1.8V, 11 Output Clock Multiplier, Distributor, Jitter Cleaner, and Buffer
1.8V, 11 Output Clock Multiplier, Distributor, Jitter Cleaner, and Buffer
1.8V, 11 Output Clock Multiplier, Distributor, Jitter Cleaner, and Buffer
www.ti.com
SLLS780A – FEBRUARY 2007 – REVISED MARCH 2008
1 Bypass
CML Output
PLL 5 Differential
DIVIDER CML Outputs
15MHz-1.25GHz
Differential
LVDS Input
30MHz-319MHz VCO
5 Differential
DIVIDER CML Outputs
15MHz-1.25GHz
SDA/SCL
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2 All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas Copyright © 2007–2008, Texas Instruments Incorporated
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
CDCL6010
www.ti.com
SLLS780A – FEBRUARY 2007 – REVISED MARCH 2008
DESCRIPTION
The CDCL6010 is a high-performance, low phase noise clock multiplier, distributor, jitter cleaner, and low skew
buffer. It effectively cleans a noisy system clock with a fully-integrated low noise Voltage Controlled Oscillator
(VCO) that operates in the 1.2GHz–1.275GHz range. (Note that the LC oscillator oscillates in the
2.4GHz–2.55GHz range. The frequency is predivided by 2 before the post-dividers P0 and P1.)
The output frequency (FOUT) is synchronized to the frequency of the input clock (FIN). The programmable
pre-dividers, M and N, and the post-dividers, P0 and P1, give a high flexibility to the ratio of the output frequency
to the input frequency:
FOUT = FIN × N/(M × P)
Where:
P (P0, P1) = 1, 2, 4, 5, 8, 10, 16, 20, 32, 40, 80
M = 1, 2, 4, 8
N = 32, 40
provided that:
30MHz < (FIN /M) < 40MHz
1200MHz < (FOUT × P) < 1275MHz
The PLL loop bandwidth is user-selectable by external filter components or by using the internal loop filter. The
PLL loop bandwidth and damping factor can be adjusted to meet different system requirements.
The CDCL6010 supports one differential LVDS clock input and a total of 11 differential CML outputs. One output
is a straight bypass with no support for jitter cleaning or clock multiplication. The remaining 10 outputs are
available in two groups of five outputs each with independent frequency division ratios. Those 10 outputs can be
optionally setup to bypass the PLL when no jitter cleaning is needed. The CML outputs are compatible with
LVDS receivers if ac-coupled.
With careful observation of the input voltage swing and common-mode voltage limits, the CDCL6010 can support
a single-ended clock input as outlined in the Pin Description Table.
The CDCL6010 can operate as a multi-output clock buffer in a PLL bypass mode.
All device settings are programmable through the SDA/SCL, serial two-wire interface.
The phase of one output group relative to the other can be adjusted through the SDA/SCL interface. For
post-divide ratios (P0, P1) that are multiples of 5, the total number of phase adjustment steps (n) equals the
divide-ratio divided by 5. For post-divide ratios (P0, P1) that are not multiples of 5, the total number of steps (n) is
the same as the post-divide ratio. The phase adjustment step (ΔΦ) in time units is given as:
ΔΦ = 1/(n × FOUT)
where FOUT is the respective output frequency.
The device operates in a 1.8V supply environment and is characterized for operation from –40°C to +85°C.
The CDCL6010 is available in a 48-pin QFN (RGZ) package.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
(1) For the most current specifications and package information, see the Package Option Addendum located at the end of this data sheet or
refer to our web site at www.ti.com.
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
condition is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
(1) No heatsink; power uniformly distributed; 36 ground vias (6 x 6 array) tied to the thermal exposed pad; 4-layer high-K board.
