Instituto Politécnico Nacional

Escuela Superior de Computo

“Practice 1: Determination of instruments errors”

Students:

 Contreras Leal Armando David

 Nolasco Cruz Oscar Daniel
 Montaño Carmona Karla Isela

Teacher: Ismael Cervantes de Anda

Matter: Instrumentation

Group: 3CV2

Date: 22/Feb/18
 Theoretical Framework

When making measurements, the measurements that are obtained are never
exactly the same, even if they were made by the same person, on the same piece,
with the same instrument, the same method and the same environment, in a strict
sense, it is impossible to make a totally accurate measurement therefore errors
always occur when making the measurements. Errors can be negligible or
significant depending on the circumstances in which the measurement occurs.
The measurement error is defined as the difference between the measured value
and the "true value". Measurement errors affect any measuring instrument and can
be due to different causes. Those that can be predicted in some way, calculated,
eliminated by calibrations and compensations, are called deterministic or
systematic and are related to the accuracy of the measurements. Those that can
not be predicted, because they depend on unknown causes, or stochastic are
called random and are related to the accuracy of the instrument.
Although it is impossible to know all the causes of the error, it is convenient to
know all the important causes and have an idea that allows us to evaluate the most
frequent errors. The main causes that produce errors can be classified as:

 Error due to the measuring instrument.

 Error due to the operator.
 Error due to environmental factors.
 Error due to geometric tolerances of the piece itself.

%error=((exact value-approximate value)/exact value))100

Objective:
The student learns to manage the measure instruments errors, this way he can find
a variable with a more exactly value.

Equipment:
 2 Digital Multimeter of different brand
 1 Oscilloscope
 1 VCD variable Source
 1 Function Generator
 4 Banana – Banana Tips
 2 Banana – Caiman Tips
 2 Oscilloscope Tips
 1 BNC – BNC Tip
 1 Protoboard
 Resistors

Development
1. Calculate to the most exactly value
First, we take a resistor of any value and using one ohmmeter we take his
measure, then we repeat this procedure eleven times using different resistances,
when we finish we change of ohmmeter and using the same resistance we take his
measure again. The results are shown in the next table.

Resistance Steren Ohmmeter Agilent Technologies Ohmmeter

Measure 1 0.464 KΩ 0.472 KΩ
Measure 2 10.01 KΩ 10.013 KΩ
Measure 3 0.12 KΩ 0.127 KΩ
Measure 4 9.82 KΩ 9.9 KΩ
Measure 5 9.67 KΩ 9.67 KΩ
Measure 6 2.180 KΩ 2.186 KΩ
Measure 7 3.242 KΩ 3.24 KΩ
 Measure 8 0.0986 KΩ 0.1059 KΩ
Measure 9 0.671 KΩ 0.67 KΩ
Measure 10 0.981 KΩ 0.98 KΩ
Measure 11 10.41 KΩ 10.432 KΩ
Measure 12 10.42 KΩ 10.427 KΩ

In this case the variable to measure is resistance, we denominate it like X variable,

for any ohmmeter you realize Xi measure, then you must proceed to calculate the
average XPROM for any instrument using the next expression:

∑ 𝑋𝑖
𝑋𝑃𝑅𝑂𝑀 =
𝑛
XPROM Steren Ohmmeter = 4.8405
XPROM Agilent Technologies = 4.8519

Now proceed to calculate the residuals (Ri), considering the next expression, you
have notice that results can be < 0 so you must take absolute value as follows:
∆𝑋𝑖 = 𝑅𝑖 = |𝑋𝑖 − 𝑋𝑃𝑅𝑂𝑀 |

