LM5170-Q1 Multiphase Bidirectional Current Controller: 1 Features 3 Description
LM5170-Q1 Multiphase Bidirectional Current Controller: 1 Features 3 Description
LM5170-Q1 Multiphase Bidirectional Current Controller: 1 Features 3 Description
LM5170-Q1
SNVSAQ6 – NOVEMBER 2016
RAMP1 IOUT1
OVPA IOUT2
LM5170-Q1 IPK
OSC
RAMP2
SYNCOUT
ISETD AGND
SYNCIN
ISETA OVPB
DIR
EN1 CSB2
EN2 CSA2
HO2 SW2 LO2
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LM5170-Q1
SNVSAQ6 – NOVEMBER 2016 www.ti.com
Table of Contents
1 Features .................................................................. 1 7.5 Programming........................................................... 37
2 Applications ........................................................... 1 8 Application and Implementation ........................ 39
3 Description ............................................................. 1 8.1 Application Information............................................ 39
4 Revision History..................................................... 2 8.2 Typical Application .................................................. 47
5 Pin Configuration and Functions ......................... 3 9 Power Supply Recommendations...................... 58
6 Specifications......................................................... 6 10 Layout................................................................... 59
6.1 Absolute Maximum Ratings ...................................... 6 10.1 Layout Guidelines ................................................. 59
6.2 ESD Ratings ............................................................ 6 10.2 Layout Examples................................................... 60
6.3 Recommended Operating Conditions....................... 6 11 Device and Documentation Support ................. 63
6.4 Thermal Information .................................................. 7 11.1 Device Support...................................................... 63
6.5 Electrical Characteristics........................................... 7 11.2 Receiving Notification of Documentation Updates 63
6.6 Typical Characteristics ............................................ 11 11.3 Community Resources.......................................... 63
7 Detailed Description ............................................ 14 11.4 Trademarks ........................................................... 63
7.1 Overview ................................................................. 14 11.5 Electrostatic Discharge Caution ............................ 63
7.2 Functional Block Diagram ....................................... 15 11.6 Glossary ................................................................ 63
7.3 Feature Description................................................. 16 12 Mechanical, Packaging, and Orderable
7.4 Device Functional Modes........................................ 32 Information ........................................................... 63
4 Revision History
DATE REVISION NOTES
November 2016 * Initial release.
PHP Package
48-Pin TQFP
Top View
SYNCOUT
SYNCIN
ISETD
AGND
ISETA
IOUT2
IOUT1
OSC
EN2
EN1
DIR
DT
48
47
46
45
44
43
42
41
40
39
38
37
CSA2 1 36 CSA1
CSB2 2 35 CSB1
NC 3 34 BRKG
VINX 4 33 BRKS
NC 5 32 NC
VIN 6 31 VCCA
NC 7 30 IPK
RAMP2 8 29 OPT
OVPA 9 28 RAMP1
UVLO 10 27 nFAULT
COMP2 11 26 COMP1
SS 12 25 OVPB
13
14
15
16
17
18
19
20
21
22
23
24
SW2
HB2
HO2
NC
LO2
PGND
VCC
LO1
NC
HO1
HB1
SW1
Pin Functions
PIN
I/O (1) DESCRIPTION
NO. NAME
1 CSA2 I CH-2 differential current sense inputs. The CSA2 pin connects to the CH-2 power inductor. The CSB2 pin
connects to the circuit breaker or directly to the LV-Port if the circuit breaker is not used. The CH-2 current sense
2 CSB2 I resistor is placed between these two pins.
3 NC — No Connect
Internally connected to VIN pin through a cutoff switch. When the controller is shutdown, VINX is disconnected
from VIN, opening the current leakage path. When the controller is enabled, VINX is connected to VIN and
4 VINX O
serves as the pullup supply for the RC ramp generators at the RAMP1 and RAMP2 pins. VINX also pulls up the
OVPA pin through an internal 3-MΩ resistor.
5 NC — No Connect
The input pin connecting to the HV-Port line voltage. It supplies the BRKG pin through an internal 330-µA current
6 VIN I
source.
7 NC — No Connect
6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted) (1) (2)
MIN MAX UNIT
VIN, VINX, to AGND –0.3 95
VIN, VINX, to AGND 50-ns Transient 100
VIN to VINX –0.3 95
VIN to VINX 50-ns Transient 100
SW1, SW2 to PGND –5 95
SW1, SW2 to PGND (20-ns Transient) 100
SW1, SW2 to PGND (50-ns Transient) –16
HB1 to SW1, HB2 to SW2 –0.3 14
HO1 to SW1, HO2 to SW2 –0.3 HB + 0.3
HO1 to SW1, HO2 to SW2 (20-ns Transient) –1.5
Voltage V
LO1, LO2 to PGND –0.3 VCC + 0.3
LO1, LO2 to PGND (20-ns Transient) –1.5
BRKG, BRKS, to PGND –0.3 65
CSA1, CSB1, CSA2, CSB2 to PGND –5 65
CSA1 to CSB1, CSA2 to CSB2 –0.3 0.3
BRKG to BRKS –0.3 14
EN1, EN2, DIR, IOUT1, IOUT2, IPK, ISETA, ISETD, nFAULT,
–0.3 7
OSC, OVPA, OVPB, SYNCIN, SYNCOUT, UVLO, to AGND
PGND to AGND –0.3 0.3
VCC to PGND, VCCA, DT, OPT, COMP1, COMP2, RAMP1,
–0.3 14
RAMP2, SS, to AGND
TJ Operating junction temperature –40 150 °C
Tstg Storage temperature –55 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) For soldering specs, see www.ti.com/packaging.
