µ-Lab Patent Pending

A compact millimeter-wave measurement system for microchips and antennas

 µ-Lab is suited for the collection of far-field and near-field electromagnetic data of chips and
miniature antenna assemblies in the millimeter waveband. It is the ideal measurement system
for testing M2M devices using WiGig technology. The extra-wide door on this compact anechoic
chamber enables easy access and mounting of the DUT. µ-Lab is a portable turn-key system that
can be moved to any preferred location. MVG’s 959 Spectrum software complements the µ-Lab
for complete data acquisition and analysis.

+ • Millimeter wave measurement

capabilities
System configurations
Software
• Wide range of antenna configurations
Measurement control, data acquisition and post-processing
• Compact and portable
(case specific)
■ 959 Spectrum
■ MiDAS
SOLUTION FOR
• Chip measurements
Equipment
• Miniature connectorized antenna measurements ■ Elevation axis positioner: rotary, lightweight gantry-arm assembly
• Measurements of laptop and other devices ■ Azimuth axis: standard bearing and motor assembly
■ Stationary DUT platform
■ DUT support: various configurations possible
■ Manual polarization positioner

Main features ■
■
Standard Digital Servo Controller and Amplifier, Model AL-4164-1
Source and receiver: Agilent PNA standard, other options available
■ RF amplifiers and cables
Technology ■ Vibration isolation
• Near-field / Spherical Add-ons
• Far-field / Spherical
 M illimeter wave VNA extension heads (e.g., VDI or equivalent)
Measurement capabilities frequency banded
 Standard gain horns
• Gain  Centered column for connectorized device measurements
• Directivity  Micro-probing for chip device measurements (offset mount)
• Sidelobe levels - user-defined criteria  Microscope camera w/ visualization screens for on-chip testing
• Null depth- search for user-defined null level (e.g, -3, -10, etc.)  Equipment rack
• Time domain response capacity  67 to 75 GHz coverage (hardware changes to meet these
• Dynamic density control - real time speed adjustments frequencies)
• Beam width - user-defined beamwidth analysis
(1 dB, 3 dB, etc.) Accessories
• Pass/fail criteria - user defined specification levels ■ Folding/retractable PC work desk
(e.g., minimum gain spec over angular region) ■ Extra space in cart for material and tool storage
• Capabilities up to 2 millimeter wave bands (V and W), ■ Leveling feet
others upon request
Services
Frequency bands
■ Training
• 50-110 GHz ■ Calibration and maintenance
• 18-50 GHz optional ■ Warranty
• Other bands possible upon request  Post warranty service plans*

Max. size of DUT

*R
 efer to ORBIT/FR service brochure  Included  Optional  Required
• On centered support column: as large as a standard for more information
laptop
• On offset column for chip measurements: 5 cm x 5 cm
(chipset)

Dynamic range
• > 60 dB at 50-110 GHz

2
 System overview

Vector Network
Analyzer (e.g., PNA)
10 MHz - 26.5 GHz

Elevation Rotator
Millimeter wave
extension

959 Spectrum
Antenna Measurement
Workstation
RF Subsystem

Azimuth Rotator

Millimeter wave
extension

Positioner
Controller

The positioning subsystem consists of a lightweight Measurement bands are reconfigurable to allow wide band-
precision gantry arm assembly mounted on an azimuth width operation of the system. The system is designed for
positioner. The near-field probe, mounted on the gantry convenient manual changeover. Measurements can be
arm, can be rotated to change polarization. The gantry arm set up in a single test or batch configuration. Analysis and
assembly rotates in azimuth to cover all the longitudinal plotting can also be included in the batch test. Overall,
cuts on the measurement sphere. The DUT remains fixed µ-Lab provides a unique, small, portable measurement test
on a stationary disk while the probe rotates in elevation and capability for a wide variety of antennas.
azimuth around the DUT to cover the measurement sphere.

3
 Standard system components
The microscope
Anechoic camera (optional) folds
chamber conveniently onto
• The chamber is approximately 7 the top of the chamber
feet high and 5 feet long x 5 feet when not in use.
wide (not including side tabletop).
It is mounted on casters for full
portability. A folding tabletop
is attached to the chamber for
peripheral computer equipment.

Equipment rack
Including:
• VNA
• AL-4164 Positioner Control Unit
• Power conditioning
• Measurement computer
• LAN switch assembly

Positioning
subsystem
Near-field probe positioning is
provided for by the elevation
Measurement specifications*
gantry arm. The elevation axis is Frequency Range 50 - 110 GHz* (V and W bands)
comprised of a standard rotary
Measurement Radius 15 in (38.1 cm) nominal
positioner, probe arm assembly,
and necessary electronic Positioner Speeds Up to 9 deg/sec typ.
and RF equipment. Typical Data Acquisition Speed 10-120 minutes depending
on the test scenario

DUT platform Sidelobe Level Accuracy +/- 1 dB peak error at - 20 dB typ.

Gain Accuracy +/- 0.5 dB typ
The center mounted support
foam column accommodates System Dynamic Range > 60 dB 50-110
small connectorized antennas * V band measurements over 50-67 GHz unless full coverage to 75 GHz is required
and items up to the size of a
standard laptop. The offset
support column supports antenna
chips up to 5 cm x 5 cm. Mechanical Characteristics
The DUT support columns
Dimensions 7 ft H x 5ft W x 5 ft L
are easily swappable between
© 2014 - Graphic design: www.ateliermaupoux.com - Pictures: all rights reserved

(2.13 m x 1.52 m x 1.52 m) nominal

connectorized and
non-connectorized testing, Max size DUT • On centered support column:
with a storage cart available for as large as a standard laptop
the support that is not in use. • On offset column: 5 cm x 5 cm
(chipset)

Contact your local sales representative

for more information
www.microwavevision.com
[email protected]