DC ELECTRICAL CHARACTERISTICS
Over recommended operating conditions (unless otherwise noted).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IVDD Total current from digital 1.8V supply All outputs enabled; VDD = VDD,typ 270 mA
30.72MHz input; 61.44MHz output
IAVDD Total current from analog 1.8V supply All outputs enabled; AVDD = VDD,typ 85 mA
30.72MHz input; 61.44MHz output
VIL,CMOS Low level CMOS input voltage VDD = 1.8V –0.2 0.6 V
VIH,CMOS High level CMOS input voltage VDD = 1.8V VDD – 0.6 VDD V
IIL,CMOS Low level CMOS input current VDD = VDD,max, VIL = 0.0V –120 µA
IIH,CMOS High level CMOS input current VDD = VDD,max, VIH = 1.9V 65 µA
VOL,SDA Low level CMOS output voltage for the
Sink current = 3mA 0 0.2VDD V
SDA pin
IOL,CMOS Low level CMOS output current 8 mA
AC ELECTRICAL CHARACTERISTICS
Over recommended operating conditions (unless otherwise noted).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Differential input impedance for the LVDS input
ZD,IN 90 132 Ω
terminals
VCM,IN Common-mode voltage, LVDS input 1125 1200 1375 mV
VS,IN Single-ended LVDS input voltage swing 100 600 mVPP
VD,IN Differential LVDS input voltage swing 200 1200 mVPP
tR,OUT,
Output signal rise/fall time 20%–80% 100 ps
tF,OUT
VCM,OUT Common-mode voltage, CML outputs VDD –0.31 VDD –0.23 VDD –0.19 V
VS,OUT Single-ended CML output voltage swing ac-coupled 180 230 280 mVPP
VD,OUT Differential CML output voltage swing ac-coupled 360 460 560 mVPP
FIN Clock input frequency 30 319 MHz
FOUT Clock output frequency 15 1250 MHz
LOUT Residual clock output phase noise FIN = 30.72MHz , FOUT = 61.44MHz
400kHz PLL bandwidth
at 10Hz offset –103 dBc/Hz
at 100Hz offset –114 dBc/Hz
at 1kHz offset –123 dBc/Hz
at 10kHz offset –121 dBc/Hz
at 100kHz offset –119 dBc/Hz
at 1MHz offset –138 dBc/Hz
at 10MHz offset –152 dBc/Hz
at 20MHz offset –152 dBc/Hz
(1) Output duty cycle of the bypass output and for post-divide ratio = 1 is just as good as the input duty cycle.
DEVICE INFORMATION
48-PIN QFN (RGZ)
(TOP VIEW)
ADD1
YN10
YP10
AVDD
AVDD
VCN
YN9
YN8
YP9
YP8
VDD
VDD
42
39
38
48
47
46
45
44
43
41
40
37
VCP 1 36 ADD0
AVDD 2 35 VDD
CLKP 3 34 YN7
CLKN 4 33 YP7
AVDD 5 32 VDD
YP0 6 31 YN6
CDCL6010
YN0 7 30 YP6
VDD 8 29 VDD
YP1 9 28 YN5
YN1 10 27 YP5
VDD 11 26 VDD
VSS 12 25 SDA
20
21
22
23
24
13
14
15
16
17
18
19
STATUS
YP2
YN2
YP3
YN3
VDD
VDD
VDD
YP4
YN4
VDD
SCL
The CDCL6010 is available in a 48-pin QFN (RGZ) package with a pin pitch of 0,5mm. The exposed thermal pad
serves both thermal and electrical grounding purposes.
NOTE:
The device must be soldered to ground (VSS) using as many ground vias as possible.
The device performance will be severely impacted if the exposed thermal pad is not
grounded appropriately.
TERMINAL FUNCTIONS
TERMINAL
NAME PIN NO. TYPE DESCRIPTION
8, 11, 14,17,
20, 23, 26,
VDD Power 1.8V digital power supply.
29, 32, 35,
38, 41
AVDD 2, 5, 44, 47 Power 1.8V analog power supply.
Exposed
VSS thermal pad Power Ground reference.
and pin 12
VCP, VCN 1, 48 I External loop filter terminals.
Differential LVDS input. Single-ended 1.8V input can be dc-coupled to pin 3 with pin 4 either
CLKP, CLKN 3, 4 I
tied to pin 3 (recommended) or left open.
YP0, YN0 6, 7
YP1, YN1 9, 10
YP2, YN2 15, 16
YP3, YN3 18, 19
YP4, YN4 21, 22 10 differential CML outputs with support for jitter cleaning and clock multiplication. Support
O
YP5, YN5 27, 28 optional PLL bypass mode when jitter cleaning is not needed.
YP6, YN6 30, 31
YP7, YN7 33, 34
YP8, YN8 40, 39
YP9, YN9 43, 42
YP10, YN10 46, 45 O Differential CML output. Straight bypass with no jitter cleaning and no clock multiplication.
SCL 24 I SDA/SCL serial clock pin. Open drain. Always connect to a pull-up resistor.
SDA 25 I/O SDA/SCL bidirectional serial data pin. Open drain. Always connect to a pull-up resistor.
STATUS 13 O LVCMOS status signaling. High status indicates PLL lock.
Configurable least significant bits (ADD[1:0]) of the SDA/SCL device address. The fixed most
ADD1, ADD0 37, 36 I
significant bits (ADD[6:2]) of the 7-bit device address are 11010.
