Confirm to ISO’02

Definition of Surface texture and Stylus instrument

Profile by Stylus and phase correct filter ISO4287:’97 and ISO3274:’96 Sampling length and Evaluation length ISO4287:’97

Total profile Primary profile Ｐ Form deviation profile

=Mean line for roughness profile Primary profile P Mean line
Measure perpendicular to lay
=Waviness profile on old DIN & JIS
X-axis Z-axis Stylus method
probe P-parameter
λs profile filter
λc profile filter
Real surface
λf profile filter
Phase correct filter
Traced profile perpendicular 50% transmission at cutoff Roughness profile R
Profile peak Mean line
to real surface No phase shift / low distortion Top of profile peak
Stylus tip geometry Waviness profile W
θ (Filtered center line waviness profile)
θ=60°( or 90°) cone ･Stylus deformation Roughness profile R
・Noise
rtip rｔｉｐ=2µm( or 5, 10µm)
R-parameter W-parameter
100%
Selection of λs & Stylus tip rtip Profile valley
Profile element width Xs
Sampling length lr Bottom of profile valley
λc (mm) λc／λs rtip (µm) Roughness profile Waviness profile = Cutoff λc lr lr lr lr
0.08 30
2.5 2 50%
0.25 Evaluation length ln = n×lr （n: Default 5）
Transmission
100
0.8 300 2 (5 at Rz >3µm) Pre travel Post travel
2.5 8 lp (λc/2) lp (λc/2)
5 or 2 Traversing length Lt = Lp + Ln + Lp
0
8 25 10, 5 or 2 λs Cutoff (Wavelength) λｃ λc Wavelength λ λf

Measuring condition: R-parameter ISO4288:’96 Evaluation procedure of roughness ISO4288:’96 Indication of surface texture ISO1302:’02
Note.：
Non-periodic profile Measuring condition 1. View the surface and decide whether profile is periodic or non-periodic. Default item（red）is not indicated.
Periodic profile Additional item（blue）is indicated if necessary.
Ra,Rq,Rsk,Rku Rz,Rv,Rp,Rc, or RSm 2. When the tolerance limit is specified, use the table shown on the left for condition.
Sampling Evaluatio
or R∆q or Rt length : lr n length
not allowed Required
3. When the tolerance limit is not specified.
= ln (mm)
Ra (µm) Rz (µm) RSm (mm) Cutoff = 3.1 Estimate roughness and measure it in corresponding condition in the table.
Over> Less≤ Over> Less≤ Over> Less≤ λc (mm) 5 × lr Material removal Manufacturing method Surface parameter and condition
3.2 Change condition according with above result and measure it again.

0.006 0.02 0.025 0.1 0.013 0.04 0.08 0.4 3.3 Repeat “3.2” if the result does not reached the condition. c ground
3.4 When the result reaches the condition, it will be the final value. a Example U 0.008-2.5/Rz3max 12.3
0.02 0.1 0.1 0.5 0.04 0.13 0.25 1.25
Check it in shorter sampling length at non-periodic and change it if it meets.
0.1 2 0.5 10 0.13 0.4 0.8 4
4. Compare the result toward tolerance limit in accordance with following rule,
e d b 3 = L “2RC”0.008-0.8/Ra75 0.2
2 10 10 50 0.4 1.3 2.5 12.5
Upper limit - the 16% rule (Default)
10 80 50 200 1.3 4 8 40 Measure on the most critical surface. If not more than 16% of all value based Machining Surface lay and orientation The second surface parameter
on sampling length are exceed the limit, surface is acceptable. allowance(mm) ═, ┴, X, M, C, R, P and condition
Measuring condition : P-parameter ISO4288:’96 - The first value does not exceed 70% of the limit.
- The first three values do not exceed the limit.
Stylus radius λs λc No. of lp = n S.length lp E.length ln
- Not more than one of the first six value exceed the limit. Upper U Filter Transmission Parameter No. of Comparison
- Not more than two of the first twelve value exceed the limit. or Phase band λs - λc S.length rule Value limit
2µm 2.5µm Length of Length of (µm)
feature feature or when µ+σ does not exceed the limit, the result is acceptable. Lower L correct (mm) n 16%
or Default is table Profile Type （Defaut 5） or
5µm 8µm — 1 (Plane,
2RC on left max
Line)
Lower limit - the 16% rule (shown as L)
10µm 25µm Measure the surface that can be expected the lowest roughness.
If not more than 16% of all sampling length are less than the limit,
Measuring condition: W-parameter ISO1302:’02
or when µ-σ is not less than the limit, the result is acceptable.
No. of lw = m S. length lw E. length ln
U”2RC” 0.008-2.5/Rz3max 12.3
λc λf Max value - the max rule (when “max” suffix is added)
λc (for roughness) n λc (n: specified) m: specified λf mλf The value is acceptable when none of value in entire surface is over the limit.

