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Perform Cable Test With A Network Analyzer Final PDF

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0% found this document useful (0 votes)
326 views110 pages

Perform Cable Test With A Network Analyzer Final PDF

Uploaded by

Valeri
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
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Perform Cable Test with a Network

Analyzer: From Basic Measurement to


Advanced Signal Integrity
Measurements for Next Generation
High Speed Serial Standards

June 2012
Agilent Technologies
Agenda

1. Device Under Test: Cables & Connectors


2. Instrument for cables testing: Network Analyzer
3. Measurement: Frequency Domain
4. Measurement: Time Domain
5. Measurement: Enhanced Time Domain (TDR)
6. Labs
Agenda (Device Under Test)

Specific
Connectors
(Fakra)

Standard
Connector Coaxial Cable
(SMA,2.4mm)

Balanced
No Connector
Cable
Agenda (Measurement modes)
Frequency
Domain

Time
Domain
Enhanced
Time
Domain

Common Measurement Parameters


Zc, Attenuation, Capacitance Velocity of Propagation
DC Resistance, Delay,Crosstalk,NEXT, FEXT
1. Device Under Test: Cables & Connectors
- Cable Equivalent Circuit
- Coaxial Cables and Connectors
- Balanced Cables and Connectors
- Cable Parameters
- Cable Measurement Issues
Cable is a Transmission Line
Transmission lines are needed to
convey RF and microwave energy from
one point to another with minimal loss.

The transmission line can be


represented as an infinite series of two-
port elementary components.

Resistance, Inductance, Capacitance


and Admittance define Characteristic
Impedance Z0.
Transmission line Zo
Zo determines relationship between voltage and current waves
Zo is a function of physical dimensions and r
Zo is usually a real impedance (e.g. 50 or 75 ohms)
1.5

1.4 attenuation is lowest at 77


ohms
1.3

1.2

50 ohm standard
1.1

normalized values
1.0

0.9

0.8

0.7 power handling capacity peaks at


30 ohms
0.6

0.5
10 20 30 40 50 60 70 80 90 100

Characteristic impedance for coaxial airlines (ohms)


The Type N Connector

DC to 18GHz

N type 75ohm IS NOT compatible with N Type 50ohm


The Precision 3.5 mm Connector

Air dielectric:
is stable DC to 34GHz
with temperature
The SMA Connector
DC to 22GHz
Usually teflon:
this expands
with temperature

This pin is often the


center wire of the
semi-rigid cable
RF Connector Chart
CONNECTOR TYPE SPECIFIED UPPER FREQUENCY TYPICAL MODING ACCURACY CONNECTOR TYPE MATEABLE WITH DIELECTRIC

BNC 2 GHz 2.2 GHz M/F self PTFE

SMC 7 GHz 10 GHz M/F self PTFE

7 mm (APC-7) 18GHz 18.5-18.6 GHz SEXLESS self PTFE

Type N 18 Ghz 18.5-18.6 GHz M/F type N PTFE

3.5 mm (APC-3.5) 26.5 GHz 32-33 GHz M/F SMA and K Air

SMA (3.5 mm size) 26.5 GHz 32-33 GHz M/F 3.5 mm and K PTFE

2.92 (K) Wiltron-Anritsu 40 GHz 40-50 GHz M/F SMA and 3.5 mm Air

2.4 mm (APC-2.4) 50 GHz >50 GHz M/F V connector Air

1.85 mm 65 GHz >65 GHz M/F 2.4 mm and V Air

60-65 GHz >60 GHz M/F 2.4 mm and 1.85mm Air


Wiltron V-connector

1.00 mm (IEEE standard) 110 GHz >110 GHz M/F self Air

1.10 mm (Anritsu-Wiltron) 110 GHz >110 GHz M/F self Air


The ‘Automotive’ Fakra Connector
DC to 6GHz

FachKReis Automobil (Automobile Expert Group)


b. Balanced Cables and Connectors

A balanced line or balanced signal pair is


a transmission line consisting of two
conductors of the same type, each of which
have equal impedances along their lengths
and equal impedances to ground and to
other circuits.

The main advantage of the balanced line


format is good rejection of external noise.

