Search
for a Specific Amplitude" on page 1-39.
2. Press Marker Search TRACKING ON to track the specified amplitude search with
every new trace and put the active marker on that point.
When tracking is not activated, the analyzer finds the specified amplitude on the
current sweep and the marker remains at same stimulus value, regardless of changes in
the trace response value with subsequent sweeps.

1- 41
Making Measurements
Using Markers

To Calculate the Statistics of the Measurement Data

This function calculates the mean, standard deviation, and peak-to-peak values of the
section of the displayed trace between the active marker and the delta reference. If there is
no delta reference, the analyzer calculates the statistics for the entire trace.
1. Move marker 1 to any point that you want to reference:
• Turn the front panel knob.
OR
• Enter the frequency value on the numeric keypad.
2. Press Marker ∆ MODE MENU ∆ REF=1 to make marker 1 a reference marker.
3. Press MARKER 2 and move marker 2 to any position that you want to measure in
reference to marker 1.
4. Press Marker Fctn MKR MODE MENU MKR STATS ON to calculate and view the
mean, standard deviation, and peak-to-peak values of the section of the measurement
data between the active marker and the delta reference marker.
An application for this feature is to find the peak-to-peak value of passband ripple
without searching separately for the maximum and minimum values.
If you are viewing a measurement in the polar or Smith Chart format, the analyzer
calculates the statistics using the first value of the complex pair (magnitude, real part,
resistance, or conductance).

Figure 1-32 Example Statistics of Measurement Data

1-42
 Making Measurements
Measuring Electrical Length and Phase Distortion

Measuring Electrical Length and Phase Distortion

Electrical Length
The analyzer mathematically implements a function similar to the mechanical “line
stretchers” of earlier analyzers. This feature simulates a variable length lossless
transmission line, which you can add to or remove from the analyzer's receiver input to
compensate for interconnecting cables, etc. In this example, the electronic line stretcher
measures the electrical length of a SAW filter.
Phase Distortion
The analyzer allows you to measure the linearity of the phase shift through a device over a
range of frequencies and the analyzer can express it in two different ways:
• deviation from linear phase
• group delay

Measuring Electrical Length

1. Connect your test device as shown in Figure 1-33.

Figure 1-33 Device Connections for Measuring Electrical Length

2. Press Preset and choose the measurement settings. For this example, the
measurement settings include reducing the frequency span to eliminate under-sampled
phase response. Press the following keys as shown:

Meas Trans:FWD S21 (B/R)

Center 134 M/µ

Span 2 M/µ

Format PHASE

Scale Ref AUTO SCALE

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Making Measurements
Measuring Electrical Length and Phase Distortion

You may also want to select settings for the number of data points, averaging, and IF
bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
Cal CALIBRATE MENU RESPONSE THRU
4. Reconnect your test device.
5. To better view the measurement trace, press:
Scale Ref AUTO SCALE
Notice that in Figure 1-34 the SAW filter under test has considerable phase shift within
only a 2 MHz span. Other filters may require a wider frequency span to see the effects
of phase shift.
The linearly changing phase is due to the device’s electrical length. You can measure
this changing phase by adding electrical length (electrical delay) to compensate for it.

Figure 1-34 Linearly Changing Phase

6. To place a marker at the center of the band, press Marker and turn the front panel
knob, or enter a value from the front panel keypad.
7. To activate the electrical delay function, press Marker Fctn MARKER→DELAY .
This function calculates and adds in the appropriate electrical delay by taking a ±10%
span about the marker, measuring the ∆Φ, and computing the delay as the negative of
∆Φ / ∆ frequency.
Alternatively, press Scale Ref ELECTRICAL DELAY and turn the front panel knob
to increase the electrical length until you achieve the best flat line, as shown in Figure
1-35.

1-44
 Making Measurements
Measuring Electrical Length and Phase Distortion

The measurement value that the analyzer displays represents the electrical length of
your device relative to the speed of light in free space. The physical length of your device
is related to this value by the propagation velocity of its medium.

NOTE Velocity factor is the ratio of the velocity of wave propagation in a coaxial
cable to the velocity of wave propagation in free space. Most cables have a
relative velocity of about 0.66 the speed in free space. This velocity depends
on the relative permittivity of the cable dielectric (εr) as

1
Velocity Factor = --------
εr

You could change the velocity factor to compensate for propagation velocity by
pressing Cal MORE VELOCITY FACTOR (enter the value) x1 . This
will allow the analyzer to accurately display the equivalent distance that
corresponds to the entered electrical delay.

Figure 1-35 Example Best Flat Line with Added Electrical Delay

8. To display the electrical length, press Scale Ref ELECTRICAL DELAY .

In this example, there is a large amount of electrical delay due to the long electrical
length of the SAW filter under test.

Measuring Phase Distortion

This portion of the example shows you how to measure the linearity of the phase shift over
a range of frequencies. The analyzer allows you to measure this linearity and read it in two
different ways: deviation from linear phase, or group delay.

1- 45
Making Measurements
Measuring Electrical Length and Phase Distortion

Deviation From Linear Phase

By adding electrical length to “flatten out” the phase response, you have removed the
linear phase shift through your device. The deviation from linear phase shift through your
device is all that remains.
1. Follow the procedure in "Measuring Electrical Length" on page 1-43.
2. To increase the scale resolution, press Scale Ref SCALE DIV and turn the front
panel knob, or enter a value from the front panel keypad.
3. To use the marker statistics to measure the maximum peak-to-peak deviation from
linear phase, press Marker Fctn MKR MODE MENU STATS ON .
4. Activate and adjust the electrical delay to obtain a minimum peak-to-peak value.

NOTE It is possible to use delta markers to measure peak-to-peak deviation in only

one portion of the trace. See "To Calculate the Statistics of the Measurement
Data" on page 1-42.

Figure 1-36 Deviation From Linear Phase Example Measurement

Group Delay
The phase linearity of many devices is specified in terms of group or envelope delay. The
analyzer can translate this information into a related parameter, group delay. Group delay
is the transmission time through your device under test as a function of frequency.
Mathematically, it is the derivative of the phase response which can be approximated by
the following ratio:
−∆Φ /(360 × ∆Φ)
where ∆Φ is the difference in phase at two frequencies separated by ∆F. The quantity ∆F is
commonly called the “aperture” of the measurement. The analyzer calculates group delay
from its phase response measurements.

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 Making Measurements
Measuring Electrical Length and Phase Distortion

The default aperture is the total frequency span divided by the number of points across the
display (i.e. 201 points or 0.5% of the total span in this example).
1. Continue with the same instrument settings and measurements as in the previous
procedure, “Deviation From Linear Phase.”
2. To view the measurement in delay format, as shown in Figure 1-37, press:
Format DELAY Scale Ref SCALE DIV
3. To activate a marker to measure the group delay at a particular frequency, press
Marker and turn the front panel knob, or enter a value from the front panel keypad.

Figure 1-37 Group Delay Example Measurement

Group delay measurements may require a specific aperture (∆)F) or frequency spacing
between measurement points. The phase shift between two adjacent frequency points
must be less than 180°, otherwise incorrect group delay information may result.
4. To vary the effective group delay aperture from minimum aperture (no smoothing) to
approximately 1% of the frequency span, press: Avg SMOOTHING ON .
When you increase the aperture, the analyzer removes fine grain variations from the
response. It is critical that you specify the group delay aperture when you compare
group delay measurements.

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Making Measurements
Measuring Electrical Length and Phase Distortion

Figure 1-38 Group Delay Example Measurement with Smoothing

5. To increase the effective group delay aperture, by increasing the number of

measurement points over which the analyzer calculates the group delay, press:
SMOOTHING APERTURE 5 x1
As the aperture is increased the “smoothness” of the trace improves markedly, but at
the expense of measurement detail.

Figure 1-39 Group Delay Example Measurement with Smoothing Aperture

Increased

Group delay is calculated by dividing the phase difference between points by the frequency
spacing. Thus, if n equals the number of points, the number of phase difference values (or
frequency segments) will be n−1. The first data point is repeated so that the total number
of points remains n.

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 Making Measurements
Characterizing a Duplexer

Characterizing a Duplexer
This measurement example demonstrates how to characterize a 3-port device, in this case
a duplexer, using four-parameter display mode. You must use a test adapter or a special
3-port test adapter to route the signals from the analyzer (a two-port instrument) to the
duplexer (a three-port device). This example procedure is performed using one of the
following test adapters:
❏ 8753D Option K36 Duplexer Test Adapter
❏ 8753D Option K39 3-Port Test Adapter
❏ 8753ES Option H39 3-Port Test Adapter (use the same instructions as those for K39
mode)

Definitions
The following abbreviations are used in reference to a duplexer:
Tx Transmitter port
Ant Antenna port
Rx Receiver port

Procedure
1. Press Preset .
2. Connect the test adapter to the analyzer according to the instructions for your
particular model. Connect any test fixture or cables to the duplexer test adapter. Refer
to Figure 1-40.

NOTE You must have an S-parameter test set connected to your analyzer.

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Making Measurements
Characterizing a Duplexer

Figure 1-40 Duplexer Connections

3. Set up channel 1 for the Tx-Ant stimulus parameters (start/stop frequency, power level,
IF bandwidth). In this example, a wide frequency range that covers both the Tx-Ant and
Ant-Rx parameters has been chosen.
4. Uncouple the primary channels from each other and then press Sweep Setup and
toggle COUPLED CH on OFF to OFF .
5. Press System CONFIGURE MENU USER SETTINGS .
6. Set up the desired mode.

• For K36 mode, toggle K36 MODE on OFF to ON. Then, press Meas
SELECT [TX-ANT] .

• For K39 mode, toggle K39 MODE on OFF to ON. Then, press Meas
SELECT PORTS [1-3] .
7. Perform a full two-port calibration on channel 1 (refer to Chapter 6 , “Calibrating for
Increased Measurement Accuracy,” if necessary).

NOTE Make sure you connect the standards to the Tx port of the test adapter (or a
cable attached to it) for FORWARD calibrations, and to the Ant port for
REVERSE calibrations.

8. Save the instrument state by pressing Save/Recall SAVE STATE .

9. Press Chan 2 .
10.Set up channel 2 for the Ant-Rx stimulus parameters. In this example, a wide frequency
range that covers both the Tx-Ant and Ant-Rx parameters has been chosen.

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 Making Measurements
Characterizing a Duplexer

11.Set up control of the test adapter so that channels 2 and 4 are Rx:

• For K36 mode, press Meas SELECT [RX-ANT] .

• For K39 mode, press Meas SELECT PORTS [2-3] .

12.Perform a full two-port calibration on channel 2.

NOTE Make sure you connect the standards to the Rx port of the test adapter (or a
cable attached to it) for FORWARD calibrations, and to the Ant port for
REVERSE calibrations.

13.Save this state in the analyzer:

Press Save/Recall SAVE STATE .
14.Connect the duplexer to the test adapter.
15.Set up a 2-graticule, 4-parameter display with transmission measurements on the top
graticule and reflection measurements on the bottom graticule:
Press Display DUAL|QUAD SETUP 4-PARAM DISPLAYS SETUP B Meas
Trans: REV S12 (A/R)

Chan 4 Refl: REV S22 (B/R) Chan 1 Trans:FWD S21 (B/R) Chan 3
Refl: FWD S11 (A/R) , then set DUAL CHAN on OFF to ON .
The display will be similar to Figure 1-41.

Figure 1-41 Duplexer Measurement

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Making Measurements
Characterizing a Duplexer

Normally, a 2-port calibration requires a forward and reverse sweep to complete before the
displayed trace updates. For faster tuning, it is possible to set the number of sweeps for the
active display channel (S11 and S21 for channel 1 in this case) to update more often than
the inactive display channel. In this example we choose 8 updates of the forward
parameters to 1 update of the reverse in channel 1, and 8 updates of the reverse to 1
update of the forward in channel 2 (where the active parameters are S22 and S12).

Press Chan 1 System CONFIGURE MENU TESTSET SW CONTINUOUS 8 x1 .

Press Chan 2 System CONFIGURE MENU TESTSET SW CONTINUOUS 8 x1 .

1-52
 Making Measurements
Measuring Amplifiers

Measuring Amplifiers
The analyzer allows you to measure the transmission and reflection characteristics of
many amplifiers and active devices. You can measure scalar parameters such as gain, gain
flatness, gain compression, reverse isolation, return loss (SWR), and gain drift versus time.
Additionally, you can measure vector parameters such as deviation from linear phase,
group delay, complex impedance and AM-to-PM conversion.

Figure 1-42 Amplifier Parameters

When you are measuring a device that is very sensitive to absolute power level, it is
important that you accurately set the power level at either the device input or output. The
analyzer is capable of using an external GPIB power meter and controlling source power
directly. Refer to Chapter 6 , "Calibrating for Increased Measurement Accuracy" for
information on power meter calibration.
This section contains the following measurement examples:
• "Measuring Harmonics (Option 002)" on page 1-54
• "Measuring Gain Compression" on page 1-59
• Measuring Gain and Reverse Isolation Simultaneously

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Making Measurements
Measuring Amplifiers

Measuring Harmonics (Option 002)

The analyzer has the capability of measuring swept second and third harmonics as a
function of frequency in a real-time manner. By using trace math, the second/third
harmonic response can be displayed directly in dBc (dB below the fundamental or carrier).
The ability to display harmonic level versus frequency or RF power allows “real-time”
tuning of harmonic distortion.

Figure 1-43 Absolute Fundamental, 2nd, and 3rd Harmonic Output Levels

Figure 1-44 2nd and 3rd Harmonic Distortion in dBc

1-54
 Making Measurements
Measuring Amplifiers

Making Harmonic Measurements

Perform the following steps to display the absolute power of the fundamental and second
harmonic in dBm.

1. Press Chan 1 Meas INPUT PORTS B to measure the power for the fundamental
frequencies.
2. Press Chan 2 Meas INPUT PORTS B to measure the power for the harmonic
frequencies.
3. Set the start frequency to a value greater than 16 MHz.
4. Press Sweep Setup and select COUPLED CH OFF . Uncoupling the channels allows
you to have the separate sweeps necessary for measuring the fundamental and
harmonic frequencies.
5. Press Power and select CHAN POWER [COUPLED] . Coupling the channel power
allows you to maintain the same fundamental frequency power level for both channels.
6. Press Power and set the power level for both channels.
7. Press Display DUAL | QUAD SETUP and select DUAL CHAN ON .

8. Press Marker and position marker to desired frequency.

9. Press System HARMONIC MEAS SECOND . You can view both the fundamental
power and harmonic power levels at the same time. (Refer to Figure 1-45.)

Figure 1-45 Fundamental and 2nd Harmonic Power Levels in dBm

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To show the second harmonic’s power level relative to the fundamental power in dBc, press
Chan 2 Display MORE and select D2/D1 toD2 ON . This display mode lets you see the
relationship between the fundamental and second or third harmonic in dBc. (Refer to
Figure 1-46.)

Figure 1-46 2nd Harmonic Power Level in dBc

Additional Harmonic Measurements

Vector network analyzers are commonly used to characterize amplifier gain compression
versus frequency and power level. This is essentially linear characterization since only the
relative level of the fundamental input to the fundamental output is measured. The
narrowband receiver is tuned to a precise frequency and, as a result, is immune from
harmonic distortion. You may want to quantify the harmonic distortion itself. Figure 1-47
illustrates a simultaneous measurement of fundamental gain compression and second
harmonic power as a function of input power.

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Measuring Amplifiers

Figure 1-47 Gain Compression and 2nd Harmonic Output Level

Understanding Harmonic Operation

Single-Channel Operation You can view the second or third harmonic alone by using
only one of the analyzer’s channels.

Dual-Channel Operation To make the following types of measurements, uncouple

channels 1 and 2, and switch on dual channel.
• The analyzer measures the fundamental on one channel while measuring the second or
third harmonic on the other channel.
• The analyzer measures the second harmonic on one channel while measuring the third
harmonic on the other channel.
• Using the COUPLED PWR ON off feature, the analyzer measures the fundamental on
channel 1 while measuring the second or third harmonic in dBc on channel 2.
• Using the COUPLED PWR ON off feature, the analyzer couples power between
channels 1 and 2. This is useful when you are using the D2/D1 to D2 feature because
you can change fundamental power and see the resultant change in the harmonic
power.
The analyzer shows the fundamental frequency value on the display. However, a marker in
the active entry area shows the harmonic frequency in addition to the fundamental. If you
use the harmonic mode, the annotation H=2 or H=3 appears on the left-hand side of the
display. The measured harmonic cannot not exceed the frequency limitations of the
network analyzer's receiver.

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Measuring Amplifiers

Coupling Power Between Channels 1 and 2 COUPLED PWR ON off is intended to

be used with the D2/D1 toD2 on OFF softkey. You can use the D2/D1 to D2 function in
harmonic measurements, where the analyzer shows the fundamental on channel 1 and the
harmonic on channel 2. D2/D1 to D2 ratios the two, showing the fundamental and the
relative power of the measured harmonic in dBc. You must uncouple channels 1 and 2 for
this measurement, using the COUPLED CHAN ON off softkey set to OFF to allow
alternating sweeps.
After uncoupling channels 1 and 2, you may want to change the fundamental power and
see the resultant change in relative harmonic power (in dBc). COUPLED PWR ON off
allows you to change the power of both channels simultaneously, even though they are
uncoupled in all other respects.

Frequency Range The frequency range is determined by the upper frequency range of
the instrument or system (3 or 6 GHz) and by the harmonic being displayed. The 6 GHz
operation requires an 8753ES Option 006. Table 1-3 shows the highest fundamental
frequency for maximum frequency and harmonic mode.
Table 1-3 Maximum Fundamental Frequency using Harmonic Mode

Maximum Fundamental Frequency

Harmonic
Measured 8753ES Option 011 8753ES Option 011
with Option 006

3 GHz 6 GHz

2nd Harmonic 1.5 GHz 3 GHz

3rd Harmonic 1.0 GHz 2.0 GHz

Accuracy and input power Refer to the “Specifications and Characteristics” chapter in
the reference guide. The maximum recommended input power and maximum
recommended source power are related specifications.
Using power levels greater than the recommended values may cause undesired harmonics
in the source and receiver. The recommended power levels ensure that these harmonics are
less than −45 dBc. Use test port power to limit the input power to your test device.

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Measuring Amplifiers

Measuring Gain Compression

Gain compression occurs when the input power of an amplifier is increased to a level that
reduces the gain of the amplifier and causes a nonlinear increase in output power. The
point at which the gain is reduced by 1 dB is called the 1 dB compression point. The gain
compression will vary with frequency, so it is necessary to find the worst-case point of gain
compression in the frequency band.
Once that point is identified, you can perform a power sweep of that CW frequency to
measure the input power at which the 1 dB compression occurs and the absolute power out
(in dBm) at compression. The following steps provide detailed instruction on how to apply
various features of the analyzer to accomplish these measurements.

NOTE In a compression measurement it is necessary to know the RF input or output

power at a certain level of gain compression. Therefore, both gain and
absolute power level need to be accurately characterized. Uncertainty in a
gain compression measurement is typically less than 0.05 dB. Also, each
input channel of the analyzer is calibrated to display absolute power
(typically within +0.5 dBm up to 3 GHz, and +1 dB up to 6 GHz). This can be
improved by calibrating the power meter. Refer to "Power Meter
Measurement Calibration" on page 6-33 for information on calibrating the
power meter.

Figure 1-48 Diagram of Gain Compression

1. Set up the stimulus and response parameters for your amplifier under test. To reduce
the effect of noise on the trace, press:
Avg IF BW 1000 x1

Chan 1 Meas Trans:FWD S21 (B/R)

2. Perform the desired error correction procedure. Refer to Chapter 6 , "Calibrating for
Increased Measurement Accuracy" for instructions on how to make a measurement
correction.
3. Connect the amplifier under test.

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Measuring Amplifiers

4. To produce a normalized trace that represents gain compression, perform either step 5
or step 6. (Step 5 uses trace math and step 6 uses uncoupled channels and the display
function D1/D2 to D2 ON .)
5. Press Display DATA →MEMORY DATA/MEM to produce a normalized trace.
6. To produce a normalized trace, perform the following steps:

• Press Display DUAL | QUAD SETUP and select DUAL CHANNEL ON to view
both channels simultaneously.
• Press Chan 2 Meas Trans:FWD S21 (B/R)
• To uncouple the channel stimulus so that the channel power will be uncoupled,
press:
Sweep Setup COUPLED CH OFF
This will allow you to separately increase the power for channel 2 and channel 1, so
that you can observe the gain compression on channel 2 while channel 1 remains
unchanged.
• To display the ratio of channel 2 data to channel 1 data on the channel 2 display,
press:
Chan 2 DISPLAY MORE D2/D1 to D2 ON
This produces a trace that represents gain compression only.
7. Press Marker MARKER 1 and position the marker at approximately mid-span.

8. Press Scale Ref SCALE/DIV x1 to change the scale to 1 dB per division.

9. Press Power .
10.Increase the power until you observe approximately 1 dB of compression on channel 2,
using the step keys or the front panel knob.
11.To locate the worst case point on the trace, press:
Marker Search SEARCH:MIN

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Measuring Amplifiers

Figure 1-49 Gain Compression Using Linear Sweep and D2/D1 to D2 ON

12.If COUPLED CH OFF was selected, recouple the channel stimulus by pressing:
Sweep Setup COUPLED CH ON
13.To place the marker exactly on a measurement point, press:
Marker Fctn MARKER MODE MENU MARKERS:DISCRETE
14.To set the CW frequency before going into the power sweep mode, press:
Seq SPECIAL FUNCTIONS MARKER→ CW

15.Press Sweep Setup SWEEP TYPE MENU POWER SWEEP .

If interpolation is on (the default setting), the calibration will be applied to the power
sweep.
16.Enter the start and stop power levels for the sweep.
Now channel 1 is displaying a gain compression curve. (Do not pay attention to channel
2 at this time.)
17.Press Chan 2 Display DUAL | QUAD SETUP DUAL CHANNEL ON .

18.If D2/D1 to D2 ON was selected, press MORE D2/D1 to D2 OFF .

19.Press Meas INPUT PORTS B.

Now channel 2 displays absolute output power (in dBm) as a function of power input.
20.Press Scale Ref SCALE/DIV 10 x1 to change the scale of channel 2 to 10 dB per
division.
21.Press Chan 1 1 x1 to change the scale of channel 1 to 1 dB per division.

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NOTE A receiver calibration will improve the accuracy of this measurement. Refer
to Chapter 6 , “Calibrating for Increased Measurement Accuracy.”

22.Press Marker Fctn MARKER MODE MENU MARKERS:COUPLED .

23.To find the 1 dB compression point on channel 1, press:
Marker Search SEARCH:MAX Marker MKR ZERO Marker Search
SEARCH:TARGET −1 x1
Notice that the marker on channel 2 tracked the marker on channel 1.
24.Press Chan 2 Marker MKR MODE MENU MARKERS:UNCOUPLED .
25.To take the channel 2 marker out of the ∆ mode so that it reads the absolute output
power of the amplifier (in dBm), press:
Marker ∆ MODE MENU ∆ MODE OFF

Figure 1-50 Gain Compression Using Power Sweep

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 Making Measurements
Measuring Amplifiers

Measuring Gain and Reverse Isolation Simultaneously

Since an amplifier will have high gain in the forward direction and high isolation in the
reverse direction, the gain (S21) will be much greater than the reverse isolation (S12).
Therefore, the power you apply to the input of the amplifier for the forward measurement
(S21) should be considerably lower than the power you apply to the output for the reverse
measurement (S12). By applying low power in the forward direction, you’ll prevent the
amplifier from being saturated. A higher power in the reverse direction keeps noise from
being a factor in the measurement and accounts for any losses caused by attenuators or
couplers on the amplifier’s output needed to lower the output power into the analyzer. The
following steps demonstrate the features that best accomplish these measurements.

1. Press Sweep Setup COUPLED CH ON .

Coupling the channels allows you to have the same frequency range and calibration
applied to channel 1 and channel 2.
2. Press Power PORT POWER [UNCOUPLED] .
Uncoupling the port power allows you to apply different power levels at each port. In
Figure 1-51, the port 1 power is set to −25 dBm for the gain measurement (S 21) and the
port 2 power is set to 0 dBm for the reverse isolation measurement (S12).

3. Press Chan 1 Meas Trans:FWD S21 (B/R) Power and set the power level for
port 1.
4. Press Chan 2 Meas Trans: REV S12 (A/R) Power and set the power level for
port 2.
5. Perform an error-correction and connect the amplifier to the network analyzer. Refer to
the Chapter 5 , “Optimizing Measurement Results,” for error-correction procedures.
6. Press Display DUAL | QUAD SETUP DUAL CHAN ON .
You can view both measurements simultaneously by using the dual channel display
mode. Refer to Figure 1-51. If the port power levels are in different power ranges, one of
the displayed measurements will not be continually updated and the annotation tsH
will appear on the left side of the display. Refer to "Source Attenuator Switch
Protection" on page 7-13 for information on how to override this state.

NOTE To obtain best accuracy, you should set the power levels prior to performing
the calibration. However, the analyzer compensates for nominal power
changes you make during a measurement, so that the error correction still
remains quite valid. In these cases, the Cor annunciator will change to C∆.

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Figure 1-51 Gain and Reverse Isolation

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 Making Measurements
Using the Swept List Mode to Test a Device

Using the Swept List Mode to Test a Device

When using a list frequency sweep, the analyzer has the ability to sweep arbitrary
frequency segments, each containing a list of frequency points. One major advantage of
using list frequency sweep is that it allows you to measure the minimum number of data
points, and only at the frequencies of interest. This serves to minimize the overall test
time. Two different list frequency sweep modes can be selected:
Stepped List
Mode In this mode, the source steps to each defined frequency point, stopping
while data is taken. This mode eliminates IF delay and allows frequency
segments to overlap. However, the sweep time is substantially slower than
for a continuous sweep with the same number of points.
Swept List
Mode This mode takes data while sweeping through the defined frequency
segments, increasing throughput by up to 6 times over a stepped sweep. In
addition, this mode allows the test port power and IF bandwidth to be set
independently for each segment that is defined. The frequency segments in
this mode cannot overlap.
The ability to completely customize the frequency sweep while using swept list mode is
useful when setting up a measurement for a device with high dynamic range, like a filter.
The following measurement of a filter illustrates the advantages of using the swept list
mode.
• For in-depth information on swept list mode, refer to "Swept List Frequency Sweep
(Hz)" on page 7-17.
• For information on optimizing your measurement results when using swept list mode,
refer to "To Use Swept List Mode" on page 5-9.

Connect the Device Under Test

1. Connect the equipment as shown in Figure 1-52.

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Using the Swept List Mode to Test a Device

Figure 1-52 Swept List Measurement Setup

2. Set the following measurement parameters:

Meas Trans: FWD S21 (B/R)

Center 900 M/µ

Span 500 M/µ

Observe the Characteristics of the Filter

Figure 1-53 Characteristics of a Filter

• Generally, the passband of a filter exhibits low loss. A relatively low incident power may
be needed to avoid overdriving the next stage of the DUT (if that stage contains an
amplifier) or the network analyzer receiver.

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Using the Swept List Mode to Test a Device

• Conversely, the stopband of a filter generally exhibits high isolation. To measure this
characteristic, the dynamic range of the system will have to be maximized. This can be
done by increasing the incident power and narrowing the IF bandwidth.

Choose the Measurement Parameters

1. Decide the frequency ranges of the segments that will cover the stopbands and
passband of the filter. For this example, the following ranges will be used:
• Lower stopband: 650 to 880 MHz
• Passband: 880 to 920 MHz
• Upper stopband: 920 to 1150 MHz
2. To set up the swept list measurement, press:
Sweep Setup SWEEP TYPE MENU EDIT LIST

Set Up the Lower Stopband Parameters

3. To set up the segment for the lower stopband, press
ADD

START 650 M/µ

STOP 880 M/µ

NUMBER of POINTS 51 x1
4. To maximize the dynamic range in the stopband (increasing the incident power and
narrowing the IF bandwidth), press
MORE

LIST POWER ON off until ON is selected SEGMENT POWER 10 x1

LIST IF BW ON off until ON is selected SEGMENT IF BW 1000 x1

RETURN DONE

Set Up the Passband Parameters

5. To set up the segment for the passband, press
ADD

CENTER 900 M/µ

SPAN 40 M/µ

STEP SIZE .2 M/µ

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6. To specify a lower power level and a wider IF bandwidth for the passband, press
MORE

SEGMENT POWER −10 x1

SEGMENT IF BW 3700 x1

RETURN DONE

Set Up the Upper Stopband Parameters

7. To set up the segment for the upper stopband, press
ADD

START 920 M/µ

STOP 1150 M/µ

NUMBER of POINTS 51 x1
8. To maximize the dynamic range in the stopband (increasing the incident power and
narrowing the IF bandwidth), press:
MORE

SEGMENT POWER 10 x1

SEGMENT IF BW 300 x1

RETURN DONE

9. Press DONE LIST FREQ [SWEPT] .

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 Making Measurements
Using the Swept List Mode to Test a Device

Calibrate and Measure

1. Remove the DUT and perform a full two-port calibration. Refer to Chapter 6 ,
“Calibrating for Increased Measurement Accuracy.”
2. With the thru connected, set the scale to autoscale to observe the benefits of using
swept list mode.
• The segments used to measure the stopbands have less noise, thus maximizing
dynamic range within the stopband frequencies.
• The segment used to measure the passband has been set up for faster sweep speed
with more measurement points.

Figure 1-54 Calibrated Swept List Thru Measurement

3. Reconnect the filter and adjust the scale to compare results with the first filter
measurement that used a linear sweep.
In Figure 1-55, notice that the noise level has decreased over 10 dB, confirming that the
noise reduction techniques in the stopbands were successful. Also, notice that the
stopband noise in the third segment is slightly lower than in the first segment. This is
due to the narrower IF bandwidth of the third segment (300 Hz).

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Using the Swept List Mode to Test a Device

Figure 1-55 Filter Measurements Using Linear Sweep and Swept List Mode
Using Linear Sweep
(Power: 0 dBm/IF BW: 3700 Hz)

Using Swept List Mode

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 Making Measurements
Using Limit Lines to Test a Device

Using Limit Lines to Test a Device

Limit testing is a measurement technique that compares measurement data to constraints
that you define. Depending on the results of this comparison, the analyzer will indicate if
your device either passes or fails the test.
Limit testing is implemented by creating individual flat, sloping, and single-point limit
lines on the analyzer display. When combined, these lines can represent the performance
parameters for your device under test. The limit lines created on each measurement
channel are independent of each other.
This example measurement shows you how to test a bandpass filter using the following
procedures:
• creating flat limit lines
• creating sloping limit lines
• creating single point limit lines
• editing limit segments
• running a limit test

Setting Up the Measurement Parameters

1. Connect your test device as shown in Figure 1-56.

Figure 1-56 Connections for SAW Filter Example Measurement

2. Press Preset and choose the measurement settings. For this example the
measurement settings are as follows:

• Meas Trans: FWD S21 (B/R)

• Center 134 M/µ

• Span 50 M/µ

• Scale Ref AUTO SCALE

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Using Limit Lines to Test a Device

You may also want to select settings for the number of data points, power, averaging,
and IF bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
Cal CALIBRATE MENU RESPONSE THRU
4. Reconnect your test device.
5. To better view the measurement trace, press:
Scale Ref AUTO SCALE

Creating Flat Limit Lines

In this example procedure, the following flat limit line values are set:

Frequency Range Power Range

127 MHz to 140 MHz −27 dB to −21 dB

100 MHz to 123 MHz −200 dB to −65 dB

146 MHz to 160 MHz −200 dB to −65 dB

NOTE The minimum value for measured data is −200 dB.

1. To access the limits menu and activate the limit lines, press:
System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE
CLEAR LIST YES
2. To create a new limit line, press:
ADD
The analyzer generates a new segment that appears on the center of the display.
3. To specify the limit’s stimulus value, test limits (upper and lower), and the limit type,
press:
STIMULUS VALUE 127 M/µ
UPPER LIMIT −21 x1
LOWER LIMIT −27 x1 DONE

NOTE You could also set the upper and lower limits by using the MIDDLE VALUE
and DELTA LIMITS keys. To use these keys for the entry, press:
MIDDLE VALUE −24 x1 DELTA LIMITS 3 x1
This would correspond to a test specification of −24 ±3 dB.

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Using Limit Lines to Test a Device

4. To define the limit as a flat line, press:

LIMIT TYPE FLAT LINE RETURN
5. To terminate the flat line segment by establishing a single point limit, press:
ADD STIMULUS VALUE 140 M/µ DONE
LIMIT TYPE SINGLE POINT RETURN
Figure 1-57 shows the flat limit lines that you have just created with the following
parameters:
• stimulus from 127 MHz to 140 MHz
• upper limit of −21 dB
• lower limit of −27 dB

Figure 1-57 Example Flat Limit Line

• To create a limit line that tests the low side of the filter, press:

ADD

STIMULUS VALUE 100 M/µ

UPPER LIMIT −65 x1

LOWER LIMIT −200 x1

DONE

LIMIT TYPE FLAT LINE RETURN

ADD

STIMULUS VALUE 123 M/µ

DONE

LIMIT TYPE SINGLE POINT RETURN

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Making Measurements
Using Limit Lines to Test a Device

• To create a limit line that tests the high side of the bandpass filter, press:

ADD

STIMULUS VALUE 146 M/µ

UPPER LIMIT −65 x1

LOWER LIMIT −200 x1

DONE

LIMIT TYPE FLAT LINE RETURN

ADD

STIMULUS VALUE 160 M/µ

DONE

LIMIT TYPE SINGLE POINT RETURN

Figure 1-58 Example Flat Limit Lines

Creating a Sloping Limit Line

This example procedure shows you how to make limits that test the shape factor of a SAW
filter. The following limits are set:

Frequency Range Power Range

123 MHz to 125 MHz −65 dB to −26 dB

144 MHz to 146 MHz −26 dB to −65 dB

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 Making Measurements
Using Limit Lines to Test a Device

1. To access the limits menu and activate the limit lines, press:
System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE
CLEAR LIST YES
2. To establish the start frequency and limits for a sloping limit line that tests the low side
of the filter, press:
ADD STIMULUS VALUE 123 M/µ

UPPER LIMIT −65 x1 LOWER LIMIT −200 x1

DONE LIMIT TYPE SLOPING LINE RETURN

3. To terminate the lines and create a sloping limit line, press:
ADD STIMULUS VALUE 125 M/µ

UPPER LIMIT −26 x1 LOWER LIMIT −200 x1

DONE LIMIT TYPE SINGLE POINT RETURN

4. To establish the start frequency and limits for a sloping limit line that tests the high
side of the filter, press:
ADD STIMULUS VALUE 144 M/µ

UPPER LIMIT −26 x1 LOWER LIMIT −200 x1

DONE LIMIT TYPE SLOPING LINE RETURN

5. To terminate the lines and create a sloping limit line, press:
ADD STIMULUS VALUE 146 M/µ

UPPER LIMIT −65 x1 LOWER LIMIT −200 x1

DONE LIMIT TYPE SINGLE POINT RETURN

You could use this type of limit to test the shape factor of a filter.

Figure 1-59 Sloping Limit Lines

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Making Measurements
Using Limit Lines to Test a Device

Creating Single Point Limits

In this example procedure, the following limits are set:
• from −23 dB to −28.5 dB at 141 MHz
• from −23 dB to −28.5 dB at 126.5 MHz
1. To access the limits menu and activate the limit lines, press:
System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE
CLEAR LIST YES
2. To designate a single point limit line, as shown in Figure 1-60, you must define two
pointers:
• downward pointing, indicating the upper test limit
• upward pointing, indicating the lower test limit
Press:
ADD STIMULUS VALUE 141 M/µ
UPPER LIMIT −23 x1 LOWER LIMIT −28.5 x1 DONE
LIMIT TYPE SINGLE POINT RETURN
ADD STIMULUS VALUE 126.5 M/µ
UPPER LIMIT −23 x1
LOWER LIMIT −28.5 x1 DONE
LIMIT TYPE SINGLE POINT RETURN

Figure 1-60 Example Single Points Limit Line

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 Making Measurements
Using Limit Lines to Test a Device

Editing Limit Segments

This example shows you how to edit the upper limit of a limit line.
1. To access the limits menu and activate the limit lines, press:
System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE
2. To move the pointer symbol (>) on the analyzer display to the segment you wish to
modify, press:
SEGMENT or repeatedly OR SEGMENT and enter the segment number
followed by x1 .
3. To change the upper limit (for example, −20) of a limit line, press:
EDIT UPPER LIMIT −20 x1 DONE

Deleting Limit Segments

1. To access the limits menu and activate the limit lines, press:
System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE
2. To move the pointer symbol (>) on the analyzer display to the segment you wish to
delete, press:
SEGMENT or repeatedly OR SEGMENT and enter the segment number
followed by x1 .
3. To delete the segment that you have selected with the pointer symbol, press:
DELETE

Running a Limit Test

1. To access the limits menu and activate the limit lines, press:

System LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE

Reviewing the Limit Line Segments

The limit table data that you have previously entered is shown on the analyzer display.
• To verify that each segment in your limits table is correct, review the entries by
pressing:
SEGMENT and
• To modify an incorrect entry, refer to the “Editing Limit Segments” procedure, located
earlier in this section.

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Using Limit Lines to Test a Device

Activating the Limit Test

To activate the limit test and the beep fail indicator, press:
System LIMIT MENU LIMIT LINE LIMIT TEST ON BEEP FAIL ON

NOTE Selecting the beep fail indicator BEEP FAIL ON is optional and will add
approximately 50 ms of sweep cycle time. Because the limit test will still work
if the limits lines are off, selecting LIMIT LINE ON is also optional.

The limit test results appear on the right side on the analyzer display. The analyzer
indicates whether the filter passes or fails the defined limit test:
• The message FAIL will appear on the right side of the display if the limit test fails.
• The analyzer beeps if the limit test fails and if BEEP FAIL ON has been selected.
• The analyzer changes the color of the trace to flashing red where the measurement
trace is out of limits.
• A TTL signal on the rear panel BNC connector "LIMIT TEST" provides a pass/fail
(5 V/0 V) indication of the limit test results.

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 Making Measurements
Using Limit Lines to Test a Device

Offsetting Limit Lines

The limit offset functions allow you to adjust the limit lines to the frequency and output
level of your device. For example, you could apply the stimulus offset feature for testing
tunable filters. Or, you could apply the amplitude offset feature for testing variable
attenuators, or passband ripple in filters with variable loss.
This example shows you the offset feature and the limit test failure indications that can
appear on the analyzer display.
1. To offset all of the segments in the limit table by a fixed frequency, (for example,
3 MHz), press:
System LIMIT MENU LIMIT LINE LIMIT LINE OFFSETS
STIMULUS OFFSET 3 M/µ
The analyzer beeps and a FAIL notation appears on the analyzer display, as shown in
Figure 1-61.

Figure 1-61 Example Stimulus Offset of Limit Lines

• To return to 0 Hz offset, press:

STIMULUS OFFSET 0 x1
• To offset all of the segments in the limit table by a fixed amplitude, press:
AMPLITUDE OFFSET 5 x1
The analyzer beeps and a FAIL notation appears on the analyzer display.
• To return to 0 dB offset, press:
AMPLITUDE OFFSET 0 x1
• To offset the amplitude offset value by the active marker reading, press
MARKER → AMP. OFS. . Pressing AMPLITUDE OFFSET shows the current value.

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Making Measurements
Using Ripple Limits to Test a Device

Using Ripple Limits to Test a Device

Setting Up the List of Ripple Limits to Test

Two tasks are involved in preparing for ripple testing:
• First, set up the analyzer settings to view the frequency of interest.
• Second, set up the analyzer to test over the appropriate frequencies against your
specific limits.
This example will show you how to set up the analyzer to test ripple limits. In this
example, we will be testing the pass band of a bandpass filter where the center frequency
of the filter is approximately 1.8 GHz and has a bandwidth of approximately 2.9 GHz.
Refer to Figure 1-62.

Figure 1-62 Bandpass Filter Being Ripple Tested

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 Making Measurements
Using Ripple Limits to Test a Device

Setting Up the Analyzer to Perform the Ripple Test

This section sets up the analyzer so that a bandpass filter can be easily viewed on the
analyzer display.
1. Connect your filter as shown in Figure 1-63.

Figure 1-63 Connections for an Example Ripple Test Measurement

2. Press Preset and choose the measurement settings. For this example, the
measurement settings are as follows:

• Meas Trans: FWD S21 (B/R)

• Center 1.8 G/n

• Span 3.4 G/n

• Scale Ref AUTO SCALE

You may also want to select settings for the number of data points, power, averaging,
and IF bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
Cal CALIBRATE MENU RESPONSE THRU
4. Reconnect your test device.
5. To better view the measurement trace, press Scale Ref AUTO SCALE . Refer to
Figure 1-64.

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Making Measurements
Using Ripple Limits to Test a Device

Figure 1-64 Filter Pass Band Before Ripple Test

Setting Up Limits for Ripple Testing

This section instructs you on setting up the ripple test parameters. You must set up the
analyzer to check the DUT at the correct frequencies and compare the measured values
against the maximum allowable ripple value for each frequency band. To do this, you set
up individual frequency bands. You define the stop and start frequency and the maximum
allowable ripple value of each frequency band. You may set up as many as 12 frequency
bands for testing ripple. The frequency bands are combined in a list that is displayed while
the ripple frequency bands are being edited.
In this example, we will create one ripple limit (or frequency band) that spans the entire
pass band from 500 MHz to 3.0 GHz. We will also create two additional frequency bands
that when merged, will span the pass band with tighter limits. Using the Ripple Edit
Menu, we will create a ripple limits list on the analyzer that is similar to the following
table.
Table 1-4 Ripple Limits for Ripple Test Example

Frequency Minimum Maximum Maximum

Band Frequency Frequency Ripple

1 500 MHz 3.2 GHz 2.0 dB

2 500 MHz 1.85 GHz 1.3 dB

3 1.85 GHz 3.2 GHz 1.3 dB

Notice that Frequency Band 1 overlaps in frequency the remaining frequency bands.
Whereas, Frequency Bands 2 and 3 are separate bands that cover the same span of
frequency. This can be done to put tighter limits over narrower frequency spans within the
bandpass or to customize the ripple test to meet your specific requirements.

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1. To access the ripple test menu, press:

System LIMIT MENU RIPPLE LIMIT

2. To access the ripple test edit menu, press EDIT RIPL LIMIT .
3. Add the first frequency band (Frequency Band 1) to be tested by pressing ADD .
4. Set the lower frequency value of Frequency Band 1 by pressing:
MINIMUM FREQUENCY 500 M/µ
5. Set the upper frequency value of Frequency Band 1 by pressing:
MAXIMUM FREQUENCY 3.2 G/n
6. Set the maximum allowable ripple amplitude value of Frequency Band 1 by pressing:
MAXIMUM RIPPLE 2.0 x1
7. Repeat steps 3 through 6 for the two remaining frequency bands to be tested for
maximum ripple.
The network analyzer allows you to enter up to 12 frequency bands to be tested for
maximum ripple.
8. After you have entered all of the ripple test frequency band parameters, return to the
ripple test menu by pressing DONE .

Editing Ripple Test Limits

Once the frequency band limits for ripple testing have been created, the limits may be
changed using the same menu that was used to create them. Using the edit ripple test
menu, you may:
• Change existing frequency band limits
• Add more frequency band limits
• Delete individual frequency band limits
• Clear all frequency band limits

Changing Existing Frequency Band Limits

Existing frequency band limits may be changed for testing the ripple. This procedure
guides you through changing the existing frequency band limits.
1. To access the ripple test edit menu from the ripple test menu, press:
EDIT RIPL LIMIT
2. Enter the frequency band whose limits you want to change by pressing:

a. FREQUENCY BAND
b. The numeric key indicating the frequency band number that you are changing.
The frequency band number is located in the left column of the list of frequency
bands.

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3. Make the changes to the selected band by pressing:

a. MINIMUM FREQUENCY and the new value to change the lower frequency of the
frequency band.
b. MAXIMUM FREQUENCY and the new value to change the upper frequency of the
frequency band.
c. MAXIMUM RIPPLE and the new decibel value to change the maximum allowable
ripple of the frequency band. Terminate the new decibel value with the x1 key.
4. Repeat steps 2 and 3 for additional frequency bands.
5. After you have entered the necessary changes to the ripple test frequency band
parameters, return to the ripple test menu by pressing DONE .

Adding Additional Frequency Bands

More frequency band limits may be added for testing the ripple. This procedure guides you
through adding the more frequency band limits.
The network analyzer allows you to enter up to 12 frequency bands for maximum ripple
testing.

1. To access the ripple test edit menu, press EDIT RIPL LIMIT .
2. Create a new frequency band by pressing ADD
3. Set the lower frequency value of the frequency band by pressing:

a. MINIMUM FREQUENCY
b. the numeric keys indicating the minimum frequency value of the frequency band
c. the appropriate frequency key (either G/n , M/µ , or k/m )
4. Set the upper frequency value of the frequency band by pressing:

a. MAXIMUM FREQUENCY
b. the numeric keys indicating the maximum frequency value of the frequency band
c. the appropriate frequency key (either G/n , M/µ , or k/m )
5. Set the maximum allowable ripple amplitude value of the frequency band by pressing:

a. MAXIMUM RIPPLE
b. the decibel value of the frequency band’s maximum allowable ripple
c. x1
6. Repeat steps 2 through 5 for additional frequency bands to be tested for maximum
ripple.
7. After you have added all of the new frequency bands, return to the ripple test menu by
pressing DONE .

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Deleting Existing Frequency Bands

Frequency band limits may be deleted for testing the ripple. This procedure guides you
through deleting existing frequency band limits. You may delete individual frequency
bands or delete all of the frequency bands from the list.
1. To access the ripple test edit menu, press:
EDIT RIPL LIMIT
2. Select the first frequency band (as an example, Frequency Band 3) to be deleted by
pressing:
FREQUENCY BAND 3 x1 DELETE
3. Repeat step 2 until you have deleted the required frequency bands from the list.
4. If you need to delete all of the frequency bands, you can delete them all by pressing:
CLEAR LIST
When this softkey is pressed, you will be asked to confirm that you want to delete all of
the frequency bands from the list.
5. After you have finished deleting the frequency bands, you can return to the ripple test
menu by pressing DONE .

Running the Ripple Test

Once the list of ripple limits has been set up, you are ready to run the ripple test. From the
Ripple Test Menu, you can:
• Start and stop the ripple test.
• Display and hide the ripple test limit lines.
• Select a frequency band and display its ripple measurement in two ways:
❏ the absolute measured ripple value
❏ the margin which the measured ripple passes or fails the user-defined maximum
ripple value

Starting and Stopping the Ripple Test

Once the list of ripple limits has been set up, start the ripple test by pressing
RIPL TEST on OFF from the Ripple Test Menu until ON is displayed on the softkey.
Pressing this softkey toggles the analyzer between ripple test on and ripple test off status.
Figure 1-65 shows the filter pass band (with the scale changed to 1 dB/division) being
ripple tested. Note that the filter fails the ripple test. The portions of the pass band trace
which do not meet the test requirements are displayed in red.

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Using Ripple Limits to Test a Device

Figure 1-65 Filter Passband with Ripple Test Activated

As the analyzer measures the ripple, a message is displayed indicating whether the
measurement passes or fails:
• If the ripple test passes, a RIPLn PASS message (where n = the channel number) is
displayed in the color assigned to Channel 1 Memory. The ripple test must pass in all
frequency bands before the pass message is displayed.
• If the ripple test fails, a RIPLn FAIL message (where n = the channel number) is
displayed in red. The portion of the trace that exceeds the user-specified maximum
ripple value is also displayed in red.

Displaying the Ripple Limits

After the list of ripple limits has been set up, display the ripple test limits by pressing
RIPL LIMIT on OFF from the Ripple Test Menu until ON is displayed on the softkey.
Pressing this softkey toggles the analyzer ripple limits display on and off. If the ripple
limits are displayed and the ripple test is off, the ripple limits are displayed near the top of
the graticule and are not compared with the displayed trace. However, once the ripple test
is started, the ripple limits are displayed with respect to the measured trace in the
following manner:
• If the ripple test passes, the ripple limits are drawn on the display for each frequency
band. Within each frequency band, an upper and lower ripple limit is drawn such that
they are equidistant above the upper point of the measured trace and below the lower
point of the measured trace.

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• If the ripple test fails, the ripple limits are drawn on the display for each frequency
band. Within each frequency band, the lower ripple limit is drawn at the lowest point on
the measured trace and the upper ripple limit is drawn at the user-specified maximum
ripple value above the lower ripple limit. The ripple that exceeds the maximum ripple
value extends above the upper limit. This measured trace that extends above the upper
limit is displayed in red.
Figure 1-66 shows the filter pass band tested with the ripple limits activated. Notice that
there are three sets of ripple limits shown. Also notice that the measured trace exceeds the
upper ripple limit only in Frequency Band 3.

Figure 1-66 Filter Pass Band with Ripple Test and Ripple Limits Activated

Changing the Ripple Limits Line Color. The color of the lines that represent the
ripple limits can be changed by:

1. pressing the Display key

2. pressing MORE ADJUST DISPLAY MODIFY COLORS MORE

3. pressing RIPPLE LIM LINES TINT and turning the analyzer front panel knob until
the desired color appears (You may also use the step keys or the numeric keypad
instead of the front panel knob to change the color.)

Checking the Ripple Value

Once the ripple test has been started and is running, you may display the ripple value of
each frequency band in one of two formats, the absolute format or the margin format. Both
formats are described in this section.

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To display the ripple value, press RIPL VALUE [ ] . Pressing this softkey toggles
between RIPL VALUE [OFF ] , RIPL VALUE [ABSOLUTE ] , and
RIPL VALUE [MARGIN ] . RIPL TEST on OFF from the Ripple Test Menu until ON is
displayed on the softkey. Pressing this softkey toggles the analyzer between ripple test on
and ripple test off status.
When the Absolute and Margin choices are selected, the frequency band and measurement
value are displayed to the right side of the pass/fail message described previously. This
display is displayed in the same color as the pass/fail message.
The frequency band of the displayed value is displayed as Bn (where n = the frequency
band number). The frequency band may be changed to display the value of each band. To
change the displayed frequency band value, from the Ripple Test Menu press
RIPL VALUE BAND and then use the and keys (or the numerical keypad) to
select the desired frequency band.

Viewing the Ripple Value in Absolute Format

When RIPL VALUE [ABSOLUTE ] is selected, the absolute ripple value of the selected
frequency band is displayed. The absolute ripple value is the measured maximum level
minus the measured minimum level within the frequency band. This value is displayed in
dB.
Figure 1-67. shows the ripple test with absolute ripple value displayed for Frequency
Band 1. The B1 indicates that the ripple value displayed is for Frequency Band 1. Notice
that Frequency Band 1 passes the ripple test. It has an absolute ripple value of 1.675 dB
while the maximum ripple value entered for Frequency Band 1 was 2.0 dB. Thus, even
though the ripple test fails because of Frequency Band 3, the ripple passes in Frequency
Band 1.

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Using Ripple Limits to Test a Device

Figure 1-67. Filter Pass Band with Absolute Ripple Value for Band 1 Activated

Viewing the Ripple Value in Margin Format

When RIPL VALUE [MARGIN ] is selected, the margin by which the ripple value passed
or failed is displayed. The ripple value margin is the user-defined maximum ripple minus
the absolute ripple value within the frequency band. This value is displayed in dB. A
positive value is the margin by which the ripple passes the ripple test in the frequency
band. A negative value is the margin by which the ripple fails the ripple test in the
frequency band.

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Figure 1-68 shows the ripple test with margin ripple value displayed for Frequency
Band 2. Notice that Frequency Band 2 passes the ripple test with a margin of 0.097 dB.
The plus sign (+) indicates this band passes the ripple test by the amount displayed. A
minus sign (−) would indicate that the band failed by the displayed amount.

Figure 1-68 Filter Pass Band with Margin Ripple Value for Band 2 Activated

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 Making Measurements
Using Bandwidth Limits to Test a Bandpass Filter

Using Bandwidth Limits to Test a Bandpass Filter

The bandwidth testing mode can be used to test the bandwidth of a bandpass filter. The
bandwidth test finds the peak of a signal in the passband and locates a point on each side
of the passband at an amplitude below the peak (that you specify during the test setup).
The frequency between these two points is the bandwidth of the filter. This bandwidth is
compared to minimum and maximum allowable bandwidths that you specify during the
test setup.
This example shows you how to test the bandwidth of a bandpass filter. In this example,
we will be testing the pass band of a bandpass filter where the center frequency of the
filter is approximately 321 MHz. Refer to Figure 1-69.

Figure 1-69 Bandpass Filter Being Bandwidth Tested

Setting Up Bandwidth Limits

When you set up the bandwidth limits to test the bandpass filter, you will first set up the
analyzer to perform the bandwidth test and then you will set up bandwidth limits of the
bandwidth test.

Setting Up the Analyzer to Perform the Bandwidth Test

This section sets up the analyzer so that a bandpass filter can be easily viewed on the
analyzer display.
1. Connect your filter as shown in Figure 1-70.

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Using Bandwidth Limits to Test a Bandpass Filter

Figure 1-70 Connections for a Bandpass Filter Example Measurement

2. Press Preset and choose the measurement settings. For this example, the
measurement settings are as follows:

a. Meas Trans: FWD S21 (B/R)

b. Center 321 M/µ

c. Span 200 M/µ

d. Scale Ref AUTO SCALE

You may also want to select settings for the number of data points, power, averaging,
and IF bandwidth.

Figure 1-71 Filter Pass Band Before Bandwidth Test

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3. Substitute a thru for the device and perform a response calibration by pressing:
Cal CALIBRATE MENU RESPONSE THRU
4. Reconnect your test device.
Refer to Figure 1-71.

Setting Up the Bandwidth Limits

When you set up the bandwidth limits to test the bandpass filter, you will set
• the amplitude below the peak that is used to measure the filter’s bandwidth. This
setting is called N dB Points.
• the Maximum Bandwidth value. If the measured bandwidth is greater than this value,
the test will fail.
• the Minimum Bandwidth value. If the measured bandwidth is less than this value, the
test will fail.
1. To access the bandwidth menu, press:
System LIMIT MENU BANDWIDTH LIMIT
2. To set the amplitude below the peak passband amplitude that you want to measure the
bandwidth. In this case, we are setting the bandwidth that will be measured 40 dB
below the peak amplitude of the bandpass filter by pressing:
N DB POINTS 40 x1
3. To set the minimum bandwidth for the bandwidth test, press:
MINIMUM BANDWIDTH 100 M/µ
4. To set the maximum bandwidth for the bandwidth test, press:
MAXIMUM BANDWIDTH 150 M/µ

Running a Bandwidth Test

After setting up the bandwidth limits, you are ready to run the bandwidth test and check
the test results. For this example, we will:
• Start the test.
• Display the bandwidth markers.
• Review the test results.

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Using Bandwidth Limits to Test a Bandpass Filter

Activating the Bandwidth Test

1. Start the bandwidth test by pressing the BW TEST on OFF softkey until ON is
displayed.
The bandwidth test continues to run until the softkey is returned to the OFF position.
The test displays a message in the upper left corner of the graticule showing that the
bandwidth test is being performed and the channel on which the test is being
performed. For example, BW1: indicates that the bandwidth test is being run on
channel 1. See Figure 1-72.
The test also displays a message indicating whether the filter passes or fails the
bandwidth test. When the filter is passing the test, the message indicates Pass. When
the filter is failing the test, the failure message indicates either Wide (when the pass
band is wider than the maximum bandwidth input) or Narrow (when the pass band is
narrower than the minimum bandwidth input).
When the filter passes the bandwidth test, the color of the bandwidth test Pass message
is green. When the filter fails the bandwidth test, the color of the bandwidth test
Wide/Narrow message is red.

Figure 1-72 Filter Pass Band with Bandwidth Test Activated

Displaying the Bandwidth Markers

1. Display the bandwidth markers by pressing the BW MARKER on OFF softkey until
ON is displayed on the softkey.
When the bandwidth markers are displayed, a marker is placed on each side of the peak
amplitude at a position equal to the N dB Points value below the peak. The markers are
placed at the 40 dB points on the signal in Figure 1-73. The bandwidth markers
resemble the following symbol: T

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 Making Measurements
Using Bandwidth Limits to Test a Bandpass Filter

Figure 1-73 Bandwidth Markers Placed 40 dB Below the Bandpass Peak

Displaying the Bandwidth Value

1. Display the bandwidth value by pressing the BW DISPLAY on OFF softkey until ON
is displayed on the softkey.
When this softkey is set to the ON position, the measured bandwidth value is displayed
in the upper left corner of the display, to the right of the bandwidth Pass/Wide/Narrow
message. This value changes as the analyzer continues measuring the bandwidth. The
bandwidth value is displayed in Figure 1-74.
If the filter is failing the bandwidth test, the color of the bandwidth value is red, the
same color as the failure (Wide) message of Figure 1-72. If the filter is passing the
bandwidth test, the displayed bandwidth value is green (the same color as the
bandwidth test Pass message).

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Figure 1-74 Filter Pass Band with Bandwidth Value Displayed

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 Making Measurements
Using Test Sequencing

Using Test Sequencing

Test sequencing allows you to automate repetitive tasks. As you make a measurement, the
analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a
single key. Because the sequence is defined with normal measurement keystrokes, you do
not need additional programming expertise. Subroutines and limited decision-making
increases the flexibility of test sequences. In addition, the GPIO outputs can be controlled
in a test sequence, and the GPIO inputs can be tested in a sequence for conditional
branching.
The test sequence function allows you to create, title, save, and execute up to six
independent sequences internally. You can also save sequences to disk and transfer them
from the analyzer to another analyzer or possibly to an external computer controller (so
the sequence can be sent to another analyzer).

How to Use Test Sequencing

The following procedures, which are based on an actual measurement example, show you
how to do the following:
• create a sequence
• title a sequence
• edit a sequence
• clear a sequence
• change a sequence title
• name files generated by a sequence
• store a sequence
• load a sequence
• purge a sequence
• print a sequence

Creating a Sequence
1. To enter the sequence creation mode, press:
Seq NEW SEQ/MODIFY SEQ
As shown in Figure 1-75, a list of instructions appear on the analyzer display to help
you create or edit a sequence.

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Using Test Sequencing

Figure 1-75 Test Sequencing Help Instructions

2. To select a sequence position in which to store your sequence, press:

SEQUENCE 1 SEQ1
This choice selects sequence position #1. The default title is SEQ1 for this sequence.
Refer to "Changing the Sequence Title" on page 1-102 for information on how to modify
a sequence title.
3. To create a test sequence, enter the parameters for the measurement that you wish to
make. For this example, a SAW filter measurement is set up with the following
parameters:

Save/Recall SELECT DISK INTERNAL MEMORY

Use the front panel knob to scroll until Preset State is highlighted on the display.
RETURN RECALL STATE

Meas Trans: FWD S21 (B/R)

Format LOG MAG

Center 134 M/µ

Span 50 M/µ

Scale Ref AUTOSCALE

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The previous keystrokes will create a displayed list as shown:

Start of Sequence
RECALL PRST STATE
Trans: FWD S21 (B/R)
LOG MAG
CENTER
134 M/u
SPAN
50 M/u
SCALE/DIV
AUTO SCALE
4. To complete the sequence creation, press:
Seq DONE SEQ MODIFY

CAUTION When you create a sequence, the analyzer stores it in volatile memory where
it will be lost if you switch off the instrument power (except for sequence #6
which is stored in the analyzer non-volatile memory). However, you may store
sequences to a floppy disk.

Running a Sequence
To run a stored test sequence, press:
Preset and the softkey labeled with desired sequence number.
or, press:
Seq DO SEQUENCE and the softkey labeled with the desired sequence number

Stopping a Sequence
To stop a sequence before it has finished, press Local .

Editing a Sequence

Deleting Commands
1. To enter the creation/editing mode, press:
Seq NEW SEQ/MODIFY SEQ
2. To select the particular test sequence you wish to modify (sequence 1 in this example),
press:
SEQUENCE 1 SEQ1

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Using Test Sequencing

3. To move the cursor to the command that you wish to delete, press:
or
• If you wish to scroll through the sequence without executing each line as you do so,
you can press the key and scroll through the command list backwards.
• If you use the key to move the cursor through the list of commands, the
commands are actually performed when the cursor points to them. This feature
allows the sequence to be tested one command at a time.
4. To delete the selected command, press:
(backspace key)
5. Press Seq DONE SEQ MODIFY to exit the modify (edit) mode.

Inserting a Command
1. To enter the creation/editing mode, press:
Seq NEW SEQ/MODIFY SEQ
2. To select the particular test sequence you wish to modify (sequence 1 in this example),
press:
SEQUENCE 1 SEQ1
3. To insert a command, move the cursor to the line immediately above the line where you
want to insert a new command, by pressing:
or

• If you use the key to move the cursor through the list of commands, the
commands are actually performed when the cursor points to them. This feature
allows the sequence to be tested one command at a time.
• If you wish to scroll through the sequence without executing each line as you do so,
you can press the key and scroll through the command list backwards.
4. To enter the new command, press the corresponding analyzer front panel keys. For
example, if you want to activate the averaging function, press:
Avg AVERAGING ON

5. Press Seq DONE SEQ MODIFY to exit the modify (edit) mode.

Modifying a Command
1. To enter the creation/editing mode, press:
Preset Seq NEW SEQ/MODIFY SEQ
2. To select the particular test sequence you wish to modify, (sequence 1 in this example),
press:
SEQUENCE 1 SEQ1

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 Making Measurements
Using Test Sequencing

The following list is the commands entered in "Creating a Sequence" on page 1-97.
Notice that for longer sequences, only a portion of the list can appear on the screen at
one time.
Start of Sequence
RECALL PRST STATE
Trans: FWD S21 (B/R)
LOG MAG
CENTER
134 M/u
SPAN
50 M/u
SCALE/DIV
AUTO SCALE
3. To change a command (for example, the span value from 50 MHz to 75 MHz), move the
cursor (→) next to the command that you wish to modify, press:
or

• If you use the key to move the cursor through the list of commands, the
commands are actually performed when the cursor points to them. This feature
allows the sequence to be tested one command at a time.
• If you wish to scroll through the sequence without executing each line as you do so,
you can press the key and scroll through the command list backwards.
4. To delete the current command (for example, span value), press:

5. To insert a new value (for example, 75 MHz), press:

75 M/µ

6. Press Seq DONE SEQ MODIFY to exit the modify (edit) mode.

Clearing a Sequence from Memory

1. To enter the menu where you can clear a sequence from memory, press:
Seq MORE CLEAR SEQUENCE
2. To clear a sequence, press the softkey of the particular sequence.

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Using Test Sequencing

Changing the Sequence Title

If you are storing sequences on a disk, you should replace the default titles (SEQ1,
SEQ2, …).
1. To select a sequence that you want to retitle, press:

Seq MORE TITLE SEQUENCE and select the particular sequence softkey.
The analyzer shows the available title characters. The current title is displayed in the
upper-left corner of the screen.
2. You can create a new file name in two ways:
• If you have an attached DIN keyboard, you can press the f6 function key on the
keyboard and type the new file name.
• If you do not have an attached DIN keyboard, press ERASE TITLE and turn the
front panel knob to point to the characters of the new file name, pressing
SELECT LETTER as you stop at each character.
The analyzer cannot accept a title (file name) that is longer than eight characters. Your
titles must also begin with a letter, and contain only letters and numbers.
3. To complete the titling, press DONE .

Naming Files Generated by a Sequence

The analyzer can automatically increment the name of a file that is generated by a
sequence using a loop structure. (See example "Loop counter decision making" on page
1-112.)
To access the sequence file name menu, press:

• Save/Recall

• FILE UTILITIES

• SEQUENCE FILENAMING
This menu presents two choices:

• FILE NAME FILE0 supplies a name for the saved state or data file. This also brings
up the Title File Menu.
• PLOT NAME PLOTFILE supplies a name for the plot file generated by a plot-to-disk
command. This also brings up the Title File Menu.
These keys show the current file name in the 2nd line of the softkey.
When titling a file for use in a loop function, you are restricted to only 2 characters in the
file name due to the 6 character length of the loop counter keyword “[LOOP].” When the
file is actually written, the [LOOP] keyword is expanded to only 5 ASCII characters
(digits), resulting in a 7 character file name.
After entering the 2 character file name, press:
LOOP COUNTER DONE

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Storing a Sequence on a Disk

1. To format a disk, refer to Chapter 4 , “Printing, Plotting, and Saving Measurement
Results.”
2. To save a sequence to the internal disk, press:
Seq MORE STORE SEQ TO DISK and select the particular sequence softkey.
The disk drive access light should turn on briefly. When it goes out, the sequence has
been saved.

CAUTION The analyzer will overwrite a file on the disk that has the same title.

CAUTION Do not mistake the line switch for the disk eject button.

Loading a Sequence from Disk

For this procedure to work, the desired file must exist on the disk in the analyzer drive.
1. To view the first six sequences on the disk, press:
Seq MORE LOAD SEQ FROM DISK READ SEQ FILE TITLS

• If the desired sequence is not among the first six files, press:
READ SEQ FILE TITLS until the desired file name appears.
2. Press the softkey next to the title of the desired sequence. The disk access light should
illuminate briefly.

NOTE If you know the title of the desired sequence, you can title the sequence (1–6)
with the name, and load the sequence. This is also how you can control the
sequence number of an imported titled sequence.

Purging a Sequence from Disk

1. To view the contents of the disk (six titles at a time), press:
Seq MORE STORE SEQ TO DISK PURGE SEQUENCES
READ SEQ FILE TITLS

• If the desired sequence is not among the first six files, press:
READ SEQ FILE TITLS until the desired file name appears.
2. Press the softkey next to the title of the desired sequence. The disk access light should
illuminate briefly.

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Using Test Sequencing

Printing a Sequence
1. Configure a compatible printer to the analyzer. (Refer to the “Options and Accessories”
chapter of the reference guide.)
2. To print a sequence, press:
Seq MORE PRINT SEQUENCE and the softkey for the desired sequence.

NOTE If the sequence is on a disk, load the sequence (as described in a previous
procedure) and then follow the printing sequence.