∆𝑋𝑖 = 𝑅𝑖 = |𝑋𝑖 − 𝑋𝑃𝑅𝑂𝑀 | ∆𝑋𝑖 = 𝑅𝑖 = |𝑋𝑖 − 𝑋𝑃𝑅𝑂𝑀 |

(Steren Ohmmeter) (Agilent Technologies Ohmmeter)
4.3765 4.3799
5.1695 5.1611
4.7205 4.7249
4.9795 5.0481
4.8295 4.8181
2.6605 2.6659
1.5985 1.6119
4.7419 4.746
4.1695 4.1819
3.8595 3.8719
5.5695 5.5801
5.5795 5.5751
∑ 𝑅𝑖 =52.2544 ∑ 𝑅𝑖 =52.3649
 Calculate average to the absolute residues value (r), using the next expression:

1
𝑟= ∑ 𝑅𝑖
𝑛

r = (Steren Ohmmeter) r= Agilent Technologies Ohmmeter

r= 4.3545 r= 4.3637

Now suppose that the set of measures X1, X2, …, Xn has a gaussian distribution,
so you can obtain a simple formula for typic error (𝜎𝑚 ) to the next form:
𝜎𝑚=1.25 𝑟
1
(𝑛−1)2

𝜎𝑚 = Steren Ohmmeter 𝜎𝑚 = Agilent Technologies Ohmmeter

𝜎𝑚 =1.6411 𝜎𝑚 =1.6446

That’s typical error and is called Peter’s Formula, finally result is going to be
expressed as follow:
𝑌 = 𝑋𝑃𝑅𝑂𝑀 + 𝜎
− 𝑚

Y Steren Ohmmeter =4.8405±1.6411

Y Agilent Technologies Ohmmeter =4.8519±1.6446
2.- Indirect Measures
Assemble a circuit as is show in the figure 1, set variable resistance at any value,
using a standard ohmmeter (you can also use resistance of set value).
Using the resistance reference value to the source, measure voltage and current in
any resistance and fill the table 2.
Table 2
Source ER1 ER2 IR1 IR2
Voltage (V) (measure) (measure) (measure) (measure)
2 1.026 v 0.99 v 0.09 mA 98.36 µA
4 2.035 v 1.758 v 0.19 mA 192.5 µA
6 3.046 v 2.469 v 0.22 mA 28.1 µA
8 4.08 v 3.492 v 0.32 mA 387 µA
10 5.07 v 4.93 v 0.47 mA 483 µA

Source ER1 ER2 IR1 IR2

Voltage (V) (simulated) (simulated) (simulated) (simulated)
2 1v 1v 100 µA 100 µA
4 2v 2v 200 µA 200 µA
6 3v 3v 300 µA 300 µA
8 4v 4v 400 µA 400 µA
10 5v 5v 500 µA 500 µA
Now, using the resistance values R1 and R2, and with the voltage source E,
calculate voltage ER1, ER2, IR1 e IR2, and fill the table 3.

Table 3
Source ER1 ER2 IR1 IR2
Voltage (V) (calculated) (calculated) (calculated) (calculated)
2 1 1 0.1mA 0.1mA

4 2 2 0.2mA 0.2mA

6 3 3 0.3mA 0.3mA

8 4 4 0.4mA 0.4mA

10 5 5 0.5mA 0.5mA

Finally calculate resistance values, using law of ohm, divide voltage/current for any
source voltage E. Do this operation for values measures and calculates, with
results fill the table 4.
Table 4
Source R1 R2 R1 R2 % Error % Error
Voltage (measure) (measure) (calculate) (calculate) R1 R2
2 10.4kΩ 10.1kΩ 10kΩ 10kΩ 4% 1%

4 10.59kΩ 10.5kΩ 10kΩ 10kΩ 3.4% 5%

6 10.8kΩ 10.22kΩ 10kΩ 10kΩ 3% 2.2%

8 10.54kΩ 10.41kΩ 10kΩ 10kΩ 2% 4.1%

10 10.49kΩ 10.33kΩ 10kΩ 10kΩ 1.1% 3.3%

 3.- Patron measure
Using an oscilloscope set generator functions on a sinusoidal signal with amplitude
10 Vp-p in a frequency of 60 Hz.
Consider oscilloscope as a patron instrument, next determine error percentage to
the voltmeter filling the Table 5.
Table 5
Vp-p from VRMS measure from VRMS calculate % Error (VRMS) % Error % Error
oscilloscope oscilloscope from oscilloscope (VRMS) (VP-P)
10 3.55 3.537 10.0404 0.013% 0.0404%
 Simulations

 Source Voltage=2V

 Source Voltage=4V
 Source Voltage=6V Source Voltage=10V

 Source Voltage=8V
With the oscilloscope fix a sinusoidal signal in function generator with amplitude at
10 vpp and 60 hz frecuency.