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) Recommended Operating Conditions are conditions under which the device is intended to be functional. For specifications and test
conditions, see the Electrical Characteristics.
6 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated
(2) High junction temperatures degrade operating lifetime. Operating lifetime is de-rated for junction temperature greater than 125°C.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(1) All minimum and maximum limits are specified by correlating the electrical characteristics to process and temperature variations and
applying statistical process control.
(2) Minimum and maximum limits apply over the –40°C to 125°C junction temperature range.
(3) Typical values correspond to TJ = 25°C.
Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 7
Product Folder Links: LM5170-Q1
LM5170-Q1
SNVSAQ6 – NOVEMBER 2016 www.ti.com
20 18
16
15
14
10 12
10
5
8
7.9 8.6
VCCA Standby Current (mA)
7.85 8.4
7.8 8.2
7.75 8
7.7 7.8
Falling
Rising
7.65 7.6
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Junction Temperature (°C) Junction Temperature (°C)
Figure 3. VCCA Standby Current vs Temperature Figure 4. VCC UVLO Threshold vs Temperature
105 6
IOUT1 Gain
IOUT1/2 Current Source Gain (PA/mV)
103 5.4
5.2
102
5
101
4.8
100 4.6
4.4
99
4.2
98 4
-50 -25 0 25 50 75 100 125 150 0 10 20 30 40 50 60 70 80 90 100
Junction Temperature (°C) Current Sense Voltage (mV) D001
ROSC = 40.2 kΩ
Figure 5. Oscillator Frequency vs Temperature Figure 6. IOUT1/2 Current Monitor Accuracy vs VCS
50.5
50.25
60
50
40
49.75
20
49.5
0 49.25
0 1 2 3 4 5 -50 -25 0 25 50 75 100 125 150
Current Setting, VISETA (V) Junction Temperature (°C)
VISETA = 2.5 V
Figure 7. Regulated VCS Voltage vs ISETA Voltage Figure 8. Regulated VCS Voltage vs Temperature
600 280
500
278
IOUT1, IOUT2 (PA)
400
276
300
274
200
272
100
IOUT1 (PA) IOUT1
IOUT2 (PA) IOUT2
0 270
0 20 40 60 80 100 -50 -25 0 25 50 75 100 125 150
Current Sense Voltage (mV) D001
Junction Temperature (°C)
VCS = 50 mV
Figure 9. IOUT1/2 Current Monitor vs VCS Voltage Figure 10. IOUT1/2 Current Monitor vs Temperature
25.2 1.19
OVP Rising Threshold Voltage (V)
25.1
1.188
25
Source Current (PA)
1.186
24.9
24.8
1.184
24.7
1.182
24.6
24.5 1.18
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Junction Temperature (°C) Junction Temperature (°C)
Figure 11. IPK Current Source vs Temperature Figure 12. OVP Reference Voltage vs Temperature
3.05 1.005
3 1
2.95 0.995
2.9 0.99
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Junction Temperature (°C) Junction Temperature (°C)
Figure 13. OVPA Pull-up Resistance vs Temperature Figure 14. OVPB Pull-up Resistance vs Temperature
140 80
120
Programmed Deadtime (ns)
60
Adaptive Deadtime (ns)
100
80
40
60
40
20
20 RDT = 25 k: HO to LO
RDT = 7.5 k: LO to HO
0 0
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Junction Temperature (°C) Junction Temperature (°C)
FSW = 100 kΩ VDT = VVCC
Figure 15. Programmed Dead-Time vs Temperature Figure 16. Adaptive Dead Time vs Temperature
14 450
Circuit Breaker Gate Current (PA)
12
390
10
VBRKS (V)
8
330
6
VBRKG
4
270
0 210
0 10 20 30 40 50 -50 -25 0 25 50 75 100 125 150
VVIN VCS1B (V) Junction Temperature (°C)
Figure 17. [VBRKG – VBRKS] vs [VVIN – VBRKG] Voltage Figure 18. Circuit Breaker Gate Current vs Temperature
7 Detailed Description
7.1 Overview
The LM5170-Q1 device is a high performance, dual-channel bidirectional current controller intended to manage
current transfer between a Higher Voltage Port (HV-Port) and a Lower Voltage Port (LV-Port) like the 48-V and
12-V ports of automotive dual battery systems. It integrates essential analog functions that enable the design of
high power converters with a minimal number of external components. It regulates DC current in the direction
designated by the DIR pin input signal. The current regulation level is programmed by the analog signal applied
at the ISETA pin or the digital PWM signal at the ISETD pin. Independent enable signals activate each channel
of the dual controller.