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 Basic surface texture parameters and curves Confirm to ISO4287:'97

Amplitude parameters (peak and valley) Amplitude average parameters Spacing parameters Hybrid parameters Height characteristic average parameters

Rp Rt Ra RSm RΔq Rsk

Pp Maxmum profile peak height Pt Total height of profile Pa Arithmetical mean deviation PSm Mean width of the profile elements PΔq Root mean square slope Psk Skewness
Wp Wt (Pt = Rmax at JIS’82) Wa WSm (RSm = Sm at ISO4287 ‘84) WΔq Wsk
Quotient of mean cube value of the
The largest profile peak height Zp within Sum of height of the largest profile peak Arithmetic mean of the absolute Mean value of the profile element width Root mean square value of the ordinate ordinate values Z(x) and cube Pq,Rq,Wq
a sampling length. height Rp and the largest profile valley ordinate values Z(x) within a sampling Xs within a sampling length. respectively, within a sampling length.
slopes dZ/dX within a sampling length.
Rv within an evaluation length. length. 1 m 1 1 lr
3
Rp, Pp, Wp = max(Z(x)) RSm, PSm, WSm = ── ∑ Xsi Rsk = ─── ── ∫ Z (x) dx
RΔq, 1 L d 2 3
Rt, Pt, Wt = max(Rpi)+max(Rvi) 1 L m
I=1
Rq lr 0
PΔq, = ──∫ ─ Z(x) dx
Rp Ra, Pa, Wa = ── ∫ | Z(x) | dx
Zp1
L
0 WΔq L 0 dx
Zp2 Zpi Rp5 Ra
Rp2 Xsm
Xs1 Xs2 Xs3 Xsi dZ(x)/dx Rsk>0
Rt

Rsk<0
Sampling length L lr Rv2 Rv4
Evaluation length ln Sampling length L Sampling length L Sampling length L
Probability density

Rv Rc Rq Parameter from bearing ratio curve and profile height amplitude curve Rku
Pv Maximum profile valley depth Pc Mean height of profile elements Pq Root mean square deviation Pku Kurtosis of profile
Wv Wc Wq Material ratio curve of the profile Profile height amplitude curve Wku
(Abbott Firestone curve)
The largest profile valley depth Zp Mean value of the profile element Root mean square value of the ordinate Sample probability density function of Quotient of mean quartic of the ordinate
within a sampling length. heights Zt within a sampling length values Z(x) within a sampling length. Curve representing the material ratio of ordinate Z(x) within an evaluation values Z(x) and 4th power of Pq,Rq,Wq
1 m the profile as a functional of level c. length. respectively, within a sampling length.
Rv, Pv, Wv = min(Z(x)) Rc, Pc, Wc = ── ∑ Zti 1 L 1 1 lr
m
I=1 Rq, Pq, Wq = ∫ Z2(x) dx Ml(c)1 Ml(c)i Rku = ─── ── ∫ Z (x) dx
4
0 0% 4 0
Zt1
L Rq lr
Zt2 Ztm
Zt3 c
Zti Rq
2
Rt Rku>3
Rv 100%

0% 100% 0 Probability
Zv1 Zv2 Zvi
Sampling length L Rmr(c) density
Sampling length L Evaluation length ln Rku<3
Profile height
Profile element: Profile Bearing ratio curve
Sampling length L amplitude curve
Profile peak & the adjacent valley Probability density

