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Testing 11

This document discusses testability analysis of VLSI circuits. It provides an overview of testability measures like controllability and observability, which analyze how difficult it is to control and observe internal circuit lines from primary inputs and outputs. The document describes the SCOAP method for calculating static controllability and observability metrics, and how these metrics can help with test pattern generation and estimating fault coverage. It also explains how the measures are computed for different gate types and provides examples of applying levelization algorithms to compute the measures on sample circuits.

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46 views

Testing 11

This document discusses testability analysis of VLSI circuits. It provides an overview of testability measures like controllability and observability, which analyze how difficult it is to control and observe internal circuit lines from primary inputs and outputs. The document describes the SCOAP method for calculating static controllability and observability metrics, and how these metrics can help with test pattern generation and estimating fault coverage. It also explains how the measures are computed for different gate types and provides examples of applying levelization algorithms to compute the measures on sample circuits.

Uploaded by

doomachaley
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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VLSI Testing

Testability
Testability Analysis
Analysis

Virendra Singh
Indian Institute of Science (IISc)
Bangalore
[email protected]

E0-286: Testing and Verification of SoC Design


Lecture - 11
Feb 13, 2008 E0-286@SERC 1
Purpose
Purpose
™ Need approximate measure of:
¾ Difficulty of setting internal circuit lines to
0 or 1 by setting primary circuit inputs
¾ Difficulty of observing internal circuit lines
by observing primary outputs
™ Uses:
¾ Analysis of difficulty of testing internal
circuit parts – redesign or add special test
hardware
¾ Guidance for algorithms computing test
patterns – avoid using hard-to-control lines
¾ Estimation of fault coverage
¾ Estimation of test vector length

Feb 13, 2008 E0-286@SERC 2


Origins
Origins
„ Control theory
„ Rutman 1972 -- First definition of controllability
„ Goldstein 1979 -- SCOAP
First definition of observability
First elegant formulation
First efficient algorithm to compute
controllability and observability
„ Parker & McCluskey 1975
Definition of Probabilistic Controllability
„ Brglez 1984 -- COP
1st probabilistic measures
„ Seth, Pan & Agrawal 1985 – PREDICT
1st exact probabilistic measures
Feb 13, 2008 E0-286@SERC 3
Testability
Testability Analysis
Analysis

ƒ Involves Circuit Topological analysis, but no


test vectors and no search algorithm
ƒ Static analysis
ƒ Linear computational complexity
ƒ Otherwise, is pointless – might as well use
automatic test-pattern generation and
calculate:
ƒ Exact fault coverage
ƒ Exact test vectors

Feb 13, 2008 E0-286@SERC 4


Types
Types of
of Measures
Measures
ƒ SCOAP – Sandia Controllability and Observability
Analysis Program
ƒ Combinational measures:
ƒ CC0 – Difficulty of setting circuit line to logic 0
ƒ CC1 – Difficulty of setting circuit line to logic 1
ƒ CO – Difficulty of observing a circuit line
ƒ Sequential measures – analogous:
ƒ SC0
ƒ SC1
ƒ SO

Feb 13, 2008 E0-286@SERC 5


Range
Range of
of SCOAP
SCOAP Measures
Measures

¾ Controllabilities – 1 (easiest) to infinity (hardest)


¾ Observabilities – 0 (easiest) to infinity (hardest)
¾ Combinational measures:
Roughly proportional to # circuit lines that
must be set to control or observe given line
¾ Sequential measures:
Roughly proportional to # times a flip-flop
must be clocked to control or observe given
line

Feb 13, 2008 E0-286@SERC 6


Goldstein’s
Goldstein’s SCOAP
SCOAP Measures
Measures

ƒ AND gate O/P 0 controllability:


output_controllability = min (input_controllabilities)
+1
ƒ AND gate O/P 1 controllability:
output_controllability = Σ (input_controllabilities)
+1
ƒ XOR gate O/P controllability
output_controllability = min (controllabilities of
each input set) + 1
ƒ Fanout Stem observability:
Σ or min (some or all fanout branch observabilities)
Feb 13, 2008 E0-286@SERC 7
Controllability
Controllability Examples
Examples

Feb 13, 2008 E0-286@SERC 8


Controllability
Controllability Examples
Examples

Feb 13, 2008 E0-286@SERC 9


Observability
Observability Examples
Examples
To observe a gate input:
Observe output and make other input values non-controlling

Feb 13, 2008 E0-286@SERC 10


Observability
Observability Examples
Examples
To observe a fanout stem:
Observe it through branch with best observability

Feb 13, 2008 E0-286@SERC 11


Levelization
Levelization Algorithm
Algorithm
™Label each gate with max # of logic levels from
primary inputs or with max # of logic levels from
primary output
™Assign level # 0 to all primary inputs (PIs)
™For each PI fanout:
¾Label that line with the PI level number, &
¾Queue logic gate driven by that fanout
™While queue is not empty:
¾Dequeue next logic gate
¾If all gate inputs have level #’s, label the gate
with the maximum of them + 1;
¾Else, requeue the gate
Feb 13, 2008 E0-286@SERC 12
Controllability
Controllability -- Level
Level 0
0
Circled numbers give level number. (CC0, CC1)

Feb 13, 2008 E0-286@SERC 13


Controllability
Controllability -- Level
Level 2
2

Feb 13, 2008 E0-286@SERC 14


Combinational
Combinational Controllability
Controllability

Feb 13, 2008 E0-286@SERC 15


Observability
Observability for
for Level
Level 1
1
Number in square box is level from primary outputs (POs).
(CC0, CC1) CO

Feb 13, 2008 E0-286@SERC 16


Observabilities
Observabilities -- Level
Level 2
2

Feb 13, 2008 E0-286@SERC 17


Thank You

Feb 13, 2008 E0-286@SERC 18

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