The dual-channel differential current sense amplifiers and dedicated channel current monitors achieve typical
accuracy of 1%. The robust 5-A half-bridge gate drivers are capable of controlling parallel MOSFET switches
delivering 500 W or more per channel. The diode emulation mode of the buck or boost synchronous rectifiers
enables discontinuous mode operation for improved efficiency under light load conditions, and it also prevents
negative current. Versatile protection features include the cycle-by-cycle peak current limit, overvoltage protection
of both 48-V and 12-V battery rails, detection and protection of MOSFET switch failures, and overtemperature
protection.
The LM5170-Q1 uses average current mode control which simplifies compensation by eliminating the right-half
plane zero in the boost operating mode and by maintaining a constant loop gain regardless of the operating
voltages and load level. The free-running oscillator is adjustable up to 500 kHz and can be synchronized to an
external clock within ±20% of the free running oscillator frequency. Stackable multiphase parallel operation is
achieved by connecting two LM5170-Q1 controllers in parallel for 3 or 4 phase operation, or by synchronizing
multiple LM5170-Q1 controllers to external multiphase clocks for a higher number of phases. The UVLO pin
provides master ON/OFF control that disables the LM5170-Q1 in a low quiescent current shutdown state when
the pin is held low.
Definition of IC Operation Modes:
• Shutdown Mode: When the UVLO pin is < 1.25 V, or VCC < 8 V, or nFAULT < 1.25 V, the LM5170-Q1 is in
the shutdown mode with all gate drivers in the low state, all internal logic reset, and the VINX pin
disconnected from the VIN pin. When UVLO < 1.25 V, the IC draws < 20 µA through the VIN and VCC pins.
• Initialization Mode: When the UVLO pin is > 1.5 V but < 2.5 V, and VCC > 8.5 V, and nFAULT > 2 V, the
LM5170-Q1 establishes proper internal logic states and prepares for circuit operation.
• Standby Mode: When the UVLO pin is > 2.5 V, and VCC > 8.5 V, and nFAULT > 2 V, the LM5170-Q1 first
performs fault detection for 2 to 3 ms, during which the external power MOSFETs are each checked for drain-
to-source short-circuit conditions. If a fault is detected, the LM5170-Q1 returns to the shutdown mode and is
latched in shutdown until reset through UVLO or VCC pins. If no failure is detected, the LM5170-Q1 is ready
to operate. The circuit breaker MOSFETs are turned on and the oscillator and ramp generators are activated,
but the four gate drive outputs remain off until the EN1 or EN2 initiate the power delivery mode.
• Power Delivery Mode: When the UVLO pin > 2.5 V, VCC > 8.5 V, nFAULT > 2 V, EN1 and/or EN2 > 2 V,
DIR is valid (either > 2 V or < 1 V), and ISETA > 0 V, the SS capacitor is released and the LM5170-Q1
regulates the DC current at the level set at the ISETA pin.
25 µA VCCUV
UVLO + ENABLE
2.5 V - nFAULT
CONTROL
+ RESET
1.5 V - LOGIC SD
300 uA
DIR_GOOD CIRCUIT BRKG
DIR DIR BREAKER
VALIDATION DIR 12 V
VIN CONTROL
FLIP BRKS
ISETA ISET DETECT
3.125 V SD
SS1 25 uA
100 K FAILURE
ISETD SS2 SS
DETECT
100K DISABLE1
+
- 0.6 V OVP LEVEL
DIR
SHIFT SW1
ADPT
EN1 SD LOGIC
CLK1 S Q VCC
1-D1
EN1 DISABLE1 VDT
D1 DELAY LO1
R Q
DISABLE1 LOGIC
+ OVP
- 0.6 V DIR LEVEL
SHIFT ADPT SW2
EN1 SD LOGIC
CLK2 S Q 1-D2 VCC
DISABLE2 VDT
EN2 D2 DELAY LO2
R Q
DISABLE2 LOGIC
CVCCA
Analog
VCC LDO
Circuit
UV
CVCC
AGND PGND
LM5170-Q1
VIN
VINX
VINX
3 Meg
OVPA OVP RAMP1
+
COMP
1.185 V
-
AGND
RAMP2
LM5170-Q1
VCS_dc (mV)
50.0
ISETA
+ ISETD
- AGND
0
0 2.5 3.0
ISETA (V)
Figure 21. Pin Configurations for Current Setting Using an Analog Voltage Signal
ISETD
FISETD=1~1000 kHz
ISETA
AGND
CISETA
100 pF~100 nF 0
0% 80% 100%
ISETD Duty (%)
Figure 22. Pin Configurations for Current Setting Using a PWM Signal
The ISETA pin is directly connected to the noninverting input of the error amplifier. By ISETA programming, the
channel DC current is determined by Equation 5:
VCS dc 0.02 u VISETA (5)
Or by Equation 6:
VCS_dc_
I_channel_dc
Rcs (6)
Or by Equation 7:
0.02 u VISETA
I_channel_dc
Rcs
where
• Rcs is the channel current sensing resistor value. (7)
When using ISETD, the produced VISETA by the internal decoder is equal to the product of the effective duty ratio
of the ISETD PWM signal (DISETD) and the 3.125-V internal reference voltage. The channel current is determined
by Equation 8:
IVISETA 3.125V u DISETD (8)
275
IOUT (µA)
25
0
0 50
V_CS (mV)
To MCU
Monitor
LM5170-Q1
IOUT2
9.09 k 10~100 nF
IOUT1
9.09 k
AGND 10~100 nF
HV-Port (48 V)
VIN
Shutdown
VINX
RRAMP1
RAMP1
CLK1
CRAMP1
-
1V PWM To Driver Logic
COMP1
+
RCOMP1 25 mA
Gm AMP
CHF1 SS From Current
-
Sense Amp
CCOMP1
Gm
CSS + ISET
AGND
COMP2
RRAMP2
To CH2 PWM
RAMP2
CLK2
CRAMP2
LM5170-Q1
Figure 25. Error Amplifier, Ramp Generator, Soft Start, and PWM Comparator
When the LM5170-Q1 is enabled, CRAMP1/2 is charged by the VINX pin through RRAMP1/2 at the beginning of each
switching cycle. The internal pulldown FET discharges CRAMP1/2 at the end of the cycle within a 200-ns internal,
then the pulldown is released, and CRAMP1/2 repeats the charging and discharging cycles. In general the RAMP
RC time constant is much greater than the period of a switching cycle. Therefore, the RAMP pin voltages are
sawtooth signals with a slope proportional to the HV-Port voltage. In this way the RAMP signals convey the line
voltage info. Being directly used by the PWM comparators to determine the instantaneous switching duty cycles,
the RAMP signals fulfill the line voltage feedforward function and enable the LM5170-Q1 to have a fast response
to line transients.
