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    Xavier Institute of Engineering, Mumbai-16

    Uploaded by

    Shailaja Udtewar
    This document is a midterm test for a class in Electronics Instrumentation and Control. It contains 2 questions with multiple parts each. Question 1 covers the working principle of LVDT, deriving the gauge factor for strain gauges, and different types of telemetry systems. Question 2 covers stability analysis using Routh's criteria, sketching a root locus for a unity feedback system, and constructing a Bode plot for a given transfer function. Students must answer any two parts from each question and the test is worth a maximum of 20 marks over 1 hour.

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    Xavier Institute of Engineering, Mumbai-16

    Uploaded by

    Shailaja Udtewar
    17 views2 pages
    This document is a midterm test for a class in Electronics Instrumentation and Control. It contains 2 questions with multiple parts each. Question 1 covers the working principle of LVDT, deriving the gauge factor for strain gauges, and different types of telemetry systems. Question 2 covers stability analysis using Routh's criteria, sketching a root locus for a unity feedback system, and constructing a Bode plot for a given transfer function. Students must answer any two parts from each question and the test is worth a maximum of 20 marks over 1 hour.

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    KJHH

    Original Title

    EIC Test2 2017

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    This document is a midterm test for a class in Electronics Instrumentation and Control. It contains 2 questions with multiple parts each. Question 1 covers the working principle of LVDT, deriving the gauge factor for strain gauges, and different types of telemetry systems. Question 2 covers stability analysis using Routh's criteria, sketching a root locus for a unity feedback system, and constructing a Bode plot for a given transfer function. Students must answer any two parts from each question and the test is worth a maximum of 20 marks over 1 hour.

    Copyright:

    © All Rights Reserved
    Download as DOCX, PDF, TXT or read online from Scribd
    Download as docx, pdf, or txt
    17 views2 pages

    Xavier Institute of Engineering, Mumbai-16

    Uploaded by

    Shailaja Udtewar
    This document is a midterm test for a class in Electronics Instrumentation and Control. It contains 2 questions with multiple parts each. Question 1 covers the working principle of LVDT, deriving the gauge factor for strain gauges, and different types of telemetry systems. Question 2 covers stability analysis using Routh's criteria, sketching a root locus for a unity feedback system, and constructing a Bode plot for a given transfer function. Students must answer any two parts from each question and the test is worth a maximum of 20 marks over 1 hour.

    Copyright:

    © All Rights Reserved
    Download as DOCX, PDF, TXT or read online from Scribd
    Download as docx, pdf, or txt
    of 2

    Xavier Institute of Engineering, Mumbai-16

    ( Affiliated to University of Mumbai)

    Midterm Test 2
    Max. Marks:20 Duration: 1Hr
    Class: S.E Semester: III
    Name of the Course: Electronics Instrumentation and Control Branch: EXTC
    Course Code: ETC305

    Instructions:

    (1) Solve Any two from Q1


    (2) Solve Any two from Q2

    Question Marks
    No.
    Q1 (a) Explain with neat diagram the working principle of LVDT. 05

    Q1 (b) Derive Gauge Factor for strain Gauge. 05

    Q1 (c) Discuss different types of telemetry systems. 05

    Q2 (a) The characteristic equation of a system is 05

    Find i) Range of K for which system is stable


    ii) Frequency of Oscillations using Routh’s criteria
    Q2 (b) Sketch the Root Locus for a unity feedback control system with open loop 05
    transfer function

    Q2 (c) Construct the Bode plot for the following transfer function 05

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