VLSI Test Technology and Reliability

Said Hamdioui
Delft University of Technology
Computer Engineering Lab
Mekelweg 4, 2628 CD Delft
The Netherlands
[email protected]
http://ce.et.tudelft.nl/~said
Skype: Said.Hamdioui
Tel: +31- 15 278 3643
+31- 62 880 2494
Office: EWI/15.020

2009-2010
 Instructor
• Education
• 1997: MSEE from TU Delft (Cum Laude)
• 2001: PhD from TU Delft (Cum Laude)

• Employment
• Intel, CA, USA (3 years)
• Philips Semiconductors R&D, Crolles, France (1 year)
• NXP Semiconductors , Nijmegen, the Netherlands (2.5 years)
• TU Delft (~2.5 years)

• Research area
• VLSI Test technology, Reliability and fault tolerance
• Silicon and non-silicon technology

• Publications
• One book
• Over 70 journals and conference papers

VLSI Test Technology and Reliability (ET4076) 2

 Goals of today…
• Understand the course organization, outline, examination, etc
• Be able to describe the importance of VLSI test technology and
reliability for ICs
• Become familiar with key words in the field
• Be able to describe the major challenges in the field

VLSI Test Technology and Reliability (ET4076) 3

 Topics of today
• What is VLSI Test Technology and Reliability?
• Motivation
• About the course (organization, materials, goals, plan, …)

• Introduction to IC test
• Definitions and concepts
• VLSI realization process
• Design for testability
• Manufacturing test flow
• Trends in SoC design and test

VLSI Test Technology and Reliability (ET4076) 4

 What is VLSI Test and reliability?
Design,
Manufacturing, Operational life Wearout
test time
t=0 t= Tlifetime
• Test/Quality
• Guarantee that the IC performs its function at t=0
• Conformance to specifications: time-independent
• Measured in DPM (defects part per million)
• Driven by defect/fault coverage & performance guard-bands
• Impacts B2B relationship

• Reliability
• Guarantee that the IC performs its function for t ≥ Tlifetime >0
• Meeting specification over time: time-dependent
• Measured in FIT (Failure in 109 device-operating hours)
• Driven by changing material properties, application profile, environment,..
• Impacts C2B relationship

Strong correlation between Quality & Reliability

VLSI Test Technology and Reliability (ET4076) 5
 Motivation…………… time, cost, quality
Quick to market advantages:
- Predictability 0.95T<T<1.05T
- First in the market
- Fast response to competitive threat

Time to Market

Customer satisfaction
Chip Overhead IC
- Test escapes
- Si area overhead
- First good chip
- Pad overhead
- Reliability
Board System Product Quality Part cost Test application
- Tester cost
- Diagnosis
- Testing time
- Rework/ repair
- DFT cost

Predictability & Reliability are the driving factors

VLSI Test Technology and Reliability (ET4076) 6
 Motivation…………………….. Share of test cost

Ref: SIA roadmap

The share of test cost continuously increases

VLSI Test Technology and Reliability (ET4076) 7

 About the course……… organization and materials
• VLSI Test Technology and Reliability
• Code: ET4076

• Course material:
• Book: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI
Circuits, M. L. Bushnell and V. D. Agrawal
• Additional reading: scientific papers
• Assessment:
• Oral exam (or writing a chapter): 90%
• Assignments: 10%

• ECTS: 4

• Expected prior knowledge

• Digital design
• Some knowledge about IC manufacturing

VLSI Test Technology and Reliability (ET4076) 8

 About the course……… Contents
Things you’ll be learning:
• VLSI Test philosophy
DSP
CPU
• Defects and fault modeling core
core ASIC
IP core

• Test schemes/Design for testability for digital circuits ASIC

Memory
• Algorithms, Scan design, Delay Test , etc Memory
• Memory testing ASIC
• Boundary Scan I/O
Memory

• Built-In-Self Test Analog

PLL

• Testing for reliability

• Future trends in digital design and test

• Better understand the weaknesses of IC’s and do research on VLSI Test

• Become a better VLSI designer

The basics of testing digital circuits: theory and practice

VLSI Test Technology and Reliability (ET4076) 9
 Introduction to IC Testing…. Verification vs. Testing
Design,
Manufacturing, Operational life Wearout
test time
t=0 t= Tlifetime

• Design synthesis: Given an I/O function, develop a

procedure to manufacture a device using known materials
and processes.

