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    Test Object - Device Settings: Substation/Bay

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    Dinesh Pitchaivel
    This document summarizes the settings and test results of a protection relay device. The device is located at the Lakhimpur substation in bay CRP6. Nominal voltage and current values are provided along with differential protection settings and thresholds. Test results are shown for faults at various current levels on the primary winding and all results are within tolerance.

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    Test Object - Device Settings: Substation/Bay

    Uploaded by

    Dinesh Pitchaivel
    47 views5 pages
    This document summarizes the settings and test results of a protection relay device. The device is located at the Lakhimpur substation in bay CRP6. Nominal voltage and current values are provided along with differential protection settings and thresholds. Test results are shown for faults at various current levels on the primary winding and all results are within tolerance.

    Original Description:

    21

    Original Title

    CRP6 87TR1

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    This document summarizes the settings and test results of a protection relay device. The device is located at the Lakhimpur substation in bay CRP6. Nominal voltage and current values are provided along with differential protection settings and thresholds. Test results are shown for faults at various current levels on the primary winding and all results are within tolerance.

    Copyright:

    © All Rights Reserved
    Download as RTF, PDF, TXT or read online from Scribd
    Download as rtf, pdf, or txt
    47 views5 pages

    Test Object - Device Settings: Substation/Bay

    Uploaded by

    Dinesh Pitchaivel
    This document summarizes the settings and test results of a protection relay device. The device is located at the Lakhimpur substation in bay CRP6. Nominal voltage and current values are provided along with differential protection settings and thresholds. Test results are shown for faults at various current levels on the primary winding and all results are within tolerance.

    Copyright:

    © All Rights Reserved
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    CRP6:

    . .
    Test Object - Device Settings
    . . .
    Substation/Bay:
    Substation: LAKHIMPUR Substation address: CRP6
    Bay: Bay address:
    . . .
    Device:
    Name/description: 7UT613 Manufacturer: SIEMENS
    Device type: Device address:
    Serial/model number: BF1802501144
    Additional info 1:
    Additional info 2:
    . . .
    Nominal Values:
    f nom: 50.00 Hz Number of phases: 3
    V nom (secondary): 110.0 V V primary: 132.0 kV
    I nom (secondary): 1.000 A I primary: 300.0 A
    . . .
    Residual Voltage/Current Factors:
    VLN / VN: 1.732 IN / I nom: 1.000
    . . .
    Limits:
    V max: 400.0 V I max: 50.00 A
    . . .
    Debounce/Deglitch Filters:
    Debounce time: 3.000 ms Deglitch time: 0.000 s
    . . .
    Overload Detection:
    Suppression time: 50.00 ms

    Test Object - Other RIO Functions


    .
    CB Configuration
    Description Name Value
    CB trip time CB trip time 50.00 ms
    CB close time CB close time 100.00 ms
    Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

    Test Object - Differential Parameters


    Protected Object:
    Protected Object: Transformer
    Vector Group: YY0
    Winding/Leg Name: Primary Secondary
    Voltage: 132.00 kV 33.00 kV
    Power: 25.00 MVA 25.00 MVA
    Starpoint Grounding: Yes Yes
    Delta-connected CT: No No

    CT:
    Winding/Leg Name: Primary Secondary
    CT Current Prim: 300.00 A 1200.00 A
    CT Current Sec: 1.00 A 1.00 A
    CT Grounding: tow. Prot. Obj. tow. Prot. Obj.
    Gnd CT Prim Current: 200.00 A 800.00 A
    Gnd CT Sec Current: 1.00 A 1.00 A
    Gnd CT Grounding: n/a n/a
    .
    Protection device:
    Reference Winding: Primary
    Ibias Calculation: ( |Ip| + |Is| ) / K1 (K1 = 1.00)
    Zero Seq. Elimination: IL-I0
    Reference Current: PO nominal current
    Ground CT Used: No
    Disable Comb. char.: No

    Idiff>: 0.20 In tdiff>: 0.03 s


    Idiff>>: 7.50 In tdiff>>: 0.03 s

    Itol rel: 2.00 % ttol rel: 3.00 %


    Itol abs: 0.05 In ttol abs: 0.01 s

    Hardware Configuration
    .
    Test Equipment
    Type Serial Number
    CMC356 KD381T
    . .
    Hardware Check
    Performed At Result Details
    09-05-2018 13:59:56 Passed

    .
    Analog Outputs
    Test Equipment Test Object Signal
    Device Connector Display Name Connection
    Terminal
    CMC356 V A 1 V L1-E V L1-E
    KD381T
    2 V L2-E V L2-E
    3 V L3-E V L3-E
    N
    CMC356 V B 1 V(2)-1
    KD381T
    N
    CMC356 I A 1 I Prim L1 I Prim L1
    KD381T
    2 I Prim L2 I Prim L2
    3 I Prim L3 I Prim L3
    N
    CMC356 I B 1 I Sec L1 I Sec L1
    KD381T
    2 I Sec L2 I Sec L2
    3 I Sec L3 I Sec L3
    N

