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MSE 510 - Microstructural Characterization Techniques - Lecture 14

The document discusses exam 1 results, Moseley's Law which states that X-ray energy varies with atomic number, and wavelength dispersive spectrometry (WDS) which uses fully focusing spectrometers and detectors to analyze and compare X-rays. WDS is compared to energy dispersive spectrometry (EDS).

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Aneek M. Noor
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74 views10 pages

MSE 510 - Microstructural Characterization Techniques - Lecture 14

The document discusses exam 1 results, Moseley's Law which states that X-ray energy varies with atomic number, and wavelength dispersive spectrometry (WDS) which uses fully focusing spectrometers and detectors to analyze and compare X-rays. WDS is compared to energy dispersive spectrometry (EDS).

Uploaded by

Aneek M. Noor
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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MSE 510 – Microstructural Characterization

Techniques - Lecture 14
• Exam 1
• Moseley’s Law
• WDS

Mar. 10, 2020 1


Exam 1 - Results

2
Moseley’s Law
• The energy of characteristic X-ray lines generated varies with the
atomic number (Z).
• Described by:
• E = A (Z-C)2

3
WDS (Wavelength Dispersive Spectrometry )

Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
WDS (Wavelength Dispersive Spectrometry )

5
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
WDS –fully focusing wavelength spectrometer

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Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
WDS –fully focusing wavelength spectrometer

7
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
WDS – Detector

8
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
EDS and WDS Comparison

9
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et al., 3rd Edition. 2007
EDS vs. WDS

10

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