Introduction To Oscilloscope Probes: Lab Experiment
Introduction To Oscilloscope Probes: Lab Experiment
Oscilloscope Probes
Lab Experiment
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Table of Contents
The probe head allows you to hold the probe while you connect the probe tip to the test point. Often,
this probe tip has a spring-loaded hook that allows you to attach the probe to the test point. The probe
head also contains a “ground” connection, which provides the reference point for voltage
measurements. (Remember that voltage measurements are always made relative to a reference point.)
For many probes, this probe ground is a black wire with an alligator clip for easy connection to ground
test points.
Connecting a probe to a circuit can affect the operation of the circuit, and an oscilloscope can only
display and measure the signal that the probe delivers to the oscilloscope input. The probe must have
minimum impact on the probed circuit and it must maintain adequate signal fidelity for the desired
measurements, or the result can be wrong or misleading.
Most probes are packaged with standard accessories. These accessories usually include a ground lead
clip that you can attach to a ground signal source, a compensation adjustment tool, and one or more
probe tip accessories to help connect the probe to test points.
Signal Fidelity
The ideal probe would transmit any signal from probe tip to oscilloscope input with absolute signal
fidelity, meaning the signal at the oscilloscope input would be identical to the original signal at the probe
tip. For absolute fidelity, the probe circuitry from tip to oscilloscope input must have zero attenuation,
infinite bandwidth, and linear phase across all frequencies. Unfortunately, the ideal probe cannot be
realized. The next section will discuss key performance considerations of real probes.
Example: If the signal of interest is 100 MHz, the oscilloscope bandwidth and probe bandwidth should
both be greater than 500 MHz.
Rise Time
Bandwidth and rise- or fall-time have an inverse relationship. The rise time of the measurement system
(probe and oscilloscope combination) should be less than one fifth of the rise- or fall-time of the
measured signal – another “five times rule”. This should ensure an error of no more than 3% in the
measured rise- or fall-time.
signal rise time
measuremen t system rise time ≤
5
measuremen t system rise time = (oscillosco pe rise time )2 + ( probe rise time )2
Example: If the signal of interest has a rise time of 50 nsec, then the measurement system rise time
should be faster than 10 nsec. If the oscilloscope has a rise time of 2 nsec, then the probe rise time
should be faster than 9.8 nsec.
Linear Phase
Bandwidth limitations also affect the shape of signals by delaying different frequency components by
different amounts of time. These variations cause distortions of complex signals, especially pulses.
Key Points to Remember
1. Attenuation is the ratio of the probe’s input signal amplitude to the output signal amplitude.
2. The bandwidth of both the oscilloscope and probe should be at least five times that of the circuit
being tested to ensure a sine wave amplitude error of not more than 3%.
3. The rise time of the measurement system should be less than one fifth of the rise- or fall-time of the
measured signal to ensure an error of no more than 3% in the measured result.
4. Bandwidth limitations also affect the shape of signals by delaying different frequency components
by different amounts of time.
Exercise
1. If you need to measure a 25 MHz sine wave, what is the minimum bandwidth probe and
oscilloscope you should use?
2. If you measure a +5 V signal with a 10X probe, what will the signal amplitude be at the oscilloscope
input?
Probe Loading
Probe loading is a measure of how the probe affects the device-under-test (DUT). The DUT can be
modeled as a signal source (Es) with input resistance (Ri) and with a load (RL) connected. The probe
can be modeled as a resistor (Rp) and a capacitor (Cp).
Ri Test Point
VEss RL RP CP
RD Test Point
VD RP CP
An ideal probe has infinite impedance so it doesn’t draw any signal current from the device. If the probe
does not load the device then it will not change the operation of the circuitry behind the test point, nor
will it change the signal seen at the test point. In practice, a probe with zero loading cannot be
achieved. The goal, however, should always be to minimize the amount of loading through appropriate
probe selection.
The value of the device impedance influences the effect of probe loading. For example, with low device
impedance, a high-impedance 10X probe will have a negligible loading effect. However, for high device
impedances, the signal at the test point can change significantly due to the probe. This change in the
signal is because the probe impedance is connected in parallel with the device impedance. To minimize
this loading effect, you can use a higher impedance probe (for example, an active probe) or measure
the signal at a test point where the impedance is lower (for example, transistor emitters and FET
sources have lower impedances than transistor collectors and FET drains).
