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Example Overcurrent OvercurrentNonDirectional

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138 views

Example Overcurrent OvercurrentNonDirectional

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icoviny
Copyright
© © All Rights Reserved
Available Formats
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You are on page 1/ 21

Testing Non-Directional

Overcurrent Protection
Practical Example of Use
Testing Non-Directional Overcurrent Protection

Test Universe 3.00 - Manual Version: Expl_OVC_NonDir.ENU.3 - Year 2015


© 2015 OMICRON electronics. All rights reserved.
This manual is a publication of OMICRON electronics GmbH.
All rights including translation reserved. Reproduction of any kind, e.g., photocopying, microfilming,
optical character recognition and/or storage in electronic data processing systems, requires the explicit
consent of OMICRON electronics. Reprinting, wholly or in part, is not permitted.
The product information, specifications, and technical data embodied in this manual represent the
technical status at the time of writing. Subject to change without notice.
OMICRON electronics translates this manual from the source language English into a number of other
languages. Any translation of this manual is done for local requirements, and in the event of a dispute
between the English and a non-English version, the English version of this manual shall govern.

2
Preface
This paper describes how to test non-directional overcurrent protection elements. It contains an application
example that will be used throughout the paper. The theoretical background of the non-directional
overcurrent protection will be explained. This paper also covers the definition of the necessary Test Object
settings as well as the Hardware Configuration for non-directional overcurrent tests. Finally the
Overcurrent test module is used to perform the tests that are needed for the non-directional overcurrent
protection function.

Supplements: Sample Control Center file


Example_Overcurrent_OvercurrentNonDirectional.occ (referred to in this
document).
Requirements: Test Universe 3.00 or later; Overcurrent and Control Center licenses.

1 Application Example
10.5 kV

Protection functions

1st element (51) / non-directional characteristic (IDMT)

200/1

2nd element (50/51) / non-directional characteristic (DTOC)

Overcurrent Relay

Figure 1: Feeder connection diagram of the application example

Parameter Name Parameter Value Notes


Frequency 50 Hz
CT (primary/secondary) 200 A /1 A
IEC Very Inverse Tripping characteristic

1st element 300 A Pick-up 1.5 x In CT primary


Time multiplier setting (TD; TMS; P, etc.)
1.2
(only for IDMT characteristics)
DTOC Tripping characteristic
2nd element 600 A Pick-up 3 x In CT primary

100 ms Trip time delay

Table 1: Relay parameters for this example

Page 3
2 Theoretical Introduction to Overcurrent Characteristics

2.1 Tripping Characteristics


There are two major overcurrent characteristic types: Inverse time and definite time.

Tripping Characteristics

Inverse-Definite Minimum Time


Definite Time Overcurrent Relay
Overcurrent Relay

Trip-time charateristic of a two- Trip-time characteristic of an


element DTOC relay IDMT overcurrent relay

t/s t/s

t(1st el.)

t(2nd el.) t(2nd el.)

1stelement 2ndelement I/I 1stelement 2ndelement I/IP


P
50-1/51 or 50N-1/51N 50-2 or 50N-2 51 or 51N or 67

Inverse time characteristics can have different basic shapes such as these:

Characteristic Formula Annotation


120
t T
I IP   1 P
LTI (long time inverse) Suitable for motors, for example.

0.14
SI (standard inverse) t  TP
I IP 0.02  1
13.5
t T
I IP   1 P
VI (very inverse)

80
EI (extremely inverse) t  TP Suitable for co-ordination with fuse
I IP  2
1 tripping characteristics.

Table 2: IDMT tripping characteristics (see IEC 60255-3 or BS 142, section 3.5.2)

t = trip time in seconds


TP or TMS = setting value of the time multiplier
I = fault current
IP = setting value of the pick-up current

Note: Some relays have an increased pick-up value for IDMT characteristics. For example, the relay
used in this example has an actual pick-up value that is 1.1 times higher than the IP setting.

Page 4
2.2 IDMT Characteristics (51, 51N)
As the properties of the operational equipment differ considerably (overload, short circuit behavior, etc.), the
characteristics have to be adapted to this.

