Detection and Localization of Internal Turn-To-Turn Short Circuits in Transformer Windings by Means of Negative Sequence Analysis
Detection and Localization of Internal Turn-To-Turn Short Circuits in Transformer Windings by Means of Negative Sequence Analysis
E-14-AAA-0000
Abstract—Internal turn-to-turn short circuits are the most Although the percentage differential relay is the most
difficult types of faults to detect within the transformers. This commonly used protection, it is not sensitive enough to detect
paper proposes a new, simple and efficient algorithm in order to low level turn-to-turn faults. Up to now, the advanced methods
protect transformers against these faults. Using this protection with high sensitivity such as Wavelet Transforms [1,2], S
algorithm which is based on negative sequence analysis, make it Transform [3,4] and Hilbert Transform have been applied for
possible to detect and also locate low level inter-turn short turn-to-turn fault detection in transformer windings. Although
circuits which typically cannot be detected by the traditional these approaches detect the minute faults, but they are based
differential algorithm before they extended into more severe on the signal processing and have complicated computation.
faults. Furthermore, the proposed algorithm is stable in the case Hence, these methods require large number of processors and
of external faults as well as load imbalance condition. In this instruments and so implementation of them is difficult [5].
work, first, a typical transformer is modeled based on Finite
Element Method to simulate the transformer behavior under In recent years, new diagnostic techniques based on
different operation conditions. Then, the accuracy and sequence components have been attended because of their
performance of new protection technique in detection and simplicity and also having a good sensitivity in winding faults
localization of inter-turn faults is studied by applying it to the detection. In 1998, sidhu and et al presented the earliest works
simulated transformer. in this field that uses the arguments of the positive and
negative sequence impedances of the power system in a fault
Keywords—transformer; turn-to-turn fault; Finite Element detection algorithm [6, 7]. In [8], authors differentiate between
Method; negative sequence analysis
different transient states using1th , 2th and 5th harmonic
components of the positive sequence differential current as
I. INTRODUCTION
inputs of artificial neural network. But, the methods based on
Transformers are one of the most important and expensive neural networks require a large number of training patterns
devices in electrical systems that are critical links between the which are produced by simulation of various cases and this
generation stations and consumers. Variety of unusual method is not generalized to be applied to different power
conditions and faults can affect the transformers. Unplanned transformers. Ref. [9] presented a digital technique for power
repairs such as fix or replacement of the faulty transformer are transformer fault detection on the basis of positive sequence
very costly and time consuming. One of the most sensitive admittance approach. The proposed method employs the
parts of the transformer is the insulation system that can be accumulated positive sequence admittances on the both side of
exposed by electrical, mechanical and thermal stresses and power transformer, so that the contour of the accumulated
moisture. Degradation of insulation system causes a values of positive sequence admittances computed by the relay
breakdown in the insulation and leads to development the is used for discrimination between internal and external faults.
inter-turn short circuits. Internal turn-to-turn faults are the In [10, 11], a new method based on the phase difference
most difficult types of faults to detect within the transformers. between negative sequence currents at the two sides of power
If turn-to-turn fault has not been rapidly detected, this fault transformer was presented for diagnosing internal faults. But,
can develop into more critical and costly to repair faults such the consequences of these works were also not convincing
as phase to phase or phase to ground faults. Therefore, quick because of restricted studies carried out for only one set of
detection of turn-to-turn faults is essential in order to protect system parameters and no detailed investigations. In [12],
the entire of electrical system and reduce the damage and MariyaBabiy performed some simulations for various
repair cost. In this way, development of online techniques for operating conditions and different configuration of the power
condition monitoring and in order to diagnose of inter-turn transformer to study the performance of mentioned method.
short circuits is very important to improve the system Ref. [13] offered a protection scheme for internal fault
reliability. detection in power transformer using comparison the ratio of
Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis
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Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis
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Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis
Fig. 4. Negative sequence current phasor related to the primary side of the
transformer in the case of turn-to-turn fault involving 3% of turns in various
phases of the secondary winding
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Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis
(a) (a)
(b) (b)
Fig. 5. Performance of proposed algorithm for a turn-to-turn fault involving Fig. 7. Performance of proposed algorithm for a turn-to-turn fault involving
3% of turns on the phase C of the primary winding: (a) negative sequence 3% of turns on the phase B of the secondary winding: (a) negative sequence
currents; (b) fault detector index currents; (b) fault detector index
(a) (a)
(b) (b)
Fig. 6. Performance of proposed algorithm for a turn-to-turn fault involving Fig. 8. Performance of proposed algorithm for a turn-to-turn fault involving
3% of turns on the phase A of the secondary winding: (a) negative sequence 3% of turns on the phase C of the secondary winding: (a) negative sequence
currents; (b) fault detector index currents; (b) fault detector index
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Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis
Turn-to-turn fault in
primary winding
100 0.0171 3.8302 9%
100 0.0132 1.1037 3%
100 0.0188 2.4184 6%
100 0.0185 3.327 9%
100 0.0139 1.1044 3%
100 0.0196 2.6539 6%
100 0.0191 3.507 9%
100 0.0144 1.2933 3%
100 0.0279 2.2605 6%
Turn-to-turn fault in
secondary winding
100 0.0383 2.7314 9%
100 0.0275 1.2683 3%
100 0.0387 2.229 6% (a)
100 0.0471 2.7098 9%
100 0.0345 1.2877 3%
100 0.0498 2.2413 6%
100 0.0582 2.7075 9%
(b)
Fig. 10. Performance of proposed algorithm for a phase to phase external
fault: (a) negative sequence currents; (b) fault detector index
(a)
(a)
(b)
Fig. 9. Negative sequence current phasor related to the primary side of the
transformer in the case of turn-to-turn faults in: (a) primary winding; (b)
secondary winding.
B. External faults
The presented results in this section are used to
demonstrate stability of the protection scheme under external R
(b)
faults. The phase to phase (A-C) and phase to ground (A-G) Fig. 11. Performance of proposed algorithm for a phase to ground external
faults have been simulated on the secondary side of the fault: (a) negative sequence currents; (b) fault detector index
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Detection and localization of internal turn-to-turn short circuits in transformer windings by means of negative sequence analysis