Rz RzJIS Ten point height of roughness Ra75 Center line average Rmr(c) Rδc Rmr
Pz Maximum height of profile profile (Rz at JIS’94) (Old Ra,AA,CLA) Pmr(c) Material ratio of profile Pδc Profile section height difference Pmr Relative material ratio
Wz (Rz = Ry at ISO4287 ‘84) Sum of mean value of largest peak to Wmr(c) (Rmr(c) = ex- tp) Wδc Wmr
the fifth largest peak and mean value of Arithmetic mean of the absolute
Sum of height of the largest profile peak largest valley to the fifth largest valley ordinate value Z(x) in a sampling length Ratio of the material length of the profile Vertical distance between two section Material ratio determined at a profile
height Rp and the largest profile valley within a sampling length. of roughness profile with 2RC filter of elements Ml(c) at a given level c to the levels of given material ratio. section level Rδc, related to a reference
Rv within a sampling length. 1 5 75% transmission. evaluation length. c0
1 ln 100 Rδc = c(Rmr1)-c(Rmr2) : Rmr1<Rmr2 Rmr = Rmr(c1)
RzJIS = ── ∑(Zpj + Zvj) m
j=1
Rz = Rp + Rv 5 Zp1st Ra75 = ──∫ | Z(x) | dx Rmr(c)= ─── ∑ Ml(c)i (%) c1= c0- Rδc、c0= c(Rmr0)
Zp2nd Zp3rd Zp4th ln
0
Ra75 Ln
i=1
0 0
Zp5th
Rp
Ml(c) Ml(c)
RzJIS C0
Rz c c(Rmr1)
Rδc Rδc
Rv Rt
Zv5th Zv Zv4th Zv2nd c(Rmr2) C1
3rd
Zv1st Sampling length L
Sampling length L 100% or 100% or
Sampling length L
Rt(µm) Rt(µm)
Annex of JIS only and confirm to JIS’94 Annex of JIS only Evaluation length ln
Different from Rz at old ISO,ANSI &JIS Different from Rz at JIS’82 Same as Ra at old ISO,ANSI & DIN 0% Rmr1 Rmr2 100% 0% Rmr 100%
Rmr0

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 Expanded surface texture parameters and curves Confirm to ISO4287:’96, ISO12085:’96
& ISO13565-1:'96 / -2:’96 / -3:’98

Traditional local parameters Parameters of surfaces having stratified functional properties ISO13565's Motif parameters of ISO12085:’96 Hint of surface texture measurement
RmaxDIN: Maximum peak to valley height Filtering process of ISO13565-1:’96 Measuring condition of ISO13565-1 Motif: A portion of the primary profile Measuring condition Roughness parameter conversion
RzDIN: Average peak to valley height Calculate mean line 1 from a primary profile Cutoff value λc Evaluation length ln between the highest points of two local Default A=0.5mm、B=2.5mm, ln=16mm The parameter ratio Ra／Rz (Rmax,Ry)=0.25
with phase correct filter. 0.8mm 4 mm peaks of the profile, which are not is applicable only to triangle profile.
Zi is the maximum Peak to valley height of a Mean line 1 2.5mm 12.5mm necessarily adjacent. A(mm) B(mm) ln (mm) λs (µm) Actual profiles have different parameter ratios
sampling length lr. according to the form of profile.
40% length secant of smallest gradient separate the Motif depths Hj & Hj+1: Depth measured 0.02 0.1 0.64 2.5
RmaxDIN is the maximum Zi of 5 adjoining Primary profile X material ratio curve into core area & projected areas. perpendicular to the general direction of the Rectangle: Ra/Rz=0.5
sampling length lr in an evaluation length ln. Calculate Rpk & Rvk with equivalent triangles of 0.1 0.5 3.2
RzDIN is arithmetic mean of 5 Zi. Calculate profile 2 with cutting valley lower primary profile.
projected areas.
1 n than mean line 1. 0.5 2.5 16 8 Sinusoidal: Ra/Rz=0.32
Peak area A1 Valley area A2 Motif length Ari or AWi: Length measured
RzDIN = Σ Zi Profile 2 0 2.5 12.5 80 25
i=1 Mean line 1 Equivalent parallel to the general direction of the profile. Triangle: Ra/Rz=0.25
n Equivalent
Z5=RmaxDIN triangle
Z2 Rpk area A1 triangle Indication of ISO1302:’02
Z1 Z3 Z4 Calculate mean line 3 from profile 2 with area A2 Lathed, Milled: Ra/Rz=0.16 to 0.26
local peak of profile local peak of profile Roughness motif
phase correct filter. Equivalent
Profile 2 straight line
Mean line 3 Rk λs– A / ln /R parameter limit value Ground, Sand blasted: Ra/Rz=0.10 to 0.17
Hj Hj+1
Calculate roughness profile 4 by taking mean Waviness motif
Rvk
lr line 3 off from a primary profile. Honing, Lapped: Ra/Rz=0.05 to 0.12
ln=5lr ARi(AWi) A – B / ln / W parameter limit value
Rt(µm) Pulse (Duty ratio 5%): Ra/Rz=0.095
100%
0% Mr1 Mr2
German old standard DIN4768/1:’90 40% Secant with (default value need not to be indicated)
roughness profile 4
smallest gradient