1
2
3
5
4
6
6
7
7
8

Figure 2: Parameters of an overcurrent relay (AREVA)

1. Tripping characteristic for the 1st element (for this example IDMT IEC very inverse)
2. Directional function (for this example non-directional)
3. Pick-up setting (primary) of 1st element
4. Pick-up value at 1.1 x IP
5. Time multiplier setting (TMS) for the 1st element
6. Tripping characteristic for the 2nd element (DTOC for this example)
7. Pick-up setting (primary) of 2nd element
8. Trip time delay of 2nd element

1000
5
1
100

1
10

8
1 6
0,1
3
1 7
1
0,01 4
1
200 300 400 500 600 700 800 900

IEC Very Inverse (TMS = 1.2) IEC Very Inverse (TMS = 4) IEC Very Inverse (TMS = 6)

Figure 3: Comparison of IEC very inverse tripping characteristics with different time multiplier settings (TMS)

Page 5
3 Practical Introduction to Overcurrent Characteristic Testing
The Overcurrent test module is designed for testing directional and non-directional overcurrent protection
functions with DTOC or IDMT tripping characteristics (short-circuit, thermal overload, zero sequence,
negative sequence, and customized curve characteristics).

The test module can be found on the start screen of the OMICRON Test Universe. It can also be inserted
into an OCC File (Control Center document).

3.1 Defining the Test Object


Before you start your test, define the settings of the relay (the test object) to be tested. Double-click the Test
Object entry in the Control Center file to launch Test Object. Alternatively, click Test Object on the Insert
tab.

Page 6
3.1.1 Device Settings
General relay settings (e.g., relay type, relay ID, substation details, CT and VT parameters) are entered in
the RIO function Device.

Note: The parameters V max and I max limit the output of the currents and voltages to prevent
damage to the device under test. These values must be adapted to the respective
Hardware Configuration when connecting the outputs in parallel or when using an amplifier.
The user should consult the manual of the device under test to make sure that its input rating
will not be exceeded.

Page 7
3.1.2 Defining the Overcurrent Protection Parameters
More specific data concerning the overcurrent relay can be entered in the RIO function Overcurrent. The
definition of the overcurrent characteristic must also be made here.

Note: Once an Overcurrent test module is inserted this RIO function is available.

Relay Parameters

This first tab contains the definition of the directional behavior as well as the relay tolerances.

1. Since we want to test a non-directional overcurrent relay this option has to be chosen.
2. The current and time tolerances can be obtained from the relay manual.

Page 8
Elements

This tab defines the characteristic of the different overcurrent elements.

1
6

3 5

The default overcurrent characteristic is shown above. It contains an IEC Definite Time scheme with one
element for a phase overcurrent protection. This characteristic has to be adjusted to the parameters of the
relay (Table 1):

1. In order to define the elements of the phase overcurrent protection, select Phase as the
Selected element type.
Note: If other element types are also present in the relay select the related element types consecutively
in (1) to enter these elements. The selection field shows the number of already defined related elements
and how many of these are marked as active.
2. This table shows the elements that define the tripping characteristic for the selected element type. The
name of the first element may be changed according to the name used in the relay, e.g., "I>1".
3. Change the characteristic type of the first element to IEC Very Inverse (Table 1).
4. Afterwards set I pick-up and the Time index.

Page 9
5. As mentioned in chapter 2.1 , the 1st element has an increased pick-up value (by factor 1.1). This has to
be considered in the Range limits of the test object. In order to do that, select Active and enter the
increased pick-up value in I min.

6. Now the second element can be added. It has an IEC Definite Time characteristic, which might be
renamed to "I>2". Also set I Pick-up and the Trip time.

Page 10
The list of the elements appearing after these adjustments is shown below.

1. The Reset Ratio must also be checked in the manual.

The resulting overcurrent characteristic is shown below.

A 1st element
B 2nd element

A
B

1
A

1
B

Page 11
3.2 Global Hardware Configuration of the CMC Test Set
The global Hardware Configuration specifies the general input/output configuration of the CMC test set. It
is valid for all subsequent test modules and, therefore, it has to be defined according to the relay’s
connections. It can be opened by double-clicking the Hardware Configuration entry in the OCC file.

3.2.1 Example Output Configuration for Protection Relays with a Secondary Nominal Current of 1 A

IA
IB
IC
IN

Page 12
3.2.2 Example Output Configuration for Protection Relays with a Secondary Nominal Current of 5 A

IA IC
IB IN

Note: Make sure that the rating of the wires is sufficient when connecting the outputs in parallel.

The following explanations only apply to protection relays with a secondary nominal current of
1 A.

Page 13
3.2.3 Analog Outputs

The analog outputs, binary inputs and outputs can all be activated individually in the local Hardware
Configuration of the specific test module (see chapter 3.3 “Local Hardware Configuration for Non-
Directional Overcurrent Testing”).

