Lahore University of Management Sciences

EE340+L Devices and Electronics + Lab

Instructor Wasif Tanveer Khan and Hassan Abbas Khan

Course Basics
Credit Hours 3+1
Lecture(s) Nbr of Lec(s) Per Week 2 Duration 75 minutes each
Recitation (per week) Nbr of Lec(s) Per Week 0 Duration N/A
Lab (per week) Nbr of Lec(s) Per Week 1 Duration 150 minutes

Course Distribution
Core Y
Elective N
Open for Student Category Electrical Engineering, Physics
Close for Student Category

COURSE DESCRIPTION
This course lays down the foundations for the design of electronic devices and systems for a variety of applications. This includes the
construction, characteristics and working of diodes, bipolar junction transistors (BJT) and field effect transistors (FET). It will cover topics on
modeling of microelectronic devices, basic microelectronic circuit analysis and design, physical electronics of semiconductor junction and MOS
devices, development of circuit models, and understanding the uses and limitations of various models. The semiconductor fundamentals,
doping and carrier densities, carrier transport and generation-recombination, and the semiconductor equations, which provide a
mathematical description of electrons and holes in semiconductors will be covered. The small signal behavior of BJT and FET transistors is
studied along with appropriate mathematical models. The course also provides an introduction to the design of power amplifiers and switching
circuits.

COURSE PREREQUISITE(S)
EE240 Circuits I (required)
EE242 Electricity and magnetism (May be waived through Instructors permission)

COURSE OBJECTIVES
1. To introduce the students to the fundamentals of semiconductors and semiconductor devices.
2. Study the structure, characteristics and behavior of fundamental set of discrete electronic devices.
3. Develop skills needed for analysis and design of electronic circuits and systems using these components.

Course Learning Outcomes

CLO1: Develop an understanding of the semiconductor bonding and energy band models,
semiconductor carrier properties and statistics, and carrier action.

CLO2: An ability to apply standard device models to explain/calculate critical internal parameters
and standard terminal characteristics of the pn-junction diode

CLO3: Understand the diode circuit models and analyze different application circuits using these
models
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CLO4: Understand the transistor circuit models for MOSFETs and analyze different application
circuits using these models
CLO5: Understand the transistor circuit models for BJTS and analyze different application circuits
using these models
CLO6: Apply the knowledge in lab environment working as a group
Relation to EE Program Outcomes
EE-352 CLOs Related PLOs Levels of learning Teaching Methods CLO Attainment checked in
CLO1 PLO1 Cog 3 Instruction, Tutorial, Assignments Midterm, Final
CLO2 PLO2 Cog 4 Instruction, Tutorial, Assignments Midterm, Final
CLO3 PLO2 Cog 3 Instruction, Tutorial, Assignments Midterm, Final
CLO4 PLO2 Cog 3 Instruction, Tutorial, Assignments Final
CLO5 PLO2 Cog 3 Instruction, Tutorial, Assignments Final
CLO6 PLO5 Psycho 3 Instruction, Labs Lab Reports + Project

Grading Breakup and Policy

Examination Detail
Yes/No: Yes
Combine/Separate: Combined
Midterm Duration: 03 hrs
Exam
Preferred Date: During Mid-week
Exam Specifications: Closed book, closed notes, formula sheet provided by the instructor, calculators
Yes/No: Yes
Combine/Separate: Combined
Final Exam Duration: 03 hrs
Exam Specifications: Closed book, closed notes, formula sheet provided by the instructor, calculators