For example, if the device impedance is about 100 Ω and the input resistance of the probe is 1 MΩ, the
impact of the probe’s input resistance is minimal. And, if the frequency of the signal is low, the impact of
the probe’s input capacitance will also be minimal.
Ideally, Vmeas = VD. In practice, the voltage divider between the DUT and the probe’s input resistance
will decrease the measured voltage. To minimize this resistive loading effect, you can you can use a
probe with higher resistance or measure the signal at a test point where the input resistance is lower.
RP
V Meas = V D
RP + RD
RD Test Point
VD RP CP
RD Test Point
VD RP CP
The other major impact from probe input capacitance is rise time degradation. Together, the DUT
resistance (RD) and the measurement system (probe + oscilloscope) impedance (dominated by Cin)
create an RC network. As you might remember, a capacitor fights changes in voltage. Therefore, if you
drive a 0 ns rise time voltage step into a capacitor, it will take some amount of time for the capacitor to
respond to that voltage change. The amount of time is determined by the time constant of the RC
network. A good estimate of the rise time (defined as being from the 10% to 90% points) is:
tr = 2.2( RDCP )
As an example, a probe input capacitance of 100 pF would result in a rise time of 220 nsec if the DUT
resistance was about 1 kΩ. However, if the input capacitance were 10 pF, then the rise time would only
be 22 nsec!
You need to consider the effects of probe loading on your circuit. For low-frequency applications,
standard passive probes are usually adequate. For high-frequency applications, you should consider
probes with much lower input capacitance, such as active probes, which we will review later.
A similar issue occurs when you solder a piece of wire to the test point and connect the probe to the
wire. Even an inch or two of wire can cause significant impedance changes at high frequencies. Use the
shortest probe tip adapters that are available when making high-frequency measurements.
RD Test Point
VD RP CP
LP
Noise Immunity
Fluorescent lights and fan motors are just two of the many electrical noise sources in our environment.
These sources can induce their noise onto nearby electrical cables and circuitry, causing the noise to
be added to signals. Because of susceptibility to induced noise, a simple piece of wire is a less than
ideal choice for an oscilloscope probe.
Instead, most oscilloscope probes are made with coaxial cables or “coax” which consists of the signal
wire surrounded by a woven metal mesh which is the ground connection. This ground connection
provides some shielding of the wire.
The ideal oscilloscope probe is completely immune to all noise sources. As a result, the signal delivered
to the oscilloscope has no more noise on it than what appeared on the signal at the test point. In
practice, use of shielding throughout the probe allows probes to achieve a high level of noise immunity
for most common signal levels. Noise, however, can still be a problem for certain low-level signals. In
particular, common mode noise can present a problem for differential measurements, as will be
discussed later.
Exercise
1. For minimum probe loading, what would the impedance of the probe need to be?
a. Rp = ∞ and Cp = 0
b. Rp = 0 and Cp = ∞
c. Rp = 0 and Cp = 0
d. Rp = ∞ and Cp = ∞
Vmeas = _________________
tr = ____________________
Passive voltage probes are typically specified by bandwidth and attenuation factors such as 1X or 10X.
Attenuation factor represents the ratio of input to output signal amplitude.
The most common probes provide at least as much bandwidth as the oscilloscope and have a 10X
attenuation factor. This is a good compromise between bandwidth, capacitive probe loading, and
sensitivity for the majority of applications.
In small-signal applications which require the best vertical sensitivity of an oscilloscope, a 1X probe can
be used. However, the capacitive loading will likely be much higher and the bandwidth will likely be
much lower. You can also use a switchable 1X/10X probe for a mix of low amplitude signals (<1 V) and
moderate to high amplitude signals (10 V or more). For example, the standard passive probe provided
with the MSO/DPO2000 Series oscilloscope is the P2221 which provides switchable 1X/10X
attenuation.
Exercise
1. Using a P2221 passive probe with the 10X attenuation selected, what is the approximate tr value if
RD = 100 k ?
tr = ______________________________
2. Using a P2221 passive probe with the 1X attenuation selected, what is Vmeas if RD = 100 k and
VD = 5 V?
Vmeas = ______________________________
Active Probes
Active voltage probes include active components such as transistors and amplifiers and require power
to operate. A simplified schematic of an active probe looks like this:
Tip Cable
Active probes have a very low input capacitance. As a result, the probe can maintain a high input
impedance over a broad range of frequencies. The high input impedance of an active probe allows
measurements at test points of unknown impedance with much less risk of loading effects. With low
loading, active voltage probes can be used on high-impedance circuits that would be seriously loaded
by passive probes. Also, active probes are less sensitive to the effects of inductance in long ground
leads.
