ALD Con Mode 2
ALD Con Mode 2
ALD Con Mode 2
H I G H L I G H T S
c Methodology for estimating kinetic parameters involved in the ALD gas–surface reactions.
c Assessment of the statistical reliability of the parameter estimates and the model response.
c Continuous flow ALD reactor model was validated experimentally and showed high predictability.
c Mechanistic dependence of process operating parameters on ALD film growth profiles were assessed.
c Application of a heuristic optimization algorithm implemented in a cluster environment.
a r t i c l e i n f o a b s t r a c t
Article history: This paper demonstrates the experimental validation and mechanistic analysis of the continuous cross-
Received 20 February 2012 flow atomic layer deposition (ALD) reactor model developed in the first article of this series (Holmqvist
Accepted 28 June 2012 et al., in press). A general nonlinear parameter estimation problem was formulated to identify the
Available online 11 July 2012
kinetic parameters involved in the developed ALD gas–surface reaction mechanism, governing ZnO film
Keywords: growth, from ex situ film thickness measurements. The presented methodology for comprehensive
Atomic layer deposition model assessment considers the statistical uncertainty of least-squares estimates and its ultimate
Experimental model validation impact on the model predicted response. Joint inference regions were determined to assess the
Parameter identification significance of parameter estimates and results indicate that all estimates involved in the precursor
Optimisation
half-reactions were adequately determined. The reparameterization of the Arrhenius equation
Dynamic simulation
effectively decreased the characteristically high correlations between Arrhenius parameters, leading
Kinetics
to improvement in precision of individual parameter estimates. Model predictions of the spatially
dependent film thickness profile with narrow confidence band were in good agreement with both
calibration and validation experimental data, respectively, under a wide range of operating conditions.
The subsequent extensive theoretical analysis exhibits that the experimentally validated model
successfully reproduces the detailed process dynamics revealed by in situ quartz crystal microbalance
and quadrupole mass spectroscopy diagnostics, and thereby provides a supplementary analysis tool.
Finally, the univariate sensitivity analysis revealed the mechanistic dependence of all the measured
process operating parameters on the spatially dependent film thickness profile, resolved at the level of
a single pulse sequence. Hence, the presented model-based framework serves as a means to guide
future research efforts in the field of ALD process optimization.
& 2012 Elsevier Ltd. All rights reserved.
0009-2509/$ - see front matter & 2012 Elsevier Ltd. All rights reserved.
http://dx.doi.org/10.1016/j.ces.2012.06.063
A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329 317
precursors, and the introduction of new process configurations and reactions and can thus be used to estimate the kinetic parameters
regimes, calibration and experimental validation of process models (Holmqvist et al., in press):
have been identified as an important step in the field.
b ¼ ½L,kT ref,i ,i ,Ei y 8i A f1; 2, . . . ,4g ð1Þ
There are two main ways of providing additional physical
Nb
insight into the nature of the reaction mechanisms concerned where b A R is the Nb -dimensional parameter space. However,
and determining reliable estimates of the kinetic parameters. identifying the restricted set of kinetic parameters, b, in an ALD
(i) Ab initio quantum-chemical and quantum-kinetic calculations process model represents a non-trivial task. The two main reasons
(Deminsky et al., 2004; Xu and Ye, 2010), and (ii) model calibra- are:
tion and experimental validation (Lim et al., 2000; Park et al.,
2000). However, the main objective of the published work was to (i) There is a complex interdependence between the sequential
determine the principal features of the kinetic mechanism, and and parallel elementary surface reactions (Pinto et al., 2011)
detailed fluid dynamics was neglected at that stage. It was involved in ALD, such that the reactivity in one half-cycle is
emphasized by Puurunen and Vandervorst (2004) that model influenced by that in the half-cycle preceding it (Kuse et al.,
calibration utilizing experimental saturation curves determined 2003; Ritala and Leskelä, 2002). Consequently, the kinetics of
from flow-type reactors, which are dominated by mass transport each reaction step must be balanced with respect to the other.
(Aarik and Siimon, 1994; Siimon and Aarik, 1995; Ylilammi, 1995), (ii) The intrinsic mathematical structure of the nonlinear Arrhe-
are generally not suitable for extracting kinetic parameters gov- nius equation introduces high correlation between the fre-
erning ALD growth without a reactor scale model. For this reason, quency factor, Ai, and the activation energy, Ei (Buzzi-Ferraris
the novel mathematical model of the continuous cross-flow and Manenti, 2009; Héberger et al., 1987; Nagy and Turányi,
reactor system F-120 by ASM Microchemistry Ltd. (Suntola, 2011; Schwaab and Pinto, 2007, 2008; Schwaab et al., 2008b;
1992) presented in the first article of this series (Holmqvist Varga et al., 2011).