Main disadvantage is the limited frequency


coverage.
Balanced Cables and Connectors: LAN

Screened / Unshielded Twisted Pair Screened / Shielded Twisted Pair

Class Category Max Frequency (MHz)


A 1 0.1
B 2 1
C 3 16
D:1995 5 100
D:2002 5E 100
E 6 250
EA 6A 500
F 7 600
FA 7A 1000
Local Area Network
Balanced Cables and Connectors: USB

From USB 2.0 to USB 3.0: more complex connector, cable and test (e.g. Cross Talk) Universal Serial Bus
Cable Parameters The Return Loss or Structural
Return Loss (SRL is a specialized
The two principle factors which cause
measurement of return loss
Attenuation are: Characteristic Impedance referenced to the cable impedance)
• Loss of conductors (caused by high Zo has to be as uniform as parameter is the measurement of the
frequency film effect), possible. The quality of the cable's production accuracy (mainly:
• Dielectric loss. conductor and the geometry constant dielectric extrusion pressure
of the cable are not and cooling control.
The Capacitance (pF/m at 1kHz) of a constant, causing signal
cable is indicated by the properties of the distortion and loss.
dielectric (the amount of electric charge
when a potential difference exists between
the two. Is directly proportional to the Screening attenuation
regularity of the dielectric's properties depends on the external
(typical values is 67 pF/m for PE). conductor's characteristics,
In the case of coaxial cables it is: which prevents the
exchange of electro-
magnetic waves between
the cable and the external
environment.
Propagation speed is the speed of which
an electrical signal travels along a line of
Transmission. Is the ratio between speed
of propagation within the cable and the
speed in open space (66% for PE, Solid
PolyEthylene dielectric).
Cable Parameters using VNA

- Attenuation is S21FreqD
- Return Loss is S11FreqD
. SRL
. Characteristic Impedance Zo
- Screening attenuation (coaxial) is S21FreqD
- Cross Talk (balanced) is S21FreqD
- Length, Propagation speed is S11TimeD
- [Capacitance @ 1kHz requires LCR Meter]
Cable Measurement Issues

- Frequency Broadband
- Long electrical length (from swept to stepped sweep)
- Reflection path loss (reflection dynamic range)
- Non-Insertable (requires adapters)
- Non-standard impedances (requires conversion)
- Balanced (requires phy/sim BalUn transformer)
DUT

RF

2. Instrument for cables testing: Network Analyzer


- Block Diagram (sources, signal separation devices, receivers, analysis)
- S parameters
- Magnitude and Phase
- Calibration (insertable, not-insertable, …)
- Fixture Simulator function
- Differential and Common Parameters (dd, dc, cc)
Network Analyzer Block Diagram
S parameters

Completely characterize
a two port device
with four S-parameters

S11 = forward reflection coefficient (input match)


S22 = reverse reflection coefficient (output match)
S21 = forward transmission coefficient (gain or loss)
S12 = reverse transmission coefficient (isolation)

Remember, S-parameters are


inherently complex, linear quantities.
However, we often express them
in a log - magnitude format
S parameters

INCIDENT S21 TRANSMITTED

REFLECTED

Port 1 DUT Port 2 S22


S11
REFLECTED

TRANSMITTED INCIDENT
S12
b1 = S11a1 + S12a2

b2 = S21a1 + S22a2
The Need For Calibration

Why do we have to calibrate?


• It is impossible to make perfect hardware
• It would be extremely difficult and expensive to make hardware good
enough to entirely eliminate the need for error correction
How do we get accuracy?
• With vector-error-corrected calibration
• Not the same as the yearly instrument calibration
What does calibration do for us?
• Removes the largest contributor to measurement
uncertainty: systematic errors
• Provides best picture of true performance of DUT Systematic error
Measurement Error Modeling
Systematic errors
• Due to imperfections in the analyzer and test setup
• Assumed to be time invariant (predictable)
• Generally, are largest sources or error
Random errors
• Vary with time in random fashion (unpredictable)
• Main contributors: instrument noise, switch and connector repeatability
Drift errors
• Due to system performance changing after a calibration has been done
• Primarily caused by temperature variation
Errors:

SYSTEMATIC
Measured Unknown
Data
RANDOM Device
DRIFT
Systematic Measurement Errors

R A B
Directivity Crosstalk

DUT

Frequency response
 Reflection tracking (A/R)
Source Load
 Transmission tracking (B/R)
Mismatch Mismatch

