N25Q512A83GSF40F
N25Q512A83GSF40F
N25Q512A83GSF40F
Features
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Products and specifications discussed herein are subject to change by Micron without notice.
512Mb, Multiple I/O Serial Flash Memory
Features
Contents
Device Description ........................................................................................................................................... 6
Features ....................................................................................................................................................... 6
3-Byte Address and 4-Byte Address Modes ..................................................................................................... 6
Operating Protocols ...................................................................................................................................... 6
XIP Mode ..................................................................................................................................................... 7
Device Configurability .................................................................................................................................. 7
Signal Assignments ........................................................................................................................................... 8
Signal Descriptions ......................................................................................................................................... 10
Memory Organization .................................................................................................................................... 12
Memory Configuration and Block Diagram .................................................................................................. 12
Memory Map – 512Mb Density ....................................................................................................................... 13
Device Protection ........................................................................................................................................... 14
Serial Peripheral Interface Modes .................................................................................................................... 16
SPI Protocols .................................................................................................................................................. 18
Nonvolatile and Volatile Registers ................................................................................................................... 19
Status Register ............................................................................................................................................ 20
Nonvolatile and Volatile Configuration Registers .......................................................................................... 21
Extended Address Register .......................................................................................................................... 24
Enhanced Volatile Configuration Register .................................................................................................... 25
Flag Status Register ..................................................................................................................................... 26
Command Definitions .................................................................................................................................... 28
READ REGISTER and WRITE REGISTER Operations ........................................................................................ 32
READ STATUS REGISTER or FLAG STATUS REGISTER Command ................................................................ 32
READ NONVOLATILE CONFIGURATION REGISTER Command ................................................................... 33
READ VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command .................................. 33
READ EXTENDED ADDRESS REGISTER Command ..................................................................................... 34
WRITE STATUS REGISTER Command ......................................................................................................... 34
WRITE NONVOLATILE CONFIGURATION REGISTER Command ................................................................. 35
WRITE VOLATILE or ENHANCED VOLATILE CONFIGURATION REGISTER Command ................................. 35
WRITE EXTENDED ADDRESS REGISTER Command ................................................................................... 36
READ LOCK REGISTER Command .............................................................................................................. 36
WRITE LOCK REGISTER Command ............................................................................................................ 38
CLEAR FLAG STATUS REGISTER Command ................................................................................................ 39
READ IDENTIFICATION Operations ............................................................................................................... 40
READ ID and MULTIPLE I/O READ ID Commands ...................................................................................... 40
READ SERIAL FLASH DISCOVERY PARAMETER Command ......................................................................... 41
READ MEMORY Operations ............................................................................................................................ 45
3-Byte Address ........................................................................................................................................... 45
4-Byte Address ........................................................................................................................................... 46
READ MEMORY Operations Timing – Single Transfer Rate ........................................................................... 48
READ MEMORY Operations Timing – Double Transfer Rate ......................................................................... 52
PROGRAM Operations .................................................................................................................................... 56
WRITE Operations .......................................................................................................................................... 61
WRITE ENABLE Command ......................................................................................................................... 61
WRITE DISABLE Command ........................................................................................................................ 61
ERASE Operations .......................................................................................................................................... 63
SUBSECTOR ERASE Command ................................................................................................................... 63
SECTOR ERASE Command ......................................................................................................................... 63
DIE ERASE Command ................................................................................................................................ 64
BULK ERASE Command ............................................................................................................................. 65
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512Mb, Multiple I/O Serial Flash Memory
Features
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512Mb, Multiple I/O Serial Flash Memory
Features
List of Figures
Figure 1: Logic Diagram ................................................................................................................................... 7
Figure 2: 8-Lead, VDFPN8 – MLP8 (Top View) .................................................................................................. 8
Figure 3: 16-Pin, Plastic Small Outline – SO16 (Top View) .................................................................................. 8
Figure 4: 24-Ball TBGA (Balls Down) ................................................................................................................ 9
Figure 5: Block Diagram ................................................................................................................................ 12
Figure 6: Bus Master and Memory Devices on the SPI Bus ............................................................................... 17
Figure 7: SPI Modes ....................................................................................................................................... 17
Figure 8: Internal Configuration Register ........................................................................................................ 19
Figure 9: Upper and Lower Memory Array Segments ....................................................................................... 24
Figure 10: READ REGISTER Command .......................................................................................................... 33
Figure 11: WRITE REGISTER Command ......................................................................................................... 35
Figure 12: READ LOCK REGISTER Command ................................................................................................. 38
Figure 13: WRITE LOCK REGISTER Command ............................................................................................... 39
Figure 14: READ ID and MULTIPLE I/O Read ID Commands .......................................................................... 41
Figure 15: READ Command ........................................................................................................................... 48
Figure 16: FAST READ Command ................................................................................................................... 48
Figure 17: DUAL OUTPUT FAST READ Command .......................................................................................... 49
Figure 18: DUAL INPUT/OUTPUT FAST READ Command .............................................................................. 49
Figure 19: QUAD OUTPUT FAST READ Command ......................................................................................... 50
Figure 20: QUAD INPUT/OUTPUT FAST READ Command ............................................................................. 51
Figure 21: FAST READ Command – DTR ......................................................................................................... 52
Figure 22: DUAL OUTPUT FAST READ Command – DTR ................................................................................ 53
Figure 23: DUAL INPUT/OUTPUT FAST READ Command – DTR .................................................................... 53
Figure 24: QUAD OUTPUT FAST READ Command – DTR ............................................................................... 54
Figure 25: QUAD INPUT/OUTPUT FAST READ Command – DTR ................................................................... 54
Figure 26: PAGE PROGRAM Command .......................................................................................................... 57
Figure 27: DUAL INPUT FAST PROGRAM Command ...................................................................................... 58
Figure 28: EXTENDED DUAL INPUT FAST PROGRAM Command ................................................................... 58
Figure 29: QUAD INPUT FAST PROGRAM Command ..................................................................................... 59
Figure 30: EXTENDED QUAD INPUT FAST PROGRAM Command ................................................................... 60
Figure 31: WRITE ENABLE and WRITE DISABLE Command Sequence ............................................................ 62
Figure 32: SUBSECTOR and SECTOR ERASE Command .................................................................................. 64
Figure 33: DIE ERASE Command ................................................................................................................... 65
Figure 34: BULK ERASE Command ................................................................................................................ 67
Figure 35: RESET ENABLE and RESET MEMORY Command ........................................................................... 70
Figure 36: READ OTP Command .................................................................................................................... 71
Figure 37: PROGRAM OTP Command ............................................................................................................ 72
Figure 38: XIP Mode Directly After Power-On .................................................................................................. 75
Figure 39: Power-Up Timing .......................................................................................................................... 77
Figure 40: Reset AC Timing During PROGRAM or ERASE Cycle ........................................................................ 80
Figure 41: Reset Enable ................................................................................................................................. 80