NOTE
TI recommends users to select appropriate RRAMP and CRAMP values by the following
equation such that the RAMP pins reach the peak value of about 5 V each cycle when
VIN is at 48 V.
9.6
RRAMP
Fsw u CRAMP (14)
22 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated
RBT DBT
2
HB
VCC
HO CBT
Driver
SW
External VCCA
10V Supply
Internal LO
Driver
Logic
AGND Circuit PGND
LM5170-Q1
During start-up in buck mode, CBT may not be charged initially; the LM5170-Q1 then holds off the high-side driver
outputs (HO1 and HO2) and sends LO pulses of 200-ns width in consecutive cycles to pre-charge CBT. When the
boot voltage is greater than the 6.5-V boot UV threshold, the high-side drivers output PWM signals at the HO1
and HO2 pins for normal switching action.
During start-up in boost mode, CBT is naturally charged by the normal turnon of the low side MOSFET, therefore
there is no such 200-ns pre-charge pulse at the LO pins.
To prevent shoot-through between the high-side and low-side power MOSFETs on the same half bridge leg, two
types of dead time schemes can be chosen with the DT pin: the programmable dead time or built-in adaptive
dead time.
To program the dead time, place a resistor RDT across the DT and AGND pins as shown in Figure 27.
The dead time tDT as depicted in Figure 28 is determined by Equation 15:
ns
tDT RDT u 4 16ns
k: (15)
Note that this equation is valid for programming tDT between 20 ns and 250 ns. When the power MOSFET is
connected to the gate drive, its gate input capacitance CISS becomes a load of the gate drive output, and the HO
and LO slew rate are reduced, leading to a reduced effective tDT between the high- and low-side MOSFETs. The
user should evaluate the effective tDT to make sure it is adequate to prevent shoot-through between the high-
and low-side MOSFETs.
When the DT programmability is not used, simply connect the DT pin to VCC as shown in Figure 29, to activate
the built-in adaptive dead time. The adaptive dead time is implemented by real time monitoring of a driver’s
output (either HO or LO) by the other driver (LO or HO) of the same half bridge switch leg, as shown in Figure 29
and Figure 30. Only when a driver’s output voltage falls below 1.25 V does the other driver starts turnon. The
effectiveness of adaptive dead time will be greatly reduced if a series gate resistor is used, or if the PCB traces
of the gate drive have excessive impedance due to poor layout design.
HV-Port (48 V)
RBT1/2 DBT1/2
VCC
LM5170-Q1 HB1/2
Adapt Logic
Level Level Shift
FROM Shift VCC
PWM DLY LO1/2
Driver
Logic
AGND DT PGND
RDT
Figure 27. Dead Time Programming With DT Pin (Only One Channel is Shown)
HO
tDT tDT
LO
Figure 28. Gate Drive Dead Time (Only One Channel is Shown)
HV-Port (48V)
RBT1/2 DBT1/2
VCC
LM5170-Q1 HB1/2
CBT1/2
DLY HO1/2
Logic Driver
SW1/2
Adapt Logic
Level Level Shift
Shift VCC
FROM
PWM DLY LO1/2
Logic Driver
AGND DT PGND
Figure 29. Dead Time Programming With DT Pin (Only One Channel is Shown)
1.5 V
HO
Adaptive
tDT
LO
1.5 V
SYNCIN
CLK1
SYNCOUT
SYNCOUT
CLK2
ENABLE
AGND
Interleaving OPT
LM5170-Q1
Control
CLK
Main FET
Turn-ON
Sync FET x x
Turn-ON
Diode Emulation
x x
Inductor
Current
0A
To obtain optimal diode emulation performance, it requires the VCS signal to be accurate in real time. Any signal
distortion caused by parasitic inductances in the current sense resistor or sensing traces may lead to erroneous
zero crossing detection and cause non-optimal diode emulation operation, and the sync FET may be turned off
while the current is still high in the positive direction. See the Application Information section for coping with
current sense parasitic inductances for optimal diode emulation operation.