Six forward and six reverse error terms yields 12


error terms for two-port devices
What is Vector-Error Correction? Errors

Measured
Vector-error correction… Actual

• Is a process for characterizing systematic error terms


• Measures known electrical standards
• Removes effects of error terms from subsequent measurements
Electrical standards…
• Can be mechanical or electronic
• Are often an open, short, load, and thru,
but can be arbitrary impedances as well
Using Known Standards to Correct
for Systematic Errors

 1-port calibration (reflection measurements)


 Only three systematic error terms measured
 Directivity, source match, and reflection tracking
 Full two-port calibration (reflection and transmission measurements)
 Twelve systematic error terms measured
 Usually requires 12 measurements on four known standards (SOLT)
 Standards defined in cal kit definition file
 Network analyzer contains standard cal kit definitions
 CAL KIT DEFINITION MUST MATCH ACTUAL CAL KIT USED!
 User-built standards must be characterized and entered into user cal-kit
Before and After A One-Port Calibration

Data after 1-port calibration

Data before 1-port calibration


Two-Port Error Correction Reverse model
Port 1 Port 2
E RT'

Forward model a1
S 21
A b2
E L' S11 S 22 A E D'
A E S' a2
Port 1 EX Port 2 b1

E TT' S12 A
S 21A ETT b2
a1 ES E X'
ED S11A S 22 A a2
b1 EL

S  ED S  ED ' S  E X S12 m  E X '


E RT S 12
A ( 11m )(1  22m E S ' )  E L ( 21m )( )
E RT E RT ' E TT E TT '
S11a 
ED = fwd directivity E L = fwd load match S  E D' S  ED ' S  E X S12 m  E X '
(1  11m E S )(1  22m E S ' )  E L ' E L ( 21m )( )
E S = fwd source match E TT = fwd transmission tracking E RT E RT ' E TT ETT '
E RT = fwd reflection tracking E X = fwd isolation
S21m  E X S22 m  E D '
E D' = rev directivity E L' = rev load match ( )(1  ( E S ' E L ))
E TT E RT '
E S' = rev source match E TT' = rev transmission tracking S21a 
S  ED S  ED' S  E X S12 m  E X '
E X' = rev isolation (1  11m E S )(1  22m E S ' )  E L ' E L ( 21m )( )
E RT' = rev reflection tracking E RT E RT ' E TT ETT '

S  EX ' S  ED
 Each actual S-parameter is a function of all ( 12m )(1  11m ( E S  E L ' ))
E TT ' E RT
S12a 
four measured S-parameters S
(1  11m
 ED S
E S )(1  22m
 ED' S
E S ' )  E L ' E L ( 21m
 E X S12m  E X '
)( )
E RT E RT ' E TT E TT '
 Analyzer must make forward and reverse
sweep to update any one S-parameter S 22m  E D '
( )( 1 
S11m  E D
ES )  E L ' (
S 21m  E X S12m  E X '
)( )
E RT ' E RT E TT E TT '
 Luckily, you don't need to know these S22a 
S  ED S  ED' S  E X S12m  E X '
(1  11m E S )(1  22m E S ' )  E L ' E L ( 21m )( )
equations to use a network analyzers!!! E RT E RT ' E TT ETT '
Response versus Two-Port Calibration
Measuring filter insertion loss

After two-port calibration

After response calibration

Uncorrected
ECal: Electronic Calibration
• Variety of two- and four-port modules cover 300 kHz to 67 GHz
• Nine connector types available, 50 and 75 ohms USB controlled

• Single-connection calibration
 dramatically reduces calibration time
 makes calibrations easy to perform
 minimizes wear on cables and standards
 eliminates operator errors
• Highly repeatable temperature-compensated
characterized terminations provide excellent accuracy

Microwave modules use a


transmission line shunted by
PIN-diode switches in various
combinations
Calibration Kit Solutions
Coaxial (*):
- APC7 Agilent www.agilent.com
- N (50/75ohm) Agilent www.agilent.com
- 3.5mm (SMA) Agilent www.agilent.com
- 2.4mm Agilent www.agilent.com
- 1mm Agilent www.agilent.com
- BNC Maury Microwave www.maurymw.com
- Automotive Fakra Rosenberger www.rosenberger.com