R3z: Base roughness depth Height characterization using the linear material ratio curve ISO13565-2:’96 Roughness motif: Motif derived by using the ideal operator with limit value A. Display aspect ratio & Stylus fall depth in
Rk: core roughness depth: Depth of the roughness core profile Limit value A: Maximum length of roughness motif to separate waviness motif. valley
3Zi is the height of the 3rd height peak from Rpk:reduced peak height: Average height of protruding peaks above roughness core profile. Upper envelope line of the primary profile (Waviness profile): Straight lines joining the Roughness profile usually displayed as much
the 3rd depth valley in a sampling length lr. Rvk:reduced valley depths: Average depth of valleys projecting through roughness core highest points of peaks of the primary profile, after conventional discrimination of peaks. magnified height deviations than wavelength.
profile. AR: Mean spacing of roughness motifs: The arithmetical mean value of the lengths ARi of Displayed valley looks sharp but actually
R3z is arithmetic mean of 3Zi’s of 5 sampling Mr1: material portion 1: Level in %, determined for the intersection line which separates the roughness motifs, within the evaluation length, i.e. wide. Stylus can contact to bottom of valley.
lengths in an evaluation length ln. protruding peaks from the roughness core profile. 1 n Depth error ε with stylus unable to contact on
1 n Mr2: material portion 2: Level in %, determined for the intersection line which separates the AR= Σ ARi (n: Total number of roughness motifs) triangle valley is; ε= rtip(1/cosθ - 1)
R3z = Σ 3zi deep valleys from the roughness core profile. n I=1 θ<15˚, or H/L=0.1-0.01 on machined surface.
n
i=1
Roughness core area R: Mean depth of roughness motifs: The arithmetical mean value of the depths Hj of rtip=2µm
0 High magnification ratio
Roughness profile 4 roughness motifs, within the evaluation length, i.e.
Equivalent straight line 1 m profile on display
Peak area Rpk R= Σ Hj m=2n x2000
m j=1
3z1 3z2 3z3 3z5 Rx: Maximum depth of roughness motifs: The maximum value of the depths Hj of
3z4
roughness motifs, within the evaluation length.
Rk Waviness profile x20
Primary profile Actual magnification ratio profile on surface
rtip=2µm
Rvk x2000 θ
lr Hj Hj+1
ln=5×lr Valley area ε H
Evaluation length ln Rt(µm) 0% ARi Roughness motif x2000
Mr1 Mr2 100% ln L

Pc Peak density /cm: ASME B46.1:’95 Height characterization using the material probability curve of ISO13565-3 Waviness motif: Motif derived on upper envelope line by using ideal operator with limit value Profile distortion with cutoff
PPI Peaks per inch: SAEJ911 Draw a material ratio curve on normal probability paper from the roughness profile 4 (primary B Roughness profile will have bigger profile
HSC High spot count profile) of an evaluation length. Limit value B: Maximum length of waviness motif distortion & smaller amplitude when cutoff λc
Separate the material probability curve to 2 area, upper plateau area and lower valley area. AW: Mean spacing of waviness motifs: The arithmetical mean value of the lengths Awi of is short.
Pc is the number of peaks counted when a Rpq (Ppq) parameter: slope of a linear regression performed through the plateau region. waviness motifs, within the evaluation length, i.e. Primary profile P
profile intersects a lower boundary line -H Rvq (Pvq) parameter: slope of a linear regression performed through the valley region. 1 n
and an upper line +H per unit length 1 cm. Rmq (Pmq) parameter: relative material ratio at the plateau to valley intersection. AW= Σ Awi (n: Total number of waviness motifs)
PPI shows Pc in 1 inch (25.4mm) unit length. n I=1
UPL LPL UVL LVL W: mean depth of waviness motifs: The arithmetical mean value of the depths HWj of Roughness profile R phase correct λc 0.8mm
HSC shows the number of peaks when the Roughness profile 4 Plateau region
lower boundary level is equal to zero. 0.1% 1 10 30 50% 70 90 99 99.9% waviness motifs, within the evaluation length, i.e.
2µm 1 m
W= Σ HWj m=2n
count 1st 1µm Rpq Rmq m j=1 Roughness profile R phase correct λc
count m H
count 2nd Wx: Maximum depth of waviness: The largest depth HWj, within the evaluation length. 0.25mm
Wte: Total depth of waviness: Distance between the highest point and the lowest point of
0µm waviness profile.Waviness profile
Rvq
HWj Wx
-1µm HWj+1
Roughness profile with 2RC filter λc 0.25mm
-H have big distortion according to phase shift.
Reset Mean line Reset -2µm
or AWi
Reset unit length(1cm or 1 inch) valley region -3s -2s s 0 -s 2s 3s
zero Evaluation length ln Waviness motif
Material ratio Mr(%) on Standard probability scale ln