In-Depth Sequencing Information

Features That Operate Differently When Executed in a Sequence

The analyzer does not allow you to use the following keys in a sequence:
and keys
Preset key, and

(backspace key)

Commands That Sequencing Completes Before the Next Sequence Command

Begins
The analyzer completes all operations related to the following commands before continuing
with another sequence command:
• single sweep
• number of groups
• auto scale
• marker search
• marker function
• data (→ ) memory
• recall or save (internal or external)
• copy list values and operating parameters
• CHAN1, CHAN2, Wait 0*
*Wait 0 is the special sequencing function WAIT x with a zero entered for the delay value.

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Using Test Sequencing

Commands That Require a Clean Sweep

Many front panel commands disrupt the sweep in progress, for example, changing the
channel or measurement type. When the analyzer does execute a disruptive command in a
sequence, some instrument functions are inhibited until a complete sweep is taken. This
applies to the following functions:
• autoscale
• data → memory

Forward Stepping in Edit Mode

In the sequence modify mode, you can step through the selected sequence list, where the
analyzer executes each step using the .

Titles
A title may contain non-printable or special ASCII characters if you download it from an
external controller. A non-printable character is represented on the display as π.

Sequence Size
A sequence may contain up to 2 kbytes of instructions. Typically, this is around 200
sequence command lines. To estimate a sequence's size (in kbytes), use the following
guidelines.
Table 1-5 Guidelines for Determining the Size of a Sequence

Type of Command Size in Bytes

Typical command 2

Title string character 1

Active entry command 1 per digit

Embedding the Value of the Loop Counter in a Title

You can append a sequentially increasing or decreasing numeric value to the title of stored
data by placing a Display MORE TITLE MORE LOOP COUNTER command after
the title string. (You must limit the title to three characters if you will use it as a disk file
name. The three-character title and five-digit loop counter number reach the
eight-character limit for disk file names.) This feature is useful in data logging
applications.

Autostarting Sequences
You can define a sequence to run automatically when you apply power to the analyzer. To
make an autostarting sequence, create a sequence in position six (SEQ6) and title it
“AUTO”. To stop an autostarting sequence, press Local . To stop an autostarting sequence
from engaging at power on, you must clear it from memory or rename it.

NOTE Presetting the instrument does not run the Auto Sequence automatically.

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Gosub Sequence Command

The GOSUB SEQUENCE softkey, located in the Sequencing menu, activates a feature
that allows the sequence to branch off to another sequence, then return to the original
sequence. For example, you could perform an amplifier measurement in the following
manner:
1. Create sequence 1 for the specific purpose of performing the gain measurement and
printing the results. This sequence will act as a sub-routine.
2. Create sequence 2 to set up a series of different input power levels for the amplifier gain
measurements. In-between each power level setting, call sequence 1 as a sub-routine by
pressing GOSUB SEQUENCE SEQUENCE 1 . Now, sequence 2 will print the
measurement results for each input power level applied to the amplifier.

NOTE The GOSUB SEQUENCE softkey branches the sequence to another

sequence in a particular location (SEQ1 through SEQ6), not to a given file
name.

The GPIO Mode

The instrument’s parallel port can be used in two different modes. By pressing Local and
then toggling the PARALLEL [ ] softkey, you can select either the [COPY] mode or the
[GPIO] mode.
The GPIO mode switches the parallel port into a “general purpose input/output” port.
In this mode, the port can be connected to test fixtures, power supplies, and other
peripheral equipment that the analyzer can interact with through test sequencing.

TESTSET I/O
The TESTSET I/O interconnect on the rear panel was originally intended for use solely
with the HP/Agilent 85046A/B and HP/Agilent 85047B external S-parameter test sets.
Since the introduction of the 8753D, a network analyzer with an internal test set, this test
set I/O port has become a general purpose control port for a variety of external devices,
such as the K36 or K39 test adapters and Option 014 configurations. Refer Table 1-6 on
page 1-110 for the definition of each pin of the test set I/O connector.

CAUTION +22 volts is available on the TESTSET I/O connector. Be careful not to
connect this to a printer port or to sensitive electronic equipment.

This connector, with the limit output, TTL OUT and TESTSET I/O outputs can also be
used with part handlers to provide control interface.
The TESTSET I/O bits are set using the TESTSET I/O FWD and TESTSET I/O REV keys
under the Seq TTL I/O TTL OUT keys. The values of the outputs (pins 11, 22, and 23)
are described in Table 1-6. The value changes with the test port, so if the external control
is required for both test port directions, the settings must be made under both
TESTSET I/O FWD and TESTSET I/O REV . This capability can be used to set different
external conditions in a test requiring changes between the forward and reverse
measurements, as might be needed in a high power test, for example.

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TTL I/O Menu

This menu can be accessed by pressing TTL I/O in the Sequencing menu.

TTL Output for Controlling Peripherals Eight TTL compatible output lines can be
used for controlling equipment connected to the parallel port. By pressing Seq TTL I/O ,
you will access the following softkeys that control the individual output bits. Refer to
Figure 1-76 for output bus pin locations.

PARALLEL OUT ALL lets you input a number (0 to 255) in base 10 and outputs it to
the bus as binary.
SET BIT lets you set a single bit (0 − 7) to high on the output bus.

CLEAR BIT lets you set a single bit (0 − 7) to low on the output bus.

TTL Input Decision Making Five TTL compatible input lines can be used for decision
making in test sequencing. For example, if a test fixture is connected to the parallel port
and has a micro switch that needs to be activated in order to proceed with a measurement,
you can construct your test sequence so that it checks the TTL state of the input line
corresponding to the switch. Depending on whether the line is high or low, you can jump to
another sequence. To access these decision making functions, press Seq TTL I/O . Refer
to Figure 1-76 for input bus pin locations.

PARALL IN BIT NUMBER lets you select the single bit (0 − 4) that the sequence will
be looking for.
PARALL IN IF BIT H lets you jump to another sequence if the single input bit you
selected is in a high state.
PARALL IN IF BIT L lets you jump to another sequence if the single input bit you
selected is in a low state.
Pin assignments:
• pin 1 is the data strobe
• pin 16 selects the printer
• pin 17 resets the printer
• pins 18-25 are ground
Electrical specifications for TTL high:
• volts(H) ≥ 2.7 volts (V)
• current = 20 microamps (µA)
Electrical specifications for TTL low:
• volts(L) ≤ 0.4 volts (V)
• current = 0.2 milliamps (mA)

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Figure 1-76 Parallel Port Input and Output Bus Pin Locations in GPIO Mode

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Test Set Interconnect Control

Figure 1-77 Test Set Interconnect Pin Designations

Control of the external switch (8762B Option T24) can be done through the test set
interface on the rear panel of the analyzer.
Pin 22 (TTL 1) on the TEST SET-I/O INTERCONNECT connector is a TTL line that
changes from TTL high to TTL low when changing TTL I/O FWD from 7 to 6. Refer to
Figure 1-77. To change from 7 to 6, press the following sequence:

• Press TTL I/O TTL OUT TESTSET I/O FWD 6 x1 .

Changing the switch state back to the standard mode requires a 7 to be entered in the
“TESTSET I/O FWD.”
Pin 1 on the external switch must be grounded. It can be grounded to:
• the analyzer's chassis
• the front panel binder post
• the outer shell of the TEST SET-I/O INTERCONNECT connector
• a ground pin on the TEST SET-I/O INTERCONNECT connector (pin 7, 12 or 18). Refer
to Figure 1-77.
Pin C (common) on the external switch (8762B Option T24) must be connected to the test
set interface pin 14 (+22 volt line). Refer to Figure 1-77.
Pin 2 on the external switch, connects to pin 22 (TTL 1) on the test set interface.
The TTL I/O can control both of the external RF switches. Both must be cascaded in
parallel together. Changing the TTL I/O FWD from 7 to 6 will change the external RF
switch state. This changes the measurement capability from the network analyzer to the
external test measurement device. The TTL I/O FWD when changed from 7 to 6 will
reverse the process.

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Table 1-6 Test Set Interconnect Pin Designation

Pin Number Pin Description

Pin 1 No Connection (NC)

Pin 2 Sweep delay: holds off sweeps until test set has finished sweeping (85046A/B and 85047B
only)

Pin 3 Same as Test Sequence (TTL OUT) output BNC connector

Pin 4 NC

Pin 5 NC

Pin 6 NC

Pin 7 Ground

Pin 8 Hi-forward/Low-reverse. Follows the test port indicator.

Pin 9 NC

Pin 10 Lstarttrig: Not used. Do not connect anything to this pin.

Pin 11 TESTSET I/O Bit 2 (most significant bit). +5 V when TESTSET I/O has values of 4, 5, 6, or
7. Otherwise, bit is TTL low.

Pin 12 Ground

Pin 13 NC

Pin 14 +22 Volts

Pin 15 NC

Pin 16 NC

Pin 17 Same as Limit Test output BNC connector

Pin 18 Ground

Pin 19 NC

Pin 20 NC

Pin 21 Ground

Pin 22 TESTSET I/O Bit 0 (least significant bit). +5 V when TESTSET I/O has values of 1, 3, 5, or
7. Otherwise, bit is TTL low.

Pin 23 TESTSET I/O Bit 1 (middle bit). +5 V when TESTSET I/O has values of 2, 3, 6, or 7.
Otherwise, bit is TTL low.

Pin 24 Lremtrig: TTL low when TEST- SET I/O pins are valid. This bit can be used to latch these
values.

Pin 25 NC

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 Making Measurements
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TTL Out Menu The TTL OUT softkey provides access to the TTL out menu. This menu
allows you to choose between the following output parameters of the TTL output signal:

• TTL OUT HIGH

• TTL OUT LOW

• END SWEEP HIGH PULSE

• END SWEEP LOW PULSE

The TTL output signals are sent to the sequencing BNC rear panel output.

Sequencing Special Functions Menu

This menu is accessed by pressing the SPECIAL FUNCTIONS softkey in the Sequencing
menu. This menu provides access to the decision making menu and the more special
functions menu. It also contains the peripheral GPIB address and titling, wait x, pause,
and marker → CW functions.

Sequence Decision Making Menu

This menu is accessed by pressing the DECISION MAKING softkey in the Sequencing
Special Functions menu.
Decision making functions are explained in more detail in the following section. These
functions check a condition and jump to a specified sequence if the condition is true. The
sequence called must be in memory. A sequence call is a one-way jump. A sequence can
jump to itself, or to any of the other five sequences currently in memory. Use of these
features is explained under the specific softkey descriptions.

Decision Making Functions

Decision making functions jump to a softkey location, not to a specific sequence

title Limit test, loop counter, and do sequence commands jump to any sequence residing
in the specified sequence position (1 through 6). These commands do not jump to a specific
sequence title. Whatever sequence is in the selected softkey position, will run when these
commands are executed.

Having a sequence jump to itself A decision making command can jump to the
sequence it is in. When this occurs, the sequence starts over and all commands in the
sequence are repeated. This is used a great deal in conjunction with loop counter
commands. See the loop counter description that follows.

TTL input decision making TTL input from a peripheral connected to the parallel port
(in the GPIO mode) can be used in a decision making function. Refer to "The GPIO Mode"
on page 1-106.

Limit test decision making A sequence can jump to another sequence or start over
depending on the result of a limit test. When entered into a sequence, the
IF LIMIT TEST PASS and IF LIMIT TEST FAIL commands require you to enter the
destination sequence.

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Loop counter decision making The analyzer has a numeric register called a loop
counter. The value of this register can be set by a sequence, and it can be incriminated or
decremented each time a sequence repeats itself. The decision making commands
IF LOOP COUNTER = 0 and IF LOOP COUNTER <> 0 jump to another sequence if the
stated condition is true. When entered into the sequence, these commands require you to
enter the destination sequence. Either command can jump to another sequence, or restart
the current sequence.
As explained in "Embedding the Value of the Loop Counter in a Title" on page 1-105, the
loop counter value can be appended to a title. This allows customized titles for data
printouts or for data files saved to disk.

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 Making Measurements
Using Test Sequencing to Test a Device

Using Test Sequencing to Test a Device

Test sequencing allows you to automate repetitive tasks. As you make a measurement, the
analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a
single key.
This section contains the following example sequences:
• “Cascading Multiple Example Sequences”
• "Loop Counter Example Sequence" on page 1-114
• "Generating Files in a Loop Counter Example Sequence" on page 1-115
• "Limit Test Example Sequence" on page 1-117

Cascading Multiple Example Sequences

By cascading test sequences, you can create subprograms for a larger test sequence. You
can also cascade sequences to extend the length of test sequences to greater than 200 lines.
In this example, you are shown two sequences that have been cascaded. You can do this by
having the last command in sequence 1 call sequence position 2, regardless of the sequence
title. Because sequences are identified by position, not title, the call operation will always
go to the sequence loaded into the given position.
1. To create the example multiple sequences, press:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ1

Center 134 M/µ

Span 50 M/µ

Seq DO SEQUENCE SEQUENCE 2

DONE SEQ MODIFY

NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2

Meas Trans: FWD S21 (B/R)

Format LOG MAG

Scale Ref AUTOSCALE

Seq DONE SEQ MODIFY

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Making Measurements
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The following sequences will be created:

SEQUENCE SEQ1
Start of Sequence
CENTER
134 M/u
SPAN
50 M/u
DO SEQUENCE
SEQUENCE 2
SEQUENCE SEQ2
Start of Sequence
Trans:FWD S21 (B/R)
LOG MAG
SCALE/DIV
AUTO SCALE
You can extend this process of calling the next sequence from the last line of the present
sequence to 6 internal sequences, or an unlimited number of externally stored
sequences.
2. To run both sequences, press:
Preset SEQUENCE 1 SEQ1

Loop Counter Example Sequence

This example shows you the basic steps necessary for constructing a looping structure
within a test sequence. A typical application of this loop counter structure is for repeating
a specific measurement as you step through a series of CW frequencies or dc bias levels.
For an example application, see "Fixed IF Mixer Measurements" on page 2-24.
1. To create a sequence that will set the initial value of the loop counter, and call the
sequence that you want to repeat, press:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ1

SPECIAL FUNCTIONS DECISION MAKING

LOOP COUNTER 10 x1

Seq DO SEQUENCE SEQUENCE 2

DONE SEQ MODIFY

This will create a displayed list as shown:
SEQUENCE LOOP 1
Start of Sequence
LOOP COUNTER
10x1
DO SEQUENCE
SEQUENCE 2

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 Making Measurements
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To create a second sequence that will perform a desired measurement function,

decrement the loop counter, and call itself until the loop counter value is equal to
zero, press:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2

Meas Trans: FWD S21 (B/R)
Scale Ref AUTO SCALE
Marker Search SEARCH: MAX
Seq SPECIAL FUNCTIONS DECISION MAKING
DECR LOOP COUNTER IF LOOP COUNTER 0
SEQUENCE 2 SEQ2
Seq DONE SEQ MODIFY
This will create a displayed list as shown:
SEQUENCE LOOP 2
Start of Sequence
Trans:FWD S21 (B/R)
SCALE/DIV
AUTO SCALE
MKR Fctn
SEARCH MAX
DECR LOOP COUNTER
IF LOOP COUNTER <> 0 THEN DO
SEQUENCE 2
To run the loop sequence, press:
Preset SEQUENCE 1 SEQ1

Generating Files in a Loop Counter Example Sequence

This example shows how to increment the names of files that are generated by a sequence
with a loop structure.

Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ 1

SPECIAL FUNCTIONS DECISION MAKING

LOOP COUNTER 7 x1

Save/Recall SELECT DISK INTERNAL DISK

RETURN DEFINE DISK-SAVE DATA ONLY ON

Local SET ADDRESSES PLOTTER PORT DISK

Seq DO SEQUENCE SEQUENCE 2

DONE SEQ MODIFY

NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ 2

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Making Measurements
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Save/Recall FILE UTILITIES SEQUENCE FILE NAMING

FILE NAME FILE0 ERASE TITLE

D T LOOP COUNTER DONE

PLOT NAME PLOTFILE ERASE TITLE

P L LOOP COUNTER DONE RETURN

Sweep Setup TRIGGER MENU SINGLE

Save/Recall SAVE STATE

Copy PLOT

Seq SPECIAL FUNCTIONS DECISION MAKING

DECR LOOP COUNTER IF LOOP COUNTER 0

SEQUENCE 2 SEQ 2

Seq DONE SEQ MODIFY

This will create the following displayed lists:
Start of Sequence
LOOP COUNTER
7 x1
INTERNAL DISK
DATA ONLY
ON
DO SEQUENCE
SEQUENCE 2

Start of Sequence
FILE NAME
DT[LOOP]
PLOT NAME
PL[LOOP]
SINGLE
SAVE FILE 0
PLOT
DECR LOOP COUNTER
IF LOOP COUNTER <> 0 THEN DO
SEQUENCE 2
Sequence 1 initializes the loop counter and calls sequence 2. Sequence 2 repeats until the
loop counter reaches 0. For each loop, it takes a single sweep, saves the data file and plots
the display.
• The data file names generated by this sequence will be:
DT00007.D1
through
DT000001.D1

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 Making Measurements
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• The plot file names generated by this sequence will be:

PL00007.FP
through
PL00001.FP
To run the sequence, press:

Preset SEQUENCE 1 SEQ 1

Limit Test Example Sequence

This measurement example shows you how to create a sequence that will branch the
sequence according to the outcome of a limit test. Refer to "Using Limit Lines to Test a
Device" on page 1-71, for a procedure that shows you how to create a limit test.
For this example, you must have already saved the following in register 1:
• device measurement parameters
• a series of active (visible) limit lines
• an active limit test
1. To create a sequence that will recall the desired instrument state, perform a limit test,
and branch to another sequence position based on the outcome of that limit test, press:

Seq NEW SEQ MODIFY SEQUENCE 1 SEQ1

Save/Recall RECALL KEYS RECALLKEYS MENU RECALL REG1

Seq SPECIAL FUNCTIONS DECISION MAKING

IF LIMIT TEST PASS SEQUENCE 2 SEQ2

IF LIMIT TEST FAIL SEQUENCE 3 SEQ3

Seq DONE SEQ MODIFY

This will create a displayed list for sequence 1, as shown:
Start of Sequence
RECALL REG 1
IF LIMIT TEST PASS THEN DO
SEQUENCE 2
IF LIMIT TEST FAIL THEN DO
SEQUENCE 3
2. To create a sequence that stores the measurement data for a device that has passed the
limit test, press:

Seq NEW SEQ MODIFY SEQUENCE 2 SEQ2

Save/Recall SELECT DISK INTERNAL DISK RETURN

DEFINE DISK-SAVE DATA ARRAY ON RETURN SAVE STATE

Seq DONE SEQ MODIFY

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This will create a displayed list for sequence 2, as shown:

Start of Sequence
INTERNAL DISK
DATA ARRAY
ON
FILENAME
FILE 0
SAVE FILE
3. To create a sequence that prompts you to tune a device that has failed the limit test,
and calls sequence 1 to retest the device, press:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 3 SEQ3

Display MORE TITLE

T U N E D E V I C E DONE

Seq SPECIAL FUNCTIONS PAUSE RETURN

DO SEQUENCE SEQUENCE 1 SEQ1

Seq DONE SEQ MODIFY

This will create a displayed list for sequence 3, as shown:
Start of Sequence
TITLE
TUNE DEVICE
SEQUENCE
PAUSE
DO SEQUENCE
SEQUENCE 1
You will see the “tune device” prompt in the title area or the sequence will pause until you
press the CONTINUE SEQUENCE key.

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2 Making Mixer Measurements

2-1
Making Mixer Measurements
Using This Chapter

Using This Chapter

This chapter contains the following:
• Information on mixer measurement capabilities.
• Information on mixer measurement considerations.
• Example procedures for making the following mixer measurements:
— Conversion loss using the frequency offset mode
— High dynamic range swept RF/IF conversion loss
— High dynamic range configuration with Option 014
— Fixed IF measurements
— Group delay measurements
— Amplitude and phase tracking
— Conversion compression using the frequency offset mode
— Isolation Measurements
— SWR/Return Loss

2-2
 Making Mixer Measurements
Mixer Measurement Capabilities

Mixer Measurement Capabilities

The analyzer is capable of measuring the following mixer (frequency converter)
parameters:

Figure 2-1 Mixer Parameters

• Transmission characteristics include conversion loss, conversion compression, group

delay, and RF feedthrough.
• Reflection characteristics include return loss, SWR and complex impedance.
• Characteristics of the signal at the output port include the output power, the spurious
or harmonic content of the signal, and intermodulation distortion.
• Other parameters of concern are isolation terms, including LO to RF isolation and LO
to IF isolation.

NOTE This chapter uses the following 3 terms when referring to mixer signals:
LO Local Oscillator. LO is normally provided by an external source or
internally generated by the frequency converter.
IF Intermediate Frequency. IF is usually the mixer’s output signal.
RF Radio Frequency. RF is usually the mixer’s input signal.

2- 3
Making Mixer Measurements
Measurement Considerations

Measurement Considerations
In mixer transmission measurements, you have RF and LO inputs and an IF output. Also
emanating from the IF port are several other mixing products of the RF and LO signals. In
mixer measurements, leakage signals from one mixer port propagate and appear at the
other two mixer ports. These unwanted mixing products or leakage signals can cause
distortion by mixing with a harmonic of the analyzer’s first down-conversion stage.
To ensure successful mixer measurements, the following measurement challenges must be
taken into consideration:
• Mixer Considerations
❏ “Minimizing Source and Load Mismatches”
❏ "Reducing the Effect of Spurious Responses" on page 2-5
❏ "Eliminating Unwanted Mixing and Leakage Signals" on page 2-6
• Analyzer Operation
❏ "How RF and IF Are Defined" on page 2-7
❏ "Frequency Offset Mode Operation" on page 2-10
❏ "LO Frequency Accuracy and Stability" on page 2-10
❏ "Power Meter Calibration" on page 2-10

Minimizing Source and Load Mismatches

When characterizing linear devices, you can use vector accuracy enhancement to
mathematically remove all systematic errors, including source and load mismatches, from
your measurement. This is difficult when the device you are characterizing is a mixer
where the input and output signals are at different frequencies. Therefore, source and load
mismatches are not corrected for and will add to overall measurement uncertainty.
You should place attenuators at all of the test ports to reduce the measurement errors
associated with the interaction between mixer port matches and system port matches. To
avoid overdriving the receiver, you should give extra care to selecting the attenuator
located at the mixer's IF port to avoid overdriving the receiver. For best results, you should
choose the attenuator value so that the power incident on the analyzer R channel input is
less than −10 dBm and greater than −35 dBm.

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 Making Mixer Measurements
Measurement Considerations

Figure 2-2 Conversion Loss versus Output Frequency without Attenuators at

Mixer Ports

Figure 2-3 Example of Conversion Loss versus Output Frequency with

Attenuation at All Mixer Ports

Reducing the Effect of Spurious Responses

By choosing test frequencies (frequency list mode), you can reduce the effect of spurious
responses on measurements by avoiding frequencies that produce IF signal path
distortion.

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Making Mixer Measurements
Measurement Considerations

Eliminating Unwanted Mixing and Leakage Signals

By placing filters between the mixer’s IF port and the receiver’s input port, you can
eliminate unwanted mixing and leakage signals from entering the analyzer’s receiver.
Filtering is required in both fixed and broadband measurements. Therefore, when
configuring broad-band (swept) measurements, you may need to trade some measurement
bandwidth for the ability to more selectively filter signals entering the analyzer receiver.

Figure 2-4 Example of Conversion Loss versus Output Frequency without

Correct IF Signal Path Filtering

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 Making Mixer Measurements
Measurement Considerations

Figure 2-5 Example of Conversion Loss versus Output Frequency with Correct
IF Signal Path Filtering and Attenuation at All Mixer Ports

How RF and IF Are Defined

When you choose between RF < LO and RF > LO in the frequency offset menus, the
analyzer determines which direction the internal source must sweep in order to achieve
the requested IF frequency. For example, to measure the lower sideband of a mixer, where
the RF signal is below the LO ( RF < LO ), the internal source must sweep backwards. See
the examples in Figure 2-6.

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Making Mixer Measurements
Measurement Considerations

Figure 2-6 Examples of Up Converters and Down Converters

In standard mixer measurements, the input of the mixer is always connected to the
analyzer’s RF source, and the output of the mixer always produces the IF frequencies that
are received by the analyzer’s receiver.
However, the ports labeled RF and IF on most mixers are not consistently connected to the
analyzer’s source and receiver ports, respectively. These mixer ports are switched,
depending on whether a down converter or an up converter measurement is being
performed.
It is important to keep in mind that in the setup diagrams of the frequency offset mode, the
analyzer’s source and receiver ports are labeled according to the mixer port to which they
are connected.

• In a down converter measurement where the DOWN CONVERTER softkey is selected,

the notation on the analyzer's setup diagram indicates that the analyzer's source
frequency is labeled RF, connecting to the mixer RF port, and the analyzer's receiver
frequency is labeled IF, connecting to the mixer IF port.
Because the RF frequency can be greater or less than the set LO frequency in this type
of measurement, you can select either RF > LO or RF < LO .

2-8
 Making Mixer Measurements
Measurement Considerations

Figure 2-7 Down Converter Port Connections

• In an up converter measurement where the UP CONVERTER softkey is selected, the

notation on the setup diagram indicates that the analyzer's source frequency is labeled
IF, connecting to the mixer IF port, and the analyzer's receiver frequency is labeled RF,
connecting to the mixer RF port.
Because the RF frequency can be greater or less than the set LO frequency in this type
of measurement, you can select either RF > LO or RF < LO .

Figure 2-8 Up Converter Port Connections

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Making Mixer Measurements
Measurement Considerations

Frequency Offset Mode Operation

This mode of operation allows you to offset the analyzer’s source by a fixed value, above or
below the analyzer’s receiver. That is, this allows you to use a device input frequency range
that is different from the receiver input frequency range.
Mixers or frequency converters, by definition, exhibit the characteristic of having different
input and output frequencies. Mixer tests can be performed using the frequency offset
operation of the analyzer (with an external LO source) or using the tuned receiver
operation of the analyzer (with both an external RF and an external LO source). The most
common and convenient method used is frequency offset.
Frequency offset measurements do not begin until all of the frequency offset mode
parameters are set. These include the following:
• Start and Stop IF Frequencies
• LO frequency
• Up Converter / Down Converter
• RF > LO / RF < LO
The LO frequency for frequency offset mode must be set to the same value as the external
LO source. The offset frequency between the analyzer source and receiver will be set to this
value.
For a single-sideband mixer measurement, the RF source can be offset in frequency from
the input receiver frequency, allowing for a swept RF stimulus over one frequency range
and measurement of the IF response over another (in this case the output IF).
When frequency offset mode operation begins, the receiver is tuned to the entered IF signal
frequencies and then offsets the source frequency required to produce the IF. Therefore,
since it is the analyzer receiver that controls the source, it is only necessary to set the start
and stop frequencies from the receiver.

LO Frequency Accuracy and Stability

The analyzer source is phaselocked to its receiver through a reference loop. In the
frequency offset mode, the mixer under test is inserted in this loop. To ensure that the
analyzer phaselocks correctly, it is important that you use an LO source that has frequency
accuracy better than ±1 MHz and residual FM < 20 kHz RMS.

Power Meter Calibration

Mixer transmission measurements are generally configured as follows:
measured output power (Watts) / set input power (Watts)
OR
measured output power (dBm) − set input power (dBm)
For this reason, the set input power must be accurately controlled in order to ensure
measurement accuracy.
The amplitude variation of the analyzer is specified at ±1 dB over any given source
frequency. This may give a maximum 2 dB error for a mixer transmission test setup: ±1 dB
for the source over the IF range during measurement and ±1 dB over the RF range during
measurement.

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 Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

Higher measurement accuracy may be obtained through the use of power meter
calibration. You can use power meter calibration to correct for power offsets, losses, and
flatness variations occurring between the analyzer source and the input to the mixer under
test. Refer to the power meter documentation for its calibration procedures.

Conversion Loss Using the Frequency Offset Mode

Conversion loss is the measure of efficiency of a mixer. It is the ratio of side-band IF power
to RF signal power, and is usually expressed in dB. The mixer translates the incoming
signal, (RF), to a replica, (IF), displaced in frequency by the local oscillator, (LO).
Frequency translation is characterized by a loss in signal amplitude and the generation of
additional sidebands. For a given translation, two equal output signals are expected, a
lower sideband and an upper sideband.

Figure 2-9 An Example Spectrum of RF, LO, and IF Signals Present in a

Conversion Loss Measurement

The following procedure describes the R channel swept IF frequency conversion loss
measurement of a broadband component mixer with power meter calibration. For this
example, we will use the following example settings. For your measurement, you will need
to use settings specific to your measurement.

Settings Used for this Example

• LO frequency of 1 GHz (1000 MHz)
• RF start frequency of 650 MHz
• RF stop frequency of 900 MHz
• IF start frequency of 100 MHz
• IF stop frequency of 350 MHz
• RF < LO
• Down convertor

TIP For ease of use, the RF frequency range needs to be the same as the network
analyzer’s frequency range limit.

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Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

Setting Measurement Parameters for the Power Meter Calibration

1. Connect the measurement equipment as shown in Figure 2-10.

Figure 2-10 Connections for Source Calibration

2. From the front panel of the analyzer, set the desired receiver (RF) frequency and source
output power by pressing:

System INSTRUMENT MODE FREQ OFFS MENU

Start 650 M/µ Stop 950 M/µ

Note that these are the example RF start and stop frequencies. Enter the
RF start and stop frequencies for your measurement instead.
If the LO frequency is not set to 0 Hz, press:
LO MENU FREQUENCY: CW 0 x1
3. To select the measurement trace, press:

Meas R
The measurement trace is shown on the display.
4. Select the analyzer as the system controller:

Local SYSTEM CONTROLLER

Performing a Power Meter (Source) Calibration Over the RF Range

1. Calibrate and zero the power meter.
2. Set the power meter’s address:

SET ADDRESSES

ADDRESS: P MTR/GPIB aa (where aa is the GPIB address of the power meter)

x1

2-12
 Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

3. Select the appropriate power meter by pressing POWER MTR [ ] until the correct
model number is displayed (Agilent 436A or Agilent 438A/437).

NOTE The Agilent E4418B and E4419B (EPM) power meters have a “437emulation”
mode which can be used in this procedure by following these steps.
• If you are using an Agilent EPM power sensor and your network analyzer
has firmware revision 7.72 or greater:
a. Select the remote interface command set on the power meter by
pressing the System Inputs key and the following softkeys: Remote
Interface, Command Set, SCPI
b. Skip step 4 and continue at step 5.
The power sensor factors are automatically read by the analyzer.
• If you are using an Agilent 848X-series power sensor or your network
analyzer does not have firmware revision 7.72 or greater:
a. Choose the 438A/437 selection on the network analyzer by pressing:

Local SET ADDRESSES

POWER MTR [ ] until it reads POWER MTR: [438A/437]

b. Select the remote interface command set on the power meter by
pressing the System Inputs key and the following softkeys: Remote
Interface, Command Set, 437B

4. Press Cal PWRMTR CAL LOSS/SENSR LISTS CAL FACTOR SENSOR A and
enter the correction factors as listed on the power sensor. Press ADD FREQUENCY
fff (where fff is the frequency of the calibration factor in MHz) M/µ CAL FACTOR
nnn (where nnn is the calibration factor number) x1 DONE for each correction
factor. When finished, press DONE .
5. To perform a one sweep power meter calibration over the RF frequency range at 0 dBm,
press:

Cal PWRMTR CAL ONE SWEEP 0 x1 TAKE CAL SWEEP

NOTE Because power meter calibration requires a longer sweep time, you may want
to reduce the number of points before pressing TAKE CAL SWEEP . After the
power meter calibration is finished, return the number of points to its original
value and the analyzer will automatically interpolate this calibration.

6. Make sure the power meter calibration is on. When the power meter calibration is on,
“PC” is displayed at the left edge of the display. Refer to Figure 2-15 on page 2-17 for an
example.

2- 13
Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

7. From the front panel of the analyzer, set the desired IF start and stop frequencies by
pressing:

System INSTRUMENT MODE FREQ OFFS MENU

Start 100 M/µ Stop 350 M/µ

Note that these are the example IF start and stop frequencies. Enter the IF
start and stop frequencies for your measurement instead.
8. To calibrate the R channel over the IF range, connect the equipment as shown in Figure
2-11

Figure 2-11 Connections for R Channel Calibration

NOTE An error message will be displayed while the R In port is disconnected.

Ignore this error message until R In port is reconnected.

9. Press Cal CALIBRATE MENU RECEIVER CAL 0 x1

TAKE RCVR CAL SWEEP .

❏ The low pass filter is required to limit the range of frequencies passed into the R
channel input port. The filter is selected to pass the IF frequencies for the
measurement but prevent the LO feedthrough and unwanted mixer products from
confusing the phase-lock loop operation.
❏ A pad is used to isolate the filter and improve the IF port match for the mixer.
Once completed, the display should read 0 dBm.
10. Save the power meter and receiver calibration to an instrument state by pressing
Save/Recall SAVE STATE .

2-14
 Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

Setting the Analyzer to Make an R Channel Measurement

1. Connect the equipment as shown in Figure 2-12.

Figure 2-12 R-Channel Mixer Measurement Equipment Setup

NOTE An error message will be displayed while the R In port is disconnected.

Ignore this error message until step 3 is complete.

The analyzer is now displaying the conversion loss of the mixer calibrated with power
meter accuracy.
2. While the analyzer is still set to the IF frequency range, set the frequency offset mode
LO frequency from the analyzer by pressing:

System INSTRUMENT MODE FREQ OFFS MENU

LO MENU FREQUENCY:CW 1000 M/µ

Note that this is the example LO frequency. Enter the LO frequency for
your measurement instead.
The LO menu is used to set only the LO CW frequency. All other settings apply when
using the HP/Agilent 8625A external source.
3. To select the converter type and a high-side LO measurement configuration, press:

RETURN DOWN CONVERTER RF < LO

Note that these are the example settings. Enter the settings for your
measurement instead.

2- 15
Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

4. Turn on frequency offset operation by pressing FREQS OFFS ON .

Notice in this high-side LO, down conversion configuration, the analyzer’s source is
actually sweeping backwards, as shown in Figure 2-13.
The measurement setup diagram is shown in Figure 2-14. Note the RF frequency values
are shown in this illustration.

Figure 2-13 Diagram of Measurement Frequencies

Figure 2-14 Measurement Setup from Display

2-16
 Making Mixer Measurements
Conversion Loss Using the Frequency Offset Mode

5. To view the conversion loss in the best vertical resolution, press Scale Ref
AUTOSCALE .

Figure 2-15 Conversion Loss Example Measurement

In this measurement, you set the input power and measured the output power. Figure 2-15
shows the absolute loss through the mixer versus mixer output frequency. If the mixer
under test contained built-in amplification, then the measurement results would have
shown conversion gain.

2- 17
Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

High Dynamic Range Swept RF/IF Conversion Loss

The frequency offset mode enables the testing of high dynamic range frequency converters
(mixers), by tuning the analyzer’s high dynamic range receiver above or below its source,
by a fixed offset. This capability allows the complete measurement of both pass and reject
band mixer characteristics.
The analyzer has a 35 dB dynamic range limitation on measurements made directly with
its R (phaselock) channel. For this reason, the measurement of high dynamic range mixing
devices (such as mixers with built in amplification and filtering) with greater than 35 dB
dynamic range must be made on either the analyzer’s A or B channel, with a reference
mixer providing input to the analyzer’s R channel for phaselock.
This example describes the swept IF conversion loss measurement of a mixer and filter.
The output filtering demonstrates the analyzer’s ability to make high dynamic range
measurements.

Set Measurement Parameters for the IF Range

Set the following analyzer parameters:

Preset
Start 100 M/µ Stop 1 G/n
Power −5 x1
Sweep Setup NUMBER of POINTS 10 x1

Perform a Power Meter Calibration Over the IF Range

1. Calibrate and zero the power meter.
2. Connect the measurement equipment as shown in Figure 2-16.

CAUTION To prevent connector damage, use an adapter (part number 1250-1462) as a

connector saver for R CHANNEL IN.

2-18
 Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

Figure 2-16 Connections for Power Meter Calibration

3. Select the analyzer as the system controller:

Local

SYSTEM CONTROLLER
4. Set the power meter’s address:

SET ADDRESSES

ADDRESS: P MTR/GPIB aa (where aa is the power meter GPIB address) x1

5. Select the appropriate power meter by pressing POWER MTR [ ] until the correct
model number is displayed (436A or 438A/437).

NOTE The E4418B and E4419B power meters have a “437 emulation” mode. This
allows these power meters, with an 848X-series power sensor, to be used with
the network analyzer. In this step, when selecting a power meter, choose the
438A/437 selection.

6. Press Cal PWRMTR CAL LOSS/SENSR LISTS CAL FACTOR SENSOR A and
enter the correction factors as listed on the power sensor. Press ADD FREQUENCY
fff (where fff is the frequency in MHz) M/µ CAL FACTOR nnn (where nnn is the
calibration factor number) x1 DONE for each correction factor. When finished, press
DONE RETURN .

2- 19
Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

7. Perform a one sweep power meter calibration over the IF frequency range at −5 dBm:

ONE SWEEP

−5 x1

TAKE CAL SWEEP

NOTE Because power meter calibration requires a longer sweep time, you may want
to reduce the number of points before pressing TAKE CAL SWEEP . After the
power meter calibration is finished, return the number of points to its original
value and the analyzer will automatically interpolate this calibration.

Perform a Receiver Calibration Over the IF Range

1. Connect the measurement equipment as shown in Figure 2-17.

Figure 2-17 Connections for Receiver Calibration

2. To calibrate the B-channel over the IF range, press:

Meas B

Cal CALIBRATE MENU RECEIVER CAL −5 x1 TAKE RCVR CAL SWEEP

Once completed, the analyzer should display −5 dBm.

2-20
 Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

Set the Analyzer to the RF Frequency Range

You can find the RF frequency range by using a simple calculation or using the mixer
measurement diagram on the analyzer display.

Using the Calculation

Add the LO frequency to the IF frequency start and stop values. If using an LO frequency
of 1500 MHz, the RF start frequency would be 1.6 GHz (1500 + 100 MHz) and the stop
frequency would be 2.5 GHz (1500 + 1000 MHz).

Using the Mixer Measurement Diagram

While the analyzer is still set to the IF frequency range, press:
System INSTRUMENT MODE FREQ OFFS MENU
LO MENU FREQUENCY:CW 1500 M/µ
RETURN RETURN DOWN CONVERTER RF > LO .
Note the RF frequency values on the diagram.
Press Start 1.6 G/n Stop 2.5 G/n .

Perform a Power Meter Calibration Over the RF Range

1. Connect the equipment as shown in Figure 2-18.

Figure 2-18 Connections for Power Meter Calibration

2. Use the previous power meter settings.

2- 21
Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

3. Perform a one sweep power meter calibration over the RF frequency range at −5 dBm:

Cal PWRMTR CAL .

ONE SWEEP

−5 x1

TAKE CAL SWEEP

Perform the High Dynamic Range Measurement

1. Return the analyzer to the IF frequency range. Press Start 100 M/µ Stop 1
G/n .
2. Make the connections shown in Figure 2-19.
3. Set the LO source to the desired CW frequency of 1500 MHz and power level to 13 dBm.

Figure 2-19 Connections for a High Dynamic Range Swept IF Conversion Loss
Measurement

4. Set the analyzers LO frequency to match the frequency of the LO source by pressing:

System INSTRUMENT MODE FREQ OFFS MENU LO MENU

FREQUENCY: CW 1500 M/µ

2-22
 Making Mixer Measurements
High Dynamic Range Swept RF/IF Conversion Loss

5. To select the converter type and low-side LO measurement configuration, press:

RETURN DOWN CONVERTER RF > LO FREQ OFFS ON
In this low-side LO, down converter measurement, the analyzer’s source frequency
range will be offset higher than the receiver frequency range. The source frequency
range can be determined from the following equation:
receiver frequency range (100 – 1000 MHz) + LO frequency (1500 MHz) = 1.6 − 2.5 GHz
6. To view the conversion loss in the best vertical resolution, press:
VIEW MEASURE Scale Ref AUTOSCALE
Figure 2-20 shows the conversion loss of this low-side LO mixer with output filtering.
Notice that the dynamic range from the pass band to the noise floor is well above the
dynamic range limit of the R Channel. If the mixer under test also contained
amplification, then this dynamic range would have been even greater due to the
conversion gain of the mixer.

Figure 2-20 Example of Swept IF Conversion Loss Measurement

2- 23
Making Mixer Measurements
Fixed IF Mixer Measurements

Fixed IF Mixer Measurements

A fixed IF can be produced by using both a swept RF and LO that are offset by a certain
frequency. With proper filtering, only this offset frequency will be present at the IF port of
the mixer.
This measurement requires two external RF sources as stimuli. Figure 2-22 shows the
hardware configuration for the fixed IF conversion loss measurement. This example
measurement procedure uses the analyzer’s test sequence function for automatically
controlling the two external synthesizers (with SCPI commands), and making a conversion
loss measurement in tuned receiver mode. The test sequence function is an instrument
automation feature internal to the analyzer. For more information on the test sequence
function, refer to "Using Test Sequencing to Test a Device" on page 1-113.

Tuned Receiver Mode

The analyzer’s tuned receiver mode allows you to tune its receiver to an arbitrary
frequency and measure signal power. This is only possible if the signal you wish to analyze
is at an exact known frequency. Therefore, the RF and LO sources must be synthesized and
synchronized with the analyzer’s time base.
Since the analyzer is not phaselocking in this configuration, you can use it to measure
conversion loss of a microwave mixer with an RF frequency range output.
Tuned receiver mode also increases dynamic range. Broadband techniques like diode
detection have a high noise floor, while narrow band techniques like tuned receivers are
much less susceptible to noise.

Sequence 1 Setup
The following sequence initializes and calibrates the network analyzer. It then initializes
the two external sources prior to measurement. This sequence includes:
• putting the network analyzer into tuned receiver mode
• setting up a frequency list sweep of 26 points
• performing a response calibration
• prompting the user to connect a mixer to the test set up
• initializing a loop counter value to 26
• addressing and configuring the two sources
• calling the next measurement sequence
1. Make the following connections as shown in Figure 2-21. Set the GPIB address of the
external RF source to 19 and the external LO source to 21.
2. Confirm that the external sources are configured to receive commands in the SCPI
programming language and that their output power is switched on.

2-24
 Making Mixer Measurements
Fixed IF Mixer Measurements

NOTE You may have to consult the user’s guide of the external source being used to
determine how to set the source to receive SCPI commands.

3. Be sure to connect the 10 MHz reference signals of the external sources to the EXT REF
connector on the rear panel of the analyzer (a BNC tee must be used).

NOTE If the 10 MHz reference signals of the external sources are connected
together, then it will only be necessary to connect one reference signal from
one of the sources to the EXT REF connector of the analyzer.

Figure 2-21 Connections for a Response Calibration

NOTE To enter the following sequence commands that require titling, an external
keyboard may be used for convenience.

4. Press the following keys on the analyzer to create sequence 1:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ1

Presetting the Instrument

Save/Recall SELECT DISK INTERNAL MEMORY

RETURN (Select the preset state.) RECALL STATE

2- 25
Making Mixer Measurements
Fixed IF Mixer Measurements

Putting the Analyzer into Tuned Receiver Mode

Local SYSTEM CONTROLLER

System INSTRUMENT MODE TUNED RECEIVER

Setting Up a Frequency List Sweep of 26 Points

Sweep Setup SWEEP TYPE MENU EDIT LIST ADD

START 100 M/µ

STOP 100 M/µ

NUMBER OF POINTS 26 x1 DONE DONE

LIST FREQ
Performing a Response Calibration

Meas INPUT PORTS B

Display MORE TITLE ERASE TITLE

Input as title: POW:LEV 6DBM
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 19 x1

HIB ADDR
TITLE TO PERIPHERAL

Display MORE TITLE ERASE TITLE

Input as title: FREQ:MODE CW;CW 100MHZ
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 19 x1

HIB ADDR
TITLE TO PERIPHERAL

Cal CALIBRATE MENU RESPONSE

THRU
Prompting the User to Connect a Mixer to the Test Setup

Display MORE TITLE ERASE TITLE

Input as title: CONNECT MIXER
DONE

Seq SPECIAL FUNCTIONS

PAUSE

2-26
 Making Mixer Measurements
Fixed IF Mixer Measurements

Initializing a Loop Counter Value to 26

Seq SPECIAL FUNCTIONS DECISION MAKING

MKING
LOOP COUNTER 26 x1

Scale Ref 2 x1

REFERENCE POSITION 0 x1

REFERENCE VALUE −20 x1

Sweep Setup TRIGGER MENU MANUAL TRG ON POINT

TG ON POINT
Addressing and Configuring the Two Sources

Display MORE TITLE ERASE TITLE

Input as title: FREQ:MODE CW;CW 500MHZ;:FREQ:CW:STEP 100MHZ
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 19 x1

TITLE TO PERIPHERAL

Display MORE TITLE ERASE TITLE

Input as title: POW:LEV 13DBM
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 21 x1

TITLE TO PERIPHERAL

Display MORE TITLE ERASE TITLE

Input as title: FREQ:MODE CW;CW 600MHZ;:FREQ:CW:STEP 100MHZ
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 21 x1

TITLE TO PERIPHERAL
Calling the Next Measurement Sequence

Seq DO SEQUENCE SEQUENCE 2 SEQ2

Seq DONE SEQ MODIFY

2- 27
Making Mixer Measurements
Fixed IF Mixer Measurements

Press Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ 1 and the analyzer will
display the following sequence commands:
SEQUENCE SEQ1
Start of Sequence
RECALL PRST STATE
SYSTEM CONTROLLER
TUNED RECEIVER
EDIT LIST
ADD
CW FREQ
100M/u
NUMBER OF POINTS
26x1
DONE
DONE
LIST FREQ
B
TITLE
POW:LEV 6DBM
PERIPHERAL HPIB ADDR
19x1
TITLE TO PERIPHERAL
TITLE
FREQ:MODE CW;CW 100MHZ
TITLE TO PERIPHERAL
CALIBRATE: RESPONSE
CAL STANDARD
DONE CAL CLASS
TITLE
CONNECT MIXER
PAUSE
LOOP COUNTER
26x1
SCALE/DIV
2 x1
REFERENCE POSITION
0 x1
REFERENCE VALUE
−20x1
MANUAL TRG ON POINT
TITLE
FREQ:MODE CW;CW 500MHZ;:FREQ:CW:STEP 100MHZ
TITLE TO PERIPHERAL
TITLE
POW:LEV 13DBM
PERIPHERAL HPIB ADDR
21x1
TITLE TO PERIPHERAL

2-28
 Making Mixer Measurements
Fixed IF Mixer Measurements

TITLE
FREQ:MODE CW;CW 600MHZ;:FREQ:CW:STEP 100MHZ
TITLE TO PERIPHERAL
DO SEQUENCE
SEQUENCE 2

Sequence 2 Setup
The following sequence makes a series of measurements until all 26 CW measurements
are made and the loop counter value is equal to zero. This sequence includes:
• taking data
• incrementing the source frequencies
• decrementing the loop counter
• labeling the screen
1. Press the following keys on the analyzer to create sequence 2:

NOTE To enter the following sequence commands that require titling, an external
keyboard may be used for convenience.

Seq DONE SEQ MODIFY

Seq NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2

Taking Data

Seq SPECIAL FUNCTIONS WAIT x .1 x1

Sweep Setup TRIGGER MENU MANUAL TRG ON POINT

Incrementing the Source Frequencies

Display MORE TITLE ERASE TITLE

Input as title: FREQ:CW UP
DONE

Seq SPECIAL FUNCTIONS PERIPHERAL GPIB ADDR 19 x1

TITLE TO PERIPHERAL

PERIPHERAL GPIB ADDR 21 x1 TITLE TO PERIPHERAL

Decrementing the Loop Counter

DECISION MAKING DECR LOOP COUNTER IF LOOP COUNTER<>0

SEQUENCE 2 SEQ2

2- 29
Making Mixer Measurements
Fixed IF Mixer Measurements

Labeling the Screen

Display MORE TITLE ERASE TITLE

Input as title: MEASUREMENT COMPLETED
DONE

Seq DONE SEQ MODIFY

Press Seq NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2 and the analyzer will
display the following sequence commands:
SEQUENCE SEQ2
Start of Sequence
WAIT x
1 x1
MANUAL TRG ON POINT
TITLE
FREQ:CW UP
PERIPHERAL HPIB ADDR
19x1
TITLE TO PERIPHERAL
PERIPHERAL HPIB ADDR
21x1
TITLE TO PERIPHERAL
DECR LOOP COUNTER
IF LOOP COUNTER <>0 THEN DO
SEQUENCE 2
TITLE
MEASUREMENT COMPLETED
2. Press the following keys to run the sequences:
Seq DONE SEQ MODIFY DO SEQUENCE SEQUENCE 2 SEQ2
When the prompt CONNECT MIXER appears, connect the equipment as shown in Figure
2-22.

2-30
 Making Mixer Measurements
Fixed IF Mixer Measurements

Figure 2-22 Connections for a Conversion Loss Using Tuned Receiver Mode

When the sequences are finished you should have a result as shown in Figure 2-23.

Figure 2-23 Example Fixed IF Mixer Measurement

The displayed trace represents the conversion loss of the mixer at 26 points. Each point
corresponds to one of the 26 different sets of RF and LO frequencies that were used to
create the same fixed IF frequency.

2- 31
Making Mixer Measurements
Phase or Group Delay Measurements

Phase or Group Delay Measurements

For information on group delay principles, refer to "Setting the Electrical Delay" on page
1-37.

Phase Measurements
When you are making linear measurements, you must provide a reference for determining
phase by splitting the RF source power and send part of the signal into the reference
channel. (This does not work for frequency offset measurements, since the source and
receiver are functioning at different frequencies.)
To provide a reference signal for the phase measurement, you need a second mixer. This
mixer is driven by the same RF and LO signals that are used to drive the mixer under test.
The IF output from the reference mixer is applied to the reference (R) channel of the
analyzer.

Phase Linearity and Group Delay

Group delay is the rate of change of phase through a device with respect to frequency
(dφ/dω). Traditionally, group delay has been used to describe the propagation delay (τg),
and deviation from linear phase through a linear device. However, this parameter also
contains valuable information about transmission delay and distortion through a
non-linear device such as a mixer or frequency converter. For example, flat group delay
corresponds to low modulation distortion (that is, carrier and sidebands propagate at the
same rate).
Phase linearity and group delay are both measurements of the distortion of a transmitted
signal. Both measure the non-linearity of a device’s phase response with respect to
frequency.
In standard vector error-correction, a thru (delay=0) is used as a calibration standard. The
solution to this problem is to use a calibration mixer with very small group delay as the
calibration standard.
An important characteristic to remember when selecting a calibration mixer is that the
delay of the device should be kept as low as possible. To do this, select a mixer with very
wide bandwidth (wider bandwidth results in smaller delay). The accuracy of this
measurement depends on the quality of the mixer that is being used for calibration and
how well this mixer has been characterized. The following measurement must be
performed with a broadband calibration mixer that has a known group delay. The following
table lists the specifications of two mixers that may be used for calibration:

Model Number Useful Frequency Range Group Delay

ANZAC MCD-123 0.03 to 3 GHz 0.5 ns

Mini-Circuits ZFM-4 dc to 1250 MHz 0.6 ns

2-32
 Making Mixer Measurements
Phase or Group Delay Measurements

1. Set the LO source to the desired CW frequency of 1000 MHz and power level to 13 dBm.
2. Initialize the analyzer by pressing Preset .
3. Set the analyzer’s LO frequency to match the frequency of the LO source by pressing:

System INSTRUMENT MODE FREQ OFFS MENU LO MENU

FREQUENCY: CW 1000 M/µ
4. From the front panel of the analyzer, set the desired receiver frequency and source
output power by pressing:

Center 300 M/µ

Span 100 M/µ

Power 0 PWR RANGE MAN x1

5. Connect the instruments as shown in Figure 2-24, placing a broadband "calibration"
mixer (ZFM-4) between PORT 1 and PORT 2.

CAUTION To prevent connector damage, use an adapter (part number 1250-1462) as a

connector saver for R CHANNEL IN.

2- 33
Making Mixer Measurements
Phase or Group Delay Measurements

Figure 2-24 Connections for a Group Delay Measurement

6. To select the converter type and a high-side LO measurement configuration, press:

System INSTRUMENT MODE FREQ OFFS MENU

DOWN CONVERTER RF<LO FREQ OFFS ON

7. To view the measurement results on the analyzer’s display, press:

System INSTRUMENT MODE FREQ OFFS MENU VIEW MEASURE

8. To select the format type, press:

Format DELAY
9. To make a response error-correction, press:

Meas B/R

Cal CALIBRATE MENU RESPONSE THRU

2-34
 Making Mixer Measurements
Phase or Group Delay Measurements

10.Replace the "calibration" mixer with the device under test. If measuring group delay, set
the delay equal to the "calibration" mixer delay (for example −0.6 ns) by pressing:

Scale Ref

ELECTRICAL DELAY

−06 G/n
11.Scale the data for best vertical resolution.

Scale Ref

AUTOSCALE

Figure 2-25 Group Delay Measurement Example

The displayed measurement trace shows the device under test delay, relative to the
"calibration" mixer. This measurement is also useful when the device under test has
built-in filtering, which requires >30 dB range (the maximum of R input). PORT 1 to PORT
2 range is >100 dB.

2- 35
Making Mixer Measurements
Amplitude and Phase Tracking

Amplitude and Phase Tracking

The match between mixers is defined as the absolute difference in amplitude or phase
response over a specified frequency range. The tracking between mixers is essentially how
well the devices are matched over a specified interval. This interval may be a frequency
interval or a temperature interval, or a combination of both.
You can make tracking measurements by ratioing the responses of two mixer conversion
loss measurements. Then any difference you view in response is due to the mixers and not
the measurement system.
Using the same measurement setup as in "Phase or Group Delay Measurements" on page
2-32, you can determine how well two mixers track each other in terms of amplitude and
phase.
1. Repeat steps 1 through 8 of the previous section "Phase Linearity and Group Delay" on
page 2-32, with the following exception:
In step 7, select Format PHASE .

2. Once the analyzer has displayed the measurement results, press Display
DATA→MEM .
3. Replace the calibration mixer with the mixer under test.
4. Press DATA/MEM .
The resulting trace should represent the amplitude and phase tracking of the two mixers.

Figure 2-26 Connections for an Amplitude and Phase Tracking Measurement

Between Two Mixers

2-36
 Making Mixer Measurements
Conversion Compression Using the Frequency Offset Mode

Conversion Compression Using the Frequency Offset Mode

Conversion compression is a measure of the maximum RF input signal level where the
mixer provides linear operation. The conversion loss is the ratio of the IF output level to
the RF input level. This value remains constant over a specified input power range. When
the input power level exceeds a certain maximum, the constant ratio between IF and RF
power levels will begin to change. The point at which the ratio has decreased by 1 dB is
called the 1 dB compression point. See Figure 2-27.

Figure 2-27 Conversion Loss and Output Power as a Function of Input Power
Level Example

Notice that the IF output power increases linearly with the increasing RF signal, until
mixer compression begins and the mixer saturates.
The following example uses a ratio of mixer output to input power and a marker search
function to locate a mixer’s 1 dB compression point.
1. Set the LO source to the desired CW frequency of 600 MHz and power level to 13 dBm.
2. Initialize the analyzer by pressing Preset .
3. Set the analyzers LO frequency to match the frequency of the LO source by pressing:

Sweep Setup

SWEEP TYPE MENU POWER SWEEP Return

System INSTRUMENT MODE FREQ OFFS MENU LO MENU

FREQUENCY: CW 800 M/µ
4. To set the analyzer to the desired power sweep range, press:

Power

Start −10 x1

Stop 10 x1

2- 37
Making Mixer Measurements
Conversion Compression Using the Frequency Offset Mode

5. Make the connections, as shown in Figure 2-28.

CAUTION To prevent connector damage, use an adapter (part number 1250-1462) as a

connector saver for R CHANNEL IN.

Figure 2-28 Connections for the First Portion of Conversion Compression

Measurement

6. To view the absolute input power to the analyzer’s R channel, press:

Meas R
7. To store a trace of the receiver power versus the source power into memory and view
data/memory, press:

Display

DATA→MEM

DATA/MEM
This removes the loss between the output of the mixer and the input to the receiver, and
provides a linear power sweep for use in subsequent measurements.
8. Make the connections as shown in Figure 2-29.

CAUTION To prevent connector damage, use an adapter (part number 1250-1462) as a

connector saver for R CHANNEL IN.

2-38
 Making Mixer Measurements
Conversion Compression Using the Frequency Offset Mode

Figure 2-29 Connections for the Second Portion of Conversion Compression

Measurement

9. To set the frequency offset mode LO frequency, press:

System

INSTRUMENT MODE FREQ OFFS MENU

LO MENU FREQUENCY:CW 600 M/µ

10.To select the converter type, press:

RETURN

UP CONVERTER
11.To select a low-side LO measurement configuration, press:

RF>LO

FREQ OFFS ON
In this low-side LO, up converter measurement, the analyzer source frequency is offset
lower than the receiver frequency. The analyzer source frequency can be determined from
the following equation:
receiver frequency (800 MHz) − LO frequency (600 MHz) = 200 MHz
The measurements setup diagram is shown in Figure 2-30.

2- 39
Making Mixer Measurements
Conversion Compression Using the Frequency Offset Mode

Figure 2-30 Measurement Setup Diagram Shown on Analyzer Display

12.To view the mixer’s output power as a function of its input power, press:

VIEW MEASURE
13.To set up an active marker to search for the 1 dB compression point of the mixer, press:

Scale Ref

AUTO SCALE

Marker Search SEARCH:MAX

14.Press:

Marker MKR ZERO

Marker Search TARGET −1 x1

The measurement results show the mixer’s 1 dB compression point. By changing the
target value, you can easily locate other compression points (for example, 0.5 dB, 3 dB).
See Figure 2-31.
15.Read the compressed power on by turning marker ∆ off.

Marker ∆ MODE MENU ∆ MODE OFF

2-40
 Making Mixer Measurements
Conversion Compression Using the Frequency Offset Mode

Figure 2-31 Example Swept Power Conversion Compression Measurement

2- 41
Making Mixer Measurements
Isolation Example Measurements

Isolation Example Measurements

Isolation is the measure of signal leakage in a mixer. Feedthrough is specifically the
forward signal leakage to the IF port. High isolation means that the amount of leakage or
feedthrough between the mixer’s ports is very small. Isolation measurements do not use
the frequency offset mode. Figure 2-32 illustrates the signal flow in a mixer.

Figure 2-32 Signal Flow in a Mixer Example

LO to RF Isolation
LO to RF isolation is the amount the LO power is attenuated when it appears directly at
the RF port.

1. Initialize the analyzer by pressing Preset .

2. To select the analyzer frequency range and source power, press:

Start 10 M/µ

Stop 3000 M/µ

Power 0 x1
This source stimulates the mixer’s LO port.
3. To select a ratio B/R measurement, press:

Meas B/R
4. Make the connections as shown in Figure 2-33.

2-42
 Making Mixer Measurements
Isolation Example Measurements

Figure 2-33 Connections for a Response Calibration

5. Perform a response calibration by pressing Cal CALIBRATE MENU RESPONSE

THRU .

NOTE A full 2-port calibration will increase the accuracy of isolation measurements.
Refer to Chapter 5 , “Optimizing Measurement Results.”

6. Make the connections as shown in Figure 2-34.

CAUTION To get an accurate assessment of the LO-IF isolation, the proper LO power
level must be input to the LO port.

2- 43
Making Mixer Measurements
Isolation Example Measurements

Figure 2-34 Connections for a Mixer Isolation Measurement

7. To adjust the display scale, press:

Scale Ref

AUTO SCALE
The measurement results show the mixer’s LO to RF isolation.

Figure 2-35 Example Mixer LO to RF Isolation Measurement

2-44
 Making Mixer Measurements
Isolation Example Measurements

RF Feedthrough
The procedure and equipment configuration necessary for this measurement are very
similar to those of the previous LO to RF Isolation procedure, with the addition of an
external source to drive the mixer’s LO port as we measure the mixer’s RF feedthrough.
RF feedthrough measurements do not use the frequency offset mode.
1. Select the CW LO frequency and source power from the front panel of the external
source.
CW frequency = 300 MHz
Power = 10 dBm
2. Initialize the analyzer by pressing Preset .
3. To select the analyzer frequency range and source power, press:

Start 10 M/µ

Stop 3000 M/µ

Power 0 x1
This source stimulates the mixer’s LO port.
4. To select a ratio B/R measurement, press:

Meas B/R

NOTE Isolation is dependent on LO power level and frequency. To ensure good test
results, you should choose these parameters as close to actual operating
conditions as possible.

5. Make the connections as shown in Figure 2-36.

Figure 2-36 Connections for a Response Calibration

2- 45
Making Mixer Measurements
Isolation Example Measurements

6. Perform a response calibration by pressing Cal CALIBRATE MENU RESPONSE

THRU .
7. Make the connections as shown in Figure 2-37.

Figure 2-37 Connections for a Mixer RF Feedthrough Measurement

8. Connect the external LO source to the mixer’s LO port.

9. The measurement results show the mixer’s RF feedthrough.

NOTE You may see spurious responses on the analyzer trace due to interference
caused by LO to IF leakage in the mixer. This can be reduced with averaging
or by reducing the IF bandwidth.

2-46
 Making Mixer Measurements
Isolation Example Measurements

Figure 2-38 Example Mixer RF Feedthrough Measurement

You can measure the IF to RF isolation in a similar manner, but with the following
modifications:
• Use the analyzer source as the IF signal drive.
• View the leakage signal at the RF port.

2- 47
Making Mixer Measurements
Isolation Example Measurements

SWR / Return Loss

Reflection coefficient (Γ) is defined as the ratio between the reflected voltage (Vr) and
incident voltage (Vi). Standing wave ratio (SWR) is defined as the ratio of maximum
standing wave voltage to the minimum standing wave voltage and can be derived from the
reflection coefficient (Γ) using the following equation. Return loss can be derived from the
reflection coefficient as well.

V
Γ = -----r
Vi

+ Γ
SWR = 1---------------
1– Γ

Return loss = – 20 log Γ

NOTE Mixers are three-port devices, and the reflection from any one port depends
on the conditions of the other two ports. You should replicate the operating
conditions the mixer will experience as closely as possible for the
measurement. For all mixer SWR measurements, use the same power level
that the mixer will use during normal operation.

When you measure the RF port SWR, you should have the LO drive level present and set
to the expected frequency and power levels. Different LO drives and frequencies may yield
different values for SWR at the same RF frequencies. The IF port should be terminated in
a condition as close to its operating state as possible.
The measurements of LO port SWR and IF port SWR are very similar. For IF port SWR,
you should terminate the RF port in a matched condition and apply the LO signal at its
normal operating level. For the LO port SWR, the RF and IF ports should both be
terminated in conditions similar to what will be present during normal operation.

2-48
3 Making Time Domain Measurements

3-1
Making Time Domain Measurements
Using This Chapter

Using This Chapter

This chapter contains the following:
• An introduction to time domain measurements
• Example procedures for making time domain transmission and reflection response
measurements
• Information on the following time domain concepts:
— "Time Domain Bandpass Mode" on page 3-12
— "Time Domain Low Pass Mode" on page 3-15
— "Transforming CW Time Measurements into the Frequency Domain" on page 3-22
— "Masking" on page 3-26
— "Windowing" on page 3-27
— "Range" on page 3-30
— "Resolution" on page 3-32
— "Gating" on page 3-35

3-2
 Making Time Domain Measurements
Introduction to Time Domain Measurements

Introduction to Time Domain Measurements

The analyzers with Option 010 allow you to measure the time domain response of a device.
Time domain analysis is useful for isolating a device problem in time or in distance. Time
and distance are related by the velocity factor of your device under test (DUT) which is
described in "Time Domain Bandpass Mode" on page 3-12.
The analyzer measures the frequency response of your device and uses an inverse Fourier
transform (a mathematical calculation) to convert the frequency domain information into
the time domain, with time as the horizontal display axis. The analyzer’s internal
computer makes this mathematical calculation using the chirp-Z Fourier transform
technique.
The resulting measurement is the fully error-corrected time domain reflection or
transmission response of the test device, displayed in near real-time. Response values
(measured on the vertical axis) now appear separated in time or distance, providing
valuable insight into the behavior of the test device beyond simple frequency
characteristics.
With Option 010, the analyzer can transform frequency domain data to the time domain or
time domain data to the frequency domain.

NOTE The analyzer can be ordered with Option 010, or the option can be added at a
later date.

The transform used by the analyzer resembles time domain reflectometry (TDR)
measurements. TDR measurements, however, are made by launching an impulse or step
into the test device and observing the response in time with a receiver similar to an
oscilloscope. In contrast, the analyzer makes swept frequency response measurements,
and mathematically transforms the data into a TDR-like display.
Figure 3-1 illustrates the frequency and time domain reflection responses of a test device.
The frequency domain reflection measurement is the composite of all the signals reflected
by the discontinuities present in the test device over the measured frequency range.

3- 3
Making Time Domain Measurements
Introduction to Time Domain Measurements

Figure 3-1 Device Frequency Domain and Time Domain Reflection Responses

The time domain measurement shows the effect of each discontinuity as a function of time
(or distance), and shows that the test device response consists of three separate impedance
changes. The second discontinuity has a reflection coefficient magnitude of 0.035 (i.e. 3.5%
of the incident signal is reflected). Marker 1 on the time domain trace shows the elapsed
time from the reference plane (where the calibration standards are connected) to the
discontinuity and back: 18.2 nanoseconds.
The analyzer has three frequency-to-time transform modes:
• Time domain bandpass mode simulates the time domain response of an impulse
input and is designed to measure band-limited devices. Although this mode is the
easiest to use, it results in less time domain resolution than low pass mode, and may
result in some magnitude errors at low frequencies when gating is used. For devices
that are not band-limited, one of the low pass modes is recommended.
• Time domain low pass step mode simulates the time domain response of a step
input. As in a traditional TDR measurement, the distance to the discontinuity in the
test device, and the type of discontinuity (resistive, capacitive, inductive) can be
determined.
• Time domain low pass impulse mode simulates the time domain response of an
impulse input (like the bandpass mode). Both low pass modes yield better time domain
resolution for a given frequency span than does the bandpass mode. In addition, when
using the low pass modes, you can determine the type of discontinuity. However, these
modes have certain limitations that are defined in "Time Domain Bandpass Mode" on
page 3-12.
The analyzer has one time-to-frequency transform mode:
• Forward transform mode transforms CW signals measured over time into the
frequency domain, to measure the spectral content of a signal. This mode is known as
the CW time mode.