7.3.16 Power MOSFET Failure Detection and Failure Protection (nFAULT, BRKG, BRKS)
The LM5170-Q1 includes a circuit to detect a MOSFET switch short-circuit failure during start-up. If a MOSFET
drain and source are found shorted, the LM5170-Q1 pulls down the nFAULT pin to flag the fault, and the
controller remains in an OFF state. This feature prevents the LM5170-Q1 from starting with a short-circuit-failed
MOSFET, thereby preventing catastrophic failures.
The LM5170-Q1 also integrates a control circuit to control the circuit breaker. As shown in Figure 33, the circuit
breaker consists of a pair of back-to-back MOSFETs. When the breaker is off, the current path between the HV-
Port and LV-Port is cut-off so as to prevent possible catastrophic failures.
NOTE
The failure detection function must be deactivated if the circuit breaker is not present, or if
the circuit breaker FETs are not controlled by the LM5170-Q1.
Lm Rcs
Figure 33. Controlling Dual-Channel Circuit Breaker for MOSFET Failure Protection
HV-Port LV-Port
Lm Rcs
To SYNCIN of
the Next VIN HO SW LO CSA CSB
LM5170-Q1
BRKG
SYNCOUT
BRKS
OPEN To MCU or
nFAULT System
LM5170-Q1
Monitor
Figure 34. Controlling System Level Circuit Breaker for MOSFET Failure Protection
HV-Port LV-Port
Lm Rcs
20 k 20 k
LM5170-Q1
VINX Current
To Ramp BRKS 20 k
Sense
Generator
3 Meg 1 Meg
DIR 0
OVPA OVP
HV Sense, OVPB LV Sense,
+ +
To MCU COMP COMP 1 To MCU
COVPA ROVPA 1.185 V ROVPB COVPB
- -
1.185 V
AGND
SS SS
SYNCOUT CSS
LM5170-Q1
10 k
Figure 36. Overvoltage Protection: When Circuit Breaker Function is Not Used
HV-Port LV-Port
Converter Stage
CSA1 CSB1
VIN
BRKG
VINX Current
To Ramp Sense BRKS
Generator
3 Meg 1 Meg
DIR 0
OVPA OVP OVPB
HV Sense, + LV Sense,
+
To MCU COMP COMP 1 To MCU
COVPA ROVPA 1.185 V ROVPB COVPB
- -
1.185 V
AGND
SS SS
SYNCOUT CSS
Open LM5170-Q1
(1) OPT State = 0 when the pin connects to AGND, and 1 when the pin voltage is >2.5 V.
(1) OPT State = 0 when the pin connects to AGND, and 1 when the pin voltage is >2.5 V.
U1 U2
MCU U1 U2
SYNCIN OPT
SYNCOUT OSC
AGND
U3
MCU U1 U2
SYNCIN OPT
SYNCOUT OSC
AGND
U3
MCU U1 U2
U3
MCU U1 U2
U3 U4
IOUT2
U2
3-Phase
AGND Total Current
Monitor
LM5170-Q1
IOUT1
No Load: 0.23 V
Max Load: 2.48 V
IOUT2
U1
3.01 kW 10~100nF
AGND
7.5 Programming
7.5.1 Dynamic Dead Time Adjustment
In addition to a fixed dead time programming by RDT, the dead time can be dynamically adjusted either by
applying an analog voltage or a PWM signal as shown in Figure 45. Varying the analog voltage or the duty ratio
of the PWM signal will adjust the DT programming. For analog adjustment, a single stage RC filter is
recommended to filter out any possible noise. For PWM adjustment, a two-stage RC filter is recommended to
minimize the ripple voltage resulted on the DT pin.
FADJ=10~100 kHz
When an analog voltage is applied, the resulted dead time is determined by Equation 19:
1
§ 1 1 0.8 u VADJ · ns
tDT (VADJ ) ¨ ¸ u4 16 ns
© RDT RADJ1 RAJD2 RADJ1 R ADJ2 ¹ k:
where
• VADJ is the analog voltage used to adjust the dead time (19)
When a PWM signal is applied, the resulted dead time is determined by Equation 20:
1
§ 1 1 0.8 u ¬ª VHI VLO u DADJ VLO ¼º · ns
tDT (D ADJ ) ¨ ¸ u4 16 ns
¨ RDT R ADJ1 R AJD2 R AJD3 R ADJ1 R ADJ2 R ADJ3 ¸ k:
© ¹
where
• VHI and VLO are the high and low voltage levels of the PWM signal, respectively,
• DADJ is the duty factor of the PWM signal. (20)
Programming (continued)
Nevertheless, the UVLO pin can also fulfill the undervoltage lockout function of a particular power rail. The rail
can be either the HV-Port, or the LV-Port, or VCC. Use a resistor divider to set the UVLO threshold, as shown in
Figure 46. The divider should satisfy Equation 21:
RUVLO2
u VUVLO 2.5V
RUVLO1 RUVLO2 (21)
The UVLO hysteresis is accomplished with an internal 25-μA current source. When UVLO > 2.5 V, the current
source is activated to instantly raise the voltage at the UVLO pin. When the UVLO pin voltage falls below the 2.5-
V threshold the current source is turned off, causing the voltage at the UVLO pin to fall. The UVLO hysteresis is
determined by Equation 22:
VHYS RUVLO1 u 25PA (22)
An optional ceramic capacitor CUVLO can be placed in parallel with RUVLO2 to improve the noise immunity. CUVLO
is usually between 1 nF to 10 nF. A large CUVLO may cause excessive delay to respond to a real UVLO event.