However, the active components do have a more limited maximum input voltage range due to
limitations in the amplifier and its power supplies.
Compare the specifications for the recommended passive and active probes for the MSO/DPO2000
Series oscilloscopes:
Passive Probe Active Probe
P2221 (10X position) TAP1500
Attenuation 10X 10X
Bandwidth DC to 200 MHz DC to 1500 MHz
Input Capacitance 17 pF (typ) ≤1 pF
Input Resistance 10 MΩ 1 MΩ
Max. Input Voltage 300 VRMS CATII ±8 V
As you can see, the probe’s shape, especially the probe tip is also very different from a passive probe.
This smaller form factor and accessories make it easier to get the probe tip and ground much closer to
small, surface-mounted components. Also note the larger box which connects to the oscilloscope. This
box contains the power supply circuitry needed to power the active circuitry in the probe.
Exercise
1. Using a P2221 passive probe with the 10X attenuation selected, what is tr if RD = 100 k ?
tr = ______________________________
tr = ______________________________
Differential Probes
Passive and active voltage probes measure voltages relative to ground. Sometimes, it is necessary to
measure the difference between two voltages where neither are at ground. These “differential” signals
are referenced to each other instead of ground. Examples of differential signals are disk drive read
channel signals, multi-phase power systems, and RS-422 and CAN data communication signals.
In some cases, you can measure differential signals by using two probes to make ground-referenced
measurements and then using the oscilloscope’s math functions to subtract one channel from the other.
This works if the signals are low frequency and have enough amplitude to rise above any concerns of
noise.
However, this approach has problems. Any differences in propagation delay between the probes and
oscilloscope channels will result in skewing of the signals. On high-speed signals, this especially can be
a problem resulting in significant amplitude and timing errors. Also, any difference in gain or frequency
response between the two channels will result in incomplete cancellation of “common-mode” noise or
rejection of noise that is impressed on both signal lines by such things as nearby clock lines or noise
from external sources such as fluorescent lights.
Tip Cable
Input 1 +
Input 2 _
A differential probe, as shown here, uses a differential amplifier in the probe head close to the device to
subtract the two signals, resulting in one differential signal for measurement by one channel of the
oscilloscope. Because of the matching of the signal paths within the probe, a differential probe can
provide very high “common mode rejection ratio” (CMRR) performance over a broad frequency range.
Compared to subtracting passive probe measurements, the advantages of active differential probes
are:
Wide bandwidth
Large Common Mode Rejection Ratio (CMRR)
Minimal skew between inputs
Small input capacitance
Because they are active probes, the primary disadvantages of differential probes compared to passive
probes are:
Higher Cost
Limited Dynamic Range
Mechanically Less Rugged
As you can see in figures 16 and 17, the shape of the probe tip and even the accessories are specially
designed to keep both inputs matched. The smaller form factor probe shown in figure 16 is designed for
high frequencies and connection to microelectronic devices, while the probe shown in figure 17 is
designed for high voltages and connection to large power components.
Figure 16: Tektronix TDP0500 & TDP1000 Figure 17: Tektronix P5205 High-Voltage,
Differential Probes. Differential Probe.
Current Probes
Voltage probes can be used to measure current flowing through a circuit by measuring the voltage drop
(usually a differential measurement) across a known resistance (which may have to be added to the
circuit). You then must divide the voltage by the resistance value to get the current.
There is a better way to make current measurements – a current probe. Current flow through a
conductor causes an electromagnetic flux field to form around the conductor. Current probes are
designed to sense the strength of this field and convert it to a corresponding voltage for measurement
by an oscilloscope. This allows you to view and analyze current waveforms with an oscilloscope. When
used in combination with an oscilloscope’s voltage measurement capabilities, current probes also allow
you to make a wide variety of power measurements.
There are basically two types of current probes for oscilloscopes. AC current probes, which usually are
passive probes, and AC/DC current probes, which are generally active probes. Both types use the
same principle of transformer action for sensing alternating current (AC) in a conductor. AC/DC probes
have an additional device, known as a Hall Effect device, for detecting DC since DC doesn’t cause a
changing flux field and, thus, cannot cause transformer action.