et al., in press) was derived to mechanistically describe the
complex interactions between the gas-phase fluid dynamics, the For this purpose, a carefully chosen experimental design have
mass transport of individual species, and the ALD heterogeneous been recognized as an important element in comprehending the
surface reaction mechanism (Ritala and Leskelä, 2002). Thereby, coupled nature of the ALD growth kinetics and to obtain ade-
the model incorporates all relevant physicochemical phenomena quately determined parameters (Park et al., 2000). The aim of the
governing ALD growth required to assist in parameter estimation. experimental design is to yield the most possible information, in a
Furthermore, in contrast to the mathematical models proposed in statistical sense, for use in parameter estimation and model
the aforementioned cited studies this model, comprises a system validation (Franceschini and Macchietto, 2008). Further, given a
of nonlinear partial differential equations (PDEs), provides spatial set of discriminating experiments (Alberton et al., 2010, 2011), it
resolution of the substrate film thickness profile (Siimon and is important to utilize the experimental information in an optimal
Aarik, 1995, 1997). Given the novel application, the detailed preserving manner. As emphasized by Schwaab et al. (2008a), the
experimental investigation on growth of ZnO films from Zn(C2H5)2 error structure of the kinetic constants in nonlinear models may
and H2O reported in Holmqvist et al. (in press) was performed in be non-convex, open and constitute of discontinuous regions. For
order to assess the validity of the derived mathematical model on this reason, it was recommended that the entire calibration
a discrete set of sampling positions on the substrate, see e.g. parameter vector, b, should be calibrated simultaneously using
Cleveland et al. (2012) and Henn-Lecordier et al. (2011). the entire experimental calibration data set, y, ^ presented in
The overall objective of this study was to experimentally Holmqvist et al. (in press).
validate and demonstrate the generally applicable mechanistic
model for the analysis and design of ALD processes developed in 2.1. Formulation of the nonlinear parameter estimation problem
the first article of this series (Holmqvist et al., in press). This paper
focuses around three main points. (i) To formulate and solve a The nonlinear parameter estimation problem is formulated as
nonlinear parameter estimation problem using ex situ experimen- a general nonlinear optimization problem:
tal data and the modeling environment presented in Holmqvist min FðbÞ
et al. (in press), and (ii) to assess the statistical reliability of the bAR
Nb
parameter estimates and the predicted model response, and (iii) to dx
perform an extensive analysis of the experimentally validated ALD s:t: 0¼F ,x,u, b,w,t , xðt 0 Þ ¼ x0
dt
process model dynamics, and to mechanistically determine the y ¼ gðx,u, b,wÞ
sensitivity of the equipment-scale process operating parameters bmin r b r bmax
on film growth. Although assessed in several experimental studies,
with b ¼ ½L,kT ref,i ,i ,Ei y 8i A f1; 2, . . . ,4g
see e.g. Aarik et al. (2006), Jur and Parsons (2011), and Lei et al.
y
(2006), the mechanistic details of the process operating para- xE ¼ ½p,v, oa , yk ,ms 8a, k
meters have not yet been thoroughly studied theoretically. yE ¼ ½hs ðzÞ9f^ ,UF y y ^f ¼ 1 , 3 , 5 9G 9
sub
The reminder of this paper is organized as follows. The non- 6 6 6
linear parameter estimation problem is formulated in Section 2, uE ¼ ½Dt ZnðC2 H5 Þ2 , Dt H2 O ,Ty
while the subsequent section describes the statistical model wE ¼ ½Dt N , Q_ , Q_ , Q_ y
2 N2 ZnðC2 H5 Þ2 H2 O ,/pS9Gout ð2Þ
validation methodology. Section 4 outlines the optimization envir-
onment. Section 5 presents the results from the validation meth- where b is subject to lower and upper bounds acting as inequa-
odology followed by an extensive mechanistic analysis of the ALD lity constraints and estimated by minimizing an objective func-
process model. Finally, concluding remarks are drawn in Section 6. tion FðbÞ, based on the deviations between the observed, y, ^ and
predicted system response, y. By using the method of lines (Davis,
1984; Schiesser, 1991) and finite element method (Zienkiewicz
s
2. Nonlinear parameter estimation and Taylor, 2000a,b) framework in COMSOL Multiphysics
(COMSOL AB, 2008), the associated system of nonlinear differ-
The inverse method used in this study utilizes the fact that the ential algebraic equations (DAEs), in which x, u and w represent
height of the film contains information on the elementary surface dependent states, free design variables, and algebraic variables, is
318 A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329
denoted by F in Eq. (2). It is noteworthy that response function g, 3.2. Assessment of the accuracy and reliability of the predicted
which transforms and selects those state variables that are model response
experimentally measured, is a nonlinear function of b for all
states x. The weighted sum of squared residuals is used to The net effect of the statistical assumptions that are inherently
quantify the estimation, and is defined as made when applying the least-squares estimates and the propa-
X gation of parametric uncertainty is to produce model predictions
FðbÞ ¼ ½y^ E yE ðxE ,uE , b,wE Þy W1 ^
E ½y E yE ðxE ,uE , b,wE Þ ð3Þ with an uncertainty bound (Draper, 1995). The approximate
E¼1
100ð1aÞ% confidence bands for the response function (Bates
where W is the square weight matrix corresponding to the and Watts, 1988) are given by the collection of all curves
different weights used to normalize the contribution of each yðx,u, b,wÞ belonging to the set:
particular observation E within the N E -dimensional sample space. n
The details underlying the statistical assumptions and their yðx,u, b,wÞ : 9fyðx,u, b,wÞgfyðx,u, b^ ,wÞg9
implications, which lead to the use of the least-squares estimates o
encompass several different aspects of the regression model, are r ½Jðb^ Þy Rðb^ ÞJðb^ Þ1=2 ðNb F ðNb , j;aÞ Þ1=2 ð7Þ
presented elsewhere (Bates and Watts, 1988).