• Verification: Predictive analysis to ensure that the

synthesized design, when manufactured, will perform the
given I/O function [after development]

• Test: A manufacturing step that ensures that the physical

device, manufactured from the synthesized design, has no
manufacturing defect [after manufacturing].

VLSI Test Technology and Reliability (ET4076) 11

 Introduction to IC Testing…. Verification vs. Testing

Development Manufacturing
1 2
1. (Design) Verification
• Verifies correctness of design (target design errors)
• Performed by simulation, hardware emulation, or formal methods.
• Performed once prior to manufacturing
• Responsible for quality of design

2. (Manufacturing) Testing
• Verifies correctness of manufactured IC (target manufacturing defects)
• Two-part process:
• Test generation: software process executed once during design
• Test application: electrical tests applied to hardware
• Test application performed on every manufactured device
• Responsible for quality of devices

VLSI Test Technology and Reliability (ET4076) 12

 Introduction to IC Test…. Definition
TESTABILITY:

• The ability to SYNTHESIZE, GENERATE, EVALUATE, APPLY and

OBSERVE tests to satisfy
• A range of predetermined objectives e.g.,
• Fault coverage, Defect level, Time-to volume, etc
• Subject to two fundamental constraints : TIME and MONEY

Cost

Total cost

Dev. & time to market

Manu. & maintenance

Test quality

Testing has a profound effect on the cost

VLSI Test Technology and Reliability (ET4076) 13
 Introduction to IC Test…. Why testing?
• The motivation is the QUALITY where:
QUALITY= Meeting the expectation of the customer

• Manufacturing process is complicated & time consuming

• Defects are inevitable
• Original silicon: E.g., impurities, dislocations
• Manufacturing process: process variation, temperature
fluctuations, opens, shorts, extra/missing transistors, spot
defects, etc
• Soft faults (in field)
• Increase speed and noise margin reduction reduce robustness
• Nanometer technologies sensitive to radiation (at sea level)

Testing is indispensable
VLSI Test Technology and Reliability (ET4076) 14
 Introduction to IC Test ……... Ideal versus real tests

Ideal tests
• Detect all defects produced in the design and/or manufacturing
• Pass all functionally good devices
• Fail all functionally bad devices
• Detect all reliability related defects

Real tests
• Very large number of possible defects need to be tested
• Difficult to generate tests for some real defects (defect oriented testing)
• Based on analyzable fault models
• Incomplete coverage of modeled faults due to high complexity/
high cost
• Some good chips are rejected (yield loss)
• Some bad chips pass (escapes/ defect level in Defect-Per-Million DPM)
VLSI Test Technology and Reliability (ET4076) 15
 Introduction to IC Test ……... Escapes and yield loss

Pass, OK

Manufactured
Escapes Pass, OK (customer’s return)
products Test Program
Yield Fail, OK
loss
Fail, OK

Fix test
system Fail, OK

Fail, OK Failure Analysis

Fix design
and/or Process And Repair

VLSI Test Technology and Reliability (ET4076) 16

 Introduction to IC Test …………. Goal of R&D
• Research targets product COST & QUALITY
• Current tests PARTLY target real fails
• Research identifies real fails to reduce cost and
increase quality
Real Detected
Real Detected
fails fails
fails fails

Test Yield
escapes Detected loss Research Detected
defects
(DPM) ($$$) defects

Test Yield
escapes loss
(DPM) ($$$)

VLSI Test Technology and Reliability (ET4076) 17

 Introduction to IC Test …………. Testing depends on

• Application Quality Budget

• Toys Lowest Lowest
• Consumer electronics Low Moderate
• Automotive/security High High
• Healthcare/aerospace Highest Highest

• Circuit type
• Digital logic • Analog
• Memory • RF

• Testing stage
• Characterization (first silicon sample)
• Production test (wafer test, e-sort)
• Reliability test

VLSI Test Technology and Reliability (ET4076) 18

 Introduction to IC Test ……….. Cause of escapes
• Timing related defects
- Complete timing testing impractical
- Increased speed makes circuits more sensitive to smaller delays
• Number of small delay defects increases rapidly

• Un-modeled faults/Untested faults

- Not all faulty behavior identified and modeled/test time limitations

• Environmental failures
- Failures at specific temperatures and/or voltages
- Noise related failures/ signal integrity

• Circuit/process sensitivities
- Design not verified over complete range of specifications

• Soft errors
- Memory sensitivity increases with each technology generation

VLSI Test Technology and Reliability (ET4076) 19

 Introduction to IC Test…..Roles of Testing
• Detection:
Determination whether or not the device under test (DUT)
has some fault.