3-4
 Making Time Domain Measurements
Making Transmission Response Measurements

Making Transmission Response Measurements

In this example measurement there are three components of the transmission response:
• RF leakage at near zero time
• the main travel path through the device (1.6 µs travel time)
• the "triple travel" path (4.8 µs travel time)
This example procedure also shows you how time domain analysis allows you to
mathematically remove individual parts of the time domain response to see the effect of
potential design changes. This is accomplished by "gating" out the undesirable responses.
With the "gating" capability, the analyzer time domain allows you to perform "what if"
analysis by mathematically removing selected reflections and seeing the effect in the
frequency domain.
1. Connect the device as shown in Figure 3-2.

Figure 3-2 Device Connections for Time Domain Transmission Example

Measurement

2. To choose the measurement parameters, press:

Preset
Meas Trans: FWD S21 (B/R)
Start 119 M/µ
Stop 149 M/µ
Scale Ref AUTO SCALE
3. Substitute a thru for the device under test and perform a frequency response correction.
Refer to Chapter 6 , “Calibrating for Increased Measurement Accuracy.”
4. Reconnect your device under test.

3- 5
Making Time Domain Measurements
Making Transmission Response Measurements

5. To transform the data from the frequency domain to the time domain and set the sweep
from 0 s to 6 µs, press:
System TRANSFORM MENU BANDPASS TRANSFORM ON
Start 0 G/n Stop 6 M/µ
The other time domain modes, low pass step and low pass impulse, are described in
"Time Domain Low Pass Mode" on page 3-15.
6. To better view the measurement trace, press:
Scale Ref REFERENCE VALUE and turn the front panel knob, or enter a value from
the front panel keypad.
7. To measure the peak response from the main path, press:
Marker Search SEARCH: MAX
The three responses shown in Figure 3-3 are the RF leakage near zero seconds, the
main travel path through the filter, and the triple travel path through the filter. Only
the combination of these responses was evident to you in the frequency domain.

Figure 3-3 Time Domain Transmission Example Measurement

8. To access the gate function menu, press:

System TRANSFORM MENU SPECIFY GATE CENTER
9. To set the gate parameters, by entering the marker value, press:
1.6 M/µ , or turn the front panel knob to position the center gate marker. This
marker, shaped like a “T”, is shown in Figure 3-4.
10.To set the gate span, press:
Span 1.2 M/µ or turn the front panel knob to position the "flag" gate markers.

3-6
 Making Time Domain Measurements
Making Transmission Response Measurements

11.To activate the gating function to remove any unwanted responses, press:
GATE ON
As shown in Figure 3-4, only response from the main path is displayed.

NOTE You may remove the displayed response from inside the gate markers by
pressing SPAN and turning the front panel knob to exchange the "flag"
marker positions.

Figure 3-4 Gating in a Time Domain Transmission Example Measurement

12.To adjust the gate shape for the best possible time domain response, press
GATE SHAPE and select between minimum, normal, wide, and maximum. Each gate
has a different passband flatness, cutoff rate, and sidelobe levels. A detailed discussion
of gating and gate shape selections is located in "Gating" on page 3-35 and "Selecting
Gate Shape" on page 3-36.
The passband ripple and sidelobe levels are descriptive of the gate shape. The cutoff
time is the time between the stop time (−6 dB on the filter skirt) and the peak of the
first sidelobe, and is equal on the left and right side skirts of the filter. The minimum
gate span is just twice the cutoff time because it has no passband.

3- 7
Making Time Domain Measurements
Making Transmission Response Measurements

Figure 3-5 Gate Shape

• To see the effect of the gating in the frequency domain, press:

System TRANSFORM MENU TRANSFORM OFF
Scale Ref AUTO SCALE
OF
Display DATA→MEM DISPLAY: DATA AND MEMORY
System TRANSFORM MENU SPECIFY GATE GATE OFF
This places the gated response in memory. Figure 3-6 shows the effect of removing the RF
leakage and the triple travel signal path using gating. By transforming back to the
frequency domain, we see that this design change would yield better out-of-band rejection.

Figure 3-6 Gating Effects in a Frequency Domain Example Measurement

3-8
 Making Time Domain Measurements
Making Reflection Response Measurements

Making Reflection Response Measurements

The time domain response of a reflection measurement is often compared with the time
domain reflectometry (TDR) measurements. Like the TDR, the analyzer measures the size
of the reflections versus time (or distance). Unlike the TDR, the time domain capability of
the analyzer allows you to choose the frequency range over which you would like to make
the measurement.
1. To choose the measurement parameters, press:

Preset
Meas Refl: FWD S11 (A/R)
Start 50 M/µ
Stop 3 G/n
2. Perform an S11 1-port correction on PORT 1. Refer to Chapter 5 , "Optimizing
Measurement Results" for a detailed procedure.
3. Connect your device under test as shown in Figure 3-7.

Figure 3-7 Device Connections for Reflection Time Domain Example

Measurement

4. To better view the measurement trace, press:

Scale Ref AUTO SCALE
Figure 3-8 shows the frequency domain reflection response of the cables under test. The
complex ripple pattern is caused by reflections from the adapters interacting with each
other. By transforming this data to the time domain, you can determine the magnitude
of the reflections versus distance along the cable.

3- 9
Making Time Domain Measurements
Making Reflection Response Measurements

Figure 3-8 Device Response in the Frequency Domain

5. To transform the data from the frequency domain to the time domain, press:
System TRANSFORM MENU BANDPASS TRANSFORM ON
6. To view the time domain over the length (<4 meters) of the cable under test, press:

Format LIN MAG

Start 0 x1
Stop 35 G/n
The stop time corresponds to the length of the cable under test. The energy travels
about 1 foot per nanosecond, or 0.3 meter/ns, in free space. Most cables have a relative
velocity of about 0.66 the speed in free space. Calculate about 3 ns/foot, or 10 ns/meter,
for the stop time when you are measuring the return trip distance to the cable end.
7. To enter the relative velocity of the cable under test, press Cal MORE
VELOCITY FACTOR and enter a velocity factor for your cable under test.

NOTE Most cables have a relative velocity of 0.66 (for polyethylene dielectrics) or 0.7
(for teflon dielectrics). If you would like the markers to read actual one-way
distance rather than return trip distance, enter one-half the actual velocity
factor. Then the markers will read the actual one-way distance to the
reflection of interest rather than the "electrical length" that assumes a
relative velocity of 1.

1
Velocity Factor = --------
εr
where εr is the relative permittivity of the cable dielectric.

3-10
 Making Time Domain Measurements
Making Reflection Response Measurements

8. To position the marker on the reflection of interest, press:

Marker and turn the front panel knob, or enter a value from the front panel keypad.
In this example, the velocity factor was set to one-half the actual value, so the marker
reads the time and distance to the reflection.
9. To position a marker at each reflection of interest, as shown in Figure 3-9, press:
MARKER 2 MARKER 3 MARKER 4 , turning the front panel knob or entering a
value from the front panel keypad after each key press.

Figure 3-9 Device Response in the Time Domain

3- 11
Making Time Domain Measurements
Time Domain Bandpass Mode

Time Domain Bandpass Mode

This mode is called bandpass because it works with band-limited devices. Traditional TDR
requires that the test device be able to operate down to dc. Using bandpass mode, there are
no restrictions on the measurement frequency range. Bandpass mode characterizes the
test device impulse response.

Adjusting the Relative Velocity Factor

A marker provides both the two-way time and the two-way electrical length (or distance) to
a discontinuity. The distance displayed is based on the assumption that the signal travels
at the speed of light. The signal travels slower than the speed of light in most media (e.g.
coax cables). This slower velocity (relative to light) can be compensated for by adjusting the
analyzer relative velocity factor. To determine the physical length, rather than the
electrical length, change the velocity factor to that of the medium under test:

1. Press Cal MORE VELOCITY FACTOR .

2. Enter a velocity factor between 0 and 1.0 (1.0 corresponds to the speed of light in a
vacuum). Most cables have a velocity factor of 0.66 (polyethylene dielectrics) or 0.70
(teflon dielectrics).

NOTE To cause the markers to read the actual one-way distance to a discontinuity,
rather than the two-way distance, enter one-half the actual velocity factor.

Reflection Measurements Using Bandpass Mode

The bandpass mode can transform reflection measurements to the time domain. Figure
3-10 (left) shows a typical frequency response reflection measurement of two sections of
cable. Figure 3-10 (right) shows the same two sections of cable in the time domain using
the bandpass mode.

3-12
 Making Time Domain Measurements
Time Domain Bandpass Mode

Figure 3-10 A Reflection Measurement of Two Cables

The ripples in reflection coefficient versus frequency in the frequency domain

measurement are caused by the reflections at each connector "beating" against each other.
One at a time, loosen the connectors at each end of the cable and observe the response in
both the frequency domain and the time domain. The frequency domain ripples increase as
each connector is loosened, corresponding to a larger reflection adding in and out of phase
with the other reflections. The time domain responses increase as you loosen the connector
that corresponds to each response.

Interpreting the Bandpass Reflection Response Horizontal Axis

In bandpass reflection measurements, the horizontal axis represents the time it takes for
an impulse launched at the test port to reach a discontinuity and return to the test port
(the two-way travel time). In Figure 3-10, each connector is a discontinuity.

Interpreting the Bandpass Reflection Response Vertical Axis

The quantity displayed on the vertical axis depends on the selected format. The common
formats are listed in Table 3-1. The default format is LOG MAG (logarithmic magnitude),
which displays the return loss in decibels (dB). LIN MAG (linear magnitude) is a format
that displays the response as reflection coefficient ρ. This can be thought of as an average
reflection coefficient of the discontinuity over the frequency range of the measurement.
Use the REAL format only in low pass mode.

3- 13
Making Time Domain Measurements
Time Domain Bandpass Mode

Table 3-1 Time Domain Reflection Formats

Format Parameter

LIN MAG Reflection Coefficient (unitless) (0 < ρ < 1)

REAL Reflection Coefficient (unitless) (−1 < ρ < 1)
LOG MAG Return Loss (dB)
SWR Standing Wave Ratio (unitless)

Transmission Measurements Using Bandpass Mode

The bandpass mode can also transform transmission measurements to the time domain.
For example, this mode can provide information about a surface acoustic wave (SAW) filter
that is not apparent in the frequency domain. Figure 3-11 illustrates a time domain
bandpass measurement of a 321 MHz SAW filter.

Figure 3-11 Transmission Measurement in Time Domain Bandpass Mode

Interpreting the Bandpass Transmission Response Horizontal Axis

In time domain transmission measurements, the horizontal axis is displayed in units of
time. The time axis indicates the propagation delay through the device. Note that in time
domain transmission measurements, the value displayed is the actual delay (not twice the
delay). The marker provides the propagation delay in both time and distance.
Marker 2 in Figure 3-11 (left) indicates the main path response through the test device,
which has a propagation delay of 655.6 ns, or about 196.5 meters in electrical length.
Marker 4 in Figure 3-11 (right) indicates the triple-travel path response at 1.91 µs, or
about 573.5 meters. The response at marker 1 (at 0 seconds) is an RF feedthrough leakage
path. In addition to the triple travel path response, there are several other multi-path
responses through the test device, which are inherent in the design of a SAW filter.

Interpreting the Bandpass Transmission Response Vertical Axis

In the log magnitude format, the vertical axis displays the transmission loss or gain in dB;
in the linear magnitude format it displays the transmission coefficient τ. Think of this as
an average of the transmission response over the measurement frequency range.

3-14
 Making Time Domain Measurements
Time Domain Low Pass Mode

Time Domain Low Pass Mode

This mode is used to simulate a traditional time domain reflectometry (TDR)
measurement. It provides information to determine the type of discontinuity (resistive,
capacitive, or inductive) that is present. Low pass provides the best resolution for a given
bandwidth in the frequency domain. It may be used to give either the step or impulse
response of the test device.
The low pass mode is less general-purpose than the bandpass mode because it places strict
limitations on the measurement frequency range. The low pass mode requires that the
frequency domain data points are harmonically related from dc to the stop frequency. That
is, stop = n × start, where n = number of points.
For example, with a start frequency of 30 kHz and 101 points, the stop frequency would be
3.03 MHz. Since the analyzer frequency range starts at 30 kHz, the dc frequency response
is extrapolated from the lower frequency data. The requirement to pass dc is the same
limitation that exists for traditional TDR.

Setting the Frequency Range for Time Domain Low Pass

Before a low pass measurement is made, the measurement frequency range must meet the
(stop = n × start) requirement previously described. The SET FREQ LOW PASS softkey
performs this function automatically: the stop frequency is set close to the entered stop
frequency, and the start frequency is set equal to stop/n.
If the low end of the measurement frequency range is critical, it is best to calculate
approximate values for the start and stop frequencies before pressing
SET FREQ LOW PASS and calibrating. This avoids distortion of the measurement
results. To see an example, select the preset values of 201 points and a 300 kHz to 3 GHz
frequency range. Now press SET FREQ LOW PASS and observe the change in frequency
values. The stop frequency changes to 2.999 GHz, and the start frequency changes to
14.925 MHz. This would cause a distortion of measurement results for frequencies from
300 kHz to 14.925 MHz.

NOTE If the start and stop frequencies do not conform to the low pass requirement
before a low pass mode (step or impulse) is selected and transform is turned
on, the analyzer resets the start and stop frequencies. If error correction is on
when the frequency range is changed, this turns it off. Therefore, set the
frequency range for time domain low pass before performing a calibration.

3- 15
Making Time Domain Measurements
Time Domain Low Pass Mode

Table 3-2 Minimum Frequency Ranges for Time Domain Low Pass

Number of Points Minimum Frequency Range Number of Points Minimum Frequency Range

3 30 kHz to 0.09 MHz 201 30 kHz to 6.03 MHz

11 30 kHz to 0.33 MHz 401 30 kHz to 12.03 MHz

26 30 kHz to 0.78 MHz 801 30 kHz to 24.03 MHz

51 30 kHz to 1.53 MHz 1601 30 kHz to 48.03 MHz

101 30 kHz to 3.03 MHz

Minimum Allowable Stop Frequencies

The lowest analyzer measurement frequency is 300 kHz (30 kHz with Option 006),
therefore for each value of n there is a minimum allowable stop frequency that can be used.
That is, the minimum stop frequency = n × 30 kHz. Table 3-2 lists the minimum frequency
range that can be used for each value of n for low pass time domain measurements.

Reflection Measurements in Time Domain Low Pass

Figure 3-12 shows the time domain response of an unterminated cable in both the low-pass
step and low-pass impulse modes.

Figure 3-12 Time Domain Low Pass Measurements of an Unterminated Cable

Interpreting the Low Pass Response Horizontal Axis

The low pass measurement horizontal axis is the two-way travel time to the discontinuity
(as in the bandpass mode). The marker displays both the two-way time and the electrical
length along the trace. To determine the actual physical length, enter the appropriate
velocity factor as described in "Time Domain Bandpass Mode" on page 3-12.

3-16
 Making Time Domain Measurements
Time Domain Low Pass Mode

Interpreting the Low Pass Response Vertical Axis

The vertical axis depends on the chosen format. In the low pass mode, the frequency
domain data is taken at harmonically related frequencies and extrapolated to dc. Because
this results in the inverse Fourier transform having only a real part (the imaginary part is
zero), the most useful low pass step mode format in this application is the real format. It
displays the response in reflection coefficient units. This mode is similar to the traditional
TDR response, which displays the reflected signal in a real format (volts) versus time (or
distance) on the horizontal axis.
The real format can also be used in the low pass impulse mode, but for the best dynamic
range for simultaneously viewing large and small discontinuities, use the log magnitude
format.

3- 17
Making Time Domain Measurements
Time Domain Low Pass Mode

Fault Location Measurements Using Low Pass

As described, the low pass mode can simulate the TDR response of the test device. This
response contains information useful in determining the type of discontinuity present.
Figure 3-13 illustrates the low pass responses of known discontinuities. Each circuit
element was simulated to show the corresponding low pass time domain S11 response
waveform. The low pass mode gives the test device response either to a step or to an
impulse stimulus. Mathematically, the low pass impulse stimulus is the derivative of the
step stimulus.

Figure 3-13 Simulated Low Pass Step and Impulse Response Waveforms (Real
Format)

Figure 3-14 shows example cables with discontinuities (faults) using the low pass step
mode with the real format.

3-18
 Making Time Domain Measurements
Time Domain Low Pass Mode

Figure 3-14 Low Pass Step Measurements of Common Cable Faults (Real
Format)

Transmission Measurements in Time Domain Low Pass

Measuring Small Signal Transient Response Using Low Pass Step

Use the low pass mode to analyze the test device’s small signal transient response. The
transmission response of a device to a step input is often measured at lower frequencies,
using a function generator (to provide the step to the test device) and a sampling
oscilloscope (to analyze the test device output response). The low pass step mode extends
the frequency range of this type of measurement to the maximum frequency of the
analyzer.
The step input shown in Figure 3-15 is the inverse Fourier transform of the frequency
domain response of a thru measured at calibration. The step rise time is proportional to
the highest frequency in the frequency domain sweep; the higher the frequency, the faster
the rise time. The frequency sweep in Figure 3-15 is from 10 MHz to 1 GHz.
Figure 3-15 also illustrates the time domain low pass response of an amplifier under test.
The average group delay over the measurement frequency range is the difference in time
between the step and the amplifier response. This time domain response simulates an
oscilloscope measurement of the amplifier’s small signal transient response. Note the
ringing in the amplifier response that indicates an under-damped design.

3- 19
Making Time Domain Measurements
Time Domain Low Pass Mode

Figure 3-15 Time Domain Low Pass Measurement of an Amplifier Small Signal
Transient Response

Interpreting the Low Pass Step Transmission Response Horizontal Axis

The low pass transmission measurement horizontal axis displays the average transit time
through the test device over the frequency range used in the measurement. The response
of the thru connection used in the calibration is a step that reaches 50% unit height at
approximately time = 0. The rise time is determined by the highest frequency used in the
frequency domain measurement. The step is a unit high step, which indicates no loss for
the thru calibration. When a device is inserted, the time axis indicates the propagation
delay or electrical length of the device. The markers read the electrical delay in both time
and distance. The distance can be scaled by an appropriate velocity factor as described in
"Time Domain Bandpass Mode" on page 3-12.

Interpreting the Low Pass Step Transmission Response Vertical Axis

In the real format, the vertical axis displays the transmission response in real units (for
example, volts). For the amplifier example in Figure 3-15, if the amplifier input is a step of
1 volt, the output, 2.4 nanoseconds after the step (indicated by marker 1), is 5.84 volts.
In the log magnitude format, the amplifier gain is the steady state value displayed after
the initial transients die out.

Measuring Separate Transmission Paths through the Test Device Using Low
Pass Impulse Mode
The low pass impulse mode can be used to identify different transmission paths through a
test device that has a response at frequencies down to dc (or at least has a predictable
response, above the noise floor, below 30 kHz).
For example, use the low pass impulse mode to measure the relative transmission times
through a multi-path device such as a power divider. Another example is to measure the
pulse dispersion through a broadband transmission line, such as a fiber optic cable. Both
examples are illustrated in Figure 3-16. The horizontal and vertical axes can be
interpreted as already described in "Time Domain Bandpass Mode" on page 3-12.

3-20
 Making Time Domain Measurements
Time Domain Low Pass Mode

Figure 3-16 Transmission Measurements Using Low Pass Impulse Mode

3- 21
Making Time Domain Measurements
Transforming CW Time Measurements into the Frequency Domain

Transforming CW Time Measurements into the Frequency

Domain
The analyzer can display the amplitude and phase of CW signals versus time. For example,
use this mode for measurements such as amplifier gain as a function of warmup time (i.e.
drift). The analyzer can display the measured parameter (e.g. amplifier gain) for periods of
up to 24 hours and then output the data to a digital plotter for hardcopy results.
These "strip chart" plots are actually measurements as a function of time (time is the
independent variable), and the horizontal display axis is scaled in time units. Transforms
of these measurements result in frequency domain data. Such transforms are called
forward transforms because the transform from time to frequency is a forward Fourier
transform, and can be used to measure the spectral content of a CW signal. For example,
when transformed into the frequency domain, a pure CW signal measured over time
appears as a single frequency spike. The transform into the frequency domain yields a
display that looks similar to a spectrum analyzer display of signal amplitude versus
frequency.

Forward Transform Measurements

Figure 3-17 shows an example of a measurement using the Fourier transform in the
forward direction, from the time domain to the frequency domain.

Figure 3-17 Amplifier Gain Measurement

Interpreting the Forward Transform Vertical Axis

With the log magnitude format selected, the vertical axis displays dB. This format
simulates a spectrum analyzer display of power versus frequency.

3-22
 Making Time Domain Measurements
Transforming CW Time Measurements into the Frequency Domain

Interpreting the Forward Transform Horizontal Axis

In a frequency domain transform of a CW time measurement, the horizontal axis is
measured in units of frequency. The center frequency is the offset of the CW frequency. For
example, with a center frequency of 0 Hz, the CW frequency (250 MHz in the example) is in
the center of the display. If the center frequency entered is a positive value, the CW
frequency shifts to the right half of the display; a negative value shifts it to the left half of
the display. The span value entered with the transform on is the total frequency span
shown on the display. (Alternatively, the frequency display values can be entered as start
and stop.)

Demodulating the Results of the Forward Transform

The forward transform can separate the effects of the CW frequency modulation amplitude
and phase components. For example, if a test device modulates the transmission response
(S21) with a 500 Hz AM signal, you can see the effects of that modulation as shown in
Figure 3-18. To simulate this effect, apply a 500 Hz sine wave to the analyzer rear panel
EXT AM input.

Figure 3-18 Combined Effects of Amplitude and Phase Modulation

Using the demodulation capabilities of the analyzer, it is possible to view the amplitude or
the phase component of the modulation separately. The window menu includes the
following softkeys to control the demodulation feature:
DEMOD: OFF is the normal preset state, in which both the amplitude and phase
components of any test device modulation appear on the display.
AMPLITUDE displays only the amplitude modulation, as illustrated in Figure 3-19a.
PHASE displays only the phase modulation, as shown in Figure 3-19b.

3- 23
Making Time Domain Measurements
Transforming CW Time Measurements into the Frequency Domain

Figure 3-19 Separating the Amplitude and Phase Components of

Test-Device-Induced Modulation

Forward Transform Range

In the forward transform (from CW time to the frequency domain), range is defined as the
frequency span that can be displayed before aliasing occurs, and is similar to range as
defined for time domain measurements. In the range formula, substitute time span for
frequency span.

Number of points – 1
Range = -------------------------------------------------------------
time span

201 – 1
Range = --------------------------
–3
200 × 10

Range = 1000 Hertz

For the example, a 201 point CW time measurement made over a 200 ms time span, choose
a span of 1 kHz or less on either side of the center frequency (see Figure 3-20). That is,
choose a total span of 2 kHz or less.

3-24
 Making Time Domain Measurements
Transforming CW Time Measurements into the Frequency Domain

Figure 3-20 Range of a Forward Transform Measurement

To increase the frequency domain measurement range, increase the span. The maximum
range is inversely proportional to the sweep time, therefore it may be necessary to increase
the number of points or decrease the sweep time. Because increasing the number of points
increases the auto sweep time, the maximum range is 2 kHz on either side of the selected
CW time measurement center frequency (4 kHz total span). To display a total frequency
span of 4 kHz, enter the span as 4000 Hz.

3- 25
Making Time Domain Measurements
Masking

Masking
Masking occurs when a discontinuity (fault) closest to the reference plane affects the
response of each subsequent discontinuity. This happens because the energy reflected from
the first discontinuity never reaches subsequent discontinuities. For example, if a
transmission line has two discontinuities that each reflect 50% of the incident voltage, the
time domain response (real format) shows the correct reflection coefficient for the first
discontinuity (ρ=0.50). However, the second discontinuity appears as a 37.5% reflection
(ρ=0.375) because only some the incident voltage reached the second discontinuity, and
some of that reflected energy is reflected off the first discontinuity as it returns. For two
discrete discontinuities, the apparent reflection of the second discontinuity is appears as
approximately ρ̂ 2 = ( 1 – ρ 2 ) ⋅ ρ , where ρ̂ 2 is the apparent reflection of the second
1 2
discontinuity, ρ 1 is the reflection of the first discontinuity, and ρ2 is the reflection of the
second discontinuity.

NOTE This example assumes a lossless transmission line. Real transmission lines,
with non-zero loss, attenuate signals as a function of the distance from the
reference plane.

As an example of masking due to line loss, consider the time domain response of a 3 dB
attenuator and a short circuit. The impulse response (log magnitude format) of the short
circuit alone is a return loss of 0 dB, as shown in Figure 3-21a. When the short circuit is
placed at the end of the 3 dB attenuator, the return loss is −6 dB, as shown in Figure 3-21b.
This value actually represents the forward and return path loss through the attenuator,
and illustrates how a lossy network can affect the responses that follow it.

Figure 3-21 Masking Example

3-26
 Making Time Domain Measurements
Windowing

Windowing
The analyzer provides a windowing feature that makes time domain measurements more
useful for isolating and identifying individual responses. Windowing is needed because of
the abrupt transitions in a frequency domain measurement at the start and stop
frequencies. The band limiting of a frequency domain response causes overshoot and
ringing in the time domain response, and causes a non-windowed impulse stimulus to have
a sin(kt)/kt shape, where k = π/frequency span and t = time (see Figure 3-22). This has two
effects that limit the usefulness of the time domain measurement:
• Finite impulse width (or rise time). Finite impulse width limits the ability to
resolve between two closely spaced responses. The effects of the finite impulse width
cannot be improved without increasing the frequency span of the measurement (see
Table 3-3).

Figure 3-22 Impulse Width, Sidelobes, and Windowing

• Sidelobes. The impulse sidelobes limit the dynamic range of the time domain
measurement by hiding low-level responses within the sidelobes of higher level
responses. The effects of sidelobes can be improved by windowing (see Table 3-3).
Windowing improves the dynamic range of a time domain measurement by filtering the
frequency domain data prior to converting it to the time domain, producing an impulse
stimulus that has lower sidelobes. This makes it much easier to see time domain responses
that are very different in magnitude. The sidelobe reduction is achieved, however, at the
expense of increased impulse width. The effect of windowing on the step stimulus (low pass
mode only) is a reduction of overshoot and ringing at the expense of increased rise time.
To select a window, press System TRANSFORM MENU WINDOW . A menu is
presented that allows the selection of three window types, see Table 3-3.

3- 27
Making Time Domain Measurements
Windowing

Table 3-3 Impulse Width, Sidelobe Level, and Windowing Values

Window Type Impulse Sidelobe Low Pass Impulse Step Sidelobe Step Rise Time
Level Width (50%) Level (10 − 90%)

Minimum −13 dB 0.60/Freq Span −21 dB 0.45/Freq Span

Normal −44 dB 0.98/Freq Span −60 dB 0.99/Freq Span

Maximum −75 dB 1.39/Freq Span −70 dB 1.48/Freq Span

NOTE: The bandpass mode simulates an impulse stimulus. Bandpass impulse width is twice
that of low pass impulse width. The bandpass impulse sidelobe levels are the same as low pass
impulse sidelobe levels.

Choose one of the three window shapes listed or use the knob to select any windowing
pulse width (or rise time for a step stimulus) between the softkey values. The time domain
stimulus sidelobe levels depend only on the window selected.
MINIMUM is essentially no window. Consequently, it gives the highest
sidelobes.
NORMAL (the preset mode) gives reduced sidelobes and is the mode
most often used.
MAXIMUM window gives the minimum sidelobes, providing the
greatest dynamic range.
USE MEMORY on OFF remembers a user-specified window pulse width (or step
rise time) different from the standard window values.
A window is activated only for viewing a time domain response, and does not affect a
displayed frequency domain response. Figure 3-23 shows the typical effects of windowing
on the time domain response of a short circuit reflection measurement.

3-28
 Making Time Domain Measurements
Windowing

Figure 3-23 The Effects of Windowing on the Time Domain Responses of a Short
Circuit (Real Format)

3- 29
Making Time Domain Measurements
Range

Range
In the time domain, range is defined as the length in time that a measurement can be
made without encountering a repetition of the response, called aliasing. A time domain
response repeats at regular intervals because the frequency domain data is taken at
discrete frequency points, rather than continuously over the frequency band.

1-
Measurement range = ------
∆F
where ∆F is the spacing between frequency data points

( number of points – 1 )
Measurement range = --------------------------------------------------------------
frequency span ( Hz )
For example:

Measurement = 201 points

Frequency Span = 1 MHz to 2.001 GHz

Frequency Spacing ( ∆F ) = 10 MHz

1- ( number of points – 1 )
Range = ------ or -----------------------------------------------------------------
∆F frequency span

1 ( 201 – 1 )
Range = ------------------------- or ----------------------
9
( 2 × 10 )
6
( 10 × 10 )

Range = 100 × 10–9 seconds

Electrical Length = range × the speed of light  3 × 10 ----

8m
 s

ElectricalLength = 100 × 10– 9 s  ×  3 × 10 8 ---- 

m
 s 

ElectricalLength = 30 meters

3-30
 Making Time Domain Measurements
Range

In this example, the range is 100 ns, or 30 meters electrical length. To prevent the time
domain responses from overlapping, the test device must be 30 meters or less in electrical
length for a transmission measurement (15 meters for a reflection measurement). The
analyzer limits the stop time to prevent the display of aliased responses.
To increase the time domain measurement range, first increase the number of points, but
remember that as the number of points increases, the sweep speed decreases. Decreasing
the frequency span also increases range, but reduces resolution.

3- 31
Making Time Domain Measurements
Resolution

Resolution
Two different resolution terms are used in the time domain:
• response resolution
• range resolution

Response Resolution
Time domain response resolution is defined as the ability to resolve two closely-spaced
responses, or a measure of how close two responses can be to each other and still be
distinguished from each other. For responses of equal amplitude, the response resolution is
equal to the 50% (−6 dB) impulse width. It is inversely proportional to the measurement
frequency span, and is also a function of the window used in the transform. The
approximate formulas for calculating the 50% impulse width are given in Table 3-3. For
example, using the formula for the bandpass mode with a normal windowing function for a
50 MHz to 13.05 GHz measurement (13.0 GHz span):

0.98
50 percent calculated impulse width = --------------------------- × 2
13.0 ( GHz )
= 0.151 nanoseconds

 c m 
Electrical length ( in air ) =  0.151 × 10 –9 s  ×  30 × 10
9
   ----
s 

= 4.53 centimeters

With this measurement, two equal responses can be distinguished when they are
separated by at least 4.53 centimeters. In a measurement with a 20 GHz span, two equal
responses can be distinguished when they are separated by at least 2.94 cm. Using the low
pass mode (the low pass frequencies are slightly different) with a minimum windowing
function, you can distinguish two equal responses that are about 1.38 centimeters or more
apart.
For reflection measurements, which measure the two-way time to the response, divide the
response resolution by 2. Using this example, you can distinguish two faults of equal
magnitude provided they are 0.69 centimeters (electrical length) or more apart.

NOTE Remember, to determine the physical length, the relative velocity factor of the
transmission medium under test must be entered into the electrical length
equation.

3-32
 Making Time Domain Measurements
Resolution

For example, a cable with a teflon dielectric (0.7 relative velocity factor), measured under
the conditions stated above, has a fault location measurement response resolution of 0.45
centimeters. This is the maximum fault location response resolution. Factors such as
reduced frequency span, greater frequency domain data windowing, and a large
discontinuity shadowing the response of a smaller discontinuity, all act to degrade the
effective response resolution.
Figure 3-24 illustrates the effects of response resolution. The solid line shows the actual
reflection measurement of two approximately equal discontinuities (the input and output
of an SMA barrel). The dashed line shows the approximate effect of each discontinuity, if
they could be measured separately.

Figure 3-24 Response Resolution

While increasing the frequency span increases the response resolution, keep the following
points in mind:
• The time domain response noise floor is directly related to the frequency domain data
noise floor. Because of this, if the frequency domain data points are taken at or below
the measurement noise floor, the time domain measurement noise floor is degraded.
• The time domain measurement is an average of the response over the frequency range
of the measurement. If the frequency domain data is measured out-of-band, the time
domain measurement is also the out-of-band response.
You may (with these limitations in mind) choose to use a frequency span that is wider than
the test device bandwidth to achieve better resolution.

3- 33
Making Time Domain Measurements
Resolution

Range Resolution
Time domain range resolution is defined as the ability to locate a single response in time. If
only one response is present, range resolution is a measure of how closely you can pinpoint
the peak of that response. The range resolution is equal to the digital resolution of the
display, which is the time domain span divided by the number of points on the display. To
get the maximum range resolution, center the response on the display and reduce the time
domain span. The range resolution is always much finer than the response resolution (see
Figure 3-25).

Figure 3-25 Range Resolution of a Single Discontinuity

3-34
 Making Time Domain Measurements
Gating

Gating
Gating provides the flexibility of selectively removing time domain responses. The
remaining time domain responses can then be transformed back to the frequency domain.
For reflection (or fault location) measurements, use this feature to remove the effects of
unwanted discontinuities in the time domain. You can then view the frequency response of
the remaining discontinuities. In a transmission measurement, you can remove the effects
of multiple transmission paths.
Figure 3-26a shows the frequency response of an electrical airline and termination. Figure
3-26b shows the response in the time domain. The discontinuity on the left is due to the
input connector. The discontinuity on the right is due to the termination. We want to
remove the effect of the connector so that we can see the frequency response of just the
airline and termination. Figure 3-26c shows the gate applied to the connector
discontinuity. Figure 3-26d shows the frequency response of the airline and termination,
with the connector "gated out."

Figure 3-26 Sequence of Steps in Gating Operation

Setting the Gate

Think of a gate as a bandpass filter in the time domain (see Figure 3-27). When the gate is
on, responses outside the gate are mathematically removed from the time domain trace.
Enter the gate position as a start and stop time (not frequency) or as a center and span
time. The start and stop times are the bandpass filter −6 dB cutoff times. Gates can have a
negative span, in which case the responses inside the gate are mathematically removed.
The gate’s start and stop flags define the region where gating is on.

3- 35
Making Time Domain Measurements
Gating

Figure 3-27 Gate Shape

Selecting Gate Shape

The four gate shapes available are listed in Table 3-4. Each gate has a different passband
flatness, cutoff rate, and sidelobe levels.
Table 3-4 Gate Characteristics

Gate Shape Passband Ripple Sidelobe Levels Cutoff Time Minimum Gate Span

Gate Span

Minimum ±0.10 dB −48 dB 1.4/Freq Span 2.8/Freq Span

Normal ±0.10 dB −68 dB 2.8/Freq Span 5.6/Freq Span

Wide ±0.10 dB −57 dB 4.4/Freq Span 8.8/Freq Span

Maximum ±0.10 dB −70 dB 12.7/Freq Span 25.4/Freq Span

Note: With 1601 frequency points, gating is available only in the bandpass mode.

The passband ripple and sidelobe levels are descriptive of the gate shape. The cutoff time
is the time between the stop time (−6 dB on the filter skirt) and the peak of the first
sidelobe, and is equal on the left and right side skirts of the filter. As shown in Table 3-4,
the minimum gate span is just twice the cutoff time because it has no passband. Always
choose a gate span wider than the minimum. For most applications, do not be concerned
about the minimum gate span, simply use the knob to position the gate markers around
the desired portion of the time domain trace.

3-36
4 Printing, Plotting, and Saving
Measurement Results

4-1
Printing, Plotting, and Saving Measurement Results
Using This Chapter

Using This Chapter

This chapter contains instructions for the following tasks:
• Printing or plotting your measurement results
❏ Configuring a print function
❏ Defining a print function
❏ Printing one measurement per page
❏ Printing multiple measurements per page
❏ Configuring a plot function
❏ Defining a plot function
❏ Plotting one measurement per page using a pen plotter
❏ Plotting multiple measurements per page using a pen plotter
❏ Plotting a measurement to disk
❏ To view plot files on a PC
❏ Outputting plot files from a PC to a plotter
❏ Outputting plot files from a PC to an HP-GL compatible printer
❏ Outputting single page plots using a printer
❏ Outputting multiple plots to a single page using a printer
❏ Plotting multiple measurements per page from disk
❏ Titling the displayed measurement
❏ Configuring the analyzer to produce a time stamp
❏ Aborting a print or plot process
❏ Printing or plotting the list values or operating parameters
❏ Solving problems with printing or plotting
• Saving and recalling instrument states
❏ Saving an instrument state
❏ Saving measurement results
❏ Re-saving an instrument state
❏ Deleting a file
❏ Renaming a file
❏ Recalling a file
❏ Formatting a disk
❏ Solving problems with saving or recalling files

4-2
 Printing, Plotting, and Saving Measurement Results
Printing or Plotting Your Measurement Results

Printing or Plotting Your Measurement Results

You can print your measurement results to the following peripherals:
• printers with GPIB interfaces
• printers with parallel interfaces
• printers with serial interfaces
You can plot your measurement results to the following peripherals:
• HPGL compatible printers with GPIB interfaces
• HPGL compatible printers with parallel interfaces
• plotters with GPIB interfaces
• plotters with parallel interfaces
• plotters with serial interfaces
Most Hewlett-Packard desktop printers and plotters are compatible with the analyzer. For
a list of recommended peripherals, refer to the configuration guide for your analyzer. The
following Web site also contains a link to the configuration guide:
www.agilent.com/find/8753
A printer compatibility guide (an up-to-date list of printers that are compatible with the
network analyzer) can be found at the following Web site:
www.agilent.com/find/pcg

4- 3
Printing, Plotting, and Saving Measurement Results
Configuring a Print Function

Configuring a Print Function

All copy configuration settings are stored in non-volatile memory. Therefore, they are not
affected if you press Preset or switch off the analyzer power.
1. Connect the printer to the interface port.

Figure 4-1 Printer Connections to the Analyzer

2. Press Local SET ADDRESSES PRINTER PORT PRNTR TYPE until the correct
printer choice appears: TPE

❏ ThinkJet (QuietJet)
❏ DeskJet (This supports most current models such as DeskJet 890C, DeskJet 895C, or
DeskJet 1600C. See also DJ 540 selection.)
❏ LaserJet (only LaserJet models III, 4, 5, and 6)
❏ PaintJet
❏ Epson-P2 (printers that conform to the ESC/P2 printer control language, such as
Epson LQ-570)
❏ DJ 540 (This can be used for printers that do not support 100 dots per inch (dpi) but
do support 300 dpi such as HP DeskJet 540 or 850C.)

NOTE Selecting DJ 540 converts 100 dpi raster information to 300 dpi raster format.
If your DeskJet printer does not support the 100 dpi raster format and your
printing results seem to be smaller than the normal size (approximately
one-half of the page), select DJ 540.

Information regarding a printer compatibility guide (an up-to-date list of printers that
are compatible with the network analyzer) is available in "Printing or Plotting Your
Measurement Results" on page 4-3.

4-4
 Printing, Plotting, and Saving Measurement Results
Configuring a Print Function

3. Select one of the following printer interfaces:

• Choose PRNTR PORT GPIB if your printer has a GPIB interface, and then
configure the print function as follows:

a. Enter the GPIB address of the printer, followed by x1 .

b. Press Local and SYSTEM CONTROLLER if there is no external controller
connected to the GPIB bus.
c. Press Local and USE PASS CONTROL if there is an external controller
connected to the GPIB bus.
• Choose PARALLEL if your printer has a parallel (Centronics) interface, and then
configure the print function as follows:
Press Local and then select the parallel port interface function by pressing
PARALLEL until the correct function appears.

❏ If you choose PARALLEL [COPY] , the parallel port is dedicated for normal copy
device use (printers or plotters).
❏ If you choose PARALLEL [GPIO] , the parallel port is dedicated for general
purpose I/O, and cannot be used for printing or plotting.
• Choose SERIAL if your printer has a serial (RS-232) interface, and then configure
the print function as follows:

a. Press PRINTER BAUD RATE and enter the printer's baud rate, followed by
x1 .
b. To select the transmission control method that is compatible with your printer,
press XMIT CNTRL (transmit control - handshaking protocol) until the correct
method appears.

❏ If you choose Xon-Xoff , the handshake method allows the printer to control
the data exchange by transmitting control characters to the network analyzer.
❏ If you choose DTR-DSR , the handshake method allows the printer to control
the data exchange by setting the electrical voltage on one line of the RS-232
serial cable.

NOTE Because the DTR-DSR handshake takes place in the hardware rather than
the firmware or software, it is the fastest transmission control method.

4- 5
Printing, Plotting, and Saving Measurement Results
Defining a Print Function

Defining a Print Function

NOTE The print definition is set to default values whenever the power is cycled.
However, you can save the print definition by saving the instrument state.

1. Press Copy DEFINE PRINT .

2. Press PRINT: MONOCHROME or PRINT: COLOR .

❏ Choose PRINT: MONOCHROME if you are using a black and white printer, or you
want just black and white from a color printer.
❏ Choose PRINT: COLOR if you are using a color printer.
3. Press AUTO-FEED until the correct choice (ON or OFF) is highlighted.

❏ Choose AUTO-FEED ON if you want to print one measurement per page.

❏ Choose AUTO-FEED OFF if you want to print multiple measurements per page.

NOTE Laser printers and some DeskJet printers do not begin to print until a full
page, or a partial page and a form feed, have been received.

If You Are Using a Color Printer

1. Press PRINT COLORS .
2. If you want to modify the print colors, select the print element and then choose an
available color.

NOTE You can set all the print elements to black to create a hardcopy in black and
white.
Since the media color is usually white or clear, you could set a print element
to white if you do not want that element to appear on your hardcopy.

4-6
 Printing, Plotting, and Saving Measurement Results
Printing One Measurement Per Page

To Reset the Printing Parameters to Default Values

1. Press Copy DEFINE PRINT DEFAULT PRNT SETUP .
Table 4-1 Default Values for Printing Parameters

Printing Parameter Default

Printer Mode Monochrome

Auto Feed ON

Printer Colors

Channel 1 and 3 Data Magenta

Channel 1 and 3 Memory Green

Channel 2 and 4 Data Blue

Channel 2 and 4 Memory Red

Graticule Cyan

Warning Black

Text Black

Ref Line Black

Printing One Measurement Per Page

1. Configure and define the print function, as explained in "Configuring a Print Function"
on page 4-4 and "Defining a Print Function" on page 4-6.
2. Press Copy PRINT MONOCHROME .

If you defined the AUTO-FEED OFF , press PRINTER FORM FEED after the
message COPY OUTPUT COMPLETED appears. FRM FEED

4- 7
Printing, Plotting, and Saving Measurement Results
Printing Multiple Measurements Per Page

Printing Multiple Measurements Per Page

1. Configure and define the print function, as explained in "Configuring a Print Function"
on page 4-4 and "Defining a Print Function" on page 4-6.
2. Press Copy DEFINE PRINT and then press AUTO-FEED until the softkey label
appears as AUTO-FEED OFF .
3. Press RETURN PRINT MONOCHROME to print a measurement on the first half
page.
4. Make the next measurement that you want to see on your hardcopy. Figure 4-2 shows
an example of a hardcopy where two measurements appear.
5. Press Copy PRINT MONOCHROME to print a measurement on the second half
page.

NOTE This feature will not work for all printers due to differences in printer
resolution.

Figure 4-2 Printing Two Measurements

4-8
 Printing, Plotting, and Saving Measurement Results
Configuring a Plot Function

Configuring a Plot Function

All copy configuration settings are stored in non-volatile memory. Therefore, they are not
affected if you press Preset or switch off the analyzer power.
Peripheral Interface Recommended Cables
Parallel 92284A
GPIB 10833A/33B/33D
Serial 24542G
1. Connect the peripheral to the interface port using the recommended cable from the
following list.

Figure 4-3 Peripheral Connections to the Analyzer

If You Are Plotting to an HPGL/2 Compatible Printer

2. Press Local SET ADDRESSES PLTR PORT and then press PLTR TYPE [ ] until
HPGL PRT appears.
Information regarding a printer compatibility guide (an up-to-date list of printers that
are compatible with the network analyzer) is available in "Printing or Plotting Your
Measurement Results" on page 4-3.
3. Configure the analyzer for one of the following printer interfaces:

• Choose PRNTR PORT GPIB if your printer has an GPIB interface, and then
configure the print function as follows:

a. Enter the GPIB address of the printer (default is 01), followed by x1 .

b. Press Local and SYSTEM CONTROLLER if there is no external controller
connected to the GPIB bus.
c. Press Local and USE PASS CONTROL if there is an external controller
connected to the GPIB bus.

4- 9
Printing, Plotting, and Saving Measurement Results
Configuring a Plot Function

• Choose PARALLEL if your printer has a parallel (Centronics) interface, and then
configure the print function as follows:
Press Local and then select the parallel port interface function by pressing
PARALLEL until the correct function appears.

❏ If you choose PARALLEL [COPY] , the parallel port is dedicated for normal copy
device use (printers or plotters).
❏ If you choose PARALLEL [GPIO] , the parallel port is dedicated for general
purpose I/O, and cannot be used for printing or plotting.
• Choose SERIAL if your printer has a serial (RS-232) interface, and then configure
the print function as follows:

a. Press PRINTER BAUD RATE and enter the printer's baud rate, followed by
x1 .
b. To select the transmission control method that is compatible with your printer,
press XMIT CNTRL (transmit control - handshaking protocol) until the correct
method appears.

❏ If you choose Xon-Xoff , the handshake method allows the printer to control
the data exchange by transmitting control characters to the network analyzer.
❏ If you choose DTR-DSR , the handshake method allows the printer to control
the data exchange by setting the electrical voltage on one line of the RS-232
serial cable.

NOTE Because the DTR-DSR handshake takes place in the hardware rather than
the firmware or software, it is the fastest transmission control method.

4. Press Local SET ADDRESSES PLOTTER PORT and then PLTR TYPE until
PLTR TYPE [HPGL PRT] appears.

If You Are Plotting to a Pen Plotter

1. Press Local SET ADDRESSES PLOTTER PORT and then PLTR TYPE until
PLTR TYPE [PLOTTER] appears.
2. Configure the analyzer for one of the following plotter interfaces:

• Choose PLTR PORT GPIB if your plotter has a GPIB interface, and then configure
the plot function as follows:

a. Enter the GPIB address of the plotter (default is 05), followed by x1 .

b. Press Local and SYSTEM CONTROLLER if there is no external controller
connected to the GPIB bus.
c. Press Local and USE PASS CONTROL if there is an external controller
connected to the GPIB bus.

4-10
 Printing, Plotting, and Saving Measurement Results
Configuring a Plot Function

• Choose PARALLEL if your plotter has a parallel (Centronics) interface, and then
configure the plot function as follows:

❏ Press Local and then select the parallel port interface function by pressing
PARALLEL until the correct function appears.

— If you choose PARALLEL [COPY] , the parallel port is dedicated for normal
copy device use (printers or plotters).
— If you choose PARALLEL [GPIO] , the parallel port is dedicated for general
purpose I/O, and cannot be used for printing or plotting.
• Choose SERIAL if your plotter has a serial (RS-232) interface, and then configure
the plot function as follows:

a. Press PLOTTER BAUD RATE and enter the plotter's baud rate, followed by
x1 .
b. To select the transmission control method that is compatible with your plotter,
press XMIT CNTRL (transmit control - handshaking protocol) until the correct
method appears.

❏ If you choose Xon-Xoff , the handshake method allows the plotter to control
the data exchange by transmitting control characters to the network analyzer.
❏ If you choose DTR-DSR , the handshake method allows the plotter to control
the data exchange by setting the electrical voltage on one line of the RS-232
serial cable.

NOTE Because the DTR-DSR handshake takes place in the hardware rather than
the firmware or software, it is the fastest transmission control method.

If You Are Plotting Measurement Results to a Disk Drive

The plot files that you generate from the analyzer, contain the HPGL representation of the
measurement display. The files will not contain any setup or formfeed commands.

CAUTION Do not mistake the line switch for the disk eject button when you are
removing the disk from the analyzer. If the line switch is mistakenly pushed,
the instrument will be turned off, losing all settings and data that have not
been saved.

1. Configure the analyzer to plot to disk.

a. Press Local SET ADDRESSES PLOTTER PORT DISK .

b. Press Save/Recall SELECT DISK and select the disk drive that you will plot to.

• Choose INTERNAL DISK if you will plot to the analyzer internal disk drive.

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Printing, Plotting, and Saving Measurement Results
Configuring a Plot Function

• Choose EXTERNAL DISK if you will plot to a disk drive that is external to the
analyzer. Then configure the disk drive as follows:

1. Press CONFIGURE EXT DISK ADDRESS: DISK and enter the GPIB
address to the disk drive (defaultDSK
is 00) followed by x1 .
2. Press Local DISK UNIT NUMBER and enter the drive where your disk is
located, followed by x1 .
3. If your storage disk is partitioned, press VOLUME NUMBER and enter the
volume number where you want to store the instrument state file.
2. Press Copy PLOT .
The analyzer assigns the first available default filename for the displayed directory. For
example, the analyzer would assign PLOT00FP for a LIF format (PLOT00.FP for a DOS
format) if there were no previous plot files saved to the disk.
Figure 4-4 shows the three parts of the file name that are generated automatically by
the analyzer whenever a plot is requested. The two digit sequence number is
incremented by one each time a file with a default name is added to the directory.

Figure 4-4 Automatic File Naming Convention for LIF Format

To Output the Plot Files

• You can plot the files to a plotter from a personal computer.
• You can output your plot files to an HPGL compatible printer, by following the sequence
in "Outputting Plot Files from a PC to an HPGL Compatible Printer" on page 4-23.
• You can run a program that plots all of the files, with the root filename of PLOT, to an
HPGL compatible printer. This program is provided on the CD-ROM of example
programs that is included in the programmer’s guide. However, this program is for use
with LIF formatted disks and is written in HP BASIC.

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 Printing, Plotting, and Saving Measurement Results
Defining a Plot Function

Defining a Plot Function

1. Press Copy DEFINE PLOT .

Choosing Display Elements

• Choose which of the following measurement display elements that you want to appear
on your plot:

❏ Choose PLOT DATA ON if you want the measurement data trace to appear on your
plot.
❏ Choose PLOT MEM ON if you want the displayed memory trace to appear on your
plot.
❏ Choose PLOT GRAT ON if you want the graticule and the reference line to appear
on your plot.
❏ Choose PLOT TEXT ON if you want all of the displayed text to appear on your plot.
(This does not include the marker values or softkey labels.)
❏ Choose PLOT MKR ON if you want the displayed markers, and marker values, to
appear on your plot.

Figure 4-5 Plot Components Available through Definition

Selecting Auto-Feed
• Press AUTO-FEED until the correct choice is highlighted.

❏ Choose AUTO-FEED ON if you want a “page eject” sent to the plotter or HPGL
compatible printer after each time you press PLOT .
❏ Choose AUTO-FEED OFF if you want multiple plots on the same sheet of paper.

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Printing, Plotting, and Saving Measurement Results
Defining a Plot Function

NOTE The peripheral ignores AUTO-FEED ON when you are plotting to a

quadrant.

Selecting Pen Numbers and Colors

• Press MORE and select the plot element where you want to change the pen number.
For example, press PEN NUM DATA and then modify the pen number. The pen
number selects the color if you are plotting to an HPGL/2 compatible color printer.
Press x1 after each modification.

NOTE The following color assignments are valid for HPGL/2 compatible color
printers only. When using word processor or graphics presentation programs,
different colors may be assigned to the pen numbers.

Table 4-2 Default Pen Numbers and Corresponding Colors

Pen Number Color Pen Number Color

0 white 4 yellow

1 cyan 5 green

2 magenta 6 red

3 blue 7 black

Table 4-3 Default Pen Numbers for Plot Elements

Corresponding Key Plot Element Pen Numbers

Channel 1 Channel 2

PEN NUM DATA Measurement Data Trace 2 3

PEN NUM MEMORY Displayed Memory Trace 5 6

PEN NUM GRATICULE Graticule and Reference Line 1 1

PEN NUM TEXT Displayed Text 7 7

PEN NUM MARKER Displayed Markers and Values 7 7

NOTE You can set all the pen numbers to black for a plot in black and white.
You must define the pen numbers separately for each measurement channel
(channel 1/3 and channel 2/4).

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 Printing, Plotting, and Saving Measurement Results
Defining a Plot Function

Selecting Line Types

• Press MORE and select each plot element line type that you want to modify.

— Select LINE TYPE DATA to modify the line type for the data trace. Then enter the
new line type (see Figure 4-6), followed by x1 .
— Select LINE TYPE MEMORY to modify the line type for the memory trace. Then
enter the new line type (see Figure 4-6), followed by x1 .
Table 4-4 Default Line Types for Plot Elements

Plot Elements Channel 1 Line Type Numbers Channel 2 Line Type Numbers

Data Trace 7 7

Memory Trace 7 7

Figure 4-6 Line Types Available

NOTE You must define the line types for each measurement channel (channel 1/3
and channel 2/4).

Choosing Scale
• Press SCALE PLOT until the selection appears that you want.

❏ Choose SCALE PLOT [FULL] if you want the normal scale selection for plotting.
This includes space for all display annotations such as marker values and stimulus
values. The entire analyzer display fits within the defined boundaries of P1 and P2
on the plotter, while maintaining the exact same aspect ratio as the display.
❏ Choose SCALE PLOT [GRAT] if you want the outer limits of the graticule to
correspond to the defined P1 and P2 scaling point on the plotter. (Intended for
plotting on preprinted rectangular or polar forms.)

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Printing, Plotting, and Saving Measurement Results
Defining a Plot Function

Figure 4-7 Locations of P1 and P2 in SCALE PLOT [GRAT] Mode

Choosing Plot Speed

• Press PLOT SPEED until the plot speed appears that you want.

❏ Choose PLOT SPEED [FAST] for normal plotting.

❏ Choose PLOT SPEED [SLOW] for plotting directly on transparencies. (The slower
speed provides a more consistent line width.)

To Reset the Plotting Parameters to Default Values

Press Copy DEFINE PLOT MORE MORE YES .
Table 4-5 Plotting Parameter Default Values

Plotting Parameter Default Value Plotting Parameter Default Value

Select Quadrant Full page Plot Scale Full

Auto Feed ON Plot Speed Fast

Define Plot All plot elements on Line Type 7 (solid line)

Pen Numbers: Channel 1 and 3 Pen Numbers: Channel 2 and 4

Data 2 Data 3

Memory 5 Memory 6

Graticule 1 Graticule 1

Text 7 Text 7

Marker 7 Marker 7

4-16
 Printing, Plotting, and Saving Measurement Results
Plotting One Measurement Per Page Using a Pen Plotter

Plotting One Measurement Per Page Using a Pen Plotter

1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-9
and "Defining a Plot Function" on page 4-13.
2. Press Copy PLOT .

❏ If you defined the AUTO-FEED OFF , press PLOTTER FORM FEED after the
message COPY OUTPUT COMPLETED appears. FRM FEED

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Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page Using a Pen Plotter

Plotting Multiple Measurements Per Page Using a Pen

Plotter
1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-9
and "Defining a Plot Function" on page 4-13.
2. Press Copy SEL QUAD [ ] .
3. Choose the quadrant where you want your displayed measurement to appear on the
hardcopy. The following quadrants are available:

❏ LEFT UPPER
❏ LEFT LOWER
❏ RIGHT UPPER
❏ RIGHT LOWER
The selected quadrant will appear in the brackets under SEL QUAD [ ] .

Figure 4-8 Plot Quadrants

4. Press PLOT .
5. Make the next measurement that you want to see on your hardcopy.
6. Press Copy and choose another quadrant where you want to place the displayed
measurement.
7. Repeat the previous three steps until you have captured the results of up to four
measurements.

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 Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page Using a Pen Plotter

If You Are Plotting to an HPGL Compatible Printer

1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-9
and "Defining a Plot Function" on page 4-13.
2. Press Copy PLOT PLOTTER FORM FEED to print the data the printer has
received.

NOTE Use test sequencing to automatically plot all four S-parameters.

1. Set all measurement parameters.
2. Perform a full 2-port calibration.
3. Enter the test sequence:

Seq NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ1

Meas Refl: FWD S11 (A/R)

Copy SEL QUAD [ ] SELECT DISK LEFT UPPER PLOT

Meas Trans: FWD S21 (B/R)

Copy SEL QUAD [ ] LEFT LOWER PLOT

Meas Refl: REV S22 (B/R)

Copy SEL QUAD [ ] RIGHT UPPER PLOT

Meas Trans: REV S12 (B/R)

Copy SEL QUAD [ ] RIGHT LOWER PLOT

Seq DONE SEQ MODIFY

4. Run the test sequence by pressing:

Seq DO SEQUENCE SEQUENCE 1 SEQ1

1SEQ1

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Printing, Plotting, and Saving Measurement Results
To View Plot Files on a PC

To View Plot Files on a PC

Plot files can be viewed and manipulated on a PC using a word processor or graphics
presentation program. Plot files contain a text stream of HPGL (Hewlett-Packard
Graphics Language) commands. In order to import a plot file into an application, that
application must have an import filter for HPGL (often called HGL). Two such applications
from the Lotus® suite of products are the word processor “Ami Pro” and the graphics
presentation package “Freelance Graphics.” Additionally, a utility is available to convert
plot files to PCX format so they can be used in additional PC applications.

NOTE Lotus applications are not supported by Hewlett-Packard. The following

procedures are provided for informational use only. Other applications or
other versions of the same application may function differently.

When viewed in such programs, the color and font size of the plot may vary from the
output of an HPGL/2 compatible color printer. The following table shows the differences
between the color assignments of HPGL/2 compatible printers and Lotus applications. Also
refer to "Selecting Pen Numbers and Colors" on page 4-14.
Table 4-6 Color Assignment Differences between HPGL/2-Compatible Printers
and Lotus Applications

HPGL/2 Printer Lotus Applications

Pen Number Color Pen Number Color

0 white N/A N/A

1 cyan (aqua) 1 black

2 magenta (red-violet) 2 red

3 blue 3 green

4 yellow 4 yellow

5 green 5 blue

6 red 6 red-violet (magenta)

7 black 7 aqua (cyan)

To modify the color or font size, consult the documentation for the particular application
being used.

NOTE Plot files may also be saved to a floppy disk as a JPEG file and used on a
personal computer. Refer to "Saving in Graphical (JPEG) Form" on page 4-45.

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 Printing, Plotting, and Saving Measurement Results
To View Plot Files on a PC

Using Ami Pro

To view plot files in Ami Pro, perform the following steps:
1. From the FILE pull-down menu, select IMPORT PICTURE.
2. In the dialog box, change the File Type selection to HPGL. This automatically changes
the file suffix in the filename box to *.PLT.

NOTE The network analyzer does not use the suffix *.PLT, so you may want to
change the filename filter to *.* or some other pattern that will allow you to
locate the files you wish to import.

3. Click OK to import the file.

4. The next dialog box allows you to select paper type, rotation (landscape or portrait), and
pen colors. You will probably need to change pen colors.

NOTE The network analyzer uses pen 7 for text. The default color in Ami Pro for pen
7 is aqua, which is not very readable against the typical white background.
You may want to change pen 7 to black.

5. After all selections have been made, the file is imported and rendered in a small
graphics frame which can be sized to the page by grabbing one of the nodes and
stretching the box as required.
• You will notice that the annotation around the display is not optimum, as the Ami
Pro filter does not accurately import the HPGL command to render text.

Using Freelance
To view plot files in Freelance, perform the following steps:
1. From the FILE pull-down menu, select IMPORT.
2. Set the file type in the dialog box to HGL.

NOTE The network analyzer does not use the suffix *.HGL, so you may want to
change the filename filter to *.* or some other pattern that will allow you to
locate the files you wish to import.
3. Click OK to import the file.
• You will notice that when the trace is displayed, the text annotation will be illegible.
You can easily fix this with the following steps:
a. From the TEXT pull-down menu, select FONT.
b. Select the type face and size. (Fourteen point text is a good place to start.)
c. Click OK to resize the font.
To change the font color, just do it immediately after you resize the font using the
same dialog box.

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Printing, Plotting, and Saving Measurement Results
Outputting Plot Files from a PC to a Plotter

Converting HPGL Files for Use with Other PC Applications

A utility can convert hpgl (or .fp) files to other PC applications. This utility, named hp2xx,
is available to be downloaded without charge (on donation basis only) from Free Software
Foundation. You may download this file using the information available on the following
Web site: ftp://ots.external.hp.com/rfmw/lou/
To convert HPGL files to be used with other PC applications.
1. Using the instructions on the Free Software Foundation website, FTP the hp2xx file
and save it on a floppy disk as “hp2xx.exe”.
2. Create the following batch file and save it on the same floppy disk as “hpglconv.bat”.
The batch file consists of the following two lines:
@ echo off
A:\hp2xx.exe -m pcx %1
(where “A” is the disk drive where the floppy disk in installed.)
3. Insert the floppy disk (with the two files already installed) into your analyzer.
4. Make sure the measurement that you want to convert is displayed on the analyzer
display.
5. Create an HPGL file of the measurement and save it to the floppy disk by pressing
Local SET ADDRESSES PLOTTER PORT DISK Copy PLOT .
6. Remove the floppy disk from the analyzer and insert it back into the PC.
7. Using Explorer or File Manager, click and drag the icon of the newly-created hpgl file
onto the icon of the hpglconv.bat file. This process creates a PCX format file from the
hpgl file.

NOTE This conversion method has been used to convert many measurement
displays. However, this conversion utility is not supported by Agilent
Technologies.

Outputting Plot Files from a PC to a Plotter

1. Connect the plotter to an output port of the computer (for example, COM1).
2. If using the COM1 port, output the file to the plotter by using the following command:
C:> TYPE PLOT00.FP > COM1

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 Printing, Plotting, and Saving Measurement Results
Outputting Plot Files from a PC to an HPGL Compatible Printer

Outputting Plot Files from a PC to an HPGL Compatible

Printer
To output the plot files to an HPGL compatible printer, you can use the HPGL
initialization sequence linked in a series as follows:
Step 1. Store the HPGL initialization sequence in a file named hpglinit.
Step 2. Store the exit HPGL mode and form feed sequence in a file named exithpgl.
Step 3. Send the HPGL initialization sequence to the printer.
Step 4. Send the plot file to the printer.
Step 5. Send the exit HPGL mode and form feed sequence to the printer.

Step 1. Store the HPGL initialization sequence.

1. Create a test file by typing in each character as shown in the left column of Table 4-7.
Do not insert spaces or linefeeds. Most editors allow the inclusion of escape sequences.
For example, in the MS-DOS editor (DOS 5.0 or greater), press CNTRL-P (hold down
the CTRL key and press P) followed by the ESCape key to create the escape character.
2. Name the file hpglinit.
Table 4-7 HPGL Initialization Commands

Command Remark

<esc>E conditional page eject

<esc>&12A page size 8.5 x 11

<esc>&l1O landscape orientation (lower case l, one, capital O)

<esc>&a0L no left margin (a, zero, capital L)

<esc>&a400M no right margin (a, 4, zero, zero, capital M)

<esc>&l0E no top margin (lower case l, zero, capital E)

<esc>*c7680x5650Y frame size 10.66"x 7.847" (720 decipoints/inch)

<esc>*p50x50Y move cursor to anchor point

<esc>*c0T set picture frame anchor point

<esc>*r-3U set CMY palette

<esc>%1B enter HPGL mode; cursor at PCL

NOTE As shown in Table 4-7, the <esc> is the symbol used for the escape character,
decimal value 27.

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Printing, Plotting, and Saving Measurement Results
Outputting Single Page Plots Using a Printer

Step 2. Store the exit HPGL mode and form feed sequence.
1. Create a test file by typing in each character as shown in the left column of
Table 4-8. Do not insert spaces or linefeeds.
2. Name the file exithpgl.
Table 4-8 HPGL Test File Commands

Command Remark

<esc>%0A exit HPGL mode

<esc>E form feed

Step 3. Send the HPGL initialization sequence to the printer.

Type print hpglinit to send the initialization sequence to the printer.

Step 4. Send the plot file to the printer.

Type print filename (where filename is the name of the HPGL plot file) to send the
plot file to the printer.

Step 5. Send the exit HPGL mode and form feed sequence to the
printer.
Type print exithpgl to send the HPGL mode and form feed sequence to the printer.

Outputting Single Page Plots Using a Printer

You can output plot files to an HPGL compatible printer using the DOS command line and
the files created in the previous steps. This example assumes that the escape sequence
files and the plot files are in the current directory and the selected printer port is PRN.
Command Remarks
C:> type hpglinit > PRN
C:> type PLOT00.FP> PRN
C:> type exithpgl > PRN

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 Printing, Plotting, and Saving Measurement Results
Outputting Multiple Plots to a Single Page Using a Printer

Outputting Multiple Plots to a Single Page Using a Printer

Refer to "Plotting Multiple Measurements Per Page Using a Pen Plotter" on page 4-18 for
the naming conventions for plot files that you want printed on the same page. You can use
the following batch file to automate the plot file printing. In this example, the batch file is
be saved as “do_plot.bat.” However, before running this batch file, you must first create the
hpglinit file and the exithpgl file described in "Outputting Plot Files from a PC to an
HPGL Compatible Printer" on page 4-23.
rem ________________________________________________________
rem Name: do_plot
rem
rem Description:
rem
rem output HPGL initialization sequence to a file:spooler
rem append all the requested plot files to the spooler
rem append the formfeed sequence to the spooler
rem copy the file to the printer
rem
rem (This routine uses COPY instead of PRINT because COPY
rem will not return until the action is completed. PRINT
rem will queue the file so the subsequent DEL will likely
rem generate an error. COPY avoids this.)
rem ________________________________________________________

echo off
type hpglinit > spooler
for %%i in (%1) do type %%i >> spooler
type exithpgl >> spooler
copy spooler LPT1
del spooler
echo on

For example, you have the following list of files to plot:

PLOT00.LL
PLOT00.LU
PLOT00.RL
PLOT00.RU
You would invoke the batch print as follows:
C:> do_plot PLOT00.*

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Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page from Disk

Plotting Multiple Measurements Per Page from Disk

The following procedures show you how to store plot files on a LIF formatted disk. A
naming convention is used so you can later run an HP BASIC program on an external
controller that will output the files to the following peripherals:
• a plotter with auto-feed capability, such as the HP 7550B
• an HP-GL/2 compatible printer, such as the LaserJet 4 series (monochrome) or the
DeskJet 1200C or DeskJet 1600C (color)
The program is provided on the CD-ROM of example programs that is included in the
programmer’s guide. The file naming convention allows the program to initiate the
following:
• to initialize the printer for HP-GL/2 at the beginning of a page
• to plot multiple plot files on the same page
• to send a page eject (form feed) to the hardcopy device, when all plots to the same page
have been completed
The plot file name is made up of four parts; the first three are generated automatically by
the analyzer whenever a plot is requested. The two digit sequence number is incremented
by one each time a file with a default name is added to the directory.