There are also basically two form factors for current probes, split-core and fixed-core. With a fixed core
current probe, the conductor to be measured must be fed through the conductor of the transformer on
the probe then reconnected to the device. The advantage of a fixed-core probe is its high frequency
response for measuring very fast, low amplitude current pulses and AC signals. Split-core current
probes, like the ones shown below, allow the probe to encircle the conductor. These probes offer
significantly simpler connection to most circuits.
Another important feature of some current probes is automatic scaling. With current probes such as
those shown below, the probe communicates the proper scale factors and units so the oscilloscope
displays the waveforms and measurements with the proper units (for example, Amperes).
As you can see in the pictures below, the split-core probe tips are designed to clamp around a
conductor. The smaller form factor current probe is designed for currents up to 30 ARMS / 50 Apeak and
frequencies ≥120 MHz, while the other probe shown is designed for higher currents (up to 150 ARMS /
500 Apeak) at frequencies up to 20 MHz and connection to much larger conductors.
Figure 18: Tektronix TCP0030 Current Probe. Figure 19: Tektronix TCP0150 Current Probe.
Exercise
1. You need to measure the voltage across a device, where neither voltage is at ground. What probe
type should you use?
2. You need to measure the current flowing through a device. What probe type should you use?
3. If you need to test a high frequency circuit, what type of probe do you probably need?
c. Attach the black probe ground lead to the ground connector on the lower right corner of the
oscilloscope. Squeeze the widest part of the ground connector to open the alligator jaws. Attach
to the connector.
d. Attach the probe tip to the PROBE COMP signal next to the ground. Hold the probe like a
syringe and pull back on the spring-loaded tip to expose the probe’s hook tip. Attach to the
connector.
e. Press the front-panel Autoset button to automatically set up the oscilloscope.
4. Probes are designed to match the inputs of specific oscilloscope models. However, there are slight
variations between oscilloscopes and even between different input channels in an oscilloscope. To
minimize these variations, you must “compensate” a passive probe every time you change a
probe/channel connection of your oscilloscope. Compensation is the process of manually adjusting
the AC attenuation by adjusting the ratio of the capacitances which appear in parallel with the
probe’s attenuator resistances.
a. Find the adjustment tool provided with the probe or other small, non-magnetic screwdriver.
b. Insert the probe adjustment tool in the small hole in the probe body near where the probe is
attached to the oscilloscope BNC input connector.
c. Slowly turn the adjustment until the oscilloscope is displaying the calibration waveform with flat
tops with no overshoot or rounding.
d. As you touch the channel 2 probe to the PROBE COMP signal, you should see that the display
is basically unchanged, indicating that the second probe is not significantly loading the signal.
Key Points to Remember
1. There are a variety of ways to connect a probe to a circuit.
2. A spring-loaded tip works well for connecting to many test points, square pin connectors and
individual wires.
3. When troubleshooting a circuit, it is often easier to use a sharp probe point. This allows you to
accurately position the probe tip on fine-pitch components.
4. It is also important to verify that the probe is not loading the signal too much. One simple way to do
this is to watch the signal as a second probe is added.
Final Exercise
1. An oscilloscope probe is:
a. Just a wire.
b. Usually just a coaxial cable.
c. A complete circuit consisting of passive and possibly active electronic components.
d. Unnecessary for most measurements.
2. You should choose your oscilloscope probe by:
a. Use the one that is already connected to the oscilloscope.
b. Choose the right probe, based on the circuit impedance and signal frequency and amplitude.
c. Grab the first one you see in the bench drawer.
d. Distract the person next to you and take theirs.
3. Oscilloscope probes are characterized by:
a. Bandwidth.
b. Maximum voltage rating.
c. Input capacitance.
d. All of the above.
4. Probes can connect to various:
a. Test points.
b. Connectors.
c. Component leads.
d. All of the above.
5. Probes can affect the quality of electronic measurements by:
a. Adding DC loading, because of the probe’s input resistance.
b. Adding AC loading, because of the probe’s input capacitance.
c. Changing the shape of the waveform because of the probe’s bandwidth.
d. All of the above.
6. This final exercise will require the use of the skills and knowledge gained to this point.
a. Begin by using the USB cable to
connect the demonstration
board to the oscilloscope’s USB
port as shown in the figure to
the right.
b. Connect both P2221 oscilloscope probes to channel 1 and channel 2. Set the 1X/10X slide
switch on both probes to 10X.
c. Connect the vertical channel 1 probe’s alligator ground tip to
the GND connector and the probe tip to the pin labeled
CNT_CLK as shown in the figure to the right.
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