If Equation 22 does not provide adequate hysteresis voltage, the user can add RUVLO3 as shown in Figure 47.
The hysteresis voltage is thus given by Equation 23:
ª § RUVLO1 · º
VHYS «RUVLO1 RUVLO3 u ¨ 1 ¸ » u 25PA
«¬ © RUVLO2 ¹ »¼ (23)
HV-Port,
or LV-Port,
or VCC
RUVLO1 25 µA
MASTER
ENABLE UVLO
+ ENABLE
-
2.5 V
CUVLO RUVLO2 AGND +
- RESET
1.5 V
LM5170-Q1
HV-Port,
or LV-Port,
or VCC
RUVLO1 25 µA
MASTER RUVLO3
ENABLE UVLO
+ ENABLE
-
2.5 V
CUVLO RUVLO2 AGND +
- RESET
1.5 V
LM5170-Q1
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
Initializ
MODE Shutdown -ation Standby Power Delivery
10 V
VCC 0V
UVLO=2.5 V
UVLO UVLO=1.5 V
nFAULT
I(BRKG)
VGS_BRK 8.5 V
0V
INTERNAL(PWR_GD)
VIN
0V
VINX
OSCILLATOR
DIR
ISET
EN1,2
1.0 V
SS
‡‡‡‡‡‡
HO1
‡‡‡‡‡‡
LO1
‡‡‡‡‡‡
HO2
‡‡‡‡‡‡
LO2
B0
A3
A2
A1
A0
A7
A6
A5
A4
C1
EN1 EN2 VCCA EN1 EN2 VCCA
SYNCIN SYNCIN
SYNCOUT OPT OPT
SYNCOUT
DIR OSC DIR OSC
ISETD AGND ISETD AGND
Lm Rcs
V48 V12
DIR
1 1 50X
DIR
0 0
D (1-D) D
PWM Vea
±
+ Gm
+ ISETA
± COMP
Ramp
Generator RCOMP
RAMP CHF Type II Compensator
Vramp
CCOMP
KFFV48
where
• the coefficient 50 is the current sense amplifier gain;
• Gm is the transconductance of the gm error amplifier, which is 1 mA/V;
• ZCOMP(s) is the equivalent impedance of the compensation network seen at the COMP pin, namely
Equation 26 (25)
1 1 s u RCOMP u CCOMP
ZCOMP (s) u
CHF CCOMP § C u CCOMP ·
s u ¨ 1 s u RCOMP u HF ¸
© CHF CCOMP ¹ (26)
Usually CHF is << CCOMP. Thus Equation 26 can be simplified to Equation 27:
1 1 s u RCOMP u CCOMP
ZCOMP (s) u
CCOMP s u 1 s u RCOMP u CHF (27)
Because RGM is > 5 MegΩ, and the frequency range for loop compensation is usually above a few kHz, the
effects of RGM on the loop gain in the interested frequency range becomes negligible. Therefore, substituting
Equation 28 into Equation 25, and neglecting RGM, one can get the following:
VÖ ea 50 u RCS u Gm 1 s u RCOMP u CCOMP
G(s) u
Öi CCOMP s u (1 s u RCOMP u CHF )
Lm (28)
The total open-loop gain of the inner current loop is the product of H(s) and G(s):
Gtotal (s) H(s) u G(s) (29)
Or:
1 50 u RCS u Gm 1 s RCOMP u CCOMP
Gtotal (s) u u
KFF u CCOMP Lm s u (1 s u RCOMP u CHF )
su 1
RCS RS (30)
The poles and zeros of the total loop transfer function are determined by:
fp1 0 (31)
(RCS RS )
fp2
2S u Lm (32)
1
fp3
2S u RCOMP u CHF (33)
1
fz
2S u RCOMP u CCOMP (34)
To tailor the total inner current loop gain to cross over at fCO, select the components of the compensation
network according to the following guidelines, then fine tune the network for optimal loop performance.
1. The zero fz is placed at the power stage pole fp2,
2. The pole fp3 is placed at about two decade higher then fCO,
3. The total open-loop gain is set to unity at fCO, namely,
H(2i u S u fCO ) u G(2i u S u fCO ) 1 (35)
Therefore, the compensation components can be derived from the above equations, as shown in Equation 36.