Figure 4-9 Plot Filename Convention

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 Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page from Disk

To Plot Multiple Measurements on a Full Page

You may want to plot various files to the same page, for example, to show measurement
data traces for different input settings, or parameters, on the same graticule.
1. Define the plot, as explained in "Defining a Plot Function" on page 4-13.
2. Press Copy PLOT DEFINE PRINT . The analyzer assigns the first available default
filename for the displayed directory. For example, the analyzer would assign PLOT00FP
if there were no previous plot files on the disk.
3. Press Save/Recall and turn the front panel knob to highlight the name of the file that
you just saved.
4. Press FILE UTILITIES RENAME FILE and turn the front panel knob to place the
↑ pointer to the A character.
5. Press SELECT LETTER DONE .
6. Define the next measurement plot that you will be saving to disk.
For example, you may want only the data trace to appear on the second plot for
measurement comparison. In this case, you would press Copy DEFINE PLOT and
choose PLOT DATA ON PLOT MEM OFF PLOT GRAT OFF PLOT TEXT OFF
PLOT MKR OFF .

7. Press Copy PLOT . The analyzer will assign PLOT00FP because you renamed the last
file saved.
8. Press Save/Recall and turn the front panel knob to highlight the name of the file that
you just saved.
9. Press FILE UTILITIES RENAME FILE and turn the front panel knob to place the
↑ pointer to the B character.
10.Press SELECT LETTER DONE .
11.Continue defining plots and renaming the saved file until you have saved all the data
that you want to put on the same page. Renaming the files as shown allows you to use
the provided program, that organizes and plots the files, according to the file naming
convention.

Plot File Recognized Filename

First File Saved PLOT00FPA

Second File Saved PLOT00FPB

Third File Saved PLOT00FPC

Fourth File Saved PLOT00FPD

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Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page from Disk

Figure 4-10 shows plots for both the frequency and time domain responses of the same
device.

Figure 4-10 Plotting Two Files on the Same Page

To Plot Measurements in Page Quadrants

1. Define the plot, as explained in "Defining a Plot Function" on page 4-13.
2. Press Copy SEL QUAD [ ] .
3. Choose the quadrant where you want your displayed measurement to appear on the
hardcopy. The selected quadrant appears in the brackets under SEL QUAD [ ] .

Figure 4-11 Plot Quadrants

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 Printing, Plotting, and Saving Measurement Results
Plotting Multiple Measurements Per Page from Disk

4. Press PLOT . The analyzer assigns the first available default filename for the selected
quadrant. For example, the analyzer would assign PLOT01LU if there were no other
left-upper quadrant plots on the disk.
5. Make the next measurement that you want to see on your hardcopy.
6. Repeat this procedure for the remaining plot files that you want to see as quadrants on
a page. If you want to see what quadrants you have already saved, press Save/Recall to
view the directory.

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Printing, Plotting, and Saving Measurement Results
Titling the Displayed Measurement

Titling the Displayed Measurement

1. Press Display MORE TITLE to access the title menu.

2. Press ERASE TITLE and enter the title you want for your measurement display.
• If you have a DIN keyboard attached to the analyzer, type the title you want from the
keyboard. Then press ENTER to enter the title into the analyzer. You can enter a
title that has a maximum of 50 characters. (For more information on using a
keyboard with the analyzer, refer to the “Options and Accessories” chapter of the
reference guide.)
• If you do not have a DIN keyboard attached to the analyzer, enter the title from the
analyzer front panel.
a. Turn the front panel knob to move the arrow pointer to the first character of the
title.
b. Press SELECT LETTER .
c. Repeat the previous two steps to enter the rest of the characters in your title. You
can enter a title that has a maximum of 50 characters.
d. Press DONE to complete the title entry.

Figure 4-12 Example of a Display Title

CAUTION The NEWLINE and FORMFEED keys are not intended for creating display
titles. Those keys are for creating commands to send to peripherals during a
sequence program.

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 Printing, Plotting, and Saving Measurement Results
Configuring the Analyzer to Produce a Time Stamp

Configuring the Analyzer to Produce a Time Stamp

You can set a clock, and then activate it, if you want the time and date to appear on your
hardcopies.

1. Press System SET CLOCK .

2. Press SET YEAR and enter the current year, followed by x1 .

3. Press SET MONTH and enter the current month of the year, followed x1 .
4. Press SET DAY and enter the current day of the month, followed by x1 .
5. Press SET HOUR and enter the current hour of the day (0-23), followed by x1 .
6. Press SET MINUTES and enter the next immediate minute, followed by x1 .
7. Press ROUND SECONDS when the current time is exactly as you have set it.
8. Press TIME STAMP until TIME STAMP ON appears on the softkey label.

Aborting a Print or Plot Process

1. Press the Local key to stop all data transfer.
2. If your peripheral is not responding, press Local again or reset the peripheral.

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Printing, Plotting, and Saving Measurement Results
Printing or Plotting the List Values or Operating Parameters

Printing or Plotting the List Values or Operating

Parameters
Press Copy LIST and select the information that you want to appear on your hardcopy.

• Choose LIST VALUES if you want a tabular listing of the measured data points, and
their current values, to appear on your hardcopy. This list will also include the limit test
information, if you have the limits function activated.
• Choose OP PARMS (MKRS etc) if you want a tabular listing of the parameters for both
measurement channels to appear on your hardcopy. The parameters include: operating
parameters, marker parameters, and system parameters that relate to the control of
peripheral devices.

If You Want a Single Page of Values

1. Choose PRINT MONOCHROME for a printer or PLOT for a plotter peripheral, to
create a hardcopy of the displayed page of listed values.
2. Press NEXT PAGE to display the next page of listed values. Press PREVIOUS PAGE
to display the previous page of listed values. Or, you can press NEXT PAGE or
PREVIOUS PAGE repeatedly to display a particular page of listed values that you
want to appear on your hardcopy. Then repeat the previous step to create the hardcopy.
3. Repeat the previous two steps until you have created hardcopies for all the desired
pages of listed values.
If you are printing the list of measurement data points, each page contains 30 lines of data.
The number of pages is determined by the number of measurement points that you have
selected.

If You Want the Entire List of Values

Choose PRINT ALL to print all pages of the listed values.

NOTE If you are printing the list of operating parameters, only the first four pages
are printed. The fifth page, system parameters, is printed by displaying that
page and then pressing PRINT .

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 Printing, Plotting, and Saving Measurement Results
Solving Problems with Printing or Plotting

Solving Problems with Printing or Plotting

If you encounter a problem when you are printing or plotting, check the following list for
possible causes:
• Look in the analyzer display message area. The analyzer may show a message that will
identify the problem. Refer to the "Error Messages" chapter of the reference guide if a
message appears.
• If necessary, refer to the peripheral configuration procedures in this chapter to check
that you have done the following:
❏ connected an interface cable between the peripheral and the analyzer
❏ connected the peripheral to ac power
❏ switched on the power
❏ switched the peripheral on line
❏ selected the correct printer or plotter type
• If you are using a laser printer for plotting, and the printer is outputting partial plots,
the printer may require more memory or the page protection activated.

NOTE Consult your printer documentation for information on upgrading memory

and how to activate page protection.

• Make sure that the analyzer address setting for the peripheral corresponds to the
actual GPIB address of the peripheral. The procedure is explained earlier in this
chapter.
• Make sure that the analyzer is in system controller mode, by pressing Local
SYSTEM CONTROLLER , if the analyzer is not connected to an external controller.
CNTROLLER
Otherwise, the analyzer must be in the pass control mode.
• Substitute the interface cable.
• Substitute a different printer or plotter.

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Saving and Recalling Instrument States

Saving and Recalling Instrument States

Places Where You Can Save

• analyzer internal memory
• floppy disk using the analyzer's internal disk drive
• floppy disk using an external disk drive
• IBM compatible personal computer using GPIB mnemonics

What You Can Save to the Analyzer’s Internal Memory

The number of registers that the analyzer allows you to save depends on the size of
associated error-correction sets, and memory traces. However, the maximum number of
registers that can be saved to internal memory is 31. Refer to the "Preset State and
Memory Allocation" chapter of the reference guide for further information.
You can save instrument states in the analyzer internal memory, along with the following
list of analyzer settings. The default file names are REG<01-31>.
• error-corrections on channels 1 and 2
• displayed memory trace
• print/plot definitions
• measurement setup
❏ frequency range
❏ number of points
❏ sweep time
❏ output power
❏ sweep type
❏ measurement parameter

NOTE When the ac line power is switched off, the internal non-volatile memory is
retained by a battery. Refer to “Specifications and Characteristics” in the
reference guide for data retention times.

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Saving and Recalling Instrument States

What You Can Save to a Floppy Disk

You can save an instrument state and measurement results to a disk. The default file
names are FILEn, where n gets incremented by one each time a file with a default name is
added to the directory. The default file names for data-only files are DATAyDz (DATAy.Dz
for DOS), where y is incremented by one each time a file with a default name is added to
the directory. The z is the channel where the measurement was made. When you save a file
to disk, you can choose to save some or all of the following:
• all settings listed for internal memory
• active error-correction for the active channel only
• displayed measurement data trace
• displayed user graphics
• data only
• HPGL plots

What You Can Save to a Computer

Instrument states can be saved to and recalled from an external computer (system
controller) using GPIB mnemonics. For more information about the specific analyzer
settings that can be saved, refer to the output commands located in the "Command
Reference" chapter of the programmer's guide. For an example program, refer to the
"Programming Examples" chapter of the programmer's guide.

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Saving an Instrument State

Saving an Instrument State

1. Press Save/Recall SELECT DISK and select one of the storage devices:

❏ INTERNAL MEMORY
❏ INTERNAL DISK
❏ EXTERNAL DISK connect an external disk drive to the analyzer’s GPIB connector,
and configure as follows:
a. Connect an external disk drive to the analyzer's GPIB connector, and configure as
follows:
b. Press Local DISK UNIT NUMBER and enter the drive where your disk is
located, followed by x1 .
c. If your storage disk is partitioned, press VOLUME NUMBER and enter the
volume number where you want to store the instrument state file.
d. Press SET ADDRESSES ADDRESS: DISK .
e. Enter the GPIB address of the peripheral, if the default address is incorrect
(default = 00). Follow the entry by pressing x1 .
f. Press Local and select one of the following:

— SYSTEM CONTROLLER allows the analyzer to control peripherals directly.

— TALKER/LISTENER allows the computer controller to be involved in all

peripheral access operations.
— USE PASS CONTROL allows you to control the analyzer over GPIB and also
allows the analyzer to take or pass control.
2. Press Save/Recall SAVE STATE .
The analyzer saves the state in the next available register, if you are saving to internal
memory, or saves the state to disk. Although one file is shown to represent an
instrument state on the analyzer display, each instrument state is composed of
numerous files (which can be viewed on a PC).

NOTE If you have saved enough files that you have used all the default names
(FILE00 − FILE31 for disk files, or REG1 − REG31 for memory files), you
must do one of the following to save more states:
• use another disk
• rename an existing file to make a default name available
• re-save a file/register
• delete an existing file/register

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Saving Measurement Results

Saving Measurement Results

Instrument states combined with measurements results can only be saved to disk. Files
that contain data-only, and the various save options available under the
DEFINE DISK-SAVE key, are also only valid for disk saves.
The analyzer stores data in arrays along the processing flow of numerical data, from IF
detection to display. These arrays are points in the flow path where data is accessible,
usually via GPIB. You can choose from three different arrays which vary in modification
flexibility when they are recalled.
• raw data
• data (raw data with error-correction applied) if correction is on; otherwise, raw data
• format (data processed to the display format)
If you choose to save the raw data array, you will have the most flexibility in modifying the
recalled measurement (including the ability to view all four S-parameters). This is because
the raw data array has the least amount of processing associated with it. Conversely, if you
choose to save the format array, your modification of the recalled measurement will be
limited by all the processes that are associated with that measurement result. However,
the format array is appropriate if you want to retrieve data traces that look like the
currently displayed data.

Define Save Modification Flexibility During Recall

Raw Data Array Most

Data Array Medium
Format Array Least

You can also save data-only. This is saved to disk with default file names
DATA00D1 to DATA31D1 for channel 1
DATA00D2 to DATA31D2 for channel 2
DATA00D3 to DATA31D3 for channel 3
DATA00D4 to DATA31D4 for channel 4
However, these files are not instrument states and cannot be recalled.

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Printing, Plotting, and Saving Measurement Results
Saving Measurement Results

Figure 4-13 Data Processing Flow Diagram

NOTE If the analyzer has an active two-port measurement calibration, all four
S-parameters will be saved with the measurement results. All four
S-parameters may be viewed if the raw data array has been saved.

1. If you want to title the displayed measurement, refer to "Titling the Displayed
Measurement" on page 4-30.
2. Press Save/Recall SELECT DISK .
3. Choose one of the following disk drives:

• INTERNAL DISK

• EXTERNAL DISK (If necessary, refer to the external disk setup procedure in
"Saving an Instrument State" on page 4-36.)
4. Press Save/Recall DEFINE DISK-SAVE .
5. Define the save by selecting from the following choices:

❏ DATA ARRAY ON
❏ RAW ARRAY ON

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Saving Measurement Results

❏ FORMAT ARY ON
If you select DATA ARRAY ON , RAW ARRAY ON , or FORMAT ARY ON , the data
is stored to disk in IEEE-64 bit real format (for LIF disks), and 32 bit PC format for
DOS disks. This makes the DOS data files half the size of the LIF files.

NOTE Selecting DATA ARRAY ON may store data to disk in the S2P ASCII data
format. See "ASCII Data Formats" on page 4-40.

❏ GRAPHICS ON
If you select GRAPHICS ON , the user graphics area is saved. (Refer to the
programmer’s guide for information on using display graphics.) The measurement
display is not saved with this selection. (Refer to "If You Are Plotting Measurement
Results to a Disk Drive" on page 4-11 to plot measurement displays to disk.)
❏ DATA ONLY ON
If DATA ONLY ON data array is saved along with any other selected array, the
instrument state is not saved, and therefore, cannot be recalled.
6. Choose the type of format you want:

❏ Choose SAVE USING BINARY for all applications except CITIfile, S2P, or CAE
applications.
❏ Choose SAVE USING ASCII for CITIfile, S2P, and CAE applications or when you
want to import the information into a spread sheet using comma-separated values
(CSV) format.
7. Press RETURN SAVE STATE .

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Saving Measurement Results

ASCII Data Formats

CITIfile
CITIfile (Common Instrumentation Transfer and Interchange file) is an ASCII data format
that is useful when exchanging data between different computers and instruments.
CITIfiles are always saved when the ASCII format has been selected as shown:

Save/Recall

DEFINE DISK-SAVE
Select one of the following choices:

— DATA ARRAY ON
— DATA ONLY ON
— RAW ARRAY ON
— FORMAT ARY ON
SAVE USING ASCII

RETURN

SAVE STATE

If DATA ARRAY ON , or DATA ONLY ON , or FORMAT ARY ON is selected, a CITIfile is

saved for each displayed channel with the suffix letter “D”, or “F”, followed by a number.
The number following “D” and “F” files is the channel number. When RAW ARRAY ON is
selected, an “r1” file is saved for channel 1/channel 3, and an “r5” file is saved for channel
2/channel 4. For more information on the CITIFile data format as well as a list of CITIFile
keywords, refer to the “Understanding the CITIFile Data Format” chapter in the reference
guide.

S2P Data Format

This format creates component data files that describe frequency dependent linear
network parameters for 2 port components. These files are assigned a file name with the
suffix "S" and are only output (that is, they cannot be read in by the analyzers).
Up to two S2P files are saved: S1 for channel 1, and S2 for channel 2. S2P files are not
stored for channel 3 or channel 4 because the data would be redundant. Each S2P file
contains all four S-parameter data.
An S2P file is only output when the all of following conditions are met:
• a full two-port or TRL two-port correction is turned on
• DATA ARRAY ON or DATA ONLY ON is selected using DEFINE DISK SAVE

• SAVE USING ASCII is selected

Error-corrected data CITI files are always saved along with S2P files.

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Saving Measurement Results

The template for component data files is as follows:

! comment line
# <frequency units> <parameter> <format> <Rn>
<data line>
..
<data line>
where

! indicates that all following on this line is a comment

# indicates that entries following on this line are parameters that are being
specified
frequency units GHz, MHz, kHz, Hz
parameter S for S-parameters
format DB for dB magnitude and angle in degrees
MA for linear magnitude and angle in degrees
RI for real and imaginary pair
Rn the reference impedance in ohms for the analyzer making the
measurement (R 50 or R 75)
The "format" choice is selected by the current selection under the FORMAT menu. To
select the DB format, the FORMAT must be LOG MAG. For MA, the FORMAT must be
LIN MAG (unlike CITIfile), and all other FORMAT selections will output RI data.
The S2P data will always represent the format array data, including effects of electrical
delay and port extensions. A CITIfile will be saved at the same time. To be consistent with
previous versions, the CITIfile data saved will represent the DATA array (corrected data)
without effects of electrical delay or port extensions.

CAUTION Using the smoothing feature or saving data displayed in time domain format
may result in invalid S2P data. Avoid using these functions when saving S2P
files.

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Saving Measurement Results

Here is an S2P example file for an 11 point measurement of a 20 dB attenuator:

# HZ S DB R 50
! Network Analyzer HP8753E.0611

50000000 −56.74 15.178 −20.219 −2.0132 −20.15 −1.6658 −36.188 −123.52

250000000 −53.015 1.7331 −20.373 −10.241 −20.377 −10.029 −33.974 −40.215

450000000 −52.094 5.8173 −20.391 −18.555 −20.387 −17.96 −31.287 61.778

650000000 −51.758 8.02 −20.189 −26.18 −20.112 −26.061 −29.427 153.37

850000000 −50.95 11.472 −20.163 −34.743 −20.198 −34.195 −24.719 −137.83

1050000000 −50.235 9.3562 −20.178 −42.682 −20.19 −42.289 −25.102 −81.096

1250000000 −49.883 9.2574 −20.142 −50.854 −20.223 −50.407 −27.582 −25.509

1450000000 −48.477 5.9944 −20.201 −58.917 −20.21 −58.436 −33.828 35.237

1650000000 −48.462 3.5156 −20.161 −67.008 −20.188 −66.587 −44.184 62.912

1850000000 −47.503 1840 −20.15 −74.862 −20.208 −74.616 −36.893 35.384

2050000000 −46.938 −5.6538 −20.167 −83.048 −20.256 −82.874 −30.385 74.001

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Saving Measurement Results

Saving in Textual (CSV) Form

Textual measurement results can be saved in a comma-separated value (CSV) format and
imported into a spreadsheet application. Additional information is also saved as a
preamble to the measurement results. The saved information includes:
• Network analyzer model number and firmware version
• Date the file was saved
• Type of measurement being done
• Start and stop frequencies
• Sweep time
• Port power
• IF bandwidth
• Channel number
• Number of points
• Format
• The frequency (or time) and the real and imaginary measurement values for each of
points measured

1. Press Save/Recall SAVE FILE FORMATS .

2. Make sure that TEXT FMT [CSV] is displayed.

3. Make sure that FILETYPE: TEXT is underlined. If it is not underlined, press the
softkey so that TEXT is underlined.
4. Insert a 3.5-inch floppy disk in the network analyzer’s disk drive.
5. Press SAVE FILE to save the display information as text in the CSV format.
The text file may be retrieved from the floppy disk on personal computer and can be
imported into an application that accepts text in the comma-separated value format,
such as a spreadsheet.

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Saving Measurement Results

How the Analyzer Names These Files Sequentially

When text files are saved, the analyzer generates the file names automatically in the
following format:

txtcss.csv

where: txt is a constant that indicates that this is a text file,

c is the indicator of the channel (1−4) on which the measurement data was
taken.

ss is a 2-digit, sequential indicator of the measurement (file index number). The

file index number may be numbered from 00−31. As the next measurement is
taken, the file index number is incremented.
If all four channels are making measurements and a save is performed, there
will be four channel numbers that share the same file index number. For
example, the files would be named txt100.csv, txt200.csv, txt300.csv, and
txt400.csv. If a measurement does not include all four channels, unused
channel-file index numbers will not be used by the next measurement.
However, if all of the files that share a file index number are erased, that file
index number will be re-used.

csv is the file format, comma-separated value in this case.

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Saving Measurement Results

Saving in Graphical (JPEG) Form

Graphical measurement results can be saved in JPEG format and used as an illustration
in a text editor or desktop publishing application.1 Up to eight traces may be saved in the
JPEG file. This is done by storing a measurement using DATA → MEMORY and turning
on DATA AND MEMORY for each of the four channels.

1. Press Save/Recall SAVE FILE FORMATS .

2. Make sure that GRAPH FMT [JPG] is displayed.

3. Make sure that FILETYPE: GRAPHIC is underlined. If it is not underlined, press the
softkey so that GRAPHIC is underlined.
4. Insert a 3.5-inch floppy disk in the network analyzer’s disk drive.
5. Press SAVE FILE to save the display as a graphic in the JPEG format.

The graphic file may be retrieved from the floppy disk on personal computer and can be
imported into an application that accepts graphics in the JPEG format.

NOTE When saving measurement results graphically, make sure that no onscreen
measurement data is displayed as white. Since media color is often white, any
measurement data printed using white will not be visible.
You may change the analyzer to the factory default color settings by pressing
Copy DEFINE PRINT DEFAULT PRNT SETUP to correct this problem.
However, to maintain your current color settings (except white), check the
measurement color settings by pressing Copy DEFINE PRINT
PRINT COLORS . Press MORE to check the remaining measurement
colors. To modify any of the measurement colors, select the measurement and
then choose another color from the list of colors that is displayed.

1. The network analyzer firmware is based in part on the work of the Independent JPEG Group.

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Saving Measurement Results

Instrument State Files

When an instrument state is saved to a floppy disk, some or all of the following files may be
produced. This depends upon which arrays are selected under the DEFINE SAVE STATE
softkey menu, and whether the selected save format is BINARY or ASCII. The “XX” part of
the file name (FileXX) refers to the number of the instrument state. The first instrument
state saved to any particular disk will be named “File00”, and each successive state saved
to that disk will be numbered “1” higher than the previous state (for example, “File01”and
“File02”).

Files with .i and .p File Extensions

The following two files (.i file and .p file) are always produced, except when DATA ONLY
is selected. These files were separated to allow backward compatibility with older
instruments. The binary data contained in these two files is not meant to be read in an
external computer:
• FileXX.i is a binary file, which contains the generic portion of the current instrument
state (specifically, the System, Local, Preset, Copy, Save, and Sequence settings).
• FileXX.p is a binary file which contains portions of the instrument state specific to later
instruments.

Files with .10, .11, .12, .1a, .1b, and .1c File Extensions
The following files are only produced if you have an active calibration. FileXX.10 is a
binary file which stores the stimulus state of the instrument as it relates to an active
calibration (specifically, the Power, Sweep Setup, Start, Stop, Center, and Span settings).
The same type of file is produced if Channel 2 is active, but the file extension is .20 instead
of the .10 file extension mentioned in the previous paragraph.
Files FileXX.11 through .12, .1a, .1b, and .1c are binary files which contain the 12 error
correction coefficients for Channel 1. If Channel 2 is active, it will have the same array, but
file extensions are in the form .21, .22, .2a., .2b, and .2c. If you save in ASCII format, only
.10 and .1c are produced, with .1c containing the entire error correction array in a
two-column, real/imaginary (CITIfile) format.

Files with File Extensions .r1 through .r8

FileXX.r1 through .r4 are produced when RAW ARRAY on OFF is turned ON. They may
be either binary or ASCII, and contain the four raw uncorrected S-parameters for
channel 1. Channel 2 has the same array, but file extensions are .r5 through .r8. In ASCII
format, the data is displayed as two columns of real/imaginary numbers (CITIfile format);
S11 appears first, S21 appears second, S12 appears third, and S22 appears last.

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Saving Measurement Results

Files with .d1 and .d2 File Extensions

There are two type of files with .d1 and .d2 file extensions. There is FileXX.d1 (or .d2) and
DataXX.d1 (or .d2).
FileXX.d1, produced only when DATA ARRAY on OFF is turned ON, may be either binary
or ASCII. This file contains the error-corrected measurement data, but without port
extensions or electrical delay. In ASCII format, this is a two-column real/imaginary array
(CITIfile format), without any direct frequency information. S11 appears first, S21 second,
S12 third, and S22 last. If Channel 2 is active, the same type of file is produced but the file
extension is .d2. If dual display is on, both d1 and .d2 files are produced.
DataXX.d1, created only when DATA ONLY on OFF is turned ON, is either a binary file
or an ASCII file in CITIfile format. Turning the DATA ONLY on OFF softkey ON
suppresses the generation of all the previous file types. The contents of this file are
identical to those of the FileXX.d1 file. The same type of file is produced if Channel 2 is
active, but the file extension is .d2. If dual display is on, both .d1 and .d2 files are produced.

NOTE The DataXX files are much smaller than an entire instrument state, and are
the best way to get just the data you want without saving the entire
instrument state. Selecting more than one disk-save option does not confuse
the analyzer, and simply produces all files associated with the selected
options. The only exception to this is that selecting DATA ONLY on OFF
suppresses all other selected options.

Files with .s1 and .s2 File Extensions

There are two type of files with .s1 and .s2 file extensions. There is FileXX.s1 (or .s2) and
DataXX.s1 (or .s2).

With DATA ONLY on OFF Turned Off

FileXX.s1 is an ASCII file in Touchstone S2P format. Basically, this is a file in
real/imaginary spreadsheet type format with five columns: frequency in the first column,
S11 in the second column, S21 in the third, S12 in the fourth, and S22 in the fifth column.
If Channel 2 is active, the same type of file is produced but the file extension is .s2. If dual
display is on, both .s1 and .s2 are produced. These Touchstone S2P files are only produced
when a full 2-port calibration is active and SAVE USING ASCII is selected. The effects of
port extensions and electrical delay, if they are turned on, are included in the data.

With DATA ONLY ON off Turned On

DataXX.s1 is also an ASCII file in Touchstone S2P format. As with FileXX.s1, DataXX.s1
is a five-column real/imaginary spreadsheet type format where the columns are used the
same as FileXX.s1. If Channel 2 is active, the same type of file is produced but the file
extension is .s2. If dual display is on, both .s1 and .s2 are produced. These Touchstone S2P
files are only produced when a full 2-port calibration is active and SAVE USING ASCII is
selected. The effects of port extensions and electrical delay, if they are turned on, are
included in the data.

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Saving Measurement Results

Files with .f1 and .f2 File Extensions

FileXX.f1, produced only when FORMAT ARY on OFF is turned ON, may be either binary
or ASCII. This file contains the formatted data in whichever format is currently displayed
on the network analyzer (dB, phase, VSWR, and so forth) with error correction, trace math,
port extensions, electrical delay, time domain gating and smoothing applied. Port
extensions are really only evident if the measured parameter is phase. The same type of
file is produced for Channel 2, but the file extension is .f2. If dual display is on, both .f1 and
.f2 are produced. In ASCII format, the data appears as two columns (CITIfile format). If
the currently selected display format is not complex data (neither Smith Chart nor Polar),
the second column will be meaningless (place holder) values.

Files with .g0 File Extension

FileXX.g0, produced only when GRAPHICS on OFF is turned ON, is a binary file
containing the active measurement trace and display graticule. The contents of this file are
not meant to be read in an external computer, so this file is only of use in the instrument.

Binary Files
The size of the data files is very small, about one tenth the size compared to the ASCII
format. Binary is the format to use when you want to store and recall instrument states on
the analyzer quickly, but do not need to read the data in an external computer.

Viewing Files Within the Analyzer

All these files are rolled up into a single instrument state, so the analyzer shows only the
“FileXX” part of the name, without an extension. The file description will say ISTATE,
followed by parentheses with letters in them, such as (CDG). These letters are explained
on the bottom of the analyzer screen, and indicate some of what is included in that
instrument state. In this example, the state includes the Calibration Array, Data, and
Graphics.
The only way to see all the file extensions previously described is to save the instrument
state to a disk and view the file structure on an external computer.

Saving Time Gated Frequency Data

Internal data processing is done sequentially beginning with raw data and ending with
error correction and all formatting applied. The time domain processing occurs near the
end of this processing chain, so data showing the effects of time domain processing is only
available in "formatted arrays".

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Differences between Raw, Data, and Format Arrays

The following discussion explains the data processing flow in the network analyzer. This
information is very important if you will be utilizing data from your analyzer for use in
computer applications such as spreadsheets, word processing, programs, etc. Refer to
Figure 4-13 on page 4-38.
The analyzer receives data from its A, B, and R or Aux-in inputs. Notice the three
highlighted blocks. They represent the raw, data, and format arrays. You can save your
measurement data in any or all of these format arrays each time the data is saved. Select
the arrays of interest based on the factors discussed in this section.
For this discussion, only DISK saves will be described. Data can be saved to internal
non-volatile memory or transferred over GPIB as well as to a floppy disk. You will find
multiple files saved depending on the arrays chosen under the analyzer’s
DEFINE DISK-SAVE menu. When using these files, it is important to know which file
extension is needed for your particular job.

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Saving Measurement Results

Raw Arrays
On the analyzer, press the Save/Recall DEFINE DISK-SAVE RAW ARRAY ON
Data created the first time in this manner will be saved as filename “FILE00.r1”. The file
extension .r1 indicates the data was created while channel 1 was active and stored in the
analyzer's raw data array. If you save the data again, but while channel 2 is active, you will
get a new file called “FILE01.r2”. RAW data are not commonly used unless sophisticated
data processing is to be performed in an external PC. As an example, multi-port calibration
is created by exporting raw data to a PC where error-correction for each of the multi-port
paths is applied to them.

Data Arrays
Press Save/Recall DEFINE DISK-SAVE DATA ARRAY ON .
Data created the first time in this manner will be saved as filename “DATA00.d1.” The file
extension .d1 indicates that the data from the analyzer's channel 1 is error corrected data
only if the analyzer's error correction feature is enabled (in other words, you have
performed a calibration). Otherwise, the data is the same as data stored in the analyzer's
raw data arrays. Data stored in the data arrays does not have any formatting applied to it.

Format Arrays
Press Save/Recall DEFINE DISK-SAVE FORMAT ARY ON
Data created the first time in this manner will be saved as filename “FILE00.f1”. The file
extension .f1 indicates the data is formatted per Figure 4-13 using the analyzer's channel
1. Depending on what features you've selected, data in the format arrays includes data in
the data arrays plus one or more of the following features:
• Trace math (i.e data-memory)
• Gating (Option 010)
• Electrical delay
• Conversion (for complex impedance (Z), admittance (Y), etc.)
• Transform (Option 010)
• Format (log, lin, phase, delay, SWR, excluding Smith and Polar)
• Smoothing
In each of these examples, most users will select SAVE USING ASCII , under the
DEFINE DISK-SAVE softkey menu. If GRAPHICS on OFF is turned ON, an additional
file will be created with file extension .g0. This is a Hewlett-Packard Graphics Language
(HPGL) file.

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Re-Saving an Instrument State

Re-Saving an Instrument State

If you re-save a file, the analyzer overwrites the existing file contents.

NOTE You cannot re-save a file that contains data only. You must create a new file.

1. Press Save/Recall SELECT DISK and select the storage device.

❏ INTERNAL MEMORY
❏ INTERNAL DISK
❏ EXTERNAL DISK (If necessary, refer to the external disk setup procedure in
"Saving an Instrument State" on page 4-36.)
2. Press RETURN and then use the or key or the front-panel knob to
highlight the name of the file that you want to re-save.
3. Press RE-SAVE STATE YES .

Deleting a File
1. Press Save/Recall SELECT DISK .
2. Choose from the following storage devices:

❏ INTERNAL MEMORY
❏ INTERNAL DISK
❏ EXTERNAL DISK (If necessary, refer to the external disk setup procedure in
"Saving an Instrument State" on page 4-36.)
3. Press RETURN .

To Delete an Instrument State File

❏ Press the or keys or the front panel knob to highlight the name of the file
that you want to delete.
❏ Press FILE UTILITIES DELETE FILE YES to delete all of the files that make up
the selected instrument state.

To Delete all Files

❏ Press FILE UTILITIES DELETE ALL FILES SAVE USING BINARY to delete all of
the files that are on the selected storage device.

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Renaming a File

Renaming a File
1. Press Save/Recall AUTO-FEED OFF .
2. Choose from the following storage devices:

❏ INTERNAL MEMORY
❏ INTERNAL DISK
❏ EXTERNAL DISK (If necessary, refer to the external disk setup procedure in
"Saving an Instrument State" on page 4-36.)
3. Press RETURN and then use the or keys or the front panel knob to
highlight the name of the file that you want to rename.
4. Press RETURN RENAME FILE ERASE TITLE .
FILE UTILITIES
FLE
5. Turn the front panel knob to point to each character of the new file name, pressing
SELECT LETTER when the arrow points to each character. Press BACK SPACE if
you enter an incorrect character. After you have selected all the characters in the new
file name, press DONE .

NOTE Renaming files may also be done by using the optional external keyboard.

Recalling a File
1. Press Save/Recall SELECT DISK .
2. Choose from the following storage devices:

❏ INTERNAL MEMORY
❏ INTERNAL DISK
❏ EXTERNAL DISK (If necessary, refer to the external disk setup procedure in
"Saving an Instrument State" on page 4-36.)
3. Press the or keys or the front panel knob to highlight the name of the file
that you want to recall.
4. Press RETURN RECALL STATE .

4-52
 Printing, Plotting, and Saving Measurement Results
Formatting a Disk

Formatting a Disk
1. Press Save/Recall FILE UTILITIES FORMAT DISK .
2. Choose the type of format you want:

❏ FORMAT:LIF
❏ FORMAT:DOS
3. Press FORMAT EXT DISK YES .

Solving Problems with Saving or Recalling Files

If you encounter a problem when you are storing files to disk, or the analyzer internal
memory, check the following list for possible causes:
• Look in the analyzer display message area. The analyzer may show a message that will
identify the problem. Refer to the "Error Messages" chapter of the reference guide if you
view a message.
• Make sure that you are NOT using a single-sided floppy disk in the analyzer disk drive.
• Make sure that you are using a formatted disk.
• Make sure that the disk has not been formatted with the LIF-HFS (hierarchical file
system) extensions as the analyzer does not support this format.

If You Are Using an External Disk Drive

• Make sure that the analyzer is in system controller mode, by pressing Local
SYSTEM CONTROLLER .
CNTROLLER
• Make sure that you have connected the disk drive to ac power, switched on the power,
and connected a GPIB cable between the disk drive and the analyzer.
• Make sure that the analyzer recognizes the disk drive's GPIB address, as explained in
"If You Are Plotting Measurement Results to a Disk Drive" on page 4-11.
• Make sure that the analyzer recognizes the disk (drive) unit that you selected (0 or 1).
• If the external disk is a hard disk, make sure that the disk volume number is set
correctly.
• If the disk drive is an older HP 9122, it may not recognize the newer high density disks.
• Substitute the GPIB cable.
• Substitute the disk drive.

4- 53
Printing, Plotting, and Saving Measurement Results
Formatting a Disk

4-54
5 Optimizing Measurement Results

5-1
Optimizing Measurement Results
Using This Chapter

Using This Chapter

This chapter describes techniques and analyzer functions that help you achieve the best
measurement results. The following topics are included in this chapter:
• "Increasing Measurement Accuracy" on page 5-4
❏ Interconnecting cables
❏ Improper calibration techniques
❏ Sweeping too fast for electrically long devices
❏ Connector repeatability
❏ Temperature drift
❏ Frequency drift
❏ Performance verification
❏ Reference plane and port extensions
• "Making Accurate Measurements of Electrically Long Devices" on page 5-7
• "Increasing Sweep Speed" on page 5-9
• "Increasing Dynamic Range" on page 5-14
• "Reducing Noise" on page 5-15
• "Reducing Receiver Crosstalk" on page 5-16
• "Reducing Recall Time" on page 5-17

5-2
 Optimizing Measurement Results
Taking Care of Microwave Connectors

Taking Care of Microwave Connectors

Proper connector care and connection techniques are critical for accurate, repeatable
measurements.
Refer to the calibration kit documentation for connector care information. Prior to making
connections to the network analyzer, carefully review the information about inspecting,
cleaning and gaging connectors.
Having good connector care and connection techniques extends the life of these devices. In
addition, you obtain the most accurate measurements.
This type of information is typically located in chapter 3 of the calibration kit manuals.
For additional connector care instruction, contact your local Agilent Technologies Sales
and Service Office about course numbers HP/Agilent 85050A+24A and 85050A+24D.
See the following table for quick reference tips about connector care.
Table 5-1 Connector Care Quick Reference
Handling and Storage
Do Keep connectors clean Do Not Touch mating-plane surfaces
Extend sleeve or connector nut Set connectors contact-end down
Use plastic end-caps during storage

Visual Inspection
Do Inspect all connectors carefully Do Not Use a damaged connector - ever
Look for metal particles, scratches, and dents
Connector Cleaning
Do Try compressed air first Do Not Use any abrasives
Use isopropyl alcohol Get liquid into plastic support beads
Clean connector threads
Gaging Connectors
Do Clean and zero the gage before use Do Not Use an out-of-spec connector
Use the correct gage type
Use correct end of calibration block
Gage all connectors before first use

Making Connections
Do Align connectors carefully Do Not Apply bending force to connection
Make preliminary connection lightly Over tighten preliminary connection
Turn only the connector nut Twist or screw any connection
Use a torque wrench for final connect Tighten past torque wrench "break" point

5- 3
Optimizing Measurement Results
Increasing Measurement Accuracy

Increasing Measurement Accuracy

The following all contribute to loss of accuracy in a measurement.

Interconnecting Cables
Cables that connect the device under test (DUT) to the analyzer are often the most
significant contribution to random errors of your measurement. You should frequently
perform the following steps as a precaution against errors caused by cable
interconnections:
• Inspect for lossy cables.
• Inspect for damaged cable connectors.
• Practice good connector care techniques.
• Minimize cable position changes between error-correction and measurements.
• Inspect for cables which dramatically change magnitude or phase response when flexed.
(This may indicate an intermittent problem.)

Improper Calibration Techniques

Calibrations techniques performed improperly contribute to random errors to your
measurement. You should frequently perform the following steps as a precaution against
errors caused by calibration techniques:
• Verify the correct calibration kit definition is selected.
• Verify the correct standards have been connected.

Sweeping Too Fast for Electrically Long Devices

It is possible to sweep too fast for electrically long devices. This will result in measurement
error. Refer to "Making Accurate Measurements of Electrically Long Devices" on page 5-7.

Connector Repeatability
Connector repeatability is a source of random measurement error. Measurement
error-corrections do not compensate for these errors. For all connectors, you should
frequently perform the following steps as a precaution against errors caused by connector
repeatability:
• Inspect the connectors.
• Clean the connectors.
• Gauge the connectors.
• Use correct connection techniques. (Refer to "Taking Care of Microwave Connectors" on
page 5-3.)

5-4
 Optimizing Measurement Results
Increasing Measurement Accuracy

Temperature Drift
Electrical characteristics will change with temperature due to the thermal expansion
characteristics of devices within the analyzer, calibration devices, test devices, cables, and
adapters. Therefore, the operating temperature is a critical factor in their performance.
During a measurement calibration, the temperature of the calibration devices must be
stable and within 25 ±5 °C.
• Use a temperature-controlled environment.
• Ensure the temperature stability of the calibration devices.
• Avoid handling the calibration devices unnecessarily during calibration.
• Ensure the ambient temperature is ±1 °C of measurement error-correction
temperature.

Frequency Drift
Minute changes in frequency accuracy and stability can occur as a result of temperature
and aging (on the order of parts per million). If you require greater frequency accuracy,
override the internal crystal with a high-stability external source, frequency standard, or
(if your analyzer is equipped with Option 1D5) use the internal frequency standard.

Performance Verification
You should periodically check the accuracy of the analyzer measurements, by performing a
measurement verification at least once per year. The service guide includes the
measurement verification procedure.

Reference Plane and Port Extensions

Use the port extension feature to compensate for the phase shift of an extended
measurement reference plane, due to such additions as cables, adapters, and fixtures, after
completing an error-correction procedure (or when there is no active correction).
Using port extensions is similar to using electrical delay. However, using port extensions is
the preferred method of compensating for test fixture phase shift. Table 5-2 explains the
difference between port extensions and electrical delay.

5- 5
Optimizing Measurement Results
Increasing Measurement Accuracy

Table 5-2 Differences between PORT EXTENSIONS and ELECTRICAL DELAY

PORT EXTENSIONS ELECTRICAL DELAY

Main Effect The end of a cable becomes the Compensates for the electrical
test port plane for all length of a cable. Set the
S-parameter measurements. cable’s electrical length × 1 for
transmission. Set the cable’s
electrical length × 2 for
reflection.

Measurements Affected All S-parameters. Only the currently selected

S-parameter.

Electrical Compensation Intelligently compensates for Only compensates for

1 times or 2 times the cable’s electrical length.
electrical delay, depending on
which S-parameter is
computed.

You can activate a port extension by pressing Cal MORE PORT EXTENSIONS
EXTENSIONS ON . Then enter the delay to the reference plane.

5-6
 Optimizing Measurement Results
Making Accurate Measurements of Electrically Long Devices

Making Accurate Measurements of Electrically Long

Devices
A device with a long electrical delay, such as a long length of cable, a SAW filter, or normal
devices measured over wide sweeps with very fast rates presents some unusual
measurement problems to a network analyzer operating in swept frequency mode. Often
the measured response is dependent on the analyzer’s sweep time, and incorrect data may
be obtained. At faster sweep rates, the magnitude of the response may seem to drop and
look distorted, while at slower sweep rates it looks correct. The results may indicate that a
cable has more loss than it truly does, or that a filter has some unusual ripple in the
passband which is not really there.
This section describes the cause of this behavior, and how to accurately measure these
electrically long devices.

The Cause of Measurement Problems

When using a vector network analyzer to measure a device that has a long electrical delay
(∆T), the device’s time delay causes a frequency shift between its input and output signals.
The frequency shift, ∆F, equals the product of the sweep rate and the time delay:
∆F = dF/dt × ∆T
Since frequency is changing with time as the analyzer sweeps, the time delay of the DUT
causes a frequency offset between its input and output. In the analyzer receiver, the test
and reference input signals will differ in frequency by ∆F. Because the test signal
frequency is slightly different than the receiver frequency, the analyzer will err in
measuring its magnitude or phase. The faster the analyzer’s sweep rate, the larger ∆F
becomes, and the larger the error in the test channel.
The analyzer does not sweep at a constant rate. The frequency range is covered in several
bands, and the sweep rate may be different in each band. So if an operator sets up a
broadband sweep with the minimum sweep time, the error in measuring a long device will
be different in each band, and the data will be discontinuous at each band edge. This can
produce confusing results which make it difficult to determine the true response of the
device.

To Improve Measurement Results

To reduce the error in these measurements, the frequency shift, ∆F, must be reduced. ∆F
can be reduced by using the following methods:
• decreasing the sweep rate
• decreasing the time delay (∆T)

5- 7
Optimizing Measurement Results
Making Accurate Measurements of Electrically Long Devices

Decreasing the Sweep Rate

The sweep rate can be decreased by increasing the analyzer’s sweep time. To increase the
analyzer’s sweep time, press Sweep Setup SWEEP TIME [MANUAL] and use the front
panel knob, the and keys, or the front panel keypad enter in the appropriate
sweep time.
Alternatively, the number of points may be increased for the same frequency range,
thereby reducing the sweep rate (in GHz/second).
Selection of the appropriate sweep time depends on the device being measured; the longer
the electrical delay of the device under test, the slower the sweep rate must be. A good way
to tell when the sweep rate is slow enough is to put the vector network analyzer into a
stepped list frequency mode of sweeping, and compare the data. In this mode, the vector
network analyzer does not sweep the frequency, but steps to each listed frequency point,
stops, makes a measurement, then goes on to the next point. Because errors do not occur in
the list frequency mode, it can be used to check the data. The disadvantage of the list
frequency mode is that it is slower than sweeping. To select the stepped list mode instead
of the swept list mode, press Sweep Setup SWEEP TYPE MENU EDIT LIST and toggle
LIST TYPE [ ] to LIST TYPE [STEPPED] .
Alternatively, the analyzer can be forced into stepped sweep mode by:
• Setting the IF bandwidth to either 30 Hz or 10 Hz.
• Setting sweep time to greater than 15 ms/point.
• Activating power meter calibration (even with no calibration). Cal PWRMTR CAL
ONE SWEEP .

Decreasing the Time Delay

The other way to reduce ∆F is by decreasing the time delay, ∆T. Since ∆T is a property of
the device that is being measured, it cannot literally be decreased. However, what can be
decreased is the difference in delay times between the paths to the R channel and the B
channel. These times can be equalized by adding a length of cable to the R channel which
has approximately the same delay as the device under test.
This length of cable can be inserted between the R CHANNEL IN and OUT connectors on
the front panel of the analyzer. The delay of this cable must be less than 5µs.

5-8
 Optimizing Measurement Results
Increasing Sweep Speed

Increasing Sweep Speed

You can increase the analyzer sweep speed by avoiding the use of some features that
require computational time for implementation and updating, such as bandwidth marker
tracking.
You can also increase the sweep speed by making adjustments to the measurement
settings. The following suggestions for increasing sweep speed are general rules that you
should experiment with:
• use swept list mode
• decrease the frequency span
• set the auto sweep time mode
• widen the system bandwidth
• reduce the averaging factor
• reduce the number of measurement points
• set the sweep type
• use chop sweep mode
• use external calibration
• use fast 2-port calibration mode

To Use Swept List Mode

When using a list frequency sweep, choosing swept list mode can increase throughput by
up to 6 times over stepped list mode. This mode takes data while sweeping through each
list segment. In addition, this mode expands the list table to include test port power and IF
bandwidth. Selectable IF bandwidths can increase the throughput of the measurement by
allowing the user to specify narrow bandwidths only where needed.
• For in-depth information on swept list mode, refer to "Swept List Frequency Sweep
(Hz)" on page 7-17.
• For more information on making measurements with swept list mode, refer to "Using
the Swept List Mode to Test a Device" on page 1-65.

1. To set up a swept list measurement, press Sweep Setup SWEEP TYPE MENU
EDIT LIST ADD .
2. The frequency segments can be defined in any of the following terms:
• start/stop/number of points/power/IFBW
• start/stop/step/power/IFBW
• center/span/number of points/power/IFBW
• center/span/step/power/IFBW
3. When finished, press DONE LIST TYPE: [SWEPT] .

5- 9
Optimizing Measurement Results
Increasing Sweep Speed

Sweep Speed-Related Errors

IF delay occurs during swept measurements when the signal from the analyzer source is
delayed in reaching the analyzer receiver because of an electrically long device. The
receiver has a narrow IF band pass filter that tracks the receiver frequency because the
receiver is sweeping. The delayed signal will be attenuated because the center of the
internal IF filter has moved.
For most measurements, swept list mode will be the optimum choice. If there is any doubt
about the effect of IF delay, perform the following test:
1. Set up the measurement using the swept list mode, as in the previous procedure.
2. Make the measurement and save the data trace to memory:
Display DATA → MEMORY DISPLAY: DATA and MEMORY
3. Then switch to stepped list mode:
Sweep Setup SWEEP TYPE MENU EDIT LIST LIST TYPE: [STEPPED] DONE

• If there is no difference between the measurements in either list mode, then use the
swept list mode.
• If the memory trace indicates that there is more attenuation in swept list mode, it
may be due to IF delay. You can usually remedy this problem by increasing the sweep
time.

NOTE IF bandwidths of 30 to 10 Hz cause the sweep (or that segment of the sweep)
to always be stepped, thus eliminating IF delay.

To Decrease the Frequency Span

The hardware of the network analyzer sweeps the frequency range in separate bands,
where switching from band to band takes time. Modify the frequency span to eliminate as
many band switches as possible while maintaining measurement integrity. Refer to the
following table to identify the analyzer's band switch points:
Table 5-3 Band Switch Points

Band Frequency Span Band Frequency Span

0 0.01 MHz to 0.3 MHz 7 178 MHz to 296 MHz

1 0.3 MHz to 3.3 MHz 8 296 MHz to 536 MHz

2 3.3 MHz to 16 MHz 9 536 MHz to 893 MHz

3 16 MHz to 31 MHz 10 893 MHz to 1.607 GHz

4 31 MHz to 61 MHz 11 1.607 GHz to 3 GHz

5 61 MHz to 121 MHz 12 (Option 006) 3 GHz to 4.95 GHz

6 121 MHz to 178 MHz 13 (Option 006) 4.95 GHz to 6 GHz

5-10
 Optimizing Measurement Results
Increasing Sweep Speed

To Set the Auto Sweep Time Mode

Auto sweep time mode is the default mode (the preset mode). This mode maintains the
fastest sweep speed possible for the current measurement settings.

• Press Sweep Setup SWEEP TIME 0 , to re-enter the auto mode.

To Widen the System Bandwidth

1. Press Avg IF BW .
2. Increase the IF bandwidth to increase the sweep speed.
The specifications and characteristics chapter of the reference guide shows the relative
increase in sweep time as you decrease system bandwidth.

To Reduce the Averaging Factor

By reducing the averaging factor (number of sweeps) or switching averaging off, you can
increase the analyzer's measurement speed. The time needed to compute averages can also
slow the sweep time slightly, in narrow spans.

1. Press Avg AVG FACTOR .

2. Enter an averaging factor that is less than the value displayed on the analyzer screen
and press x1 .
3. If you want to switch off averaging, press Avg AVERAGING OFF .

To Reduce the Number of Measurement Points

1. Press Menu NUMBER OF POINTS .
2. Enter a number of points that is less than the value displayed on the analyzer screen
and press x1 .
Refer to the “Specifications and Characteristics” chapter of the reference guide for
examples of how sweep time changes with the number of points.

To Set the Sweep Type

Different sweep speeds are associated with the following three types of non-power sweeps.
Choose the sweep type that is most appropriate for your application.

1. Press Sweep Setup SWEEP TYPE MENU .

2. Select the sweep type:

• Select LIN FREQ for the fastest sweep for a given number of fixed points.
• Select LIST FREQ for the fastest sweep when specific non-linearly spaced
frequency points are of interest.
• Select LOG FREQ for the fastest sweep when the frequency points of interest are in
the lower part of the frequency span selected.

5- 11
Optimizing Measurement Results
Increasing Sweep Speed

To View a Single Measurement Channel

Viewing a single channel will increase the measurement speed if the analyzer’s channels
are in alternate, or uncoupled mode.

1. Press Display DUAL | QUAD SETUP DUAL CHAN on OFF

AUX CHAN on OFF .

2. Press Chan 1 and Chan 2 to alternately view the two measurement channels.
If you must view both measurement channels simultaneously (with dual channel), use
the chop sweep mode, explained next.
3. If you want to view channel 3 (or channel 4), press Chan 3 (or Chan 4 ). This will
always result in a dual trace display of channel 1 and channel 3 (or channel 2 and
channel 4).
To return to a single-trace display, press Display DUAL | QUAD SETUP
AUX CHAN on OFF .

To Activate Chop Sweep Mode

You can use the chop sweep mode to make two measurements at the same time. For
example, the analyzer can measure S11 and S21 simultaneously. You can activate the chop
mode by pressing Preset or by pressing Cal MORE CHOP A and B .
While Chop mode is the fastest way to measure devices, some components, such as filters
with very high attenuation, may require measurement in Alternate mode. See "Increasing
Dynamic Range" on page 5-14.

To Use External Calibration

Off-loading the error correction process to an external PC increases throughput on the
network analyzer. This can be accomplished with remote-only commands. Refer to the
programmer’s guide for information on how to use external calibration.

To Use Fast 2-Port Calibration

With a 2-port calibration on, faster trace updates are possible by not measuring the
reverse path for every forward sweep. This is controlled by the test set switch command.
This is convenient for tuning applications because it gives a faster trace update.
When making measurements using full two-port error-correction, the following types of
test set switching can be defined by the user:
• Hold: In this mode the analyzer does not switch between the test ports on every sweep.
The measurement stays on the active port after an initial cycling between the ports.
The fastest measurements can be made by using this type of test set switching.
Pressing the Meas key, changing to a different S-parameter measurement, or any
other action which restarts a sweep will cause the test set to switch and cycle between
the ports.

5-12
 Optimizing Measurement Results
Increasing Sweep Speed

• Continuous: In this mode the analyzer will switch between the test ports on every
sweep. Although this type of test set switching provides the greatest measurement
accuracy, it requires a reverse sweep for every forward sweep.
• Number of Sweeps: In this mode there is an initial cycling between the test ports and
then the measurement stays on the active port for a user-defined number of sweeps.
After the specified number of sweeps have been executed, the analyzer switches
between the test ports and begins the cycle again. This type of test set switching can
provide improved measurement accuracy over the hold mode and faster measurement
speeds than continuous mode.

NOTE Fast 2-Port Calibration Accuracy

For most devices, the fast 2-Port Calibration method is nearly as accurate as
the full 2-Port Calibration method.

1. To access the test set switch functions, press:

Cal MORE TESTSET SW CONTINUOUS
2. To activate the hold mode, press:
0 x1

The analyzer will then display the softkey as TESTSET SW HOLD .

3. To activate the continuous mode, press:
1 x1

The analyzer will then display TESTSET SW CONTINUOUS .

4. To enter the number of sweeps, (for this example, 8 sweeps) press:
8 x1

The analyzer will then display the softkey as TESTSET SW 8 Sweeps .

5- 13
Optimizing Measurement Results
Increasing Dynamic Range

Increasing Dynamic Range

Dynamic range is the difference between the analyzer’s maximum allowable input level
and minimum measurable power. For a measurement to be valid, input signals must be
within these boundaries. The dynamic range is affected by these factors:
• test port input power
• test port noise floor
• receiver crosstalk

Increase the Test Port Input Power

You can increase the analyzer's source output power so that the test device output power is
at the top of the measurement range of the analyzer test port.
Press Power and enter the new source power level, followed by x1 .

CAUTION Do not exceed the maximum test port power level that is printed on
the front panel of your network analyzer. Exceeding this maximum
power level may damage your analyzer.

Reduce the Receiver Noise Floor

Refer to "Reducing Noise" on page 5-15.

Reduce the Receiver Crosstalk

Refer to "Reducing Receiver Crosstalk" on page 5-16.

5-14
 Optimizing Measurement Results
Reducing Noise

Reducing Noise
You can use two analyzer functions to help reduce the effect of noise on the data trace:
• activate measurement averaging
• reduce system bandwidth

To Activate Averaging
The noise is reduced with each new sweep as the effective averaging factor increments.

1. Press Avg AVERAGING FACTOR .

2. Enter a value followed by x1 .

3. Press AVERAGING ON .
Refer to "Averaging" on page 7-34 for more information.

To Change System Bandwidth

By reducing the system bandwidth, you reduce the noise that is measured during the
sweep. While averaging requires multiple sweeps to reduce noise, narrowing the system
bandwidth reduces the noise on each sweep, however, the sweep will be slower.

1. Press Avg IF BW .

2. Enter the IF bandwidth value that you want, followed by x1 .

Narrower system bandwidths cause longer sweep times. When in auto sweep time mode,
the analyzer uses the fastest sweep time possible for any selected system bandwidth. Auto
sweep time mode is the default (preset) analyzer setting.

NOTE Another capability that can be used for effective noise reduction is the marker
statistics function, which computes the average value of part or all of the
formatted trace.

5- 15
Optimizing Measurement Results
Reducing Receiver Crosstalk

Reducing Receiver Crosstalk

To reduce receiver crosstalk you can do the following:
• Perform a response and isolation measurement calibration.
• Set the sweep to the alternate mode.
Alternate sweep is intended for measuring wide dynamic range devices, such as high pass
and bandpass filters. This sweep mode removes a type of leakage term through the device
under test, from one channel to another.
To set the alternate sweep, press Cal MORE ALTERNATE A and B .

Refer to "Frequency Response and Isolation Error Corrections" on page 6-17.

5-16
 Optimizing Measurement Results
Reducing Recall Time

Reducing Recall Time

To reduce time during recall and frequency changes, the raw offset function and the spur
avoidance function can be turned off. To turn these functions off, press System
CONFIGURE MENU RAW OFFSET OFF SPUR AVOID OFF .
The raw offset function is normally on and controls the sampler and attenuator offsets.
The spur avoidance function is normally on and generates values as part of the sampler
offset table. The creation of this table takes considerable time during a recall of an
instrument state.
To save time at recalls and during frequency changes, both functions should be turned off.
This will avoid generating the sampler offset table.
Raw offsets may be turned on or off individually for each channel. They follow the channel
coupling. For dual channel operation, raw offsets should be turned off for each channel if
the channels are uncoupled. Spur avoidance is always coupled between channels, therefore
both channels are turned on or off at the same time.

NOTE Both functions must be turned off to realize the recall time savings.

Refer to “Specifications and Characteristics” chapter in the reference guide for examples of
recall state times with the following functions on or off: raw offsets, spur avoidance, and
blank display. Using blank display may speed up recall times.

Understanding Spur Avoidance

In the 400 MHz to 3 GHz range, where the source signal is created by heterodyning two
higher frequency oscillators, unwanted spurious mixing products from the source may be
present at the output. These spurs can become apparent in filter measurements when
filters have greater than 80 dB rejection.
Spur avoidance slightly moves the frequency of both oscillators such that the source
frequency remains the same but the spurious mixing products shift out of the
measurement receiver range. The calculation of the exact frequency points where the
shifting must occur (stored in the sampler offset table) increases the time needed to change
or recall instrument states. Selecting SPUR AVOID OFF and RAW OFFSET OFF
eliminates this calculation.

5- 17
Optimizing Measurement Results
Reducing Recall Time

5-18
6 Calibrating for Increased
Measurement Accuracy

6-1
Calibrating for Increased Measurement Accuracy
How to Use This Chapter

How to Use This Chapter

This chapter is divided into the following subjects:
• "Calibration Considerations" on page 6-4
• "Procedures for Error Correcting Your Measurements" on page 6-10
— frequency response error correction
— frequency response and isolation error correction
— enhanced frequency response error correction (with enhanced reflection error
correction)
— one-port reflection error correction
— full two-port error correction
• "Power Meter Measurement Calibration" on page 6-33
• "Calibrating for Noninsertable Devices" on page 6-40
— adapter removal calibration
— matched adapters
— modify the cal kit thru definition
• "Calibrating for Non-Coaxial Devices" on page 6-52
— TRL* calibration
— LRM* calibration
• "Calibrating Using Electronic Calibration (ECal)" on page 6-60
• "Adapter Removal Using ECal" on page 6-71

6-2
 Calibrating for Increased Measurement Accuracy
Introduction

Introduction
The accuracy of network analysis is greatly influenced by factors external to the network
analyzer. Components of the measurement setup, such as interconnecting cables and
adapters, introduce variations in magnitude and phase that can mask the actual response
of the device under test.
Error correction is an accuracy enhancement procedure that removes systematic errors
(repeatable measurement variations) in the test setup. The analyzer measures known
standard devices, and uses the results of these measurements to characterize the system.
Measurement accuracy and system characteristics can be affected by the following factors:
• Adapting to a different connector type or impedance.
• Connecting a cable between the test device and an analyzer test port.
• Connecting any attenuator or other such device on the input or output of the test device.
If your test setup meets any of the these conditions, the following system characteristics
may be affected:
• amplitude at device input
• frequency response accuracy
• directivity
• crosstalk (isolation)
• source match
• load match

6- 3
Calibrating for Increased Measurement Accuracy
Calibration Considerations

Calibration Considerations

Measurement Parameters
Calibration procedures are parameter-specific, rather than channel-specific. When a
parameter is selected, the instrument checks the available calibration data, and uses the
data found for that parameter. For example, if a transmission response calibration is
performed for B/R, and an S11 1-port calibration for A/R, the analyzer retains both
calibration sets and corrects whichever parameter is displayed. Once a calibration has
been performed for a specific parameter or input, measurements of that parameter remain
calibrated in either channel, as long as stimulus values are coupled. In the response and
response and isolation calibrations, the parameter must be selected before calibration.
Other correction procedures select parameters automatically. Changing channels during a
calibration procedure invalidates the part of the procedure already performed.

Device Measurements
In calibration procedures that require measurement of several different devices, for
example a short, an open, and a load, the order in which the devices are measured is not
critical. Any standard can be re-measured, until the DONE key is pressed. The change in
trace during measurement of a standard is normal.
“Response” and “response and isolation” calibrations require measurement of only one
standard device. If more than one device is measured, only the data for the last device is
retained.

Clarifying Type-N Connector Sex

When you are performing error correction for a system that has type-N port connectors,
the softkey menus label the sex of the test port connector — not the calibration standard
connector. For example, the label, SHORT (F), refers to the short that will be connected to
the female test port. Since many devices have type-N (f) connectors, the calibration
standard to select is the type-N (m). Be sure to use the port extension pin on the type-N
(m) Open calibration standard.

NOTE Since the 85032F calibration kit offsets are equal for both male and female
connectors, the standard’s sex type is not requested during the calibration.

Omitting Isolation Calibration

Isolation calibration can be omitted for most measurements, except where high dynamic
range is a consideration. Use the following guidelines. When the measurement requires a
dynamic range of:
• Less than 90 dB: Omit isolation calibration for most measurements.

6-4
 Calibrating for Increased Measurement Accuracy
Calibration Considerations

• 90 to 100 dB: Isolation calibration is recommended with test port power greater than
0 dBm. For this isolation calibration, averaging should be turned on with an averaging
factor at least four times the measurement averaging factor. For example, use an
averaging factor of 16 for the isolation calibration, and then reduce the averaging factor
to four for the measurement after calibration.
• Greater than 100 dB: Same as 90 to 100 dB, but alternate mode should be used. See "To
View a Single Measurement Channel" on page 5-12.

Saving Calibration Data

You should save the calibration data, either in the internal non-volatile memory or on a
disk. If you do not save it, it will be lost if you select another calibration procedure for the
same channel, or if you change stimulus values. Instrument preset, power on, and
instrument state recall will also clear the calibration data.

Restarting a Calibration
If you interrupt a calibration to go to another menu, such as averaging, you can continue
the calibration by pressing the RESUME CAL SEQUENCE softkey in the correction
menu.

The Calibration Standards

During measurement calibration, the analyzer measures actual, well-defined standards
and mathematically compares the results with ideal "models" of those standards. The
differences are separated into error terms which are later removed during error correction.
Most of the differences are due to systematic errors—repeatable errors introduced by the
analyzer, test set, and cables—which are correctable.
The standard devices required for system calibration are available in compatible
calibration kits with different connector types. Each kit contains at least one short circuit,
one open circuit, and an impedance-matched load. In kits that require adapters for
interface to the test set ports, the adapters are phase-matched for calibration prior to
measurement of non-insertable and non-reversible devices. Other standard devices can be
used by specifying their characteristics in a user-defined kit, as described in "Modifying
Calibration Kits" on page 7-56.
The accuracy improvement of the correction is limited by the quality of the standard
devices, and by the connection techniques used. For maximum accuracy, ensure that the
connectors are clean and use a torque wrench for final connections.
Electronic calibration (ECal) modules serve as the calibration standards for electronic
calibration procedures. ECal modules are electronic networks that simulate impedance
states that are similar to mechanical standards. The factory error correction for optimum
performance is embedded in the module’s memory.

6- 5
Calibrating for Increased Measurement Accuracy
Calibration Considerations

Frequency Response of Calibration Standards

In order for the response of a reference standard to show as a dot on the smith chart
display format, it must have no phase shift with respect to frequency. Standards that
exhibit such "perfect" response are the following:
• 7-mm short (with no offset)
• type-N male short (with no offset)
There are two reasons why other types of reference standards show phase shift after
calibration:
• The reference plane of the standard is electrically offset from the mating plane of the
test port. Such devices exhibit the properties of a small length of transmission line,
including a certain amount of phase shift.
• The standard is an open termination, which by definition exhibits a certain amount of
fringe capacitance (and therefore phase shift). Open terminations which are offset from
the mating plane will exhibit a phase shift due to the offset in addition to the phase
shift caused by the fringe capacitance.
The most important point to remember is that these properties will not affect your
measurements. The analyzer compensates for them during measurement. As a result, if
these standards are measured after a calibration, they will not appear to be "perfect"
shorts or opens. This is an indication that your analyzer is working properly and that it has
successfully performed a calibration. Figure 6-1 shows sample displays of various
calibration standards after calibration.

Electrical Offset
Some standards have reference planes that are electrically offset from the mating plane of
the test port. These devices will show a phase shift with respect to frequency. Table 6-1
shows which reference devices exhibit an electrical offset phase shift. The amount of phase
shift can be calculated with the formula:
Φ = (360° × f × l)/c where:
f = frequency
l = electrical length of the offset

c = speed of light (3 x 108 meters/second)

Fringe Capacitance
All open circuit terminations exhibit a phase shift over frequency due to fringe
capacitance. Offset open circuits have increased phase shift because the offset acts as a
small length of transmission line. Refer to Table 6-1.