Balanced (*):
- USB3.0 BitifEye www.bitifeye.com
- LAN
- Automotive LVDS (adapters: Rosenberger www.rosenberger.com)
(*)
Full-2-Port (complete ad accurate) calibration procedure at Cal Plane 2 (DUT Plane) is possible
only with a Calibration Kit with same mechanical configuration of the Device Under Test (eg. Fakra
CalKit if DUT has Fakra connectors).
Otherwise use Calibration Kit suitable for Cal Plane 1 and try to compensate the Adapters
contribution between Cal Plane 1 and Cal Plane 2:
- using De-Embedding,
- using Port Extension.
Fixture Simulator function
> De-Embedding
Exclude undesired 2-port network from measured S-parameter

Measured S-parameter
Port 2
Undesired
Port 1 Network
Undesired DUT
Network Undesired
Network
Port 3
De-embedded
Response

• De-embedding ON/OFF is applied to all ports.


• Each port can be chosen as “None” or “User”.
• Undesired network is specified by Touchstone file (.s2p).
> Embedding (Port Matching)

Include matching network of each port into measured S-parameter


Measured
S-parameter
Port 2
Port 1 Matching
Network
Matching DUT
Network Matching
Network
Port 3
Embedded Response

• Port matching ON/OFF is applied to all ports.


• Matching network is defined by each port independently.
• Matching network is specified by pre-defined circuit models or
Touchstone file (.s2p).
> Matching Circuit : Single-Ended models

• “0” for Series C means


“no capacitor”.
• Touchstone file (.s2p) can
be defined for “User”.
> Matching Circuit : Differential

Measured
S-parameter
Port 2

Port 1
Matching
DUT
Network

Port 3
Embedded Response
> Characteristic Impedance Conversion
Convert S-parameter measured with 50 ohms to arbitrary port
characteristic impedance

DUT DUT
50W 50W XW YW
Port 1: 50W Port 1: 100W
Port 2: 50W Port 2: 50W

• Impedance Conversion
ON/OFF is applied to all
ports. S11 on Log Mag & Smith

• Port impedance can be


specified at each port.
• Example: SAW filter
•Port 1 50W --> 100W
•Port 2 50W
Single-ended to Mixed-mode conversion
Mixed-Mode S-Parameters
- Sdd11 is the differential Attenuation

Sdd21 Scd21

Sdc21 Scc21

- Sdc11 is the LCL (Longitudinal Conversion Loss)  S DD11 S DD12 S DC 11 S DC12 


Sdc11 S S DD 22 S DC 21 S DC 22 
 DD 21 
 SCD11 SCD12 SCC11 SCC12 
 
 SCD21 SCD22 SCC 21 SCC 22 
3. Measurement: Frequency Domain
- Measurement Technique
- Insertion Loss, Attenuation and Phase matching
- Return Loss and Impedance
- Cross Talk, FEXT, NEXT
- Screening Attenuation
Measurement Technique: Frequency Sweep
Coaxial Cable Measurement:
- Return Loss, Zin
- Insertion Loss, Attenuation and Phase Matching
Coaxial Cable Measurement:
> Return Loss  Failure in manufacturing process

LogMag format

SWR format
Coaxial Cable Measurement:
- Screening Attenuation

To maximize Dynamic Range:


- Decrease IFBW
- Increase Source Power [external Amplifier]
- If possible use Receiver’s direct inputs

Ref. “Standards, Design & Installation of CATV-Cables”, Bernhard Mund, bedea


Balanced Cable Measurement:
- Insertion Loss, LCL
- Return Loss, Zin
Balanced Cable Measurement:
- CrossTalk, FEXT, NEXT
4. Measurement: Time Domain
- Measurement Technique
- Resolution and Range
- Delay, Length and Velocity Factor
- Gating
What is time domain ?