-
°
° 1 KFF
°RCOMP u 2iuSufCO uLm (RCS RS )
50uRCS uGmu H(2iuSufCO 50uRCS uGm
°
® Lm
° CCOMP
° (RCS RS )uRCOMP
° CCOMP
° CHF
100
¯ (36)
Main FET
Vgs
0
IL
Inductor Current
0
LCS dIL
False 0- dt
Crossing
VCS
xx
0
xx
xx xx
x
Sync FET
Vgs
0 x
time
Figure 51. Effects of Parasitic Inductance on the Current Sense Signal and Zero Crossing Detection
Lm1
V12
+
1: 1: ±
CCS1
CSA1 CSB1
LM5170-Q1
CSA2 CSB2
CCS2
1: 1:
Lm2
Figure 52. Compensation Network to Compensate the Current Sense Resistor’s Parasitic Inductance
ILm
HV-Port(48 V) LV-Port (12 V)
Lm Rcs
DIR 1 1
0 0 DIR
D (1-D) D
Gm
PWM Vea ±
+
+ ISETA
± COMP
Vramp
kFF
FF Ramp
Generator
½ LM5170-Q1
± ISET ±
Lm Rcs
DIR 1 1
0 0 DIR
D (1-D) D
Gm
PWM Vea ±
+
+ ISETA
± COMP
Vramp
kFF
FF Ramp
Generator
½ LM5170-Q1
DIR
ISET
ADC
±
PID
Vout Set
+
Microcontroller
4.7 µH
CHB1 1m
+ +
C1 QH1 0.22 µF C2
HV-Port LV-Port
- 100 µF 470 µF -
VCC QL2
PGND PGND
DHB1
PGND
22 24 23 20 18 36 35
SW1
HB1
LO1
PGND
HO1
CSA1
CSB1
VCC 6 VIN BRKG 34
RBRKG
RBRKS
10 k
+ 19 VCC BRKS 33
CVCC
+10Vdc RVCCA 10 k
- 2.2 µF 24.9
31 VCCA VINX 4
RRAMP1
C5 29 OPT 95.3 k
PGND RAMP1 28
1 µF CRAMP1
46 AGND RRAMP2
1 nF
ROSC 95.3 k
47 OSC RAMP2 8
CRAMP2
40.2 k
42 ISETD 1 nF
44 DIR RDT 10 k
DIR
DT 48
ISETA 45 ISETA CSS 10 nF
SS 12
27 nFAULT ROVPA 51.1 k
OVPA 25
IOUT1 37 IOUT1 ROVPB 54.9 k
CIOUT1 OVPB 9
RIOUT1
10 nF 9.09 k RIPK 40.2 k
IPK 30
IOUT2 38 IOUT2
CIOUT2
RIOUT2
AGND
CSA2
CSB2
SW2
10 nF 9.09 k
HO2
HB2
LO2
15 13 14 17 1 2
AGND
VCC
DHB2
CHB2
QH2 0.22 µF Lm2
RCS2
4.7 µH
1m
QL2
C8 C10
470 µF
100 µF
Lm1
V12
+
1: 1: -
CSA1 CSB1
LM5170-Q1
CSA2 CSB2
100 pF 100 pF
CCS2
1: 1:
Lm2
Figure 56. Current Sense With Compensation to Cancel the Effects of Parasitic Inductances
where
• Dmax is the maximum duty cycle, either in the buck mode or boost mode. (54)
The switching transient rise and fall times are approximately determined by:
N u Qg
'trise |
4A (55)
N u Qg
't fall |
4A (56)
And the switching losses of each of the paralleled MOSFETs are approximately determined by:
1 2 1 Ipeak
PQ_sw u Coss u VHV u Fsw u u VHV u ('trise 't fall ) u Fsw
2 2 N
where
• Coss is the MOSFET’s output capacitance. (57)
The power MOSFET usually requires a gate-to-source resistor of 10 kΩ to 100 kΩ to mitigate the effects of a
failed gate drive. When using parallel MOSFETs, a good practice is to use 1- to 2-Ω gate resistor for each
MOSFET, as shown in Figure 57.
HV-Port To Inductor
100 K
100 K 100 K
100 K
1 1 1 1
HO SW LO PGND
LM5170-Q1
If the dead time is not optimal, the body diode of the power synchronous rectifier MOSFET will cause losses in
reverse recovery. Assuming the reverse recovery charge of the power MOSFET is Qrr, the reverse recovery
losses are thus determined by Equation 58:
PQ_rr Qrr u VHV_max u Fsw (58)
To reduce the reverse recovery losses, an optional Schottky diode can be placed in parallel with the power
MOSFETs. The diode should have the same voltage rating as the MOSFET, and it must be placed directly
across the MOSFETs drain and source. The peak repetitive forward current rating should be greater than Ipeak,
and the continuous forward current rating should be greater than the following Equation 59:
ISD_avg Ipk u tDT u Fsw (59)
where
• 5 mA is the worst case maximum current used by the control logic circuit of each phase. (60)
In an example of a four-phase system employing two parallelled MOSFETs for one switch, where M=4, N=2,
Qg=100 nC, and Fsw=100 KHz, the bias supply should be able to support at least the following total load current:
IVCC t 2 u 4 u 2 u 100nC u 100kHz 4 u 5mA 180 mA (61)
In an example of an eight-phase system employing the same parallel MOSFETs for one switch, the bias supply
should be able to support the following total load current:
IVCC_8ph 2 u 8 u 2 u 100nC u 100kHz 8 u 5mA 360 mA (62)
The VCC AC bypass ceramic capacitor CVCC = 1 ~ 2.2 µF, rated at least 16 V, must be placed close to the VCC
and PGND pins. Similarly, a ceramic capacitor CVCCA = 1 µF, rated at least 16 V, must be placed close to the
VCCA and AGND pins. Place a 24-Ω resistor between VCC and VCCA pins.