6-6
 Calibrating for Increased Measurement Accuracy
Calibration Considerations

Table 6-1 Calibration Standard Types and Expected Phase Shift

Test Port Connector Type Standard Type Expected Phase Shift

7-mm Short 180°

Type-N male

3.5-mm male Offset Short

( 360° × f × l )
180° + --------------------------------
3.5-mm female c
2.4-mm male

2.4-mm female

Type-N female

75Ω Type-N female

7-mm Open

Type N-male 0° + Φ°capitance

3.5-mm male Offset Open

0° + Φ°capitance + (-------------------------------
360° × f × l )-
3.5-mm female c
2.4-mm male

2.4-mm female

Type-N female

75Ω Type-N female

6- 7
Calibrating for Increased Measurement Accuracy
Calibration Considerations

Figure 6-1 Typical Responses of Calibration Standards after Calibration

CH1 S11 1 U FS 1: 998.84 mU -179.92° CH1 S11 1 U FS 1: 999.62 mU 142.07°
3 000 . 000 000 MHz 3 000 . 000 000 MHz
1

Cor Cor

START .300 000 MHZ STOP 3 000 . 000 000 MHZ START .300 000 MHZ STOP 3 000 . 000 000 MHZ

7mm or Type-N Male Type-N Female,

Short (No Offset) 3.5mm Male or Female Offset Short

CH1 S11 1 U FS 1: 998.25 mU -11.779° CH1 S11 1 U FS 1: 999.1 mU -44.561°

3 000 . 000 000 MHz 3 000 . 000 000 MHz

Cor Cor

START .300 000 MHZ STOP 3 000 . 000 000 MHZ START .300 000 MHZ STOP 3 000 . 000 000 MHZ

7mm or Type-N Male Type-N Female

Open (No Offset) with Fringing Capacitance 3.5 mm Male or Female Offset Open

pa5162e

Interpolated Error Correction

You may want to use interpolated error correction when you choose a subset of a frequency
range that you already corrected, when you change the number of points, or when you
change to CW. This feature also allows you to change the parameters in a 2-port correction,
such as IF bandwidth, power, or sweep time. The analyzer calculates the systematic errors
from the errors of the original correction.

6-8
 Calibrating for Increased Measurement Accuracy
Calibration Considerations

To activate interpolated measurement correction, press Cal INTERPOL ON off so that

ON is selected, and CORRECTION on OFF so that ON is selected. When interpolation is
in use, the notation C∆ will appear on the analyzer display.

NOTE The preset state of the instrument can be configured so that interpolated
error correction is on or off. Press System CONFIGURE MENU
USER SETTINGS PRESET SETTINGS CAL INTERP ON off to configure
the preset state of interpolated error correction.

System performance is unspecified when using interpolated error correction. The quality of
the interpolated error correction is dependent on the amount of phase shift and the
amplitude change between measurement points. If phase shift is no greater than 180° per
approximately five measurement points, interpolated error correction offers a great
improvement over uncorrected measurements. The accuracy of interpolated error
correction improves as the phase shift and amplitude change between adjacent points
decrease. When you use the analyzer in linear frequency sweep, perform the original
calibration with at least 30 points per 1 GHz of frequency span for greatest accuracy with
interpolated error correction.
Interpolated error correction is available in three sweep modes: linear frequency, power
sweep, and CW time.

NOTE If there is a valid correction array for a linear frequency sweep, this may be
interpolated to provide correction at the CW frequency used in power sweep
or CW time modes. This correction is part of the interpolated error-correction
feature.

Error-Correction Stimulus State

Error correction is only valid for a specific stimulus state, which you must select before you
start a correction. If you change any of the following parameters, you will invalidate the
correction and the analyzer will switch the correction off (unless the interpolated error
correction feature is activated):
• frequency range
• number of points
• sweep type
The error correction quality may be degraded (Cor changes to C∆), if you change the
following stimulus state parameters:
• sweep time
• system bandwidth
• output power
If correction is turned off or shows C∆, the original stimulus state can be recalled by, first,
turning interpolation off ( INTERPOL ON off ), and toggling correction off and then on
( CORRECTION ON off ).

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Calibrating for Increased Measurement Accuracy
Procedures for Error Correcting Your Measurements

Procedures for Error Correcting Your Measurements

This section has example procedures or information on the following topics:
• frequency response correction
• frequency response and isolation correction
• enhanced frequency response correction (with enhanced reflection error correction)
• one-port reflection correction
• full two-port correction
• TRL*/LRM* correction
• power meter measurement calibration procedure

NOTE If the channels are uncoupled, you must make a correction for each channel.

Types of Error Correction

Several types of error correction are available that remove from one to twelve systematic
errors. The full 2-port correction effectively removes all twelve correctable systematic
errors. Some measurements do not require correction for all twelve errors. Table 6-2
explains each correction and its uses.
Table 6-2 Purpose and Use of Different Error Correction Procedures

Correction Procedure Corresponding Errors Corrected Standard Devices

Measurement

Response Transmission or Frequency response. Thru for

reflection transmission, open or
measurement when short for reflection.
the highest accuracy
is not required.

Response & Isolation Transmission of high Frequency response Same as response

insertion loss devices plus isolation in plus isolation
or reflection of high transmission or standard. (load)
return loss devices. directivity in
Not as accurate as reflection.
1-port or 2-port
correction.

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 Calibrating for Increased Measurement Accuracy
Procedures for Error Correcting Your Measurements

Table 6-2 Purpose and Use of Different Error Correction Procedures

Correction Procedure Corresponding Errors Corrected Standard Devices

Measurement

Enhanced Response Transmission or Directivity, source Short, open, load, and

and Enhanced reflection match, and frequency thru or ECal module.
Reflection measurement when response for
improved accuracy is reflection. Frequency
desired. Not as response, source
accurate as 2-port match, and isolation
calibration. for transmission.
Enhanced reflection
corrects for load
match on bilateral
devices.

S11 1-port Reflection of any Directivity, source Short, open and load
one-port device or match, frequency or ECal module.
well terminated response.
two-port device.

S22 1-port Reflection of any Directivity, source Short, open and load
one-port device or match, frequency or ECal module.
well terminated response.
two-port device.

Full 2-port Transmission or Directivity, source Short, open, load and

reflection of highest match, load match, thru (2 loads for
accuracy for two-port isolation, frequency isolation) or ECal
devices. response, forward and module
reverse.

TRL*/LRM * Transmission or Directivity, isolation, Thru, reflect, line, or

reflection in frequency response. line, reflect, match, or
noncoaxial (forward and reverse) thru, reflect, match.
environment such as
in a fixture or
on-wafer.

NOTE Response calibration is not as accurate as other calibration methods.

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Calibrating for Increased Measurement Accuracy
Frequency Response Error Corrections

Frequency Response Error Corrections

You can remove the frequency response of the test setup for the following measurements:
• reflection measurements
• transmission measurements
• combined reflection and transmission measurements

Response Error Correction for Reflection Measurements

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a reflection measurement on PORT 1 (in the forward direction,
S11), leave the instrument default setting.
❏ If you want to make a reflection measurement on PORT 2 (in the reverse direction,
S22), press:

Meas Refl: REV S22 (B/R)

3. Set any other measurement parameters that you want for the device measurement:
power, sweep type, number of points, or IF bandwidth.
4. To access the measurement error-correction menus, press:
Cal CALIBRATE MENU

5. If your calibration kit is different than the kit specified under the Cal CAL KIT [ ]
softkey, press:
Cal CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
6. To select a response correction, press:
Cal CALIBRATE MENU RESPONSE
Connect the short or open calibration standard to the port you selected for the test port
(PORT 1 for S11 or PORT 2 for S22).

NOTE Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device to the particular connector where you
will connect your DUT.

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 Calibrating for Increased Measurement Accuracy
Frequency Response Error Corrections

Figure 6-2 Standard Connections for a Response Error Correction for

Reflection Measurement

7. To measure the standard when the displayed trace has settled, press SHORT or
OPEN .
If the calibration kit you selected has a choice between male and female calibration
standards, remember to select the sex that applies to the test port and not the standard.
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the softkey that you selected after it finishes
the measurement, and computes the error coefficients.

NOTE This calibration allows only one standard to be measured. If you press the
wrong key for a standard, press RESPONSE again and choose the correct
standard. Do not use a thru standard for a reflection response correction.

NOTE You can save or store the measurement correction to use for later
measurements, that use the same measurement parameters. Refer to the
Chapter 4 , “Printing, Plotting, and Saving Measurement Results” for
procedures.

This completes the response correction for reflection measurements. You can connect
and measure your device under test.

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Calibrating for Increased Measurement Accuracy
Frequency Response Error Corrections

Response Error Correction for Transmission Measurements

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a transmission measurement in the forward direction (S21),
press:
Meas Trans: FWD S21 (B/R)
❏ If you want to make a transmission measurement in the reverse direction (S12),
press:
Meas Trans: REV S12 (A/R)
3. Set any other measurement parameters that you want for the device measurement:
power, number of points, IF bandwidth.
4. To select a response correction, press:
Cal CALIBRATE MENU RESPONSE
5. Make a "thru" connection between the points where you will connect your DUT.

NOTE Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device where you will connect your DUT.

Figure 6-3 Standard Connections for Response Error Correction for

Transmission Measurements

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 Calibrating for Increased Measurement Accuracy
Frequency Response Error Corrections

6. To measure the standard, press:

THRU
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the THRU softkey after it measures the
calibration standard, and computes the error coefficients.

NOTE Do not use an open or short standard for a transmission response correction.

NOTE You can save or store the measurement correction to use for later
measurements. Refer to the Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

7. This completes the response correction for transmission measurements. You can
connect and measure your device under test.

Receiver Calibration
Receiver calibration provides a frequency response error correction for a non-ratioed
measurement that also indicates absolute power in dBm. This calibration is most useful
when performed with a power meter calibration. This calibration is only allowed for
non-ratioed measurements A, B, and R.
This calibration normalizes the trace to the current reference value. Typically, this
reference value is entered to be the same as the current source power.
1. Perform a power meter calibration to the desired level. Refer to step A of Figure 6-4.
Use −10 dBm for this example. (See also, "Power Meter Measurement Calibration" on
page 6-33.) This provides a calibrated power, referenced to the power meter, to use as a
receiver calibration standard.
or
Set the analyzer test port power to the desired level (−10 dBm in this example) by
pressing:
Power −10 x1 . This calibrates the receiver to the approximate accuracy of the
source output power, which is subject to the source power flatness specification.
2. Make a "thru" connection between the points where you will connect your device under
test. Refer to Step B of Figure 6-4.

NOTE Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device where you will connect your device under
test.

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Calibrating for Increased Measurement Accuracy
Frequency Response Error Corrections

Figure 6-4 Standard Connections for a Receiver Calibration

3. To choose a non-ratioed measurement, press:

Meas INPUT PORTS B

Press TEST PORTS 1 . This sets the source at PORT 1.

4. Set any other measurement parameters that you want for the device measurement:
power, number of points, IF bandwidth.
5. To perform a receiver error correction, press:
Cal CALIBRATE MENU RECEIVER CAL −10 x1 TAKE RCVR CAL SWEEP

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

6. This completes the receiver calibration for transmission measurements. You can
connect and measure your device under test.

NOTE The accuracy of the receiver calibration will be nearly the same as the test
port power accuracy; and the test port power accuracy can be significantly
improved by performing a power meter source calibration, as described later
in "Power Meter Measurement Calibration" on page 6-33.

Calibrations at powers other than 0 dBm are possible. Receiver calibration normalizes the
trace to the value set for the reference level. For example, to do a receiver calibration at
−10 dBm, set the source to −10 dBm, set the reference level to −10 dBm, then perform the
receiver calibration.

6-16
 Calibrating for Increased Measurement Accuracy
Frequency Response and Isolation Error Corrections

Frequency Response and Isolation Error Corrections

You can make a response and isolation correction for the following measurements:
• reflection measurements
• transmission measurements
• combined reflection and transmission measurements

NOTE Although you can perform a response and isolation correction for reflection
measurements, we recommend that you perform an S11 one-port error
correction; it is more accurate and just as convenient.

Response and Isolation Error Correction for Transmission

Measurements
This procedure is intended for measurements that have a measurement range of greater
than 90 dB.

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a transmission measurement in the forward direction (S21),
press:
Meas Trans: FWD S21 (B/R)
❏ If you want to make a transmission measurement in the reverse direction (S12),
press:
Meas Trans: REV S12 (A/R)
3. Set any other measurement parameters that you want for the device measurement:
power, number of points, IF bandwidth.
4. To access the measurement correction menus, press:
Cal

5. If your calibration kit is different than the kit specified under the CAL KIT [ ] softkey,
press:
CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
6. To select a response and isolation correction and to start the response portion of the
calibration, press:
CALIBRATE MENU RESPONSE & ISOL’N RESPONSE

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Calibrating for Increased Measurement Accuracy
Frequency Response and Isolation Error Corrections

7. Make a "thru" connection between the points where you will connect your device under
test.

NOTE Include any adapters that you will have in the device measurement. That is,
connect the standard device to the particular connector where you will
connect your device under test.

8. To measure the standard, when the displayed trace has settled, press:
THRU
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the THRU softkey after it measures the
calibration standard, and computes the error coefficients.
9. Connect impedance-matched loads to PORT 1 and PORT 2, as shown in Figure 6-5.
Include the adapters that you would include for your device measurement.

Figure 6-5 Standard Connections for a Response and Isolation Error

Correction for Transmission Measurements

NOTE If you will be measuring highly reflective devices, such as filters, use the test
device, connected to the reference plane and terminated with a load, for the
isolation standard.

10.To help remove crosstalk noise, set the analyzer as follows:

a. Press Avg AVERAGING ON AVERAGING FACTOR and enter at least four

times more averages than desired during the device measurement.
b. Press Cal MORE ALTERNATE A and B to eliminate one crosstalk path.

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 Calibrating for Increased Measurement Accuracy
Frequency Response and Isolation Error Corrections

11.To measure the calibration standard, press:

Cal RESUME CAL SEQUENCE ISOL’N STD
12.Return the averaging to the original state of the measurement. For example, reduce the
averaging factor by at least four times or turn averaging off.
13.To compute the isolation error coefficients, press:
Cal RESUME CAL SEQUENCE DONE RESP ISOL’N CAL
The analyzer displays the corrected data trace. The analyzer also shows the notation
Cor at the left of the screen, indicating that the correction is switched on for this
channel.

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

14.This completes the response and isolation correction for transmission measurements.
You can connect and measure your device under test.

Response and Isolation Error Correction for Reflection

Measurements
The response and isolation error correction for reflection measurements provides the
following benefits:
• removes frequency response of the test setup
• removes isolation in transmission measurements
• removes directivity in reflection measurements
To perform the response and isolation error correction for reflection measurements:

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a reflection measurement on PORT 1 (in the forward direction,
S11), leave the instrument default setting.
❏ If you want to make a reflection measurement on PORT 2 (in the reverse direction,
S22), press:

Meas Refl: REV S22 (B/R)

3. Set any other measurement parameters that you want for the device measurement:
power, sweep type, number of points, IF bandwidth.
4. To access the measurement correction menus, press:
Cal

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Calibrating for Increased Measurement Accuracy
Frequency Response and Isolation Error Corrections

5. If your calibration kit is different than the kit specified under the CAL KIT [ ] softkey,
press:
CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
6. To select a response and isolation correction and to start with the response portion of
the calibration, press:
CALIBRATE MENU RESPONSE & ISOL’N RESPONSE
7. Connect the short or open calibration standard to the port you selected for the test port
(PORT 1 for S11 or PORT 2 for S22).

NOTE Include any adapters that you will have in the device measurement. That is,
connect the standard device to the particular connector where you will
connect your device under test.

Figure 6-6 Standard Connections for a Response and Isolation Error

Correction for Reflection Measurements

6-20
 Calibrating for Increased Measurement Accuracy
Frequency Response and Isolation Error Corrections

8. To measure the standard, press:

SHORT or OPEN
If the calibration kit you selected has a choice between male and female calibration
standards, remember to select the sex that applies to the test port and not the standard.
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the softkey that you selected after it finishes
the measurement, and computes the error coefficients.
9. Connect the load calibration standard to the test port.
10.To measure the standard for the isolation portion of the correction, press ISOL’N STD .

a. Press Avg AVERAGING ON AVERAGING FACTOR and enter at least four

times more averages than desired during the device measurement.
11.To compute the response and directivity error coefficients, press:
DONE RESP ISOL’N CAL
The analyzer displays the corrected S11 (or S22) data. The analyzer also shows the
notation Cor to the left of the screen, indicating that the correction is switched on for
this channel.

NOTE You can save or store the error correction to use for later measurements.
Refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results” for
procedures.

12.This completes the response and isolation error correction for reflection measurements.
You can connect and measure your device under test.

6- 21
Calibrating for Increased Measurement Accuracy
Enhanced Frequency Response Error Correction

Enhanced Frequency Response Error Correction

The enhanced frequency response error correction removes the following errors in both the
forward and reverse directions:
• removes directivity errors of the test setup
• removes source match errors of the test setup
• removes isolation errors of the test setup (optional)
• removes frequency response of the test setup
The enhanced reflection error correction may be used to remove load match from the test
setup when measuring bilateral devices. Enhanced reflection terms are mathematically
derived during all enhanced response calibrations but are not applied unless initiated by
the ENH. REFL. on OFF softkey. Enhanced reflection correction is applied after the
enhanced frequency response error correction is finished.

IMPORTANT Use enhanced reflection error correction only on bilateral devices. A bilateral
device has similar forward and reverse transmission characteristics.
Examples of bilateral devices are passive devices (filters, attenuators, and
switches). Most active devices (amplifiers) and some passive devices (isolators
and circulators) are not bilateral. If this error correction is used for a
non-bilateral device, errors will occur in the resulting measurement.

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make measurements in the forward direction (S21 S11), press:

Meas Trans: FWD S21 (B/R)

❏ If you want to make measurements in the reverse direction (S12 S22), press:

Meas Trans: REV S12 (A/R)

3. Set any measurement parameters that you want for the device measurement: power,
format, number of points, or IF bandwidth.
4. To access the measurement correction menus, press:
Cal

5. If your calibration kit is different than the kit specified under the CAL KIT [ ] softkey,
press:
CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
6. To select the correction type, press CALIBRATE MENU ENHANCED RESPONSE
and select the correction type.

6-22
 Calibrating for Increased Measurement Accuracy
Enhanced Frequency Response Error Correction

❏ If you want to make measurements in the forward direction, press:

S11/S21 ENH. RESP.
❏ If you want to make measurements in the reverse direction, press:
S22/S12 ENH. RESP.
7. Connect a shielded open circuit to PORT 1 (or PORT 2 for reverse measurements).

NOTE Include any adapters that you will have in the device measurement. That is,
connect the standard to the particular connector where you will connect your
device under test.

Figure 6-7 Standard Connections for Enhanced Response Calibration

8. To measure the standard, when the displayed trace has settled, press:
OPEN
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the OPEN softkey after it measures the
standard.
9. Disconnect the open, and connect a short circuit to the test port.
10.To measure the device, when the displayed trace has settled, press:
SHORT

The analyzer measures the short circuit and underlines the SHORT softkey.
11.Disconnect the short, and connect an impedance-matched load to the test port.

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Calibrating for Increased Measurement Accuracy
Enhanced Frequency Response Error Correction

12.To measure the standard, when the displayed trace has settled, press:
LOADS , select the type of load you are using, and then press DONE: LOADS when
the analyzer has finished measuring the load.
Notice that the LOADS softkey is now underlined.
13.To compute the reflection correction coefficients, press STANDARDS DONE .
14.To start the transmission portion of the correction, press TRANSMISSION .
15.Make a "thru" connection between the points where you will connect your device under
test as shown in Figure 6-7.

NOTE Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device where you will connect your device under
test.

NOTE The thru in most calibration kits is defined with zero length. The correction
will not work properly if a non-zero length thru is used, unless the calibration
kit is modified to change the defined thru to the length used. This is
important for measurements of non-insertable devices (devices having ports
that are both male or both female). The modified calibration kit must be
saved as the user calibration kit, and the USER KIT softkey must be
selected before the calibration is started.

16.To measure the standard, when the trace has settled, press:
FWD TRANS THRU or REV TRANS THRU

FWD MATCH THRU or REV MATCH THRU

STANDARDS DONE
The analyzer underlines the softkey label after it makes each measurement.
17.Press ISOLATION and select from the following two options:
❏ If you will be measuring devices with a dynamic range less than 90 dB, press:
OMIT ISOLATION
❏ If you will be measuring devices with a dynamic range greater than 90 dB, follow
these steps:
a. Connect impedance-matched loads to the test ports. Include the adapters that you
would include for your device measurement.

NOTE If you will be measuring highly reflective devices such as filters, use the test
device, connected to the reference plane and terminated with a load, for the
isolation standard.

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 Calibrating for Increased Measurement Accuracy
Enhanced Frequency Response Error Correction

b. Activate at least four times more averages than desired during the device
measurement.
c. Press Cal RESUME CAL SEQUENCE ISOLATION FWD or REV
ISOL’N STD DONE .

d. Return the averaging to the original state of the measurement, and press Cal
RESUME CAL SEQUENCE .

18.To compute the error coefficients, press DONE ENH RESP CAL .
The analyzer displays the corrected measurement trace. The analyzer also shows the
notation Cor at the left of the screen, indicating that error correction is on.

Enhanced Reflection Calibration

19.If you are measuring a bilateral device and want to remove the load match error,
activate the enhanced reflection calibration by pressing:
ENHANCED RESPONSE

ENH. REFL. on OFF until ON is selected

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

20.This completes the enhanced response correction procedure. You can connect and
measure your device under test.

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Calibrating for Increased Measurement Accuracy
One-Port Reflection Error Correction

One-Port Reflection Error Correction

• removes directivity errors of the test setup
• removes source match errors of the test setup
• removes frequency response of the test setup
You can perform a 1-port correction for an S11 or an S22 measurement. The only difference
between the two procedures is the measurement parameter that you select.

NOTE This is the recommended error correction process for all reflection
measurements, when full two-port correction or enhanced response
calibration is not used.

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a reflection measurement on PORT 1 (in the forward direction,
S11), leave the instrument default setting.
❏ If you want to make a reflection measurement on PORT 2 (in the reverse direction,
S22), press:

Meas Refl: REV S22 (B/R)

3. Set any other measurement parameters that you want for the device measurement:
power, number of points, IF bandwidth.
4. To access the measurement correction menus, press:
Cal

5. If your calibration kit is different than the kit specified under the CAL KIT [ ] softkey,
press:
CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
6. To select the correction type, press CALIBRATE MENU and select the correction type.
❏ If you want to make a reflection measurement at PORT 1, press:
S11 1-PORT
❏ If you want to make a reflection measurement at PORT 2, press:
S22 1-PORT
7. Connect a shielded open circuit to PORT 1 (or PORT 2 for an S22 measurement).

6-26
 Calibrating for Increased Measurement Accuracy
One-Port Reflection Error Correction

NOTE Include any adapters that you will have in the device measurement. That is,
connect the calibration standard to the particular connector where you will
connect your device under test.

Figure 6-8 Standard Connections for a One Port Reflection Error Correction

8. To measure the standard, when the displayed trace has settled, press: OPEN

NOTE If the calibration kit that you selected has a choice between male or female
calibration standards, remember to select the sex that applies to the test port
and not the standard.

The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the OPEN softkey after it measures the
calibration standard.
9. Disconnect the open, and connect a short circuit to the test port.
10.To measure the standard when the displayed trace has settled, press:
SHORT

The analyzer measures the short circuit and underlines the SHORT softkey.
11.Disconnect the short, and connect an impedance-matched load to the test port.
12.When the displayed trace has settled, press:
LOADS , select the type of load you are using, and then press DONE: LOADS when
the analyzer has finished measuring the load.
Notice that the LOADS softkey is now underlined.

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Calibrating for Increased Measurement Accuracy
One-Port Reflection Error Correction

13.To compute the error coefficients, press:

DONE: 1-PORT CAL
The analyzer displays the corrected data trace. The analyzer also shows the notation
Cor to the left of the screen, indicating that the correction is switched on for this
channel.

NOTE The open, short, and load could be measured in any order, and need not follow
the order in this example.

NOTE You can save or store the error correction to use for later measurements.
Refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results” for
procedures.

14.This completes the one-port correction for reflection measurements. You can connect
and measure your device under test.

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 Calibrating for Increased Measurement Accuracy
Full Two-Port Error Correction

Full Two-Port Error Correction

• removes directivity errors of the test setup in forward and reverse directions
• removes source match errors of the test setup in forward and reverse directions
• removes load match errors of the test setup in forward and reverse directions
• removes isolation errors of the test setup in forward and reverse directions (optional)
• removes frequency response of the test setup in forward and reverse directions

NOTE This is the most accurate error-correction procedure. Since the analyzer takes
both forward and reverse sweeps to update one measurement trace, this
procedure takes more time than the other correction procedures.

1. Set any measurement parameters that you want for the device measurement: power,
format, number of points, or IF bandwidth.
2. To access the measurement correction menus, press:
Cal

3. If your calibration kit is different than the kit specified under the CAL KIT [ ] softkey,
press:
CAL KIT SELECT CAL KIT (select your type of kit) RETURN
If your type of calibration kit is not listed in the displayed menu, refer to "Modifying
Calibration Kits" on page 7-56.
4. To select the correction type, press:
CALIBRATE MENU FULL 2-PORT REFLECTION
5. Connect a shielded open circuit to PORT 1.

NOTE Include any adapters that you will have in the device measurement. That is,
connect the standard to the particular connector where you will connect your
DUT.

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Calibrating for Increased Measurement Accuracy
Full Two-Port Error Correction

Figure 6-9 Standard Connections for Full Two-Port Error Correction

6. To measure the standard, when the displayed trace has settled, press:
FORWARD: OPEN
The analyzer displays WAIT - MEASURING CAL STANDARD during the standard
measurement. The analyzer underlines the OPEN softkey after it measures the
standard.
7. Disconnect the open, and connect a short circuit to PORT 1.
8. To measure the device, when the displayed trace has settled, press:
FORWARD: SHORT

The analyzer measures the short circuit and underlines the SHORT softkey.
9. Disconnect the short, and connect an impedance-matched load to PORT 1.
10.To measure the standard, when the displayed trace has settled, press:
FORWARD: LOAD , select the type of load you are using, and then press
DONE: LOADS when the analyzer has finished measuring the load.

Notice that the LOADS softkey is now underlined.

11.Repeat the open-short-load measurements described in the previous steps, but connect
the devices in turn to PORT 2, and use the REVERSE: OPEN , REVERSE: SHORT ,
and REVERSE: LOADS softkeys. Include any adapters that you would include in your
device measurement.
12.To compute the reflection correction coefficients, press:
STANDARDS DONE

13.To start the transmission portion of the correction, press TRANSMISSION .

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 Calibrating for Increased Measurement Accuracy
Full Two-Port Error Correction

14.Make a "thru" connection between the points where you will connect your device under
test as shown in Figure 6-9.

NOTE Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device where you will connect your DUT.

NOTE The thru in most calibration kits is defined with zero length. The correction
will not work properly if a non-zero length thru is used, unless the calibration
kit is modified to change the defined thru to the length used. This is
important for measurements of non-insertable devices (devices having ports
that are both male or both female). The modified calibration kit must be
saved as the user calibration kit, and USER KIT must be selected before the
calibration is started.

15.To measure the standard, when the trace has settled, press:
DO BOTH FWD+REV
The analyzer underlines the softkey label after it makes each measurement.
16.Press ISOLATION and select from the following two options:
❏ If you will be measuring devices with a dynamic range less than 90 dB, press:
OMIT ISOLATION
❏ If you will be measuring devices with a dynamic range greater than 90 dB, follow
these steps:
a. Connect impedance-matched loads to PORT 1 and PORT 2. Include the adapters
that you would include for your device measurement.

NOTE If you will be measuring highly reflective devices, such as filters, use the test
device, connected to the reference plane and terminated with a load, for the
isolation standard.

b. Activate at least four times more averages than desired during the device
measurement.

NOTE If loads can be connected to both port 1 and port 2 simultaneously, then the
following step can be performed using the DO BOTH FWD + REV softkey.

c. Press CalRESUME CAL SEQUENCE ISOLATION

FWD ISOL’N ISOL’N STD REV ISOL’N ISOL’N STD ISOLATION DONE .

d. Return the averaging to the original state of the measurement, and press Cal
RESUME CAL SEQUENCE .

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Calibrating for Increased Measurement Accuracy
Full Two-Port Error Correction

17.To compute the error coefficients, press:

DONE 2-PORT CAL
The analyzer displays the corrected measurement trace. The analyzer also shows the
notation Cor at the left of the screen, indicating that error correction is on.

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

18.This completes the full two-port correction procedure. You can connect and measure
your device under test.

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 Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

Power Meter Measurement Calibration

A GPIB-compatible power meter can monitor and correct RF source power to achieve
leveled power at the test port. During a power meter calibration, the power meter samples
the power at each measurement point across the frequency band of interest. The analyzer
then constructs a correction data table to correct the power output of the internal source.
The correction table may be saved in an instrument state register with the SAVE key.
The correction table may be updated on each sweep (in a leveling application) or during an
initial single sweep. In the sample-and-sweep mode the power meter is not needed for
subsequent sweeps. The correction table may be read or modified through GPIB.
Power meter calibration is useful for the following applications:
• when you are testing a system with significant frequency response errors (for example,
a coupler with significant roll-off, or a long cable with a significant amount of loss)
• when you are measuring devices that are very sensitive to actual input power for proper
operation
• when you require a reference for receiver power calibration
The power meter can measure and correct power in two ways:
• continuous correction—each sweep mode
• sample-and-sweep correction—single sweep mode
The time required to perform a power meter calibration depends on the source power,
number of points tested, and number of readings taken. Refer to the “Specifications and
Characteristics” chapter of the reference guide for characteristic power meter calibration
sweep speeds and accuracy.
Regardless of the measurement application, the analyzer's source can only supply
corrected power within the selected power range. If power outside this range is requested,
the annotation will change to PC?.

Loss of Power Meter Calibration Data

The power meter calibration data will be lost by committing any of the following actions:
Turning power off. Turning off the instrument erases the power meter calibration
table.
Changing sweep type. If the sweep type is changed (linear, log, list, CW, power) while
power meter calibration is on, the calibration data will be lost. However, calibration
data is retained if you change the sweep type while power meter calibration is off.
Changing frequency. Power meter calibration data will also be lost if the frequency is
changed in log or list mode, but it is retained in linear sweep mode.
Pressing Preset . Presetting the instrument will erase power meter calibration data.
If the instrument state has been saved in a register using the Save/Recall key, you may
recall the instrument state and the data will be restored. Saving the instrument state
will not protect the data if the instrument is turned off.

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Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

Interpolation in Power Meter Calibration

If the frequency is changed in linear sweep, or the start/stop power is changed in power
sweep, then the calibration data is interpolated for the new range.
If calibration power is changed in any of the sweep types, the values in the power setting
array are increased or decreased to reflect the new power level. Some accuracy is lost when
this occurs.

Entering the Power Sensor Calibration Data

Entering the power sensor calibration data compensates for the frequency response of the
power sensor, thus ensuring the accuracy of power meter calibration.
1. Make sure that your analyzer and power meter are configured. Refer to the “Options
and Accessories” chapter of the reference guide for configuration procedures.
2. Press Cal PWRMTR CAL LOSS/SENSR LISTS CAL FACTOR SENSOR A .
The analyzer shows the notation EMPTY, if you have not entered any segment
information.
3. To create the first segment, press:
ADD FREQUENCY
4. Enter the frequency of a correction factor data point, as listed on the power sensor,
followed by the appropriate key: G/n M/µ k/m .
5. Press CAL FACTOR and enter the correction factor that corresponds to the frequency
that you have entered in the previous step. Complete the correction factor entry by
pressing x1 DONE .
6. Repeat the previous three steps to enter up to 55 frequency segments.
You may enter multiple segments in any order because the analyzer automatically sorts
them and lists them on the display by frequency value. The analyzer also automatically
interpolates the values between correction factor data points.
If you only enter one frequency segment, the analyzer assumes that the single value is
valid over the entire frequency range of the correction.
7. After you have entered all the frequency segments, press DONE .

Editing Frequency Segments

1. Access the Segment Modify menu by pressing Cal PWRMTR CAL

LOSS/SENSR LISTS CAL FACTOR SENSOR A (or CAL FACTOR SENSOR B ,
depending on where the segment is that you want to edit).
2. Identify the segment that you want to edit by pressing SEGMENT and using the
and keys to locate and position the segment next to the pointer (>), shown on the
display. Or press SEGMENT and enter the segment number followed by x1 .
3. Press EDIT and then press either the FREQUENCY or CAL FACTOR key,
depending on which part of the segment you want to edit.

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 Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

❏ If you are modifying the frequency, enter the new value, followed by a G/n , M/µ ,
or k/m key.
❏ If you are modifying the correction factor, enter the new value, followed by the x1
key.
4. Press DONE after you have finished modifying the segment.
5. If you want to edit any other segments, press SEGMENT and follow the previous steps,
starting with step 2.

Deleting Frequency Segments

1. Access the Segment Modify menu by pressing CalPWRMTR CAL

LOSS/SENSR LISTS CAL FACTOR SENSOR A (or CAL FACTOR SENSOR B ,
depending on where the segment is that you want to delete).
2. Identify the segment that you want to delete by pressing SEGMENT and using the
and keys to locate and position the segment next to the pointer (>), shown
on the display. Or press SEGMENT and enter the segment number followed by x1 .
3. Press DELETE .
The analyzer deletes the segment and moves the remainder of the segments up one
number.
4. You could also delete all the segments in a list by pressing CLEAR LIST YES .

5. Press DONE when you are finished modifying the segment list.

Compensating for Directional Coupler Response

If you use a directional coupler to sample power in your measurement configuration, you
should enter the coupled arm power loss value into the power loss table, using the
following procedure. You can enter the loss information in a single segment, and the
analyzer will assume that the value applies to the entire frequency range of the
instrument. Or, you can input actual measured power loss values at several frequencies
using up to 12 segments, enhancing power accuracy.

1. Press Cal PWRMTR CAL LOSS/SENSR LISTS POWER LOSS .

The analyzer shows the notation EMPTY, if you have not entered any segment
information.
2. To create the first segment, press ADD FREQUENCY and enter a frequency of a
correction factor data point, followed by the appropriate key: G/n M/µ k/m .
3. Press LOSS and enter the power loss that corresponds to the attenuation of the
directional coupler (or power splitter) at the frequency that you have entered in the
previous step. Complete the power loss entry by pressing x1 DONE .

6- 35
Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

NOTE Remember to subtract the through arm loss from the coupler arm loss before
entering it into the power loss table, to ensure the correct power at the output
of the coupler.

4. Repeat the previous two steps to enter up to 12 frequency segments, depending on the
required accuracy.
You may enter multiple segments in any order because the analyzer automatically sorts
them and lists them on the display in increasing order of frequency.
If you only enter one frequency segment, the analyzer assumes that the single value is
valid over the entire frequency range of the correction.
5. After you have entered all the segments, press DONE .
6. Press Cal PWRMTR CAL PWR LOSS ON to activate the power loss compensation.

Using Sample-and-Sweep Correction Mode

You can use the sample-and-sweep mode to correct the analyzer output power and update
the power meter correction data table, during the initial measurement sweep. Because the
analyzer measures the actual power at each frequency point during the initial sweep, the
initial sweep time is significant. However, in this mode of operation the analyzer does not
require the power meter for subsequent sweeps. Therefore, this mode sweeps considerably
faster than the continuous correction mode.

Figure 6-10 Sample-and-Sweep Mode for Power Meter Calibration

1. Calibrate and zero the power meter.

2. Connect the equipment as shown in Figure 6-10.

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 Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

3. Select the analyzer as the system controller:

Local

SYSTEM CONTROLLER
4. Set the power meter’s address (“XX” represents the address in the following keystrokes:

SET ADDRESSES

ADDRESS: P MTR/GPIB XX x1

5. Select the appropriate power meter by pressing POWER MTR [ ] until the correct
model number is displayed (436A or 438A/437).

NOTE The E4418B and E4419B power meters have a “437 emulation” mode. This
allows these power meters, with an HP/Agilent 848X-series power sensor, to
be used with the network analyzer. In this step, when selecting a power
meter, choose the 438A/437 selection.

6. Set test port power to the approximate desired corrected power.

7. Press Cal PWRMTR CAL and enter the test port power level that you want at the
input to your test device. For example, if you enter −10 x1 , the display will read CAL
POWER −10.
8. If you want the analyzer to make more than one power measurement at each frequency
data point, press:
NUMBER OF READINGS n x1 , (where n = the number of desired iterations).
If you increase the number of readings, the power meter correction time will
substantially increase.
9. Press Cal PWRMTR CAL ONE SWEEP TAKE CAL SWEEP .

NOTE Because power meter calibration requires a longer sweep time, you may want
to reduce the number of points before pressing TAKE CAL SWEEP . After the
power meter calibration is finished, return the number of points to its original
value and the analyzer will automatically interpolate this calibration. Some
accuracy will be lost for the interpolated points.

The analyzer will use the data table for subsequent sweeps to correct the output power
level at each measurement point. Also, the status annunciator PC will appear on the
analyzer display.

NOTE You can abort the calibration sweep by pressing PWRMTR CAL OFF .

10.Remove the power sensor from the analyzer test port and connect your test device.

6- 37
Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

Using Continuous Correction Mode

You can set the analyzer to update the correction table at each sweep (as in a leveling
application), using the continuous sample mode. When the analyzer is in this mode, it
continuously checks power at every point in each sweep. You must keep the power meter
connected as shown in Figure 6-11. This mode is also known as power meter leveling, and
the speed is limited by the power meter.

NOTE You may level at the input of a device under test, using a 2-resistor power
splitter or a directional coupler before the device; or level at the output of the
device using a 3-resistor power splitter or a bidirectional coupler after the
device.

Figure 6-11 Continuous Correction Mode for Power Meter Calibration

1. Connect a power splitter or directional coupler to the port supplying RF power to your
test device, as shown in Figure 6-11.
2. Set test port power to approximate desired leveled power.
3. Press Cal PWRMTR CAL and enter the test port power level that you want the
analyzer to maintain at the input to your test device. Compensate for the power loss of
the power splitter or directional coupler in the setup.
4. If you want the analyzer to make more than one power measurement at each frequency
data point, press NUMBER OF READINGS n x1 (where n = the number of desired
iterations).
If you increase the number of readings, the power meter correction time will
substantially increase.
5. Press Cal PWRMTR CAL EACH SWEEP TAKE CAL SWEEP to activate the
power meter correction.

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 Calibrating for Increased Measurement Accuracy
Power Meter Measurement Calibration

To Calibrate the Analyzer Receiver to Measure Absolute Power

You can use the power meter calibration as a reference to calibrate the analyzer receiver to
accurately measure absolute power. The following procedure shows you how to calibrate
the receiver to any power level.
1. Set the analyzer test port power to the desired level:
Power (enter power level) x1
2. Connect the power sensor to the analyzer test port 1.
3. To apply the one sweep mode, press:
Cal PWRMTR CAL (enter power level) x1 ONE SWEEP TAKE CAL SWEEP

NOTE Because power meter calibration requires a longer sweep time, you may want
to reduce the number of points before pressing TAKE CAL SWEEP . After the
power meter calibration is finished, return the number of points to its original
value and the analyzer will automatically interpolate this calibration.

The status notation PC will appear on the analyzer display. Port 1 is now a calibrated
source of power.
4. Connect the test port 1 output to the test port 2 input.
5. Choose a non-ratioed measurement by pressing:
Meas INPUT PORTS B TEST PORT 1
This sets the source at PORT 1, and the measurement receiver to PORT 2, or input port
B.
6. To perform a receiver error correction, press:
Cal CALIBRATE MENU RECEIVER CAL (enter power level) x1
TAKE RCVR CAL SWEEP
The receiver channel now measures power to a characteristic accuracy of 0.35 dB or
better. The accuracy depends on the match of the power meter, the source, and the
receiver.

6- 39
Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Calibrating for Noninsertable Devices

A test device that cannot be connected directly into a transmission test configuration is
considered to be noninsertable.
Some examples of noninsertable test devices are:
• a fixture with two female SMA connectors, or a cable with two male type-N connectors.
• an adapter with SMA male and type-N female (or any combination connector type and
sex).
Therefore, one of the following calibration methods must be performed:
• adapter removal (ES analyzers only)
• matched adapters
• modify the cal kit thru definition

Figure 6-12 Noninsertable Device

6-40
 Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Adapter Removal Calibration (ES Analyzers Only)

Adapter removal calibration provides the most complete and accurate procedure for
measuring noninsertable devices.
The following adapters are needed:
• Adapter A1, which mates with port 1 of the device, must be installed on test set port 1.
• Adapter A2, which mates with port 2 of the device, must be installed on test set port 2.
• Adapter A3 must match the connectors on the device under test (DUT).

NOTE Adapter A1 and Adapter A2 become part of the test setup to allow connection
to the DUT. Adapter A3 is used during calibration only. Its effects will be
removed.

Figure 6-13 Adapters Needed

Other requirements include:

• Calibration standards for performing a 2-port error correction for each connector type.
Only recognized cal kit standards are available. SSMA, SMX, GPO and similar
connectors have no recognized traceable cal kit standards.
• Specified electrical length of adapter A3 within ± 1/4 wavelength for the measurement
frequency range.
For each port, a separate 2-port error correction is performed,the first at the connection
between A1 and A3, and the second at the connection between A2 and A3. The error
coefficients are stored in separate calibration sets. After these calibrations, the two
calibration sets are combined and, with knowledge of the electrical length of the adapter
A3, a separate third calibration set is created. This cal set contains error coefficients that
accurately represent the characteristics of Port 1 and Port 2, as if A1 and A2 were actually
connected together to measure forward and reverse match and tracking terms.

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Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Perform the 2-Port Error Corrections

1. Check the firmware to see if your revision supports adapter removal calibration by
pressing:
Cal MORE ADAPTER REMOVAL HELP ADAPT REMOVAL
2. Determine the delay of adapter A3.
a. Refer to Figure 6-14 while performing the steps in this procedure. Also refer to
page 6-41 for an explanation of A1, A2, and A3.
b. Perform a 1-port calibration at “Reference Port 1”. Refer to Step A of Figure 6-14.

Figure 6-14 Determining the Electrical Delay Setup

c. Connect the A3 adapter to "Reference Port 1" as shown in Step B of Figure 6-14.
Attach the short (from the calibration kit for port 2) to the other end of the adapter.
You must know the delay of the short. The delay of the short can be found in the
calibration kit that you are using. Typical delays of shorts are 31.7 ps for the short
from the 85052D calibration kit and 31.8 ps for the short from the 85033D
calibration kit.
d. Measure the delay of the adapter and short together by pressing Format DELAY .
e. Divide the resulting delay measurement by 2 to determine the delay of the thru and
the short in one direction.
f. Subtract the offset delay of the short (determined in step c) from the delay of the thru
and the short in one direction (determined in step e). The result is the electrical
delay of the thru. This value is used in the Step 12.
g. Remove the short from the adapter.

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 Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

NOTE You must use the floppy disk to store the following calibrations. Select the
floppy disk by pressing Save/Recall SELECT DISK INTERNAL DISK.

3. Connect adapter A3 (same sex and connector type as the DUT) to adapter A2 on port 2
as shown in Figure 6-15.

Figure 6-15 Two-Port Cal Set 1

4. Perform a full 2-port calibration between ports 1 and 2 using calibration standards
appropriate for the connector type at port 1 (the connector type for adapter A1). Save
the calibration by selecting Save/Recall SAVE STATE . Name the file "PORT1."
5. Connect adapter A3 to adapter A1 on port 1 as shown in Figure 6-16.

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Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Figure 6-16 Two-Port Cal Set 2

6. Perform a full 2-port calibration between ports 1 and 2 using calibration standards
appropriate for the connector type at port 2 (the connector type for adapter A2). Save
the calibration by selecting Save/Recall SAVE STATE . Name the file "PORT2."

NOTE In the following steps, calibration data is recalled, not instrument states.

7. Press Cal MORE ADAPTER REMOVAL RECALL CAL SETS .

8. Turn the knob to select the file that contains the port 1 calibration data (where adapter
A3 was on port 2).
9. Press RECALL CAL PORT 1 .
10.Turn the knob to select the file that contains the port 1 calibration data (where adapter
A3 was on port 1).
11.Press RECALL CAL PORT 2 RETURN.
12.Press ADAPTER DELAY . Enter the delay value of the adapter from step 2f. Select the
appropriate type: ADAPTER COAX or ADAPTER WAVEGUIDE .
13.Press REMOVE ADAPTER to complete the technique for calculating the new
coeffiecients and overwrite the current active calibration set in use.
This process uses up an internal memory register. The calibration in this register is not
the calibration created by adapter removal, rather it is a "scratch" calibration. You may
wish to delete the register, or re-save the new calibration in this register (step 14).
14.Press Save/Recall SELECT DISK INTERNAL MEMORY RETURN and
SAVE STATE . You can now remove the adapter from the test setup and insert the
DUT.

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 Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Figure 6-17 Calibrated Measurement

Verify the Results

Since the effect of the adapter has been removed, it is easy to verify the accuracy of the
technique by simply measuring the adapter itself. Because the adapter was used during
the creation of the two cal sets, and the technique removes its effects, measurement of the
adapter itself should show the S-parameters.
If unexpected phase variations are observed, this indicates that the electrical delay of the
adapter was not specified within a quarter wavelength over the frequency range of
interest. To correct this, recall both cal sets, since the data was previously stored to disk,
change the adapter delay, and press REMOVE ADAPTER .
Your analyzer’s programmer’s guide contains an example program that demonstrates the
adapter removal process over GPIB.

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Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Matched Adapters
With this method, you use two precision matched adapters which are "equal." To be equal,
the adapters must have the same match, Z0, insertion loss, and electrical delay. The
adapters in most Agilent calibration kits have matched electrical length, even if the
physical lengths appear different.

Figure 6-18 Calibrating for Noninsertable Devices

To use this method, refer to Figure 6-18 and perform the following steps:
1. Perform a transmission calibration using the first adapter.
2. Remove adapter A, and place adapter B on port 2. Adapter B becomes the effective test
port.
3. Perform a reflection calibration.
4. Measure the test device with adapter B in place.
The errors remaining after calibration with this method are equal to the differences
between the two adapters that are used.

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 Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

Modify the Cal Kit Thru Definition

With this method, it is only necessary to use a thru adapter. The calibration kit thru
definition is modified to compensate for the adapter and then saved as a user kit. However,
the electrical delay of the adapter must first be found. The adapter match will degrade the
effective load match terms on both ports as well as degrade the transmission frequency
response (tracking).
1. Refer to Figure 6-19 while performing the steps in this procedure. Also refer to
page 6-41 for an explanation of A1, A2, and A3.
2. Perform a 1-port calibration at “Reference Port 1”. Refer to Step A of Figure 6-19.

Figure 6-19 Determining the Electrical Delay Setup

3. Connect the A3 adapter to “Reference Port 1” as shown in Step B of Figure 6-19.

Connect a short to the open end of the A3 adapter.
4. Measure the delay of the adapter by pressing Format DELAY .
5. Divide the resulting delay measurement by 2 to determine the delay of the thru and the
short in one direction.
6. Determine the offset delay of the calibration short by examining the define standard
menu (see "Define Standard Menus" on page 7-58).
7. Subtract the offset delay of the short (determined in step 6) from the delay of the thru
and the short in one direction (determined in step 5). The result is electrical delay of the
thru. This value is used in the next step.

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Calibrating for Increased Measurement Accuracy
Calibrating for Noninsertable Devices

8. Modify the calibration kit thru definition by entering in the electrical delay of adapter
A3. Save this as a user kit.
For example, if A3 has 100 ps of delay, press:
Cal CAL KIT MODIFY DEFINE STANDARD 4 x1

MODIFY STD DEFINITION SPECIFY OFFSET OFFSET DELAY 0.100 G/n

STD DONE (DEFINED) RETURN KIT DONE (MODIFIED) SAVE USER KIT
9. Perform the desired calibration with this new user kit.
10.Connect the test device as shown in Figure 6-17 and measure the device.

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 Calibrating for Increased Measurement Accuracy
Minimizing Error When Using Adapters

Minimizing Error When Using Adapters

To minimize the error introduced when you add an adapter to a measurement system, the
adapter needs to have low SWR or mismatch, low loss, and high repeatability.

Figure 6-20 Adapter Considerations

In a reflection measurement, the directivity of a system is a measure of the error

introduced by an imperfect signal separation device. It typically includes any signal that is
detected at the coupled port which has not been reflected by the test device. This
directivity error will add with the true reflected signal from the device, causing an error in
the measured data. Overall directivity is the limit to which a device’s return loss or
reflection can be measured. Therefore, it is important to have good directivity to measure
low reflection devices.
For example, a coupler has a 7 mm connector and 40 dB directivity, which is equivalent to
a reflection coefficient of ρ = 0.01 directivity in dB = −20 log (ρ). Suppose we want to
connect to a device with an SMA male connector. We need to adapt from 7 mm to SMA.
If we choose a precision 7 mm to SMA adapter with a SWR of 1.06, which has ρ=0.03, the
overall directivity becomes ρ=0.04 or 28 dB. However, if we use two adapters to do the
same job, the reflection from each adapter adds up to degrade the directivity to 17 dB. The
last example, shown in Figure 6-20, uses three adapters that shows an even worse
directivity of 14 dB. It is clear that a low SWR is desirable to avoid degrading the
directivity of the system.

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Calibrating for Increased Measurement Accuracy
Making Non-Coaxial Measurements

Making Non-Coaxial Measurements

Non-coaxial, on-wafer measurements present a unique set of challenges for error
correction in the analyzer:
• The close spacing between the microwave probes makes it difficult to maintain a high
degree of isolation between the input and the output.
• The type of device measured on-wafer is often not always a simple two-port.
• It may be difficult to make repeatable on-wafer contacts due to the size of the device
contact pads.
The capability of making non-coaxial measurements is available with TRL*
(thru-reflect-line) or LRM* (line-reflect-match) calibration. For in-depth information on
TRL*/LRM* calibration, refer to "Calibrating for Non-Coaxial Devices" on page 6-52.
Due to the simplicity of the calibration standards, TRL* or LRM* calibrations may be used
for non-coaxial applications such as on-wafer measurements. This type of calibration with
time-domain gating and a variety of probe styles can provide optimal accuracy in on-wafer
measurements. At frequencies where on-wafer calibration standards are available,
short-open-load-thru (SOLT) calibrations can also be done and may be preferred due to the
better accuracy of the SOLT calibration method.

Fixtures
Fixtures are needed to interface non-coaxial devices to coaxial test instruments. It may
also be necessary to transform the characteristic impedance from standard 50 Ω
instruments to a non-standard impedance and to apply bias if an active device is being
measured.
For accurate measurements, the fixture must introduce minimum change to the test
signal, not destroy the test device, and provide a repeatable connection to the device.
For information about test fixtures for your measurement systems, ask for literature
number 5962-9723E or contact: Inter-Continental Microwave, 1515 Wyatt Drive, Santa
Clara, CA 95054, USA (Web site: http://www.icmicrowave.com).

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 Calibrating for Increased Measurement Accuracy
Making Non-Coaxial Measurements

If You Want to Design Your Own Fixture

Ideally, a fixture should provide a transparent connection between the test instrument and
the test device. This means it should have no loss or electrical length and a flat frequency
response, to prevent distortion of the actual signal. A perfect match to both the instrument
and the test device eliminates reflected test signals. The signal should be effectively
coupled into the test device, rather than leaking around the device and resulting in
crosstalk from input to output. Repeatable connections are necessary to ensure consistent
data.
Realistically, it is impossible to build an ideal fixture, especially at high frequencies.
However, it is possible to optimize the performance of the test fixture relative to the
performance of the test device. If the fixture’s effects on the test signal are relatively small
compared to the device’s parameters, then the fixture’s effects can be assumed to be
negligible.
For example, if the fixture’s loss is much less than the acceptable measurement
uncertainty at the test frequency, then it can be ignored.
For additional information about fixtures, refer to Agilent Technologies Application Note
1287-9, “In-Fixture Measurements Using Vector Network Analyzers,” literature number
5968-5329E.

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Calibrating for Increased Measurement Accuracy
Calibrating for Non-Coaxial Devices

Calibrating for Non-Coaxial Devices

The analyzer has the capability of making calibrations using the TRL*/LRM* method.
TRL* and LRM* are implementations of the thru-reflect-line and line-reflect-match
calibrations, modified for the three-sampler receiver architecture in the analyzer.

TRL Error Correction

Create a User-Defined TRL Calibration Kit

In order to use the TRL technique, the calibration standards characteristics must be
entered into the analyzer’s user defined calibration kit.
The following steps show you how to define a calibration kit to utilize a set of TRL (THRU,
REFLECT, LINE) standards. This example TRL kit contains the following:
• zero length THRU
• "flush" short for the REFLECT standard (0 second offset)
• 50 ohm transmission line with 80 ps of offset delay for the LINE
Modify the Standard Definitions
1. Press the following keys to start modifying the standard definitions:
Preset Cal CAL KIT MODIFY DEFINE STANDARD

2. To select a short, press 1 x1 . (In this example, the REFLECT standard is a

SHORT .)
3. Press the following keys:

SHORT MODIFY STD DEFINITION SPECIFY OFFSET OFFSET DELAY 0

x1 STD OFFSET DONE STD DONE (DEFINED)
4. To define the THRU/LINE standard, press:

DEFINE STANDARD 4
DELAY/THRU x1 MODIFY STD DEFINITION
SPECIFY OFFSET OFFSET DELAY 0 x1 STD OFFSET DONE
STD DONE (DEFINED)
5. To define the LINE/MATCH standard, press:

DEFINE STANDARD 6 x1
DELAY/THRU MODIFY STD DEFINITION
SPECIFY OFFSET OFFSET DELAY .08 G/n MAXIMUM FREQUENCY
Enter a frequency greater than the maximum frequency range of the analyzer. For
example, press 10 G/n . Then, press STD OFFSET DONE .
6. For the purposes of this example, change the name of the standard by pressing
LABEL STD and modifying the name to "LINE."

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Calibrating for Non-Coaxial Devices

7. When the title area shows the new label, press:

DONE STD DONE (DEFINED)
Assign the Standards to the Various TRL Classes
8. To assign the calibration standards to the various TRL calibration classes, press:
Cal CAL KIT MODIFY SPECIFY CLASS MORE MORE TRL REFLECT
9. Since you previously designated standard #1 for the REFLECT standard, press:
1 x1
10.Since you previously designated standard #6 for the LINE/MATCH standard, press:

TRL LINE OR MATCH 6 x1

11.Since you previously designated standard #4 for the THRU/LINE standard, press:

TRL THRU 4 x1
12.To complete the specification of class assignments, press:
SPECIFY CLASS DONE
Label the Classes

NOTE To enter the following label titles, an external keyboard may be used for
convenience.

13.Press LABEL CLASS MORE MORE .

14.Change the label of the "TRL REFLECT" class to "TRLSHORT."
15.Change the label of the "TRL LINE OR MATCH" class to "TRLLINE."
16.Change the label of the "TRL THRU" class to "TRLTHRU."
17.Press LABEL CLASS DONE .
Label the Calibration Kit
18.Press LABEL KIT and create a label up to 8 characters long. For this example, enter
"TRL KIT1" DONE.
19.To save the newly defined kit into nonvolatile memory, press:
KIT DONE (MODIFIED) SAVE USER KIT

NOTE Refer to "Saving Modified Calibration Kits to a Disk" on page 7-65 for
information about saving modified calibration kits, along with calibration
data and instrument states, to a disk.

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Calibrating for Increased Measurement Accuracy
Calibrating for Non-Coaxial Devices

Perform the TRL Calibration

1. Press Cal CAL KIT SELECT CAL KIT USER KIT RETURN RETURN
CALIBRATE MENU TRL*/LRM* 2-PORT .
2. To measure the "TRL THRU," connect the "zero length" transmission line between the
two test ports.
3. To make the necessary four measurements, press THRU THRU .
4. To measure the "TRL SHORT," connect the short to PORT 1, and press:
S11 REFL: TRLSHORT
5. Connect the short to PORT 2 and press S22 REFL: TRLSHORT .
6. To measure the "TRL LINE," disconnect the short and connect the TRL line from PORT
1 to PORT 2.
7. Press LINE/MATCH DO BOTH FWD+REV .
8. The line data is measured and the LN/MATCH1 LINE and LN/MATCH2 LINE softkey
labels are underlined.
9. To measure the "ISOLATION" class, press ISOLATION .
❏ You could choose not to perform the isolation measurement by pressing
OMIT ISOLATION DONE TRL/LRM .

NOTE You should perform the isolation measurement when the highest dynamic
range is desired. To perform the best isolation measurements, you should
reduce the system bandwidth or activate the averaging function.
A poorly measured isolation class can actually degrade the overall
measurement performance. If you are in doubt of the isolation measurement
quality, you should omit the isolation portion of this procedure.

NOTE If loads can be connected to both port 1 and port 2 simultaneously, then the
following measurement can be performed using the DO BOTH FWD+REV
softkey.

10.Connect a load to PORT 2, and press REV ISOL’N ISOL’N STD .

11.Connect the load to PORT 1, and press FWD ISOL’N ISOL’N STD
ISOLATION DONE .
12.You may repeat any of the previous steps. There is no requirement to go in the order of
steps. When the analyzer detects that you have made all the necessary measurements,
the message line will show PRESS ’DONE’ IF FINISHED WITH CAL. Press
DONE TRL/LRM .
The message COMPUTING CAL COEFFICIENTS will appear, indicating that the analyzer is
performing the numerical calculations of error coefficients.

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 Calibrating for Increased Measurement Accuracy
Calibrating for Non-Coaxial Devices

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

13.Connect the device under test. The device S-parameters are now being measured.

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Calibrating for Increased Measurement Accuracy
LRM Error Correction

LRM Error Correction

Create a User-Defined LRM Calibration Kit

In order to use the LRM technique, the calibration standards characteristics must be
entered into the analyzer’s user defined calibration kit.
The following steps show you how to define a calibration kit to utilize a set of LRM (LINE,
REFLECT, MATCH) standards. This example LRM kit contains the following:
• zero length LINE
• "flush" short for the REFLECT standard (0 second offset)
• 50 ohm termination for the MATCH (infinite length line)

NOTE LRM with a zero length line is sometimes referred to as TRM (THRU,
REFLECT, MATCH).

Modify the Standard Definitions

1. Press the following keys to start modifying the standard definitions:
Preset Cal CAL KIT MODIFY DEFINE STANDARD

2. To select a short, press 1 x1 . (In this example, the REFLECT standard is a

SHORT.)
3. Press the following keys:

SHORT MODIFY STD DEFINITION SPECIFY OFFSET OFFSET DELAY 0

x1 STD OFFSET DONE STD DONE (DEFINED)
4. To define the THRU/LINE standard, press:

DEFINE STANDARD 4 x1
DELAY/THRU MODIFY STD DEFINITION
SPECIFY OFFSET OFFSET DELAY 0 x1 STD OFFSET DONE
STD DONE (DEFINED)
5. To define the LINE/MATCH standard, press:

DEFINE STANDARD 3 x1 LOAD

6. For the purposes of this example, change the name of the standard by pressing
MODIFY STD DEFINITION LABEL STD ERASE TITLE , if a previous title exists,
and then modify the name to "MATCH".
7. When the title area shows the new label, press:
DONE STD DONE (DEFINED)

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 Calibrating for Increased Measurement Accuracy
LRM Error Correction

Assign the Standards to the Various LRM Classes

8. To assign the calibration standards to the various TRL calibration classes, press:
Cal CAL KIT MODIFY SPECIFY CLASS MORE MORE TRL REFLECT
9. Since you previously designated standard #1 for the REFLECT standard, press:
1 x1
10.Since you previously designated standard #3 for the LINE/MATCH standard, press:

TRL LINE OR MATCH 3 x1

11.Since you previously designated standard #4 for the THRU/LINE standard, press:

TRL THRU 4 x1
12.To complete the specification of class assignments, press:
SPECIFY CLASS DONE
Label the Classes

NOTE To enter the following label titles, an external keyboard may be used for
convenience.

13.Press LABEL CLASS MORE MORE .

14.Change the label of the "TRL REFLECT" class to "LRMSHORT."
15.Change the label of the "TRL LINE OR MATCH" class to "LRMLOAD."
16.Change the label of the "TRL THRU" class to "LRMTHRU."
17.Press LABEL CLASS DONE .
Label the Calibration Kit
18.Press LABEL KIT and create a label up to 8 characters long. For this example, enter
"LRM KIT1" and press DONE .
19.To save the newly defined kit into nonvolatile memory, press:
KIT DONE (MODIFIED) SAVE USER KIT

NOTE Refer to "Saving Modified Calibration Kits to a Disk" on page 7-65 for
information about saving modified calibration kits, along with calibration
data and instrument states, to a disk.

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LRM Error Correction

Perform the LRM Calibration

1. You must have a LRM calibration kit defined and saved in the USER KIT, as shown in
"Modifying Calibration Kits" on page 7-56.

NOTE This must be done before performing the following sequence.

2. Press Cal CAL KIT SELECT CAL KIT USER KIT RETURN RETURN
CALIBRATE MENU TRL*/LRM* 2-PORT .
3. To measure the "LRM THRU," connect the "zero length" transmission line between the
two test ports.
4. To make the necessary four measurements, press:
LRMTHRU
5. To measure the "LRM SHORT," connect the short to PORT 1, and press:
S11 REFL LRMSHORT
6. Connect the short to PORT 2, and press:
S22 REFL LRMSHORT

NOTE If loads can be connected to both port 1 and port 2 simultaneously, then the
following LRM load measurement can be performed using the
DO BOTH FWD+REV softkey.

7. To measure the "LRM LOAD," disconnect the short and connect the LRM load to
PORT1.
8. Press LINE/MATCH LN/MATCH1 LOAD to access the No Loads menu. When the
displayed trace settles, press the softkey corresponding to the load used. If a sliding load
is used, press SLIDING to access the Sliding Load menu. Position the slide and press
SLIDE IS SET .
9. When all the appropriate load measurements are complete, the load data is measured
and the LN/MATCH1 LOAD softkey label is underlined.
10.Connect the load to PORT 2 and press LN/MATCH2 LOAD .
11.Repeat the previous LRM load measurement steps for PORT 2.
12.After the measurement is complete, press:
DONE LINE/MATCH
13.To measure the "ISOLATION" class, press:
ISOLATION
❏ You could choose not to perform the isolation measurement by pressing
OMIT ISOLATION DONE TRL/LRM .

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 Calibrating for Increased Measurement Accuracy
LRM Error Correction

NOTE You should perform the isolation measurement when the highest dynamic
range is desired.

To perform the best isolation measurements, you should reduce the system
bandwidth or activate the averaging function.
A poorly measured isolation class can actually degrade the overall
measurement performance. If you are in doubt of the isolation measurement
quality, you should omit the isolation portion of this procedure.

14.You may repeat any of the previous steps. There is no requirement to go in the order of
steps. When the analyzer detects that you have made all the necessary measurements,
the message line will show PRESS ’DONE’ IF FINISHED WITH CAL. Press
DONE TRL/LRM .
The message COMPUTING CAL COEFFICIENTS will appear, indicating that the analyzer is
performing the numerical calculations of error coefficients.

NOTE You can save or store the measurement correction to use for later
measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving
Measurement Results” for procedures.

15.Connect the device under test. The device S-parameters are now being measured.

NOTE When making measurements using the same port with uncoupled channels,
the power level for each channel must fall within the same power range
setting of that single port. An error message will be displayed if you enter two
power levels that do not fall within the same power range.

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Calibrating for Increased Measurement Accuracy
Calibrating Using Electronic Calibration (ECal)

Calibrating Using Electronic Calibration (ECal)

This section describes Electronic Calibration (ECal).
Use the following steps to perform the calibration.
1. Set up the measurement for which you are calibrating. Refer to “Set Up the
Measurement.”
2. Connect the ECal equipment. Refer to "Connect the ECal Equipment" on page 6-61.
3. Select the ECal options. Refer to "Select the ECal Options" on page 6-62.
4. Perform the calibration. Refer to "Perform the Calibration" on page 6-64.
5. Perform the confidence check. Refer to "Perform the Confidence Check" on page 6-67.

Set Up the Measurement

1. Press Preset .
2. Select the type of measurement you want to make.
❏ If you want to make a reflection measurement on PORT 1 (in the forward direction,
S11), leave the instrument default setting or press:

Meas Refl: FWD S11 (A/R)

❏ If you want to make a transmission measurement in the forward direction (S21),
press:
Meas Trans: FWD S21 (B/R)
❏ If you want to make a transmission measurement in the reverse direction (S12),
press:
Meas Trans: REV S12 (A/R)
❏ If you want to make a reflection measurement on PORT 2 (in the reverse direction,
S22), press:

Meas Refl: REV S22 (B/R)

3. Set any other measurement parameters that you want for the device measurement:
frequency, span, power, sweep type, number of points, or IF bandwidth.

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Connect the ECal Equipment

1. Connect the power supply to the PC interface unit. Refer to Figure 6-21.

Figure 6-21 ECal Setup

2. Connect the power supply to the ac source.

3. Connect one end of a DB25 cable to the Parallel Port connector on the rear of the
network analyzer. Connect the other end of the DB25 cable to the connector on the PC
interface unit labeled "DB25 Interface to Parallel Interface on Personal Computer."

CAUTION Only connect the DB25 cable to the Parallel Port connector of the network
analyzer.
If the cable is connected to the Test Set - I/O Interconnect connector, damage
to the PC interface unit could occur.

NOTE For steps 3 through 5, use the three DB25 cables (part number 8120-8710)
shipped with the 85097A Electronic Calibration System. Other cables may
not give reliable results.

4. Connect one end of a DB25 cable to the connector on the PC interface unit labeled
"DB25 Interface to ECal Module A." Connect the other end of the DB25 cable to the
parallel cable connector on the ECal module.

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5. If you need to calibrate with a second ECal module, connect one end of another DB25
cable to the connector on the PC interface unit labeled "DB25 Interface to ECal
Module B". Connect the other end of the DB25 cable to the parallel cable connector on
the ECal module.

NOTE Why Use a Second ECal Module?

If the frequency span of the measurement that you set up earlier exceeds the
span of a single ECal module, you need to use another ECal module whose
frequency range allows the rest of the measurement span to be calibrated.
The frequency range of the ECal modules is listed in the “General
Information” chapter of the 85097A Electronic Calibration System User's
Guide.

6. Using an RF cable (or a microwave cable, as appropriate), connect one port of the ECal
module to test port 1 of the analyzer. Refer to Figure 6-21.

CAUTION RF ECal modules can be damaged if you apply excessive torque to the
connectors. Do not exceed the recommended torque indicated in the
Electronic Calibration Module Reference Guide (part number 85091-90009).

NOTE It is not critical which ECal module port (Port A or Port B) is connected to the
network analyzer test ports. The network analyzer detects where each ECal
module port is connected and uses the appropriate module data. If Port A is
connected to Port 1 of the analyzer, the calibration will be performed slightly
faster.