• Diagnosis:
Identification of a specific fault that is present on DUT.

• Device characterization:
Determination and correction of errors in design and/or test
procedure.

• Failure mode analysis (FMA):

Determination of manufacturing process errors that may
have caused defects on the DUT.

VLSI Test Technology and Reliability (ET4076) 20

 Today VLSI realization process
From idea to shipping Customer
Rule of ten

10000

Requirements
Test & repair cost

1000

100

Specifications
10

1
Comp. Board System Field
Design+ Test
Product phase Verification develop.
Failure Mode
Cost Fabrication
Analysis
Total cost
Manufacturing
BAD products Testing
Dev. & time to market

Manu. & maintenance

GOOD products
Test quality

VLSI Test Technology and Reliability (ET4076) 21

 Design for Testability DFT
• DFT refers to those design techniques that make test
generation, test application and test evaluation cost-effective.

• DFT helps answering three main questions:

• Can tests that detect all faults assured?
• Can test development time be kept within economical limits?
• Can test execution time be kept within economical limits?

• Example:
Logic Logic PO
PI block A block B
Int.
bus
Test Test
input output
VLSI Test Technology and Reliability (ET4076) 22
 Design for Testability DFT
• Electronic systems consists of different components
• Digital logic CPU
DSP
core ASIC
core
• Memory blocks IP core

• Analog and mixed-signal blocks Memory

ASIC

Memory

ASIC
• Each component requires specific DFT I/O
Memory
Analog
PLL

• Component level-DFT is not sufficient

for producing testable system
• Access mechanism to the embedded component needed

VLSI Test Technology and Reliability (ET4076) 23

 Design for Testability DFT
• DFT methods for digital circuits
• Ad-hoc methods
• Structured methods:
• Scan/ Partial Scan
• Built-in self-test (BIST)
• Boundary scan
• Test compression
•…

• DFT method for mixed-signal circuits

• Analog test bus
• BIST??

VLSI Test Technology and Reliability (ET4076) 24

 Manufacturing test flow
• Three main sources of test info:
Pass ICs
Test program
• Initial test set from older application (customer returns)
technologies
adapt it Fail
• New technologies introduces
new faults
additional tests Yield/ Failure
required (R&D) analysis
• Depending on target yield (and
customer returns), test set is R&D/
adapted (using e.g., failure Test program
Dev.
analysis)

• Test adaptation LOOP: Test Initial test

application
Yield/failure Design
set
analysis
R&D

VLSI Test Technology and Reliability (ET4076) 25

 Testing Costs

• Design for testability (DFT)

• Chip area overhead and yield reduction
• Performance overhead

• Software processes of test

• Test generation and fault simulation
• Test programming and debugging

• Manufacturing test
• Automatic Test Equipment (ATE) capital cost
• Test center operational cost

VLSI Test Technology and Reliability (ET4076) 26

Testing Costs …...Manufacturing Testing in 2000AD
• 0.5-1.0GHz, analog instruments, 1024 digital pins: ATE
purchase price
= $1.2M + 1024 x $3000 = $4.272M
• Running cost (five-year linear depreciation)
= Depreciation + Maintenance + Operation
= $0.854M + $0.085M + $0.5M
= $1.439M/year
• Test cost (24 hour ATE operation)
= $1.439M/(365 x 24 x 3600)
= 4.5 cents/second
Assume: Circuit test time is 6 sec.
This results in test cost as 27 cents.
If only 65% pass the test (yield), the test contribution to the price
of a good chip is 27/0.65 = 41.5 cents.
VLSI Test Technology and Reliability (ET4076) 27
 Trends in SoC design & test
• Enhancement in semiconductor IC & technology DSP
CPU
ASIC
• Integration density is steadily increasing core
core
IP core
• Feature sizes decreasing (10nm in 2011?)
ASIC
Memory
• More & different devices included and new types Memory

of structures integrated ASIC

I/O

Increase in complexity Memory
Analog
• This impacts: PLL

• Design styles
• Power (Pdyn= α.C.f.Vdd2)
• Leakage (static and dynamic)
• Testing (digital, analog,…)
• Reliability (electromigration, ESD,…)
• Signal integrity (cross talk, signal propagation, supply
noise, …)

