Lecture 9 - Modeling, Simulation, and Systems Engineering
Lecture 9 - Modeling, Simulation, and Systems Engineering
Systems Engineering
• Development steps
• Model-based control engineering
• Modeling and simulation
• Systems platform: hardware, systems software.
algorithm:
Analysis
x(t+1) = x(t) + u(t) u = -k(x-xd)
Systems platform:
System and software
Deployed
Deployment Physical plant
controller
• Control analysis
Physical
perspective system
Control
computing
v
Sampled and continuous time
• Sampled and continuous time together
• Continuous time physical system + digital controller
– ZOH = Zero Order Hold
F c
u g m M
β b
off x 70 on
x 72 x& = − Kx x& = K (h − x) x
x ≥ 70 x ≤ 75
x 75
– structural deformations
• For ‘controls’ simulation, model y
heat flux
T ∂ T
k 2
– Example: fit step response ∂t ∂x
T (0) u; T (1) 0
∂T
y
∂x x1
Simulation
• ODE solution
– dynamical model: x& f (x,t)
– Euler integration method: x(t d ) x(t) d ⋅ f x(t), t
– Runge-Kutta method: ode45 in Matlab
• Can do simple problems by integrating ODEs
• Issues with modeling of engineered systems:
– stiff systems, algebraic loops
– mixture of continuous and sampled time
– state machines and hybrid logic (conditions)
– systems build of many subsystems
– large projects, many people contribute different subsystems
• Ptolemeus -
UC Berkeley
• Block libraries
• Subsystem blocks
developed independently
• Engineered for developing
large simulation models
• Controller can be designed
in the same environment
• Supports generation of
run-time control code
Model development and validation
• Model development is a skill
• White box models: first principles
• Black box models: data driven
• Gray box models: with some unknown parameters
• Identification of model parameters – necessary step
– Assume known model structure
– Collect plant data: special experiment or normal operation
– Tweak model parameters to achieve a good fit
• Industrial
processes
• Process maps in
semiconductor
manufacturing
• Epitaxial growth
(semiconductor
process)
– process map for
run-to-run control
j j
1 − −x y
f (x) = e y=f(x)
1 + e− x x
EE392m - Spring 2005 Control Engineering 9-26
Gorinevsky
Multi-Layered Perceptrons
• Network parameter computation
– training data set Y = y(1) K y( N )
– parameter identification
x (1) K x( N )
y(x) F (x;θ )
• Noninear LS problem
V = ∂ y( j ) − F (x( j ) ;θ ) 2 → min
j
∑ y j j (x)
j
∂ j (x)
y(x) 1
∂ j (x) j
j
Relational
Database
Heat
demand
Forecastedecasted
Time
variableariable
Query point Outdoor of day
( What if ? ) temperature
Explanatory
variables
• Workstations
– advanced process control
– enterprise optimizers
– computing servers
(QoS/admission control)
• Specialized controllers:
– PLC, DCS, motion controllers,
hybrid controllers
• FPGA
• ASIC / SoC
EM =
Electr-opt
Modulator
AGC = Auto Gain Control