Vrms measured in simulation were 3.54V

 Calculations
 Calculations of table 3

E1= (VinxR1 ) / RS

ER1= (2x10000 ) / 20000=1

ER1= (4x10000 ) / 20000=2
ER1= (6x10000 ) / 20000=3
ER1= (8x10000 ) / 20000=4
ER1= (10x10000 ) / 20000=5

ER2= (2x10000 ) / 20000=1

ER2= (4x10000 ) / 20000=2
ER2= (6x10000 ) / 20000=3
ER2= (8x10000 ) / 20000=4
ER2= (10x10000 ) / 20000=5

I=Vin / RS

IR1=2 / 20000= 0.1Ma

IR1=4 / 20000= 0.2mA
IR1=6 / 20000= 0.3mA
IR1=8 / 20000= 0.4mA

IR1=10 / 20000= 0.5mA

IR2=2 / 20000= 0.1Ma

IR2=4 / 20000= 0.2mA
IR2=6 / 20000= 0.3mA
IR2=8 / 20000= 0.4mA

IR2=10 / 20000= 0.5mA

 Questionnaire

1.- The following measures was obtained for the resistance of a coil wire give in
ohms (Ω). Calculate typical error and the most accurate value from resistance.
5.625, 5.622, 5.624, 5.618, 5.620
5.633, 5.628, 5.624, 5.613, 5.659

XPROM=∑Xin=56.25610=5.6256

Ri=|Xi−XPROM|

R1=|5.615−5.6256|=0.0106

R2=|5.622−5.6256|=0.0036

R3=|5.624−5.6256|=0.0016

R4=|5.618−5.6256|=0.0076

R5=|5.620−5.6256|=0.0056

R6=|5.633−5.6256|=0.0074

R7=|5.628−5.6256|=0.0024

R8=|5.624−5.6256|=0.0016

R9=|5.613−5.6256|=0.0126

R10=|5.659−5.6256|=0.0334

r=1n∑Ri=110(0.0864)=0.00864

σm=1.25r(n−1)12=1.250.00864(10−1)12=0.0036

Standart Error=σm=0.0036 Ω

Accurate Resistance=XPROM±σm=5.6256±0.0036 Ω
2.-Why is important to determine the error of measuring instruments?

It is important because it helps us to know beforehand how much accuracy and

precision have such an instrument, in this way, to adjust or keep track of the
possible variations in measurements we make.

3.-What types of mistakes you know? And say in what way can be avoided.
Manufacturing error.
It can be corrected by carrying out a manufacturing process quality; in the case of
the end user, a manufacturing error is very difficult to solve.

Instrument error.
It can be corrected by comparing piece or replacement parts with another
instrument to know which of these are obsolete, defective or worn. Replace these
parts.

Operator error.
It can be solved taking the proper precautions when taking measurements. The
causes may include fatigue, positioning, visibility, etc.

Error by environmental factors.

It is not solved as such, simply record the environmental conditions on which
conducted measurements, for example, ambient temperature, atmospheric
pressure, humidity, etc.
 Conclusions:
Sometimes we can find different measures from one component, this is caused
because instruments have a different range of error, but we have considered that
the measure that we take must be similar in all instruments if it’s not probably we
made something wrong.
 References
(20016).División de voltaje – tensión en resistencias
serie. ElectronicaUnicrom.Recuperado de https://unicrom.com/division-de-tension-en-
resistencias-serie/