8-Bit UART With BIST and Hamming Code Feature Using Verilog Module
8-Bit UART With BIST and Hamming Code Feature Using Verilog Module
BACHELOR OF TECHNOLOGY
in
ELECTRONICS AND COMMUNICATION ENGINEERING
by
ABHISHEK PRATAP SINGH (1513231011)
JITENDER KUMAR (1513231078)
AKASH AGARWAL (1513231018)
With increase in designing and complexity, testing has become a major problem as external
test bench has to created or used for this purpose and various VLSI testing problems like Test
generation problems, input combinatorial problems, gate to I/O pin ratio problems are
encountered. In order to cope up with these problems we insert a special test circuitry on the
VLSI circuit that allows efficient test coverage to answer these problems. It is addressed by the
need of design for testability (DFT) using BIST circuit. BIST is an on-chip test logic that is
utilized to test the functional logic of a chip, by itself. With the rapid increase in the design
complexity, BIST has become a major design consideration in DFT methods and is becoming
increasingly important. A properly designed BIST is able to offset the cost of added test
hardware while at the same time ensuring the reliability, testability and reduces maintenance
cost. BIST solution consists of an Automatic Test Pattern Generator (ATPG), the circuit to be
tested, a way to analyse the results, and a way to compress those results for simplicity and
handling.
BLOCK DIAGRAM
The software used in this project is “Xilinx ISE design suite.” It is software which is used for
the synthesis and analysis of the HDL codes.
Xilinx ISE (Integrated Synthesis Environment) is a software tool produced by Xilinx for
synthesis and analysis of HDL designs, enabling the developer to synthesize(‘compile”) their
design, perform timing analysis, examine RTL diagrams, simulate a design’s reaction to
different stimuli, and configure the target device with the programmer.