where Jðb^ Þ ¼ @yðx,u, b,wÞð@bÞ1 9b ¼ b^ denotes the parameter Jaco-
bian matrix (Chappell and Gunn, 1998).
3. Statistical model validation via nonlinear parameter
estimation
2000; Vajda et al., 1989): the hybrid numerical procedure described in Section 4. The
Nb Nb experimental calibration data sets, y^ E , 8E 2
= f2; 11,23g used for
P ¼ fb A R n
: rank Jðb Þ ¼ Nb 4:(b A R , UðbÞ r Uðb Þg
n n
ð8Þ
evaluation of FðbÞ are reported in Holmqvist et al. (in press)
the gradient-based algorithm lsqcurvefit in the Optimization and the operating conditions associated with the E th index are
TM
Toolbox for MATLABs (The MathWorks Inc, 2010b) was uti- listed in Table 1. The remaining data sets are used for experi-
lized to yield the final least-squares estimates, b^ . mental model validation (see Section 5.1.3).
Table 2
Regression analysis of the parameter least-squares estimates, b^ . The correlation matrix Cðb^ Þ and normalized margin of error e b^ were determined at a significance level of
a ¼ 5 102 . The specific reaction rate kT ref,i ,i and 8i A f1; 2, . . . ,4g are defined at the reference temperature T ref,i ¼ 4:19 102 K. According to Elam and George (2003), the
variable numbers of surface hydroxyl groups that react with the ZnðC2 H5 Þ2 adsorptive precursor molecule in the elementary surface reactions (cf. Holmqvist et al., in press)
was defined as n ¼ 1:37. Parameter units: kT ref,1 ,1 ððmol m2 Þ1n Pa1 s1 Þ; kT ref,2 ,2 ððmol m2 Þn1 Pa1 s1 Þ; kT ref,3 ,3 ððmol m2 Þ1 s1 Þ; kT ref,4 ,4 ðPa1 s1 Þ.
ı Parameter b Parameter estimates b^ Margin of error e b^ (%) Approximate correlation matrix Cðb^ Þ
1 L 1.53 10 5 0.183 1.00 0.63 0.74 0.46 0.52 0.80 0.61 0.39 0.35
2 kref,1 8.16 10 6 1.24 1.00 0.53 0.12 0.22 0.19 0.11 0.10 0.06
3 E1 3.57 104 0.172 1.00 0.21 0.15 0.72 0.19 0.21 0.23
4 kref,2 1.33 10 6 1.16 1.00 0.52 0.28 0.13 0.97 0.30
5 E2 4.04 104 0.155 1.00 0.11 0.09 0.20 0.17
6 kref,3 3.45 10 6 3.29 1.00 0.56 0.31 0.36
7 E3 2.67 104 2.56 1.00 0.38 0.29
8 kref,4 4.68 10 7 5.21 1.00 0.59
9 E4 3.79 104 4.95 1.00
320 A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329
Fig. 1. Nominal 95% likelihood confidence region for pairs of normalized and centered parameters bı and 8ıA f1; 2,3; 6g; (– –) approximate marginal 95% confidence interval
ð 7 e b^ Þ; (þ ) normalized and centered least-squares estimates, b^ ı .
ı
A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329 321
(Eq. (4)) provides a poor representation, and thus, lead to erro- uncertainty on the precision of the parameter estimates given by
neous conclusions about the confidence on model parameters. In the model can be evaluated.