7. Using an RF cable (or a microwave cable, as appropriate), connect the other port of the
ECal module to test port 2 of the analyzer.

Select the ECal Options

In addition to the standard ECal method, there are two options that you may want to use
when performing the electronic calibration. They are:
• ECal using a manual thru
Calibration using a manual thru is more accurate than calibrating using the thru
internal to the ECal module. (A zero-length thru is created by connecting the two test
port cables together.) The improved loss of the manual thru compared to the ECal
module's thru, increases the accuracy of other error terms in the correction. The
accuracy of the overall calibration is improved. Manual thrus can only be used with
ECal modules having connectors of the opposite sex.

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• ECal using isolation averaging

During the isolation measurement portion of ECal, you are actually measuring
instrument crosstalk. Typically, the data during this measurement is near the noise
floor. (See also "Omitting Isolation Calibration" on page 6-4.)
When the crosstalk is near (or in) the noise floor, one way to reduce the noise is to turn
on the isolation averaging. When the random noise of the instrument is averaged, its
magnitude declines. As the energy of the trace is averaged, the displayed data becomes
smoother. When the random noise is reduced, the network analyzer display shows the
non-random crosstalk data.

NOTE If you are performing an ECal using two modules, selecting either option sets
up the option to be performed with both modules.

To Select the Manual Thru Calibration Option

1. To select the manual thru calibration option, press Cal ECal MENU
CONFIGURE [ ] .

2. Press MAN’L THRU on OFF until ON is selected.

3. Press RETURN .
4. Continue with step 2 of "Perform the Calibration" on page 6-64.

To Select the Isolation Calibration Option

1. To select the isolation calibration option, press Cal ECal MENU CONFIGURE [ ] .

2. Press OMIT ISOLATION ON off until OFF is selected.

The isolation measurement is normally off. Therefore, the default setting for the
OMIT ISOLATION ON off softkey is ON. When isolation is not omitted
( OMIT ISOLATION on OFF ), isolation standards are measured.
ISOLATION on OFF
3. Press ISOLATION AVERAGES , enter the isolation averages numeric value on the
AVERAGES
front panel keypad, and then press x1 .

NOTE The isolation averaging default is set to take 10 sweeps. This isolation
averaging value is less than the network analyzer default sweep averaging
value of 16.

4. Press RETURN .
5. Continue with step 2 of “Perform the Calibration.”

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Calibrating Using Electronic Calibration (ECal)

Perform the Calibration

1. Press Cal ECal MENU .
When ECal is first selected (or when you select module A or module B), there is a small
initial delay so that the network analyzer can detect and download the calibration
information from the internal memory of the ECal module.
2. Press MODULE A b so that A is selected.

NOTE If you are calibrating with two modules, the overlapping frequency span will
be determined by the second module. Therefore, if you want to use the
calibration data of Module A in the overlapping frequency span, calibrate
using Module B first, and then calibrate using Module A.

3. Press the ECal calibration selection.

• The calibration choices are:

— S11 1-PORT performs a measurement calibration for reflection-only. Measures

of one-port devices or properly terminated two-port devices, at port 1 of an
S-parameter test set.
— S22 1-PORT performs a measurement calibration for reflection-only. Measures
of one-port devices or properly terminated two-port devices, at port 2 of an
S-parameter test set.
— FULL 2-PORT performs a complete calibration for measurement of all four
S-parameters of a two-port device. This is the most accurate calibration for
measurements of two-port devices.
— S11/S21 ENH. RESP. performs an S11 and S21 enhanced response calibration
(forward direction). Enhanced response generates a 1-port cal for S11 and an
improved calibration over the response cal for S21.
— S22/S12 ENH. RESP. performs an S22 and S12 enhanced response calibration
(reverse direction). Enhanced response generates a 1-port cal for S22 and an
improved calibration over the response cal for S12.
Once the ECal calibration selection is made, the network analyzer performs the
calibration.
4. If you selected the manual thru calibration option, when the prompt is displayed,
remove the ECal module from the setup and connect the manual thru (the two test
ports connected together) as shown in Figure 6-22.

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 Calibrating for Increased Measurement Accuracy
Calibrating Using Electronic Calibration (ECal)

Figure 6-22 Manual Thru Setup

5. After you connect the manual thru, press CONTINUE ECal to complete the manual
thru portion of the ECal.
6. If you are calibrating using two ECal modules, a prompt is displayed directing you to
remove the first module and connect the second module. Follow this prompt as shown in
Figure 6-23.

Figure 6-23 Connect the Second ECal Module

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Calibrating for Increased Measurement Accuracy
Calibrating Using Electronic Calibration (ECal)

7. After you connect the second ECal module, press CONTINUE ECal to continue the
ECal.
8. Repeat steps 4 and 5 if you selected to calibrate using the manual thru option.
9. Review the displayed calibration results. Refer to "Perform the Confidence Check" on
page 6-67.
10.Save the calibration results by pressing Save/Recall .

Display the Module Information

Display information about the module by pressing Cal ECal MENU CONFIGURE [ ]
MODULE INFO .
A text window is displayed that contains the following information about the selected
module.
1 PC interface unit port to which it is connected 6 Number of measurement points

2 Model number 7 Start (minimum) frequency

3 Serial number 8 Stop (maximum) frequency

4 Connector type 9 Suggested warmup time

5 Date of last certification 10 Warmup status (This is the remaining time

on an internal analyzer timer. The timer
simply counts down the recommended ECal
module warm-up time. When the timer
reaches zero, a message is displayed
indicating that the ECal module is ready. The
ECal module temperature or status is not
read. The timer is reset when the analyzer is
powered up or preset or when a new module
is attached.)

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Perform the Confidence Check

The confidence check is a means of visually checking the quality of the calibration. The
confidence check displays the currently measured data (DATA trace) and the
factory-premeasured data (MEM trace) for the module’s confidence state. The confidence
state, an independent reference standard, was not used for the calibration. For a good
calibration measurement, there should be no significant difference between the traces (see
Figure 6-24).

To Perform the Confidence Check

NOTE A confidence check is only valid after an ECal has been performed.

1. Press Cal ECal MENU CONFIGURE [ ] .

2. Press MODULE A b until the correct module (A or B) is selected.

3. Select CONFIDENCE CHECK to display the confidence check and the ECal
Confidence Menu.
4. Press PARAMETER [ ] until the S-parameter that you want to view is displayed.
Pressing the PARAMETER [ ] softkey toggles between the S11, S21, S12, and S22
calibration traces. The confidence check will only display the S-parameter calibration
data for which you calibrated. Uncalibrated S-parameter data traces are invalid. The
memory trace still displays the module’s factory-premeasured trace.
For example,
If you performed: You can view:
A 1-port calibration Only one calibrated S-parameter

• S11 1-PORT

• S22 1-PORT

An enhanced response calibration Only two calibrated S-parameters, one

at a time
• S11/S21 ENH. RESP.

• S22/S12 ENH. RESP.

A full 2-port calibration All four calibrated S-parameters, one

at a time
• FULL 2-PORT

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Calibrating for Increased Measurement Accuracy
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5. Press TRACE TYPE [ ] until the calibration confidence check trace that you want to
view is displayed.
Pressing the TRACE TYPE [ ] softkey toggles between the five trace-type display
options. The confidence check can display the measured ECal results (DATA) and the
premeasured calibration data (MEM) in following five ways.
• DATA&MEM displays two traces representing the measured ECal results and
module's premeasured calibration data trace.
• DATA/MEM displays a single trace representing the ratio of the measured ECal
results to the module's premeasured calibration data.
• DATA-MEM displays a single trace representing the difference between the
measured ECal results and the module's premeasured calibration data.
• DATA displays a single trace representing only the measured ECal results.
• MEM displays a single trace representing only the module's premeasured
calibration data.
6. If you want to change the scale of the display, press AUTO SCALE .
The AUTO SCALE softkey is located in this menu for convenience in viewing the
confidence check data. It acts the same as AUTO SCALE under the Scale Ref key.
7. Review the confidence check display.

Figure 6-24 Confidence Check Display showing DATA&MEM Trace Type

8. If you want to check other calibration S-parameters or trace types, repeat steps 4
through 7.
9. When finished, select RETURN to complete the confidence check.

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 Calibrating for Increased Measurement Accuracy
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Investigating the Calibration Results Using the ECal Service Menu

CAUTION The confidence check described in the previous section displays the ECal data
of a single state. This confidence state is a calibrated standard not used
during ECal. It is provided to give an independent assessment of the quality
of a calibration. In the Ecal Service menu, you may also display each of the
calibration standards which are used during an ECal calibration, along with
the analyzer’s measurement of those standards.
You may notice a difference in measurement results when comparing ECal
confidence state data and ECal standard state data. This result may be
related to certain measurement errors with the network analyzer system,
which add uncertainty to measurement results. More detailed information
regarding measurement uncertainty is documented in the “Determining
System Measurement Uncertainties” chapter of the network analyzer's
reference guide. Additional information on improving your measurements
can be found in Chapter 5 , “Optimizing Measurement Results.”

Using the ECal Service menu is not a standard part of the ECal procedure. It is a tool to
allow you to identify problems in the calibration equipment, cables, connectors, or
procedures.
The Confidence Check menu supports the comparison of the measured data versus the
module's premeasured calibration data for the confidence state. The ECal Service menu
supports the comparison of the measured data versus the module's premeasured
calibration data for the remainder of the module states, in addition to the confidence state.
Access the ECal Service menu by pressing ECal SERVICE from the Confidence Check
menu.
The ECal Service menu softkeys are:

ECal STD [ ] Toggles the analyzer to show the data for the following calibration
states:
• CONF (Confidence)
• THRU
• ISOL (Isolation)
• S11 REFL (S11 Reflection)
• S22 REFL (S22 Reflection)

REFL STD [ ] Toggles between the available S11 and S22 reflection states listed in
the ECal STD [ ] softkey described above.
• S11 REFL allows up to 13 reflection states.
• S22 REFL allows up to 13 reflection states.

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NOTE When there is no premeasured calibration data for a given state and
measurement parameter, a warning is displayed indicating that no module
date is available.

PARAMETER [ ] Toggles the analyzer to show the data for the following S-parameters:
• S11
• S21
• S12
• S22

TRACE TYPE [ ] Toggles through the following trace types:

• DATA&MEM displays two traces representing the measured ECal
results and the module's premeasured calibration data trace.
• DATA/MEM displays a single trace representing a ratio of the
measured ECal results to the module's premeasured calibration
data.
• DATA-MEM displays a single trace representing the difference
between the measured ECal results and the module's premeasured
calibration data.
• DATA displays a single trace representing only the measured ECal
results.
• MEM displays a single trace representing only the module's
premeasured calibration data.

AUTO SCALE Changes scale and reference values to bring the trace data in view on
the display. The analyzer determines the smallest possible scale factor
that will put all displayed data onto 80% of the vertical graticule. The
reference value is chosen to put the trace in center screen.

RETURN Returns to the ECal Confidence Check menu.

NOTE When returning to the Confidence Check menu from the ECal Service menu,
press the SET CONF STANDARD softkey on the ECal Confidence Check
menu. If this softkey is not pressed, the confidence check information
displayed may not be accurate.

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 Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Adapter Removal Using ECal

A device under test (DUT) whose connectors cannot be connected directly to a test
configuration is considered to be a noninsertable device. See Figure 6-25 Noninsertable
devices can be caused because the DUT has:
• Input or output connectors with the same sex connector as the test configuration.
• Input or output connectors of a different connector type than the test configuration.

Figure 6-25 Noninsertable Device

The adapter removal calibration technique may be used with the ECal calibration to
accurately measure noninsertable devices. The following adapters (shown in Figure 6-26)
are needed.
• Adapter A1, which mates with port 1 of the DUT, must be installed on Port 1 of the
analyzer.
• Adapter A2, which mates with port 2 of the DUT, must be installed on Port 2 of the
analyzer.
• Adapter A3 must match the connectors on the DUT. The effects of this adapter will be
completely removed with this calibration technique.

NOTE Adapters A1 and A2 become part of the test setup to allow connection to the
DUT. Adapter A3 is used during the calibration only. Its effects will be
removed.

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Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Figure 6-26 Adapters Needed

The following requirements must also be met:

• An ECal module for performing a 2-port error correction for each connector type must
be available.
• Specified electrical length of adapter A3 within ± 1/4 wavelength for the measurement
frequency range.
For each port, a separate 2-port error correction needs to be performed to create two
calibration sets. The adapter removal algorithm uses the resultant data from the two
calibration sets and the nominal electrical length of the adapter to compute the adapter's
actual S-parameters. This data is then used to generate a separate third calibration set in
which the forward and reverse match and tracking terms are as if port 1 and port 2 could
be connected. This is possible because the actual S-parameters of the adapter are
measured with great accuracy, thus allowing the effects of the adapter to be completely
removed when the third calibration set is generated.

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 Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Perform the 2-Port Error Corrections

1. Connect adapter A3 to adapter A2 on port 2 as shown in Figure 6-27.

Figure 6-27 Two-Port Cal Set 1

2. Connect the ECal module between adapter A1 and adapter A3.

3. Press Cal ECal MENU MODULE A b .

4. Press FULL 2-PORT to perform the first 2-port error correction using the ECal
module.

NOTE When using adapter removal calibration, you must save calibration sets to
the internal disk, not to internal memory.

5. Save the results to disk. Name the file "PORT1."

6. Remove the ECal module and adapter A3 from the setup. Connect adapter A3 to
adapter A1 on port 1 as shown in Figure 6-28.

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Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Figure 6-28 Two-Port Cal Set 2

7. Connect the ECal module between adapter A3 and adapter A2.

8. Press Cal ECal MENU .

9. Press FULL 2-PORT to perform the second 2-port error correction using the ECal
module.
10.Save the results to disk. Name the file "PORT2."
11.Determine the electrical delay of adapter A3. If you have adapter specifications that
identify the electrical delay, you may use that information and continue with "Remove
the Adapter" on page 6-76. If you do not know the delay of adapter A3, perform the
“Determine the Electrical Delay” procedure on page 6-75.

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 Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Determine the Electrical Delay

This procedure determines the electrical delay of adapter A3 using a short.
1. Refer to Figure 6-29 while performing the steps in this procedure.
2. Perform a 1-port calibration at “Reference Port 1”. Refer to Step A of Figure 6-29.
This 1-port calibration can either be a manual calibration or an ECal.

Figure 6-29 Determining the Electrical Delay Setup

3. Connect the A3 adapter to “Reference Port 1” as shown in Step B of Figure 6-29.

Connect a short to the open end of the A3 adapter.
4. Measure the delay of the adapter by pressing Format DELAY .
5. Divide the resulting delay measurement by 2 to determine the delay of the thru and the
short in one direction.
6. Determine the offset delay of the calibration short by examining the define standard
menu (see "Define Standard Menus" on page 7-58).
7. Subtract the offset delay of the short (determined in step 6) from the delay of the thru
and the short in one direction (determined in step 5). The result is electrical delay of the
thru. This value is used in the next procedure.

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Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

Remove the Adapter

When the two sets of error correction files have been created (now referred to as
"calibration sets"), the A3 adapter may be removed.

1. Press Cal MORE ADAPTER REMOVAL to display the following menu:

HELP ADAPT REMOVAL (This Help softkey provides a quick reference guide
to using the adapter removal technique.)
RECALL CAL SETS

ADAPTER DELAY

ADAPTER COAX

ADAPTER WAVEGUIDE

REMOVE ADAPTER

2. Press RECALL CAL SETS to display RECALL CAL PORT 1 and

RECALL CAL PORT 2 .
RECALL CAL SETS also displays the internal (or external if internal not used) disk
file directory.

NOTE In the following two steps, calibration data is recalled, not instrument states.

3. From the disk directory, choose the file associated with the port 1 error correction, then
press RECALL CAL PORT 1 .
4. When this is complete, choose the file for the port 2 error correction and press
RECALL CAL PORT 2 .
5. When complete, press RETURN .
6. Enter the value of adapter A3 electrical delay by pressing ADAPTER DELAY and
entering the value.
7. Select the appropriate key: ADAPTER COAX or ADAPTER WAVEGUIDE .
8. Press REMOVE ADAPTER to complete the technique for calculating the new error
coefficients and overwrite the current active calibration set in use.
This process uses up an internal memory register. The calibration in this register is not
the calibration created by adapter removal, rather it is a "scratch" calibration. You may
wish to delete the register, or re-save the new calibration in this register as shown in
the following step.
9. To save the results of the new calibration set, press Save/Recall SELECT DISK
INTERNAL MEMORY RETURN SAVE STATE .

NOTE Adapter removal can leave a residual state in internal memory. This is not a
valid instrument state and should be deleted.

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 Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

10.Connect the DUT to the network analyzer as shown in Figure 6-30 to perform
calibrated measurements.

Figure 6-30 Calibrated Measurement

Verify the Results

Since the effect of the adapter has been removed, it is easy to verify the accuracy of the
technique by simply measuring the adapter itself. Because the adapter was used during
the creation of the two calibration sets, and the technique removes its effects,
measurement of the adapter itself should show the S-parameters.
If unexpected phase variations are observed, this indicates that the electrical delay of the
adapter was not specified within a quarter wavelength over the frequency range of
interest. To correct this, recall both cal sets, since the data was previously stored to disk,
change the adapter delay, and press REMOVE ADAPTER .

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Calibrating for Increased Measurement Accuracy
Adapter Removal Using ECal

6-78
7 Operating Concepts

7- 1
Operating Concepts
Using This Chapter

Using This Chapter

This chapter provides conceptual information on how specific functions of the network
analyzer operate. The following topics are discussed:
• “System Operation” on page 7-3
• “Processing” on page 7-6
• “Output Power” on page 7-10
• “Sweep Time” on page 7-11
• “Source Attenuator Switch Protection” on page 7-13
• “Channel Stimulus Coupling” on page 7-14
• “Sweep Types” on page 7-15
• “S-Parameters” on page 7-20
• “Analyzer Display Formats” on page 7-24
• “Electrical Delay” on page 7-33
• “Noise Reduction Techniques” on page 7-34
• “Measurement Calibration” on page 7-37
• “Calibration Routines” on page 7-54
• “Modifying Calibration Kits” on page 7-56
• TRL/LRM Calibration
• “GPIB Operation” on page 7-77
• “Limit Line Operation” on page 7-81
• “Knowing the Instrument Modes” on page 7-83

Where to Find More Information

• Operation concepts relating to mixer measurements and time domain measurements
can be found in Chapter 2 , "Making Mixer Measurements" and Chapter 3 , “Making
Time Domain Measurements.”
• Descriptions of all instrument functions are located in the “Hardkey/Softkey Reference”
chapter of the reference guide.
• Procedures for using instrument functions, making measurements, recording
measurement results, and performing calibrations are located in Chapter 1 , "Making
Measurements" and Chapter 6 , “Calibrating for Increased Measurement Accuracy.”

7-2
 Operating Concepts
System Operation

System Operation
Network analyzers measure the reflection and transmission characteristics of devices and
networks. A network analyzer test system consists of the following:
• source
• signal-separation devices
• receiver
• display
The analyzer applies a signal that is transmitted through the test device, or reflected from
its input, and then compares it with the incident signal generated by the swept RF source.
The signals are then applied to a receiver for measurement, signal processing, and display.
The vector network analyzer integrates a high resolution synthesized RF source, test set,
and a dual channel three-input receiver to measure and display magnitude, phase, and
group delay of transmitted and reflected power. With Option 010, the analyzer has the
additional capability of transforming measured data from the frequency domain to the
time domain. Other options are explained in “Options and Accessories” chapter of the
reference guide. A simplified block diagram of the network analyzer system is shown in
Figure 7-1. A detailed block diagram of the analyzer is provided in the service guide
together with a theory of system operation.

Figure 7-1 Simplified Block Diagram of the Network Analyzer System

7- 3
Operating Concepts
System Operation

The Built-In Synthesized Source

The analyzer’s built-in synthesized source produces a swept RF signal or CW (continuous
wave) signal in the range of 300 kHz to 3.0 GHz. Option 006 is able to generate signals
from 30 kHz to 6 GHz. The RF output power is leveled by an internal ALC (automatic
leveling control) circuit. To achieve frequency accuracy and phase measuring capability,
the analyzer is phase locked to a highly stable crystal oscillator. For this purpose, a portion
of the transmitted signal is routed to the R channel input of the receiver, where it is
sampled by the phase detection loop and fed back to the source.

Test Sets
A test set provides connections to the test device, as well as to the signal-separation
devices. The signal separation devices are needed to separate the incident signal from the
transmitted and reflected signals. The incident signal is applied to the R channel input.
Meanwhile, the transmitted and reflected signals are applied to the A or B inputs. Port1 is
connected to the A input and port 2 is connected to the B input (does not apply to the
HP/Agilent 85044A/B T/R test sets).
The HP/Agilent 85046A/B and HP/Agilent 85047A S-parameter test sets contain the
hardware required to make simultaneous transmission and reflection measurements in
both the forward and reverse directions. An RF path switch in the test set allows reverse
measurements to be made without changing the connections to the test device.

Test Set Step Attenuator

The step attenuator contained in the test set is used to adjust the power level to the DUT
without changing the level of the incident power in the reference path. The attenuator in
the 85046A/B or 85047A test set is controlled from the front panel of the analyzer using
the ATTENUATOR PORT 1 or ATTENUATOR PORT 2 softkeys located in the Power
menu.

The Receiver Block

The receiver block contains three sampler/mixers for the R, A, and B inputs. The signals
are sampled, and mixed to produce a 4 kHz IF (intermediate frequency). A multiplexer
sequentially directs each of the three IF signals to the ADC (analog to digital converter)
where it is converted from an analog to a digital signal. The signals are then measured and
processed for viewing on the display. Both amplitude and phase information are measured
simultaneously, regardless of what is displayed on the analyzer.

The Microprocessor
A microprocessor takes the raw data and performs all the required error correction, trace
math, formatting, scaling, averaging, and marker operations, according to the instructions
from the front panel or over GPIB. The formatted data is then displayed. The data
processing sequence is described in “Processing” on page 7-6.

7-4
 Operating Concepts
System Operation

Required Peripheral Equipment

Measurements require calibration standards for vector accuracy enhancement
(error-correction), and cables for interconnections. Model numbers and details of
compatible power splitters, calibration kits, and cables are provided in “Options and
Accessories” chapter of the reference guide.

7- 5
Operating Concepts
Processing

Processing
The analyzer’s receiver converts the R, A, and B input signals into useful measurement
information. This conversion occurs in two main steps:
• The swept high frequency input signals are translated to fixed low frequency IF signals,
using analog sampling or mixing techniques. (Refer to the service guide for more details
on the theory of operation.)
• The IF signals are converted into digital data by an analog to digital converter (ADC).
From this point on, all further signal processing is performed mathematically by the
analyzer microprocessors.
The following paragraphs describe the sequence of math operations and the resulting data
arrays as the information flows from the ADC to the display. They provide a good
foundation for understanding most of the response functions, and the order in which they
are performed.
Figure 7-2 is a data processing flow diagram that represents the flow of numerical data
from IF detection to display. The data passes through several math operations, denoted in
the figure by single line boxes. Most of these operations can be selected and controlled with
the front panel response block menus. The data, stored in arrays along the way and
denoted by double line boxes, are places in the flow path where data is accessible via GPIB.

Figure 7-2 Data Processing Flow Diagram

7-6
 Operating Concepts
Processing

While only a single flow path is shown, two identical paths are available, corresponding to
channel 1 and channel 2. Each channel also has an auxiliary channel for which the data is
processed along with the primary channel’s data. Channel 3 is the auxiliary channel for
channel 1, while channel 4 is the auxiliary channel for channel 2. When the channels are
uncoupled, each channel is processed and controlled independently.
Data point definition: A "data point" or "point" is a single piece of data representing a
measurement at a single stimulus value. Most data processing operations are
performed point-by-point; some involve more than one point.
Sweep definition: A "sweep" is a series of consecutive data point measurements,
taken over a sequence of stimulus values. A few data processing operations require that
a full sweep of data is available. The number of points per sweep can be defined by the
user. The units of the stimulus values (such as power, frequency, and time) can change,
depending on the sweep mode, although this does not generally affect the data
processing path.

Processing Details

The ADC
The ADC (analog-to-digital converter) converts the R, A, and B inputs (already
down-converted to a fixed low frequency IF) into digital words. (The AUX INPUT connector
on the rear panel is a fourth input.) The ADC switches rapidly between these inputs, so
they are converted nearly simultaneously.

IF Detection
This detection occurs in the digital filter, which performs the discrete Fourier transform
(DFT) on the digital words. The samples are converted into complex number pairs (real
plus imaginary, R+jX). The complex numbers represent both the magnitude and phase of
the IF signal. If the AUX INPUT is selected, the imaginary part of the pair is set to zero.
The DFT filter shape can be altered by changing the IF bandwidth, which is a highly
effective technique for noise reduction.

Ratio Calculations
These calculations are performed if the selected measurement is a ratio of two inputs (for
example, A/R or B/R). This is a complex divide operation. If the selected measurement is
absolute (such as A or B), no calculations are performed. The R, A, and B values are also
split into channel data at this point.

Sampler/IF Correction
The next digital processing technique used is sampler/IF correction. This process digitally
corrects for frequency response errors (both magnitude and phase, primarily sampler
rolloff) in the analog down-conversion path.

7- 7
Operating Concepts
Processing

Sweep-To-Sweep Averaging
Averaging is another noise reduction technique. This calculation involves taking the
complex exponential average of several consecutive sweeps. This technique cannot be used
with single-input measurements.

Pre-Raw Data Arrays

These data arrays store the results of all the preceding data processing operations. (Up to
this point, all processing is performed real-time with the sweep by the IF processor. The
remaining operations are not necessarily synchronized with the sweep, and are performed
by the main processor.) When full 2-port error correction is on, the raw arrays contain all
four S-parameter measurements required for accuracy enhancement. When the channels
are uncoupled ( COUPLED CH OFF ), there may be as many as eight raw arrays. These
arrays are directly accessible via GPIB. Notice that the numbers here are still complex
pairs.

Raw Arrays
Raw arrays contain the pre-raw data which has sampler and attenuator offset applied.

Vector Error-correction (Accuracy Enhancement)

Error-correction is performed next, if a measurement calibration has been performed and
correction is activated. Error-correction removes repeatable systematic errors (stored in
the error coefficient arrays) from the raw arrays. This can vary from simple vector
normalization to full 12-term error-correction.
The results of error-correction are stored in the data arrays as complex number pairs.
These are subsequently used whenever correction is on, and are accessible via GPIB.
If the data-to-memory operation is performed, the data arrays are copied into the memory
arrays.

Trace Math Operation

This operation selects either the data array, memory array, or both to continue flowing
through the data processing path. In addition, the complex ratio of the two (data/memory)
or the difference (data−memory) can also be selected. If memory is displayed, the data from
the memory arrays goes through exactly the same processing flow path as the data from
the data arrays.

Gating (Option 010 Only)

This digital filtering operation is associated with time domain transformation. Its purpose
is to mathematically remove unwanted responses isolated in time. In the time domain, this
can be viewed as a time-selective bandpass or bandstop filter. (If both data and memory
are displayed, gating is applied to the memory trace only if gating was on when data was
stored into memory.)

The Electrical Delay Block

This block involves adding or subtracting phase in proportion to frequency. This is
equivalent to "line-stretching" or artificially moving the measurement reference plane.
This block also includes the effects of port extensions as well as electrical delay.

7-8
 Operating Concepts
Processing

Conversion
This converts the measured S-parameter data to the equivalent complex impedance (Z) or
admittance (Y) values, or to inverse S-parameters (1/S).

Transform (Option 010 Only)

This transform converts frequency domain information into the time domain when it is
activated. The results resemble time domain reflectometry (TDR) or impulse-response
measurements. The transform uses the chirp-Z inverse fast Fourier transform (FFT)
algorithm to accomplish the conversion. The windowing operation, if enabled, is performed
on the frequency domain data just before the transform. (A special transform mode is
available to "demodulate" CW sweep data, with time as the stimulus parameter, and
display spectral information with frequency as the stimulus parameter.)

Format
This operation converts the complex number pairs into a scalar representation for display,
according to the selected format. This includes group delay calculations. These formats are
often easier to interpret than the complex number representation. (Polar and Smith chart
formats are not affected by the scalar formatting.) It is impossible to recover the complex
data after formatting, as shown in Figure 7-2.

Smoothing
This noise reduction technique smoothes noise on the trace. Smoothing is also used to set
the aperture for group delay measurements.
When smoothing is on, each point in a sweep is replaced by the moving average value of
several adjacent (formatted) points. The number of points included depends on the
smoothing aperture, which can be selected by the user. The effect is similar to video
filtering. If data and memory are displayed, smoothing is performed on the memory trace
only if smoothing was on when data was stored into memory.

Format Arrays
The data processing results are now stored in the format arrays. Notice that the marker
values and marker functions are all derived from the format arrays in Figure 7-2. Limit
testing is also performed on the formatted data. The format arrays are accessible via GPIB.

Offset and Scale

These operations prepare the formatted data for display. This is where the reference line
position, reference line value, and scale calculations are performed, as appropriate to the
format.

Display Memory
The display memory stores the display image for presentation on the analyzer. The
information stored includes graticules, annotation, and softkey labels. If user display
graphics are written, these are also stored in display memory. When a print or plot is
made, the information is taken from display memory.
The display is updated frequently and synchronously with the data processing operations.

7- 9
Operating Concepts
Output Power

Output Power
Source output power can be set over a range of −5 to +20 dBm (−5 to +18 dBm for
Option 006). The power setting can be combined with the test set step attenuator setting
for a wide output power range at the test ports. The actual test power range depends on
the test set.

NOTE After measurement calibration, you can change the power within a range (i.e.
without changing the step attenuator setting) and still maintain nearly full
accuracy. In some cases better accuracy can be achieved by changing the
power within a range. It can be useful to set different power levels for
calibration and measurement to minimize the effects of sampler compression
or noise floor.
If you decide to change the step attenuator setting, the calibration accuracy is
degraded and accuracy is no longer specified. However, the analyzer leaves
the correction on.
The annotation C∆ will be displayed whenever you change the power after
calibration.

Power Coupling Options

There are two methods you can use to couple and uncouple power levels with the analyzer:
• channel coupling
• port coupling
By uncoupling the channel powers, you effectively have two separate sources. Uncoupling
the test ports allows you to have different power levels on each port.

Channel coupling
CH PWR [COUPLED] toggles between coupled and uncoupled channel power. With the
channel power coupled, the power levels are the same on each channel. With the channel
power uncoupled, you can set different power levels for each channel. For the channel
power to be uncoupled, the other channel stimulus functions must also be uncoupled
( COUPLED CH OFF ).

Test port coupling

PORT PWR [COUPLED] toggles between coupled and uncoupled test ports. With the test
ports coupled, the power level is the same at each port. With the ports uncoupled, you can
set a different power level at each port. This can be useful, for example, if you want to
simultaneously perform a gain and reverse isolation measurement on a high-gain
amplifier using the dual channel mode to display the results. In this case, you would want
the power in the forward direction (S21) much lower than the power in the reverse
direction (S12).

7-10
 Operating Concepts
Sweep Time

Sweep Time
The SWEEP TIME [ ] softkey selects sweep time as the active entry and shows whether
the automatic or manual mode is active. The following explains the difference between
automatic and manual sweep time:
• Manual sweep time. As long as the selected sweep speed is within the capability of
the instrument, it will remain fixed, regardless of changes to other measurement
parameters. If you change measurement parameters such that the instrument can no
longer maintain the selected sweep time, the analyzer will change to the fastest sweep
time possible.
• Auto sweep time. Auto sweep time continuously maintains the fastest sweep speed
possible with the selected measurement parameters.
Sweep time refers only to the time that the instrument is sweeping and taking data, and
does not include the time required for internal processing of the data, retrace time, or band
switching time. A sweep speed indicator ↑ is displayed on the trace for sweep times longer
than 1.0 second. For sweep times equal to or faster than 1.0 second, the ↑ indicator appears
in the status notations area at the left of the analyzer's display.

Manual Sweep Time Mode

When this mode is active, the softkey label reads SWEEP TIME [MANUAL] . This mode is
engaged whenever you enter a sweep time greater than zero. This mode allows you to
select a fixed sweep time. If you change the measurement parameters such that the
current sweep time is no longer possible, the analyzer will automatically increase to the
next fastest sweep time possible. If the measurement parameters are changed such that a
faster sweep time is possible, the analyzer will not alter the sweep time while in this mode.

Auto Sweep Time Mode

When this mode is active, the softkey label reads SWEEP TIME [AUTO] . This mode is
engaged whenever you enter 0 x1 as a sweep time. Auto sweep time continuously
maintains the fastest sweep time possible with the selected measurement parameters.

Minimum Sweep Time

The minimum sweep time is dependent on the following measurement parameters:
• the number of points selected
• IF bandwidth
• sweep-to-sweep averaging in dual channel display mode
• error-correction
• type of sweep

7- 11
Operating Concepts
Sweep Time

In addition to the these parameters, the actual cycle time of the analyzer is also dependent
on the following measurement parameters:
• smoothing
• limit test
• trace math
• marker statistics
• time domain (Option 010 only)
Refer to the specifications and characteristics chapter of the reference guide to see the
minimum cycle time values for specific measurement parameters.

7-12
 Operating Concepts
Source Attenuator Switch Protection

Source Attenuator Switch Protection

The programmable step attenuator of the source can be switched between port 1 and port 2
when the test port power is uncoupled, or between channel 1 and channel 2 when the
channel power is uncoupled. To avoid premature wear of the attenuator, measurement
configurations requiring continuous switching between different power ranges are not
allowed.
For example, continuous switching would be required if channels 1 and 2 of the analyzer
are decoupled, power levels in two different ranges are selected for each channel, and dual
channel display is engaged. To prevent continuous switching between the two power
ranges, the analyzer automatically engages the test set hold mode after measuring both
channels once. The active channel continues to be updated each sweep while the inactive
channel is placed in the hold mode. (The status annotation tsH appears on the left side of
the display.) If averaging is on, the test set hold mode does not engage until the specified
number of sweeps is completed. The MEASURE RESTART and NUMBER OF GROUPS
softkeys can override this protection feature.

Allowing Repetitive Switching of the Attenuator

The MEASURE RESTART and NUMBER OF GROUPS softkeys allow measurements
which demand repetitive switching of the step attenuator. Use these softkeys with caution;
repetitive switching can cause premature wearing of the attenuator.

• MEASURE RESTART causes one measurement to occur before activating the test set
hold mode.
• NUMBER OF GROUPS causes a specified number of measurements to occur before
activating the test set hold mode.

7- 13
Operating Concepts
Channel Stimulus Coupling

Channel Stimulus Coupling

COUPLED CH on OFF toggles the channel coupling of stimulus values. With
COUPLED CH ON (the preset condition), both channels have the same stimulus values.
(The inactive channel takes on the stimulus values of the active channel.)
In the stimulus coupled mode, the following parameters are coupled:
• frequency
• number of points
• source power
• number of groups
• IF bandwidth
• sweep time
• trigger type
• gating parameters
• sweep type
• power meter calibration
Coupling of stimulus values for the two channels is independent of DUAL CHAN on OFF
in the display menu and MARKERS: UNCOUPLED in the marker mode menu.
COUPLED CH OFF activates an alternate sweep function when dual channel display is
on. In this mode, the analyzer alternates between the two sets of stimulus values and
displays the measurement data of both channels.

7-14
 Operating Concepts
Sweep Types

Sweep Types
The following sweep types will function with the interpolated error-correction feature
(described in “Interpolated Error Correction” on page 6-8):
• linear frequency
• power sweep
• CW time
The following sweep types will not function with the interpolated error correction feature:
• logarithmic frequency sweep
• list frequency sweep

Linear Frequency Sweep (Hz)

The LIN FREQ softkey activates a linear frequency sweep that is displayed on a standard
graticule with ten equal horizontal divisions. This is the preset default sweep type.
For a linear sweep, sweep time is combined with the channel's frequency span to compute a
source sweep rate:
sweep rate = (frequency span) / (sweep time)
Since the sweep time may be affected by various factors, the equation provided here is
merely an indication of the ideal (fastest) sweep rate. If the user-specified sweep time is
greater than 15 ms times the number of points, the sweep changes from a continuous ramp
sweep to a stepped CW sweep. Also, for 10 Hz or 30 Hz IF bandwidths, the sweep is
automatically converted to a stepped CW sweep.
In the linear frequency sweep mode, it is possible, with Option 010, to transform the data
for time domain measurements using the inverse Fourier transform technique.

Logarithmic Frequency Sweep (Hz)

The LOG FREQ softkey activates a logarithmic frequency sweep mode. The source is
stepped in logarithmic increments and the data is displayed on a logarithmic graticule.
This is slower than a continuous sweep with the same number of points, and the entered
sweep time may therefore be changed automatically. For frequency spans of less than two
octaves, the sweep type automatically reverts to linear sweep.

Stepped List Frequency Sweep (Hz)

The LIST FREQ [STEPPED] softkey activates a stepped list frequency sweep, one of two
list frequency sweep modes. The stepped list mode allows the analyzer to sweep a list of
arbitrary frequency points. This list is defined and modified using the edit list menu and
the edit subsweep menu. Up to 30 frequency subsweeps (called "segments") of several
different types can be specified, for a maximum total of 1601 points.

7- 15
Operating Concepts
Sweep Types

NOTE Earlier 8753 models allowed a maximum of 1632 points, but this value was
reduced to 1601 to add the 4 channels in the 4-parameter display feature.

One list is common to both channels. Once a frequency list has been defined and a
measurement calibration performed on the full frequency list, one or all of the frequency
segments can be measured and displayed without loss of calibration.
When the LIST FREQ [STEPPED] key is pressed, the network analyzer sorts all the
defined frequency segments into CW points in order of increasing frequency. It then
measures each point and displays a single trace that is a composite of all data taken. If
duplicate frequencies exist, the analyzer makes multiple measurements on identical points
to maintain the specified number of points for each subsweep. Since the frequency points
may not be distributed evenly across the display, the display resolution may be uneven,
and more compressed in some parts of the trace than in others. However, the stimulus and
response readings of the markers are always accurate. Because the list frequency sweep is
a stepped CW sweep, the sweep time is slower than for a continuous sweep with the same
number of points.

Segment Menu
The LIST FREQ [STEPPED] softkey provides access to the segment menu, which allows
you to select any single segment ( SINGLE SEG SWEEP ) in the frequency list or all of the
segments ( ALL SEGS SWEEP ) in the frequency list.
See the following information on how to enter or modify the list frequencies. If no list has
been entered, the message CAUTION: LIST TABLE EMPTY is displayed. A tabular printout
of the frequency list data can be obtained using the LIST VALUES function in the copy
menu.

Stepped Edit List Menu

The EDIT LIST softkey within the sweep type menu provides access to the edit list menu.
This menu is used to edit the list of frequency segments (subsweeps) defined with the edit
subsweep menu, described next. Up to 30 frequency subsweeps can be specified, for a
maximum of 1601 points. The segments do not have to be entered in any particular order:
the analyzer automatically sorts them and shows them on the display in increasing order
of start frequency. This menu determines which entry on the list is to be modified, while
the edit subsweep menu is used to make changes in the frequency or number of points of
the selected entry.

Stepped Edit Subsweep Menu

Using the EDIT or ADD softkey within the edit list menu will display the edit subsweep
menu. This menu lets you select measurement frequencies arbitrarily. Using this menu it
is possible to define the exact frequencies to be measured on a point-by-point basis. For
example, the sweep could include 100 points in a narrow passband, 100 points across a
broad stop band, and 50 points across the third harmonic response. The total sweep is
defined with a list of subsweeps.

7-16
 Operating Concepts
Sweep Types

The frequency subsweeps, or segments, can be defined in any of the following terms:
• start/stop/number of points
• start/stop/step
• center/span/number of points
• center/span/step
• CW frequency
The subsweeps can overlap, and do not have to be entered in any particular order. The
analyzer sorts the segments automatically and lists them on the display in order of
increasing start frequency, even if they are entered in center/span format. If duplicate
frequencies exist, the analyzer makes multiple measurements on identical points to
maintain the specified number of points for each subsweep. The data is shown on the
display as a single trace that is a composite of all data taken. The trace may appear uneven
because of the distribution of the data points, but the frequency scale is linear across the
total range.
Once the list frequencies have been defined or modified, the list frequency sweep mode can
be selected with the LIST FREQ [STEPPED] softkey in the sweep type menu. The
frequency list parameters can also be saved with an instrument state.

Swept List Frequency Sweep (Hz)

The LIST FREQ [SWEPT] softkey activates a swept list frequency sweep, one of two list
frequency sweep modes. The swept list mode allows the analyzer to sweep a list of
arbitrary frequency points which are defined and modified in a way similar to the stepped
list mode.
However, this mode takes data while sweeping through the defined frequency points,
increasing throughput by up to 6 times over a stepped sweep. In addition, this mode allows
the test port power and IF bandwidth to be set independently for each segment that is
defined. The only restriction is that you cannot specify overlapping frequency segments.
Similar to stepped list mode, the LIST FREQ [SWEPT] softkey also provides access to the
segment menu. However, swept list mode expands the way segments can be defined.Refer
to the following information on how to enter or modify the list segments.

Swept Edit List Menu

The EDIT LIST softkey within the sweep type menu provides access to the edit list menu.
The function of this menu is the same as in the stepped list mode.

Swept Edit Subsweep Menu

Using the EDIT or ADD softkey within the edit list menu will display the edit subsweep
menu. This menu lets you select measurement frequencies arbitrarily. Using this menu it
is possible to define the exact frequencies to be measured on a point-by-point basis at
specific power levels and IF bandwidth settings. The total sweep is defined with a list of
subsweeps.

7- 17
Operating Concepts
Sweep Types

The frequency subsweeps, or segments, can be defined in any of the following terms:
• start/stop/number of points/power/IFBW
• start/stop/step/power/IFBW
• center/span/number of points/power/IFBW
• center/span/step/power/IFBW
See “Setting Segment Power” and “Setting Segment IF Bandwidth” on page 7-18 for
information on how to set the segment power and IF bandwidth.
The subsweeps may be entered in any particular order but they cannot overlap. The
analyzer sorts the segments automatically and lists them on the display in order of
increasing start frequency, even if they are entered in center/span format. The data is
shown on the display as a single trace that is a composite of all data taken. The trace may
appear uneven because of the distribution of the data points, but the frequency scale is
linear across the total range.
Once the list frequencies have been defined or modified, the list frequency sweep mode can
be selected with the LIST FREQ [SWEPT] softkey in the sweep type menu. The frequency
list parameters can also be saved with an instrument state.

Setting Segment Power

To enable the SEGMENT POWER function, you must first select LIST POWER ON off
in the edit subsweep menu. List power is off by default and the asterisks that appear in the
"power" column of the list table indicate that power for the sweep is being set by the
normal analyzer power controls.
The power settings for all segments are restricted to a single power range. This prevents
the attenuator from switching to different settings mid-sweep. Select the power range and
then edit the list table to specify the segment powers. If the power range is selected after
the list has been defined, the list settings may be affected.
When analyzer port power is uncoupled, the segment power level can be set independently
for each port. To do this, you must first select a measurement parameter to activate the
port whose power you want to set. For example, select S11 to set port 1 power, or S22 to set
port 2 power. (Notice that the list mode table will only display the currently selected port in
the table. This is due to restricted display space.)
When analyzer port power is uncoupled, the LIST POWER ON off softkey can also be set
independently for each port. For example, you may choose to set LIST POWER ON off for
forward measurements and LIST POWER on OFF for reverse measurements. In this
case, the power would be set according to values in the list when measuring the forward
parameters. When measuring the reverse parameters, the power would be set according to
the normal analyzer power controls.

Setting Segment IF Bandwidth

To enable the SEGMENT IF BW function, you must first select LIST IF BW ON off in
the edit subsweep menu. List IF bandwidth is off by default and the asterisks that appear
in the "IFBW" column of the list table indicate that the IF bandwidth for the sweep is
being set by the normal analyzer controls.

7-18
 Operating Concepts
Sweep Types

Narrow IF bandwidths require more data samples per point and thus slow down the
measurement time. Selectable IF bandwidths can increase the throughput of the
measurement by allowing you to specify narrow bandwidths only where needed.

Power Sweep (dBm)

The POWER SWEEP softkey turns on a power sweep mode that is used to characterize
power-sensitive circuits. In this mode, power is swept at a single frequency, from a start
power value to a stop power value, selected using the Start and Stop keys and the
entry block. This feature is convenient for such measurements as gain compression or AGC
(automatic gain control) slope. To set the frequency of the power sweep, use CW FREQ in
the stimulus menu.
The span of the swept power is limited to being equal to or within one of the eight
pre-defined power ranges. The attenuator will not switch to a different power range while
in the power sweep mode. Therefore, when performing a power sweep, power range
selection will automatically switch to the manual mode.
In power sweep, the entered sweep time may be automatically changed if it is less than the
minimum required for the current configuration (number of points, IF bandwidth,
averaging, etc.).

CW Time Sweep (Seconds)

The CW TIME softkey turns on a sweep mode similar to an oscilloscope. The analyzer is
set to a single frequency, and the data is displayed versus time. The frequency of the CW
time sweep is set with CW FREQ in the stimulus menu. In this sweep mode, the data is
continuously sampled at precise, uniform time intervals determined by the sweep time and
the number of points minus 1. The entered sweep time may be automatically changed if it
is less than the minimum required for the current instrument configuration.
In time domain using Option 010, the CW time mode data is translated to frequency
domain, and the x-axis becomes frequency. In this mode, the instrument can be used as a
spectrum analyzer to measure signal purity, or for low frequency (<1 kHz) analysis of
amplitude or pulse modulation signals.

Selecting Sweep Modes

In addition to the previous sweep types, there are also two different sweep modes. These
can be accessed through the correction menu by pressing Cal MORE
ALTERNATE A and B or CHOP A and B .

7- 19
Operating Concepts
S-Parameters

S-Parameters
The Meas key accesses the S-parameter menu which contains softkeys that can be used
to select the parameters or inputs that define the type of measurement being performed.

Understanding S-Parameters
S-parameters (scattering parameters) are a convention used to characterize the way a
device modifies signal flow. A brief explanation of the S-parameters of a two-port device is
provided, however, for additional details, refer to Application Notes 95-1 and 154.
S-parameters are always a ratio of two complex (magnitude and phase) quantities.
S-parameter notation identifies these quantities using the numbering convention:
S out in
where the first number (out) refers to the test-device port where the signal is emerging and
the second number (in) is the test-device port where the signal is incident. For example,
the S-parameter S21 identifies the measurement as the complex ratio of the signal
emerging at the test device’s port 2 to the signal incident at the test device’s port 1.
Figure 7-3 is a representation of the S-parameters of a two-port device, together with an
equivalent flowgraph. In the illustration, "a" represents the signal entering the device and
"b" represents the signal emerging. Note that a and b are not related to the A and B input
ports on the analyzer.

7-20
 Operating Concepts
S-Parameters

Figure 7-3 S-Parameters of a Two-Port Device

S-parameters are exactly equivalent to these more common description terms, requiring
only that the measurements be taken with all test device ports properly terminated.

S-Parameter Definition Test Set Description Direction

S11 b1/a1 a2 = 0 Input reflection coefficient FWD

S21 b2/a1 a2 = 0 Forward gain FWD

S12 b1/a2 a1 = 0 Reverse Gain REV

S22 b2/a2 a1 = 0 Output reflection coefficient REV

7- 21
Operating Concepts
S-Parameters

The S-Parameter Menu

The S-parameter menu allows you to define the input ports and test set direction for
S-parameter measurements. The analyzer automatically switches the direction of the
measurement according to the selections you made in this menu. Therefore, the analyzer
can measure all four S-parameters with a single connection. The S-parameter being
measured is labeled at the top left corner of the display.
The S-parameter menu contains the following softkeys:

• Refl: FWD S11 (A/R)

• Trans: FWD S21 (B/R)
• Trans: REV S12 (A/R)
• Refl: REV S22 (B/R)
• ANALOG IN Aux Input
• CONVERSION [ ] accesses the conversion menu.
• INPUT PORTS accesses the input ports menu.

Analog In Menu
This menu allows you to monitor voltage and frequency nodes, using the analog bus and
internal counter. For more information, refer to the "Service Menus and Error Messages"
chapter in the service guide.

Conversion Menu
This menu converts the measured reflection or transmission data to the equivalent
complex impedance (Z) or admittance (Y) values. This is not the same as a two-port Y or Z
parameter conversion, as only the measured parameter is used in the equations. Two
simple one-port conversions are available, depending on the measurement configuration.
An S11 or S22 trace measured as reflection can be converted to equivalent parallel
impedance or admittance using the model and equations shown in Figure 7-4.

Figure 7-4 Reflection Impedance and Admittance Conversions

7-22
 Operating Concepts
S-Parameters

In a transmission measurement, the data can be converted to its equivalent series

impedance or admittance using the model and equations shown in Figure 7-5.

Figure 7-5 Transmission Impedance and Admittance Conversions

NOTE Avoid the use of Smith chart, SWR, and delay formats for display of Z and Y
conversions, as these formats are not easily interpreted.

Input Ports Menu

This menu allows you to define the input ports for power ratio measurements, or a single
input for magnitude only measurements of absolute power. You cannot use single inputs
for phase or group delay measurements, or any measurements with averaging activated.

7- 23
Operating Concepts
Analyzer Display Formats

Analyzer Display Formats

The Format key accesses the format menu. This menu allows you to select the
appropriate display format for the measured data.
The analyzer automatically changes the units of measurement to correspond with the
displayed format. Special marker menus are available for the polar and Smith formats,
each providing several different marker types for readout of values.
The selected display format of a particular S-parameter or input is assigned to that
parameter. Thus if different S-parameters are measured, even if only one channel is used,
each parameter is shown in its selected format each time it is displayed.
The following illustrations show a reflection measurement of a bandpass filter displayed in
each of the available formats.

Log Magnitude Format

The LOG MAG softkey displays the log magnitude format. This is the standard Cartesian
format used to display magnitude-only measurements of insertion loss, return loss, or
absolute power in dB versus frequency. The bandpass filter reflection data in a log
magnitude format is illustrated in Figure 7-6.

Figure 7-6 Log Magnitude Format

Phase Format
The PHASE softkey displays a Cartesian format of the phase portion of the data,
measured in degrees. This format displays the phase shift versus frequency. The phase
response of the same filter in a phase-only format is illustrated in Figure 7-7.

7-24
 Operating Concepts
Analyzer Display Formats

Figure 7-7 Phase Format

Group Delay Format

The DELAY softkey selects the group delay format, with marker values given in seconds.
The bandpass filter response formatted as group delay is shown in Figure 7-8. Group delay
principles are described in the next few pages.

Figure 7-8 Group Delay Format

7- 25
Operating Concepts
Analyzer Display Formats

Smith Chart Format

The SMITH CHART softkey displays a Smith chart format. Refer to Figure 7-9. This is
used in reflection measurements to provide a readout of the data in terms of impedance.
The intersecting dotted lines on the Smith chart represent constant resistance and
constant reactance values, normalized to the characteristic impedance, Z0, of the system.
Reactance values in the upper half of the Smith chart circle are positive (inductive)
reactance, and those in the lower half of the circle are negative (capacitive) reactance. The
default marker readout is in ohms (Ω) to measure resistance and reactance (R+jX).
Additional marker types are available in the Smith marker menu.
The Smith chart is most easily understood with a full scale value of 1.0. If the scale per
division is less than 0.2, the format switches automatically to polar.
If the characteristic impedance of the system is not 50 ohms, modify the impedance value
recognized by the analyzer by pressing Cal MORE SET Z0 (the impedance value) x1 .
An inverted Smith chart format for admittance measurements is also available. This is
shown in Figure 7-9. Access this by selecting SMITH CHART in the format menu, and
pressing Marker Fctn MKR MODE MENU SMITH MKR MENU G+jB MKR . The
Smith chart is inverted and marker values are read out in siemens (S) to measure
conductance and susceptance (G+jB).

Figure 7-9 Standard and Inverse Smith Chart Formats

7-26
 Operating Concepts
Analyzer Display Formats

Polar Format
The POLAR softkey displays a polar format as shown in Figure 7-10. Each point on the
polar format corresponds to a particular value of both magnitude and phase. Quantities
are read vectorally: the magnitude at any point is determined by its displacement from the
center (which has zero value), and the phase by the angle counterclockwise from the
positive x-axis. Magnitude is scaled in a linear fashion, with the value of the outer circle
usually set to a ratio value of 1. Since there is no frequency axis, frequency information is
read from the markers.
The default marker readout for the polar format is in linear magnitude and phase. A log
magnitude marker and a real/imaginary marker are available in the polar marker menu.

Figure 7-10 Polar Format

Linear Magnitude Format

The LIN MAG softkey displays the linear magnitude format as shown in Figure 7-11.
This is a Cartesian format used for unitless measurements such as reflection coefficient
magnitude ρ or transmission coefficient magnitude τ, and for linear measurement units. It
is used for display of conversion parameters and time domain transform data.

7- 27
Operating Concepts
Analyzer Display Formats

Figure 7-11 Linear Magnitude Format

SWR Format
The SWR softkey reformats a reflection measurement into its equivalent SWR (standing
wave ratio) value. See Figure 7-12. SWR is equivalent to (1 + ρ)/(1 − ρ), where ρ is the
reflection coefficient. Note that the results are valid only for reflection measurements. If
the SWR format is used for measurements of S21 or S12 the results are not valid.

Figure 7-12 Typical SWR Display

7-28
 Operating Concepts
Analyzer Display Formats

Real Format
The REAL softkey displays only the real (resistive) portion of the measured data on a
Cartesian format. See Figure 7-13. This is similar to the linear magnitude format, but can
show both positive and negative values. It is primarily used for analyzing responses in the
time domain, and also to display an auxiliary input voltage signal for service purposes.

Figure 7-13 Real Format

Imaginary Format
The IMAGINARY softkey displays only the imaginary (reactive) portion of the measured
data on a Cartesian format. This format is similar to the real format except that reactance
data is displayed on the trace instead of resistive data.

Group Delay Principles

For many networks, the amount of insertion phase is not as important as the linearity of
the phase shift over a range of frequencies. The analyzer can measure this linearity and
express it in two different ways: directly, as deviation from linear phase, or as group delay,
a derived value.
Group delay is the measurement of signal transmission time through a test device. It is
defined as the derivative of the phase characteristic with respect to frequency. Since the
derivative is basically the instantaneous slope (or rate of change of phase with respect to
frequency), a perfectly linear phase shift results in a constant slope, and therefore a
constant group delay. See Figure 7-14.

7- 29
Operating Concepts
Analyzer Display Formats

Figure 7-14 Constant Group Delay

Note, however, that the phase characteristic typically consists of both linear and higher
order (deviations from linear) components. The linear component can be attributed to the
electrical length of the test device, and represents the average signal transit time. The
higher order components are interpreted as variations in transit time for different
frequencies, and represent a source of signal distortion. See Figure 7-15.

Figure 7-15 Higher Order Phase Shift

The analyzer computes group delay from the phase slope. Phase data is used to find the
phase change, ∆ Φ over a specified frequency aperture, ∆ f, to obtain an approximation for
the rate of change of phase with frequency. Refer to Figure 7-16. This value, (τ)g,
represents the group delay in seconds assuming linear phase change over ∆f. It is
important that ∆ Φ be ≤ 180°, or errors will result in the group delay data. These errors can
be significant for long delay devices. You can verify that ∆ Φ is ≤ 180° by increasing the
number of points or narrowing the frequency span (or both) until the group delay data no
longer changes.

7-30
 Operating Concepts
Analyzer Display Formats

Figure 7-16 Rate of Phase Change Versus Frequency

When deviations from linear phase are present, changing the frequency step can result in
different values for group delay. Note that in this case the computed slope varies as the
aperture ∆f is increased. See Figure 7-17. A wider aperture results in loss of the fine grain
variations in group delay. This loss of detail is the reason that in any comparison of group
delay data, it is important to know the aperture that was used to make the measurement.

Figure 7-17 Variations in Frequency Aperture

In determining the group delay aperture, there is a trade-off between resolution of fine
detail and the effects of noise. Noise can be reduced by increasing the aperture, but this
will tend to smooth out the fine detail. More detail will become visible as the aperture is
decreased, but the noise will also increase, possibly to the point of obscuring the detail. A
good practice is to use a smaller aperture to assure that small variations are not missed,
then increase the aperture to smooth the trace.

7- 31
Operating Concepts
Analyzer Display Formats

The default group delay aperture is the frequency span divided by the number of points
across the display. To set the aperture to a different value, turn on smoothing in the
average menu, and vary the smoothing aperture. The aperture can be varied up to 20% of
the span swept.
Group delay measurements can be made on linear frequency, log frequency, or list
frequency sweep types (not in CW or power sweep). Group delay aperture varies depending
on the frequency spacing and point density, therefore the aperture is not constant in log
and list frequency sweep modes. In list frequency mode, extra frequency points can be
defined to ensure the desired aperture.
To obtain a readout of aperture values at different points on the trace, turn on a marker.
Then press Avg SMOOTHING APERTURE . Smoothing aperture becomes the active
function, and as the aperture is varied its value in Hz is displayed beneath the active entry
area.

7-32
 Operating Concepts
Electrical Delay

Electrical Delay
The ELECTRICAL DELAY softkey adjusts the electrical delay to balance the phase of the
test device. This softkey must be used in conjunction with COAXIAL DELAY or
WAVEGUIDE DELAY (with cut-off frequency) in order to identify which type of
transmission line the delay is being added to. These softkeys can be accessed by pressing
the Scale Ref key.
Electrical delay simulates a variable length lossless transmission line, which can be added
to or removed from a receiver input to compensate for interconnecting cables, etc. This
function is similar to the mechanical or analog "line stretchers" of other network analyzers.
Delay is annotated in units of time with secondary labeling in distance for the current
velocity factor.
With this feature, and with MARKER → DELAY (refer to “Setting the Electrical Delay”
on page 1-37), an equivalent length of air-filled, lossless transmission line is added or
subtracted according to the following formula:

Φ
Length ( meters ) = -------------------------------------------------------------------
( Freq ( MHz ) × 1.20083 )

Once the linear portion of the test device's phase has been removed, the equivalent length
of the lossless, transmission line can be read out in the active marker area. If the average
relative permittivity (εr) of the test device is known over the frequency span, the length
calculation can be adjusted to indicate the actual length of the test device more closely.
This can be done by entering the relative velocity factor for the test device using the
calibrate more menu. The relative velocity factor for a given dielectric can be calculated by:
1
Velocity Factor = --------
εr

assuming a relative permeability of 1.

7- 33
Operating Concepts
Noise Reduction Techniques

Noise Reduction Techniques

The Avg key is used to access three different noise reduction techniques: sweep-to-sweep
averaging, display smoothing, and variable IF bandwidth. All of these can be used
simultaneously. Averaging and smoothing can be set independently for each channel, and
the IF bandwidth can be set independently if the stimulus is uncoupled.

Averaging
Averaging computes each data point based on an exponential average of consecutive
sweeps weighted by a user-specified averaging factor. Each new sweep is averaged into the
trace until the total number of sweeps is equal to the averaging factor, for a fully averaged
trace. Each point on the trace is the vector sum of the current trace data and the data from
the previous sweep. A high averaging factor gives the best signal-to-noise ratio, but slows
the trace update time. Doubling the averaging factor reduces the noise by 3 dB. Averaging
is used for ratioed measurements: if it is attempted for a single-input measurement (e.g. A
or B), the message CAUTION: AVERAGING INVALID ON NON-RATIO MEASURE is displayed.
The effect of averaging on a log magnitude format trace is shown in Figure 7-18.

NOTE If you switch power ranges with averaging on, the average will restart.

Figure 7-18 Effect of Averaging on a Trace

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 Operating Concepts
Noise Reduction Techniques

Smoothing
Smoothing (similar to video filtering) averages the formatted active channel data over a
portion of the displayed trace. Smoothing computes each displayed data point based on one
sweep only, using a moving average of several adjacent data points for the current sweep.
The smoothing aperture is a percent of the swept stimulus span, up to a maximum of 20%.
Rather than lowering the noise floor, smoothing finds the mid-value of the data. Use it to
reduce relatively small peak-to-peak noise values on broadband measured data. Use a
sufficiently high number of display points to avoid misleading results. Do not use
smoothing for measurements of high resonance devices or other devices with wide trace
variations, as it will introduce errors into the measurement.
Smoothing is used with Cartesian and polar display formats. It is also the primary way to
control the group delay aperture, given a fixed frequency span. Refer to “Group Delay
Principles” on page 7-29. In polar display format, large phase shifts over the smoothing
aperture will cause shifts in amplitude, since a vector average is being computed. The
effect of smoothing on a log magnitude format trace is illustrated in Figure 7-19.

Figure 7-19 Effect of Smoothing on a Trace

IF Bandwidth Reduction
IF bandwidth reduction lowers the noise floor by digitally reducing the receiver input
bandwidth. It works in all ratio and non-ratio modes. It has an advantage over averaging
as it reliably filters out unwanted responses such as spurs, odd harmonics, higher
frequency spectral noise, and line-related noise. Sweep-to-sweep averaging, however, is
better at filtering out very low frequency noise. A tenfold reduction in IF bandwidth lowers
the measurement noise floor by about 10 dB. Bandwidths less than 300 Hz provide better
harmonic rejection than higher bandwidths.
Another difference between sweep-to-sweep averaging and variable IF bandwidth is the
sweep time. Averaging displays the first complete trace faster but takes several sweeps to
reach a fully averaged trace. IF bandwidth reduction lowers the noise floor in one sweep,
but the sweep time may be slower. The difference in noise floor between a trace measured
with a 3000 Hz IF bandwidth and with a 10 Hz IF bandwidth is illustrated by Figure 7-20.

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Operating Concepts
Noise Reduction Techniques

Figure 7-20 IF Bandwidth Reduction

NOTE Hints
Another capability that can be used for effective noise reduction is the marker
statistics function, which computes the average value of part or all of the
formatted trace.

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 Operating Concepts
Measurement Calibration

Measurement Calibration
Measurement calibration is an accuracy enhancement procedure that effectively removes
the system errors that cause uncertainty in measuring a test device. It measures known
standard devices, and uses the results of these measurements to characterize the system.
This section discusses the following topics:
• definition of accuracy enhancement
• causes of measurement errors
• characterization of microwave systematic errors
• effectiveness of accuracy enhancement
• ensuring a valid calibration
• modifying calibration kits
• TRL*/LRM* calibration

What Is Accuracy Enhancement?

A perfect measurement system would have infinite dynamic range, isolation, and
directivity characteristics, no impedance mismatches in any part of the test setup, and flat
frequency response. In any high frequency measurement there are measurement errors
associated with the system that contribute uncertainty to the results. Parts of the
measurement setup such as interconnecting cables and signal-separation devices (as well
as the analyzer itself) all introduce variations in magnitude and phase that can mask the
actual performance of the test device. Vector accuracy enhancement, also known as
measurement calibration or error-correction, provides the means to simulate a nearly
perfect measurement system.
For example, crosstalk due to the channel isolation characteristics of the analyzer can
contribute an error equal to the transmission signal of a high-loss test device. For
reflection measurements, the primary limitation of dynamic range is the directivity of the
test setup. The measurement system cannot distinguish the true value of the signal
reflected by the test device from the signal arriving at the receiver input due to leakage in
the system. For both transmission and reflection measurements, impedance mismatches
within the test setup cause measurement uncertainties that appear as ripples
superimposed on the measured data.
Error-correction simulates an improved analyzer system. During the measurement
calibration process, the analyzer measures the magnitude and phase responses of known
standard devices, and compares the measurement with actual device data. The analyzer
uses the results to characterize the system and effectively remove the system errors from
the measurement data of a test device, using vector math capabilities internal to the
network analyzer.
When you use a measurement calibration, the dynamic range and accuracy of the
measurement are limited only by system noise and stability, connector repeatability, and
the accuracy to which the characteristics of the calibration standards are known.

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Operating Concepts
Measurement Calibration

What Causes Measurement Errors?

Network analysis measurement errors can be separated into systematic, random, and drift
errors.
Correctable systematic errors are the repeatable errors that the system can measure.
These are errors due to mismatch and leakage in the test setup, isolation between the
reference and test signal paths, and system frequency response.
The system cannot measure and correct for the non-repeatable random and drift errors.
These errors affect both reflection and transmission measurements. Random errors are
measurement variations due to noise and connector repeatability. Drift errors include
frequency drift, temperature drift, and other physical changes in the test setup between
calibration and measurement.
The resulting measurement is the vector sum of the test device response plus all error
terms. The precise effect of each error term depends upon its magnitude and phase
relationship to the actual test device response.
In most high frequency measurements the systematic errors are the most significant
source of measurement uncertainty. Since each of these errors can be characterized, their
effects can be effectively removed to obtain a corrected value for the test device response.
For the purpose of vector accuracy enhancement, these uncertainties are quantified as
directivity, source match, load match, isolation (crosstalk), and frequency response
(tracking). The description of each of these systematic errors follows.
Random and drift errors cannot be precisely quantified, so they must be treated as
producing a cumulative uncertainty in the measured data.

Directivity
Normally a device that can separate the reverse from the forward traveling waves (a
directional bridge or coupler) is used to detect the signal reflected from the test device.
Ideally the coupler would completely separate the incident and reflected signals, and only
the reflected signal would appear at the coupled output, as shown in Figure 7-21a.

Figure 7-21 Directivity

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 Operating Concepts
Measurement Calibration

However, an actual coupler is not perfect, as shown in Figure 7-21b. A small amount of the
incident signal appears at the coupled output due to leakage as well as reflection from the
termination in the coupled arm. Also, reflections from the coupler output connector appear
at the coupled output, adding uncertainty to the signal reflected from the device. The
figure of merit for how well a coupler separates forward and reverse waves is directivity.
The greater the directivity of the device, the better the signal separation. System
directivity is the vector sum of all leakage signals appearing at the analyzer receiver input.
The error contributed by directivity is independent of the characteristics of the test device
and it usually produces the major ambiguity in measurements of low reflection devices.

Source Match
Source match is defined as the vector sum of signals appearing at the analyzer receiver
input due to the impedance mismatch at the test device looking back into the source, as
well as to adapter and cable mismatches and losses. In a reflection measurement, the
source match error signal is caused by some of the reflected signal from the test device
being reflected from the source back toward the test device and re-reflected from the test
device. This is illustrated in Figure 7-22. In a transmission measurement, the source
match error signal is caused by reflection from the test device that is re-reflected from the
source. Source match is most often given in terms of return loss in dB: thus the larger the
number, the smaller the error.