C1 R
CLKP
LVDS Divider M PFD
CLKN CP Divider
VCO MUX YP[9:5]
P1
¸2 CML
CML
Divider N
YN[9:5]
I
Internal
LPF
LPF
Divider
MUX P0
YP[4:0]
CML
CML
PLL Setting YN[4:0]
PLL_LOCK
STATUS
VSS
TYPICAL CHARACTERISTICS
Typical operating conditions are at VDD = 1.8V and TA = +25°C, VD,IN = 200mVPP (unless otherwise noted).
200
200
150
100
100
50
0 0
-50
-100
-100
-150
-200
-200
-300 -250
0 10 20 30 40 50 0 0.5 1 1.5 2
t - Time - ns
t - Time - ns
Figure 1. Figure 2.
-90
-100
Phase Noise - dBc/Hz
-110
-120
-130
-140
-150
-160
10 100 1k 10 k 100 k 1M 10 M 100 M
Offset Frequency - Hz
Figure 3.
SDA/SCL INTERFACE
This section describes the SDA/SCL interface of the The device address is made up of the fixed internal
CDCL6010 device. The CDCL6010 operates as a address, 11010 (A6:A2), and configurable external
slave device of the industry standard 2-pin SDA/SCL pins ADD1 (A1) and ADD0 (A0). Four different
bus. It operates in the fast-mode at a bit-rate of up to devices with addresses 1101000, 1101001, 1101010
400kbit/s and supports 7-bit addressing compatible and 1101011, can be addressed via the same
with the popular two-pin serial interface standard. SDA/SCL bus interface. The least significant bit of the
address byte designates a write or read operation.
SDA/SCL Bus Slave Device Address R/W Bit:
A6 A5 A4 A3 A2 A1 A0 R/W 0 = Write to CDCL6010 device
1 1 0 1 0 ADD1 ADD0 0/1 1 = Read from CDCL6010 device
VIH(SM)
SCL
VIL(SM)
tSU(START)
tSU(SDATA) th(SDATA) tSU(STOP)
t(BUS) th(START)
tr(SM) tf(SM)
VIH(SM)
SDA
VIL(SM)
S Start condition
P Stop condition
Wr Command
S Slave Address A A S Slave Address Rd A Data Byte N P
Code
S Slave Address Wr A Command Code A Data Byte Low A Data Byte High A P
Byte 0:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 PLL-LOCK 1 if PLL has achieved lock, otherwise 0 R 0
6 MANF[6] Manufacturer reserved R
5 MANF[5] Manufacturer reserved R
4 MANF[4] Manufacturer reserved R
3 MANF[3] Manufacturer reserved R
2 MANF[2] Manufacturer reserved R
1 MANF[1] Manufacturer reserved R
0 MANF[0] Manufacturer reserved R
Byte 1:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 RES Reserved R/W 0
6 RES Reserved R/W 0
5 ENPH Phase select enable R/W 1
4 PH1[4] Phase select for YP[9:5] and YN[9:5] R/W 0 Table 4, Table 5
3 PH1[3] Phase select for YP[9:5] and YN[9:5] R/W 0 Table 4, Table 5
2 PH1[2] Phase select for YP[9:5] and YN[9:5] R/W 0 Table 4, Table 5
1 PH1[1] Phase select for YP[9:5] and YN[9:5] R/W 0 Table 4, Table 5
0 PH1[0] Phase select for YP[9:5] and YN[9:5] R/W 0 Table 4, Table 5
Byte 2:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 RES Reserved R/W 0
6 RES Reserved R/W 0
5 ENP1 Post-divider P1 enable; if 0 output YP[9:5] and YN[9:5] are disabled R/W 1
4 ENBP1 Bypass PLL for post-divider P1: If 1 input is CLKP/CLKN, if 0 input is PLL R/W 0
clock
3 SELP1[3] Divide ratio select for post-divider P1 R/W 0 Table 1
2 SELP1[2] Divide ratio select for post-divider P1 R/W 1 Table 1
1 SELP1[1] Divide ratio select for post-divider P1 R/W 1 Table 1
0 SELP1[0] Divide ratio select for post-divider P1 R/W 1 Table 1
Byte 3:
Bit Power Up
Bit Name Description/Function Type Condition Reference To
7 RES Reserved R/W 0
6 RES Reserved R/W 0
5 PLLLOC PLL Lock Overwrite: If 1 output not gated by PLL Lock status. R/W 0
K OW
4 PH0[4] Phase select for YP[4:0] and YN[4:0] R/W 0 Table 4, Table 5
3 PH0[3] Phase select for YP[4:0] and YN[4:0] R/W 0 Table 4, Table 5
2 PH0[2] Phase select for YP[4:0] and YN[4:0] R/W 0 Table 4, Table 5
1 PH0[1] Phase select for YP[4:0] and YN[4:0] R/W 0 Table 4, Table 5