– useful for measuring impedance values along a transmission line and


for evaluating a device problem (discontinuity) in time or distance.
– Time domain display provides a more intuitive and direct look at the
device under test (DUT) characteristics and gives more meaningful
information concerning the broadband response of a transmission
system than other measuring techniques by showing the effect of each
discontinuity as a function of time or distance.

r Upper
r
Limit
Frequency Time
TDR Time Domain Reflectometry Technology
OSCILLOSCOPE

2t

Trigger

Chan 1

DIRECTIONAL
UNKNOWN
STEP / SNAP COUPLER
GENERATOR
TDR Basics Using a Network Analyzer
 Start with broadband frequency sweep (often requires microwave VNA)
 Use inverse-Fourier transform to compute time-domain
 Resolution inversely proportionate to frequency span

Time Domain Frequency Domain


CH1 S 22 Re 50 mU/ REF 0 U

F -1
Cor 20 GHz
6 GHz
t f

 F(t)*dt
t
Integrate 1/s*F(s)
0

TDR
F -1

t f CH1 START 0 s STOP 1.5 ns


Frequency Domain S11 Response of Semi-rigid Coax
Cable

r Upper
Limit

Frequency
Time Domain S11 Response of Semi-rigid Coax Cable

Time
(1) Frequency Data: Resolution and Range
(1) Effect of Frequency Span on Resolution
200 mU / REF-600 1: 963.84mU 0
S11 LIN mU s

FSpan = 1 GHz

Cor FSpan = 3 GHz

FSpan = 6 GHz
STOP 2
START -2 ns ns
Same Time Span

For Example (Return Loss meas, so /2):


- Frequency Span = 1GHz
- k =0.45 (TD mode and Window)
- Velocity Factor = 0.66 (PE)

Resolution (s) = 0.5ns


Resolution (m) = 0.05m
Resolution as a Function of Frequency Span (2)
(1) What is the Maximum Range that can be measured?

For Example (Return Loss meas, so /2):


- Frequency Span = 1GHz
- # of points = 201
- Velocity Factor = 0.66 (PE)

Range (s) = 100ns


Range (m) = 19.8m
Time domain Modes
(2) Summary on modes
(4) Gating Operation

S11 S11

1 2

IFFT

Original Frequency Response Time Domain

S11 S11 Filter Out this Response


4 3

FFT

Frequency Response w/ Gate Time Domain w/ Gate


(4) Gating Example: Time Domain response

Connector Cable Connector


Termination

S11 LIN 200 mU / REF -400 mU

Gate On
Remove the effects of
the Input Connector
Cor

START -1 ns STOP 9 ns
(5) Frequency Domain response with Gate On

Connector Cable Connector


Termination

S11 LIN 200 mU / REF -400 mU

Gate On
Gate Off

Cor

START -1 ns STOP 9 ns

Use Gating to show the frequency response of the output connector & termination only
> Coaxial cables with adapter and N connector
> Coaxial cable with adapter and Fakra connector
> Balanced cable with adapter and LVDS connector
5. Measurement: Enhanced Time Domain (TDR)
- Measurement Technique
- Eye Diagram and Mask
- Jitter, Emphasis, Equalization
What is ENA Option TDR?

The ENA Option TDR is an application software embedded on the ENA,


which provides an one-box solution for high speed serial interconnect
analysis.

Time Domain Frequency Domain 3 Breakthroughs


for Signal Integrity Design and Verification

Eye Diagram
Simple and Intuitive Operation

Fast and Accurate Measurements

ESD Robustness
ESD protection inside
One-box Solution
for High Speed Serial Interconnect Analysis

Time domain
Time Domain Frequency Domain

TDR Return Loss

Frequency domain

TDT Insertion Loss

Eye diagram
One-box Solution
for High Speed Serial Interconnect Analysis

Time domain
Automatic display allocation
for most common
measurement parameters
up to 9 markers depending on selected
device topology

zoom

Frequency domain

rise time
Set rise time to
characterize
Flexibility to set expected
measurement performance at
Dedicated controls for parameter for each slower edge
Eye diagram common adjustments individual trace speeds

⊿ Time (skew)
measurements
One-box Solution
for High Speed Serial Interconnect Analysis

Time domain Eye Diagram

Frequency domain

Eye diagram
One-box Solution
for High Speed Serial Interconnect Analysis

Time domain

Frequency domain
Eye mask editor

Eye mask test

Automated eye diagram


Virtual bit measurement results
Eye diagram pattern generator
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive


Similar look-and-feel to TDR scopes
Intuitive operation even for users unfamiliar to vector network analyzers
and S-parameter measurements.

Fast and Accurate

ESD Robustness

ESD protection inside


Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive Setup Wizard


Guides the user through all of the required steps, making setup, error
correction, and measurement intuitive and error-free.

Fast and Accurate


4 steps !!