Fig. 2, the point estimate of model parameters is placed at the The graphic representation of some of the experimental
center of the hyper-ellipsoid and the likelihood confidence region calibration data sets E A f1; 3,8; 9,10; 14,17; 20,24g in Fig. 3a–c
is non-convex and unbounded, since the parameter b8 does not indicates that the model output and the experimental data show
have an upper limit. Hence, the model is unable to discriminate good agreement. The comparison between the uniformity factors
between high values of b8 , as high values of this parameter lead to for the experimentally observed, UF y^ , and model generated
a constant model response, y. The occurrence of the elongated response, UF y , in Table 1 also shows satisfactory agreement for
likelihood joint confidence region reflects the parameter correla- the majority of the calibration data sets. The worst fit is found for
tion (Emig and Hosten, 1974). In order to further reduce the the calibration data sets employing a temperature of 1:0 102 1C
parameter correlation and simultaneously improve the precision and short pulse duration of the adsorptive precursors, which give
of the parameter estimates, two essential points are: (i) use an film profiles with the lowest uniformity factors. This is evident
experimental design with extended information that enables when visualizing the model accuracy, the associated bandwidth
discrimination (Franceschini and Macchietto, 2008) of the afore- of the inference bands and when analyzing the relative error dyE
mentioned parameters and (ii) perform the numerical optimiza- and 8EA NE for each calibration index (see Table 1). On the other
tion procedure proposed in Schwaab et al. (2008b) and Schwaab hand, the calibration sets with longer adsorptive precursor pulse
and Pinto (2007, 2008) to provide the optimum reference tem- duration, especially for the H2O precursor, have significantly
peratures, T ref,i , for every ith Arrhenius reaction rate equation, lower relative errors, demonstrating that the model describes
respectively. An optimal experimental design and a set of optimal this part of the calibration region better.
reference values holds the potential to yield precise estimates of When growing oxide films by ALD in a viscous flow reactor
uncorrelated parameters, and the likelihood joint confidence with alternating injection of adsorptive precursors, Groner et al.
region would tend towards being elliptical. (2004) reported that complete purging of reactants, especially
Moreover, on the subject of improving information content, in H2O, takes significant longer time at low temperatures ð r1:0
a statistical sense, obtained from the measured response, y, ^ to 102 1CÞ because of slower desorption from the reactor walls.
maximize the calibration parameter discrimination capacity, the Hence, purge times must be increased with decreasing tempera-
ITRS guidelines promote the use of in situ diagnostics, including ture in order to prevent simultaneous presence of both precursors
quartz crystal microbalance (QCM) (Aarik et al., 2006; Elam and in the gas phase which results in regular CVD growth, comprising
George, 2003) and quadrupole mass spectroscopy (QMS) (Lei a higher growth rate than in true ALD (Elers et al., 2006; Jur and
et al., 2006; Rahtu and Ritala, 2002). These monitoring techniques Parsons, 2011). In this study, the N2 purge time was held constant
provide extensive dynamic information during the ALD pulse at Dt N2 ¼ 4:0 101 s (see Table 1) in the entire temperature
sequence, thereby improving the information content and enhan- region and local CVD growth may occur on the leading edge of the
cing the reliability of the parameter estimates. However, the main substrate in the cross-flow reactor, causing the sharp change in
objective of the derived ALD process model in this article series growth rate over the substrate, and thus degrading the overall
was to accurately predict the response of the substrate spatially uniformity. Consequently, this phenomena could explain the
dependent film thickness profile to the variations of all the discrepancy between the model predicted response and the
measured equipment-scale process operating parameters. For this experimental measurement data at T ¼ 1:0 102 1C.
reason, the ex situ instrumentation used for film characterization A more comprehensive presentation of the reliability and the
in Holmqvist et al. (in press) are superior to the aforementioned adequacy of the model response can be achieved by examining
in situ diagnostics, since the latter measurement response pro- the distribution of the residual errors for the calibrated model.
vides no information regarding the nature of the spatial depen- This can be graphically visualized by plotting the relative error dyE
dence of the deposition rate. Consequently, to further enhance the and 8EA N E for all calibration sets against the cumulative distribu-
reliability of the parameter estimates, b^ , while still maintaining tion, determined using the empirical cumulative distribution
TM
the precision of the spatial model response, the utilization of both function ecdf in the Statistics Toolbox for MATLABs (The
in situ and ex situ diagnostic methods may become necessary. MathWorks Inc, 2010c). On the basis of the cumulative distribu-
tion of residual errors in Fig. 4, it is evident that 90% of the
residual errors is below 7.3% and the only errors above this arise
5.1.2. Assessment of the accuracy and reliability of the predicted from experimental indices E A f6; 7g. However, the relative errors
model response are below 10% for all experimental indices, confirming rather high
In order to verify the precision of the model response, the predictability even for the worst cases studied.