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 Comparison of national standards of surface texture measurement
ID. of national JIS B0601-’82 ANSI B46.1-’85 NF E05-015(’84) ISO468-'82 BS1134 part 1-’88 DIN4768-’90 JIS B0601-’94 ASME B46.1-’95 ISO4287:’97 (JISB0601:’01)
standard JIS B0031-’82 NF E05-016(’78) ISO4287/1-’84 BS1134 part 2-'90 DIN4771-'77 JIS B0031-’94 ISO4288:’96 (JISB0633:’01)
NF E05-017(’72) ISO4288-’85 DIN4775-'82 ISO12085:’96 (JISB0631:’00)
country ISO1302-'78 DIN4776-’90 ISO13565’s, (JISB0671’s)
Specification DIN4777-’90 ISO1302:’02
former Japan former U.S.A. former France former ISO former U.K. former Germany former Japan U.S.A. EU, U.K. & Japan
Primary Profile format Analog signal Analog signal with Analog signal Analog signal Analog signal Digital data Digital data Digital data with λs filter Digital data with λs filter
profile P without filtering low pass filtering without filtering without filtering without filtering without filtering without filtering
Evaluation length 1 sampling length ——— not defined ——— ——— 0,5, 1,5, 5, 15 ——— ——— = 1 sampling length
0.25,0.8,2.5,8,&25 & 50mm = Length of the measured feature
P profile Maximum height Rmax(S indication) ——— Pt ——— ——— Pt ——— ——— Pt, Pz(=Pt)
Ten point height Rz (Z indication) ——— ——— ——— ——— ——— ——— ——— ———
parameter Other ——— ——— Pp, Pa, (Tp)c, ——— ——— ——— ——— ——— Pp,Pv,Pc,Pa,Pq,Psk,Pku,PSm,
P parameters P∆q,Pmr(c),Pδc,Pmr,Ppq,Pvq,Pmq
Motif parameters ——— ——— R, AR, Kr, W, ——— ——— ——— ——— ——— R, AR, Rx, W, AW, Wx, Wte
W’max, W’t, AW, Kw
Indication of ——— ——— ——— ——— ———
Rmax=1.6 Pt 0.8 - 1.6 15 / Pt 1,6
maximum height U 0.008- / Pt 1.5
Rmax=0.8
<1.5µm
Roughness Unit of height µm µm or µin. µm µm µm (µin) µm µm µm (or µin.) µm
profile R Unit of length mm mm or in. mm mm mm(inch) mm mm mm (or in.) mm
Filter 2RC 2RC 2RC 2RC 2RC Phase correct Phase correct Phase correct(or 2RC) Phase correct
Long cutoff λc λB λc λc λB λc λc λc λc
Short cutoff ——— cutoff value 2.5µm ——— ——— ——— ——— ——— λs λs
Sampling length L=3 x λc or over L:1.3-5mm@λB 0.25 l l lr lc lr Cutoff length : l lr
Evaluation length TL=L=3 x λc or over L:2.4-8mm@λB0.8 L=nxl ln = n x l le = 5 x lr 5 x lc le = 5 x lr L=5xl le = 5 x lr
L:5-15mm @λB2.5 Calculate for each sampling length lr
R profile Maximum height ——— Peak-to-Valley Ry Ry ——— Rt Maximum height Ry Rt Maximum height Rz in 1 lr
Height (Rmax,Ry) in 1 lr or total height Rt in 1 le
Height Maximum peak to ——— ——— Rmax Rymax Ry Maximum two point ——— Rmax Rz max
valley height height Rmax
parameter Ten point height ——— (Rz) Rz Rz Rz ——— Ten point height Rz ——— ———