3.2.4 Binary Inputs

1
2

1. The start command is optional (it is needed if Starting is selected as the time reference in the test
module or if a pick-up / drop-off test is required).
2. The trip command has to be connected to a binary input. BI1 … BI10 can be used.
3. For wet contacts adapt the nominal voltages of the binary inputs to the voltage of the circuit breaker trip
command or select Potential Free for dry contacts.
4. The binary outputs and analog inputs etc. will not be used for the following tests.
Start
Trip

Page 14
3.2.5 Wiring of the Test Set for Relays with a Secondary Nominal Current of 1A
Note: The following wiring diagrams are examples only. The wiring of the analog current inputs may
be different if additional protective functions such as sensitive ground fault protection are
provided. In this case IN may be wired separately.

Protection
Relay
(-) (-)

IA

IB

IC

IN

Trip
(+)
optional

Start
(+)

Protection
Relay
(-) (-)

IA

IB

IC

IN

Trip
(+)
optional

Start
(+)

Page 15
3.3 Local Hardware Configuration for Non-Directional Overcurrent Testing
The local Hardware Configuration activates the outputs/inputs of the CMC test set for the selected
test module. Therefore, it has to be defined for each test module separately. It can be opened by
clicking the Hardware Configuration button in the test module.

3.3.1 Analog Outputs

3.3.2 Binary Inputs

Page 16
3.4 Defining the Test Configuration
3.4.1 General Approach
When testing the non-directional overcurrent protection, the following steps are recommended:

> Pick-up Test: Testing the pick-up value of the overcurrent protection (only if the start contact is wired for
this relay, or if the relay is of the Ferraris disk type – see Help for more information).
> Trip time characteristic: Verifying the trip times of every element of the tripping characteristic.

Each of these tests can be performed with the Overcurrent test module.

Page 17
3.4.2 Pick-Up Test
2 1

4 5 6

1. For this test, it is not necessary to define a trigger in the Trigger tab. The pick-up test can be performed if
a start contact is wired and defined as a test module input signal in the local Hardware Configuration
(see chapter 3.3 “Local Hardware Configuration for Non-Directional Overcurrent Testing”).
2. Settings in the Fault tab will not be needed in this test (but might be added to combine pick-up and
characteristic tests in one module).
3. As the start contact is used to trigger this test, Relay with start contact has to be chosen.
4. The phase overcurrent function is tested with phase to phase faults.

Note: In this case other protection functions may interfere with the test. However, if such functions or
elements (e.g., ground fault protection, negative sequence protection, etc.) are present they may be
specified in the Test Object in the same manner as the phase elements were entered in this example.
The resulting characteristic will be calculated individually and shown for each test shot depending on its
fault type (4) and fault angle (5), ensuring a proper assessment according to the expected overall relay
behavior.

5. For the non-directional test, no voltages are used, therefore, no test angle can be set.
6. As the pick-up is not delayed, a step length (Resolution) of 50 ms should be sufficient.

Note: The pick-up value will be measured and assessed automatically. The drop-off value will also be
measured, but it will not be assessed. The assessment of the drop-off value and of the reset
ratio has to be made manually.

More test lines can be added if needed, e.g., different fault types.

Page 18
3.4.3 Trip Time Characteristic Test
Trigger and Fault tabs:

1 3

1. The trigger for this test will be the trip contact.


2. A Load current during the pre-fault state will not be used in this example.
3. The Absolute max. time has to be adjusted. On the one hand, it has to exceed the upper tolerance of
the test point with the longest trip time otherwise an assessment will not be possible. On the other hand,
it should not be set to an unnecessarily high value. For shots where No trip is expected this will be the
waiting time until the assessment 'no trip' is made before continuing with the next shot. So if this time is
set to a very high value, it would unnecessarily prolong the test duration.

Page 19
Characteristic Test tab:

1 2

3
4

1. As the function to test is a phase overcurrent function, a phase to phase fault is used.

Note: In this case other protection functions may interfere with the test. However, if such functions or
elements (e.g., ground fault protection, negative sequence protection, etc.) are present they may be
specified in the Test Object in the same manner as the phase elements were entered in this example.
The resulting characteristic will be calculated individually and shown for each test shot depending on its
fault type (1) and fault angle (2), ensuring a proper assessment according to the expected overall relay
behavior.

2. The Angle cannot be set because no voltages are used.


3. As the trip time of the IDMT element depends on the current, this element has to be verified with more
than one test point.
4. The trip time of the 2nd element can be confirmed with only one test point.
5. The value of the 2nd element is also confirmed by placing two test points outside of the tolerance band of
this setting.
Instead of directly entering the magnitude value it can be expressed by its relation to an element setting,
e.g., set Relative to: to the 2nd element and set the Factor to 1.06 (i.e., 6 % above the threshold) or 0.94
(i.e., 6 % below the threshold).

Feedback regarding this application is welcome by email at [email protected].

Page 20
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Page 21

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