ESD Robustness

ESD protection inside


Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive EDN (Oct 12, 2006)


http://www.edn.com/contents/images/6378087.pdf

Fast and Accurate

ESD Robustness

ESD protection inside


Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive

DUT: 50 Ohm pattern

Fast and Accurate

ENA Option TDR TDR Scope

1 ohm/div 1 ohm/div
ESD Robustness

VNA Based TDR measurements


ESD protection inside = Low Noise
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive

DUT: 50 Ohm pattern

Fast and Accurate

ENA Option TDR TDR Scope

Averaging…
1 ohm/div 1 ohm/div
ESD Robustness

Averaging
ESD protection inside
can lower noise BUT…
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive

DUT: 50 Ohm pattern

Fast and Accurate

ENA Option TDR TDR Scopes

Averaging…
1 ohm/div 1 ohm/div
ESD Robustness

ESD protection inside


Real-Time Analysis
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive Dynamic range is generally defined as the maximum power the receiver can
accurately measure minus the receiver noise floor.

Fast and Accurate

ESD Robustness

ESD protection inside

•E5071C Datasheet (5989-5479EN) July 10, 2009 … System Dynamic Range 10Hz IFBW
•86100C Technical Specifications (5989-0278EN) October 1, 2009 … Attenuation Dynamic Range Internal
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive TDR Scopes


Difficult to implement protection circuits inside the instrument without sacrificing
performance.

“In addition, protection diodes cannot be placed in


Fast and Accurate
front of the sampling bridge as this would limit the
bandwidth. This reduces the safe input voltage for a
sampling oscilloscope to about 3 V, as compared to 500 V
available on other oscilloscopes. “
Tektronix ApNote “XYZ of Oscilloscopes”, p17 (02/09, 03W-8605-3)

ESD Robustness
External ESD protection module (80A02) available, but rise time is
degraded.
ESD protection inside
•Single-channel protection and plugs into sampling mainframe
•$4K USD / module
•Reflected rise time when used with 80E04: 28ps -> 37ps
Three Breakthroughs
for Signal Integrity Design and Verification

Simple and Intuitive ENA Option TDR


ESD protection
circuits inside the
instrument

Fast and Accurate Higher robustness against ESD, because protection circuits are implemented
inside the instrument for all ports, while maintaining excellent RF performance.

Proprietary ESD protection chip significantly increase ESD


robustness, while at the same time maintaining excellent RF
ESD Robustness performance (22ps rise time for 20GHz models).

To ensure high robustness against ESD, ENA Option TDR is tested for ESD
ESD protection inside
survival according to IEC801-2 Human Body Model.
Measurement Correlation
TDR/TDT

•DUT: USB3.0 Cable


•50 ps rise time (20-80%)
Measurement Correlation
Eye Diagram

•DUT: USB3.0 Cable


•PRBS (2^7-1) @ 5 Gbps

ENA Option TDR N4903B + 86100C


(simulated) (live)

Refer to Appendix for DisplayPort and SATA correlation data.


Summary

The Agilent ENA Option TDR application…

•Provides one-box solution for high speed serial interconnect analysis


Time domain Frequency domain Eye diagram

•Brings three breakthroughs for signal integrity design and verification


Simple & Intuitive Fast & Accurate
Operation Measurements ESD Robustness
USB 3.0 Cable/Connector Compliance Test Solution
Agilent Digital Standards Program

Our solutions are driven and supported by Agilent experts


involved in international standards committees:
• Joint Electronic Devices Engineering Council (JEDEC)
• PCI Special Interest Group (PCI-SIG®)
• Video Electronics Standards Association (VESA)
• Serial ATA International Organization (SATA-IO)
• USB-Implementers Forum (USB-IF)
• Mobile Industry Processor Interface (MIPI) Alliance
• Optical Internetworking Forum (OIF)

We’re active in standards meetings, workshops, plugfests, and


seminars

Our customers test with highest confidence and achieve


compliance faster
USB 3.0 Cable/Connector Compliance Test Solution
Cable Assembly

Host CabCon Device

SS USB Pair
Full Simplex
2

SS USB Pair
Full Simplex

USB 2.0 Pair


Half-Duplex

PWR (1), GND (1)