Figure 42: Serial Input Timing ........................................................................................................................ 80
Figure 43: Hold Timing .................................................................................................................................. 81
Figure 44: Output Timing .............................................................................................................................. 81
Figure 45: V PPH Timing .................................................................................................................................. 82
Figure 46: AC Timing Input/Output Reference Levels ...................................................................................... 84
Figure 47: V-PDFN-8/8mm x 6mm ................................................................................................................. 88
Figure 48: SOP2-16/300 mils .......................................................................................................................... 89
Figure 49: T-PBGA-24b05/6mm x 8mm .......................................................................................................... 90
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512Mb, Multiple I/O Serial Flash Memory
Features
List of Tables
Table 1: Signal Descriptions ........................................................................................................................... 10
Table 2: Sectors[1023:0] ................................................................................................................................. 13
Table 3: Data Protection Using Device Protocols ............................................................................................. 14
Table 4: Memory Sector Protection Truth Table .............................................................................................. 14
Table 5: Protected Area Sizes – Upper Area ..................................................................................................... 14
Table 6: Protected Area Sizes – Lower Area ...................................................................................................... 15
Table 7: SPI Modes ........................................................................................................................................ 16
Table 8: Extended, Dual, and Quad SPI Protocols ............................................................................................ 18
Table 9: Status Register Bit Definitions ........................................................................................................... 20
Table 10: Nonvolatile Configuration Register Bit Definitions ........................................................................... 21
Table 11: Volatile Configuration Register Bit Definitions .................................................................................. 22
Table 12: Sequence of Bytes During Wrap ....................................................................................................... 23
Table 13: Supported Clock Frequencies – STR ................................................................................................. 23
Table 14: Supported Clock Frequencies – DTR ................................................................................................ 23
Table 15: Extended Address Register Bit Definitions ........................................................................................ 25
Table 16: Enhanced Volatile Configuration Register Bit Definitions .................................................................. 25
Table 17: Flag Status Register Bit Definitions .................................................................................................. 26
Table 18: Command Set ................................................................................................................................. 28
Table 19: Lock Register .................................................................................................................................. 36
Table 20: Data/Address Lines for READ ID and MULTIPLE I/O READ ID Commands ....................................... 40
Table 21: Read ID Data Out ............................................................................................................................ 40
Table 22: Extended Device ID, First Byte ......................................................................................................... 40
Table 23: Extended Device ID, Second Byte .................................................................................................... 41
Table 24: Serial Flash Discovery Parameter Data Structure .............................................................................. 42
Table 25: Parameter ID .................................................................................................................................. 42
Table 26: Command/Address/Data Lines for READ MEMORY Commands ....................................................... 45
Table 27: Command/Address/Data Lines for READ MEMORY Commands – 4-Byte Address ............................. 46
Table 28: Data/Address Lines for PROGRAM Commands ................................................................................ 56
Table 29: Suspend Parameters ....................................................................................................................... 68
Table 30: Operations Allowed/Disallowed During Device States ...................................................................... 69
Table 31: Reset Command Set ........................................................................................................................ 70
Table 32: OTP Control Byte (Byte 64) .............................................................................................................. 72
Table 33: XIP Confirmation Bit ....................................................................................................................... 75
Table 34: Effects of Running XIP in Different Protocols .................................................................................... 75
Table 35: Power-Up Timing and V WI Threshold ............................................................................................... 78
Table 36: AC RESET Conditions ...................................................................................................................... 79
Table 37: Absolute Ratings ............................................................................................................................. 83
Table 38: Operating Conditions ...................................................................................................................... 83
Table 39: Input/Output Capacitance .............................................................................................................. 83
Table 40: AC Timing Input/Output Conditions ............................................................................................... 84
Table 41: DC Current Characteristics and Operating Conditions ...................................................................... 85
Table 42: DC Voltage Characteristics and Operating Conditions ...................................................................... 85
Table 43: AC Characteristics and Operating Conditions ................................................................................... 86
Table 44: Part Number Information ................................................................................................................ 91
Table 45: Package Details ............................................................................................................................... 92
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512Mb, Multiple I/O Serial Flash Memory
Device Description
Device Description
The N25Q is a high-performance multiple input/output serial Flash memory device
manufactured on 65nm NOR technology. It features execute-in-place (XIP) functionali-
ty, advanced write protection mechanisms, and a high-speed SPI-compatible bus inter-
face. Innovative, high-performance, dual and quad input/output instructions enable
double or quadruple the transfer bandwidth for READ and PROGRAM operations.
Features
The 512Mb N25Q stacked device contains two 256Mb die. From a user standpoint this
stacked device behaves as a monolithic device, except with regard to READ MEMORY
and ERASE operations and status polling. The device contains a single chip select (S#); a
dual-chip version is also available. Contact the factory for more information.
The memory is organized as 1024 (64KB) main sectors that are further divided into 16
subsectors each (16,384 subsectors in total). The memory can be erased one 4KB sub-
sector at a time, 64KB sectors at a time, or single die (256Mb) at a time.
The memory can be write protected by software through volatile and nonvolatile pro-
tection features, depending on the application needs. The protection granularity is of
64KB (sector granularity) for volatile protections
The device has 64 one-time programmable (OTP) bytes that can be read and program-
med with the READ OTP and PROGRAM OTP commands. These 64 bytes can also be
permanently locked with a PROGRAM OTP command.
The device can also pause and resume PROGRAM and ERASE cycles by using dedicated
PROGRAM/ERASE SUSPEND and RESUME instructions.
Operating Protocols
The memory can be operated with three different protocols:
• Extended SPI (standard SPI protocol upgraded with dual and quad operations)
• Dual I/O SPI
• Quad I/O SPI
The standard SPI protocol is extended and enhanced by dual and quad operations. In
addition, the dual SPI and quad SPI protocols improve the data access time and
throughput of a single I/O device by transmitting commands, addresses, and data
across two or four data lines.
Each protocol contains unique commands to perform READ operations in DTR mode.
This enables high data throughput while running at lower clock frequencies.
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512Mb, Multiple I/O Serial Flash Memory
Device Description
XIP Mode
XIP mode requires only an address (no instruction) to output data, improving random
access time and eliminating the need to shadow code onto RAM for fast execution.
Nonvolatile configuration register bits can set XIP mode as the default mode for appli-
cations that must enter XIP mode immediately after powering up.
All protocols support XIP operation. For flexibility, multiple XIP entry and exit methods
are available. For applications that must enter XIP mode immediately after power-up,
nonvolatile configuration register bit settings can enable XIP as the default mode.
Device Configurability
The N25Q family offers additional features that are configured through the nonvolatile
configuration register for default and/or nonvolatile settings. Volatile settings can be
configured through the volatile and volatile-enhanced configuration registers. These
configurable features include the following:
• Number of dummy cycles for the fast READ commands
• Output buffer impedance
• SPI protocol types (extended SPI, dual SPI, or quad SPI)
• Required XIP mode
• Enabling/disabling HOLD (RESET function)
• Enabling/disabling wrap mode
VCC
DQ0 DQ1
C NOR die 2
S# NOR die 1
VPP/W#/DQ2
HOLD#/DQ3 RESET
VSS
Note: 1. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for more details. The RESET pin is available only for part num-
bers N25Q512A83G1240x, N25Q512A83GSF40x, N25Q512A83GSFA0x,
N25Q512A83G12A0x and N25Q512A83G12H0x On these parts, the additional RESET pin
must be connected to an external pull-up.
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512Mb, Multiple I/O Serial Flash Memory
Signal Assignments
Signal Assignments
S# 1 8 VCC
DQ1 2 7 HOLD#/DQ3
W#/VPP/DQ2 3 6 C
VSS 4 5 DQ0
Notes: 1. On the underside of the MLP8 package, there is an exposed central pad that is pulled
internally to VSS and must not be connected to any other voltage or signal line on the
PCB.
2. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for complete package names and details.
HOLD#/DQ3 1 16 C
VCC 2 15 DQ0
RESET/DNU 3 14 DNU
DNU 4 13 DNU
DNU 5 12 DNU
DNU 6 11 DNU
S# 7 10 VSS
DQ1 8 9 W#/VPP /DQ2
Note: 1. Reset functionality is available in devices with a dedicated part number. See Part Num-
ber Ordering Information for complete package names and details. Pin 3 is DNU except
for part number N25Q512A83GSF40x and N25Q512A83GSFA0x, for which it is used as a
RESET pin.
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512Mb, Multiple I/O Serial Flash Memory
Signal Assignments
1 2 3 4 5
A
NC NC RESET/NC NC
B
NC C VSS VCC NC
C
NC S# NC W#/VPP/DQ2 NC
D
NC DQ1 DQ0 HOLD#/DQ3 NC
E
NC NC NC NC NC
Note: 1. See Part Number Ordering Information for complete package names and details. Ball A4
is NC except for part numbers N25Q512A83G1240x,N25Q512A83G12A0x and
N25Q512A83G12H0x for which it is used as a RESET pin.
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512Mb, Multiple I/O Serial Flash Memory
Signal Descriptions
Signal Descriptions
The signal description table below is a comprehensive list of signals for the N25 family
devices. All signals listed may not be supported on this device. See Signal Assignments
for information specific to this device.
