Fds6676As: 30V N-Channel Powertrench Syncfet
Fds6676As: 30V N-Channel Powertrench Syncfet
Fds6676As: 30V N-Channel Powertrench Syncfet
May 2008
tm
FDS6676AS
30V N-Channel PowerTrench® SyncFET™
D
D 5 4
D
D 6 3
7 2
G
S 8 1
S
SO-8 S
Thermal Characteristics
RθJA Thermal Resistance, Junction-to-Ambient (Note 1a) 50 °C/W
RθJC Thermal Resistance, Junction-to-Case (Note 1) 25
FDS6676AS Rev B2
©2008 Fairchild Semiconductor Corporation
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Electrical Characteristics TA = 25°C unless otherwise noted
Off Characteristics
BVDSS Drain–Source Breakdown Voltage VGS = 0 V, ID = 1 mA 30 V
∆BVDSS Breakdown Voltage Temperature ID = 10 mA, Referenced to 25°C 20 mV/°C
∆TJ Coefficient
IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V 500 µA
IGSS Gate–Body Leakage VGS = ±20 V, VDS = 0 V ±100 nA
On Characteristics (Note 2)
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 1 mA 1 1.5 3 V
∆VGS(th) Gate Threshold Voltage ID = 10 mA, Referenced to 25°C –4 mV/°C
∆TJ Temperature Coefficient
RDS(on) Static Drain–Source VGS = 10 V, ID = 14.5 A 4.5 6.0 mΩ
On–Resistance VGS = 4.5 V, ID = 13.2 A 5.9 7.25
VGS=10 V, ID =14.5A, TJ=125°C 6.7 8.5
ID(on) On–State Drain Current VGS = 10 V, VDS = 5 V 50 A
gFS Forward Transconductance VDS = 10 V, ID = 14.5 A 66 S
Dynamic Characteristics
Ciss Input Capacitance VDS = 15 V, V GS = 0 V, 2510 pF
Coss Output Capacitance f = 1.0 MHz 710 pF
Crss Reverse Transfer Capacitance 270 pF
RG Gate Resistance VGS = 15 mV, f = 1.0 MHz 1.6 2.8 Ω
FDS6676AS Rev B2
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Electrical Characteristics TA = 25°C unless otherwise noted
FDS6676AS Rev B2
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Typical Characteristics
50 2.4
VGS = 10V 3.5V
DRAIN-SOURCE ON-RESISTANCE
2.2
40 VGS = 3.0V
ID, DRAIN CURRENT (A)
RDS(ON), NORMALIZED
30 1.8
1.6
3.5V
20
1.4
4.0V
4.5V
1.2
10 6.0V
2.5V
1 10V
0 0.8
0 0.25 0.5 0.75 1 0 10 20 30 40 50
VDS, DRAIN-SOURCE VOLTAGE (V) ID, DRAIN CURRENT (A)
1.4 0.016
ID = 14.5A ID = 7.3 A
DRAIN-SOURCE ON-RESISTANCE
VGS =10V
RDS(ON), ON-RESISTANCE (OHM)
0.014
1.2
RDS(ON), NORMALIZED
0.012
1 0.01
o
TA = 125 C
0.008
0.8
0.006
TA = 25oC
0.6 0.004
-55 -35 -15 5 25 45 65 85 105 125 2 4 6 8 10
o
TJ, JUNCTION TEMPERATURE ( C) VGS, GATE TO SOURCE VOLTAGE (V)
50 100
VDS = 5V VGS = 0V
IS, REVERSE DRAIN CURRENT (A)
40 10
ID, DRAIN CURRENT (A)
o
TA = 125 C
30 1
TA = 125oC -55oC
25oC
20 0.1
o -55oC
25 C
10 0.01
0 0.001
1 1.5 2 2.5 3 3.5 0 0.2 0.4 0.6 0.8
VGS, GATE TO SOURCE VOLTAGE (V) VSD, BODY DIODE FORWARD VOLTAGE (V)
FDS6676AS Rev B2
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Typical Characteristics (continued)
10
3500
ID = 14.5A
f = 1MHz
VGS, GATE-SOURCE VOLTAGE (V)
3000 VGS = 0 V
8
VDS = 10V
2500
CAPACITANCE (pF)
20V
Ciss
6
2000
15V
4 1500
Coss
1000
2
500
Crss
0 0
0 10 20 30 40 50 0 5 10 15 20 25 30
Qg, GATE CHARGE (nC) VDS, DRAIN TO SOURCE VOLTAGE (V)