statistical uncertainties and their effects on the model response The fitted normal cumulative distribution function, using
TM
were addressed by considering the model 100ð1aÞ% approximate normcdf in the Statistics Toolbox for MATLABs (The
confidence band (Eq. (7)). The model generated spatially dependent MathWorks Inc, 2010c), depicted in Fig. 4, demonstrates reason-
film thickness profile, hs ðzÞ, for the least-squares estimates (see able agreement with the cumulative frequency of the relative
Table 2) and the associated 95% approximate confidence band are model error, implying that the residual errors follow a normal
depicted in Fig. 3 along with the experimentally observed film distribution with an expected value and a variance (Hines et al.,
thickness, y9 ^ f^ , sampled at three spatially equidistant positions, 2003), in accordance with the chi-square goodness-of-fit test as
f^ ¼ ½16 , 36 , 56 9Gsub 9 (m), on the substrate, Gsub . defined in Schwaab et al. (2006), Pinto et al. (2011), and Alberton
Essentially, to statistically assess the reliability of the spatially et al. (2011). Thus, the underlying statistical assumptions on
dependent film thickness profile hs ðzÞ, it is necessary that the which the use of the least squares was based are not violated.
confidence bandwidth is moderately narrow and that it replicates
the spatial dependency of the model response. According to Fig. 3
it is possible to statistically assure that the model output predicts 5.1.3. Experimental model validation
a non-uniform film thickness profile for E ¼ 17, in contrast to the The ultimate test of the adequacy of the model is to compare it
case of E ¼ 10. Hence, the accuracy and predictability of the model to the validation set, and if the experimentally observed and
can thus be determined by analyzing the bandwidth and shape of model predicted response show good agreement, the model can
the approximate inference band. In addition, the effect of the be considered valid. The region of validity can subsequently be
322 A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329
Fig. 3. Spatially dependent film thickness profile hs ðzÞ as a function of the substrate boundary Gsub local coordinate variable z A ½0,9Gsub 9 (m). The operating conditions
associated with the E th index are specified in Table 1. Model response hs ðzÞ (Å cycle 1) for: (a) calibration data sets performed at T ¼ 1:0 102 1C; (b) calibration data sets
performed at T ¼ 1:5 102 1C; (c) calibration data sets performed at T ¼ 2:0 102 1C; (d) validation data sets. (þ ) Experimental response hs ðf^ Þ (Å cycle 1) at f^ ¼ ½16 , 36 , 56
9Gsub 9 (m); (–) spatial film thickness profile; (– –) 95% approximate confidence band (Eq. (7)); (––) uncertainty band for the expected response determined by uniformity
distribution with the parameter bounds specified according to the marginal confidence intervals given in Table 2.
defined as the union between of the calibration region and the 5.2. Mechanistic analysis of the ALD process model
region covered by the validation experiments (Brereton, 2003).
Fig. 3d visualizes the model response for the experimental This section demonstrates the universal applicability of the
validation data set with EA f2; 11,23g (see Table 1). The uncertain- mechanistic model of the continuous cross-flow ALD reactor
ties enclosed bands were constructed from the extreme model (Suntola, 1992), derived in the first article of this series
response generated from Latin hypercube sampling (LHS) (McKay (Holmqvist et al., in press), with statistical reliable least-squares
TM
et al., 1979), using lhsdesign in the Statistics Toolbox for estimates (see Eq. (1) and Table 2) for the kinetic parameters
s
MATLAB (The MathWorks Inc, 2010c), with the parameter involved in the elementary ALD gas–surface reactions. Based on
boundaries specified in accordance with the marginal confidence the experimentally validated mathematical model, with adequate
intervals (see Eq. (5) and Table 2). The graphical presentation of predictability of the spatial resolution of the film thickness profile
the model response in Fig. 3d demonstrates that the performance (see Section 5.1), an extensive theoretical investigation was
of the model and the resulting predictability are satisfactory, with performed with the focus on mechanistic understanding of ALD
low relative residual errors, dy, and conformal uniformity factors process dynamics and the influence of equipment-scale process
for the model generated, UF y , and the experimentally observed, operating parameters on ALD film growth. The mechanistic
UF y^ , response, which confirms that the model is valid within the model-based analysis complements available experimental
calibration region. results deduced from the literature, see e.g. Aarik et al. (2006),
A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329 323
2 1
100
1.8 0.9
1.6 0.8
80
1.4 0.7
1.2 0.6
60
1 0.5
0.8 0.4
40
0.6 0.3
0.4 0.2
20 0.2 0.1
0 0
0 50 100 150 200 250 300
0
0 2 4 6 8 10 12 14
Fig. 5. Dependence of the film mass increment on the process temperature during
one ALD sequence. (–) The integral mean value of the mass increment /ms S over
Fig. 4. The cumulative distribution of the relative residual errors, dyE , and 8E A N E . Gsub per ALD sequence and unit area; ð,Þ analogous to (–) but using the
(–) The cumulative frequency for the calibration data set; (– –) fitted normal generalization of Fick’s law (cf. Holmqvist et al., in press); (– –) the degree of
TM
cumulative distribution function normcdf in the Statistics Toolbox for MATLABs hydroxylation /gS (a.u.) after the H2 O exposure in the pulse sequence. Process
(The MathWorks Inc, 2010c). operating parameters: /pS9Gout ¼ 3:0 102 Pa, /pS9Gin ¼ 4:3 102 Pa, ½Q_ ZnðC2 H5 Þ2 ,
Q_ H2 O , Q_ N2 ¼ ½0:10,0:15,5:0 102 sccm (standard cubic centimeters per minute at
STP), pulse sequence, ½Dt ZnðC2 H5 Þ2 , Dt N2 , Dt H2 O , Dt N2 ¼ ½2:0,4:0,2:0,4:0 101 s.