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512Mb, Multiple I/O Serial Flash Memory
Signal Descriptions
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512Mb, Multiple I/O Serial Flash Memory
Memory Organization
Memory Organization
Memory Configuration and Block Diagram
The memory is a stacked device comprised of two 256Mb chips. Each chip is internally
partitioned into two 128Mb segments. Each page of memory can be individually pro-
grammed. Bits are programmed from one through zero. The device is subsector, sector,
or single 256Mb chip erasable, but not page-erasable. Bits are erased from zero through
one. The memory is configured as 67,108,864 bytes (8 bits each); 1024 sectors (64KB
each); 16,384 subsectors (4KB each); and 262,144 pages (256 bytes each); and 64 OTP
bytes are located outside the main memory array.
HOLD#
High voltage
W#/VPP Control logic
generator
S# 64 OTP bytes
DQ0
DQ1
DQ2 I/O shift register
DQ3
03FFFFFFh
Y decoder
0000000h 00000FFh
256 bytes (page size)
X decoder
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512Mb, Multiple I/O Serial Flash Memory
Memory Map – 512Mb Density
Table 2: Sectors[1023:0]
Address Range
Sector Subsector Start End
1023 16383 03FF F000h 03FF FFFFh
⋮ ⋮ ⋮
16368 03FF 0000h 03FF 0FFFh
⋮ ⋮ ⋮ ⋮
511 8191 01FF F000h 01FF FFFFh
⋮ ⋮ ⋮
8176 01FF 0000h 01FF 0FFFh
⋮ ⋮ ⋮ ⋮
255 4095 00FF F000h 00FF FFFFh
⋮ ⋮ ⋮
4080 00FF 0000h 00FF 0FFFh
⋮ ⋮ ⋮ ⋮
127 2047 007F F000h 007F FFFFh
⋮ ⋮ ⋮
2032 007F 0000h 007F 0FFFh
⋮ ⋮ ⋮ ⋮
63 1023 003F F000h 003F FFFFh
⋮ ⋮ ⋮
1008 003F 0000h 003F 0FFFh
⋮ ⋮ ⋮ ⋮
0 15 0000 F000h 0000 FFFFh
⋮ ⋮ ⋮
0 0000 0000h 0000 0FFFh
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512Mb, Multiple I/O Serial Flash Memory
Device Protection
Device Protection
Note: 1. Extended, dual, and quad SPI protocol functionality ensures that device data is protec-
ted from excessive noise.
Note: 1. Sector lock register bits are written to when the WRITE TO LOCK REGISTER command is
executed. The command will not execute unless the sector lock down bit is cleared (see
the WRITE TO LOCK REGISTER command).
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512Mb, Multiple I/O Serial Flash Memory
Device Protection
Note: 1. See the Status Register for details on the top/bottom bit and the BP 3:0 bits.
Note: 1. See the Status Register for details on the top/bottom bit and the BP 3:0 bits.
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512Mb, Multiple I/O Serial Flash Memory
Serial Peripheral Interface Modes
Note: 1. The listed SPI modes are supported in extended, dual, and quad SPI protocols.
Shown below is an example of three memory devices in extended SPI protocol in a sim-
ple connection to an MCU on an SPI bus. Because only one device is selected at a time,
that one device drives DQ1, while the other devices are High-Z.
Resistors ensure the device is not selected if the bus master leaves S# High-Z. The bus
master might enter a state in which all input/output is High-Z simultaneously, such as
when the bus master is reset. Therefore, the serial clock must be connected to an exter-
nal pull-down resistor so that S# is pulled HIGH while the serial clock is pulled LOW.
This ensures that S# and the serial clock are not HIGH simultaneously and that tSHCH
is met. The typical resistor value of 100kΩ, assuming that the time constant R × Cp (Cp =
parasitic capacitance of the bus line), is shorter than the time the bus master leaves the
SPI bus in High-Z.
Example: Cp = 50pF, that is R × Cp = 5μs. The application must ensure that the bus mas-
ter never leaves the SPI bus High-Z for a time period shorter than 5μs. W# and HOLD#
should be driven either HIGH or LOW, as appropriate.
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512Mb, Multiple I/O Serial Flash Memory
Serial Peripheral Interface Modes
VSS
VCC
SDO
SPI interface:
(CPOL, CPHA) =
SDI
(0, 0) or (1, 1) SCK
CPOL CPHA
0 0 C
1 1 C
DQ0 MSB
DQ1 MSB
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512Mb, Multiple I/O Serial Flash Memory
SPI Protocols
SPI Protocols
Com-
Protocol mand Address Data
Name Input Input Input/Output Description
Extended DQ0 Multiple DQn Multiple DQn Device default protocol from the factory. Additional com-
lines, depending lines, depending mands extend the standard SPI protocol and enable address
on the command on the command or data transmission on multiple DQn lines.
Dual DQ[1:0] DQ[1:0] DQ[1:0] Volatile selectable: When the enhanced volatile configu-
ration register bit 6 is set to 0 and bit 7 is set to 1, the de-
vice enters the dual SPI protocol immediately after the
WRITE ENHANCED VOLATILE CONFIGURATION REGISTER
command. The device returns to the default protocol after
the next power-on. In addition, the device can return to de-
fault protocol using the rescue sequence or through new
WRITE ENHANCED VOLATILE CONFIGURATION REGISTER
command, without power-off or power-on.
Note: 1. In quad SPI protocol, all command/address input and data I/O are transmitted on four
lines except during a PROGRAM and ERASE cycle performed with VPP. In this case, the
device enters the extended SPI protocol to temporarily allow the application to perform
a PROGRAM/ERASE SUSPEND operation or to check the write-in-progress bit in the sta-
tus register or the program/erase controller bit in the flag status register. Then, when
VPP goes LOW, the device returns to the quad SPI protocol.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Device behavior
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Status Register
Notes: 1. Bits can be read from or written to using READ STATUS REGISTER or WRITE STATUS REG-
ISTER commands, respectively.
2. Volatile bits are cleared to 0 by a power cycle or reset.
3. The status register write enable/disable bit, combined with the W#/VPP signal as descri-
bed in the Signal Descriptions, provides hardware data protection for the device as fol-
lows: When the enable/disable bit is set to 1, and the W#/VPP signal is driven LOW, the
status register nonvolatile bits become read-only and the WRITE STATUS REGISTER oper-
ation will not execute. The only way to exit this hardware-protected mode is to drive
W#/VPP HIGH.
4. See Protected Area Sizes tables. The DIE ERASE command is executed only if all bits are
0.
5. In case of protection error this volatile bit is set and can be reset only by means of a
CLEAR FLAG STATUS REGISTER command.
6. Program or erase controller bit = NOT (write in progress bit).
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Notes: 1. Settings determine device memory configuration after power-on. The device ships from
the factory with all bits erased to 1 (FFFFh). The register is read from or written to by
READ NONVOLATILE CONFIGURATION REGISTER or WRITE NONVOLATILE CONFIGURA-
TION REGISTER commands, respectively.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
2. The 0000 and 1111 settings are identical in that they both define the default state,
which is the maximum frequency of fc = 108 MHz. This ensures backward compatibility.
3. If the number of dummy clock cycles is insufficient for the operating frequency, the
memory reads wrong data. The number of cycles must be set according to and sufficient
for the clock frequency, which varies by the type of FAST READ command, as shown in
the Supported Clock Frequencies table.
4. If bits 2 and 3 are both set to 0, the device operates in quad I/O. When bits 2 or 3 are
reset to 0, the device operates in dual I/O or quad I/O respectively, after the next power-
on.
Notes: 1. Settings determine the device memory configuration upon a change of those settings by
the WRITE VOLATILE CONFIGURATION REGISTER command. The register is read from or
written to by READ VOLATILE CONFIGURATION REGISTER or WRITE VOLATILE CONFIGU-
RATION REGISTER commands respectively.
