Introduction of OIM6.

0 Software
TECHNICAL BULLETIN-EBSD

Figure 3. To center the cluster near the center of

the pole figure, the user would have to estimate
Introduction the correct rotations in the manual entry part
of the dialog and close the dialog to apply
Orientation Imaging Microscopy (OIM) is a technique the rotations. Now, a click at the cluster
rotates the data so that the cluster is at
used to obtain crystallographic orientation, grain the center of the pole figure. This is
boundary character, and phase distribution information reflected in the pole figure in real time
from single and polyphase crystalline materials through and the rotations applied to the data
set after Oking the dialog.
the collection of Scanning Electron Microscope (SEM)
based Electron Backscatter Diffraction (EBSD) patterns.
The OIM 6.0 system consists of the Data Collection
and Analysis software packages. OIM Data Collection
software is used, in conjunction with an EBSD detector
and SEM, to automatically capture and analyze EBSD
patterns to compile OIM datasets. OIM Analysis is
the standalone application used for the creation of
maps, plots, and charts detailing the sampled
microstructure as well as highlighting and partitioning of
data for advanced analysis. Delphi is the dedicated
Phase Identification application using combined EBSD
and Energy Dispersive Spectroscopy (EDS).

Figure 1. A combined
image quality and OIMSoftware is Easier to Use
orientation map from the
Gibeon meteorite. Expanded QuickGen and Template Functionality:
Easier initial access to the most commonly used
functions in OIM Analysis software and one-button
complete analysis using template files with a
comprehensive template library
Full Image Area Mapping: Map full image area with
scan resolution selected automatically by the number
of points desired in the map, resulting in quicker time-
to-mapping
Easier Data Rotations: Fast data rotation based on
manual selection using pole figures for easy
Figure 2. A combined alignment of data (see Fig. 3)
image quality and
orientation map from a Interactive page colors make quick measurements
partially recrystallized easier to understand and utilize
steel.
The system level
settings are
password protected,
though the improved
user interface allows
users access to
OIM 6.0 software is the first microanalysis package to
options needed for
be written for 64-bit processor and Microsoft Windows
data collection
7 compatibility. OIM Analysis software allows for
without changing
very large scan files to be handled on systems with a
critical system
64-bit processor and operating system. Some recent
settings (see Fig. 4)
examples of analysis include datasets that are an Figure 4. Improved user interface.
order of magnitude larger than current systems
(>40 million data points).
Results with Confidence
 Enhanced Batch Processor: More comprehensive
automated analysis of multiple datasets using a range
of template types. Useful for both routine analysis, 3D,
or in-situ measurements for faster, repeatable, and
consistent data analysis
Crystallographic Plane Matching: Identify and visualize
specified planes aligned across a boundary and
aligned with 2D grain boundary trace. Useful for
investigating phase transformations and orientation
relationships
Fast Fourier Transform (FFT) Image Processing:
Improved EBSD pattern quality with an FFT-based
a image processing routine that can be combined with
Figure 5. Improved access to information about crystal planes with other algorithms and saved as a recipe for later use
advanced visualization tools for understanding the underlying (see Fig. 7)
crystallography used by the OIMsystem.
Non-Cubic Coincidence Site Lattice (CSL) Boundary
Analysis: Extends CSL boundary analysis to
Improved Access to the Information hexagonal, trigonal, and tetragonal unit cells for
You Need Most materials such as magnesium, zirconium, and alumina
Improved advanced visualization tools to easily
understand the underlying crystallography such as
crystal planes and misorientation axes (see Fig. 5)
Interactive status bar displays useful information at
each datapoint
Data Processing Log automatically records post
processing performed on datasets

Figure 6. Enhanced functionality with Chi-Scan PCA Component

Variation. 70% tolerance map is shown on left - notice the red phase. Figure 7. Enhanced functionality with additional image processing
When the component variation map is shown (middle), the red phase routine based on Fast Fourier Transform (FFT). Can be combined
divides into two shades of red. When the tolerance is increased to with other processing routines and saved as a recipe for later use.
75% (right), the initial red phase is divided into two unique phases.

With the addition of these new features, the

The Enhanced Functionality Provides OIMsystem continues to lead the way with the most
the User with: advanced EBSD tools in the industry. OIMsoftware still
implements its unique triplet indexing algorithms and
Improved Chi-Scan technology, EDAXs patented patented Confidence Index for superior EBSD pattern
combined EBSD-EDS tool for multiphase analysis: analysis and subsequent data quality.
Component deviation mapping, EDS spatial shifting,
and EDS kernel averaging have all been implemented
to improve phase differentiation, especially for
nanoscale measurements (see Fig. 6)

EDAX Inc., 2010 1210 www.edax.com