A Recursive Method For Traveling-Wave Arrival-Time Detection in Power Systems
A Recursive Method For Traveling-Wave Arrival-Time Detection in Power Systems
A Recursive Method For Traveling-Wave Arrival-Time Detection in Power Systems
1) Illustrative Example
The following parameters are selected for the proposed
method: 𝑅0 = 0.005 × 𝑉𝐴 where 𝑉𝐴 is the voltage amplitude
(285.774 kV), 𝑞 = 1, 𝑏 = 20 ms (i.e., the first 4000 samples
as 𝐹𝑠 = 200 kHz), Λ = 0.99, 𝜆 = 0.99, 𝜓 = 0.1. 𝑇 = 1.488 is Fig. 4. SLG fault with 𝑍𝑓 = 10 Ω at 50 mi from Bus 1 at 𝑡 = 250 ms. (a) The
selected for a confidence level of 95%. 𝑛 = 10 is selected for measured voltage and its estimated value in the aerial mode. (b) The
the Chi-Square test. An SLG fault with a fault impedance of normalized residuals during the buffering time. (c) The estimated and
measured voltages before the occurrence of the fault. (d) The normalized
10 Ω (𝑍𝑓 = 10 Ω) occurs 50 mi away from Bus 1 at 𝑡 = 250 residuals after the buffering time. (e) and (f) The fault-induced arriving wave
ms. The voltage measurements contain zero-mean Gaussian and its corresponding normalized residuals. (g) and (h) The entire
noises with 𝜎 2 = 0.01 × 𝑉𝐴 . The aerial mode of the measured measurement and normalized residuals during the procedure.
voltages (using Clarke’s transform) is fed to the proposed
method.
Fig. 4(a) shows the measured (𝑧̃𝑘 ) and estimated
measurements (𝑧̂𝑘 ) in the beginning of the procedure during
the buffering time (𝑡 ≤ 20 ms). The estimated voltage quickly
converge to the measured voltage since the sampling rate is
high and the states update fast. Fig. 4(b) shows the normalized
residuals (𝑟𝑘𝑁 ) during the buffering time. It is noticed that the
normalized residuals become smaller as the states are updated.
After the buffering time, the estimated voltage closely follows
the measured voltage and the normalized residuals deviate
around zero, corresponding to a zero-mean Gaussian noise, as
shown in Figs. 4(c) and 4(d). The fault-induced arriving waves
reach Bus 1 at 250.275 ms as Fig. 4(e) depicts. As Fig. 4(f)
shows, at 𝑡 = 250.275 ms, the normalized residual caused by
the arriving wave becomes large. Therefore, the EWMA
determines 𝑇𝐴𝑇 = 250.275 ms. Then, the proposed method
predicts the next 10 samples for times
250.280, 250.285, … , 250.325 ms. After measurement of the
next 10 samples, the normalized prediction-based residual set
𝑁 Fig. 5. Fault-location errors related to an SLG fault 50 mi away from Bus 1,
(𝑟𝑝𝑟𝑒 ) is generated. Chi-square testing technique determines
𝑍𝑓 = 10 Ω, 𝐹𝐼𝐴 = 150 , and 𝐹𝑆 = 200 kHz. (a) 𝜎 2 = 0.0075𝑉𝑝 . (b) 𝜎 2 =
that the elements of the normalized prediction-based residual 0.01𝑉𝑝 . (c) 𝜎 2 = 0.0125𝑉𝑝 .
𝑁
set (𝑟𝑝𝑟𝑒 ) do not belong to the normal Gaussian noise.
Therefore, the low-gain filter verifies that the abrupt change is proposed method with the existing AT-detection methods
produced by an arriving wave. Therefore, 𝐴𝑇 = 𝑇𝐴𝑇 that based on Test Case 1.
equals 250.275 ms. Figs. 4(g) and 4(h) illustrate the entire
procedure. In Fig. 4(h), the double-head arrow indicates that 1) Noise Sensitivity
as the ADKF updates the measurement noise variance, the Fault-induced TWs mitigate along TLs. Also, the
normalized residuals become smaller, improving the proposed environmental and measuring device noises skew the
method efficiency. measurements. Therefore, it is preferable that AT-detection
methods be able to accurately detect arriving waves in low-
B. Sensitivity Analysis Based on Test Case 1 SNR measurements. For evaluation of the proposed method, it
The following subsections evaluate and compare the is assumed that an SLG fault takes place 50 mi away from Bus
6
TABLE II
FIA INFLUENCE OVER FAULT LOCATION ERROR
Transient FIA [⁰]
RFL
Detection 5 6 7 8
[mi]
Method Error in Fault-Location [%]
1 F(†) F F F
DWT, db-4,
5 F F F F
scale 1
50 F F F 1.120
1 F F 1.021 1.060
DWT, db-4,
5 F 1.109 1.015 1.001
scale 2
50 F 0.388 0.382 0.381
1 F F F F Fig. 7. The effect of fault-impedance on the arriving waves at Bus 1, 𝑅𝐹𝐿 =
DWT, Haar 5 F F F 0.601 10 mi from Bus 1, 𝐹𝑠 = 200 kHz, 𝑍𝑓 = 𝑅𝑓 + 𝑗𝑋𝑓 = 2 Ω, and 𝐹𝐼𝐴 = 90⁰.