    .
    Binary/Analog Inputs
    Test Equipment Test Object Signal
    Device Connector Display Name Connection
    Terminal
    CMC356 1+ Trip Trip
    KD381T
    1-
    2+ Bin. in 2
    2-
    3+ Bin. in 3
    3-
    4+ Bin. in 4
    4-
    5+ Bin. in 5
    5-
    6+ Bin. in 6
    6-
    7+ Bin. in 7
    7-
    8+ Bin. in 8
    8-
    9+ Bin. in 9
    9-
    10+ Bin. in 10
    10-
    1 Bin. in 11
    2 Bin. in 12
    N

    .
    Binary Outputs
    Test Equipment Test Object Signal
    Device Connector Display Name Connection
    Terminal
    CMC356 1+ Bin. out 1 Bin. out 1
    KD381T
    1-
    2+ Bin. out 2 Bin. out 2
    2-
    3+ Bin. out 3 Bin. out 3
    3-
    4+ Bin. out 4 Bin. out 4
    4-
    11 Bin. out 5
    12 Bin. out 6
    13 Bin. out 7
    14 Bin. out 8
    N

    .
    Analog DC Inputs
    Test Equipment Test Object Signal
    Device Connector Display Name Connection
    Terminal

    .
    Time Source
    Operating mode: None

    Comment

    .
    Time Trigger Settings
    Start time: Next full 1 min
    Trigger period: 60 s
    Start test accuracy: -

    . .
    Test Module
    Name: OMICRON Diff Operating Version: 3.10
    Characteristic
    Test Start: 09-May-2018 14:14:43 Test End: 09-May-2018 14:19:38
    User Name: Manager:
    Company:

    .
    Test Settings:
    .
    General Settings:
    Testing: Primary / Secondary
    Max. Test Time: 1.50 s Delay Time: 0.25 s
    Prefault: No
    Prefault current: 0.00 In Prefault time: 0.200 s
    Vout enabled: No Vout winding: Primary
    Time-triggered: No Winding/leg output: Primary
    .
    Search Test Settings:
    Ignore Default Char.: No
    Resolution Relative: 0.10 % Resolution Absolute: 0.010 In
    . . .
    Binary Outputs
    Bin. out 1: 0
    Bin. out 2: 0
    Bin. out 3: 0
    Bin. out 4: 0

    Test Results for Fault Location L1-E at Reference Side Primary


    Ibias Idiff NominalIdiff Actual Dev (rel) Dev (abs) Check Test State Result
    1.00 In 0.250 In 0.246 In -1.56 % -0.0039 In Tested Passed
    2.00 In 0.500 In 0.504 In 0.78 % 0.0039 In Tested Passed
    3.00 In 0.750 In 0.746 In -0.54 % -0.0040 In Tested Passed
    4.00 In 1.000 In 0.996 In -0.44 % -0.0044 In Tested Passed
    5.00 In 1.250 In 1.245 In -0.37 % -0.0047 In Tested Passed
    6.00 In 1.500 In 1.485 In -0.99 % -0.0149 In Tested Passed
    7.00 In 1.750 In 1.758 In 0.46 % 0.0080 In Tested Passed
    8.00 In 2.000 In 2.003 In 0.14 % 0.0028 In Tested Passed
    9.00 In 2.250 In 2.265 In 0.67 % 0.0150 In Tested Passed
    10.00 In 2.500 In 2.514 In 0.58 % 0.0144 In Tested Passed
    11.00 In 3.000 In 3.030 In 1.00 % 0.0300 In Tested Passed
    12.00 In 3.500 In 3.521 In 0.61 % 0.0213 In Tested Passed
    13.00 In 4.000 In 3.990 In -0.24 % -0.0096 In Tested Passed
    14.00 In 4.500 In 4.440 In -1.33 % -0.0596 In Tested Passed
    15.00 In 5.000 In 5.028 In 0.56 % 0.0280 In Tested Passed
    16.00 In 5.500 In 5.513 In 0.24 % 0.0130 In Tested Passed
    17.00 In 6.000 In 6.023 In 0.39 % 0.0232 In Tested Passed
    18.00 In 6.500 In 6.476 In -0.36 % -0.0237 In Tested Passed
    Operating Characteristic Diagram
    Idiff [In]

    0
    2.5 5.0 7.5 10.0 12.5 15.0 17.5 20.0 22.5
    Ibias [In]

    .
    Test State:
    Test passed

    18 out of 18 points tested.


    18 points passed. 0
    points failed.

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