Elam and George (2003), Jur and Parsons (2011), Kuse et al.
(2003), Lei et al. (2006), and Rahtu et al. (2001).
adsorption sites for the adsorptive H2O precursor in the subse-
quent pulse sequence. The pseudo-steady-state process corre-
5.2.1. General characteristics of the ALD film growth process sponding to one pulse sequence can be seen in the figure, where
In the context of deposition of ZnO films in continuous cross- the initial surface fraction composition is also governed at the end
flow ALD reactors, the temperature, which is the most readily of the same pulse sequence. This is a consequence of the initial
attribute to activation energies of the elementary reactions, as normally hydroxylated surface, resulting in a constant mass gain
well as the process time parameters, i.e. precursor exposure and per cycle (MGPC) (Burton et al., 2009), and consistent with the
purge times, dependence have been undertaken seriously in Elam ex situ XRR analysis in Holmqvist et al. (in press).
et al. (2002), Elam and George (2003), Törndahl et al. (2007), and However, all states governing the system’s behavior do not
Yousfi et al. (2000). According to Deminsky et al. (2004) and remain constant throughout the duration of the pulse sequence;
Matero et al. (2000), either the dehydroxylation reaction or the therefore, the system is evidently not time-invariant. The
rehydroxylation reaction (surface reaction index i A f3; 4g, response of the transient system is apparent when analyzing
Holmqvist et al., in press) determines the overall growth rate in the mean mass deposited per unit area resolved at the level of
the high-temperature region. This is evident when considering each cycle, see Fig. 7. The theoretical trajectory resembles
the temperature dependence of the degree of hydroxylation, /gS, previous experimental QCM measurements for ZnO: i.e. a mass
after the H2O sequence t A ½0, Dt ZnðC2 H5 Þ2 þ Dt N2 þ Dt H2 O , graphically increment due to irreversible adsorption of the adsorptive
presented in Fig. 5, and expressed as Zn(C2H5)2 precursor, a flat portion of the trajectory during the
Z Z purge exposure, and a decrease in mass during the adsorptive
1 yOH
/gS ¼ @G@t ð9Þ H2O precursor sequence (Elam and George, 2003; Yousfi et al.,
9Gsub 9 t Gsub yOH þ yO
2000).
At the highest temperatures, dehydroxylation is so extensive that The general formalism of the sequential elementary surface
it overrides the increase in hydroxyl groups during the water reactions i A f1; 2g (Holmqvist et al., in press) incorporating a
sequence. In contrast, the overall growth rate decreases in the variable number of reacting hydroxyl groups, n, enables the
low-temperature region, which is attributed to the activation surface chemistry to be analyzed during one pulse sequence,
energy of the elementary surface reactions i A f1; 2g. and the discrepancy between different reaction mechanisms to be
A graphic representation of the transient production and investigated on the basis of mass increment during the respective
consumption of fractional surface species, yk and k A fOH, half-reactions. The theoretical mass increment trajectories shown
ZnðC2 H5 Þ2n ,Og, during one complete ALD pulse sequence in Fig. 7 demonstrate the characteristic dependence of n A 0, nL ½,
ðDt ¼ Dt ZnðC2 H5 Þ2 þ 2Dt N2 þ Dt H2 O Þ sampled at three different tem- where nL represents the total number of ligands of the adsorptive
peratures is presented in Fig. 6. It is evident from this figure that organometallic precursor, and corresponding DM 2 DM 1 1 ratios
the fractional surface coverage of elementary oxygen, yO , is the (Elam and George, 2003). Thus, the inherent structure of the
source of the decrease in yOH at elevated temperatures. Because of model supports the utilization of the entire information content
the sequential nature of the surface reactions, the effect of the net of observed mass increment trajectories when extracting detailed
yO production is twofold: the fractional surface coverage of yOH is surface chemistry data, i.e. when determining n and the calibra-
reduced, which limits the number of adsorption sites for the tion parameter vector, b (Eq. (1)).
adsorptive ZnðC2 H5 Þ2 precursor, thereby preventing the produc- An additional method of assessing n considers temporal and
tion of yZnðC2 H5 Þ2n , which successively reduces the number of spatial integration over an arbitrary boundary G, of the reaction
324 A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329
100
1
0.8
80
0.6
0.4
60
0.2
0
40
1
20
0.8
0.6
0
0.4
15
0.2
12
0
9
6
1
3
0.8 0
0.6
0 Fig. 7. (a) Transient analysis of the integral mean mass increment /ms Sðng cm2 Þ
at Gsub during one ALD sequence. (–) /ms S with the number of reacting hydroxyl
groups n ¼ 1:37; (– –) /ms S with the number of reacting hydroxyl groups n ¼ 1:0.