2. The 0000 and 1111 settings are identical in that they both define the default state,
which is the maximum frequency of fc = 108 MHz. This ensures backward compatibility.
3. If the number of dummy clock cycles is insufficient for the operating frequency, the
memory reads wrong data. The number of cycles must be set according to and be suffi-
cient for the clock frequency, which varies by the type of FAST READ command, as
shown in the Supported Clock Frequencies table.
4. See the Sequence of Bytes During Wrap table.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Note: 1. Values are guaranteed by characterization and not 100% tested in production.
Note: 1. Values are guaranteed by characterization and not 100% tested in production.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
03FFFFFFh
A[25:24] = 11
02FFFFFFh
A[25:24] = 10
03000000h
01FFFFFFh
02000000h A[25:24] = 01
00FFFFFFh
01000000h
A[25:24] = 00
00000000h
The PROGRAM and ERASE operations act upon the 128Mb segment selected in the ex-
tended address register.
The READ operation begins reading in the selected 128Mb segment. It is bound by the
256Mb (die segment) to which the 128Mb segment belongs. In a continuos read, when
the last byte of the die segment selected is read, the next byte output is the first byte of
the same die segment; therefore, a download of the whole array is not possible with one
READ operation. The value of the extended address register does not change when a
READ operation crosses the selected 128Mb boundary.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Note: 1. The extended address register is for an application that supports only 3-byte addressing.
It extends the device's first three address bytes A[23:0] to a fourth address byte A[31:24]
to enable memory access beyond 128Mb. The extended address register bits [1:0] are
used to select one of the four 128Mb segments of the memory array. If 4-byte address-
ing is enabled, extended address register settings are ignored.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Notes: 1. Settings determine the device memory configuration upon a change of those settings by
the WRITE ENHANCED VOLATILE CONFIGURATION REGISTER command. The register is
read from or written to in all protocols by READ ENHANCED VOLATILE CONFIGURATION
REGISTER or WRITE ENHANCED VOLATILE CONFIGURATION REGISTER commands, respec-
tively.
2. If bits 6 and 7 are both set to 0, the device operates in quad I/O. When either bit 6 or 7 is
reset to 0, the device operates in dual I/O or quad I/O respectively following the next
WRITE ENHANCED VOLATILE CONFIGURATION command.
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512Mb, Multiple I/O Serial Flash Memory
Nonvolatile and Volatile Registers
Notes: 1. Register bits are read by READ FLAG STATUS REGISTER command. All bits are volatile.
2. Status bits are reset automatically.
3. Error bits must be cleared through the CLEAR FLAG STATUS REGISTER command.
4. These error flags are "sticky." They must be cleared through the CLEAR STATUS REGIS-
TER command.
5. Program or erase controller bit = NOT (write in progress bit).
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512Mb, Multiple I/O Serial Flash Memory
Command Definitions
Command Definitions
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512Mb, Multiple I/O Serial Flash Memory
Command Definitions
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512Mb, Multiple I/O Serial Flash Memory
Command Definitions
Notes: 1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
2. Address bytes = 0. Dummy clock cycles = 0.
3. Address bytes = 3. Dummy clock cycles default = 8.
4. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles = 0.
5. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 8. Dummy clock cycles default = 10 (when quad SPI protocol is enabled). Dummy
clock cycles are configurable by the user.
6. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 6. Dummy clock cycles default = 8 when quad SPI protocol is enabled. Dummy
clock cycles are configurable by the user.
7. Address bytes default = 3; address bytes = 4 (extended address). Dummy clock cycles de-
fault = 8. Dummy clock cycles are configurable by the user.
8. Address bytes = 4. Dummy clock cycles = 0.
9. Address bytes = 4. Dummy clock cycles default = 8. Dummy clock cycles default = 10
(when quad SPI protocol is enabled). Dummy clock cycles are configurable by the user.
10. Address bytes = 4. Dummy clock cycles default = 10. Dummy clock cycles is configurable
by the user.
11. When the device is in dual SPI protocol, the command can be entered with any of these
three codes. The different codes enable compatibility between dual SPI and extended
SPI protocols.
12. When the device is in quad SPI protocol, the command can be entered with any of these
three codes. The different codes enable compatibility between quad SPI and extended
SPI protocols.
13. The WRITE ENABLE command must be issued first before this command can be execu-
ted.
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512Mb, Multiple I/O Serial Flash Memory
Command Definitions
14. Requires the READ FLAG STATUS REGISTER command being issued with at least one byte
output. (After code, at least 8 clock pulses in extended SPI, 4 clock pulses in dual I/O SPI,
and 2 clock pulses in quad I/O SPI.) The cycle is not complete until bit 7 of the flag status
register outputs 1.
15. The end of operation can be detected by means of a READ FLAG STATUS REGISTER com-
mand being issued twice, S# toggled between command execution, and bit 7 of the flag
status register outputs 1 both times.
16. The WRITE ENABLE command must be issued first before this command can be execu-
ted. Not necessary for part numbers N25Q512A83GSF40x, N25Q512A83G1240x,
N25Q512A83GSFA0x, N25Q512A83G12A0x and N25Q512A83G12H0x.
17. Only available for part numbers N25Q512A83GSF40x, N25Q512A83G1240x,
N25Q512A83GSFA0x, N25Q512A83G12A0x and N25Q512A83G12H0x.
18. The code 38h is valid only for part numbers N25Q512A83GSF40x, N25Q512A83G1240x,
N25Q512A83GSFA0x, N25Q512A83G12A0x and N25Q512A83G12H0x; the code 12h is
valid for the other part numbers.
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Extended
0 7 8 9 10 11 12 13 14 15
C
LSB
DQ0 Command
MSB
LSB
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dual
0 3 4 5 6 7
C
LSB LSB
DQ[1:0] Command DOUT DOUT DOUT DOUT DOUT
MSB MSB
Quad
0 1 2 3
C
LSB LSB
DQ[3:0] Command DOUT DOUT DOUT
MSB Don’t Care
MSB
Notes: 1. Supports all READ REGISTER commands except READ LOCK REGISTER.
2. A READ NONVOLATILE CONFIGURATION REGISTER operation will output data starting
from the least significant byte.
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Extended
0 7 8 9 10 11 12 13 14 15
C
LSB LSB
DQ0 Command DIN DIN DIN DIN DIN DIN DIN DIN DIN
MSB MSB
Dual
0 3 4 5 6 7
C
LSB LSB
DQ[1:0] Command DIN DIN DIN DIN DIN
MSB MSB
Quad
0 1 2 3
C
LSB LSB
DQ[3:0] Command DIN DIN DIN
MSB MSB
Notes: 1. Supports all WRITE REGISTER commands except WRITE LOCK REGISTER.
2. A WRITE NONVOLATILE CONFIGURATION REGISTER operation requires data being sent
starting from least significant byte. For this command, the data in consists of two bytes.
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
followed by the data bytes. For dual SPI protocol, the command code is input on
DQ[1:0], followed by the data bytes. For quad SPI protocol, the command code is input
on DQ[3:0], followed by the data bytes.
Because register bits are volatile, change to the bits is immediate. After the data is latch-
ed in, S# must be driven HIGH. Reserved bits are not affected by this command.
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Note: 1. Sector lock register bits 1:0 are written to by the WRITE LOCK REGISTER command. The
command will not execute unless the sector lock down bit is cleared.
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ[0] Command
MSB A[MAX]
LSB
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dual
0 3 4 Cx
C
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
READ REGISTER and WRITE REGISTER Operations
Extended
0 7 8 Cx
C
Dual
0 3 4 Cx
C
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Table 20: Data/Address Lines for READ ID and MULTIPLE I/O READ ID Commands
Unique ID
Command Name Data In Data Out is Output Extended Dual Quad
READ ID DQ0 DQ0 Yes Yes No No
MULTIPLE I/O READ ID DQ[3:0] DQ[1:0] No No Yes Yes
Note: 1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
Size
(Bytes) Name Content Value Assigned by
1 Manufacturer ID 20h JEDEC
2 Device ID
Memory Type BAh Manufacturer
Memory Capacity 20h (512Mb)
17 Unique ID
1 Byte: Length of data to follow 10h Factory
2 Bytes: Extended device ID and device ID and information such as uniform
configuration information architecture, and HOLD
or RESET functionality
14 Bytes: Customized factory data Optional
Note: 1. The 17 bytes of information in the unique ID is read by the READ ID command, but can-
not be read by the MULTIPLE I/O READ ID command.