SuperSpeeed USB Developers Conference Presentation, Taipei, Taiwan (April 1-2, 2010), “SuperSpeed USB Physical Layer”, Howard Heck,
Intel Corporation http://www.usb.org/developers/presentations/pres0410
USB 3.0 Cable/Connector Compliance Test Solution
Measurement Parameters

Time Domain Measurements


•Mated Connector Impedance
•Cable Electrical Performance
•Characteristic Impedance
•Intra-pair Skew
•Near-end Crosstalk between SuperSpeed Pairs
•Differential Near-end Crosstalk between SuperSpeed Pairs
•Differential Crosstalk between D=/D- and SuperSpeed Pairs

Frequency Domain Measurements


•Differential Insertion Loss (Sdd21)
•Differential–to-Common-Mode Conversion (Scd21)

SuperSpeeed USB Developers Conference Presentation, Taipei, Taiwan (April 1-2, 2010), “SuperSpeed USB Physical Layer”, Howard Heck, Intel Corporation
http://www.usb.org/developers/presentations/pres0410
USB 3.0 Cable/Connector Compliance Test Solution
Solution Overview

•USB 3.0 cable/connector compliance testing requires parametric measurements in both


time and frequency domains
Traditional
Solution New Solution
•ALL parameters can be
Vector measured with
Frequency Domain ENA Option TDR
Network
•Insertion Loss (Sdd21)
Analyzer
•Mode Conversion (Scd21)
(VNA)
One-box
Solution !!

Time Domain
•Mated Connector
Impedance Profile (TDR) TDR Scope
•Crosstalk (NEXT, FEXT)
(TDT)
USB 3.0 Cable/Connector Compliance Test Solution
Developers Conference (Taiwan, April 2010)

ENA Option TDR introduced as


recommended solution for
CabCon compliance test.

“SuperSpeed USB Compliance: Overview”,


Rahman Ismail, Intel Corporation

http://www.usb.org/developers/ssusb
USB 3.0 Cable/Connector Compliance Test Solution
ENA Option TDR Solution

•ENA Mainframe SuperSpeed Cable Test


•E5071C-480: 4-port, 9kHz to 8.5GHz Fixtures
•E5071C-485: 4-port, 100kHz to 8.5GHz
•E5071C-4D5: 4-port, 300kHz to 14GHz
Fixtures for testing
•E5071C-4K5: 4-port, 300kHz 20GHz SuperSpeed cable
•Enhanced Time Domain Analysis Option assemblies and USB 3.0
(E5071C-TDR) connectors are available for
•ECal Module purchase through Allion and
•N4431B for E5071C-480/485 BitifEye.
•N4433A for E5071C-4D5/4K5 http://www.usb.org/developers/ss
usb/ssusbtools/
•Method of Implementation (MOI)
document available for download on
Agilent.com
•State files (480,485,4D5, 4K5) and cal MOI
kit definition file for official cal fixtures are (Method of Implementation)
Step-by-step procedure on how
also available to measure the specified
parameters in the specification
document using ENA Option TDR.

www.agilent.com/find/ena-tdr_usb3-cabcon
USB 3.0 Cable/Connector Compliance Test Solution
Measurement Parameters

Time Domain Frequency Domain

Cable Z
Connector Z
(Tdd11, Tdd22) Insertion Loss (Sdd21)
(Tdd11, Tdd22)

Mode Conversion (Scd21)

Intra-Pair Skew
(T31, T42)

Near End Xtalk D+/D- Pair Attenuation (Sdd21)


D+/D- Intra-Pair Skew &
D+/D- SS Xtalk (Tdd21)
Propagation Delay (T31,
T42)
USB 3.0 Cable/Connector Compliance Test Solution
Summary

ENA Option TDR Cable/Connector Compliance Testing Solution is ….


•One-box solution which provides complete characterization of high speed digital
interconnects (time domain, frequency domain, eye diagram)
•Similar look-and-feel to traditional TDR scopes, providing simple and intuitive operation
even for users unfamiliar to VNAs and S-parameters
•Adopted by test labs worldwide
High-Speed Digital Bus
Compliance Test and Characterization

Industry-leading Instruments + BitifEye Software

Taking Test Automation


to the Next Level

Automated
HDMI Cable Testing
HDMI Cable Test Station
Agilent ENA-TDR and ECal, BitifEye Switch, Software

ECal Module
HDMI Cable Test Station
Agilent ENA-TDR and ECal, BitifEye Switch, Software
• Test Equipment (see Agilent HDMI Cable Test MOI):

