Brochure Tosca TM 400 Screen

Tosca™ 400
Atomic Force Microscope

Peak Performance AFM.
No complexity, just simplicity
We open the way for real industrial AFMs
Atomic force microscopy provides real three-dimensional information
on surface topographies. It is a standard method for material science
on the nanoscale used at universities and research centers.
The journey to AFM started in 1985, when this technology was users as well as scientists. Automation and a workflow-oriented
invented by Benning et al. Over the past decades the technology control and analysis software are integral elements on every level
was developed further and now covers, besides surface topo of operation, further increasing efficiency and simplifying the
graphies, a huge number of other mechanical and electrical handling of AFM measurements.
material properties such as friction, phase, electrical and thermal
conductivity/resistance, glass transition temperature, melting
temperature, stiffness, modulus, adhesion, surface potential,
capacitance, magnetism, electrochemistry, and many more.
On the one hand, this technology was and is still mainly used
by academia and research centers due to the very complicated
handling of conventional AFM instruments. On the other hand,
the demand from industry for complex nanosurface analysis is
growing continuously as companies are confronted with new
materials and research topics.
Anton Paar, as a well-established developer, producer, and

distributor of highly accurate laboratory instruments and process
measuring systems predominantly for industry, now meets
these demands by introducing Tosca™ 400, an AFM uniquely
designed for industrial users. It combines premium technology
with user-friendly operation, which makes it fit for industrial
Applications
Discover how your material performs – with peak performance AFM.
Soft organic materials Polymers Coatings Hard metallic and Semiconductors

ceramic systems
Key steps on your way to peak performance
Automatic laser alignment
Tosca™ 400 provides a fully automatic laser alignment function:

After loading the cantilever the instrument carries out the laser
alignment automatically. In this way the whole process takes less
than 60 seconds, even for inexperienced users.
Large scan area in all directions combined

with the highest accuracy
The X-Y scan range of up to 100 μm covers a wide range
of applications. The X-Y scan location can be regulated very
easily by the click-and-move navigation of the Tosca™ control
software. Accurate positioning and scanning of your sample is
guaranteed.
With a huge Z range of 15 μm, it is possible to acquire surface

topographies in a wide X-Y area and perform roughness analysis
on a large Z scale.
The easiest engagement procedure

on the AFM market
The engagement procedure brings the
cantilever in contact with the sample
surface. This is one of the most complex
procedures when operating an AFM.
Tosca™ 400 overcomes this problem
by implementing a side-view camera
that enables an engagement procedure
which does not require the instrument to
be opened to check the position of the
cantilever. A closed instrument leads to
higher accuracy due to stable temperature
conditions.
Compatible with all cantilevers
There are many different cantilever brands on the market –

Tosca™ 400 allows you to use your favorite one, regardless of
the brand or manufacturer.
State-of-the-art sample navigation
Quickly jump from one position on your sample to the next: After
loading and initializing Tosca™ 400, you can start an overview
image of the whole sample table. Simply click on the desired
position inside the overview image and the instrument navigates
to the area of choice for the next measurement.
Workflow-oriented control and analysis

software which meets the demands of
industry
Tosca™ Control is a workflow-oriented and easy-to-use
software tool to operate the AFM. It enables you to set up the
instrument and perform measurements with just a few clicks. All
measurement results are directly saved for later evaluations of
surface topography as well as metrology and imaging analysis
with Tosca™ Analysis. The state-of-the-art user interface and
workflow templates for automated analysis meet long-held
industry demands for smooth operation procedures in AFM.
How to gear up for your journey: Clever companions
Probemaster
You now have the perfect tool for fast and safe cantilever exchange –
a game changer in the world of atomic force microscopy. With this
cantilever exchange tool the complicated handling of cantilevers is a
thing of the past. Just place the cantilever anywhere in the marked area
of the Probemaster and easily slide it into the actuator body. There is no
need to use tweezers for positioning the tiny cantilever anymore.
Due to the extensive space for placing a cantilever, Probemaster can