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512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Manufacturer Device
identification identification
Manufacturer Device
identification identification
Don’t Care
Note: 1. The READ ID command is represented by the extended SPI protocol timing shown first.
The MULTIPLE I/O READ ID command is represented by the dual and quad SPI protocols
are shown below extended SPI protocol.
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512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
The operation always executes in continuous mode so the read burst wrap setting in the
volatile configuration register does not apply.
Byte 512Mb
Description Address Bits Data
Minimum block/sector erase sizes 30h 1:0 01b
Write granularity 2 1
WRITE ENABLE command required for writing to volatile status reg- 3 0
isters
WRITE ENABLE command selected for writing to volatile status regis- 4 0
ters
Reserved 7:5 111b
4KB ERASE command 31h 7:0 20h
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512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Byte 512Mb
Description Address Bits Data
Supports DUAL OUTPUT FAST READ operation (single input address, 32h 0 1
dual output)
Number of address bytes used (3-byte or 4-byte) for array READ, 2:1 01b
WRITE, and ERASE commands
Supports double transfer rate clocking 3 1
Supports DUAL INPUT/OUTPUT FAST READ operation (dual input ad- 4 1
dress, dual output)
Supports QUAD INPUT/OUTPUT FAST READ operation (quad input 5 1
address, quad output)
Supports QUAD OUTPUT FAST READ operation (single input address, 6 1
quad output)
Reserved 7 1
Reserved 33h 7:0 FFh
Flash size (bits) 34h 7:0 FFh
35h 7:0 FFh
36h 7:0 FFh
37h 7:0 1Fh
Number of dummy clock cycles required before valid output from 38h 4:0 01001b
QUAD INPUT/OUTPUT FAST READ operation
Number of XIP confirmation bits for QUAD INPUT/OUTPUT FAST 7:5 001b
READ operation
Command code for QUAD INPUT/OUTPUT FAST READ operation 39h 7:0 EBh
Number of dummy clock cycles required before valid output from 3Ah 4:0 00111b
QUAD OUTPUT FAST READ operation
Number of XIP confirmation bits for QUAD OUTPUT FAST READ op- 7:5 001b
eration
Command code for QUAD OUTPUT FAST READ operation 3Bh 7:0 6Bh
Number of dummy clock cycles required before valid output from 3Ch 4:0 00111b
DUAL OUTPUT FAST READ operation
Number of XIP confirmation bits for DUAL OUTPUT FAST READ oper- 7:5 001b
ation
Command code for DUAL OUTPUT FAST READ operation 3Dh 7:0 3Bh
Number of dummy clock cycles required before valid output from 3Eh 4:0 00111b
DUAL INPUT/OUTPUT FAST READ operation
Number of XIP confirmation bits for DUAL INPUT/OUTPUT FAST 7:5 001b
READ
Command code for DUAL INPUT/OUTPUT FAST READ operation 3Fh 7:0 BBh
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512Mb, Multiple I/O Serial Flash Memory
READ IDENTIFICATION Operations
Byte 512Mb
Description Address Bits Data
Supports FAST READ operation in dual SPI protocol 40h 0 1
Reserved 3:1 111b
Supports FAST READ operation in quad SPI protocol 4 1
Reserved 7:5 111b
Reserved 43:41h FFFFFFh FFFFFFh
Reserved 45:44h FFFFh FFFFh
Number of dummy clock cycles required before valid output from 46h 4:0 00111b
FAST READ operation in dual SPI protocol
Number of XIP confirmation bits for FAST READ operation in dual SPI 7:5 001b
protocol
Command code for FAST READ operation in dual SPI protocol 47h 7:0 BBh
Reserved 49:48h FFFFh FFFFh
Number of dummy clock cycles required before valid output from 4Ah 4:0 01001b
FAST READ operation in quad SPI protocol
Number of XIP confirmation bits for FAST READ operation in quad 7:5 001b
SPI protocol
Command code for FAST READ operation in quad SPI protocol 4Bh 7:0 EBh
Sector type 1 size (4k) 4Ch 7:0 0Ch
Sector type 1 command code (4k) 4Dh 7:0 20h
Sector type 2 size (64KB) 4Eh 7:0 10h
Sector type 2 command code 64KB) 4Fh 7:0 D8h
Sector type 3 size (not present) 50h 7:0 00h
Sector type 3 size (not present) 51h 7:0 00h
Sector type 4 size (not present) 52h 7:0 00h
Sector type 4 size (not present) 53h 7:0 00h
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
3-Byte Address
To execute READ MEMORY commands, S# is driven LOW. The command code is input
on DQn, followed by input on DQn of three address bytes. Each address bit is latched in
during the rising edge of the clock. The addressed byte can be at any location, and the
address automatically increments to the next address after each byte of data is shifted
out; therefore, a die can be read with a single command. The operation is terminated by
driving S# HIGH at any time during data output.
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Notes: 1. Yes in the "Supported' row for each protocol indicates that the command in that col-
umn is supported; when supported, a command's functionality is identical for the entire
column regardless of the protocol. For example, a FAST READ functions the same for all
three protocols even though its data is input/output differently depending on the pro-
tocol.
2. FAST READ is similar to READ, but requires dummy clock cycles following the address
bytes and can operate at a higher frequency (fC).
4-Byte Address
To execute 4-byte READ MEMORY commands, S# is driven LOW. The command code is
input on DQn, followed by input on DQn of four address bytes. Each address bit is
latched in during the rising edge of the clock. The addressed byte can be at any location,
and the address automatically increments to the next address after each byte of data is
shifted out; therefore, a die can be read with a single command. The operation is termi-
nated by driving S# HIGH at any time during data output.
Table 27: Command/Address/Data Lines for READ MEMORY Commands – 4-Byte Address
Notes 1 and 2 apply to entire table
Command Name (4-Byte Address)
DUAL QUAD
FAST DUAL OUTPUT INPUT/OUTPUT QUAD OUTPUT INPUT/OUTPUT
READ READ FAST READ FAST READ FAST READ FAST READ
STR Mode 03/13 0B/0C 3B/3C BB/BC 6B/6C EB/EC
DTR Mode – 0D 3D BD 6D ED
Extended SPI Protocol
Supported Yes Yes Yes Yes Yes Yes
Command Input DQ0 DQ0 DQ0 DQ0 DQ0 DQ0
Address Input DQ0 DQ0 DQ0 DQ[1:0] DQ0 DQ[3:0]
Data Output DQ1 DQ1 DQ[1:0] DQ[1:0] DQ[3:0] DQ[3:0]
Dual SPI Protocol
Supported No Yes Yes Yes No No
Command Input – DQ[1:0] DQ[1:0] DQ[1:0] – –
Address Input – DQ[1:0] DQ[1:0] DQ[1:0] – –
Data Output – DQ[1:0] DQ[1:0] DQ[1:0] – –
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Table 27: Command/Address/Data Lines for READ MEMORY Commands – 4-Byte Address (Contin-
ued)
Notes 1 and 2 apply to entire table
Command Name (4-Byte Address)
DUAL QUAD
FAST DUAL OUTPUT INPUT/OUTPUT QUAD OUTPUT INPUT/OUTPUT
READ READ FAST READ FAST READ FAST READ FAST READ
STR Mode 03/13 0B/0C 3B/3C BB/BC 6B/6C EB/EC
DTR Mode – 0D 3D BD 6D ED
Quad SPI Protocol
Supported No Yes No No Yes Yes
Command Input – DQ[3:0] – – DQ[3:0] DQ[3:0]
Address Input – DQ[3:0] – – DQ[3:0] DQ[3:0]
Data Output – DQ[3:0] – – DQ[3:0] DQ[3:0]
Notes: 1. Yes in the "Supported' row for each protocol indicates that the command in that col-
umn is supported; when supported, a command's functionality is identical for the entire
column regardless of the protocol. For example, a FAST READ functions the same for all
three protocols even though its data is input/output differently depending on the pro-
tocol.
