Lecture 01
Lecture 01
Introduction
Highlight
Course orientation
– Objective, textbook, assignments, and grading policy
VLSI design
– History, today, and tomorrow
– Design flow: Integration and abstraction
Key design metrics:
– Area, performance, power, reliability, and cost
Challenges and trend for nano-VLSI
Reading: Chapter 1
Handout: the syllabus and schedule
EEE525, ASU, Y. Cao Lecture 01 -2-
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Basic Information
Instructor: Y. Kevin Cao, GWC 336
– Office hour: MW, 1:30-2:30pm; E-mail: [email protected]
Textbook:
– CMOS VLSI Design: A Circuits and Systems Perspective, by
Neil H. E. Weste and David Harris
Other references:
– Design of High-Performance Microprocessor Circuits, Edited by
A. Chandrakasan, et al.
– Digital Integrated Circuits: A Design Perspective, by Jan M.
Rabaey, et al. (http://bwrc.eecs.berkeley.edu/IcBook/)
Lab at GWC 273, with TA available
Lectures etc. are available at http://my.asu.edu
EEE525, ASU, Y. Cao Lecture 01 -3-
Design metrics
Fundamental Practical
CMOS, interconnect, ALU, memory, datapath,
cost, performance,
inverter, logic styles clock, power, I/O, CAD
power, and reliability
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Assignments
Homework (15%): exercise your learning
– Totally five: three before Midterm and two after it
– Part of them will be software labs
Project : design and optimization of a datapath circuit
– Phase I (15%): schematic design with Spectre/SPICE
– Phase II (15%): layout, extraction, and optimization
– Two people per group, with balanced contribution
– The load will be adjusted for online students
– Grade is based on the ranking of design quality: speed, power,
area, layout, and report
Examination: evaluate your knowledge
– One mid-term (25%): design fundamentals
– Final (30%): majority of the final is from the second half
EEE525, ASU, Y. Cao Lecture 01 -5-
Grading Policy
Letter grade depends on the relative distribution,
with + and – (µ: average; σ: standard deviation)
– A+: top 10%
– A: > µ + 0.5·σ
– A-: > µ
– B+: > µ - 0.5·σ
– B: > µ - σ
– C: > µ - 1.5·σ
– D: else
HW (15%), Project (30%), Midterm (25%),
Final (30%)
EEE525, ASU, Y. Cao Lecture 01 -6-
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Highlight
Course orientation
– Objective, textbook, assignments, and grading policy
VLSI design
– History, today, and tomorrow
– Design flow: Integration and abstraction
Key design metrics:
– Area, performance, power, reliability, and cost
Challenges and trend for nano-VLSI
Reading: Chapter 1
Handout: the syllabus and schedule
EEE525, ASU, Y. Cao Lecture 01 -7-
4
The First Electronic Computer
ENIAC
(1946)
by U.S.A.
Transistor
(1947)
by Bell Labs
5
The First Integrated Circuit
Integrated Circuit
(1958)
by TI
Size: ~ 9mm2,
2.3 K transistors @10µm
Speed: 1MHz
Design team: 3
6
The Pentium 4 CPU
MOSFET
Interconnect
P4 CPU (2002)
Size: ~217mm2, 42M @ 0.18µm
Speed: 2GHz
Design team: 1000
EEE525, ASU, Y. Cao Lecture 01 - 13 -
Moore’s Law
In 1965, Gordon Moore (Intel) noted that the number of
transistors on a chip doubled every 18 to 24 months.
Prediction: semiconductor technology will double its
effectiveness every 18 months
16
COMPONENTS PER INTEGRATED FUNCTION
15
14
13
LOG2 OF THE NUMBER OF
12
11
10
9
8
7
6
Electronics,
5
4
3
2
1
0 April 19, 1965
1959
1960
1961
1962
1963
1964
1965
1966
1967
1968
1969
1970
1971
1972
1973
1974
1975
7
Moore’s Law in Microprocessors
Year
Chip
Transistors 1980 1990 2000 2010 Frequency
(Hz)
1000M 3.2G
100M
Itanium 1.0G
10M
Pentium 200M
1M
80386
• Transistor counts: 2x
33M/ 2 years
100K
8086 • Channel length: 0.7 5M
/ 18 months
Technology 3.0µm 1.0µm 0.35µm 180nm 50nm
Node
Clock Frequency
10000
Doubles every
1000
2 years
Frequency (Mhz)
P6
100
Pentium ® proc
486
10 8085 386
8086 286
1 8080
8008 • Clock frequency: 2x / 2 years
4004
0.1
1970 1980 1990 2000 2010
Year
8
Evolution in Complexity
P6
10 486 Pentium ® proc
386
286
8080 8086
8085
8008 • Die Size: 14% / 2 years
4004
or 2x in 10 years
1
1970 1980 1990 2000 2010
Year
9
Driving Forces
Technology scaling
– Semiconductor device shrinks by 0.7x / generation
Circuit and System design
“Cleverness”
Functions per chip doubles every generation;
chip cost does not increase significantly
– Cost of a function decreases by 2x
On the other hand:
– Design population does not double every two years…
– Productivity per designer decreases due to
complexities of design and team management
Design Abstraction
SYSTEM
MODULE
GATE
CIRCUIT
DEVICE
G
S D
n+ n+
10
Top-Down Design Flow
systems
systems
application software
Outp
ut M2
h=
system software 3;
k = h; h
k >3;
T h<
M1
platform / architecture h
sa pchg#
3;
circuits
LA T C H
s a b it
s a b it #
devices/interconnect
structures
structures
materials
materials
physics
physics
Design knobs:
– Architecture (gates/block, register count, etc)
– Circuit style (static, dynamic, etc)
– Circuit implementation (sizing, layout, VDD, etc.)