easily be handled by inexperienced users. Damages to often expensive
probes are prevented by the automatic positioning of the cantilever into
the actuator body.
Active vibration isolation
The active vibration isolation is a necessary accessory for measurements

at extremely high resolutions, especially on the sub-nanometer scale. It
compensates for vibrations caused by, for example, vehicles passing by
the laboratory building. Distortions or measurement errors are eliminated.
The compact design, the short settling time, and the automatic load
adjustment make the vibration isolation an essential tool that is space-
saving, easy to handle, and ready to use within a few seconds.
Acoustic enclosure
The acoustic enclosure for Tosca™ 400 ensures noise-free and

extremely accurate measurements on the sub-nanometer scale.
Interfering noises such as air conditioning, closing doors, or voices are
damped so that they do not influence the measurement in any way. The
enclosure is extremely robust due to its steel frame but still moves easily
on its integrated wheels. In this way it can easily be transported from
one laboratory space to another.
Specifications
Scanner
X-Y scan range 100 µm x 100 µm
Z scan range 15 µm
Sample size
Max. sample diameter 90 mm
Max. sample height 25 mm
Max. sample weight <600 g
Motorized stage
X-Y stage 100 mm travel
Z stage 85 mm travel
Position repeatability (uni-directonal) <1 µm
Video microscope
Camera Color, 5 megapixel, CMOS sensor
Field of view 1.73 mm x 1.73 mm
Spatial resolution 5 µm
Focus Motorized focus
Overview camera
Camera Color, 5 megapixel, CMOS sensor
Field of view 40 mm x 40 mm
Spatial resolution 50 µm
Side-view camera
Side-view camera Black and white, range of view 30 mm in height
Standard modes
Contact mode, tapping mode (including phase image), lateral

Imaging
force microscopy
AFM unit
Dimensions (D x W x H) of AFM unit 490 mm x 410 mm x 505 mm
Weight of AFM unit 51.1 kg
Dimensions (D x W x H) of controller 340 mm x 305 mm x 280 mm
Weight of controller 7.8 kg

© 2017 Anton Paar GmbH | All rights reserved.
Specifications subject to change without notice.
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Tosca™ 400

Atomic Force Microscope

Anton Paar, as a well-established developer, producer, and

Soft organic materials Polymers Coatings Hard metallic and Semiconductors

Automatic laser alignment

Tosca™ 400 provides a fully automatic laser alignment function:

Large scan area in all directions combined

With a huge Z range of 15 μm, it is possible to acquire surface

The easiest engagement procedure

There are many different cantilever brands on the market –

State-of-the-art sample navigation

Workflow-oriented control and analysis

Due to the extensive space for placing a cantilever, Probemaster can

Active vibration isolation

The active vibration isolation is a necessary accessory for measurements

The acoustic enclosure for Tosca™ 400 ensures noise-free and

X-Y scan range 100 µm x 100 µm

Z scan range 15 µm

Max. sample diameter 90 mm

Max. sample height 25 mm

Max. sample weight <600 g

X-Y stage 100 mm travel

Z stage 85 mm travel

Position repeatability (uni-directonal) <1 µm

Camera Color, 5 megapixel, CMOS sensor

Field of view 1.73 mm x 1.73 mm

Spatial resolution 5 µm

Focus Motorized focus

Camera Color, 5 megapixel, CMOS sensor

Field of view 40 mm x 40 mm

Spatial resolution 50 µm

Side-view camera Black and white, range of view 30 mm in height

Contact mode, tapping mode (including phase image), lateral

Dimensions (D x W x H) of AFM unit 490 mm x 410 mm x 505 mm

Weight of AFM unit 51.1 kg

Dimensions (D x W x H) of controller 340 mm x 305 mm x 280 mm

Weight of controller 7.8 kg

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