2. Command codes 13, 0C, 3C, BC, 6C, and EC do not need to be set up in the addressing
mode; they will work directly in 4-byte addressing mode.
3. A 4-BYTE FAST READ command is similar to 4-BYTE READ operation, but requires dum-
my clock cycles following the address bytes and can operate at a higher frequency (fC).
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ[0] Command
MSB A[MAX]
LSB
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Don’t Care
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ0 Command
MSB A[MAX]
LSB
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dummy cycles
Dual
0 3 4 Cx
C
Dummy cycles
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended 0 7 8 Cx
C
Dummy cycles
Dual
0 3 4 Cx
C
Dummy cycles
Extended
0 7 8 Cx
C
Dummy cycles
Dual
0 3 4 Cx
C
Dummy cycles
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN] LSB
DQ0 Command DOUT DOUT DOUT
MSB A[MAX]
DQ[2:1] High-Z DOUT DOUT DOUT
Dummy cycles
Quad
0 1 2 Cx
C
Dummy cycles
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN] LSB
DQ0 Command DOUT DOUT DOUT
MSB
Dummy cycles
Quad
0 1 2 Cx
C
Dummy cycles
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ0 Command
MSB A[MAX]
LSB
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dummy cycles
Dual
0 3 4 Cx
C
Dummy cycles
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN] LSB
DQ0 Command DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB A[MAX]
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dummy cycles
Extended
0 7 8 Cx
C
DQ1 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
A[MAX] MSB
Dummy cycles
Dual
0 3 4 Cx
C
Dummy cycles
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
Extended
0 7 8 Cx
C
LSB A[MIN] LSB
DQ0 Command DOUT DOUT DOUT DOUT
MSB A[MAX]
DQ[2:1] High-Z DOUT DOUT DOUT DOUT
Dummy cycles
Extended
0 7 8 Cx
C
LSB A[MIN] LSB
DQ0 Command DOUT DOUT DOUT DOUT
MSB
Dummy cycles
Quad
0 1 2 Cx
C
LSB A[MIN] LSB
DQ[3:0] Command DOUT DOUT DOUT DOUT
MSB A[MAX] MSB
Dummy cycles
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512Mb, Multiple I/O Serial Flash Memory
READ MEMORY Operations
2. Shown here is the QUAD INPUT/OUTPUT FAST READ timing for the extended SPI proto-
col. The quad timing shown for the FAST READ command is the equivalent of the QUAD
INPUT/OUTPUT FAST READ timing for the quad SPI protocol.
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512Mb, Multiple I/O Serial Flash Memory
PROGRAM Operations
PROGRAM Operations
PROGRAM commands are initiated by first executing the WRITE ENABLE command to
set the write enable latch bit to 1. S# is then driven LOW and held LOW until the eighth
bit of the last data byte has been latched in, after which it must be driven HIGH. The
command code is input on DQ0, followed by input on DQ[n] of address bytes and at
least one data byte. Each address bit is latched in during the rising edge of the clock.
When S# is driven HIGH, the operation, which is self-timed, is initiated; its duration is
tPP.
If the bits of the least significant address, which is the starting address, are not all zero,
all data transmitted beyond the end of the current page is programmed from the start-
ing address of the same page. If the number of bytes sent to the device exceed the maxi-
mum page size, previously latched data is discarded and only the last maximum page-
size number of data bytes are guaranteed to be programmed correctly within the same
page. If the number of bytes sent to the device is less than the maximum page size, they
are correctly programmed at the specified addresses without any effect on the other
bytes of the same page.
When the operation is in progress, the program or erase controller bit of the flag status
register is set to 0. The write enable latch bit is cleared to 0, whether the operation is
successful or not. The status register and flag status register can be polled for the opera-
tion status. The operation is considered complete after bit 7 of the flag status register
outputs 1 with at least one byte output. When the operation completes, the program or
erase controller bit is cleared to 1.
If the operation times out, the write enable latch bit is reset and the program fail bit is
set to 1. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1. When a command is applied
to a protected sector, the command is not executed, the write enable latch bit remains
set to 1, and flag status register bits 1 and 4 are set.
Note that the flag status register must be polled even if operation times out.
Note: 1. Yes in the protocol columns indicates that the command is supported and has the same
functionality and command sequence as other commands marked Yes.
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512Mb, Multiple I/O Serial Flash Memory
PROGRAM Operations
Extended
0 7 8 Cx
C
Dual
0 3 4 Cx
C
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
PROGRAM Operations
Extended
0 7 8 Cx
C
Dual
0 3 4 Cx
C
Extended
0 7 8 Cx
C
Dual
0 3 4 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
PROGRAM Operations
Extended
0 7 8 Cx
C
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
PROGRAM Operations
Extended
0 7 8 Cx
C
Quad
0 1 2 Cx
C
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512Mb, Multiple I/O Serial Flash Memory
WRITE Operations
WRITE Operations
WRITE ENABLE Command
The WRITE ENABLE operation sets the write enable latch bit. To execute a WRITE ENA-
BLE command, S# is driven LOW and held LOW until the eighth bit of the command
code has been latched in, after which it must be driven HIGH. The command code is
input on DQ0 for extended SPI protocol, on DQ[1:0] for dual SPI protocol, and on
DQ[3:0] for quad SPI protocol.
The write enable latch bit must be set before every PROGRAM, ERASE, WRITE, ENTER
4-BYTE ADDRESS MODE, and EXIT 4-BYTE ADDRESS MODE command. If S# is not
driven HIGH after the command code has been latched in, the command is not execu-
ted, flag status register error bits are not set, and the write enable latch remains cleared
to its default setting of 0.
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512Mb, Multiple I/O Serial Flash Memory
WRITE Operations
Extended
0 1 2 3 4 5 6 7
C
S#
Command Bits LSB
DQ0 0 0 0 0 0 1 1 0
MSB
DQ1 High-Z
Dual
0 1 2 3
C
S#
Command Bits
LSB
DQ0 0 0 1 0
DQ1 0 0 0 1
MSB
Quad
0 1
C
S#
Command Bits LSB
DQ0 0 0
DQ1 0 1
DQ2 0 1
Note: 1. Shown here is the WRITE ENABLE command code, which is 06h or 0000 0110 binary. The
WRITE DISABLE command sequence is identical, except the WRITE DISABLE command
code is 04h or 0000 0100 binary.
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
ERASE Operations
When the operation is in progress, the program or erase controller bit of the flag status
register is set to 0. The flag status register must be polled for the operation status. When
the operation completes, that bit is cleared to 1.
Note that the flag status register must be polled even if operation times out.
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
byte output. When the operation completes, the program or erase controller bit is
cleared to 1.
If the operation times out, the write enable latch bit is reset and erase error bit is set to
1. If S# is not driven HIGH, the command is not executed, flag status register error bits
are not set, and the write enable latch remains set to 1. When a command is applied to a
protected sector, the command is not executed. Instead, the write enable latch bit re-
mains set to 1, and flag status register bits 1 and 5 are set.
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ0 Command
MSB A[MAX]
Dual
0 3 4 Cx
C
LSB A[MIN]
DQ0[1:0] Command
MSB A[MAX]
Quad
0 1 2 Cx
C
LSB A[MIN]
DQ0[3:0] Command
MSB A[MAX]
If the write enable latch bit is not set, the device ignores the DIE ERASE command and
no error bits are set to indicate operation failure.
When the operation is in progress, the program or erase controller bit is set to 0. The
write enable latch bit is cleared to 0, whether the operation is successful or not. The sta-
tus register and flag status register can be polled for the operation status. The operation
is considered complete once bit 7 of the flag status register outputs 1 with at least one
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
byte output. When the operation completes, the program or erase controller bit is
cleared to 1.