0 PH0[0] Phase select for YP[4:0] and YN[4:0] R/W 0 Table 4, Table 5
Byte 4:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 RES Reserved R/W 0
6 RES Reserved R/W 0
5 ENP0 Post-divider P0 enable. If 0, output YP[4:0] and YN[4:0] are disabled R/W 1
4 ENBP0 Bypass PLL for post-divider P0. If 1, input is CLKP/CLKN; if 0 input is PLL R/W 0
clock
3 SELP0[3] Divide ratio select for post-divider P0 R/W 0 Table 1
2 SELP0[2] Divide ratio select for post-divider P0 R/W 1 Table 1
1 SELP0[1] Divide ratio select for post-divider P0 R/W 1 Table 1
0 SELP0[0] Divide ratio select for post-divider P0 R/W 1 Table 1
Byte 5:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 EN Chip enable; if 0 chip is in Iddq mode R/W 1
6 ENDRV10 YP10, YN10 enable; if 0 output is disabled R/W 1
5 ENDRV9 YP[9], YN[9] enable; if 0 output is disabled R/W 1
4 ENDRV8 YP[8], YN[8] enable; if 0 output is disabled R/W 1
3 ENDRV7 YP[7], YN[7] enable; if 0 output is disabled R/W 1
2 ENDRV6 YP[6], YN[6] enable; if 0 output is disabled R/W 1
1 ENDRV5 YP[5], YN[5] enable; if 0 output is disabled R/W 1
0 ENDRV4 YP[4], YN[4] enable; if 0 output is disabled R/W 1
Byte 6:
Power Up
Bit Bit Name Description/Function Type Condition Reference To
7 ENDRV3 YP[3], YN[3] enable; if 0 output is disabled R/W 1
6 ENDRV2 YP[2], YN[2] enable; if 0 output is disabled R/W 1
5 ENDRV1 YP[1], YN[1] enable; if 0 output is disabled R/W 1
4 ENDRV0 YP[0], YN[0] enable; if 0 output is disabled R/W 1
3 SELBW[3] PLL BW select; if 1 external loop filter is expected R/W 0 Table 6
2 SELBW[2] PLL BW select; if 1 external loop filter is expected R/W 0 Table 6
1 SELBW[1] PLL BW select; if 1 external loop filter is expected R/W 0 Table 6
0 SELBW[0] PLL BW select; if 1 external loop filter is expected R/W 0 Table 6
Byte 7:
Bit Power Up
Bit Name Description/Function Type Condition Reference To
7 ENPLL PLL enable; if 0 PLL is switched off R/W 1
6 RES Reserved R/W 0
5 SELM[1] Divide ratio select for input clock CLKP and CLKN R/W 0 Table 3
4 SELM[0] Divide ratio select for input clock CLKP and CLKN R/W 0 Table 3
3 SELN[3] Divide ratio select for pre-divider N (PLL clock) R/W 1 Table 2
2 SELN[2] Divide ratio select for pre-divider N (PLL clock) R/W 0 Table 2
1 SELN[1] Divide ratio select for pre-divider N (PLL clock) R/W 0 Table 2
0 SELN[0] Divide ratio select for pre-divider N (PLL clock) R/W 1 Table 2
(1) Refer to Functional Block Diagram for the external low pass filter architecture.
Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
• Added second specification condition for clock output skew parameter. .............................................................................. 5
www.ti.com 8-Dec-2009
PACKAGING INFORMATION
Orderable Device Status (1) Package Package Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Type Drawing Qty
CDCL6010RGZR ACTIVE VQFN RGZ 48 2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR
no Sb/Br)
CDCL6010RGZRG4 ACTIVE VQFN RGZ 48 2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR
no Sb/Br)
CDCL6010RGZT ACTIVE VQFN RGZ 48 250 Green (RoHS & CU NIPDAU Level-3-260C-168 HR
no Sb/Br)
CDCL6010RGZTG4 ACTIVE VQFN RGZ 48 250 Green (RoHS & CU NIPDAU Level-3-260C-168 HR
no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
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to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 8-Dec-2009
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 8-Dec-2009
Pack Materials-Page 2
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