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Lecture 6

The document discusses fading channel models and key parameters. It covers narrowband fading distributions like Rayleigh and Ricean. It also discusses level crossing rate and average fade duration which characterize outage times. Markov models approximate fading dynamics and scattering functions characterize delay and Doppler spread which impact system design.

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Hussain Naushad
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0% found this document useful (0 votes)
56 views9 pages

Lecture 6

The document discusses fading channel models and key parameters. It covers narrowband fading distributions like Rayleigh and Ricean. It also discusses level crossing rate and average fade duration which characterize outage times. Markov models approximate fading dynamics and scattering functions characterize delay and Doppler spread which impact system design.

Uploaded by

Hussain Naushad
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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EE359 – Lecture 6 Outline

 Announcements:
 Makeup lecture Friday (with pizza): last one
 Extra OHs for me: Friday after class and by appt.
 Review of Last Lecture
 Signal Envelope Distributions
 Level Crossing Rate
 Average Fade Duration
 Markov Models
 Wideband Multipath Channels
 Scattering Function
Review of Last Lecture
 For a narrowband fading model (Tm<<1/B), received signal
has a random, complex amplitude gain
 Under CLT approximation, in-phase and quadrature signal
components of received signal are Gaussian processes
 For n~U[0,2], the processes are zero mean, WSS, with
ArI ( )  .5 p E n [cos 2f Dn  ]  ArQ ( ), f Dn  v cos n / 
ArI ,rQ ( )  .5 p E n [sin 2f Dn ]   ArI ,rQ ( ) =0
Ar ( )  ArI ( ) cos(2f c )  ArI ,rQ ( ) sin(2f c )

 Auto and cross correlation depends on AOAs


of multipath
Review of Last Lecture (Cont’d)
 Uniform AoAs in Narrowband Model
 In-phase/quad comps have no cross correlation and
Decorrelates over roughly
ArI ( )  ArQ ( )  PJ 0 (2f D ) half a wavelength

 PSD is maximum at the maximum Doppler frequency


 PSD used to generate simulation values
Signal Envelope Distribution
 CLT approx. leads to Rayleigh distribution (power
is exponential)
 When LOS component present, Ricean
distribution is used

 Measurements support Nakagami distribution in


some environments
 Similar to Ricean, but models “worse than Rayleigh”
 Lends itself better to closed form BER expressions
Level crossing rate and
Average Fade Duration
 LCR: rate at which the signal crosses a fade value
 AFD: How long a signal stays below target R/SNR
 Derived from LCR
t1 t2 t3
R

 For Rayleigh fading


2
t R  (e  1) /( f D 2 )
 Depends on ratio of target to average level ()
 Inversely proportional to Doppler frequency
Markov Models for Fading
R2
 Model for fading dynamics A2
R1
Simplifies performance analysis
A1
 R0
A0

 Divides range of fading power into


discrete regions Rj={: Aj   < Aj+1}
 Aj s and # of regions are functions of model
 Transition probabilities (Lj is LCR at Aj):
L j 1T L jT
p j , j 1  , p j , j 1  , p j , j  1  p j , j 1  p j , j 1
j j
Wideband Channels
 Individual multipath components resolvable
 True when time difference between
components exceeds signal bandwidth

  1 / Bu   1 / Bu

 1  2
 
Narrowband Wideband
Scattering Function
 Fourier transform of c(t) relative to t
 Typically characterize its statistics, since
c(,t) is different in different environments
 Underlying process WSS and Gaussian, so
only characterize mean (0) and correlation
 Autocorrelation is Ac(1,2,t)=Ac(,t)
 Statistical scattering function:

s(,)=Ft[Ac(,t)] 

Main Points
 Narrowband fading distribution depends on
environment
 Rayleigh, Ricean, and Nakagami all common

 Average fade duration determines how long a user is


in continuous outage (e.g. for coding design)

 Markov model approximates fading dynamics.

 Scattering function characterizes rms delay and


Doppler spread. Key parameters for system design.

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