The command is not executed if any sector is locked. Instead, the write enable latch bit
remains set to 1, and flag status register bits 1 and 5 are set.
Extended
0 7 8 Cx
C
LSB A[MIN]
DQ0 Command
MSB A[MAX]
Dual
0 3 4 Cx
C
LSB A[MIN]
DQ0[1:0] Command
MSB A[MAX]
Quad
0 1 2 Cx
C
LSB A[MIN]
DQ0[3:0] Command
MSB A[MAX]
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
The command is not executed if any sector is locked. Instead, the write enable latch bit
remains set to 1, and flag status register bits 1 and 5 are set.
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
Extended
0 7
C
LSB
DQ0 Command
MSB
Dual
0 3
C
LSB
DQ0[1:0] Command
MSB
Quad
0 1
C
LSB
DQ0[3:0] Command
MSB
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
mand to a sector that is in an erase suspend state; it also sets the flag status register bit 4
to 1, program failure/protection error, and leaves the write enable latch bit unchanged.
The commands allowed during an erase suspend state are shown in the Operations Al-
lowed/Disallowed During Device States table. When the ERASE resumes, it does not
check the new lock status of the WRITE LOCK REGISTER command.
During a PROGRAM SUSPEND operation, a READ operation is possible in any page ex-
cept the one in a suspended state. Reading from a page that is in a suspended state will
output indeterminate data. The commands allowed during a program suspend state in-
clude the WRITE VOLATILE CONFIGURATION REGISTER command and the WRITE
ENHANCED VOLATILE CONFIGURATION REGISTER command.
It is possible to nest a PROGRAM/ERASE SUSPEND operation inside a PROGRAM/
ERASE SUSPEND operation just once. Issue an ERASE command and suspend it. Then
issue a PROGRAM command and suspend it also. With the two operations suspended,
the next PROGRAM/ERASE RESUME command resumes the latter operation, and a sec-
ond PROGRAM/ERASE RESUME command resumes the former (or first) operation.
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512Mb, Multiple I/O Serial Flash Memory
ERASE Operations
Notes: 1. The device can be in only one state at a time. Depending on the state of the device,
some operations are allowed (Yes) and others are not (No). For example, when the de-
vice is in the standby state, all operations except SUSPEND are allowed in any sector. For
all device states except the erase suspend state, if an operation is allowed or disallowed
in one sector, it is allowed or disallowed in all other sectors. In the erase suspend state, a
PROGRAM operation is allowed in any sector except the one in which an ERASE opera-
tion has been suspended.
2. All READ operations except READ STATUS REGISTER and READ FLAG REGISTER. When is-
sued to a sector or subsector that is simultaneously in an erase suspend state, the READ
operation is accepted, but the data output is not guaranteed until the erase has comple-
ted.
3. All PROGRAM operations except PROGRAM OTP. In the erase suspend state, a PROGRAM
operation is allowed in any sector (Yes) except the sector (No) in which an ERASE opera-
tion has been suspended.
4. Applies to the SECTOR ERASE or SUBSECTOR ERASE operation.
5. Applies to the following operations: WRITE STATUS REGISTER, WRITE NONVOLATILE
CONFIGURATION REGISTER, PROGRAM OTP, and DIE ERASE.
6. Applies to the WRITE VOLATILE CONFIGURATION REGISTER, WRITE ENHANCED VOLA-
TILE CONFIGURATION REGISTER, WRITE ENABLE, WRITE DISABLE, CLEAR FLAG STATUS
REGISTER, WRITE EXTENDED ADDRESS REGISTER, ENTER 4-BYTE EXTENDED ADDRESS
REGISTER, EXIT 4-BYTE EXTENDED ADDRESS REGISTER, or WRITE LOCK REGISTER opera-
tion.
7. Applies to the READ STATUS REGISTER or READ FLAG STATUS REGISTER operation.
8. Applies to the PROGRAM SUSPEND or ERASE SUSPEND operation.
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512Mb, Multiple I/O Serial Flash Memory
RESET Operations
RESET Operations
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
C
DQ0
Note: 1. The number of lines and rate for transmission varies with extended, dual, or quad SPI.
RESET Conditions
All volatile lock bits, the volatile configuration register, the enhanced volatile configura-
tion register, and the extended address register are reset to the power-on reset default
condition. The power-on reset condition depends on settings in the nonvolatile config-
uration register.
Reset is effective once bit 7 of the flag status register outputs 1 with at least one byte
output. A RESET ENABLE command is not accepted in the cases of WRITE STATUS
REGISTER and WRITE NONVOLATILE CONFIGURATION REGISTER operations.
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512Mb, Multiple I/O Serial Flash Memory
ONE-TIME PROGRAMMABLE Operations
Extended
0 7 8 Cx
C, C_1, C_2
LSB A[MIN]
DQ0/DQ4 Command
MSB A[MAX]
LSB
DQ1/DQ5 High-Z DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT DOUT
MSB
Dummy cycles
Dual
0 3 4 Cx
C, C_1, C_2
Dummy cycles
Quad
0 1 2 Cx
C, C_1, C_2
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512Mb, Multiple I/O Serial Flash Memory
ONE-TIME PROGRAMMABLE Operations
PROGRAM OTP ARRAY programs, at most, 64 bytes to the OTP memory area and one
OTP control byte. When the operation is in progress, the write in progress bit is set to 1.
The write enable latch bit is cleared to 0, whether the operation is successful or not, and
the status register and flag status register can be polled for the operation status. When
the operation completes, the write in progress bit is cleared to 0.
If the operation times out, the write enable latch bit is reset and the program fail bit is
set to 1. If S# is not driven HIGH, the command is not executed, flag status register error
bits are not set, and the write enable latch remains set to 1. The operation is considered
complete once bit 7 of the flag status register outputs 1 with at least one byte output.
The OTP control byte (byte 64) is used to permanently lock the OTP memory array.
Extended
0 7 8 Cx
C, C_1, C_2
Dual
0 3 4 Cx
C, C_1, C_2
Quad
0 1 2 Cx
C, C_1, C_2
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512Mb, Multiple I/O Serial Flash Memory
ADDRESS MODE Operations – Enter and Exit 4-Byte Address
Mode
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512Mb, Multiple I/O Serial Flash Memory
XIP Mode
XIP Mode
Execute-in-place (XIP) mode allows the memory to be read by sending an address to the
device and then receiving the data on one, two, or four pins in parallel, depending on
the customer requirements. XIP mode offers maximum flexibility to the application,
saves instruction overhead, and reduces random access time.
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512Mb, Multiple I/O Serial Flash Memory
XIP Mode
Mode 3 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
C Mode 0
tVSI (<100µ)
S#
A[MIN] LSB
DQ0 Xb DOUT DOUT DOUT DOUT DOUT
Dummy cycles
Note: 1. Xb is the XIP confirmation bit and should be set as follows: 0 to keep XIP state; 1 to exit
XIP mode and return to standard read mode.
Protocol Effect
Extended I/O In a device with a dedicated part number where RESET# is enabled, a LOW pulse on that pin resets
and Dual I/O XIP and the device to the state it was in previous to the last power-up, as defined by the nonvolatile
configuration register.
Dual I/O Values of DQ1 during the first dummy clock cycle are "Don't Care."
Quad I/O1 Values of DQ[3:1] during the first dummy clock cycle are "Don't Care." In a device with a dedicated
part number, it is only possible to reset memory when the device is deselected.
Note: 1. In a device with a dedicated part number where RESET# is enabled, a LOW pulse on that
pin resets XIP and the device to the state it was in previous to the last power-up, as de-
fined by the nonvolatile configuration register only when the device is deselected.