8.2.1.2.11 OVP
As shown in Figure 36 and Figure 37, the HV-Port and LV-Port overvoltage protection thresholds can be
programmed by ROVPA and ROVPB, respectively. These resistor values are determined by Equation 64 and
Equation 65.
1.185V 1.185V
ROVPA u 3000k: u 3000k: 51.66 k :
VOVPA th 1.185V 70V 1.185V (64)
1.185V 1.185V
ROVPB u 1000k: u 1000k: 54.3 k:
VOVPB th 1.185V 23V 1.185V (65)
Select the closest standard resistor values. In this example, ROVPA = 51.1 kΩ, and ROVPB = 54.9 kΩ.
RVIN
10
VIN
CVIN
0.1~1.0 µF AGND
LM5170-Q1
Selecting the closest standard values for the compensation network, namely,
RCOMP1 = RCOMP2 = 634 Ω
CCOMP1 = CCOMP2 = 150 nF
CHF1 = CHF2 = 1 nF
These initial component selections produce a total loop phase margin of 90°, which is larger than necessary.
Fine tune the loop compensation by reselecting CCOMP1 = CCOMP2 = 15 nF, then the phase margin will be 45° for
an optimal dynamic performance.
Figure 59 shows the Bode Plots of the power plant, the compensation gain, and the resulting total open loop.
60
Power Plant
40
Compensation
Total Loop
Gain (dB)
20
20
40
3 4 5 6
100 1u10 1u10 1u10 1u10
180
150
Phase (deg)
120
90
60
30
0
3 4 5 6
100 1u10 1u10 1u10 1u10
Frequency (Hz)
Figure 59. Bode Plots of the Example Converter
Select the closest standard ceramic capacitor, that is, CSS = 10 nF.
1.5 nF 1.5 nF
ISETD
AGND
Figure 60. Two-Stage RC Filter to Convert the PWM into an Analog Voltage at the ISETA Pin
Figure 61. Channel Inductor Current and IOUT Tracking Figure 62. Diode Emulation Prevents Negative Current
ISETA Command
Figure 63. Channel Inductor Current and Monitor Figure 64. Start-Up Sequence Following UVLO Enable
Responses to Dynamic DIR Change
Figure 65. nFAULT Shutdown Latch Figure 66. Boot Capacitor Pre-Charge During Start-Up in
Buck Mode
Figure 67. Dual=Channel Interleaving Operation: Buck Figure 68. Dual-Channel Interleaving Operation: Boost
Mode Mode
Figure 69. LV-Port OVP: Buck Mode Figure 70. HV-Port OVP: Boost Mode
V48 V12
LM5170-Q1
+ Bi-Directional +
- Converter -
RTN RTN
E-Load PS E-Load
PS
Figure 71. Emulated Dual Battery System With Bench Power Supplies and E-Loads
10 Layout
S
GND
D
L
CH-1 AC
Loop
G
LV(+12 V)
HV(+48 V)
G
RCS
S
D
D
D
LV(+12 V)
S
LV-PORT
G Circuit
HV-PORT
TVS S G
Breaker GND
G
LV(+12 V) GND
S
G S
D
D
S
G
D
RCS
GND HV(+48 V)
CH-2 AC
LM5170-Q1 Loop
D
Controller L
G
Figure 72. A Layout Example of Dual-Channel Power Circuit Placement
D
L
CH-1
G
HV(+48 V)
D
HO1
SW1
To LM5170-Q1
S G
LO1
GND
PGND
PGND
GND
LO2 G S
SW2
HO2
HV(+48 V)
S
L
D
CH-2
G
RCS To LM5170-Q1
RCS To LM5170-Q1
To AGND
From VCC
To CH-2
Current
Sense
From OPT
From nFAULT
OVPB
COMP1
nFAULT
RAMP1
OPT
IPK
VCCA
NC
BRKS
BRKG
CSB1
CSA1
From UVLO
IOUT1 SW1
IOUT2 HB1
Or System
HO1
Controller
EN1
To MCU
NC To CH-1
SYNCIN
MOSFETs
SYNCOUT LO1
LM5170-Q1 EP
ISETD VCC
To +10V Supply
EN2 PGND
DIR LO2
To CH-2
ISETA NC MOSFETs
AGND HO2
OSC HB2
DT SW2
COMP2
RAMP2
OVPA
UVLO
CSB2
CSA2
VINX
VIN
NC
NC
NC
SS
Single Point
Ground
Connection To CH-2
Current
Sense
To AGND
11.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
11.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 23-Nov-2016
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
LM5170QPHPRQ1 ACTIVE HTQFP PHP 48 1000 Green (RoHS CU NIPDAU Level-3-260C-168 HR -40 to 150 LM5170Q1
& no Sb/Br)
LM5170QPHPTQ1 ACTIVE HTQFP PHP 48 250 Green (RoHS CU NIPDAU Level-3-260C-168 HR -40 to 150 LM5170Q1
& no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 23-Nov-2016
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 24-Nov-2016
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 24-Nov-2016
Pack Materials-Page 2
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