Figure 7-22 Source Match

The error contributed by source match is dependent on the relationship between the actual
input impedance of the test device and the equivalent match of the source. It is a factor in
both transmission and reflection measurements. Source match is a particular problem in
measurements where there is a large impedance mismatch at the measurement plane.
(For example, reflection devices such as filters with stop bands.)

Load Match
Load match error results from an imperfect match at the output of the test device. It is
caused by impedance mismatches between the test device output port and port 2 of the
measurement system. Some of the transmitted signal is reflected from port 2 back to the
test device as illustrated in Figure 7-23. A portion of this wave may be re-reflected to
port 2, or part may be transmitted through the device in the reverse direction to appear at
port 1. If the test device has low insertion loss (for example a filter pass band), the signal
reflected from port 2 and re-reflected from the source causes a significant error because the
test device does not attenuate the signal significantly on each reflection. Load match is
usually given in terms of return loss in dB: thus the larger the number, the smaller the
error.

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Operating Concepts
Measurement Calibration

Figure 7-23 Load Match

The error contributed by load match is dependent on the relationship between the actual
output impedance of the test device and the effective match of the return port (port 2). It is
a factor in all transmission measurements and in reflection measurements of two-port
devices. The interaction between load match and source match is less significant when the
test device insertion loss is greater than about 6 dB. However, source match and load
match still interact with the input and output matches of the DUT, which contributes to
transmission measurement errors. (These errors are largest for devices with highly
reflective ports.)

Isolation (Crosstalk)
Leakage of energy between analyzer signal paths contributes to error in a transmission
measurement, much like directivity does in a reflection measurement. Isolation is the
vector sum of signals appearing at the analyzer samplers due to crosstalk between the
reference and test signal paths. This includes signal leakage within the test set and in both
the RF and IF sections of the receiver.
The error contributed by isolation depends on the characteristics of the test device.
Isolation is a factor in high-loss transmission measurements. However, analyzer system
isolation is more than sufficient for most measurements, and correction for it may be
unnecessary.
For measuring devices with high dynamic range, accuracy enhancement can provide
improvements in isolation that are limited only by the noise floor. Generally, the isolation
falls below the noise floor, therefore, when performing an isolation calibration you should
use a noise reduction function such as averaging or reduce the IF bandwidth.

Frequency Response (Tracking)

This is the vector sum of all test setup variations in which magnitude and phase change as
a function of frequency. This includes variations contributed by signal-separation devices,
test cables, adapters, and variations between the reference and test signal paths. This
error is a factor in both transmission and reflection measurements.
For further explanation of systematic error terms and the way they are combined and
represented graphically in error models, refer to the “Characterizing Microwave
Systematic Errors” on page 7-41.

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 Operating Concepts
Measurement Calibration

Characterizing Microwave Systematic Errors

One-Port Error Model

In a measurement of the reflection coefficient (magnitude and phase) of a test device, the
measured data differs from the actual, no matter how carefully the measurement is made.
Directivity, source match, and reflection signal path frequency response (tracking) are the
major sources of error. See Figure 7-24.

Figure 7-24 Sources of Error in a Reflection Measurement

To characterize the errors, the reflection coefficient is measured by first separating the
incident signal (I) from the reflected signal (R), then taking the ratio of the two values. See
Figure 7-25. Ideally, (R) consists only of the signal reflected by the test device (S11A, for S11
actual).

Figure 7-25 Reflection Coefficient

However, all of the incident signal does not always reach the unknown. Refer to Figure
7-26. Some of (I) may appear at the measurement system input due to leakage through the
test set or through a signal separation device. Also, some of (I) may be reflected by
imperfect adapters between a signal separation device and the measurement plane. The
vector sum of the leakage and the miscellaneous reflections is the effective directivity, EDF.
Understandably, the measurement is distorted when the directivity signal combines
vectorally with the actual reflected signal from the unknown, S11A.

7- 41
Operating Concepts
Measurement Calibration

Figure 7-26 Effective Directivity EDF

Since the measurement system test port is never exactly the characteristic impedance
(50 ohms), some of the reflected signal bounces off the test port, or other impedance
transitions further down the line, and back to the unknown, adding to the original incident
signal (I). This effect causes the magnitude and phase of the incident signal to vary as a
function of S11A and frequency. Leveling the source to produce a constant incident signal
(I) reduces this error, but since the source cannot be exactly leveled at the test device input,
leveling cannot eliminate all power variations. This re-reflection effect and the resultant
incident power variation are caused by the source match error, E SF as shown in Figure
7-27.

Figure 7-27 Source Match ESF

Frequency response (tracking) error is caused by variations in magnitude and phase

flatness versus frequency between the test and reference signal paths. These are due
mainly to coupler roll off, imperfectly matched samplers, and differences in length and loss
between the incident and test signal paths. The vector sum of these variations is the
reflection signal path tracking error, ERF as shown in Figure 7-28.

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 Operating Concepts
Measurement Calibration

Figure 7-28 Reflection Tracking ERF

These three errors are mathematically related to the actual data, S 11A, and measured
data, S11M, by the following equation:

 S 
 11A E RF 
S 11M = EDF + -----------------------------------------
1 – E S 
 SF 11A 

If the value of these three "E" errors and the measured test device response were known
for each frequency, this equation could be solved for S11A to obtain the actual test device
response. Because each of these errors changes with frequency, their values must be
known at each test frequency. These values are found by measuring the system at the
measurement plane using three independent standards whose S11A is known at all
frequencies.
The first standard applied is a "perfect load," which makes S11A = 0 and essentially
measures directivity. See Figure 7-29. "Perfect load" implies a reflectionless termination at
the measurement plane. All incident energy is absorbed. With S11A = 0 the equation can be
solved for E DF, the directivity term. In practice, of course, the "perfect load" is difficult to
achieve, although very good broadband loads are available in the compatible calibration
kits.

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Operating Concepts
Measurement Calibration

Figure 7-29 "Perfect Load" Termination

Since the measured value for directivity is the vector sum of the actual directivity plus the
actual reflection coefficient of the "perfect load," any reflection from the termination
represents an error. System effective directivity becomes the actual reflection coefficient of
the near "perfect load" as shown in Figure 7-30. In general, any termination having a
return loss value greater than the uncorrected system directivity reduces reflection
measurement uncertainty.

Figure 7-30 Measured Effective Directivity

Next, a short circuit termination whose response is known to a very high degree is used to
establish another condition as shown in Figure 7-31.

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 Operating Concepts
Measurement Calibration

Figure 7-31 Short Circuit Termination

The open circuit gives the third independent condition. In order to accurately model the
phase variation with frequency due to fringing capacitance from the open connector, a
specially designed shielded open circuit is used for this step. (The open circuit capacitance
is different with each connector type.) Now the values for EDF, directivity, ESF, source
match, and ERF, reflection frequency response, are computed and stored. See Figure 7-32.

Figure 7-32 Open Circuit Termination

This completes the calibration procedure for one port devices.

Device Measurement
Now the unknown is measured to obtain a value for the measured response, S11M, at each
frequency. Refer to Figure 7-33.

7- 45
Operating Concepts
Measurement Calibration

Figure 7-33 Measured S11

This is the one-port error model equation solved for S 11A. Since the three errors and S11M
are now known for each test frequency, S11A can be computed as follows:

( S11M – E DF )
S 11A = ----------------------------------------------------------------
-
ESF ( S 11M – EDF ) + E RF

For reflection measurements on two-port devices, the same technique can be applied, but
the test device output port must be terminated in the system characteristic impedance.
This termination should have as low a reflection coefficient as the load used to determine
directivity. The additional reflection error caused by an improper termination at the test
device’s output port is not incorporated into the one-port error model.

Two-Port Error Model

The error model for measurement of the transmission coefficients (magnitude and phase)
of a two-port device is derived in a similar manner. The potential sources of error are
frequency response (tracking), source match, load match, and isolation as shown in Figure
7-34. These errors are effectively removed using the full two-port error model.

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 Operating Concepts
Measurement Calibration

Figure 7-34 Major Sources of Error

The transmission coefficient is measured by taking the ratio of the incident signal (I) and
the transmitted signal (T). Refer to Figure 7-35. Ideally, (I) consists only of power delivered
by the source, and (T) consists only of power emerging at the test device output.

Figure 7-35 Transmission Coefficient

As in the reflection model, source match can cause the incident signal to vary as a function
of test device S11A. Also, since the test setup transmission return port is never exactly the
characteristic impedance, some of the transmitted signal is reflected from the test set
port 2, and from other mismatches between the test device output and the receiver input,
to return to the test device. A portion of this signal may be re-reflected at port 2, thus
affecting S21M, or part may be transmitted through the device in the reverse direction to
appear at port 1, thus affecting S11M. This error term, which causes the magnitude and
phase of the transmitted signal to vary as a function of S22A, is called load match, E LF. See
Figure 7-36.

7- 47
Operating Concepts
Measurement Calibration

Figure 7-36 Load Match ELF

The measured value, S21M, consists of signal components that vary as a function of the
relationship between ESF and S11A as well as ELF and S22A, so the input and output
reflection coefficients of the test device must be measured and stored for use in the S21A
error-correction computation. Thus, the test setup is calibrated as described for reflection
to establish the directivity, EDF, source match, ESF, and reflection frequency response,
ERF, terms for reflection measurements on both ports.
Now that a calibrated port is available for reflection measurements, the thru is connected
and load match, E LF, is determined by measuring the reflection coefficient of the thru
connection.
Transmission signal path frequency response is then measured with the thru connected.
The data is corrected for source and load match effects, then stored as transmission
frequency response, E TF.

NOTE It is very important that the exact electrical length of the thru be known.
Most calibration kits assume a zero length thru. For some connection types
such as Type-N, this implies one male and one female port. If the test system
requires a non-zero length thru, for example, one with two male test ports,
the exact electrical delay of the thru adapter must be used to modify the
built-in calibration kit definition of the thru.

Isolation, EXF, represents the part of the incident signal that appears at the receiver
without actually passing through the test device. See Figure 7-37. Isolation is measured
with the test set in the transmission configuration and with terminations installed at the
points where the test device will be connected. Since isolation can be lower than the noise
floor, it is best to increase averaging by at least a factor of four during the isolation portion
of the calibration. The RESUME CAL SEQUENCE softkey under the Cal menu allows a
calibration sequence to resume after a change to the averaging factor.
If the leakage falls below the noise floor, it is best to increase averaging before calibration.

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 Operating Concepts
Measurement Calibration

In this case, omitting isolation is better than measuring the isolation standards without
increasing the averaging factor.

Figure 7-37 Isolation EXF

Thus there are two sets of error terms, forward and reverse, with each set consisting of six
error terms, as follows:
• Directivity, EDF (forward) and E DR (reverse)
• Isolation, EXF and E XR
• Source Match, ESF and E SR
• Load Match, ELF and ELR
• Transmission Tracking, ETF and ETR
• Reflection Tracking, ERF and ERR
The analyzer's test set can measure both the forward and reverse characteristics of the test
device without you having to manually remove and physically reverse the device. A full
two-port error model illustrated in Figure 7-38. This illustration depicts how the analyzer
effectively removes both the forward and reverse error terms for transmission and
reflection measurements.

7- 49
Operating Concepts
Measurement Calibration

Figure 7-38 Full Two-Port Error Model

A full two-port error model equations for all four S-parameters of a two-port device is
shown in Figure 7-39. Note that the mathematics for this comprehensive model use all
forward and reverse error terms and measured values. Thus, to perform full
error-correction for any one parameter, all four S-parameters must be measured.
Applications of these error models are provided in the calibration procedures described in
Chapter 5 , “Optimizing Measurement Results.”

Enhanced Response Calibration Error Model Enhanced response calibration uses

the same error model as the forward configuration portion of Figure 7-38. In the response
portion, the source and load match effects are fully-accounted for giving the same accuracy
to the forward tracking term (ETF) as the two-port calibration. During the measurement,
the enhanced response calibration performs a correction which is mathematically the same
as setting the values of ELF, ELR, ESR, EXR, EDR to zero (0) and the values of ERR and ETR
to one (1) in the equations for S11 and S21 shown in Figure 7-39.

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 Operating Concepts
Measurement Calibration

Figure 7-39 Full Two-Port Error Model Equations

How Effective Is Accuracy Enhancement?

In addition to the errors removed by accuracy enhancement, other systematic errors exist
due to limitations of dynamic accuracy, test set switch repeatability, and test cable
stability. These, combined with random errors, also contribute to total system
measurement uncertainty. Therefore, after accuracy enhancement procedures are
performed, residual measurement uncertainties remain.
The uncorrected performance of the analyzer is sufficient for many measurements.
However, the next three illustrations show the improvements that can be made in
measurement accuracy by using a more complete calibration routine. See Figure 7-40,
Figure 7-41, and Figure 7-42.

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Operating Concepts
Measurement Calibration

Figure 7-40a shows a measurement in log magnitude format with a response calibration
only. Figure 7-40b shows the improvement in the same measurement using an S11
one-port calibration. Figure 7-41a shows the measurement on a Smith chart with response
calibration only, and Figure 7-41b shows the same measurement with an S11 one-port
calibration.

Figure 7-40 Response versus S11 1-Port Calibration on Log Magnitude Format

Figure 7-41 Response versus S11 1-Port Calibration on Smith Chart

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 Operating Concepts
Measurement Calibration

The response of a device in a log magnitude format is shown in Figure 7-42. Figure 7-42a
shows the response using a response calibration and Figure 7-42b the response using a full
two-port calibration.

Figure 7-42 Response versus Full Two-Port Calibration

(a) (b)

7- 53
Operating Concepts
Calibration Routines

Calibration Routines
There are twelve different error terms for a two-port measurement that can be corrected
by accuracy enhancement in the analyzer. These are directivity, source match, load match,
isolation, reflection tracking, and transmission tracking, each in both the forward and
reverse direction. The analyzer has several different measurement calibration routines to
characterize one or more of the systematic error terms and remove their effects from the
measured data.
The calibrate menu allows you to perform the measurement calibration routines. These
procedures range from a simple frequency response calibration to a full two-port
calibration that effectively removes all twelve error terms.

Response Calibration
The response calibration, activated by pressing the RESPONSE softkey within the
calibrate menu, provides a normalization of the test setup for reflection or transmission
measurements. This calibration procedure may be adequate for measurement of well
matched devices. This is the simplest error-correction to perform, and should be used when
extreme measurement accuracy is not required.

Response and Isolation Calibration

The response and isolation calibration, activated by pressing the RESPONSE & ISOL’N
softkey within the calibrate menu, provides a normalization for frequency response and
crosstalk errors in transmission measurements, or frequency response and directivity
errors in reflection measurements. This procedure may be adequate for measurement of
well matched high-loss devices.

Enhanced Response Calibration

The enhanced response calibration, activated by pressing the ENHANCED RESPONSE
softkey within the calibrate menu, provides a one-port calibration to correct for directivity,
source match, and frequency response for reflection measurements, and corrects for source
match as well as frequency response for transmission measurements.
Enhanced response calibration improves accuracy in transmission measurements
compared to a response calibration or a response and isolation calibration, but it is not as
accurate as a full 2-port calibration.

Enhanced Reflection Calibration

The enhanced reflection calibration is activated by selecting ENH. REFL. ON off under
the ENHANCED RESPONSE menu.

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 Operating Concepts
Calibration Routines

The enhanced reflection calibration effectively removes load match error from the
enhanced response calibration performed on a bilateral device. A bilateral device has an
identical forward (S21) and reverse transmission (S12) response. Most passive devices (such
as filters, attenuators, or switches) are bilateral. Some passive devices (circulators,
isolators) and most active devices do not have identical forward and reverse transmission
responses and enhanced reflection calibration will not work with these devices.

S11 and S22 One-Port Calibration

The S 11 and S22 one-port calibration procedures, activated by pressing the S11 1-PORT or
S22 1-PORT softkey within the calibrate menu, provide directivity, source match, and
frequency response vector error-correction for reflection measurements. These procedures
provide high accuracy reflection measurements of one-port devices or properly terminated
two-port devices.

Full Two-Port Calibration

The full two-port calibration, activated by pressing the FULL 2-PORT softkey within the
calibrate menu, provides directivity, source match, load match, isolation, and frequency
response vector error-correction, in both forward and reverse directions, for transmission
and reflection measurements of two-port devices. This calibration provides the best
magnitude and phase measurement accuracy for both transmission and reflection
measurements of two-port devices, and requires an S-parameter test set.
In this type of calibration, both forward and reverse measurements must be made. You
have the option of setting the ratio of the number of forward (or reverse) sweeps versus the
number of reverse (or forward) sweeps. To access this function, press Cal MORE
TESTSET SW and enter the number of sweeps desired.

TRL*/LRM* Two-Port Calibration

The TRL*/LRM* two-port calibration, activated by pressing the TRL*/LRM* 2-PORT
softkey within the calibration menu, provides the ability to make calibrations using the
TRL or LRM method. For more information, refer to “TRL*/LRM* Calibration” on
page 7-66.

E-CAL

The E-Cal calibration menu is activated by pressing E-CAL MENU in the calibration
menu.
The E-Cal (Electronic Calibration) system determines systemic errors of the analyzer
through a one-time connection of an E-Cal module to the network analyzer ports. The
random error of connector repeatability is reduced substantially through a one-time
connection when compared to frequent connections and disconnections of the conventional
short/open/load methods.

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Operating Concepts
Modifying Calibration Kits

Modifying Calibration Kits

Modifying calibration kits is necessary only if unusual standards (such as in TRL*) are
used or the very highest accuracy is required. Unless a calibration kit model is provided
with the calibration devices used, a solid understanding of error-correction and the system
error model are absolutely essential to making modifications. You may use modifications to
a predefined calibration kit by modifying the kit and saving it as a user kit. The original
predefined calibration kit will remain unchanged.
Before attempting to modify calibration standard definitions, you should read Application
Note 8510-5A to improve your understanding of modifying calibration kits. The part
number of this application note is 5956-4352. Although the application note is written for
the 8510 family of network analyzers, it also applies to this network analyzer.
Several situations exist that may require a user-defined calibration kit:
• A calibration is required for a connector interface different from the four default
calibration kits. (Examples: SMA, TNC, or waveguide.)
• A calibration with standards (or combinations of standards) that are different from the
default calibration kits is required. (Example: Using three offset shorts instead of open,
short, and load to perform a 1-port calibration.)
• The built-in standard models for default calibration kits can be improved or refined.
Remember that the more closely the model describes the actual performance of the
standard, the better the calibration. (Example: The 7 mm load is determined to be
50.4 Ω instead of 50.0 Ω.)

Definitions
The following are definitions of terms:
• A "standard" (represented by a number 1-8) is a specific, well-defined, physical device
used to determine systematic errors. For example, standard 1 is a short in the 3.5 mm
calibration kit. Standards are assigned to the instrument softkeys as part of a class.
• A standard "type" is one of five basic types that define the form or structure of the
model to be used with that standard (short, open, load, delay/thru, and arbitrary
impedance); standard 1 is of the type short in the 3.5 mm calibration kit.
• Standard "coefficients" are numerical characteristics of the standards used in the model
selected. For example, the offset delay of the short is 32 ps in the 3.5 mm calibration kit.
• A standard "class" is a grouping of one or more standards that determines which of the
eight standards are used at each step of the calibration. For example, standard number
2 and 8 usually makes up the S11A reflection class, which for type-N calibration kits are
male and female shorts.

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 Operating Concepts
Modifying Calibration Kits

Procedure
The following steps are used to modify or define a user kit:
1. Select the predefined kit to be modified. (This is not necessary for defining a new
calibration kit.)
2. Define the standards:
• Define which "type" of standard it is.
• Define the electrical characteristics (coefficients) of the standard.
3. Specify the class where the standard is to be assigned.
4. Store the modified calibration kit.

Modify Calibration Kit Menu

The MODIFY [ ] softkey in the cal kit menu accesses the modify calibration kit menu.
This leads in turn to additional series of menus associated with modifying calibration kits.
The following is a description of the softkeys located within this menu:

• DEFINE STANDARD makes the standard number the active function, and brings up
the define standard menus. Before selecting a standard, a standard number must be
entered. This number (1 to 8) is an arbitrary reference number used to reference
standards while specifying a class. The standard numbers for the predefined calibration
kits are as follows:

1 short (m)

2 open (m)

3 broadband load

4 thru

5 sliding load

6 lowband load

7 short (f)

8 open (f)

NOTE Although the numbering sequences are arbitrary, confusion can be minimized
by using consistency. However, standard 5 is always a sliding load.

• SPECIFY CLASS leads to the specify class menu. After the standards are modified,
use this key to specify a class to group certain standards.
• LABEL CLASS leads to the label class menu, to give the class a meaningful label for
future reference.

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 Operating Concepts
Modifying Calibration Kits

• LABEL KIT leads to a menu for constructing a label for the user-modified cal kit. If a
label is supplied, it will appear as one of the five softkey choices in the select cal kit
menu. The approach is similar to defining a display title, except that the kit label is
limited to ten characters.
• TRL/LRM OPTION brings up the TRL Option menu.
• KIT DONE (MODIFIED) terminates the calibration kit modification process, after all
standards are defined and all classes are specified. Be sure to save the kit with the
SAVE USER KIT softkey, if it is to be used later.

Define Standard Menus

Standard definition is the process of mathematically modeling the electrical
characteristics (delay, attenuation, and impedance) of each calibration standard. These
electrical characteristics (coefficients) can be mathematically derived from the physical
dimensions and material of each calibration standard, or from its actual measured
response. The parameters of the standards can be listed in Table 7-1.
Table 7-1 Standard Definitions

System Z0a = __________________________________________ Calibration Kit Label _____________________________________________

Disk File Name: __________________________

STANDARD b C0c C1c C2c C3c FIXED d TERMe OFFSET FREQ (GHz) COAX STND
or LABEL
×10−15 ×10−27 ×10−36 ×10−45 SLIDING IMPED
F F/Hz or Ω WG
NO. TYPE F/Hz2 F/Hz3 DELAY Z0 LOSS MIN MAX
OFFSET
s Ω Ω/s

a. Ensure system Z0 of network analyzer is set to this value.

b. Open, short, load, delay/thru, or arbitrary impedance.
c. Open standard types only.
d. Load or arbitrary impedance only.
e. Arbitrary impedance only, device terminating impedance.

Each standard must be identified as one of five "types": open, short, load, delay/thru, or
arbitrary impedance.

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 Operating Concepts
Modifying Calibration Kits

After a standard number is entered, selection of the standard type will present one of five
menus for entering the electrical characteristics (model coefficients) corresponding to that
standard type, such as OPEN . These menus are tailored to the current type, so that only
characteristics applicable to the standard type can be modified.
The following is a description of the softkeys located within the define standard menu:

• OPEN defines the standard type as an open, used for calibrating reflection
measurements. Opens are assigned a terminal impedance of infinite ohms, but delay
and loss offsets may still be added. Pressing this key also brings up a menu for defining
the open, including its capacitance.
As a reflection standard, an open termination offers the advantage of broadband
frequency coverage. At RF and microwave frequencies, however, an open rarely has
perfect reflection characteristics because fringing capacitance effects cause phase shift
that varies with frequency. This can be observed in measuring an open termination
after calibration, when an arc in the lower right circumference of the Smith chart
indicates capacitive reactance. These effects are impossible to eliminate, but the
calibration kit models include the open termination capacitance at all frequencies for
compatible calibration kits. The capacitance model is a cubic polynomial, as a function
of frequency, where the polynomial coefficients are user-definable. The capacitance
model equation is:

C = (C0) + (C1 × F) + (C2 × F2) + (C3 × F3)

where F is the measurement frequency.
The terms in the equation are defined with the specify open menu as follows:

— C0 allows you to enter the C0 term, which is the constant term of the cubic
polynomial and is scaled by 10−15 Farads.
— C1 allows you to enter the C1 term, expressed in F/Hz (Farads/Hz) and scaled by
10−27.

— C2 allows you to enter the C2 term, expressed in F/Hz2 and scaled by 10−36.

— C3 allows you to enter the C3 term, expressed in F/Hz3 and scaled by 10−45.
• SHORT defines the standard type as a short, for calibrating reflection measurements.
Shorts are assigned a terminal impedance of 0 ohms, but delay and loss offsets may still
be added.
• LOAD defines the standard type as a load (termination). Loads are assigned a
terminal impedance equal to the system characteristic impedance Z0, but delay and loss
offsets may still be added. If the load impedance is not Z0, use the arbitrary impedance
standard definition.

— FIXED defines the load as a fixed (not sliding) load.

— SLIDING defines the load as a sliding load. When such a load is measured during
calibration, the analyzer will prompt for several load positions, and calculate the
ideal load value from it.
— OFFSET defines the load as being offset.

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Operating Concepts
Modifying Calibration Kits

• DELAY/THRU defines the standard type as a transmission line of specified length, for
calibrating transmission measurements.
• ARBITRARY IMPEDANCE defines the standard type to be a load, but with an
arbitrary impedance (different from system Z0).

— TERMINAL IMPEDANCE allows you to specify the (arbitrary) impedance of the

standard, in ohms.
— FIXED defines the load as a fixed (not sliding) load.
— SLIDING defines the load as a sliding load. When such a load is measured during
calibration, the analyzer will prompt for several load positions, and calculate the
ideal load value from it. Normally, arbitrary impedance standards are fixed rather
than sliding.
Any standard type can be further defined with offsets in delay, loss, and standard
impedance; assigned minimum or maximum frequencies over which the standard applies,
and defined as coax or waveguide. The SPECIFY OFFSET softkey accesses the specify
offset menu (described next).
The LABEL STD softkey allows you to define a distinct label for each standard, so that
the analyzer can prompt you with explicit standard labels during calibration (such as
SHORT). The function is similar to defining a display title, except that the label is limited to
ten characters.
After each standard is defined, including offsets, the STD DONE (DEFINED) softkey will
terminate the standard definition.

Specify Offset Menu

The specify offset menu allows additional specifications for a user-defined standard.
Features specified in this menu are common to all five types of standards.
Offsets may be specified with any standard type. This means defining a uniform length of
transmission line to exist between the standard being defined and the actual measurement
plane. (Example: a waveguide short circuit terminator, offset by a short length of
waveguide.) For reflection standards, the offset is assumed to be between the measurement
plane and the terminating element of the standard (one-way only). For transmission
standards, the offset is assumed to exist between the two reference planes (in effect, the
offset is the thru). For both reflection and transmission, the offset is entered as a one-way
offset. Three characteristics of the offset can be defined: its delay (length), loss, and
impedance.
In addition, the frequency range over which a particular standard is valid can be defined
with a minimum and maximum frequency. This is particularly important for a waveguide
standard, since the minimum frequency is used to define the waveguide cutoff frequency.
Note that several band-limited standards can together be defined as the same "class" (see
“Specify Class Menu” on page 7-62). Then, if a measurement calibration is performed over
a frequency range exceeding a single standard, additional standards can be used for each
portion of the range.

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 Operating Concepts
Modifying Calibration Kits

Lastly, the standard must be defined as either coaxial or waveguide. If it is waveguide,

dispersion effects are calculated automatically and included in the standard model.
The following is a description of the softkeys located within the specify offset menu:

• OFFSET DELAY allows you to specify the one-way electrical delay from the
measurement (reference) plane to the standard, in seconds (s). (In a transmission
standard, offset delay is the delay from plane to plane.) Delay can be calculated from the
precise physical length of the offset, the permittivity constant of the medium, and the
speed of light.
In coax, group delay is considered constant. In waveguide, however, group delay is
dispersive, that is, it changes significantly as a function of frequency. Hence, for a
waveguide standard, offset delay must be defined as though it were a TEM wave
(without dispersion).
• OFFSET LOSS allows you to specify energy loss, due to skin effect, along a one-way
length of coax offset. The value of loss is entered as ohms/nanosecond (or Giga
ohms/second) at 1 GHz. (Such losses are negligible in waveguide, so enter 0 as the loss
offset.)
• OFFSET Z0 allows you to specify the characteristic impedance of the coax offset.
(Note: This is not the impedance of the standard itself.) For waveguide, the offset
impedance as well as the system Z0 must always be set to 1Ω.
• MINIMUM FREQUENCY allows you to define the lowest frequency at which the
standard can be used during measurement calibration. In waveguide, this must be the
lower cutoff frequency of the standard, so that the analyzer can calculate dispersive
effects correctly (see OFFSET DELAY ).
• MAXIMUM FREQUENCY allows you to define the highest frequency at which the
standard can be used during measurement calibration. In waveguide, this is normally
the upper cutoff frequency of the standard.
• COAX defines the standard (and the offset) as coaxial. This causes the analyzer to
assume linear phase response in any offsets.
• WAVEGUIDE defines the standard (and the offset) as rectangular waveguide. This
causes the analyzer to assume a dispersive delay (see OFFSET DELAY ).

Label Standard Menu

This menu allows you to label (reference) individual standards during the menu-driven
measurement calibration sequence. The labels are user-definable using a character set
shown on the display that includes letters, numbers, and some symbols, and they may be
up to ten characters long. The analyzer will prompt you to connect standards using these
labels, so they should be meaningful to you, and distinct for each standard.
By convention, when sexed connector standards are labeled male (m) or female (f), the
designation refers to the test port connector sex, not the connector sex of the standard.

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Operating Concepts
Modifying Calibration Kits

Specify Class Menu

Once a standard has been defined, it must be assigned to a standard "class." This is a
group of from one to seven standards that is required to calibrate for a single error term.
The standards within a single class can be assigned to the locations listed in Table 7-2
according to their standard reference numbers.
A class often consists of a single standard, but may be composed of more than one standard
if band-limited standards are used. For example, if there were two load standards—a fixed
load for low frequencies, and a sliding load for high frequencies—then that class would
have two standards.
Table 7-2 Standard Class Assignments

Calibration Kit Label: _______________________

Disk File Name: _________________________________

Class Standard Reference Numbers Standard

Class
1 2 3 4 5 6 7 8 Label

S11A

S11B

S11C

S22A

S22B

S22C

Forward Transmission

Reverse Transmission

Forward Match

Reverse Match

Response

Response and Isolation

TRL thru

TRL reflect

TRL line or match

The number of standard classes required depends on the type of calibration being
performed, and is identical to the number of error terms corrected. A response calibration
requires only one class, and the standards for that class may include an open, or short, or
thru. A 1-port calibration requires three classes. A full 2-port calibration requires 10
classes, not including two for isolation.

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 Operating Concepts
Modifying Calibration Kits

The number of standards that can be assigned to a given class may vary from none (class
not used) to one (simplest class) to seven. When a certain class of standards is required
during calibration, the analyzer will display the labels for all the standards in that class
(except when the class consists of a single standard). This does not, however, mean that all
standards in a class must be measured during calibration. Unless band-limited standards
are used, only a single standard per class is required.

NOTE It is often simpler to keep the number of standards per class to the bare
minimum needed (often one) to avoid confusion during calibration.

Each class can be given a user-definable label as described under label class menus.
Standards are assigned to a class simply by entering the standard’s reference number
(established while defining a standard) under a particular class. The following is a
description of the softkeys located within the specify class menu:

• S11A allows you to enter the standard numbers for the first class required for an S11
1-port calibration. (For default calibration kits, this is the open.)
• S11B allows you to enter the standard numbers for the second class required for an
S11 1-port calibration. (For default calibration kits, this is the short.)

• S11C allows you to enter the standard numbers for the third class required for an S11
1-port calibration. (For default calibration kits, this is the load.)
• S22A allows you to enter the standard numbers for the first class required for an S22
1-port calibration. (For default calibration kits, this is the open.)
• S22B allows you to enter the standard numbers for the second class required for an
S22 1-port calibration. (For default calibration kits, this is the short.)

• S22C allows you to enter the standard numbers for the third class required for an S22
1-port calibration. (For default calibration kits, this is the load.)
• FWD TRANS allows you to enter the standard numbers for the forward transmission
thru calibration. (For default calibration kits, this is the thru.)
• REV TRANS allows you to enter the standard numbers for the reverse transmission
(thru) calibration. (For default calibration kits, this is the thru.)
• FWD MATCH allows you to enter the standard numbers for the forward match (thru)
calibration. (For default calibration kits, this is the thru.)
• REV MATCH allows you to enter the standard numbers for the reverse match (thru)
calibration. (For default calibration kits, this is the thru.)
• RESPONSE allows you to enter the standard numbers for a response calibration. This
calibration corrects for frequency response in either reflection or transmission
measurements, depending on the parameter being measured when a calibration is
performed. (For default kits, the standard is either the open or short for reflection
measurements, or the thru for transmission measurements.)

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Operating Concepts
Modifying Calibration Kits

• RESPONSE &ISOL’N allows you to enter the standard numbers for a response &
isolation calibration. This calibration corrects for frequency response and directivity in
reflection measurements, or frequency response and isolation in transmission
measurements.
• TRL THRU allows you to enter the standard numbers for a TRL thru calibration.
• TRL REFLECT allows you to enter the standard numbers for a TRL reflect
calibration.
• TRL LINE OR MATCH allows you to enter the standard numbers for a TRL line or
match calibration.

Label Class Menu

The label class menus are used to define meaningful labels for the calibration classes.
These then become softkey labels during a measurement calibration. Labels can be up to
ten characters long.

Label Kit Menu

This LABEL KIT softkey within the modify cal kit menu, accesses this menu. It is
identical to the label class menu and the label standard menu previously described. It
allows definition of a label up to eight characters long.
After a new calibration kit has been defined, be sure to specify a label for it. Choose a label
that describes the connector type of the calibration devices. This label will then appear in
the CAL KIT [ ] softkey label in the correction menu and the MODIFY [ ] label in the
select cal kit menu. It will be saved with calibration sets.

Verify Performance
Once a measurement calibration has been generated with a user-defined calibration kit, its
performance should be checked before making device measurements. To check the
accuracy that can be obtained using the new calibration kit, a device with a well-defined
frequency response (preferably unlike any of the standards used) should be measured. The
verification device must not be one of the calibration standards: measurement of one of
these standards is merely a measure of repeatability.
To achieve more complete verification of a particular measurement calibration, accurately
known verification standards with a diverse magnitude and phase response should be
used. National standard traceable or Agilent standards are recommended to achieve
verifiable measurement accuracy.

NOTE The published specifications for this network analyzer system include
accuracy enhancement with compatible calibration kits. Measurement
calibrations made with user-defined or modified calibration kits are not
subject to the analyzer specifications, although a procedure similar to the
system verification procedure may be used.

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Modifying Calibration Kits

Saving Modified Calibration Kits to a Disk

The calibration kit, along with any calibration data and other instrument state
information, can be saved to an ISTATE file on a floppy disk. To save a modified calibration
kit with an instrument state, press:

Cal CAL KIT SELECT CAL KIT USER KIT

Save/Recall SAVE STATE

Modifying and Saving a Calibration Kit from the Calibration Kit

Selection Menu
To modify a calibration kit from the calibration kit selection menu, press:

Cal CAL KIT SELECT CAL KIT MODIFY KIT DONE (MODIFIED)
To save the modified calibration kit, press:

Cal CAL KIT SELECT CAL KIT USER KIT SAVE USER KIT or
Save/Recall SAVE STATE .

Ensure that USER KIT is underlined before saving the modified user kit.

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Operating Concepts
TRL*/LRM* Calibration

TRL*/LRM* Calibration
The network analyzer has the capability of making calibrations using the "TRL"
(thru-reflect-line) method. This section contains information on the following subjects:
• Why Use TRL Calibration?
• TRL Terminology
• How TRL*/LRM* Calibration Works
• Improving Raw Source Match and Load Match for TRL*/LRM* Calibration
• The TRL Calibration Procedure
— Requirements for TRL Standards
— TRL Options

Why Use TRL Calibration?

This method is convenient in that calibration standards can be fabricated for a specific
measurement environment, such as a transistor test fixture or microstrip. Microstrip
devices in the form of chips, MMIC's, packaged transistors, or beam-lead diodes cannot be
connected directly to the coaxial ports of the analyzer. The device under test (DUT) must
be physically connected to the network analyzer by some kind of transition network or
fixture. Calibration for a fixtured measurement in microstrip presents additional
difficulties.
A calibration at the coaxial ports of the network analyzer removes the effects of the
network analyzer and any cables or adapters before the fixture; however, the effects of the
fixture itself are not accounted for. An in-fixture calibration is preferable, but high-quality
short-open-load- thru (SOLT) standards may not be readily available to allow a
conventional full 2-port calibration of the system at the desired measurement plane of the
device. In microstrip, a short circuit is inductive, an open circuit radiates energy, and a
high-quality purely resistive load is difficult to produce over a broad frequency range. The
Thru-Reflect-Line (TRL) 2-port calibration is an alternative to the traditional SOLT Full
2-port calibration technique that utilizes simpler, more convenient standards for device
measurements in the microstrip environment.
For coaxial, waveguide and other environments where high-quality impedance standards
are readily available, the traditional short, open, load, thru (SOLT) method provides the
most accurate results since all of the significant systematic errors are reduced. This
method is implemented in the form of the S11 1-port, S22 1-port, and full 2-port calibration
selections.
In all measurement environments, you must provide calibration standards for the desired
calibration to be performed. The advantage of TRL is that only three standards need to be
characterized as opposed to 4 in the traditional open, short, load, and thru full 2-port
calibrations. Further, the requirements for characterizing the T, R, and L standards are
less stringent and these standards are more easily fabricated.

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 Operating Concepts
TRL*/LRM* Calibration

TRL Terminology
Notice that the letters TRL, LRL, LRM, etc. are often interchanged, depending on the
standards used. For example, "LRL" indicates that two lines and a reflect standard are
used; "TRM" indicates that a thru, reflection and match standards are used. All of these
refer to the same basic method.
TRL* calibration is a modified form of TRL calibration. It is adapted for a receiver with
three samplers instead of four samplers. The TRL* calibration is not as accurate as the
TRL calibration because it cannot isolate the source match from the load match, so it
assumes load match and source match are equal.

How TRL*/LRM* Calibration Works

The TRL*/LRM* calibration used in the analyzer relies on the characteristic impedance of
simple transmission lines rather than on a set of discrete impedance standards. Since
transmission lines are relatively easy to fabricate (in a microstrip, for example), the
impedance of these lines can be determined from the physical dimensions and substrate’s
dielectric constant.

TRL* Error Model

Figure 7-43 Functional Block Diagram for a 2-Port Error-Corrected

Measurement System

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Operating Concepts
TRL*/LRM* Calibration

For the analyzer TRL* 2-port calibration, a total of 10 measurements are made to quantify
eight unknowns (not including the two isolation error terms). Assume the two
transmission leakage terms, EXF and EXR, are measured using the conventional technique.
The eight TRL error terms are represented by the error adapters shown in Figure 7-43.
Although this error model is slightly different from the traditional Full 2-port 12-term
model, the conventional error terms may be derived from it. For example, the forward
reflection tracking (E RF) is represented by the product of ε10 and ε01. Also notice that the
forward source match (ESF) and reverse load match (E LR) are both represented by ε11,
while the reverse source match (ESR) and forward load match (ELF) are both represented
by ε22. In order to solve for these eight unknown TRL error terms, eight linearly
independent equations are required.
The first step in the TRL* 2-port calibration process is the same as the transmission step
for a Full 2-port calibration. For the thru step, the test ports are connected together
directly (zero length thru) or with a short length of transmission line (non- zero length
thru) and the transmission frequency response and port match are measured in both
directions by measuring all four S-parameters.
For the reflect step, identical high reflection coefficient standards (typically open or short
circuits) are connected to each test port and measured (S11 and S22).
For the line step, a short length of transmission line (different in length from the thru) is
inserted between port 1 and port 2 and again the frequency response and port match are
measured in both directions by measuring all four S-parameters.
In total, ten measurements are made, resulting in ten independent equations. However,
the TRL error model has only eight error terms to solve for. The characteristic impedance
of the line standard becomes the measurement reference and, therefore, has to be assumed
ideal (or known and defined precisely).
At this point, the forward and reverse directivity (EDF and EDR), transmission tracking
(ETF and ETR), and reflection tracking (ERF and ERR) terms may be derived from the TRL
error terms. This leaves the isolation (EXF and EXR), source match (ESF and ESR) and load
match (ELF and ELR) terms to discuss.

Isolation
Two additional measurements are required to solve for the isolation terms (EXF and EXR).
Isolation is characterized in the same manner as the Full 2-port calibration. Forward and
reverse isolation are measured as the leakage (or crosstalk) from port 1 to port 2 with each
port terminated. The isolation part of the calibration is generally only necessary when
measuring high loss devices (greater than 70 dB).

NOTE If an isolation calibration is performed, the fixture leakage must be

the same during the isolation calibration and the measurement.

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 Operating Concepts
TRL*/LRM* Calibration

Figure 7-44 8-term TRL (or TRL*) Error Model and Generalized Coefficients

Source match and load match

A TRL calibration assumes a perfectly balanced test set architecture as shown by the term
which represents both the forward source match (ESF) and reverse load match (E LR), and
by the ε22 term which represents both the reverse source match (ESR) and forward load
match (ELF). However, in any switching test set, the source and load match terms are not
equal because the transfer switch presents a different terminating impedance as it is
changed between port 1 and port 2.
Because the standard network analyzer is based on a three-sampler receiver architecture,
it is not possible to differentiate the source match from the load match terms. The
terminating impedance of the switch is assumed to be the same in either direction.
Therefore, the test port mismatch cannot be fully corrected. An assumption is made that:
forward source match (ESF ) = reverse load match (ELR) = ε11
reverse source match (E SR ) = forward load match (ELF) = ε22
For a fixture, TRL* can eliminate the effects of the fixture’s loss and length, but does not
completely remove the effects due to the mismatch of the fixture.

NOTE Because the TRL technique relies on the characteristic impedance of

transmission lines, the mathematically equivalent method LRM (for
line-reflect-match) may be substituted for TRL. Since a well matched
termination is, in essence, an infinitely long transmission line, it is well
suited for low (RF) frequency calibrations. Achieving a long line standard for
low frequencies is often times physically impossible.

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Operating Concepts
TRL*/LRM* Calibration

Improving Raw Source Match and Load Match for TRL*/LRM*

Calibration
A technique that can be used to improve the raw test port mismatch is to add high quality
fixed attenuators. The effective match of the system is improved because the fixed
attenuators usually have a return loss that is better than that of the network analyzer.
Additionally, the attenuators provide some isolation of reflected signals. The attenuators
also help to minimize the difference between the port source match and load match,
making the error terms more equivalent.
With the attenuators in place, the effective port match of the system is improved so that
the mismatch of the fixture transition itself dominates the measurement errors after a
calibration.

Figure 7-45 Typical Measurement Set up

If the device measurement requires bias, it will be necessary to add external bias tees
between the fixed attenuators and the fixture. The internal bias tees of the analyzer will
not pass the bias properly through the external fixed attenuators. Be sure to calibrate with
the external bias tees in place (no bias applied during calibration) to remove their effect
from the measurement.
Because the bias tees must be placed after the attenuators, they essentially become part of
the fixture. Their mismatch effects are the same for source match and load match, so the
TRL CAL routine will correct for their effects. Although the fixed attenuators improve the
raw mismatch of the network analyzer system, they also degrade the overall measurement
dynamic range.
This effective mismatch of the system after calibration has the biggest effect on reflection
measurements of highly reflective devices. Likewise, for well matched devices, the effects
of mismatch are negligible. This can be shown by the following approximation:

Reflection magnitude uncertainty = ED + ERS11 + ES(S11)2 + ELS21S12

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 Operating Concepts
TRL*/LRM* Calibration

Transmission magnitude uncertainty = EX + ETS21 + ESS11S21 + E LS22S21

where:
E D = effective directivity
E R = effective reflection tracking
E S = effective source match
E L = effective load match
E X = effective crosstalk
E T = effective transmission tracking
Sxx= S-parameters of the device under test

The TRL Calibration Procedure

Requirements for TRL Standards

When building a set of TRL standards for a microstrip or fixture environment, the
requirements for each of these standard types must be satisfied.

Types Requirements
THRU
(Zero length) • No loss. Characteristic impedance (Z0 ) need not be known.
• S21= S12= 1 ∠0°
• S11= S22 = 0
THRU
(Non-zero
length) • Z0 of the thru must be the same as the line. (If they are not the same,
the average impedance is used.)
• Attenuation of the thru need not be known.
• If the thru is used to set the reference plane, the insertion phase or
electrical length must be well-known and specified. If a non-zero length
thru is specified to have zero delay, the reference plane is established in
the middle of the thru, resulting in phase errors during measurement of
devices.
REFLECT • Reflection coefficient Γ magnitude is optimally 1.0, but need not be
known.
• Phase of Γ must known and specified to within ± 1/4 wavelength or
± 90°. During computation of the error model, the root choice in the
solution of a quadratic equation is based on the reflection data. An error
in definition would show up as a 180° error in the measured phase.

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Operating Concepts
TRL*/LRM* Calibration

• Γ must be identical on both ports.

• If the reflect is used to set the reference plane, the phase response must
be well-known and specified.
LINE/MATCH
(LINE) • Z0 of the line establishes the reference impedance of the measurement
(i.e. S11= S22 = 0). The calibration impedance is defined to be the same
as Z0 of the line. If the Z0 is known but not the desired value (i.e., not
equal to 50 Ω), the SYSTEMS Z0 selection under the TRL/LRM options
menu is used.
• Insertion phase of the line must not be the same as the thru (zero
length or non-zero length). The difference between the thru and line
must be between (20° and 160°) ± n x 180°. Measurement uncertainty
will increase significantly when the insertion phase nears 0 or an
integer multiple of 180°.
• Optimal line length is 1/4 wavelength or 90° of insertion phase relative
to the thru at the middle of the desired frequency span.
• Usable bandwidth for a single thru/line pair is 8:1 (frequency span:start
frequency).
• Multiple thru/line pairs (Z0 assumed identical) can be used to extend
the bandwidth to the extent transmission lines are available.
• Attenuation of the line need not be known.
• Insertion phase must be known and specified within ± 1/4 wavelength
or ± 90°.
LINE/MATCH
(MATCH) • Z0 of the match establishes the reference impedance of the
measurement.
• Γ must be identical on both ports.

Fabricating and defining calibration standards for TRL/LRM

When calibrating a network analyzer, the actual calibration standards must have known
physical characteristics. For the reflect standard, these characteristics include the offset in
electrical delay (seconds) and the loss (ohms/second of delay). The characteristic
impedance, OFFSET Z0 , is not used in the calculations in that it is determined by the line
standard. The reflection coefficient magnitude should optimally be 1.0, but need not be
known since the same reflection coefficient magnitude must be applied to both ports.
The thru standard may be a zero-length or known length of transmission line. The value of
length must be converted to electrical delay, just like that done for the reflect standard.
The loss term must also be specified.

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TRL*/LRM* Calibration

The line standard must meet specific frequency related criteria, in conjunction with the
length used by the thru standard. In particular, the insertion phase of the line must not be
the same as the thru. The optimal line length is 1/4 wavelength (90 degrees) relative to a
zero length thru at the center frequency of interest, and between 20 and 160 degrees of
phase difference over the frequency range of interest. (Note: these phase values can be
±N × 180 degrees where N is an integer.) If two lines are used (LRL), the difference in
electrical length of the two lines should meet these optimal conditions. Measurement
uncertainty will increase significantly when the insertion phase nears zero or is an integer
multiple of 180 degrees, and this condition is not recommended.
For a transmission media that exhibits linear phase over the frequency range of interest,
the following expression can be used to determine a suitable line length of one-quarter
wavelength at the center frequency (which equals the sum of the start frequency and stop
frequency divided by 2):

Electrical length ( cm ) = ( LINE – 0 length THRU )

( 15000 × V F )
Electrical length ( cm ) = --------------------------------------------------
f1 ( MHz ) + f2 ( MHz )
-

let:
f1 = 1000 MHz
f2 = 2000 MHz
VF = Velocity Factor = 1 (for this example)
Thus, the length to initially check is 5 cm.
Next, use the following to verify the insertion phase at f1 and f2:

( 360 × f × l -)
Phase ( degrees ) = ----------------------------
v

where:
f = frequency
l = length of line
v = velocity = speed of light × velocity factor
which can be reduced to the following using frequencies in MHz and length in centimeters:

0.012 × f ( MHz ) × l ( cm )
Phase ( degrees ) approx = ----------------------------------------------------------
VF
-

7- 73
Operating Concepts
TRL*/LRM* Calibration

So for an air line (velocity factor approximately 1) at 1000 MHz, the insertion phase is
60 degrees for a 5 cm line; it is 120 degrees at 2000 MHz. This line would be a suitable line
standard.
For microstrip and other fabricated standards, the velocity factor is significant. In those
cases, the phase calculation must be divided by that factor. For example, if the dielectric
constant for a substrate is 10, and the corresponding "effective" dielectric constant for
microstrip is 6.5, then the "effective" velocity factor equals 0.39 (1 ÷ square root of 6.5).
Using the first equation with a velocity factor of 0.39, the initial length to test would be
1.95 cm. This length provides an insertion phase at 1000 MHz of 60 degrees; at 2000 MHz,
120 degrees (the insertion phase should be the same as the air line because the velocity
factor was accounted for when using the first equation).
Another reason for showing this example is to point out the potential problem in
calibrating at low frequencies using TRL. For example, one-quarter wavelength is

7500 × VF-
Length ( cm ) = -------------------------
fc
where:
• fc = center frequency
Thus, at 50 MHz,
7500
Length ( cm ) = ----------------------
50 ( MHz )
- = 150 cm or 1.5 m

Such a line standard would not only be difficult to fabricate, but its long term stability and
usability would be questionable as well.
Thus at lower frequencies or very broad band measurements, fabrication of a "match" or
termination may be deemed more practical. Since a termination is, in essence, an infinitely
long transmission line, it fits the TRL model mathematically, and is sometimes referred to
as a "TRM" calibration.
The TRM calibration technique is related to TRL with the difference being that it bases the
characteristic impedance of the measurement on a matched Z O termination instead of a
transmission line for the third measurement standard. Like the TRL thru standard, the
TRM THRU standard can either be of zero length or non-zero length. The same rules for
thru and reflect standards used for TRL apply for TRM.
TRM has no inherent frequency coverage limitations which makes it more convenient in
some measurement situations. Additionally, because TRL requires a different physical
length for the thru and the line standards, its use becomes impractical for fixtures with
contacts that are at a fixed physical distance from each other.

7-74
 Operating Concepts
TRL*/LRM* Calibration

For information on how to modify calibration constants for TRL*/LRM*, and how to
perform a TRL or TRM calibration, refer to “Calibrating for Non-Coaxial Devices” on
page 6-52.

TRL Options
The TRL/LRM OPTION softkey accesses the TRL/LRM options menu. There are two
selections under this menu:

• CAL ZO: (calibration Z 0)

• SET REF: (set reference)

The characteristic impedance used during the calibration can be referenced to either the
line (or match) standard ( CAL ZO: LINE ZO ) or to the system ( CAL ZO: SYSTEM ZO ).
The analyzer defaults to a calibration impedance that is equal to the line (or match)
standard.
When the CAL ZO: LINE ZO is selected, the impedance of the line (or match) standard is
assumed to match the system impedance exactly (the line standard is reflectionless). After
a calibration, all measurements are referenced to the impedance of the line standard. For
example, when the line standard is remeasured, the response will appear at the center of
the Smith chart. When CAL ZO: LINE ZO is selected, the values entered for SET ZO
(under Cal menu) and OFFSET ZO (within the define standard menu) are ignored.
CAL ZO: SYSTEM ZO is selected when the desired measurement impedance differs from
the impedance of the line standard. This requires a knowledge of the exact value of the Z0
of the line. The system reference impedance is set using SET ZO under the calibration
menu. The actual impedance of the line is set by entering the real part of the line
impedance as the OFFSET ZO within the define standard menu. For example, if the line
was known to have a characteristic impedance of 51 Ω ( OFFSET ZO = 51 Ω), it could still
be used to calibrate for a 50 Ω measurement ( SET ZO = 50 Ω). After a calibration, all
measurements would be referenced to 50 Ω, instead of 51 Ω. When the line standard is
remeasured, the center of the Smith chart is at the current value of SET ZO (in this case,
50 Ω). Since only one value of offset Z0 can be selected for the line standard, the value of Z0
should be a constant value over the frequency range of interest in order to be meaningful.
The location of the reference plane is determined by the selection of SET REF: THRU and
SET REF: REFLECT . By default, the reference plane is set with the thru standard which
must have a known insertion phase or electrical length. If a non-zero length thru is
specified to have zero delay, the reference plane will be established in the middle of the
thru. The reflect standard may be used to set the reference plane instead of the thru
provided the phase response (offset delay, reactance values and standard type) of the
reflect standard is known and is specified in the calibration kit definition.

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Operating Concepts
TRL*/LRM* Calibration

NOTE Dispersion Effects

Dispersion occurs when a transmission medium exhibits a variable
propagation or phase velocity as a function of frequency. The result of
dispersion is a non-linear phase shift versus frequency, which leads to a group
delay which is not constant. Fortunately, the TRL calibration technique
accounts for dispersive effects of the test fixture up to the calibration plane,
provided that:
1. The thru (zero or non-zero length) is defined as having zero electrical
length and is used to set the reference plane ( SET REF: THRU ).
2. The transmission lines used as calibration standards have identical
dispersion characteristics (i.e., identical height, width and relative
dielectric constant).
When a non-zero length thru is used to set the reference plane, it should be
defined as having zero length in the TRL standards definition, even though it
has physical length. The actual electrical length of the thru standard must
then be subtracted from the actual electrical length of each line standard in
the TRL calibration kit definition. The device must then be mounted between
two short lengths of transmission line so that each length is exactly one-half
of the length of the non-zero length thru standard. In this configuration, the
measurement will be properly calibrated up to the point of the device.

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 Operating Concepts
GPIB Operation

GPIB Operation
This section contains information on the following topics:
• local key
• GPIB controller modes
• instrument addresses
• using the parallel port

Local Key
This key is allows you to return the analyzer to local (front panel) operation from remote
(computer controlled) operation. This key will also abort a test sequence or hardcopy
print/plot. In this local mode, with a controller still connected on GPIB, you can operate the
analyzer manually (locally) from the front panel. This is the only front panel key that is
not disabled when the analyzer is remotely controlled over GPIB by a computer. The
exception to this is when local lockout is in effect: this is a remote command that disables
the Local key, making it difficult to interfere with the analyzer while it is under
computer control.
In addition, the Local key accesses the GPIB menu, where you can set the controller
mode, and to the address menu, where you can enter the GPIB addresses of peripheral
devices and select plotter/printer ports. You can also set the mode of the parallel port here.
The GPIB menu consists of the following softkeys:

• SYSTEM CONTROLLER
• TALKER/LISTENER
• USE PASS CONTROL
• SET ADDRESS
• PARALLEL [ ]
• GPIB DIAG on OFF
• DISK UNIT NUMBER
• VOLUME NUMBER
The analyzer is factory-equipped with a remote programming interface using the General
Purpose Interface Bus (GPIB). This enables communication between the analyzer and a
controlling computer as well as other peripheral devices. This menu indicates the present
GPIB controller mode of the analyzer. Three GPIB modes are possible: system controller,
talker/listener, and pass control.

7- 77
Operating Concepts
GPIB Operation

GPIB STATUS Indicators

When the analyzer is connected to other instruments over GPIB, the GPIB STATUS
indicators in the instrument state function block light up to display the current status of
the analyzer.
R = remote operation
L = listen mode
T = talk mode
S = service request (SRQ) asserted by the analyzer

System Controller Mode

The SYSTEM CONTROLLER softkey activates the system controller mode. When in this
mode, the analyzer can use GPIB to control compatible peripherals, without the use of an
external computer. It can output measurement results directly to a compatible printer or
plotter, store instrument states using a compatible disk drive, or control a power meter for
performing service routines. The power meter calibration function requires system
controller or pass control mode.

Talker/Listener Mode
The TALKER/LISTENER softkey activates the talker/listener mode, which is the mode of
operation most often used. In this mode, a computer controller communicates with the
analyzer and other compatible peripherals over the bus. The computer sends commands or
instructions to and receives data from the analyzer. All of the capabilities available from
the analyzer front panel can be used in this remote operation mode, except for control of
the power line switch and some internal tests.

Pass Control Mode

The USE PASS CONTROL softkey activates the third mode of GPIB operation: the pass
control mode. In an automated system with a computer controller, the controller can pass
control of the bus to the analyzer on request from the analyzer. The analyzer is then the
controller of the peripherals, and can direct them to plot, print, or store without going
through the computer. When the peripheral operation is complete, control is passed back to
the computer. Only one controller can be active at a time. The computer remains the
system controller, and can regain control at any time.
Preset does not affect the selected controller mode, but cycling the power returns the
analyzer to talker/listener mode.
Information on compatible peripherals is provided in the “Options and Accessories”
chapter of the reference guide.

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 Operating Concepts
GPIB Operation

Address Menu
This menu can be accessed by pressing the SET ADDRESS softkey within the GPIB
menu.
In communications through the General Purpose Interface Bus (GPIB), each instrument
on the bus is identified by a GPIB address. This decimal-based address code must be
different for each instrument on the bus.
This menu lets you set the GPIB address of the analyzer, and enter the addresses of
peripheral devices so that the analyzer can communicate with them.
Most of the GPIB addresses are set at the factory and need not be modified for normal
system operation. The standard factory-set addresses for instruments that may be part of
the system are as follows:

Instrument GPIB Address

(decimal)

Analyzer 16

Plotter 05

Printer 01

External Disk Drive 00

Controller 21

Power Meter 13

The address displayed in this menu for each peripheral device must match the address set
on the device itself. The analyzer does not have a GPIB switch: its address is set only from
the front panel.
These addresses are stored in non-volatile memory and are not affected by preset or by
cycling the power.

Using the Parallel Port

The instrument’s parallel port can be used in two different modes. By pressing Local and
then toggling the PARALLEL [ ] softkey, you can select either the [COPY] mode or the
[GPIO] mode.

The Copy Mode

The copy mode allows the parallel port to be connected to a printer or plotter for the
outputting of test results. To use the parallel port for printing or plotting, you must do the
following:

1. Press Local SET ADDRESSES .

2. Select either PLOTTER PORT or PRINTER PORT .
3. Select PARALLEL so that copy is underlined.

7- 79
Operating Concepts
GPIB Operation

The GPIO Mode

The GPIO mode turns the parallel port into a "general purpose input/output" port.
In this mode the port can be connected to test fixtures, power supplies, and other
peripheral equipment that might be used to interact with the analyzer during
measurements. This mode is exclusively used in test sequencing.

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 Operating Concepts
Limit Line Operation

Limit Line Operation

This menu can be accessed by pressing LIMIT MENU LIMIT LINE within the system
menu.
You can have limit lines drawn on the display to represent upper and lower limits or device
specifications with which to compare the test device. Limits are defined in segments,
where each segment is a portion of the stimulus span. Each limit segment has an upper
and a lower starting limit value. Three types of segments are available: flat line, sloping
line, and single point.
Limits can be defined independently for the four channels, up to 22 segments for each
channel. These can be in any combination of the three limit types.
Limit testing compares the measured data with the defined limits, and provides pass or
fail information for each measured data point. An out-of-limit test condition is indicated in
five ways: with a FAIL message on the screen, with a beep, by changing the color of the
failing portions of a trace, with an asterisk in tabular listings of data, and with a bit in the
GPIB event status register B. (The analyzer also has a BNC rear panel output that
includes this status, but is only valid for a single channel measurement.)

NOTE The limit test output has three selectable modes. For more information, refer
to “Using Limit Lines to Test a Device” on page 1-71.

Limit lines and limit testing can be used simultaneously or independently. If limit lines are
on and limit testing is off, the limit lines are shown on the display for visual comparison
and adjustment of the measurement trace. However, no pass/fail information is provided.
If limit testing is on and limit lines are off, the specified limits are still valid and the
pass/fail status is indicated even though the limit lines are not shown on the display.
Limits are entered in tabular form. Limit lines and limit testing can be either on or off
while limits are defined. As new limits are entered, the tabular columns on the display are
updated, and the limit lines (if on) are modified to the new definitions. The complete limit
set can be offset in either stimulus or amplitude value.
Limits are checked only at the actual measured data points. It is possible for a device to be
out of specification without a limit test failure indication if the point density is insufficient.
Be sure to specify a high enough number of measurement points in the stimulus menu.
Limit lines are displayed only on Cartesian formats. In polar and Smith chart formats,
limit testing of one value is available: the value tested depends on the marker mode and is
the magnitude or the first value in a complex pair. The message NO LIMIT LINES
DISPLAYED is shown on the display in polar and Smith chart formats.
The list values feature in the copy menu provides tabular listings to the display or a
printer for every measured stimulus value. These include limit line or limit test
information if these functions are activated. If limit testing is on, an asterisk is listed next
to any measured value that is out of limits. If limit lines are on, and other listed data
allows sufficient space, the upper limit and lower limit are listed, together with the margin
by which the device data passes or fails the nearest limit.

7- 81
Operating Concepts
Limit Line Operation

If limit lines are on, they are plotted with the data on a plot. If limit testing is on, the PASS
or FAIL message is plotted, and the failing portions of the trace that are a different color on
the display are also a different color on the plot. If limits are specified, they are saved in
memory with an instrument state.

Edit Limits Menu

This menu allows you to specify limits for limit lines or limit testing, and presents a table
of limit values on the display. Limits are defined in segments. Each segment is a portion of
the stimulus span. Up to 22 limit segments can be specified for each channel. The limit
segments do not have to be entered in any particular order: the analyzer automatically
sorts them and lists them on the display in increasing order of start stimulus value.
For each segment, the table lists the segment number, the starting stimulus value, upper
limit, lower limit, and limit type. The ending stimulus value is the start value of the next
segment, or a segment can be terminated with a single point segment. You can enter limit
values as upper and lower limits or delta limits and middle value. As new limit segments
are defined, the tabular listing is updated. If limit lines are switched on, they are shown on
the display.
If no limits have been defined, the table of limit values shows the notation EMPTY. Limit
segments are added to the table using the ADD softkey or edited with the EDIT softkey,
as previously described. The last segment on the list is followed by the notation END.

Edit Segment Menu

This menu sets the values of the individual limit segments. The segment to be modified, or
a default segment, is selected in the edit limits menu. The stimulus value can be set with
the controls in the entry block or with a marker (the marker is activated automatically
when this menu is presented). The limit values can be defined as upper and lower limits, or
delta limits and middle value. Both an upper limit and a lower limit (or delta limits) must
be defined: if only one limit is required for a particular measurement, force the other out of
range (for example +500 dB or −500 dB).
As new values are entered, the tabular listing of limit values is updated.
Segments do not have to be listed in any particular order: the analyzer sorts them
automatically in increasing order of start stimulus value when the DONE key in the edit
limits menu is pressed. However, the easiest way to enter a set of limits is to start with the
lowest stimulus value and define the segments from left to right of the display, with limit
lines turned on as a visual check.
Phase limit values can be specified between +500° and −500°. Limit values above +180°
and below −180° are mapped into the range of −180° to +180° to correspond with the range
of phase data values.

Offset Limits Menu

This menu allows the complete limit set to be offset in either stimulus value or amplitude
value. This is useful for changing the limits to correspond with a change in the test setup,
or for device specifications that differ in stimulus or amplitude. It can also be used to move
the limit lines away from the data trace temporarily for visual examination of trace detail.

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 Operating Concepts
Knowing the Instrument Modes

Knowing the Instrument Modes

There are five major instrument modes of the analyzer:
• network analyzer mode
• external source mode
• tuned receiver mode
• frequency offset operation
• harmonic mode operation (Option 002)

Network Analyzer Mode

This is the standard mode of operation for the analyzer, and is active after you press
Preset or switch on the AC power. This mode uses the analyzer's internal source.

Pressing System INSTRUMENT MODE NETWORK ANALYZER returns the analyzer

to the "normal" network analyzer operating mode.

External Source Mode

This mode allows the analyzer to phase lock to an external CW signal. External source
mode is best used for unknown signals, or for signals that drift. If a synthesized external
source is used, the tuned receiver mode is recommended because it is faster.

Primary Applications
External source mode is useful in several applications:
• when your test device is a mixer or other frequency translation device
• in automated test applications where a source is already connected to the system, and
you do not want to switch between the system source and the analyzer's internal source.

Typical Test Setup

A typical test setup using the external source mode is shown in Figure 7-46. The same test
setup is applicable for either manual or automatic external source mode operation.

7- 83
Operating Concepts
Knowing the Instrument Modes

Figure 7-46 Typical Setup for the External Source Mode

External Source Mode In-Depth Description

You may use the external source in automatic or manual mode. External source mode
phase locks the analyzer to an external CW signal.

NOTE The external source mode works only in CW time sweep.

External Source Auto If you press System INSTRUMENT MODE

EXT SOURCE AUTO , the analyzer turns on the external source auto mode. You should
observe the following points when using this operation mode:
• The auto mode has a wider capture range than the manual mode.
• The manual mode is faster than the auto mode.
• The auto mode searches for the incoming CW signal.
• The capture range is typically 10% of the selected CW frequency.
• This feature works only in CW time sweep type.
• The incoming signal should not have large spurs or sidebands, as the analyzer may
phase lock on a spur or not phase lock at all.
The frequency the instrument has locked onto is shown on the analyzer, and is also
available via GPIB.

External Source Manual If you press System INSTRUMENT MODE

EXT SOURCE MANUAL , the analyzer activates the external source manual mode. You
should observe the following points when using this operation mode:
• The manual mode has a smaller capture range than the auto mode.
• The manual mode is much faster than auto mode.
• This feature works only in CW time sweep type.

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 Operating Concepts
Knowing the Instrument Modes

• The incoming signal should not have large spurs or sidebands, as the analyzer may
phase lock on a spur or not phase lock at all.
• The frequency of the incoming signal should be within −0.5 to +5.0 MHz of the selected
frequency or the analyzer will not be able to phase lock to it.

CW Frequency Range in External Source Mode 300 kHz to 3 GHz (6 GHz for Option
006)

Compatible Sweep Types The external source mode will only function in CW time
sweep. If the instrument is in any other sweep type when external source is activated, the
warning message CHANGED TO CW TIME MODE will appear on the display.