Design is no longer a matter of switches, zeros and ones….

It is about resistors, capacitors, inductors, noise, interference, radiation, etc.
VLSI Test Technology and Reliability (ET4076) 28
 Trends in SoC design & test…… Density
memory and logic density

Consequences
• Test complexity
• High leakage
• Cross talk
• Voltage drop
• Supply bounce
• EMC (electromagnetic compatibility)
• Propagation delay
• Reliability
• Radiation
• ….

Number of transistors/chip increases ~ 60% per year

(Moore’s law, April 1965)
VLSI Test Technology and Reliability (ET4076) 29
 Trends in SoC design & test….. Performance

Consequences
•At speed testing
•Delay testing
•Switching (di/dt) noise
•EMC
•ATE cost (Agilent)
~2M$ +3K$/pin??
- Speed ~ 650Mhz??
…..

Exponential increase in the clock rate ~60% /year [till ~ 2004]

VLSI Test Technology and Reliability (ET4076) 30

 Trends in SoC design & test ………… multi-core
• 2001: Intel warned about the dangers of heat dissipation in
processors. Solution: lay in producing chips with multi-cores

• 2004: announcement of dual-core processors

• Increase productivity, Powerful energy-efficient performance,
Leading-edge advanced computing experiences, etc

• Many-core, multi-core will be dominating

3.16 GHz

• Consequences on Testing
• Cross talk, interferences, noise from
power lines
• Test complexity
• Temperature related faults Intel dual core
• Process variations (…, 0.13um,
90nm, 65nm, 45nm, 32nm, …)
• …

VLSI Test Technology and Reliability (ET4076) 31

 Trends in SoC design & test…….
Design is no longer a matter of switchers, zeros and ones….
It is about resistors, capacitors, inductors, noise, interface, radiation, etc.

SoC & scaling impacts e.g.,:

Design
- Increase in the design-productivity gap DSP
CPU core ASIC
- Styles has to be changes to make design core
manageable IP core
- Design reuse (time-to-market)
ASIC
Power dissipation Memory

- Lower power design techniques Memory

Testing, Reliability & Sig. Integrity ASIC

- Complexity (embedded blocks) I/O
- Time consuming
Memory
- Electromigarion
- Signal interference/ Cross talk Analog
PLL
- Noise
- …
- …..
(High cost associated with scaling)
……
VLSI Test Technology and Reliability (ET4076) 32
 Research topics & roadmap @ CE-TUDelft
System/architecture approach

Cores Interconnect Memory

Design for Testability and Reliability

• Cores: Multi-core, nano-computing
• Interconnect: NOC
CAT tools
• Memory:
• Conventional: SRAM, DRAM
• Future: PCM, CMOL
• Computer Aided Test (CAT) Tools
• New Technology: 3D integration
VLSI Test Technology and Reliability (ET4076) 33
 Some successful stories and ongoing activities…
Belgium Canada
Altera, San Jose, CA

Taiwan
Intel, CA
Design of Systems on Silicon,
Valencia, Spain

MTD, Germany
Infineon Technologies,
Munich, Germany
ST Microelectronics, France
Atmel, France
Philips/ NXP, Netherlands

VLSI Test Technology and Reliability (ET4076) 34

 Summary
• Test technology is an integral part of IC design
manufacturing
• Test is becoming more important with technology scaling
• Design for testability
• Reliability, FIT, test, fault models, verification
• Yield, Yield loss, DPM, escapes,
• Detection, diagnosis, failure analysis, characterization
• Many challenges due to technology scaling
• design, manufacturing & test

VLSI Test Technology and Reliability (ET4076) 35