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512Mb, Multiple I/O Serial Flash Memory
XIP Mode
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512Mb, Multiple I/O Serial Flash Memory
Power-Up and Power-Down
VCC
VCC,max
S# not allowed
tVTW = tVTR
Device fully accessible
VCC,min
Chip reset tVTP Polling allowed
VWI SPI protocol Starting protocol defined by NVCR
WIP = 1 WIP = 0
WEL = 0 WEL = 0
Time
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512Mb, Multiple I/O Serial Flash Memory
Power-Up and Power-Down
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512Mb, Multiple I/O Serial Flash Memory
AC Reset Specifications
AC Reset Specifications
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512Mb, Multiple I/O Serial Flash Memory
AC Reset Specifications
S#
tSHRH tRHSL
tRLRH
RESET#
Don’t Care
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
C
tSHSL2 tSHSL3
Reset enable Reset memory
S#
DQ0
tSHSL
S#
C
tCHCL
tDVCH tCHDX tCLCH
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512Mb, Multiple I/O Serial Flash Memory
AC Reset Specifications
S#
C
tCHHH
tHLQZ tHHQX
DQ0
DQ1
HOLD#
Don’t Care
S#
DQ1 Address
LSB in
Don’t Care
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512Mb, Multiple I/O Serial Flash Memory
AC Reset Specifications
End of command
(identified by WIP polling)
S#
DQ0
tVPPHSL
VPPH
VPP
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512Mb, Multiple I/O Serial Flash Memory
Absolute Ratings and Operating Conditions
Notes: 1. Compliant with JEDEC Standard J-STD-020C (for small-body, Sn-Pb or Pb assembly),
RoHS, and the European directive on Restrictions on Hazardous Substances (RoHS)
2002/95/EU.
2. JEDEC Standard JESD22-A114A (C1 = 100pF, R1 = 1500Ω, R2 = 500Ω).
3. During signal transitions, minimum voltage may undershoot to –1V for periods less than
10ns.
4. During signal transitions, maximum voltage may overshoot to VCC + 1V for periods less
than 10ns.
Note: 1. These parameters are sampled only, not 100% tested. TA = 25°C at 54 MHz.
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512Mb, Multiple I/O Serial Flash Memory
Absolute Ratings and Operating Conditions
Note: 1. 0.8VCC = VCC for dual/quad operations; 0.2VCC = 0V for dual/quad operations.
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512Mb, Multiple I/O Serial Flash Memory
DC Characteristics and Operating Conditions
Note: 1. Automotive temperature range = –40°C to 125°C; See also the Part Number Information
table.
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512Mb, Multiple I/O Serial Flash Memory
AC Characteristics and Operating Conditions
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512Mb, Multiple I/O Serial Flash Memory
AC Characteristics and Operating Conditions
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512Mb, Multiple I/O Serial Flash Memory
Package Dimensions
Package Dimensions
8 1
5 4
0.10 M C A B
+0.08
0.40 -0.05
0.15 C
0.05 M C
0.40 ±0.05 5.16 TYP
0.2
MIN
0.10 C
0.05 C
0.85 TYP/ 0.05 MAX
1 MAX
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512Mb, Multiple I/O Serial Flash Memory
Package Dimensions
7.50 ±0.10
1 8 0° MIN/8° MAX
0.1 Z
0.33 MIN/ 0.40 MIN/
0.51 MAX 1.27 TYP Z 1.27 MAX
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512Mb, Multiple I/O Serial Flash Memory
Package Dimensions
0.79 TYP
Seating
plane
A
0.1 A
4.00 C 8 ±0.10
D
1.00 TYP
E
6 ±0.10
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512Mb, Multiple I/O Serial Flash Memory
Part Number Ordering Information
Part Number
Category Category Details Notes
Device type N25Q = Serial NOR Flash memory, Multiple Input/Output (Single, Dual, Quad I/O), XIP
Density 512 = 512Mb
Technology A = 65nm
Feature set 1 = Byte addressability; HOLD pin; Micron XIP 1
2 = Byte addressability; HOLD pin; Basic XIP 1
3 = Byte addressability; RST# pin; Micron XIP 1
4 = Byte addressability; RST# pin; Basic XIP 1
7 = Byte addressability; HOLD pin; Micron XIP 2
8 = Byte addressability; HOLD pin; Micron XIP; RESET pin 1
Operating voltage 3 = VCC = 2.7 to 3.6V
Block structure G = Uniform (64KB and 4KB) , easy transparent stack
Package F8 = V-PDFN-8/8mm x 6mm RP 3
(RoHS-compliant) SF = SOP2-16/300mils
12 = T-PBGA-24b05/6mm x 8mm
Temperature and 4 = IT: –40°C to 85°C; Device tested with standard test flow
test flow A = Automotive temperature range, –40 to 125°C; Device tested with high reliability
certified test flow
H = IT: –40°C to 85°C; Device tested with high reliability certified test flow
Security features 0 = Default 4
Shipping material E = Tray
F = Tape and reel
G = Tube
Notes: 1. Enter 4-byte address mode and exit 4-byte address mode supported.
2. 4-byte addressing mode is the default at power-up. Enter and exit 4-byte addressing
mode are not supported.
3. See the table below for additional information.
4. Additional secure options are available upon customer request.
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. T 08/14 EN 91 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
512Mb, Multiple I/O Serial Flash Memory
Part Number Ordering Information
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. T 08/14 EN 92 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
512Mb, Multiple I/O Serial Flash Memory
Revision History
Revision History
Rev. T - 08/14
• Added N25Q512A83G12A0x and N25Q512A83G12H0x
Rev. S – 06/14
• Corrected device ID
Rev. R – 03/14
• In Command Set table, updated value for Quad I/O FAST READ – DTR from 3Dh to
6Dh
Rev. Q – 11/13
• Added N25Q512A83G1240x, N25Q512A83GSF40x, N25Q512A83GSFA0F
Rev. P – 07/13
• Revised signal assignments
Rev. O – 05/13
• Changed ICC1 (grade 3) to ICC1 (automotive) in the DC Current Characteristics and
Operating Conditions table, and added a footnote
• Revised maximum temperature (–40°C to 125°C) in DC Characteristics and Operating
Conditions table footnote
• Added part number N25Q512A83GSF40x and N25Q512A83G1240x in AC Characteris-
tics and Operating Conditions table note
Rev. N – 02/13
• Updated the READ ID Operation figure in READ ID Operations
• Updated ERASE Operations
• Added link to part number chart in Part Number Ordering Information
• Updated part numbers in Features
Rev. M – 12/12
• Revised part numbers to selected notes in the Command Definitions table.
Rev. L – 11/12
• Typo fix in Command Set table in Command Definitions – Dual I/O FAST READ - DTR
from DBh to BDh
Rev. K – 11/12
• Updated part numbers
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. T 08/14 EN 93 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
512Mb, Multiple I/O Serial Flash Memory
Revision History
Rev. J – 08/12
• Additional command (BULK ERASE) added to Command Set table in Command Defi-
nitions
• Corrections to Commands in Command Definitions
Rev. I – 07/12
• Added part number N25Q512A13GSFA0X to Features
• Added ICC1 (grade 3) to DC Characteristics and Operating Conditions
Rev. H – 06/12
• Added part numbers N25Q512A83GSF40X and N25Q512A83G1240X and associated
QUAD commands for these part numbers
Rev. G – 06/12
• Typo fix in Supported Clock Frequencies - DTR table in Nonvolatile and Volatile Reg-
isters
• Updated tSSE specification in AC Reset Conditions table
Rev. F – 06/12
• Added MLP8 ballout to Signal Assignments
• Updated dimensions to V-PDFN-8/8mm x 6mm package in Package Dimensions
• Typo fix in Supported Clock Frequencies - DTR table in Nonvolatile and Volatile Reg-
isters
Rev. E – 05/12
• Added V-PDFN 8/8mm x 6mm package
Rev. D – 02/12
• To Production status
Rev. B – 11/11
• Correction to bit 1:0; A24 in Description corrected to A[25:24] of Extended Address
Register Bit Definitions table in Nonvolatile and Volatile Registers
Rev. A – 07/11
• Initial release
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. T 08/14 EN 94 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
512Mb, Multiple I/O Serial Flash Memory
Revision History
PDF: 09005aef84752721
n25q_512mb_1ce_3V_65nm.pdf - Rev. T 08/14 EN 95 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.