50 F F 0.820 0.433
1 F F 0.227 0.214
HT 5 F 0.188 0.168 0.160
50 F 0.074 0.071 0.066
1 0.960 0.420 0.404 0.395
STMPM 5 0.528 0.418 0.392 0.367
50 0.271 0.216 0.201 0.194
1 F 0.455 0.404 0.395
The Proposed
5 0.414 0.391 0.391 0.370
Method
50 0.223 0.188 0.176 0.191
(†)
F means that the method fails to detect the AT.
Fig. 8. The effect of fault-impedance on fault-location errors.
𝑋𝑓 /𝑅𝑓 ratios: 0.05, 0.1, and 0.2. Fig. 7 shows the arriving-
wave shapes at the Bus 1. It is noticed that the arriving-wave
shapes are slightly dissimilar; therefore, AT-detection methods
estimate different ATs. One thousand MCSs are run for each
𝑋𝑓 /𝑅𝑓 ratio. The fault-location errors of different AT-
detection methods are shown in Fig. 8. It is noticed that db-4
at scale 1 and to a lesser extent at scale 2 are influenced by
NIFs. However, NIFs have a relatively low impact on Haar
and HT. The proposed method and STMPM are robust against
NIFs.
C. Test Case 2: Real-Time Digital Simulator (RTDS)
Implementation
The schematic of Test Case 2 is shown in Fig. 9(a). The line
topology is based on [36], and its details are provided in Fig. 9. (a) The schematic of the test system in RTDS. (b) The schematic of
the hardware for converting the analog measurements to digital and sending
Appendix B. The TL is transposed and its length is 200 mi.
them to Matlab.
The Bergeron line model, which is frequency dependent, is
utilized in RTDS simulations. The system voltage and
frequency are respectively 230 kV and 60 Hz. The voltage
contains the harmonics given in Table I. The TW velocity is
178,430 mi/s [36].
The simulations are performed using RTDS with a digital-
to-analog (D/A)-in-the-loop. Fig. 9(b) shows the schematic of
the used hardware. The three-phase voltage measurements at
both ends of the TL (shown in Fig. 9(a) as “Measurement 1”
and “Measurement 2”) are sent to the D/A of the RTDS. The
D/A produces analog voltages based on the simulation results
at 1 MHz. The output of the D/A is then connected to a data
acquisition (DAQ), “IOTech DAQ/3000”, to provide time-
stamped digital samples at a rate up to 1 MHz [38]. The
digitalized measurements are then sent to a computer and
processed in MATLAB. Fig. 10. (a) and (b) show the arriving waves at Buses 1 and 2, respectively
(𝐹𝑠 = 200 kHz). (c) and (d) show the corresponding normalized residuals and
Figs. 10(a) and (b) respectively show the measurements at ATs.
Buses 1 and 2 at a sampling rate of 200 kHz for a solid SLG
fault at 75 miles from Bus 1. Figs. 10(c) and (d) show the compared and the results are given in Table IV. The
normalized residuals corresponding to the measurements at performance of DWT using db-4 at scale 1 is not preferable
Buses 1 and 2, respectively. The proposed method detects the against all the influencing parameters except for 𝐹𝑠 . However,
ATs at Bus 1 as 𝑡1 = 74.945 ms, and at Bus 2 as 𝑡2 = 75.220 DWT using db-4 at scale 2 is comparatively robust against
ms. Therefore, with reference to (18) and (19), Δ𝑡 = 275 µs, FIA. The efficiency of Haar deteriorates against low FIAs.
and the estimated fault location is 𝐸𝐹𝐿 = 75.465 mi, and However, Haar efficiency does not deteriorate with lower
𝑒𝑟𝑟 = 0.23%. The measurement noise variances estimated by sampling frequencies. The errors in the estimated fault-
the ADKF are almost 2080 V (i.e., 0.011VA ) and 575 V (i.e., locations using HT are smaller compared to DWT. However,
0.003𝑉𝐴 ) at Buses 1 and 2, respectively, which are due to the HT results in inefficient outcomes in the case of low-sampling
RTDS D/A, DAQ system, and the connections. measurements. None of the influencing parameters affects
Several experiments for the DAQ sampling frequencies of STMPM. The proposed method results in reliable outcomes
200 and 500 kHz and different fault locations are carried out. against the influencing parameters, except for 𝐹𝑠 .
