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    IV (M) QM Gamma Ray Microscope

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    Abhigyan Hazarika
    (1) Heisenberg's gamma ray microscope experiment aimed to simultaneously measure the position and momentum of an electron. It used a high-powered microscope with gamma rays. (2) As gamma ray photons collided with electrons, some were deflected into the microscope, allowing observation of the electron's position. However, the electron's momentum also changed due to recoil from photon collisions based on Compton effect calculations. (3) There was a limit to measurement accuracy due to the inverse relationship between wavelength (determining position accuracy) and scattering angle (determining momentum accuracy) as shown by the equations derived from the experiment. This demonstrated the uncertainty principle.

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    IV (M) QM Gamma Ray Microscope

    Uploaded by

    Abhigyan Hazarika
    240 views2 pages
    (1) Heisenberg's gamma ray microscope experiment aimed to simultaneously measure the position and momentum of an electron. It used a high-powered microscope with gamma rays. (2) As gamma ray photons collided with electrons, some were deflected into the microscope, allowing observation of the electron's position. However, the electron's momentum also changed due to recoil from photon collisions based on Compton effect calculations. (3) There was a limit to measurement accuracy due to the inverse relationship between wavelength (determining position accuracy) and scattering angle (determining momentum accuracy) as shown by the equations derived from the experiment. This demonstrated the uncertainty principle.

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    Gamma ray for DIBRUGARH UNIVERSITY

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    IV(M)QM Gamma Ray Microscope

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    (1) Heisenberg's gamma ray microscope experiment aimed to simultaneously measure the position and momentum of an electron. It used a high-powered microscope with gamma rays. (2) As gamma ray photons collided with electrons, some were deflected into the microscope, allowing observation of the electron's position. However, the electron's momentum also changed due to recoil from photon collisions based on Compton effect calculations. (3) There was a limit to measurement accuracy due to the inverse relationship between wavelength (determining position accuracy) and scattering angle (determining momentum accuracy) as shown by the equations derived from the experiment. This demonstrated the uncertainty principle.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    240 views2 pages

    IV (M) QM Gamma Ray Microscope

    Uploaded by

    Abhigyan Hazarika
    (1) Heisenberg's gamma ray microscope experiment aimed to simultaneously measure the position and momentum of an electron. It used a high-powered microscope with gamma rays. (2) As gamma ray photons collided with electrons, some were deflected into the microscope, allowing observation of the electron's position. However, the electron's momentum also changed due to recoil from photon collisions based on Compton effect calculations. (3) There was a limit to measurement accuracy due to the inverse relationship between wavelength (determining position accuracy) and scattering angle (determining momentum accuracy) as shown by the equations derived from the experiment. This demonstrated the uncertainty principle.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    of 2

    IV(M) GAMMA RAY MICROSCOPE

    GOPAL HAZARIKA

    11/05/2020

    Q1. Describe with necessary diagram Heisenberg’s gamma ray microscope experiment to show that
    validity of uncertainty principle.

    Ans. Let us try to measure both position and momentum of an


    electron. In order to do so, we set up a high-powered microscope
    with gamma ray.

    As the photon from the sources collide with the electrons some of
    these bounce into the microscope and enable the observer to see
    the flash of light and thus to find out both the position and
    momentum of the electron at some instant of time.

    (i)Accuracy in determining the position of electron by a


    microscope is done by the resolving power of

    microscope as follows----
    𝜆′
    Δ𝑥 = → (1)
    2 sin 𝜃
    Where,

    Δ𝑥 = Minimum distance between two points in the field of view


    which can be distinguished as separate.

    𝜆′ → Wavelength of the scattered photon and

    𝜃 →Semi vertical angle of the cone light coming from the illuminated electron.

    To make Δ𝑥 very small, radiation of very small wavelength such as gamma rays should be used.

    (ii) In the process of determining the momentum of the electron with gamma ray photon will result in
    the change of momentum of the electron because of its recoil.

    Suppose at any instant the electron is observed near the point O. It means that at least one photon
    coming from light source gets deflected by the electron into the microscope. The scattered photon
    enters the objective lens along the path OA or OB. Now the change in momentum of the electron can
    be calculated by using Compton effect.
    ℎ𝜈
    In fig.2 when a photon of momentum 𝑐
    strikes an
    electron initially at rest. If the electron is at rest, its
    momentum will be zero. The striking photon will
    transfer a momentum mv to the electron and gets
    scattered in a direction, making an angle 𝜙 with x-
    axis. Now if the conservation of momentum is
    applied along the x-axis i.e. the momentum, before
    strike is same as after strike, then we get
    ℎ𝜈 ℎ𝜈 ′
    = cos 𝜙 + 𝑚𝑣 cos 𝜓 → (2)
    𝑐 𝑐
    Fig:2

    Now component of momentum along x-axis transferred by the photon to an electron is given as
    follows:

    px=mvcos 𝜓
    ℎ𝜈 ℎ𝜈 ′
    =𝑐 − 𝑐
    cos 𝜙 𝑓𝑟𝑜𝑚 → (2)
    ℎ ′
    = 𝑐 (𝜈 − 𝜈 cos 𝜙

    As the angle 𝜙 inside the microscope may vary from (90−𝜃) to (90+𝜃)

    ∴ the uncertainty in momentum is given as


    ℎ ℎ
    ∆𝑝x= 𝑐 [𝜈 − 𝜈 ′ cos(90 + 𝜃)] − 𝑐 [𝜈 − 𝜈 ′ cos(90 − 𝜃)]

    ℎ ℎ
    = [𝜈 + 𝜈 ′ sin 𝜃] − [𝜈 − 𝜈 ′ sin 𝜃]
    𝑐 𝑐
    ℎ𝜈 ℎ𝜈 ′ sin 𝜃 ℎ𝜈 ℎ𝜈 ′ sin 𝜃
    = + − +
    𝑐 𝑐 𝑐 𝑐
    2ℎ𝜈 ′ sin 𝜃
    =
    𝑐
    2ℎ
    ≈ sin 𝜃 → (3)
    𝜆′
    Equations (1) & (3) are contrary to each other. If we try to improve the measurement of the
    electron’s position by decreasing λ and increasing θ, then accuracy in the measurement of
    momentum is increased and vice versa. Multiplying equations (1) & (3) we get

    ∆𝑥∆𝑝 ≈ ℎ → (4)
    ħ ħ
    But the Planck’s constant h is greater than 2. Therefore, eq. (4) becomes Δ𝑥Δ𝑝𝑥 ≥ 2 .

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