0 0.2 0.6 0.8 1.2 (b) Transient analysis of the integral mean gas-phase composition, /pa S (Pa), of
the adsorptive precursor at Gin . (–) /pZnðC2 H5 Þ2 S; ð,Þ analogous to (–) but using the
generalization of Fick’s law (cf. Holmqvist et al., in press); (– –) /pH2 O S. The
Fig. 6. Integral mean value of the fractional surface coverage /yk S (a.u.) at Gsub dotted lines perpendicular to the t-axis represent the individual adsorptive
precursors and purge exposures of one pulse sequence. The process operating
during one ALD sequence at: (a) T ¼ 1:5 102 1C; (b) T ¼ 2:0 102 1C;
parameters are analogous to those defined in Fig. 5 and T ¼ 1:5 102 1C.
(c) T ¼ 2:5 102 1C. (-) /yOH S; ð,Þ analogous to (-) but using the generalization
of Fick’s law (cf. Holmqvist et al., in press); (- -) /yZnðC2 H5 Þ2n S; ð Þ /yO S. The
dotted lines perpendicular to the t-axis represent the individual adsorptive
precursors and purge exposures of one pulse sequence. The process operating Together, Figs. 7 and 8 reveal rigorous process dynamics of the
parameters are analogous to those defined in Fig. 5. ZnO ALD process that are essential process analysis, design and
optimization.
byproduct released during the surface reaction i¼1 (Holmqvist The comparison of the model response in Figs. 5–8, using the
et al., in press) and the entire pulse sequence. Consequently, this binary and multicomponent formulations (cf. Holmqvist et al., in
quantity is governed by press), respectively, for the mass flux show only minor deviations.
This is due to the low molar composition of C2 H6 relative the
Y Z Z ð1ÞW þ 1
remaining species, and hence, the rigorous, multicomponent
n ¼ nL pC2 H6 @G@t ð10Þ
W¼1 tW G formulation may be omitted, to a very good approximation, and
one-way solute–solvent interactions suffice. Therefore, the dis-
where W ¼ f1; 2g and t 1 A ½0, Dt ZnðC2 H5 Þ2 þ Dt N2 for the nominator cussion regarding the sensitivity of the process operating para-
respective t 2 A ½0, Dt ZnðC2 H5 Þ2 þ 2Dt N2 þ Dt H2 O denominator tem- meters in Section 5.2.2 will be addressed solely on the basis of the
poral integrals. The trajectories of the integral mean value of the binary formulation for the mass flux.
gas-phase composition at the outlet boundary, Gout , during one
pulse sequence are presented graphically in Fig. 8. It is clear that
the /pC2 H6 S9Gout trajectory is explicitly governed by xa,i /r i S9G 5.2.2. Sensitivity of process operating parameters on ALD film
sub
and Eq. (10) provides the specified nominal value of n. growth
The aforementioned method, which considers spatial integra- In their experimental investigation of deposition efficiency in a
tion, provides quantitative, chemically specific information and continuous flow ALD reactor, Aarik et al. (2006) and Jur and
can be used as a supplementary theoretical analysis quantity in Parsons (2011) observed the influence of carrier gas flow para-
in situ QMS diagnostics (Lei et al., 2006; Rahtu et al., 2001). It is meters on ALD growth rate. To verify whether the predicted model
noteworthy that the spatial boundary integration or point evalua- response resemble the experimental observations, a comprehen-
tion can be utilized anywhere downstream of the substrate to sive univariate sensitivity analysis of the measured process oper-
adequately reproduce the output of QMS sampling systems. ating parameters u ¼ ½/pS9Gout ,T, Q_ a , Dt a y , a A fN2 ,ZnðC2 H5 Þ2 ,H2 Og,
A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329 325
1 1
0.8 0.8
0.6 0.6
0.4 0.4
0.2 0.2
0 0
50 50
180 180
310 310
440 26 15 440 90 50
570 48 37 570 170 130
700 70 59 700 250 210
1 1
0.8 0.8
0.6 0.6
0.4 0.4
0.2 0.2
0 0
15 1.5
26 1.2
37 0.9
48 90 50 0.6 16 20
59 170 130 0.3 8 12
70 250 210 0 0 4
Fig. 9. Normalized integral mean mass increment /ms S (a.u.) as a function of (a) integral mean value of the velocity field /vS9O ðm s1 Þ on O and pressure at the outlet
/pS9Gout (Pa); (b) process temperature T (1C) and outlet pressure /pS9Gout (Pa); (c) process temperature T (1C) and integral mean value of the velocity field /vS9O ðm s1 Þ on
O; (d) inlet mass flow Q_ ZnðC2 H5 Þ2 (sccm) and pulse duration DtZnðC2 H5 Þ2 (s). The values of the parameters not varied in each case were assigned according to the reference
conditions: temperature T ¼ 1:5 102 1C, pressure at the outlet /pS9Gout ¼ 3:0 102 Pa, integral mean value of the velocity field /vS9O ¼ 3:0 101 m s1 on O, inlet
adsorptive precursor mass flow ½Q_ ZnðC2 H5 Þ2 , Q_ H2 O ¼ ½5:0,5:0 sccm, pulse sequence ½Dt ZnðC2 H5 Þ2 , Dt N2 , Dt H2 O , Dt N2 ¼ ½2:0,4:0,2:0,4:0 101 s).