The average fault-location errors based on one hundred The proposed method is also compared to STMPM in terms
experiments for each fault location and 𝐹𝑠 are provided in of computational burden since STMPM is considerably
Table III. The average fault-location errors corresponding to capable of detecting ATs, especially for low-SNR and low-𝐹𝑆
measurements. The CPU and RAM of the computer are Intel
the higher 𝐹𝑠 are smaller. In addition, it is noticed that the
Xeon E5420 and 32 GB, respectively. In both the proposed
average fault-location errors related to the faults closer to Bus
and STMPM methods, calculation of the sine and cosine
1 are larger.
functions are fulfilled through lookup tables, and divisions by
constants are replaced with multiplication (e.g., ÷ 4 is
IV. COMPARISON replaced with × 0.25) since it decreases the computation time.
Based on the simulation outcomes, the efficiency of the The measurement shown in Fig. 4(g) for 0 ≤ 𝑡 ≤ 100 ms is
existing and proposed AT-detection methods are qualitatively considered. As 𝐹𝑠 = 200 kHz, 100 ms is equal to 20,000
8
0.088102 s (88.102 ms), respectively. Thus, the proposed that is the recursive form of (8.b) as presented in (10).
method is considerably faster compared to STMPM. • Recursive Average of Residuals: the fixed forgetting factor
average is defined as [30], [31]
V. CONCLUSION 𝑘
Accurate detection of traveling-wave arrival times (ATs) 𝑟̅𝑘 = (1 − 𝜆) ∑ 𝜆(𝑘−𝑖) 𝑟𝑖 (27)
𝑖=1
plays a vital role in fault location based on ATs. Thus, this where 𝜆 ∈ (0,1). Therefore,
paper proposes a novel method for detecting the first AT of 𝑟̅1 = (1 − 𝜆)𝑟1 ,
TWs in power grids. The proposed method pinpoints the
𝜆(1 − 𝜆)𝑟1 + (1 − 𝜆)𝑟2 ,
𝑟̅2 = ⏟
abrupt changes in the residuals (innovation sequence)
𝜆𝑟̅1
generated by an adaptive discrete Kalman filter (ADKF)
⏟2 (1 − 𝜆)𝑟1 + 𝜆(1 − 𝜆)𝑟2 + (1 − 𝜆)𝑟3 , …, and
𝑟̅3 = 𝜆
through the exponentially weighted moving average (EWMA) 𝜆𝑟̅2
as a high-gain control chart. Then, the Chi-square filter ⏟𝑘−1 (1 − 𝜆)𝑟1 + 𝜆𝑘−2 (1 − 𝜆)𝑟2 + ⋯ + (1 − 𝜆)𝑟𝑘 .
𝑟̅𝑘 = 𝜆
verifies the released alarm validity. The proposed method is 𝜆𝑟̅𝑘−1
recursive. Therefore, it is proper for implementation in on-site Therefore, 𝑟̅𝑘 = 𝜆𝑟̅𝑘−1 + (1 − 𝜆)𝑟𝑘 , and it is (27) in a
microprocessor-based fault locators managing real-time recursive manner as presented in (11).
streams of high time-resolution measurements. The transient • The EWMA threshold: Referring to (13), and considering
simulations are performed utilizing EMTP-RV and the real- that 𝑟𝑘𝑁 ~𝒩(0, 1), then
time digital simulator (RTDS). The proposed method is 𝑔1 , 𝑔1′ ~𝒩(0, (1 − 𝜓)2 ),
compared with the state-of-the-art AT-detection methods in
𝑔2 , 𝑔2′ ~𝒩(0, 𝜓 2 (1 − 𝜓)2 + (1 − 𝜓)2 ),
the literature using MATLAB. According to the sensitivity
𝑔3 , 𝑔3′ ~𝒩(0, 𝜓 4 (1 − 𝜓)2 + 𝜓 2 (1 − 𝜓)2 + (1 − 𝜓)2 ),…, and
analysis, the performance of the proposed method is
satisfactory for AT detection. The measurement noises, fault 𝑔𝑘 , 𝑔𝑘′ ~𝒩(0, ∑𝑘𝑗=1 𝜓 2(𝑗−1) (1 − 𝜓)2 ).
inception angle (FIA), and non-ideal faults (NIFs) Based on the properties of geometric series and as 𝜓 < 1,
comparatively less affect the proposed method. However, (1−𝜓)2
lower sampling frequencies (𝐹𝑆 ) to some extent reduce the 𝑔𝑘 , 𝑔𝑘′ ~𝒩 (0, ) , ∀𝑘 ≫ 1. Therefore, using the normal
1−𝜓2
accuracy of the proposed method. Gaussian PDF, the value of the threshold 𝑇 can be selected.
For example, for 𝜓 = 0.1, 𝑔𝑘 , 𝑔𝑘′ ~𝒩(0,9/11), ∀𝑘 ≫ 1. Thus,
APPENDIX A 𝑇 = 1.488 indicates that 𝑔𝑘 and 𝑔𝑘′ are Gaussian noises for
• Recursive Measurement Noise Estimation: For any given 95% and the released alarm is false for 5%.
(𝑘 − 1)-th sample satisfying (8.a), (8.b) is [27]
1 𝑚
APPENDIX B
𝑅̂𝑘−1 = ∑ 𝑟(𝑘−1)−𝑖 2
−⏟𝑯𝑘−1 𝑷− 𝑇
𝑘−1 𝑯𝑘−1
𝑚 ⏟ 𝑖=1 (20) • The topology of the TL used in Test Case 1 is shown in Fig.
𝐵 𝑘−1
𝐴𝑘−1
B. 1 [32], and its details are as follows: The DC resistances of
9