- Inlculded in BitifEye switch bundle

- not needed with switch bundle

- not needed with switch bundle


- not needed with switch bundle

- optional BitifEye switch bundle


# 1x BIT-4010-0000-0, HDMI cable test switch matrix, 4x SMA Snap-On Connectors, 4x SMA cables 1 m
- BitifEye test automation software
# Bundle software BIT-2011-9450 (new customers), upgrade product BIT-2011-0450 (installed customer base)
N5990A Test Automation Software
HDMI Compliance Test and Product Characterization

Custom
Services
Solution

Test ValiFrame Test Automation Software Platform


Sequencer (Base Product, BIT-2001-0009-0)
User Programming (MS .NET dlls)

Legacy LabView, VEE,


Code C#, VB, C++
New
Cable Test Cable Test
Software BIT-…-0450

Sink Test
Test Integration

HDMI Sink Prot., HDCP HEC, ARC


Software
VF Opt. 150 VF Opt. 350 VF Opt. 351

Source Test HDMI-Source


Software N5399B

Low Speed Low Speed


Test VF Opt. 470)

Instrument
Software

Standard Real-time TMDS Sig. Protocol Pulse Arb Fct. TDR, Multi-, Volt-,
Instruments Oscilloscope Generator Gen./Analyzer Generator ENA LCR-meter

investigation
N5990A Test Automation Software Overview
Digital Bus Compliance Test and Characterization
Customiza-
BitifEye and Partner Services; Support
tions

Test
N5990A Test Automation Software Platform
Sequencer

Legacy Code,
… C, C++ C# Visual Basic VEE, LabView Python Opt. 500
User Progr. Remote Interface (Opt. 2xx)
Test Automation, System Integration

New
Cable Test TBT USB DP HDMI
… BIT-…
Software BIT-… BIT-… BIT-… BIT-…

Protocol/Ctrl/ … MIPI MHL HDMI Opt. 3xx


HDCP Test … …
Remote Interface…
(Opt. 2xx) N5990A-350

Rx Test … Rx PCIe HDMI Interface


Software … N5990A-101 N5990A-150 Opt. 2xx

Tx Test USB U7243A HDMI N5399B


N5990A-202 N5990A-250 Opt. 1xx
Software

Standard Pulse Data Real-time Protocol


AWGs BERTs ENA-TDR
Instruments Generators Oscilloscopes Testers
Automated HDMI Cable Test Details
Station Configuration Examples
Automated HDMI Cable Test Details
DUT Configuration
Automated HDMI Cable Test Details
Calibration and Test Procedures

• Test 5-4: Intra-Pair Skew


• Test 5-5: Inter-Pair Skew
• Test 5-6: Far End Crosstalk
• Test 5-7: Attenuation and Phase
• Test 5-8: Differential Impedance

User-selectable test parameters


in Expert Mode!
Automated HDMI Cable Test Details
Connection Diagram Examples
Automated HDMI Cable Test Details
De-Embedding
Automated HDMI Cable Test Details
De-Embedding

• De-embedding moves the measurement plane from the


instrument connectors to the switch connectors;
it compensates the impact caused by the switch
• Consists of two steps:
1. Calibrate the ENA-TDR for a single ended setup
by using the ECal module
2. Measure the four paths of the module and save
the de-embedding files.
• Once the files are saved, they are valid until the switch
wears out or is replaced.
Automated HDMI Cable Test Coverage
CTS Test Result Example
Automated HDMI Cable Test Coverage
More CTS Test Result Examples
Resources

www.bitifeye.com
[email protected]
Alexander Schmitt, Tel. +49-7031 / 437 48-01
Questions?
References/backup slides
Agilent E5071C ENA Network Analyzer Portfolio
•Flexible Lineup for a Variety of Applications
Select the number of ports, frequency, and bias tee to fit your application
Agilent E5071C ENA Network Analyzer Portfolio
•Protect your hardware investment
The E5071C is a safe investment because of its flexibility.
You can easily upgrade any feature of the E5071C whenever you
need the feature! This includes not only software options like
enhanced time domain mode, frequency offset mode, and MWA,
but also hardware options such as frequency and number of test-
ports.

Buy the bandwidth


you need today,
upgrade to higher
bandwidth in the
future !!

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