Average peak to ——— ——— ——— Ry5 ——— Ten point height Rz Maximum height Ry Rz Average method Rz
valley height
Other peak height ——— (Rp) Rp Rp, Rpmax, Rp5, ——— ——— ——— Rp, Rpm, Rv Rp, Rv, Rc
parameters Rm, Rc
lr & λc for 0.25mm Rmax, Rz ≤ 0.8µm ——— not defined 0,1<Rz,Ry ≤0,5µm 0,1< Rz ≤ 0,5µm 0,1< Rz ≤ 0,5µm 0.1<Rz,Ry≤ 0.5µm 0.02< Ra ≤ 0.1µm 0.1< Rz ≤ 0.5µm
peak height 0.8mm 0.8<Rmax ,Rz ——— not defined 0,5<Rz,Ry ≤10µm 0,5< Rz ≤10µm 0,5< Rz ≤10µm 0.5<Rz,Ry≤10µm 0.1 < Ra ≤ 2µm 0.5< Rz ≤ 10µm
parameter ≤6.3µm
2.5mm 6.3<Rmax ,Rz ≤25µm ——— not defined 10<Rz,Ry≤50µm 10< Rz ≤50µm 10< Rz ≤50µm 10<Rz,Ry≤50µm 2 < Ra ≤ 10µm 10 < Rz ≤ 50µm
Indication of Maximum height ——— ——— Rmax 1.6 Ry =1.6 Ry =1.6 Rmax = 1,6 Ry1.6~0.8 Rmax = 1.6 U 0.008-2.5/Rz 1.5
λc 0.25 L -0.25/Rz 0.7
in case of Rz<1.5µm
R profile Arithmetic average Ra (a indication) Ra Ra Ra Ra Ra Ra Ra Ra
averaging root mean square ——— (Rq) Rq Rq ——— ——— ——— Rq Rq
parameter Skewness, kurtosis ——— (Skewness,Kurtosis) Sk, Ek Sk ——— ——— ——— Rsk, Rku Rsk, Rku
lr & λc for Ra on 0.25mm optional 0.0063<Sm≤0.05µm not defined 0,02< Ra ≤ 0,1µm 0,02< Ra ≤ 0,1µm 0,02< Ra ≤ 0,1µm 0.02< Ra ≤ 0.1µm 0.02 < Ra ≤ 0.1µm 0.02 < Ra ≤ 0.1µm
non-periodic 0.8mm Ra ≤ 12.5µm 0.02 <Sm≤0.16µm not defined 0,1< Ra ≤ 2µm 0,1< Ra ≤ 2µm 0,1< Ra ≤ 2µm 0.1< Ra ≤ 2µm 0.1 < Ra ≤ 2µm 0.1 < Ra ≤ 2µm
profile 2.5mm 12.5<Ra≤100µm 0.063<Sm≤ 0.5µm not defined 2 < Ra ≤ 10µm 2 < Ra ≤ 10µm 2 < Ra ≤ 10µm 2 < Ra ≤ 10µm 2 < Ra ≤ 10µm 2 < Ra ≤ 10µm
Indication of Ra Ra 1.6 - 3.2 3.2 N8 3,2 3.2
3.2 125 3.2 N8 1.6~3.2 U“2RC” -0.8/Ra75 3.1
1.6 63 1.6 N7 1.6 N7 1,6 1.6
in case of 1.5<Ra<3.1µm L”2RC” -0.8/Ra75 1.5

R profile Mean spacing ——— Roughness spacing Sm Sm Sm ——— Sm Sm RSm

other RMS slope ——— ——— ∆q ∆q ——— ——— ——— ∆q R∆q
parameter material ratio ——— (tp) ——— tp tp ——— tp tp Rmr(c)
Other parameters ——— (Peak count Pc) S, ∆a, λa, λq S, ∆a, λa, λq, S ——— S Htp, ∆a, SAE Peak PPI, Rδc, Rmr, Rpk, Rvk, Rk, Mr1, Mr2,
Lo, D Peak density Pc Rpq, Rvq, Rmq
Comparison rule Average average value of all average value of all not defined ——— ——— ——— average value of all not defined average value of all sampling
of measured sampling lengths sampling lengths sampling lengths lengths
value with 16% rule ——— ——— not defined 16% rule default 16% rule 16% rule for Ra, Rz ——— not defined 16% rule default
tolerance limits Maximum rule ——— ——— not defined Max rule for Max rule for Max rule for ——— not defined Max rule for
parameter with parameter with Rmax parameter with suffix "max"
suffix "max" suffix "max"

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