COURSE OVERVIEW
Related CLOs &
Lecture Topics Recommended Readings
Additional Remarks
1. Semiconductors General Introduction SDF: Ch. 1 CLO1
2. Semiconductors Models and material classification SDF: Ch. 1, 2 CLO1
3. Carrier Modeling: Carrier densities, Doping SDF: Ch. 2 CLO1
4. Density of States, Fermi Energy, Carrier distributions SDF: Ch. 2 CLO1
5. Transport mechanism SDF: Ch. 3 CLO1
6. Drift and Diffusion Currents SDF: Ch. 3 CLO1
7. Recombination/Generation SDF: Ch. 3 CLO1
8. pn Junction structure and electrostatics SDF: Ch. 5 CLO2
9. pn Junction Electrostatics SDF: Ch. 5, CLO2
10. Electrostatics and Junction I-V characteristics SDF: Ch. 5, 6 CLO2
11. I-V characteristics- quantitative solution SDF: Ch. 6 CLO2
12. Introduction to circuit analysis with non-linear elements S&S: Ch. 4 CLO3
13. Diode circuits models S&S: Ch. 4 CLO3
14. Diode circuits analysis and applications S&S: Ch. 4 CLO3
15. Midterm
16. MOSFET Structure and physical operation S&S: Ch. 5 CLO4
17. MOSFET device operation and models S&S: Ch. 5 CLO4
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18. MOSFET Biasing and DC analysis S&S: Ch. 5 CLO4
19. MOSFET Small signal models and analysis S&S: Ch. 5 CLO4
20. MOSFET Amplifier configurations and characteristics S&S: Ch. 5 CLO4
21. MOSFET Amplifier configurations and characteristics S&S: Ch. 5 CLO4
22. BJT Structure and physical operation S&S: Ch. 6 CLO5
23. BJT device operation and models S&S: Ch. 6 CLO5
24. BJT Biasing and DC analysis S&S: Ch. 6 CLO5
25. BJT Small signal models and analysis S&S: Ch. 6 CLO5
26. BJT Amplifier configurations and characteristics S&S: Ch. 6 CLO5
27. Frequency response of a MOSFET CS amplifier S&S: Ch. 9 CLO4
28. Frequency Response of BJT CE amplifier S&S: Ch. 9 CLO5

Textbook(s)/Supplementary Readings
Textbook:
Semiconductor Device Fundamentals (SDF) by Robert Pierret, Addison Wesley, 1996
Microelectronic Circuits by Sedra and Smith, 6th Edition, Oxford University Press, 2010
Supplementary Reading:
Microelectronic Devices & Circuits by Clifton Fonstad, 2006 Electronic Edition, http://dspace.mit.edu/handle/1721.1/34219

Labs
Session 1: Lab No. 1: Diode characteristics 1 week CLO6
1. - Characteristics of different semiconductor diodes and understand the parameters
used to model their behavior.
Session 2: Lab No. 1: Diode characteristics 1 week CLO6
2. - Characteristics of different semiconductor diodes and understand the
parameters used to model their behavior.
Session 3: Lab No. 2: Diode applications 1 week CLO6
3. - Use of diode as a rectifier, ripple reduction with capacitor filter, regulation
using a zener diode, clamping circuit and voltage multipliers
Session 4: Lab No. 2: Diode applications 1 week CLO6
4. - Use of diode as a rectifier, ripple reduction with capacitor filter, regulation
using a zener diode, clamping circuit and voltage multipliers
Session 5: Lab No. 3: MOSFET Characteristics 1 week CLO6
5. - Characteristics of a MOSFET device and understanding the parameters used to
model its behavior.
Session 6: Lab No. 4: Transistor as an amplifier 1 week CLO6
6. - Biasing schemes and amplification characteristics of a single stage common
source MOSFET amplifier.
Session 7: Lab No. 4: Transistor as an amplifier 1 week CLO6
7. - Biasing schemes and amplification characteristics of a single stage common
source MOSFET amplifier.
Session 8: Lab No. 5: Common Drain and Common Gate Amplifiers 1 week CLO6
8. - Biasing and amplification characteristics of a common gate and common drain
MOSFET amplifiers
Session 9: Lab No. 6: Frequency Response 1 week CLO6
9. - High frequency and low frequency response of a common source MOSFET
amplifier
Session 10: Lab No. 7: CMOS Digital Logic Inverter 1 week CLO6
10. - Voltage transfer characteristics and dynamic operation of CMOS digital logic
inverter
11. Session 11: Lab No. 8: Switching Circuits and Timers 1 week CLO6
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- Design and working of discrete component multi-vibrators with BJTs and
applications of 555 timer
Sessions 12 14: Final Project: Group project (4 members maximum) 1 week CLO6
12.
- Proposal to be submitted in week 10.