– Physical design (placement, routing, etc.)
EEE525, ASU, Y. Cao Lecture 01 - 22 -
11
IC Design Tools
Synthesis
– Micro-architectural, Logic, Automatic physical generation
Static Analysis
– Design rule checking (DRC), Circuit parasitics extraction,
Timing analysis, Test generation
Dynamic Analysis
– Architectural simulation, Logic, Circuit simulation (SPICE)
for speed and power, Test verification
Tool capability is limited and exploited by your
physical understanding
Highlight
Course orientation
– Objective, textbook, assignments, and grading policy
VLSI design
– History, today, and tomorrow
– Design flow: Integration and abstraction
Key design metrics:
– Area, performance, power, reliability, and cost
Challenges and trend for nano-VLSI
Reading: Chapter 1
Handout: the syllabus and schedule
EEE525, ASU, Y. Cao Lecture 01 - 24 -
12
Challenges in Future VLSI
“Microscopic Problems” “Macroscopic Issues”
• Ultra-high speed design • Time-to-Market
• Interconnect • Millions of Gates
• Noise, Crosstalk • High-Level Abstractions
• Reliability, Manufacturability • Reuse & IP: Portability
• Power Dissipation • Predictability
• Clock distribution
Power Dissipation
105 103
18KW
104 5KW 102 Switching
1.5KW
101
Power (Watts)
Power (W)
103 500W
100
Pentium® proc
102 10-1
486 10-2
10 8086 386
8080 10-3 Source: Intel
Leakage
1 4004 10-4
10µm 1µm 100nm 10nm
0.1
Technology node
1971 1974 1978 1985 1992 2000 2004 2008
Year
13
Power Density
Power/transistor switching goes down with
technology scaling, but:
10000
Rocket
Power Density (W/cm2)
1000 Nozzle
Nuclear
100 Reactor
Hot Plate
8086
10 P6
4004
8008 8085 386 Pentium
286 486
8080
1
1970 1980 1990 2000 2010
Source: Intel
Year
EEE525, ASU, Y. Cao Lecture 01 - 27 -
IBM ES9000
12
Bipolar CMOS
10
8 Fujitsu VP2000
IBM 3090S IBM RY5
NTT
6 IBM RY7
Fujitsu M-780
4 IBM3090
CDC Cyber 205
Pulsar
IBM RY6
IBM4381
IBM3084 IBM RY4
2 IBM370 Fujitsu
Apache
IBM360 IBM3033 M380 Pentium II
0
1950 1960 1970 1980 1990 2000 2010
Year of Announcement
14
Cost of Integrated Circuits
NRE (non-recurrent engineering) costs
– design time and effort, mask generation
– one-time cost factor
Recurrent costs
– silicon processing, packaging, test
– proportional to volume
– proportional to chip area
NRE Cost
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Recurrent Cost
Cost per Transistor
10-4
10-5
Dollar
10-6
10-7
10-8
10-9
1µm 100nm 10nm
Reliability
Process variations
Dynamic uncertainties:
– Temperature
– Power supply (Ldi/dt noise)
138 W/cm2
– Crosstalk
– Soft error
16
Design Trend I: Integration
Integrate various technologies
Integral design solutions
Small Power
Signal RF RF
Power
Management
Analog
Baseband
Digital Baseband
(DSP + MCU)
Design of Nanoelectronics
1947 1958
???
Carbon Nanotube
FET
1993 2006
17
Design Trend II: Parallelism
Broader Applications
Digital IC have come a long way and still have
quite some potential left for the coming
decades:
– Computation and Communications
– Automobile (30-70 chips/car now)
– Consumer electronics
– Energy conservation
– Security and intelligence
– Biomedical
– Much more with your innovation
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Summary
EEE 525: design fundamentals and practices
underlying the VLSI system integration
Metrics: area, speed, power, reliability, and cost
Challenges ahead: power, cost, and reliability
Clear understanding from a circuit perspective
Contact: [email protected]
Office hours: MW 1:30-2:30pm, GWC 336
Web access: http://my.asu.edu
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