External Source Requirements The external source mode has spectral purity and
power input requirements, which are described in the specifications and characteristics
chapter of the reference guide.

Capture Range In either automatic or manual mode, you can enter the frequency of the
external CW signal using the CW FREQ softkey (located under the Stimulus Menu key).
The actual signal must be within a certain frequency capture range as shown in Table 7-3.
Table 7-3 8753ES Option 011 External Source Capture Ranges

Mode CW Frequency Capture Range

Automatic ≤ 50 MHz ±5 MHz of nominal CW frequency

> 50 MHz ±10% of nominal CW frequency

Manual All −0.5 to +5 MHz of nominal CW frequency

If the incoming signal is not within the capture range, the analyzer will not phase lock
correctly.

Locking onto a signal with a frequency modulation component Although the

analyzer may phase-lock onto a signal that has FM, it may not accurately show the signal's
amplitude. The accuracy of such measurements depends greatly on the IF bandwidth you
choose. Use the widest IF bandwidth available (3 kHz) if this problem occurs.

Tuned Receiver Mode

In the tuned receiver mode, the analyzer's receiver operates independently of any signal
source. This mode is not phase-locked and functions in all sweep types. The analyzer tunes
the receiver to a synthesized CW input signal at a precisely specified frequency. All phase
lock routines are bypassed, increasing sweep speed significantly. The external source must
be synthesized, and must drive the analyzer's external frequency reference. The analyzer's
internal source frequency is not accurate, and the internal source should not be used in the
tuned receiver mode.

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Operating Concepts
Knowing the Instrument Modes

Using the analyzer’s tuned receiver mode is useful for automated test applications where
an external synthesized source is available and applications where speed is important.
Although the tuned receiver mode can function in all sweep types, it is typically used in
CW applications.

Typical test setup

1. Activate the tuned receiver mode by pressing System INSTRUMENT MODE

TUNED RECEIVER .
2. To perform a CW measurement using the tuned receiver mode, connect the equipment
as shown in Figure 7-47.

Figure 7-47 Typical Test Setup for Tuned Receiver Mode

Tuned Receiver Mode In-Depth Description

If you press System INSTRUMENT MODE TUNED RECEIVER , the analyzer receiver
operates independently of any signal source.
The following features and limitations apply to the tuned receiver mode:
• It is a fully synthesized receiver; it does not phase-lock to any source.
• It functions in all sweep types.
• It requires a synthesized CW source whose timebase is input to the analyzer's external
frequency reference.
For more information on using the tuned receiver mode, refer to “Tuned Receiver Mode” on
page 2-24.

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 Operating Concepts
Knowing the Instrument Modes

Frequency Offset Operation

Refer to “Conversion Loss Using the Frequency Offset Mode” on page 2-11 for information
on frequency offset operation.

Harmonic Operation (Option 002 Only)

The analyzer's harmonic menu can be accessed by pressing System HARMONIC MEAS .
The harmonic measurement mode allows you to measure the second or third harmonic as
the analyzer's source sweeps fundamental frequencies above 16 MHz. The analyzer can
make harmonic measurements in any sweep type.

Typical Test Setup

Figure 7-48 Typical Harmonic Mode Test Setup

Single-Channel Operation
You can view the second or third harmonic alone by using only one of the analyzer's two
channels.

Dual-Channel Operation
To make the following types of measurements, uncouple channels 1 and 2, and switch on
dual channel.
• The analyzer measures the fundamental on one channel while measuring the second or
third harmonic on the other channel.
• The analyzer measures the second harmonic on one channel while measuring the third
harmonic on the other channel.
• Using the COUPLE PWR ON off feature, the analyzer measures the fundamental on
channel 1 while measuring the second or third harmonic in dBc on channel 2.
• Using the COUPLE PWR ON off feature, the analyzer couples power between
channels 1 and 2. This is useful when you are using the D2/D1 to D2 feature because
you can change fundamental power and see the resultant change in the harmonic
power.

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Operating Concepts
Knowing the Instrument Modes

The analyzer shows the fundamental frequency value on the display. However, a marker in
the active entry area shows the harmonic frequency in addition to the fundamental. If you
use the harmonic mode, the annotation H=2 or H=3 appears on the left-hand side of the
display. The measured harmonic cannot not exceed the frequency limitations of the
network analyzer’s receiver.

Coupling Power Between Channels 1 and 2

COUPLE PWR ON off is intended to be used with the D2/D1 toD2 on OFF softkey. You
can use the D2/D1 to D2 function in harmonic measurements, where the analyzer shows
the fundamental on channel 1 and the harmonic on channel 2. D2/D1 to D2 ratios the two,
showing the fundamental and the relative power of the measured harmonic in dBc. You
must uncouple channels 1 and 2 for this measurement, using the
COUPLED CHAN ON off softkey set to OFF to allow alternating sweeps.
After uncoupling channels 1 and 2, you may want to change the fundamental power and
see the resultant change in relative harmonic power (in dBc). COUPLE PWR ON off
allows you to change the power of both channels simultaneously, even though they are
uncoupled in all other respects.

Frequency Range
The frequency range is determined by the upper frequency range of the instrument or
system (3 or 6 GHz) and by the harmonic being displayed. The 6 GHz operation requires an
8753ET/ES Option 002 and Option 011 with Option 006. Table 7-4 shows the highest
fundamental frequency for maximum frequency and harmonic mode.
Table 7-4 Maximum Fundamental Frequency using the Harmonic Mode

Harmonic Maximum Fundamental Frequency

Measured
8753ES Option 011 8753ES Option 011 with
with Option 002 Option 002 and Option 006

2nd Harmonic 1.5 GHz 3.0 GHz

3rd Harmonic 1.0 GHz 2.0 GHz

Accuracy and Input Power

Refer to the specifications and characteristics chapter of the reference guide for
recommendations on the maximum input power and maximum source power.
Using power levels greater than the recommended values may cause undesired harmonics
in the source and receiver. The recommended power levels ensure that these harmonics are
less than −45 dBc. Use test port power to limit the input power to your test device.

7-88
 Operating Concepts
Differences between 8753 Network Analyzers

Differences between 8753 Network Analyzers

Table 7-5 Comparing the 8753A/B/C/D

Feature 8753A 8753B 8753C 8753D 8753D

Opt. 011

Fully integrated measurement system (built-in No No No Yes No

test set)
Test port power range (dBm) −a −a −a +10 to −85 −a
Auto/manual power range selecting No No No Yes No
Port power coupling/uncoupling No No No Yes No
Internal disk drive No No No Yes Yes
Precision frequency reference (Option 1D5) No No No Yes Yes
Frequency range - low end (in kHz) 300 300 300 30 30/300b
Ext. frequency range to 6 GHz (Option 006) No Yes Yes Yes Yes
75Ω system impedance (Option 075) −a −a −a Yes −a
TRL*/LRM* correction No No No Yes Yes
Power meter calibration No Yes Yes Yes Yes
Interpolated error correction No Yes Yes Yes Yes
Maximum error corrected measurement points 801 1601 1601 1601 1601
Segmented error correction in frequency list mode No No Yes Yes Yes
Color CRT No No Yes Yes Yes
Test sequencing No Yes Yes Yes Yes
Automatic sweep time No Yes Yes Yes Yes
External source capability No Yes Yes Yes Yes
Tuned receiver mode No Yes Yes Yes Yes
Printer/plotter buffer No Yes Yes Yes Yes
Harmonic measurements (Option 002) No Yes Yes Yes Yes
Frequency offset mode (mixer measurements) No Yes Yes Yes Yes
dc bias to test device −a −a −a Yes −a
Interfaces: RS-232, parallel, and DIN keyboard No No No Yes Yes
User-defined preset No No No Yes Yes
Non-volatile memory (in Kbytes) 16 16 16 512 512
Dynamic range: 30 kHz − 3 GHz 100 dB 100 dB 100 dB 110 dBc 100 dB

Dynamic range: 3 GHz − 6 GHz N/A 80 dB 80 dB 105 dB 110 dB

Real time clock No No No Yes Yes

a. For this network analyzer, the feature is dependent on the test set being used.
b. 300 kHz to 3 GHz without Option 006; 30 kHz to 6 GHz, with Option 006.
c. 90 dB from 30 kHz to 50 kHz; 100 dB from 300 kHz to 16 MHz.

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Operating Concepts
Differences between 8753 Network Analyzers

Table 7-6 Comparing the 8753D/E/ES

Feature 8753D 8753E 8753ES

Fully integrated measurement system (built-in test set) Yes Yes Yes
Test port power range (dBm) +10 to −85 +10 to −85 +10 to −85
Auto/manual power range selecting Yes Yes Yes
Port power coupling/uncoupling Yes Yes Yes
Internal disk drive Yes Yes Yes
Flash EPROM No Yes Yes
Precision frequency reference (Option 1D5) Yes Yes Yes
Frequency range - low end (in kHz) 30 30 30
Ext. frequency range to 6 GHz (Option 006) Yes Yes Yes
75Ω system impedance (Option 075) Yes Yes Yes
TRL*/LRM* correction Yes Yes Yes
Power meter calibration Yes Yes Yes
Interpolated error correction Yes Yes Yes
Enhanced response calibration No Yes Yes
Maximum error corrected measurement points 1601 1601 1601
Configurable test set (Option 014) No Yes Yes
Segmented error correction in frequency list mode Yes Yes Yes
Swept list frequency sweep No Yes Yes
Sweep speed (201 points, one-port cal, ms) 200 77 70
Sweep speed (201 points, full 2-port cal) 510 145 121
Speed in time domain transform 350 46 42
Data I/O speed (GPIB) (ms, internal binary) 35 11 16
Four parameter display No Yes Yes
Markers/display channel 4 5 5
Total viewable markers at any time 8 20 20
Color display Yes Yes Yes
Flat panel LCD No Yes Yes
VGA output No Yes Yes
Delete display (Option 1DT) No Yes No
Test sequencing Yes Yes Yes
Automatic sweep time Yes Yes Yes
External source capability Yes Yes Yes
Tuned receiver mode Yes Yes Yes
Printer/plotter buffer Yes Yes Yes
Harmonic measurements (Option 002) Yes Yes Yes
Frequency offset mode (mixer measurements) Yes Yes Yes
dc bias to test device Yes Yes Yes

7-90
 Operating Concepts
Differences between 8753 Network Analyzers

Table 7-6 Comparing the 8753D/E/ES (Continued)

Feature 8753D 8753E 8753ES

Interfaces: RS-232, parallel, and DIN keyboard Yes Yes Yes
User-defined preset Yes Yes Yes
Non-volatile memory (in Kbytes) 512 2000 2000
Dynamic range: 30 kHz − 3 GHz 110 dB a
110 dB a 110 dB a
Dynamic range: 3 GHz − 6 GHz 105 dB 105 dB 105 dB
Real time clock Yes Yes Yes

a. 90 dB from 30 kHz to 50 kHz; 100 dB from 300 kHz to 16 MHz.

Table 7-7 Comparing the 8753D/E/ES Option 011 Network Analyzers

Feature 8753D 8753E 8753ES
Option 011 Option 011 Option 011

Fully integrated measurement system (built-in test set) No No No

Test port power range (dBm) −a −a −a
Auto/manual power range selecting No No No
Port power coupling/uncoupling No No No
Internal disk drive Yes Yes Yes
Flash EPROM No Yes Yes
Precision frequency reference (Option 1D5) Yes Yes Yes
Frequency range - low end (in kHz) 30/300b 30/300b 30/300b
Ext. frequency range to 6 GHz (Option 006) Yes Yes Yes
75Ω system impedance (Option 075) −a −a −a
TRL*/LRM* correction Yes Yes Yes
Power meter calibration Yes Yes Yes
Interpolated error correction Yes Yes Yes
Enhanced response calibration No Yes Yes
Maximum error corrected measurement points 1601 1601 1601
Configurable test set (Option 014) N/A N/A N/A
Segmented error correction in frequency list mode Yes Yes Yes
Swept list frequency sweep No Yes Yes
Sweep speed (201 points, one-port cal, ms) 200 77 70
Sweep speed (201 points, full 2-port cal) 510 145 121
Speed in time domain transform 350 46 42
Data I/O speed (GPIB) (ms, internal binary) 35 11 16
Four parameter display No Yes Yes
Markers/display channel 4 5 5
Total viewable markers at any time 8 20 20

7- 91
Operating Concepts
Differences between 8753 Network Analyzers

Table 7-7 Comparing the 8753D/E/ES Option 011 Network Analyzers (Continued)

Feature 8753D 8753E 8753ES

Option 011 Option 011 Option 011

Color display Yes Yes Yes

Flat panel LCD No Yes Yes
VGA output No Yes No
Delete display (Option 1DT) No Yes No
Test sequencing Yes Yes Yes
Automatic sweep time Yes Yes Yes
External source capability Yes Yes Yes
Tuned receiver mode Yes Yes Yes
Printer/plotter buffer Yes Yes Yes
Harmonic measurements (Option 002) Yes Yes Yes
Frequency offset mode (mixer measurements) Yes Yes Yes
a a
dc bias to test device − − −a
Interfaces: RS-232, parallel, and DIN keyboard Yes Yes Yes
User-defined preset Yes Yes Yes
Non-volatile memory (in Kbytes) 512 2000 2000
Dynamic range: 30 kHz − 3 GHz 100 dB 100 dB 100 dB
Dynamic range: 3 GHz − 6 GHz 110 dB 110 dB 110 dB
Real time clock Yes Yes Yes

a. For this network analyzer, the feature is dependent on the test set being used.
b. 300 kHz to 3 GHz without Option 006; 30 kHz to 6 GHz, with Option 006.

7-92
8 Safety and Regulatory Information

8-1
Safety and Regulatory Information
General Information

General Information

Maintenance
Clean the cabinet, using a dry or damp cloth only.

WARNING To prevent electrical shock, disconnect the analyzer from mains

before cleaning. Use a dry cloth or one slightly dampened with water
to clean the external case parts. Do not attempt to clean internally.

Assistance
Product maintenance agreements and other customer assistance agreements are available
for Agilent Technologies products.
For any assistance, contact your nearest Agilent Technologies Sales and Service Office.

Shipment for Service

If you are sending the instrument to Agilent Technologies for service, ship the analyzer to
the nearest service center for repair, including a description of any failed test and any error
message. Ship the analyzer using the original or comparable antistatic packaging
materials.

8-2
 Safety and Regulatory Information
General Information

Table 8-1 Contacting Agilent

Online assistance: www.agilent.com/find/assist

United States Latin America Canada Europe

(tel) 1 800 452 4844 (tel) (305) 269 7500 (tel) 1 877 894 4414 (tel) (+31) 20 547 2323
(fax) (305) 269 7599 (fax) (905) 282-6495 (fax) (+31) 20 547 2390

New Zealand Japan Australia

(tel) 0 800 738 378 (tel) (+81) 426 56 7832 (tel) 1 800 629 485
(fax) (+64) 4 495 8950 (fax) (+81) 426 56 7840 (fax) (+61) 3 9210 5947

Asia Call Center Numbers

Country Phone Number Fax Number

Singapore 1-800-375-8100 (65) 836-0252

Malaysia 1-800-828-848 1-800-801664

Philippines (632) 8426802 (632) 8426809

1-800-16510170 (PLDT 1-800-16510288 (PLDT
Subscriber Only) Subscriber Only)

Thailand (088) 226-008 (outside Bangkok) (66) 1-661-3714

(662) 661-3999 (within Bangkok)

Hong Kong 800-930-871 (852) 2506 9233

Taiwan 0800-047-866 (886) 2 25456723

People’s Republic 800-810-0189 (preferred) 10800-650-0121

of China 10800-650-0021

India 1-600-11-2929 000-800-650-1101

8- 3
Safety and Regulatory Information
Safety Symbols

Safety Symbols
The following safety symbols are used throughout this manual. Familiarize yourself with
each of the symbols and its meaning before operating this instrument.

CAUTION Caution denotes a hazard. It calls attention to a procedure that, if not

correctly performed or adhered to, would result in damage to or destruction of
the instrument. Do not proceed beyond a caution note until the indicated
conditions are fully understood and met.

WARNING Warning denotes a hazard. It calls attention to a procedure which, if

not correctly performed or adhered to, could result in injury or loss
of life. Do not proceed beyond a warning note until the indicated
conditions are fully understood and met.

Instrument Markings
The instruction documentation symbol. The product is marked with this
symbol when it is necessary for the user to refer to the instructions in the
documentation.

The CE mark is a registered trademark of the European Community. (If

accompanied by a year, it is when the design was proven.)

The CSA mark is a registered trademark of the Canadian Standards

Association.

This is a symbol of an Industrial Scientific and Medical Group 1 Class A

product.
The C-Tick mark is a registered trademark of the Australian Spectrum
Management Agency.
ICES / NMB-001 This is a marking to indicate product compliance with the Canadian
Interference-Causing Equipment Standard (ICES-001).

8-4
 Safety and Regulatory Information
Safety Considerations

Safety Considerations

NOTE This instrument has been designed and tested in accordance with IEC
Publication 1010, Safety Requirements for Electronics Measuring Apparatus,
and has been supplied in a safe condition. This instruction documentation
contains information and warnings which must be followed by the user to
ensure safe operation and to maintain the instrument in a safe condition.

Safety Earth Ground

WARNING This is a Safety Class I product (provided with a protective earthing

ground incorporated in the power cord). The mains plug shall only
be inserted in a socket outlet provided with a protective earth
contact. Any interruption of the protective conductor, inside or
outside the instrument, is likely to make the instrument dangerous.
Intentional interruption is prohibited.

CAUTION Always use the three-prong AC power cord supplied with this product. Failure
to ensure adequate earth grounding by not using this cord may cause product
damage.

Before Applying Power

CAUTION Install the instrument so that the ON/OFF switch is readily identifiable and
is easily reached by the operator. The ON/OFF switch or the detachable power
cord is the instrument disconnecting device. It disconnects the mains circuits
from the mains supply before other parts of the instrument. Alternately, an
externally installed switch or circuit breaker (which is readily identifiable
and is easily reached by the operator) may be used as a disconnecting device.

CAUTION Before switching on this instrument, make sure that the analyzer line voltage
selector switch is set to the voltage of the power supply and the correct fuse is
installed. Assure the supply voltage is in the specified range.

CAUTION If this product is to be energized via an autotransformer make sure the

common terminal is connected to the neutral (grounded side of the mains
supply).

8- 5
Safety and Regulatory Information
Safety Considerations

Servicing

WARNING No operator serviceable parts inside. Refer servicing to qualified

personnel. To prevent electrical shock, do not remove covers.

WARNING These servicing instructions are for use by qualified personnel only.
To avoid electrical shock, do not perform any servicing unless you
are qualified to do so.

WARNING The opening of covers or removal of parts is likely to expose

dangerous voltages. Disconnect the instrument from all voltage
sources while it is being opened.

WARNING Adjustments described in this document may be performed with

power supplied to the product while protective covers are removed.
Energy available at many points may, if contacted, result in personal
injury.

WARNING The power cord is connected to internal capacitors that may remain
live for 10 seconds after disconnecting the plug from its power
supply.

WARNING For continued protection against fire hazard replace line fuse only
with same type and rating (115V operation: T 5A 125 V UL/CSA;
230V operation: T 4A H 250V IEC). The use of other fuses or material
is prohibited.

8-6
 Safety and Regulatory Information
Safety Considerations

General

WARNING To prevent electrical shock, disconnect the analyzer from mains

before cleaning. Use a dry cloth or one slightly dampened with water
to clean the external case parts. Do not attempt to clean internally.

WARNING If this product is not used as specified, the protection provided by

the equipment could be impaired. This product must be used in a
normal condition (in which all means for protection are intact) only.

CAUTION This product is designed for use in Installation Category II and Pollution
Degree 2 per IEC 1010 and 664 respectively.

CAUTION VENTILATION REQUIREMENTS: When installing the product in a cabinet,

the convection into and out of the product must not be restricted. The ambient
temperature (outside the cabinet) must be less than the maximum operating
temperature of the product by 4° C for every 100 watts dissipated in the
cabinet. If the total power dissipated in the cabinet is greater that 800 watts,
then forced convection must be used.

WARNING Install the instrument according to the enclosure protection

provided. This instrument does not protect against the ingress of
water. This instrument protects against finger access to hazardous
parts within the enclosure.

8- 7
Safety and Regulatory Information
Safety Considerations

Compliance with German FTZ Emissions Requirements

This network analyzer complies with German FTZ 526/527 Radiated Emissions and
Conducted Emission requirements.

Compliance with German Noise Requirements

This is to declare that this instrument is in conformance with the German Regulation on
Noise Declaration for Machines (Laermangabe nach der Maschinenlaermrerordung −3.
GSGV Deutschland).

Acoustic Noise Emission/Geraeuschemission

LpA<70 dB Lpa<70 dB

Operator Position am Arbeitsplatz

Normal Operation normaler Betrieb

per ISO 7779 nach DIN 45635 t. 19

Compliance with Canadian EMC Requirements

This ISM device complies with Canadian ICE-001.
Cet appareil ISM est conforme a la norme NMB du Canada.

8-8
 Safety and Regulatory Information
Declaration of Conformity

Declaration of Conformity

8- 9
Safety and Regulatory Information
Declaration of Conformity

8-10
Index

Numerics SWR format, 7-28 calibrating for non-coaxial

2-port error corrections, analyzer internal memory, what devices, 6-52
performing, 6-42, 6-73 you can save, 4-34 TRL error-correction, 6-52
4 Param Displays softkey, 1-18 applying power, 8-5 TRM error correction, 6-56
arrays calibrating for noninsertable
A format, 7-9 devices, 6-40
pre-raw data, 7-8 adapter removal, 6-41, 6-71
aborting a print or plot process, raw, 7-8 matched adapters, 6-46
4-31 ASCII data formats, 4-40 modifying the cal kit through
absolute CITIfile, 4-40 definition, 6-47
ripple test value, 1-87, 1-88 S2P data format, 4-40 calibrating the analyzer receiver
absolute power, 6-39 assigning standards to various to measure absolute power,
accuracy , 1-58 TRL classes, 6-53 6-39
accuracy and input power, 7-88 assigning standards to various calibration
accuracy enhancement, 7-8, 7-37, TRM classes, 6-57 ECal, 6-60–6-70
7-51 attenuator, 7-13 electronic. See ECal
accurate measurements of attenuator, repetitive switching, power meter, 2-10
electrically long devices 7-13 calibration considerations, 6-4
cause of measurement auto sweep time mode, 7-11 calibration standards, 6-5
problems, 5-7 auto sweep time mode, setting, clarifying type-N connector sex,
improving measurement 5-11 6-4
results, 5-7 auto-feed, selecting, 4-13 device measurements, 6-4
activating autostarting sequences, 1-105 error-correction stimulus state,
averaging, 5-15 averaging, 7-34 6-9
chop sweep mode, 5-12 isolation, 6-63 frequency response of
display markers, 1-25 averaging factor, reducing, 5-11 calibration standards, 6-6
fixed markers, 1-29 averaging, activating , 5-15 interpolated error correction,
limit test, 1-78 averaging, sweep to sweep, 7-8 6-8
activating the bandwidth test, measurement parameters, 6-4
1-94 B omitting isolation calibration,
active channel display , 1-11 6-4
adapter removal, 6-41 band
adding a frequency, 1-84 restarting a calibration, 6-5
adapter removal calibration saving calibration data, 6-5
(ECal), 6-71–6-77 changing a frequency, 1-83
deleting a frequency, 1-85 calibration data, saving, 6-5, 7-65
adapters calibration kit menu, 7-57
minimizing error, 6-49 frequency, 1-82
bandwidth, 1-93 defining standard menus, 7-58
adapters, matched, 6-46 label class menu, 7-64
ADC , 7-7 bandwidth markers
displaying, 1-94 label kit menu, 7-64
address menu, 7-79 label standard menu, 7-61
addressing two sources, 2-27 bandwidth test
activating, 1-94 specify class menu, 7-62
adjusting specifying offset menu, 7-60
display colors, 1-22 running, 1-93–1-96
setting up limits, 1-91–1-93 calibration kit, saving a modified,
relative velocity factor, 3-12 7-65
AmiPro, using, 4-21 bandwidth testing, 1-91–1-96
bandwidth value calibration kits, modifying, 7-56
amplifiers, measuring, 1-53 calibration routines, 7-54
amplitude tracking, 2-36 displaying, 1-95
bandwidth, searching for, 1-41 full two-port calibration, 7-55
amplitude, tracking, 1-41 response and isolation
analog in menu, 7-22 basic measurements, making, 1-4
bilateral device, 6-22, 6-25 calibration, 7-54
analyzer display formats, 7-24 response calibration, 7-54
group delay format, 7-25 blanking the display, 1-21
block, receiver, 7-4 S11 and S22 one-port
group delay principles, 7-29 calibration, 7-55
imaginary format, 7-29 built-in synthesized source, 7-4
TRL*/LRM* two-port
linear magnitude format, 7-27 calibration, 7-55
log magnitude format, 7-24 C
calibration standards, 6-5
phase format, 7-24 cables, interconnecting, 5-4 calibration techniques
polar format, 7-27 calculating statistics of improper, 5-4
real format, 7-29 measurement data, 1-42 calibration, measurement, 7-37
smith chart format, 7-26 calculations, ratio, 7-7

Index-1
Index

calibration, receiver, 6-15 comma-separated values. See decision making functions, 1-111
calibration, TRL*/LRM*, 7-66 CSV format decoupled
calling the next measurement compensating for directional channel power, 1-13
sequence, 2-27 coupler response, 6-35 stimulus, 1-13
capabilities compliance with German noise decreasing
mixer measurement, 2-3 requirements, 8-8 frequency span, 5-10
capacitance, fringe, 6-6 computer, what you can save, 4-35 sweep rate, 5-8
cause of measurement problems, confidence check, 6-67 time delay, 5-8
5-7 configuring decrementing the loop counter,
center frequency, setting , 1-35 plot function, 4-9 2-29
changing configuring two sources , 2-27 default colors, 1-22
sequence title, 1-102 connecting defining
system bandwidth, 5-15 device under test, 1-4 plot function, 4-13
changing the ripple limits color, required test equipment, 1-4 print function, 4-6
1-87 connector defining a print function
channel coupling, 7-10 care, 5-3 color printer, using, 4-6
channel position softkey, 1-17 repeatability, 5-4 resetting print parameters to
channel stimulus coupling, 7-14 continuous correction mode, default value, 4-7
characteristics of the filter, 1-66 using, 6-38 delay block, electrical, 7-8
characterizing a duplexer, 1-49 continuous markers, 1-24 delay, determining electrical, 6-75
definitions, 1-49 conversion, 7-9 delay, electrical, 7-33
procedure, 1-49 conversion compression using delay, group, 1-46, 2-32
characterizing microwave frequency offset mode, 2-37 deleting
systematic errors, 7-41 conversion loss, 2-18 commands, 1-99
device measurement, 7-45 conversion loss using frequency frequency signals, 6-35
one-port error model, 7-41 offset mode, 2-11 line segments, 1-77
two-port error model, 7-46 conversion menu, 7-22 deleting a file, 4-51
choosing copy mode, 7-79 all files, 4-51
display elements, 4-13 correction, sampler/IF, 7-7 instrument state file, 4-51
measurement parameters, 1-4 coupling display markers, 1-31 delta markers, 1-28
plot speed, 4-16 coupling power between channels demodulating the results of the
scale, 4-15 1 and 2, 1-58, 7-88 forward transform , 3-23
chop sweep mode, activating, 5-12 coupling, channel stimulus, 7-14 designing your own fixture, 6-51
CITIfile, 4-40 creating detecting IF delay, 5-10
clarifying type-N connector sex, flat limit lines, 1-72 detection, IF, 7-7
6-4 sequence, 1-97 deviation from linear phase, 1-46
clearing a sequence from memory, sloping limit line, 1-74 device measurement, 7-45
1-101 user-defined TRL calibration device measurements, 6-4
color kit, 6-52 device under test
changing the ripple limits, 1-87 user-defined TRM calibration measuring , 1-5
ripple test message, 1-86 kit, 6-56 device under test, connecting , 1-4
color printer, using, 4-6 creating single point limits, 1-76 device, bilateral, 6-22, 6-25
colors of the display, adjusting, crosstalk , 7-40 device, noninsertable, 6-71
1-22 CSV format, saving measurement directional coupler response,
default, 1-22 results in, 4-43 compensating for, 6-35
intensity , 1-22 CW frequency range in external discrete markers, 1-24
modified, 1-23 source mode, 7-85 disk
modify colors menu, 1-22 CW frequency, setting, 1-38 formatting, 4-53
command CW time measurements, 3-22 disk, plotting a measurement to,
deleting, 1-99 CW time sweep, 7-19 4-11
inserting, 1-100 display elements, choosing , 4-13
modifying, 1-100 D display functions, 1-10
commands that require clean data formats, ASCII, 4-40 active channel display, 1-11
sweep, 1-105 data processing, 7-6 titling, 1-11
commands that sequencing processing details, 7-7 adjusting colors of the display,
completes before next data trace, 1-19 1-22
command, 1-104 saving to display memory, 1-19 blanking the display, 1-21

Index-2
Index

data trace E exit HPGL mode, 4-24

saving to display memory, ECal, 6-60–6-77 sending to the printer, 4-24
1-19 adapter removal calibration, external
four-channel display 6-71–6-77 calibration, 5-12
4 Param Displays softkey , calibration, 6-60–6-70 disk drive, 4-53
1-18 confidence check, 6-67 external source mode, 7-83
Channel Position softkey, 1-17 equipment, 6-61 capture range, 7-85
customizing, 1-17 isolation calibration, 6-63 compatible sweep types, 7-85
viewing, 1-14 manual thru, 6-62 CW frequency range, 7-85
measurement data module information, 6-66 external source auto, 7-84
dividing by the memory trace, options, 6-62 external source manual, 7-84
1-20 service menu, 6-69 in-depth description, 7-84
subtracting memory trace, edit limits menu, 7-82 locking onto a signal with
1-20 edit segment menu, 7-82 frequency modulation
viewing, 1-20 editing a sequence, 1-99 component, 7-85
memory math functions, 1-19 deleting commands, 1-99 primary applications, 7-83
memory trace editing line segments, 1-77 requirements, 7-85
viewing, 1-20 editing ripple limits , 1-83–1-85 typical test setup, 7-83
memory traces, 1-19 electrical
primary measurement length, 1-43 F
dual channel mode with offset, 6-6 fabricating and defining
decoupled channel power, electrical delay, 7-33 calibration standards for
1-13 electrical delay block, 7-8 TRL/LRM, 7-72
dual channel mode with electrical delay, determining, 6-75 fast 2-port calibration, 5-12
decoupled stimulus, 1-13 electrical delay, setting, 1-37 fault location measurements
primary measurement electrically long devices, 5-4 using low pass, 3-18
channels, 1-12 electronic calibration. See ECal features that operate differently
viewing, 1-12 eliminating unwanted mixing and in sequence, 1-104
ratio measurements in channel leakage signals, 2-6 feedthrough, RF, 2-45
1 and 2, to, 1-20 embedding loop counter value in file
display intensity, 1-22 title, 1-105 deleting, 4-51
display markers enhanced frequency response index numbers, 4-44
coupling, 1-31 error correction, 6-22 recalling, 4-52
uncoupling, 1-31 enhanced reflection error renaming, 4-52
display markers, activating, 1-25 correction, 6-22, 6-25 sequential CSV naming of, 4-44
display memory, 1-19, 7-9 enhancement, accuracy, 7-37 to delete all, 4-51
display reference value, setting, entering the power sensor filter, characteristics, 1-66
1-37 calibration data, 6-34 finite impulse width (or rise time),
display ripple test limits, 1-86 deleting frequency signals, 6-35 3-27
display ripple test values, 1-87 editing frequency segments, fixed IF mixer adjustments
displayed measurement, titling , 6-34 tuned receiver mode, 2-24
4-30 error fixed IF mixer measurements,
displaying the bandwidth minimizing error while using 2-24
markers, 1-94 adapters, 6-49 addressing and configuring two
displaying the bandwidth value, error correcting measurements, sources, 2-27
1-95 6-10 calling the next measurement
drift, frequency, 5-5 error correction sequence, 2-27
drift, temperature, 5-5 enhanced frequency response, decrementing the loop counter,
dual channel mode with decoupled 6-22 2-29
power, 1-13 enhanced reflection , 6-22, 6-25 frequency list sweep of 26
dual channel mode with decoupled frequency response, 6-12 points, 2-26
stimulus, 1-13 full two-port, 6-29 incrementing the source
dual-channel operation, 1-57, one-port reflection, 6-26 frequencies, 2-29
7-87 error-correction, 1-5 initializing loop counter value to
duplexer, characterizing, 1-49 stimulus state, 6-9 26, 2-27
dynamic range, increasing, 5-14 error-correction, vector, 7-8 labeling the screen, 2-30
errors, measurement, 7-38 presetting the instrument, 2-25

Index-3
Index

prompting user to connect mixer frequency offset mode, conversion moving marker information off
test setup, 2-26 loss, 2-11 the grids, 1-26
response calibration, 2-26 frequency offset operation, 7-87 group delay, 1-46
sequence 1 setup, 2-24 frequency range, 1-58, 7-88 group delay format, 7-25
sequence 2 setup, 2-29 frequency range, setting, 1-5 group delay measurements, 2-32
taking data, 2-29 frequency range, setting for time group delay principles, 7-29
tuned receiver mode, 2-26 domain low pass, 3-15
fixed markers, 1-29 frequency response, 7-40 H
fixtures, 6-50 frequency response and isolation harmonic measurements
designing your own fixture, 6-51 error corrections, 6-17 additional, 1-56
flat limit lines, 1-72 reflection measurements, 6-19 making, 1-55
floppy disk, what you can save, transmission measurements, harmonic operation, 7-87
4-35 6-17 accuracy, 1-58
form feed sequence, 4-24 frequency response error accuracy and input power, 7-88
sending to the printer, 4-24 corrections, 6-12 coupling power between
format, 7-9 receiver calibration, 6-15 channels 1 and 2, 1-58, 7-88
format arrays, 7-9 response error correction for dual-channel operation, 1-57,
format markers, polar, 1-32 reflection measurements, 7-87
formats, analyzer display, 7-24 6-12 frequency range, 1-58, 7-88
formatting a disk, 4-53 response error correction for input power, 1-58
forward stepping in edit mode, transmission single-channel operation, 1-57,
1-105 measurements, 6-14 7-87
forward transform frequency response of calibration test setup, typical, 7-87
measurements, 3-22 standards, 6-6 understanding , 1-57
demodulating the results of the electrical offset, 6-6 harmonics, measuring, 1-54
forward transform , 3-23 fringe capacitance, 6-6 high dynamic range
forward transform range, 3-24 fringe capacitance, 6-6 measurement, 2-22
interpreting the forward full two-port calibration, 7-55 swept RF/IF conversion loss,
transform horizontal axis, full two-port error correction, 6-29 2-18
3-23 high dynamic range
interpreting the forward G measurement, 2-22
transform vertical axis, 3-22 gain, 1-63 high dynamic range swept RF/IF
forward transform mode, 3-4 gain compression conversion loss
forward transform range, 3-24 measuring, 1-59 measurement parameters for IF
four-channel display using linear sweep, 1-61 range, 2-18
4 Param Displays softkey, 1-18 gating, 3-35, 7-8 power meter calibration over IF
Channel Position softkey , 1-17 selecting gate shape, 3-36 range, 2-18
customizing, 1-17 setting the gate, 3-35 power meter calibration over RF
viewing, 1-14 general, 8-7 range, 2-21
Freelance, using , 4-21 generating files in a loop counter receiver calibration over IF
frequency example, 1-115 range, 2-20
segments, editing, 6-34 German FTZ emissions RF frequency range, 2-21
signals, deleting, 6-35 requirements, 8-8 horizontal axis, 3-13, 3-14, 3-16,
span, decreasing , 5-10 gosub sequence command, 1-106 3-20, 3-23
span, setting, 1-36 GPIB operation how RF and IF are defined, 2-7
frequency bands address menu, 7-79 HPGL
adding, 1-84 GPIB STATUS indicators, 7-78 compatible printer, 4-19
changing, 1-83 local key, 7-77 initialization sequence, sending
deleting, 1-85 pass control mode, 7-78 to the printer, 4-24
setting, 1-82 system controller mode, 7-78 initialization sequence, storing,
frequency drift, 5-5 talker/listener mode, 7-78 4-23
frequency list sweep of 26 points, using the parallel port, 7-79 HPGL compatible printer, 4-23
2-26 GPIO mode, 1-106, 7-80 HPGL/2 compatible printer, 4-9
frequency offset mode operation, graphic files
2-10 saving measurement results as, I
frequency offset mode, conversion 4-45
compression, 2-37 IF bandwidth reduction, 7-35
grids

Index-4
Index

IF bandwidth, setting segment, in-depth sequencing information, interpolated error correction, 6-8
7-18 1-104 interpolation in power meter
IF delay, detecting, 5-10 autostarting sequences, 1-105 calibration, 6-34
IF detection, 7-7 commands completed before interpreting
IF range next sequence begins, 1-104 bandpass reflection response
measurement parameters, 2-18 commands that require a clean horizontal axis, 3-13
power meter calibration, 2-18 sweep, 1-105 bandpass reflection response
receiver calibration, 2-20 decision making functions, vertical axis, 3-13
IF, defining, 2-7 1-111 bandpass transmission response
imaginary format, 7-29 embedding loop counter value in horizontal axis, 3-14
improving measurement results, title, 1-105 bandpass transmission response
5-7 features that operate differently vertical axis, 3-14
decreasing the sweep rate, 5-8 in a sequence, 1-104 forward transform horizontal
decreasing time delay, 5-8 forward stepping in edit mode, axis, 3-23
improving raw source match and 1-105 forward transform vertical axis,
load match for TRL*/LRM* gosub sequence command, 1-106 3-22
calibration, 7-70 GPIO mode, 1-106 low pass response horizontal
increase sweep speed limit test decision making, axis, 3-16
using fast 2-port calibration, 1-111 low pass response vertical axis,
5-12 loop counter decision making, 3-17
increasing dynamic range, 5-14 1-112 low pass step transmission
increasing test port input power, sequence decision making response horizontal axis,
5-14 menu, 1-111 3-20
reducing receiver crosstalk, 5-14 sequence size, 1-105 low pass step transmission
reducing the receiver noise floor, sequence that jumps to itself, response vertical axis, 3-20
5-14 1-111 introduction to time domain
increasing measurement sequencing special functions measurements, 3-3
accuracy, 5-4 menu, 1-111 isolation, 7-40, 7-68
connector repeatability, 5-4 titles, 1-105 averaging, 6-63
frequency drift, 5-5 TTL I/O menu, 1-107 calibrating using ECal, 6-63
interconnecting cables, 5-4 TTL input decision making, calibration, omitting, 6-4
performance verification, 5-5 1-107, 1-111 error corrections and frequency
reference plane and port TTL out menu, 1-111 response, 6-17
extensions, 5-5 TTL output for controlling isolation example measurements,
temperature drift, 5-5 peripherals, 1-107 2-42
increasing sweep speed, 5-9 indicators, GPIB STATUS, 7-78 LO to RF isolation, 2-42
activating chop sweep mode, initializing loop counter value to RF feedthrough, 2-45
5-12 26, 2-27 SWR/return loss, 2-48
decreasing the frequency span, input ports menu, 7-23
5-10 input power, 1-58 J
reducing the averaging factor, inserting a command, 1-100 jpeg files, saving results as, 4-45
5-11 insertion phase response, 1-7, 1-8
reducing the number of instrument markings, 8-4
K
measurement points, 5-11 instrument modes, 7-83
setting the auto sweep time external source mode, 7-83 knowing the instrument modes,
mode, 5-11 frequency offset operation , 7-87 7-83
setting the sweep type, 5-11 harmonic operation, 7-87
using external calibration, 5-12 network analyzer mode, 7-83 L
using swept list mode, 5-9 tuned receiver mode, 7-85 labeling the screen, 2-30
viewing a single measurement instrument state leakage signals, eliminating
channel, 5-12 file, deleting, 4-51 unwanted, 2-6
widening the system bandwidth, files, 4-46 limit line operation, 7-81
5-11 re-saving , 4-51 edit limits menu, 7-82
increasing test port input power, saving, 4-36, 7-65 edit segment menu, 7-82
5-14 saving and recalling, 4-34 offset limits menu, 7-82
incrementing the source interconnecting cables, 5-4 limit lines
frequencies, 2-29 internal memory, 4-34 creating flat limit lines, 1-72

Index-5
Index

creating single point limits, 1-76 connecting the device under isolation example, 2-42
editing line segments, 1-77 test, 1-4 non-coaxial, 6-50
measurement parameters, 1-71 error-correction, 1-5 plotting to a disk, 4-11
offsetting limit lines, 1-79 frequency range, setting, 1-5 printing or plotting results, 4-3
running a limit test, 1-77 measurement, setting, 1-5 reflection response, 3-9
sloping limit line, 1-74 measuring the device under results, outputting, 1-6
using to test a device, 1-71 test, 1-5 results, saving, 4-37
limit test outputting measurement results, saving graphically, 4-45
decision making, 1-111 results, 1-6 setting, 1-5
example sequence, 1-117 source power, setting, 1-5 time domain, 3-3
limit test, running , 1-77 making harmonic measurements, transmission measurements in
activating the limit test, 1-78 1-55 time domain low pass, 3-19
reviewing the limit line making non-coaxial transmission response, 3-5
segments, 1-77 measurements, 6-50 measurement calibration, 7-37
line segments, editing, 1-77 fixtures, 6-50 accuracy enhancement, 7-37,
deleting line segments, 1-77 making reflection response 7-51
line types, selecting, 4-15 measurements, 3-9 characterizing microwave
linear frequency sweep, 7-15 making transmission response systematic errors, 7-41
linear magnitude format, 7-27 measurements, 3-5 measurement errors, 7-38
linear phase, deviation, 1-46 manual sweep time mode, 7-11 measurement considerations, 2-4
linear sweep, 1-61 manual thru, 6-62 eliminating unwanted mixing
linearity, phase, 2-32 margin and leakage signals, 2-6
list values, printing or plotting, ripple test value, 1-87, 1-90 frequency offset mode operation,
4-32 markers, 1-24 2-10
LO frequency accuracy and calculating statistics of how RF and IF are defined, 2-7
stability, 2-10 measurement data, 1-42 LO frequency accuracy and
LO to RF isolation, 2-42 continuous, 1-24 stability , 2-10
load match, 7-39, 7-70 coupling display markers, 1-31 minimizing source and load
load mismatches, minimizing, 2-4 CW frequency, setting, 1-38 mismatches, 2-4
loading a sequence from a disk, delta markers, 1-28 power meter calibration, 2-10
1-103 discrete, 1-24 reducing the effect of spurious
local key, 7-77 display markers responses, 2-5
locking onto a signal with activating, 1-25 measurement data, 1-20
frequency modulation fixed marker dividing by the memory trace,
component, 7-85 activating, 1-29 1-20
log magnitude format, 7-24 moving marker information off viewing, 1-20
logarithmic frequency sweep, 7-15 of the grids, 1-26 measurement data trace, 1-20
loop counter polar format markers, 1-32 subtracting memory trace, 1-20
decision making, 1-112 setting measurement measurement error
example sequence, 1-114 parameters, 1-34 crosstalk, 7-40
value, 2-27 smith chart markers, 1-33 frequency response, 7-40
loss of power meter calibration specific amplitude, searching isolation, 7-40
data , 6-33 for, 1-39 load match, 7-39
low pass impulse mode, 3-20 uncoupling display markers, measurement errors
lower stopband parameters, 1-67 1-31 directivity, 7-38
masking, 3-26 source match, 7-39
M matched adapters, 6-46 measurement parameters, 1-67,
magnitude maximum amplitude, searching 6-4
measuring , 1-7 for, 1-39 center frequency, setting , 1-35
measuring response, 1-7 maximum and minimum, 1-93 choosing, 1-4
maintenance, 8-2 maximum bandwidth, 1-93 display reference value, setting,
making a basic measurement, 1-4 measurement 1-37
choosing measurement accuracy, increasing, 5-4 electrical delay, setting, 1-37
parameters, 1-4 calibration, power meter, 6-33 for IF range, 2-18
connecting required test fault location using low pass, frequency span, setting, 1-36
equipment, 1-4 3-18 lower stopband parameters,
high dynamic range, 2-22 1-67

Index-6
Index

markers, setting with, 1-34 input ports menu, 7-23 calibration kit menu, 7-57
passband parameters, 1-67 offset limits, 7-82 saving to a disk, 7-65
start frequency, setting, 1-34 segment, 7-16 verifying performance, 7-64
stop frequency, setting, 1-35 S-parameter, 7-22 module information, 6-66
upper stopband parameters, stepped edit list, 7-16 multiple
1-68 stepped edit subsweep, 7-16 measurements per page,
measurements swept edit list, 7-17 plotting from a disk, 4-26
basic, 1-4 swept edit subsweep, 7-17 measurements, plotting on a full
phase or group delay, 2-32 microprocessor, 7-4 page, 4-27
measuring microwave connector care, 5-3 plots, outputting to a single page
device under test, 1-5 microwave systematic errors, using a plotter, 4-25
gain and reverse isolation characterizing, 7-41
simultaneously, 1-63 minimizing N
insertion phase response, 1-7, error when using adapters, 6-49 N dB Point, 1-93
1-8 source and load mismatches, 2-4 names for CSV files, 4-44
separate transmission paths minimum allowable stop naming files generated by a
through the test device frequencies, 3-16 sequence, 1-102
using low pass impulse minimum amplitude, searching network analyzer mode, 7-83
mode, 3-20 for, 1-39 noise reduction techniques, 7-34
small signal transient response minimum bandwidth , 1-93 averaging, 7-34
using low pass step, 3-19 minimum sweep time, 7-11 IF bandwidth reduction, 7-35
measuring amplifiers, 1-53 mixer smoothing, 7-35
harmonic operation, fixed IF measurements, 2-24 non-coaxial
understanding, 1-57 measurement, 2-3 making measurements, 6-50
harmonics, measuring, 1-54 measurement diagram, using, non-coaxial devices, calibrating
measuring gain and reverse 2-15, 2-21 for, 6-52
isolation simultaneously, mixing signals, eliminating noninsertable device, 6-71
1-63 unwanted, 2-6 noninsertable devices, calibrating
measuring gain compression, mode for, 6-40
1-59 auto sweep time, 5-11, 7-11
measuring electrical length, 1-43 chop sweep, 5-12
O
measuring gain compression, 1-59 continuous correction, 6-38
linear sweep, 1-61 copy, 7-79 offset and scale, 7-9
using linear sweep, 1-61 external source, 7-83 offset limits menu, 7-82
measuring harmonics, 1-54 frequency offset, 2-37 offset, electrical, 6-6
additional harmonic GPIO , 7-80 offsetting limit lines, 1-79
measurements, 1-56 low pass impulse, 3-20 omitting isolation calibration, 6-4
making harmonic manual sweep time, 7-11 one-port calibration, S11 and S22,
measurements, 1-55 network analyzer, 7-83 7-55
measuring magnitude, 1-7 pass control, 7-78 one-port error model, 7-41
magnitude response, 1-7 system controller, 7-78 one-port reflection error
measuring phase distortion, 1-43, talker/listener, 7-78 correction, 6-26
1-45 time domain bandpass, 3-12 operating parameters, printing or
deviation from linear phase, time domain low pass, 3-15 plotting, 4-32
1-46 tuned receiver, 7-85 operation
group delay, 1-46 model dual-channel, 1-57
memory math functions, 1-19 one-port error, 7-41 single-channel, 1-57
memory trace, 1-19, 1-20 two-port error, 7-46 operation, frequency offset, 7-87
viewing, 1-20 modified colors, 1-23 operation, GPIB, 7-77
memory, display, 7-9 recalling, 1-23 operation, harmonic, 7-87
menu saving, 1-23 operation, limit line, 7-81
address, 7-79 modify colors menu, 1-22 operation, system, 7-3
analog in, 7-22 modifying operation, trace math, 7-8
calibration kit, 7-57 cal kit through definition, 6-47 output power, 7-10
conversion, 7-22 command, 1-100 power coupling options, 7-10
edit limits, 7-82 standard definitions, 6-52 outputting
edit segment, 7-82 modifying calibration kits, 7-56 measurement results, 1-6

Index-7
Index

multiple plots to a single page phase linearity and group delay, power meter
using a plotter, 4-25 2-32 calibration, 2-10
plot files, 4-12 phase measurements, 2-32 calibration over IF range, 2-18
plot files from a PC to a plotter, places where you can save, 4-34 calibration over RF range, 2-21
4-22 plot power meter measurement
single page plots using a printer, aborting a process, 4-31 calibration, 6-33
4-24 plot files calibrating the analyzer receiver
outputting plot files from a PC to outputting from a PC to a to measure absolute power,
an HPGL compatible printer, plotter, 4-22 6-39
4-23 outputting from a PC to an compensating for directional
sending the exit HPGL mode HPGL compatible printer, coupler response, 6-35
and form feed sequence to 4-23 entering the power sensor
the printer, 4-24 sending to the printer, 4-24 calibration data, 6-34
sending the HPGL initialization to output, 4-12 interpolation in power meter
sequence to the printer, to view on a PC, 4-20 calibration, 6-34
4-24 plot function, configuring, 4-9 loss of power meter calibration
sending the plot file to the plotting to a pen plotter, 4-10 data, 6-33
printer, 4-24 plotting to an HPGL/2 using continuous correction
storing the exit HPGL mode and compatible printer, 4-9 mode, 6-38
form feed sequence, 4-24 plot function, defining, 4-13 using sample-and-sweep
storing the HPGL initialization choosing display elements, 4-13 correction mode, 6-36
sequence, 4-23 choosing plot speed, 4-16 power sensor calibration data,
choosing scale, 4-15 entering, 6-34
P resetting plotting parameters to power sweep, 7-19
page quadrants, plotting default values, 4-16 power, output, 7-10
measurements in, 4-28 selecting auto-feed, 4-13 primary measurement channels,
parameters selecting line types, 4-15 viewing, 1-12
lower stopband, 1-67 selecting pen numbers and principles, group delay, 7-29
measurement, 1-4, 1-67, 6-4 colors, 4-14 print
passband, 1-67 plot speed, choosing, 4-16 aborting a process, 4-31
upper stopband, 1-68 plotting print function
pass control mode, 7-78 measurement results, 4-3 configuring, 4-4
passband parameters, 1-67 measurement to a disk, 4-11 defining, 4-6
PC interface unit, 6-61 measurements in page printer
PC, to view files on, 4-20 quadrants, 4-28 color printer, using, 4-6
pen numbers and colors, selecting, multiple measurements on a full HPGL compatible printer, 4-19,
4-14 page, 4-27 4-23
pen plotter, 4-17, 4-18 multiple measurements per HPGL/2 compatible printer, 4-9
plotting to, 4-10 page from a disk, 4-26 printing
performance verification, 5-5 multiple measurements per measurement results, 4-3
performance, verifying , 7-64 page using a pen plotter, multiple measurements per
performing 4-18 page, 4-8
2-port error corrections, 6-42, one measurements per page one measurement per page, 4-7
6-73 using a pen plotter, 4-17 parameters, resetting to default
TRL calibration, 6-54 parameters, resetting to default values, 4-7
TRM calibration, 6-58 values, 4-16 sequence, 1-104
peripheral equipment, required, plotting to an HPGL compatible solving problems, 4-33
7-5 printer, 4-19 printing or plotting the list values
per-raw data arrays, 7-8 solving problems, 4-33 or operating parameters, 4-32
phase plotting a measurement to a disk entire list of values, 4-32
linearity, 2-32 to output the plot files, 4-12 single page of values, 4-32
measurements, 2-32 polar format, 7-27 procedure, TRL calibration, 7-71
tracking , 2-36 polar format markers, 1-32 procedures for error correcting
phase distortion, 1-43, 1-45 port extensions, 5-5 measurements, 6-10
phase format, 7-24 power coupling options, 7-10 types of error correction, 6-10
phase or group delay channel coupling, 7-10 processing details, 7-7
measurements, 2-32 test port coupling, 7-10 accuracy enhancement, 7-8

Index-8
Index

ADC, 7-7 reference plane and port resolution, 3-32

conversion, 7-9 extensions, 5-5 response and isolation
display memory, 7-9 reflection measurements calibration, 7-54
electrical delay block, 7-8 response and isolation error response and isolation error
format, 7-9 correction, 6-19 correction for reflection
format arrays, 7-9 response error correction, 6-12 measurements, 6-19
gating, 7-8 reflection measurements in time response calibration, 7-54
IF detection, 7-7 domain low pass, 3-16 restarting a calibration, 6-5
pre-raw data arrays, 7-8 interpreting the low pass reverse isolation, 1-63
ratio calculations, 7-7 response horizontal axis, reviewing the limit line segments,
raw arrays, 7-8 3-16 1-77
sampler/IF correction, 7-7 interpreting the low pass RF feedthrough, 2-45
scale and offset, 7-9 response vertical axis, 3-17 RF frequency range, 2-21
smoothing, 7-9 reflection measurements using using the calculation, 2-21
sweep-to-sweep averaging, 7-8 bandpass using the mixer measurement
trace math operation, 7-8 interpreting the band pass diagram, 2-15, 2-21
transform, 7-9 reflection response vertical RF range
vector error-correction, 7-8 axis, 3-13 power meter calibration, 2-21
processing, data, 7-6 reflection measurements using RF, defining, 2-7
prompting user to connect mixer bandpass mode, 3-12 ripple limit testing, 1-80–1-90
test setup, 2-26 interpreting the bandpass ripple limits
purging a sequence from a disk, reflection response editing, 1-83–1-85
1-103 horizontal axis, 3-13 running the test, 1-85–1-90
reflection response setting, 1-80–1-83
R measurements, making, 3-9 ripple test
range, 3-30 relative velocity factor, adjusting , absolute value, 1-88
forward transform, 3-24 3-12 displaying limits, 1-86
frequency, 1-58 removing adapter delay, 6-42 displaying values, 1-87
resolution, 3-34 removing the effect of an adapter, frequency bands, 1-82
ratio calculations, 7-7 6-76 margin value, 1-90
ratio measurements in channel 1 renaming a file, 4-52 message color, 1-86
and 2, to, 1-20 repeatability, connector, 5-4 starting and stopping, 1-85
raw arrays, 7-8 repetitive switching of the running a bandwidth test,
raw source match, 7-70 attenuator, 7-13 1-93–1-96
real format, 7-29 required peripheral equipment, running a limit test, 1-77
recall time, reducing, 5-17 7-5 running a sequence, 1-99
recalling a file, 4-52 required test equipment, running the ripple limits test,
solving problems, 4-53 connecting , 1-4 1-85–1-90
recalling instrument states, 4-34 requirements for TRL standards,
receiver 7-71 S
calibration, 6-15 re-saving an instrument state, S11 and S22 one-port calibration,
crosstalk, reducing, 5-14, 5-16 4-51 7-55
noise floor, reducing, 5-14 resetting S2P data format, 4-40
receiver block, 7-4 plotting parameters to default safety considerations, 8-5
reducing values, 4-16 before applying power, 8-5
averaging factor, 5-11 printing parameters to default compliance with German FTZ
effect of spurious responses, 2-5 values, 4-7 emissions requirements, 8-8
number of measurement points, resolution, 3-32 compliance with German noise
5-11 range resolution, 3-34 requirements, 8-8
reducing recall time, 5-17 response resolution, 3-32 general, 8-7
understanding spur avoidance, response safety earth ground, 8-5
5-17 calibration, 2-26 servicing, 8-6
reducing trace noise, 5-15 error correction for reflection safety earth ground, 8-5
activating averaging, 5-15 measurements, 6-12 safety symbols, 8-4
changing system bandwidth, error correction for transmission sample-and-sweep correction
5-15 measurements, 6-14 mode, using , 6-36
reduction, IF bandwidth, 7-35 magnitude, 1-7 sampler/IF correction, 7-7

Index-9
Index

saving printing, 1-104 conversion menu, 7-22

calibration data, 6-5, 7-65 purging from a disk, 1-103 S-parameters, 7-20
data trace, 1-19 running, 1-99 S-parameter menu, 7-22
instrument state, 4-36, 7-65 size, 1-105 understanding , 7-20
measurement results, 4-37 stopping, 1-99 S-parameters menu
measurement results storing to disk, 1-103 input ports menu, 7-23
graphically, 4-45 sequencing specific amplitude, 1-39
modified calibration kits, 7-65 special functions menu, 1-111 bandwidth, searching for, 1-41
to a disk, 7-65 test, 1-97 maximum amplitude, searching
saving a file service menu (ECal), 6-69 for, 1-39
solving problems, 4-53 servicing, 8-6 minimum amplitude, searching
saving and recalling instrument setting for, 1-39
states, 4-34 auto sweep time mode, 5-11 target amplitude, searching for,
places where you can save, 4-34 frequency range for time domain 1-40
what you can save to a low pass, 3-15 tracking the amplitude, 1-41
computer, 4-35 gate, 3-35 spreadsheet, saving test file for a,
what you can save to a floppy setting ripple limits, 1-80–1-83 4-43
disk, 4-35 setting segment IF bandwidth, spur avoidance, understanding,
what you can save to the 7-18 5-17
analyzer’s internal memory, setting segment power, 7-18 spurious responses, reducing the
4-34 setting the sweep type, 5-11 effect of, 2-5
saving measurement results setting up bandwidth test limits, standards, calibration , 6-5
ASCII data formats, 4-40 1-91–1-93 start frequency, setting, 1-34
instrument state files, 4-46 shipment for service, 8-2 starting the ripple test, 1-85
scale and offset, 7-9 sidelobes, 3-27 statistics of measurement data,
scale, choosing, 4-15 single page plots, outputting calculating , 1-42
searching for specific amplitude, using a printer, 4-24 stepped edit list menu, 7-16
1-39 single point limits, 1-76 stepped edit subsweep menu, 7-16
segment menu, 7-16 single-channel operation, 1-57, stepped list frequency sweep, 7-15
segment power, setting , 7-18 7-87 segment menu, 7-16
selecting sloping limit line, 1-74 stepped edit list menu, 7-16
auto-feed, 4-13 small signal transient response, stepped edit subsweep menu,
gate shape, 3-36 measuring, 3-19 7-16
line types, 4-15 smith chart format, 7-26 stepped list mode, 1-65
pen numbers and colors, 4-14 smith chart markers, 1-33 stimulus state, error-correction,
selecting sweep modes, 7-19 smoothing , 7-9, 7-35 6-9
sending the exit HPGL mode and softkey stop frequencies, minimum
form feed sequence to the 4 Param Displays, 1-18 allowable, 3-16
printer, 4-24 channel position, 1-17 stop frequency, setting , 1-35
sending the HPGL initialization solving problems with printing or stopping a sequence, 1-99
sequence to the printer, 4-24 plotting, 4-33 stopping the ripple test, 1-85
sending the plot file to the printer, solving problems with saving or storing
4-24 recalling files, 4-53 exit HPGL mode and form feed
sequence using an external disk drive, sequence, 4-24
changing the title, 1-102 4-53 HPGL initialization sequence,
clearing from memory, 1-101 source attenuator switch 4-23
creating, 1-97 protection, 7-13 sequence on a disk, 1-103
decision making menu, 1-111 repetitive switching of the sweep
editing, 1-99 attenuator, 7-13 rate, decreasing, 5-8
generating files in a loop counter source match, 7-39 speed, increasing, 5-9
example, 1-115 source match and load match, type, setting, 5-11
in-depth information, 1-104 7-69 sweep time, 7-11
jumps to itself, 1-111 source mismatches, minimizing , auto sweep time mode, 7-11
limit test example, 1-117 2-4 manual sweep time mode, 7-11
loading from a disk, 1-103 source power, setting , 1-5 minimum sweep time, 7-11
loop counter example, 1-114 S-parameter menu sweep types, 7-15
naming files, 1-102 analog in menu, 7-22 CW time sweep, 7-19

Index-10
Index

linear frequency sweep, 7-15 test port input power, increasing , time domain low pass step mode,
logarithmic frequency sweep, 5-14 3-4
7-15 test sequencing, 1-97 time domain measurements,
power sweep, 7-19 changing the sequence title, introduction, 3-3
selecting sweep modes, 7-19 1-102 forward transform mode, 3-4
stepped list frequency sweep, clearing a sequence from time domain bandpass mode,
7-15 memory, 1-101 3-4
swept list frequency sweep, 7-17 creating a sequence, 1-97 time domain low pass impulse
sweep-to-sweep averaging, 7-8 editing a sequence, 1-99 mode, 3-4
swept edit list menu, 7-17 generating files in a loop counter time domain low pass step
swept edit subsweep menu, 7-17 example, 1-115 mode, 3-4
swept list frequency sweep, 7-17 in-depth sequencing time stamp, 4-31
setting segment IF bandwidth, information , 1-104 title, 1-105
7-18 inserting a command, 1-100 title, display, 1-11
setting segment power, 7-18 limit test example sequence, titling the displayed
swept edit list menu, 7-17 1-117 measurement, 4-30
swept edit subsweep menu, 7-17 loading a sequence from a disk, to produce a time stamp, 4-31
swept list mode 1-103 trace math operation, 7-8
calibrate, 1-69 loop counter example sequence, trace noise, reducing, 5-15
characteristics of the filter, 1-66 1-114 tracking, 7-40
device under test, connect, 1-65 modifying a command, 1-100 tracking the amplitude, 1-41
measure, 1-69 naming files generated by a tracking, amplitude and phase,
measurement parameters, 1-67 sequence, 1-102 2-36
stepped list mode, 1-65 printing a sequence, 1-104 transform, 7-9
to test a device, 1-65 purging a sequence from a disk, transforming CW time
swept list mode, using, 5-9 1-103 measurements into the
swept RF/IF conversion loss, high running a sequence, 1-99 frequency domain, 3-22
dynamic range, 2-18 stopping a sequence, 1-99 forward transform
switch protection, source storing a sequence on a disk, measurements, 3-22
attenuator, 7-13 1-103 transmission measurements in
SWR format, 7-28 using to test a device, 1-113 time domain low pass, 3-19
SWR/return loss, 2-48 text file, saving measurements as interpreting the low pass step
synthesized source, built-in, 7-4 a, 4-43 transmission response
system thru, manual, 6-62 horizontal axis, 3-20
bandwidth, changing, 5-15 time delay, decreasing, 5-8 interpreting the low pass step
bandwidth, widening, 5-11 time domain bandpass mode, 3-4, transmission response
system controller mode, 7-78 3-12 vertical axis, 3-20
system operation, 7-3 adjusting the relative velocity measuring separate
built-in synthesized source, 7-4 factor, 3-12 transmission paths through
microprocessor, 7-4 reflection measurements using the test device using low
receiver block, 7-4 bandpass mode, 3-12 pass impulse mode, 3-20
required peripheral equipment, transmission measurements measuring small signal
7-5 using bandpass mode, 3-14 transient response using
systematic errors, 7-41 time domain low pass impulse low pass step, 3-19
mode, 3-4 transmission measurements
T time domain low pass mode, 3-15 using bandpass mode, 3-14
taking care of microwave fault location measurements interpreting the bandpass
connectors, 5-3 using low pass, 3-18 transmission response
talker/listener mode, 7-78 minimum allowable stop horizontal axis, 3-14
target amplitude, searching for, frequencies, 3-16 interpreting the bandpass
1-40 reflection measurements in time transmission response
temperature drift, 5-5 domain low pass, 3-16 vertical axis, 3-14
terminology, TRL, 7-67 setting frequency range for time transmission measurements,
test domain low pass, 3-15 response and isolation error
bandwidth, 1-91–1-96 transmission measurements in correction, 6-17
ripple limit, 1-80–1-90 time domain low pass, 3-19
test port coupling, 7-10

Index-11
Index

transmission measurements, in-depth description, 7-86 finite impulse width (or rise
response error correction, test setup, typical, 7-86 time), 3-27
6-14 two sources sidelobes, 3-27
transmission response addressing and configuring,
measurements, making, 3-5 2-27
TRL calibration, performing, 6-54 two-port calibration, full, 7-55
TRL error correction two-port calibration, TRL*/LRM*,
assigning standards to various 7-55
TRL classes, 6-53 two-port error model, 7-46
label the calibration kit, 6-53 type-N connector sex
label the classes, 6-53 clarifying, 6-4
performing the TRL calibration, types of error correction, 6-10
6-54
TRL error-correction, 6-52 U
creating a user-defined TRL uncoupling display markers, 1-31
calibration kit, 6-52 understanding
TRL options, 7-75 harmonic operation, 1-57
TRL terminology, 7-67 spur avoidance, 5-17
TRL* error model, 7-67 understanding S-parameters,
TRL*/LRM* calibration, 7-66 7-20
fabricating and defining upper stopband parameters, 1-68
calibration standards for using continuous correction mode,
TRL/LRM, 7-72 6-38
how TRL*/LRM* works , 7-67 using external calibration, 5-12
improving raw source match and using fast 2-port calibration, 5-12
load match for TRL*/LRM* using sample-and-sweep
calibration, 7-70 correction mode, 6-36
isolation , 7-68 using swept list mode, 5-9
source match and load match, detecting IF delay, 5-10
7-69 using the parallel port, 7-79
TRL calibration procedure, 7-71 copy mode, 7-79
TRL options, 7-75 GPIO mode, 7-80
TRL standards, requirements,
7-71
V
TRL terminology, 7-67
TRL* error model, 7-67 vector error-correction, 7-8
TRL*/LRM* two-port calibration, verification, performance, 5-5
7-55 verifying performance, 7-64
TRM error correction, 6-56 vertical axis, 3-13, 3-14, 3-17,
assigning standards to various 3-20, 3-22
TRM classes, 6-57 viewing a single measurement
creating a user-defined TRM channel, 5-12
calibration kit, 6-56 viewing plot files on a PC, 4-20
labeling the calibration kit, 6-57 using AmiPro, 4-21
labeling the classes, 6-57 using Freelance, 4-21
modifying the standard
definitions, 6-56 W
performing the TRM what you can save to a computer,
calibration, 6-58 4-35
TTL what you can save to a floppy disk,
I/O menu, 1-107 4-35
input decision making, 1-107 what you can save to the
out menu, 1-111 analyzer’s internal memory,
output for controlling 4-34
peripherals, 1-107 widening the system bandwidth,
tuned receiver mode, 2-24, 2-26, 5-11
7-85 windowing, 3-27

Index-12