uniformity factor, UF, is not strictly increasing with the precursor analyses, design or optimization. For this reason, a systematic
exposure dose. methodology to support the development and statistical valida-
Furthermore, the interdependence of /pS9Gout and /vS9O tion of ALD process models was proposed. Within this framework,
depicted in Fig. 10a reveals that UF approaches unity at the lower the statistical uncertainty of least-squares estimates of kinetic
parameter boundaries. By analysing the spatially dependent film parameters involved in the ALD gas–surface reaction mechanism
thickness profiles depicted in Fig. 3, it is evident that thickness governing ZnO film growth, and its ultimate impact on the model
uniformity enhancement imposes higher reaction driving forces, response have been assessed.
r i pðpca Þ9G and 8i a 3, as z-9Gsub 9 (m). As aforementioned, the The comprehensive model assessment reported here showed
sub
decrease in /pS9Gout and /vS9O promoted enhanced mass flux, ja , that the expected high parameter correlation, originating from
to the substrate surface and mass fraction, oa , of the a th the complex interdependence between elementary surface reac-
precursor, respectively, and thus, explains the parametric depen- tions involved in ALD and the intrinsic mathematical structure of
dence on UF. In addition, the UF temperature dependence resem- the Arrhenius equation, was successfully diminished through
bles that of /ms S (cf. Figs. 9 and 10), however the impact is not reparameterization of the Arrhenius equation, and hence, leading
that pronounced in the lower temperature region, in which the to the improvement in precision of the parameter estimates. It is
overall growth rate is attributed to the activation energy of r i and also shown that the model predictions of the spatially dependent
i A f1; 2g (cf. Section 5.2.1). film thickness profile are in good agreement with both calibration
and validation experimental data, respectively, under a wide
range of operating conditions.
6. Concluding remarks The novel model-based methodology presented in this paper
constitutes a general platform for mechanistic investigations of the
This paper demonstrates the universal applicability of the detailed process dynamics of a continuous cross-flow ALD reactor.
mechanistic model of the continuous cross-flow reactor system The extensive theoretical analysis exhibits that the experimentally
F-120 by ASM Microchemistry Ltd. Suntola (1992) derived in the validated model, successfully reproduces the detailed process
first article of this series (Holmqvist et al., in press). According to dynamics revealed by modern in situ monitoring technologies, as
the ITRS initiative, models of ALD processes must have a high advocated by the ITRS initiative, and thereby provides a supplemen-
level of accuracy if they are to be used to assist in process tary analysis tool. Furthermore, the univariate sensitivity analysis
A. Holmqvist et al. / Chemical Engineering Science 94 (2013) 316–329 327
a b
1 1
0.96 0.96
0.92 0.92
0.88 0.88
0.84 0.84
0.8 0.8
50 50
180 180
310 310 250
440 59 70 440 210
570 48 570 130 170
26 37 90
700 15 700 50
c d
1 1
0.96 0.96
0.92 0.92
0.88 0.88
0.84 0.84
0.8 0.8
15 1.5
26 1.2
37 0.9
48 210 250 0.6 4 0
59 130 170 0.3 12 8
70 50 90 0 20 16
Fig. 10. Across substrate film thickness uniformity, UF, as a function of (a) integral mean value of the velocity field /vS9O ðm s1 Þ on O and pressure at the outlet /pS9Gout
(Pa); (b) process temperature T (1C) and outlet pressure /pS9Gout (Pa); (c) process temperature T (1C) and integral mean value of the velocity field /vS9O ðm s1 Þ on O;
(d) inlet mass flow Q_ ZnðC2 H5 Þ2 (sccm) and pulse duration Dt ZnðC2 H5 Þ2 (s). The values of the parameters not varied in each case were assigned according to the reference
condition in Fig. 9.
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