100 50
SINGLE PULSE
P(pk), PEAK TRANSIENT POWER (W)
RDS(ON) LIMIT 100us
RθJA = 125°C/W
1ms 40 TA = 25°C
ID, DRAIN CURRENT (A)
10 10ms
100ms
1s 30
10s
1
DC
20
VGS = 10V
0.1 SINGLE PULSE
o 10
RθJA = 125 C/W
o
TA = 25 C
0.01 0
0.01 0.1 1 10 100 0.001 0.01 0.1 1 10 100 1000
VDS, DRAIN-SOURCE VOLTAGE (V) t1, TIME (sec)
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
r(t), NORMALIZED EFFECTIVE TRANSIENT
D = 0.5
RθJC(t) = r(t) * RθJC
RθJC = 125 °C/W
THERMAL RESISTANCE
0.2
0.1 0.1
0.05
P(pk
0.02
t1
0.01
0.01 t2
TJ - TC = P * RθJC(t)
Duty Cycle, D = t1 / t2
SINGLE PULSE
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
t1, TIME (sec)
FDS6676AS Rev B2
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Typical Characteristics (continued)
SyncFET Schottky Body Diode
Characteristics
Fairchild’s SyncFET process embeds a Schottky diode in Schottky barrier diodes exhibit significant leakage at high
parallel with PowerTrench MOSFET. This diode exhibits temperature and high reverse voltage. This will increase
similar characteristics to a discrete external Schottky the power in the device.
diode in parallel with a MOSFET. Figure 12 shows the
reverse recovery characteristic of the FDS6676AS. 0.1
0.001 TA = 100oC
0.8A/DIV
0.0001
TA = 25oC
0.00001
0 5 10 15 20 25 30
VDS, REVERSE VOLTAGE (V)
10nS/DIV
FDS6676AS Rev B2
FDS6676AS 30V N-Channel PowerTrench® SyncFET™
Typical Characteristics
VDS L
BVDSS
VGS tP
VDS
RGE DUT + IAS
VDD VDD
0V -
VGS tp IAS
vary tP to obtain
required peak IAS 0.01Ω
tAV
Figure 15. Unclamped Inductive Load Test Figure 16. Unclamped Inductive
Circuit Waveforms
Same type as
- +
VDD
QG(TOT)
-
VGS 10V
DUT
VGS QGS QGD
Ig(REF
Charge, (nC)
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveform
tON tOFF
td(ON) td(OFF
RL
VDS VDS tr ) tf
90% 90%
VGS +
10% 10%
RGEN DUT VDD 0V
- 90%
VGS
VGSPulse Width ≤ 1µs 50% 50%
10%
Duty Cycle ≤ 0.1% 0V Pulse Width
Figure 19. Switching Time Test Figure 20. Switching Time Waveforms
Circuit
FDS6676AS Rev B2
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global
subsidianries, and is not intended to be an exhaustive list of all such trademarks.
ACEx® FPS™ PDP-SPM™ The Power Franchise®
Build it Now™ F-PFS™ Power-SPM™
CorePLUS™ FRFET® PowerTrench® tm
* EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
As used herein:
1. Life support devices or systems are devices or systems which, 2. A critical component in any component of a life support,
(a) are intended for surgical implant into the body or (b) device, or system whose failure to perform can be reasonably
support or sustain life, and (c) whose failure to perform when expected to cause the failure of the life support device or
properly used in accordance with instructions for use provided system, or to affect its safety or effectiveness.
in the labeling, can be reasonably expected to result in a
significant injury of the user.
FDS6676AS Rev.B2